In-situ test device and test method for thermal physical parameters in space environment irradiation test

Abstract

The present invention discloses an in-situ test device for thermal physical property parameters in a space environment irradiation test, which includes a vacuum irradiation chamber (1), an in-situ test system (2), an automatic sample taking / sending system (3) and a vacuum pumping system (4). The test device of the present invention can be applied to the in-situ test of various performance parameters such as the solar absorptance, emissivity and electrical properties of materials after space environment irradiation tests, and realizes the real-time measurement of the attenuation changes of various properties of materials during space environment irradiation tests; moreover, a supercontinuum light source is used to test the solar absorptance, which makes up for the relatively large fluctuations in the test results in the ultraviolet band during the test with a composite light source, and improves the stability and accuracy of the measurement results.

Description

Technical Field

[0001] The present invention belongs to the field of materials science research, relates to the field of space materials science and technology, and more specifically, relates to an in-situ test device and test method for thermal physical parameters of space environment irradiation tests. Background Art

[0002] There are two main methods for evaluating the service of space materials. One is the spaceflight experiment, and the other is the ground simulation experiment of the space environment. The spaceflight experiment is the most effective means for evaluating the service of materials, and it has been implemented in the space station projects at home and abroad. However, due to the complexity, long cycle, and high cost of the spaceflight experiment technology, and it can only characterize the properties of materials at the beginning and end of space service, and it is impossible to dynamically and online study the performance evolution process of materials under various space environmental factors. Therefore, the ground simulation experiment of the space environment is still the main method for the research of material service evaluation.

[0003] After most materials are subjected to the ground simulation experiment of the space environment, their optical properties will deteriorate. After being damaged in a vacuum environment and contacting the atmosphere, the optical properties will change and show a "bleaching" phenomenon of recovery. In order to prevent the influence of the "bleaching" effect on the accuracy of material performance testing after the experiment, in-situ testing methods need to be used for performance testing. Chinese Patent CN113063732A discloses an in-situ detection device and method for solar absorptance in a vacuum and low-temperature environment. During the in-situ test of solar absorptance, a composite light source composed of light sources that can generate multiple bands is used. This kind of light source has a complex optical structure, is prone to degradation, and is prone to test errors caused by changes in the optical structure. The existing tests for the emissivity and electrical properties of materials after space environment irradiation still use the method of taking out the samples and measuring them in the atmospheric environment. Due to the influence of environmental changes, the performance changes of materials in a vacuum environment cannot be accurately characterized. The main difficulty in the in-situ electrical property measurement process is to realize the replacement of samples and the measurement of the electrical properties of multiple consecutive samples without opening the cavity. In the in-situ emissivity measurement, the space of the instrument is limited, and the equipment needs to have high integration. The conventional methods for measuring the emissivity at room temperature mainly include the calorimetric method and the reflection method. The calorimetric method is based on the principle of heat transfer and has high requirements for the heat conduction and temperature stability between the sample and the environment. Therefore, the equipment is relatively complex and it is difficult to integrate it into the in-situ test system while ensuring accuracy. When measuring the emissivity of materials using the reflection method, it is difficult to make the infrared radiation signal reaching the sample have sufficient intensity, and the emitted energy can be fully received, and to ensure the stability of the optical system throughout the test process. Summary of the Invention

[0004] In view of this, the object of the present invention is to provide an in-situ testing device and method for thermal physical property parameters in a space environment irradiation test. The testing device can be applied to the in-situ testing of various performance parameters such as the solar absorptance, emissivity, and electrical properties of materials after a space environment irradiation test, and realize the real-time measurement of the attenuation changes of various properties of materials during the space environment irradiation test.

