An ultrafast super-resolution imaging method and apparatus

Abstract

The application belongs to the technical field of ultrafast imaging, and discloses an ultrafast super-resolution imaging method and device. The application uses an STAMP unit to perform ultrafast imaging on a sample to be observed, obtains m pulses perpendicular to the z-axis direction and separated along the x-axis according to the light wavelength; uses a beam splitting unit to split the m pulses into n groups along the y-axis, and obtains m*n pulses with the same light intensity and no optical path difference; uses a spatial light modulator to modulate the incident pulses in n regions, and obtains m*n structured light pulses carrying sample information to be observed; the m*n structured light pulses are incident on an imaging lens and converge on an ultrafast camera; and an image reconstruction unit takes the m*n images captured by the ultrafast camera as a super-resolution image reconstruction source, performs image reconstruction, and obtains a super-resolution image. The application solves the problem of low image resolution in the ultrafast imaging technology, and can obtain a super-resolution image while ensuring the imaging rate of the ultrafast imaging system.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of ultrafast imaging, and more particularly, relates to an ultrafast super-resolution imaging method and device. BACKGROUND

[0002] Transient events occur on the time scale of femtoseconds to nanoseconds, reflecting many important fundamental principles in physics, chemistry and biology. Generally speaking, pump-probe method can capture these events through repeated measurements. However, many ultrafast phenomena are either non-reproducible or difficult to reproduce, such as optical rogue waves, irreversible crystal chemical reactions, light scattering in living tissues and shock waves in laser-induced damage, in which case the pump-probe method is not applicable. In some cases, although reproducible, the ultrafast phenomena have significant sequential variations and low occurrence rates, such as the generation of dense plasmas by high-power, low-repetition laser systems and laser-driven implosions in inertial confinement fusion, in which case the pump-probe method will lead to large errors.

[0003] In order to overcome the limitations of the pump-probe method, single-shot ultrafast optical imaging technology has emerged. "Single-shot" describes that the system captures the entire dynamic process in a single shot without repeating the event; "ultrafast" defines the imaging speed of 100 million frames per second or more, corresponding to a frame interval of 10 ns or less; "optical" refers to the detection of photons in the far ultraviolet to far infrared spectral range. Due to the unique ability to record non-reproducible and difficult-to-reproduce transient events, single-shot ultrafast optical imaging technology has become an indispensable technology for understanding fundamental scientific problems and achieving high-precision measurements.

[0004] Sequentially Timed All-optical Mapping Photography (STAMP) is a representative technology in the field of single-shot ultrafast optical imaging, and the imaging frame interval of this technology can reach the order of hundreds of femtoseconds or even tens of femtoseconds, but the spatial resolution of imaging is limited by the optical diffraction limit, and can only image at the order of hundreds of nanometers, which makes many microscopic transient events cannot be observed.

[0005] Structured Illumination Microscopy (SIM) technology is a far-field super-resolution imaging technology, and the imaging rate can reach about 1000 fps. Its imaging rate is mainly limited by the refresh rate of the spatial light modulator, which is about 60 Hz, while the imaging rate of the STAMP system is 10 12Hz, so the traditional SIM scheme is subject to the refresh frequency limitation of the spatial light modulator itself, and it is difficult to apply to the field of ultrafast imaging. How to obtain super-resolution images while maintaining the imaging rate advantage of the ultrafast imaging system to meet the ever-deepening research needs is an important research topic in this field. SUMMARY

[0006] The application provides an ultrafast super-resolution imaging method and device, solving the problem of low image resolution in ultrafast imaging technology.

[0007] The application provides an ultrafast super-resolution imaging device, comprising an image reconstruction unit, and a STAMP unit, a beam splitting unit, a spatial light modulator, an imaging lens and an ultrafast camera arranged in sequence along an optical path.

[0008] The STAMP unit is used for ultrafast imaging of a to-be-observed sample to obtain m pulses perpendicular to the z-axis direction and separated along the x-axis according to the light wavelength, and the m pulses all carry to-be-observed sample information; wherein the STAMP unit is a sequential timing full optical mapping photography unit, and the z-axis direction is the optical axis direction.

