Scintillator performance testing apparatus

Abstract

The application discloses a scintillator performance testing device, which comprises at least one of a steady-state ray source and a pulse ray source, a sample holder capable of rotating to adjust an angle, a moving table capable of moving to adjust a position, a lens group arranged on the moving table, an exit end of the lens group being connected with one end of a light collecting light path, the other end of the light collecting light path being connected with a light detecting element, and a control device for controlling the working state of the steady-state ray source or the pulse ray source and adjusting the position of the moving table and / or the rotating angle of the sample holder to form different testing light paths. The application can complete the testing of various performances of the scintillator sample, and has the advantages of high integration, low cost and multiple functions.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of optical testing, in particular to a scintillator performance testing device. BACKGROUND

[0002] The scintillator is a kind of element that can emit light after absorbing high-energy particles or rays (detector sensitive waveband), and plays a very important role in the field of radiation detection and imaging. At present, most of the testing methods for the performance of the scintillator need to use radioactive sources, which has the disadvantages of high equipment cost and great difficulty in ionizing radiation protection.

[0003] At present, the scintillator performance testing equipment is mostly integrated with a steady-state X-ray source in a lead box, and a collection optical path module is arranged perpendicular to the X-ray direction, the radiation luminescence of the scintillator sample is collected through the collection optical path module, and the radiation luminescence is introduced into a fluorescence spectrometer through the light collection path in the collection optical path module to complete the radiation luminescence spectrum test of the scintillator. However, the existing scintillator performance testing equipment has the following problems:

[0004] 1. The radiation position X-ray radiation dose test cannot be completed;

[0005] 2. The transmission and reflection luminescence test of the scintillator sample cannot be realized at the same time;

[0006] 3. The temperature characteristic test of the scintillator sample cannot be carried out;

[0007] 4. The X-ray imaging quality comparison experiment of the scintillator sample cannot be carried out;

[0008] 5. The relative light output (photon number / MeV) experiment of the scintillator sample cannot be completed;

[0009] 6. The detection limit of the X-ray radiation dose rate of the scintillator sample, and the linear response experiment of the X-ray radiation dose rate and the radiation luminescence intensity cannot be completed;

[0010] 7. The decay time experiment of the scintillator sample cannot be completed;

[0011] 8. The afterglow characteristic test of the scintillator sample cannot be completed;

[0012] 9. The micro-area division test of the scintillator sample cannot be completed.

[0013] Therefore, the present application is proposed by the present inventor on the basis of years of experience and practice in the relevant industry, so as to overcome the defects of the prior art. SUMMARY

[0014] The scintillator performance testing device provided by the present application can complete the test of various performances of the scintillator sample, and has the advantages of high integration, low cost and multiple functions.

[0015] The object of the present application can be achieved by the following solutions:

[0016] The present application provides a scintillator performance testing device, comprising:

[0017] at least one of a steady-state ray source and a pulsed ray source;

[0018] a sample holder rotatable to adjust an angle;

[0019] a moving table movable to adjust a position, a lens set being arranged on the moving table, an exit end of the lens set being connected with one end of a light collecting optical path, the other end of the light collecting optical path being connected with a light detecting element;

[0020] controlling an operating state of the steady-state ray source or the pulsed ray source, and adjusting the position of the moving table and / or the rotation angle of the sample holder to form different testing light paths.

[0021] In a preferred embodiment of the present application, the steady-state ray source comprises a high-voltage generator and a first ray light pipe, a power transmission line being connected between the high-voltage generator and the first ray light pipe, an exit end of the first ray light pipe being directed towards the sample holder.

[0022] In a preferred embodiment of the present application, the pulsed ray source comprises a pulsed laser, a first reflecting mirror and a second ray light pipe, an exit end of the pulsed laser being directed towards the first reflecting mirror, the angle of the first reflecting mirror being adjusted so that the light reflected by the first reflecting mirror is incident into an entrance end of the second ray light pipe, an exit end of the second ray light pipe being directed towards the sample holder.

[0023] In a preferred embodiment of the present application, the lens set at least comprises a first lens and a second lens for converging light, an entrance end of the first lens being directed towards the sample holder, an exit end of the first lens being directed towards an entrance end of the second lens, an exit end of the second lens being connected with the light collecting optical path.

[0024] In a preferred embodiment of the present application, the scintillator performance testing device comprises a track, the moving table being slidably arranged on the track, the moving table being movable along the track between at least a first position and a second position.

[0025] In a preferred embodiment of the present application, when the moving table is adjusted to the first position, a scintillator sample is arranged on the sample holder, and the sample holder is rotated to a first angle, so as to form a first testing light path between the steady-state ray source, the scintillator sample, the lens set, the light collecting optical path and the light detecting element, for testing the transmission luminescence performance of the scintillator sample.

[0026] In a preferred embodiment of the present application, the scintillator performance testing device further comprises a second reflector;

[0027] When the moving platform is adjusted to the second position, a scintillator sample is arranged on the sample holder, and the sample holder is rotated to a second angle, the second reflector can receive the light reflected by the scintillator sample and reflect the reflected light to the entrance end of the lens group, so as to form a second testing light path for testing the reflective light emitting performance of the scintillator sample between the steady-state radiation source, the scintillator sample, the second reflector, the lens group, the light collecting path and the light detection element.

