An x-ray focusing detection system with a wide spectral range and high spectral resolution

Abstract

The application discloses a kind of wide spectrum range and high spectral resolution X-ray focusing detection system, for detecting after X-ray diffraction of light source, including diffraction crystal and detector, the surface of the diffraction crystal has diffraction surface, the diffraction surface can be detected by detector after the total diffraction of X-ray emitted and radiated to diffraction surface by the light source;The application solves the technical problems of low X-ray collection efficiency of traditional plane crystal, low X-ray spectrum resolution of cylindrical or conical crystal, narrow spectral range of spherical crystal, so that it has the characteristics of high spectral resolution, high collection efficiency and wide spectral range, so as to realize the focusing spectral function of X-ray at multiple energy points, and weaken the restriction on the placement position of light source in the whole X-ray spectrum detection system.

Description

Technical Field

[0001] This invention relates to the field of X-ray spectral detection, and more specifically to an X-ray focusing detection system with a wide spectral range and high spectral resolution. Background Technology

[0002] Inertial confinement fusion (ICF) involves uniformly irradiating a miniature target composed of thermonuclear fuels such as deuterium and tritium with highly directional energy (the energy driving nuclear fusion, also known as the actuator) such as a powerful laser (or particle beam). Within an extremely short time, the surface of the target ionizes and ablates, forming a high-temperature plasma surrounding the target core. This plasma explodes and expands outward, creating an immense centripetal reaction pressure, equivalent to a billion times the atmospheric pressure on Earth, according to the law of conservation of momentum. Under this enormous pressure, the deuterium-tritium plasma is compressed to extremely high temperatures and densities, triggering a nuclear fusion reaction in the deuterium-tritium fuel.

[0003] In inertial confinement nuclear fusion, X-ray emission and neutrons are the only observable characteristic signals of the plasma. X-ray energy spectrum can provide important information about the plasma's electron density, temperature, plasma motion, charge distribution, and ion transport parameters.

[0004] Currently, X-ray spectroscopy is the primary method for diagnosing ICF (intracytoplasmic fibrosis), and it has two advantages over other methods:

[0005] First, the X-ray emission of the plasma itself is used as the basis for diagnosis, which will not interfere with the plasma being tested.

[0006] II. The emission intensity of X-ray spectra is directly related to the ionization state and energy level distribution of plasma.

[0007] When detecting X-rays, the common method is to use a crystal to diffract and separate the X-rays before detection. X-rays that can be diffracted by a crystal must satisfy the Bragg condition: 2dsinθ=nλ, where d is the crystal constant, θ is the Bragg incident angle, and n is the diffraction order.

[0008] The following methods are commonly used in existing technologies to detect X-rays after diffraction and spectral dispersion:

[0009] (1) Direct diffraction of X-rays using a planar crystal

[0010] Planar crystals have a simple structure and a wide spectral range, but they do not have the ability to focus X-rays, resulting in low X-ray collection efficiency.

[0011] (2) X-ray diffraction is performed using cylindrical or conical crystals.

[0012] The diffraction plane of a cylindrical or conical crystal is part of a smooth cylindrical or conical surface. The diffraction principle of X-rays by cylindrical or conical crystals is Bragg diffraction. A characteristic of cylindrical or conical crystals is that the diffraction and dispersion of X-rays occurs in the generatrix direction of the cylindrical or conical crystal, and the cylindrical or conical surface only acts as a focusing point for the light beam.

[0013] Since cylindrical or conical crystals can focus X-rays, thus improving the X-ray collection efficiency, their focusing principle is not based on the Rowland circle principle, resulting in lower spectral resolution. In addition, X-rays of different energies have inconsistent optical path lengths after diffraction by cylindrical or conical crystals, which can affect the detection results and lead to inaccurate or erroneous judgments.

[0014] (3) X-ray diffraction using a spherical crystal

[0015] A spherical curved crystal has curved surfaces with the same radius of curvature, and if the radius of curvature is R, then the radius of the Rowland circle is R / 2. On the meridional plane, X-rays of different wavelengths emitted from a source on the Rowland circle are focused at corresponding positions on the circle. When the detector is located at that position on the Rowland circle, a high-resolution spectrum can be obtained. When a spherical crystal diffracts X-rays that satisfy the Bragg condition, in addition to focusing the X-rays according to the Rowland circle principle, it must also satisfy specific structural requirements, such as… Figure 6 As shown, point A is the location of the light source, the dashed circle is the Rowland circle with a radius of R / 2, and the arc passing through point C is the curved surface of the crystal with a radius of R. The detection point B must be located on the Rowland circle, and the center of the crystal circle must be located on the line connecting A and B. This ensures that the rays radiated from point A to the crystal surface are focused at point B.

[0016] However, since the spherical crystal theoretically conforms to the Rowland circle principle only at point C, which is tangent to the Rowland circle, the spectral range is narrow; moreover, the X-ray source must be placed at a considerable distance outside the Rowland circle, and the possible placement locations are relatively limited, thus restricting the application range.

[0017] The aforementioned Rowland's circle principle refers to: such as Figure 1 As shown, a reflective grating composed of a series of equally spaced parallel lines engraved on a concave spherical reflective mirror has the ability to split and concentrate light. It was discovered by physicist Henry A. Rowland in the early 1880s. If a slit light source and a concave grating are placed on a circle with a diameter equal to the radius of curvature of the concave grating, and this circle is tangent to the midpoint G of the grating, then the spectrum formed by the concave grating will be on this circle, which is called the Rowland circle.

