Beam failure detection method, system and electronic device

Abstract

The application provides a beam failure detection method, system and electronic equipment. The beam failure detection method is applied to a user equipment and includes: acquiring a signal quality parameter of a beam; judging whether the signal quality parameter reaches a threshold value; when it is judged that the signal quality parameter reaches the threshold value, judging whether the signal quality parameter reaches a failure threshold value; and if the signal quality parameter reaches the failure threshold value, judging that there is a beam failure in the current beam. The beam failure can be accurately detected, the judgment mechanism of the beam failure is optimized, and the user equipment is prevented from frequently entering a beam failure recovery state.

Description

Technical Field

[0001] The present application relates to the field of wireless communication technology, and in particular to a beam fault detection method, system, and electronic device. Background Art

[0002] In wireless communication systems, beamforming is a technology that can effectively improve the coverage and capacity of wireless communication systems by reducing beam misalignment. However, factors such as channel fluctuations, unexpected obstacles, and user equipment (UE) rotation can still cause beam misalignment. Frequent beam misalignment can lead to wireless link failures. Therefore, beam failure recovery technology is needed to confirm whether there is a beam failure and restore the connection. Beam failure detection is a key step in beam failure recovery technology.

[0003] Currently, the beam fault detection and judgment mechanism in related technologies will lead to an increase in the signaling overhead of user equipment, which in turn causes network congestion. Summary of the Invention

[0004] In view of this, it is necessary to provide a beam fault detection method, system, and electronic device that can accurately detect beam faults and optimize the beam fault judgment mechanism.

[0005] In a first aspect, an embodiment of the present application provides a beam failure detection method, applied to a user equipment, including:

[0006] Obtaining signal quality parameters of the beam;

[0007] Determining whether the signal quality parameter reaches a threshold;

[0008] When it is determined that the signal quality parameter reaches a threshold, determining whether the signal quality parameter reaches a fault threshold;

[0009] If the signal quality parameter reaches the fault threshold, it is determined that a beam fault exists in the current beam.

[0010] In one possible implementation of the present application, determining whether the signal quality parameter reaches a fault threshold includes:

[0011] The number of times the signal quality parameter reaches the threshold value within a preset time is counted. If the number of times the signal quality parameter reaches the threshold value reaches a preset value, it is determined that a beam fault exists in the current beam.

[0012] In one possible implementation of the present application, determining whether the signal quality parameter reaches a fault threshold further includes:

[0013] Counting the number of times the signal quality parameter reaches the threshold value continuously;

[0014] Determine whether the number of times the signal quality parameter continuously reaches the threshold reaches a fault threshold. If the number of times the signal quality parameter continuously reaches the threshold reaches the fault threshold, determine that a beam fault exists in the current beam.

[0015] In a possible implementation of the present application, the beam signal quality parameter includes a reference signal received power or a synchronization signal block.

[0016] In one possible implementation of the present application, when it is determined that the signal quality parameter reaches the threshold value, the method further includes:

[0017] Determining whether the beam signal quality parameter reaching the threshold value is beam jitter;

[0018] If the beam signal quality parameter is beam jitter, the beam signal quality parameter is deleted.

[0019] In a possible implementation of the present application, the beam jitter judgment parameter includes a threshold value R th , the currently measured beam quality parameter R i , the beam quality parameter R measured last time i-1 , the beam quality parameter R measured next time i+1 and a beam jitter reference coefficient m, wherein the value range of the beam jitter reference coefficient m is [0, 1].

[0020] In one possible implementation of the present application, the beam jitter is determined as follows:

[0021] When R i-1 >R th 、R i <(1+m)*R th And R i+1 >R th , it is determined that the beam signal quality parameter is not the beam jitter.

[0022] In one possible implementation of the present application, the judgment parameters of the fault threshold include the beam signal quality parameter measurement period T, the beam data flow S, the number of times the threshold is continuously reached N, and the minimum number of times the threshold is reached N. min ;

[0023] The fault threshold is determined as follows:

[0024] when , setting the number of times N that the threshold value is continuously reached as the fault threshold;

[0025] If N<N min , then the fault threshold is N min .

