Computed tomography scatter and cross-talk correction method and apparatus

Abstract

The control circuit accesses a memory in which has been stored: total computed tomography image signal information detected in a projection domain of the object; a first model representing object scatter; a second model representing background scatter; and a third model representing detector cross-talk. Prior to the reconstruction step, the control circuit processes the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model, and the third model, thereby compensating for object scatter, background scatter, and detector cross-talk by providing scatter and cross-talk corrected computed tomography image signal information in the projection domain of the object. The control circuit then performs the reconstruction step using the scatter and cross-talk corrected computed tomography image signal information in the projection domain of the object.

Description

Technical Field

[0001] These teachings broadly cover computed tomography and more specifically, methods and equipment for scattering and crosstalk correction. Background Technology

[0002] Industrial computed tomography (CT) scanning generally refers to any computer-aided tomographic procedure, but more specifically to X-ray computed tomography. X-ray computed tomography uses radiation to generate a three-dimensional internal and external representation of the scanned object. Industrial CT scans serve many industries to facilitate the internal inspection of parts. This inspection allows for things such as defect detection, failure analysis, metrology, and assembly analysis. Summary of the Invention

[0003] This disclosure provides a method comprising:

[0004] By controlling the circuit:

[0005] Access memory, in which the following has already been stored:

[0006] Total computed tomography image signal information detected in the projection domain of the object;

[0007] The first model representing object scattering;

[0008] The second model represents background scattering; and

[0009] The third model represents detector crosstalk; and

[0010] Prior to the reconstruction step, the total computed tomography image signal information detected in the projection domain of the object is processed according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

[0011] A device is also provided, comprising:

[0012] Memory, in which the following has been stored:

[0013] Total computed tomography image signal information detected in the projection domain of the object;

[0014] The first model representing object scattering;

[0015] The second model represents background scattering; and

[0016] The third model represents detector crosstalk; and

[0017] A control circuit, operably coupled to the memory and configured to process, prior to the reconstruction step, the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object. Attached Figure Description

[0018] By providing the methods and apparatus for computed tomography scattering and crosstalk correction described in the following detailed description, various needs are at least partially met, particularly when studied in conjunction with the accompanying drawings. A complete and enabling disclosure of aspects of this description, including its best mode, is set forth in the specification with reference to the accompanying drawings, for those skilled in the art, wherein:

[0019] Figure 1 Including block diagrams configured according to various embodiments of these teachings;

[0020] Figure 2 Includes flowcharts of various embodiments configured according to these teachings;

[0021] Figure 3 Includes flowcharts of various embodiments configured according to these teachings;

[0022] Figure 4 Includes flowcharts of various embodiments configured according to these teachings;

[0023] Figure 5 Includes flowcharts of various embodiments configured according to these teachings;

[0024] Figure 6 This includes detector crosstalk calibration views configured according to various embodiments of these teachings; and

[0025] Figure 7 Includes block diagram views configured according to various embodiments of these teachings.

[0026] The elements in the figures are shown for simplicity and clarity and are not necessarily drawn to scale. For example, the size and / or relative positioning of some elements in the figures may be exaggerated relative to other elements to aid in understanding the various embodiments of this teaching. Furthermore, common but easily understood elements that are useful or necessary in commercially viable embodiments are generally not depicted to facilitate less obstructed observation of these different embodiments of this teaching. Certain actions and / or steps may be described or depicted in a specific sequence of occurrence, and those skilled in the art will understand that such specificity regarding the sequence is not actually necessary. Detailed Implementation

[0027] The quality and accuracy of a given CT image are a function of many variables, including the presence of interfering content. Examples of the latter include detector crosstalk, object scattering, and background scattering. These typically degrade CT image quality by introducing image artifacts, reducing spatial resolution, and consequently lowering the signal-to-noise ratio. Existing solutions for removing such interfering content present various problems, including the need for expensive, specially designed hardware and / or the requirement for periodic supplementary scans. These are significant challenges.

[0028] Generally, various aspects of this disclosure can be used in conjunction with control circuitry that accesses a memory in which: total computed tomography (CT) image signal information detected in the projection domain of an object is stored; a first model representing object scattering; a second model representing background scattering; and a third model representing detector crosstalk. Prior to the reconstruction step, the control circuitry processes the total CT image signal information detected in the projection domain of the object according to each of the first, second, and third models, thereby compensating for object scattering, background scattering, and detector crosstalk by providing scattering and crosstalk-corrected CT image signal information in the projection domain of the object. The control circuitry then uses the scattering and crosstalk-corrected CT image signal information in the projection domain of the object to perform the reconstruction step.