[0018] A crystal can be viewed as a grating that can separate and focus X-rays. If the crystal is bent into an arc shape with a bending radius equal to the diameter of the Rowland circle, then the X-rays emitted from a point on the Rowland circle will still be focused on the point on the Rowland circle after being reflected by the bent crystal.

[0019] In summary, there is a need to invent an X-ray focusing detection system that can fundamentally solve the problems of low X-ray collection efficiency of traditional planar crystals, narrow spectral range of spherical crystals, and low spectral resolution of cylindrical or conical crystal structures. This system should be able to simultaneously achieve X-ray focusing at multiple energy points, reducing the limitations on the placement of X-ray spectral detectors, in order to obtain an X-ray detection system with high X-ray collection efficiency, wide spectral range, and high spectral resolution. Summary of the Invention

[0020] The purpose of this invention is to provide an X-ray focusing detection system with a wide spectral range and high spectral resolution, which solves in principle the problems of low X-ray collection efficiency of traditional planar crystals, narrow spectral measurement range of spherical crystals, and low spectral resolution of cylindrical or conical crystal structures, thus providing an X-ray detection system with both a wide spectral range and high spectral resolution for fusion ignition.

[0021] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0022] A wide-spectrum-range and high-spectral-resolution X-ray focusing detection system is characterized in that it is used to detect X-rays emitted from a light source after diffraction, and includes a diffraction crystal and a detector. The surface of the diffraction crystal has a diffraction surface, which can diffract all X-rays emitted by the light source and radiated to the diffraction surface before they are detected by the detector.

[0023] Preferably, the diffraction surface includes multiple sagittal arcs, the line connecting the midpoints of the multiple sagittal arcs is a meridional arc with radius R, the multiple sagittal arcs are arranged sequentially according to the extension trajectory of the meridional arc to form the diffraction surface, the X-rays emitted by the light source are diffracted on the multiple sagittal arcs and can be focused on multiple sagittal focal points respectively, each sagittal focal point is located on a Rowland circle on a plane perpendicular to the corresponding sagittal arc surface, each Rowland circle has a diameter of R, and each Rowland circle is tangent to the meridional arc.

[0024] Preferably, the detection surface of the detector covers at least the location of each sagittal focus.

[0025] Preferably, the detection surface of the detector is composed of the lines connecting the focal points of each arc.

[0026] This invention also discloses a method for fabricating a diffraction crystal and a detector, used to fabricate an X-ray focusing detection system with a wide spectral range and high spectral resolution as described above, characterized by comprising the following steps:

[0027] S1. Construct a meridional arc with radius R, and place the simulated X-ray source S on one side of the tangent point between the meridional arc and the Rowland circle;

[0028] S2. Simulate an X-ray source emitting n X-rays and obtain n intersection points {A1, A2, A3...A...} with the meridian arc. n}; Connect the center O of the meridian arc with the obtained intersection points {A1, A2, A3...A... n}, resulting in n connecting lines

[0029] {AO1,AO2,AO3...AO n}; with n lines {AO1, AO2, AO3...AO n The midpoint of} is the center of the circle.

[0030] {O1,O2,O3...O n Draw n Rowland circles with diameter R;

[0031] S3. Insert n X-rays at intersection points {A1, A2, A3...A...} n The line connecting the points is mirrored along the mirror axis to obtain n X-ray diffraction lines; these n X-ray diffraction lines are extended and intersected with the corresponding n Rowland circles to obtain n intersection points {D1, D2, D3...D}. n};

[0032] S4. Connect the simulated X-ray source S to each intersection point {D1, D2, D3...D...} n Connect} to obtain n lines {SD1,SD2,SD3...SD} n}, and from n intersection points {A1,A2,A3...A n} Connect n lines {SD1,SD2,SD3...SD n Draw perpendicular lines to obtain n perpendicular points and n perpendicular lines {AC1, AC2, AC3...AC4}. n}; with each perpendicular point {C1,C2,C3...C n With} as the center, and the corresponding perpendicular lines {AC1, AC2, AC3...AC...} n Draw circles with the radius to obtain n sagittal circles perpendicular to the plane of the Rowland circle;

[0033] S5. Take the centers {C1, C2, C3...C...} obtained in step S4. n The n arcs between the meridian arc and the crystal are arranged to form a surface, which is used as the diffraction surface shape of the crystal; the intersection points {D1, D2, D3...D...} in step S4 are then... nConnect the points and use the resulting lines as the detection surface of the detector;

[0034] S6. Based on the diffraction surface shape of the crystal and the detector surface shape obtained in step S5, process the diffraction surface of the crystal and the detector surface shape of the detector, and then attach the X-ray photosensitive material to the detector surface shape to obtain a diffraction crystal with the specific diffraction surface in step S5 and a detector surface that matches the diffraction crystal.

[0035] Preferably, the simulated X-ray source S in step S1 is arranged inside each Rowland circle.

[0036] Preferably, the value of n is in the range of n≥50, where n is a natural number.

[0037] Preferably, the value of n ranges from 50 to 150, where n is a natural number.

