A network-based data sharing method and related equipment

Abstract

The present invention discloses a network-based data sharing method and related equipment. The method includes: when receiving a modeling request from the current user, searching in the uploaded electronic device data to obtain relevant stored electronic device data and determining whether it is public; if so, fitting and modeling the current electronic device data with the stored electronic device data to obtain a modeling result; after the fitting and modeling is completed, determining whether the current user has made the current electronic device data public; if so, sharing the current electronic device data and scoring the stored electronic device data based on the modeling result. The present invention centrally manages the electronic device test data and electronic device models uploaded by each user, performs fitting and modeling, and performs shared scoring, thereby promoting communication between researchers providing electrical test data and researchers providing device models, and also promoting the development and research of new electronic devices.

Description

Technical Field

[0001] The present invention relates to the field of data processing technology, and in particular to a network-based data sharing method, system, shared modeling platform and computer-readable storage medium. Background Art

[0002] The development of the integrated circuit industry is inseparable from people's understanding of the performance and laws governing the most basic electronic components. The development of traditional integrated circuits has been driven by the shrinking size and improved performance of complementary metal-oxide-semiconductor (CMOS) transistors. This process has resulted in the development of increasingly smaller, more complex, and more parasitic CMOS transistors. Accurate device models are essential for verifying the functionality and performance of integrated circuits constructed using these new CMOS transistors. Traditional CMOS transistor device models, such as the BSIM model and surface potential model, serve as a bridge between CMOS process factories and electronic design automation (EDA) software, playing a crucial role in the integrated circuit industry.

[0003] Currently, the research, development, fabrication, and testing of various new devices generate a vast amount of experimental data. Different electronic devices often require distinct electrical testing methods, and researchers at universities, research institutes, and other institutions scattered around the world employ varying formats and methods for storing data. Analyzing the operating mechanisms of new electronic devices, studying specific physical effects, and implementing them in circuit simulators all rely on device models. A device model typically describes the electrical behavior of an electronic device using mathematical formulas or lookup tables. This model is ultimately expressed as computer code, enabling simulation of the device's electrical behavior within a computer. In particular, it can be described using computer code in a hardware description language, allowing the electrical behavior of circuits containing these new electronic devices to be directly simulated within circuit simulation programs. However, developing device models often requires extensive experimental data to fine-tune the physical mechanisms and mathematical formulas describing electrical behavior, as well as to extract parameters. This often requires extensive communication and data exchange between those responsible for device fabrication and electrical testing and those responsible for device model development. Due to the increasing refinement of scientific research divisions, it is common for these individuals to reside in different research groups, institutions, or even countries. Moreover, for some popular devices, there may be multiple research groups responsible for electronic device fabrication and electrical testing, as well as multiple research groups responsible for device model development. This makes communication and data exchange between device fabrication, electrical testing, and device model developers extremely complex and difficult. Furthermore, due to the existence of different device models and parameter extraction methods, there is no unified standard for determining the validity of performance indicators. In academic literature, it is common to encounter situations where the publisher does not provide the model and extraction method used for device model parameters, and readers do not have convenient access to electrical test data for verification, resulting in skepticism about the performance indicators.

[0004] Therefore, the existing technology still needs to be improved and developed. Summary of the Invention

[0005] The main purpose of the present invention is to provide a network-based data sharing method, system, shared modeling platform and computer-readable storage medium, aiming to solve the problem in the prior art that device test data and device models cannot be centrally stored, shared and fitted for modeling.

[0006] To achieve the above object, the present invention provides a network-based data sharing method, which includes the following steps:

[0007] Obtain electronic device test data or electronic device models uploaded by users;

[0008] When receiving a modeling request from the current user, searching the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model;

[0009] Obtaining current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, and if so, fitting and modeling the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting and modeling the current electronic device model with the stored electronic device test data to obtain a second modeling result;

[0010] When the fitting modeling is completed, it is determined whether the current user chooses to disclose the current electronic device test data or the current electronic device model. If so, the current electronic device test data or the current electronic device model is shared, and the stored electronic device model is scored according to the first modeling result or the stored electronic device test data is scored according to the second modeling result.

[0011] Optionally, in the network-based data sharing method, the step of obtaining electronic device test data or electronic device models uploaded by a user specifically includes:

[0012] Upon receiving the user login, determining the role to which the user belongs;

[0013] The roles include electronic device test users and device model development users;

[0014] Acquiring basic information of the electronic device test user and the device model development user, and storing the basic information in a database;

[0015] The basic information includes: account number, password, user role, name, work unit, research field and contact information;

[0016] If the user is an electronic device testing user, obtaining electronic device testing data uploaded by the electronic device testing user;

[0017] If the user is a device model development user, the electronic device model uploaded by the device model development user is obtained.

[0018] Optionally, in the network-based data sharing method, the step of obtaining electronic device test data or electronic device models uploaded by users further comprises:

[0019] When the electronic device test data is acquired, the electronic device test data is stored in the database according to a first standard format;

[0020] When the electronic device model is acquired, storing the electronic device model in the database according to a second standard format;

[0021] An index relationship is established according to the label contents corresponding to the electronic device test data and the electronic device model, and the label contents are stored in the database.

[0022] Optionally, the network-based data sharing method, wherein, upon receiving a modeling request from the current user, searching the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model, specifically includes:

[0023] When receiving a modeling request from a current electronic device testing user, obtaining tag content queried by the current electronic device testing user;

[0024] According to the index relationship established in the database by the tag content, searching the database for a related electronic device model to obtain a stored electronic device model;

[0025] When receiving a modeling request from a current device model development user, obtaining tag content queried by the current device model development user;

[0026] According to the index relationship established in the database by the tag content, relevant electronic device test data is searched from the database to obtain the stored electronic device test data.

