A radio frequency device testing system, method and device

Abstract

A radio frequency device testing system, method and apparatus, applied in the field of electronic technology, including testing equipment, a transceiver, a coupler and a radio frequency device. The testing equipment is used to receive a test command from a user interaction interface, generate a test instruction according to the test command and send it to the transceiver, and determine the performance of the radio frequency device according to the coupling power signal from the transceiver; the transceiver is used to send a transmission power signal to the radio frequency device according to the test instruction, and return the coupling power signal from the coupler to the testing equipment; the radio frequency device is used to perform radio frequency processing on the transmission power signal and send it to the coupler; the coupler is used to radiate the radio frequency processed transmission power signal from the radio frequency device and generate a coupling power signal and return it to the transceiver. This solution automatically generates a test instruction according to the test command and sends it to the transceiver, which can improve the test efficiency and effectively reduce the manpower cost required for reliability testing of radio frequency devices.

Description

Technical Field

[0001] The present invention relates to the field of electronic technology, and in particular to a radio frequency device testing system, method and device. Background Art

[0002] With the rapid development of the domestic terminal market, there is an increasing demand for reliability testing of RF devices in terminals. Reliability testing of RF devices in the R&D stage can help objectively evaluate the design quality, material quality, and process quality of RF devices; reliability testing of RF devices in the mass production stage can help regular assessment and management of the quality of RF devices.

[0003] At present, the reliability test of RF devices is usually performed by manually inputting test instructions. This method has a complex process, low test efficiency, and consumes a lot of human resources and time.

[0004] In summary, there is a need for a radio frequency device testing system to solve the problem in the prior art that radio frequency devices require manual testing and have low testing efficiency. Summary of the invention

[0005] The present invention provides a radio frequency device testing system, method and device, which are used to solve the problem in the prior art that radio frequency devices need to be tested manually and the testing efficiency is low.

[0006] In the first aspect, the present invention provides a radio frequency device test system, including a test device, a transceiver, a coupler and a radio frequency device. The transceiver is connected to the test device, the radio frequency device and the coupler respectively, and the radio frequency device is also connected to the coupler; the test device is used to receive a test command from a user interaction interface, generate a test instruction according to the test command, and send it to the transceiver, and determine the performance of the radio frequency device according to the coupling power signal from the transceiver; the transceiver is used to send a transmission power signal to the radio frequency device according to the test instruction, and return the coupling power signal from the coupler to the test device; the radio frequency device is used to perform radio frequency processing on the transmission power signal and send it to the coupler; the coupler is used to radiate the radio frequency processed transmission power signal from the radio frequency device, and generate a coupling power signal according to the radiated power signal and return it to the transceiver.

[0007] In the above scheme, the test device can receive a test command from the user interaction interface, generate a test instruction according to the test command, and then automatically send the generated test instruction to the transceiver. In contrast, the prior art requires a technician to manually input a test instruction and then send the test instruction to the transceiver. However, in the reliability test of a radio frequency device, it is necessary to perform a durability test on the radio frequency device to be tested, and therefore, it is necessary to send the test instruction to the transceiver multiple times. Therefore, the prior art requires a technician to manually input the test instruction and send the instruction multiple times, which is time-consuming and has low test efficiency. This scheme can improve the test efficiency and effectively reduce the manpower cost required for reliability testing of radio frequency devices by automatically generating a test instruction according to the test command and then automatically sending the generated test instruction to the transceiver.

[0008] In an optional manner, before generating a test instruction according to a test command, the test device is also used to: send a path instruction to a transceiver; the transceiver is also used to: send a tolerance power to the RF device according to the path instruction, the tolerance power being within an operating power range of the RF device; the RF device is also used to: open a hardware path of the RF device according to the tolerance power.

[0009] In the above scheme, before the test device generates a test instruction according to the test command, that is, before the test device performs a reliability test on the RF device, it is necessary to determine whether the RF device can work normally. Therefore, the test device sends a path instruction to the transceiver, and the transceiver sends a tolerance power to the RF device according to the path instruction so that the RF device opens the hardware path. Afterwards, the return result received by the test device is used to determine whether the RF device can work normally. This scheme can screen out RF devices that work normally for further reliability testing by judging in advance whether the RF device can work normally, thereby improving the test efficiency.

[0010] In an optional manner, when the radio frequency device is a power amplifier: the test command includes the sending interval time of the test instruction, the number of cycles of the test instruction, and the gain switching coefficient of the power amplifier.