[0038] Preferably, the crystal in step S6 is one of the crystal materials such as quartz, Ge, and Si.

[0039] Preferably, the X-ray photosensitive material described in step S6 is a flexible X-ray film or X-ray imaging plate device.

[0040] The present invention has the following beneficial effects:

[0041] This invention discloses an X-ray focusing detection system with a wide spectral range and high spectral resolution, which fundamentally solves the technical problems of low X-ray collection efficiency of traditional planar crystals, low X-ray spectral resolution of cylindrical or conical crystals, and narrow spectral measurement range of spherical crystals. It enables the system to simultaneously possess the characteristics of high spectral resolution, high collection efficiency, and wide spectral measurement range, thereby achieving the focusing function of X-rays at multiple energy points and reducing the limitations on the placement of the light source in the entire X-ray spectral detection system.

[0042] The diffraction crystal in this invention has a diffraction surface that includes multiple sagittal arcs. When the light source emits X-rays, the X-rays can be focused on the multiple sagittal arcs on the diffraction surface, generating multiple focal points simultaneously. The detection surface of the corresponding detector fully covers the focal points on each Rowland circle after the X-rays are diffracted by the diffraction surface, thus enabling the detection of X-rays with both high spectral resolution and a wide spectral range. Attached Figure Description

[0043] To make the objectives, technical solutions, and advantages of the invention clearer, the invention will now be described in further detail with reference to the accompanying drawings, wherein:

[0044] Figure 1 This is a schematic diagram of Rowland's circle principle.

[0045] Figure 2 This is a schematic diagram illustrating the diffraction principle of X-rays by a planar crystal in the prior art.

[0046] Figure 3 This is a schematic diagram illustrating the diffraction principle of Cy-I and Cy-II cylindrical crystals for X-rays in the prior art.

[0047] Figure 4 This is a schematic diagram illustrating the diffraction principle of X-rays by a Co-I type conical crystal in the prior art.

[0048] Figure 5 This is a schematic diagram illustrating the diffraction principle of X-rays by a Co-II type conical crystal in the prior art.

[0049] Figure 6 This is a schematic diagram illustrating the X-ray diffraction principle of spherical curved crystals in existing technologies.

[0050] Figure 7 This is a schematic diagram of the X-ray focusing detection system of the present invention.

[0051] Figure 8 This is a schematic diagram illustrating the principle of the fabrication method of the diffraction crystal and detector of the present invention.

[0052] Figure 9 This is a schematic diagram of the X-ray focusing detection system according to an embodiment of the present invention.

[0053] Explanation of reference numerals in the attached drawings: 100, diffraction crystal; 101, diffraction plane; 102, fixing part; 103, screw hole; 200, elastic element; 300, first screw; 400, positioning plate; 401, positioning hole; 402, positioning screw; 403, mounting hole; 500, detector; 600, light source; 601, X-ray; 700, meridional arc; 800, Rowland circle. Detailed Implementation

[0054] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.

[0055] It should be noted that similar reference numerals and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the figures, or the orientation or positional relationship commonly used when the product is in use. They are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance. In addition, the terms "horizontal," "vertical," etc., do not indicate that the component is required to be absolutely horizontal or suspended, but can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted. In the description of this invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0056] To better understand the inventive points of this invention, the research background of the technical solutions disclosed in this invention will be described in detail first.

[0057] For plasma X-ray radiation with wavelengths in the range of 0.1 to 2 nm, spectrometers that use various crystal materials with crystal plane spacing of sub-nanometer to several nanometers as spectroscopic elements are an important experimental means of acquiring spectral images.

[0058] For ease of understanding, the Rowland circle principle, commonly used in X-ray detection, is introduced here. Crystals that utilize the Rowland circle principle can focus X-rays during diffraction and achieve high spectral resolution at specific energy points. Therefore, in the same or similar technical fields of X-ray detection, how to fully apply the Rowland circle principle to crystal structures capable of X-ray diffraction has a significant research position and great research value.

[0059] X-rays that can be diffracted must satisfy the Bragg diffraction principle, as shown in equation (1):

[0060] 2d sinθ = nλ (1)

[0061] Where λ is the X-ray wavelength, d is the interplanar spacing, θ is the Bragg diffraction angle, and n is the diffraction order.

[0062] like Figure 1 As shown, the Rowland circle principle refers to the following: a reflective grating composed of a series of equally spaced parallel lines engraved on a concave spherical reflective mirror has the ability to disperse and concentrate light. It was discovered by physicist Henry A. Rowland in the early 1880s. If a slit light source and a concave grating are placed on a circle with a diameter equal to the radius of curvature of the concave grating, and this circle is tangent to the midpoint G of the grating, then the spectrum formed by the concave grating will be on this circle, which is called the Rowland circle.

[0063] A crystal can be viewed as a grating that can separate and focus X-rays. If the crystal is bent into an arc shape with a bending radius equal to the diameter of the Rowland circle, then the X-rays emitted from a point on the Rowland circle will still be focused on the point on the Rowland circle after being reflected by the bent crystal.

