Third order input cutoff point testing method, related systems, and storage media

Abstract

Embodiments of the present application provide a third-order input intercept point test method, a test system and a computer readable storage medium. The third-order input intercept point test method comprises: powering on a low noise amplifier; generating a continuous and directional input signal, and sending the input signal to the low noise amplifier, so that the low noise amplifier amplifies the input signal to obtain an output signal and outputs the output signal, the input signal being provided with two power spectrums of a preset amplitude output; acquiring measurement values of the output signal in real time; collecting measurement values corresponding to all frequency points appearing in a second frequency f2 sweep process, and calculating the measurement values corresponding to each frequency point according to a preset formula to obtain a corresponding third-order input intercept point, the third-order input intercept point being IIP3, and the preset formula being IIP3=P+(P1-P2) / 2. Compared with related technologies, the technical solution of the present application can test and obtain third-order input intercept points of multiple frequency points and has high test efficiency.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of wireless communication frequency point testing, and particularly relates to a third-order input intercept point testing method, a testing system and a computer readable storage medium applied to a low-noise amplifier. BACKGROUND

[0002] In a multi-carrier communication system, due to intermodulation distortion, adjacent channel crosstalk is generated, the system spectral efficiency is reduced, and the bit error rate is deteriorated, so the larger the system capacity is, the higher the requirement for intermodulation distortion is. Among them, the third-order input intercept point (IIP3) is an important parameter for reflecting the intermodulation distortion. The third-order input intercept point is used to ensure the intersection point of the corresponding third harmonic and fundamental wave power when the amplifier is in a linear state. The third-order input intercept point is an important index for measuring linearity or distortion.

[0003] At present, the single frequency point testing method is adopted to test the intermodulation distortion in the prior art.

[0004] However, the single frequency point testing method in the related art has a large amount of measurement on a fixed number of limited frequency points, so in the case of a large number of frequency points, the test time will increase dramatically, resulting in low test efficiency and being unable to realize rapid and comprehensive verification of the performance of the product in the early stage. Therefore, it is necessary to provide a new method and system to solve the above technical problems. SUMMARY

[0005] The purpose of the present application is to overcome the above technical problems, and to provide a third-order input intercept point testing method, a testing system and a computer readable storage medium capable of testing the third-order input intercept point of multiple frequency points and having high test efficiency.

[0006] In a first aspect, an embodiment of the present application provides a third-order input intercept point testing method applied to a low-noise amplifier, which comprises the following steps:

[0007] Step S1, powering on the low-noise amplifier to make the low-noise amplifier work normally;

[0008] Step S2, generating a continuous and directional input signal, and sending the input signal to the low-noise amplifier, so that the low-noise amplifier amplifies the input signal to obtain an output signal and outputs the output signal, the input signal being provided with two power spectrums of a preset amplitude output;

[0009] The input signal has a frequency within a working frequency range of the low noise amplifier, the input signal includes a first signal with a first frequency f1 and a second signal with a second frequency f2, the output power of the first signal and the output power of the second signal are both set as P, f2>f1, the first frequency f1 is a fixed frequency, and the second frequency f2 is a frequency variable which is swept from high to low in a preset frequency range.

[0010] In step S3, a measurement value of the output signal is acquired in real time; the measurement value includes a first output power P1 of the first signal output after amplification by the low noise amplifier and a second output power P2 of the first signal and the second signal output after amplification by the low noise amplifier, the second output power P2 corresponds to a frequency function 2f1-f2.

[0011] In step S4, measurement values corresponding to all frequency points appearing in the process of sweeping the second frequency f2 are collected, and the measurement value corresponding to each frequency point is calculated according to a preset formula to obtain a corresponding third-order input intercept point, the third-order input intercept point is IIP3, the preset formula is IIP3=P+(P1-P2) / 2, and the frequency points include a plurality of frequency points, the frequency function 2f1-f2 of the frequency points corresponds to the second output power P2.

[0012] Preferably, in step S2, the preset frequency range is from a frequency fa1 to a frequency fa2, fa2>fa1, and the sweeping is sweeping the second frequency f2 from the frequency fa2 to the frequency fa1 by N frequencies, N>2, and N is a positive integer.

[0013] Preferably, 10≤N≤30.

