A chip capacitor testing machine

Abstract

The application discloses a chip capacitor testing machine, which comprises a feeding device, a testing device and a discharging device. The feeding device comprises a feeding mechanism and a conveying mechanism, the feeding mechanism is used for storing capacitors to be tested, and the conveying mechanism is used for conveying the capacitors to be tested of the feeding mechanism; the testing device comprises a rotating disc mechanism and a testing mechanism, the testing motor drives multiple transmission components to move synchronously, so that the testing needle clamps the capacitors to be tested, then the lifting cylinder lifts the lifting plate, so that the capacitors to be tested are in a suspended state for testing; the discharging device comprises a distributing mechanism and a collecting mechanism, the distributing mechanism is used for putting the tested capacitors on the testing rotating disc into corresponding collecting grooves according to test results, and the collecting mechanism is used for putting the capacitors in the full collecting groove column into corresponding grading bins. Therefore, the chip capacitor testing machine can automatically and continuously test four parameters of the chip capacitor, i.e. voltage resistance, insulation resistance, capacity and loss, and sort the capacitors according to the test results, and the testing efficiency is high.

Description

Technical Field

[0001] This invention relates to the field of capacitor manufacturing equipment, and in particular to a chip capacitor testing machine. Background Technology

[0002] Surface mount capacitors, with their surface mount design and ease of modularization, are among the most widely used components in modern mobile communication devices, computer circuit boards, and home appliance remote controls. Before leaving the factory, surface mount capacitors typically undergo testing for parameters such as withstand voltage, insulation resistance, capacitance, and losses. Current testing machines can only test a single capacitor at a time, or test individual parameters of multiple capacitors simultaneously, resulting in low testing efficiency. Summary of the Invention

[0003] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a chip capacitor testing machine that can automatically and continuously test four parameters of chip capacitors: withstand voltage, insulation resistance, capacitance, and loss, and sort them according to the test results, resulting in high testing efficiency.

[0004] The technical solution adopted by this invention to solve its technical problem is:

[0005] A chip capacitor tester, comprising

[0006] The feeding device includes a feeding mechanism and a conveying mechanism. The feeding mechanism is used to store the capacitors to be tested, and the conveying mechanism is used to transport the capacitors to be tested from the feeding mechanism.

[0007] A testing device includes a turntable mechanism and a testing mechanism. The turntable mechanism receives a capacitor to be tested from the conveying mechanism. The turntable mechanism includes a test turntable and a rotary motor that drives the test turntable to rotate at equal intervals. The test turntable has multiple test slots evenly arranged around its circumference to accommodate the capacitors to be tested. The testing mechanism includes a lifting plate disposed below the turntable mechanism, a lifting cylinder that drives the lifting plate to move up and down, and multiple testing components disposed on the lifting plate. Each testing component includes test pins disposed opposite to each other on both sides of the test slot and a transmission component that drives the two test pins to open or close. Each set of test pins is used to test parameters including withstand voltage, insulation resistance, capacitance, and loss of the capacitor to be tested. The testing mechanism also includes a test motor that drives the multiple transmission components to move synchronously. The test motor drives the multiple transmission components to move synchronously, causing the test pins to clamp the capacitor to be tested. Then, the lifting cylinder raises the lifting plate, so that the capacitor to be tested is in a suspended state for testing.

[0008] The feeding device includes a feeding mechanism and a receiving mechanism. The feeding mechanism includes a feeding component and a feeding device. The feeding device includes a collecting plate with multiple rows of collecting troughs. The feeding component is used to place the capacitors tested on the test turntable into the corresponding columns of collecting troughs according to the test results. The receiving mechanism includes a receiving component and multiple graded hoppers. The receiving component is used to place the capacitors that fill a column of collecting troughs into the corresponding graded hoppers.

[0009] According to an embodiment of the present invention, a chip capacitor testing machine has at least the following advantages: a feeding mechanism stores the capacitors to be tested; a conveying mechanism transports the capacitors to be tested from the feeding mechanism to the test slots on the test turntable of the turntable mechanism; a testing motor drives multiple transmission components to move synchronously, causing the test probes to clamp the capacitors to be tested; then, a lifting cylinder raises the lifting plate, thus suspending the capacitors to be tested for testing. The test probes perform tests on the capacitors to be tested, including withstand voltage, insulation resistance, capacitance, and loss parameters. Therefore, capacitors in different test slots can be tested simultaneously. After one test is completed, the rotating motor drives the test turntable to rotate equidistantly, and the capacitors in one test slot switch to the next set of test probes for testing. Each capacitor can complete the tests for withstand voltage, insulation resistance, capacitance, and loss parameters. After all parameters are tested, the sorting component places the tested capacitors on the test turntable into the corresponding collection slots according to the test results. The receiving component places the capacitors filling one column of the collection slots into the corresponding graded bins, thereby completing the sorting process. Therefore, it can automatically and continuously test four parameters of chip capacitors: withstand voltage, insulation resistance, capacitance, and loss, and sort them according to the test results, resulting in high testing efficiency.

