X-ray phase-quantitative imaging technique and measurement method

Abstract

The application discloses an X-ray phase quantitative imaging technology and a measuring method, device and equipment and a storage medium thereof. The scheme provided by the application avoids the phenomenon that positive and negative phase images are overlapped from the imaging mechanism and signal detection of the system, directly extracts a phase image of a sample without subsequent complex positive and negative phase image separation operation, simplifies the data processing process, and improves the efficiency of sample phase information acquisition. The imaging technology constructs the correlation between the imaging system parameters and the separation degree of positive and negative phase images, quantitatively designs the imaging conditions required by each optical device in the system, proposes an experimental method for measuring absolute phase signals, and the detector assembly scheme can accurately measure phase images with different separation directions and degrees.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of X-ray microscopic imaging methods, in particular to an X-ray phase quantitative imaging technology and measurement method, device, equipment and storage medium thereof. BACKGROUND

[0002] X-ray phase contrast imaging, as a very important X-ray imaging technology, can effectively improve the image contrast of weakly absorbing samples (such as soft tissue, carbon materials), and is widely used in X-ray imaging tasks of different resolutions in various fields. For example, in the biological direction, it can realize high-quality morphological characterization of cells in polymer scaffolds; in the field of materials, it can be used to observe the morphology of lithium peroxide and its pore size distribution in lithium-oxygen batteries under different charge states; in archaeological research, it can be used to characterize the parasitic co-evolution of species since the Miocene. Compared with X-ray absorption imaging, X-ray phase imaging has the following characteristics and advantages: first, for light and weakly absorbing samples, phase contrast has higher sensitivity, which can improve the signal-to-noise ratio of the image and better reflect the internal structure information of the object; second, phase contrast has different X-ray energy dependence from absorption contrast, which can partially alleviate the difficulty of weak absorption contrast in high-energy X-ray conditions, and is expected to realize low-dose high-quality imaging; finally, phase contrast can enhance other target characteristics of the observed object rather than absorption contrast, which is a good complement to X-ray absorption imaging. For this reason, X-ray phase imaging methods have attracted widespread attention and attention from many scientific and technical personnel.

[0003] Among the various X-ray phase imaging methods proposed so far, the X-ray Talbot (-Lau) imaging system based on grating interferometer has become a research hotspot due to its compatibility with laboratory light sources. In addition to simultaneously measuring absorption and small-angle scattering signals, this system can also extract the differential phase imaging (DPI) image of the sample by analyzing the Moiré fringes obtained in the experiment. In order to extend the advantages of this type of system in quantitative phase imaging to the field of X-ray microscopic imaging with micron-level or even nanometer-level spatial resolution, many international research groups have made explorations in integrating grating interferometer with full-field transmission X-ray microscope. Among them, the most representative work is the high-sensitivity phase difference imaging (PDI) realized by the research group led by Professor Momose of Northeastern University in Japan in 2017 based on the commercial X-ray nanoscopic system of ZEISS company. However, the existence of positive and negative phase images overlapping in the obtained image hinders the further popularization and use of this microscopic imaging technology.

[0004] In order to overcome the above-mentioned image artifact problems, the current main solution is to separate a single relatively clean sample phase image from the experimental data with overlapping artifacts based on various image post-processing techniques. For example, the iterative deconvolution method proposed by Takano et al. and the maximum likelihood reconstruction scheme proposed by Wolf et al. The existing results prove that similar image analysis methods have good information extraction effect on samples with relatively simple morphology. However, similar methods do not fundamentally eliminate the influence of the positive and negative phase images on each other, and when processing samples with complex structures, algorithm-related uncertainties and even errors will inevitably be introduced, which will further cause irreversible effects on subsequent CT image reconstruction and analysis. SUMMARY

[0005] In view of the defects or deficiencies in the prior art described above, it is desirable to provide an X-ray phase quantitative imaging technology and measurement method, device, equipment and storage medium thereof.