[0028] In a preferred embodiment of the present application, when the moving platform is adjusted to the first position, a scintillator sample is arranged on the sample holder, and the sample holder is rotated to a third angle, so as to form a third testing light path for testing the radiation decay time performance of the scintillator sample between the pulsed radiation source, the scintillator sample, the lens group, the light collecting path and the light detection element.

[0029] In a preferred embodiment of the present application, the scintillator performance testing device further comprises a radiation dose meter, and the radiation dose meter is arranged on the moving platform;

[0030] When the moving platform is adjusted to the second position, the exit end of the steady-state radiation source is directed towards the entrance end of the radiation dose meter, so as to form a fourth testing light path for detecting the radiation dose of the steady-state radiation source between the steady-state radiation source and the radiation dose meter.

[0031] In a preferred embodiment of the present application, the scintillator performance testing device further comprises an imaging camera and a third reflector, and the third reflector is rotatably arranged on the moving platform;

[0032] When the moving platform is adjusted to the first position, a quality of image meter and a scintillator sample are arranged on the sample holder, and the sample holder is rotated to a first angle, the third reflector can receive the light transmitted by the quality of image meter and the scintillator sample and reflect the transmitted light to the imaging camera, so as to form a fifth testing light path for radiological imaging of the scintillator sample between the steady-state radiation source, the quality of image meter, the scintillator sample, part of the lens group, the third reflector and the imaging camera.

[0033] In a preferred embodiment of the present application, the scintillator performance testing device further comprises a temperature control station, which is arranged in place of the sample holder and in which a scintillator sample is arranged to form a sixth test light path for testing temperature characteristics of the scintillator sample between the steady-state radiation source, the scintillator sample, the lens group, the light collecting light path and the light detection element.

[0034] In a preferred embodiment of the present application, the scintillator performance testing device further comprises a shielding and an imaging camera, the shielding is provided with a collimator, the collimator is movably arranged at the exit end of the steady-state radiation source to replace collimators of different shapes and / or sizes, the sample holder is provided with a scintillator sample and different light spots are projected on the scintillator sample to form a seventh test light path for micro-area measurement of the scintillator sample between the steady-state radiation source, the collimator, the scintillator sample and the imaging camera.

[0035] In a preferred embodiment of the present application, the shielding comprises a motor, a transmission structure, a first connecting rod, a mounting, a sliding plate and a collimator, the output shaft of the motor is connected to one end of the first connecting rod through the transmission structure, the transmission structure converts the rotation of the motor into the linear motion of the first connecting rod, the other end of the first connecting rod is connected to the sliding plate, and the collimator is arranged on the sliding plate.

[0036] The mounting is arranged at the exit end of the steady-state radiation source, the mounting is provided with a light transmission hole, the position of the sliding plate is adjusted to block the light transmission hole or make the light transmission hole conductive or make the collimator align with the light transmission hole.

[0037] In a preferred embodiment of the present application, the scintillator performance testing device further comprises a lead box, the steady-state radiation source, the pulsed radiation source, the sample holder and the moving table are located in the lead box.

[0038] The lead box is provided with a radiation indicator, a safety lock, a handle lock and a plurality of second heat dissipation elements.

[0039] The scintillator performance testing device has the characteristics and advantages that: at least one of the steady-state ray source and the pulse ray source is arranged, the sample holder capable of rotating to adjust the angle and the moving table capable of moving to adjust the position are arranged, the working state of the steady-state ray source or the pulse ray source is controlled, the steady-state ray source or the pulse ray source emits light, the rotating angle of the sample holder is adjusted to change the orientation of the scintillator sample on the sample holder, and the position of the moving table is adjusted to change the position of the lens group on the moving table, so that different test light paths are formed, the different performance of the scintillator sample is tested, the integration degree is higher, the multiple performances of the scintillator sample can be tested by using one device, the function of the scintillator performance testing device is enriched, and the testing cost is greatly reduced. BRIEF DESCRIPTION OF DRAWINGS

[0040] The following drawings are only intended to illustrate and explain the present application, and do not limit the scope of the present application.

[0041] Among them:

[0042] Figure 1 : It is a structural schematic view of the scintillator performance testing device of the present application.

[0043] Figure 2 : It is one of the working state schematic views of the scintillator performance testing device of the present application.

[0044] Figure 3 : It is the second working state schematic view of the scintillator performance testing device of the present application.

[0045] Figure 4 : It is the third working state schematic view of the scintillator performance testing device of the present application.

[0046] Figure 5 : It is the fourth working state schematic view of the scintillator performance testing device of the present application.

[0047] Figure 6 : It is the fifth working state schematic view of the scintillator performance testing device of the present application.

[0048] Figure 7 : It is a left view of the shielding member in the scintillator performance testing device of the present application.

[0049] Figure 8 : It is a front view of the shielding member in the scintillator performance testing device of the present application.

