True amplitude migration method, device, equipment and storage medium

Abstract

The disclosure provides a true amplitude migration imaging method, device, equipment and storage medium, and belongs to the technical field of oil and gas exploration. The migration imaging method comprises the following steps: determining the position of a transmission point in a three-dimensional coordinate system, the transmission point being the position of a seismic wave source; diffracting simulated multiple waves with the transmission point as a diffraction point, the simulated multiple waves being generated based on actual multiple waves, the actual multiple waves being waves formed by multiple diffractions of the seismic wave in the stratum; obtaining a diffraction waveform diagram of the simulated multiple waves in the diffraction process; and obtaining a true amplitude migration image of seismic data based on the diffraction waveform diagram. Through the imaging method, the true amplitude migration imaging efficiency of seismic data can be greatly improved.

Description

TECHNICAL FIELD

[0001] The present disclosure belongs to the technical field of oil and gas exploration, and particularly relates to a true-amplitude migration imaging method, device, equipment and storage medium. BACKGROUND

[0002] The seismic exploration method is an important method for oil, natural gas and other energy exploration, and the true-amplitude migration imaging method of seismic data is a key link of modern seismic exploration data processing, and provides necessary technical support for seismic interpretation and lithology inversion.

[0003] In the related art, in the true-amplitude migration imaging method of seismic data, first, seismic data is acquired, the seismic data including a wave field value of a surface, and then, according to a wave equation, the wave field value of the surface is used to image a subsurface structure.

[0004] However, since the wave equation contains a second-order partial derivative in the depth direction, to make the wave equation solvable in mathematics, the wave field value of the surface and the partial derivative of the surface wave field in the depth direction must be determined. When the seismic data is acquired, the partial derivative of the surface wave field in the depth direction cannot be obtained. Therefore, various approximate treatments are performed on the wave equation, so as to image the subsurface structure by using the wave field value of the surface. The approximate treatment of the wave equation will cause imaging distortion, so that the true-amplitude migration image cannot truly reflect the lithology change of the subsurface structure, which is not conducive to lithology exploration. SUMMARY

[0005] The present disclosure provides a true-amplitude migration imaging method, device, equipment and storage medium, which can greatly improve the true-amplitude migration imaging efficiency of seismic data. The technical solution is as follows:

[0006] The present disclosure provides a true-amplitude migration imaging method, which comprises:

[0007] determining a position of a transmitting point in a three-dimensional coordinate system, the transmitting point being a position of a seismic wave source;

[0008] diffracting a simulated multiple wave with the transmitting point as a diffraction point, the simulated multiple wave being generated based on an actual multiple wave, the actual multiple wave being a wave formed by multiple diffractions of the seismic wave through a stratum; acquiring a diffraction waveform diagram of the simulated multiple wave in the diffraction process; and obtaining a true-amplitude migration image of seismic data based on the diffraction waveform diagram.

[0009] In another implementation manner of the present disclosure, the acquiring of the diffraction waveform diagram of the simulated multiple wave in the diffraction process comprises:

[0010] In the process of diffracting the simulated multiple wave with the emission point as a diffraction point, the simulated multiple wave is captured at the same time interval to obtain a plurality of diffraction capture points; a position of the diffraction capture point in the three-dimensional coordinate system is determined; a diffraction capture diagram formed by the diffraction capture point is obtained according to the position of the diffraction capture point in the three-dimensional coordinate system; a wave shape diagram corresponding to different time periods of the simulated multiple wave in the three-dimensional coordinate system is obtained according to the diffraction capture diagram, and each time period corresponds to a plurality of wave shape diagrams of different viewing angles; and a diffraction wave shape diagram of the multiple wave in the three-dimensional coordinate system is obtained according to the wave shape diagram.

[0011] In another implementation manner of the present disclosure, the determination of the position of the diffraction capture point in the three-dimensional coordinate system comprises:

[0012] The Z-axis direction coordinate value of the diffraction capture point in the three-dimensional coordinate system is obtained according to the following formula:

[0013]

[0014] Wherein, F a is the Z-axis direction coordinate value of the diffraction capture point in the three-dimensional coordinate system, and is also the amplitude value of the diffraction capture point; I n is the Z-axis direction coordinate value of the emission point in the three-dimensional coordinate system; E XW is the perturbation wave field value; C a V is the corresponding Z-axis direction coordinate value of the diffraction capture point in the three-dimensional coordinate system when the diffraction capture point is captured, and the Z-axis direction is used to represent the direction perpendicular to the ground.