[0029] These teachings provide a method to accomplish the aforementioned without using hardware-based scattering profilometry.

[0030] One method provides a pre-calculated object scattering database, and then the aforementioned first model is generated, at least in part, based on that object scattering database. Another method involves pre-calculating the object scattering database only for each material / spectrum.

[0031] One method provides calibrated background scattering information to provide calibrated background scattering information, and then generates the aforementioned second model based at least in part on the calibrated background scattering information. Another method involves calibrating the background scattering information only once on a per-scan basis.

[0032] In one method, these teachings provide calibrated detector crosstalk information to provide calibrated detector crosstalk information, and then at least partially based on the calibrated detector crosstalk information to generate the aforementioned third model. In another method, the foregoing includes calibrating the detector crosstalk information only once on a per-scan basis. In yet another method, the aforementioned use of the third model may include processing the total computed tomography image signal information detected in the projection domain of the object according to the third model to compensate for detector crosstalk by using deconvolution.

[0033] With this configuration, these teachings provide a software-based calibration method that utilizes models to handle the three main scattering effects in industrial CT systems. These teachings can be applied to the projection data prior to the reconstruction step. A specific model-based method is used to estimate the corresponding scattering signal, which is subtracted from the total signal detected in the projection domain for each of detector crosstalk, object scattering, and background scattering. While each method benefits from calibration (using calibration scans or simulations), such calibration is required only infrequently, and in many cases, only once for each material / spectrum and / or each scanner.

[0034] Those skilled in the art will understand that these teachings provide useful and important corrections while avoiding any need to measure scattering on a given workpiece itself. Therefore, these teachings save time, eliminate hardware costs, and significantly delay or even avoid aging or memory effects in the detector.

[0035] The terms and expressions used herein have the same general technical meaning as those attributed to them by one of ordinary skill in the art, unless otherwise specified herein. Unless otherwise expressly stated, the word "or" as used herein should be interpreted as having a disjunctive structure rather than a conjunctive structure. Unless otherwise specified herein, the terms "connection," "fixed," "attached," etc., refer both to direct connection, fixation, or attachment, and to indirect connection, fixation, or attachment via one or more intermediate components or features.

[0036] Unless the context clearly indicates otherwise, the singular forms “a,” “one,” and “the” include plural references.

[0037] As used throughout the specification and claims, approximate language is applied to modify any quantitative expression that allows for variation without altering its underlying function. Therefore, values ​​modified by one or more terms such as “about,” “approximately,” and “substantially” are not limited to specified exact values. In at least some cases, approximate language may correspond to the precision of the instrument used to measure the value, or the precision of the method or machine used to construct or manufacture the component and / or system. For example, approximate language may refer to a margin of 10%.

[0038] The above and other benefits may become clearer after a comprehensive review and study of the following detailed description. Refer now to the accompanying drawings, especially... Figure 1 Now, an illustrative device 100 compatible with many of these teachings will be presented.

[0039] In this particular example, enabling device 100 includes control circuitry 101. As a “circuit”, control circuitry 101 therefore includes a structure comprising at least one (and typically many) conductive paths (e.g., paths comprising conductive metals such as copper or silver) for the orderly transmission of electricity, which typically also include corresponding electrical components (both passive (e.g., resistors and capacitors) and active (e.g., any of various semiconductor-based devices, depending on the case) to allow the circuitry to implement the control aspects of these teachings.

[0040] Such control circuitry 101 may include a fixed-purpose hardwired hardware platform (including, but not limited to, application-specific integrated circuits (ASICs) (which are custom-designed integrated circuits for a specific purpose rather than for general use), field-programmable gate arrays (FPGAs), etc.) or may include a partially or fully programmable hardware platform (including, but not limited to, microcontrollers, microprocessors, etc.). These architectural options of such structures are well known and understood in the art and do not require further description herein. The control circuitry 101 is configured (e.g., by using corresponding programming that will be well understood by those skilled in the art) to perform one or more of the steps, actions, and / or functions described herein.

[0041] Alternatively, control circuitry 101 can be operatively coupled to memory 102. Memory 102 can be integrated into control circuitry 101 or physically separated from control circuitry 101 (wholly or partially) as needed. Memory 102 can also be local relative to control circuitry 101 (where, for example, both share a common circuit board, chassis, power supply, and / or enclosure), or can be partially or completely remote relative to control circuitry 101 (where, for example, memory 102 is physically located in another facility, metropolitan area, or even country compared to control circuitry 101).

