A flexible configurable flexible integrated test method and system

Abstract

The application discloses a flexible integrated test method and system, which realizes equipment interconnection by adding a network communication interface circuit on hardware, realizes burning and writing of MAC addresses and product SNs in a normal working mode on software, replaces a tool provided by a CPU manufacturer and capable of burning and writing MAC addresses and product SNs only in a recover mode, integrates circuit parameter test, software loading, MAC address and product SN burning and function performance test (four-in-one), realizes all tests in one process, and further realizes flexible integrated test by flexible setting of a configuration file, avoids quality risk of missing test, is compatible with previous process test, can be used in processes when special production requirements are encountered, and is flexible and integrated. The flexible integrated test method and system provided by the application reduce quality risk, improve production efficiency, and realize flexible and integrated test.

Description

Technical Field

[0001] This invention relates to the field of circuit board testing technology, and in particular to a flexible integrated testing method and system that can be flexibly configured. Background Technology

[0002] Testing product circuit boards typically involves three steps: First, a circuit parameter testing device is used to test the circuit parameters of the board, measuring the static resistance to ground at each power supply test point. Boards with short circuits or significantly abnormal resistance are immediately rejected. Next, the board's load current is measured, and boards with abnormal current are rejected. Finally, the operating voltage at each power supply test point is measured, and boards with abnormal voltage are rejected. Then, software is loaded if necessary, followed by programming the MAC address and product serial number using the MAC address and product serial number programming tool provided by the CPU manufacturer. Finally, a functional performance testing device is used to test the functions and performance of various interfaces.

[0003] Because the MAC address and product SN programming tool provided by the CPU manufacturer needs to work in recovery mode when programming the MAC address and product SN, while the software system in the board needs to work in normal mode when performing functional and performance tests, they can only be completed separately in separate processes. Separating the processes makes production scheduling more convenient.

[0004] However, existing testing methods have the following problems: First, there is the issue of quality risk. During production, workers often forget to test the circuit parameters first and directly power on the circuit to program the MAC address and product serial number. This means that boards with short circuit defects or abnormal voltage cannot be intercepted in advance, and boards may burn out during the MAC address and product serial number programming process, resulting in losses. Sometimes, batch-wide board burnouts can occur, causing serious losses and even damaging the testing computer, further increasing losses and affecting production. Second, there is the issue of low efficiency. Because the processes are separated, testing a single board requires multiple handling and placement of the board, as well as multiple power-on and power-off cycles. The firmware system of the board has a relatively long startup time, and multiple power-on cycles result in significant time waste and low efficiency. Third, due to the overall complexity of the electrical connections, the setup and maintenance of the testing environment are troublesome and prone to errors, increasing losses.

[0005] Furthermore, software loading is sometimes required during board testing. Whenever software loading is needed, a new process must be started to load the software, adding to the pre-shipment preparation of the board. Summary of the Invention

[0006] The technical problem to be solved by this invention is to provide a flexible integrated testing method and system that can be flexibly configured. By programming the MAC address and product serial number in normal working mode and integrating it with circuit parameter testing, software loading, and functional performance testing, all tests can be completed in one process. The test items can be flexibly configured and executed in sequence, thereby reducing quality risks, improving production efficiency, and realizing flexible integrated testing.

[0007] In a first aspect, the present invention provides a flexibly configurable flexible integration testing method, comprising:

[0008] The test fixture is electrically connected to the circuit parameter test device, the functional performance test device and the host computer respectively. The host computer is network connected to the circuit parameter test device and the functional performance test device respectively. The host computer is connected to the barcode scanning module through the network or serial port.

[0009] Obtain the test items selected in the configuration file, wherein the test items include at least one of the following: circuit parameter test items, software loading, product number information burning, and functional performance test items;

[0010] Based on the selected test items, the circuit parameter testing device and / or functional performance testing device perform corresponding tests on the product under test, and / or the host computer writes the product number information to the product under test, and / or the host computer loads the software onto the product under test.

[0011] Furthermore, the product under test is connected to the test fixture via a pin, and the product under test is connected to the host computer via a USB interface and / or network.

[0012] Furthermore, before writing the product number information, the process includes: obtaining the storage unit of the product number information in the storage device of the product under test; after obtaining the storage unit, writing the product number information into the storage unit in the normal working mode of the CPU, wherein the product number information includes the MAC address and / or the product barcode SN.

