Server stress testing scheduling method and device, electronic equipment and storage medium

Abstract

Embodiments of the present application relate to a server stress testing scheduling method and device, electronic equipment and storage medium, comprising: obtaining stress testing demand information of a target server order to be tested, and determining a target stress testing room based on the stress testing demand information; obtaining stress testing site occupation information of the target stress testing room, and determining a stress testing scheduling scheme of the target server order based on the stress testing site occupation information; and performing stress testing scheduling on the server based on the stress testing scheduling scheme. Thus, according to the stress testing demand of different orders, the corresponding stress testing room is matched, and stress testing scheduling is performed according to the idle stress testing site of the stress testing room, which can improve the equipment utilization, reduce the stress testing cost, and realize intelligent manufacturing.

Description

Technical Field

[0001] This invention relates to the field of server load testing scheduling, and more particularly to a server load testing scheduling method, apparatus, electronic device, and storage medium. Background Technology

[0002] Server manufacturing processes include load testing, which is performed according to order requirements after assembly. Load testing can last for several hours, far exceeding the assembly cycle time; therefore, load testing centers typically have thousands of test stations. The test environments are diverse; configuring each test station with the same environment would inevitably increase costs, reduce equipment utilization, and result in poor economic efficiency. Servers are generally handled manually, either by moving them up and down the test racks, consuming significant manpower. Furthermore, manual monitoring of the test station's status is not possible; it requires checking the system and memorizing numerous commands and information, which is extremely inconvenient.

[0003] Current technologies typically involve a large, open testing center without separate testing chambers. After the server comes off the production line, it is transported to the testing position via a combination of conveyor lines and elevators. This method results in a fixed production line and a fixed elevator track, making it inflexible overall. Alternatively, AGVs can carry the testing carts to the testing chamber, where the machines perform the tests directly on the carts. This method, however, occupies a large amount of space and has a much lower space utilization rate than the testing rack method. Summary of the Invention

[0004] In view of this, in order to solve the above-mentioned technical problems or some of the technical problems, the present invention provides a server stress test scheduling method, apparatus, electronic device and storage medium.

[0005] In a first aspect, embodiments of the present invention provide a server stress testing scheduling method, comprising:

[0006] Obtain the load testing requirements information of the target server order, and determine the target load testing room based on the load testing requirements information;

[0007] Obtain the load testing position occupancy information of the target load testing room, and determine the load testing scheduling scheme for the target server order based on the load testing position occupancy information;

[0008] The server is scheduled for stress testing based on the aforementioned stress testing scheduling scheme.

[0009] In one possible implementation, the method further includes:

[0010] The stress test requirements include at least the power supply voltage, power, network bandwidth, and number of servers to be tested.

[0011] Based on the number of servers to be tested, a preset number of target stress test chambers are selected from the current multiple stress test chambers;

[0012] The pressure testing environment of the available pressure testing positions in the target pressure testing chamber is initialized based on the pressure testing requirement information.

[0013] In one possible implementation, the method further includes:

[0014] If the remaining time of the server orders currently under test in the target load testing room meets either the first formula or the second formula, then the conditions for allocating the target server orders to multiple load testing rooms are determined based on preset rules. The first formula is: t k余 ≤N ij Dt i The second formula is: t k余 ≤(N i订单 -N ij )Dt i ;

[0015] Among them, t k余 N represents the remaining time of the current server orders in the target stress testing room. i订单 Let N be the total number of servers to be tested in order i of the target server to be tested. ij The number of load testing bits Dt allocated to j load testing chambers for target server order i. i The time required to test a server;

[0016] The pass-through rate of the target server orders under test is calculated using a third formula, which is:

[0017] Where, η i Let N be the pass-through rate of order i on the target server to be tested. NG N represents the number of servers that failed the load test. i订单 The total number of servers to be tested for target server order i.

[0018] In one possible implementation, the method further includes:

[0019] Based on the pass-through rate of the target server orders, the required power of the stress testing chamber is determined using the fourth formula, which is: P j =P i N ij η i +∑ k P k N k订单 η k ≤S j ;

[0020] Among them, P i For the power of the i order server, P k The current power of the k-order server being tested, S jThe power distribution capacity of the pressure testing room is specified in section j.