[0027] Optionally, the network-based data sharing method, wherein the obtaining of the current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, and if so, fitting and modeling the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting and modeling the current electronic device model with the stored electronic device test data to obtain a second modeling result, specifically includes:

[0028] Acquiring current electronic device test data of the current electronic device test user and determining whether the stored electronic device model is in a public mode, and if so, performing a first automatic fitting between the current electronic device test data and the stored electronic device model;

[0029] After performing a first automatic fitting between the current electronic device test data and the stored electronic device model, selecting the best fitting result to generate a first device parameter and a first device model file;

[0030] Obtaining a current electronic device model of the current device model development user and determining whether the stored electronic device test data is in a public mode, and if so, performing a second automatic fitting between the current electronic device model and the stored electronic device test data;

[0031] After the current electronic device model and the stored electronic device test data are subjected to a second automatic fitting, the best fitting result is selected to generate a second device parameter and a second device model file.

[0032] Optionally, the network-based data sharing method, wherein the obtaining of the current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, if so, fitting and modeling the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting and modeling the current electronic device model with the stored electronic device test data to obtain a second modeling result, further comprises:

[0033] When the current electronic device test data is subjected to a first automatic fitting with the stored electronic device model and the best fitting result is not obtained, adjusting parameters in the stored electronic device model or replacing the stored electronic device model;

[0034] Refitting the stored electronic device model after parameter adjustment or the replaced stored electronic device model with the current electronic device test data until an optimal fitting result is met, and generating the first device parameters and the first device model file;

[0035] When the current electronic device model is subjected to a second automatic fit with the stored electronic device test data and the best fit result is not obtained, adjusting parameters in the current electronic device model or replacing the stored electronic device test data;

[0036] The current electronic device model after parameter adjustment is refitted with the stored electronic device test data or the current electronic device model is refitted with the replaced stored electronic device test data until the best fitting result is met, and the second device parameters and the second device model file are generated.

[0037] Optionally, the network-based data sharing method, wherein, after the fitting modeling is completed, determining whether the current user chooses to disclose the current electronic device test data or the current electronic device model, and if so, sharing the current electronic device test data or the current electronic device model, and scoring the stored electronic device model according to the first modeling result or scoring the stored electronic device test data according to the second modeling result, specifically includes:

[0038] After the current electronic device test data is fitted with the stored electronic device model and modeling is completed, determining whether the current electronic device test user chooses to disclose the current electronic device test data;

[0039] If public is selected, all users will be given the authority to view and use the current electronic device test data;

[0040] If you choose not to disclose, the current electronic device test data will only be viewed, used and deleted by the current electronic device test user;

[0041] After obtaining the first device parameters and the first device model file, determining whether the current electronic device test user has scored the stored electronic device model used, and if so, uploading and displaying the score;

[0042] After the current electronic device model is fitted with the stored electronic device test data and modeled, determining whether the current device model developer chooses to make the current electronic device model public;

[0043] If public is selected, all users will be given the authority to view and use the current electronic device model;

[0044] If you choose not to make it public, the current electronic device model will only be viewed, used, and deleted by the user who developed the current device model.

[0045] After obtaining the second device parameters and the second device model file, it is determined whether the current device model development user has scored the storage electronic device test data. If so, the score is uploaded and displayed.

[0046] Optionally, in the network-based data sharing method, the first automated fitting and the second automated fitting specifically include:

[0047] When performing the first automated fitting, a simulation test is performed according to the storage electronic device model to obtain first simulation test data;

[0048] Comparing the first simulation test data with the current electronic device test data, and obtaining a best fitting result when the first simulation data is most consistent with the current electronic device test data;

[0049] When performing the second automatic fitting, performing a simulation test according to the current electronic device model to obtain second simulation test data;

[0050] The second simulation test data is compared with the storage electronic device test data, and when the second simulation data is most consistent with the storage electronic device test data, a best fitting result is obtained.

[0051] Optionally, in the network-based data sharing method, the first standard format is: csv, txt, html, xls format file or database key-value type;

[0052] The second standard format is a VerilogA format file or a database key-value type.

[0053] Optionally, in the network-based data sharing method, the label content includes: device type, preparation process, test method, whether it is public data, required citation instructions and intellectual property rights instructions.

[0054] In addition, to achieve the above-mentioned purpose, the present invention further provides a network-based data sharing system, wherein the network-based data sharing system includes:

[0055] A data upload module is used to obtain electronic device test data or electronic device models uploaded by users;

[0056] a data query module configured to, upon receiving a modeling request from a current user, search the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model;

[0057] a data fitting module, configured to obtain current electronic device test data uploaded by the current user and determine whether the requested stored electronic device model is in a public mode, or to obtain the current electronic device model uploaded by the current user and determine whether the requested stored electronic device test data is in a public mode, and if so, to perform fitting modeling on the current electronic device test data and the stored electronic device model to obtain a first modeling result, or to perform fitting modeling on the current electronic device model and the stored electronic device test data to obtain a second modeling result;

[0058] A shared scoring module is used to determine whether the current user chooses to disclose the current electronic device test data or the current electronic device model after the fitting modeling is completed. If so, the current electronic device test data or the current electronic device model is shared, and the stored electronic device model is scored according to the first modeling result or the stored electronic device test data is scored according to the second modeling result.

[0059] In addition, to achieve the above-mentioned purpose, the present invention also provides a shared modeling platform, wherein the shared modeling platform includes: a memory, a processor, and a network-based data sharing program stored on the memory and runnable on the processor, and when the network-based data sharing program is executed by the processor, the steps of the network-based data sharing method described above are implemented.

[0060] In addition, to achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, wherein the computer-readable storage medium stores a network-based data sharing program, and when the network-based data sharing program is executed by the processor, it implements the steps of the network-based data sharing method described above.

