Waveguide integrated system, connection device and method for positioning a sample under test
By designing a connection device that includes a sleeve and a backplate, and combining it with an automatic positioning method, the problems of low device loading and unloading efficiency and poor anti-interference ability in the transmission reflection method were solved, and more efficient and accurate electromagnetic parameter measurement was achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING INST OF RADIO METROLOGY & MEASUREMENT
- Filing Date
- 2023-05-29
- Publication Date
- 2026-06-26
Smart Images
Figure CN117013232B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of wave-transparent material measurement technology, and in particular to an integrated waveguide system, a connecting device, and a method for positioning the sample under test. Background Technology
[0002] Currently, the main methods for measuring the electromagnetic parameters of wave-transparent materials include the parallel-plate capacitor method, the resonant cavity method, and the transmission reflection method. Among them, the transmission reflection method is further divided into the coaxial transmission reflection method, the waveguide transmission reflection method, and the free space method. This method has high measurement accuracy in the microwave frequency band and a wide measurement bandwidth, allowing for frequency sweep measurements over a broad frequency range.
[0003] The transmission reflection method places the sample under test in an air transmission line and measures its scattering parameters (S-parameters). By combining these measurements with parameters such as frequency and sample thickness, the electromagnetic parameters of the sample can be deduced. The waveguide transmission reflection method consists of a vector network analyzer, a waveguide coaxial adapter, a waveguide transition section, test fixtures, and calibration components. These components are connected by screws. During calibration and testing, the screws need to be repeatedly removed and removed to secure the calibration components and test fixtures, resulting in low connection efficiency. Furthermore, because the sample is placed in an air transmission line, it is susceptible to external interference.
[0004] Therefore, there is a need for a device that can improve the efficiency and accuracy of loading and unloading test devices, while also being resistant to interference. Summary of the Invention
[0005] This application provides an integrated waveguide system, a connecting device, and a method for positioning the sample under test, which solves the problems of low loading and unloading efficiency and accuracy and poor resistance to external interference in the transmission reflection method in the prior art.
[0006] This application provides a connecting device for positioning and connecting two waveguide transition sections, comprising a first sleeve, a second sleeve, and a back plate. The first and second sleeves each have a cylindrical first through cavity. The first through cavity is divided into a front cavity and a rear cavity by a stepped structure. The cross-sectional radius of the front cavity is larger than that of the rear section, and the cross-sectional radii of both the front and rear cavities are larger than the flange of the waveguide transition section. The back plate is a disk with a radius larger than the cross-sectional area of the rear cavity but smaller than that of the front cavity, and a strip-shaped notch is formed on the disk. The width of the strip-shaped notch is slightly larger than the width of the straight arm of the waveguide transition section but smaller than the diameter of the flange. The back plate is fitted onto the straight arm of the waveguide transition section through the strip-shaped notch, abutting against the flange. The first and second sleeves are respectively fitted onto one waveguide transition section. The stepped structure abuts against the back plate. The front cavities of the first and second sleeves are detachably and fixedly connected.
[0007] Furthermore, the inner wall of the front cavity of the first sleeve is threadedly fitted with the outer wall of the front cavity of the second sleeve.
[0008] Furthermore, the back plate is fixedly connected to the flange.
[0009] Preferably, the material used for the back plate is softer than the materials used for the first sleeve and the second sleeve.
[0010] This application also provides an integrated waveguide system. Using the connection device of any of the above embodiments, it further includes an electromagnetic wave input end, an electromagnetic wave output end, a first measuring box, a second measuring box, a linear guide rail, a first waveguide transition section, a second waveguide transition section, and a waveguide test fixture. One end of the first waveguide transition section is connected to the electromagnetic wave input end, and the other end is detachably and fixedly connected to one end of the second waveguide transition section via a connecting device. The waveguide test fixture is located in the cavity formed by the front cavity of the first sleeve and the front cavity of the second sleeve. Its two end faces are respectively in contact with the end faces of the first and second waveguide transition sections. The waveguide test fixture has through holes perpendicular to the two end faces for placing the sample to be tested. The other end of the second waveguide transition section is connected to the electromagnetic wave output end. The flanges of the first and second waveguide transition sections are detachably and fixedly connected via the waveguide test fixture. The first and second waveguide transition sections are respectively disposed in the first and second measuring boxes, and the first and second measuring boxes are slidably connected to the linear guide rail.