[0064] When detecting X-rays, the common method is to diffract the X-rays before detection. The following methods are commonly used in existing technologies:

[0065] (1) Direct diffraction of X-rays using a planar crystal

[0066] like Figure 2 As shown, Figure 2 This paper demonstrates the diffraction principle of X-rays by planar crystals. Planar crystals are widely used in X-ray spectroscopy analysis due to their simple structure and low fabrication difficulty, and are the simplest type of X-ray diffraction crystal. While planar crystals offer a simple structure and a wide spectral range, they lack X-ray focusing capabilities, resulting in low photon collection efficiency and weak spectral line intensity. Furthermore, the size of the light source significantly affects spectral resolution, and the diffraction of X-rays by planar crystals does not conform to the Rowland circle principle, making it difficult to improve spectral resolution and failing to meet the requirements for high spectral resolution measurements.

[0067] (2) X-ray diffraction is performed using cylindrical or conical crystals.

[0068] like Figures 3 to 5 As shown, the diffraction surface of a cylindrical or conical crystal is part of a smooth cylindrical or conical surface, and the diffraction principle of X-rays by cylindrical or conical crystals is Bragg diffraction.

[0069] Figures 3 to 5 The diagrams show the geometric structures and working principles of several cylindrical or pyramidal crystals. Figure 3The exhibits Cy-I and Cy-II cylindrical crystals, characterized by the light source located on the axis of the cylindrical crystal. The difference between Cy-I and Cy-II is the placement of the detector. In Cy-I, the detector plane is placed perpendicular to the axis, while in Cy-II, the detector plane is placed on the axis. Figure 4 and Figure 5 The images show Co-I and Co-II type conical crystals respectively. The Co-I type is characterized by the light source being located within the main cross section of the conical crystal, while the detector plane passes through the apex of the cone and is perpendicular to the generatrix. The Co-II type is characterized by both the light source and detector planes being placed on the axis of symmetry of the cone.

[0070] The characteristics of cylindrical or conical crystals in X-ray diffraction are as follows: X-ray diffraction and spectral dispersion occur in the generatrix direction of the cylindrical or conical crystal. When a beam of polychromatic X-rays passes through the crystal for diffraction, there is dispersion in space. By placing detectors at different positions, a spectral image can be obtained. The cylindrical or conical surface only plays a focusing role on the beam.

[0071] Since cylindrical or conical crystals can focus X-rays, they can improve the X-ray collection efficiency. However, because the focusing principle of cylindrical or conical crystals does not utilize the Rowland circle principle, the spectral resolution is relatively low. In addition, X-rays of different energies have inconsistent optical path lengths after diffraction by cylindrical or conical crystals, which can affect the detection results and cause inaccurate or erroneous judgments.

[0072] (3) X-ray diffraction using a spherical crystal

[0073] X-rays acting on a spherical crystal must also satisfy the Bragg diffraction principle shown in equation (1). Figure 6 As shown, the diffraction crystal used has a spherical surface. The spherical curved crystal X-ray spectroscopy detection system features a narrow spectral width (monochromaticity), high throughput, and high resolution, and is currently widely used in laser plasma physics diagnostic experiments. Due to these characteristics of spherical curved crystal focusing, the difficulty of spectral data processing is reduced, and the reliability of the data is improved.

[0074] A spherical curved crystal has an arc surface with the same radius of curvature, and the radius of curvature is R. The radius of the Rowland circle is R / 2. On the meridional plane, X-rays of different wavelengths emitted from a light source on the Rowland circle are focused at corresponding positions on the circle. When the detector is located at that position on the Rowland circle, a high-resolution spectrum can be obtained. When a spherical crystal diffracts X-rays that satisfy the Bragg condition, in addition to focusing the X-rays according to the Rowland circle principle, it must also satisfy specific structural requirements.

[0075] like Figure 6As shown, point A is the location of the light source, the dashed circle is the Rowland circle with a radius of R / 2, and the arc passing through point C is the curved surface of the crystal with a radius of R. The detection point B is required to be located on the Rowland circle, and the center of the crystal circle must be located on the line connecting AB, so as to ensure that the rays radiated from point A to the crystal surface can be focused at point B.

[0076] However, since theoretically only point C, which is tangent to the Rowland circle, conforms to the Rowland circle principle on a spherical crystal, the spectral range is narrow; moreover, the X-ray source must be placed far outside the Rowland circle, and the possible placement locations are relatively limited, thus restricting the application range.

[0077] In summary, while planar crystal X-rays have a wide spectral range, their collection efficiency is low; cylindrical or conical crystal structures can improve X-ray collection efficiency, but their spectral resolution is low; spherical crystals can improve X-ray collection efficiency, but only specific energy points (the point of tangency between the Rowland circle and the crystal circle) conform to the Rowland circle principle, thus resulting in a narrow spectral range and relatively limited placement of the X-ray source, thereby restricting its application scope.

[0078] If an X-ray spectral detection system could exist that simultaneously possesses high spectral resolution, high collection efficiency, and a wide spectral range, it would be of great theoretical and applied significance to existing X-ray spectral equipment.

[0079] Therefore, in order to overcome the aforementioned technical defects, it is necessary to invent an X-ray focusing detection system that can fundamentally solve the technical problems of low X-ray collection efficiency of traditional planar crystals, low X-ray spectral resolution of cylindrical or conical crystals, and narrow spectral measurement range of spherical crystals. This system should possess the characteristics of high spectral resolution, high collection efficiency, and wide spectral measurement range, thereby enabling the focusing and spectral measurement of X-rays at multiple energy points and reducing the limitations on the placement of the light source in the entire X-ray spectral detection system.

