Method, device and storage medium for determining camera assembly tolerance

Abstract

The present disclosure relates to a method, device and storage medium for determining camera assembly tolerance. The method for determining camera assembly tolerance comprises: performing first calibration on a binocular camera based on a target to obtain a first rotation vector, a first offset vector, a second rotation vector and a second offset vector; performing second calibration on the binocular camera based on the target to obtain a third rotation vector, a third offset vector, a fourth rotation vector and a fourth offset vector; and determining a first assembly tolerance of a first camera and a second assembly tolerance of a second camera based on the first rotation vector, the first offset vector, the second rotation vector, the second offset vector, the third rotation vector, the third offset vector, the fourth rotation vector and the fourth offset vector. Through the present disclosure, the assembly tolerance of each camera in the binocular camera is determined, and the determination of the binocular camera assembly tolerance is realized.

Description

Technical Field

[0001] This disclosure relates to the field of terminal technology, and in particular to a method, apparatus and storage medium for determining camera assembly tolerances. Background Technology

[0002] In related technologies, on the production line of terminal manufacturing, in order to ensure that the camera performance is fully utilized, an indispensable step is to calibrate the camera (also known as factory calibration). During factory calibration, calibration parameters need to be calibrated based on a calibration station, and the calibration results are verified by a calibration verification station.

[0003] When calibrating a camera, it is necessary to calibrate the camera assembly tolerances. Currently, camera assembly tolerances are mainly calibrated for the assembly tolerances of a single camera, and there is no way to determine the tolerances for multiple cameras (such as dual cameras). Summary of the Invention

[0004] To overcome the problems existing in related technologies, this disclosure provides a method, apparatus and storage medium for determining camera assembly tolerances.

[0005] According to a first aspect of the present disclosure, a method for determining camera assembly tolerances is provided, comprising:

[0006] A first calibration is performed on the binocular cameras, including a first camera and a second camera, based on a target. This yields a first calibration extrinsic parameter of the first camera relative to the target and a second calibration extrinsic parameter of the second camera relative to the target. The first calibration extrinsic parameter includes a first rotation vector and a first offset vector, and the second calibration extrinsic parameter includes a second rotation vector and a second offset vector. A second calibration is performed on the binocular cameras based on the target. This yields a third calibration extrinsic parameter of the first camera relative to the target and a fourth calibration extrinsic parameter of the second camera relative to the target. The third calibration extrinsic parameter includes a third rotation vector and a third offset vector, and the fourth calibration extrinsic parameter includes a fourth rotation vector and a fourth offset vector. Based on the first, second, third, and fourth calibration extrinsic parameters, a first assembly tolerance of the first camera and a second assembly tolerance of the second camera are determined. The first assembly tolerance includes a first assembly rotation vector and a first assembly offset vector of the first camera relative to its actual assembly position relative to its ideal assembly position, and the second assembly tolerance includes a second assembly rotation vector and a second assembly offset vector of the second camera relative to its actual assembly position relative to its ideal assembly position.

[0007] In one embodiment, the second calibration of the binocular camera based on the target includes:

[0008] The first and second cameras in the binocular camera system are symmetrically swapped at their midpoints. The position of the first camera relative to the target after the midpoint swap is the same as the position of the second camera relative to the target before the swap, and the position of the second camera relative to the target after the midpoint swap is the same as the position of the first camera relative to the target before the swap. A second calibration is performed on the first and second cameras after the midpoint swap based on the target.

[0009] In one embodiment, determining a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, and the fourth calibration extrinsic parameter includes:

[0010] A first ideal extrinsic parameter of the first camera mounting position relative to the target and a second ideal extrinsic parameter of the second camera mounting position relative to the target are determined. The first ideal extrinsic parameter includes a first ideal rotation vector and a first ideal offset vector, and the second ideal extrinsic parameter includes a second ideal rotation vector and a second ideal offset vector. Based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter, a first assembly tolerance of the first camera and a second assembly tolerance of the second camera are determined.

[0011] In one embodiment, determining a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter includes:

[0012] Determine the correlation between the target vector, the target ideal vector, and the target assembly vector; based on the correlation, determine the first assembly tolerance of the first camera and the second assembly tolerance of the second camera;

[0013] The target vector, the target ideal vector, and the target assembly vector include the following combinations:

[0014] The target vector is a first rotation vector, the target ideal vector is a first ideal rotation vector, and the target assembly vector is a first assembly rotation vector;

[0015] The target vector is a first offset vector, the target ideal vector is a first ideal offset vector, and the target assembly vector is a first assembly offset vector;

[0016] The target vector is a second rotation vector, the target ideal vector is a second ideal rotation vector, and the target assembly vector is a second assembly rotation vector;

[0017] The target vector is the second offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the second assembly offset vector;

[0018] The target vector is the third rotation vector, the target ideal vector is the second ideal rotation vector, and the target assembly vector is the first assembly rotation vector;

[0019] The target vector is the third offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the first assembly offset vector;

[0020] The target vector is the fourth rotation vector, the target ideal vector is the first ideal rotation vector, and the target assembly vector is the second assembly rotation vector;

[0021] The target vector is the fourth offset vector, the target ideal vector is the first ideal offset vector, and the target assembly vector is the second assembly offset vector.

[0022] In one embodiment, the relationship between the target vector, the target ideal vector, and the target assembly vector satisfies the following: the target vector is the sum of the target ideal vector and the target assembly vector.

