Method and device for testing anti-interference sensitivity of electromagnetic relay
By inputting an adjustable pulse voltage to the electromagnetic relay coil and monitoring the contact action, and using a microcontroller and high-frequency clock circuit for automatic judgment, the problem of lacking anti-interference sensitivity testing in the existing technology is solved, realizing efficient and reliable malfunction assessment of electromagnetic relays and ensuring product quality.
Patent Information
- Application Number
- CN202310396302.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-04-14
- Publication Date
- 2026-02-27
- Estimated Expiration
- 2043-04-14
AI Technical Summary
Existing industry standards lack detailed descriptions and testing requirements for the anti-interference sensitivity of electromagnetic relays, resulting in a lack of unified understanding and requirements among manufacturers and users regarding relay operation sensitivity indicators, which affects product quality stability.
An electromagnetic relay anti-interference sensitivity test method and device are adopted. By inputting an adjustable pulse voltage to the relay coil, the pulse time value of the normally closed contact of the relay is monitored and recorded. A microcontroller and a high-frequency clock circuit are used to generate voltage pulses, automatically determine the contact action, and display the sensitivity parameters on the display.
It enables quantitative evaluation of the malfunction voltage and duration of electromagnetic relays under series interference signals, providing parameter assurance for the production of high-quality relay products and improving testing efficiency and data reliability.
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Figure CN116660737B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application belongs to the technical field of electromagnetic relay detection, and particularly relates to a method and device for testing the anti-interference sensitivity of an electromagnetic relay. BACKGROUND
[0002] The input anti-interference sensitivity refers to the minimum coil excitation quantity for causing the relay contact to act. In the actual working circuit of a user, due to the possibility of connecting a disturbance signal in the system, the relay may be misoperated to cause a quality accident. Testing the anti-interference capability (anti-interference sensitivity) of the relay to master the conditions for stable operation of the relay is of great significance for ensuring the quality of the relay product. The existing various industry specifications do not contain the input anti-interference sensitivity parameter, nor do they have detailed description and testing requirements for the parameter. The manufacturers and users have no unified understanding and requirements for the action sensitivity index of the relay. SUMMARY
[0003] The present application provides a method and device for testing the anti-interference sensitivity of an electromagnetic relay, so as to obtain the voltage value and duration for which the electromagnetic relay does not misoperate after connecting a disturbance signal, thereby providing a quantitative parameter guarantee for producing high-quality electromagnetic relay products.
[0004] The technical solution for achieving the above-mentioned purpose includes the following contents.
[0005] A method for testing the anti-interference sensitivity of an electromagnetic relay, comprising inputting an adjustable pulse voltage to the relay coil, and monitoring and recording the pulse time value at the instant when the normally closed contact of the relay is separated.
[0006] Further, the pulse voltage is not greater than 32V.
[0007] Based on the above-mentioned method, the present application provides a device for testing the anti-interference sensitivity of an electromagnetic relay, comprising a coil power supply, a pulse circuit, a time base timer, and a display controller. The coil power supply comprises a voltage adjustment circuit, and supplies power to the relay coil through the pulse circuit. The pulse circuit is electrically connected with the time base timer, and is used to generate a voltage pulse and apply it to the input end of the relay coil. The time base timer comprises a single-chip microcomputer and a high-frequency clock circuit electrically connected therewith, and is used to generate a voltage pulse to drive the relay coil. When the electromagnetic relay is attracted and actuated, the single-chip microcomputer monitors the pulse time value at the instant when the normally closed contact JC is separated, and the display controller is electrically connected with the single-chip microcomputer.
[0008] Further, the voltage adjustment circuit comprises a multi-turn potentiometer.
[0009] Further, the multi-turn potentiometer adjusts the voltage value in steps of 0.1V, and the maximum voltage is 32V.
[0010] Further, the single-chip microcomputer is STC15F412AD.
[0011] The electromagnetic relay anti-interference sensitivity test method of the application tests the minimum parameter combination of relay misoperation by adjusting voltage and pulse width. Based on the method, the electromagnetic relay anti-interference sensitivity test device of the application automatically judges the contact action by a single-chip microcomputer, records pulse width time data at the moment of opening of the static closed contact of the relay, and reads the sensitivity in a digital display mode, having the advantages of high efficiency and reliable data. BRIEF DESCRIPTION OF DRAWINGS
[0012] Figure 1 The circuit diagram for actual application of the electromagnetic relay anti-interference sensitivity test device of the embodiment;
[0013] Figure 2 The functional module connection schematic diagram of the application. DETAILED DESCRIPTION
[0014] The application will be specifically described below in combination with the embodiment.
