Method, device, equipment and medium for determining state under irradiation conditions

Abstract

The present application discloses a method, apparatus, device and medium for determining a state under irradiation conditions, wherein the method comprises: obtaining energy spectrum data of a target radiation source; determining irradiation parameters of an irradiation device based on the energy spectrum data; wherein the accuracy of the beam intensity of the irradiation device is greater than or equal to a target accuracy; controlling the irradiation device to irradiate a sample to be tested based on the irradiation parameters to obtain an energy data set output by the sample to be tested; and determining the energy output state of the sample to be tested under irradiation conditions including the irradiation parameters based on the energy data set.

Description

Technical Field

[0001] The present application relates to the field of radiation energy conversion technology, and in particular to a method, device, equipment and medium for determining a state under radiation conditions. Background Art

[0002] The energy output characteristics of materials, films, or devices when irradiated by a radioactive source are widely used in the field of energy conversion technology. Therefore, accurately determining the energy output of samples such as materials, films, or devices under irradiation conditions is particularly important. Although some related technologies provide methods for determining the irradiation energy of samples under irradiation conditions, the accuracy of the energy output determined by these methods is relatively low. Summary of the Invention

[0003] Based on the above technical problems, the embodiments of the present application provide a method, device, equipment and medium for determining the state under irradiation conditions.

[0004] The technical solution provided by the embodiments of this application is as follows:

[0005] An embodiment of the present application provides a method for determining a state under irradiation conditions, the method comprising:

[0006] Obtain energy spectrum data of target radioactive source;

[0007] determining irradiation parameters of an irradiation device based on the energy spectrum data; wherein the accuracy of the beam intensity of the irradiation device is greater than or equal to a target accuracy;

[0008] controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters to obtain a set of energy data output by the sample to be tested;

[0009] Based on the energy data set, an energy output state of the sample to be tested under irradiation conditions including the irradiation parameters is determined.

[0010] In some embodiments, the energy spectrum data includes at least energy data of electrons emitted by the target radiation source; the irradiation parameters include at least a set of energy data of electrons emitted by the irradiation device; and determining the irradiation parameters of the irradiation device based on the energy spectrum data includes:

[0011] determining an energy radiation range of electrons emitted by the target radiation source based on energy data of the electrons emitted by the target radiation source in the energy spectrum data;

[0012] The energy data set is determined based on the energy radiation range.

[0013] In some embodiments, determining the energy data set based on the energy radiation range includes:

[0014] determining a sampling strategy based on a distribution state of energy data of electrons emitted by the target radiation source within the energy radiation range;

[0015] Based on the sampling strategy, energy data of electrons emitted by the target radiation source within the energy radiation range are sampled to determine the energy data set.

[0016] In some embodiments, the energy spectrum data includes at least activity data of the target radiation source; the irradiation parameters include at least a set of beam intensities of the electron beam emitted by the irradiation device; and determining the irradiation parameters of the irradiation device based on the energy spectrum data includes:

[0017] Determining an emission probability set of the target radioactive source based on the energy spectrum data; wherein the emission probability set includes a set of occurrence probabilities of any energy data of the target radioactive source;

[0018] The beam intensity set is determined based on the emission probability set and the activity data.

[0019] In some embodiments, determining the beam intensity set based on the emission probability set and the activity data includes:

[0020] determining a target emission intensity data set based on the total amount of activity of the activity data and at least some of the emission probabilities in the emission probability set;

[0021] The emission intensity data in the target emission intensity data set is converted based on the elementary charge to obtain the beam intensity set.

[0022] In some embodiments, the irradiation parameters include an energy data set and / or a beam intensity set; the energy data set includes a set of energy data of electrons emitted by the irradiation device; the beam intensity set includes a set of beam intensities of electron beams emitted by the irradiation device; the irradiation device includes an electron gun; and controlling the irradiation device to irradiate the sample to be tested based on the irradiation parameters includes:

[0023] The electron gun is controlled to irradiate the sample to be tested based on the energy data in the energy data set and / or the beam intensity in the beam intensity set.

[0024] In some embodiments, controlling the irradiation device to irradiate the sample to be tested based on the irradiation parameters to obtain a set of energy data output by the sample to be tested includes:

[0025] controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters, and detecting a brightness data set and / or an electric power data set output by the sample to be tested;

[0026] The determining, based on the energy data set, an energy output state of the sample to be tested under irradiation conditions including the irradiation parameters, comprises:

[0027] The brightness data set and / or the electric power data set are integrated and statistically analyzed to obtain the light energy output state and / or electric energy output state of the sample to be tested under the irradiation conditions.

[0028] In some embodiments, the target radiation source comprises a beta radiation source.

[0029] The present application also provides a device for determining a state under irradiation conditions, the device comprising:

[0030] An acquisition module, used to acquire energy spectrum data of a target radioactive source;

[0031] a determination module, configured to determine irradiation parameters of an irradiation device based on the energy spectrum data; wherein the accuracy of the beam intensity of the irradiation device is greater than or equal to a target accuracy;

[0032] A control module, configured to control the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters, and obtain an energy data set output by the sample to be tested;

[0033] The determination module is further configured to determine, based on the energy data set, an energy output state of the sample to be tested under irradiation conditions including irradiation parameters.

[0034] An embodiment of the present application also provides an electronic device, which includes a processor and a memory; a computer program is stored in the memory; when the computer program is executed by the processor, it can implement the state determination method under irradiation conditions as described in any of the above.

[0035] An embodiment of the present application further provides a computer-readable storage medium, wherein the storage medium stores a computer program; when the computer program is executed by a processor of an electronic device, the method for determining the state under irradiation conditions as described above can be implemented.

[0036] The state determination method under irradiation conditions provided in an embodiment of the present application can determine the irradiation parameters of the irradiation equipment based on the energy spectrum data after obtaining the energy spectrum data of the target radiation source, so that the irradiation parameters of the irradiation equipment can be consistent with the energy spectrum data of the target radiation source; and, by controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters, the simulation of the radiation process of the target radiation source through the irradiation operation of the irradiation equipment is achieved, which can improve the safety of irradiating the sample to be tested; and, by adjusting the target radiation source, the irradiation operation of the irradiation equipment can achieve a full range of simulation of the radiation processes of multiple target radiation sources, thereby obtaining the energy output state of the sample to be tested under the irradiation conditions of multiple target radiation sources.