[0006] In a first aspect, the embodiments of the present application provide an X-ray phase quantitative imaging technology and measurement method, which comprises: realizing complete separation of positive and negative phase images of a to-be-measured sample through an X-ray phase microscopy system of a grating interferometer; giving a detector assembly and adjustment scheme with multiple spatial degrees of freedom according to the separation degree of the positive and negative phase images; and detecting the separated positive and negative phase images through the detector assembly and adjustment scheme.

[0007] In one of the embodiments, the complete separation of the positive and negative phase images of the to-be-measured sample comprises: under the premise of ensuring clear imaging of the sample, judging whether the separation distance between the positive and negative phase images is greater than the maximum size of the sample along the grating stepping direction, i.e. Wherein, λ is the X-ray wavelength, p is the equivalent period of the phase grating along the stepping direction, d4 is the distance from the phase grating to the detector, M is the magnification multiple of the sample imaging via the wave band sheet, and Δ is the maximum size of the sample along the grating stepping direction; if the separation distance between the positive and negative phase images is greater than the maximum size of the sample along the grating stepping direction, the positive and negative phase images are completely separated; if not completely separated, the corresponding system parameters can be adjusted to increase the separation degree of the positive and negative phase images according to the expression

[0008] In one of the embodiments, after the complete separation of the positive and negative phase images at the detection end, the method further comprises: using a detector device with multiple spatial degrees of freedom to realize accurate signal extraction according to the quantitative separation information of the obtained positive and negative phase images.

[0009] ​In one of the embodiments, the use of the detector device with multiple spatial degrees of freedom to achieve accurate signal extraction includes simultaneously recording the positive and negative phase images of the sample by combining two detectors to form a detection array, wherein the distance between the receiving surfaces of the two detectors depends on the separation degree of the positive and negative phase images.

[0010] In one of the embodiments, the use of the detector device with multiple spatial degrees of freedom to achieve accurate signal extraction includes using a single X-ray detector, cooperating with three directional motion axes and connecting assemblies and sliding mechanisms, and moving the detection area in a certain range of two-dimensional plane by the mutual movement between the detector and the axes to obtain a single phase image of the sample.

[0011] In the second aspect, the embodiments of the present application further provide an X-ray phase quantitative imaging technology and measurement device, which comprises: a system setting unit, configured to realize the complete separation of the positive and negative phase images of the sample to be measured by an X-ray phase microscope system of a grating interferometer; a detector setting unit, configured to give a detector assembly and adjustment scheme with multiple spatial degrees of freedom according to the separation degree of the positive and negative phase images; and the separated positive and negative phase images are detected by the detector assembly and adjustment scheme.

[0012] In the third aspect, the embodiments of the present application further provide a computer device, which comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the method described in any of the embodiments of the present application when executing the program.

[0013] In the fourth aspect, the embodiments of the present application further provide a computer readable storage medium, which stores a computer program, and the computer program is used to implement the method described in any of the embodiments of the present application when executed by a processor.

[0014] The beneficial effects of the present application are as follows:

[0015] The X-ray phase quantitative imaging technology and measurement method provided by the present application avoids the phenomenon of overlap of the positive and negative phase images from the imaging mechanism of the system, directly extracts the phase image of the sample without subsequent complex positive and negative phase image separation operation, simplifies the data processing process, and improves the efficiency of sample information acquisition; the imaging technology quantitatively describes the influence of each optical device in the system on the final detected light intensity under ideal conditions, and simultaneously constructs the correlation between the system parameters and the separation degree of the positive and negative phase images by a simple analytical expression to guide the specific system design; the proposed detector assembly scheme can accurately measure the phase images with different separation directions and degrees. BRIEF DESCRIPTION OF DRAWINGS

[0016] Other features, objects, and advantages of the application will become more apparent from the following detailed description when read in conjunction with the accompanying drawings:

[0017] Figure 1 A flowchart of an X-ray phase quantitative imaging technique and measurement method provided by an embodiment of the application is shown;

[0018] Figure 2 An exemplary structural block diagram of an X-ray phase quantitative imaging technique and measurement device 200 according to an embodiment of the application is shown;

