A test method for backup characteristics of aerospace-grade analog switches

Abstract

This invention discloses a test method for the backup characteristics of aerospace-grade analog switches, proposing four test methods based on backup application verification circuits. These methods cover the actual application states of analog switches in spacecraft, obtaining the backup functional characteristics of aerospace-grade analog switch circuits. The backup characteristic verification test method and circuit proposed in this invention have advantages such as simple test procedures, mature technology, significant application verification test results, and comprehensive application coverage. They possess high application value and provide application assurance for analog switch components in next-generation spacecraft.

Description

Technical Field

[0001] This invention relates to a test method for the backup characteristics of an aerospace analog switch, belonging to the field of aerospace special application technology of analog switch circuits. Background Technology

[0002] Analog switches are mainly used to switch signals in signal links. Their function is similar to that of mechanical switches, but they have the characteristics of low power consumption, high speed and no mechanical contacts. They can be used for signal combining, splitting or switching functions.

[0003] For redundant systems with parallel models, redundancy (reserve) models, and voting system models, it can be concluded that the application of analog switch components can be categorized into cold backup conditions, warm backup conditions, and hot backup conditions. That is, it is necessary to verify whether the system interface status of analog switch components simultaneously monitoring and controlling the same signal under power supply, no power supply, or different power supply states meets the requirements of engineering applications.

[0004] When there is a need for backup applications of analog switches in spacecraft, the backup performance of the analog switches needs to be tested before they are officially applied to aerospace satellite missions. Currently, there is a problem of insufficient test coverage in the backup application verification test of analog switch circuits, which makes it difficult to ensure the reliability of the analog switches. Summary of the Invention

[0005] The technical problem solved by this invention is to overcome the shortcomings of the prior art and propose a test method for the backup characteristics of aerospace analog switches. By simulating different working conditions of the analog switch on a spacecraft, the performance of the analog switch is tested, which can effectively improve the test coverage of the analog switch device and improve the reliability of the device.

[0006] The technical solution of this invention is:

[0007] A method for testing the backup characteristics of an aerospace-grade simulated switch, comprising:

[0008] Construct a test circuit for the backup characteristics of analog switches. Two sets of identical analog switches are connected together at their input and output. One set of analog switches is powered on and in use, while the other set of analog switches is powered off and in backup mode. The analog switch in backup mode is referred to as the backup analog switch.

[0009] Based on the analog switch backup characteristic test circuit, analog switch backup characteristic tests were conducted under different operating conditions. For each type of test, the positive and negative power supply voltage values, reference level voltage value, enable voltage value, and output voltage value of the backup analog switch were obtained. Based on the above voltage values, it was determined whether the analog switch was usable under the corresponding operating conditions.

[0010] Preferably, the test circuit includes a signal generation circuit, a power supply, a power ground, an analog switch, a backup analog switch, and a parameter testing circuit.

[0011] The signal generation circuit is used to provide input signals for the analog switch and backup analog switch;

[0012] The positive and negative power supply terminals of the analog switch are connected to the power supply, the ground terminal is connected to the power ground, the reference level terminal is connected to the reference voltage, the signal input terminal, the address input terminal and the enable terminal are connected to the signal generation circuit, and the output terminal is connected to the parameter testing circuit.

[0013] The positive and negative power supply terminals of the backup analog switch are connected to the power supply through the first mechanical switch group, the ground terminal is connected to the power ground, the reference level terminal is connected to the reference voltage through the second mechanical switch, and the signal input terminal is connected to the signal input terminal of the analog switch one by one. The address input terminal and the enable terminal are connected to the address input terminal and the enable terminal of the analog switch one by one through the closed third mechanical switch group and the fourth mechanical switch. The address input terminal and the enable terminal are left floating when the third mechanical switch group and the fourth mechanical switch are opened. The output terminal is connected to the output terminal of the analog switch one by one.