[0037] At the same time, since the accuracy of the beam intensity of the irradiation equipment is greater than or equal to the target accuracy, fine-grained control of the irradiation parameters can be achieved, thereby improving the fineness of irradiation of the sample to be tested, and capturing the energy data set of the sample to be tested under subtle changes in the irradiation parameters, thereby improving the accuracy of the energy data set and the energy output state.

[0038] On the other hand, based on the scattered energy data sets, the energy output state of the sample to be tested under irradiation conditions is determined, which realizes the organic integration of the scattered energy data sets, so that the overall energy output state of the sample to be tested under various irradiation conditions can be reflected from a fine granularity and a macroscopic perspective, thereby improving the comprehensiveness and accuracy of the energy output state of the sample to be tested under various irradiation conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 A schematic flow chart of a method for determining a state under irradiation conditions provided in an embodiment of the present application;

[0040] Figure 2 A schematic diagram of a process for determining an energy data set according to an embodiment of the present application;

[0041] Figure 3 A schematic diagram of the principle of detecting the brightness data set and the electric power data set output by the sample to be tested provided in an embodiment of the present application;

[0042] Figure 4 A schematic diagram of the distribution of emission probability sets and energy data sets provided in an embodiment of the present application;

[0043] Figure 5 A schematic diagram of the structure of a device for determining a state under irradiation conditions provided in an embodiment of the present application;

[0044] Figure 6 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0045] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application.

[0046] It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application.

[0047] When a radioactive source irradiates a material, film, or device, it can generate light or electricity. This irradiation property has been widely applied in the field of energy conversion. In practical applications, the state of light or electrical energy emitted by a sample under irradiation can vary depending on the sample type, preparation process, and irradiation conditions. Therefore, detecting the light or electrical energy output of samples, including these materials, films, or devices, under irradiation is particularly important.

[0048] To accurately measure the energy output of a sample under irradiation conditions, researchers typically use a radioactive source to directly irradiate the sample. However, this method carries a high risk and can easily pose a threat to the researcher's health.

[0049] To reduce the risk of sample irradiation and the threat to researchers' health, related technologies also provide methods for electron beam irradiation of samples using commercial equipment such as scanning electron microscopes or electron irradiators, as well as methods for electron beam irradiation of samples using modified scanning electron microscopes or electron irradiators. However, these scanning electron microscopes or electron irradiators are not professional equipment for irradiating samples, and their energy output forms are single and lacks precision. Therefore, the energy output state of the sample obtained by these methods under irradiation conditions is insufficiently accurate.

[0050] Based on the above problems, embodiments of the present application provide a method, apparatus, device, and medium for determining a state under irradiation conditions.

[0051] The state determination method under irradiation conditions provided in the embodiment of the present application irradiates the sample to be tested according to the irradiation parameters determined based on the energy spectrum data of the target radiation source by controlling the irradiation equipment so that the accuracy of the beam intensity is greater than or equal to the target accuracy. This not only improves the consistency between the energy output state of the irradiation equipment and the energy spectrum data of the target radiation source, but also improves the control accuracy of the output energy when the sample to be tested is irradiated, so that the energy data set obtained by irradiating the sample to be tested by the irradiation equipment can be consistent with the energy output of the sample to be tested when irradiated by the target radiation source, thereby improving the accuracy of the energy data set and the accuracy of determining the energy output state of the sample to be tested based on the energy data set.

[0052] It should be noted that the state determination method under irradiation conditions provided in the embodiment of the present application can be implemented by a processor of an electronic device; the above-mentioned processor can be at least one of an application-specific integrated circuit (ASIC), a digital signal processor (DSP), a digital signal processing device (DSPD), a programmable logic device (PLD), a field programmable gate array (FPGA), a central processing unit (CPU), a controller, a microcontroller, and a microprocessor.

[0053] Exemplarily, the electronic device may include a physical machine device or a virtual machine device.

[0054] Exemplarily, the electronic device may include a computer device, such as a server device or a personal computer device.

[0055] Figure 1 This is a flow chart of the method for determining the state under irradiation conditions provided in the embodiment of the present application. Figure 1 As shown, the process may include the following steps:

[0056] Step 101: Acquire energy spectrum data of a target radioactive source.

[0057] In one embodiment, the target radiation source may include a radiation source provided with any type of radioactive material; illustratively, the type and / or quantity of the radioactive material may be determined or adjusted based on actual irradiation requirements; illustratively, the irradiation requirements may include at least one requirement of irradiation intensity, irradiation duration, convenience of irradiation detection, and the environment in which the irradiation operation is performed.

[0058] In one embodiment, the type of target radioactive source can be distinguished according to the type of radiation released by the radioactive material contained therein, the packaging method of the radioactive material, etc.; illustratively, according to the type of radiation released by the radioactive material contained therein, the target radioactive source can be divided into α radiation source, β radiation source, γ radiation source and neutron source, etc.; illustratively, according to the packaging method of the radioactive material, the target radioactive source can be divided into sealed radioactive source and unsealed radioactive source.

[0059] In one embodiment, the energy spectrum data may include statistical results of at least one type of energy released by the radioactive material contained in the target radiation source during the radioactive decay process.

[0060] In one embodiment, the energy spectrum data may be expressed in a discrete form or in a continuous form, such as in the form of a continuous curve in a two-dimensional coordinate system.

[0061] Step 102: Determine irradiation parameters of the irradiation equipment based on the energy spectrum data.

[0062] The beam intensity accuracy of the irradiation equipment is greater than or equal to the target accuracy.

[0063] In one embodiment, the irradiation equipment may include a device that can flexibly adjust the irradiation energy output mode, irradiation energy amplitude and irradiation energy type; exemplarily, the irradiation energy output mode may include continuous irradiation or intermittent irradiation; exemplarily, the irradiation energy amplitude may include the size of the energy irradiated by the irradiation equipment; exemplarily, the irradiation energy type may include the type of energy that the irradiation equipment can radiate or output, wherein the energy type may include light energy or electrical energy.

[0064] In one embodiment, the target accuracy can be determined or adjusted based on the actual irradiation requirements; illustratively, the irradiation requirements may include, in addition to the factors described above, at least one of the type, process, material, and geometric shape of the sample to be tested; illustratively, the sample to be tested may include the film, material or device described above, which is not limited to the embodiments of the present application.

[0065] In one embodiment, the accuracy of the beam intensity of the irradiation equipment is greater than or equal to the target accuracy, which may include the minimum adjustable unit of the beam intensity of the irradiation equipment being less than or equal to the adjustment unit corresponding to the target accuracy, such as the minimum adjustable unit of the beam of the irradiation equipment being less than or equal to the picoampere (pA) or nanoampere (nA) corresponding to the target accuracy.