[0023] In one implementation, determining the correlation between the target vector, the target ideal vector, and the target assembly vector includes:

[0024] Determine the target vector operation error between the second calibration and the first calibration, and determine the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error; based on the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error, determine the correlation between the target vector, the target ideal vector, and the target assembly vector.

[0025] In one embodiment, determining the target vector operation error between the second calibration and the first calibration includes:

[0026] During the first calibration process, determine the first camera rotation vector and the first camera offset vector relative to the second camera. During the second calibration process, determine the second camera rotation vector and the second camera offset vector relative to the first camera. The difference between the second camera rotation vector and the first camera rotation vector is determined as the rotation vector operation error, and the difference between the second camera offset vector and the first camera offset vector is determined as the offset vector operation error.

[0027] According to a second aspect of the present disclosure, an apparatus for determining camera assembly tolerances is provided, comprising:

[0028] A calibration unit is configured to perform a first calibration on a binocular camera including a first camera and a second camera based on a target, to obtain a first calibration extrinsic parameter of the first camera relative to the target and a second calibration extrinsic parameter of the second camera relative to the target. The first calibration extrinsic parameter includes a first rotation vector and a first offset vector, and the second calibration extrinsic parameter includes a second rotation vector and a second offset vector. The unit is also configured to perform a second calibration on the binocular camera based on the target, to obtain a third calibration extrinsic parameter of the first camera relative to the target and a fourth calibration extrinsic parameter of the second camera relative to the target. The third calibration extrinsic parameter includes a third rotation vector and a third offset vector, and the fourth calibration extrinsic parameter includes a fourth rotation vector and a fourth offset vector.

[0029] The processing unit is configured to determine a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, and the fourth calibration extrinsic parameter. The first assembly tolerance includes a first assembly rotation vector and a first assembly offset vector of the actual assembly position of the first camera relative to the ideal assembly position. The second assembly tolerance includes a second assembly rotation vector and a second assembly offset vector of the actual assembly position of the second camera relative to the ideal assembly position.

[0030] In one embodiment, the calibration unit performs a second calibration of the binocular camera based on the target in the following manner:

[0031] The first and second cameras in the binocular camera system are symmetrically swapped at their midpoints. The position of the first camera relative to the target after the midpoint swap is the same as the position of the second camera relative to the target before the swap, and the position of the second camera relative to the target after the midpoint swap is the same as the position of the first camera relative to the target before the swap. A second calibration is performed on the first and second cameras after the midpoint swap based on the target.

[0032] In one embodiment, the processing unit determines the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, and the fourth calibration extrinsic parameter in the following manner:

[0033] A first ideal extrinsic parameter of the first camera mounting position relative to the target and a second ideal extrinsic parameter of the second camera mounting position relative to the target are determined. The first ideal extrinsic parameter includes a first ideal rotation vector and a first ideal offset vector, and the second ideal extrinsic parameter includes a second ideal rotation vector and a second ideal offset vector. Based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter, a first assembly tolerance of the first camera and a second assembly tolerance of the second camera are determined.

[0034] In one embodiment, the processing unit determines a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter:

[0035] Determine the correlation between the target vector, the target ideal vector, and the target assembly vector; based on the correlation, determine the first assembly tolerance of the first camera and the second assembly tolerance of the second camera;

[0036] The target vector, the target ideal vector, and the target assembly vector include the following combinations:

[0037] The target vector is a first rotation vector, the target ideal vector is a first ideal rotation vector, and the target assembly vector is a first assembly rotation vector;

[0038] The target vector is a first offset vector, the target ideal vector is a first ideal offset vector, and the target assembly vector is a first assembly offset vector;

[0039] The target vector is a second rotation vector, the target ideal vector is a second ideal rotation vector, and the target assembly vector is a second assembly rotation vector;

[0040] The target vector is the second offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the second assembly offset vector;

[0041] The target vector is the third rotation vector, the target ideal vector is the second ideal rotation vector, and the target assembly vector is the first assembly rotation vector;

[0042] The target vector is the third offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the first assembly offset vector;

[0043] The target vector is the fourth rotation vector, the target ideal vector is the first ideal rotation vector, and the target assembly vector is the second assembly rotation vector;

[0044] The target vector is the fourth offset vector, the target ideal vector is the first ideal offset vector, and the target assembly vector is the second assembly offset vector.

[0045] In one embodiment, the relationship between the target vector, the target ideal vector, and the target assembly vector satisfies the following: the target vector is the sum of the target ideal vector and the target assembly vector.

[0046] In one implementation, the processing unit determines the correlation between the target vector, the target ideal vector, and the target assembly vector in the following manner:

[0047] Determine the target vector operation error between the second calibration and the first calibration, and determine the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error; based on the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error, determine the correlation between the target vector, the target ideal vector, and the target assembly vector.

[0048] In one embodiment, the processing unit determines the target vector operation error between the second calibration and the first calibration in the following manner:

[0049] During the first calibration process, determine the first camera rotation vector and the first camera offset vector relative to the second camera. During the second calibration process, determine the second camera rotation vector and the second camera offset vector relative to the first camera. The difference between the second camera rotation vector and the first camera rotation vector is determined as the rotation vector operation error, and the difference between the second camera offset vector and the first camera offset vector is determined as the offset vector operation error.

[0050] According to a third aspect of the present disclosure, an apparatus for determining camera assembly tolerances is provided, comprising:

[0051] processor;

[0052] Memory for storing processor-executable instructions; the method for determining camera assembly tolerances as described in the first aspect or any embodiment of the first aspect.