[0011] Furthermore, both the first and second measuring boxes include a cover and a body. A slot is provided on the body. The cover covers the body, forming a second through cavity with the slot. A waveguide transition section is disposed within the second through cavity, with its two ends extending from both ends of the second through cavity.
[0012] Furthermore, there is an enlarged structure between the first waveguide transition section and the second waveguide transition section. The shape of the second through cavity is adapted to the enlarged structure.
[0013] Furthermore, it also includes a base plate and sliders. A linear guide rail is mounted on the base plate. Two sets of sliders are mounted on the linear guide rail. A first measuring box and a second measuring box are respectively fixed to the two sets of sliders.
[0014] Furthermore, the expanded structure is positioned on the side of the waveguide transition section closest to the connecting structure, and the width of the expanded structure is approximately equal to the diameter of the flange. Pin holes are provided on the surface of the expanded structure opposite the flange. Two sets of pins pass through the expanded structures and flanges of the first and second waveguide transition sections, respectively, and are fixedly connected to the waveguide test fixture.
[0015] This application also provides a method for locating a test sample, used in any of the above-described waveguide integrated systems, comprising the following steps:
[0016] The scattering parameters of the calibration reference surface are measured; the calibration reference surface is the through hole surface at one end of the waveguide test fixture.
[0017] Extract the distance between the calibration reference surface and the sample under test, the set step size, the number of steps, and the termination value;
[0018] For each step, calculate |S11-S22| at each frequency point at that position, obtain the maximum value, and get the maximum value of |S11-S22| for each step;
[0019] Compare the maximum values of |S11-S22| for all steps, and find the minimum value among them;
[0020] Calculate the scattering parameters at the step position where the minimum value is obtained.
[0021] The above-described technical solutions adopted in the embodiments of this application can achieve the following beneficial effects:
[0022] This application improves the efficiency and accuracy of loading and unloading test devices, while effectively resisting external interference. Attached Figure Description
[0023] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments of this application and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:
[0024] Figure 1 This is a structural diagram of a connecting device according to an embodiment of this application;
[0025] Figure 2 This is a diagram of the backplate structure of an embodiment of this application;
[0026] Figure 3 This is a structural diagram of an integrated waveguide system according to an embodiment of this application;
[0027] Figure 4 A schematic diagram showing the three dimensions of the sample to be tested in this application;
[0028] Figure 5 This is a schematic diagram illustrating the movement of a reference surface in an embodiment of this application;
[0029] Figure 6 This is a flowchart of a sample positioning method according to an embodiment of this application;
[0030] Figure 7 This is a flowchart illustrating the automatic correction process for sample position in an embodiment of this application. Detailed Implementation
[0031] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0032] The technical solutions provided by the various embodiments of this application are described in detail below with reference to the accompanying drawings.
[0033] Figure 1 This is a structural diagram of a connection device according to an embodiment of this application.
[0034] This application provides a connecting device 1 for positioning and connecting two waveguide transition sections, including a first sleeve 11, a second sleeve 12 and a back plate 13.
[0035] The first sleeve and the second sleeve are each provided with a cylindrical first through cavity 14.
[0036] The first through cavity is divided into a front cavity 141 and a rear cavity 142 by a stepped structure.
[0037] It should be noted that, due to Figure 1 The front cavity of the second sleeve is occupied by the back plate, so the reference numeral 141 in the attached figure points to the back plate 13, which actually refers to the cavity space where the back plate is located.
[0038] The cross-sectional radius of the front cavity is larger than that of the rear section, and the cross-sectional radii of both the front and rear cavities are larger than the flange of the waveguide transition section.