[0010] According to some embodiments of the present invention, the test turntable has an opening in the middle, and the transmission component includes a fixed seat disposed on the lifting plate, a lever rotatably connected to the side of the fixed seat, and a needle seat rotatably connected to both ends of the lever. The needle seat is used to install the test needle. One of the needle seats is disposed through the opening, and the other needle seat is disposed on the outside of the test turntable. A roller is disposed on the side of the needle seat located on the outside. An eccentric wheel is disposed above the lifting plate and abuts against the roller. A synchronous pulley coaxial with the eccentric wheel is disposed below the lifting plate. The synchronous pulley is connected to the test motor through a double-sided synchronous belt.

[0011] The advantage is that the test motor drives all the synchronous pulleys to rotate simultaneously through the double-sided synchronous belt, which in turn drives the eccentric wheel to rotate and, through the abutment roller, drives the outer pin holder to move towards the test turntable. Through the lever, the turntable located in the opening moves to the outside of the test turntable, so that the two pin holders drive the test pins to clamp the capacitor to be tested in the test slot, thus ensuring that each group of test components can synchronously clamp the capacitor to be tested for testing.

[0012] According to some embodiments of the present invention, the feeding mechanism includes a motion component, a feeding rack, and an empty box suction assembly. The motion component includes a slide rail, a sliding frame disposed on the slide rail, a displacement cylinder for driving the sliding frame to move along the slide rail, and a linear motor disposed below the slide rail. The sliding frame has two parallel feeding racks, and the feeding racks stack multiple layers of boxes. The boxes contain capacitors to be tested. The empty box suction assembly is disposed next to the feeding racks. The empty box suction assembly includes an empty box compartment, a first lead screw slide module, a first lifting cylinder moving along the first lead screw slide module, a lifting frame mounted on the output end of the first lifting cylinder, and an empty box suction head disposed on the lifting frame. The empty box suction head is used to suck empty boxes from the feeding racks into the empty box compartment. The linear motor is used to push the boxes up and down. The displacement cylinder is used to drive the sliding frame to move to switch the feeding racks.

[0013] The advantages are: the feeding rack has multiple layers of boxes. When the capacitors to be tested in the top box are all transported by the conveying mechanism, the first lead screw slide module drives the first lifting cylinder to move above the feeding rack. The first lifting cylinder drives the empty box suction head of the lifting rack to pick up the empty box into the empty box compartment. When all the boxes in one feeding rack are used up, the displacement cylinder drives the sliding frame to move to switch to another feeding rack. The worker then stacks the boxes full of capacitors to be tested on the empty feeding rack again, thus ensuring that the testing process is not interrupted and improving testing efficiency.

[0014] According to some embodiments of the present invention, the conveying mechanism includes a first suction assembly, a conveying assembly, and a second suction assembly. The first suction assembly includes a second lead screw module, a second lifting cylinder that moves along the second lead screw module, and a suction head assembly disposed at the output end of the second lifting cylinder. The conveying assembly includes a conveyor belt, a conveying motor that drives the conveyor belt to rotate, baffles located on both sides of the conveyor belt, and a material stop block located at the end of the conveying direction. The second suction assembly includes a cam, a suction motor that drives the cam to swing, a sliding plate that is rotatably connected to the cam, and a material suction head at the bottom of the sliding plate. The back of the sliding plate is slidably connected to a Y-guide rail, and the back of the Y-guide rail is slidably connected to an X-guide rail. The second lead screw module and the second lifting cylinder are used to drive the suction head assembly to suck a row of capacitors to be tested from the material box onto the conveyor belt. The suction motor drives the cam to swing, causing the sliding plate to move up and down along the Y-guide rail and left and right along the X-guide rail, thereby driving the suction head to suck the capacitors to be tested from the conveyor belt one by one into the test slot.