[0061] In the present invention, electronic device test data or electronic device models uploaded by users are obtained; when a modeling request from the current user is received, a search is performed in the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device models; the current electronic device test data uploaded by the current user is obtained and it is determined whether the requested stored electronic device model is in a public mode, or the current electronic device model uploaded by the current user is obtained and it is determined whether the requested stored electronic device test data is in a public mode. If so, the current electronic device test data and the stored electronic device model are fitted and modeled to obtain a first modeling result, or the current electronic device model and the stored electronic device test data are fitted and modeled to obtain a second modeling result; when the fitting modeling is completed, it is determined whether the current user chooses to make the current electronic device test data or the current electronic device model public. If so, the current electronic device test data or the current electronic device model is shared, and the stored electronic device model is scored according to the first modeling result or the stored electronic device test data is scored according to the second modeling result. The present invention uses the cloud storage capabilities of the server to classify, organize, store and publicly share the electronic device test data and device models uploaded by users. On the one hand, it is conducive to the long-term preservation and sharing of achievements of the whole society. On the other hand, it also strengthens the communication and exchange between electronic device test data and electronic device models, and promotes the development of new electronic device processes, device mechanism research and circuit application research. BRIEF DESCRIPTION OF THE DRAWINGS

[0062] Figure 1 is a flow chart of a preferred embodiment of the network-based data sharing method of the present invention;

[0063] Figure 2 is a general schematic diagram of the data and modeling platform in a preferred embodiment of the network-based data sharing method of the present invention;

[0064] Figure 3 It is a schematic diagram of the functional modules and operation flow involved in electronic device testing users in a preferred embodiment of the network-based data sharing method of the present invention;

[0065] Figure 4 It is a schematic diagram of the functional modules and operation flow involved by the device model user in a preferred embodiment of the network-based data sharing method of the present invention;

[0066] Figure 5 It is a structural diagram of a preferred embodiment of the network-based data sharing system of the present invention;

[0067] Figure 6 This is a structural diagram of a preferred embodiment of the shared modeling platform of the present invention. DETAILED DESCRIPTION

[0068] In order to make the purpose, technical solutions and advantages of the present invention more clear and distinct, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0069] The network-based data sharing method described in the preferred embodiment of the present invention is as follows: Figure 1 As shown, the network-based data sharing method includes the following steps:

[0070] Step S10: Acquire electronic device test data or electronic device models uploaded by the user.

[0071] The network-based data sharing method of the present invention runs on an Internet server. Users can remotely access the server through an Internet shared modeling platform, or access the server in the form of a web page through an Internet browser on the remote shared modeling platform, or complete the access through a specially developed client program.

[0072] Specifically, when the user login is received, the role to which the user belongs is determined, and the roles include an electronic device test user and a device model development user.

[0073] When a user registers, he or she can choose between two roles: electronic device test user or device model development user. Furthermore, the user can use both roles at the same time.

[0074] The basic information of the electronic device test user and the device model development user is obtained and stored in a database. The basic information includes: account number, password, user role, name, work unit, scientific research field and contact information.

[0075] If the user is an electronic device testing user, then the electronic device testing data uploaded by the electronic device testing user is obtained.

[0076] Among them, electronic device testing users can upload experimental data and manage experimental data online.

[0077] like Figure 2 As shown, Data model storage is an experimental test data & simulation model source code storage function. When the electronic device test data is obtained, the electronic device test data is stored in the database according to the first standard format.

[0078] The first standard format is: csv, txt, html, xls format file or database key-value type.

[0079] In addition to the file format, the first standard format also defines the arrangement of data within the file, such as the first column is the test voltage, the second column is the test current, etc.

[0080] If the user is a device model development user, the electronic device model uploaded by the device model development user is obtained, and the type of electronic device to which the electronic device model is applicable is specified.

[0081] The electronic device model refers to a physical formula that describes device characteristics and may be a collection of physical formulas.

[0082] When the electronic device model is acquired, the electronic device model is stored in the database according to a second standard format.

[0083] The second standard format is a VerilogA (Verilog HDL analog extensions, a hardware language) format file or a database key-value type.

[0084] An index relationship is established according to the label contents corresponding to the electronic device test data and the electronic device model, and the label contents are stored in the database.

[0085] The label content includes: device type, preparation process, test method, whether it is public data, required citation instructions and intellectual property rights description.

[0086] Step S20: When a modeling request from the current user is received, searching is performed in the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model.

[0087] Specifically, when a modeling request from a current electronic device testing user is received, the tag content queried by the current electronic device testing user is obtained.

[0088] According to the index relationship established in the database by the tag content, the related electronic device model is searched from the database to obtain the stored electronic device model.

[0089] Among them, setting the index relationship according to the tag content is to classify the devices more finely so that users can search and match as needed. The index relationship is set in a way that the device type, preparation process, test method and other filling options are given on the data upload interface. The user fills in the interface by himself, and then stores it in the database together with the data.

[0090] When a modeling request from a current device model development user is received, the tag content queried by the current device model development user is obtained.

[0091] According to the index relationship established in the database by the tag content, relevant electronic device test data is searched from the database to obtain the stored electronic device test data.

[0092] Step S30: obtain the current electronic device test data uploaded by the current user and determine whether the requested stored electronic device model is in public mode, or obtain the current electronic device model uploaded by the current user and determine whether the requested stored electronic device test data is in public mode. If so, fit the current electronic device test data and the stored electronic device model to obtain a first modeling result, or fit the current electronic device model and the stored electronic device test data to obtain a second modeling result.

[0093] like Figure 2As shown in the figure, Curve fitting is a data-model fitting function, wherein the fitting modeling process is the process of using the device model. The simulation data obtained by model calculation needs to be compared and analyzed with the current device test data, and the model that best matches the current device test data results is selected. At the same time, some related parameters involved in the model may need to be modified and adjusted according to the current device test data to obtain a model that better matches the actual tested device. This process is called modeling.

[0094] like Figure 2 As shown, taking the IV (current-voltage) characteristic as an example, the test data will obtain a set of IV data. Using the model through the voltage input under the same conditions as the test data, a set of current output will also be obtained. This will generate the IV characteristics obtained by the model. Fitting is to select the model that is closest to the experimental data (including relevant parameter adjustments) and perform analysis.