[0039] The back plate is a disk with a radius larger than the cross-section of the rear cavity but smaller than the cross-section of the front cavity, and there are strip-shaped notches on the disk.
[0040] The width of the strip-shaped notch is slightly larger than the width of the waveguide transition section's through arm, but smaller than the diameter of the flange. The backplate is fitted onto the waveguide transition section's through arm through the strip-shaped notch, abutting against the flange.
[0041] The first and second sleeves are respectively fitted onto a waveguide transition section. The stepped structure abuts against the back plate. The front cavities of the first and second sleeves are detachably fixedly connected.
[0042] Furthermore, the inner wall of the front cavity of the first sleeve is threadedly fitted with the outer wall of the front cavity of the second sleeve.
[0043] For example, the traditional connection method for rectangular waveguides is to use screws and nuts for connection and fixation. This connection method has low alignment accuracy and low operation efficiency. Therefore, designing a tightening device can effectively improve alignment accuracy and connection efficiency.
[0044] The connecting device consists of three parts: a pin, sleeves (including a first sleeve and a second sleeve), and a back plate. The pin is used for precise positioning between the waveguide transition section, the test fixture, and the calibration component. The sleeves and back plate are used for connection and fixation between the devices. The pin is designed to be detachable and can be replaced according to the length of the calibration component. Two sleeves, one with internal and one with external threads, are designed to fit onto the first and second waveguide transition sections respectively. The two sleeves can be matched, connected, and tightened.
[0045] Since the diameter of the sleeve needs to be larger than the flange size of the waveguide transition section in order to fit into the waveguide transition section, the diameter of the sleeve tail is made smaller inward, and a back plate is designed to be installed on the waveguide transition section. The sleeve tail is pressed against the back plate, and the back plate is pressed against the flange of the waveguide transition section for compression and fixation.
[0046] Figure 2 This is a diagram of the backplate structure of an embodiment of this application.
[0047] Furthermore, the back plate is fixedly connected to the flange.
[0048] The outer side of the backplate is designed to be circular, with a size smaller than the maximum inner diameter of the sleeve but larger than the minimum inner diameter of the sleeve. A slot 131 is designed on the underside of the backplate. The size of this slot is slightly larger than the outer dimension of the waveguide transmission line through arm, allowing the backplate to be mounted on the through arm of the waveguide transition section. The backplate is then fixed to the flange of the waveguide transition section using pins.
[0049] Preferably, the material used for the back plate is softer than the materials used for the first sleeve and the second sleeve.
[0050] For example, the sleeve is made of copper, which is harder than aluminum, thus extending its service life. The backplate is made of aluminum, which is softer than copper, preventing deformation of the waveguide transition flange when the sleeve is used for locking.
[0051] Furthermore, when the first sleeve and the second sleeve are fixedly connected in the tightest state, the distance between the two back plates is greater than the distance between the two opposing flanges of the first waveguide transition section and the second waveguide transition section.
[0052] Since the radius of the front cavity is larger than that of the flange, when the first sleeve and the second sleeve are fixedly connected, the two sets of front cavities, back plate and flange form a sealed cavity to prevent the material to be tested placed between the two flanges from being disturbed by the outside.
[0053] Figure 3 This is a structural diagram of an integrated waveguide system according to an embodiment of this application.
[0054] Traditional waveguide transmission reflection method electromagnetic parameter measurement systems use screws to connect various dispersed components, resulting in low connection accuracy and efficiency. Therefore, a platform with a precision positioning device is designed, and the waveguide coaxial adapter and waveguide transition section are integrated into the measurement box, which can achieve more efficient and accurate electromagnetic parameter measurement.
[0055] This application also provides an integrated waveguide system. Using any of the above-described embodiments of the connecting device, it further includes an electromagnetic wave input terminal 2, an electromagnetic wave output terminal 3, a first measuring box 4, a second measuring box 5, a linear guide rail 6, a first waveguide transition section 7, a second waveguide transition section 8, and a waveguide test fixture (not shown in the figure).