[0014] The parameter testing circuit is used to collect the positive and negative power supply voltage values, reference level terminal voltage value, enable terminal voltage value, and output terminal voltage value of the backup analog switch.

[0015] Preferably, a simulated switch backup characteristic test is conducted under cold backup operating conditions, including:

[0016] The positive and negative power supply terminals and the reference level terminal of the analog switch are respectively supplied with the maximum recommended voltage value of the analog switch; a dynamic signal is applied to the address terminal through the signal generation circuit to turn on the input channels sequentially; a static signal is alternately applied to the input terminal through the signal generation circuit.

[0017] Disconnect the first, second, third, and fourth mechanical switch groups on the backup analog switch, and connect the input channels of the backup analog switch to the input channels of the analog switch one by one;

[0018] The positive and negative power supply voltages, reference level voltage, enable voltage, and output voltage of the backup analog switch are tested using a parameter testing circuit. If all of these voltage values ​​are less than the acceptable voltage threshold for the analog switch, the backup application verification evaluation result of the analog switch is "the analog switch is usable under cold backup operating conditions"; otherwise, it is not usable.

[0019] Preferably, a dynamic signal is applied to the address terminal through a signal generation circuit, and the address terminal is applied with a signal whose frequency is halved for each number.

[0020] Preferably, simulated switch backup characteristic tests are conducted under weak cold backup operating conditions, including:

[0021] The positive and negative power supply terminals and the reference level terminal of the analog switch are respectively supplied with the maximum recommended voltage value of the analog switch; a dynamic signal is applied to the address terminal through the signal generation circuit to turn on the input channels sequentially; a static signal is alternately applied to the input terminal through the signal generation circuit.

[0022] Close the second mechanical switch of the backup analog switch, and disconnect the first, third, and fourth mechanical switch groups of the backup analog switch. Connect the input channels to the input channels of the analog switch one by one.

[0023] The positive and negative power supply voltages, enable voltage, and output voltage of the backup analog switch are tested using a parameter testing circuit. If all of the above voltage values ​​are less than the acceptable voltage threshold for the analog switch, the verification and evaluation result of the analog switch backup application is "the analog switch is usable under weak cold backup operating conditions"; otherwise, it is not usable.

[0024] Preferably, a simulated switch backup characteristic test is conducted under warm backup operating conditions, including:

[0025] The positive and negative power supply terminals and the reference level terminal of the analog switch are respectively supplied with the maximum recommended voltage value of the analog switch; a dynamic signal is applied to the address terminal through the signal generation circuit to turn on the input channels sequentially; a static signal is alternately applied to the input terminal through the signal generation circuit.

[0026] Disconnect the first and second mechanical switch groups of the backup analog switch, and close the third and fourth mechanical switch groups. Connect the input channels to the analog switch input channels one by one.

[0027] The voltage values ​​at the positive and negative power supply terminals, the reference level terminal, and the output terminal are tested using a parameter testing circuit. If each of these voltage values ​​is less than the acceptable voltage threshold for the analog switch, the evaluation result for the analog switch backup application is "the analog switch is usable under warm backup operating conditions"; otherwise, it is not usable.

[0028] Preferably, a simulated switch backup characteristic test is conducted under hot backup operating conditions, including:

[0029] The positive and negative power supply terminals and the reference level terminal of the analog switch are respectively supplied with the maximum recommended voltage value of the analog switch; a dynamic signal is applied to the address terminal through the signal generation circuit to turn on the input channels sequentially; a static signal is alternately applied to the input terminal through the signal generation circuit.

[0030] Close the first mechanical switch group of the backup analog switch to increase the power supply voltage from 0V to the highest value recommended by the analog switch; disconnect the second, third, and fourth mechanical switches of the backup analog switch; connect the input channels of the backup analog switch to the input channels of the analog switch one by one.