[0042] In addition to the CT image signal information and model described above, the memory 102 can be used, for example, to non-transitory store computer instructions that, when executed by the control circuit 101, cause the control circuit 101 to behave as described herein. (As used herein, the reference to "non-transitory" shall be understood to mean the non-transitory state of the stored content (and thus excludes the case where the stored content constitutes only a signal or wave) rather than the volatility of the storage medium itself, and therefore includes both non-volatile memory (e.g., read-only memory (ROM)) and volatile memory (e.g., dynamic random access memory (DRAM)).

[0043] Alternatively, control circuitry 101 may be operatively connected to user interface 103. User interface 103 may include any of a variety of user input mechanisms (e.g., but not limited to keyboards and keypads, cursor-control devices, touch-sensitive displays, voice recognition interfaces, gesture recognition interfaces, etc.) and / or user output mechanisms (e.g., but not limited to visual displays, audio transducers, printers, etc.) to facilitate receiving information and / or instructions from and / or providing information to the user.

[0044] Alternatively, in lieu of or in combination with the foregoing, the control circuitry 101 may also be operatively coupled to the network interface 104. The control circuitry 101 thus configured can communicate with other components (both within and outside the device 100) via the network interface 104. Network interfaces, including wireless and non-wireless platforms, are well understood in the art and do not require particular description here.

[0045] Furthermore, by yet another alternative method, and again in lieu of or in combination with the foregoing, the control circuit 101 can be operatively coupled to the imaging system 105 (in particular, a computed tomography imaging system having, for example, a radiation source and one or more detectors).

[0046] refer to Figure 2 The process 200, which can be performed via, for example, the control circuit 101 and the device 100 described above, will be described.

[0047] At box 201, control circuit 101 accesses the aforementioned memory 102. In particular, control circuit 101 accesses multiple items stored in the memory 102.

[0048] The accessed storage items include total computed tomography image signal information detected in the projection domain of the object. This latter information may conform to common prior art practice. The object itself may include, for example, a workpiece or other item being examined to assess, for example, its physical integrity. The aforementioned information may be obtained, for example, from the imaging system 105 described above.

[0049] The accessed storage item also includes a first model representing object scattering. (Temporary reference) Figure 3 These teachings will apply to process 300, which provides a pre-calculated object scattering database at box 301, and then generates a first model at box 302 based at least partially on that object scattering database. By one method, these teachings will only apply to the pre-calculation of the object scattering database on a per-material / spectral basis. For example, the object scattering database for tungsten material only needs to be pre-calculated once, and the object scattering database for stainless steel material also only needs to be pre-calculated once.

[0050] One approach to this first model could include a kernel-based model pre-trained using Monte Carlo simulations. In a typical application setting, the X-ray beam comprises a cone-shaped beam. As used herein, beam i is the i-th sample of the beam and approximates a pencil beam. It could be the beam at pixel i or a beam of a small group of pixels (e.g., 2x2 pixels or 3x3 pixels). In this illustrative example, for each beam i:

[0051]

[0052]

[0053]

[0054] This allows the total scattering and correction to be expressed as:

[0055]

[0056] Where I is the detected projection (which represents the intensity of the X-rays passing through the object - in fact, this corresponds to the detection signal of the detector array, which is proportional to the X-ray intensity), and prep is the attenuation ( SPR stands for Scatter-to-Primary-ratio. It is an object projection. This is an air scan; prep reflects the object's thickness, and i is the beam index. I is the estimated scattering distribution of pixel i. cor I0 is the corrected projection, and I0 is the uncorrected projection. (In the above text, air scanning refers to objectless detection, where air is the only X-ray absorber; the corrected projection refers to the projection after scattering correction; the uncorrected projection refers to the projection before scattering correction; and beam i refers to the i-th beam sample of the entire X-ray beam).

[0057] Refer again Figure 2 The accessed storage item further includes a second model representing background scattering (which may include defocused radiation). (Temporary reference) Figure 4 These teachings will apply to process 400, which provides calibrated background scattering information at box 401 to provide corresponding calibrated background scattering information, and then generates a second model at box 402 based at least partially on the calibrated background scattering information. By a method, these teachings will be applicable to calibrating the calibrated background scattering information only once on a per-scan basis. Using this method, scanners, including those used as part of the imaging system 105, only need to be calibrated once as an initial step and do not need to be recalibrated for the purposes of these teachings.

