Systems, methods, and computer-readable storage media of testing memory devices

Abstract

A method for testing a memory device includes the following steps: using a plurality of commands conforming to the specifications of the memory device; performing a random decision on the plurality of commands to generate a plurality of different patterns, causing at least one test device to test the memory device according to the plurality of different patterns, wherein each of the plurality of different patterns comprises a sequence of one or more commands randomly selected from the plurality of commands. By virtue of the technical solution of this invention, this method can automatically generate different patterns conforming to the specifications of the memory device, thereby effectively and completely testing the memory device.

Description

Technical Field

[0001] This invention relates to a system and method, and more particularly to a system and method for testing memory devices. Background Technology

[0002] Dynamic Random Access Memory (DRAM) is a type of random access semiconductor memory that stores each bit of data in a memory cell. Patterns are now used to analyze whether DRAM is good enough. Basically, regardless of the test instrument used, patterns are initially planned manually. Patterns depend on the tester's ideas. Manually planned patterns are usually very simple in structure, therefore, they are insufficient for effectively and completely testing DRAM.

[0003] To understand these problems, relevant fields have spared no effort in seeking solutions, but a suitable method has yet to be developed. Therefore, how to solve these problems more efficiently is one of the important research topics at present, and also a goal that relevant fields urgently need to improve. Summary of the Invention

[0004] This invention provides a system and method for testing memory devices and a computer-readable storage medium, which improves upon the problems of prior art.

[0005] In one embodiment of the present invention, the system for testing a memory device proposed by the present invention includes a memory device and a processor electrically connected to the memory device. The memory device is used to store at least one instruction, and the processor is used to access and execute the at least one instruction: using a plurality of commands conforming to the specifications of the memory device; performing random decisions on the plurality of commands to generate a plurality of different patterns, such that at least one test device tests the memory device according to the plurality of different patterns, wherein each of the plurality of different patterns comprises a sequence of one or more commands randomly selected from the plurality of commands.

[0006] In one embodiment of the present invention, the storage device stores specifications, the specifications including a plurality of commands, a plurality of timings and the definition of an operating environment, and the processor accesses and executes at least one instruction: according to the specifications of the storage device, using a plurality of commands and a plurality of timings; performing random decisions on the plurality of commands and the plurality of timings to establish a plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands and one or more timings randomly selected from the plurality of timings.

[0007] In one embodiment of the invention, the processor accesses and executes at least one instruction: classifying a plurality of different patterns into a plurality of groups having a plurality of different test preferences.

[0008] In one embodiment of the present invention, the processor accesses and executes at least one instruction: based on the characteristics of one or more commands in each of the plurality of different modes, analyzes the corresponding test preferences of each of the plurality of different modes; and classifies the plurality of different modes into a plurality of groups according to the corresponding test preferences of each of the plurality of different modes, so that the multiple groups have multiple different test preferences respectively.

[0009] In one embodiment of the present invention, the processor accesses and executes at least one instruction: selecting one or more groups from a plurality of groups; randomly selecting one or more patterns from the one or more groups and arranging them to generate at least one combination sequence, so that at least one test device tests the memory device according to the at least one combination sequence.

[0010] In one embodiment of the invention, the storage device stores a list to record a plurality of groups, and the processor accesses and executes at least one instruction: when a new group is generated, the new group is added to the list.

[0011] In one embodiment of the invention, the processor accesses and executes at least one instruction: to re-execute a random decision based on the changed conditions to generate a plurality of different new patterns.

[0012] In one embodiment of the present invention, the method for testing a memory device proposed in the present invention includes the following steps: using a plurality of commands conforming to the specifications of the memory device; performing random decision-making on the plurality of commands to generate a plurality of different patterns, such that at least one test device tests the memory device according to the plurality of different patterns, wherein each of the plurality of different patterns comprises a sequence of one or more commands randomly selected from the plurality of commands.

[0013] In one embodiment of the invention, the step of using a plurality of commands conforming to the specifications of a memory device includes: preloading the specifications, which include a plurality of commands, a plurality of timing sequences, and definitions of an operating environment; and using the plurality of commands and the plurality of timing sequences according to the specifications of the memory device. The step of performing random decisions on the plurality of commands to generate a plurality of different patterns includes: performing random decisions on the plurality of commands and the plurality of timing sequences to establish a plurality of different patterns, wherein each of the plurality of different patterns includes a sequence of one or more commands randomly selected from the plurality of commands and one or more timing sequences randomly selected from the plurality of timing sequences.