[0019] Figure 3 A structural schematic diagram of a computer system of a terminal device suitable for implementing an embodiment of the application is shown;

[0020] Figure 4 A simplified schematic diagram of an X-ray phase microscopic imaging system provided by an embodiment of the application is shown;

[0021] Figure 5 A detector installation schematic diagram provided by an embodiment of the application is shown. DETAILED DESCRIPTION

[0022] In order to make the above objectives, features and advantages of the present application more apparent, specific embodiments of the present application will be described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. However, the present application can be practiced in a variety of ways beyond the specific embodiments described herein without departing from the scope of the present application, and it is understood that similar improvements can be made by those skilled in the art without departing from the spirit of the present application, and therefore the present application is not limited to the specific embodiments disclosed below.

[0023] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0024] In addition, the terms "first", "second", etc. are used only for descriptive purposes and do not connote or imply a relative importance or an ordering between the indicated technical features. Thus, a feature defined with "first", "second" may or may not include at least one of the features. In the description of the present application, the meaning of "a plurality" is at least two, for example, two, three, etc., unless explicitly specified and limited otherwise.

[0025] In the present application, unless specifically defined and limited otherwise, the terms "mounting", "connecting", "connecting", "fixing" and the like should be broadly interpreted, for example, it can be fixed connection, or detachable connection, or integrated; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through intermediate medium, or the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly defined. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0026] In the present application, unless specifically defined and limited otherwise, the first feature is "on" or "under" the second feature, which can be direct contact between the first and second features, or indirect contact between the first and second features through intermediate medium. Moreover, the first feature "above", "above" and "above" the second feature can be the first feature directly above or obliquely above the second feature, or only indicate that the first feature is higher than the second feature in horizontal height. The first feature "below", "below" and "below" the second feature can be the first feature directly below or obliquely below the second feature, or only indicate that the first feature is lower than the second feature in horizontal height.

[0027] It should be noted that when an element is referred to as "fixed to" or "disposed on" another element, it can be directly on another element or there can be a middle element. When an element is referred to as "connected to" another element, it can be directly connected to another element or there can be a middle element. The terms "vertical", "horizontal", "up", "down", "left", "right" and similar expressions used herein are for illustrative purposes only and are not the only embodiment.

[0028] Reference is made to Figure 1 , Figure 1 The flowchart of the X-ray phase quantitative imaging technology and measurement method provided by the embodiment of the present application is shown.

[0029] As Figure 1 shown, the method comprises:

[0030] Step 110, in the X-ray phase microscopy system based on grating interferometer, an imaging technology for completely separating the positive and negative phase images of the sample to be measured is realized, and a design method for corresponding system geometry and key optical device parameters is given;

[0031] Step 120, according to the separation degree of the positive and negative phase images, a detector assembly and adjustment scheme with multiple spatial degrees of freedom is given, which can detect the separated positive and negative phase images respectively.

[0032] By using the above technical scheme, the phenomenon of overlap of the positive and negative phase images is avoided from the imaging mechanism of the system, the phase image of the sample can be directly extracted without subsequent complex positive and negative phase image separation operation, the data processing process is simplified, and the efficiency of sample information acquisition is improved; the imaging technology quantitatively depicts the influence of each optical device in the system on the final detected light intensity under ideal conditions, and simultaneously builds the correlation between the system parameters and the separation degree of the positive and negative phase images through a simple analytical expression, so as to guide the specific system design; the proposed detector assembly scheme can accurately measure the phase images with different separation directions and degrees.