[0066] In one embodiment, the irradiation parameters may include the type of energy irradiated or output by the irradiation device and / or the energy output method.

[0067] In one embodiment, the irradiation parameters may also include the amplitude of the energy irradiated or output by the irradiation device; illustratively, under the condition that the irradiation device irradiates or outputs energy in a discrete form, the irradiation parameters may also include the amplitude difference or time interval between two adjacent irradiations or output energies.

[0068] In one embodiment, the irradiation parameters may be determined by:

[0069] The energy spectrum data is calibrated to obtain at least part of the energy spectrum data, and the intersection of at least part of the data and the energy output range of the irradiation equipment is determined as the irradiation parameter of the irradiation equipment.

[0070] Parameters of the irradiation equipment are adjusted or set based on at least part of the energy spectrum data, thereby obtaining irradiation parameters of the irradiation equipment.

[0071] Step 103: Control the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters to obtain an energy data set output by the sample to be tested.

[0072] In one embodiment, the set of energy data output by the sample to be tested may include a set of energy data of a specified form output by the sample to be tested detected by a specified device, may also include a set of energy data output by the sample to be tested with an amplitude greater than an amplitude threshold, and may also include a set of all energy data output by the sample to be tested.

[0073] In one embodiment, controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters to obtain the energy data set output by the sample to be tested can be achieved by any of the following methods:

[0074] Based on the parameters in the irradiation parameters, the irradiation device is continuously controlled to irradiate the sample to be tested, and an energy detection device or equipment is used to detect a set of energy data output by the sample to be tested. Exemplarily, the energy detection device or equipment may include a device capable of detecting energy output by the sample to be tested; Exemplarily, the detection accuracy of the energy detection device or equipment may also be greater than or equal to a target accuracy.

[0075] Based on the parameters in the irradiation parameters, the irradiation equipment is controlled in sequence to irradiate the sample to be tested, and the energy data set output by the sample to be tested is detected by the energy detection device or equipment.

[0076] Step 104: Based on the energy data set, determine the energy output state of the sample to be tested under irradiation conditions including irradiation parameters.

[0077] In one embodiment, the irradiation conditions may also include the environmental conditions of the environment in which the sample to be tested is located and the duration of the irradiation operation of the irradiation equipment; illustratively, the environmental conditions may include at least one of ambient temperature, humidity, air pressure, air flow rate, and light intensity; the duration of the irradiation operation may include the time from the start to the end of the irradiation operation.

[0078] In one embodiment, the energy output state may include whether the sample to be tested outputs energy under the above-mentioned irradiation conditions, the energy output form, the type of output energy, and at least one of the amplitude of the output energy; illustratively, the type of output energy may include a single type, such as light energy, or may include multiple types, such as light energy and heat energy.

[0079] In one embodiment, the energy data set can reflect the energy output state of the sample to be tested under irradiation conditions in a discrete or microscopic form. Accordingly, the energy output state of the sample to be tested can reflect the energy output state of the sample to be tested under irradiation conditions in an overall form.

[0080] In one embodiment, the energy output state of the sample under irradiation conditions can be determined by any of the following methods:

[0081] The energy data in the energy data set are sorted based on the acquisition time of the energy data in the energy data set, so as to obtain the change state of the energy output by the sample to be tested under irradiation conditions in the time dimension.

[0082] The energy data in the energy data set is temporally correlated with the irradiation parameters of the irradiation equipment to obtain the energy output state of the sample to be tested under different irradiation parameters of the irradiation equipment. The above energy output state can characterize the change process of the energy output state of the sample to be tested as the irradiation parameters are included.

[0083] The energy data in the energy data set are associated with the irradiation parameters of the irradiation equipment and the environmental conditions of the environment in which the sample to be tested is located, and the change process of the energy output state of the sample to be tested along with the irradiation parameters and environmental conditions is obtained.

[0084] From the above, it can be seen that the state determination method under irradiation conditions provided in the embodiment of the present application can determine the irradiation parameters of the irradiation equipment based on the energy spectrum data after obtaining the energy spectrum data of the target radiation source, so that the irradiation parameters of the irradiation equipment can be consistent with the energy spectrum data of the target radiation source; and, by controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters, the simulation of the radiation process of the target radiation source through the irradiation operation of the irradiation equipment is realized, which can improve the safety of irradiating the sample to be tested; and, by adjusting the target radiation source, the irradiation process of multiple target radiation sources can be fully simulated through the irradiation operation of the irradiation equipment, thereby obtaining the energy output state of the sample to be tested under the irradiation conditions of multiple target radiation sources.

[0085] At the same time, since the accuracy of the beam intensity of the irradiation equipment is greater than or equal to the target accuracy, fine-grained control of the irradiation parameters can be achieved, thereby improving the fineness of irradiation of the sample to be tested, and capturing the energy data set of the sample to be tested under subtle changes in the irradiation parameters, thereby improving the accuracy of the energy data set and the energy output state.

[0086] On the other hand, based on the scattered energy data sets, the energy output state of the sample to be tested under irradiation conditions is determined, which realizes the organic integration of the scattered energy data sets, so that the overall energy output state of the sample to be tested under various irradiation conditions can be reflected from a fine granularity and a macroscopic perspective, thereby improving the comprehensiveness and accuracy of the energy output state of the sample to be tested under various irradiation conditions.

[0087] Based on the above embodiments, in the energy determination state under the irradiation conditions provided in the embodiments of the present application, the energy spectrum data includes at least the energy data of the electrons emitted by the target radiation source; and the irradiation parameters include at least the energy data set of the electrons emitted by the irradiation equipment.

[0088] In one embodiment, the energy data of electrons emitted by the target radiation source may include the energy of electrons radiated by any radioactive material contained in the target radiation source during the radioactive decay process.

[0089] In one embodiment, the energy data set of electrons emitted by the irradiation device may include a set of energy amplitudes of electrons emitted by the irradiation device at different time points; illustratively, the distribution state and / or change trend of energy data in the energy data set of electrons emitted by the irradiation device may be consistent with the distribution state and / or change trend of energy data in the energy spectrum data.

[0090] In one embodiment, the amount of energy data in the energy data set of electrons emitted by the irradiation device may be greater than or equal to a quantity threshold, so that the distribution state of the energy data in the energy data set of electrons emitted by the irradiation device can comprehensively and accurately characterize the distribution state of the energy data in the energy spectrum data.

[0091] In one embodiment, the energy data in the energy data set can be represented as E i , where i can be an integer greater than or equal to 1.