[0014] In one embodiment of the present invention, the method further includes classifying a plurality of different patterns into a plurality of groups having a plurality of different testing preferences.

[0015] In one embodiment of the present invention, the step of classifying a plurality of different modes into a plurality of groups having a plurality of different test preferences includes: analyzing the corresponding test preferences of each of the plurality of different modes based on the characteristics of one or more commands in each of the plurality of different modes; classifying the plurality of different modes into a plurality of groups according to the corresponding test preferences of each of the plurality of different modes, so that the plurality of groups each have a plurality of different test preferences.

[0016] In one embodiment of the present invention, the method further includes: selecting one or more groups from a plurality of groups; randomly selecting one or more patterns from the one or more groups and arranging them in a permutation and combination to generate at least one combination sequence, so that at least one test device tests the memory device according to the at least one combination sequence.

[0017] In one embodiment of the present invention, the method further includes: storing a list to record a plurality of groups; and adding a new group to the list when a new group is generated.

[0018] In one embodiment of the present invention, the method further includes: re-executing the random decision based on the changed conditions to generate a plurality of different new patterns.

[0019] In one embodiment of the present invention, a computer-readable storage medium is provided to store a plurality of instructions to cause a computer to execute a method for testing a memory device. The method includes the steps of: using a plurality of commands conforming to the specifications of the memory device; performing random decisions on the plurality of commands to generate a plurality of different patterns, causing at least one test device to test the memory device according to the plurality of different patterns, wherein each of the plurality of different patterns comprises a sequence of one or more commands randomly selected from the plurality of commands.

[0020] In one embodiment of the invention, a preload specification is provided, which includes a plurality of commands, a plurality of timing sequences, and definitions of an operating environment; the plurality of commands and timing sequences are used according to the specifications of the memory device. The step of performing random decisions on the plurality of commands to generate a plurality of different modes includes: performing random decisions on the plurality of commands and the plurality of timing sequences to establish a plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands and one or more timing sequences randomly selected from the plurality of timing sequences.

[0021] In one embodiment of the present invention, the method further includes classifying a plurality of different patterns into a plurality of groups having a plurality of different testing preferences.

[0022] In one embodiment of the present invention, the step of classifying a plurality of different modes into a plurality of groups having a plurality of different test preferences includes: analyzing the corresponding test preferences of each of the plurality of different modes based on the characteristics of one or more commands in each of the plurality of different modes; classifying the plurality of different modes into a plurality of groups according to the corresponding test preferences of each of the plurality of different modes, so that the plurality of groups each have a plurality of different test preferences.

[0023] In one embodiment of the present invention, the method further includes: selecting one or more groups from a plurality of groups; randomly selecting one or more patterns from the one or more groups and arranging them in a permutation and combination to generate at least one combination sequence, so that at least one test device tests the memory device according to the at least one combination sequence.

[0024] In one embodiment of the present invention, the method further includes: storing a list to record a plurality of groups; and adding a new group to the list when a new group is generated.

[0025] In summary, the technical solution of the present invention has significant advantages and beneficial effects compared with the prior art. Through the technical solution of the present invention, the system and method can automatically generate different patterns conforming to the specifications of memory devices, thereby effectively and completely testing memory devices.

[0026] The above description will be given in detail below with reference to the embodiments, and a further explanation of the technical solution of the present invention will be provided. Attached Figure Description

[0027] To make the above and other objects, features, advantages and embodiments of the present invention more apparent and understandable, the accompanying drawings are described below:

[0028] Figure 1 This is a block diagram of a system for testing a memory device according to an embodiment of the present invention; and

[0029] Figure 2 This is a flowchart of a method for testing a memory device according to an embodiment of the present invention. Detailed Implementation

[0030] To provide a more detailed and complete description of the invention, reference can be made to the accompanying drawings and the various embodiments described below, in which the same numbers represent the same or similar elements. Furthermore, well-known elements and steps are not described in the embodiments to avoid unnecessarily limiting the invention.

[0031] Please refer to Figure 1 The present invention relates to a system 100 for testing a memory device 190, which can be applied in a test line or widely used in related technical processes. The following will be accompanied by... Figure 1, Figure 2 The specific implementation of system 100 will be described below.

