与小麦籽粒硬度紧密连锁的分子标记及其应用

By detecting molecular markers closely linked to grain hardness index during the wheat seedling stage, the problem of labor and material resources being consumed in grain hardness screening has been solved, enabling seedling screening and efficient breeding.

CN116397043BActive Publication Date: 2026-07-17JIANGSU ACAD OF AGRI SCI
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
JIANGSU ACAD OF AGRI SCI
Filing Date
2023-02-28
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing methods for screening wheat grain hardness require crushing mature grains, which consumes a lot of manpower and resources, and can only be carried out at specific growth stages, affecting breeding efficiency.

Method used

A molecular marker closely linked to the wheat grain hardness index was developed. PCR amplification technology was used to detect wheat plant DNA, and the grain hardness index was determined by detecting a 331bp DNA fragment, enabling seedling screening.

Benefits of technology

Grain hardness can be predicted during the seedling stage, reducing waste of manpower and resources, improving breeding efficiency, and simplifying the screening process.

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Abstract

本发明公开一种与小麦籽粒硬度QTL紧密连锁的分子标记KH5D‑331及其应用，该分子标记是以小麦DNA为模板，以核苷酸序列如SEQ ID No.1和SEQ ID No.2所示的引物对进行PCR扩增，再以1.5％琼脂糖凝胶电泳分离后获得的大小为331bp DNA片段；通过检测该分子标记KH5D‑331的有无可预测小麦籽粒硬度，进而在籽粒成熟前筛选小麦植株，可提高育种过程中对小麦籽粒硬度的选择效率。
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