[0050] Figure 9 : It is a structural schematic view of the lead box in the scintillator performance testing device of the present application. The reference numerals in the present application are:

[0051] 1, high-voltage generator; 2, lead box;

[0052] 3. first ray light pipe; 301. first heat dissipation element;

[0053] 4. light collecting optical path; 5. shielding member;

[0054] 501. motor; 502. transmission structure;

[0055] 5021. connecting shaft; 5022. joint bearing;

[0056] 5023. connecting pin; 5024. connecting head;

[0057] 5025. second connecting rod; 503. first connecting rod;

[0058] 504. mounting member; 5041. bottom plate;

[0059] 5042. cover plate; 505. sliding plate;

[0060] 506. collimator; 507. accommodating box;

[0061] 5071. linear bearing; 6. sample holder;

[0062] 7. radiation dose meter; 8. mobile station;

[0063] 9. imaging camera; 10. first reflecting mirror;

[0064] 11. pulsed laser; 12. second reflecting mirror;

[0065] 13. second ray light pipe; 14. monitoring camera;

[0066] 15. track; 16. second heat dissipation element;

[0067] 17. third reflecting mirror; 18. first lens;

[0068] 19. second lens; 20. scintillator sample;

[0069] 21. image quality meter; 22. temperature control station;

[0070] 23. handle lock; 24. radiation indicator;

[0071] 25. safety lock. DETAILED DESCRIPTION

[0072] In order to have a clearer understanding of the technical features, objectives and effects of the present application, the specific embodiments of the present application will be described with reference to the accompanying drawings.

[0073] As Figure 1As shown, the present application provides a scintillator performance testing device, which comprises: at least one of a steady-state ray source and a pulse ray source; a sample holder 6 rotatable to adjust an angle; a moving table 8 movable to adjust a position, and a lens group is arranged on the moving table 8, and an exit end of the lens group is connected with one end of a light collecting path 4, and the other end of the light collecting path 4 is connected with a light detection element (not shown); by controlling the working state of the steady-state ray source or the pulse ray source, and adjusting the position of the moving table 8 and / or the rotation angle of the sample holder 6, different test light paths are formed.

[0074] In the present application, at least one of a steady-state ray source and a pulse ray source is arranged, and a sample holder 6 rotatable to adjust an angle and a moving table 8 movable to adjust a position are arranged, by controlling the working state of the steady-state ray source or the pulse ray source, the steady-state ray source or the pulse ray source emits light, at the same time, the rotation angle of the sample holder 6 is adjusted to change the orientation of the scintillator sample 20 on the sample holder 6, and the position of the moving table 8 is adjusted to change the position of the lens group on the moving table 8, thereby forming different test light paths, and achieving the purpose of testing different performances of the scintillator sample 20. The present application has higher integration, and can complete the testing of multiple performances of the scintillator sample 20 by using one device, thereby enriching the functions of the scintillator performance testing device, and greatly reducing the testing cost.

[0075] Further, the light collecting path 4 can adopt a light collecting fiber, of course, other spatial light path can also be adopted to collect radiation light, and the specific light path form is not limited herein.

[0076] In an optional embodiment of the present application, as shown in Figure 1 The steady-state ray source comprises a high-voltage generator 1 and a first ray light pipe 3, and a power transmission line is connected between the high-voltage generator 1 and the first ray light pipe 3, and the exit end of the first ray light pipe 3 faces the sample holder 6, and by applying a continuous high voltage to the first ray light pipe 3 through the high-voltage generator 1, hot electrons are generated in the first ray light pipe 3 through high-temperature heating, and the high-voltage generator 1 and the first ray light pipe 3 cooperate as a radiation light source. The high-voltage generator 1 can be but is not limited to a steady-state X-ray source high-voltage generator, and the first ray light pipe 3 can be but is not limited to a steady-state X-ray light pipe, and the cost is low, and the steady-state X-ray source high-voltage generator and the steady-state X-ray light pipe can complete the steady-state testing and long-afterglow performance testing of the scintillator sample 20.

[0077] Further, as shown in Figure 1 The first ray light pipe 3 is externally provided with a first heat dissipation element 301, and the first heat dissipation element 301 can play a role of heat dissipation and cooling for the first ray light pipe 3 during the testing process.

[0078] In an optional embodiment of the present application, as shown in Figure 1As shown in the figure, the pulsed ray source comprises a pulsed laser 11, a first mirror 10 and a second ray light pipe 13, the exit end of the pulsed laser 11 is directed to the first mirror 10, the angle of the first mirror 10 is adjusted so that the light reflected by the first mirror 10 enters the entrance end of the second ray light pipe 13, and the exit end of the second ray light pipe 13 is directed to the sample holder 6. The light emitted by the pulsed laser 11 is reflected by the first mirror 10 and enters the second ray light pipe 13 and hits the cold cathode of the second ray light pipe 13, so that the second ray light pipe 13 generates photoelectrons in the form of pulses, and the second ray light pipe 13 emits light to the scintillator sample 20 on the sample holder 6. The second ray light pipe 13 can be, but is not limited to, a light-excited X-ray light pipe. The combination of the pulsed laser 11 and the light-induced cold cathode picosecond pulsed X-ray light source (i.e., the light-excited X-ray light pipe) can complete the scintillation decay time test of the scintillator sample 20.