[0021] In one possible implementation, the method further includes:

[0022] Based on the conditions that the number of load testing bits allocated to multiple load testing chambers for the target server order and the conditions that the required power of the load testing chambers must satisfy, we can solve for the maximum value of the number of load testing bits allocated to the j load testing chambers for the target server order i to be tested.

[0023] The number of load testing bits allocated to multiple load testing chambers for the target server order i is determined based on the maximum value of the load testing bit number in the j load testing chambers.

[0024] In one possible implementation, the method further includes:

[0025] Based on the stress test scheduling scheme, a transport vehicle scheduling instruction is sent to the transport vehicle scheduling system so that the transport vehicle scheduling system can schedule a transport vehicle to move the target server to be tested to the stress test position in the target stress test room.

[0026] In one possible implementation, the method further includes:

[0027] Obtain the load test results for each target server under test;

[0028] Servers that fail the stress test will be removed and repaired.

[0029] Secondly, embodiments of the present invention provide a server stress testing scheduling device, comprising:

[0030] The acquisition and determination module is used to acquire the load testing requirement information of the target server order to be tested, and determine the target load testing room based on the load testing requirement information;

[0031] The acquisition and determination module is used to acquire the load testing position occupancy information of the target load testing room, and determine the load testing scheduling scheme of the target server order based on the load testing position occupancy information;

[0032] The scheduling module is used to schedule the server for stress testing based on the stress testing scheduling scheme.

[0033] Thirdly, embodiments of the present invention provide an electronic device, including: a processor and a memory, wherein the processor is configured to execute a server load testing scheduling program stored in the memory to implement the server load testing scheduling method described in the first aspect above.

[0034] Fourthly, embodiments of the present invention provide a storage medium, comprising: the storage medium storing one or more programs, the one or more programs being executable by one or more processors to implement the server stress testing scheduling method described in the first aspect above.

[0035] The server load testing scheduling scheme provided in this invention obtains the load testing requirement information of the target server order and determines the target load testing room based on the load testing requirement information; obtains the load testing slot occupancy information of the target load testing room and determines the load testing scheduling scheme for the target server order based on the load testing slot occupancy information; and performs load testing scheduling on the server based on the load testing scheduling scheme. Compared with existing load testing centers that do not have isolated load testing rooms, making it impossible to perform accurate load testing according to the load testing requirements and resulting in low equipment utilization and poor economic efficiency, this scheme matches the corresponding load testing room according to the load testing requirements of different orders and performs load testing scheduling based on the available load testing slots in the load testing room, which can improve equipment utilization, reduce load testing costs, and realize intelligent manufacturing. Attached Figure Description

[0036] Figure 1 This invention provides an architecture diagram of a server load testing scheduling system.

[0037] Figure 2 This is a schematic diagram of information interaction in a server load testing scheduling system provided by an embodiment of the present invention;

[0038] Figure 3 A schematic flowchart of a server load testing scheduling method provided in an embodiment of the present invention;

[0039] Figure 4 This is a schematic diagram of the layout of a pressure testing center provided in an embodiment of the present invention;

[0040] Figure 5 A schematic diagram of a pressure testing frame provided in an embodiment of the present invention;

[0041] Figure 6 This is a schematic diagram showing the installation details of a pressure testing frame guide rail according to an embodiment of the present invention;

[0042] Figure 7 This is a schematic diagram of an AGV transport vehicle structure provided in an embodiment of the present invention;

[0043] Figure 8 This is a schematic diagram of a server stress testing scheduling device provided in an embodiment of the present invention;

[0044] Figure 9 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0045] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0046] To facilitate understanding of the embodiments of the present invention, further explanations and descriptions will be provided below with reference to the accompanying drawings and specific embodiments. These embodiments do not constitute a limitation on the embodiments of the present invention.