[0031] The positive and negative power supply voltages, reference voltage, enable voltage, and output voltage of the backup analog switch are tested using a parameter testing circuit. If each of these voltage values ​​is less than the acceptable voltage threshold for the analog switch, the backup application verification evaluation result is "the analog switch is usable under hot backup operating conditions"; otherwise, it is not usable.

[0032] Preferably, the parameter testing circuit uses an AD7616 ADC chip with a sampling rate of 2MSPS and an LM124 operational amplifier chip.

[0033] Preferably, the signal generation circuit uses an XC7A35T FPGA and an SN74LVC4245 power conversion chip.

[0034] Preferably, if it is usable under all operating conditions, the analog switch is considered to have excellent performance and is suitable for all operating conditions on spacecraft.

[0035] The advantages of this invention compared to the prior art are:

[0036] (1) This invention provides a test method for backup characteristics of aerospace analog switches, which can evaluate the backup characteristics of different types of analog switch circuits. It is a general test method and can more effectively improve the test coverage of device backup verification test. It is easy to implement and can be applied in practice.

[0037] (2) The present invention provides a test method for backup characteristics of aerospace analog switches, which has strong reconfigurability and can quickly send test vectors of different types, amplitudes and frequencies to the input terminals of analog switches and backup analog switches by sending commands through the signal generation circuit. Attached Figure Description

[0038] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0039] Figure 1 This is a schematic diagram of a space-use analog switch backup characteristic test device according to an embodiment of the present invention. Detailed Implementation

[0040] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the disclosure to those skilled in the art. It should be noted that, unless otherwise specified, the embodiments and features described herein can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0041] This invention proposes a test method for the backup characteristics of aerospace analog switches, which is applicable to the evaluation of backup characteristics in the application verification test of analog switch circuits for spacecraft, and guides analog switch users to select aerospace-suitable analog switch products and backup conditions.

[0042] This backup verification test includes four backup application verification test methods, covering the actual application state of the analog switch in the spacecraft. The circuit includes a signal generation circuit, a power supply, a power ground, analog switch A, a backup analog switch B of the same type, and a parameter test circuit. The signal generation circuit provides input signals to the analog switch. In this embodiment, an XC7A35T FPGA and an SN74LVC4245 power conversion chip are selected. The positive and negative power supply terminals of analog switch A are connected to the power supply, the ground terminal is connected to the power ground, the reference level terminal is connected to the reference voltage, the signal input terminals (IN1~INm), the address input terminals (A0~An), and the enable terminal are connected to the signal generation circuit, and the output terminal OUT is connected to the parameter test circuit.

[0043] The positive and negative power supply terminals of the backup analog switch B are connected to the power supply via a mechanical switch, the ground terminal is connected to the power ground via a mechanical switch, the reference level terminal is connected to the reference voltage via a mechanical switch, the signal input terminals (IN1~INm) are connected one by one to the signal input terminals of analog switch A, the address input terminals (A0~An) and the enable terminal can be connected one by one to the address input terminals and the enable terminal of analog switch A by closing the mechanical switch or by opening the mechanical switch to leave the address input terminals and the enable terminal floating, and the output terminal OUT is connected one by one to the output terminal of analog switch A.

[0044] The power supply provides voltage to analog switch A and its backup analog switch B, while the power ground provides ground for both analog switch A and its backup analog switch B, ensuring they are at the same reference level. Analog switch A is the main operating circuit in the spacecraft, and the backup analog switch B is a backup of analog switch A. The parameter testing circuit acquires the values ​​of V2+, V2-, V2REF, VEN, and OUT of the backup analog switch B. In this embodiment, an AD7616 ADC chip with a sampling rate of 2MSPS and an LM124 operational amplifier chip are used.

[0045] 1. Cold backup working conditions

[0046] The conditions for analog switch A to operate are as follows: power supply voltage V1+ = +VS, V1- = -VS, and reference voltage V1REF = +VREF. Dynamic signals are applied to addresses A1_0 to A1_n via a signal generation circuit, sequentially activating input channels IN1 to INm and outputting to the OUT terminal. Static signals +VS and -VS are alternately applied to the input terminals via the signal generation circuit. Here, +VS, -VS, and +VREF are the maximum values ​​recommended in the analog switch manual. The frequency of applying the dynamic signals is the maximum recommended operating frequency for the analog switch.