[0026] In a second aspect, an embodiment of the present application provides a beam fault detection system, including:

[0027] Parameter acquisition module, which obtains the signal quality parameters of the beam;

[0028] A first judgment module is used to judge whether the signal quality parameter reaches a threshold value;

[0029] a second judgment module, configured to, when it is determined that the signal quality parameter reaches the threshold value, determine whether the signal quality parameter reaches a fault threshold value; the second judgment module is further configured to count the number of times the signal quality parameter continuously reaches the threshold value, and determine whether the number of times the signal quality parameter continuously reaches the threshold value reaches a fault threshold value;

[0030] The third judgment module is used to judge whether the current beam has a beam fault when the signal quality parameter reaches the fault threshold; the third judgment module is also used to judge whether the current beam has a beam fault when the number of times the signal quality parameter continuously reaches the threshold reaches the fault threshold.

[0031] In a third aspect, an electronic device provided by an embodiment of the present application includes a memory and a processor;

[0032] The memory is used to store computer programs;

[0033] The processor is used to control the memory to execute the program stored in the memory to implement the beam fault detection method as described in the first aspect.

[0034] The beam fault detection method, system, and electronic device provided by the embodiments of the present application can accurately detect beam faults, optimize the beam fault judgment mechanism, and prevent user equipment from frequently entering the beam fault recovery state. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 A schematic diagram of an exemplary communication system provided for one embodiment of the present application.

[0036] Figure 2 A schematic flow chart of a beam fault detection method provided in one embodiment of the present application.

[0037] Figure 3 A schematic flow chart of a beam fault detection method provided in another embodiment of the present application.

[0038] Figure 4 This is the reference signal received power monitoring data provided by an embodiment of the present application.

[0039] Figure 5 This is the reference signal received power monitoring data provided by an embodiment of the present application.

[0040] Figure 6 This is the reference signal received power monitoring data provided by an embodiment of the present application.

[0041] Figure 7 This is the reference signal received power monitoring data provided by an embodiment of the present application.

[0042] Figure 8 A schematic diagram of a beam fault detection system provided in one embodiment of the present application.

[0043] Figure 9 A schematic diagram of an electronic device provided in one embodiment of the present application.

[0044] Description of main component symbols

[0045] Base Station 10

[0046] Connect Beam 11

[0047] Candidate beam 12

[0048] User equipment 20

[0049] Beam Fault Detection System 100

[0050] Parameter acquisition module 110

[0051] First judgment module 120

[0052] Second judgment module 130

[0053] The third judgment module 140

[0054] Electronic equipment 200

[0055] Processor 210

[0056] Memory 220 DETAILED DESCRIPTION

[0057] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments.

[0058] It should be noted that, in the embodiments of the present application, "at least one" refers to one or more, and "more" refers to two or more. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art in the art to which this application relates. The terms used in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0059] It should be noted that, in the embodiments of the present application, words such as "first" and "second" are only used for the purpose of distinguishing descriptions, and cannot be understood as indicating or implying relative importance, nor can they be understood as indicating or implying an order. Features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design scheme described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or design schemes. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a concrete way.

[0060] Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0061] The following describes some embodiments of the application in detail with reference to the accompanying drawings. In the absence of conflict, the following embodiments and features in the embodiments may be combined with each other.

[0062] Figure 1 It is a communication interaction diagram of an exemplary communication system. Usually, the base station 10 will generate multiple beams with different directions to completely cover the entire cell when in operation. The user equipment 20 will select a beam with the best communication effect from multiple different beams as a communication beam. After the user equipment 20 is connected to the base station 10, the base station 10 uses beams with different directions to transmit wireless signals in turn. This process is called beam scanning (BS). At the same time, the user measures the wireless signals emitted by different beams (Beam Measurement, BM) and reports relevant information to the base station (Beam Reporting, BR). The base station determines the best transmission beam (Beam Determination, BD) aimed at the user based on the user report.

[0063] like Figure 1As shown, it is assumed that user equipment 20 has achieved beam alignment with base station 10 and is communicating via connection beam 11. However, during the communication process, user equipment 20 may experience beam failures, which may lead to radio link failures (RLF) in user equipment 20. When RLF occurs frequently, beam failure recovery technology is required to enable user equipment 20 to switch to a candidate beam, such as candidate beam 12, to achieve beam failure recovery.

[0064] It is understood that beam failure recovery technology typically includes beam failure detection, alternative beam identification, recovery request transmission, and network response to the beam recovery request. If the beam failure detection mechanism fails to intervene correctly, the user equipment may not quickly enter the beam failure recovery state after a beam failure occurs. If the beam failure detection mechanism intervenes too frequently, the user equipment will frequently enter the beam failure recovery state, resulting in a large amount of signaling overhead and possible communication network congestion.