[0015] In another implementation manner of the present disclosure, the wave shape diagram comprises an X-viewing-angle wave shape diagram, a Y-viewing-angle wave shape diagram and a Z-viewing-angle wave shape diagram, the X-viewing-angle wave shape diagram is a diffraction capture diagram observed along the X-axis direction in the three-dimensional coordinate system, the Y-viewing-angle wave shape diagram is a diffraction capture diagram observed along the Y-axis direction in the three-dimensional coordinate system, and the Z-viewing-angle wave shape diagram is a diffraction capture diagram observed along the Z-axis direction in the three-dimensional coordinate system; and the obtaining of the diffraction wave shape diagram of the multiple wave in the three-dimensional coordinate system according to the wave shape diagram comprises:

[0016] arranging the partial wave shape diagrams corresponding to different time periods into the XOY plane of the three-dimensional coordinate system according to the coordinates corresponding to the starting positions of the partial wave shape diagrams, to obtain information of intersection points between the X-view partial wave shape diagram, the Y-view partial wave shape diagram and the Z-view partial wave shape diagram; obtaining starting positions and ending positions of a combined wave shape diagram of different time periods according to the information of the intersection points, the combined wave shape diagram being a combined wave shape diagram formed by combining the X-view partial wave shape diagram, the Y-view partial wave shape diagram and the Z-view partial wave shape diagram together; obtaining a diffraction wave shape diagram of the multiple waves in the three-dimensional coordinate system according to the starting positions and the ending positions of the combined wave shape diagram of different time periods.

[0017] In yet another implementation manner of the present disclosure, the obtaining of the starting positions and the ending positions of the combined wave shape diagram of different time periods according to the information of the intersection points comprises:

[0018] If the number of the intersection points is zero, the average value of the sum of the coordinate values of different coordinate axes corresponding to the starting positions of the X-view partial wave shape diagram, the Y-view partial wave shape diagram and the Z-view partial wave shape diagram is taken as the coordinate value of the starting position of the combined wave shape diagram, and the average value of the sum of the coordinate values of different coordinate axes corresponding to the ending positions of the X-view partial wave shape diagram, the Y-view partial wave shape diagram and the Z-view partial wave shape diagram is taken as the coordinate value of the ending position of the combined wave shape diagram.

[0019] If the number of the intersection points is one, the position corresponding to the intersection point is taken as the starting position and the ending position of the combined wave shape diagram.

[0020] If the number of the intersection points is two, the positions of the two intersection points are respectively taken as the starting position and the ending position of the combined wave shape diagram.

[0021] If the number of the intersection points is more than two, the positions of two intersection points with the largest Y-axis direction coordinate difference among the positions of the intersection points are selected as the starting position and the ending position of the combined wave shape diagram.

[0022] In yet another implementation manner of the present disclosure, the obtaining of the true amplitude migration image of the seismic data based on the diffraction wave shape diagram comprises:

[0023] performing an amplitude-preserving imaging processing on the diffraction wave shape diagram to obtain the true amplitude migration image.

[0024] In another aspect, a true-amplitude migration device is also provided, which includes a shot point determination module configured to determine a position of a shot point in a three-dimensional coordinate system, the shot point being a position of a source of seismic waves; a diffraction module configured to diffract a simulated multiple wave at the shot point, the simulated multiple wave being generated based on an actual multiple wave, the actual multiple wave being a wave formed by multiple diffractions of the seismic waves through a stratum; a diffraction waveform map acquisition module configured to acquire a diffraction waveform map of the simulated multiple wave in the diffraction process; and an imaging module configured to obtain a true-amplitude migration image of seismic data based on the diffraction waveform map.

[0025] In yet another implementation manner of the present disclosure, a computer device is also provided, which includes a processor and a memory configured to store instructions executable by the processor; and the processor is configured to execute the above method.

[0026] In yet another implementation manner of the present disclosure, a computer storage medium is also provided, which stores computer instructions, and the computer instructions are executed by a processor to implement the above method.

[0027] The technical scheme provided by the embodiments of the present disclosure has the following beneficial effects:

[0028] The true-amplitude migration method provided by the embodiments of the present disclosure has the following beneficial effects: BRIEF DESCRIPTION OF DRAWINGS

[0029] In order to more clearly illustrate the technical scheme in the embodiments of the present disclosure, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present disclosure, and other drawings can be obtained by those skilled in the art without creative effort.

