Optoelectronic differential automatic trigger probe

By using a photoelectric differential automatic triggering probe, combined with a sliding mechanism and a photoelectric triggering module, the problems of high processing difficulty, high cost, or low accuracy of existing probes are solved. This enables the generation of high-precision, low-cost trigger signals, which are suitable for high-end geometric measurement instruments such as length and height measurement.

CN116558426BActive Publication Date: 2026-05-22BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
Filing Date
2023-03-27
Publication Date
2026-05-22

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Abstract

The application discloses a photoelectric differential automatic trigger probe and belongs to the field of geometric parameter measurement. The application comprises a first sliding mechanism, a second sliding mechanism, a force balance unit, a photoelectric trigger module and a probe unit. The first sliding mechanism is composed of a first sliding table and four groups of cross-circulating bearing assemblies; the second sliding mechanism is composed of a second sliding table and three V-shaped bearing assemblies; and the force balance unit is composed of an elastic force adjusting piece, a spring and a sliding mechanism fastening assembly. The first sliding table mechanism and the second sliding table mechanism drive the probe to relatively move relative to a reference surface. Since the probe is subjected to a contact force, the force balance unit is in a non-balanced state, the sliding mechanism is relatively displaced, and when the photoelectric trigger module is offset by a set threshold value, a trigger signal is generated, and the high-precision latching of the one-dimensional height value of the measured workpiece is completed. The application can provide a high-precision and high-repetitive aiming signal for geometric parameter measurement equipment.
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Description

Technical Field

[0001] This invention belongs to the field of geometric parameter measurement, specifically relating to a photoelectric differential automatic trigger probe. Background Technology

[0002] In my country's equipment manufacturing industry, especially in the high-end equipment manufacturing sector, the requirements for machining precision of parts are becoming increasingly stringent, which also places higher demands on the measurement of geometric parameters of machined parts. As a general-purpose instrument for measuring geometric parameters, the height gauge is mainly used to measure the one-dimensional dimensions of workpieces, solving the problem of high-precision measurement in the height direction of components. The high-precision trigger probe, as a key component of the height gauge, directly determines the technical specifications of the instrument due to its high repeatability. The core function of the trigger probe is to generate a high-precision trigger aiming signal when the probe tip contacts the workpiece being measured, thereby enabling the height gauge to latch the current height value and obtain the one-dimensional dimension of the workpiece in the height direction.

[0003] Currently, there are two main types of mature trigger probe implementation solutions for length and height measuring instruments or devices on the market:

[0004] 1) This method uses a lever probe combined with manual aiming by the human eye. This type of application is mainly for low-end geometric measuring instruments such as length and height measuring devices, most typically verticality checkers and low-end height measuring instruments. The human eye monitors the changes in contact displacement in real time to determine whether the contact threshold force has been reached, thus achieving the measurement.

[0005] 2) Employing a force (sensor)-triggered probe with high-precision automatic triggering. This type is used in high-end geometric measurement instruments such as length and height measuring machines, most typically in high-precision coordinate measuring machines. The design of this type of trigger probe is mainly based on a high-precision force sensor, and this method requires high sensitivity and trigger repeatability of the force sensor.

[0006] Force (sensor) triggered probes offer advantages over lever probes in terms of high accuracy and repeatability, but their design is more complex, particularly in manufacturing, leading to higher procurement costs. This makes them suitable only for coordinate measuring machines (CMMs) in laboratory settings. Furthermore, the market for force (sensor) triggered probes is almost entirely monopolized by a few British and Swiss companies, making it extremely difficult for domestic manufacturers of length and height measuring instruments to conduct secondary development, thus hindering widespread application. While lever-type mechanical probes offer high technological maturity and low cost, their biggest problems lie in trigger repeatability and trigger modes, which fail to meet the requirements of high-precision length and height measuring instruments.

[0007] Therefore, given the high manufacturing difficulty, high procurement cost, and low measurement accuracy of force (sensor) trigger probes, it is necessary to develop an automatic trigger probe with simple structure, low cost, and high trigger repeatability.

[0008] Patent content

[0009] To overcome the shortcomings of the prior art, the main objective of this invention is to provide a photoelectric differential automatic trigger probe that can provide high-precision trigger aiming signals for geometric parameter measurement equipment such as length and height measurement. This invention has the advantages of simple structure, low cost, and high trigger repeatability.

[0010] To achieve the above objectives, the technical solution of the present invention is implemented in the following manner.