[0047] Figure 1 An architecture diagram of a server load testing scheduling system provided in an embodiment of the present invention is shown below. Figure 1 As shown, the SAP system is a server order issuance system that can issue stress test orders; the MES system is a stress test scheduling and management system according to this embodiment of the invention; the digital process system contains order information and technical instructions obtained from the SAP system, which have been digitized and can be used as parameters by the MES system through a RESTful interface. The call information includes power supply voltage and power, network port bandwidth, etc.; the iWCS system is a transport vehicle management system; and the Diag system is a stress test management system that can push the server's stress test status to the MES system.

[0048] Figure 2 This is a schematic diagram illustrating the information interaction of a server stress testing scheduling system provided in an embodiment of the present invention. The stress testing chamber uses automatic doors, and the automatic door controller is controlled by the iWCS system. Each stress testing chamber initializes its stress testing position information in the MES system, establishing a correspondence between power supply voltage, power, network bandwidth, and the stress testing position. The MES system automatically obtains the stress testing content from the digital process system, parses out the power supply and network environment requirements, and determines the suitable stress testing position. After the servers are assembled, they are transported off the production line by AGV transport vehicles. Once each AGV transport vehicle is full of four servers, it notifies the MES system, and the destination stress testing position is sent from the MES system to the iWCS system. Figure 7 This is a schematic diagram of an AGV transport vehicle provided in an embodiment of the present invention, which can transport 4 servers at a time.

[0049] Furthermore, before the AGV transport vehicle arrives at the target stress testing rack, it moves the servers one by one to the stress testing position, notifies the MES system, and the MES system reminds employees through the software interface to plug in the power cord and network cable and turn on the machine. Empty AGV systems are dispatched by the iWCS system to the AGV buffer area or the server offline standby position.

[0050] Furthermore, after the server is powered on, load testing is performed. The load testing status is pushed from the Diag system to the MES system, and then visualized in the MES system. Employees can see information such as the remaining load testing time, load testing steps, load testing results, and the first-pass yield rate of corresponding orders from the interface. Based on the load testing results pushed by the Diag system, the MES system notifies employees through the visual interface to unplug the power cord and network cable, and scan a code to confirm completion.

[0051] Figure 3 This is a flowchart illustrating a server load testing scheduling method provided in an embodiment of the present invention, as shown below. Figure 3 As shown, the method specifically includes:

[0052] S31. Obtain the load testing requirement information of the target server order to be tested, and determine the target load testing room based on the load testing requirement information.

[0053] This invention embodiment uses a stress testing center, pre-divided into multiple stress testing chambers, to perform stress testing on orders from the target server under test, such as... Figure 4 The diagram shows the layout of the stress testing center. Each stress testing room in the stress testing center is configured with different power supplies and network environments, and the stress testing environment information is initialized in the MES system according to the stress testing position.

[0054] Power supplies include AC 220V / 50Hz and DC 54V. Test room #1 is configured for machines with a power output greater than 10KW, and has two fewer test racks than the other test rooms. Test room #2 provides both AC 220V / 50Hz and DC 54V power. Network options include Gigabit and 10 Gigabit Ethernet. Each test station is equipped with Category 6 cabling for Gigabit Ethernet and 10 Gigabit Ethernet with 10G, 25G, 40G, and 100G fiber optic cables. Test rooms #1-#5 have 25G and 10G fiber optic cables, test room #5 has an additional 40G fiber optic cable, and test rooms #6-#8 have 25G and 100G fiber optic cables. The switch cabinet is located in test room #6, and power is distributed from the cabinet to the switches on each test rack. Power is supplied to the servers via PDU cable trays on the test racks. Fiber optic cables and Category 6 cabling exit from the switches, and the cable trays directly supply power to the corresponding network ports on the servers. The default vertical spacing of the pressure testing rack guide rails is 35mm higher than that of the 2U (89mm) rack, facilitating AGV forklift handling. To ensure compatibility with 1U and 4U servers, guide rails can be added or removed, and the spacing adjusted. The guide rails are connected to the pressure testing rack mounting columns using screws. Power and network cables are configured based on 1U capacity, totaling 3008 cables. A schematic diagram of the pressure testing rack is shown below. Figure 5 As shown, the installation details of the pressure testing frame guide rail are as follows: Figure 6 As shown.