[0092] Accordingly, the irradiation parameters of the irradiation equipment can be determined based on the energy spectrum data in the following ways:

[0093] Based on the energy data of the electrons emitted by the target radioactive source in the energy spectrum data, the energy radiation range of the electrons emitted by the target radioactive source is determined; based on the energy radiation range, the energy data set is determined.

[0094] In one embodiment, the energy radiation range may include an energy range between a minimum value and a maximum value of the energy data of the electrons emitted by the target radiation source; illustratively, the energy radiation range may include a plurality of energy data distributed continuously or discretely. The maximum value of the energy data of the electrons emitted by the target radiation source may be expressed as E max .

[0095] In one embodiment, the energy radiation range can be determined by comparing the energy data of the electrons emitted by the target radiation source in the energy spectrum data, wherein the energy radiation range can be expressed as [0, E max ], and E i Less than or equal to E max .

[0096] In one embodiment, the energy data set may be determined by any of the following methods:

[0097] Energy data whose number is not less than a threshold value is randomly selected from the energy radiation range, and a set of these energy data is determined as an energy data set.

[0098] Energy data with a quantity not less than a threshold value is randomly selected from the energy radiation range, and these energy data are arranged in ascending order, and then the arrangement result is determined as an energy data set.

[0099] From the above, it can be seen that in the state determination method under irradiation conditions provided in the embodiment of the present application, the energy spectrum data at least includes the energy data of the electrons emitted by the target radiation source. Therefore, the energy radiation range determined based on the energy data of the electrons emitted by the target radiation source in the energy spectrum data can comprehensively and accurately reflect the actual energy state of the electrons emitted by the target radiation source in at least one interval; and, determining the energy data set of electrons emitted by the irradiation equipment based on the energy radiation range can improve the consistency between the energy data set of electrons emitted by the irradiation equipment and the energy data of electrons emitted by the target radiation source; at the same time, determining the energy data set based on the energy radiation range can also approximate the electron emission characteristics of the target radiation source through the limited energy data in the energy data set.

[0100] Based on the above embodiment, in the state determination method under irradiation conditions provided in the embodiment of the present application, the energy data set is determined based on the energy radiation range, which can be achieved by Figure 2 The process shown is implemented as follows, Figure 2 A schematic diagram of a process for determining an energy data set provided in an embodiment of the present application is shown in FIG. Figure 2 As shown, the process may include the following steps:

[0101] Step 201: Determine a sampling strategy based on the distribution state of energy data of electrons emitted by a target radiation source within an energy radiation range.

[0102] In one embodiment, the distribution state of the energy data of electrons emitted by the target radiation source within the energy radiation range may include the energy interval between the energy data of electrons emitted by the target radiation source within the energy radiation range and / or the slope of the curve represented by the energy data of electrons emitted by the target radiation source.

[0103] In one embodiment, the above distribution state may also include a time domain distribution state of energy data of electrons emitted by the target radiation source.

[0104] In one embodiment, the sampling strategy may include at least one of an energy data point at which sampling starts, a sampling quantity, and a quantity of energy data intervals between adjacent sampled energy data points within the energy radiation range.

[0105] In one embodiment, the sampling strategy may include a strategy of sampling the energy data within the energy radiation range at a uniform energy data interval or a non-uniform energy data interval.

[0106] In one embodiment, the sampling strategy may be determined as follows:

[0107] Based on the distribution state of energy data of electrons emitted by the target radiation source within the energy radiation range, a corresponding sampling strategy is determined. For example, for a first interval in which the density of energy data of electrons emitted by the target radiation source is a first degree, a first sampling interval can be used to sample the energy data of electrons emitted by the target radiation source, and for a second interval in which the density of energy data of electrons emitted by the target radiation source is a second degree, a second sampling interval can be used to sample the energy data of electrons emitted by the target radiation source. Exemplarily, the first degree can be greater than the second degree, the first sampling interval can be smaller than the second sampling interval, and the energy radiation range can include at least the first interval and the second interval.

[0108] Step 202: Based on the sampling strategy, sample the energy data of electrons emitted by the target radiation source within the energy radiation range to determine an energy data set.

[0109] Exemplarily, based on the sampling starting point in the sampling strategy, energy data within the energy radiation range may be uniformly sampled or non-uniformly sampled, and the energy data obtained by the sampling may be determined as an energy data set.

[0110] From the above, it can be seen that in the state determination method under irradiation conditions provided in the embodiment of the present application, the sampling strategy determined based on the distribution state of energy data of electrons emitted by the target radiation source within the energy radiation range can improve the pertinence and accuracy of the sampling operation; and the energy data set determined by sampling the energy data within the energy radiation range based on the above-mentioned sampling strategy can not only improve the consistency between the energy data set and the energy data within the energy radiation range, but also through the limited data in the energy data set, it can infinitely approach the distribution state between the energy data within the energy radiation range.

[0111] Based on the above embodiments, in the state determination method under irradiation conditions provided in the embodiments of the present application, the energy spectrum data includes at least the activity data of the target radiation source; and the irradiation parameters include at least the beam intensity set of the electron beam emitted by the irradiation equipment.

[0112] In one embodiment, the activity data of the target radioactive source may include the number of atoms of the radioactive element or isotope contained in the target radioactive source that decay per second. The international unit of the activity data of the radioactive element or isotope is Becquerel (Bq).

[0113] In one embodiment, the activity data of the target radioactive source may include the number of times per second that the radioactive element or isotope contained in the target radioactive source decays.

[0114] In one embodiment, the activity data of the target radiation source may be represented by the intensity of electrons emitted by the radiation source.

[0115] In one embodiment, the beam intensity set of the electron beam emitted by the irradiation device may include multiple beam intensities; illustratively, the number of beam intensities in the beam intensity set may be less than or equal to the number of energy data in the energy data set.

[0116] Accordingly, the irradiation parameters of the irradiation equipment can be determined based on the energy spectrum data in the following ways:

[0117] Based on the energy spectrum data, the emission probability set of the target radiation source is determined; based on the emission probability set and the activity data, the beam intensity set is determined.

[0118] The emission probability set includes a set of occurrence probabilities of any energy data of the radiation source.

[0119] In one embodiment, the emission probability set may include multiple emission probabilities, and these emission probabilities may correspond to various energy data respectively; illustratively, the emission probability in the emission probability set may be less than 1.

[0120] In one embodiment, the probability of occurrence of the activity data may be determined based on the ratio of the number of occurrences of the energy data in the energy spectrum data to the sum of the number of occurrences of all the energy data in the energy spectrum data.