[0015] The advantage is that the second lead screw module and the second lifting cylinder drive the suction head group to first suck a row of capacitors to be tested from the material box onto the conveyor belt. Then, the suction motor drives the cam to drive the suction head to suck the capacitors to be tested from the conveyor belt one by one into the test slot. This can improve the conveying speed and conveying accuracy of the conveying mechanism and ensure that the capacitors to be tested can be quickly and accurately conveyed from the feeding mechanism to the test slot.

[0016] According to some embodiments of the present invention, the material distribution assembly includes a third lead screw module, a third lifting cylinder that moves along the third lead screw module, and a suction head disposed at the output end of the third lifting cylinder. The third lead screw module and the third lifting cylinder drive the suction head to suck up the capacitors that have been tested on the test turntable and place them into the corresponding column of the collection trough according to the test results.

[0017] The advantage is that this arrangement of the material distribution component can quickly and accurately transfer the capacitors that have been tested on the test turntable into the corresponding collection slots according to the test results. While distributing the materials, it also frees up space in the test slots to receive the capacitors to be tested from the conveying mechanism for the next round of testing, thus improving testing efficiency.

[0018] According to some embodiments of the present invention, the feeder further includes an X-screw module disposed below the collecting plate and a Y-screw module disposed below the X-screw module, wherein the X-screw module and the Y-screw module are arranged perpendicularly to each other and convey materials to the same straight line as the plurality of tiered hoppers.

[0019] The advantage is that, by setting up X-screw modules and Y-screw modules, the distributor can quickly and accurately transfer the collection plate to the sorting bin after the collection trough is full of capacitors, thus preparing the receiving component to place the capacitors that have filled the collection trough into the corresponding sorting bin.

[0020] According to some embodiments of the present invention, the plurality of segmented hoppers are arranged in a straight line, and the X-screw module and the Y-screw module are used to convey the collecting plate to one end of the plurality of segmented hoppers arranged in a straight line.

[0021] The advantage is that the linear arrangement of the graded bins facilitates the setting of the feeder and the receiving component, making it easier for the receiving component to place the capacitors that fill a row of collection troughs into the corresponding graded bins, which can simplify the machine structure.

[0022] According to some embodiments of the present invention, the receiving assembly includes a fourth lead screw module disposed above the grading bin, a fourth lifting cylinder moving along the fourth lead screw module, and a suction head assembly disposed on the fourth lifting cylinder. The suction head assembly is used to pick up capacitors filled with a row of the collecting trough into the corresponding grading bin.

[0023] The advantages are: the receiving component drives the suction head group to move through the fourth lead screw module and the fourth lifting cylinder, thereby picking up the capacitors that fill a row of collection troughs and picking them up into the suction head group of the corresponding graded hopper. The structure is simple, easy to control, and the feeding is fast and accurate.

[0024] According to some embodiments of the present invention, the fourth lead screw module is further provided with a fifth lifting cylinder, the output end of the fifth lifting cylinder is provided with a lifting frame, an empty box suction head is installed on the lifting frame, an empty box bin is provided at one end of a row of tiered bins, an empty box bin is stacked in the empty box bin, and the empty box suction head is used to suck the box in the empty box bin into the tiered bin.

[0025] The advantage is that by driving the empty box suction head through the fourth lead screw module and the fifth lifting cylinder, the empty box can be sucked into the grading box, which can replenish the grading box with empty boxes to install the tested capacitors.

[0026] According to some embodiments of the present invention, the feeding device is provided in two parts.

[0027] The advantage is that the feeding device has two sections that can sort the tested capacitors into more grades according to the test results. The more grades there are, the better for the subsequent processing of the capacitors.

[0028] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0029] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0030] Figure 1 This is a schematic diagram of an embodiment of the present invention;

[0031] Figure 2 for Figure 1 A schematic diagram of the testing device;

[0032] Figure 3 for Figure 2 Schematic diagram of the transmission components;

[0033] Figure 4 for Figure 1 A schematic diagram of the material supply mechanism;

[0034] Figure 5 for Figure 1 Schematic diagram of the central suction empty box assembly;

[0035] Figure 6 for Figure 1 A schematic diagram of the first suction and conveying component;

[0036] Figure 7 for Figure 1 A schematic diagram of the conveyor components;

[0037] Figure 8 for Figure 1 A schematic diagram of the second suction and conveying component;

[0038] Figure 9 for Figure 1 Schematic diagram of the material distribution assembly;

[0039] Figure 10 for Figure 1 Schematic diagram of the distributor;

[0040] Figure 11 for Figure 1 A schematic diagram of the receiving component.