[0055] Before load testing, the load testing center is divided into eight test chambers, each equipped with a precision air conditioner to maintain a temperature range of 18-28°C. The test chambers use automatic doors, whose controllers are controlled by the iWCS system. The load testing requirements of the target server orders are obtained, and the target test chambers are determined based on these requirements. The load testing requirements include at least the power supply voltage, power, network bandwidth, and the number of servers under test. Each test chamber initializes its load testing position information in the MES (Manufacturing Execution System), establishing the correspondence between power supply voltage, power, network bandwidth, and the load testing position.

[0056] S32. Obtain the load testing position occupancy information of the target load testing room, and determine the load testing scheduling scheme of the target server order based on the load testing position occupancy information.

[0057] The MES system automatically acquires stress test data from the digital process system, analyzes the power and network environment requirements, and determines suitable stress test locations. The determination method is as follows:

[0058] To facilitate management and allow for intuitive tracking of order load testing status on the dashboard, the same order should be assigned to the same load testing room whenever possible, with a maximum of 3 load testing rooms. That is, order i should be assigned to load testing room j and load testing position N. ij Must meet:

[0059]

[0060]

[0061] During the production process of order i, if a server in the initially allocated load testing room j has completed its load testing, then order i will be preferentially allocated to load testing room j. During allocation, the j load testing rooms will be N out of the N orders being tested (currently running server orders). kj Remaining time for each server t k余 If either the first formula or the second formula is satisfied, the first formula is: t k余 ≤N ij Dt i The second formula is: t k余 ≤(N i订单 -N ij )Dt i ;

[0062] Among them, t k余 N represents the remaining time of the current server orders in the target stress testing room. i订单 Let N be the total number of servers to be tested in order i of the target server to be tested. ij The number of load testing bits Dt allocated to j load testing chambers for target server order i. i The time required to test a server;

[0063] Then we have:

[0064]

[0065] Where, N j余 These are the remaining pressure testing positions.

[0066] like:

[0067] t k余 ≥Tt i

[0068] Among them, Tt i This refers to the aging time.

[0069] Then we have:

[0070] N j余 =N ij

[0071] The pass-through rate of the target server orders under test is calculated using a third formula, which is:

[0072] Where, η i Let N be the pass-through rate of order i on the target server to be tested. NG N represents the number of servers that failed the load test. i订单 The total number of servers to be tested for target server order i.

[0073] Furthermore, based on the pass-through rate of the target server's orders, the required power of the stress testing chamber is determined using the fourth formula, which is: P j =P i N ij η i +∑ k P k N k订单 η k ≤S j , where P i For the power of the i order server, P k The current power of the k-order server being tested, S j The power distribution capacity of the pressure testing room is specified in section j.

[0074] Based on the above algorithm, N can be solved. ij The maximum value is obtained by dynamically determining the maximum number of load testing bits that order i can be allocated to j load testing rooms, thus obtaining the load testing scheduling scheme.

[0075] S33. Perform load testing on the server based on the load testing scheduling scheme.

[0076] After determining the load testing scheduling plan, the MES system matches the load testing environment requirements of the currently offline servers based on the remaining load testing positions and those about to complete their tests. It then communicates with the AGV scheduling software iWCS via a RESTful interface to dispatch AGV transport vehicles to the corresponding load testing positions. The AGV transport vehicles enter and exit the load testing chamber via Modbus TCP protocol, communicating with the automatic door controller to control the door opening and closing.

[0077] Before the AGV reaches the target stress testing rack, it moves the servers one by one to the stress testing position and notifies the MES system. The MES system then reminds employees to plug in the power cord and network cable and turn on the server via the software interface. Empty AGVs are dispatched by the iWCS system to the AGV buffer area or the server offline standby position.

[0078] After the server boots up, load testing is performed. The load testing status is pushed from the Diag system to the MES, and then visualized in the MES. Employees can see information such as the remaining load testing time, load testing steps, load testing results, and the first-pass yield rate of the corresponding orders from the interface.

