A test method for tracking delay time of optoelectronic platform based on embedded software

Abstract

This application provides a method for testing the tracking delay time of an optoelectronic platform based on embedded software. The method includes: pre-setting platform motion curve information, determining the focal length of the detector, generating the actual motion curve, selecting a stationary target, putting the optoelectronic platform into tracking mode, recording the pitch and azimuth angles at the current moment when complete tracking is determined, inputting the actual motion curve into the optoelectronic platform servo system, switching to electric lock mode while other parts remain in tracking mode, selecting one axis as the test axis, and moving it according to the actual motion curve based on the current angle value, while keeping the other axis stationary, calculating the tracking pixel deviation between the stationary target point and the center point in the image, solving for the time difference, and repeating the process to obtain multiple sets. This application does not require additional hardware circuit modules and can directly perform a large number of repeated tests through a host computer. The method is simple and reliable.

Description

Technical Field

[0001] This application relates to the field of optoelectronic platform technology, and specifically to a test method for tracking delay time of an optoelectronic platform based on embedded software. Background Technology

[0002] In an optoelectronic platform tracking system, the tracking delay time refers to the time required from the detector's exposure output through circuit transmission and image processing to the servo control system's reception. This test can obtain the actual tracking delay time at the system level, which is more accurate and reliable than traditional methods. Accurate tracking delay time helps verify whether the optoelectronic platform's servo control system can respond to control commands quickly and accurately, and whether the platform's tracking performance meets system requirements. The optoelectronic platform involves multiple subsystems: an imaging detector subsystem, a circuit transmission subsystem, an image tracking processing subsystem, and a servo control subsystem. However, in existing technologies, the delay time is calculated in stages. The imaging detector transmits its calculated delay time to the circuit transmission delay system, adds it to the circuit transmission delay calculation time, and then inputs the summed delay time into the image tracking processing algorithm. Adding the image tracking processing algorithm's processing time gives the total delay time, which is then input into the optoelectronic platform servo control system. The servo control system modifies the corresponding parameters based on this total delay time.

[0003] However, during tracking capability testing, the mutual coupling and interaction between multiple subsystems makes it impossible to accurately test the platform's tracking control performance. For example, a higher frame rate of the imaging detector, lower image transmission latency, and higher efficiency of image tracking processing and platform control algorithms all affect the tracking capability of the optoelectronic platform. However, during testing, the mutual coupling between these factors may mask the actual tracking control performance of the optoelectronic platform, leading to inaccurate final latency times. Summary of the Invention

[0004] The purpose of this application is to address the above problems by providing a test method for tracking delay time on an optoelectronic platform based on embedded software, comprising the following steps:

[0005] S1, Pre-defined platform motion curve information;

[0006] S2. Obtain the maximum and minimum focal lengths of the detector used in this experiment, and select the focal length of the detector used in this experiment between the maximum and minimum focal lengths;

[0007] S3. Generate the actual motion curve based on the predetermined platform motion curve information, maximum focal length, minimum focal length and the used focal length;

[0008] S4. Select a stationary target and put the photoelectric platform system into tracking mode. The servo part of the photoelectric platform system includes pitch and azimuth axes. When it is determined that the photoelectric platform system has completely tracked the target, record the pitch axis angle value and azimuth axis angle value at the current moment.

[0009] S5. Input the actual motion curve to the control terminal of the servo part of the photoelectric platform system, and switch the servo part of the photoelectric platform system from tracking mode to electric lock mode, while other parts of the photoelectric platform system remain in tracking mode.

[0010] S6. Select one axis as the test axis, and use the pitch axis angle value or azimuth axis angle value recorded during full tracking as the base angle value. Move according to the actual motion curve. Keep the other axis unchanged and keep the azimuth axis angle value or pitch axis angle value recorded during full tracking. Measure the angle value of the test axis in real time, and at the same time calculate the tracking pixel deviation between the stationary target point and the image center point. Solve the time difference between the angle value of the test axis and the tracking pixel deviation at each moment. The image center point refers to the position of the test axis in each frame of the image.