[0030] Figure 1 is a true-amplitude migration method flowchart provided by the embodiments of the present disclosure;

[0031] Figure 2 is another true-amplitude migration method flowchart provided by the embodiments of the present disclosure;

[0032] Figure 3is a structural schematic diagram of a true amplitude migration imaging device provided by an embodiment of the present disclosure.

[0033] Figure 4 is a structural schematic diagram of a computer device provided by an embodiment of the present disclosure. DETAILED DESCRIPTION

[0034] For the purpose, technical solutions and advantages of the present disclosure to be clearer, the present disclosure will be further described in detail with reference to the accompanying drawings.

[0035] An embodiment of the present disclosure provides a true amplitude migration imaging simulation method. The method can be executed by a computer device. As shown in the method includes: Figure 1

[0036] S101: determining the position of a transmitting point in a three-dimensional coordinate system, the transmitting point being the position of a wave point source.

[0037] The wave point source is a wave point transmitting base station.

[0038] S102: diffracting a simulated multiple wave with the transmitting point as a diffraction point, the simulated multiple wave being generated based on an actual multiple wave, the actual multiple wave being a wave formed by multiple diffractions of a seismic wave in a stratum.

[0039] In an embodiment of the present disclosure, diffraction can also be referred to as diffraction. The simulated multiple wave is diffracted after passing through an obstacle (the size of the obstacle is not greater than the wavelength of the simulated multiple wave) located at the transmitting point.

[0040] The size of the obstacle can be freely set as long as the diffraction condition is met.

[0041] In the present embodiment, the actual multiple wave is established by establishing a wave point transmitting base station on the ground, and then transmitting a propagating seismic wave (for example, a rammer simulation, a rammer hammering the ground) to the stratum through the wave point transmitting base station. The seismic wave is formed by multiple reflections in the stratum.

[0042] The actual multiple wave is obtained by separating the seismic data. The simulated multiple wave is obtained by simulating the propagation characteristics of the actual multiple wave according to the propagation process of the actual multiple wave. The simulated multiple wave has the same physical characteristics as the actual multiple wave, such as the same amplitude, phase and propagation speed. The present embodiment does not limit the way of generating the simulated multiple wave based on the actual multiple wave, and any computer simulation algorithm and mathematical algorithm can be used to achieve it.

[0043] S103: obtaining a diffraction waveform diagram of the simulated multiple wave in the diffraction process.

[0044] S104: obtaining a true amplitude migration image of the seismic data based on the diffraction waveform diagram. ​

[0045] The true-amplitude migration method provided by the embodiments of the present disclosure can be used for imaging seismic data. The imaging simulation method is used to obtain a diffraction waveform diagram of the simulated multiple waves in a three-dimensional coordinate system by taking the simulation multiple waves as the diffraction point, and a true-amplitude migration image of the seismic data is formed according to the diffraction waveform diagram. In this way, the simulated multiple waves can be used as the input data, the actual surface multiple waves can be inversely reflected on each stratum interface in the form of the diffraction waveform diagram, that is, the actual multiple waves can be returned to the real structure of the stratum, so that the true-amplitude migration image of the seismic data can be obtained. The above method can obtain the true-amplitude migration imaging of the seismic data without solving the wave equation approximately, greatly improves the accuracy of the imaging, and makes the true-amplitude migration image more truly reflect the lithological changes of the underground structure.

[0046] Figure 2 FIG. 2 is a flowchart of another true-amplitude migration method provided by the embodiments of the present disclosure. The method can be executed by a computer device. In combination with FIG. 1, Figure 2 The method comprises the following steps.

[0047] S201: Determine the position of the emission point in the three-dimensional coordinate system.

[0048] Exemplarily, the three-dimensional coordinate system is a Cartesian coordinate system, which comprises X, Y and Z axes. The direction of the Z axis is perpendicular to the ground, which is referred to as the Z axis direction.

[0049] In this embodiment, the emission point is denoted as a γ point, and the position of the γ point in the three-dimensional coordinate system can be positioned at a position with a non-zero coordinate value in the Z axis direction in the three-dimensional coordinate system.

[0050] S202: Perform diffraction on the simulation multiple waves by taking the emission point as the diffraction point.

[0051] The related content of the simulation multiple waves is described in S102, and the detailed description is omitted here.

[0052] S203: Capture the simulation multiple waves at the same time interval during the diffraction of the simulation multiple waves by taking the emission point as the diffraction point, and obtain the positions of a plurality of diffraction capture points in the three-dimensional coordinate system.