[0047] Power-on conditions for backup analog switch B: Disconnect the mechanical switches at the power supply end (first mechanical switch group), the mechanical switch at the reference level end (second mechanical switch), the mechanical switches at each address end (third mechanical switch group), and the mechanical switch at the enable end (fourth mechanical switch), so that the power supply voltage V2+, V2-, the reference level end V2REF, the address A1_0~A1_n, and the enable signal EN are left floating, and the input channels IN1~INm are connected one by one to the input channels IN1~INm of analog switch A.

[0048] The voltage values ​​of V2+, V2-, V2REF, V2EN, and OUT are tested using a parameter testing circuit. If the voltage value is less than the acceptable voltage threshold Vth for the analog switch, the analog switch backup application verification evaluation result is "the analog switch is usable under cold backup operating conditions"; otherwise, it is unusable.

[0049] The 506-type 16-to-1 multiplexer analog switch was used as the test object in this embodiment. Its backup characteristics were tested under cold backup operating conditions, using an acceptable voltage threshold Vth = 10mV.

[0050] Conditions for powering on analog switch A: Apply the recommended maximum power supply voltage for the 506 analog switch. Power supply voltage V1+ = +15.0V, V1- = -15.0V, reference V1REF = 5.0V, apply a 125kHz square wave to address A0_1, a (125 / 2)kHz square wave to A1_1, a (125 / 4)kHz square wave to A2_1, and a (125 / 8)kHz square wave to A3_1 with an amplitude of 0-5V. Apply -15V to input terminals IN1, IN3, IN5, IN7, IN9, IN11, IN13, and IN15, and +15V to input terminals IN2, IN4, IN6, IN8, IN10, IN12, IN14, and IN16.

[0051] Power-on conditions for backup analog switch B: power supply voltages V2+ and V2- are floating, V2REF is floating, addresses A1_0 to A1_n and enable signal EN2 are floating, and input channels IN1 to INm are connected one by one to the input channels IN1 to INm of analog switch A.

[0052] Through the parameter test circuit, a square wave with alternating ±15V can be observed at the output terminal OUT of analog switch A; the backup analog switch B is in normal condition, with the power supply terminals V2+ and V2- not exceeding 10mV and the output voltage of the other ports being 0V. The test results are shown in Table 1.

[0053] Table 1 Test values ​​of backup analog switch B under operating condition 1

[0054] V2+ V2- VREF VEN OUT 7mV -5mV 0.000V 0.000V 0.000V

[0055] 2. Working conditions for weak cold backup

[0056] The power-on conditions for analog switch A are the same as those for its cold backup operation.

[0057] Power-on conditions for backup analog switch B: Close the mechanical switch at the reference level terminal to connect the V2REF terminal to +VREF; disconnect the mechanical switches at the power supply terminal, address terminal, and enable terminal to leave the power supply voltage V2+, V2-, address A1_0~A1_n, and enable signal EN floating, and connect the input channels IN1~INm one by one with the input channels IN1~INm of analog switch A.

[0058] The voltage values ​​of V2+, V2-, VEN, and OUT are tested using a parameter testing circuit. If the voltage value is less than the acceptable voltage threshold Vth for the analog switch, the analog switch backup application verification evaluation result is "the analog switch is usable under weak cold backup operating conditions"; otherwise, it is unusable.

[0059] The backup characteristics of this type of 16-to-1 multiplexed analog switch were tested:

[0060] The conditions for normal operation of analog switch A are the same as in point 1.

[0061] Power-on conditions for backup analog switch B: power supply voltages V2+ and V2- are left floating, +VREF is applied to the V2REF pin, addresses A1_0 to A1_n and enable signal EN are left floating, and input channels IN1 to INm are connected one by one to the input channels IN1 to INm of analog switch A.