[0033] In some embodiments, the complete separation of the positive and negative phase images at the detection end in the present application includes: under the premise of ensuring clear imaging of the sample, judging whether the separation distance between the positive and negative phase images is greater than the maximum size of the sample along the grating stepping direction, i.e. Where λ is the X-ray wavelength, p is the equivalent period of the phase grating along the stepping direction, d4 is the distance from the phase grating to the detector, M is the magnification multiple of the sample imaging via the wave plate, and Δ is the maximum size of the sample along the grating stepping direction. If the separation distance between the positive and negative phase images is greater than the maximum size of the sample along the x-axis direction, the positive and negative phase images are completely separated; if not completely separated, the corresponding system parameters can be adjusted to increase the separation degree of the positive and negative phase images according to the expression

[0034] ​The imaging device upon which this invention is based is an X-ray phase microscopy imaging system based on a grating interferometer. This system consists of multiple parts, including an X-ray source, an ellipsoidal condenser, a source grating, a zone plate, a phase grating, and a detector. The primary imaging targets are small, weakly absorbing samples with microstructures (e.g., micrometer-sized biological cells, carbon materials, etc.). Here, the higher sensitivity of phase imaging effectively compensates for the insufficient contrast in sample morphology observation due to absorption contrast. Using this imaging system, two imaging functions can be simultaneously achieved: microscopic magnification imaging and phase imaging. Microscopic imaging is based on the lens function of the zone plate, while phase imaging is achieved through the grating interferometer structure within the system. In the actual imaging process, X-rays emitted from the source are focused by the ellipsoidal condenser and then illuminate the source grating to form structured light, which is subsequently focused onto the sample for imaging. After interacting with the sample, the X-rays carrying information such as sample absorption and phase pass through the zone plate to image the source grating and the sample at different magnification ratios. To extract the phase information of the sample, the system employs a method of introducing a phase grating at a certain distance behind the zone plate. The image of this grating, originating from the same source, forms an imaging structure similar to that of a Talbot (-Lau) grating interferometer. Combined with the traditional phase-stepping method, the original phase data can be collected. Further CT scanning involves repeating the above imaging process at different rotation angles of the sample.

[0035] The physical basis of X-ray phase imaging is the wave nature of X-rays. In principle, wave optics principles can be used to understand and analyze various phenomena occurring during the imaging process, including diffraction effects, the encoding process of phase information, and light intensity distribution. The optical path of the experimental setup described above can be simplified as follows: Figure 4 The imaging structure shown is illustrated. The light source module (laboratory-grade X-ray source + ellipsoidal condenser + source grating) is replaced with a point source because the source grating's function is to create an array of point sources, and the propagation process of each point source is an independent unit constituting the final imaging result. The theoretical derivation of this imaging unit will be based on Fresnel diffraction theory and a cascaded model of signal transmission. The former is mainly used to quantitatively characterize the wave propagation characteristics of X-rays, while the latter facilitates segmented processing of the entire imaging process.

[0036] For ease of demonstration and explanation, Figure 4 The derivation of the imaging process will be performed in the one-dimensional case (i.e., all devices in the optical path contain structural information only in a single dimension). Based on this, the two-dimensional case can be easily extended. Given the initial wavefield U... in Under the premise of (x), the diffraction field U formed after it has propagated freely for a certain distance d is out (x′) can be calculated using the one-dimensional Fresnel paraxial diffraction formula.

[0037] The amplitude of the light field reaching the sample after a free propagation of distance di from a point source of ideal Dirac delta function δ(x0-η) with wavelength λ, where η represents the off-axis distance, can be expressed as U1(x1,η). After interacting with the sample, the amplitude and phase of the X-ray wavefront are changed. Assuming the refractive index of the sample is (1-δ+iβ) and the thickness along the optical axis is thin enough, the modulated X-ray wavefront can be approximated by projection as where k is the wave number, α(x1)=∫β(x1,z1)dz1 and φ(x1)=∫δ(x1,z1)dz1 represent the amplitude attenuation and phase shift, respectively. If the absorption of the imaging object to X-ray can be further ignored, then α(x1) can be approximated as 0. With the wavefront U'1(x1,η) as the initial condition, the amplitude of the light field reaching the position of the wave plate can be calculated, denoted as U2(x2,η).