[0041] Reference numerals: Feeding mechanism 100, Testing device 110, Testing turntable 120, Rotary motor 130, Testing slot 140, Lifting plate 150, Lifting cylinder 160, Testing needle 170, Testing motor 180, Distributing assembly 190, Distributor 200, Collecting plate 210, Collecting trough 220, Receiving assembly 230, Dividing bin 240, Opening 250, Fixed base 260, Lever 270, Needle holder 280, Roller 290, Eccentric wheel 300, Synchronous belt pulley 310, Feeding rack 320, Empty box suction assembly 330, Slide rail 340, Sliding frame 350, Displacement cylinder 360, Linear motor 370, Material box 380, Empty box bin 390, First wire The components include: a sliding table module 400, a first lifting cylinder 410, a lifting frame 420, an empty box suction head 430, a first suction and conveying assembly 440, a conveying assembly 450, a second suction and conveying assembly 460, a second lead screw module 470, a second lifting cylinder 480, a suction head assembly 490, a conveyor belt 500, a conveying motor 510, a baffle 520, a stop block 530, a cam 540, a suction and conveying motor 550, a suction head 560, a third lead screw module 570, a third lifting cylinder 580, an X-lead screw module 590, a Y-lead screw module 600, a fourth lead screw module 610, a fourth lifting cylinder 620, a fifth lifting cylinder 630, a sliding plate 640, a Y-guide rail 650, and an X-guide rail 660. Detailed Implementation

[0042] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0043] In the description of this invention, it should be understood that the orientation descriptions, such as up, down, front, back, left, right, etc., are based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting this invention.

[0044] In the description of this invention, "several" means one or more, "more than" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.

[0045] In the description of this invention, unless otherwise explicitly defined, terms such as "set up," "install," and "connect" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this invention in conjunction with the specific content of the technical solution.

[0046] The following is for reference. Figures 1-11 A chip capacitor tester is described in detail with reference to a specific embodiment. It is to be understood that the following description is merely illustrative and not intended to limit the invention.

[0047] like Figures 1-11 As shown, a chip capacitor testing machine includes a feeding device, a testing device 110, and a discharging device.

[0048] The feeding device includes a feeding mechanism 100 and a conveying mechanism. The feeding mechanism 100 is used to store the capacitors to be tested, and the conveying mechanism is used to transport the capacitors to be tested from the feeding mechanism 100. The testing device 110 includes a turntable mechanism and a testing mechanism. The turntable mechanism is used to receive the capacitors to be tested from the conveying mechanism. The turntable mechanism includes a testing turntable 120 and a rotating motor 130 that drives the testing turntable 120 to rotate at equal intervals. The testing turntable 120 is evenly provided with multiple test slots 140 for accommodating the capacitors to be tested in the circumferential direction. It is worth mentioning that the testing turntable 120 can be set separately, including a turntable base and a test plate set on the turntable base. This allows the test plate to be replaced according to different models of capacitors. In addition, the test slots can be set to one specification or two specifications can be staggered, which is also conducive to switching between different models of capacitors. The testing mechanism includes a lifting plate 150 located below the turntable mechanism, a lifting cylinder 160 that drives the lifting plate 150 to rise and fall, and multiple testing components mounted on the lifting plate 150. Each testing component includes test pins 170 positioned opposite each other on either side of a test slot 140, and a transmission component that drives the two test pins 170 to open or close. Each set of test pins 170 is used to test parameters including the withstand voltage, insulation resistance, capacitance, and loss of the capacitor under test. The testing mechanism also includes a test motor 180 that drives the multiple transmission components to move synchronously. The test motor 180 drives the multiple transmission components to move synchronously, causing the test pins 170 to clamp the capacitor under test. The capacitor to be tested is then lifted by the lifting cylinder 160, which raises the lifting plate 150 so that the capacitor to be tested is suspended in the air for testing. The unloading device includes a distributing mechanism and a receiving mechanism. The distributing mechanism includes a distributing component 190 and a distributor 200. The distributor 200 includes a collecting plate 210, which has multiple rows of collecting troughs 220. The distributing component 190 is used to place the capacitors that have been tested on the test turntable 120 into the corresponding column of collecting troughs 220 according to the test results. The receiving mechanism includes a receiving component 230 and multiple graded bins 240. The receiving component 230 is used to place the capacitors that have filled a column of collecting troughs 220 into the corresponding graded bins 240.