[0014] Preferably, step S3 further includes step S30 of adjusting a frequency width of the output signal to acquire the measurement value.

[0015] Preferably, the manner of adjusting the frequency width of the output signal is amplifying the frequency width of the output signal.

[0016] Preferably, in step S2, the input signal is generated by a spectrum sweep generator.

[0017] Preferably, in step S3, the measurement value is acquired by a spectrum analyzer.

[0018] In a second aspect, an embodiment of the present application further provides a test system, the test system applying the third-order input intercept point test method provided by the embodiment of the present application; the test system includes:

[0019] A spectrum scanning generator is configured to generate a continuous and directional input signal; the input signal is provided with two power spectrums of preset amplitude output, the input signal comprises a first signal with a first frequency f1 and a second signal with a second frequency f2, the output power of the first signal and the output power of the second signal are both set as P, f2>f1, the first frequency f1 is a fixed frequency, and the second frequency f2 is a frequency variable which is swept from high to low in a preset frequency range;

[0020] A low noise amplifier is connected to the output end of the spectrum scanning generator, and is configured to receive the input signal, amplify the input signal to obtain an output signal, and output the output signal; wherein the frequency of the input signal is within the working frequency range of the low noise amplifier;

[0021] A spectrum analyzer is connected to the output end of the low noise amplifier, and is configured to obtain a measurement value of the output signal in real time; wherein the measurement value comprises a first output power P1 of the first signal output after amplification by the low noise amplifier and a second output power P2 of the first signal and the second signal output after amplification by the low noise amplifier, the second output power P2 corresponds to a frequency function 2f1-f2;

[0022] A frequency band adjustment controller is connected to the control end of the spectrum scanning generator and the control end of the spectrum analyzer, respectively, and is configured to control and set the spectrum scanning generator to generate a continuous and directional input signal with two power spectrums of preset amplitude output; the frequency band adjustment controller is further configured to adjust the amplitude frequency relationship curve of the first signal, the second signal and the frequency function 2f1-f2 displayed by the spectrum analyzer, so as to obtain the measurement value displayed by the spectrum analyzer in real time.

[0023] Preferably, the test system further comprises a processor electrically connected to the spectrum scanning generator, the spectrum analyzer and the frequency band adjustment controller; the processor is configured to collect measurement values corresponding to all frequency points appearing in the sweeping process of the second frequency f2, calculate the measurement value corresponding to each frequency point according to a preset formula to obtain a corresponding third order input intercept point, the third order input intercept point is IIP3, and the preset formula is IIP3=P+(P1-P2) / 2; the frequency points include a plurality of frequency points, and the frequency function 2f1-f2 of the frequency points corresponds to the second output power P2 one by one.

[0024] In a third aspect, the embodiments of the present application further provide a computer readable storage medium, which stores a computer program. The computer program includes program instructions, and the program instructions are executed by a processor to implement the steps of the third-order input intercept point test method provided by the embodiments of the present application.

[0025] Compared with the prior art, the third-order input intercept point test method, the test system and the computer readable storage medium provided by the embodiments of the present application have the following advantages. The third-order input intercept point test method includes the following steps: step S1, powering on the low noise amplifier to make the low noise amplifier work normally; step S2, generating a continuous and directional input signal, and sending the input signal to the low noise amplifier, so that the low noise amplifier amplifies the input signal to obtain an output signal and outputs the output signal, the input signal being provided with two power spectrums of a preset amplitude output; step S3, acquiring measurement values of the output signal in real time; and step S4, collecting measurement values corresponding to all frequency points appearing in the second frequency f2 sweep process, and calculating the measurement values corresponding to each frequency point according to a preset formula to obtain a corresponding third-order input intercept point, the third-order input intercept point being IIP3, and the preset formula being IIP3=P+(P1-P2) / 2. The third-order input intercept points corresponding to a plurality of frequency points are quickly tested by implementing the above steps S1 to S4, so that the third-order input intercept point test method, the test system and the computer readable storage medium provided by the embodiments of the present application can test and obtain third-order input intercept points of multiple frequency points and have high test efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained without creative labor based on these drawings.