[0011] In the above scheme, when the RF device is a power amplifier, the test command includes the test instruction sending interval, the number of test instruction cycles, and the gain coefficient of the power amplifier. Among them, the test instruction sending interval can be used to indicate the frequency of the test device sending the test instruction; the number of test instruction cycles can be used to indicate the frequency of the test device sending the test instruction; the power amplifier refers to the number of times the gain of the power amplifier (that is, the RF device) is switched.

[0012] In an optional manner, the test device is specifically used to determine the performance of the radio frequency device according to the coupling power signal and the transmission power signal from the transceiver, as well as the preset power threshold and the preset power consumption threshold.

[0013] In the above solution, when the RF device is a power amplifier, the test equipment compares the coupled power signal and the transmitted power signal received from the transceiver with the preset power threshold and the preset power consumption threshold, so as to determine the performance of the power amplifier.

[0014] In an optional manner, when the radio frequency device is a radio frequency switch: the test command includes an interval time of the test instruction, a number of cycles of the test instruction, and a transmission path of the test instruction.

[0015] In the above scheme, when the RF device is an RF switch, the test command includes the sending interval of the test instruction, the number of cycles of the test instruction, and the transmission path of the test instruction. Among them, the sending interval of the test instruction can be used to indicate the frequency of the test device sending the test instruction; the number of cycles of the test instruction can be used to indicate the frequency of the test device sending the test instruction; the transmission path of the test instruction refers to the transmission path of the RF switch.

[0016] In an optional manner, the testing device is specifically used to determine the performance of the radio frequency device according to the register address from the transceiver and the preset register address.

[0017] In the above solution, when the RF device is a RF switch, the test equipment compares the register address received from the transceiver with the preset register address, thereby determining the performance of the RF switch.

[0018] In an optional manner, the test device is specifically used to: generate a test instruction in a format corresponding to the chip type according to the chip type of the chip deployed in the radio frequency device.

[0019] In the above scheme, the types of chips deployed in the RF device are different, and the formats of test instructions that can be recognized by different types of chips are also different. Therefore, by generating test instructions in the format corresponding to the chip type according to the type of chip deployed by the RF device, the test instructions can be correctly identified, so that the RF device can be tested.

[0020] In an optional manner, the test device is further used to receive coupling power signals when the radio frequency device is located in different environments, and determine the performance of the radio frequency device according to the coupling power signals in different environments.

[0021] In the above solution, the test equipment can determine the performance of the RF device in different environments by receiving the coupled power signals when the RF device is in different environments.

[0022] In a second aspect, the present invention provides a method for testing a radio frequency device, comprising a test device, a transceiver, a coupler and a radio frequency device, the method comprising: receiving a test command from a user interaction interface through the test device; generating a test instruction through the test device according to the test command; sending a transmission power signal to the radio frequency device through the transceiver according to the test instruction; performing radio frequency processing on the transmission power signal through the radio frequency device; radiating the transmission power signal after radio frequency processing through the coupler, and generating a coupled power signal based on the radiated power signal; receiving the coupled power signal through the transceiver and returning it to the test device; determining the performance of the radio frequency device through the test device based on the coupled power signal.

[0023] Optionally, the method also includes: sending a path instruction to the transceiver through a test device; sending a tolerance power to the RF device through the transceiver according to the path instruction, the tolerance power being within an operating power range of the RF device; and opening a hardware path of the RF device through the RF device according to the tolerance power.

[0024] Optionally, when the RF device is a power amplifier: the test command includes the sending interval time of the test instruction, the number of cycles of the test instruction, and the gain switching coefficient of the power amplifier.

[0025] Optionally, determining the performance of the RF device by the test device based on the coupling power signal includes: determining the performance of the RF device by the test device based on the coupling power signal and the transmission power signal, as well as a preset power threshold and a preset power consumption threshold.

[0026] Optionally, when the RF device is a RF switch: the test command includes an interval time of the test instruction, a number of cycles of the test instruction, and a transmission path of the test instruction.

[0027] Optionally, determining the performance of the radio frequency device by the test device according to the coupling power signal includes: determining the performance of the radio frequency device according to a received register address of the radio frequency device and a preset register address.

[0028] Optionally, generating a test instruction by the test device according to the test command includes: generating the test instruction in a format corresponding to the chip type by the test device according to the test command and the chip type of the chip deployed by the radio frequency device.