[0011] This invention discloses a photoelectric differential automatic triggering probe, comprising a primary sliding mechanism, a secondary sliding mechanism, a force balancing unit, a photoelectric triggering module, and a probe unit. The primary sliding mechanism consists of a primary sliding platform and four sets of cross-circulating bearing assemblies fixed to the primary sliding platform. The secondary sliding mechanism consists of a secondary sliding platform and three V-shaped bearing assemblies fixed to the secondary sliding platform. The force balancing unit consists of a spring adjustment component, a spring, and a sliding mechanism fastening assembly. One end of the spring is fixed to the primary sliding platform, and the other end is fixed to the secondary sliding platform. The elastic adjustment component is fixedly installed on the connecting secondary sliding platform to achieve dynamic balance adjustment; the sliding mechanism fastening assembly consists of a locking rod and a limiting plate; one end of the limiting plate is fixed on the primary sliding platform and the other end is fixed on the secondary sliding platform, and the locking rod passes through the upper slot of the limiting plate and is fixed on the secondary sliding platform; the photoelectric trigger module consists of a grating sensor unit and a grating reading head unit; the grating sensor unit and the grating reading head are fixedly connected to the primary sliding platform and / or the secondary sliding platform respectively; the probe unit consists of a probe mounting base, a probe holder, a probe holder locking knob, a probe, and a probe locking knob; the probe mounting base is fixedly installed on the primary sliding platform; the probe holder is fixed on the probe mounting base and locked by the probe holder locking knob; the probe is fixedly installed on the probe holder and fixed by the probe locking knob.

[0012] Preferably, the primary sliding mechanism consists of a primary sliding table and four sets of cross-circulating bearing assemblies, with the four sets of cross-circulating bearings fixed at the four corners of the primary sliding table.

[0013] Preferably, the primary sliding stage is supported on the sliding guide rail by four sets of cross-circulating bearings and moves in the vertical direction of the guide rail.

[0014] Preferably, the secondary sliding mechanism consists of a secondary sliding table and three V-shaped bearing assemblies.

[0015] Preferably, the secondary slide is supported on the sliding guide rail by three V-bearings.

[0016] Preferably, the secondary sliding mechanism is elastically connected to the primary sliding mechanism through a force-balancing adjustment device.

[0017] Preferably, the force balancing unit consists of an elastic adjustment component, a spring, and a sliding mechanism fastening assembly, with its upper end connected to the secondary sliding mechanism and its lower end fixed to the primary sliding mechanism.

[0018] Preferably, the elastic adjustment component is used to adjust the tension of the spring; one end of the spring is fixed to the first-stage sliding platform and the other end is fixed to the second-stage sliding platform, which can be used to provide an upward pulling force to the first-stage sliding mechanism, thereby ensuring that the first-stage sliding mechanism and the second-stage sliding mechanism are in a static equilibrium state.

[0019] Preferably, the sliding mechanism fastening assembly consists of a locking rod and a limiting plate. The locking rod can press the limiting plate to achieve locking between the primary sliding mechanism and the secondary sliding mechanism.

[0020] Preferably, the locking rod passes through the upper slot of the limiting plate and connects to the secondary sliding table, while the lower end of the limiting plate is fixed on the primary sliding table.

[0021] Preferably, the photoelectric triggering module consists of a grating sensor unit and a grating reading head unit, which are fixed on the primary slide and the secondary slide, respectively.

[0022] Preferably, the probe unit consists of a probe mounting base, a probe holder, a probe holder locking knob, a probe, and a probe locking knob.

[0023] Preferably, the probe mounting base is fixed to the primary slide by screws.

[0024] Preferably, the probe holder can be fixed to the probe mounting base by a probe holder locking knob, and the probe can be fixed in the probe holder by a probe locking knob.

[0025] Beneficial effects:

[0026] 1. The present invention discloses an optoelectronic differential automatic trigger probe, which serves as a triggering device for geometric parameter measuring equipment for length and height measurement. It can realize the automatic generation of probe trigger signals and provide high-precision, high-repeatability aiming signals for geometric parameter measuring equipment for length and height measurement.

[0027] 2. The photoelectric differential automatic triggering probe disclosed in this invention uses a grating sensor unit and a grating reading head unit as the core units of the photoelectric triggering module, and cooperates with a first-level sliding mechanism, a second-level sliding mechanism, and a force balancing unit to achieve high-precision detection and triggering of the trigger threshold force. Compared with the lever probe, it has the advantages of high triggering accuracy and good triggering repeatability.

[0028] 3. The photoelectric differential automatic triggering probe disclosed in this invention has the advantages of simple triggering method, low processing difficulty, and high technical maturity compared with force (sensor) triggering probes due to its differential mechanical structure design. At the same time, the research and development and production costs are low, making it very suitable as a supporting product for mass-produced instruments. Attached Figure Description

[0029] Figure 1 This is a front view of a photoelectric differential automatic trigger probe disclosed in this invention.