[0027] Figure 1 A flow chart of the third-order input intercept point test method provided for the first embodiment of the present application;

[0028] Figure 2 A frequency relationship diagram of the third-order input intercept point test method provided for the first embodiment of the present application;

[0029] Figure 3 An amplitude-frequency relationship curve diagram of the output signal of the third-order input intercept point test method provided for the first embodiment of the present application;

[0030] Figure 4 A module structure diagram of the test system provided for the second embodiment of the present application;

[0031] Figure 5 A block diagram of a test system provided for Embodiment Three of the present application. DETAILED DESCRIPTION

[0032] The technical solutions in the embodiments of the present application will be clearly and completely described with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art without creative effort belong to the scope of protection of the present application.

[0033] The terms "comprise" and "have" and any variations thereof in the specification and claims of the present application and the description of the drawings are intended to cover not exclusive inclusion. The terms "first", "second", and the like in the specification and claims of the present application or the drawings are used to distinguish different objects, rather than to describe a particular order. In this document, "embodiment or the present embodiment" means that a specific feature, structure or property described in connection with an embodiment can be included in at least one embodiment of the present application. The phrase appears at various places in the specification does not necessarily refer to the same embodiment, nor is it mutually exclusive or alternative to other embodiments. Those skilled in the art explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0034] (Embodiment One)

[0035] The present application provides a third-order input cutoff point test method. The third-order input cutoff point test method is applied to a low noise amplifier. In a multi-carrier communication system, the third-order input cutoff point test method is used to test the third-order input cutoff point (IIP3) of multiple frequency points.

[0036] Referring to Figure 1 , Figure 1 A flowchart of the third-order input cutoff point test method provided for Embodiment One of the present application.

[0037] The third-order input cutoff point test method includes the following steps:

[0038] Step S1, power on the low noise amplifier to make the low noise amplifier work normally.

[0039] Step S2, generate a continuous and directional input signal, and then send the input signal to the low noise amplifier, so that the low noise amplifier amplifies the input signal to obtain an output signal and outputs it.

[0040] The input signal has two power spectrums with preset amplitude outputs. The input signal includes a first signal with a first frequency f1 and a second signal with a second frequency f2. That is, the two power spectrums are the first frequency f1 and the second frequency f2 respectively. The output power of the first signal and the output power of the second signal are both set to P. f2>f1. The first frequency f1 is a fixed frequency. The second frequency f2 is a frequency variable which is swept one by one in a direction from high to low within a preset frequency range.

[0041] Please refer to Figure 2 , the frequency relationship diagram of the third-order input cutoff point test method provided by the embodiment one of the present application is shown. Figure 2

[0042] In the embodiment one, the preset frequency range is from a frequency fa1 to a frequency fa2, and fa2>fa1.

[0043] The sweeping is that the second frequency f2 is swept one by one from the frequency fa2 to the frequency fa1 by N frequencies.

[0044] Please refer to Figure 3 , the amplitude frequency relationship curve diagram of the output signal of the third-order input cutoff point test method provided by the embodiment one of the present application is shown. Figure 3 After the low noise amplifier amplifies the input signal, the output signal waveform as shown in Figure 3 , the direction of the waveform pulse from low frequency to high frequency is 2f1-f2, f1, f2 and 2f2-f1 in turn. Figure 3

[0045] Wherein, N>2, N is a positive integer. In the embodiment one, the range of N is 10≤N≤30. The test efficiency of the sweeping within 10≤N≤30 is higher, and the efficiency is the highest in the compromise between test speed and calculation amount.

[0046] In the embodiment one, the input signal is generated by a frequency spectrum scanning generator.

[0047] Step S3, the measurement value of the output signal is acquired in real time.

[0048] Wherein, the measurement value includes a first output power P1 and a second output power P2 of the first signal output after the low noise amplifier amplifies.

[0049] The second output power P2 is the power corresponding to the frequency function 2f1-f2 when the first signal and the second signal are simultaneously amplified by the low noise amplifier. As shown in Figure 2 ​​The frequency function 2f1-f2 is from low frequency to high frequency, that is, the frequency function 2f1-f2 is from X1 to X2, wherein the power corresponding to f1 amplified at a certain moment is the first output power P1, and the power corresponding to 2f1-f2 at this moment is the second output power P2.

[0050] In the embodiment one, the measurement value is obtained by a spectrum analyzer.