[0080] Based on the above technical background and the technical problems to be solved, this invention discloses a wide-spectrum-range and high-spectral-resolution X-ray focusing detection system. The wide-spectrum-range and high-spectral-resolution X-ray focusing detection system can perform diffraction focusing detection of X-rays and can be applied in the fields of nuclear radiation and X-ray spectral detection, including nuclear fission process spectral detection, laser inertial confinement fusion spectral detection, particle accelerator and synchrotron radiation spectral diagnosis, etc.

[0081] like Figure 7 As shown, the wide-spectrum and high-spectral-resolution X-ray focusing detection system is used to detect X-rays emitted from a light source after diffraction. It includes a diffraction crystal and a detector. The surface of the diffraction crystal has a diffraction surface, which can diffract all the X-rays emitted by the light source and radiated to the diffraction surface before they are detected by the detector.

[0082] Preferably, the diffraction surface includes multiple sagittal arcs, the line connecting the midpoints of the multiple sagittal arcs is a meridional arc with radius R, the multiple sagittal arcs are arranged sequentially according to the extension trajectory of the meridional arc to form the diffraction surface, the X-rays emitted by the light source are diffracted on the multiple sagittal arcs and can be focused on multiple sagittal focal points respectively, each sagittal focal point is located on a Rowland circle on a plane perpendicular to the corresponding sagittal arc surface, each Rowland circle has a diameter of R, and each Rowland circle is tangent to the meridional arc.

[0083] Specifically, the meridional arc is the arc that passes through the central axis of the diffraction surface.

[0084] Specifically, the radius of curvature R of the meridional arc of the diffraction surface ranges from 500 to 2000 mm.

[0085] Specifically, the radius of the arc is in the range of 100 to 400 mm.

[0086] Preferably, the detection surface of the detector covers at least the location of each sagittal focus.

[0087] Preferably, the detection surface of the detector is composed of the lines connecting the focal points of each arc.

[0088] Specifically, the light source is located within each Rowland circle, and the diffraction crystal is located between the light source and the detector.

[0089] Specifically, the wide-spectrum and high-spectral-resolution X-ray focusing detection system disclosed in this invention has a spectral measurement range of 1k to 20keV and a spectral resolution range greater than 2000. The spectral resolution is the ratio of the wavelength of the radiation spectrum detected by the detector to the minimum wavelength interval; generally, the larger this ratio, the higher the spectral resolution.

[0090] Specifically, the X-rays emitted by the light source that can be diffracted need to satisfy the Bragg diffraction principle, as shown in equation (1) above. The range of the Bragg diffraction angle θ is 5° to 85°.

[0091] The working principle of this invention is as follows: The wide-spectrum and high-resolution X-ray focusing detection system disclosed in this invention applies the Rowland circle principle, that is, the diameter of the Rowland circle is equal to the bending radius of the crystal. X-rays emitted from a point on the Rowland circle are still focused on the point on the Rowland circle after reflection. However, this invention is not limited to a single Rowland circle, but uses multiple Rowland circles to address the diffraction of X-rays on the meridional arc. Each Rowland circle is tangent to the meridional arc, and each Rowland circle has a corresponding sagittal plane, that is, the plane on which the sagittal arc lies.

[0092] When the light source emits X-rays, it can focus them separately on multiple sagittal arcs, generating multiple focal points. Each focal point is the sagittal focus of the X-rays diffracted on a single sagittal arc. The detection surface of the corresponding detector fully covers all focal points on each Rowland circle after the X-rays are diffracted by the diffraction surface, thus enabling the detection of X-rays with high spectral resolution, high collection efficiency, and wide spectral range.

[0093] The X-ray focusing detection system with wide spectral range and high spectral resolution disclosed in this invention has the following technical effects: The diffraction surface of the diffraction crystal in this invention includes multiple sagittal arcs. When the light source emits X-rays, they can be focused on multiple sagittal arcs on the diffraction surface, generating multiple focal points simultaneously. The detection surface of the corresponding detector fully covers all focal points on each Rowland circle after the X-rays are diffracted by the diffraction surface, thereby enabling the detection of X-rays with both high spectral resolution and wide spectral range.

[0094] This invention also discloses a method for fabricating a diffraction crystal and a detector, comprising the following steps:

[0095] S1. Construct a meridional arc with radius R, and place the simulated X-ray source S on one side of the tangent point between the meridional arc and the Rowland circle;

[0096] S2. Simulate an X-ray source emitting n X-rays and obtain n intersection points {A1, A2, A3...A...} with the meridian arc. n}; Connect the center O of the meridian arc with the obtained intersection points {A1, A2, A3...A... n}, resulting in n connecting lines

[0097] {AO1,AO2,AO3...AO n}; with n lines {AO1, AO2, AO3...AO n The midpoint of} is the center of the circle.