[0053] Exemplarily, the time interval can be set according to actual needs, and is usually in the order of milliseconds. For example, 1 millisecond, 2 milliseconds, etc. In this embodiment, the simulation multiple waves are captured every 1 millisecond, and the positions of a plurality of diffraction capture points in the three-dimensional coordinate system can be obtained.

[0054] S204: Obtain a diffraction capture diagram formed by the diffraction capture points according to the positions of the diffraction capture points in the three-dimensional coordinate system.

[0055] In some examples, the step S204 comprises:

[0056] 2041: correcting the position of the diffraction capture point in the three-dimensional coordinate system according to the perturbation wave field.

[0057] 2041 comprises:

[0058] (1) determining a correction factor based on the perturbation wave field value.

[0059] The correction factor is used to represent the degree of influence of the perturbation wave field value on the simulation of the multiple wave in the diffraction process.

[0060] The perturbation wave field value refers to the amplitude value of a certain position in the perturbation wave field at a certain time. In the embodiments of the present disclosure, the perturbation wave field value refers to the perturbation wave field value of the emission point at the sampling time. The perturbation wave field value can be calculated according to the wave field value, the sound speed field and the source wavelet in the environment corresponding to the emission point at the sampling time. The specific calculation process can refer to the ray tracing method in the related art, which will not be described here.

[0061] Wherein, the wave field value, the sound speed field and the source wavelet in the environment corresponding to the emission point at the sampling time can be measured. In the present embodiment, the wave field value, the sound speed field and the source wavelet in the environment are determined again every set time length (for example, 15-20 min), so as to calculate the perturbation wave field value corresponding to different time periods.

[0062] In the present embodiment, the correction factor can be equal to the proportional value of the position of the emission point and the perturbation wave field value. The greater the proportional value, the greater the influence of the perturbation wave field value on the simulation of the multiple wave in the diffraction process.

[0063] The correction factor can be calculated according to the following formula:

[0064] S C =I n ÷E XW ; (1)

[0065] In formula (1), Sc is the proportional value, I n is the Z-axis direction coordinate value of the emission point in the three-dimensional coordinate system, and E XW is the perturbation wave field value.

[0066] (2) correcting the positions of the plurality of diffraction capture points in the three-dimensional coordinate system according to the correction factor.

[0067] The positions of the plurality of diffraction capture points in the three-dimensional coordinate system are determined by the following formula:

[0068] F a =S C ×C a V; (2)

[0069] In formula (2), F a is the coordinate value of the Z-axis direction of the modified position of the diffraction capture point in the three-dimensional coordinate system, and is also the amplitude value of the diffraction capture point; C a V is the coordinate value of the Z-axis direction of the position of the diffraction capture point in the three-dimensional coordinate system.

[0070] That is, the step 2041 can include:

[0071] According to the following formula (3), the Z-axis direction coordinate value of the diffraction capture point in the three-dimensional coordinate system is obtained;

[0072]

[0073] The meanings of the parameters in formula (3) are described in the foregoing formula (1) and (2).

[0074] The X-axis direction coordinate value and the Y-axis direction coordinate value of the modified position of the diffraction capture point in the three-dimensional coordinate system are considered as the corresponding coordinate values before the modification.

[0075] 2042: Obtain a diffraction capture image formed by the diffraction capture point according to the position of the modified diffraction capture point in the three-dimensional coordinate system.

[0076] Optionally, 2042 includes:

[0077] Connect the modified positions of a plurality of diffraction capture points in a unit time length into a line as the corresponding diffraction capture image of the plurality of diffraction capture points.

[0078] Exemplarily, the unit time length is an integer multiple of the foregoing time interval, which can be set according to actual needs. For example, one unit time length includes 1000 time intervals. When the time interval is 1 millisecond, the unit time length is 1 second.

[0079] In other examples, the diffraction capture image formed by the diffraction capture point is obtained directly according to the position of the diffraction capture point in the three-dimensional coordinate system. That is, the positions of a plurality of diffraction capture points in a unit time length are connected into a line as the corresponding diffraction capture image of the plurality of diffraction capture points.

[0080] S205: Obtain a divided wave image corresponding to different time periods of the simulated multiple waves in the three-dimensional coordinate system according to the diffraction capture image.

[0081] The split waveforms corresponding to each time period each include an X-view split waveform, a Y-view split waveform and a Z-view split waveform, the X-view split waveform being a diffraction capture observed along an X-axis direction in a three-dimensional coordinate system, the Y-view split waveform being a diffraction capture observed along a Y-axis direction in the three-dimensional coordinate system, and the Z-view split waveform being a diffraction capture observed along a Z-axis direction in the three-dimensional coordinate system.