[0079] In an optional embodiment of the present application, as shown in the figure, Figure 1 The lens group comprises at least a first lens 18 and a second lens 19, the entrance end of the first lens 18 is directed to the sample holder 6, the exit end of the first lens 18 is directed to the entrance end of the second lens 19, and the exit end of the second lens 19 is connected to the light collection optical path 4. The light is converged by the cooperation of the first lens 18 and the second lens 19, and the converged light is transmitted to the light detection element through the light collection optical path 4. The light detection element can be, but is not limited to, a steady-state transient light detection element, and can also be a photodetector and other elements that can perform scintillator-related light performance tests.

[0080] In an optional embodiment of the present application, as shown in the figure, Figure 1 The scintillator performance test device comprises a track 15 (double slide rail structure), and the moving table 8 is slidably arranged on the track 15 and can move along the track 15 at least between a first position and a second position. By moving the moving table 8 between the first position and the second position, different test light paths can be formed at the corresponding positions. The first position and the second position are different positions.

[0081] In an optional embodiment of the present application, the transmission light path mode of the scintillator performance test device is as shown in the figure, Figure 2As shown in the figure, when the moving platform 8 is adjusted to the first position along the track 15, the scintillator sample 20 is arranged on the sample holder 6, and the sample holder 6 is rotated to the first angle, so as to form a first test light path for testing the transmission luminescence performance of the scintillator sample 20 between the steady-state ray source, the scintillator sample 20, the lens group, the light collecting path 4 and the light detection element. The steady-state ray source is started, and the light emitted by the steady-state ray source is irradiated on the scintillator sample 20, and the light transmitted by the scintillator sample 20 is sequentially transmitted to the light detection element through the first lens 18, the second lens 19 and the light collecting path 4, so that the related performance of the transmission luminescence of the scintillator sample 20 can be tested through the light detection element.

[0082] In an optional embodiment of the present application, as shown in the figure, Figure 1 , Figure 3 As shown in the figure, the scintillator performance testing device further comprises a second reflector 12; and the transmission light path mode of the scintillator performance testing device is as shown in the figure, Figure 3 As shown in the figure, when the moving platform 8 is adjusted to the second position along the track 15, the scintillator sample 20 is arranged on the sample holder 6, and the sample holder 6 is rotated to the second angle, so that the scintillator sample 20 on the sample holder 6 can reflect the light to the second reflector 12, and the second reflector 12 can receive the reflected light of the scintillator sample 20 and reflect the reflected light to the incident end of the lens group, so as to form a second test light path for testing the reflection luminescence performance of the scintillator sample 20 between the steady-state ray source, the scintillator sample 20, the second reflector 12, the lens group, the light collecting path 4 and the light detection element. The steady-state ray source is started, and the light emitted by the steady-state ray source is irradiated on the scintillator sample 20, and the reflected light of the scintillator sample 20 is sequentially transmitted to the light detection element through the second reflector 12, the first lens 18, the second lens 19 and the light collecting path 4, so that the related performance of the reflection luminescence of the scintillator sample 20 can be tested through the light detection element. The second angle of the sample holder 6 can be set according to the setting position of the second reflector 12 in actual situation, and the light reflected by the scintillator sample 20 can be ensured to be incident to the second reflector 12.

[0083] In an optional embodiment of the present application, the transient test mode of the scintillator performance testing device is as shown in the figure, Figure 4As shown, when the mobile platform 8 is adjusted to the first position along the track 15, the scintillator sample 20 is arranged on the sample holder 6, and the sample holder 6 is rotated to the third angle, by rotating the sample holder 6 to the third angle, the scintillator sample 20 on the sample holder 6 can reflect light to the lens group, so as to form a third test light path for testing the radiation decay time performance of the scintillator sample 20 between the pulsed radiation source, the scintillator sample 20, the lens group, the light collecting path 4 and the light detection element. The pulsed radiation source is started, and the light emitted by the steady-state radiation source is irradiated on the scintillator sample 20, and the light reflected by the scintillator sample 20 is transmitted to the light detection element in turn through the first lens 18, the second lens 19 and the light collecting path 4, and the related performance of the radiation decay time of the scintillator sample 20 can be tested through the light detection element. Wherein, the third angle of the sample holder 6 can be set according to the actual setting position of the exit end of the pulsed radiation source and the first lens 18, so as to ensure that the light reflected by the scintillator sample 20 can be shot into the lens group.

[0084] In an optional embodiment of the present application, as shown in Figure 1 , the scintillator performance testing device further comprises a radiation dose meter 7, and the radiation dose meter 7 is arranged on the mobile platform 8; and the sample position radiation dose calibration mode of the scintillator performance testing device is that when the mobile platform 8 is adjusted to the second position along the track 15, the exit end of the steady-state radiation source is directed to the entrance end of the radiation dose meter 7, and the sample holder 6 is removed, so as to form a fourth test light path between the steady-state radiation source and the radiation dose meter 7 for detecting the radiation dose of the steady-state radiation source. The light emitted by the steady-state radiation source is shot into the radiation dose meter 7, so that the steady-state radiation dose calibration experiment can be completed. Wherein, the radiation dose meter 7 can be but not limited to a scintillator type radiation dose meter, of course, other types of radiation dose meters such as ionization chamber type radiation dose meters can also be used.