[0051] In the embodiment one, the step S3 further comprises:

[0052] In step S30, the frequency width of the output signal is adjusted to obtain the measurement value. The frequency width of the output signal is amplified to adjust the frequency width of the output signal. The measurement value can be clearly observed in the spectrum analyzer, and the measurement value can be more efficiently obtained.

[0053] In step S4, the measurement values corresponding to all the frequency points appearing in the second frequency f2 sweep process are collected, and the measurement value corresponding to each frequency point is calculated according to a preset formula to obtain a corresponding third-order input intercept point. The third-order input intercept point is IIP3. The preset formula is: IIP3=P+(P1-P2) / 2.

[0054] The frequency points include a plurality of frequency points. The frequency function 2f1-f2 of the frequency points corresponds to the second output power P2. As the second frequency f2 is swept from the frequency fa2 to the frequency fa1 by N frequencies, the values of the frequency points are displayed on the spectrum analyzer, and the recorded values of the frequency points are the measurement values. Through step S4, the third-order input intercept point IIP3 in a wide frequency band can be obtained at one time.

[0055] Through steps S1 to S4, the third-order input intercept point test method of the present application can replace the low-efficiency single frequency point test method of the related art, so that the component size of the intermodulation product IIP3 in the whole frequency range of the product can be quickly verified, the current situation of the product in this aspect can be efficiently and comprehensively mastered, potential impact caused by incomprehensiveness can be avoided, the third-order input intercept point of multiple frequency points can be tested and obtained, and the test efficiency is high.

[0056] (Embodiment two)

[0057] The embodiment two of the present application further provides a test system 100. The test system 100 applies the third-order input intercept point test method provided in the embodiment one.

[0058] Please refer to Figure 4 as shown, Figure 4A block diagram of a test system 100 for embodiment two of the present application.

[0059] The test system 100 comprises a spectrum scanning generator 1, a low noise amplifier 2, a spectrum analyzer 3 and a frequency band adjustment controller 4.

[0060] The spectrum scanning generator 1 is configured to generate a continuous and directional input signal with two power spectra of preset amplitude output.

[0061] The input signal comprises a first signal with a first frequency f1 and a second signal with a second frequency f2.

[0062] The output power of the first signal and the output power of the second signal are both set to P. f2>f1. The first frequency f1 is a fixed frequency, and the second frequency f2 is a frequency variable that is swept from high to low within a preset frequency range.

[0063] The input end of the low noise amplifier 2 is connected to the output end of the spectrum scanning generator 1. The low noise amplifier 2 is configured to receive the input signal and amplify the input signal to obtain an output signal and output the output signal. The frequency of the input signal is within the working frequency band of the low noise amplifier 2.

[0064] The input end of the spectrum analyzer 3 is connected to the output end of the low noise amplifier 2. The spectrum analyzer 3 is configured to obtain measurement values of the output signal in real time. The measurement values include the first output power P1 and the second output power P2 of the first signal output by the low noise amplifier 2 after amplification. The second output power P2 is the power corresponding to the frequency function 2f1-f2 of the first signal and the second signal output by the low noise amplifier 2 after amplification.

[0065] The output end of the frequency band adjustment controller 4 is connected to the control end of the spectrum scanning generator 1 and the control end of the spectrum analyzer 3, respectively.

[0066] The frequency band adjustment controller 4 is configured to control and set the spectrum scanning generator 1 to generate a continuous and directional input signal with two power spectra of preset amplitude output. The frequency band adjustment controller 4 is also configured to adjust the spectrum analyzer 3 to display the amplitude-frequency relationship curves of the first signal, the second signal and the frequency function 2f1-f2, so as to obtain the measurement values displayed in the spectrum analyzer 3 in real time.

[0067] It should be noted that the spectrum scanning generator 1, the low noise amplifier 2, the spectrum analyzer 3 and the frequency band adjustment controller 4 adopted in the present application are all instruments and equipment commonly used in the field, and the corresponding specific indicators and models are adjusted according to the actual application, and here, no detailed description is made.

[0068] It can be understood that the contents in the second embodiment of the test system 100 described above are all applicable to the third-order input intercept point test method of the first embodiment, the functions specifically realized by the second embodiment of the test system 100 are the same as those of the first embodiment of the third-order input intercept point test method, and the beneficial effects achieved are also the same as those of the first embodiment of the third-order input intercept point test method.