[0009] The beam splitting unit is used for splitting the m pulses emitted after the STAMP unit into n groups along the y-axis to obtain m*n pulses with the same light intensity and no optical path difference.

[0010] The spatial light modulator is used for modulating the m*n pulses emitted after the beam splitting unit in n regions, different regions loading different structured light patterns to obtain m*n structured light pulses carrying to-be-observed sample information.

[0011] The imaging lens is used for converging the m*n structured light pulses emitted after the spatial light modulator to form an image on the ultrafast camera.

[0012] The ultrafast camera is used for capturing m*n images.

[0013] The image reconstruction unit is used for taking the m*n images obtained by the ultrafast camera as a super-resolution image reconstruction source to perform image reconstruction to obtain a super-resolution image.

[0014] Preferably, the STAMP unit comprises a femtosecond pulse laser, a time-domain stretching unit and a spatial domain shaping unit arranged in sequence along an optical path, and the to-be-observed sample is located between the time-domain stretching unit and the spatial domain shaping unit.

[0015] The femtosecond pulse laser is used for generating femtosecond pulses.

[0016] The time domain stretching unit is used to stretch the femtosecond pulse in time domain and cut the pulse into a probe pulse train formed by multiple pulses in time domain, the multiple pulses in the probe pulse train having different spectra and same time intervals; the probe pulse train obtained by the time domain stretching unit is incident to the sample to be observed;

[0017] The space domain shaping unit is used to separate the pulse train carrying the sample information to be observed in space domain, and m pulses are emitted perpendicularly to the z-axis direction and are separated along the x-axis according to the wavelengths of the light.

[0018] Preferably, the time domain stretching unit stretches the femtosecond pulse to picosecond level or hundred femtosecond level.

[0019] Preferably, the beam splitting unit is an i+1 level mesh structure, including i level structure assemblies and two periscopic mirror arrays at an exit end as an i+1 level structure; each level structure assembly includes a beam splitting mirror and two groups of reflecting mirrors located on both sides of the beam splitting mirror.

[0020] The beam splitting mirror in the 1st level to i-1th level structure assemblies is used to split the incident light into two groups of light with same intensity, and the two groups of reflecting mirrors are used to reflect the two groups of light obtained by splitting to the beam splitting mirror in the next level structure assembly, respectively.

[0021] The beam splitting mirror in the i level structure assembly is used to split the incident light into two groups of light with same intensity, and the two groups of reflecting mirrors are used to make the two groups of light obtained by splitting exit to the two periscopic mirror arrays with same direction and without optical path difference.

[0022] The periscopic mirror array is used to eliminate the optical path difference of multiple sub-beams in each group of light.

[0023] Preferably, each periscopic mirror array includes n / 2 periscopic mirrors arranged side by side and having different intervals.

[0024] Preferably, the spatial light modulator adopts a digital micromirror device.

[0025] Preferably, the structured light pattern is a fringe pattern, and different fringe patterns loaded in different regions have different fringe orientation angles and / or different phases.

[0026] Preferably, the exit pulse after the beam splitting unit is aligned with the modulation region of the spatial light modulator, and the position distribution of the structured light pattern loaded in the spatial light modulator corresponds to the incident position of the pulse.

[0027] In another aspect, the present application provides an ultrafast super-resolution imaging method, which is realized by using the above-mentioned ultrafast super-resolution imaging device, and the method includes the following steps:

[0028] Step 1, using the STAMP unit to perform ultrafast imaging on the sample to be observed, obtaining m pulses perpendicular to the z-axis direction, separated along the x-axis by light wavelength, and each carrying sample information to be observed;

[0029] Step 2, the m pulses obtained in step 1 are incident to a beam splitting unit, and the beam splitting unit splits the m pulses into n groups along the y-axis, obtaining m*n pulses with the same light intensity and no optical path difference;

[0030] Step 3, the m*n pulses obtained in step 2 are incident to a spatial light modulator, which modulates the incident pulses in n regions, and different regions load different structured light patterns, obtaining m*n structured light pulses carrying sample information to be observed;

[0031] Step 4, the m*n structured light pulses obtained in step 3 are incident to an imaging lens, and the outgoing light after the imaging lens converges on an ultrafast camera;

[0032] Step 5, the image reconstruction unit takes the m*n images captured by the ultrafast camera as a super-resolution image reconstruction source, and performs image reconstruction to obtain a super-resolution image.