[0095] Among them, Expert.data is the experimental test data, Device model code is the model simulation data, and the formula below is a schematic explanation of the model formula (see Figure 2 ).

[0096] like Figure 3 As shown, the specific process of the current electronic device test user requesting fitting modeling is: after obtaining the current electronic device test data, search the database for the related storage electronic device model, and make the server fit the current electronic device test data with the related storage electronic device model in the database, and view the fitting results in real time. When the current electronic device test user is satisfied with the fitting results, the device parameters and device model files obtained by fitting are downloaded. If the current electronic device test user is not satisfied with the fitting results, the parameters of the storage electronic device model can be manually adjusted or the storage device model can be replaced. The adjusted storage electronic device model or the replaced storage device model can then be re-fitted with the current electronic device test data until a fitting result that satisfies the current electronic device test user is obtained, and finally the fitted device parameters and device model files are obtained.

[0097] Specifically, current electronic device test data of the current electronic device test user is acquired and it is determined whether the stored electronic device model is in a public mode. If so, a first automatic fitting is performed on the current electronic device test data and the stored electronic device model.

[0098] Among them, the current electronic device test user can search the electronic device model related to the current electronic device test data from the database. When it is determined that the relevant electronic device model is in public mode, the user can choose to select the electronic device model he needs and the current electronic device test data for fitting modeling, and can view the fitting modeling results in real time.

[0099] like Figure 2 As shown, Model generation is a model generation function. After the current electronic device test data is automatically fitted with the stored electronic device model, the best fitting result is selected to generate first device parameters and a first device model file.

[0100] The device parameters can be used to describe the relevant performance of the device that researchers are interested in, and the device model can be used for practical applications in subsequent circuit simulations.

[0101] When the first automatic fitting is performed, a simulation test is performed according to the storage electronic device model to obtain first simulation test data.

[0102] The first simulation test data is compared with the current electronic device test data, and when the first simulation data is most consistent with the current electronic device test data, a best fitting result is obtained.

[0103] When the current electronic device test data is first automatically fitted with the stored electronic device model and the best fitting result is not obtained, the parameters in the stored electronic device model are adjusted or the stored electronic device model is replaced.

[0104] Among them, the adjustment of parameters means that the device model source code uploaded by the user will contain a series of parameters. These parameters can be used as variables in the fitting function to allow users who use the model to adjust them to correspond to experimental data. The adjustment method can be adjusted in command line mode or in a visual interface (all parameters are displayed visually). The specific adjustment method depends on the implementation method of the fitting modeling between the device model and the device test data.

[0105] The stored electronic device model after parameter adjustment or the replaced stored electronic device model is refitted with the current electronic device test data until the best fitting result is met, and the first device parameters and the first device model file are generated.

[0106] Among them, when the electronic device test user is not satisfied with the results produced by the current fitting modeling or fails to achieve his expected goals, he can choose to replace the currently selected storage electronic device model from the database, or choose to adjust the parameters of the currently selected storage electronic device model, and re-fit and model the current electronic device test data with the replaced or adjusted storage electronic device model until the best fitting result is obtained, and the first device parameters and the first device model file are obtained.

[0107] like Figure 4 As shown, the specific process of the current device model development user requesting fitting modeling is: after obtaining the current electronic device model, search the database for the related stored electronic device test data, and make the server fit the current electronic device model with the related stored electronic device test data in the database, and view the fitting results in real time. When the current device model development user is satisfied with the fitting results, the device parameters and device model files obtained by fitting are downloaded. If the current device model development user is not satisfied with the fitting results, the parameters or model code of the current electronic device model can be manually adjusted, and the adjusted current electronic device model and the stored electronic device test data are re-fitted until the fitting results that satisfy the current device model development user are obtained, and finally the fitted device parameters and device model files are obtained.

[0108] The current electronic device model of the current device model development user is obtained and it is determined whether the stored electronic device test data is in a public mode. If so, a second automatic fitting is performed on the current electronic device model and the stored electronic device test data.

[0109] Among them, the current device model development user can search for electronic device test data related to the current electronic device model from the database. When it is determined that the relevant electronic device test data is in public mode, the user can choose to select the electronic device test data he needs and the current electronic device model for fitting modeling, and can view the fitting modeling results in real time.

[0110] When the second automatic fitting is performed, a simulation test is performed according to the current electronic device model to obtain second simulation test data.

[0111] The second simulation test data is compared with the storage electronic device test data, and when the second simulation data is most consistent with the storage electronic device test data, a best fitting result is obtained.

[0112] After the current electronic device model and the stored electronic device test data are subjected to a second automatic fitting, the best fitting result is selected to generate a second device parameter and a second device model file.

[0113] When the current electronic device model is subjected to the second automatic fitting and the stored electronic device test data is not fitted and the best fitting result is not obtained, the parameters in the current electronic device model are adjusted or the stored electronic device test data are replaced.

[0114] The current electronic device model after parameter adjustment is refitted with the stored electronic device test data or the current electronic device model is refitted with the replaced stored electronic device test data until the best fitting result is met, and the second device parameters and the second device model file are generated.

[0115] Among them, when the device model development user is not satisfied with the results produced by the current fitting modeling or fails to achieve his expected goals, he can adjust the parameters of the current electronic device model or replace the stored electronic device test data, and re-fit the adjusted current electronic device model with the stored electronic device test data or re-fit the current electronic device model with the replaced stored electronic device test data until the best fitting result is obtained, and obtain the second device parameters and the second device model file.

[0116] After obtaining the device parameters and model files, the user can use the device parameters and model files to perform circuit simulation operations in a circuit simulator.

[0117] Among them, circuit simulation is the subsequent application of model files. When electronic devices are used in circuit simulation, relevant model files are required to support the call of circuit simulator. Through specific circuit simulation, various application prospects of devices can be developed.