[0098] {O1,O2,O3...O n Draw n Rowland circles with diameter R;

[0099] S3. Insert n X-rays at intersection points {A1, A2, A3...A...} n The line connecting the points is mirrored along the mirror axis to obtain n X-ray diffraction lines; these n X-ray diffraction lines are extended and intersected with the corresponding n Rowland circles to obtain n intersection points {D1, D2, D3...D}. n};

[0100] S4. Connect the simulated X-ray source S to each intersection point {D1, D2, D3...D...}n Connect} to obtain n lines {SD1,SD2,SD3...SD} n}, and from n intersection points {A1,A2,A3...A n} Connect n lines {SD1,SD2,SD3...SD n Draw perpendicular lines to obtain n perpendicular points and n perpendicular lines {AC1, AC2, AC3...AC4}. n}; with each perpendicular point {C1,C2,C3...C n With} as the center, and the corresponding perpendicular lines {AC1, AC2, AC3...AC...} n Draw circles with the radius to obtain n sagittal circles perpendicular to the plane of the Rowland circle;

[0101] S5. Take the centers {C1, C2, C3...C...} obtained in step S4. n The n arcs between the meridian arc and the crystal are arranged to form a surface, which is used as the diffraction surface shape of the crystal; the intersection points {D1, D2, D3...D...} in step S4 are then... n Connect the points and use the resulting lines as the detection surface of the detector;

[0102] S6. Based on the diffraction surface shape of the crystal and the detector surface shape obtained in step S5, process the diffraction surface of the crystal and the detector surface shape of the detector, and then attach the X-ray photosensitive material to the detector surface shape to obtain a diffraction crystal with the specific diffraction surface in step S5 and a detector surface that matches the diffraction crystal.

[0103] Specifically, the simulated X-ray source S is arranged inside each Rowland circle.

[0104] In practical applications, the position of the light source S can be adjusted within each Rowland circle according to actual needs. After adjustment, the detector surface on the detector needs to be adjusted accordingly according to the steps described above.

[0105] Specifically, the larger the value of n, the higher the precision of the diffraction surface of the diffraction crystal, the smaller the restriction on the incident angle of X-rays, and the wider the spectral range of X-rays. According to experiments, when the value of n is less than 50, the detection accuracy of the focused spectrum will be affected. Therefore, the range of n values ​​used in the technical solution disclosed in this invention is n≥50, where n is a natural number.

[0106] As a preferred option, based on the processing precision of existing manufacturing machinery, if the value of n is too high, it will greatly increase the manufacturing difficulty of the crystal diffraction surface. Specifically, when the value of n is higher than 150, it will greatly increase the manufacturing difficulty of the crystal diffraction surface. Therefore, considering the high spectral resolution and wide spectral range that can be achieved, as well as the manufacturing cost, the preferred range of n value is 50 to 150.

[0107] Specifically, the crystal mentioned in step S6 is one of the crystal materials such as quartz, Ge, and Si.

[0108] Specifically, the X-ray photosensitive material mentioned in step S6 is a flexible and deformable X-ray film or X-ray imaging plate device.

[0109] like Figure 8 The diagram illustrates the principle of the fabrication method of the diffraction crystal and detector disclosed in this invention. The principle is as follows: when the light source 600 emits X-rays 601, it can focus them on n sagittal arcs, generating n focal points (sagittal focal points). Each focal point is the sagittal focal point of the X-rays 601 diffracted on a single sagittal arc. The detection surface of the detector 500 comprehensively covers the focal points of each Rowland circle 800 after the X-rays are diffracted by the diffraction surface 101, thereby enabling the detection of X-rays 601 with high spectral resolution, high collection efficiency, and wide spectral range.

[0110] To further illustrate the structure / method of the present invention, the following embodiments are disclosed.

[0111] Example

[0112] This embodiment discloses an X-ray focusing detection system with a wide frequency range and high spectral resolution, used to detect X-rays emitted from a light source after diffraction.

[0113] This embodiment can solve the technical problems of low X-ray collection efficiency of traditional planar crystals, low X-ray spectral resolution of cylindrical or conical crystals, low X-ray collection efficiency and spectral resolution of curved crystals, and narrow spectral measurement range of spherical crystals. It can simultaneously achieve high spectral resolution, high collection efficiency, and wide spectral measurement range, thereby realizing the focusing function of X-rays at multiple energy points and reducing the limitation on the placement of the light source in the entire X-ray spectral detection system.

[0114] First, such as Figure 8 As shown, based on the aforementioned technical problems that need to be solved, the fabrication is carried out according to the steps in the above-mentioned fabrication method for diffraction crystals and detectors, specifically:

[0115] S1. Construct a meridional arc with a radius of 1500mm, and place the simulated X-ray source S on one side of the tangent point between the meridional arc and the Rowland circle;

[0116] S2. Simulate an X-ray source emitting n X-rays and obtain n intersection points {A1, A2, A3...A...} with the meridian arc. n}; Connect the center O of the meridian arc with the obtained intersection points {A1, A2, A3...A... n}, resulting in n connecting lines

[0117] {AO1,AO2,AO3...AO n}; with n lines {AO1, AO2, AO3...AO n The midpoint of} is the center of the circle.