[0065] Therefore, the present application provides a beam fault detection method, device and electronic device to accurately detect beam faults, optimize the beam fault judgment mechanism, and avoid user equipment from frequently entering the beam fault recovery state.

[0066] It will be appreciated that the beam failure detection method described in the embodiments of the present application can be used in various wireless communication networks, such as LTE, CDMA, TDMA, FDMA, OFDMA, SC-FDMA, and other networks. The terms "network" and "system" are often used interchangeably. A CDMA network can implement radio technologies such as Universal Terrestrial Radio Access (UTRA) and CDMA2000. UTRA includes Wideband CDMA (WCDMA) and other variants of CDMA. CDMA2000 covers the IS-2000, IS-95, and IS-856 standards. A TDMA network can implement radio technologies such as Global System for Mobile Communications (GSM). An OFDMA network can implement radio technologies such as NR (New Radio), such as 5G RA, Evolved UTRA (E-UTRA), Ultra Mobile Broadband (UMB), IEEE 802.11 (Wi-Fi), IEEE 802.16 (WiMAX), IEEE 802.20, Flash-OFDMA, and the like. UTRA and E-UTRA are parts of the Universal Mobile Telecommunications System (UMTS). NR is an emerging wireless communication technology being developed in collaboration with the 5G Technology Forum (5GTF). 3GPP Long Term Evolution (LTE) and Advanced LTE (LTE-A) are versions of UMTS that use E-UTRA. UTRA, E-UTRA, UMTS, LTE, LTE-A, and GSM are described in documents from an organization called the "3rd Generation Partnership Project" (3GPP). CDMA2000 and UMB are described in documents from an organization called the "3rd Generation Partnership Project 2" (3GPP2). The techniques described in the embodiments of the present application can be used for the wireless networks and radio technologies mentioned above as well as other wireless networks and radio technologies. The beam failure detection method described in the present application can be described using terms commonly associated with 3G and / or 4G wireless technologies, but aspects of the present application can be applied in communication systems based on other generations (e.g., 5G and later generations) including NR technology.

[0067] Please refer to Figure 2 , is a flow chart of a beam fault detection method provided in an embodiment of the present application.

[0068] like Figure 2 As shown, the beam fault detection method includes at least the following steps:

[0069] S100: Obtain beam signal quality parameters.

[0070] In the embodiment of the present application, after the user equipment 20 establishes a connection with the base station 10 , the user equipment 20 analyzes the signal of the connection beam 11 and obtains the signal quality parameter of the connection beam 11 .

[0071] It can be understood that the signal quality parameter includes reference signal receiving power (RSRP) or synchronization signal block (SSB).

[0072] In the embodiment of the present application, the user equipment 20 periodically measures or detects SSB or RSRP during communication with the base station 10. Therefore, using the beam failure detection method proposed in the embodiment of the present application, a beam failure can be detected by detecting the beam signal quality while the user equipment 20 is connected to the base station 10, without adding an additional processor or signal transceiver module to the user equipment 20 to implement beam failure detection. This can reduce the power consumption of the user equipment 20 when performing beam failure detection, and can also reduce the signaling overhead of the user equipment 20 when performing beam failure detection.

[0073] S200: Determine whether the beam signal quality parameter reaches a threshold.

[0074] In the embodiment of the present application, the user equipment 20 may determine whether the beam signal quality parameter reaches a threshold value. If the beam signal quality parameter reaches the threshold value, step S300 is executed; if the beam signal quality parameter does not reach the threshold value, step S600 is executed.

[0075] It is understandable that the communication quality of user equipment 20 may fluctuate during communication with base station 10. Therefore, setting a threshold value can filter out normal jitter of the beam signal quality parameter, avoid frequent intervention of the beam fault detection mechanism due to normal jitter of the beam signal, and reduce the signaling overhead caused by frequent intervention of the beam fault detection mechanism during communication of user equipment 20.

[0076] S300: Count the number of times the threshold value is reached continuously.

[0077] It will be appreciated that in this embodiment of the present application, only the number of consecutive times the beam signal quality parameter falls below the threshold is counted, that is, each beam signal quality parameter is counted. Counting begins when a beam signal quality parameter falls below the threshold is recorded. When a beam signal quality parameter rises above the threshold is recorded, the recorded number of times the beam signal quality parameter falls below the threshold is cleared and the count restarts. It will be appreciated that counting only the number of times the threshold is reached may result in misjudgment, thereby increasing the signaling overhead of user equipment 20.