[0056] One end of the first waveguide transition section is connected to the electromagnetic wave input terminal, and the other end is detachably and fixedly connected to one end of the second waveguide transition section via a connecting device. The other end of the second waveguide transition section is connected to the electromagnetic wave output terminal. The flanges of the first and second waveguide transition sections are detachably and fixedly connected via waveguide test fixtures.
[0057] The waveguide test fixture is located in the cavity formed by the first sleeve front cavity and the second sleeve front cavity. The two end faces are respectively attached to the end faces of the first waveguide transition section and the second waveguide transition section. The waveguide test fixture has through holes perpendicular to the two end faces for placing the sample to be tested.
[0058] The first waveguide transition section and the second waveguide transition section are respectively installed in the first measurement box and the second measurement box, and the first measurement box and the second measurement box are slidably connected to the linear guide rail.
[0059] The waveguide test fixture is a columnar structure with through holes on the top and bottom surfaces. The material under test is placed in the through holes. The two ground surfaces of the waveguide test fixture are fixedly connected to the opposing flanges of the first waveguide transition section and the second waveguide transition section, respectively, so as to complete the clamping of the material under test by the flanges.
[0060] Furthermore, both the electromagnetic wave input terminal and the electromagnetic wave output terminal are vector network analyzers. The vector network analyzer is connected to the waveguide coaxial adapter via a cable, and the waveguide coaxial adapter is connected to the waveguide transition section.
[0061] For example, the side of the measurement box has openings with dimensions matching those of the coaxial connector and the waveguide transition section's through arm, serving as the input / output terminals of the measurement box. That is, the encapsulated measurement box has two ports: a coaxial port and a waveguide port, which connect to the waveguide-coaxial adapter and the waveguide transition section, respectively. During testing, simply connect the coaxial cable to the coaxial port of the measurement box and the test fixture to the waveguide ports on both sides.
[0062] Furthermore, both the first and second measuring boxes include lids 41 and 51 and bodies 42 and 52. The bodies are provided with slots. The lids cover the bodies, forming a second through cavity with the slots. A waveguide transition section is disposed within the second through cavity, with its two ends extending from both ends of the second through cavity.
[0063] Furthermore, there is an enlarged structure between the first waveguide transition section and the second waveguide transition section. The shape of the second through cavity is adapted to the enlarged structure.
[0064] For example, the measuring box (including the first measuring box and the second measuring box) is designed to be square on the outside, with a cover on the top side. The cover is located near the top of the box and is secured with three screws. The interior of the measuring box is designed with slots that match the dimensions of the expanded portion of the waveguide transition section, allowing the transition section to be placed and fixed within the slots.
[0065] Furthermore, it also includes a base plate 9 and a slider 10. The linear guide rail is mounted on the base plate. Two sets of sliders are mounted on the linear guide rail. The first measuring box and the second measuring box are respectively fixed on the two sets of sliders.
[0066] For example, the bottom of the measuring box is designed with threaded holes, so that screws can be used to install the measuring box onto the slider.
[0067] Furthermore, the expanded structure is positioned on the side of the waveguide transition section closer to the connecting structure, and the width of the expanded structure is approximately equal to the diameter of the flange. Pin holes are provided on the surface of the expanded structure opposite to the flange. Two sets of pins pass through the expanded structures and flanges of the first and second waveguide transition sections, respectively, and are fixedly connected to the waveguide test fixture.
[0068] For example, the specific steps for measuring materials in the 18GHz–40GHz frequency band are as follows:
[0069] Connect one end of the waveguide coaxial adapter to the first waveguide transition section with screws and place it in the first measurement box. Then, install and secure the cover of the first measurement box with screws. During calibration and testing, firstly, fit the first sleeve and second sleeve onto the first and second waveguide transition sections on both sides, respectively. Then, attach the back plate to the straight arms of the two waveguide transition sections. Use pins to connect the waveguide flanges on both sides to ensure connection positioning accuracy. Finally, tighten the sleeves on both sides.