[0033] Preferably, the step 5 includes the following sub-steps:

[0034] Determine the spatial frequency and initial phase of the structured light illumination through the super-resolution image reconstruction source;

[0035] Estimate the power spectrum of the super-resolution image reconstruction source to obtain each spectral component of the super-resolution image reconstruction source; after setting the quality factor, perform Wiener filtering on the super-resolution image reconstruction source, and perform displacement and phase calibration on two offset spectral components and;

[0036] Merge all spectral components to obtain the super-resolution image through inverse Fourier transform.

[0037] One or more technical solutions provided in the application have at least the following technical effects or advantages:

[0038] The application firstly performs ultrafast imaging on the sample to be observed by using the STAMP unit to obtain m pulses which are perpendicular to the z-axis direction and are separated along the x-axis according to the light wavelength; then the m pulses emitted after the STAMP unit are each split into n groups along the y-axis by using the beam splitting unit to obtain m*n pulses with the same light intensity and without optical path difference; the m*n pulses emitted after the beam splitting unit are modulated by using the spatial light modulator to divide n regions, different regions load different structured light patterns, and m*n structured light pulses carrying the information of the sample to be observed are obtained; then the m*n images obtained by using the imaging lens and the ultrafast camera are used as the super-resolution image reconstruction source, and the image reconstruction unit performs image reconstruction to obtain a super-resolution image. That is, the application converts the distribution of each frame in the time domain into the distribution in the spatial domain, images all the encoding patterns at one time on the encoding device, and then completes the super-resolution image reconstruction. By using the method and device provided by the application, the super-resolution image can be obtained while the imaging rate of the ultrafast imaging system is unchanged, the resolution is improved by about 2 times, and the problem that the spatial resolution cannot meet the observation requirement due to the limitation of the optical diffraction limit in the ultrafast imaging technology can be effectively solved. In summary, the application provides a scheme for realizing the sequential timing plenoptic photography, which can realize the image super-resolution of the ultrafast imaging technology, and can realize the capture of the image of the micro transient event, thereby providing a new implementation approach for the research on the micro dynamic phenomenon in physics, chemistry and industrial science. BRIEF DESCRIPTION OF DRAWINGS

[0039] Figure 1 The overall structure schematic diagram of the ultrafast super-resolution imaging device provided by the embodiment of the application is shown in the figure.

[0040] Figure 2 The structure schematic diagram of the STAMP unit in the ultrafast super-resolution imaging device provided by the embodiment of the application is shown in the figure.

[0041] Figure 3 The structure schematic diagram of the beam splitting unit in the ultrafast super-resolution imaging device provided by the embodiment of the application is shown in the figure.

[0042] Figure 4 The structure schematic diagram of the periscope array in the ultrafast super-resolution imaging device provided by the embodiment of the application is shown in the figure.

[0043] Figure 5 The schematic diagram of the pattern loaded on the spatial light modulator in the ultrafast super-resolution imaging device provided by the embodiment of the application is shown in the figure. DETAILED DESCRIPTION

[0044] In order to better understand the above technical solutions, the above technical solutions will be described in detail in combination with the drawings in the specification and specific embodiments.

[0045] Embodiment 1:

[0046] Embodiment 1 provides a kind of ultrafast super-resolution imaging method, comprising the following steps:

[0047] Step 1, using STAMP unit to the ultrafast imaging of the sample to be observed, obtains the m pulses that are separated along x axis by light wavelength perpendicular to z axis direction, and m pulses all carry the information of the sample to be observed.

[0048] Wherein, STAMP unit is sequential timing plenoptic mapping unit, and z axis direction is optical axis direction.

[0049] Specifically, embodiment 1 is realized using ultrafast super-resolution imaging device, see Figure 1 Including image reconstruction unit, and STAMP unit 101, beam splitting unit 102, spatial light modulator 103, imaging lens 104 and ultrafast camera 105 arranged along optical path in sequence.