[0069] (Embodiment three)

[0070] The third embodiment of the present application also provides a test system 200. The test system 200 of the third embodiment is basically the same as the test system 100 in the second embodiment, and the difference between the test system 200 of the third embodiment and the test system 100 in the second embodiment is that:

[0071] The test system 100 further comprises a processor 5.

[0072] The processor 5 is electrically connected with the spectrum scanning generator 1a, the spectrum analyzer 3a and the frequency band adjustment controller 4a respectively.

[0073] The processor 5 is configured to collect all the measurement values corresponding to the frequency points appearing in the second frequency f2 sweep process, and then calculate each measurement value corresponding to the frequency point according to a preset formula to obtain a corresponding third-order input intercept point, the third-order input intercept point being IIP3, and the preset formula being IIP3=P+(P1-P2) / 2. The frequency points include a plurality of frequency points, and the frequency function 2f1-f2 of the frequency points is in one-to-one correspondence with the second output power P2.

[0074] That is, when implementing the third-order input intercept point test method, the test system 100 in the second embodiment is calculated manually, while the test system 200 in the third embodiment is calculated by the processor 5. Therefore, the test system 200 using the processor 5 is good in test automation and higher in test efficiency.

[0075] (Embodiment four)

[0076] The fourth embodiment of the present application also provides a computer readable storage medium, which stores a computer program, the computer program comprising program instructions, the program instructions being executed by a processor to implement the steps in the third-order input intercept point test method described above.

[0077] Those skilled in the art can understand that all or part of the processes in the third-order input intercept point test method of the test system 100 of embodiment two and the test system 200 of embodiment three can be completed by instructing the relevant hardware through a computer program. The program can be stored in a computer-readable storage medium, and when the program is executed, the program can include the processes of the embodiments of the method. The storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), a random access memory (RAM), or the like.

[0078] The embodiments mentioned in the embodiments of the present application are for the convenience of description. The above disclosure is only the preferred embodiments of the present application, and of course cannot limit the scope of the rights of the present application. Therefore, equivalent changes made according to the claims of the present application still fall within the scope of the present application.

[0079] Compared with the prior art, the third-order input intercept point test method, the test system and the computer-readable storage medium of the present application, the third-order input intercept point test method implements the following steps: step S1, powering on the low noise amplifier to make the low noise amplifier work normally; step S2, generating a continuous and directional input signal, and then sending the input signal to the low noise amplifier, so that the low noise amplifier amplifies the input signal to obtain an output signal and outputs it, the input signal is provided with two power spectrums of a preset amplitude output; step S3, acquiring the measurement value of the output signal in real time; step S4, collecting the measurement values corresponding to all frequency points appearing in the second frequency f2 sweep process, and then calculating the measurement value corresponding to each frequency point according to a preset formula to obtain a corresponding third-order input intercept point, the third-order input intercept point is IIP3, and the preset formula is: IIP3=P+(P1-P2) / 2. By implementing the above steps S1 to S4, the third-order input intercept points corresponding to multiple frequency points are quickly tested, so that the third-order input intercept point test method, the test system and the computer-readable storage medium of the present application can test and obtain the third-order input intercept points of multiple frequency points and have high test efficiency.

[0080] The above is only the embodiment of the present application, and it should be pointed out that those skilled in the art can make improvements without departing from the inventive concept, but these all belong to the protection scope of the present application.

Claims

1. A third-order input cutoff point testing method, applied to low-noise amplifiers, characterized in that, The third-order input cutoff point test method includes the following steps: Step S1: Power on the low-noise amplifier to enable it to operate normally. Step S2: Generate a continuous and directional input signal, and then send the input signal to the low noise amplifier so that the low noise amplifier amplifies the input signal to obtain an output signal and outputs it. The input signal has two power spectra with preset amplitude output. The frequency of the input signal is within the operating frequency band of the low noise amplifier. The input signal includes a first signal with a first frequency f1 and a second signal with a second frequency f2. The output power of the first signal and the output power of the second signal are both set to P, f2>f1. The first frequency f1 is a fixed frequency, and the second frequency f2 is a frequency variable that is swept from high to low within a preset frequency range. Step S3: Real-time acquisition of the measured value of the output signal; wherein, the measured value includes the first output power P1 and the second output power P2 output by the first signal after amplification by the low noise amplifier, and the second output power P2 is the power corresponding to the frequency function 2f1-f2 output by the first signal and the second signal simultaneously after amplification by the low noise amplifier; Step S4: Collect the measurement values ​​corresponding to all frequency points that appear during the second frequency f2 sweep process, and then calculate the measurement value corresponding to each frequency point according to the preset formula to obtain the corresponding third-order input cutoff point. The third-order input cutoff point is IIP3, and the preset formula is: IIP3=P+(P1-P2) / 2; the frequency points include multiple ones, and the frequency function 2f1-f2 of the frequency points corresponds one-to-one with the second output power P2.