[0049] The feeding mechanism 100 is used to store the capacitors to be tested. The conveying mechanism transports the capacitors to be tested from the feeding mechanism 100 to the test slots 140 on the test turntable 120 of the turntable mechanism. The test motor 180 drives multiple transmission components to move synchronously, causing the test probes 170 to clamp the capacitors to be tested. Then, the lifting cylinder 160 lifts the lifting plate 150, so that the capacitors to be tested are suspended in the air for testing. The test probes 170 test the capacitors to be tested for parameters including withstand voltage, insulation resistance, capacitance, and loss. Therefore, capacitors to be tested in different test slots 140 can be tested simultaneously. After one test is completed, the rotating motor 130 drives the test turntable 120 to rotate at equal intervals, and the capacitors to be tested in one test slot 140 are switched to the next set of test probes 170 for testing. Each capacitor to be tested can complete the tests of withstand voltage, insulation resistance, capacitance, and loss parameters. After all parameters are tested, the sorting component 190 places the tested capacitors from the test turntable 120 into the corresponding collection trough 220 according to the test results. The receiving component 230 then places the capacitors filling one column of the collection trough 220 into the corresponding sorting bin 240, thus completing the sorting process. Therefore, it can automatically and continuously test the four parameters of chip capacitors—voltage withstand capability, insulation resistance, capacitance, and loss—and sort them according to the test results, resulting in high testing efficiency.

[0050] Specifically, such as Figure 2 and Figure 3As shown, the test turntable 120 has an opening 250 in the middle. The transmission components include a fixed seat 260 mounted on a lifting plate 150, a lever 270 rotatably connected to the side of the fixed seat 260, and a needle holder 280 rotatably connected to both ends of the lever 270. The needle holder 280 is used to mount the test needle 170. One needle holder 280 is disposed through the opening 250, and the other needle holder 280 is disposed on the outside of the test turntable 120. The side of the outer needle holder 280 is provided with a roller 290. The lifting plate... Above the lifting plate 150 is an eccentric wheel 300 that abuts against the roller 290. Below the lifting plate 150 is a synchronous pulley 310 coaxial with the eccentric wheel 300. The synchronous pulley 310 is connected to the test motor 180 via a double-sided synchronous belt, which is not shown in the figure. It should be noted that all the synchronous pulleys 310 and the output end of the test motor (which should also have a synchronous pulley 310) are sequentially and alternately connected to the inner and outer sides of the double-sided synchronous belt to form a closed loop, ensuring synchronous rotation. In this way, the test motor 180 drives all the synchronous pulleys 310 to rotate simultaneously via the double-sided synchronous belt, thereby rotating the eccentric wheel 300 and driving the outer needle seat 280 to move towards the test turntable 120 via the abutting roller 290. Through the lever 270, the turntable located in the opening 250 moves towards the outside of the test turntable 120, thereby driving the two needle seats 280 to clamp the test needle 170 to the capacitor to be tested in the test slot 140, thus ensuring that each group of test components can synchronously clamp the capacitor to be tested for testing.

[0051] like Figure 4 and Figure 5As shown, the feeding mechanism 100 includes a motion component, a feeding rack 320, and a vacuum box assembly 330. The motion component includes a slide rail 340, a sliding frame 350 mounted on the slide rail 340, a displacement cylinder 360 that drives the sliding frame 350 to move along the slide rail 340, and a linear motor mounted below the slide rail 340. The sliding frame 350 has two parallel feeding racks 320, and the feeding racks 320 stack multiple layers of material boxes 380. The material boxes 380 contain capacitors to be tested. The vacuum box assembly 330 is located next to the feeding racks 320 and is used for vacuuming. The box assembly 330 includes an empty box compartment 390, a first lead screw slide module 400, a first lifting cylinder 410 that moves along the first lead screw slide module 400, a lifting frame 420 installed at the output end of the first lifting cylinder 410, and an empty box suction head 430 disposed on the lifting frame 420. The empty box suction head 430 is used to pick up empty boxes 380 on the feeding rack 320 and put them into the empty box compartment 390. A linear motor is used to push the box 380 to rise and fall, and a displacement cylinder 360 is used to drive the sliding frame 350 to move to switch the feeding rack 320. The feeding rack 320 stacks multiple layers of material boxes 380. After the capacitors to be tested in the top material box 380 are completely conveyed by the conveying mechanism, the first lead screw slide module 400 drives the first lifting cylinder 410 to move above the feeding rack 320. The first lifting cylinder 410 drives the empty box suction head 430 of the lifting rack 420 to pick up the empty material boxes 380 into the empty box bin 390. When all the material boxes 380 of a feeding rack 320 are consumed, the displacement cylinder 360 drives the sliding frame 350 to move and switch to another feeding rack 320. The worker then stacks the material boxes 380 filled with capacitors to be tested on the empty feeding rack 320 again, thus ensuring that the testing process is not interrupted and improving testing efficiency.