[0082] The diffraction capture is a three-dimensional solid image in the three-dimensional coordinate system, so that the X-view split waveform, the Y-view split waveform and the Z-view split waveform corresponding to different coordinate axes in the three-dimensional coordinate system can be obtained.

[0083] Here, one time period includes a plurality of unit time lengths in succession, and different time periods do not overlap with each other. In the embodiments of the present disclosure, the number of unit time lengths included in one time period can be set according to actual needs, for example, 10 or 20 unit time lengths, etc. For example, when the unit time length is 1 second, one time period includes 10 unit time lengths, which is 10 seconds.

[0084] In the embodiments, the split waveforms are obtained every 10 seconds. That is, first, the diffraction capture in 10 consecutive seconds is obtained, and then three split waveforms corresponding to the diffraction capture in the 10 consecutive seconds are obtained.

[0085] S206: obtaining a diffraction waveform diagram of the simulated multiple waves in the three-dimensional coordinate system according to the split waveforms.

[0086] Optionally, S206 includes:

[0087] 2061: arranging the split waveforms corresponding to different time periods into the XOY plane of the three-dimensional coordinate system according to the coordinates corresponding to the starting positions of the split waveforms, to obtain information of intersection points between the X-view split waveform, the Y-view split waveform and the Z-view split waveform. Here, the information of the intersection points at least includes the number and positions of the intersection points.

[0088] 2062: determining the starting position and the ending position of the combined waveform diagram of different time periods according to the information of the intersection points, the combined waveform diagram being a combined waveform diagram formed by combining the X-view split waveform, the Y-view split waveform and the Z-view split waveform.

[0089] For example, when the diffraction capture recorded in the first 10 seconds is obtained, the X-view split waveform, the Y-view split waveform and the Z-view split waveform in the diffraction capture are arranged into the XOY plane of the three-dimensional coordinate system according to the coordinates of the corresponding starting positions, so that the number of intersection points between the three split waveforms can be obtained.

[0090] For example, after obtaining the diffraction capture graph recorded in the first 10 seconds, the corresponding X-view partial waveform graph, Y-view partial waveform graph and Z-view partial waveform graph are obtained, and then the X-view partial waveform graph, Y-view partial waveform graph and Z-view partial waveform graph are corresponded to the XOY plane. At this time, the coordinates of each point position of the X-view partial waveform graph are changed from (0, y, z) to (x, y) in the XOY plane, that is, the value of y is changed to x, and the value of z is changed to y. The coordinates of each point position of the Y-view partial waveform graph are changed from (x, 0, z) to (x, y) in the XOY plane, that is, the value of x is changed to x, and the value of z is changed to y. The coordinates (x, y, 0) of each point position of the Z-view partial waveform graph are directly taken as (x, y). In this way, the partial waveform graphs corresponding to different time periods can be arranged along the x-axis direction. In the embodiment, the starting position and the ending position of the combined waveform graph are obtained by the following method:

[0091] (1) If the number of intersection points is zero, the average value of the sum of the coordinate values of different coordinate axes corresponding to the starting positions of the X-view partial waveform graph, the Y-view partial waveform graph and the Z-view partial waveform graph is taken as the coordinate value of the starting position of the combined waveform graph, and the average value of the sum of the coordinate values of different coordinate axes corresponding to the ending positions of the X-view partial waveform graph, the Y-view partial waveform graph and the Z-view partial waveform graph is taken as the coordinate of the ending position of the combined waveform graph.

[0092] For example, when the number of intersection points is zero, the coordinates corresponding to the starting positions of the X-view partial waveform graph, the Y-view partial waveform graph and the Z-view partial waveform graph are (X1, Y1), (X2, Y2) and (X3, Y3) respectively. At this time, the coordinate value of the starting position of the combined waveform graph is ((X1+X2+X3) / 3, (Y1+Y2+Y3) / 3). The coordinate value of the ending position of the combined waveform graph is similar to the above.

[0093] (2) If the number of intersection points is one, the position corresponding to the intersection point is taken as the starting position and the ending position of the combined waveform graph.

[0094] (3) If the number of intersection points is two, the positions of the two intersection points are taken as the starting position and the ending position of the combined waveform graph respectively.