[0070] The measuring device was designed based on the dimensions of the waveguide transition section flange and test fixture. The flange dimensions for the K-band (18GHz~26.5GHz) waveguide transition section are 22.4mm×22.4mm, and the flange dimensions for the R-band (26.5GHz~40GHz) waveguide transition section are 19.1mm×19.1mm. The waveguide transition section is made of aluminum, with a length of 100mm. The protrusion dimensions are consistent with the waveguide flange dimensions, with a length of 50mm, and the edge distance from one flange is 30mm.
[0071] The sleeve is made of copper, which is harder than aluminum, thus extending its service life. The sleeve's front cavity diameter is designed to be 33.5mm, allowing it to be used in both K and R bands. The outer surface of the sleeve features a textured design to increase friction and facilitate gripping. The backplate is made of aluminum, which is softer than copper, preventing deformation of the waveguide transition flange when the sleeve is used for locking. The backplate has an outer diameter of 32mm and a thickness of 5mm. The K-band groove width is 8mm, and the R-band groove width is 6mm. Based on the thickness of the test fixture and calibration components, the K-band pin length is designed to be 10mm with an accuracy of 50μm, and the R-band pin length is 8mm with an accuracy of 50μm.
[0072] The integrated waveguide platform and measurement module are made of aluminum, with an alignment accuracy of 50μm on both sides. The K-band integrated platform has a base plate size of 350mm × 100mm × 40mm, a guide rail length of 300mm, and a measurement module size of 60mm × 46mm × 50mm. The R-band integrated platform also has a base plate size of 350mm × 100mm × 40mm, a guide rail length of 300mm, and a measurement module size of 60mm × 46mm × 50mm.
[0073] Figure 4 This is a schematic diagram showing the three dimensions of the sample to be tested in this application.
[0074] For example, such as Figure 4 As shown, since the sample is completely embedded in the waveguide test fixture, the positioning and connection of the sample under test in the vertical and horizontal dimensions of the entire waveguide integrated system can be transformed into the positioning and connection of the test fixture in the vertical and horizontal dimensions of the entire waveguide integrated system.
[0075] Traditional waveguide test fixtures are connected to the flanges of the waveguide transition sections on both sides using four screws. This method has low alignment accuracy and low operational efficiency. Therefore, a tightening device with locating pins was designed to improve positioning accuracy and effectively address the inconvenience of connecting test devices.
[0076] The tightening device consists of three parts: a pin, a collar, and a back plate. The pin ensures precise positioning of the waveguide test fixture, the test sample, and the calibration component perpendicular to its length. The collar and back plate are used for connection and fixation between the waveguide components being tested and calibrated. All three parts of the tightening device are designed to be detachable and replaceable depending on the length of the calibration component and test fixture. Two collars, one with internal and one with external threads, are fitted onto the waveguide transition sections at both ends. The two collars can be matched and tightened. To facilitate replacement, the diameter of the collars must be larger than the waveguide flange size for easy insertion and removal. The back plate is installed on the waveguide transition section, using the tail of the collar against the back plate, which in turn presses against the waveguide flange for fixation. The outer side of the back plate is circular, with a size smaller than the maximum inner diameter of the collar but larger than its minimum inner diameter. This design ensures that the tightening force of the collar is evenly distributed on the back plate, preventing deformation of the waveguide flange. A groove is designed on the underside of the backplate. The size of the groove is slightly larger than the outer dimension of the waveguide transmission line through arm, so that the backplate can be mounted on the through arm of the waveguide transition section. Two protrusions are designed on the backplate to fix the backplate to the flange of the waveguide transition section.
[0077] Figure 5 This is a schematic diagram of the reference surface relocation in an embodiment of this application.