[0011] S7. Repeat steps S1 to S6, change the predetermined platform motion curve information and detector focal length value, obtain multiple sets of time difference values ​​between the angle values ​​of the tested axis and the tracking pixel deviation, and solve the average time difference value based on the multiple sets of time difference values.

[0012] According to the technical solution provided in the embodiments of this application, the tracking pixel deviation is calculated according to the following formula;

[0013]

[0014] in: To track pixel deviations;

[0015] The position of the stationary target in the image after the servo section of the optoelectronic platform system enters electric lock mode;

[0016] The center point of the axis being tested in each image is the servo section of the optoelectronic platform system after the electric lock mode.

[0017] According to the technical solution provided in the embodiments of this application, the platform motion curve information includes the amplitude of the platform motion curve and the target frequency value, and its expression is as follows:

[0018] θ goal =θ0-Amp*cos(2*PI*frqgoal*timecnt)

[0019] Where: θgoal This represents the angle value of the platform's motion curve;

[0020] θ0 is the current angle value of the photoelectric platform after complete tracking;

[0021] Amp represents the amplitude of the platform motion curve.

[0022] PI is π;

[0023] fregoal is the frequency value;

[0024] timegoal is the counter value that increments by the control cycle.

[0025] According to the technical solution provided in the embodiments of this application, the expression of the actual motion curve is as follows:

[0026] θ real =θ goal *Zoom real Zoom min

[0027] Where: θ real This represents the angle value of the actual motion curve;

[0028] Zoom min This is the minimum focal length of the detector;

[0029] Zoom real The focal length used by the detector, and Zoom min ≤Zoom real ≤Zoom max ;

[0030] Zoom max This is the maximum focal length of the detector.

[0031] According to the technical solution provided in the embodiments of this application, after the step of selecting a stationary target and controlling the photoelectric platform system to enter the tracking mode, the method further includes:

[0032] The first pixel deviation is calculated in real time. When the first pixel deviation is less than a first preset threshold, it is determined that the photoelectric platform system has completely tracked the target.

[0033] The formula for calculating the first pixel deviation is as follows:

[0034]

[0035] in: To track pixel deviations;

[0036] To fully track the position of previously stationary targets in the image;

[0037] To fully track the center point of the previously tested axis in each image.

[0038] Compared with the prior art, the beneficial effects of this application are as follows: This application pre-sets the platform motion curve information, then obtains the maximum and minimum focal lengths of the detector used in this experiment, and selects the actual focal length used in this experiment between the two. Then, based on the platform motion curve information, the maximum focal length, the minimum focal length, and the used focal length, the actual motion curve of the platform is generated. Then, a stationary target is selected, and the photoelectric platform enters the tracking mode. The servo part of the photoelectric platform system includes pitch and azimuth axes. When it is determined that the photoelectric platform has completely tracked the stationary target, the current pitch axis angle value and azimuth axis angle value are recorded, and then the actual motion curve is input. The system is connected to the control terminal of the servo section of the optoelectronic platform system and switched to electric lock mode. Then, one axis is selected as the test axis and the pitch or azimuth angle value recorded during full tracking is used as the base angle value. The system moves according to the actual motion curve. The other axis keeps the azimuth or pitch angle value recorded during full tracking unchanged. The angle value of the test axis is measured in real time, and the tracking pixel deviation between the stationary target point and the image center point is calculated. The time difference between them is solved. The above steps are repeated. By changing the platform motion curve information and the detector focal length value, multiple sets of time difference values ​​are obtained, and the average time difference value is solved.