[0030] Among them: 1-first stage slide, 2-second stage slide, 3-elastic adjustment component, 4-spring, 5-locking rod, 6-limiting piece, 7-photoelectric trigger module, 8-probe mounting base, 9-probe base, 10-probe base locking knob, 11-probe, 12-probe locking knob. Detailed Implementation

[0031] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. Furthermore, descriptions of well-known structures and technologies are omitted in the following description to avoid unnecessarily obscuring the concept of this invention.

[0032] like Figure 1 As shown in this embodiment, a photoelectric differential automatic triggering probe includes a primary sliding mechanism, a secondary sliding mechanism, a force balancing unit, a photoelectric triggering module, and a probe unit. The primary sliding mechanism consists of a primary sliding platform 1 and four sets of cross-circulating bearing assemblies. The secondary sliding mechanism consists of a secondary sliding platform 2 and three V-shaped bearing assemblies. The force balancing unit consists of a spring adjustment component 3, a spring 4, and a sliding mechanism fastening assembly. The photoelectric triggering module 7 consists of a grating sensor unit and a grating reading head unit. The probe unit consists of a probe mounting base 8, a probe base 9, a probe base locking knob 10, a probe 11, and a probe locking knob 12. The sliding mechanism fastening assembly consists of a locking rod 5 and a limiting piece 6.

[0033] The primary sliding mechanism consists of a primary sliding table 1 and four sets of cross-circulating bearing assemblies, with the four sets of cross-circulating bearings fixed at the four corners of the primary sliding table 1.

[0034] The primary sliding stage 1 is supported on the sliding guide rail by four sets of cross-circulating bearings and moves in the vertical direction of the guide rail.

[0035] The secondary sliding mechanism consists of a secondary sliding table 2 and three V-shaped bearing assemblies.

[0036] The secondary slide 2 is supported on the sliding guide rail by three V-type bearings.

[0037] The secondary sliding mechanism is elastically connected to the primary sliding mechanism through a force-balancing adjustment device.

[0038] The force balancing unit consists of an elastic adjustment component 3, a spring 4, and a sliding mechanism fastening assembly. Its upper end is connected to the secondary sliding mechanism, and its lower end is fixed to the primary sliding mechanism.

[0039] The elastic adjustment component 3 is used to adjust the tension of the spring 4; one end of the spring 4 is fixed on the first-stage sliding table 1 and the other end is fixed on the second-stage sliding table 2, which can be used to provide an upward pulling force for the first-stage sliding mechanism, thereby ensuring that the first-stage sliding mechanism and the second-stage sliding mechanism are in a static equilibrium state.

[0040] The sliding mechanism fastening assembly consists of a locking rod 5 and a limiting piece 6. The locking rod 5 can press the limiting piece 6, thereby locking the first-level sliding mechanism and the second-level sliding mechanism.

[0041] The locking rod 5 passes through the upper slot of the limiting piece 6 and is connected to the secondary sliding table 2. The lower end of the limiting piece 6 is fixed on the primary sliding table 1.

[0042] The photoelectric triggering module 7 consists of a grating sensor unit and a grating reading head unit, which are fixed on the primary slide 1 and the secondary slide 2, respectively.

[0043] The probe unit consists of a probe mounting base 8, a probe base 9, a probe base locking knob 10, a probe 11, and a probe locking knob 12.

[0044] The probe mounting base 8 is fixed to the primary slide 1 by screws.

[0045] The probe holder 9 can be fixed to the probe mounting base 8 by the probe holder locking knob 10, and the probe 11 can be fixed in the probe holder 9 by the probe locking knob 12.

[0046] The working method of the photoelectric differential automatic trigger probe disclosed in this embodiment is as follows:

[0047] The upper end of the probe 11 is a spherical measuring contact. When the measuring contact of the probe 11 is not in contact with the surface of the workpiece being measured, the force balancing unit is in a static "balanced" state. During the measurement process, the probe can move relative to the reference surface by sliding the primary slide 1 and the secondary slide 2 on the guide rail. When the measuring contact of the probe 11 contacts the surface of the workpiece being measured, the force balancing unit is in a non-"balanced" state due to the contact force. Thus, the spring of the force balancing unit causes the primary slide 1 and the secondary slide 2 to change relative displacement. When the offset of the photoelectric trigger module 7 reaches the set threshold, a trigger signal (command) is generated, thereby completing the high-precision latching of the one-dimensional height value of the workpiece being measured. After the measurement is completed, the probe is moved so that the measuring contact of the probe 11 is in a non-contact state. Due to the action of the spring 4 in the force balancing unit, an internal elastic force is generated acting on the first-stage slide 1 and the second-stage slide 2, causing the first-stage slide 1 and the second-stage slide 2 to complete the "differential" rebound motion, thereby restoring the force balancing unit to the "balanced" state before the measurement, and completing the entire working process of the photoelectric differential automatic trigger probe.