[0078] S400: Determine whether the number of times that the beam signal quality parameter continuously reaches the threshold reaches a fault threshold.

[0079] In an embodiment of the present application, if the number of times the beam signal quality parameter continuously reaches the threshold reaches the fault threshold, step S500 is executed; if the number of times the beam signal quality parameter continuously reaches the threshold does not reach the fault threshold, it indicates that there is no obstacle to the current communication quality, and step S600 is executed.

[0080] It is understood that in some embodiments, the number of times the threshold is reached may be counted and a preset time may be set. If the number of times the threshold is reached within the preset time reaches the failure threshold, step S500 is executed. If the number of times the threshold is reached within the preset time does not reach the failure threshold, then there is no problem with the current communication quality, and step S600 is executed.

[0081] S500: Determine whether a beam failure exists in the current beam.

[0082] In an embodiment of the present application, if the number of times that the beam signal quality parameter continuously reaches the threshold reaches the fault threshold, it is determined that a beam fault exists in the current beam.

[0083] It is understood that after detecting a beam failure in the current beam, a beam failure recovery process may be executed. Exemplarily, the beam failure recovery process may include user equipment 20 detecting the layer reference signal received power of the beam to determine an alternative beam 12, sending a transmission resumption request to base station 10 using the alternative beam 12, and base station 10 sending a reply message to user equipment 20 after receiving the transmission resumption request.

[0084] S600: End the process.

[0085] In an embodiment of the present application, if there is no beam fault in the current beam, the beam fault detection process is terminated.

[0086] Please also refer to Figure 3 , Figure 3 for Figure 2 The following is a flow chart of the sub-steps of step S200 in the beam fault detection method. Specifically, in order to further reduce the impact of beam jitter on the threshold determination, step S200 further includes the following sub-steps:

[0087] S210: Determine whether the beam signal quality parameter is beam jitter.

[0088] In this embodiment of the present application, it is determined whether the beam signal quality parameter that reaches the threshold value is beam jitter. If it is determined that the beam signal quality parameter is beam jitter, sub-step S220 is executed. If it is determined that the beam signal quality parameter is not beam jitter, sub-step S230 is executed.

[0089] S220: Delete the beam signal quality parameter.

[0090] In an embodiment of the present application, if the beam signal quality parameter is beam jitter, the beam signal quality parameter is deleted.

[0091] It is understandable that deleting the beam quality parameter determined to be beam jitter can avoid frequent activation of the beam fault detection mechanism and reduce the power consumption and signaling overhead of the user equipment 20.

[0092] S230: Retain beam signal quality parameters.

[0093] In the embodiment of the present application, if the beam signal quality parameter is not beam jitter, the beam signal quality parameter is retained and step S300 is executed, that is, the number of times the threshold value is continuously reached is counted.

[0094] It is understandable that further screening of beam jitter can prevent effective values ​​from being eliminated, thereby reducing misjudgments in fault detection while ensuring the accuracy of the judgment results.

[0095] In the embodiment of the present application, the beam jitter judgment parameters include the threshold value R th , the currently measured beam quality parameter R i , the beam quality parameter R measured last time i-1 , the beam quality parameter R measured next time i+1 and a beam jitter reference coefficient m. The value range of the beam jitter reference coefficient m is [0, 1]. The value of the beam jitter reference coefficient m can be adjusted based on the signal strength of the beam and other parameters during communication to increase or decrease the beam jitter determination criterion so that the determination criterion is more consistent with the current operating conditions of the user equipment 20.

[0096] In the embodiment of the present application, the beam jitter is determined as follows: when formulas (1), (2) and (3) are satisfied at the same time, the beam signal quality parameter is determined to be beam jitter.

[0097] R i-1 >R th (1)

[0098] R i <(1+m)*R th (2)

[0099] R i+1 >R th (3)

[0100] The following combination Figure 4 and Figure 5, taking the beam signal quality parameter as the reference signal received power as an example, and combining the above formulas (1)-(3) to exemplarily describe the method of removing beam jitter. Among them, Figure 4 A set of reference signal received power monitoring data is shown. Figure 5 Another set of reference signal received power monitoring data is shown.

[0101] In this embodiment of the present application, the reference signal received power is set to -110 dBm, that is, the threshold Rth is -110 dBm. The beam jitter reference coefficient m is set to 0.5. According to formula (2), it can be calculated that the reference signal received power exceeding the threshold is -165 dBm.