[0005] In the first aspect, the present invention provides an in-situ testing device for thermal physical property parameters in a space environment irradiation test, which is characterized by comprising a vacuum irradiation chamber (1), an in-situ testing system (2), an automatic sample loading / unloading system (3), and a vacuum pumping system (4); wherein,

[0006] The vacuum irradiation chamber (1) includes a sample stage (1-1) for placing a sample (1-2), and the sample stage (1-1) is rotatable so that the sample (1-2) in the irradiation test can be taken out in sequence for performance testing;

[0007] The in-situ testing system (2) includes a testing chamber (2-1), an emissivity testing subsystem (2-2), an electrical property testing subsystem (2-3), and a solar absorptance testing subsystem (2-4); the emissivity testing subsystem (2-2) includes an emissivity measuring instrument (2-2-1), an infrared transmission window (2-2-2), and an emissivity reference plate (2-2-3); the electrical property testing subsystem (2-3) includes a resistance measuring instrument (2-3-1) and a surface resistance testing probe (2-3-2) fixed on the testing chamber (2-1); the solar absorptance testing subsystem includes a supercontinuum light source (2-4-1), an integrating sphere (2-4-2), an optical fiber spectrometer (2-4-3), and a solar absorptance reference plate (2-4-4);

[0008] The automatic sample loading / unloading system (3) includes an X-axis manipulator (3-1) for taking out the sample (1-2) from the vacuum irradiation chamber (1) and moving it to the in-situ testing position, a first Y-axis manipulator (3-2) for moving the emissivity reference plate (2-2-3) to the emissivity testing position, a second Y-axis manipulator (3-3) for moving the solar absorptance reference plate (2-4-4) to the solar absorptance testing position, a first ejector rod (3-4) for adjusting the height of the emissivity reference plate (2-2-3) or the sample (1-2), a second ejector rod (3-5) for adjusting the height of the sample (1-2), a third ejector rod (3-6) for adjusting the height of the solar absorptance reference plate (2-4-4) or the sample (1-2), a fourth ejector rod (3-7) for raising the sample (1-2) to facilitate the X-axis manipulator to take the sample, and a computer (3-8) for controlling the positions of each manipulator and ejector rod;

[0009] The vacuum pumping system includes a molecular pump, a dry pump and a vacuum gauge, and can achieve a vacuum degree of 6×10 -4 Pa in the test chamber.

[0010] In the present invention, the in-situ testing device for thermal physical property parameters in the space environment irradiation test can in-situ measure the solar absorptance, emissivity and electrical properties of a sample during the space environment irradiation process. Among them, the in-situ testing subsystem for solar absorptance mainly aims at samples opaque in the solar band, and the in-situ testing subsystem for emissivity mainly aims at samples opaque in the mid-infrared and far-infrared bands.

[0011] Preferably, the emissivity measuring instrument (2-2-1) includes an infrared high-reflectivity integrating sphere, measures the reflectivity R of the sample in the infrared band based on an optical method, and obtains the emissivity of the sample through emissivity ε = 1 - R.

[0012] Preferably, the transmittance of the infrared transmission window (2-2-2) in the mid-infrared and far-infrared bands is greater than 70%.

[0013] Preferably, the emissivity reference plate (2-2-3) includes a low-emissivity reference plate and a high-emissivity reference plate.

[0014] Preferably, the electrical property measurement subsystem (2-3) is used to measure the surface resistance and volume resistance of high-resistance or low-resistance samples.

[0015] Preferably, the supercontinuum light source (2-4-1) emits continuous light in the wavelength range of 250 - 2500 nm and is connected to the integrating sphere (2-4-2) through an optical fiber or a spatial coupling adapter.

[0016] Preferably, there is an interlock device between each manipulator and the ejector rod in the automatic sample loading and unloading system (3) to prevent collisions during operation; the interlock device includes a sensor for identifying the position of the manipulator and software for judging whether the manipulator movement conditions are met, and the sensor is located on the outer wall of the manipulator cylinder.