2. The third-order input cutoff point testing method according to claim 1, characterized in that, In step S2, the preset frequency range is from frequency fa1 to frequency fa2, where fa2 > fa1; the frequency sweep is the second frequency f2 sweeping from frequency fa2 to frequency fa1 one by one according to N frequencies, where N > 2 and N is a positive integer.

3. The third-order input cutoff point testing method according to claim 2, characterized in that, 10≤N≤30。 4. The third-order input cutoff point testing method according to claim 1, characterized in that, Step S3 further includes: Step S30: Adjust the bandwidth of the output signal to obtain the measured value.

5. The third-order input cutoff point testing method according to claim 4, characterized in that, The bandwidth of the output signal is adjusted by amplifying the bandwidth of the output signal.

6. The third-order input cutoff point testing method according to claim 1, characterized in that, In step S2, the input signal is generated by a spectrum scanning generator.

7. The third-order input cutoff point testing method according to claim 1, characterized in that, In step S3, the measured value is obtained through a spectrum analyzer.

8. A testing system, characterized in that, The test system applies the third-order input cutoff point test method as described in any one of claims 1 to 7; The testing system includes: A spectrum scanning generator is used to generate a continuous and directional input signal; the input signal has two power spectra with preset amplitude output, the input signal includes a first signal with a first frequency f1 and a second signal with a second frequency f2, the output power of the first signal and the output power of the second signal are both set to P,f2>f1, the first frequency f1 is a fixed frequency, and the second frequency f2 is a frequency variable that is swept from high to low within a preset frequency range; A low-noise amplifier, the input of which is connected to the output of the spectrum scanning generator, is used to receive the input signal, amplify the input signal to obtain an output signal, and output the signal; wherein the frequency of the input signal is within the operating frequency band of the low-noise amplifier. A spectrum analyzer, the input of which is connected to the output of the low-noise amplifier, is used to acquire the measured value of the output signal in real time; wherein, the measured value includes a first output power P1 and a second output power P2 output by the first signal after being amplified by the low-noise amplifier, and the second output power P2 is the power corresponding to the frequency function 2f1-f2 output by the first signal and the second signal simultaneously after being amplified by the low-noise amplifier; A frequency band adjustment controller is provided, the output of which is connected to the control terminal of the spectrum scanning generator and the control terminal of the spectrum analyzer. The frequency band adjustment controller is used to control and set the input signals of the two power spectra of the spectrum scanning generator to generate a continuous directional preset amplitude output. The frequency band adjustment controller is also used to adjust the amplitude-frequency relationship curve of the first signal, the second signal and the frequency function 2f1-f2 displayed by the spectrum analyzer to obtain the measured values ​​displayed in the spectrum analyzer in real time.

9. The testing system according to claim 8, characterized in that, The test system further includes a processor, which is electrically connected to the spectrum scanning generator, the spectrum analyzer, and the frequency band adjustment controller. The processor is used to collect the measurement values ​​corresponding to all frequency points that appear during the second frequency f2 frequency sweep process, and then calculate the measurement value corresponding to each frequency point according to a preset formula to obtain the corresponding third-order input cutoff point. The third-order input cutoff point is IIP3, and the preset formula is: IIP3=P+(P1-P2) / 2. There are multiple frequency points, and the frequency function 2f1-f2 of each frequency point corresponds one-to-one with the second output power P2.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, which includes program instructions that, when executed by a processor, implement the steps of the third-order input cutoff point test method as described in any one of claims 1-7.

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