[0038] The function of the wave plate is similar to that of a lens, which adjusts the amplitude and propagation direction of the wavefront through the wave plate structure, which can be mathematically expressed as where m represents the diffraction order, and f is the first-order focal length of the wave plate. The light field after a free propagation distance d3 is U3(x3,η), and the amplitude of the light field just passing through the phase grating is U'3(x3,η)=T(x3)U3(x3,η), where T(x3) represents a one-dimensional structure grating, which can be expanded by Fourier series as p x is the grating period, n is the diffraction order, and the expansion coefficient a n is determined according to the type of phase grating. After another free propagation, the light field will reach the detector surface with an amplitude of U4(x4,η). Considering the influence of the source grating, the final light field intensity recorded by the ideal detector is I(x4)=∫|U4(x4,η)| 2 dη.

[0039] In the next step, the phase stepping method will be used to extract the phase information of the sample. Specifically, the phase grating is translated along the x-axis direction by a constant distance μ (the total number of movements M ps ≥3) and the light field intensity after each movement is recorded. Then, the overall phase shift information can be obtained by using an analytical algorithm. Combined with the common experimental setup and the diffraction efficiency of the main imaging devices (wave plate, grating), the following substitutions can be made: the diffraction order m of the wave plate is +1, the grating is a π / 2 phase grating (duty cycle is 50%) and the considered diffraction order is limited to 0 and ±1. The final extracted phase information of the sample is

[0040]

[0041] This formula contains two mutually separated positive and negative phase images.

[0042] On the basis of ensuring clear imaging of the sample (the size of the sample needs to fall within the depth of field of the zone plate , Δr is the outermost ring width of the zone plate), in order to avoid the positive and negative phase images from overlapping, the separation degree of the two needs to be greater than the maximum size Δ of the sample along the stepping direction of the grating (at this time, the x-axis direction), that is

[0043]

[0044] Considering the two-dimensional case and the possibility of rotation of the grating along the optical axis, formula (2) can be generalized as where p is the equivalent period of the phase grating along the actual stepping direction. It needs to be noted that the above derivation is developed for a one-dimensional π / 2 phase grating, and if the type (for example, it can be replaced by a π phase grating, an absorption grating) and structure of the grating change, formula (2) also needs to be modified accordingly, but the overall imaging analysis idea is still similar.

[0045] For example, consider an animal cell sample with a maximum size of 10 μm, and the specific parameters of the X-ray energy and the imaging geometry of the system are as follows:

[0046]

[0047] Substituting the parameters in the table into formula (2), the grating period condition p≤0.52 μm for completely separating the positive and negative phase images of the 10 μm sample can be obtained. It is worth noting that under this condition, the period and position of the source grating also need to be optimized accordingly to obtain the best fringe contrast at the detection end. According to formula (2), in addition to changing the period of the phase grating in the system, the factors that can be adjusted in experiments for the control of the separation of the positive and negative phase images include the X-ray energy and the imaging geometry of the system. Reducing the X-ray energy and the magnification, or increasing the distance of the phase grating to the detector, all help to achieve a greater degree of separation between the positive and negative phase images, but at the same time, new challenges will also arise, for example, as the magnification decreases, the fine structure information of the sample detected under the limited system resolution is gradually lost, at this time, a trade-off needs to be made between the image information and the magnification. Therefore, in the process of adjusting and optimizing the separation of the positive and negative phase images, the imaging target and quality, the system resolution (including the resolution of the zone plate and the detector), the detectability of the signal, and other indicators also need to be considered comprehensively.

[0048] In some embodiments, after the complete separation of the positive and negative phase images at the detection end, the method further includes: using a detector device with multiple spatial degrees of freedom to achieve accurate signal extraction according to the quantitative separation information of the obtained positive and negative phase images.

[0049] Specifically, for the separated phase information, it is necessary to cooperate with the corresponding detector settings to achieve accurate signal extraction. Due to the very limited effective working area of the currently commercialized high-sensitivity X-ray detector, which is usually around 1 cm x 1 cm. For phase images with a large degree of separation, a single detector traditionally centered on the optical axis often fails to cover the entire image area. For example, two in-phase and anti-phase images separated by 30 μm (sample size of 20 μm), considering the 40 times magnification of the zone plate and the 10 times optical magnification of the detection end, the actual separation at the detection end is 1.2 cm, which has exceeded the 1 cm lateral field of view of the detector, thus resulting in the inability to obtain a complete single sample phase image.