[0078] Sample in Figure 4 The positioning of the sample in the test fixture along the front-to-back direction (i.e., the length of the waveguide) is the distance from the end face of the sample. However, since the sample is embedded in the waveguide test fixture, common tools such as vernier calipers cannot accurately measure the distance from the sample to the end face of the test fixture, which will introduce errors due to inaccurate sample positioning. Therefore, based on the conventional reference surface relocation, a method for positioning the sample under test is proposed.
[0079] Traditional reference plane relocation diagram as shown Figure 4 As shown, the calibration reference surface is located at the connection surface between the waveguide transition section and the waveguide test fixture on one side port, which is also the empty surface of the through hole at one end of the waveguide test fixture. The distance between the sample and the calibration reference surface is l. The S-parameters after the reference surface is moved are shown in Equation 1-4:
[0080] S 11 =S 11M exp(2γ0l) Formula 1
[0081] S 12 =S 12M exp(-γ0d) Formula 2
[0082] S 21 =S 21M exp(-γ0d) Formula 3
[0083] S 22 =S 22MFormula 4: exp(-2γ0(l+d))
[0084] Assuming the sample under test is an isotropic, homogeneous, and linear material, the S-parameters of the sample itself after the reference surface is moved are scattering parameters. These S-parameters are obtained by measuring the scattering parameters at both ends of the waveguide test fixture using a vector network analyzer and by moving the reference surface.
[0085] Figure 6 This is a flowchart of a method for locating a test sample according to an embodiment of this application.
[0086] This application also provides a method for locating a test sample, used in any of the waveguide integrated systems described in the above embodiments, comprising the following steps:
[0087] Step 110: Measure the scattering parameters of the calibration reference surface; the calibration reference surface is the through hole surface at one end of the waveguide test fixture;
[0088] Step 120: Extract the distance between the calibration reference surface and the sample under test, the set step size, the number of steps, and the termination value;
[0089] Step 130: Calculate the scattering parameters at the relocation distance for each step, select the maximum value of |S11-S22| for all frequency points at the relocation distance, and obtain the maximum value of |S11-S22| for each step;
[0090] Step 140: Compare the maximum values of |S11-S22| for all steps, and obtain the minimum value among them;
[0091] Step 150: Calculate the scattering parameters at the step position of the minimum value.
[0092] Figure 7 This is a flowchart illustrating the automatic correction process for sample position in an embodiment of this application.
[0093] For example, when S21 = S12, the sample position is the closest position between S11 and S22. First, input the initial value of the distance l between the sample and the reference surface at port 1, the step size Δl, and the number of steps n or the termination value ln. Apply formulas 1-4 to calculate the S-parameters for each transport distance l. Select the maximum value of |S11-S22| among all frequency points under each l for comparison. The minimum value corresponds to the distance l between the tested sample and the calibration reference surface. The calculation process is as follows: Figure 7 As shown.
[0094] For example, the specific implementation steps of the improved sample positioning method using waveguide transmission reflection are as follows:
[0095] During testing, the collars must first be fitted onto the waveguide transition sections on both sides. Then, the backplate is mounted onto the through arm of the waveguide transition section, and the pin is installed onto the flange of one side of the waveguide transition section. Next, the sample is placed into the test fixture, and the test fixture is mounted onto the pin. The pin is then connected through to the waveguide flange on the other side to ensure overall connection and positioning accuracy. Finally, the collars on both sides are tightened.
[0096] In the automatic positioning correction algorithm, the position search step Δl is defined as 10 μm, and the position search range is 2 mm before and after the initial input value. Using tools such as vernier calipers, the initial position of the sample in the fixture is estimated and input into the software as the initial value. Running the automatic positioning correction algorithm then yields the precise position of the sample in the fixture.
[0097] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.