[0085] In an optional embodiment of the present application, as shown in Figure 1 , Figure 5 , the scintillator performance testing device further comprises an imaging camera 9 and a third reflector 17, and the third reflector 17 is rotatably arranged on the mobile platform 8; and the scintillator imaging quality comparison mode of the scintillator performance testing device is that Figure 5As shown, when the mobile station 8 is adjusted to the first position, the sample holder 6 is provided with the image quality meter 21 and the scintillator sample 20, the image quality meter 21 is located on the side close to the steady-state radiation source relative to the scintillator sample 20, the sample holder 6 is rotated to the first angle, the third mirror 17 can receive the light transmitted by the image quality meter 21 (i.e. the object to be imaged, such as a circuit board, etc.) and the scintillator sample 20 and reflect the transmitted light to the imaging camera 9, so as to form a fifth test light path for the radiation imaging of the scintillator sample 20 between the steady-state radiation source, the image quality meter 21, the scintillator sample, the partial lens group, the third mirror 17 and the imaging camera 9. The partial lens group is the first lens 18 in the lens group, when the radiation imaging experiment of the scintillator sample 20 is performed, the third mirror 17 is rotated to between the first lens 18 and the second lens 19, so that the light transmitted by the image quality meter 21 and the scintillator sample 20 is irradiated to the third mirror 17 after converging through the first lens 18, and the third mirror 17 reflects the light to the imaging camera 9, so that the radiation imaging experiment of the scintillator sample 20 is completed. When the radiation imaging experiment of the scintillator sample 20 is not performed, the third mirror 17 is rotated to other angles, so as to ensure that the third mirror 17 does not affect the normal path of the light between the first lens 18 and the second lens 19.

[0086] The third mirror 17 can be, but is not limited to, a spherical mirror.

[0087] In an optional embodiment of the present application, as shown in Figure 6 the scintillator performance testing device further comprises a temperature control table 22 (the scintillator sample 20 can have different temperatures by adjusting the temperature), and the scintillator temperature characteristic testing mode of the scintillator performance testing device can remove the sample holder 6 or set the sample holder 6 in the temperature control table 22. The temperature control table 22 is rotatably arranged at the position of the sample holder 6, the temperature control table 22 is provided with the scintillator sample 20, so as to form a sixth test light path for testing the temperature characteristics of the scintillator sample 20 between the steady-state radiation source, the scintillator sample 20, the lens group, the light collecting light path 4 and the light detection element. The light emitted by the steady-state radiation source is irradiated on the scintillator sample 20, the light transmitted by the scintillator sample 20 is sequentially transmitted to the light detection element through the first lens 18, the second lens 19 and the light collecting light path 4, and the related performance of the transmitted light emission of the scintillator sample 20 at different temperatures can be tested through the light detection element, so as to complete the temperature characteristic experiment of the scintillator sample 20.

[0088] The temperature control table 22 has a window for the light to enter the inside of the temperature control table 22, and an edge of aluminum material is arranged along the circumference of the window, so as to improve the transmittance of the light.

[0089] In an optional embodiment of the present application, the micro-area distinguishing testing mode of the scintillator performance testing device is as shown in Figure 1 ,Figure 7 、 Figure 8 As shown in FIG. 6, the scintillator performance testing device further comprises a shielding member 5 and an imaging camera 9, the shielding member 5 is provided with a collimator 506, the collimator 506 is movably arranged at the exit end of the steady-state radiation source, the sample holder 6 is provided with a scintillator sample 20, and by replacing collimators 506 of different shapes and / or sizes, different light spots can be projected on the scintillator sample 20 to form a seventh test light path for micro-differentiation measurement of the scintillator sample 20 between the steady-state radiation source, the collimator 506, the scintillator sample 20 and the imaging camera 9. The light-emitting points on the scintillator sample 20 can be observed by the imaging camera 9, and by adjusting the rotation of the sample holder 6 to different angles during the test, micro-differentiation measurement of different positions on the scintillator sample 20 can be realized.

[0090] Further, as shown in FIG. 7, the scintillator performance testing device further comprises a monitoring camera 14, the monitoring camera 14 is arranged at a position close to the sample holder 6, and the entrance end of the monitoring camera 14 is directed towards the scintillator sample 20. In the micro-differentiation test mode, the light-emitting points on the scintillator sample 20 can also be observed by the monitoring camera 14 to achieve the purpose of micro-differentiation measurement of the scintillator sample 20. Figure 1