[0102] In the embodiment of this application, Figure 4 The -50dbm, -170dbm and -80dbm in R are respectively i-1 , R i and R i+1 , that is, assuming that the beam quality parameter R measured last time i-1 is -50dBm, the currently measured beam quality parameter R i is -170dBm, the beam quality parameter R i+1 is -80dbm, and according to the above formulas (1)-(3), we can get R i+1 <R th ,Right now Figure 4 R in i Satisfying formulas (1), (2) and (3), therefore Figure 4 The -170dBm in the figure is recorded as beam jitter rather than reaching the threshold.

[0103] Another example, such as Figure 5 ,Will Figure 5 The -170dbm, -120dbm and -180dbm in the figure are respectively replaced by R i-1 , R i and R i+1 , that is, assuming that the beam quality parameter R measured last time i-1 is -170dbm, the currently measured beam quality parameter R i is -120dBm, the beam quality parameter R i+1 is -180dbm, and according to the above formulas (1)-(3), we can get R i+1 >R th ,Right now Figure 5 R in i Does not satisfy formula (3), so Figure 5 The -120dbm in the figure is recorded as reaching the threshold.

[0104] In the embodiment of the present application, adding beam jitter judgment to the beam fault detection method can filter out beam jitter while retaining valid data reaching the threshold value, thereby avoiding frequent activation of the beam fault detection mechanism.

[0105] It is understood that the reference signal received power of -110 dBm is the standard for determining the strongest cell in NR (New Radio) technology. In some embodiments, the reference signal received power can also be adjusted according to the signal strength received by the user equipment 20.

[0106] In the embodiment of the present application, the judgment parameters of the fault threshold include the beam signal quality parameter measurement period T, the beam data flow S, the number of times the threshold is continuously reached N, and the minimum number of times the threshold is reached N. min The beam data flow S is negatively correlated with the uplink and downlink data volume when the user equipment 20 communicates. It can be understood that the fault threshold is determined by satisfying both formula (4) and formula (5).

[0107]

[0108] Max(N,N min ) (5)

[0109] The following takes the beam signal quality parameter as the reference signal received power as an example, and combines formula (4) and formula (5) to exemplarily describe a method for determining whether the number of times the beam signal quality parameter continuously reaches the threshold reaches the fault threshold.

[0110] In the embodiment of the present application, the number of times N that the threshold value is continuously reached is set according to the beam data flow S and the beam signal quality parameter measurement period T. It is understandable that if the value of N is too small, it may cause the beam fault detection mechanism to intervene too frequently. Therefore, an additional minimum number of times N that the threshold value is reached is set. min After obtaining the threshold value N times, compare (N, N min ), and take the larger value as the number of times N that the output reaches the threshold.

[0111] Please also refer to Figure 6 and Figure 7 , Figure 6 A set of reference signal received power monitoring data is shown; Figure 7 Another set of reference signal received power monitoring data is shown.

[0112] like Figure 6As shown, it can be understood that, taking the number of times the threshold is reached N = 4 as an example. If the number of times the threshold is reached N is set to be non-continuous, it is possible that the signal strength between the N-1th time and the Nth time is very good, but due to the poor quality of the previous beam signal, the beam fault detection mechanism is triggered when the signal strength is good, thereby increasing signaling overhead and causing the network speed to slow down.

[0113] like Figure 7 As shown, it can be understood that in the embodiment of the present application, the fourth time the threshold is reached will not trigger the beam fault detection mechanism. The beam fault detection mechanism will only be triggered when the threshold is reached four times in a row.

[0114] Please also refer to Figure 8 , the embodiment of the present application also provides a beam fault detection system 100. Figure 8 As shown, the beam fault detection system 100 includes: a parameter acquisition module 110 , a first judgment module 120 , a second judgment module 130 and a third judgment module 140 .

[0115] In the embodiment of the present application, the parameter acquisition module 110 is used to obtain the beam signal quality parameter, that is, it can be used to perform step S100. Figure 2 The related descriptions will not be repeated here.

[0116] In the embodiment of the present application, the first judgment module 120 is used to judge whether the beam signal quality parameter reaches the threshold value, that is, to execute steps S200, S210-S230. Figure 2 and Figure 3 The related descriptions will not be repeated here.

[0117] In the embodiment of the present application, the second judgment module 130 is used to determine whether the number of times the beam signal quality parameter continuously reaches the threshold value reaches the fault threshold value when the beam signal quality parameter reaches the threshold value, that is, the second judgment module 130 is used to execute step S400, specifically refer to Figure 2 The related descriptions will not be repeated here.