[0058] The second model, through one method, includes an analytical model calibrated using line or edge measurements, in which the following is determined: .For example:

[0059]

[0060]

[0061]

[0062]

[0063] Where I is the detected projection (representing the intensity of X-rays), Prim refers to the main beam, Trans refers to the transmittance, Air is the air scan, Bsc is the background scattering, and I cor I0 is the corrected projection, and I0 is the uncorrected projection.

[0064] Refer again Figure 2 The accessed storage item further includes a third model representing detector crosstalk. (Temporary reference) Figure 5 These teachings will apply to process 500, which provides calibration detector crosstalk information at block 501 to provide corresponding calibrated detector crosstalk information, and then generates a third model at block 502 based at least in part on the calibrated detector crosstalk information. By a method, and similar to the second model described above, these teachings will apply to calibrating the detector crosstalk information only once on a per-scan basis.

[0065] One approach to this third model involves an analytical model calibrated using corresponding measurements. Illustrative examples in these respects will be provided via provisional reference. Figure 6 This is provided for illustrative purposes only and is not intended to impose any particular limitation on the teachings by virtue of the specificity of this example.

[0066] Detector crosstalk calibration may involve placing a high-attenuation edge or line (e.g., tungsten line 601) on the detector surface. The edge image or contour 602 will become blurred due to crosstalk. The blur can be fitted using a convolutional model, where the correction is calculated... Optimize the kernel. (DeConv refers to deconvolution, and represents I...) cor *kernel= I o The inverse of, where * is the convolution.

[0067] Instead of the foregoing or in combination with it, these teachings will also be similarly applicable to measuring the crosstalk point spread function or kernel using a profile at the edge of the barrier 603, which can be matched with the corresponding model.

[0068] Refer again Figure 2 At block 202, control circuit 101 then processes the total computed tomography image signal information detected in the projection domain of the object according to each of the first, second, and third models, thereby compensating for object scattering, background scattering, and detector crosstalk (respectively), thus providing scattering and crosstalk corrected computed tomography image signal information in the projection domain of the object. (Computed tomography data has two domains, projection and image. Here, projection is the detection for each view, and image includes the tomography image generated by projection reconstruction. When the correction method is applied to the projection, it is “projection domain correction.” Similarly, if the correction method is applied to the reconstructed image, it will be “image domain correction.”) The foregoing may include processing the total computed tomography image signal information detected in the projection domain of the object according to the third model to compensate for detector crosstalk by using deconvolution.

[0069] Through a method, and as Figure 2 As shown, the above processing activities occur before any reconstruction steps. It should also be understood that the described processing activities can be performed without using hardware-based scattering profilometry.

[0070] As an optional but likely typical follow-up step, and as shown in box 203, process 200 can then subsequently provide a reconstruction step performed using computed tomography with scattering and crosstalk correction in the object's projection domain. Image reconstruction in computed tomography constitutes a mathematical process that generates tomographic images from X-ray projection data acquired from many different angles around the object.

[0071] Figure 7 Illustrative examples of these teachings in specific application settings are provided. Box 701 illustrates various calibration and pre-calculation activities assumed by these teachings.

[0072] Box 702 presents an illustrative imaging chain. Generally, the output of one correction is the input of the next. In this particular example, after the gain / offset correction step 703, the imaging chain first performs crosstalk correction using the third model described above at box 704, then performs object scattering correction using the first model described above at box 705, and then performs background scattering correction using the second model described above at box 706. The resulting correction information is then processed according to the inverse logarithmic step 707, followed by beam hardening correction at box 708, and then reconstruction at box 709. While the order in which the models are applied may vary depending on the needs and / or opportunities represented by a given application setting, the order described above in this imaging chain may prove beneficial in many application settings.

[0073] These teachings address many image quality issues caused by scattering and crosstalk, while avoiding the need for specific scattering measurements and the ongoing requirement for additional or specialized hardware. Therefore, these teachings deliver high-quality results at a reduced cost, at least in part due to avoiding the time required for additional scans and without reducing detector lifetime by avoiding hardware-based methods that could lead to aging patterns.