[0118] Step S40: After the fitting modeling is completed, determine whether the current user chooses to disclose the current electronic device test data or the current electronic device model. If so, share the current electronic device test data or the current electronic device model, and score the stored electronic device model according to the first modeling result or score the stored electronic device test data according to the second modeling result.

[0119] Specifically, after the current electronic device test data is fitted with the stored electronic device model and modeling is completed, it is determined whether the current electronic device test user chooses to disclose the current electronic device test data.

[0120] If public is selected, all users will be given the authority to view and use the current electronic device test data.

[0121] If the user chooses not to disclose the data, the current electronic device test data is only available for viewing, use and deletion by the current electronic device test user.

[0122] Among them, when currently uploading data, electronic device testing users can choose whether to make the data they upload public, or choose different disclosure times and methods. They can require other academic researchers who use their experimental data to cite their relevant academic papers, and upload relevant intellectual property declaration information, specifically including the following five points: 1. If public, other users can view and use the test data; 2. If not public, the user himself can view it later, and the user can also choose whether the data is stored on the service for a long time or deleted at any time; 3. Users can also choose to make the experimental data public after a specific time point, such as after the paper is published; 4. Users can require other academic researchers who use their experimental data to cite their relevant academic papers; 5. If other users use their experimental data for commercial purposes, users can require other users to negotiate and obtain intellectual property rights for a fee.

[0123] like Figure 2 As shown, Ranking is a scoring ranking function. After obtaining the first device parameters and the first device model file, it is determined whether the current electronic device test user has scored the stored electronic device model used. If so, the score is uploaded and displayed.

[0124] The basis is that the current user has actually applied the corresponding test data or device model, and the used data or models can be displayed through the scoring interface and selected for scoring.

[0125] The evaluation criteria for the scoring are different for each user, and the requirements for different devices are also different. A unified standard can be formulated for devices of the same type, and multiple options of their most relevant characteristics can be provided, and users can score each performance option.

[0126] Through user scoring, the uploaded data or models can be comprehensively evaluated and ranked. The comprehensive evaluation and ranking can reflect the device performance or model accuracy. The higher the comprehensive evaluation, the higher the corresponding attention, and the corresponding article results will receive more exposure and citations, which can motivate users.

[0127] After the current electronic device model is fitted with the stored electronic device test data and modeled, it is determined whether the current device model development user chooses to make the current electronic device model public.

[0128] If public is selected, all users will be given the authority to view and use the current electronic device model.

[0129] If you choose not to make it public, the current electronic device model will only be viewed, used, and deleted by the user who developed the current device model.

[0130] Among them, when the current device model development user uploads the device model file, he can choose whether to make the uploaded model file public, or choose different disclosure times and methods. He can require other academic researchers who use his device model file to cite his relevant academic papers, and upload relevant intellectual property declaration information, specifically including the following five points: 1. If public, other users can view and use the test data; 2. If not public, the user himself can view it later, and the user can also choose whether the data is stored on the service for a long time or deleted at any time; 3. The user can also choose to disclose the experimental data after a specific time point, such as after the paper is published; 4. The user can require other academic researchers who use his experimental data to cite his relevant academic papers; 5. If other users use their experimental data for commercial purposes, the user can require other users to negotiate and obtain intellectual property rights for a fee.

[0131] After obtaining the second device parameters and the second device model file, it is determined whether the current device model development user has scored the storage electronic device test data. If so, the score is uploaded and displayed.

[0132] The present invention discloses a network-based data sharing method, thereby realizing the reception of electronic device electrical test data and electronic device model source code on an Internet server, and combining the computing power of the Internet server to realize the analysis of the test data and the fitting of the test data with the model. The core feature of the present invention is that the storage of electronic device electrical test data, model code storage, and the integration of multiple electronic device test data analysis processes such as data processing and fitting are realized on the Internet server. The lack of some specific functions, such as the lack of user information management function and sharing and communication function, does not affect the integrity of the invention.

[0133] The present invention utilizes the interconnectivity of the network to solve the communication and data exchange difficulties between device preparation, electrical testing personnel and device model developers, and openly shares and evaluates the performance of electronic device test data and models, realizes the evaluation and ranking of electronic device performance, and solves the problem of no unified standardization of electronic device performance indicators. At the same time, it also provides an open and transparent evaluation environment for performance improvement of new electronic devices and device model development.

[0134] The present invention helps to achieve effective communication and exchange between electronic device preparation and testing personnel and modeling personnel, and is also conducive to the one-stop storage, organization, analysis and modeling of electronic device test data.

[0135] The electronic device electrical test data hosting and modeling platform of the present invention can be run on a centralized internet server, allowing dispersed users to store, share, and analyze data in a centralized network space. Simultaneously, this data hosting and modeling platform can be run on multiple collaborative internet servers. Access can also be limited to users in a specific area, or to users within a specific enterprise, or to users within other social organizations, or the platform can be run in a local area network environment. The specific operating environment should not be a limitation of the present invention.

[0136] Further, if Figure 5 As shown, based on the above-mentioned network-based data sharing method, the present invention also provides a network-based data sharing system, wherein the network-based data sharing system includes:

[0137] The data upload module 51 is used to obtain user-uploaded or electronic device test data and electronic device models;

[0138] The data query module 52 is configured to, upon receiving a modeling request from the current user, search the uploaded electronic device test data or electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model;

[0139] a data fitting module 53, configured to obtain the current electronic device test data uploaded by the current user and determine whether the requested stored electronic device model is in a public mode, or to obtain the current electronic device model uploaded by the current user and determine whether the requested stored electronic device test data is in a public mode, and if so, to perform fitting modeling on the current electronic device test data and the stored electronic device model to obtain a first modeling result, or to perform fitting modeling on the current electronic device model and the stored electronic device test data to obtain a second modeling result;

[0140] The sharing scoring module 54 is used to determine whether the current user chooses to disclose the current electronic device test data or the current electronic device model after the fitting modeling is completed. If so, the current electronic device test data or the current electronic device model is shared, and the stored electronic device model is scored according to the first modeling result or the stored electronic device test data is scored according to the second modeling result.