[0017] In a second aspect, the present invention also provides a testing method for the in-situ testing device for thermal physical property parameters in the space environment irradiation test as described above, including the following steps:

[0018] S1. Calibrate the fiber optic spectrometer using a solar absorptance reference plate;

[0019] S2. Use the fourth ejector rod to lift the sample on the sample stage, and use the X-axis manipulator to transfer the sample from the vacuum irradiation chamber to the solar absorptance measurement position in the test chamber, and measure the solar absorptance of the sample;

[0020] S3. Use the X-axis manipulator to move the sample to the electrical property test position and test the electrical properties of the sample;

[0021] S4. Calibrate the emissivity measuring instrument using an emissivity reference plate;

[0022] S5. Use the X-axis manipulator to move the sample to the emissivity test position and test the emissivity of the sample;

[0023] S6. After the test is completed, use the X-axis manipulator to send the sample back to the sample stage in the vacuum irradiation chamber.

[0024] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0025] (1) The in-situ test device for thermal physical property parameters in space environment irradiation test of the present invention integrates in-situ test of solar absorptance, in-situ test of electrical properties and in-situ test of emissivity, makes up for the blank of in-situ test of emissivity and in-situ test of electrical properties, realizes the simultaneous real-time measurement of solar absorptance, electrical properties and emissivity during the space irradiation test, and can be used to study the evolution process of material performance degradation during space irradiation.

[0026] (2) The in-situ test device for thermal physical property parameters in space environment irradiation test of the present invention has the functions of in-situ emissivity measurement and in-situ electrical property measurement, uses a supercontinuum light source to test the solar absorptance, makes up for the relatively large fluctuation of the test results in the ultraviolet band during the test with a composite light source, and improves the stability and accuracy of the measurement results.

[0027] (3) The in-situ test device for thermal physical property parameters in space environment irradiation test of the present invention realizes automatic sample feeding and sampling, and avoids the influence of the recovery phenomenon on the test results.

[0028] (4) Based on the design of infrared high-transmittance window panes and integrating spheres, the present invention improves the accuracy of the test results in the connection situation between the sample and the measuring device during the electrical property measurement. Description of the Drawings

[0029] Figure 1 It is a schematic structural diagram of the in-situ test device for thermal physical property parameters in space environment irradiation test of the present invention.

[0030] Figure 2 It is a sample fixture diagram with a diameter of 20 mm of the in-situ test device for thermal physical property parameters in space environment irradiation test of the present invention.

[0031] Figure 3 It is a comparison diagram of solar absorptance using a composite light source and a supercontinuum light source during the in-situ test of solar absorptance.

[0032] Reference Signs:

[0033] 1 Irradiation chamber,

[0034] 1-1 Sample stage,

[0035] 1-2 samples

[0036] 2 in-situ test system

[0037] 2-1 test chamber

[0038] 2-2 emissivity test subsystem

[0039] 2-2-1 emissivity measuring instrument

[0040] 2-2-2 infrared transmission window

[0041] 2-2-3 emissivity reference plate

[0042] 2-3 electrical performance test subsystem

[0043] 2-3-1 electrical performance measuring instrument

[0044] 2-3-2 electrical performance test probe

[0045] 2-4 solar absorptance test subsystem

[0046] 2-4-1 supercontinuum light source

[0047] 2-4-2 integrating sphere

[0048] 2-4-3 fiber optic spectrometer

[0049] 2-4-4 solar absorptance reference plate

[0050] 3 automatic sample loading and unloading system

[0051] 3-1 X-axis manipulator

[0052] 3-2 first Y-axis manipulator

[0053] 3-3 second Y-axis manipulator

[0054] 3-4 first ejector rod

[0055] 3-5 second ejector rod

[0056] 3-6 third ejector rod

[0057] 3-7 fourth ejector rod

[0058] 3-8 computer

[0059] 4 vacuum pumping system Detailed implementation method

[0060] The present invention will be further described below in conjunction with the accompanying drawings and the following embodiments. It should be understood that the accompanying drawings and the following embodiments are only used to illustrate the present invention, rather than limiting the present invention.