[0062] Through the parameter testing circuit, a square wave with alternating ±15V can be observed at the output terminal OUT of analog switch A; the backup analog switch B has a significant series voltage at the positive power supply V2+, and there is also a weak voltage at the enable port. The output terminal is normal. The test results are shown in Table 2.

[0063] Table 2 Test values ​​of backup simulation switch B under weak cold backup operating conditions

[0064] V2+ V2- VEN OUT 4.43V 0V 0.26V to 0V 0.000V

[0065] 3. Warm backup operating conditions

[0066] Analog switch A operates under the same cold backup conditions.

[0067] Power-on conditions for backup analog switch B: Disconnect the mechanical switch at the power supply terminal, leaving power supply voltages V2+ and V2- floating; disconnect the mechanical switch at the reference level terminal, leaving the V2REF pin floating; close the mechanical switches at the address and enable terminals, connecting addresses A1_0 to A1_n to VA and the enable signal EN to VEN. Connect input channels IN1 to INm one by one to the input channels IN1 to INm of analog switch A. VA is the highest value recommended in the analog switch manual.

[0068] The voltage values ​​of V2+, V2-, V2REF, and OUT are tested using a parameter testing circuit. If the voltage value is less than the acceptable voltage threshold Vth for the analog switch, the analog switch backup application verification evaluation result is "the analog switch is usable under warm backup operating conditions"; otherwise, it is not usable.

[0069] The backup characteristics of the 16-to-1 multiplexer were tested under backup operating condition 3:

[0070] The conditions for normal operation of analog switch A are the same as above.

[0071] Power-on conditions for backup analog switch B: The recommended maximum enable signal and address input levels for the 506 analog switch are applied. Power supply voltages V2+ and V2- are left floating, the V2REF pin is left floating, addresses A1_0 to A1_n are connected to VA, the enable signal EN is connected to VEN, and input channels IN1 to INm are connected one by one to the input channels IN1 to INm of analog switch A.

[0072] Through the parameter testing circuit, a square wave with alternating ±15V can be observed at the output terminal OUT of analog switch A; the backup analog switch B has a significant series voltage at the positive power supply V2+, the positive power supply voltage is raised, the V2REF terminal is normal, and the output terminal is normal. The test results are shown in Table 3.

[0073] Table 3 Test values ​​of backup simulation switch B under warm backup operating conditions

[0074] V2+ V2- V2REF OUT 4.48V 0V 0.000V 0.000V

[0075] 4. Hot backup operating conditions

[0076] Analog switch A operates under the same cold backup conditions.

[0077] Conditions for powering on backup analog switch B: Close the mechanical switch at the power supply terminal, so that the power supply voltage V2+ and V2- connected to the variable power supply gradually increases from 0V to the highest value recommended in the analog switch manual; open the mechanical switches at the reference level terminal and each address terminal, so that V2REF, address A1_0~A1_n, and enable EN port are left floating, and the input channels IN1~INm are connected one by one to the input channels IN1~INm of analog switch A.

[0078] The voltage values ​​of V2+, V2-, V2REF, VEN, and OUT are tested using a parameter testing circuit. If the voltage value is less than the acceptable voltage threshold Vth for the analog switch, the analog switch backup application verification evaluation result is "the analog switch is usable under hot backup operating conditions"; otherwise, it is unusable.

[0079] The backup characteristics of the 16-to-1 multiplexed analog switch were tested:

[0080] Analog switch A operates under the same cold backup conditions.

[0081] The conditions for adding backup analog switch B are as follows: Close the mechanical switch at the power supply terminal, so that the power supply voltage V2+ and V2- connected to the variable power supply gradually increases from 0V to the highest value recommended in the analog switch manual; open the mechanical switches at the reference level terminal, each address terminal, and the enable terminal, so that V2REF, address A1_0~A1_n, and enable EN port are left floating, and the input channels IN1~INm are connected one by one to the input channels IN1~INm of analog switch A.