[0091] Specifically, as shown in FIG. 8, the shielding member 5 comprises a motor 501, a transmission structure 502, a first connecting rod 503, a mounting member 504, a sliding plate 505 and the collimator 506, the output shaft of the motor 501 is connected to one end of the first connecting rod 503 through the transmission structure 502, the transmission structure 502 converts the rotation of the motor 501 into the linear motion of the first connecting rod 503, the other end of the first connecting rod 503 is connected to the sliding plate 505, and the collimator 506 is arranged on the sliding plate 505; the mounting member 504 is arranged at the exit end of the steady-state radiation source, and a long strip-shaped light transmission hole (not shown) is formed in the mounting member 504; the position of the sliding plate 505 is adjusted to block the light transmission hole or make the light transmission hole conductive or make the collimator 506 align with the light transmission hole. When the sliding plate 505 moves to the position of blocking the light transmission hole, the exit end of the steady-state radiation source cannot emit light outward; when the sliding plate 505 moves to the position of being separated from the mounting member 504 (the sliding plate 505 does not block the light transmission hole), the light can be emitted from the exit end of the steady-state radiation source; when the sliding plate 505 moves to the position where the collimator 506 is opposite to the light transmission hole, the light emitted from the exit end of the steady-state radiation source is irradiated on the scintillator sample 20 after passing through the collimator 506, and the purpose of micro-differentiation measurement of the scintillator sample 20 can be achieved. Figure 7 Figure 8 Further, as shown in FIG. 9, the scintillator performance testing device further comprises a monitoring camera 14, the monitoring camera 14 is arranged at a position close to the sample holder 6, and the entrance end of the monitoring camera 14 is directed towards the scintillator sample 20. In the micro-differentiation test mode, the light-emitting points on the scintillator sample 20 can also be observed by the monitoring camera 14 to achieve the purpose of micro-differentiation measurement of the scintillator sample 20.

[0092] Further, as shown in FIG. 10, the scintillator performance testing device further comprises a monitoring camera 14, the monitoring camera 14 is arranged at a position close to the sample holder 6, and the entrance end of the monitoring camera 14 is directed towards the scintillator sample 20. In the micro-differentiation test mode, the light-emitting points on the scintillator sample 20 can also be observed by the monitoring camera 14 to achieve the purpose of micro-differentiation measurement of the scintillator sample 20. Figure 7 Figure 8 ​​​As shown, the shielding member 5 further comprises a containing box 507, the transmission structure 502 is arranged in the containing box 507, and the containing box 507 is fixedly installed at a position close to the steady-state radiation source. The transmission structure 502 comprises a connecting shaft 5021, a joint bearing 5022, a connecting pin 5023 and a connecting head 5024, the motor 501 is fixed to the outer wall of the containing box 507, the output shaft of the motor 501 extends into the containing box 507 and is connected with the connecting shaft 5021, the edge of the connecting shaft 5021 is provided with a second connecting rod 5025, one end of the second connecting rod 5025 is connected with the connecting shaft 5021, the other end of the second connecting rod 5025 extends away from the motor 501, the joint bearing 5022 is rotatably sleeved on the second connecting rod 5025, one end of the connecting pin 5023 is connected with the joint bearing 5022, the other end of the connecting pin 5023 is hingedly connected with the connecting head 5024, one end of the first connecting rod 503 is connected with the connecting head 5024, and the other end of the first connecting rod 503 extends out of the containing box 507 and is connected with the sliding plate 505. In the use process, the connecting shaft 5021 is driven to rotate by the motor 501, and then the second connecting rod 5025 moves eccentrically along the rotation direction of the connecting shaft 5021, and the rotation of the connecting shaft 5021 is converted into linear motion through the cooperation of the joint bearing 5022, the connecting pin 5023 and the connecting head 5024, so as to drive the first connecting rod 503 to move linearly, so that the relative position between the sliding plate 505 and the light transmission hole can be adjusted.

[0093] Further, as shown in Figure 7 , the inside of the containing box 507 is provided with a linear bearing 5071, the first connecting rod 503 passes through the linear bearing 5071 and extends out of the containing box 507, and the linear bearing 5071 plays a role of limiting the first connecting rod 503.

[0094] Further, as shown in Figure 7 , the mounting member 504 comprises a bottom plate 5041 and a cover plate 5042, in the installation process, the bottom plate 5041 is first fixed to the exit end of the steady-state radiation source, and then the cover plate 5042 is fixedly connected with the bottom plate 5041, the cover plate 5042 and the bottom plate 5041 are respectively provided with a first through hole and a second through hole, and the first through hole and the second through hole are communicated to form the light transmission hole. By pre-installing the bottom plate 5041, the bottom plate 5041 can be conveniently and adaptively connected with the exit end of the steady-state radiation source, and by arranging the cover plate 5042 with a corresponding thickness, the sliding plate 505 can be slidably attached with the cover plate 5042, so that the plugging effect of the light transmission hole can be ensured.

[0095] In an optional embodiment of the present application, as shown in Figure 1 , Figure 9As shown in the figure, the scintillator performance testing device further comprises a lead box 2, a steady-state ray source, a pulse ray source, a sample holder 6, a moving table 8, a shielding member 5, an imaging camera 9, a monitoring camera 14, a track 15, all of which are located in the lead box 2, and the safety of radiation during use is ensured by the lead box 2.