[0095] (4) If the number of intersection points is greater than two, the positions of the two intersection points with the maximum difference in the Y-axis direction coordinate value are selected as the starting position and the ending position of the combined waveform graph respectively.

[0096] 2063: According to the starting position and the ending position of the combined waveform graph of different time periods, the diffraction waveform graph of the multiple wave in the three-dimensional coordinate system is obtained.

[0097] In this embodiment, the corresponding intersection points are obtained through the simulated multiple waveforms recorded every ten seconds, and then the combined waveform diagram is obtained through the intersection points. Then, the starting position and the ending position of the combined waveform diagram in each minute are connected along the X-axis direction to form the whole diagram of the combined waveform diagram in each minute, and then the whole diagrams of the combined waveform diagrams in each minute are connected to obtain the diffraction waveform diagram.

[0098] The above method of constructing the waveform diagram can simply and quickly determine the diffraction waveform diagram, so that the diffraction waveform diagram is simple and convenient to obtain.

[0099] S207: Obtain a true amplitude migration image of the seismic data based on the diffraction waveform diagram.

[0100] The obtained diffraction waveform diagram is subjected to the amplitude-preserving imaging profile processing to obtain the true amplitude migration image. In this way, the overall wave group characteristics are better, the data positioning is more accurate, the cross-section morphology is clearer, the internal imaging is improved, the quality of the migration imaging is effectively improved, and the vertical resolution and the lateral resolution of the seismic data can also be improved.

[0101] The amplitude-preserving imaging profile processing can refer to related technologies, and is not specifically limited here.

[0102] In addition to effectively compensating the amplitudes of the middle and deep layers, the amplitude-preserving imaging profile can also improve the data quality of part of the shallow layers, so that the accuracy of the seismic data migration imaging is high, and the quality of the seismic data migration imaging is ensured.

[0103] Figure 3 is a structural schematic diagram of a true amplitude migration imaging device provided by the embodiment of the present disclosure, which is combined with Figure 3 The device has the functions of the above method examples, and the functions can be realized by hardware or corresponding software executed by hardware. The migration imaging device comprises a transmitting point determination module 31, a diffraction module 32, a diffraction waveform diagram acquisition module 33, and an imaging module 34.

[0104] The transmitting point determination module 31 is configured to determine the position of the transmitting point in a three-dimensional coordinate system, and the transmitting point is the position of the seismic wave source. The diffraction module 32 is configured to diffract the simulated multiple wave at the transmitting point as a diffraction point, and the simulated multiple wave is generated based on an actual multiple wave. The actual multiple wave refers to a wave formed by multiple diffractions of the seismic wave in the stratum. The diffraction waveform diagram acquisition module 33 is configured to acquire a diffraction waveform diagram of the simulated multiple wave in the diffraction process. The imaging module 34 is configured to obtain a true amplitude migration image of the seismic data based on the diffraction waveform diagram.

[0105] Optionally, the diffraction module 32 is configured to: capture the simulated multiple waves at the same time interval to obtain a plurality of diffraction capture points in a process of diffracting the simulated multiple waves with the emission point as a diffraction point; determine positions of the diffraction capture points in a three-dimensional coordinate system; obtain a diffraction capture graph formed by the diffraction capture points according to the positions of the diffraction capture points in the three-dimensional coordinate system; obtain a split wave graph corresponding to different time periods of the simulated multiple waves in the three-dimensional coordinate system according to the diffraction capture graph, each time period corresponding to a plurality of split wave graphs of different viewing angles; and obtain a diffraction wave graph of the multiple waves in the three-dimensional coordinate system according to the split wave graph.

[0106] Optionally, the diffraction module 32 is further configured to determine the positions of the diffraction capture points in the three-dimensional coordinate system according to formula (3).

[0107] Optionally, the diffraction module 32 is further configured to: arrange the split wave graphs corresponding to different time periods into the XOY plane of the three-dimensional coordinate system according to the coordinates corresponding to the starting positions of the split wave graphs to obtain the number of intersection points between the X-view split wave graph, the Y-view split wave graph and the Z-view split wave graph; obtain the starting position and the ending position of the combined wave graph of different time periods according to the number of intersection points, the combined wave graph being a combined wave graph formed by combining the X-view split wave graph, the Y-view split wave graph and the Z-view split wave graph together; and obtain the diffraction wave graph of the multiple waves in the three-dimensional coordinate system according to the starting position and the ending position of the combined wave graph of different time periods.