[0029] Optionally, the method further includes: receiving, by the test device, a coupling power signal when the radio frequency device is located in different environments, and determining the performance of the radio frequency device according to the coupling power signals in the different environments.

[0030] In a third aspect, the present invention provides a radio frequency device testing device, the radio frequency device testing device comprising: an acquisition unit, Used for Acquire a test command from a user interaction interface; a processing unit is used to generate a test instruction according to the test command; according to the test instruction, send a transmission power signal to the radio frequency device; perform radio frequency processing on the transmission power signal; radiate the transmission power signal after radio frequency processing, and generate a coupling power signal according to the radiated power signal; after receiving the coupling power signal, return it to the test device; and determine the performance of the radio frequency device according to the coupling power signal.

[0031] Optionally, the processing unit is specifically used to send a path instruction to the transceiver through a test device; according to the path instruction, send a tolerance power to the RF device through the transceiver, and the tolerance power is within the operating power range of the RF device; according to the tolerance power, open the hardware path of the RF device through the RF device.

[0032] Optionally, when the RF device is a power amplifier: the test command includes the sending interval time of the test instruction, the number of cycles of the test instruction, and the gain switching coefficient of the power amplifier.

[0033] Optionally, the processing unit is specifically used to determine the performance of the radio frequency device through the test equipment according to the coupling power signal and the transmission power signal, as well as a preset power threshold and a preset power consumption threshold.

[0034] Optionally, when the RF device is a RF switch: the test command includes an interval time of the test instruction, a number of cycles of the test instruction, and a transmission path of the test instruction.

[0035] Optionally, the processing unit is specifically used to determine the performance of the radio frequency device according to the received register address of the radio frequency device and a preset register address.

[0036] Optionally, the processing unit is specifically configured to generate, through the test device, the test instruction in a format corresponding to the chip type according to the test command and the chip type of the chip deployed in the radio frequency device.

[0037] Optionally, the processing unit is specifically used to receive, through the test equipment, coupling power signals of the radio frequency device when the device is located in different environments, and determine the performance of the radio frequency device according to the coupling power signals in the different environments.

[0038] In a fourth aspect, the present invention provides a computing device comprising at least one processor and at least one memory, wherein the memory stores a computer program, and when the program is executed by the processor, the processor executes any RF device testing method described in the second aspect.

[0039] In a fifth aspect, the present invention further provides a computer-readable storage medium, wherein the storage medium stores a program, and when the program is run on a computer, the computer implements any of the radio frequency device testing methods described in the second aspect.

[0040] For the beneficial effects of the second to fifth aspects mentioned above, please refer to the technical effects that can be achieved by the corresponding design in the first aspect mentioned above, and no further details will be given here. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative labor.

[0042] Figure 1 A schematic diagram of an application scenario of a radio frequency device testing system provided by the present invention;

[0043] Figure 2 A schematic diagram of a radio frequency device testing system provided by the present invention;

[0044] Figure 3 A schematic diagram of a radio frequency device testing system provided by the present invention when the radio frequency device is a power amplifier;

[0045] Figure 4 A schematic diagram of a radio frequency device testing system provided by the present invention when the radio frequency device is a radio frequency switch;

[0046] Figure 5 A structural diagram of a radio frequency device testing device provided by an embodiment of the present invention;

[0047] Figure 6 A schematic diagram of the structure of a computing device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0048] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0049] RF devices refer to devices used to process RF signals. RF signals, also known as high-frequency electrical signals, usually range from millions of hertz to several gigahertz. Common RF devices include power amplifiers and RF switches, which are widely used in various communication devices, such as mobile phones, wireless network routers, and satellite communication systems.

[0050] As described in the background art, currently, reliability testing of radio frequency devices is usually performed by manually inputting test instructions. This method has a complex process, low test efficiency, and consumes a lot of human resources and time.

[0051] In view of this, an embodiment of the present invention provides a radio frequency device testing system to solve the problem in the prior art that radio frequency devices need to be tested manually and the testing efficiency is low.

[0052] like Figure 1 As shown, it is a schematic diagram of an application scenario of a radio frequency device test system provided by an embodiment of the present invention. The application scenario includes a test device 101 and a device under test 102. Among them, the test device 101 can communicate with the device under test 102, for example, the test device 101 is connected to at least one device under test 102 by communication. Exemplarily, the test device 101 can communicate with the device under test 102 by means of a universal serial bus (USB) connection line.