Claims
1. A connecting device for positioning and connecting two waveguide transition sections, characterized in that, It includes a first sleeve, a second sleeve, and a back plate; The first sleeve and the second sleeve are each provided with a cylindrical first through cavity; The first through cavity is divided into a front cavity and a rear cavity by a stepped structure; The cross-sectional radius of the front cavity is larger than that of the rear section, and the cross-sectional radii of both the front and rear cavities are larger than the flange of the waveguide transition section. The back plate is a disk with a radius larger than the cross-section of the rear cavity but smaller than the cross-section of the front cavity, and there are strip-shaped notches on the disk; The width of the strip-shaped notch is slightly larger than the width of the straight arm of the waveguide transition section, but smaller than the diameter of the flange; The backplate is fitted onto the straight arm of the waveguide transition section through a strip-shaped notch, and abuts against the flange; The first sleeve and the second sleeve are respectively fitted onto a waveguide transition section; The stepped structure abuts against the back panel; The front chambers of the first and second sleeves are detachably fixedly connected.
2. The connecting device according to claim 1, characterized in that, The inner wall of the front cavity of the first sleeve is threadedly fitted with the outer wall of the front cavity of the second sleeve.
3. The connecting device according to claim 1, characterized in that, The back plate is fixedly connected to the flange.
4. The connecting device according to claim 1, characterized in that, The material used for the backplate is softer than that used for the first and second sleeves.
5. A waveguide integrated system, characterized in that, The device includes the connection device according to any one of claims 1-4, and further includes an electromagnetic wave input terminal, an electromagnetic wave output terminal, a first measuring box, a second measuring box, a linear guide rail, a first waveguide transition section, a second waveguide transition section, and a waveguide test fixture; One end of the first waveguide transition section is connected to the electromagnetic wave input end, and the other end is provided with a detachable fixed connection to one end of the second waveguide transition section via a connecting device. The other end of the second waveguide transition section is connected to the electromagnetic wave output end; The flanges of the first and second waveguide transition sections are detachably fixedly connected by waveguide test fixtures. The waveguide test fixture is located in the cavity formed by the front cavity of the first sleeve and the front cavity of the second sleeve. The two end faces are respectively attached to the end faces of the first waveguide transition section and the second waveguide transition section. The waveguide test fixture has through holes that are perpendicular to the two end faces for placing the sample to be tested. The first waveguide transition section and the second waveguide transition section are respectively installed in the first measurement box and the second measurement box, and the first measurement box and the second measurement box are slidably connected to the linear guide rail.
6. The waveguide integrated system according to claim 5, characterized in that, Both the first and second measuring boxes include a lid and a box body; The box is equipped with a card slot; The cover is placed on the box body, forming a second through cavity with the slot. The waveguide transition section is set inside the second through cavity, with its two ends extending out from both ends of the second through cavity.
7. The waveguide integrated system according to claim 6, characterized in that, There is an enlarged structure between the first waveguide transition section and the second waveguide transition section; The second through cavity is adapted to the shape of the expanded structure.
8. The waveguide integrated system according to claim 5, characterized in that, It also includes a base plate and sliders; The linear guide rail is mounted on the base plate; The two sets of sliders are mounted on a linear guide rail; The first measuring box and the second measuring box are fixed on the two sets of sliders, respectively.
9. The waveguide integrated system according to claim 7, characterized in that, The expansion structure is positioned on the side of the waveguide transition section closer to the connecting structure, and the width of the expansion structure is approximately equal to the diameter of the flange. The expansion structure has pin holes on the surface opposite to the flange; Two sets of pins pass through the enlarged structures of the first and second waveguide transition sections, the flange, and are fixedly connected to the waveguide test fixture.
10. A method for locating a sample under test, using the waveguide integrated system described in any one of claims 5-9, characterized in that, Includes the following steps: The scattering parameters of the calibration reference surface are measured; the calibration reference surface is the through hole surface at one end of the waveguide test fixture. Extract the distance between the calibration reference surface and the sample under test, the set step size, the number of steps, and the termination value; For each step, calculate |S11-S22| at each frequency point at that position, obtain the maximum value, and get the maximum value of |S11-S22| for each step; Compare the maximum values of |S11-S22| for all steps, and find the minimum value among them; Calculate the scattering parameters at the step position where the minimum value is obtained.