[0013] Furthermore, the process of the host computer writing product number information to the product under test includes: when the product under test is placed on the test fixture, the barcode scanning module automatically scans the product number barcode on the product under test and outputs the scanned product number information to the host computer; the host computer stores the acquired product number information into the corresponding storage unit of the product under test in normal working mode.

[0014] Furthermore, the circuit parameter testing device performs corresponding tests on the product under test, including: the configuration file contains test standards for each circuit parameter; when performing circuit parameter tests, the host computer sends a circuit parameter test command to the circuit parameter testing device; the circuit parameter testing device automatically collects the circuit parameters of the product under test and sends the collected circuit parameters to the host computer via the network; after receiving the test parameters, the host computer judges the test results and then outputs the corresponding results.

[0015] Furthermore, if the test item includes software loading, the host computer sends a software loading command to the functional performance testing device. The functional performance testing device sets the level of the specified test points of the product under test through the test fixture, and then restarts the product under test to put it into software loading mode. The product under test then communicates with the host computer via USB interface to load the software.

[0016] Furthermore, the functional performance testing device performs corresponding tests on the product under test, including: configuring test items for various functions and performances in the configuration file, selecting the items to be tested, and when conducting functional performance testing, the host computer sends a specific functional performance detection command to the functional performance testing device. The functional performance testing device automatically collects the selected functional performance of the product under test and outputs the collected data to the host computer via the network. After receiving the test data, the host computer judges the test results and then outputs the corresponding results.

[0017] Furthermore, the execution order of the circuit parameter test items, software loading, product number information burning, and functional performance test items is as follows: first perform the circuit parameter test items, then perform the software loading, then perform the product number information burning, and finally perform the functional performance test items.

[0018] The circuit parameter testing device and / or functional performance testing device are enabled to test the board under test according to the selected test items and the order of execution of the test items. When a test item passes, the next test item is executed. When the test item fails, the test process of the current product under test is exited and an error is reported. When all test items are completed, the test is completed and the test results are saved.

[0019] Furthermore, each type of product number information is provided with a corresponding barcode scanning module. Each barcode scanning module scans the barcode to obtain the product number information of the corresponding type and sends it to the host computer.

[0020] Secondly, the present invention provides a flexibly configurable flexible integration test system, comprising:

[0021] The test fixture is connected to the circuit parameter test device, the functional performance test device and the host computer respectively. The test fixture is also connected to the product under test through a pin.

[0022] Circuit parameter testing device, used to test the circuit parameters of the product under test;

[0023] Functional performance testing equipment is used to test the various interface functions and performance of the product under test;

[0024] The barcode scanning module automatically scans the product number information barcode on the tested product and outputs the scanned product number information to the host computer; the product number information includes at least a MAC address, and the barcode scanning module includes at least one barcode scanning unit.

[0025] The host computer is connected to the circuit parameter testing device and the functional performance testing device via network. The host computer is also connected to the product under test via USB and / or network. The host computer is also connected to the barcode scanning module via network or serial port.

[0026] Obtain the test items selected in the configuration file. The test items include at least one of the following: circuit parameter test items, software loading, product number information burning, and functional performance test items.

[0027] Based on the selected test items, the circuit parameter testing device and / or functional performance testing device perform the corresponding tests, and / or the host computer writes the product number information to the product under test, and / or the host computer loads the software onto the product under test.

[0028] The technical solutions provided in the embodiments of the present invention have at least the following technical effects:

[0029] 1. Achieving Flexible Production Management: By adding network ports to testing equipment and fixtures, network communication is achieved between the host computer, various testing devices, fixtures, and the product under test. The software implements MAC address writing in normal operating mode, integrating circuit parameter testing with functional performance testing, enabling all tests to be completed in a single process. Furthermore, the optimal testing scheme can be flexibly adopted through configuration files based on different production models and capacity requirements. Applying the testing method of this invention, it is possible to test one item of a circuit board individually (circuit parameter testing, functional performance testing, software loading, or product number information writing), or to test all four items simultaneously, achieving flexible production scheduling and management.