[0053] According to a fourth aspect of the present disclosure, a storage medium is provided, the storage medium storing instructions that, when executed by a processor of a terminal, enable the terminal to perform the method for determining camera assembly tolerances as described in the second aspect or any embodiment of the second aspect.

[0054] The technical solutions provided by the embodiments of this disclosure may include the following beneficial effects: by obtaining the calibration extrinsic parameters, including the rotation vector and the offset vector, during the two calibration processes of the binocular camera, the assembly tolerance of each camera in the binocular camera can be determined, thereby enabling the determination of the assembly tolerance of the binocular camera.

[0055] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0056] The accompanying drawings, which are incorporated in and form a part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure.

[0057] Figure 1 This is a flowchart illustrating a method for determining camera assembly tolerances according to an exemplary embodiment.

[0058] Figure 2 A schematic diagram illustrating dual-camera calibration of a first camera and a second camera is shown in an exemplary embodiment of this disclosure.

[0059] Figure 3 This disclosure illustrates an exemplary embodiment in which the R value between the first camera and the second camera is determined. LR And T LR A schematic diagram of the process.

[0060] Figure 4 This illustration shows a schematic diagram of the process of obtaining the rotation vectors and offset vectors of the first and second cameras during the first calibration process in an exemplary embodiment of this disclosure.

[0061] Figure 5 This illustration shows a schematic diagram of the process of obtaining the rotation vectors and offset vectors of the first and second cameras during the second calibration process in an exemplary embodiment of this disclosure.

[0062] Figure 6 This is a flowchart illustrating a method for determining a first assembly tolerance of a first camera and a second assembly tolerance of a second camera based on a first calibration extrinsic parameter, a second calibration extrinsic parameter, a third calibration extrinsic parameter, and a fourth calibration extrinsic parameter, according to an exemplary embodiment.

[0063] Figure 7 This is a block diagram illustrating an apparatus for determining camera assembly tolerances according to an exemplary embodiment.

[0064] Figure 8 This is a block diagram illustrating an apparatus for determining camera assembly tolerances according to an exemplary embodiment. Detailed Implementation

[0065] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure.

[0066] The method for determining camera assembly tolerances provided in this disclosure is applied to scenarios where assembly tolerances for binocular cameras are determined on a terminal production line.

[0067] Figure 1 This is a flowchart illustrating a method for determining camera assembly tolerances according to an exemplary embodiment, such as... Figure 1 As shown, the method for determining camera assembly tolerances in a terminal includes the following steps.

[0068] In step S11, the binocular cameras, including the first camera and the second camera, are calibrated for the first time based on the target to obtain the first calibration extrinsic parameters of the first camera relative to the target and the second calibration extrinsic parameters of the second camera relative to the target.

[0069] The first calibration extrinsic parameter includes a first rotation vector and a first offset vector, and the second calibration extrinsic parameter includes a second rotation vector and a second offset vector.

[0070] In step S12, the binocular cameras are calibrated a second time based on the target to obtain the third calibration extrinsic parameters of the first camera relative to the target and the fourth calibration extrinsic parameters of the second camera relative to the target.

[0071] The third calibration extrinsic parameters include the third rotation vector and the third offset vector, and the fourth calibration extrinsic parameters include the fourth rotation vector and the fourth offset vector.

[0072] In step S13, based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, and the fourth calibration extrinsic parameter, the first assembly tolerance of the first camera and the second assembly tolerance of the second camera are determined.

[0073] The first assembly tolerance includes the first assembly rotation vector and the first assembly offset vector of the actual assembly position of the first camera relative to the ideal assembly position, and the second assembly tolerance includes the second assembly rotation vector and the second assembly offset vector of the actual assembly position of the second camera relative to the ideal assembly position.

[0074] The calibration process for the binocular camera, including the first and second cameras, in this disclosure can be understood as a dual-camera calibration process. In one example, Zhang Zhengyou's stereo calibration method can be used for dual-camera calibration.

[0075] In this disclosure, the first camera can be the left camera of a binocular camera, and the second camera can be the right camera of a binocular camera. Alternatively, the first camera can also be understood as the main camera of the binocular camera, and the second camera can also be understood as the secondary camera of the binocular camera.

[0076] Figure 2 A schematic diagram illustrating dual-camera calibration of a first camera and a second camera is shown in an exemplary embodiment of this disclosure. See also... Figure 2 As shown, the left camera is the first camera and the right camera is the second camera. The left and right cameras are placed at a set distance from the target to capture and calibrate the target object on the target.

[0077] In this disclosure, the calibration extrinsic parameters obtained from calibrating the binocular cameras include the rotation vector and offset vector of the camera relative to the target. Hereinafter, R represents the rotation vector, and T represents the offset vector. The calibration extrinsic parameters of the first camera relative to the target may include the rotation vector R of the first camera relative to the target. LO and the offset vector T of the first camera relative to the target LO The calibration extrinsic parameters of the second camera relative to the target may include the rotation vector R of the second camera relative to the target. RO And the offset vector T of the second camera relative to the target RO .

[0078] Where L is short for left, which can be represented as the left camera (first camera), R is short for right, which can be represented as the right camera (second camera), and O is short for object, which can be represented as a target.

[0079] In this disclosure, based on R LO T LO R RO And T RO This allows us to determine the calibration extrinsic parameters between the first and second cameras, such as the calibration rotation vector between them, hereinafter referred to as the camera calibration rotation vector R.LR And the calibration offset vector, hereinafter referred to as the camera offset vector T. LR .in, Figure 3 This disclosure illustrates an exemplary embodiment in which the R value between the first camera and the second camera is determined. LR And T LR A schematic diagram of the process.