[0039] During use, this application first needs to pre-determine the platform motion curve information, then obtain the maximum and minimum focal lengths of the detector for this experiment, select the focal length used in this experiment, and generate the actual motion curve based on the pre-determined platform motion curve information. Then, a stationary target is selected, and the photoelectric platform system is controlled to enter tracking mode. The photoelectric platform servo system includes pitch and azimuth axes. When it is determined that the photoelectric platform has completely tracked the target, the current pitch and azimuth angle values ​​are recorded. The actual motion curve is then input to the photoelectric platform servo system control terminal, and simultaneously, the photoelectric platform servo system is controlled to enter electric lock mode. Then, one axis is selected, and that axis... Defined as the axis under test, and using the angle value recorded during full tracking as the base angle value, the system moves according to the actual motion curve, and the angle value of the axis under test is measured in real time. At the same time, the pixel deviation between the stationary target point and the center point of the image is calculated. The time difference between the angle value of the axis under test and the tracking pixel deviation at each moment is solved, and this time difference is the delay time. Then, the above steps are repeated. By changing the predetermined platform motion curve information and the detector focal length value, multiple sets of time difference values ​​between the angle value of the axis under test and the tracking pixel deviation are obtained. Based on the multiple sets of time difference values, the average time difference value is solved, and this average time difference value is the final average delay time.

[0040] This application calculates the delay time by considering each subsystem of the optoelectronic platform as a whole, thus avoiding the obscuring of the actual tracking and control performance of the optoelectronic platform due to mutual coupling and cooperation between subsystems, thereby obtaining a more accurate delay time. Simultaneously, by using embedded software to generate motion curves, the tracking link of the optoelectronic platform is considered as a whole system, reducing experimental costs and facilitating testing under laboratory conditions. Furthermore, the amplitude, frequency, and tracking field of view focal length of the motion trajectory can be set according to actual needs, making it easy to adjust and meeting the tracking delay test requirements under different target motion conditions. It has strong applicability. Moreover, the method described in this application does not require additional hardware circuit modules, and the test results can be directly used for a large number of repeated tests via a host computer. The method is simple, reliable, and improves testing efficiency. Attached Figure Description

[0041] Figure 1 A flowchart illustrating the method provided in this application embodiment;

[0042] Figure 2 The system composition of a tracking delay time testing method based on an embedded software optoelectronic platform provided in this application embodiment;

[0043] Figure 3 The upper curve is a graph of the test axis angle of the photoelectric platform provided in this application embodiment before, during and after the test; the lower curve is the tracking deviation of the test axis in the corresponding tracking mode.

[0044] Figure 4 The turntable test axis angle and corresponding tracking deviation (pixels) during the test time of 10s-13s provided in the embodiments of this application. Detailed Implementation

[0045] To enable those skilled in the art to better understand the technical solution of this application, the application will be described in detail below with reference to the accompanying drawings. The description in this section is only exemplary and explanatory, and should not be used to limit the scope of protection of this application.

[0046] This application provides a test method for tracking delay time on an optoelectronic platform based on embedded software, such as... Figure 1 As shown: Figure 2 The system composition of a tracking delay time testing method based on an embedded software optoelectronic platform provided in this application embodiment;

[0047] S1, Pre-defined platform motion curve information;

[0048] A. The platform motion curve information includes the amplitude and frequency values ​​of the platform motion curve, and its expression is as follows:

[0049] θgoal =θ0-Amp*cos(2*PI*frqgoal*timecnt)

[0050] Where: θ goal This represents the angle value of the platform's motion curve;

[0051] θ0 is the current angle value of the photoelectric platform after complete tracking;

[0052] Amp represents the amplitude of the platform motion curve;

[0053] PI is π;

[0054] fregoal is the frequency value;

[0055] timegoal is the counter value that increments by the control cycle.