[0032] It should be understood that the system 100 has multiple implementation methods. Figure 1 The following description provides a comprehensive account of one or more embodiments for ease of explanation. However, the art can be practiced without these specific details. In other examples, known structures and apparatuses are shown in block diagram form for the effective description of these embodiments. The term "by way of example" is used herein to mean "as an example, instance, or illustration." Any embodiment described herein as "by way of example" is not to be construed as preferred or superior to other embodiments.

[0033] Figure 1 This is a block diagram of a system 100 for a test memory device 190 according to an embodiment of the present invention. Figure 1 As shown, system 100 may include computer 101 and testing device 102. It should be understood that, in the embodiments and claims, unless specifically defined herein, the terms "a" and "the" may refer to a single or multiple entities. Furthermore, the terms "comprising," "including," "having," etc., as used in the description herein and the following claims should be understood as open-ended terms, meaning including but not limited to. Unless the context clearly specifies otherwise, the word "in" as used in the description herein and the following claims includes both "within" and "on."

[0034] Architecturally, computer 101 can be electrically connected to test device 102. It should be understood that, in the embodiments and claims, the description of "electrical connection" can broadly refer to one component being indirectly electrically coupled to another component through other components, or one component being directly electrically connected to another component without needing to go through other components. For example, test device 102 can be a built-in test device directly connected to computer 101, or test device 102 can be an external test device, with computer 101 indirectly obtaining data from test device 102.

[0035] In practice, for example, the test device 102 may be a test circuit, test equipment (e.g., automatic test equipment, built-in test equipment, etc.) or similar device.

[0036] In practice, for example, computer 101 could be a computer host or a server. Regarding servers, many technologies have been developed or are under development to manage the operation of computer servers, generally providing accessibility, consistency, and efficiency. Remote management allows for the removal of input / output interfaces used for servers, as well as the need for network administrators to access each server. For example, large data centers with many computer servers typically use various remote management tools to manage, configure, monitor, and troubleshoot server hardware and software.

[0037] like Figure 1 As shown, computer 101 includes a storage device 110, a processor 120, an input / output (I / O) interface 130, and a display device 170. In practice, for example, the storage device 110 may be storage hardware, such as a hard disk drive (HDD) or a solid-state drive (SSD). The processor 120 may be a central processing unit (CPU), the input / output interface 130 may include connectors, communication equipment, transmission equipment, input devices, etc., and the display device 170 may be a liquid crystal display (LCD) or a similar device.

[0038] In terms of architecture, processor 120 is electrically connected to storage device 110, input / output interface 130, and display device 170. Input / output interface 130 can be connected to test device 102, and test device 102 is electrically connected to memory device 190. In practice, for example, memory device 190 can be DRAM, flash memory, or other memory circuitry.

[0039] Storage device 110 is used to store at least one instruction. When in use, processor 120 is used to access and execute at least one instruction: a plurality of commands conforming to the specifications of memory device 190. Next, processor 120 is used to access and execute at least one instruction: to perform a random decision on the plurality of commands to generate a plurality of different patterns, causing at least one test device to test the memory device according to the plurality of different patterns, wherein each of the plurality of different patterns contains a sequence of one or more commands randomly selected from the plurality of commands. Thus, system 100 can automatically generate different patterns conforming to the specifications of memory device 190, thereby effectively and completely testing memory device 190.

[0040] Next, the test device 102 transmits the results of the test memory device 190 to the computer 101, wherein the input / output interface 130 receives the results of the test memory device 190, the processor 120 stores the results of the test memory device 190 to the storage device 110, and the display device 170 can display the contents of the results of the test memory device 190.

[0041] To further illustrate the specifications of the memory device 190, in one embodiment of the present invention, the memory device 110 stores specifications, including the definition of a plurality of commands, a plurality of timing sequences, and an operating environment. In use, the processor 120 accesses and executes at least one instruction: using the plurality of commands and the plurality of timing sequences according to the specifications of the memory device. Next, the processor 120 accesses and executes at least one instruction: performing random decisions on the plurality of commands and the plurality of timing sequences to establish a plurality of different patterns, each of the plurality of different patterns comprising a sequence of one or more commands randomly selected from the plurality of commands and one or more timing sequences randomly selected from the plurality of timing sequences. Thus, the system 100 can automatically generate different patterns conforming to the specifications of the memory device 190 in a more diverse manner, thereby more effectively and completely testing the memory device 190.