[0052] like Figures 6-8As shown, the conveying mechanism includes a first suction assembly 440, a conveying assembly 450, and a second suction assembly 460. The first suction assembly 440 includes a second lead screw module 470, a second lifting cylinder 480 that moves along the second lead screw module 470, and a suction head assembly 490 disposed at the output end of the second lifting cylinder 480. The conveying assembly 450 includes a conveyor belt 500, a conveying motor 510 that drives the conveyor belt 500 to rotate, baffles 520 located on both sides of the conveyor belt 500, and a stop block 530 located at the end of the conveying direction. The second suction assembly 460 includes a cam 540, a suction motor 550 that drives the cam 540 to swing, and a suction head assembly 490 disposed at the output end of the second lifting cylinder 480. 54) A rotatably connected sliding plate 640, a suction head 560 at the bottom of the sliding plate 640, a sliding back of the sliding plate 640 slidably connected to the Y guide rail 650, a sliding back of the Y guide rail 650 slidably connected to the X guide rail 660, a second lead screw module 470 and a second lifting cylinder 480 are used to drive the suction head group 490 to suck up a row of capacitors to be tested from the material box 380 onto the conveyor belt 500, and the suction motor 550 drives the cam 540 to swing and drive the sliding plate 640 to move up and down along the Y guide rail 650 and left and right along the X guide rail 660, thereby driving the suction head 560 to suck up the capacitors to be tested from the conveyor belt 500 one by one into the test slot 140. The second lead screw module 470 and the second lifting cylinder 480 drive the suction head group 490 to first suck up a row of capacitors to be tested from the material box 380 onto the conveyor belt 500. Then, the suction motor 550 drives the cam 540 to drive the suction head 560 to suck up the capacitors to be tested one by one from the conveyor belt 500 into the test tank 140. This can improve the conveying speed and conveying accuracy of the conveying mechanism and ensure that the capacitors to be tested can be quickly and accurately conveyed from the feeding mechanism 100 to the test tank 140.

[0053] like Figure 9 As shown, the material distribution assembly 190 includes a third lead screw module 570, a third lifting cylinder 580 that moves along the third lead screw module 570, and a suction head 560 located at the output end of the third lifting cylinder 580. The third lead screw module 570 and the third lifting cylinder 580 drive the suction head 560 to pick up the capacitors tested on the test turntable 120 and place them into the corresponding column's collection trough 220 according to the test results. This configuration of the material distribution assembly 190 allows for quick and accurate placement of the tested capacitors from the test turntable 120 into the corresponding column's collection trough 220, achieving material distribution while also freeing up space in the test trough 140 to receive capacitors to be tested from the conveying mechanism for the next round of testing, thus improving testing efficiency.

[0054] like Figure 10As shown, the distributor 200 also includes an X-screw module 590 disposed below the collecting plate 210 and a Y-screw module 600 disposed below the X-screw module 590. The X-screw module 590 and the Y-screw module 600 are arranged vertically and are used to convey the collecting plate 210 to the side of the sorting bin 240. By setting up the X-screw module 590 and the Y-screw module 600, the distributor 200 can quickly and accurately convey the collecting plate 210 to the sorting bin 240 when the collecting trough 220 is full of a row of capacitors, thus preparing for the receiving assembly 230 to place the capacitors that have filled a row of the collecting trough 220 into the corresponding sorting bin 240.

[0055] like Figure 1 and Figure 10 As shown, multiple tiered hoppers 240 are arranged in a straight line. The X-screw module 590 and Y-screw module 600 are used to convey the collecting plate 210 to the same straight line as the multiple tiered hoppers 240. The straight arrangement of the tiered hoppers 240 facilitates the setting of the distributor 200 and the receiving assembly 230, making it easier for the receiving assembly 230 to place the capacitors that fill a row of collecting troughs 220 into the corresponding tiered hoppers 240, thus simplifying the machine structure.

[0056] like Figure 11 As shown, the receiving assembly 230 includes a fourth lead screw module 610 positioned above the grading bins 240, a fourth lifting cylinder 620 moving along the fourth lead screw module 610, and a suction head assembly 490 positioned on the fourth lifting cylinder 620. The suction head assembly 490 is used to pick up capacitors filling a row of the collection troughs 220 and transfer them to the corresponding grading bins 240. The receiving assembly 230 drives the suction head assembly 490 to move via the fourth lead screw module 610 and the fourth lifting cylinder 620, thereby picking up capacitors filling a row of the collection troughs 220 and transferring them to the suction head assembly 490 in the corresponding grading bins 240. The structure is simple, easy to control, and provides fast and accurate feeding.