[0061] Figure 1 It is a schematic structural diagram of an in-situ test device for thermal physical property parameters of a space environment irradiation test in an embodiment of the present invention. As Figure 1 shown, the test device of this embodiment includes a vacuum irradiation chamber (1), an in-situ test system (2), an automatic sample taking / sending system (3), and a vacuum pumping system (4). Among them, the vacuum irradiation chamber (1) includes a sample stage (1-1) and a sample (1-2). The sample (1-2) is placed above the through hole on the sample stage (1-1); different sample jigs can be designed for different sample forms to facilitate the movement of the sample by the automatic sample taking / sending system. The sample stage (1-1) can rotate so that the samples in the irradiation test can be taken out in sequence for in-situ performance testing.

[0062] The in-situ test system (2) includes a test chamber (2-1), an emissivity test subsystem (2-2), an electrical property test subsystem (2-3), and a solar absorptance test subsystem (2-4). Among them, the emissivity test subsystem (2-2) includes an emissivity measuring instrument (2-2-1), an infrared transmission window (2-2-2), and an emissivity reference plate (2-2-3) fixed on the first Y-axis manipulator (3-2). The emissivity measuring instrument (2-2-1) includes an infrared high-reflectivity integrating sphere, and measures the reflectivity R of the sample in the infrared band based on an optical method. The emissivity of the sample is obtained by emissivity ε = 1 - R. The infrared transmission rate of the infrared through the infrared transmission window (2-2-2) in the mid-infrared and far-infrared bands is greater than 70%. The material of the window (2-2-2) can be, for example, zinc selenide, potassium bromide, etc. The emissivity reference plate (2-2-3) includes a low-emissivity reference plate and a high-emissivity reference plate. The electrical property test subsystem (2-3) includes a resistance measuring instrument (2-3-1) and an electrical property test probe (2-3-2) fixed on the test chamber (2-1); the electrical property measurement subsystem (2-3) is used to measure the surface resistance and volume resistance of the sample; according to the different levels of the resistance value of the material, a suitable electrical property test probe and electrical property measuring instrument are selected. The solar absorptance test subsystem includes a supercontinuum light source (2-4-1), an integrating sphere (2-4-2), an optical fiber spectrometer (2-4-3), and a solar absorptance reference plate (2-4-4) fixed on the second Y-axis manipulator (3-3); the supercontinuum light source (2-4-1) emits continuous light in the wavelength range of 250 - 2500 nm and is connected to the integrating sphere (2-4-2) through an optical fiber or a space coupling adapter.

[0063] The described automatic sample fetching and delivering system (3) includes an X-axis manipulator (3-1) for taking out the sample (1-2) from the vacuum irradiation chamber (1) and moving it to the in-situ test position, a Y-axis manipulator 1 (3-2) for moving the emissivity reference plate (2-2-3) to the emissivity test position, a Y-axis manipulator 2 (3-3) for moving the solar absorptance reference plate (2-4-4) to the solar absorptance test position, a push rod 1 (3-4) for adjusting the height of the emissivity reference plate (2-2-3) or the sample (1-2), a push rod 2 (3-5) for adjusting the height of the sample (1-2), a push rod 3 (3-6) for adjusting the height of the solar absorptance reference plate (2-4-4) or the sample (1-2), a push rod 4 (3-7) for lifting the sample (1-2) to facilitate the X-axis manipulator (3-1) to take the sample (1-2), and a computer (3-8) for controlling the positions of each manipulator and push rod; there is an interlock device between each manipulator and push rod to prevent collision during operation.

[0064] The described vacuum pumping system (4) consists of a molecular pump, a dry pump and a vacuum gauge, and can achieve a vacuum degree of 6×10 -4 Pa in the test chamber (2-1).

[0065] The in-situ test device for thermal physical property parameters of space environment irradiation test of the present invention integrates in-situ solar absorptance test, in-situ electrical property test and in-situ emissivity test, makes up for the blank of in-situ emissivity test and in-situ electrical property test, realizes the simultaneous real-time measurement of solar absorptance, electrical property and emissivity during the space irradiation test, and can be used to study the evolution process of material performance degradation during space irradiation.