[0141] Further, if Figure 6 As shown, based on the above-mentioned network-based data sharing method and system, the present invention also provides a shared modeling platform, which includes a processor 10, a memory 20 and a display 30. Figure 6Only some of the components of the shared modeling platform are shown, but it should be understood that implementation of all of the shown components is not required, and more or fewer components may be implemented instead.

[0142] In some embodiments, the memory 20 may be an internal storage unit of the shared modeling platform, such as a hard disk or memory of the shared modeling platform. In other embodiments, the memory 20 may also be an external storage device of the shared modeling platform, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the shared modeling platform. Furthermore, the memory 20 may also include both an internal storage unit and an external storage device of the shared modeling platform. The memory 20 is used to store application software and various types of data installed on the shared modeling platform, such as the program code for installing the shared modeling platform. The memory 20 may also be used to temporarily store data that has been output or is to be output. In one embodiment, a network-based data sharing program 40 is stored on the memory 20, and the network-based data sharing program 40 can be executed by the processor 10, thereby realizing the network-based data sharing method in the present application.

[0143] In some embodiments, the processor 10 may be a central processing unit (CPU), a microprocessor, or other data processing chip, configured to execute program codes stored in the memory 20 or process data, such as executing the network-based data sharing method.

[0144] In some embodiments, the display 30 may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, or an OLED (Organic Light-Emitting Diode) touchscreen. The display 30 is used to display information on the shared modeling platform and to display a visual user interface. The components 10-30 of the shared modeling platform communicate with each other via a system bus.

[0145] In one embodiment, when the processor 10 executes the network-based data sharing program 40 in the memory 20, the following steps are implemented:

[0146] Obtain electronic device test data or electronic device models uploaded by users;

[0147] When receiving a modeling request from the current user, searching the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model;

[0148] Obtaining current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, and if so, fitting and modeling the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting and modeling the current electronic device model with the stored electronic device test data to obtain a second modeling result;

[0149] When the fitting modeling is completed, it is determined whether the current user chooses to disclose the current electronic device test data or the current electronic device model. If so, the current electronic device test data or the current electronic device model is shared, and the stored electronic device model is scored according to the first modeling result or the stored electronic device test data is scored according to the second modeling result.

[0150] The step of obtaining the electronic device test data or electronic device model uploaded by the user specifically includes:

[0151] Upon receiving the user login, determining the role to which the user belongs;

[0152] The roles include electronic device test users and device model development users;

[0153] Acquiring basic information of the electronic device test user and the device model development user, and storing the basic information in a database;

[0154] The basic information includes: account number, password, user role, name, work unit, research field and contact information;

[0155] If the user is an electronic device testing user, obtaining electronic device testing data uploaded by the electronic device testing user;

[0156] If the user is a device model development user, the electronic device model uploaded by the device model development user is obtained.

[0157] The step of obtaining the electronic device test data or electronic device model uploaded by the user specifically further includes:

[0158] When the electronic device test data is acquired, the electronic device test data is stored in the database according to a first standard format;

[0159] When the electronic device model is acquired, storing the electronic device model in the database according to a second standard format;

[0160] An index relationship is established according to the label contents corresponding to the electronic device test data and the electronic device model, and the label contents are stored in the database.

[0161] When receiving a modeling request from the current user, searching the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model specifically includes:

[0162] When receiving a modeling request from a current electronic device testing user, obtaining tag content queried by the current electronic device testing user;

[0163] According to the index relationship established in the database by the tag content, searching the database for a related electronic device model to obtain a stored electronic device model;

[0164] When receiving a modeling request from a current device model development user, obtaining tag content queried by the current device model development user;

[0165] According to the index relationship established in the database by the tag content, relevant electronic device test data is searched from the database to obtain the stored electronic device test data.

[0166] The obtaining of the current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, and if so, fitting the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting the current electronic device model with the stored electronic device test data to obtain a second modeling result, specifically includes:

[0167] Acquiring current electronic device test data of the current electronic device test user and determining whether the stored electronic device model is in a public mode, and if so, performing a first automatic fitting between the current electronic device test data and the stored electronic device model;

[0168] After performing a first automatic fitting between the current electronic device test data and the stored electronic device model, selecting the best fitting result to generate a first device parameter and a first device model file;

[0169] Obtaining a current electronic device model of the current device model development user and determining whether the stored electronic device test data is in a public mode, and if so, performing a second automatic fitting between the current electronic device model and the stored electronic device test data;

[0170] After the current electronic device model and the stored electronic device test data are subjected to a second automatic fitting, the best fitting result is selected to generate a second device parameter and a second device model file.

[0171] The method further includes obtaining the current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode. If so, fitting the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting the current electronic device model with the stored electronic device test data to obtain a second modeling result.

[0172] When the current electronic device test data is subjected to a first automatic fitting with the stored electronic device model and the best fitting result is not obtained, adjusting parameters in the stored electronic device model or replacing the stored electronic device model;

[0173] Refitting the stored electronic device model after parameter adjustment or the replaced stored electronic device model with the current electronic device test data until an optimal fitting result is met, and generating the first device parameters and the first device model file;

[0174] When the current electronic device model is subjected to a second automatic fit with the stored electronic device test data and the best fit result is not obtained, adjusting parameters in the current electronic device model or replacing the stored electronic device test data;

[0175] The current electronic device model after parameter adjustment is refitted with the stored electronic device test data or the current electronic device model is refitted with the replaced stored electronic device test data until the best fitting result is met, and the second device parameters and the second device model file are generated.