[0057] It should be noted that the fourth lead screw module 610 is also equipped with a fifth lifting cylinder 630. The output end of the fifth lifting cylinder 630 is equipped with a lifting frame 420, on which an empty box suction head 430 is installed. One end of a row of graded material bins 240 is equipped with an empty box bin 390, on which empty boxes 380 are stacked. This empty box bin 390 can be shared with the empty box bin 390 of the feeding mechanism 100, or it can be set separately. The empty box suction head 430 is used to pick up the boxes 380 from the empty box bin 390 and put them into the graded material bins 240. By driving the lifting frame 420 and the empty box suction head 430 to move through the fourth lead screw module 610 and the fifth lifting cylinder 630, the boxes 380 from the empty box bin 390 are picked up and put into the graded material bins 240, which can replenish the graded material bins 240 with empty boxes 380 to load the tested capacitors.

[0058] like Figure 1 As shown, there are two feeding devices. Having two feeding devices allows the tested capacitors to be sorted into more grades according to the test results, which is beneficial for subsequent processing of the capacitors.

[0059] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of the present invention.

Claims

1. A chip capacitor testing machine, characterized in that, include: The feeding device includes a feeding mechanism (100) and a conveying mechanism. The feeding mechanism (100) is used to store the capacitor to be tested, and the conveying mechanism is used to convey the capacitor to be tested from the feeding mechanism (100). The testing device (110) includes a turntable mechanism and a testing mechanism. The turntable mechanism is used to receive the capacitor to be tested from the conveying mechanism. The turntable mechanism includes a test turntable (120) and a rotary motor (130) for driving the test turntable (120) to rotate at equal intervals. The test turntable (120) is evenly provided with a plurality of test slots (140) for accommodating the capacitor to be tested in the circumferential direction. The testing mechanism includes a lifting plate (150) disposed below the turntable mechanism, a lifting cylinder (160) for driving the lifting plate (150) to rise and fall, and a plurality of testing components disposed on the lifting plate (150). Each testing component includes a phase The test needles (170) on both sides of the test slot (140) and the transmission components that drive the two test needles (170) to open or close are respectively used to test the withstand voltage, insulation resistance, capacitance and loss parameters of the capacitor to be tested. The test mechanism also includes a test motor (180) that drives multiple transmission components to move synchronously. The test motor (180) drives multiple transmission components to move synchronously so that the test needles (170) clamp the capacitor to be tested. Then, the lifting plate (150) is lifted by the lifting cylinder (160) so that the capacitor to be tested is in a suspended state for testing. The test turntable (120) has an opening (250) in the middle. The transmission component includes a fixed seat (260) on the lifting plate (150), a lever (270) rotatably connected to the side of the fixed seat (260), and a needle seat (280) rotatably connected to both ends of the lever (270). The needle seat (280) is used to install the test needle (170). One of the needle seats (280) is set through the opening (250), and the other needle seat (280) is set on the outside of the test turntable (120). The side of the needle seat (280) on the outside is provided with a roller (290). An eccentric wheel (300) is provided above the lifting plate (150) to abut against the roller (290). A synchronous pulley (310) coaxial with the eccentric wheel (300) is provided below the lifting plate (150). The synchronous pulley (310) is connected to the test motor (180) through a double-sided synchronous belt. The feeding device includes a feeding mechanism and a receiving mechanism. The feeding mechanism includes a feeding component (190) and a feeder (200). The feeder (200) includes a collecting plate (210). The collecting plate (210) is provided with multiple rows of collecting troughs (220). The feeding component (190) is used to place the capacitors that have been tested on the test turntable (120) into the corresponding column of the collecting trough (220) according to the test results. The receiving mechanism includes a receiving component (230) and multiple graded hoppers (240). The receiving component (230) is used to place the capacitors that fill a column of the collecting trough (220) into the corresponding graded hopper (240).