[0050] The STAMP unit is built based on sequential timing plenoptic mapping technology, as shown in Figure 2 The STAMP unit includes femtosecond pulse laser 201, time domain stretching unit 202 and space domain shaping unit 204 arranged along optical path in sequence, and the sample to be observed 203 is located between the time domain stretching unit 202 and the space domain shaping unit 204.

[0051] The femtosecond pulse laser 201 is used to generate femtosecond pulse. The time domain stretching unit 202 is used to stretch femtosecond pulse in time domain, and cut the pulse into a plurality of pulse formed probe pulse train in time domain, and the plurality of pulses in the probe pulse train have different spectrum, same time interval, and the scale of cutting in time domain also determines the frame rate of ultrafast imaging finally;The probe pulse train obtained by the time domain stretching unit 202 is incident to the sample to be observed 203. The space domain shaping unit 204 is used to separate the pulse train carrying the information of the sample to be observed in space domain, and m pulses separated along x axis by light wavelength perpendicular to z axis direction are emitted.

[0052] Wherein, the time domain stretching unit 202 stretches femtosecond pulse to picosecond level or hundred femtosecond level.

[0053] Step 2, the m pulses obtained in step 1 are incident to beam splitting unit, and the beam splitting unit divides m pulses into n groups along y axis, and obtains m*n pulses with same light intensity and no optical path difference.

[0054] The beam splitting unit is an i+1 level net structure, comprising an i level structure assembly and two periscopes arrays at an exit end as an i+1 level structure; each level structure assembly comprises a beam splitting mirror and two groups of mirrors on both sides of the beam splitting mirror. The beam splitting mirror in the first level to the i-1 level structure assembly is used for splitting the incident light into two groups of light with the same intensity, and the two groups of mirrors are used for reflecting the two groups of light obtained by splitting to the beam splitting mirror in the next level structure assembly; the beam splitting mirror in the i level structure assembly is used for splitting the incident light into two groups of light with the same intensity, and the two groups of mirrors are used for making the two groups of light obtained by splitting exit to the two periscopes arrays respectively without optical path difference and with the same direction; the periscopes array is used for eliminating the optical path difference of a plurality of sub-beams in each group of light. Each periscopes array comprises n / 2 periscopes arranged side by side with different intervals.

[0055] Step 3: The m*n pulses obtained in step 2 are incident to a spatial light modulator, the spatial light modulator modulates the incident pulses in n regions, different regions load different structured light patterns, and m*n structured light pulses carrying sample information to be observed are obtained.

[0056] The structured light pattern is a stripe pattern, and different stripe patterns loaded in different regions have different stripe orientation angles and / or different phases.

[0057] The exit pulse after the beam splitting unit is aligned with the modulation region of the spatial light modulator, and the position distribution of the structured light pattern loaded by the spatial light modulator corresponds to the incident position of the pulse.

[0058] The spatial light modulator can adopt a digital micromirror device.

[0059] Step 4: The m*n structured light pulses obtained in step 3 are incident to an imaging lens, and the exit light after the imaging lens converges on an ultrafast camera.

[0060] Step 5: The image reconstruction unit takes the m*n images captured by the ultrafast camera as an ultra-resolution image reconstruction source, and performs image reconstruction to obtain an ultra-resolution image.

[0061] The step 5 comprises the following sub-steps:

[0062] The spatial frequency and initial phase of the structured light illumination are determined by the ultra-resolution image reconstruction source;

[0063] The power spectrum of the ultra-resolution image reconstruction source is estimated to obtain each spectral component of the ultra-resolution image reconstruction source; after setting a quality factor, the ultra-resolution image reconstruction source is subjected to Wiener filtering, and two offset spectral components are subjected to displacement and phase calibration;

[0064] All the spectral components are combined to obtain the super-resolution image by inverse Fourier transform.

[0065] In conclusion, the application applies structured light microscopy to ultrafast imaging, solves the problem that the spatial resolution of the ultrafast imaging technology is limited by the optical diffraction limit and cannot meet the observation requirements, i.e. solves the problem of low image resolution in the ultrafast imaging technology, and can obtain a super-resolution image while keeping the imaging rate of the ultrafast imaging system unchanged.

[0066] The application is illustrated below with specific parameters.