[0042] In one embodiment of the present invention, the processor 120 accesses and executes at least one instruction: classifying a plurality of different modes into a plurality of groups having a plurality of different test preferences. In practice, for example, test preferences may include voltage test preferences, current test preferences, speed test preferences, reliability test preferences, access test preferences, etc., but the present invention is not limited thereto.

[0043] To further illustrate the above classification, in one embodiment of the present invention, the processor 120 accesses and executes at least one instruction: based on the characteristics of one or more commands in each of the plurality of different modes, analyzes the corresponding test preferences of each of the plurality of different modes. Next, the processor 120 accesses and executes at least one instruction: according to the corresponding test preferences of each of the plurality of different modes, classifies the plurality of different modes into a plurality of groups, such that multiple groups can each have multiple different test preferences.

[0044] In one embodiment of the present invention, processor 120 accesses and executes at least one instruction: selecting one or more groups from a plurality of groups. Next, processor 120 accesses and executes at least one instruction: randomly selecting one or more patterns from the one or more groups for permutation and combination to generate at least one combination sequence, causing at least one test device 102 to test memory device 190 based on the at least one combination sequence. In practice, for example, when the above-mentioned random decision-making is difficult to generate a specific sequence, system 100 can permutate and combine the plurality of groups to generate a more specific and complex combination sequence than the above-mentioned plurality of different patterns.

[0045] For example, the plurality of groups includes a first group, a second group, and a third group, wherein the first group includes a first mode, a second mode, and a third mode; the second group includes a fourth mode, a fifth mode, and a sixth mode; and the third group includes a seventh mode and an eighth mode. For example, the processor 120 can randomly select the first group and the third group from the first group, the second group, and the third group. Then, the processor 120 can randomly select the first, second, third, seventh, and eighth modes from the first group and the third group and permutate and combine the first, second, third, seventh, and eighth modes to generate one or more combination sequences. It should be noted that although the terms "first," "second," etc., are used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, without departing from the scope of the embodiments, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element.

[0046] In one embodiment of the invention, storage device 110 stores a list to record a plurality of groups. In use, processor 120 accesses and executes at least one instruction: when a new group is generated, add the new group to the list. Thus, system 100 can be easily expanded.

[0047] In one embodiment of the invention, processor 120 accesses and executes at least one instruction: to re-execute a random decision based on changed conditions to generate a plurality of different new patterns. Thus, pattern maintenance of system 100 is easier than traditional manual planning methods.

[0048] To further explain the operating method of the aforementioned system 100, please also refer to... Figure 1 , Figure 2 , Figure 2 This is a flowchart of a method 200 for testing a memory device 190 according to an embodiment of the present invention. Figure 2 As shown, method 200 includes steps S201 and S203 (it should be understood that, unless otherwise specified, the order of the steps mentioned in this embodiment can be adjusted as needed, and they can even be executed simultaneously or partially simultaneously).

[0049] Method 200 may take the form of a computer program product on a computer-readable storage medium having a plurality of computer-readable instructions contained therein. Suitable storage media may include any of the following: non-volatile memory, such as read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM); volatile memory, such as static random access memory (SRAM), dynamic random access memory (DRAM), double data rate random access memory (DDR-RAM); optical storage devices, such as read-only optical disc (CD-ROM), read-only digital multifunction laser disc (DVD-ROM); magnetic storage devices, such as hard disk drives, floppy disk drives.

[0050] In one embodiment of the present invention, in step S201, a plurality of commands conforming to the specifications of memory device 190 are used; in step S203, random decision-making is performed on the plurality of commands to generate a plurality of different patterns, such that at least one test device tests memory device 190 according to the plurality of different patterns, wherein each of the plurality of different patterns comprises a sequence of one or more commands randomly selected from the plurality of commands. Thus, method 200 can automatically generate different patterns conforming to the specifications of memory device 190, thereby effectively and completely testing memory device 190.