2. The chip capacitor testing machine according to claim 1, characterized in that, The feeding mechanism (100) includes a motion component, a feeding rack (320), and a vacuum box assembly (330). The motion component includes a slide rail (340), a sliding frame (350) mounted on the slide rail (340), a displacement cylinder (360) for driving the sliding frame (350) to move along the slide rail (340), and a linear motor (370) mounted below the slide rail (340). The sliding frame (350) has two parallel feeding racks (320), and the feeding racks (320) stack multiple layers of material boxes (380). The material boxes (380) contain capacitors to be tested. The vacuum box assembly (330) is located next to the feeding racks (320). The empty box suction assembly (330) includes an empty box compartment (390), a first lead screw slide module (400), a first lifting cylinder (410) that moves along the first lead screw slide module (400), a lifting frame (420) installed at the output end of the first lifting cylinder (410), and an empty box suction head (430) disposed on the lifting frame (420). The empty box suction head (430) is used to suck up empty boxes (380) on the feeding rack (320) into the empty box compartment (390). The linear motor (370) is used to push the box (380) to rise and fall. The displacement cylinder (360) is used to drive the sliding frame (350) to move to switch the feeding rack (320).

3. The chip capacitor testing machine according to claim 2, characterized in that, The conveying mechanism includes a first suction assembly (440), a conveying assembly (450), and a second suction assembly (460). The first suction assembly (440) includes a second lead screw module (470), a second lifting cylinder (480) that moves along the second lead screw module (470), and a suction head assembly (490) disposed at the output end of the second lifting cylinder (480). The conveying assembly (450) includes a conveyor belt (500), a conveying motor (510) that drives the conveyor belt (500) to rotate, baffles (520) located on both sides of the conveyor belt (500), and a stop block (530) located at the end of the conveying direction. The second suction assembly (460) includes a cam (540), a suction motor (550) that drives the cam (540) to swing, and a suction head assembly (460) that rotates with the cam (540). The sliding plate (640) is connected, the suction head (560) at the bottom of the sliding plate (640) is slidably connected to the back of the sliding plate (640) and the back of the Y guide rail (650) is slidably connected to the X guide rail (660). The second lead screw module (470) and the second lifting cylinder (480) are used to drive the suction head group (490) to suck up a row of capacitors to be tested from the material box (380) onto the conveyor belt (500). The suction motor (550) drives the cam (540) to swing and drive the sliding plate (640) to move up and down along the Y guide rail (650) and move left and right along the X guide rail (660), thereby driving the suction head (560) to suck up the capacitors to be tested from the conveyor belt (500) one by one into the test slot (140).

4. The chip capacitor testing machine according to claim 1, characterized in that, The material distribution assembly (190) includes a third lead screw module (570), a third lifting cylinder (580) that moves along the third lead screw module (570), and a suction head (560) disposed at the output end of the third lifting cylinder (580). The third lead screw module (570) and the third lifting cylinder (580) drive the suction head (560) to suck up the tested capacitors on the test turntable (120) and place them into the corresponding column of the collection trough (220) according to the test results.

5. A chip capacitor testing machine according to claim 1, characterized in that, The feeder (200) also includes an X-screw module (590) disposed below the collecting plate (210) and a Y-screw module (600) disposed below the X-screw module (590). The X-screw module (590) and the Y-screw module (600) are arranged perpendicularly to each other. The X-screw module (590) and the Y-screw module (600) are used to convey the collecting plate (210) to the side of the grading bin (240).

6. A chip capacitor testing machine according to claim 5, characterized in that, The multiple tiered hoppers (240) are arranged in a straight line, and the X-screw module (590) and the Y-screw module (600) are used to convey the collecting plate (210) to the same straight line as the multiple tiered hoppers (240).

7. A chip capacitor testing machine according to claim 6, characterized in that, The receiving assembly (230) includes a fourth lead screw module (610) disposed above the grading bin (240), a fourth lifting cylinder (620) moving along the fourth lead screw module (610), and a suction head assembly (490) disposed on the fourth lifting cylinder (620). The suction head assembly (490) is used to pick up capacitors that fill a row of the collection trough (220) and transfer them to the corresponding grading bin (240).

8. A chip capacitor testing machine according to claim 7, characterized in that, The fourth lead screw module (610) is also provided with a fifth lifting cylinder (630). The output end of the fifth lifting cylinder (630) is provided with a lifting frame (420). An empty box suction head (430) is installed on the lifting frame (420). An empty box bin (390) is provided at one end of a row of tiered bins (240). Empty boxes (380) are stacked in the empty box bins (390). The empty box suction head (430) is used to pick up the boxes (380) in the empty box bins (390) and put them into the tiered bins (240).

9. A chip capacitor testing machine according to any one of claims 1-8, characterized in that, The feeding device is provided in two parts.

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