[0030] 2. Significantly improve production efficiency: The testing process, which previously required four steps, is now completed in one step. In terms of operation, existing technology requires four pick-up and four placement steps to test a circuit board, while the present invention only requires one pick-up and one placement step, thus improving testing efficiency. Existing technology requires four power-on and four power-off steps to test a circuit board, while the method of the present invention only requires one power-on and one power-off step. The waiting time for the product software to start is reduced from three times to one time, significantly reducing waiting time and greatly improving production efficiency.

[0031] 3. Avoid the risk of board burnout: After combining the tests that originally required four separate processes into one process, the circuit parameter test is no longer a separate process. This avoids missing circuit parameter tests and ensures that short circuit faults are intercepted before power-on, thus avoiding the risk of the tested product burning out after power-on due to short circuit faults.

[0032] 4. Convenient equipment setup and maintenance: Existing technologies require separate testing workbenches for each of the four testing processes. This invention integrates the four testing processes together, making the setup and maintenance of the testing environment much simpler.

[0033] The above description is merely an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention and to implement it in accordance with the contents of the specification, and in order to make the above and other objects, features and advantages of the present invention more apparent and understandable, specific embodiments of the present invention are described below. Attached Figure Description

[0034] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0035] Figure 1 This is a schematic diagram illustrating the implementation process of the test items in the accessory file of Embodiment 1 of the present invention;

[0036] Figure 2 This is a schematic diagram of the system framework of Embodiment 2 of the present invention. Detailed Implementation

[0037] This invention provides a flexibly configurable integrated testing method and system. By implementing MAC address programming in normal operating mode and integrating it with circuit parameter testing and functional performance testing, all tests can be completed in one process. The test items can be flexibly configured and executed in sequence, thereby reducing quality risks, improving production efficiency, and achieving flexible integrated testing.

[0038] The overall concept of the technical solutions in the embodiments of the present invention is as follows:

[0039] To address the problems with existing testing solutions, the inventors, after repeated research and consideration, made technical improvements to the testing solution in both hardware and software aspects. On the hardware side, the testing equipment used in the three processes (circuit parameter testing device, MAC programming device (implemented by a host computer using programming software provided by the manufacturer), functional performance testing device, and host computer) was modified, and a network communication interface circuit was added to enable device interconnection. On the software side, by acquiring a specific storage area of ​​the eMMC (emitter memory) used to store the SN number, MAC address, and other important configuration information (obtained by comparing data changes before and after writing important configuration information under the original method), MAC address programming was implemented in normal operating mode, replacing the MAC address programming tool provided by the CPU manufacturer. This integrated the MAC address programming process into the functional performance testing process. On the host computer testing software side, through flexible configuration file settings, circuit parameter testing and functional performance testing were integrated, enabling all tests to be completed in one process. Simultaneously, it is compatible with the original separate process testing and can be used separately for special production needs, thus achieving flexible integrated testing with configurable settings.

[0040] Example 1

[0041] This embodiment provides a flexibly configurable flexible integration testing method, including:

[0042] The test fixture is electrically connected to the circuit parameter test device, the functional performance test device and the host computer respectively. The host computer is network connected to the circuit parameter test device and the functional performance test device respectively. The host computer is connected to the barcode scanning module through the network or serial port.

[0043] Obtain the test items selected in the configuration file, wherein the test items include at least one of the following: circuit parameter test items, software loading, product number information burning, and functional performance test items;

[0044] Based on the selected test items, the circuit parameter testing device and / or functional performance testing device perform corresponding tests on the product under test, and / or the host computer writes the product number information to the product under test, and / or the host computer loads the software onto the product under test.

[0045] In one possible implementation, the execution order of the circuit parameter testing, software loading, product number information burning, and functional performance testing can be: first perform the circuit parameter testing, then the software loading, then the product number information burning, and finally the functional performance testing; for example... Figure 1 The diagram shows the implementation flow of a configuration file testing project in one possible implementation method.

[0046] The circuit parameter testing device and / or functional performance testing device are enabled to test the board under test according to the selected test items and the order of execution of the test items. When a test item passes, the next test item is executed. When the test item fails, the test process of the current product under test is exited and an error is reported. When all test items are completed, the test is completed and the test results are saved.