[0056] Specifically, in this embodiment, the platform motion curve information must first be generated. This can be achieved using embedded software such as DSPs or microcontrollers to generate the predetermined platform motion curve information for the optoelectronic platform. The platform motion curve information includes the amplitude and frequency values ​​of the platform motion curve. The platform motion curve information is as follows:

[0057] θ goal =θ0-Amp*cos(2*PI*frqgoal*timecnt)

[0058] Where: θ goal This represents the angle value of the target's motion curve;

[0059] θ0 is the current angle value of the photoelectric platform at the moment before the tracking mode is activated;

[0060] Amp represents the amplitude of the platform motion curve;

[0061] PI is π;

[0062] fregoal is the frequency value;

[0063] timegoal is the counter value that increments by the control cycle.

[0064] The amplitude of the target motion curve and the target frequency can both be set manually.

[0065] S2. Obtain the maximum and minimum focal lengths of the detector used in this experiment, and select the focal length of the detector used in this experiment between the maximum and minimum focal lengths;

[0066] Specifically, in this embodiment, after the target motion curve information is generated, the maximum focal length and minimum focal length of the detector to be used in this experiment are obtained, and then a focal length is selected between the maximum focal length and the minimum focal length according to the actual situation, that is, the focal length of the detector to be used in this experiment is selected.

[0067] S3. Generate the actual motion curve based on the predetermined target motion curve information, the maximum focal length, the minimum focal length and the used focal length;

[0068] B. The expression for the actual motion curve is as follows:

[0069] θ real =θ goal *Zoom real Zoom min

[0070] Where: θ real This represents the angle value of the actual motion curve;

[0071] Zoom min This is the minimum focal length of the detector;

[0072] Zoom real The focal length used by the detector, and Zoom min ≤Zoom real ≤Zoom max ;

[0073] Zoom max This is the maximum focal length of the detector.

[0074] Specifically, in this embodiment, based on the target motion curve information, the maximum and minimum focal lengths of the detector used in this experiment, and the focal length used, the actual motion curve of the photoelectric platform is generated, as shown below:

[0075] θ real =θ goal *Zoom real Zoom min

[0076] Where: θ real The angle value represents the actual motion curve;

[0077] Zoom min This is the minimum focal length of the detector;

[0078] Zoom real The focal length used by the detector, and Zoom min ≤Zoom real ≤Zoom max ;

[0079] Zoom max This is the maximum focal length of the detector.

[0080] At the end of each experiment, multiple sets of experimental data can be obtained by changing the focal length, motion curve amplitude, and frequency.

[0081] S4. Select a stationary target and put the photoelectric platform system into tracking mode. The servo part of the photoelectric platform system includes pitch axis and azimuth axis. When it is determined that the photoelectric platform system has completely tracked the stationary target, record the pitch axis angle value and azimuth axis angle value at the current moment.

[0082] C. After the step of selecting a stationary target and putting the photoelectric platform system into tracking mode, the following is also included:

[0083] The first pixel deviation is calculated in real time. When the first pixel deviation is less than a first preset threshold, it is determined that the photoelectric platform has completely tracked the stationary target.

[0084] The formula for calculating the first pixel deviation is as follows:

[0085]

[0086] in: To track pixel deviations;

[0087] To fully track the position of previously stationary targets in the image;

[0088] To fully track the center point of the previously tested axis in each image.

[0089] The optoelectronic platform system comprises four sequentially connected subsystems: an imaging detector subsystem, a circuit transmission subsystem, an image tracking and processing subsystem, and a platform servo control subsystem. The first three subsystems are primarily used for target selection. After target selection, the optoelectronic platform system enters tracking mode to track the selected stationary target. The optoelectronic platform servo system includes a pitch axis and an azimuth axis; rotation of these two axes enables the optoelectronic platform to rotate. The system then determines whether it has completely tracked the selected target. The criterion for this determination is real-time calculation of the first pixel deviation. If the first pixel deviation is less than a first preset threshold, it can be concluded that the optoelectronic platform system has achieved complete target tracking. In this embodiment, the first preset threshold is set to 2; that is, when the first pixel deviation is less than 2, it can be concluded that the optoelectronic platform has achieved complete target tracking. The formula for calculating the first pixel deviation is as follows:

[0090]

[0091] in: To track pixel deviations;

[0092] To fully track the position of previously stationary targets in the image;

[0093] To fully track the center point of the previously tested axis in each image.