[0053] Specifically, the device under test 102 includes a radio frequency device. The device under test 102 may be a mobile terminal such as a mobile phone, a personal computer (PC), a tablet computer (PAD), or a personal digital assistant (PDA).

[0054] The test device 101 is used to receive a test command from a user interaction interface, generate a test instruction according to the test command, send the test instruction to the device under test 102 , and determine the performance of the radio frequency device according to the result returned by the device under test 102 .

[0055] Specifically, the test device 101 may be a terminal device such as a mobile phone, a personal computer, a tablet computer, a PDA, a laptop computer, etc. A radio frequency test program may be installed in the terminal device 101, or a browser application may be run in the terminal device 101, and a radio frequency test program may be run in the browser, or a small program application may be run in the terminal device 101, and a radio frequency test program may be run in the small program application.

[0056] like Figure 2 FIG. 2 is a schematic diagram of a radio frequency device test system provided by an embodiment of the present invention. The radio frequency device test system includes a test device 201, a transceiver 202, a radio frequency device 203 and a coupler 204. Figure 1 The device under test 102 includes a transceiver 202, a radio frequency device 203 and a coupler 204. In detail, the transceiver 202 is connected to the test device 201, the radio frequency device 203 and the coupler 204 respectively, and the radio frequency device 203 is also connected to the coupler 204.

[0057] In the above example, the test device 201 is used to receive a test command from a user interface, generate a test instruction according to the test command, and send it to the transceiver 202 , and determine the performance of the RF device according to the coupling power signal from the transceiver 202 .

[0058] The transceiver 202 is used to receive the test instruction sent by the test device 201, and send a corresponding transmission power signal to the radio frequency device 203 according to the test instruction, and return the coupling power signal from the coupler 204 to the test device 201;

[0059] The radio frequency device 203 is used to perform radio frequency processing on the transmission power signal emitted by the radio frequency device 203 and send the processed transmission power signal to the coupler 204;

[0060] The coupler 204 is used to radiate the transmission power signal after RF processing from the RF device 203 , and generate a coupled power signal according to the radiated power signal and return it to the transceiver 202 .

[0061] In a possible implementation manner, the radio frequency device testing system further includes an antenna 205 , which is connected to the coupler 204 and is used to radiate a signal from the coupler 204 .

[0062] In the above scheme, the test device can receive a test command from the user interaction interface, generate a test instruction according to the test command, and then automatically send the generated test instruction to the transceiver. In contrast, the prior art requires a technician to manually input a test instruction and then send the test instruction to the transceiver. However, in the reliability test of a radio frequency device, it is necessary to perform a durability test on the radio frequency device to be tested, and therefore, it is necessary to send the test instruction to the transceiver multiple times. Therefore, the prior art requires a technician to manually input the test instruction and send the instruction multiple times, which is time-consuming and has low test efficiency. This scheme can improve the test efficiency and effectively reduce the manpower cost required for reliability testing of radio frequency devices by automatically generating a test instruction according to the test command and then automatically sending the generated test instruction to the transceiver.

[0063] In a possible implementation, before generating a test instruction according to a test command, the test device 201 is further configured to: send a path instruction to the transceiver 202;

[0064] Specifically, before the test device generates a test instruction according to the test command, that is, before the test device performs a reliability test on the RF device, it is necessary to determine whether the RF device can work normally. Therefore, the test device 201 sends a path instruction to the transceiver 202 to enable the transceiver 202 to transmit the tolerance power of the RF device, thereby opening the hardware path of the RF device.

[0065] Among them, the hardware path of the RF device refers to the physical circuit used to transmit, amplify or detect RF signals. The hardware path can be a combination of physical structures such as electronic components, circuit boards, connectors, antennas, etc. These physical structures are usually used to implement the functions of the RF device, such as amplifying signals, filtering signals, and combining signals. The hardware paths of RF devices can be divided into two categories: single-ended paths and differential paths. A single-ended path refers to a path with a single-ended signal as input and output. A differential path refers to a path with a differential signal as input and output.

[0066] The transceiver 202 is further used to: send a tolerance power to the radio frequency device 203 according to the path instruction, where the tolerance power is within the working power range of the radio frequency device 203;

[0067] Specifically, the transceiver 202 sends the tolerance power to the RF device 203 according to the received path instruction so that the RF device 203 opens the hardware path, and the transceiver 202 receives the coupling power of the coupler 204 and returns the coupling power signal from the coupler 204 to the test equipment 201 .