[0080] This disclosure performs a first calibration and a second calibration for the first camera and the second camera, respectively.

[0081] Figure 4 This illustration shows a schematic diagram of the process of obtaining the rotation vectors and offset vectors of the first and second cameras during the first calibration process in an exemplary embodiment of this disclosure.

[0082] See Figure 4 As shown, the first rotation vector of the first camera relative to the target is obtained through the first calibration. and the first offset vector of the first camera relative to the target The second rotation vector of the second camera relative to the target is obtained through the first calibration. and the second offset vector of the second camera relative to the target

[0083] In this disclosure, the rotation vector of the first camera relative to the second camera can also be obtained through the first calibration. and the first camera offset vector

[0084] Figure 5 This illustration shows a schematic diagram of the process of obtaining the rotation vectors and offset vectors of the first and second cameras during the second calibration process in an exemplary embodiment of this disclosure.

[0085] See Figure 5 As shown, the third rotation vector of the first camera relative to the target is obtained through the second calibration. and the third offset vector of the first camera relative to the target The fourth rotation vector of the second camera relative to the target is obtained through the second calibration. and the fourth offset vector of the second camera relative to the target

[0086] In this disclosure, the rotation vector of the second camera relative to the first camera can also be obtained through a second calibration. and the second camera offset vector

[0087] In one embodiment of this disclosure, during the second calibration of the binocular cameras based on a target, the midpoint symmetrical positions of the first and second cameras in the binocular cameras can be interchanged. Specifically, the position of the first camera relative to the target after the midpoint symmetrical position interchange is the same as the position of the second camera relative to the target before the interchange, and vice versa. That is, the first camera in the first calibration process and the second camera in the second calibration process are in the same position.

[0088] In this disclosure, the second calibration of the first and second cameras after the target midpoints are symmetrically swapped can ensure that the positions of the first and second cameras relative to the target remain unchanged, thereby improving the accuracy of subsequent determination of camera assembly tolerances.

[0089] The first assembly rotation vector included in the first assembly tolerance of the first camera in this disclosure is Δr LeftCamera This indicates that the first assembly offset vector is Δt LeftCamera The second assembly tolerance of the second camera includes the second assembly rotation vector in the form of Δr. RightCamera This indicates that the second assembly offset vector is Δt RightCamera express.

[0090] In one embodiment of this disclosure, a first ideal extrinsic parameter of the mounting position of the first camera relative to the target, and a second ideal extrinsic parameter of the mounting position of the second camera relative to the target can be determined. The first ideal extrinsic parameter includes a first ideal rotation vector r. LO and the first ideal offset vector t LO The second ideal extrinsic parameters include the second ideal rotation vector r. RO Second ideal offset vector t RO .

[0091] In this disclosure, a first assembly tolerance of the first camera and a second assembly tolerance of the second camera can be determined based on a first ideal external parameter and a second ideal external parameter.

[0092] Figure 6 This is a flowchart illustrating a method for determining a first assembly tolerance of a first camera and a second assembly tolerance of a second camera based on a first calibration extrinsic parameter, a second calibration extrinsic parameter, a third calibration extrinsic parameter, and a fourth calibration extrinsic parameter, according to an exemplary embodiment. Figure 6 As shown, it includes the following steps.

[0093] In step S21, the first ideal extrinsic parameter of the first camera installation position relative to the target and the second ideal extrinsic parameter of the second camera installation position relative to the target are determined.

[0094] Wherein, the first ideal extrinsic parameter includes the first ideal rotation vector r LO and the first ideal offset vector t LO The second ideal extrinsic parameters include the second ideal rotation vector r. RO Second ideal offset vector t RO .

[0095] In step S22, based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter, the first assembly tolerance of the first camera and the second assembly tolerance of the second camera are determined.

[0096] In this disclosure, when determining the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter, the correlation between the target vector, the target ideal vector, and the target assembly vector can be determined, and based on the correlation, the first assembly tolerance of the first camera and the second assembly tolerance of the second camera can be determined.

[0097] The target vector, the target ideal vector, and the target assembly vector include the following combinations:

[0098] A: The target vector is the first rotation vector, the target ideal vector is the first ideal rotation vector, and the target assembly vector is the first assembly rotation vector.

[0099] B: The target vector is the first offset vector, the target ideal vector is the first ideal offset vector, and the target assembly vector is the first assembly offset vector.

[0100] C: The target vector is the second rotation vector, the target ideal vector is the second ideal rotation vector, and the target assembly vector is the second assembly rotation vector.

[0101] D: The target vector is the second offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the second assembly offset vector.

[0102] E: The target vector is the third rotation vector, the target ideal vector is the second ideal rotation vector, and the target assembly vector is the first assembly rotation vector.

[0103] F: The target vector is the third offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the first assembly offset vector.

[0104] G: The target vector is the fourth rotation vector, the target ideal vector is the first ideal rotation vector, and the target assembly vector is the second assembly rotation vector.

[0105] H: The target vector is the fourth offset vector, the target ideal vector is the first ideal offset vector, and the target assembly vector is the second assembly offset vector.

[0106] In one implementation, the relationship between the target vector, the target ideal vector, and the target assembly vector satisfies the following: the target vector is the sum of the target ideal vector and the target assembly vector.