[0066] The in-situ test device for thermal physical property parameters of space environment irradiation test of the present invention has the functions of in-situ emissivity measurement and in-situ electrical property measurement, uses an ultra-continuous light source to test the solar absorptance, makes up for the relatively large fluctuation of the test results in the ultraviolet band during the test with a composite light source, and improves the stability and accuracy of the measurement results. Figure 3 It is a comparison chart of solar absorptance of a composite light source and an ultra-continuous light source during the in-situ solar absorptance test. From Figure 3 It can be seen that during the in-situ test, the fluctuation of the solar absorptance of the composite light source is greater, the ultra-continuous light source is more stable than the composite light source, and the present invention uses the ultra-continuous light source to in-situ test the thermal physical property parameters of the space environment irradiation test with higher stability and accuracy.

[0067] The following are further examples to illustrate the present invention in detail. It should also be understood that the following examples are only for further illustration of the present invention and should not be construed as limiting the protection scope of the present invention. Any non-essential improvements and adjustments made by those skilled in the art based on the above content of the present invention fall within the protection scope of the present invention. The specific process parameters and the like in the following examples are only examples within a suitable range, that is, those skilled in the art can make selections within a suitable range through the description herein, rather than being limited to the specific values in the following examples.

[0068] Example 1:

[0069] Using Figure 1 the test device of the shown embodiment to conduct in-situ emissivity measurement on an anti-static cerium glass silver-plated secondary surface mirror thermal control coating material. Specifically, in one embodiment, the sample fixture is as Figure 2 shown.

[0070] The specific test steps are as follows:

[0071] Step 1: Calibrate the fiber optic spectrometer using the solar absorptance reference plate;

[0072] Step 2: Use the ejector rod 4 to raise the sample for comprehensive irradiation, use the X manipulator to transfer the sample from the irradiation chamber to the solar absorptance measurement position in the test chamber, use the ejector rod 3 to move the sample to the integrating sphere test port, and measure the solar absorptance of the sample;

[0073] Step 3: Use the X-axis manipulator to move the sample to the electrical performance test position, use the ejector rod 2 to move the sample to the test position of the electrical performance probe, and keep close contact with the probe to measure the electrical performance of the sample;

[0074] Step 4: Calibrate the emissivity measuring instrument using the high-emissivity reference plate and the low-emissivity reference plate;

[0075] Step 5: Use the X-axis manipulator to move the sample to the emissivity test position, use the ejector rod 1 to move the sample to the emissivity test position, and make it in close contact with the infrared transmission window to test the emissivity of the sample;

[0076] Step 6: After the test is completed, use the X-axis manipulator to send the sample back to the sample stage in the vacuum irradiation chamber.

[0077] Without departing from the gist of the basic features of the present invention, the present invention can be embodied in various forms. Therefore, the embodiments in the present invention are for illustration rather than limitation. Since the scope of the present invention is defined by the claims rather than the specification, and all changes falling within the scope defined by the claims, or within the equivalent scope of the defined scope, should be understood to be included in the claims.