[0079] Based on the stress test results pushed by the Diag system, the MES system notifies employees through a visual interface to unplug the power cord and network cable, and scan the code to confirm completion. Then, AGVs are dispatched to remove the servers that have completed the stress test from the stress test rack. Servers that fail the stress test are removed from the rack at any time and can be repaired on-site or transported to the repair area by AGVs. Servers that pass the stress test are removed in batches and transported to the next process post-test area after the rack is full.

[0080] It should be noted that when loading / unloading the server from the AGV transport station, the order number needs to be bound / unbound to the AGV location. The server's order number is automatically obtained by scanning the barcode at the offline location. Similarly, the test position on the load testing rack needs to be bound / unbound to the server's order number. The server order number is transmitted through the bound AGV location. Unbinding is completed by an employee scanning the server's MyRa information with a barcode scanner in the MES interface. This MyRa information includes, but is not limited to, server attribute information tags, serial numbers, and other information that uniquely identifies the server.

[0081] The server load testing scheduling method provided by this invention solves the problem of intelligent scheduling of servers after assembly to the test position. It uses AGVs to transport servers and automatically load and unload them from the load testing rack, reducing manpower input. It also establishes information flow between the MES (Manufacturing Execution System), digital process system, Diag system, and iWCS system, constructing an information system centered on MES. This makes load testing more energy-efficient, resource utilization more efficient, and achieves the goals of intelligent and green manufacturing.

[0082] Figure 8 A schematic diagram of a server stress testing scheduling device provided in an embodiment of the present invention specifically includes:

[0083] The acquisition and determination module 801 is used to acquire the load testing requirement information of the target server order and determine the target load testing room based on the load testing requirement information. For detailed explanations, please refer to the relevant descriptions in the above method embodiments, which will not be repeated here.

[0084] The acquisition and determination module 801 is used to acquire the load testing position occupancy information of the target load testing room, and determine the load testing scheduling scheme for the target server order based on the load testing position occupancy information. For detailed explanations, please refer to the relevant descriptions in the above method embodiments, which will not be repeated here.

[0085] The scheduling module 802 is used to schedule server load tests based on the load test scheduling scheme. For detailed explanations, please refer to the relevant descriptions in the above method embodiments; they will not be repeated here.

[0086] The server stress testing scheduling device provided in this embodiment can be as follows: Figure 4 The server load testing scheduling device shown can perform tasks such as... Figure 3 All steps of the server load testing scheduling method are implemented to achieve Figure 3 For details on the technical effects of the server load testing scheduling method shown, please refer to [link / reference]. Figure 3 The relevant descriptions are presented concisely and will not be elaborated upon here.

[0087] Figure 9 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention. Figure 9 The illustrated electronic device 900 includes at least one processor 901, a memory 902, at least one network interface 904, and other user interfaces 903. The various components in the electronic device 900 are coupled together via a bus system 905. It is understood that the bus system 905 is used to implement communication between these components. In addition to a data bus, the bus system 905 also includes a power bus, a control bus, and a status signal bus. However, for clarity, ... Figure 9 The general labeled all buses as Bus System 905.

[0088] The user interface 903 may include a display, keyboard, or clicking device (e.g., mouse, trackball, touchpad, or touchscreen).

[0089] It is understood that the memory 902 in the embodiments of the present invention can be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory. The non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. The volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced Synchronous DRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), and Direct Rambus RAM (DRRAM). The memory 902 described herein is intended to include, but is not limited to, these and any other suitable types of memory.

[0090] In some implementations, memory 902 stores elements, executable units or data structures, or subsets thereof, or extended sets thereof: operating system 9021 and application program 9022.

[0091] The operating system 9021 includes various system programs, such as the framework layer, core library layer, and driver layer, used to implement various basic business functions and handle hardware-based tasks. The application program 9022 includes various applications, such as a media player and a browser, used to implement various application functions. The program implementing the method of this embodiment can be included in the application program 9022.