[0118] In the embodiment of the present application, the third judgment module 140 is used to judge that there is a beam fault in the current beam when the number of times the beam signal quality parameter continuously reaches the threshold reaches the fault threshold, that is, the third judgment module 140 can be used to execute step S500, for details, see Figure 2 The related descriptions will not be repeated here.

[0119] It can be understood that the beam fault detection system 100 can accurately detect beam faults, optimize the beam fault judgment mechanism, and avoid user equipment frequently entering the beam fault recovery state.

[0120] Figure 9 This is an electronic device 200 provided in an embodiment of the present application, such as Figure 9 As shown, the electronic device 200 includes a processor 210 and a memory 220, the memory 220 is used to store computer programs; the processor 210 is used to control the memory 220 and execute the program stored in the memory 220 to implement the above steps S100-S600 and steps S210-S230. Figure 2 and Figure 3 The related descriptions will not be repeated here.

[0121] It can be understood that the processor 210 is used to perform normal communication functions of the electronic device 200 and implement beam fault detection through the beam fault detection system 100 set in the memory 220.

[0122] It is understood that the beneficial effects of the electronic device 200 can be seen in FIG. Figure 4 The beam fault detection method shown, and Figure 8 The beam fault detection system 100 shown is not described in detail here.

[0123] Those skilled in the art should recognize that the above embodiments are merely intended to illustrate the present application and are not intended to limit the present application. As long as they are within the spirit of the present application, appropriate changes and modifications to the above embodiments are within the scope of protection claimed in the present application.

Claims

1. A beam failure detection method, applied to a user equipment, characterized in that: include: Obtaining signal quality parameters of the beam; Determining whether the signal quality parameter reaches a threshold; When it is determined that the signal quality parameter reaches the threshold, determine whether the beam signal quality parameter that reaches the threshold is beam jitter. If the beam signal quality parameter is beam jitter, delete the beam signal quality parameter without counting it. If the beam signal quality parameter is not beam jitter, retain the beam signal quality parameter and count the number of times the signal quality parameter reaches the threshold within a preset time, wherein the beam jitter judgment parameter includes the threshold , the beam signal quality parameter currently measured , the beam signal quality parameter measured last time , the beam signal quality parameter measured next time And the beam jitter reference coefficient m, wherein the value range of the beam jitter reference coefficient m is [0,1], and the beam jitter is determined as follows: when 、 and , determining that the beam signal quality parameter is the beam jitter; Determine, based on the statistical result, whether the number of times the signal quality parameter continuously reaches the threshold value reaches a fault threshold value; If the number of times that the signal quality parameter continuously reaches the threshold value reaches the fault threshold value, it is determined that a beam fault exists in the current beam.

2. The beam fault detection method according to claim 1, wherein: The beam signal quality parameter includes a reference signal received power or a synchronization signal block.

3. A beam fault detection system, characterized in that: include: Parameter acquisition module, which obtains the signal quality parameters of the beam; A first judgment module is used to judge whether the signal quality parameter reaches a threshold value; The second judgment module is used to judge whether the beam signal quality parameter reaching the threshold value is beam jitter when it is judged that the signal quality parameter reaches the threshold value. If the beam signal quality parameter is beam jitter, the beam signal quality parameter is deleted without statistics. If the beam signal quality parameter is not beam jitter, the beam signal quality parameter is retained and the number of times the signal quality parameter reaches the threshold value within a preset time is counted, wherein the judgment parameter of the beam jitter includes the threshold value , the beam signal quality parameter currently measured , the beam signal quality parameter measured last time , the beam signal quality parameter measured next time And the beam jitter reference coefficient m, wherein the value range of the beam jitter reference coefficient m is [0,1], and the beam jitter is determined as follows: when 、 and When the beam signal quality parameter is determined to be the beam jitter, the second judgment module is further configured to count the number of times the signal quality parameter continuously reaches a threshold value, and determine whether the number of times the signal quality parameter continuously reaches the threshold value reaches a fault threshold value; The third judgment module is used to judge whether the current beam has a beam fault when the signal quality parameter reaches the fault threshold; the third judgment module is also used to judge whether the current beam has a beam fault when the number of times the signal quality parameter continuously reaches the threshold reaches the fault threshold.

4. An electronic device, characterized in that: include: memory and processor; The memory is used to store computer programs; The processor is used to control the memory and execute the program stored in the memory to implement the beam fault detection method according to any one of claims 1 to 2.

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