[0050] Two solutions are proposed for this. The first is to form a detection array by combining the working areas of two or more detectors to achieve a larger range of ray detection, Figure 5 (a) The scheme shown is a two-detector cooperation scheme. Two detectors are mounted on the same horizontal support shaft, and according to the separation degree of the in-phase and anti-phase images to be detected, the support shaft can independently adjust the positions of the two detectors on the shaft, thereby covering the areas where the in-phase and anti-phase images appear and achieving simultaneous recording of both. Taking the case of the above image separation of 1.2 cm as an example, the detection planes of the two detectors need to be placed symmetrically on the left and right sides of the central axis, with a distance of 1.2 cm between them, so as to achieve the purpose of simultaneous detection. If the phase grating is rotated around the optical axis, the in-phase and anti-phase images produced will no longer be separated in the horizontal direction. For this case, the rotating structure behind the detector array provides the possibility of movement in another dimension, thereby responding to different separation directions. For example, if the phase grating is rotated counterclockwise by 45°, the separation direction of the in-phase and anti-phase images will also change by the same amount. At this time, by rotating the horizontal support shaft with the detector array counterclockwise by 45° and adjusting the distance between the detectors, the separated phase images can be captured. The movement axes in the front-to-back direction placed on the base will assist the detectors in adjusting the distance along the optical axis, further improving the quality and clarity of the imaging.

[0051] The second solution is a single detector setting scheme, such as Figure 5(b) is shown. The use of a single detector is more advantageous for cost control. The implementation device body includes three high-precision motion axes (front-back, horizontal, and vertical), an X-ray detector, and a supporting connection assembly and sliding mechanism. The precision of the motion axes in the horizontal and vertical directions needs to reach the micron level. The detector is fixed with the motion axis in the vertical direction and further connected to the motion axis in the horizontal direction. Finally, the whole is placed on a supporting base with front-back movement function. Through the above design, the movement of the detection plane in a certain range of two-dimensional plane can be realized. Still analyzing the case of the above separation of 1.2 cm, under the system setting, the center of the detection plane needs to be first moved to the optical axis by the motion axis in the vertical direction, and then the motion axis in the horizontal direction is adjusted to move the detection plane 0.6 cm to the left or right, so as to detect and record a single phase image. For the case of rotation of the phase grating, the detection plane needs to be placed in the area where the phase image appears by controlling the movement of the motion axes in the horizontal and vertical directions. It should be noted that the connection order of the detector and the motion axes in the three directions (front-back, horizontal, and vertical) (including the connection between the axes) is not mandatory, which means that in addition to the above assembly scheme, the detector can also be fixed with one of the motion axes in the other two directions, and the connection order between the axes can also be arbitrary. The core is to realize the adjustment of the detection plane in three-dimensional space. Similar to the first scheme, the motion axis on the base provides the possibility of forward and backward movement of the detector to assist imaging.

[0052] In addition, it is worth mentioning that the selection of the X-ray detector in the above two solutions can be either direct conversion or indirect conversion. When the center of the detection plane is located on the optical axis, the absorption contrast image of the sample can be obtained by analytical algorithm or removal of the grating in the system, achieving multi-contrast imaging. These two types of detection devices can also be applied to more general scenarios: (1) In the face of more complex grating structures, the separation of positive and negative phase images will be possible in an asymmetric manner in a two-dimensional plane, and the detector can also make corresponding adjustments; (2) If the size of the enlarged single phase image still exceeds the effective area of a single detector, local signal acquisition can be performed by moving the detector, and finally the information of the complete sample can be restored by splicing the scanned partial images.

[0053] Further, referring to Figure 2 , Figure 2 an exemplary structural block diagram of an X-ray phase quantitative imaging technology and measurement device 200 according to an embodiment of the present application is shown.

[0054] As Figure 2 shown, the device includes:

[0055] The system setting unit 210 is configured to separate the positive and negative phase images according to the actual size of the sample to be measured The imaging geometry and optical parameters of the X-ray phase microscopy system based on a grating interferometer are set or adjusted to achieve complete separation of the positive and negative phase images at the detection end.