[0107] Therefore, the relationship between the target vector, the target ideal vector, and the target assembly vector in this disclosure can be expressed as the following formula:

[0108]

[0109]

[0110]

[0111]

[0112]

[0113]

[0114]

[0115]

[0116] As can be seen from the above embodiments of this disclosure, data can be obtained during the first calibration process and the second calibration process. Therefore, it can be determined

[0117] based on And formulas (1) to (8) can be used to calculate:

[0118] [r LO t LO r RO t RO Δr LeftCamera Δt LeftCamera Δr RightCamera Δt RightCamera ]

[0119] Where, r LO t LO r RO and t ROLet [Δr] be the target ideal vector, and let [Δr] be a known quantity. Therefore, we can determine [Δr]. LeftCamera Δt LeftCamera Δr RightCamera Δt RightCamera ].

[0120] Furthermore, in order to reduce the assembly tolerances of the first and second cameras, this disclosure can determine the target vector operation error between the second and first calibrations, and determine the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error. Based on the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error, the correlation between the target vector, the target ideal vector, and the target assembly vector is determined.

[0121] In one embodiment, the target vector manipulation error between the second calibration and the first calibration includes rotation vector manipulation error, hereinafter referred to as... The following describes the error in offset vector operations, and uses... express.

[0122] In this disclosure, the relationship between the target vector, the ideal target vector, the assembled target vector, and the target vector manipulation error can be expressed as follows:

[0123]

[0124]

[0125]

[0126]

[0127]

[0128]

[0129]

[0130]

[0131]

[0132]

[0133]

[0134]

[0135] In this disclosure, the rotation vector of the first camera relative to the second camera, obtained during the first calibration process, can be determined. and the first camera offset vector And determine the rotation vector of the second camera relative to the first camera during the second calibration process. and the second camera offset vector Rotate the second camera vector Rotation vector of the first camera The difference between them is determined as the rotation vector operation error. And the second camera offset vector offset vector of the first camera The difference between them is determined as the offset vector operation error. Right now,

[0136] Based on the above, formulas (1) to (8) can be obtained through formulas (9) to (20). That is, the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error can be determined by the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error.

[0137] The method for determining camera assembly tolerances provided in this disclosure can determine the rotation vectors and offset vectors corresponding to the first and second cameras respectively based on two calibration processes of the binocular camera, thereby determining the pose difference between the first and second cameras. Furthermore, based on the target vector operation error between the second and first calibrations, the process of finding the binocular camera assembly tolerances can be simplified.

[0138] Based on the same concept, embodiments of this disclosure also provide an apparatus for determining camera assembly tolerances.

[0139] It is understood that the apparatus for determining camera assembly tolerances provided in this disclosure includes hardware structures and / or software modules corresponding to each function in order to achieve the above-mentioned functions. In conjunction with the units and algorithm steps of the various examples disclosed in this disclosure, this disclosure can be implemented in hardware or a combination of hardware and computer software. Whether a function is executed by hardware or by computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the technical solutions of this disclosure.

[0140] Figure 7 This is a block diagram illustrating an apparatus for determining camera assembly tolerances according to an exemplary embodiment. (Refer to...) Figure 7 The device 100 for determining camera assembly tolerances includes a calibration unit 101 and a processing unit 102.

[0141] The calibration unit 101 is used to perform a first calibration on the binocular camera including a first camera and a second camera based on a target, to obtain a first calibration extrinsic parameter of the first camera relative to the target and a second calibration extrinsic parameter of the second camera relative to the target. The first calibration extrinsic parameter includes a first rotation vector and a first offset vector, and the second calibration extrinsic parameter includes a second rotation vector and a second offset vector. The unit 101 is also used to perform a second calibration on the binocular camera based on the target, to obtain a third calibration extrinsic parameter of the first camera relative to the target and a fourth calibration extrinsic parameter of the second camera relative to the target. The third calibration extrinsic parameter includes a third rotation vector and a third offset vector, and the fourth calibration extrinsic parameter includes a fourth rotation vector and a fourth offset vector.

[0142] The processing unit 102 is used to determine the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter and the fourth calibration extrinsic parameter. The first assembly tolerance includes the first assembly rotation vector and the first assembly offset vector of the actual assembly position of the first camera relative to the ideal assembly position. The second assembly tolerance includes the second assembly rotation vector and the second assembly offset vector of the actual assembly position of the second camera relative to the ideal assembly position.

[0143] In one embodiment, the calibration unit 101 performs a second calibration of the binocular camera based on a target in the following manner:

[0144] The first and second cameras in the binocular camera system are symmetrically swapped at their midpoints. The position of the first camera relative to the target after the swap is the same as the position of the second camera relative to the target before the swap, and vice versa. A second calibration is then performed on the first and second cameras after the midpoint swap based on the target.

[0145] In one embodiment, the processing unit 102 determines the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, and the fourth calibration extrinsic parameter in the following manner:

[0146] A first ideal extrinsic parameter relative to the target for the mounting position of the first camera and a second ideal extrinsic parameter relative to the target are determined. The first ideal extrinsic parameter includes a first ideal rotation vector and a first ideal offset vector, and the second ideal extrinsic parameter includes a second ideal rotation vector and a second ideal offset vector. Based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter, a first assembly tolerance for the first camera and a second assembly tolerance for the second camera are determined.

[0147] In one embodiment, the processing unit 102 determines the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter:

[0148] Determine the relationship between the target vector, the ideal target vector, and the assembled target vector. Based on this relationship, determine the first assembly tolerance of the first camera and the second assembly tolerance of the second camera.

[0149] The target vector, the target ideal vector, and the target assembly vector include the following combinations:

[0150] The target vector is the first rotation vector, the target ideal vector is the first ideal rotation vector, and the target assembly vector is the first assembly rotation vector.