[0047] Permissions can be set for the configuration file, allowing technical personnel to select test items. Activation is only permitted after approval by at least one reviewer. While the configuration file can be presented in a clear, hierarchical structure on the interface, ensuring correct item selection for proper test execution, permissions can be set to further prevent incorrect or missed selections due to testers' lack of technical knowledge. Engineering technicians configure the configuration, selecting necessary test items, inputting required parameters, and deselecting unnecessary items. After selection, the save button on the interface is pressed, and the configuration file is then reviewed by an auditor. The host computer reads the approved configuration file and performs tests item by item. Testers only need to place and remove boards.

[0048] In one possible implementation, the product under test is connected to the test fixture via a pin, and the product under test is connected to a host computer via a USB interface and / or a network.

[0049] The circuit parameter testing device can perform corresponding tests on the product under test, including: the configuration file contains test standards for each circuit parameter; when performing circuit parameter tests, the host computer sends a circuit parameter test command to the circuit parameter testing device; the circuit parameter testing device automatically collects the circuit parameters of the product under test and sends the collected circuit parameters to the host computer via the network; after receiving the test parameters, the host computer judges the test results and then outputs the corresponding results.

[0050] The circuit parameter test items include non-power-on test items and power-on test items. The power-on test items are executed and passed after the non-power-on test items are completed. If any non-power-on test item fails, the test process of the current product under test is exited and an error is reported.

[0051] The process of writing product number information to the product under test by the host computer can include: when the product under test is placed on the test fixture, the barcode scanning module automatically scans the product number barcode on the product under test and outputs the scanned product number information to the host computer; the host computer stores the acquired product number information into the corresponding storage unit of the product under test in normal working mode.

[0052] Before writing the product number information, the process further includes: obtaining the storage unit of the product number information in the storage device of the product under test; after obtaining the storage unit, writing the product number information into the storage unit in the normal working mode of the CPU, wherein the product number information includes the MAC address and / or the product barcode SN.

[0053] Each product number can be assigned a separate barcode scanning module. Each barcode scanning module scans the corresponding product number and sends it to the host computer.

[0054] The functional performance testing device performs corresponding tests on the product under test, including: the configuration file contains test items for various functions and performances; the user selects the test items; during functional performance testing, the host computer sends a specific functional performance test command to the functional performance testing device; the functional performance testing device automatically collects the selected functional performance data of the product under test and outputs the collected data to the host computer via the network; after receiving the test data, the host computer judges the test results and then outputs the corresponding results.

[0055] If the test item includes software loading, the host computer sends a software loading command to the functional performance testing device. The functional performance testing device sets the level of the specified test points of the product under test through the test fixture, and then restarts the product under test to put it into software loading mode. The product under test then communicates with the host computer via USB interface to load the software.

[0056] By adding network ports to testing equipment and fixtures, network communication is achieved between the host computer, various testing devices, testing fixtures, and the product under test. The software implements MAC address programming in normal operating mode, thus integrating circuit parameter testing with functional performance testing, enabling all tests to be completed in a single process. Furthermore, the optimal testing scheme can be flexibly adopted through configuration files based on different production models and production capacity requirements. Applying this invention's testing method allows for both individual testing of a single board and simultaneous testing of multiple boards, achieving flexibility in production scheduling and management.

[0057] Based on the same inventive concept, this application also provides a system corresponding to the method in Embodiment 1, as detailed in Embodiment 2.

[0058] Example 2

[0059] This embodiment provides a flexibly configurable flexible integration test system, such as Figure 2 As shown, it includes five parts: Part 1, test fixture; Part 2, circuit parameter test device; Part 3, functional performance test device; Part 4, barcode scanning module; Part 5, host computer (PC);

[0060] The test fixture is connected to the circuit parameter test device, the functional performance test device and the host computer respectively. The test fixture is also connected to the product under test through a pin.

[0061] Circuit parameter testing device, used to test the circuit parameters of the product under test;

[0062] Functional performance testing equipment is used to test the various interface functions and performance of the product under test;

[0063] The barcode scanning module automatically scans the product number information barcode on the tested product and outputs the scanned product number information to the host computer; the product number information includes at least a MAC address, and the barcode scanning module includes at least one barcode scanning unit.

[0064] The host computer is connected to the circuit parameter testing device and the functional performance testing device via network. The host computer is also connected to the product under test via USB and / or network. The host computer is also connected to the barcode scanning module via network or serial port.