[0074] Further aspects of this disclosure are provided by the subject matter of the following clauses:

[0075] 1. A method comprising:

[0076] By controlling the circuit:

[0077] Access memory, in which the following has already been stored:

[0078] Total computed tomography image signal information detected in the projection domain of the object;

[0079] The first model representing object scattering;

[0080] The second model represents background scattering; and

[0081] The third model represents detector crosstalk; and

[0082] Prior to the reconstruction step, the total computed tomography image signal information detected in the projection domain of the object is processed according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

[0083] 2. The method according to item 1 further includes:

[0084] The reconstruction steps are performed using the computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

[0085] 3. The method according to clause 1, wherein providing the scattering and crosstalk corrected computed tomography image signal information in the projection domain of the object includes providing the scattering and crosstalk corrected computed tomography image signal information in the projection domain of the object without using hardware-based scattering profile measurement.

[0086] 4. The method according to clause 1, further comprising:

[0087] Pre-calculate the object scattering database;

[0088] The first model is generated at least in part based on the object scattering database.

[0089] 5. The method according to clause 4, wherein pre-calculating the object scattering database includes pre-calculating the object scattering database only on a per-material / spectrum basis.

[0090] 6. The method according to clause 1, further comprising:

[0091] Calibrate background scattering information to provide calibrated background scattering information;

[0092] The second model is generated at least in part based on the calibrated background scattering information.

[0093] 7. The method according to item 6, wherein calibrating the background scattering information comprises calibrating the background scattering information only once on a per-scan basis.

[0094] 8. The method according to clause 1, further comprising:

[0095] Calibrate detector crosstalk information to provide calibrated detector crosstalk information;

[0096] The third model is generated at least in part based on the calibrated detector crosstalk information.

[0097] 9. The method according to item 8, wherein calibrating the detector crosstalk information comprises calibrating the detector crosstalk information only once on a per-scan basis.

[0098] 10. The method according to clause 1, wherein processing the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object, comprises at least in part: processing the total computed tomography image signal information detected in the projection domain of the object according to the third model to compensate for detector crosstalk by using deconvolution.

[0099] 11. An apparatus comprising:

[0100] Memory, in which the following has been stored:

[0101] Total computed tomography image signal information detected in the projection domain of the object;

[0102] The first model representing object scattering;

[0103] The second model represents background scattering; and

[0104] The third model represents detector crosstalk; and

[0105] A control circuit, operably coupled to the memory and configured to process, prior to the reconstruction step, the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

[0106] 12. The device according to clause 11, wherein the control circuit is further configured to:

[0107] The reconstruction steps are performed using the computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

[0108] 13. The apparatus according to clause 11, wherein the control circuitry is further configured to provide the scattering and crosstalk corrected computed tomography image signal information in the projection domain of the object by providing the scattering and crosstalk corrected computed tomography image signal information in the projection domain of the object without using hardware-based scattering profile measurement.

[0109] 14. The device according to clause 11, wherein the control circuit is further configured to:

[0110] Pre-calculate the object scattering database;

[0111] The first model is generated at least in part based on the object scattering database.

[0112] 15. The apparatus according to clause 14, wherein the control circuitry is further configured to pre-calculate the object scattering database by pre-calculating the object scattering database only on a per-material / spectrum basis.

[0113] 16. The device according to clause 11, wherein the control circuit is further configured to:

[0114] Calibrate background scattering information to provide calibrated background scattering information;

[0115] The second model is generated at least in part based on the calibrated background scattering information.

[0116] 17. The device according to clause 16, wherein the control circuitry is further configured to calibrate the background scattering information by calibrating the background scattering information only once on a per-scan basis.

[0117] 18. The device according to clause 11, wherein the control circuit is further configured to:

[0118] Calibrate detector crosstalk information to provide calibrated detector crosstalk information;

[0119] The third model is generated at least in part based on the calibrated detector crosstalk information.

[0120] 19. The device according to clause 18, wherein the control circuitry is further configured to calibrate the detector crosstalk information by calibrating the detector crosstalk information only once on a per-scan basis.

[0121] 20. The apparatus according to claim 11, wherein the control circuitry is further configured to at least partially process the total computed tomography image signal information detected in the projection domain of the object according to the third model to compensate for detector crosstalk by using deconvolution, to process the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

[0122] Those skilled in the art will recognize that various modifications, substitutions, and combinations can be made to the above embodiments without departing from the scope of this disclosure, and such modifications, substitutions, and combinations should be considered within the scope of the inventive concept.