[0051] To further illustrate the specifications of the memory device 190, in one embodiment of the present invention, in step S201, specifications are preloaded, including a plurality of commands, a plurality of timing sequences, and definitions of the operating environment; according to the specifications of the memory device 190, the plurality of commands and timing sequences are used. In step S203, random decisions are made on the plurality of commands and timing sequences to establish a plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands and one or more timing sequences randomly selected from the plurality of timing sequences. Thus, method 200 can automatically generate different modes conforming to the specifications of the memory device 190 in a more diverse manner, thereby testing the memory device 190 more effectively and completely.

[0052] In one embodiment of the present invention, method 200 further includes classifying a plurality of different modes into a plurality of groups having a plurality of different test preferences. In practice, for example, test preferences may include voltage test preferences, current test preferences, speed test preferences, reliability test preferences, access test preferences, etc., but the present invention is not limited thereto.

[0053] To further elaborate on the above classification, in one embodiment of the present invention, based on the characteristics of one or more commands in each of the plurality of different modes, the corresponding test preferences of each of the plurality of different modes are analyzed; according to the corresponding test preferences of each of the plurality of different modes, the plurality of different modes are classified into a plurality of groups, so that the multiple groups have multiple different test preferences respectively.

[0054] In one embodiment of the present invention, method 200 further includes: selecting one or more groups from a plurality of groups; randomly selecting one or more patterns from the one or more groups and arranging them in a permutation and combination to generate at least one combination sequence, such that at least one test device tests a memory device according to the at least one combination sequence. In practice, for example, when the above-mentioned random decision-making is difficult to generate a specific sequence, method 200 can arrange and combine the plurality of groups to generate a combination sequence that is more specific and complex than the above-mentioned plurality of different patterns.

[0055] In one embodiment of the invention, method 200 further includes: storing a list to record a plurality of groups; and adding a new group to the list when a new group is generated. Thus, method 200 can be easily expanded.

[0056] In one embodiment of the invention, method 200 further includes: re-executing the random decision based on the changed conditions to generate a plurality of different new patterns. Thus, pattern maintenance in method 200 is easier than in traditional manual planning methods.

[0057] In summary, the technical solution of the present invention has significant advantages and beneficial effects compared with the prior art. Through the technical solution of the present invention, system 100 and method 200 can automatically generate different modes conforming to the specifications of memory device 190, thereby effectively and completely testing memory device 190.

[0058] Although the present invention has been disclosed above by way of embodiments, it is not intended to limit the present invention. Those skilled in the art can make various modifications and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

[0059] [Symbol Explanation]

[0060] To make the above and other objects, features, advantages and embodiments of the present invention more apparent and understandable, the appended symbols are explained as follows:

[0061] 100: System

[0062] 101: Computer

[0063] 102: Testing equipment

[0064] 110: Storage device

[0065] 120: Processor

[0066] 130: Input / Output Interface

[0067] 170: Display device

[0068] 190: Memory device

[0069] 200: Method

[0070] S201, S203: Steps.

Claims

1. A system for testing memory devices, characterized in that, The system includes: Storage device for storing at least one instruction; and A processor, electrically connected to the storage device, is used to access and execute the at least one instruction: Use a plurality of commands that conform to the specifications of the memory device; Perform random decisions on the plurality of commands to generate a plurality of distinct patterns, each of the plurality of distinct patterns comprising a sequence of one or more commands randomly selected from the plurality of commands; The multiple different patterns are classified into multiple groups with multiple different testing preferences; Choose one or more groups from the plurality of groups; as well as One or more patterns are randomly selected from the one or more groups and arranged in a permutation and combination to generate at least one combination sequence, so that at least one test device tests the memory device according to the at least one combination sequence.

2. The system according to claim 1, characterized in that, The storage device stores the specification, which includes the definition of the plurality of commands, the plurality of timing parameters, and the operating environment. The processor accesses and executes the at least one instruction. According to the specifications of the memory device, the plurality of commands and the plurality of timing sequences are used; and The random decision is performed on the plurality of commands and the plurality of timing sequences to establish the plurality of different patterns, wherein each of the plurality of different patterns comprises the sequence of one or more commands randomly selected from the plurality of commands and one or more timing sequences randomly selected from the plurality of timing sequences.

3. The system according to claim 1, characterized in that, The processor accesses and executes the at least one instruction: Based on the characteristics of one or more commands in each of the plurality of different modes, analyze the corresponding test preferences for each of the plurality of different modes; and Based on the corresponding test preference of each of the plurality of different patterns, the plurality of different patterns are classified into the plurality of groups, such that the plurality of groups each have the plurality of different test preferences.