[0067] The application provides an ultrafast super-resolution imaging method, which comprises the following steps:

[0068] Step 1: using a STAMP unit to perform ultrafast imaging on a sample to be observed to obtain 6 pulses perpendicular to the z-axis direction and separated along the x-axis according to the wavelength of light;

[0069] Step 2: the 6 pulses obtained in step 1 are incident to a beam splitting unit, and the beam splitting unit splits the 6 pulses into 16 groups along the y-axis to obtain 96 pulses with the same light intensity and no optical path difference;

[0070] Referring to Figure 3 , the beam splitting unit is a 5-level network structure composed of four beam splitting mirrors, nine reflecting mirrors and two periscope arrays, including a 4-level structure assembly and two periscope arrays as the 5th level structure at the exit end; each level structure assembly includes a beam splitting mirror and two groups of reflecting mirrors on both sides of the beam splitting mirror.

[0071] The beam splitting mirror in the 1st to 3rd level structure assemblies is used to split the incident light into two groups of light with the same intensity, and the two groups of reflecting mirrors are used to reflect the two groups of light obtained by splitting to the beam splitting mirror in the next level structure assembly. Among them, the 1st level structure assembly includes a first beam splitting mirror 301, a first reflecting mirror 305 and a second reflecting mirror 306; the 2nd level structure assembly includes a second beam splitting mirror 302, a third reflecting mirror 307 and a fourth reflecting mirror 308; the 3rd level structure assembly includes a third beam splitting mirror 303, a fifth reflecting mirror 309 and a sixth reflecting mirror 310.

[0072] The beam splitting mirror (i.e. the fourth beam splitting mirror 304) in the 4th level structure assembly is used to split the incident light into two groups of light with the same intensity, and the two groups of reflecting mirrors (the first group of reflecting mirrors includes the eighth reflecting mirror 312 and the ninth reflecting mirror 313, and the second group of reflecting mirrors includes the seventh reflecting mirror 311) are used to make the two groups of light obtained by splitting have no optical path difference and the same direction and exit to two periscope arrays (i.e. a first periscope array 314 and a second periscope array 315) respectively.

[0073] Each periscope array is composed of 8 periscopes placed side by side with different spacings, as shown inFigure 4 The 8 sub-beams of each group of light are shown to eliminate the optical path difference of each group of light.

[0074] Alternatively, the fourth-level structure component can also be regarded as a fourth-level structure together with the two periscopes arrays, and the beam splitting unit is regarded as a 4-level network structure. The three mirrors and two periscopes arrays in the fourth-level structure are used to ensure the optical path difference of the outgoing pulses to be consistent and to ensure that the outgoing pulses are aligned with the modulation area of the spatial light modulator.

[0075] Step 3: The 96 pulses obtained in step 2 are incident on a spatial light modulator, which modulates the incident pulses in 16 areas. Different areas load different required structured light patterns, and 96 structured light pulses carrying sample information to be observed are obtained.

[0076] Specifically, after the above-mentioned pulses are emitted by the spatial light modulator, two-dimensional stripe structured light is generated, as shown in FIG. 6. Figure 5 The stripe orientation angles of the 16 groups of structured light pulses are separated by 45 degrees, the phases are separated by π / 2, and the spatial frequency is 150 lp / μm. The spatial light modulator loads stripe patterns in each specific area, and the stripe patterns loaded by the spatial light modulator are set and adjusted by observing the stripe orientation and phase of the outgoing structured light pulses, to ensure that the required structured light pulses are met.

[0077] Step 4: The 96 structured light pulses obtained in step 3 are incident on an imaging lens, and the outgoing light after the imaging lens converges on an ultrafast camera to form images, and 96 images carrying sample information and having different orientation and phase structured light modulation are obtained.

[0078] Step 5: The 96 images captured by the ultrafast camera are used as super-resolution image reconstruction sources, and super-resolution images are obtained by image reconstruction.

[0079] Specifically, the 96 images captured by the ultrafast camera are divided into 6 groups according to different pulse arrival times, and each group is 16 images of different structured light modulation at the pulse arrival time, which are used as super-resolution image reconstruction sources of the pulse arrival time images. After image reconstruction algorithm, super-resolution images are obtained. The image reconstruction algorithm can use the traditional SIM image reconstruction algorithm, and 16 images taken at different structured light orientations and phases are used as image reconstruction sources to perform image super-resolution reconstruction.