[0151] The target vector is the first offset vector, the target ideal vector is the first ideal offset vector, and the target assembly vector is the first assembly offset vector.

[0152] The target vector is the second rotation vector, the target ideal vector is the second ideal rotation vector, and the target assembly vector is the second assembly rotation vector.

[0153] The target vector is the second offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the second assembly offset vector.

[0154] The target vector is the third rotation vector, the target ideal vector is the second ideal rotation vector, and the target assembly vector is the first assembly rotation vector.

[0155] The target vector is the third offset vector, the target ideal vector is the second ideal offset vector, and the target assembly vector is the first assembly offset vector.

[0156] The target vector is the fourth rotation vector, the target ideal vector is the first ideal rotation vector, and the target assembly vector is the second assembly rotation vector.

[0157] The target vector is the fourth offset vector, the target ideal vector is the first ideal offset vector, and the target assembly vector is the second assembly offset vector.

[0158] In one implementation, the relationship between the target vector, the target ideal vector, and the target assembly vector satisfies the following: the target vector is the sum of the target ideal vector and the target assembly vector.

[0159] In one embodiment, the processing unit 102 determines the correlation between the target vector, the target ideal vector, and the target assembly vector in the following manner:

[0160] Determine the target vector manipulation error between the second and first calibrations, and establish the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector manipulation error. Based on the correlation between the target vector, the target ideal vector, the target assembly vector, and the target vector manipulation error, determine the correlation between the target vector, the target ideal vector, and the target assembly vector.

[0161] In one embodiment, the processing unit 102 determines the target vector operation error between the second calibration and the first calibration in the following manner:

[0162] During the first calibration process, determine the rotation vector and offset vector of the first camera relative to the second camera. During the second calibration process, determine the rotation vector and offset vector of the second camera relative to the first camera. The difference between the rotation vector of the second camera and the rotation vector of the first camera is defined as the rotation vector operation error, and the difference between the offset vector of the second camera and the offset vector of the first camera is defined as the offset vector operation error.

[0163] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0164] Figure 8 This is a block diagram illustrating an apparatus 200 for determining camera assembly tolerances according to an exemplary embodiment. The apparatus 200 can be provided as a terminal. For example, the apparatus 200 can be a mobile phone, computer, digital broadcasting terminal, messaging device, game console, tablet device, medical device, fitness equipment, personal digital assistant, etc.

[0165] Reference Figure 8 The device 200 may include one or more of the following components: processing component 202, memory 204, power component 206, multimedia component 208, audio component 210, input / output (I / O) interface 212, sensor component 214, and communication component 216.

[0166] Processing component 202 typically controls the overall operation of device 200, such as operations associated with display, telephone calls, data communication, camera operation, and recording. Processing component 202 may include one or more processors 220 to execute instructions to perform all or part of the steps of the methods described above. Furthermore, processing component 202 may include one or more modules to facilitate interaction between processing component 202 and other components. For example, processing component 202 may include a multimedia module to facilitate interaction between multimedia component 208 and processing component 202.

[0167] Memory 204 is configured to store various types of data to support the operation of device 200. Examples of such data include instructions for any application or method operating on device 200, contact data, phonebook data, messages, pictures, videos, etc. Memory 204 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk.

[0168] The power supply component 206 provides power to the various components of the device 200. The power supply component 206 may include a power management system, one or more power sources, and other components associated with generating, managing, and distributing power to the device 200.

[0169] Multimedia component 208 includes a screen that provides an output interface between the device 200 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touchscreen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touches, swipes, and gestures on the touch panel. The touch sensors may sense not only the boundaries of the touch or swipe action but also the duration and pressure associated with the touch or swipe operation. In some embodiments, multimedia component 208 includes a front-facing camera and / or a rear-facing camera. When the device 200 is in an operating mode, such as a shooting mode or a video mode, the front-facing camera and / or the rear-facing camera may receive external multimedia data. Each front-facing camera and rear-facing camera may be a fixed optical lens system or have focal length and optical zoom capabilities.

[0170] Audio component 210 is configured to output and / or input audio signals. For example, audio component 210 includes a microphone (MIC) configured to receive external audio signals when device 200 is in an operating mode, such as call mode, recording mode, and voice recognition mode. The received audio signals may be further stored in memory 204 or transmitted via communication component 216. In some embodiments, audio component 210 also includes a speaker for outputting audio signals.

[0171] I / O interface 212 provides an interface between processing component 202 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to, home buttons, volume buttons, power buttons, and lock buttons.

[0172] Sensor assembly 214 includes one or more sensors for providing status assessments of various aspects of device 200. For example, sensor assembly 214 may detect the on / off state of device 200, the relative positioning of components such as the display and keypad of device 200, changes in the position of device 200 or a component of device 200, the presence or absence of user contact with device 200, the orientation or acceleration / deceleration of device 200, and temperature changes of device 200. Sensor assembly 214 may include a proximity sensor configured to detect the presence of nearby objects without any physical contact. Sensor assembly 214 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, sensor assembly 214 may also include an accelerometer, a gyroscope, a magnetometer, a pressure sensor, or a temperature sensor.

[0173] Communication component 216 is configured to facilitate wired or wireless communication between device 200 and other devices. Device 200 can access wireless networks based on communication standards, such as WiFi, 4G, or 5G, or combinations thereof. In one exemplary embodiment, communication component 216 receives broadcast signals or broadcast-related information from an external broadcast management system via a broadcast channel. In one exemplary embodiment, communication component 216 also includes a near-field communication (NFC) module to facilitate short-range communication. For example, the NFC module may be implemented based on radio frequency identification (RFID) technology, Infrared Data Association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.