[0094] The imaging detector captures images of the platform's tested axis in real time. Through image tracking processing algorithms, it can determine the position of the tested axis in each frame of the image and the position of the stationary target in the image. Then, it calculates the first pixel deviation between the position of the tested axis in each frame of the image and the position of the stationary target in the image. When the first pixel deviation is less than 2, it can be determined that the photoelectric platform has achieved complete tracking of the target.

[0095] S5. Input the actual motion curve to the servo system control terminal of the photoelectric platform, and control the photoelectric platform servo system to enter the electric lock mode;

[0096] Once it is determined that the photoelectric platform has completely tracked the target, the actual motion curve is input to the control terminal of the photoelectric platform servo system, and the photoelectric platform servo system is controlled to enter the electric lock mode. The electric lock mode means that the photoelectric platform servo system moves according to the actual motion curve.

[0097] S6. Select one axis as the test axis, and use the pitch axis angle value or azimuth axis angle value recorded during full tracking as the base angle value. Move according to the actual motion curve. Keep the other axis unchanged and keep the azimuth axis angle value or pitch axis angle value recorded during full tracking. Measure the angle value of the test axis in real time, and at the same time calculate the tracking pixel deviation between the stationary target point and the image center point. Solve the time difference between the angle value of the test axis and the tracking pixel deviation at each moment. The image center point refers to the position of the test axis in each frame of the image.

[0098] D. Calculate the pixel deviation using the following formula;

[0099]

[0100] in: To track pixel deviations;

[0101] The position of the stationary target in the image after the servo section of the optoelectronic platform system enters electric lock mode;

[0102] The center point of the axis being tested in each image is the servo section of the optoelectronic platform system after the electric lock mode.

[0103] Then, select any axis as the test axis, and use the current pitch or azimuth angle value as the base angle value. Control the platform to move according to the actual motion curve, while keeping the other axis at its current angle value unchanged. This ensures that the pixel deviation between the test axis and the image center is always 2. During the motion, the angle value of the test axis is measured in real time. Then, the pixel value of the stationary target point and the pixel value of the image center point are measured in real time, and the pixel deviation between the target point pixel value and the image center point pixel value is calculated. This pixel deviation is input to the host computer for storage, and a curve is plotted based on multiple pixel deviations. Then, the angle value of the test axis at each moment is input to the host computer for storage, and a curve is plotted based on multiple test axis angle values. By comparing these two curves, the time difference between the angle value of the test axis and the pixel deviation at each moment is calculated. The calculated time deviation is the delay time.

[0104] S7. Repeat steps S1 to S6, change the predetermined target motion curve information and the detector focal length value, obtain multiple sets of time difference values ​​between the angle values ​​of the tested axis and the pixel deviation, and solve the average time difference value based on the multiple sets of time difference values.

[0105] Figure 3 The test procedure using the method described in this application is shown in the upper part, where the curve represents the angle of the photoelectric platform test axis before, during, and after the test; the lower line represents the tracking deviation of the test axis in the corresponding tracking mode. Figure 3 as well as Figure 4 As can be seen, the time between two adjacent peaks or troughs is the tracking delay time. The tracking delay time of this experiment is approximately 160ms.

[0106] By repeating the above steps and changing the amplitude, frequency, and focal length values ​​in the predetermined target motion curve information, multiple sets of values ​​can be obtained. Then, the average time difference is calculated, which is the average delay time. Specific examples have been used in this paper to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of this application. The above descriptions are merely preferred embodiments of this application. It should be noted that due to the limitations of written expression, and the objective existence of infinite specific structures, those skilled in the art can make several improvements, modifications, or changes without departing from the principles of this invention, and can also combine the above technical features in an appropriate manner. These improvements, modifications, changes, or combinations, or the direct application of the inventive concept and technical solution to other situations without modification, should all be considered within the scope of protection of this application.