[0068] The radio frequency device 203 is further used to open a hardware path of the radio frequency device according to the allowable power.

[0069] Afterwards, the test device 201 can determine whether the RF device 203 can work normally by receiving the coupling power signal of the coupler 204 returned by the transceiver 202. In the embodiment of the present invention, by first determining whether the RF device can work normally, the RF devices that work normally can be screened out for further reliability testing, thereby improving the test efficiency.

[0070] In a possible implementation, the radio frequency device may be a power amplifier. The power amplifier is used to increase the level of an input power signal and convert it into a larger output power signal, and is widely used in industrial systems. In the reliability test of the power amplifier, the performance of the power amplifier can be determined by comparing the ratio of the power received by the power amplifier to the power transmitted by the power amplifier with a preset power threshold, or by calculating the power consumption of the power amplifier and comparing it with a preset power consumption threshold to determine whether the performance of the power amplifier meets the standard.

[0071] like Figure 3 , which is a schematic diagram of a radio frequency device test system when the radio frequency device provided by an embodiment of the present invention is a power amplifier. The radio frequency device test system includes a test device 301, a transceiver 302, a power amplifier 303 and a coupler 304. The transceiver 302 is connected to the test device 301, the power amplifier 303 and the coupler 304 respectively, and the power amplifier 303 is also connected to the coupler 304.

[0072] In the above example, the test device 301 is used to receive a test command from a user interface, generate a test instruction according to the test command, and send it to the transceiver, and determine the performance of the power amplifier 303 according to the coupling power signal and the transmission power signal from the transceiver 302, as well as the preset power threshold and the preset power consumption threshold. The coupling power signal can be used to indicate the power transmitted by the power amplifier. The test device 301 can determine the power consumption of the power amplifier according to the received coupling power signal and the transmission power signal.

[0073] Optionally, the test command includes the test instruction sending interval, the number of test instruction cycles, and the gain switching coefficient of the power amplifier. Among them, the test instruction sending interval can be used to indicate the frequency of the test device sending the test instruction; the number of test instruction cycles can be used to indicate the frequency of the test device sending the test instruction; the power amplifier refers to the number of times the gain of the power amplifier (ie, the RF device) is switched.

[0074] In a possible implementation, it can be determined whether the performance of the power amplifier meets the standard by simultaneously determining the ratio of the power received by the power amplifier to the power transmitted by the power amplifier and the power consumption of the power amplifier. Exemplarily, the preset power threshold can be set to ±1.5dB of the power value of the transmitted power signal, and the preset power consumption threshold can be set to 50mA. When the power value of the coupled power signal received by the test device 301 is within the range of ±1.5dB of the power value of the transmitted power signal, and the power consumption of the power amplifier obtained by calculation differs from the value of the single-unit test report issued by the manufacturer of the power amplifier within 50mA, it is determined that the performance of the power amplifier meets the standard.

[0075] For a detailed introduction of the transceiver 302, please refer to the aforementioned introduction of the transceiver 202, which will not be repeated here.

[0076] For a detailed description of the coupler 304 , please refer to the aforementioned description of the transceiver 202 , which will not be repeated here.

[0077] In the above solution, when the RF device is a power amplifier, the test equipment compares the coupled power signal and the transmitted power signal received from the transceiver with the preset power threshold and the preset power consumption threshold, so as to determine the performance of the power amplifier.

[0078] In a possible implementation manner, the radio frequency device testing system further includes an antenna 305 , which is connected to the coupler 304 and is used to radiate the signal from the coupler 304 .

[0079] In one possible implementation, the RF device may be an RF switch. An RF switch is a switch used to control RF signals. It can control the transmission of RF signals by opening or closing a circuit. Such switches are commonly used in radio devices, such as mobile phones and wireless network routers, to control the transmission and reception of signals. RF switches can be used to improve the energy efficiency of devices and protect circuits from interference. Reliability testing of RF switches may also be referred to as Mobile Industry Processor Interface (MIPI) device testing. MIPI is an interface standard designed specifically for mobile devices that is used to connect various components, including processors, displays, cameras, and storage devices, in smartphones, tablets, and other mobile devices. The MIPI interface standard can provide high-speed, low-power, and high-reliability data transmission, and is therefore widely used in mobile devices.