[0015] Referring to Figure 1 and Figure 2 , the embodiment provides an electromagnetic relay anti-interference sensitivity test device. The test device takes a single-chip microcomputer (STC15F412AD) as the center, and is provided with a display, a 24M high-frequency clock circuit, a direct current power supply and an interface circuit in the periphery. The interface circuit is connected with the input and output ports of the measured relay and is provided with a plurality of keys for controlling the initial setting, test start and stop of the system; the single-chip microcomputer and the 24M high-frequency clock circuit form a time base timer for generating a voltage pulse to drive the coil of the relay. When the electromagnetic relay is attracted, the single-chip microcomputer monitors the pulse time value recorded at the moment of opening of the normally closed contact JC, the instruction period of the time base timer is 0.5µs, the bandwidth of the high-frequency clock circuit is 24MHz, and the program storage capacity is 8K; the display is a whole LCD display (JCG19264N) for displaying the coil voltage, pulse width, set maximum pulse time, contact type (such as normally open or normally closed), interval time between adjacent two tests and other parameters; the direct current power supply is an AC / DC power supply: 220VAC / 90W, which has a 5v and 12v working voltage output and a 0-30v voltage adjustable output port, and the adjustable output port is connected with the input end of the coil of the measured relay.
[0016] The electromagnetic relay anti-interference sensitivity test device of the embodiment uses a certain type of electromagnetic relay with coil specifications of 28V and 6 pairs of conversion contacts as an example. The DC power output is adjusted to 28V, the maximum output pulse width is adjusted to 99ms, the contact type is static contact, and the test interval is set to 5s. The output conversion and static contact of the test instrument are connected to the conversion and static contact output terminals of a group of contacts of the relay, respectively, and the coil output of the test instrument is connected to the coil output terminal of the relay in a one-to-one correspondence. Press the "test" key to start the test, output the pulse voltage, and display the pulse time (action sensitivity value) when the relay operates. The test is repeated automatically at the set interval time. Press the "test" key again to stop the test. Then, adjust the DC power output voltage to 27.5V and perform the above test. After completion, adjust the DC power output voltage to 27.0V and perform the above test. Decrease the coil voltage (DC power output voltage) by 0.5V step by step until the relay does not move for 99ms. The coil voltage value (DC power output voltage) and the corresponding action time are the sensitivity parameters of the relay.
Claims
1. A method for testing anti-interference sensitivity of an electromagnetic relay, characterized in that, The test device comprises a coil power supply, a pulse circuit, a time base timer, a display controller and an interface circuit, the coil power supply comprises a voltage adjusting circuit, the relay coil is powered through the pulse circuit, the pulse circuit is electrically connected with the time base timer and is used to generate a voltage pulse and apply the voltage pulse to the input end of the relay coil, the time base timer comprises a single-chip microcomputer and a high-frequency clock circuit electrically connected with the single-chip microcomputer and is used to generate a voltage pulse to drive the relay coil, when the electromagnetic relay is attracted and acts, the single-chip microcomputer monitors the pulse time value recorded at the moment when the normally closed contact JC is separated, the display controller is electrically connected with the single-chip microcomputer, the interface circuit is connected with the coil power supply, the single-chip microcomputer and the input and output ports of the tested relay respectively and is provided with a plurality of keys for controlling the initial setting, test start and test stop of the test device, the test method comprises the following steps: when testing, the coil power supply output is adjusted to 28V, the maximum output pulse width is adjusted to 99ms, the contact type is a static contact, the test interval is set to 5s, the output conversion and static conversion of the test device are connected to the conversion and static conversion output ends of a group of contacts of the relay respectively, the coil power supply output of the test device is connected to the coil output end of the relay in one-to-one correspondence, the "test" key is pressed to start the test, the output pulse voltage is output, the pulse time is displayed when the relay acts, and the automatic test is repeated after the set interval time; the "test" key is pressed again to stop the test; then the coil power supply output voltage is adjusted to 27.5V, and the above test is performed; after the test is completed, the coil power supply output voltage is adjusted to 27.0V, and the above test is performed, the coil power supply output voltage of the relay is decreased by 0.5V step by step, and the above test is repeated until the relay does not act for 99ms, at this time, the coil power supply output voltage value and the corresponding action time are the sensitivity parameters of the relay.
2. The electromagnetic relay anti-interference sensitivity test method according to claim 1, characterized in that, The pulse voltage is not greater than 32V.
3. The electromagnetic relay anti-interference sensitivity test method according to claim 1, characterized in that, The voltage adjusting circuit comprises a multi-turn potentiometer.
4. The electromagnetic relay anti-interference sensitivity test method according to claim 3, characterized in that, The multi-turn potentiometer adjusts the voltage value by 0.1V step, and the maximum voltage is 32V.
5. The electromagnetic relay anti-interference sensitivity test method according to claim 1, characterized in that, The single-chip microcomputer is STC15F412AD.
Citation Information
Patent Citations
Electromagnetic relay anti-interference sensitivity testing device
CN219799679U