[0121] Exemplarily, the number of occurrences of activity data in the energy spectrum data may be sorted, and the probability of activity data with a number of occurrences greater than or equal to a threshold may be counted to obtain an emission probability set.

[0122] In one embodiment, determining a set of beam intensities based on a set of emission probabilities and activity data can be achieved by:

[0123] The emission probabilities in the emission probability set are sorted, and the activity data corresponding to the emission probabilities whose emission probabilities are greater than or equal to the probability threshold are selected as the activity data of the irradiation device. The activity data of the irradiation device are then converted to obtain a beam intensity set.

[0124] As can be seen from the above, in the state determination method under irradiation conditions provided in the embodiments of the present application, the energy spectrum data includes at least the activity data of the target radiation source. Therefore, determining the emission probability set of the target radiation source based on the energy spectrum data can comprehensively and accurately reflect the probability of occurrence of any activity data of the target radiation source; and determining the beam intensity set based on the emission probability set and the activity data can ensure that the beam intensity in the beam intensity set is consistent with the change state and coverage range of the activity data of the target radiation source, thereby improving the accuracy of the beam intensity in the beam intensity set.

[0125] Based on the above embodiments, in the state determination method under irradiation conditions provided in the embodiments of the present application, determining the beam intensity set based on the emission probability set and activity data can be achieved in the following manner:

[0126] A target emission intensity data set is determined based on the total activity of the activity data and at least part of the emission probabilities in the emission probability set; and the emission intensity data in the target emission intensity data set is converted based on the elementary charge to obtain a beam intensity set.

[0127] In one embodiment, at least some of the transmission probabilities in the transmission probability set may be greater than or equal to a probability threshold.

[0128] In one embodiment, the product of the total activity and the emission probabilities in at least part of the emission probabilities can be determined as the target emission intensity. Accordingly, the products of the total activity and the emission probabilities in at least part of the emission probabilities can be integrated, and the integrated multiple target emission intensity data can be determined as the target emission intensity data set. For example, the i-th target emission intensity data can be calculated using formula (1):

[0129] A i = A×w i (1)

[0130] In formula (1), A i It can represent the emission intensity data of the i-th target, A can represent the total activity of the target radioactive source, w i The i-th transmission probability in at least a portion of the set of transmission probabilities may be identified, where i is an integer greater than or equal to 1.

[0131] In one embodiment, the product of the elementary charge and the target emission intensity data in the target emission intensity set can be determined as the beam intensity. Accordingly, the set of beam intensities obtained by multiplying the elementary charge and each target emission intensity data in the target emission intensity set can be determined as the above-mentioned beam intensity set. For example, the beam intensity can be calculated using formula (2):

[0132] q i =A i ×1.6×10 -19 (2)

[0133] In formula (2), q i It can represent the i-th beam intensity, and its unit can be 1.6×10 -19 is the elementary charge.

[0134] For example, by transforming formula (2), formula (3) can be obtained:

[0135] q i =A i ×1.6×10 -10 (nA) (3)

[0136] In formula (3), q i The unit is converted to nanoampere (nA), which can improve the convenience of controlling and adjusting the beam intensity of the irradiation equipment.

[0137] From the above, it can be seen that in the state determination method under irradiation conditions provided in the embodiment of the present application, the target emission intensity data set is determined by the total activity of the target radiation source and at least part of the emission probability in the emission probability set. This not only improves the consistency between the target emission intensity data in the target emission intensity data set and the activity data of the target radiation source, but also, by switching at least part of the emission probability, it is possible to achieve flexible selection of the emission data in the target emission intensity data set; at the same time, the beam intensity set obtained by converting the emission intensity data in the target emission intensity data set based on the elementary charge can accurately characterize the beam intensity change state of the target radiation source during the radiation process.

[0138] Based on the foregoing embodiments, in the state determination method under irradiation conditions used in the embodiments of the present application, the irradiation parameters include an energy data set and / or a beam intensity set; the energy data set includes a set of energy data of electrons emitted by the irradiation equipment; the beam intensity set includes a set of beam intensities of electron beams emitted by the irradiation equipment; and the irradiation equipment includes an electron gun.

[0139] In related technologies, the scanning electron microscopes or electron irradiators used to irradiate samples have high beam energies, typically hundreds of keV. The beam energy is uniform, the beam intensity is also high (typically in the milliampere range), and the beam spot size is small (typically in the micrometer or nanometer range). However, the electron beam energy of a real radioactive source is continuous, with half the beam intensity ranging from picoamperes (pA) to tens of nanoamperes (nA), and the beam spot size is typically in the centimeter range. Therefore, the energy output state obtained by irradiating a sample using such a scanning electron microscope or electron irradiator is not equivalent to the energy output state of the sample under irradiation conditions from a real radioactive source.

[0140] In the embodiment of the present application, by controlling the accuracy of the electron gun's beam intensity to be greater than or equal to the target accuracy, and determining the electron gun's energy data set including the emitted electrons and / or the beam intensity set based on the energy spectrum data of the target radiation source, not only is a precise simulation of the radiation characteristics of the target radiation source achieved, but a method for simulating the target radiation source with an electron beam of low beam intensity is also established, thereby enabling precise simulation of the activity of at least two dimensions of the same target radiation source, as well as precise simulation of the activity of different target radiation sources.

[0141] Accordingly, controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters can be achieved in the following ways:

[0142] The electron gun is controlled to irradiate the sample to be measured based on the energy data in the energy data set and / or the beam intensity in the beam intensity set.

[0143] In an embodiment of the present application, based on the energy data set and the beam intensity set determined by the energy spectrum data of the target radiation source, the electron gun is controlled to irradiate the sample to be tested, thereby achieving irradiation of the sample to be tested with an electron beam of different energies and beam intensities simulating the target radiation source by the electron gun; and, since the accuracy of the beam intensity of the electron gun is greater than or equal to the target accuracy, by irradiating the sample to be tested with the electron gun, a fine-grained irradiation operation consistent with the target radiation source can be achieved for the sample to be tested, thereby improving the accuracy of the energy data set output by the sample to be tested.

[0144] Based on the above embodiments, in the state determination method under irradiation conditions provided in the embodiments of the present application, controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters to obtain the energy data set output by the sample to be tested can be achieved in the following manner:

[0145] The irradiation equipment is controlled to irradiate the sample to be tested based on the irradiation parameters, and a brightness data set and / or an electric power data set output by the sample to be tested is detected.