[0118] {O1,O2,O3...O n Draw n Rowland circles with diameter R; where n = 50;

[0119] S3. Insert n X-rays at intersection points {A1, A2, A3...A...} n The line connecting the points is mirrored along the mirror axis to obtain n X-ray diffraction lines; these n X-ray diffraction lines are extended and intersected with the corresponding n Rowland circles to obtain n intersection points {D1, D2, D3...D}. n}; where n = 50;

[0120] S4. Connect the simulated X-ray source S to each intersection point {D1, D2, D3...D...} n Connect} to obtain n lines {SD1,SD2,SD3...SD} n}, and from n intersection points {A1,A2,A3...A n} Connect n lines {SD1,SD2,SD3...SD n Draw perpendicular lines to obtain n perpendicular points and n perpendicular lines {AC1, AC2, AC3...AC4}. n}; with each perpendicular point {C1,C2,C3...C n With} as the center, and the corresponding perpendicular lines {AC1, AC2, AC3...AC...} n Draw a circle with radius} to obtain n sagittal circles perpendicular to the plane of the Rowland circle; where n = 50;

[0121] S5. Take the centers {C1, C2, C3...C...} obtained in step S4. n The n arcs between the meridian arc and the crystal are arranged to form a surface, which is used as the diffraction surface shape of the crystal; the intersection points {D1, D2, D3...D...} in step S4 are then... n Connect the points to form the detection surface of the detector; where n = 50.

[0122] S6. Based on the diffraction surface shape of the crystal and the detector surface shape of the detector obtained in step S5, the diffraction surface of the crystal and the detector surface shape of the detector are processed, and then the X-ray photosensitive material is pasted on the detector surface shape to obtain a diffraction crystal 100 with a specific diffraction surface 101 and a detector 500 with a specific detector surface in step S5 that cooperates with the diffraction crystal 100.

[0123] Specifically, the X-ray photosensitive material used in step S6 of this embodiment is a flexible and deformable X-ray film or X-ray imaging plate device.

[0124] The fabricated wide-spectrum and high-spectral-resolution X-ray focusing detection system, such as Figure 9 As shown, the device includes a diffraction crystal 100 and a detector 500. The surface of the diffraction crystal 100 has a diffraction surface 101. The diffraction surface 101 can diffract all X-rays 601 emitted by the light source 600 and radiated to the diffraction surface 101 before they are detected by the detector 500. The diffraction surface 101 includes n sagittal arcs, where n = 50. The line connecting the midpoints of the n sagittal arcs forms a meridional arc 700 with a radius of R. The n sagittal arcs are arranged sequentially according to the extension trajectory of the meridional arc 700 to form the diffraction surface 101. The X-rays 601 emitted by the light source 600 can be focused on n sagittal focal points after diffracting on the n sagittal arcs. Each sagittal focal point is located on a Rowland circle 800 on a plane perpendicular to the corresponding sagittal arc surface. Each Rowland circle 800 has a diameter of 1500 mm and is tangent to the meridional arc 700.

[0125] The diffraction crystal 100 also includes a fixing part 102. A positioning plate 400 is provided on the side of the fixing part 102 away from the diffraction surface 101. The positioning plate 400 is used to fix the diffraction crystal 100 in a preset position to prevent the diffraction crystal 100 from shifting during operation, which would prevent the X-ray 601 from diffracting normally.

[0126] Specifically, the fixing part 102 has a plurality of screw holes 103, which are evenly distributed on the fixing part 102; the positioning plate 400 corresponding to the plurality of screw holes 103 has a plurality of mounting holes 403, and the screw holes 103 are connected to the corresponding mounting holes 403; each mounting hole 403 has an elastic element 200 placed in it, and a first screw 300 is installed in the screw hole 103. The first screw 300 causes the elastic element 200 to undergo elastic deformation by screwing into the screw hole 103. The depth to which the first screw 300 is screwed into the screw hole 103 adjusts the relative parallelism between the diffraction crystal 100 and the positioning plate 400, that is, it can adjust the orientation of the diffraction surface 101 so that the X-rays 601 emitted by the light source 600 can be smoothly diffracted onto the detector 500.

[0127] At the same time, the elastic element 200 that undergoes elastic deformation can generate a reverse pushing force on the first screw 300, so that the diffraction crystal 100 can be firmly fixed on the positioning plate 400 and is not prone to positional displacement.

[0128] In one specific embodiment of the elastic element 200, the elastic element 200 is a spring, and the spring is made of one of iron, plastic or stainless steel, with stainless steel being the preferred material.

[0129] Specifically, the positioning plate 400 is provided with a positioning hole 401. The inner wall of the positioning hole 401 has an internal thread, which is used to fix the positioning plate 400 in a preset position so that the positioning plate 400 does not shift in position. Specifically, by installing the positioning screw 402 into the positioning hole 401, the positioning plate 400 is fixedly installed in the preset position.

[0130] The working principle of this embodiment is as follows: Based on the Loland circle principle, when the light source emits X-rays, they can be focused separately on multiple sagittal arcs, generating multiple focal points. Each focal point is the sagittal focus of the X-rays diffracted on a single sagittal arc. The detection surface of the corresponding detector fully covers each focal point on each Loland circle after the X-rays are diffracted by the diffraction surface, thereby enabling the detection of X-rays with high spectral resolution, high collection efficiency, and wide spectral range.