[0082] The backup analog switch B circuit was tested using a parameter testing circuit. When the power supply voltage was between 0V and ±0.9V, the output voltage was between 0mV and 10mV. When the power supply voltage was ±1.0V or higher, a significant crosstalk occurred at the output voltage. The test results are shown in Table 4.

[0083] Table 4 Test values ​​of backup simulation switch B under hot backup operating conditions

[0084]

[0085] Under the above four conditions, the corresponding values ​​of V2+, V2-, V2REF, VEN, and OUT of the backup analog switch B are tested by the parameter test circuit. The above values ​​are compared with the voltage threshold Vth that the analog switch can accept. The results of the backup characteristic evaluation in the application verification test of the analog switch circuit are determined by judging whether the analog switch is usable or unusable under the above four conditions.

[0086] In this embodiment, the parameter test values ​​under four conditions show that the 16-to-1 multiplexer analog switch is usable under cold backup conditions, but not usable under weak cold backup, warm backup, and hot backup conditions.

[0087] The experimental method and circuit for verifying the backup characteristics of aerospace analog switch circuits proposed in this invention have technical advantages such as simple experimental process, mature technology, significant application verification test results, and the ability to simultaneously cover application scope, and have high application value.

[0088] The embodiments described above are merely preferred embodiments of the present invention. Ordinary variations and substitutions made by those skilled in the art within the scope of the technical solution of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for testing the backup characteristics of an analog switch for space applications, characterized in that, The application relates to a backup characteristic test circuit of an analog switch. The backup analog switch is recorded as a backup analog switch; The backup characteristic test circuit of the analog switch is used to carry out backup characteristic tests of the analog switch under different working conditions, and positive and negative power supply voltage values, reference level voltage values, enable voltage values and output voltage values of the backup analog switch are obtained in each test, and whether the backup analog switch is available under the corresponding working condition is judged according to the voltage values. The test circuit comprises a signal generating circuit, a power supply, a power supply ground, an analog switch, a backup analog switch and a parameter test circuit. The signal generating circuit is used for providing input signals for the analog switch and the backup analog switch. The positive and negative power supply ends of the analog switch are connected with the power supply, the ground end is connected with the power supply ground, the reference level end is connected with the reference voltage, the signal input end, the address input end and the enable end are connected with the signal generating circuit, and the output end is connected with the parameter test circuit. The positive and negative power supply ends of the backup analog switch are connected with the power supply through a first mechanical switch group, the ground end is connected with the power supply ground, the reference level end is connected with the reference voltage through a second mechanical switch, the signal input end is connected with the signal input end of the analog switch, the address input end and the enable end are connected with the address input end and the enable end of the analog switch through a closed third mechanical switch group and a fourth mechanical switch, and the address input end and the enable end are suspended when the third mechanical switch group and the fourth mechanical switch are disconnected. The output end is connected with the output end of the analog switch. The parameter test circuit is used for collecting the positive and negative power supply voltage values, the reference level voltage values, the enable voltage values and the output voltage values of the backup analog switch. The backup characteristic test of the analog switch under the cold backup working condition comprises the following steps:

2. The method of claim 1, wherein the method further comprises: The positive and negative power supply ends and the reference level end of the analog switch are respectively added with the highest voltage value recommended by the analog switch, a dynamic signal is added to the address end through the signal generating circuit, the input channels are sequentially opened, and static signals are alternately added to the input end through the signal generating circuit. The first mechanical switch group, the second mechanical switch, the third mechanical switch group and the fourth mechanical switch of the backup analog switch are disconnected, and the input channels of the backup analog switch are connected with the input channels of the analog switch. The positive and negative power supply voltage values, the reference level voltage values, the enable voltage values and the output voltage values of the backup analog switch are tested through the parameter test circuit, if the voltage values are all less than the acceptable voltage threshold of the analog switch, the backup application verification evaluation result of the analog switch is "available under the cold backup working condition", otherwise, the analog switch is not available. A dynamic signal is added to the address end through the signal generating circuit, and the address end is sequentially added with signals with frequency halved according to the number.