[0146] In one embodiment, the brightness data set may include a set of data of light signals output by the sample to be tested, which are detected by a brightness detection device during the process of the irradiation equipment irradiating the sample to be tested using the method provided in the aforementioned embodiment; illustratively, the brightness detection device may include a luminance meter and / or a spectrometer.

[0147] In one embodiment, the electric power data set may include a set of data of the electric signal output by the sample to be tested, which is detected by the electric energy detection device during the process of the irradiation equipment irradiating the sample to be tested by the method provided in the aforementioned embodiment; illustratively, the electric energy detection device may include an electric output measuring device.

[0148] Figure 3 This is a schematic diagram of the principle of detecting the brightness data set and the electric power data set output by the sample to be tested provided in the embodiment of the present application. Figure 3 As shown, the sample to be tested 301 can be placed on a sample table 303 set in the detection space 302; before the sample to be tested 301 is irradiated, the air pressure inside the detection space 302 can be adjusted by a vacuum unit, such as adjusting it to a vacuum state, and the air pressure state in the detection space 302 can be detected by a vacuum gauge 304.

[0149] Illustratively, after determining the energy data set and beam intensity set of electrons emitted by the electron gun 305 by the method provided in the above embodiment, the electron gun 305 can be controlled to irradiate the sample 301 based on the energy data set and beam intensity set.

[0150] For example, during the process of the electron gun 305 irradiating the sample to be tested 301, the light data emitted by the sample to be tested 301 can be detected by the luminance meter 306 to obtain a brightness data set, and the spectrum of the light data emitted by the sample to be tested can be detected by the spectrometer 307. The electric power data output by the sample to be tested can also be detected by the electric output measuring device 308 to obtain an electric power data set.

[0151] Exemplarily, a communication connection can be established between the vacuum gauge 304, the luminance meter 306, the spectrometer 307, and the electrical output measuring device 308 and the computer device 309, so that the computer device 309 can obtain the air pressure state, light data set, and electric power data set in the detection space 302; exemplarily, a communication connection can also be established between the electron gun 305 and the computer device 309, so that the computer device 309 can obtain the irradiation parameters of the electron gun 305.

[0152] Accordingly, based on the energy data set, determining the energy output state of the sample under irradiation conditions including irradiation parameters can be achieved in the following ways:

[0153] The brightness data set and / or the electric power data set are integrated and statistically analyzed to obtain the light energy output state and / or electric energy output state of the sample to be tested under the irradiation condition.

[0154] In one embodiment, the brightness data in the brightness data set may be statistically averaged to obtain the light energy output state of the sample to be tested under the above irradiation conditions; illustratively, the light energy amplitude in the light energy output state may be calculated using formula (4):

[0155]

[0156] In formula (4), B can be the light energy amplitude output by the sample under the above irradiation conditions; B i It can represent the i-th brightness data in the brightness data set.

[0157] In one embodiment, the electric power data in the electric power data set may be statistically averaged to obtain the electric energy output state of the sample to be tested under the above-mentioned irradiation conditions; illustratively, the electric energy amplitude in the electric energy output state may be calculated using formula (5):

[0158]

[0159] Wherein, P is the electric energy amplitude output by the sample under the above irradiation conditions, P i is the i-th electric power data in the electric power data set.

[0160] Exemplarily, the i-th brightness data and the i-th electric power data may be obtained under the condition that the irradiation equipment irradiates the sample to be measured with the i-th energy data and the i-th beam intensity.

[0161] In the following, the sample to be tested is irradiated with an area of ​​1.54 cm 2 ZnS:Cu thin film sample, with the target radiation source of 1Ci 3Taking H as an example, the process of the state determination method under irradiation conditions provided in the embodiment of the present application is explained.

[0162] First, get 1Ci 3 The energy spectrum data of H is used to determine the energy radiation range based on the energy spectrum data, and the energy data set is determined based on the above energy radiation range. The activity data in the energy spectrum data can also be used to determine 3 The set of emission probabilities of H. Figure 4 Schematic diagram of the distribution of the emission probability set and energy data set provided in the embodiment of the present application. Figure 4 In the two-dimensional coordinate system shown, the horizontal axis represents 3 The energy data set of H, whose unit is keV, and the normalized probability represented by the vertical axis can be the emission probability set in the above embodiment.

[0163] For example, based on Figure 4 The energy data set and beam intensity set determined by the energy spectrum data shown can be shown in Table 1. As shown in Table 1, Table 1 includes two columns of data: energy data set and beam intensity set. The unit of energy data in the energy data set can be keV, and the unit of beam intensity in the beam intensity set can be / 10-1nA. In Table 1, the energy data in the energy data set can be expressed in E i Indicates that, and E i The value can be less than or equal to E max , where E max Can be 3 The maximum energy value of the radiated electrons of H.

[0164] For example, the internal air pressure of the detection space can be adjusted to 10 -6 Pa, and based on the energy data in the energy data set in Table 1 and the beam intensity in the beam intensity set, control

[0165] Energy data collection <![CDATA[A×w i ]]> Beam intensity collection 1 <![CDATA[3.42×10 10 ]]> 5.47 2 <![CDATA[3.63×10 10 ]]> 5.81 3 <![CDATA[3.63×10 10 ]]> 5.81 4 <![CDATA[3.50×10 10 ]]> 5.6 5 <![CDATA[3.29×10 10 ]]> 5.26 5.7 <![CDATA[3.11×10 10 ]]> 4.98 6 <![CDATA[3.03×10 10 ]]> 4.84 7 <![CDATA[2.72×10 10 ]]> 4.35 8 <![CDATA[2.38×10 10 ]]> 3.81 9 <![CDATA[2.06×10 10 ]]> 3.3 10 <![CDATA[1.73×10 10 ]]> 2.77 11 <![CDATA[1.40×10 10 ]]> 2.24 12 <![CDATA[1.09×10 10 ]]> 1.74 13 <![CDATA[8.19×10 10 ]]> 1.31 14 <![CDATA[5.69×10 10 ]]> 0.91 15 <![CDATA[1.78×10 10 ]]> 0.56 16 <![CDATA[1.94×10 10 ]]> 0.31 17 <![CDATA[7.50×10 10 ]]> 0.12 18.6 <![CDATA[6.25×10 10 ]]> 0.001

[0166] Table 1

[0167] Electron gun irradiation 3 H, detected by luminance meter and spectrometer at the same time 3 The brightness data set emitted by H is detected by an electrical output measuring device 3 The electric power data set emitted by H is calculated by using equations (3) to (4) to calculate the brightness data in the brightness data set and the electric power data in the electric power data set, so that 3 H's light output status and electrical output status.