[0080] Embodiment 2:

[0081] Embodiment 2 provides an ultrafast super-resolution imaging device, which includes an image reconstruction unit, and a STAMP unit, a beam splitting unit, a spatial light modulator, an imaging lens, and an ultrafast camera arranged in sequence along an optical path.

[0082] The STAMP unit is used for ultrafast imaging of the sample to be observed, to obtain m pulses separated along the x-axis by optical wavelengths in the direction perpendicular to the z-axis, and the m pulses all carry sample information to be observed.

[0083] The beam splitting unit is used for splitting the m pulses emitted after the STAMP unit into n groups along the y-axis, to obtain m*n pulses with the same light intensity and no optical path difference.

[0084] The spatial light modulator is used for modulating the m*n pulses emitted after the beam splitting unit in n regions, different regions load different structured light patterns, to obtain m*n structured light pulses carrying sample information to be observed.

[0085] The imaging lens is used for converging the m*n structured light pulses emitted after the spatial light modulator on the ultrafast camera.

[0086] The ultrafast camera is used for capturing m*n images.

[0087] The image reconstruction unit is used for taking the m*n images obtained by the ultrafast camera as a super-resolution image reconstruction source, and performing image reconstruction to obtain a super-resolution image.

[0088] Embodiment 2 provides an ultrafast super-resolution imaging device corresponding to the ultrafast super-resolution imaging method provided in Embodiment 1. Each device in Embodiment 2 can realize the corresponding function of the method in Embodiment 1, and therefore will not be repeated.

[0089] In summary, when the scheme provided by the present application is used for image super-resolution imaging in the field of ultrafast imaging of a sample to be observed, the sample to be observed is first ultrafast imaged, then the pulse carrying sample information to be observed is split into several parts by the beam splitting unit, the required structured light pattern is loaded in different regions by the spatial light modulator, the pulse carrying sample information to be observed is modulated after being incident, and at the same time, a plurality of structured light pulses of sample information to be observed with different orientations and different phases are generated, and finally the imaging lens converges to the ultrafast camera to be captured. The image reconstruction algorithm of the traditional structured light illumination microscopic imaging technology can reconstruct the super-resolution image of the sample to be observed. The present application not only has the picosecond or even hundred femtosecond level of ultra-high imaging rate of ultrafast imaging, but also can obtain a super-resolution image, the resolution is improved by about 2 times, and the image of a micro-transient event can be captured.

[0090] Finally, it should be noted that the above detailed description is merely illustrative of the technical solutions of the present application and is not limiting, and although the present application has been described in detail with reference to the examples, it should be understood by those skilled in the art that the technical solutions of the present application can be modified or equivalently replaced without departing from the spirit and scope of the technical solutions of the present application, and all should be covered in the scope of the claims of the present application.

Claims

1. An ultrafast, super-resolution imaging device, characterized in that, It includes an image reconstruction unit, as well as a STAMP unit, a beam splitter, a spatial light modulator, an imaging lens, and an ultrafast camera arranged sequentially along the optical path; The STAMP unit is used to perform ultrafast imaging of the sample to be observed, obtaining m pulses perpendicular to the z-axis and separated along the x-axis according to the light wavelength. Each of the m pulses carries information about the sample to be observed. The STAMP unit is a sequential timing all-optical mapping imaging unit, and the z-axis direction is the optical axis direction. The beam splitting unit is used to split the m pulses emitted after passing through the STAMP unit into n groups along the y-axis, resulting in pulses with the same light intensity and no optical path difference. One pulse; The spatial light modulator is used to divide the light emitted after passing through the beam splitter unit into n regions. Each pulse is modulated, and different structured light patterns are loaded into different regions to obtain... A structured light pulse carrying information about the sample to be observed; The imaging lens is used to direct the light emitted after passing through the spatial light modulator. A structured light pulse is converged and imaged on the ultrafast camera; The ultrafast camera is used to capture... Image; The image reconstruction unit is used to obtain the image from the ultrafast camera. The images are used as the source for super-resolution image reconstruction, and super-resolution images are obtained through image reconstruction. The STAMP unit includes a femtosecond pulsed laser, a temporal stretching unit, and a spatial shaping unit arranged sequentially along the optical path, with the sample to be observed located between the temporal stretching unit and the spatial shaping unit; The femtosecond pulse laser is used to generate femtosecond pulses; The time-domain stretching unit is used to stretch the femtosecond pulse in the time domain and cut the pulse into a detection pulse train of multiple pulses in the time domain. The multiple pulses in the detection pulse train have different spectra and the same time interval. The detection pulse train obtained by the time-domain stretching unit is incident on the sample to be observed. The spatial shaping unit is used to separate the pulse train carrying the information of the sample to be observed in the spatial domain and emit m pulses perpendicular to the z-axis and separated along the x-axis according to the light wavelength. The time-domain stretching unit stretches femtosecond pulses to the picosecond or hundred femtosecond level.