Claims

1. A method characterized by, include: By controlling the circuit: Access memory, in which the following has already been stored: Total computed tomography image signal information detected in the projection domain of the object; A first model representing object scattering, wherein the first model is generated at least in part based on an object scattering database, which is pre-calculated only once for each material and / or spectrum; A second model representing background scattering, wherein the second model is generated at least in part based on calibrated background scattering information, which is calibrated only once per scanner; and A third model representing detector crosstalk, wherein the third model is generated at least in part based on calibrated detector crosstalk information, which is calibrated only once per scanner; and Prior to the reconstruction step, the total computed tomography image signal information detected in the projection domain of the object is processed according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

2. The method of claim 1, wherein, Further includes: The reconstruction steps are performed using the computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

3. The method of claim 1, wherein, in, Providing the computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object includes providing the computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object without using hardware-based scattering profile measurements.

4. The method of claim 1, wherein, Further includes: Pre-calculate the object scattering database; and The first model is generated at least in part based on the object scattering database.

5. The method of claim 4, wherein, in, Pre-calculating the object scattering database includes pre-calculating the object scattering database only on a per-material / spectrum basis.

6. The method of claim 1, wherein, Further includes: Calibrate background scattering information to provide calibrated background scattering information; and The second model is generated at least in part based on the calibrated background scattering information.

7. The method of claim 6, wherein, in, The background scattering information is calibrated only once per scanner.

8. The method of claim 1, wherein, Further includes: Calibrate detector crosstalk information to provide calibrated detector crosstalk information; and The third model is generated at least in part based on the calibrated detector crosstalk information.

9. The method of claim 8, wherein, in, The calibration of the detector crosstalk information involves calibrating the detector crosstalk information only once per scanner.

10. The method according to claim 1, characterized in that, in, Processing the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object, at least in part includes: processing the total computed tomography image signal information detected in the projection domain of the object according to the third model to compensate for detector crosstalk by using deconvolution.

11. A device, characterized in that, include: Memory, in which the following has been stored: Total computed tomography image signal information detected in the projection domain of the object; A first model representing object scattering, wherein the first model is generated at least in part based on an object scattering database, which is pre-calculated only once for each material and / or spectrum; A second model representing background scattering, wherein the second model is generated at least in part based on calibrated background scattering information, which is calibrated only once per scanner; and A third model representing detector crosstalk, wherein the third model is generated at least in part based on calibrated detector crosstalk information, which is calibrated only once per scanner; and A control circuit, operably coupled to the memory and configured to process, prior to the reconstruction step, the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model, and the third model, thereby compensating for object scattering, background scattering, and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

12. The device according to claim 11, characterized in that, in, The control circuit is further configured to: The reconstruction steps are performed using the computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

13. The device according to claim 11, characterized in that, in, The control circuit is further configured to provide the scattering and crosstalk corrected computed tomography image signal information in the projection domain of the object by providing the scattering and crosstalk corrected computed tomography image signal information in the projection domain of the object without using hardware-based scattering profile measurement.

14. The device according to claim 11, characterized in that, in, The control circuit is further configured to: Pre-calculated object scattering database; and The first model is generated at least in part based on the object scattering database.

15. The device according to claim 14, characterized in that, in, The control circuit is further configured to pre-calculate the object scattering database by pre-calculating the object scattering database only on a per-material / spectrum basis.

16. The device according to claim 11, characterized in that, in, The control circuit is further configured to: Calibrate background scattering information to provide calibrated background scattering information; and The second model is generated at least in part based on the calibrated background scattering information.

17. The device according to claim 16, characterized in that, in, The control circuit is further configured to calibrate the background scattering information by calibrating the background scattering information only once on a per-scan basis.

18. The device according to claim 11, characterized in that, in, The control circuit is further configured to: Calibrate detector crosstalk information to provide calibrated detector crosstalk information; and The third model is generated at least in part based on the calibrated detector crosstalk information.

19. The device according to claim 18, characterized in that, in, The control circuit is further configured to calibrate the detector crosstalk information by calibrating the detector crosstalk information only once on a per-scan basis.

20. The device according to claim 11, characterized in that, in, The control circuit is further configured to at least partially process the total computed tomography image signal information detected in the projection domain of the object according to the third model to compensate for detector crosstalk by using deconvolution, and to process the total computed tomography image signal information detected in the projection domain of the object according to each of the first model, the second model and the third model, thereby compensating for object scattering, background scattering and detector crosstalk by providing computed tomography image signal information with scattering and crosstalk correction in the projection domain of the object.

Images