[0096] Further, as shown in the figure, Figure 9 As shown in the figure, the lead box 2 is provided with a ray indicating lamp 24, through which it can be shown whether the ray light pipe is in working condition; in addition, the cover of the lead box 2 is further provided with a safety lock 25 and a handle lock 23, which can play a double safety protection role. Specifically, there can be a first touch switch and a second touch switch in series on the control circuit, wherein the first touch switch is arranged on the lead box 2 and close to the position of the ray indicating lamp 24, the action of the first touch switch is controlled by the safety lock 25, and the second touch switch is arranged on the cover, the second touch switch is turned on when the cover is closed and the handle lock 23 is rotated to the closed position, the safety lock 25, the handle lock 23 and the shielding member 5 are interlocked with the ray light pipe, when the cover is closed and the safety lock 25 and the handle lock 23 are in the locked state, the shielding member 5 is moved and does not block the ray light pipe, the ray light pipe can be used, at this time, the cover cannot be opened; when the safety lock 25 and the handle lock 23 are in the open state, the shielding member 5 is moved and blocks the ray light pipe, the ray light pipe cannot be used, at this time, the cover can be opened.

[0097] Further, as shown in the figure, Figure 9 As shown in the figure, the inner wall of the lead box 2 is provided with a plurality of second heat dissipation elements 16, which play a role in heat dissipation when the scintillator performance testing device is working.

[0098] The various functions of the scintillator performance testing device of the present application can be integrated control (such as: using Omni-WIN software), convenient operation, without the need for experimental personnel to monitor the completion of long time, complex experimental scheme, with higher safety, the degree of automation is greatly improved.

[0099] In the present application, the steady-state ray source and the pulse ray source can respectively adopt a split steady-state X-ray source and a photo-cold cathode picosecond pulse X-ray source, of course, other types of radiation light sources, radioactive isotopes, laser light sources or other complex light sources can also be used.

[0100] In the switching process of different modes of the present application, the switching between different test light paths can be realized by manual switching, or the switching between different test light paths can also be realized by automatic control in an electric manner, and the specific switching and implementation manner are not limited herein.

[0101] The scintillator performance testing device of the present application has the following characteristics and advantages:

[0102] I. The scintillator performance testing device controls the working state of the steady-state radiation source or the pulsed radiation source, so that the steady-state radiation source or the pulsed radiation source emits light, adjusts the rotation angle of the sample holder 6 to change the orientation of the scintillator sample 20 on the sample holder 6, and adjusts the position of the moving table 8 to change the position of the lens group on the moving table 8, thereby forming different test light paths, achieving the purpose of testing different performances of the scintillator sample 20, and having higher integration. The present application can complete the testing of multiple performances of the scintillator sample 20 with one device, enriches the functions of the scintillator performance testing device, and greatly reduces the testing cost.

[0103] II. The existing scintillator performance testing experiment usually requires the experimenters to build the test light path themselves. For different performance tests, different light path structures need to be built, and there is a risk of radiation leakage. The scintillator performance testing device of the present application can complete the testing of multiple performances of the scintillator sample 20 with one set of equipment, thereby achieving the performance index testing of the scintillator sample 20 according to different industrial needs, and having better applicability.

[0104] III. In the scintillator performance testing device, the steady-state radiation source adopts a split structure of a radiation light pipe and a high-voltage generator. Compared with the small integrated radiation source commonly used in the prior art, it can provide better radiation power and greatly reduce the cost of the radiation source.

[0105] IV. The scintillator performance testing device can realize both transmission light testing and reflection light testing of the scintillator sample 20. Since the conventional use of the scintillator sample 20 is transmission light, but for weak light, strong self-absorption, powder samples and other scintillators, the surface light of the scintillator sample 20 needs to be tested through the reflection light path to facilitate the study of the light emission characteristics of the scintillator sample 20 by experimenters.

[0106] V. In the scintillator performance testing device, each functional element is arranged in the lead box 2, and the working state of each functional element can be controlled by one software, which is convenient to operate and can complete long-term and complex experimental schemes without the need for experimenters to monitor, has higher safety, and greatly improves the degree of automation.

[0107] The above is only a specific embodiment of the present application, and is not intended to limit the scope of the present application. Any equivalent changes and modifications made by those skilled in the art without departing from the concept and principles of the present application shall fall within the scope of the present application.

Claims

1. A scintillator performance testing device, characterized in that: include: Steady-state ray sources and pulsed ray sources; A sample holder capable of rotating to adjust an angle, wherein a scintillator sample is arranged on the sample holder; A movable platform capable of moving to adjust its position, wherein a lens group is provided on the movable platform, wherein an output end of the lens group is connected to one end of a light collecting optical path, and the other end of the light collecting optical path is connected to a light detecting element; Controlling the working state of the steady-state ray source or the pulse ray source, and adjusting the position of the movable stage and / or the rotation angle of the sample holder to form different test light paths; The steady-state radiation source includes a high-voltage generator and a first radiation light tube. A power line is connected between the high-voltage generator and the first radiation light tube. The output end of the first radiation light tube is directed toward the sample holder. The high-voltage generator applies a continuous high voltage to the first radiation light tube. The first radiation light tube generates thermal electrons through high-temperature heating. The high-voltage generator and the first radiation light tube cooperate as a radiation light source to perform steady-state testing and long-afterglow performance testing on the scintillator sample. The pulsed ray source includes a pulsed laser, a first reflector, and a second ray tube. The output end of the pulsed laser is directed toward the first reflector. The angle of the first reflector is adjusted so that the light reflected by the first reflector is incident on the incident end of the second ray tube. The output end of the second ray tube is directed toward the sample holder. The light emitted by the pulsed laser is reflected by the first reflector into the second ray tube and hits the cold cathode of the second ray tube, thereby exciting the second ray tube to generate photoelectrons in the form of pulses. The second ray tube emits the light toward the scintillator sample. The pulsed laser cooperates with the second ray tube to perform a scintillation decay time test on the scintillator sample.