[0080] In the reliability test of the RF switch, the performance of the RF switch can be judged by reading the register address of the RF switch and comparing it with the preset register address. The register of the RF switch is a memory used to control the state of the RF switch. It can be used to store the on or off state of the RF switch and modify the state of the RF switch when necessary. The register of the RF switch is usually composed of one or more chips and contains many programmable storage cells. These storage cells can be programmed to be on or off in order to control the state of the RF switch. The register of the RF switch is usually composed of one or more input terminals and one or more output terminals. The input terminal is used to receive external control signals, and the output terminal is used to output control signals. The register of the RF switch can be implemented using various technologies, such as CMOS, TTL, FPGA, etc. Their type and performance depend on the technology and design used.

[0081] like Figure 4 , a schematic diagram of a radio frequency device test system when the radio frequency device provided by an embodiment of the present invention is a radio frequency switch. The radio frequency device test system includes a test device 401, a transceiver 402, a radio frequency switch 403 and a coupler 404. The transceiver 402 is connected to the test device 401, the radio frequency switch 403 and the coupler 404 respectively, and the radio frequency switch 403 is also connected to the coupler 404.

[0082] In the above example, the test device 401 is used to receive a test command from a user interface, generate a test instruction according to the test command, and send it to the transceiver 402, and determine the performance of the RF switch 403 according to the register address from the transceiver and the preset register address.

[0083] Optionally, the test command includes the interval time of the test instruction, the number of cycles of the test instruction, and the transmission path of the test instruction. Among them, the interval time of sending the test instruction can be used to indicate the frequency of the test device sending the test instruction; the number of cycles of the test instruction can be used to indicate the frequency of the test device sending the test instruction; the transmission path of the test instruction refers to the transmission path of the RF switch.

[0084] In a possible implementation, whether the performance of the RF switch meets the standard can be determined by determining whether the register address of the RF switch read is consistent with the preset register address. The preset register address may be a register address in the specification of the RF switch. When the register address of the RF switch read is consistent with the preset register address, the performance of the RF switch is determined to meet the standard; when the register address of the RF switch read is inconsistent with the preset register address, the performance of the RF switch is determined to be not up to standard.

[0085] In an optional manner, the test device is specifically used to: generate a test instruction in a format corresponding to the chip type according to the chip type of the chip deployed in the radio frequency device.

[0086] For example, when the chip type is a MediaTek Inc (MTK) chip, the format of the test instruction starts with an AT instruction. An AT instruction is a command used to control a terminal device (such as a module) whose chip type is an MTK chip. By setting various parameters in the instruction, the terminal device can be controlled to perform various operations.

[0087] For example, when the chip type is a Qualcomm chip, the format of the test instruction starts with a diags instruction. The diags instruction is a command for controlling a terminal device (such as a module) whose chip type is a Qualcomm chip. By setting various parameters in the instruction, the terminal device can be controlled to perform various operations.

[0088] In the above scheme, the chip types deployed by the RF device are different, and the formats of test instructions that can be recognized by different types of chips are also different. Therefore, by generating test instructions in the format corresponding to the chip type according to the chip type deployed by the RF device, the test instructions can be correctly identified, so that the RF device can be tested.

[0089] In a possible implementation manner, the radio frequency device testing system further includes an antenna 405 , which is connected to the coupler 404 and is used to radiate a signal from the coupler 404 .

[0090] In an optional manner, the test equipment is further used to receive coupling power signals when the radio frequency device is located in different environments, and determine the performance of the radio frequency device according to the coupling power signals in different environments.

[0091] Specifically, the test equipment can be placed in three environments, namely, normal temperature 26°, high temperature 55°, and low temperature -10°, for 48 hours of reliability testing to determine whether the performance of the test equipment meets the standards.

[0092] In the above solution, the test equipment can determine the performance of the RF device in different environments by receiving the coupled power signals when the RF device is in different environments.

[0093] Based on the same inventive concept as above, the present invention also provides a radio frequency device testing device, which can execute the system and method in the above invention embodiments. The structure of the radio frequency device testing device provided by the present invention can be seen in Figure 5. The radio frequency device testing device 500 includes an acquisition unit 501 and a processing unit 502. Among them, the acquisition unit 501 is used to acquire a test command from a user interaction interface; the processing unit 502 is used to generate a test instruction according to the test command; according to the test instruction, send a transmission power signal to the radio frequency device; perform radio frequency processing on the transmission power signal; radiate the transmission power signal after radio frequency processing, and generate a coupling power signal according to the radiated power signal; after receiving the coupling power signal, return it to the test device; and determine the performance of the radio frequency device according to the coupling power signal.