[0048] The above detailed description further illustrates the purpose, technical solution, and beneficial effects of the invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A photoelectric differential automatic trigger probe, characterized in that: It mainly includes a primary sliding mechanism, a secondary sliding mechanism, a force balancing unit, a photoelectric triggering module, and a probe unit; the primary sliding mechanism consists of a primary sliding table (1) and four sets of cross-circulating bearing assemblies fixed on the primary sliding table (1); the secondary sliding mechanism consists of a secondary sliding table (2) and three V-shaped bearing assemblies fixed on the secondary sliding table (2); the force balancing unit consists of an elastic adjustment component (3), a spring (4), and a sliding mechanism fastening assembly; one end of the spring is fixed on the primary sliding table (1), and the other end is fixed on the secondary sliding table (2); the elastic adjustment component (3) is fixedly installed on the secondary sliding table (2) to achieve dynamic balance adjustment; the sliding mechanism fastening assembly consists of a locking rod (5) and a limiting piece (6); one end of the limiting piece (6) is fixed on the primary sliding table (1), and the other end is fixed on the secondary sliding table (2). One end is fixed to the secondary sliding stage (2), and the locking rod (5) passes through the upper slot of the limiting piece (6) and is fixed on the secondary sliding stage (2); the photoelectric trigger module (7) is composed of a grating sensor unit and a grating reading head unit; the grating sensor unit and the grating reading head unit are respectively fixedly connected to the primary sliding stage (1) and / or the secondary sliding stage (2); the probe unit is composed of a probe mounting base (8), a probe seat (9), a probe seat locking knob (10), a probe (11), and a probe locking knob (12); the probe mounting base (8) is fixedly installed on the primary sliding stage (1); the probe seat (9) is fixed on the probe mounting base (8), and the probe seat (9) is locked by the probe seat locking knob (10); the probe (11) is fixedly installed on the probe seat (9), and is fixed by the probe locking knob (12); The primary sliding mechanism consists of a primary sliding table (1) and four sets of cross-circulating bearing assemblies, with the four sets of cross-circulating bearings fixed at the four corners of the primary sliding table (1). The secondary sliding mechanism consists of a secondary sliding table (2) and three V-type bearing assemblies; The secondary sliding stage (2) is supported on the sliding guide rail by three V-type bearings; The secondary sliding mechanism is elastically connected to the primary sliding mechanism through a force-measuring and balancing adjustment device; The force balancing unit consists of an elastic adjustment component (3), a spring (4), and a sliding mechanism fastening assembly. Its upper end is connected to the secondary sliding mechanism, and its lower end is fixed to the primary sliding mechanism.

2. The photoelectric differential automatic trigger probe as described in claim 1, characterized in that: The primary sliding stage (1) is supported on the sliding guide rail by four sets of cross-circulating bearings and moves in the vertical direction of the guide rail.

3. The photoelectric differential automatic trigger probe as described in claim 1, characterized in that: The elastic adjustment component (3) is used to adjust the tension of the spring (4); one end of the spring (4) is fixed on the first-stage sliding table (1), and the other end is fixed on the second-stage sliding table (2), which is used to provide the upward tension of the first-stage sliding mechanism, thereby ensuring that the first-stage sliding mechanism and the second-stage sliding mechanism are in a static equilibrium state.

4. The photoelectric differential automatic trigger probe as described in claim 1, characterized in that: The sliding mechanism fastening assembly consists of a locking rod (5) and a limiting piece (6). The locking rod (5) presses the limiting piece (6) to lock the first-level sliding mechanism and the second-level sliding mechanism. The locking rod (5) passes through the upper slot of the limiting piece (6) and is connected to the secondary sliding table (2). The lower end of the limiting piece (6) is fixed on the primary sliding table (1).

5. The photoelectric differential automatic trigger probe as described in claim 1, characterized in that: The photoelectric trigger module (7) consists of a grating sensor unit and a grating reading head unit, which are fixed on the first-stage sliding stage (1) and the second-stage sliding stage (2), respectively.

6. The photoelectric differential automatic trigger probe as described in claim 1, characterized in that: The probe unit consists of a probe mounting base (8), a probe base (9), a probe base locking knob (10), a probe (11), and a probe locking knob (12).

7. The photoelectric differential automatic trigger probe as described in claim 1, characterized in that: The probe mounting base (8) is fixed to the primary sliding stage (1) by screws.

8. The photoelectric differential automatic trigger probe as described in claim 1, characterized in that: The probe holder (9) is fixed to the probe mounting base (8) by the probe holder locking knob (10), and the probe (11) is fixed in the probe holder (9) by the probe locking knob (12).