[0168] Energy data collection Beam intensity collection Brightness data set 1 5.47 1.16 2 5.81 1.23 3 5.81 1.23 4 5.6 1.18 5 5.26 1.10 5.7 4.98 1.05 6 4.84 1.02 7 4.35 0.91 8 3.81 0.79 9 3.3 0.68 10 2.77 0.57 11 2.24 0.46 12 1.74 0.35 13 1.31 0.27 14 0.91 0.18 15 0.56 0.11 16 0.31 0.06 17 0.12 0.02 18.6 0.001 0.0002

[0169] Table 2

[0170] Table 2 shows the irradiation area of ​​1.54 cm by controlling the electron gun based on the energy data set and beam intensity set in Table 2 according to the embodiment of the present application. 2 The data of the brightness data set obtained by irradiating the ZnS:Cu thin film sample is shown in Table 2. The first two columns of data and their units are the same as those in Table 1. The third column of data in Table 2 is the brightness data set; for example, the third column of data B in Table 2 is obtained by formula (6). i That is, the brightness data set is calculated, and the light energy is 1.24, where the unit of B is Cd / m 2 .

[0171]

[0172] From the above, it can be seen that in the state determination method under irradiation conditions provided in the embodiment of the present application, the irradiation equipment is controlled to irradiate the sample to be tested based on the irradiation parameters, and the brightness data set and / or electric power data set output by the sample to be tested is detected, thereby realizing the simulation of the target radiation source by the irradiation equipment, and achieving the purpose of equivalent irradiation of the sample to be tested without directly operating the target radiation source; and, by controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters and detecting the brightness data set and / or electric power data set output by the sample to be tested, the photoelectric characteristics of the sample to be tested are quickly detected by the equivalent radiation of the irradiation equipment; at the same time, the light energy output state and / or electric energy output state obtained by integrating and statistically analyzing the brightness data set and / or electric power data set can accurately characterize the light and / or electric energy output characteristics of the sample to be tested under irradiation of the target radiation source. In this way, not only the radiation risk of determining the energy output state of the sample to be tested under irradiation conditions is reduced, but also the efficiency of determining the energy output state is improved.

[0173] Based on the foregoing embodiments, in the energy determination method under irradiation conditions provided in the embodiments of the present application, the target radiation source includes a β radiation source.

[0174] In practical applications, the energy spectrum of a beta radiation source is a continuous spectrum. Therefore, the energy of electrons emitted by the beta radiation source can cover the range from 0 to the maximum electron energy of the beta radiation source. In addition, the number of electrons emitted by the beta radiation source can also change continuously with the change of the electron energy.

[0175] Therefore, when determining the energy data set and / or the data in the beam intensity set in the irradiation parameters by using the energy spectrum data of the β radiation source, the requirements for the selection of the energy data and / or beam intensity can be reduced, thereby improving the flexibility of the selection of the energy data and / or beam intensity.

[0176] Based on the above embodiments, the present application also provides a device for determining a state under irradiation conditions. Figure 5 A schematic diagram of the structure of the device for determining the state under irradiation conditions provided in an embodiment of the present application, such as Figure 5 As shown, the device may include:

[0177] An acquisition module 501 is used to acquire energy spectrum data of a target radioactive source;

[0178] A determination module 502 is configured to determine irradiation parameters of the irradiation device based on the energy spectrum data; wherein the accuracy of the beam intensity of the irradiation device is greater than or equal to the target accuracy;

[0179] A control module 503 is configured to control the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters, and obtain an energy data set output by the sample to be tested;

[0180] The determination module 502 is further configured to determine the energy output state of the sample to be tested under irradiation conditions including irradiation parameters based on the energy data set.

[0181] In some embodiments, the energy spectrum data includes at least energy data of electrons emitted by the target radiation source; the irradiation parameters include at least a set of energy data of electrons emitted by the irradiation device;

[0182] The determination module 502 is configured to determine an energy radiation range of electrons emitted by the target radiation source based on energy data of electrons emitted by the target radiation source in the energy spectrum data; and determine an energy data set based on the energy radiation range.

[0183] In some embodiments, the determination module 502 is used to determine a sampling strategy based on the distribution state of energy data of electrons emitted by the target radiation source within the energy radiation range; based on the sampling strategy, the energy data of electrons emitted by the target radiation source within the energy radiation range is sampled to determine an energy data set.

[0184] In some embodiments, the energy spectrum data includes at least activity data of the target radiation source; the irradiation parameters include at least a set of beam current intensities of the electron beam emitted by the irradiation device;

[0185] A determination module 502 is configured to determine an emission probability set of a target radioactive source based on the energy spectrum data; wherein the emission probability set includes a set of occurrence probabilities of any energy data of the target radioactive source;

[0186] The determination module 502 is configured to determine a beam intensity set based on the emission probability set and the activity data.

[0187] In some embodiments, the apparatus may further include a processing module;

[0188] A determination module 502 is configured to determine a target emission intensity data set based on the total activity amount of the activity data and at least some of the emission probabilities in the emission probability set;

[0189] The processing module is used to convert the emission intensity data in the target emission intensity data set based on the elementary charges to obtain a beam intensity set.

[0190] In some embodiments, the irradiation parameters include an energy data set and / or a beam intensity set; the energy data set includes a set of energy data of electrons emitted by the irradiation device; the beam intensity set includes a set of beam intensities of electron beams emitted by the irradiation device; the irradiation device includes an electron gun;

[0191] The control module 503 is configured to control the electron gun to irradiate the sample to be measured based on the energy data in the energy data set and / or the beam intensity in the beam intensity set.

[0192] In some embodiments, the control module 503 is configured to control the irradiation device to irradiate the sample to be tested based on the irradiation parameters, and detect the brightness data set and / or electric power data set output by the sample to be tested;

[0193] The processing module is used to integrate and statistically analyze the brightness data set and / or the electric power data set to obtain the light energy output state and / or electric energy output state of the sample to be tested under irradiation conditions.

[0194] In some embodiments, the target radiation source comprises a beta radiation source.

[0195] Based on the above embodiments, the present application also provides an electronic device, Figure 6 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application, such as Figure 6 As shown, the electronic device 6 may include a processor 601 and a memory 602, wherein the memory 602 stores a computer program, which, when executed by the processor 601, can implement the state determination method under irradiation conditions provided in any of the previous embodiments.