[0176] Wherein, when the fitting modeling is completed, determining whether the current user chooses to disclose the current electronic device test data or the current electronic device model, and if so, sharing the current electronic device test data or the current electronic device model, and scoring the stored electronic device model according to the first modeling result or scoring the stored electronic device test data according to the second modeling result, specifically includes:

[0177] After the current electronic device test data is fitted with the stored electronic device model and modeling is completed, determining whether the current electronic device test user chooses to disclose the current electronic device test data;

[0178] If public is selected, all users will be given the authority to view and use the current electronic device test data;

[0179] If you choose not to disclose, the current electronic device test data will only be viewed, used and deleted by the current electronic device test user;

[0180] After obtaining the first device parameters and the first device model file, determining whether the current electronic device test user has scored the stored electronic device model used, and if so, uploading and displaying the score;

[0181] After the current electronic device model is fitted with the stored electronic device test data and modeled, determining whether the current device model developer chooses to make the current electronic device model public;

[0182] If public is selected, all users will be given the authority to view and use the current electronic device model;

[0183] If you choose not to make it public, the current electronic device model will only be viewed, used, and deleted by the user who developed the current device model.

[0184] After obtaining the second device parameters and the second device model file, it is determined whether the current device model development user has scored the storage electronic device test data. If so, the score is uploaded and displayed.

[0185] Wherein, the first automated fitting and the second automated fitting specifically include:

[0186] When performing the first automated fitting, a simulation test is performed according to the storage electronic device model to obtain first simulation test data;

[0187] Comparing the first simulation test data with the current electronic device test data, and obtaining a best fitting result when the first simulation data is most consistent with the current electronic device test data;

[0188] When performing the second automatic fitting, performing a simulation test according to the current electronic device model to obtain second simulation test data;

[0189] The second simulation test data is compared with the storage electronic device test data, and when the second simulation data is most consistent with the storage electronic device test data, a best fitting result is obtained.

[0190] The first standard format is: csv, txt, html, xls format file or database key-value type;

[0191] The second standard format is a VerilogA format file or a database key-value type.

[0192] The label content includes: device type, preparation process, test method, whether it is public data, required citation instructions and intellectual property rights description.

[0193] The present invention also provides a computer-readable storage medium, wherein the computer-readable storage medium stores a network-based data sharing program, and when the network-based data sharing program is executed by a processor, the steps of the network-based data sharing method described above are implemented.

[0194] In summary, the present invention provides a network-based data sharing method and related equipment, the method comprising: obtaining electronic device test data or electronic device models uploaded by a user; when receiving a modeling request from the current user, searching in the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model; obtaining the current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, and if so, fitting the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting the current electronic device model with the stored electronic device test data to obtain a second modeling result; when the fitting modeling is completed, determining whether the current user chooses to make the current electronic device test data or the current electronic device model public, and if so, sharing the current electronic device test data or the current electronic device model, and scoring the stored electronic device model according to the first modeling result or scoring the stored electronic device test data according to the second modeling result. The present invention uses the cloud storage capabilities of the server to classify, organize, store and publicly share the electronic device test data and device models uploaded by users. On the one hand, it is conducive to the long-term preservation and sharing of achievements of the whole society. On the other hand, it also strengthens the communication and exchange between electronic device test data and electronic device models, and promotes the development of new electronic device processes, device mechanism research and circuit application research.

[0195] It should be noted that, in this document, the terms "include," "comprises," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or shared modeling platform that includes a series of elements includes not only those elements but also other elements not explicitly listed, or also includes elements inherent to such process, method, article, or shared modeling platform. In the absence of further limitations, an element defined by the phrase "comprises a..." does not preclude the presence of other identical elements in the process, method, article, or shared modeling platform that includes the element.

[0196] Of course, those skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing related hardware (such as a processor, controller, etc.) through a computer program. The program can be stored in a computer-readable storage medium that can be read by a computer. When the program is executed, it can include the processes in the above-described method embodiments. The computer-readable storage medium can be a memory, a magnetic disk, an optical disk, etc.

[0197] It should be understood that the application of the present invention is not limited to the above examples. For those skilled in the art, improvements or changes can be made based on the above description. All these improvements and changes should fall within the scope of protection of the claims attached to the present invention.

Claims

1. A network-based data sharing method, characterized in that: The network-based data sharing method includes: Obtain electronic device test data or electronic device models uploaded by users; The obtaining of electronic device test data or electronic device model uploaded by the user specifically further includes: When the electronic device test data is acquired, the electronic device test data is stored in a database according to a first standard format; When the electronic device model is acquired, storing the electronic device model in the database according to a second standard format; Establishing index relationships according to the label contents corresponding to the electronic device test data and the electronic device model, respectively, and storing the label contents in the database; When receiving a modeling request from the current user, searching the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model; Obtaining current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, and if so, fitting and modeling the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting and modeling the current electronic device model with the stored electronic device test data to obtain a second modeling result; When the fitting modeling is completed, it is determined whether the current user chooses to disclose the current electronic device test data or the current electronic device model. If so, the current electronic device test data or the current electronic device model is shared, and the stored electronic device model is scored according to the first modeling result or the stored electronic device test data is scored according to the second modeling result.

2. The network-based data sharing method according to claim 1, characterized in that: The obtaining of electronic device test data or electronic device model uploaded by the user specifically includes: Upon receiving the user login, determining the role to which the user belongs; The roles include electronic device test users and device model development users; Acquiring basic information of the electronic device test user and the device model development user, and storing the basic information in a database; The basic information includes: account number, password, user role, name, work unit, research field and contact information; If the user is an electronic device testing user, obtaining electronic device testing data uploaded by the electronic device testing user; If the user is a device model development user, the electronic device model uploaded by the device model development user is obtained.

3. The network-based data sharing method according to claim 1, characterized in that: When receiving a modeling request from the current user, searching the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model specifically includes: When receiving a modeling request from a current electronic device testing user, obtaining tag content queried by the current electronic device testing user; According to the index relationship established in the database by the tag content, searching the database for a related electronic device model to obtain a stored electronic device model; When receiving a modeling request from a current device model development user, obtaining tag content queried by the current device model development user; According to the index relationship established in the database by the tag content, relevant electronic device test data is searched from the database to obtain the stored electronic device test data.