2. The ultrafast super-resolution imaging device according to claim 1, characterized in that, The beam splitting unit is an i+1 level mesh structure, including an i-level structural component and two periscope arrays located at the exit end as the i+1 level structure; each level structural component includes a beam splitter and two sets of reflectors located on both sides of the beam splitter. The beam splitter in the first to i-1th stage structural components is used to split the incident light into two groups of light with the same intensity, and the two sets of reflectors are used to reflect the two groups of light obtained by beam splitting to the beam splitter in the next stage structural component. The beam splitter in the i-th stage structural component is used to split the incident light into two groups of light with the same intensity, and the two sets of reflectors are used to ensure that the two groups of light obtained by splitting have no optical path difference and are in the same direction and are respectively emitted to the two periscope arrays. The periscope array is used to eliminate the optical path difference between multiple sub-beams in each group of light.

3. The ultrafast super-resolution imaging device according to claim 2, characterized in that, Each of the periscope arrays comprises n / 2 periscopes arranged side by side with different spacing.

4. The ultrafast super-resolution imaging device according to claim 1, characterized in that, The spatial light modulator employs a digital micromirror device.

5. The ultrafast super-resolution imaging device according to claim 1, characterized in that, The structured light pattern is a stripe pattern, and different stripe patterns loaded in different regions have different stripe orientation angles and / or different phases.

6. The ultrafast super-resolution imaging device according to claim 1, characterized in that, The emitted pulse after passing through the beam splitting unit is aligned with the modulation region of the spatial light modulator, and the positional distribution of the structured light pattern loaded on the spatial light modulator corresponds to the incident position of the pulse.

7. An ultrafast, super-resolution imaging method, characterized in that, The method, implemented using the ultrafast super-resolution imaging device as described in any one of claims 1-6, comprises the following steps: Step 1: Use the STAMP unit to perform ultrafast imaging of the sample to be observed, and obtain m pulses perpendicular to the z-axis and separated along the x-axis according to the light wavelength. Each of the m pulses carries information about the sample to be observed. Step 2: The m pulses obtained in Step 1 are incident on a beam splitting unit, which splits each of the m pulses into n groups along the y-axis, resulting in beams with the same intensity and no optical path difference. One pulse; Step 3 and Step 2 obtained A pulse is incident on a spatial light modulator, which modulates the incident pulse in n regions, with different structured light patterns loaded in each region, resulting in... A structured light pulse carrying information about the sample to be observed; Step 4 and Step 3 obtained A structured light pulse is incident on the imaging lens, and the outgoing light after passing through the imaging lens is converged and imaged on the ultrafast camera. Step 5: The image reconstruction unit uses the image captured by the ultrafast camera... The images are used as the source for super-resolution image reconstruction, and the super-resolution image is obtained by image reconstruction.

8. The ultrafast super-resolution imaging method according to claim 7, characterized in that, Step 5 includes the following sub-steps: The spatial frequency and initial phase of the structured light illumination are determined using the super-resolution image reconstruction source. The power spectrum of the super-resolution image reconstruction source is estimated to obtain each spectral component of the super-resolution image reconstruction source; After setting the quality adjustment factor, Wiener filtering is applied to the super-resolution image reconstruction source, and the shift and phase of the two offset spectral components are calibrated. All spectral components are combined, and the super-resolution image is obtained by inverse Fourier transform.

Images