[0196] The above-mentioned processor can be at least one of ASIC, DSP, DSPD, PLD, FPGA, CPU, controller, microcontroller, and microprocessor.

[0197] The above-mentioned memory can be a volatile memory (volatile memory), such as random access memory (RAM); or a non-volatile memory (non-volatile memory), such as read-only memory (ROM), flash memory, hard disk drive (HDD) or solid state drive (SSD); or a combination of the above types of memory, and provides instructions and data to the processor.

[0198] The acquisition module, control module, determination module and processing module mentioned above can be implemented by the processor mentioned above.

[0199] Based on the above embodiments, the embodiments of the present application also provide a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by the processor of the electronic device, the state determination method under irradiation conditions provided in any of the previous embodiments can be implemented.

[0200] The above description of the various embodiments tends to emphasize the differences between the various embodiments. The same or similar aspects can be referenced with each other and will not be repeated herein for the sake of brevity.

[0201] The methods disclosed in the various method embodiments provided in this application can be arbitrarily combined without conflict to obtain new method embodiments.

[0202] The features disclosed in the various product embodiments provided in this application can be arbitrarily combined without conflict to obtain new product embodiments.

[0203] The features disclosed in the various method or device embodiments provided in this application can be arbitrarily combined without conflict to obtain new method embodiments or device embodiments.

[0204] It should be noted that the above-mentioned computer-readable storage medium can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a magnetic random access memory (FRAM), a flash memory (Flash Memory), a magnetic surface storage, an optical disc, or a compact disc read-only memory (CD-ROM); it can also be various electronic devices that include one or any combination of the above-mentioned memories, such as mobile phones, computers, tablet devices, personal digital assistants, etc.

[0205] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or apparatus comprising the element.

[0206] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0207] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus necessary general hardware nodes, and of course can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), including a number of instructions for enabling a terminal device (which can be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0208] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the steps in the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0209] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0210] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0211] The above are only preferred embodiments of the present application and do not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for determining a state under irradiation conditions, characterized in that: The method comprises: Acquiring energy spectrum data of a target radioactive source; wherein the energy spectrum data at least includes activity data of the target radioactive source; Determining irradiation parameters of an irradiation device based on the energy spectrum data; wherein the accuracy of the beam intensity of the irradiation device is greater than or equal to a target accuracy; and the irradiation parameters at least include a set of beam intensities of the electron beam emitted by the irradiation device; controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters to obtain a set of energy data output by the sample to be tested; determining, based on the energy data set, an energy output state of the sample to be tested under irradiation conditions including the irradiation parameters; Wherein, determining the irradiation parameters of the irradiation equipment based on the energy spectrum data includes: Determining an emission probability set of the target radioactive source based on the energy spectrum data; wherein the emission probability set includes a set of occurrence probabilities of any energy data of the target radioactive source; The beam intensity set is determined based on the emission probability set and the activity data.

2. The method according to claim 1, characterized in that The energy spectrum data at least includes energy data of electrons emitted by the target radiation source; the irradiation parameters at least include a set of energy data of electrons emitted by the irradiation equipment; The determining of irradiation parameters of the irradiation equipment based on the energy spectrum data includes: determining an energy radiation range of electrons emitted by the target radiation source based on energy data of the electrons emitted by the target radiation source in the energy spectrum data; The energy data set is determined based on the energy radiation range.

3. The method according to claim 2, characterized in that The determining the energy data set based on the energy radiation range includes: determining a sampling strategy based on a distribution state of energy data of electrons emitted by the target radiation source within the energy radiation range; Based on the sampling strategy, energy data of electrons emitted by the target radiation source within the energy radiation range are sampled to determine the energy data set.

4. The method according to claim 1, wherein The determining the beam intensity set based on the emission probability set and the activity data includes: determining a target emission intensity data set based on the total amount of activity of the activity data and at least some of the emission probabilities in the emission probability set; The emission intensity data in the target emission intensity data set is converted based on the elementary charge to obtain the beam intensity set.

5. The method according to claim 1, wherein The irradiation parameters include an energy data set and / or a beam intensity set; the energy data set includes a set of energy data of electrons emitted by the irradiation device; the beam intensity set includes a set of beam intensities of electron beams emitted by the irradiation device; The irradiation device includes an electron gun; and controlling the irradiation device to irradiate the sample to be tested based on the irradiation parameters includes: The electron gun is controlled to irradiate the sample to be tested based on the energy data in the energy data set and / or the beam intensity in the beam intensity set.

6. The method according to claim 1, characterized in that The step of controlling the irradiation device to irradiate the sample to be tested based on the irradiation parameters to obtain a set of energy data output by the sample to be tested includes: controlling the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters, and detecting a brightness data set and / or an electric power data set output by the sample to be tested; The determining, based on the energy data set, an energy output state of the sample to be tested under irradiation conditions including the irradiation parameters, comprises: The brightness data set and / or the electric power data set are integrated and statistically analyzed to obtain the light energy output state and / or electric energy output state of the sample to be tested under the irradiation conditions.

7. The method according to any one of claims 1 to 6, characterized in that: The target radiation source includes a beta radiation source.

8. A device for determining a state under irradiation conditions, characterized in that: The device comprises: An acquisition module, configured to acquire energy spectrum data of a target radioactive source; wherein the energy spectrum data at least includes activity data of the target radioactive source; a determination module, configured to determine irradiation parameters of an irradiation device based on the energy spectrum data; wherein the accuracy of the beam intensity of the irradiation device is greater than or equal to a target accuracy; and the irradiation parameters at least include a set of beam intensities of the electron beam emitted by the irradiation device; The determination module is specifically configured to determine an emission probability set of the target radioactive source based on the energy spectrum data; and determine the beam intensity set based on the emission probability set and the activity data; wherein the emission probability set includes a set of occurrence probabilities of any energy data of the target radioactive source; A control module, configured to control the irradiation equipment to irradiate the sample to be tested based on the irradiation parameters, and obtain an energy data set output by the sample to be tested; The determination module is further configured to determine, based on the energy data set, an energy output state of the sample to be tested under irradiation conditions including irradiation parameters.

9. An electronic device, characterized in that: The electronic device includes a processor and a memory; a computer program is stored in the memory; when the computer program is executed by the processor, the state determination method under irradiation conditions as described in any one of claims 1 to 7 can be implemented.

10. A computer-readable storage medium, characterized in that The storage medium stores a computer program; when the computer program is executed by a processor of an electronic device, the method for determining a state under irradiation conditions as described in any one of claims 1 to 7 can be implemented.

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