[0108] Optionally, the diffraction module 32 is further configured to: if the number of intersection points is zero, take the average value of the sum of the coordinate values of different coordinate axes corresponding to the starting positions of the X-view split wave graph, the Y-view split wave graph and the Z-view split wave graph as the coordinate value of the starting position of the combined wave graph, and take the average value of the sum of the coordinate values of different coordinate axes corresponding to the ending positions of the X-view split wave graph, the Y-view split wave graph and the Z-view split wave graph as the coordinate value of the ending position of the combined wave graph; if the number of intersection points is one, take the position corresponding to the intersection point as the starting position and the ending position of the combined wave graph; if the number of intersection points is two, take the positions of the two intersection points as the starting position and the ending position of the combined wave graph respectively; and if the number of intersection points is greater than two, select the positions of two intersection points with the largest Y-axis direction coordinate difference from the positions of the intersection points as the starting position and the ending position of the combined wave graph respectively.

[0109] Optionally, the imaging module 34 is configured to perform amplitude-preserved imaging profile processing on the diffraction wave graph to obtain a true-amplitude migration image.

[0110] It should be noted that the true amplitude migration provided in the above embodiments is only used for example to illustrate the division of the above functional modules when performing migration. In actual application, the above functions can be completed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. In addition, the true amplitude migration device and the true amplitude migration method provided in the above embodiments belong to the same concept, and the specific implementation process is detailed in the method embodiments, which will not be repeated here.

[0111] Figure 4 is a structural schematic diagram of a computer device provided by an embodiment of the present disclosure, in combination with Figure 4 The computer device 400 can include one or more of the following components: a processor 401, a memory 402, a communication interface 403, and a bus 404.

[0112] The processor 401 includes one or more processing cores. The processor 401 performs various functional applications and information processing by running software programs and modules.

[0113] The memory 402 and the communication interface 403 are connected to the processor 401 through the bus 404. The memory 402 can be used to store at least one instruction, and the processor 401 is configured to execute the at least one instruction to implement the steps in the above method.

[0114] In addition, the memory 402 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, including but not limited to: a magnetic or optical disk, an electrically erasable programmable read-only memory (EEPROM), an erasable programmable read-only memory (EPROM), a static random access memory (SRAM), a read-only memory (ROM), a magnetic storage, a flash memory, and a programmable read-only memory (PROM).

[0115] The present disclosure also provides a non-transitory computer-readable storage medium, when the instructions in the storage medium are executed by the processor of the computer device, the computer device can execute the true amplitude migration method provided in the present disclosure.

[0116] The present disclosure also provides a computer program product, including computer programs / instructions, which, when executed by a processor, implement the true amplitude migration method provided in the present disclosure.

[0117] The above is only an optional embodiment of the present disclosure, and does not limit the present disclosure. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present disclosure shall be included in the protection scope of the present disclosure.

Claims

1. A true amplitude migration imaging method, characterized in that, The offset imaging method includes: Determine the position of the emission point in the three-dimensional coordinate system, where the emission point is the location of the seismic wave source; The simulated multiple wave is diffracted with the emission point as the diffraction point. The simulated multiple wave is generated based on the actual multiple wave, which refers to the wave formed by the seismic wave after multiple diffractions through the strata. Obtain the diffraction waveform of the simulated multiple waves during the diffraction process; Based on the diffraction waveform, the true amplitude shift image of the seismic data is obtained.

2. The offset imaging method according to claim 1, characterized in that, The step of obtaining the diffraction waveform of the simulated multiple waves during the diffraction process includes: During the process of the simulated multiple waves diffracting with the emission point as the diffraction point, the simulated multiple waves are captured at the same time interval to obtain the positions of multiple diffraction capture points in the three-dimensional coordinate system. Based on the position of the diffraction capture point in the three-dimensional coordinate system, the diffraction capture pattern formed by the diffraction capture point is obtained; Based on the diffraction capture pattern, the simulated multiple waves are obtained as waveform diagrams corresponding to different time periods in the three-dimensional coordinate system, with each time period corresponding to multiple waveform diagrams from different perspectives. Based on the waveform diagram, the diffraction waveform diagram of the multiple waves in the three-dimensional coordinate system is obtained.

3. The offset imaging method according to claim 2, characterized in that, The step of obtaining the diffraction pattern formed by the diffraction capture point based on its position in the three-dimensional coordinate system includes: The position of the diffraction capture point in the three-dimensional coordinate system is corrected based on the perturbation wave field; Based on the corrected position of the diffraction capture point in the three-dimensional coordinate system, the diffraction capture pattern formed by the diffraction capture point is obtained.