4. The network-based data sharing method according to claim 3, characterized in that: The obtaining of the current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining of the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode, and if so, fitting and modeling the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting and modeling the current electronic device model with the stored electronic device test data to obtain a second modeling result, specifically includes: Acquiring current electronic device test data of the current electronic device test user and determining whether the stored electronic device model is in a public mode, and if so, performing a first automatic fitting between the current electronic device test data and the stored electronic device model; After performing a first automatic fitting between the current electronic device test data and the stored electronic device model, selecting the best fitting result to generate a first device parameter and a first device model file; Obtaining a current electronic device model of the current device model development user and determining whether the stored electronic device test data is in a public mode, and if so, performing a second automatic fitting between the current electronic device model and the stored electronic device test data; After the current electronic device model and the stored electronic device test data are subjected to a second automatic fitting, the best fitting result is selected to generate a second device parameter and a second device model file.

5. The network-based data sharing method according to claim 4, characterized in that: The method further comprises: obtaining the current electronic device test data uploaded by the current user and determining whether the requested stored electronic device model is in a public mode, or obtaining the current electronic device model uploaded by the current user and determining whether the requested stored electronic device test data is in a public mode; if so, fitting and modeling the current electronic device test data with the stored electronic device model to obtain a first modeling result, or fitting and modeling the current electronic device model with the stored electronic device test data to obtain a second modeling result, and then further comprising: When the current electronic device test data is subjected to a first automatic fitting with the stored electronic device model and the best fitting result is not obtained, adjusting parameters in the stored electronic device model or replacing the stored electronic device model; Refitting the stored electronic device model after parameter adjustment or the replaced stored electronic device model with the current electronic device test data until an optimal fitting result is met, and generating the first device parameters and the first device model file; When the current electronic device model is subjected to a second automatic fit with the stored electronic device test data and the best fit result is not obtained, adjusting parameters in the current electronic device model or replacing the stored electronic device test data; The current electronic device model after parameter adjustment is refitted with the stored electronic device test data or the current electronic device model is refitted with the replaced stored electronic device test data until the best fitting result is met, and the second device parameters and the second device model file are generated.

6. The network-based data sharing method according to claim 5, characterized in that: After the fitting modeling is completed, determining whether the current user chooses to disclose the current electronic device test data or the current electronic device model; if so, sharing the current electronic device test data or the current electronic device model, and scoring the stored electronic device model according to the first modeling result or scoring the stored electronic device test data according to the second modeling result, specifically including: After the current electronic device test data is fitted with the stored electronic device model and modeling is completed, determining whether the current electronic device test user chooses to disclose the current electronic device test data; If public is selected, all users will be given the authority to view and use the current electronic device test data; If you choose not to disclose, the current electronic device test data will only be viewed, used and deleted by the current electronic device test user; After obtaining the first device parameters and the first device model file, determining whether the current electronic device test user has rated the stored electronic device model used, and if so, uploading and displaying the score obtained by the rating; After the current electronic device model is fitted with the stored electronic device test data and modeled, determining whether the current device model developer chooses to make the current electronic device model public; If public is selected, all users will be given the authority to view and use the current electronic device model; If you choose not to make it public, the current electronic device model will only be viewed, used, and deleted by the user who developed the current device model. After obtaining the second device parameters and the second device model file, it is determined whether the current device model development user has scored the stored electronic device test data. If so, the score obtained by the scoring is uploaded and displayed.

7. The network-based data sharing method according to claim 4, characterized in that: The first automated fitting and the second automated fitting specifically include: When performing the first automated fitting, a simulation test is performed according to the storage electronic device model to obtain first simulation test data; Comparing the first simulation test data with the current electronic device test data, and obtaining a best fitting result when the first simulation data is most consistent with the current electronic device test data; When performing the second automatic fitting, performing a simulation test according to the current electronic device model to obtain second simulation test data; The second simulation test data is compared with the storage electronic device test data, and when the second simulation data is most consistent with the storage electronic device test data, a best fitting result is obtained.

8. The network-based data sharing method according to claim 1, characterized in that: The first standard format is: csv, txt, html, xls format file or database key-value type; The second standard format is a VerilogA format file or a database key-value type.

9. The network-based data sharing method according to claim 1 or 3, characterized in that: The label content includes: device type, preparation process, test method, whether it is public data, required citation instructions and intellectual property rights description.

10. A network-based data sharing system, characterized in that: The network-based data sharing system is applied to the network-based data sharing method according to any one of claims 1 to 9, and the network-based data sharing system includes: A data upload module is used to obtain electronic device test data or electronic device models uploaded by users; a data query module configured to, upon receiving a modeling request from a current user, search the uploaded electronic device test data or the electronic device model according to the modeling request to obtain relevant stored electronic device test data or stored electronic device model; a data fitting module, configured to obtain current electronic device test data uploaded by the current user and determine whether the requested stored electronic device model is in a public mode, or to obtain the current electronic device model uploaded by the current user and determine whether the requested stored electronic device test data is in a public mode, and if so, to perform fitting modeling on the current electronic device test data and the stored electronic device model to obtain a first modeling result, or to perform fitting modeling on the current electronic device model and the stored electronic device test data to obtain a second modeling result; A shared scoring module is used to determine whether the current user chooses to disclose the current electronic device test data or the current electronic device model after the fitting modeling is completed. If so, the current electronic device test data or the current electronic device model is shared, and the stored electronic device model is scored according to the first modeling result or the stored electronic device test data is scored according to the second modeling result.

11. A shared modeling platform, characterized in that: The shared modeling platform includes: a memory, a processor, and a network-based data sharing program stored in the memory and executable on the processor. When the network-based data sharing program is executed by the processor, the steps of the network-based data sharing method according to any one of claims 1 to 9 are implemented.

12. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a network-based data sharing program, and when the network-based data sharing program is executed by a processor, the steps of the network-based data sharing method according to any one of claims 1 to 9 are implemented.

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