[0094] For a more detailed description of the acquisition unit 501 and the processing unit 502, please refer to Figure 2 The relevant descriptions in the method embodiment shown are directly obtained and will not be repeated here.

[0095] Based on the same technical concept, the present invention also provides a computing device, such as Figure 6 As shown, the computing device 600 includes at least one processor 601 and a memory 602 connected to the at least one processor. The present invention does not limit the specific connection medium between the processor 601 and the memory 602. Figure 6 For example, the processor 601 and the memory 602 are connected via a bus. The bus can be divided into an address bus, a data bus, a control bus, etc.

[0096] In the present invention, the memory 602 stores instructions that can be executed by at least one processor 601 , and the at least one processor 601 can execute the steps included in the aforementioned RF device testing method by executing the instructions stored in the memory 602 .

[0097] Among them, the processor 601 is the control center of the computing device, and can use various interfaces and lines to connect various parts of the computing device, and realize the RF device test by running or executing instructions stored in the memory 602 and calling data stored in the memory 602. Optionally, the processor 601 may include one or more processing units, and the processor 601 may integrate an application processor and a modem processor, wherein the application processor mainly processes the operating system, user interface, and application programs, and the modem processor mainly processes the issuance of instructions. It is understandable that the above-mentioned modem processor may not be integrated into the processor 601. In some embodiments, the processor 601 and the memory 602 may be implemented on the same chip, and in some embodiments, they may also be implemented separately on independent chips.

[0098] The processor 601 may be a general-purpose processor, such as a central processing unit (CPU), a digital signal processor, an application-specific integrated circuit (ASIC), a field programmable gate array or other programmable logic device, a discrete gate or transistor logic device, or a discrete hardware component, and may implement or execute the methods, steps, and logic block diagrams disclosed in the present invention. A general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the method disclosed in the embodiment of the radio frequency device test may be directly embodied as being executed by a hardware processor, or may be executed by a combination of hardware and software modules in the processor.

[0099] The memory 602 is a non-volatile computer-readable storage medium that can be used to store non-volatile software programs, non-volatile computer executable programs and modules. The memory 602 may include at least one type of storage medium, such as a flash memory, a hard disk, a multimedia card, a card-type memory, a random access memory (Random Access Memory, RAM), a static random access memory (Static Random Access Memory, SRAM), a programmable read-only memory (Programmable Read Only Memory, PROM), a read-only memory (Read Only Memory, ROM), an electrically erasable programmable read-only memory (Electrically Erasable Programmable Read-Only Memory, EEPROM), a magnetic memory, a disk, an optical disk, etc. The memory 602 is any other medium that can be used to carry or store a desired program code in the form of an instruction or data structure and can be accessed by a computer, but is not limited thereto. The memory 602 in the present invention can also be a circuit or any other device that can realize a storage function, for storing program instructions and / or data.

[0100] Based on the same technical concept, the present invention also provides a computer-readable storage medium storing a computer program executable by a computing device. When the program runs on the computing device, the computing device executes the steps of the above-mentioned RF device testing method.

[0101] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0102] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0103] These computer program instructions may also be stored in a computer readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture including an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0104] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0105] Obviously, those skilled in the art can make various changes and modifications to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

Claims

1. A radio frequency device testing system, characterized in that: It includes a test device, a transceiver, a coupler and a radio frequency device, wherein the transceiver is connected to the test device, the radio frequency device and the coupler respectively, and the radio frequency device is also connected to the coupler; The test device is used to receive a test command from a user interaction interface, generate a test instruction according to the test command, and send it to the transceiver, and determine the performance of the radio frequency device according to the coupling power signal from the transceiver; wherein, if the radio frequency device is a radio frequency switch, the test command includes an interval time of the test instruction, a number of cycles of the test instruction, and a transmission path of the test instruction, and the test device is specifically used to: determine the performance of the radio frequency device according to a register address from the transceiver and a preset register address; The transceiver is used to send a transmission power signal to the radio frequency device according to the test instruction, and return the coupling power signal from the coupler to the test equipment; The radio frequency device is used to perform radio frequency processing on the transmission power signal and then send it to the coupler; The coupler is used to radiate the transmission power signal after RF processing from the RF device, and generate a coupled power signal based on the radiated power signal and return it to the transceiver; Before the test device generates a test instruction according to the test command: the test device is also used to send a path instruction to the transceiver; the transceiver is also used to send a tolerance power to the RF device according to the path instruction, and the tolerance power is within the operating power range of the RF device; the RF device is also used to open the hardware path of the RF device according to the tolerance power.