4. The offset imaging method according to claim 3, characterized in that, The step of correcting the position of the diffraction capture point in the three-dimensional coordinate system based on the perturbation wave field includes: The Z-axis coordinate value of the diffraction capture point in the three-dimensional coordinate system is obtained according to the following formula; Among them, F a I represents the coordinates of the diffraction capture point along the Z-axis in the three-dimensional coordinate system, and also the amplitude value of the diffraction capture point; n E represents the coordinate value of the launch point along the Z-axis in the three-dimensional coordinate system. XW C represents the value of the perturbation wave field. a V is the coordinate value of the Z-axis direction in the three-dimensional coordinate system when the diffraction capture point is captured. The Z-axis direction is used to represent the direction perpendicular to the ground.

5. The offset imaging method according to claim 2, characterized in that, The waveform diagrams include X-view waveform diagrams, Y-view waveform diagrams, and Z-view waveform diagrams. The X-view waveform diagram is a diffraction capture diagram observed along the X-axis direction in the three-dimensional coordinate system. The Y-view waveform diagram is a diffraction capture diagram observed along the Y-axis direction in the three-dimensional coordinate system. The Z-view waveform diagram is a diffraction capture diagram observed along the Z-axis direction in the three-dimensional coordinate system. The step of obtaining the diffraction waveform of the multiple waves in the three-dimensional coordinate system based on the waveform diagram includes: Arrange the waveform diagrams corresponding to different time periods into the XOY plane of the three-dimensional coordinate system according to the coordinates corresponding to the starting position of the waveform diagrams, to obtain the information of the intersection points between the X-view waveform diagrams, the Y-view waveform diagrams and the Z-view waveform diagrams; Based on the information of the intersection point, the start and end positions of the combined waveform diagram for different time periods are obtained. The combined waveform diagram is a combined waveform diagram formed by combining the X-view sub-waveform diagram, the Y-view sub-waveform diagram, and the Z-view sub-waveform diagram. Based on the start and end positions of the combined waveform diagrams at different time periods, the diffraction waveform diagrams of the multiple waves in the three-dimensional coordinate system are obtained.

6. The offset imaging method according to claim 5, characterized in that, The step of obtaining the start and end positions of the combined waveform diagram for different time periods based on the information of the intersection points includes: If the number of intersection points is zero, then the average of the sums of the coordinate values ​​of the different coordinate axes corresponding to the starting positions of the X-view waveform diagram, the Y-view waveform diagram, and the Z-view waveform diagram is taken as the coordinate value of the starting position of the combined waveform diagram, and the average of the sums of the coordinate values ​​of the different coordinate axes corresponding to the ending positions of the X-view waveform diagram, the Y-view waveform diagram, and the Z-view waveform diagram is taken as the coordinate value of the ending position of the combined waveform diagram. If the number of intersection points is one, then the position corresponding to the intersection point is taken as the start and end position of the composite waveform. If there are two intersection points, then the positions of the two intersection points are respectively used as the start and end positions of the combined waveform. If the number of intersection points is greater than two, then the positions of the two intersection points with the largest Y-axis coordinate difference are selected as the starting and ending positions of the combined waveform, respectively.

7. The offset imaging method according to claim 1, characterized in that, The process of obtaining the true amplitude migration image of the seismic data based on the diffraction waveform includes: The diffraction waveform is processed by amplitude-preserving imaging profile to obtain the true amplitude shift image.

8. A true amplitude offset imaging device, characterized in that, The offset imaging device includes: The launch point determination module is used to determine the position of the launch point in a three-dimensional coordinate system, wherein the launch point is the location of the seismic wave source; The diffraction module is used to diffract the simulated multiple waves with the emission point as the diffraction point. The simulated multiple waves are generated based on the actual multiple waves, which refer to the waves formed by the seismic waves after multiple diffractions through the strata. The diffraction waveform acquisition module is used to acquire the diffraction waveform of the simulated multiple waves during the diffraction process. An imaging module is used to obtain a true amplitude shift image of the seismic data based on the diffraction waveform.

9. A computer device, characterized in that, The computer device includes a processor and a memory configured to store processor-executable instructions; the processor is configured to perform the true amplitude offset imaging method according to any one of claims 1 to 7.

10. A computer storage medium storing computer instructions thereon, characterized in that, When the computer instructions are executed by the processor, they implement the true amplitude offset imaging method according to any one of claims 1 to 7.

Images