[0065] Obtain the test items selected in the configuration file. The test items include at least one of the following: circuit parameter test items, software loading, product number information burning, and functional performance test items.

[0066] Based on the selected test items, the circuit parameter testing device and / or functional performance testing device perform the corresponding tests, and / or the host computer writes the product number information to the product under test, and / or the host computer loads the software onto the product under test.

[0067] In one possible scenario, the barcode scanning module may include two barcode scanning units, with the MAC address and product serial number (SN) on the same product under test being scanned separately by the two barcode scanning units. By setting up two barcode scanning units to automatically scan the SN and MAC barcodes one-to-one, a limit switch is electrically connected to the barcode scanning module. The barcode scanning module is electrically connected to the computer's serial port through the external interface of the test fixture. When the product board under test is placed on the test fixture, the limit switch is subjected to pressure from the product board under test, changing from a normally open state to a closed state. The barcode scanning module automatically scans the product serial number (SN) and MAC address and outputs the results to the host computer.

[0068] The host computer can freely combine test items through configuration files. It can select test item groups such as circuit parameter testing, software loading, SN / MAC address writing, and functional performance testing. Each test item group contains several specific test items, which can be selected according to test requirements.

[0069] The configuration file sets test standards for various circuit parameters. During circuit parameter testing, the host computer issues a command, and the circuit parameter testing device automatically collects the circuit parameters of the product under test. The collected circuit parameters are then output to the host computer for judgment via network communication. After receiving the test parameters submitted by the circuit parameter testing device, the host computer judges the test results and outputs the corresponding results.

[0070] The configuration file also includes test items for various functions and performance aspects, allowing users to freely select whether to include each item in the test. During functional performance testing, the host computer sends commands to the functional performance testing device to automatically collect the functional and performance parameters of the product under test, and outputs the collected data to the host computer for judgment via network communication. After receiving the test data submitted by the functional performance testing device, the host computer judges the test results and outputs the corresponding results.

[0071] This invention integrates circuit parameter testing and functional performance testing by adding network ports to testing equipment and fixtures, enabling network communication between the host computer, various testing devices, testing fixtures, and the product under test. It also implements MAC address burning in normal operating mode, allowing all tests to be completed in a single process. Furthermore, the optimal testing scheme can be flexibly adopted through configuration files based on different production models and production capacity requirements. The testing method of this invention can perform individual testing of one item on a circuit board (circuit parameter testing, functional performance testing, software loading, or product number information burning), or simultaneously test all four items, achieving flexibility in production scheduling and management. By merging the tests that previously required four separate processes into one, the existing technology for testing a circuit board requires four pick-up and four placement operations; now, only one pick-up and one placement operation is needed, significantly improving testing efficiency. The existing technology for testing a circuit board requires four power-on and four power-off operations; the method of this invention only requires one power-on and one power-off operation, reducing the waiting time for product software startup from three times to one, significantly reducing waiting time and greatly improving production efficiency. By combining the tests that previously required four separate steps into one, circuit parameter testing is no longer a separate process. This avoids missing any circuit parameter tests, ensuring that short-circuit faults are intercepted before power-on and preventing the risk of the tested product burning out due to short circuits after power-on. Existing technologies require separate test benches for each of the four testing steps. This invention simplifies the setup and maintenance of the test environment by integrating the four testing steps.

[0072] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0073] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0074] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0075] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0076] While specific embodiments of the present invention have been described above, those skilled in the art should understand that the specific embodiments described are merely illustrative and not intended to limit the scope of the present invention. Equivalent modifications and variations made by those skilled in the art in accordance with the spirit of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A flexibly configurable flexible integration testing method, characterized in that, include: The test fixture is electrically connected to the circuit parameter test device, the functional performance test device and the host computer respectively. The host computer is network connected to the circuit parameter test device and the functional performance test device respectively. The host computer is connected to the barcode scanning module through the network or serial port. Obtain the test items selected in the configuration file. The test items include at least one of the following: circuit parameter test items, software loading, product number information burning, and functional performance test items. According to the selected test items, the circuit parameter testing device and / or functional performance testing device perform corresponding tests on the product under test, and / or the host computer writes the product number information to the product under test, and / or the host computer loads the software on the product under test; The circuit parameter testing device and / or functional performance testing device are enabled to test the board under test according to the selected test items and the order of execution of the test items. When a test item passes, the next test item is executed. When the test item fails, the test process of the current product under test is exited and an error is reported. When all test items are completed, the test is completed and the test results are saved.