Claims

1. An in-situ testing device for thermal physical parameters in a space environment irradiation test, characterized in that, It includes a vacuum irradiation chamber (1), an in-situ testing system (2), an automatic sample loading / unloading system (3), and a vacuum pumping system (4); among them, the vacuum irradiation chamber (1) includes a sample stage (1-1) for placing a sample (1-2), and the sample stage (1-1) is rotatable so that the sample (1-2) in the irradiation test can be taken out in sequence for performance testing; the in-situ testing system (2) includes a testing chamber (2-1), an emissivity testing subsystem (2-2), an electrical property testing subsystem (2-3), and a solar absorptance testing subsystem (2-4); the emissivity testing subsystem (2-2) includes an emissivity measuring instrument (2-2-1), an infrared transmission window (2-2-2), and an emissivity reference plate (2-2-3); the electrical property testing subsystem (2-3) includes a resistance measuring instrument (2-3-1) and a surface resistance testing probe (2-3-2) fixed on the testing chamber (2-1); the solar absorptance testing subsystem includes a supercontinuum light source (2-4-1), an integrating sphere (2-4-2), an optical fiber spectrometer (2-4-3), and a solar absorptance reference plate (2-4-4); the automatic sample loading / unloading system (3) includes an X-axis robot (3-1) for taking out the sample (1-2) from the vacuum irradiation chamber (1) and moving it to the in-situ testing position, a first Y-axis robot (3-2) for moving the emissivity reference plate (2-2-3) to the emissivity testing position, a second Y-axis robot (3-3) for moving the solar absorptance reference plate (2-4-4) to the solar absorptance testing position, a first ejector rod (3-4) for adjusting the height of the emissivity reference plate (2-2-3) or the sample (1-2), a second ejector rod (3-5) for adjusting the height of the sample (1-2), a third ejector rod (3-6) for adjusting the height of the solar absorptance reference plate (2-4-4) or the sample (1-2), a fourth ejector rod (3-7) for raising the sample (1-2) to facilitate the X-axis robot to take the sample, and a computer (3-8) for controlling the positions of each robot and ejector rod; The vacuum pumping system includes a molecular pump, a dry pump and a vacuum gauge, and can achieve a vacuum degree of 6×10 -4 Pa in the test chamber.

2. The in-situ testing device for thermal physical property parameters of space environment irradiation test according to claim 1, wherein, the emissivity measuring instrument (2-2-1) includes an infrared high reflectivity integrating sphere, measures the reflectivity R of the sample in the infrared band based on an optical method, and obtains the emissivity of the sample through emissivity ε = 1 - R.

3. The in-situ testing device for thermal physical property parameters of space environment irradiation test according to claim 1, characterized in that, The infrared transmission window (2-2-2) has a transmittance greater than 70% in the mid-infrared and far-infrared bands.

4. The in-situ testing device for thermal physical property parameters of space environment irradiation test according to claim 1, characterized in that, The emissivity reference plate (2-2-3) includes a low emissivity reference plate and a high emissivity reference plate.

5. The in-situ testing device for thermal physical property parameters of space environment irradiation test according to claim 1, wherein The electrical property measuring subsystem (2-3) is used to measure the surface resistance and volume resistance of high-resistance or low-resistance samples.

6. The in-situ testing device for thermal physical property parameters of space environment radiation test according to claim 1, characterized in that, The supercontinuum light source (2-4-1) emits continuous light in the wavelength range of 250 - 2500 nm and is connected to the integrating sphere (2-4-2) through an optical fiber or a spatial coupling adapter.

7. The in-situ testing device for thermal physical property parameters of space environment irradiation test according to claim 1, characterized in that, There is an interlock device between each manipulator and the ejector rod in the automatic sample loading and unloading system (3) to prevent collisions during operation; the interlock device includes a sensor for identifying the position of the manipulator and software for judging whether the manipulator movement conditions are met, and the sensor is located on the outer wall of the manipulator cylinder.

8. A testing method for an in-situ testing device of thermal physical property parameters in a space environment irradiation test as described in any one of claims 1-7, characterized in that, The steps are as follows: S1. Calibrate the fiber optic spectrometer using the solar absorptance reference plate. S2. Use the fourth ejector rod to lift the sample on the sample stage, and use the X-axis manipulator to transfer the sample from the vacuum irradiation chamber to the solar absorptance measurement position in the test chamber to measure the solar absorptance of the sample. S3. Use the X-axis manipulator to move the sample to the electrical property test position to test the electrical properties of the sample. S4. Calibrate the emissivity measuring instrument using the emissivity reference plate. S5. Use the X-axis manipulator to move the sample to the emissivity test position to test the emissivity of the sample. S6. After the test is completed, use the X-axis manipulator to send the sample back to the sample stage in the vacuum irradiation chamber.

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