[0056] The detector setting unit 220 is configured to move the detection area to a proper position according to the separation degree of the positive and negative phase images of the sample and a specific detector layout scheme (single or two detectors), so that the complete phase information of the sample can be recorded.

[0057] It should be understood that the units or modules described in the apparatus 200 correspond to the respective steps in the method described above. Figure 1 Accordingly, the operations and features described above with respect to the method are also applicable to the apparatus 200 and the units included therein, and will not be described here again. The apparatus 200 can be pre- implemented in a browser or other security application of an electronic device, or can be loaded into the browser or the security application of the electronic device through downloading or the like. The corresponding units in the apparatus 200 can cooperate with the units in the electronic device to implement the schemes of the embodiments of the present application.

[0058] Reference will be made to the following description Figure 3 which shows a structural schematic diagram of a computer system 300 suitable for implementing the terminal device or the server of the embodiments of the present application.

[0059] As shown in Figure 3 , the computer system 300 includes a central processing unit (CPU) 301 which can perform various appropriate actions and processes according to programs stored in a read-only memory (ROM) 302 or programs loaded from a storage portion 308 into a random access memory (RAM) 303. In the RAM 303, various programs and data required for the operation of the system 300 are also stored. The CPU 301, the ROM 302, and the RAM 303 are connected to each other through a bus 304. An input / output (I / O) interface 305 is also connected to the bus 304.

[0060] The following components are connected to the I / O interface 305: an input section 306 including input devices such as a keyboard and mouse; an output section 307 including output devices such as a cathode ray tube (CRT), liquid crystal display (LCD), and speakers; a storage section 308 including a hard disk and the like; and a communication section 309 including a network interface card such as a LAN card, a modem, and the like. The communication section 309 performs communication processing via a network such as the Internet. A drive 310 is also connected to the I / O interface 305 as necessary. A removable media 311 such as a magnetic disk, optical disk, magneto-optical disk, semiconductor memory, and the like is attached to the drive 310 as necessary, so that a computer program read out therefrom is installed in the storage section 308 as necessary.

[0061] In particular, according to embodiments of the present disclosure, the processes described above with reference to Figure 1 may be implemented as a computer software program. For example, embodiments of the present disclosure include an X-ray phase-quantitative imaging technique and measurement method including a computer program tangibly embodied on a machine-readable medium, the computer program including program code for executing Figure 1 the methods described above. In such embodiments, the computer program can be downloaded and installed from a network via the communication section 309, and / or installed from the removable media 311.

[0062] The flow diagrams and block diagrams in the drawings are illustrations of possible architectures, functions, and operations of systems, methods, and computer program products according to various embodiments of the present application. In this regard, each block in the flow diagrams and block diagrams can represent a module, a segment, or a portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that in some alternative implementations, the functions noted in the blocks can occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently or the blocks can sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and / or flowchart illustrations, and combinations thereof, can be implemented by special purpose hardware-based systems that perform the specified functions or operations, or combinations of special purpose hardware and computer instructions.

[0063] The units or modules described in the embodiments of the present application can be implemented in the form of software or in the form of hardware. The described units or modules can also be arranged in a processor, for example, a processor can be described as including a first sub-region generation unit, a second sub-region generation unit, and a display region generation unit. Among them, the name of these units or modules does not constitute a limitation on the units or modules themselves in some cases, for example, the display region generation unit can also be described as "a unit for generating a display region of text according to the first sub-region and the second sub-region".

[0064] As another aspect, the present application also provides a computer readable storage medium, which can be the computer readable storage medium contained in the foregoing apparatus in the above embodiments; or can exist independently and not be assembled into the device. The computer readable storage medium stores one or more programs, and the foregoing programs are used by one or more processors to execute the text generation method applied to the transparent window envelope described in the present application.