2. The scintillator performance testing device according to claim 1, wherein: The lens group includes at least a first lens and a second lens for converging light, the incident end of the first lens faces the sample holder, the exit end of the first lens faces the incident end of the second lens, and the exit end of the second lens is connected to the light collecting optical path.

3. The scintillator performance testing device according to claim 1, wherein: The scintillator performance testing device includes a track, the moving platform is slidably arranged on the track, and the moving platform can move along the track at least between a first position and a second position.

4. The scintillator performance testing device according to claim 3, characterized in that: When the movable stage is adjusted to the first position, the sample holder is rotated to a first angle to form a first test light path for testing the transmissive luminescence performance of the scintillator sample between the steady-state ray source, the scintillator sample, the lens group, the light collecting light path and the light detecting element.

5. The scintillator performance testing device according to claim 3, characterized in that: The scintillator performance testing device further includes a second reflecting mirror; When the movable stage is adjusted to the second position, a scintillator sample is set on the sample holder, and the sample holder is rotated to the second angle, the second reflector can receive the light reflected by the scintillator sample and reflect the reflected light to the incident end of the lens group, so as to form a second test light path for testing the reflective luminescence performance of the scintillator sample between the steady-state ray source, the scintillator sample, the second reflector, the lens group, the light collecting light path and the light detection element.

6. The scintillator performance testing device according to claim 3, characterized in that: When the movable stage is adjusted to the first position, a scintillator sample is set on the sample holder, and the sample holder is rotated to a third angle to form a third test optical path for testing the radiation decay time performance of the scintillator sample between the pulsed ray source, the scintillator sample, the lens group, the light collecting optical path and the light detection element.

7. The scintillator performance testing device according to claim 3, wherein: The scintillator performance testing device further includes a radiation dosimeter, which is arranged on the mobile platform; When the movable platform is adjusted to the second position, the output end of the steady-state ray source faces the input end of the radiation dosimeter, so as to form a fourth test optical path between the steady-state ray source and the radiation dosimeter for detecting the radiation dose of the steady-state ray source.

8. The scintillator performance testing device according to claim 3, wherein: The scintillator performance testing device further includes an imaging camera and a third reflector, wherein the third reflector is rotatably disposed on the movable platform; When the movable stage is adjusted to the first position, the image quality meter and the scintillator sample are arranged on the sample holder, and the sample holder is rotated to the first angle, the third reflector can receive the light transmitted by the image quality meter and the scintillator sample and reflect the transmitted light to the imaging camera, so as to form a fifth test optical path for performing radiation imaging on the scintillator sample between the steady-state radiation source, the image quality meter, the scintillator sample, part of the lens group, the third reflector and the imaging camera.

9. The scintillator performance testing device according to claim 3, wherein: The scintillator performance testing device also includes a temperature control table, which is rotatably arranged at the position of the sample holder instead of the sample holder. A scintillator sample is arranged in the temperature control table to form a sixth test light path for testing the temperature characteristics of the scintillator sample between the steady-state ray source, the scintillator sample, the lens group, the light collecting light path and the light detection element.

10. The scintillator performance testing device according to claim 3, wherein: The scintillator performance testing device also includes a shielding member and an imaging camera. A collimator is provided on the shielding member. The collimator can be movably provided at the output end of the steady-state ray source, and collimators of different shapes and / or sizes can be replaced. A scintillator sample is provided on the sample holder, and different light spots are projected on the scintillator sample to form a seventh test optical path for performing differential measurement of the scintillator sample between the steady-state ray source, the collimator, the scintillator sample and the imaging camera.

11. The scintillator performance testing device according to claim 10, characterized in that: The shielding member includes a motor, a transmission structure, a first connecting rod, a mounting member, a sliding plate, and a collimator, wherein the output shaft of the motor is connected to one end of the first connecting rod through the transmission structure, and the transmission structure converts the rotation of the motor into linear motion of the first connecting rod. The other end of the first connecting rod is connected to the sliding plate, and the collimator is disposed on the sliding plate. The mounting member is arranged at the emission end of the steady-state ray source, and a light-transmitting hole is opened on the mounting member. The position of the sliding plate is adjusted so that the sliding plate blocks the light-transmitting hole or makes the light-transmitting hole conductive or the collimator is aligned with the light-transmitting hole.

12. The scintillator performance testing device according to claim 1, wherein: The scintillator performance testing device further includes a lead box, wherein the steady-state ray source, the pulse ray source, the sample holder and the moving stage are all located in the lead box; The lead box is provided with a ray indicator light, a safety lock, a handle lock and a plurality of second heat dissipation elements.

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