3. The method of claim 2, wherein the method further comprises: The backup characteristic test of the analog switch under the weak cold backup working condition comprises the following steps:

4. The method of claim 1, wherein the method further comprises: The positive and negative power supply ends and the reference level end of the analog switch are respectively added with the highest voltage value recommended by the analog switch, a dynamic signal is added to the address end through the signal generating circuit, the input channels are sequentially opened, and static signals are alternately added to the input end through the signal generating circuit. ​ Close the second mechanical switch of the backup analog switch, open the first mechanical switch group, the third mechanical switch group and the fourth mechanical switch of the backup analog switch, and connect the input channel with the analog switch input channel one by one. Test the positive and negative power supply voltage value, the enable end voltage value and the output end voltage value of the backup analog switch through the parameter test circuit; if each voltage value is less than the acceptable voltage threshold of the analog switch, the backup application verification evaluation result of the analog switch is "the analog switch is available under the weak cold backup working condition", otherwise it is not available.

5. The method of claim 1, wherein the method further comprises: determining whether the analog switch is operating properly by applying a test signal to the analog switch and measuring the output of the analog switch. Carry out the analog switch backup characteristic test under the warm backup working condition, including: The positive and negative power supply ends and the reference level end of the analog switch are respectively added with the highest voltage value recommended by the analog switch; the address end is given a dynamic signal through the signal generating circuit, so that the input channel is sequentially opened; the input end is alternately given a static signal through the signal generating circuit; Close the first mechanical switch group of the backup analog switch, open the second mechanical switch, the third mechanical switch group and the fourth mechanical switch, and connect the input channel with the analog switch input channel one by one. Test the positive and negative power supply end voltage value, the reference level end voltage value and the output end voltage value through the parameter test circuit; if each voltage value is less than the acceptable voltage threshold of the analog switch, the backup application verification evaluation result of the analog switch is "the analog switch is available under the warm backup working condition", otherwise it is not available.

6. The method of claim 1, wherein the method further comprises: Carry out the analog switch backup characteristic test under the warm backup working condition, including: The positive and negative power supply ends and the reference level end of the analog switch are respectively added with the highest voltage value recommended by the analog switch; the address end is given a dynamic signal through the signal generating circuit, so that the input channel is sequentially opened; the input end is alternately given a static signal through the signal generating circuit; Close the first mechanical switch group of the backup analog switch, so that the power supply voltage is increased from 0V to the highest value recommended by the analog switch; open the second mechanical switch, the third mechanical switch group and the fourth mechanical switch of the backup analog switch; connect the input channel of the backup analog switch with the analog switch input channel one by one. Test the positive and negative power supply voltage value, the reference voltage value, the enable end voltage value and the output end voltage value of the backup analog switch through the parameter test circuit; if each voltage value is less than the acceptable voltage threshold of the analog switch, the backup application verification evaluation result of the analog switch is "the analog switch is available under the warm backup working condition", otherwise it is not available.

7. The method of claim 1 to 6, wherein the method is used for testing the backup characteristics of an analog switch for space applications. The parameter test circuit selects an AD7616 type ADC chip with a sampling rate of 2MSPS and an LM124 operational amplifier chip.

8. The method of claim 1 to 6, wherein the method is used for testing the backup characteristics of an analog switch for space applications. The signal generating circuit selects an XC7A35T type FPGA and an SN74LVC4245 power conversion chip.

9. The method of claim 1, wherein the method further comprises: determining whether the analog switch is operating properly by applying a test signal to the analog switch and measuring the output of the analog switch. If it is available under all working conditions, it is determined that the analog switch has excellent performance and is suitable for all working conditions on the spacecraft.

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