[0092] In this embodiment of the invention, by calling the program or instructions stored in the memory 902, specifically the program or instructions stored in the application program 9022, the processor 901 executes the method steps provided in each method embodiment, including, for example:

[0093] Obtain the load testing requirement information of the target server order to be tested, and determine the target load testing room based on the load testing requirement information; obtain the load testing slot occupancy information of the target load testing room, and determine the load testing scheduling scheme of the target server order based on the load testing slot occupancy information; perform load testing scheduling on the server based on the load testing scheduling scheme.

[0094] In one possible implementation, the stress testing requirement information includes at least power supply voltage, power, network bandwidth, and the number of servers under test; based on the number of servers under test, a preset number of target stress testing rooms are selected from the current multiple stress testing rooms; and based on the stress testing requirement information, the stress testing environment of the empty stress testing positions in the target stress testing rooms is initialized.

[0095] In one possible implementation, if the remaining time of the server orders currently under test in the target load testing room satisfies either the first formula or the second formula, then the conditions for the number of load testing bits allocated to multiple load testing rooms for the target server orders are determined based on preset rules. The first formula is: t k余 ≤N ij Dt i The second formula is: t k余 ≤(N i订单 -N ij )Dt i ; where t k余 N represents the remaining time of the current server orders in the target stress testing room. i订单 Let N be the total number of servers to be tested in order i of the target server to be tested. ij The number of load testing bits Dt allocated to j load testing chambers for target server order i. i The time required to test a server; the pass-through rate of the orders for the target server under test is calculated using a third formula, which is: Where, η i Let N be the pass-through rate of order i on the target server to be tested. NG N represents the number of servers that failed the load test. i订单 The total number of servers to be tested for target server order i.

[0096] In one possible implementation, the power requirement of the stress testing chamber is determined based on the pass-through rate of the target server's orders using a fourth formula, which is: P j =P i N ij η i +∑ k P k N k订单 η k ≤S j Among them, P i For the power of the i order server, Pk The current power of the k-order server being tested, S j The power distribution capacity of the pressure testing room is specified in section j.

[0097] In one possible implementation, the maximum value of the number of load testing bits allocated to the j load testing chambers for the target server order i is solved based on the conditions satisfied by the number of load testing bits allocated to the multiple load testing chambers for the target server order i and the conditions satisfied by the power required by the load testing chambers; the number of load testing bits allocated to the multiple load testing chambers for the target server order i is determined based on the maximum value of the number of load testing bits allocated to the j load testing chambers for the target server order i.

[0098] In one possible implementation, a transport vehicle scheduling instruction is sent to the transport vehicle scheduling system based on the stress test scheduling scheme, so that the transport vehicle scheduling system can schedule a transport vehicle to move the target server to be tested to the stress test position in the target stress test room.

[0099] In one possible implementation, the load test results for each target server under test are obtained; servers that fail the load test are taken down and repaired.

[0100] The methods disclosed in the above embodiments of the present invention can be applied to or implemented by processor 901. Processor 901 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the integrated logic circuit of the hardware or by instructions in the form of software in processor 901. The processor 901 may be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of the present invention. The general-purpose processor may be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of the present invention can be directly embodied in the execution of a hardware decoding processor, or executed by a combination of hardware and software units in the decoding processor. The software units may be located in random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, or other mature storage media in the art. The storage medium is located in memory 902. Processor 901 reads the information in memory 902 and, in conjunction with its hardware, completes the steps of the above method.

[0101] It is understood that the embodiments described herein can be implemented in hardware, software, firmware, middleware, microcode, or a combination thereof. For hardware implementation, the processing unit can be implemented in one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers, microprocessors, other electronic units for performing the functions described herein, or combinations thereof.

[0102] For software implementation, the techniques described herein can be implemented by units that perform the functions described herein. The software code can be stored in memory and executed by a processor. The memory can be implemented in the processor or external to the processor.