Claims

1. A test method for tracking delay time of an optoelectronic platform based on embedded software, characterized in that, Includes the following steps: S1, Pre-defined platform motion curve information; S2. Obtain the maximum and minimum focal lengths of the detector used in this experiment, and select the focal length of the detector used in this experiment between the maximum and minimum focal lengths; S3. Generate the actual motion curve based on the predetermined platform motion curve information, maximum focal length, minimum focal length and the used focal length; S4. Select a stationary target and put the photoelectric platform system into tracking mode. The servo part of the photoelectric platform system includes pitch axis and azimuth axis. When it is determined that the photoelectric platform system has completely tracked the stationary target, record the pitch axis angle value and azimuth axis angle value at the current moment. S5. Input the actual motion curve to the control terminal of the servo part of the photoelectric platform system, and switch the servo part of the photoelectric platform system from tracking mode to electric lock mode, while other parts of the photoelectric platform system remain in tracking mode. S6. Select one axis as the test axis, and use the pitch axis angle value or azimuth axis angle value recorded during full tracking as the base angle value. Move according to the actual motion curve. Keep the other axis unchanged and keep the azimuth axis angle value or pitch axis angle value recorded during full tracking. Measure the angle value of the test axis in real time, and at the same time calculate the tracking pixel deviation between the stationary target point and the image center point. Solve the time difference between the angle value of the test axis and the tracking pixel deviation at each moment. The image center point refers to the position of the test axis in each frame of the image. S7. Repeat steps S1 to S6, change the predetermined platform motion curve information and detector focal length value, obtain multiple sets of time difference values ​​between the angle values ​​of the tested axis and the tracking pixel deviation, and solve the average time difference value based on the multiple sets of time difference values.

2. The method for testing the tracking delay time of an optoelectronic platform based on embedded software according to claim 1, characterized in that, The tracking pixel deviation is calculated using the following formula; in: To track pixel deviations; The position of the stationary target in the image after the servo section of the optoelectronic platform system enters electric lock mode; The center point of the axis being tested in each image is the servo section of the optoelectronic platform system after the electric lock mode.

3. The method for testing the tracking delay time of an optoelectronic platform based on embedded software according to claim 2, characterized in that, The platform motion curve information includes the platform motion curve amplitude and the target frequency value, and its expression is as follows: θ goal nθ0-Amp*cos(2*PI*frqgoal*timecnt) Where: θ goal This represents the angle value of the platform's motion curve; θ0 is the current angle value of the photoelectric platform after complete tracking; Amp represents the amplitude of the platform motion curve. PI is π; fregoal is the frequency value; timegoal is the counter value that increments by the control cycle.

4. The method for testing the tracking delay time of an optoelectronic platform based on embedded software according to claim 3, characterized in that, The expression for the actual motion curve is as follows: i real =θ goal *Zoom real / Zoom min Where: θ real The angle value represents the actual motion curve; Zoom min This is the minimum focal length of the detector; Zoom real The focal length used by the detector, and Zoom min ≤Zoom real ≤Zoom max ; Zoom max This is the maximum focal length of the detector.

5. The method for testing the tracking delay time of an optoelectronic platform based on embedded software according to claim 4, characterized in that, After the step of selecting a stationary target and controlling the photoelectric platform system to enter tracking mode, the following is also included: The first pixel deviation is calculated in real time. When the first pixel deviation is less than a first preset threshold, it is determined that the photoelectric platform system has completely tracked the target. The formula for calculating the first pixel deviation is as follows: in: To track pixel deviations; To fully track the position of previously stationary targets in the image; To fully track the center point of the previously tested axis in each image.

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