[0174] In an exemplary embodiment, the apparatus 200 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the methods described above.

[0175] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 204 including instructions, which can be executed by a processor 220 of the device 200 to perform the above-described method. For example, the non-transitory computer-readable storage medium may be a ROM, random access memory (RAM), CD-ROM, magnetic tape, floppy disk, and optical data storage device, etc.

[0176] It is understood that in this disclosure, "multiple" refers to two or more, and other quantifiers are similar. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, and B alone. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. The singular forms "a," "the," and "the" are also intended to include the plural forms unless the context clearly indicates otherwise.

[0177] It is further understood that the terms "first," "second," etc., are used to describe various types of information, but this information should not be limited to these terms. These terms are only used to distinguish information of the same type from one another, and do not indicate a specific order or degree of importance. In fact, the expressions "first," "second," etc., are completely interchangeable. For example, without departing from the scope of this disclosure, first information can also be referred to as second information, and similarly, second information can also be referred to as first information.

[0178] It can be further understood that, unless otherwise specified, "connection" includes both direct connections where no other components exist between the two parties and indirect connections where other components exist between them.

[0179] It is further understood that although operations are described in a specific order in the accompanying drawings in the embodiments of this disclosure, this should not be construed as requiring these operations to be performed in the specific order or serial order shown, or requiring all of the shown operations to be performed to obtain the desired result. In certain environments, multitasking and parallel processing may be advantageous.

[0180] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein.

[0181] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A method of determining camera assembly tolerances, the method comprising: The method comprises: ​ performing first calibration on a binocular camera comprising a first camera and a second camera based on a target to obtain a first calibration extrinsic parameter of the first camera relative to the target and a second calibration extrinsic parameter of the second camera relative to the target, wherein the first calibration extrinsic parameter comprises a first rotation vector and a first offset vector, and the second calibration extrinsic parameter comprises a second rotation vector and a second offset vector; performing second calibration on the binocular camera based on the target to obtain a third calibration extrinsic parameter of the first camera relative to the target and a fourth calibration extrinsic parameter of the second camera relative to the target, wherein the third calibration extrinsic parameter comprises a third rotation vector and a third offset vector, and the fourth calibration extrinsic parameter comprises a fourth rotation vector and a fourth offset vector; determining a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter and the fourth calibration extrinsic parameter, wherein the first assembly tolerance comprises a first assembly rotation vector and a first assembly offset vector of an actual assembly position of the first camera relative to an ideal assembly position, and the second assembly tolerance comprises a second assembly rotation vector and a second assembly offset vector of an actual assembly position of the second camera relative to an ideal assembly position.

2. The method of claim 1, wherein, The performing second calibration on the binocular camera based on the target comprises: interchanging the first camera and the second camera in the binocular camera at a midpoint symmetry position, wherein a position of the first camera after interchanging at the midpoint symmetry position relative to the target is the same as a position of the second camera before interchanging relative to the target, and a position of the second camera after interchanging at the midpoint symmetry position relative to the target is the same as a position of the first camera before interchanging relative to the target; performing second calibration on the first camera and the second camera after interchanging at the midpoint symmetry position based on the target.

3. The method according to claim 1 or 2, characterized in that, The determining a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter and the fourth calibration extrinsic parameter comprises: determining a first ideal extrinsic parameter of a first camera mounting position relative to the target and a second ideal extrinsic parameter of a second camera mounting position relative to the target, wherein the first ideal extrinsic parameter comprises a first ideal rotation vector and a first ideal offset vector, and the second ideal extrinsic parameter comprises a second ideal rotation vector and a second ideal offset vector; determining the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter and the second ideal extrinsic parameter.

4. The method of claim 3, wherein, The determining the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter and the second ideal extrinsic parameter comprises: determine a relationship between the target vector, the target ideal vector, and the target assembly vector; determine a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the relationship; the target vector, the target ideal vector, and the target assembly vector include a combination of: the target vector is a first rotation vector, the target ideal vector is a first ideal rotation vector, and the target assembly vector is a first assembly rotation vector; the target vector is a first offset vector, the target ideal vector is a first ideal offset vector, and the target assembly vector is a first assembly offset vector; the target vector is a second rotation vector, the target ideal vector is a second ideal rotation vector, and the target assembly vector is a second assembly rotation vector; the target vector is a second offset vector, the target ideal vector is a second ideal offset vector, and the target assembly vector is a second assembly offset vector; the target vector is a third rotation vector, the target ideal vector is a second ideal rotation vector, and the target assembly vector is a first assembly rotation vector; the target vector is a third offset vector, the target ideal vector is a second ideal offset vector, and the target assembly vector is a first assembly offset vector; the target vector is a fourth rotation vector, the target ideal vector is a first ideal rotation vector, and the target assembly vector is a second assembly rotation vector; the target vector is a fourth offset vector, the target ideal vector is a first ideal offset vector, and the target assembly vector is a second assembly offset vector.

5. The method of claim 4, wherein, the relationship between the target vector, the target ideal vector, and the target assembly vector satisfies: the target vector is a sum of the target ideal vector and the target assembly vector.

6. The method of claim 4, wherein, the determining of the relationship between the target vector, the target ideal vector, and the target assembly vector includes: determining a target vector operation error between the second calibration and the first calibration, and determining a relationship between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error; determining the relationship between the target vector, the target ideal vector, and the target assembly vector based on the relationship between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error.