[0103] The electronic device provided in this embodiment may be as follows: Figure 9 The electronic device shown can perform the following: Figure 3 All steps of the server load testing scheduling method are implemented to achieve... Figure 3 For details on the technical effects of the server load testing scheduling method shown, please refer to [link / reference]. Figure 3 The relevant descriptions are presented concisely and will not be elaborated upon here.

[0104] This invention also provides a storage medium (computer-readable storage medium). This storage medium stores one or more programs. The storage medium may include volatile memory, such as random access memory; the memory may also include non-volatile memory, such as read-only memory, flash memory, hard disk, or solid-state drive; the memory may also include combinations of the above types of memory.

[0105] When one or more programs in the storage medium can be executed by one or more processors, the above-mentioned server stress test scheduling method executed on the electronic device side can be implemented.

[0106] The processor is used to execute a server load testing scheduler stored in memory to implement the following steps of a server load testing scheduling method executed on the electronic device side:

[0107] Obtain the load testing requirement information of the target server order to be tested, and determine the target load testing room based on the load testing requirement information; obtain the load testing slot occupancy information of the target load testing room, and determine the load testing scheduling scheme of the target server order based on the load testing slot occupancy information; perform load testing scheduling on the server based on the load testing scheduling scheme.

[0108] In one possible implementation, the stress testing requirement information includes at least power supply voltage, power, network bandwidth, and the number of servers under test; based on the number of servers under test, a preset number of target stress testing rooms are selected from the current multiple stress testing rooms; and based on the stress testing requirement information, the stress testing environment of the empty stress testing positions in the target stress testing rooms is initialized.

[0109] In one possible implementation, if the remaining time of the server orders currently under test in the target load testing room satisfies either the first formula or the second formula, then the conditions for the number of load testing bits allocated to multiple load testing rooms for the target server orders are determined based on preset rules. The first formula is: t k余 ≤N ij Dt i The second formula is: t k余 ≤(N i订单 -N ij )Dt i ; where t k余 N represents the remaining time of the current server orders in the target stress testing room. i订单 Let N be the total number of servers to be tested in order i of the target server to be tested. ij The number of load testing bits Dt allocated to j load testing chambers for target server order i. i The time required to test a server; the pass-through rate of the orders for the target server under test is calculated using a third formula, which is: Where, η i Let N be the pass-through rate of order i on the target server to be tested. NG N represents the number of servers that failed the load test. i订单 The total number of servers to be tested for target server order i.

[0110] In one possible implementation, the power requirement of the stress testing chamber is determined based on the pass-through rate of the target server's orders using a fourth formula, which is: P j =P i N ij η i +∑ k P k N k订单 η k ≤S j Among them, P i For the power of the i order server, Pk The current power of the k-order server being tested, S j The power distribution capacity of the pressure testing room is specified in section j.

[0111] In one possible implementation, the maximum value of the number of load testing bits allocated to the j load testing chambers for the target server order i is solved based on the conditions satisfied by the number of load testing bits allocated to the multiple load testing chambers for the target server order i and the conditions satisfied by the power required by the load testing chambers; the number of load testing bits allocated to the multiple load testing chambers for the target server order i is determined based on the maximum value of the number of load testing bits allocated to the j load testing chambers for the target server order i.

[0112] In one possible implementation, a transport vehicle scheduling instruction is sent to the transport vehicle scheduling system based on the stress test scheduling scheme, so that the transport vehicle scheduling system can schedule a transport vehicle to move the target server to be tested to the stress test position in the target stress test room.

[0113] In one possible implementation, the load test results for each target server under test are obtained; servers that fail the load test are taken down and repaired.

[0114] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0115] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein can be implemented in hardware, a software module executed by a processor, or a combination of both. The software module can be located in random access memory (RAM), main memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art.