4. The system according to claim 1, characterized in that, The storage device stores a list to record the plurality of groups, and the processor accesses and executes the at least one instruction: When a new group is created, add the new group to a list.

5. The system according to claim 1, characterized in that, The processor accesses and executes the at least one instruction: The random decision is re-executed based on the changed conditions to produce multiple different new patterns.

6. A method for testing a memory device, characterized in that, The method includes the following steps: Use a plurality of commands that conform to the specifications of the memory device; Perform random decisions on the plurality of commands to generate a plurality of distinct patterns, each of the plurality of distinct patterns comprising a sequence of one or more commands randomly selected from the plurality of commands; The multiple different patterns are classified into multiple groups with multiple different testing preferences; Choose one or more groups from the plurality of groups; as well as One or more patterns are randomly selected from the one or more groups and arranged in a permutation and combination to generate at least one combination sequence, so that at least one test device tests the memory device according to the at least one combination sequence.

7. The method according to claim 6, characterized in that, The steps of using the plurality of commands conforming to the specification of the memory device include: This specification is preloaded, and includes the definitions of the plurality of commands, the plurality of timing sequences, and the operating environment; and According to the specifications of the memory device, using the plurality of commands and the plurality of timings, The steps of executing the random decision on the plurality of commands to generate the plurality of different patterns include: The random decision is performed on the plurality of commands and the plurality of timing sequences to establish the plurality of different patterns, wherein each of the plurality of different patterns comprises the sequence of one or more commands randomly selected from the plurality of commands and one or more timing sequences randomly selected from the plurality of timing sequences.

8. The method according to claim 6, characterized in that, The step of classifying the plurality of different patterns into the plurality of groups having the plurality of different test preferences includes: Based on the characteristics of one or more commands in each of the plurality of different modes, analyze the corresponding test preferences for each of the plurality of different modes; and Based on the corresponding test preference of each of the plurality of different patterns, the plurality of different patterns are classified into the plurality of groups, such that the plurality of groups each have the plurality of different test preferences.

9. The method according to claim 6, characterized in that, Also includes: Store a list to record the plurality of groups; and When a new group is created, add the new group to a list.

10. The method according to claim 6, characterized in that, Also includes: The random decision is re-executed based on the changed conditions to produce multiple different new patterns.

11. A computer-readable storage medium storing a plurality of instructions to cause a computer to perform a method for testing a memory device, characterized in that, The method includes the following steps: Use a plurality of commands that conform to the specifications of the memory device; Random decisions are made on the plurality of commands to generate a plurality of different patterns, such that at least one test device tests the memory device according to the plurality of different patterns, wherein each of the plurality of different patterns comprises a sequence of one or more commands randomly selected from the plurality of commands; The multiple different patterns are classified into multiple groups with multiple different testing preferences; Choose one or more groups from the plurality of groups; as well as One or more patterns are randomly selected from the one or more groups and arranged in a permutation and combination to generate at least one combination sequence, so that at least one test device tests the memory device according to the at least one combination sequence.

12. The computer-readable storage medium according to claim 11, characterized in that, The steps of using the plurality of commands conforming to the specification of the memory device include: This specification is preloaded, and includes the definitions of the plurality of commands, the plurality of timing sequences, and the operating environment; and According to the specifications of the memory device, using the plurality of commands and the plurality of timings, The steps of executing the random decision on the plurality of commands to generate the plurality of different patterns include: The random decision is performed on the plurality of commands and the plurality of timing sequences to establish the plurality of different patterns, wherein each of the plurality of different patterns comprises the sequence of one or more commands randomly selected from the plurality of commands and one or more timing sequences randomly selected from the plurality of timing sequences.

13. The computer-readable storage medium according to claim 11, characterized in that, The step of classifying the plurality of different patterns into the plurality of groups having the plurality of different test preferences includes: Based on the characteristics of one or more commands in each of the plurality of different modes, analyze the corresponding test preferences for each of the plurality of different modes; and Based on the corresponding test preference of each of the plurality of different patterns, the plurality of different patterns are classified into the plurality of groups, such that the plurality of groups each have the plurality of different test preferences.

14. The computer-readable storage medium according to claim 11, characterized in that, The method also includes: Store a list to record the plurality of groups; and When a new group is created, add the new group to a list.

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