[0065] The above description is only the preferred embodiments of the present application and the explanation of the applied technical principles. Those skilled in the art should understand that the scope of the application involved in the present application is not limited to the technical solutions formed by the specific combination of the above technical features, and also covers other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the above inventive concept. For example, the above features are replaced with the technical features disclosed in the present application (but not limited to) having similar functions to form a technical solution.

Claims

1. A method of X-ray phase-quantitative imaging and measurement, characterized in that, The method comprises: The X-ray phase microscopy system of the grating interferometer is used to realize complete separation of the positive and negative phase images of the sample to be measured; According to the separation degree of the positive and negative phase images, a detector assembly and adjustment scheme with multiple spatial degrees of freedom is given; The positive and negative phase images after separation are detected through the detector assembly and adjustment scheme; The complete separation of the positive and negative phase images of the sample to be measured comprises: Under the premise of ensuring clear imaging of the sample, it is judged whether the separation distance between the positive and negative phase images is greater than the maximum size of the sample along the stepping direction of the grating, that is wherein, is the X-ray wavelength, is the equivalent period of the phase grating along the stepping direction, is the distance from the phase grating to the detector, is the magnification of the sample via the waveband sheet amplification imaging, is the maximum size of the sample along the stepping direction of the grating. If the separation distance between the positive and negative phase images is greater than the maximum dimension of the sample along the stepping direction of the grating, the positive and negative phase images are completely separated; if not, the expression Adjust the corresponding system parameters to increase the degree of separation of the positive and negative phase images. After the complete separation of the positive and negative phase images at the detection end, the method further comprises: According to the quantitative separation information of the obtained positive and negative phase images, a detector device with multiple spatial degrees of freedom is used to realize accurate signal extraction.

2. The method of x-ray phase-quantitative imaging and measurement according to claim 1, wherein, The use of a detector device with multiple spatial degrees of freedom to realize accurate signal extraction comprises: Two detectors are combined to form a detection array to record the positive and negative phase images of the sample at the same time, wherein the distance between the receiving surfaces of the two detectors depends on the separation degree of the positive and negative phase images.

3. The method of x-ray phase-quantitative imaging and measurement according to claim 1, wherein, The use of a detector device with multiple spatial degrees of freedom to realize accurate signal extraction comprises: A single X-ray detector is used, which is matched with three directional motion shafts, connecting components and sliding mechanisms, and the movement of the detector and the shafts is used to realize the movement of the detection area in a certain range of two-dimensional plane, so as to obtain a single phase image of the sample.

4. An X-ray phase-quantitative imaging and measuring apparatus, characterized by, The device comprises: A system setting unit is configured to realize complete separation of the positive and negative phase images of the sample to be measured through the X-ray phase microscopy system of the grating interferometer; A detector setting unit is configured to give a detector assembly and adjustment scheme with multiple spatial degrees of freedom according to the separation degree of the positive and negative phase images, and to detect the positive and negative phase images after separation through the detector assembly and adjustment scheme; The complete separation of the positive and negative phase images at the detection end comprises: Under the premise of ensuring clear imaging of the sample, it is judged whether the separation distance between the positive and negative phase images is greater than the maximum size of the sample along the stepping direction of the grating, that is wherein is the X-ray wavelength, is the equivalent period of the phase grating along the stepping direction, is the distance from the phase grating to the detector, is the magnification of the sample via waveband sheet amplification imaging, is the maximum size of the sample along the stepping direction of the grating. If the separation distance between the positive and negative phase images is greater than the maximum dimension of the sample along the stepping direction of the grating, the positive and negative phase images are completely separated; if not, the expression Adjust the corresponding system parameters to increase the degree of separation of the positive and negative phase images. After the complete separation of the positive and negative phase images at the detection end, the device further comprises: According to the quantitative separation information of the obtained positive and negative phase images, a detector device with multiple spatial degrees of freedom is used to realize accurate signal extraction.

5. A computer device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, The processor realizes the X-ray phase quantitative imaging and measurement method according to any one of claims 1-3 when executing the program.

6. A computer readable storage medium having stored thereon a computer program for: The computer program is executed by the processor to realize the X-ray phase quantitative imaging and measurement method according to any one of claims 1-3.

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