[0116] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A server stress testing scheduling method, characterized in that, include: Obtain the load testing requirements information of the target server order, and determine the target load testing room based on the load testing requirements information; Obtain the load testing position occupancy information of the target load testing room, and determine the load testing scheduling scheme for the target server order based on the load testing position occupancy information; The server is scheduled for stress testing based on the aforementioned stress testing scheduling scheme. The step of obtaining the load testing position occupancy information of the target load testing room and determining the load testing scheduling plan for the target server order based on the load testing position occupancy information includes: If the remaining time of the server orders currently under test in the target load testing room meets either the first formula or the second formula, then the conditions for allocating the target server orders to multiple load testing rooms are determined based on preset rules. The first formula is: The second formula is: ; in, The remaining time for the server orders currently being tested in the target stress testing room. Let i be the total number of servers to be tested in order i of the target server to be tested. The number of bits used in the load testing of the j load testing chambers allocated to the target server order i. The time required to test a server; The pass-through rate of the target server orders under test is calculated using a third formula, which is: ; in, Let i be the pass-through rate of order i on the target server to be tested. This represents the number of servers that failed the load test. The total number of servers to be tested for target server order i.

2. The method according to claim 1, characterized in that, The stress test requirements include at least the power supply voltage, power, network bandwidth, and number of servers to be tested. The step of obtaining the load testing requirement information of the target server order and determining the target load testing room based on the load testing requirement information includes: Based on the number of servers to be tested, a preset number of target stress test chambers are selected from the current multiple stress test chambers; The pressure testing environment of the available pressure testing positions in the target pressure testing chamber is initialized based on the pressure testing requirement information.

3. The method according to claim 1 or 2, characterized in that, The method further includes: Based on the pass-through rate of the orders of the target server under test, the required power of the stress test chamber is determined using the fourth formula, which is: ; in, For i order server power, The current power of the k-order server being tested. The power distribution capacity of the pressure testing room is specified in section j.

4. The method according to claim 3, characterized in that, The method further includes: Based on the conditions that the number of load testing bits allocated to multiple load testing chambers for the target server order and the conditions that the required power of the load testing chambers must satisfy, we can solve for the maximum value of the number of load testing bits allocated to the j load testing chambers for the target server order i to be tested. The number of load testing bits allocated to multiple load testing chambers for the target server order i is determined based on the maximum value of the load testing bit number in the j load testing chambers.

5. The method according to claim 4, characterized in that, The stress testing scheduling of the server based on the stress testing scheduling scheme includes: Based on the stress test scheduling scheme, a transport vehicle scheduling instruction is sent to the transport vehicle scheduling system so that the transport vehicle scheduling system can schedule a transport vehicle to move the target server to be tested to the stress test position in the target stress test room.

6. The method according to claim 1, characterized in that, The method further includes: Obtain the load test results for each target server under test; Servers that fail the stress test will be removed and repaired.

7. A server stress testing scheduling device, characterized in that, include: The acquisition and determination module is used to acquire the load testing requirement information of the target server order to be tested, and determine the target load testing room based on the load testing requirement information; The acquisition and determination module is used to acquire the load testing position occupancy information of the target load testing room, and determine the load testing scheduling scheme of the target server order based on the load testing position occupancy information; The scheduling module is used to schedule the server for stress testing based on the stress testing scheduling scheme. The step of obtaining the load testing position occupancy information of the target load testing room and determining the load testing scheduling plan for the target server order based on the load testing position occupancy information includes: If the remaining time of the server orders currently under test in the target load testing room meets either the first formula or the second formula, then the conditions for allocating the target server orders to multiple load testing rooms are determined based on preset rules. The first formula is: The second formula is: ; in, The remaining time for the server orders currently under test in the target stress testing room. Let i be the total number of servers to be tested in order i of the target server to be tested. The number of bits used in the load testing of the j load testing chambers allocated to the target server order i. The time required to test a server; The pass-through rate of the target server orders under test is calculated using a third formula, which is: ; in, Let i be the pass-through rate of order i on the target server to be tested. This represents the number of servers that failed the load test. The total number of servers to be tested for target server order i.

8. An electronic device, characterized in that, include: A processor and a memory, wherein the processor is configured to execute a server load testing scheduler stored in the memory to implement the server load testing scheduling method according to any one of claims 1 to 6.

9. A storage medium, characterized in that, The storage medium stores one or more programs, which can be executed by one or more processors to implement the server stress testing scheduling method according to any one of claims 1 to 6.

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