2. The flexibly configurable flexible integration testing method according to claim 1, characterized in that: The product under test is connected to the test fixture via a pin, and the product under test is connected to the host computer via a USB interface and / or network.

3. The flexibly configurable flexible integration testing method according to claim 1, characterized in that, Before writing the product number information, the process further includes: obtaining the storage unit of the product number information in the storage device of the product under test; after obtaining the storage unit, writing the product number information into the storage unit in the normal working mode of the CPU, wherein the product number information includes the MAC address and / or the product barcode SN.

4. The flexibly configurable integrated testing method according to claim 1, characterized in that, The process of writing product number information to the product under test by the host computer includes: when the product under test is placed on the test fixture, the barcode scanning module automatically scans the product number barcode on the product under test and outputs the scanned product number information to the host computer; the host computer stores the acquired product number information into the corresponding storage unit of the product under test in normal working mode.

5. The flexibly configurable flexible integration testing method according to claim 1, characterized in that, The circuit parameter testing device performs corresponding tests on the product under test, including: the configuration file contains test standards for each circuit parameter; when performing circuit parameter tests, the host computer sends a circuit parameter test command to the circuit parameter testing device; the circuit parameter testing device automatically collects the circuit parameters of the product under test and sends the collected circuit parameters to the host computer via the network; after receiving the test parameters, the host computer judges the test results and then outputs the corresponding results.

6. The flexibly configurable flexible integration testing method according to claim 1, characterized in that, If the test item includes software loading, the host computer sends a software loading command to the functional performance testing device. The functional performance testing device sets the level of the specified test points of the product under test through the test fixture, and then restarts the product under test to put it into software loading mode. The product under test then communicates with the host computer via USB interface to load the software.

7. The flexibly configurable flexible integration testing method according to claim 1, characterized in that, The functional performance testing device performs corresponding tests on the product under test, including: the configuration file contains test items for various functions and performances; the user selects the test items; during functional performance testing, the host computer sends a test command for the selected functions and performances to the functional performance testing device; the functional performance testing device automatically collects the selected functions and performances of the product under test and outputs the collected data to the host computer via the network; after receiving the test data, the host computer judges the test results and then outputs the corresponding results.

8. The flexibly configurable flexible integration testing method according to any one of claims 2-7, characterized in that: The execution order of the circuit parameter test items, software loading, product number information burning, and functional performance test items is as follows: first perform the circuit parameter test items, then perform the software loading, then perform the product number information burning, and finally perform the functional performance test items.

9. The flexibly configurable flexible integration testing method according to claim 1, characterized in that: Each type of product number information is assigned a corresponding barcode scanning module. Each barcode scanning module scans the corresponding product number information and sends it to the host computer.

10. A flexibly configurable integrated testing system, characterized in that, include: The test fixture is connected to the circuit parameter test device, the functional performance test device and the host computer respectively. The test fixture is also connected to the product under test through a pin. Circuit parameter testing device, used to test the circuit parameters of the product under test; Functional performance testing equipment is used to test the interface functions and performance of the product under test. The barcode scanning module automatically scans the product number information barcode on the tested product and outputs the scanned product number information to the host computer; the product number information includes at least a MAC address, and the barcode scanning module includes at least one barcode scanning unit. The host computer is connected to the circuit parameter testing device and the functional performance testing device via network. The host computer is also connected to the product under test via USB and / or network. The host computer is also connected to the barcode scanning module via network or serial port. Obtain the test items selected in the configuration file. The test items include at least one of the following: circuit parameter test items, software loading, product number information burning, and functional performance test items. According to the selected test items, the circuit parameter testing device and / or functional performance testing device perform corresponding tests, and / or the host computer writes the product number information to the product under test, and / or the host computer loads the software to the product under test; The circuit parameter testing device and / or functional performance testing device are enabled to test the board under test according to the selected test items and the order of execution of the test items. When a test item passes, the next test item is executed. When the test item fails, the test process of the current product under test is exited and an error is reported. When all test items are completed, the test is completed and the test results are saved.

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