2. The system according to claim 1, characterized in that When the radio frequency device is a power amplifier: The test command includes the sending interval time of the test instruction, the number of cycles of the test instruction, and the gain switching coefficient of the power amplifier.

3. The system according to claim 2, characterized in that The testing device is specifically used to determine the performance of the radio frequency device according to the coupling power signal and the transmission power signal from the transceiver, as well as a preset power threshold and a preset power consumption threshold.

4. The system according to claim 1, characterized in that The testing equipment is specifically used for: According to the chip type of the chip deployed in the radio frequency device, the test instruction in a format corresponding to the chip type is generated.

5. The system according to claim 1, wherein: The testing device is also used to receive coupling power signals when the radio frequency device is located in different environments, and determine the performance of the radio frequency device according to the coupling power signals in the different environments.

6. A method for testing a radio frequency device, characterized in that: The invention comprises a test device, a transceiver, a coupler and a radio frequency device, and the method comprises: Receiving a test command from a user interaction interface through the test device; According to the test command, generating a test instruction by the test device; According to the test instruction, sending a transmission power signal to the radio frequency device through the transceiver; Performing radio frequency processing on the transmission power signal by using the radio frequency device; radiating the transmission power signal after radio frequency processing through the coupler, and generating a coupling power signal according to the radiated power signal; The transceiver receives the coupled power signal and returns it to the test device; Determining the performance of the radio frequency device by the test equipment according to the coupled power signal; Wherein, if the RF device is a RF switch, the test command includes an interval time of the test instruction, a number of cycles of the test instruction, and a transmission path of the test instruction, and the determining the performance of the RF device by the test device according to the coupling power signal includes: determining the performance of the RF device according to the received register address of the RF device and the preset register address; Before generating a test instruction through the test device according to the test command, the method also includes: sending a path instruction to the transceiver through the test device; sending a tolerance power to the RF device through the transceiver according to the path instruction, the tolerance power is within the operating power range of the RF device; and opening the hardware path of the RF device through the RF device according to the tolerance power.

7. The method according to claim 6, characterized in that When the radio frequency device is a power amplifier: The test command includes the sending interval time of the test instruction, the number of cycles of the test instruction, and the gain switching coefficient of the power amplifier.

8. The method according to claim 6, characterized in that Determining the performance of the radio frequency device by the test equipment according to the coupled power signal includes: The performance of the radio frequency device is determined by the test equipment according to the coupled power signal and the transmitted power signal, as well as a preset power threshold and a preset power consumption threshold.

9. The method according to claim 6, characterized in that Generating a test instruction by the test device according to the test command includes: According to the test command and the chip type of the chip deployed in the radio frequency device, the test instruction in a format corresponding to the chip type is generated by the test device.

10. The method according to claim 6, characterized in that The method further comprises: The test device receives coupling power signals of the radio frequency device when the device is in different environments, and determines the performance of the radio frequency device according to the coupling power signals in the different environments.

11. A radio frequency device testing device, characterized in that: include: An acquisition unit, used for acquiring a test command from a user interaction interface; A processing unit, used to generate a test instruction according to the test command; According to the test instruction, sending a transmission power signal to the radio frequency device; performing radio frequency processing on the transmit power signal; radiating the transmit power signal after radio frequency processing, and generating a coupled power signal according to the radiated power signal; After receiving the coupled power signal, the coupled power signal is returned to the test equipment; and according to the coupled power signal, the performance of the radio frequency device is determined; If the RF device is a RF switch, the test command includes an interval time of the test instruction, a number of cycles of the test instruction, and a transmission path of the test instruction. The processing unit is specifically used to: determine the performance of the RF device according to the received register address of the RF device and the preset register address; The processing unit is specifically used to send a path instruction to the transceiver through the test equipment; according to the path instruction, send a tolerance power to the radio frequency device through the transceiver, and the tolerance power is within the working power range of the radio frequency device; according to the tolerance power, open the hardware path of the radio frequency device through the radio frequency device.

12. A computing device, characterized in that: The method comprises at least one processor and at least one memory, wherein the memory stores a computer program, and when the program is executed by the processor, the processor executes the method according to any one of claims 6 to 10.

13. A computer-readable storage medium, characterized in that: The storage medium stores a program, and when the program is run on a computer, the computer is enabled to implement the method according to any one of claims 6 to 10.

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