[0131] The X-ray focusing detection system with wide spectral range and high spectral resolution disclosed in the embodiments of the present invention has the following technical effects: The diffraction surface of the diffraction crystal in the present invention includes multiple sagittal arcs. When the light source emits X-rays, it can focus on the multiple sagittal arcs on the diffraction surface, and can generate multiple focal points at the same time. The detection surface of the corresponding detector fully covers the focal points of each Rowland circle after the X-rays are diffracted by the diffraction surface, thereby enabling the detection of X-rays with both high spectral resolution and wide spectral range.

[0132] It is understood that the present invention has been described through some embodiments, and those skilled in the art will recognize that various changes or equivalent substitutions can be made to these features and embodiments without departing from the spirit and scope of the invention. Under the teachings of the present invention, modifications can be made to these features and embodiments to adapt to specific situations and materials without departing from the spirit and scope of the invention. The embodiments described in this invention are only a part of the embodiments of the invention, not all of them. The components of the embodiments of the invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. Therefore, the invention is not limited to the specific embodiments disclosed herein, and all other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the present invention.

Claims

1. A wide-spectral-range and high-spectral-resolution X-ray focusing detection system, characterized in that, It is used to detect X-rays emitted from a light source after diffraction, including a diffraction crystal and a detector. The surface of the diffraction crystal has a diffraction surface, which can diffract all the X-rays emitted by the light source and radiated to the diffraction surface before they are detected by the detector. The diffraction surface includes multiple sagittal arcs. The line connecting the midpoints of the multiple sagittal arcs forms a meridional arc with radius R. The multiple sagittal arcs are arranged sequentially according to the extension trajectory of the meridional arc to form the diffraction surface. The X-rays emitted by the light source are diffracted on the multiple sagittal arcs and can be focused on multiple sagittal focal points. Each sagittal focal point is located on a Rowland circle on a plane perpendicular to the corresponding sagittal arc surface. Each Rowland circle has a diameter of R and is tangent to the meridional arc.

2. The wide-spectral-range and high-spectral-resolution X-ray focusing detection system according to claim 1, characterized in that, The detection surface of the detector covers at least the location of each sagittal focus.

3. The wide-spectrum-range and high-spectral-resolution X-ray focusing detection system according to claim 1, characterized in that, The detection surface of the detector is composed of the lines connecting the focal points of each arc.

4. A method for fabricating a diffraction crystal and a detector, used to fabricate an X-ray focusing detection system with a wide spectral range and high spectral resolution as described in claim 3, characterized in that, Includes the following steps: S1. Construct a meridional arc with radius R, and place the simulated X-ray source S on one side of the tangent point between the meridional arc and the Rowland circle; S2. Simulate an X-ray source emitting n X-rays and obtain n intersection points {A1, A2, A3...A...} with the meridian arc. n }; Connect the center O of the meridian arc with the obtained intersection points {A1, A2, A3...A... n }, resulting in n connecting lines {AO1, AO2, AO3...AO n }; with n lines {AO1, AO2, AO3...AO n The midpoint of the circle {O1, O2, O3...O} is the center. n Draw n Rowland circles with diameter R; S3. Insert n X-rays at intersection points {A1, A2, A3...A...} n The line connecting the points is mirrored along the mirror axis to obtain n X-ray diffraction lines; these n X-ray diffraction lines are extended and intersected with the corresponding n Rowland circles to obtain n intersection points {D1, D2, D3...D}. n }; S4. Connect the simulated X-ray source S to each intersection point {D1, D2, D3...D...} n Connect} to obtain n lines {SD1,SD2,SD3...SD} n }, and from n intersection points {A1,A2,A3...A n Connect n lines {SD1,SD2,SD3...SD... n Draw perpendicular lines to obtain n perpendicular points and n perpendicular lines {AC1, AC2, AC3...AC...} n }; with each perpendicular point {C1,C2,C3...C n Using} as the center, and the corresponding perpendicular lines {AC1, AC2, AC3...AC...} n Draw circles with the radius to obtain n sagittal circles perpendicular to the plane of the Rowland circle; S5. Take the centers {C1, C2, C3...C...} obtained in step S4. n The n arcs between the meridian arc and the crystal are arranged to form a surface, which is used as the diffraction surface shape of the crystal; the intersection points {D1,D2,D3...D...} in step S4 are then... n Connect the points and use the resulting lines as the detection surface of the detector; S6. Based on the diffraction surface shape of the crystal and the detector surface shape obtained in step S5, process the diffraction surface of the crystal and the detector surface shape of the detector, and then attach the X-ray photosensitive material to the detector surface shape to obtain a diffraction crystal with the specific diffraction surface in step S5 and a detector surface that matches the diffraction crystal.

5. The method for fabricating the diffraction crystal and detector according to claim 4, characterized in that, The simulated X-ray source S mentioned in step S1 is arranged inside each Rowland circle.

6. The method for fabricating the diffraction crystal and detector according to claim 4, characterized in that, The value of n is in the range of n≥50, where n is a natural number.

7. The method for fabricating the diffraction crystal and detector according to claim 4, characterized in that, The value of n ranges from 50 to 150, where n is a natural number.

8. The method for fabricating the diffraction crystal and detector according to claim 4, characterized in that, The crystal mentioned in step S6 is one of the following crystal materials: quartz, Ge, or Si.

9. The method for fabricating the diffraction crystal and detector according to claim 8, characterized in that, The X-ray photosensitive material mentioned in step S6 is a flexible X-ray film or X-ray imaging plate device.

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