7. The method of claim 6, wherein, the determining of the target vector operation error between the second calibration and the first calibration includes: determining a first camera rotation vector of the first camera relative to the second camera and a first camera offset vector during the first calibration, and determining a second camera rotation vector of the second camera relative to the first camera and a second camera offset vector during the second calibration; determining a rotation vector operation error as a difference between the second camera rotation vector and the first camera rotation vector, and determining an offset vector operation error as a difference between the second camera offset vector and the first camera offset vector.

8. An apparatus for determining camera assembly tolerances, characterized in that, the method includes: The calibration unit is configured to perform a first calibration on the binocular camera including the first camera and the second camera based on a target to obtain a first calibration extrinsic parameter of the first camera relative to the target and a second calibration extrinsic parameter of the second camera relative to the target, the first calibration extrinsic parameter including a first rotation vector and a first offset vector, and the second calibration extrinsic parameter including a second rotation vector and a second offset vector, and perform a second calibration on the binocular camera based on the target to obtain a third calibration extrinsic parameter of the first camera relative to the target and a fourth calibration extrinsic parameter of the second camera relative to the target, the third calibration extrinsic parameter including a third rotation vector and a third offset vector, and the fourth calibration extrinsic parameter including a fourth rotation vector and a fourth offset vector; The processing unit is configured to determine a first assembly tolerance of the first camera and a second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, and the fourth calibration extrinsic parameter, the first assembly tolerance including a first assembly rotation vector and a first assembly offset vector of an actual assembly position of the first camera relative to an ideal assembly position, and the second assembly tolerance including a second assembly rotation vector and a second assembly offset vector of an actual assembly position of the second camera relative to an ideal assembly position.

9. The apparatus of claim 8, wherein, The calibration unit performs the second calibration on the binocular camera based on the target in the following manner: interchange the first camera and the second camera in the binocular camera in a midpoint symmetrical position, wherein a position of the first camera relative to the target after the interchange is the same as a position of the second camera relative to the target before the interchange, and a position of the second camera relative to the target after the interchange is the same as a position of the first camera relative to the target before the interchange; perform the second calibration on the first camera and the second camera after the interchange based on the target.

10. The apparatus of claim 8 or 9, wherein, The processing unit determines the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, and the fourth calibration extrinsic parameter in the following manner: determine a first ideal extrinsic parameter of a first camera mounting position relative to the target and a second ideal extrinsic parameter of a second camera mounting position relative to the target, the first ideal extrinsic parameter including a first ideal rotation vector and a first ideal offset vector, and the second ideal extrinsic parameter including a second ideal rotation vector and a second ideal offset vector; determine the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter.

11. The apparatus of claim 10, wherein, The processing unit determines the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the first calibration extrinsic parameter, the second calibration extrinsic parameter, the third calibration extrinsic parameter, the fourth calibration extrinsic parameter, the first ideal extrinsic parameter, and the second ideal extrinsic parameter in the following manner: determining a relationship between a target vector, a target ideal vector, and a target assembly vector; determining the first assembly tolerance of the first camera and the second assembly tolerance of the second camera based on the relationship; The target vector, the target ideal vector, and the target assembly vector include the following combinations: The target vector is a first rotation vector, the target ideal vector is a first ideal rotation vector, and the target assembly vector is a first assembly rotation vector; The target vector is a first offset vector, the target ideal vector is a first ideal offset vector, and the target assembly vector is a first assembly offset vector; The target vector is a second rotation vector, the target ideal vector is a second ideal rotation vector, and the target assembly vector is a second assembly rotation vector; The target vector is a second offset vector, the target ideal vector is a second ideal offset vector, and the target assembly vector is a second assembly offset vector; The target vector is a third rotation vector, the target ideal vector is a second ideal rotation vector, and the target assembly vector is a first assembly rotation vector; The target vector is a third offset vector, the target ideal vector is a second ideal offset vector, and the target assembly vector is a first assembly offset vector; The target vector is a fourth rotation vector, the target ideal vector is a first ideal rotation vector, and the target assembly vector is a second assembly rotation vector; The target vector is a fourth offset vector, the target ideal vector is a first ideal offset vector, and the target assembly vector is a second assembly offset vector.

12. The apparatus of claim 11, wherein, The relationship between the target vector, the target ideal vector, and the target assembly vector satisfies that the target vector is the sum of the target ideal vector and the target assembly vector.

13. The apparatus of claim 11, wherein, The processing unit determines the relationship between the target vector, the target ideal vector, and the target assembly vector in the following manner: determining a target vector operation error between the second calibration and the first calibration, and determining a relationship between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error; determining the relationship between the target vector, the target ideal vector, and the target assembly vector based on the relationship between the target vector, the target ideal vector, the target assembly vector, and the target vector operation error.

14. The apparatus of claim 13, wherein, The processing unit determines the target vector operation error between the second calibration and the first calibration in the following manner: determining a first camera rotation vector and a first camera offset vector of the first camera relative to the second camera in the first calibration, and determining a second camera rotation vector and a second camera offset vector of the second camera relative to the first camera in the second calibration; A difference between the second camera rotation vector and the first camera rotation vector is determined as a rotation vector operation error, and a difference between the second camera offset vector and the first camera offset vector is determined as an offset vector operation error.

15. An apparatus for determining camera assembly tolerances, characterized in that, Comprise: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to perform the method of determining camera assembly tolerance according to any one of claims 1-7.

16. A storage medium, characterized by The storage medium has instructions stored therein, and when the instructions in the storage medium are executed by the processor of the terminal, the terminal can perform the method of determining camera assembly tolerance according to any one of claims 1-7.

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