Near-field testing method, system and apparatus for antennas

Abstract

The present disclosure provides a near-field test method, system and device for an antenna, the method comprising: providing a to-be-tested antenna and a feed source, a to-be-tested region of the to-be-tested antenna being divided into a plurality of sub-regions, the feed source being configured to provide a radiation field to the to-be-tested region; performing near-field scanning on the plurality of sub-regions respectively by using a test probe to obtain measurement data corresponding to each of the plurality of sub-regions respectively; and obtaining far-field characteristic data of the to-be-tested antenna based on the measurement data corresponding to each of the plurality of sub-regions respectively.

Description

Technical Field

[0001] This disclosure relates to the field of antenna technology, and in particular to a near-field testing method, system, and device for antennas. Background Technology

[0002] In recent years, near-field measurement technology has gradually emerged. Near-field measurement technology uses near-field scanning to indirectly measure the radiation performance of an antenna and obtains the far-field characteristics of the antenna through algorithm inversion. It has advantages such as high confidentiality, high precision, and all-weather operation.

[0003] In near-field measurement technology, the measuring device used is a test probe. During near-field testing, a feed source is used to provide a radiation field to the antenna under test. The test probe moves within a scanning plane to scan and obtain the near-field measurement data of the antenna under test, thereby obtaining the far-field characteristics of the antenna under test based on the measurement data.

[0004] In related technologies, near-field measurement technology includes two methods: positive feed illumination and negative feed illumination. In practice, regardless of which method is used, the test probe needs to move within the entire scan area corresponding to the antenna under test to complete the scan. When the scan area is too large, the test time is very long, resulting in low test efficiency. Summary of the Invention

[0005] This disclosure provides a near-field testing method for an antenna, the near-field testing method for the antenna including:

[0006] An antenna under test and a feed source are provided. The test area of ​​the antenna under test is divided into multiple sub-regions, and the feed source is used to provide a radiation field to the test area.

[0007] A test probe was used to perform near-field scanning on each of the sub-regions to obtain measurement data corresponding to each of the sub-regions.

[0008] Based on the measurement data corresponding to each of the multiple sub-regions, the far-field characteristic data of the antenna under test are obtained.

[0009] In an optional example, the step of using a test probe to perform near-field scanning on multiple sub-regions to obtain measurement data corresponding to each of the multiple sub-regions includes:

[0010] The antenna under test is translated and / or rotated so that the first sub-region to be tested is located within the scanning range of the test probe and the radiation field of the feed source; the first sub-region is any one of the plurality of sub-regions;

[0011] The test probe is used to perform a near-field scan of the first sub-region to obtain measurement data of the first sub-region.

[0012] In one optional example, a test probe is used to perform near-field scanning on multiple sub-regions to obtain measurement data corresponding to each of the multiple sub-regions, including:

[0013] Adjust the position of the test probe and / or the position of the feed source so that the test probe is located within the scanning plane corresponding to the second sub-region to be scanned, and the second sub-region is located in the radiation field of the feed source; the second sub-region is any one of the multiple sub-regions;

[0014] The test probe is used to perform a near-field scan of the second sub-region to obtain measurement data of the second sub-region; wherein the test probe is not located in the radiation field of the feed source.

[0015] In one alternative example, the position of the test probe is adjusted under the constraint condition corresponding to the test probe; the constraint condition is that the test probe has the same interval distance with different sub-regions.

[0016] In an optional example, the method further includes:

[0017] During the near-field scanning of each sub-region, other sub-regions are occluded except for that sub-region.

[0018] In one optional example, far-field characteristic data of the antenna under test are obtained based on measurement data from multiple said sub-regions, including:

[0019] Inverting the measurement data of multiple sub-regions yields the aperture field distribution corresponding to each of the multiple sub-regions;

[0020] Based on the aperture field distribution corresponding to each of the multiple sub-regions, the far-field characteristic data of the antenna under test are obtained.

[0021] In one optional example, far-field characteristic data of the antenna under test are obtained based on the aperture field distribution corresponding to each of the multiple sub-regions, including:

[0022] Based on the positions of each of the multiple sub-regions in the region under test, the aperture field distributions of each sub-region are combined to obtain the actual aperture field distribution of the antenna under test.

[0023] Based on the actual aperture field distribution of the antenna under test, the far-field characteristic data of the antenna under test in the radiation field are obtained.

[0024] In one optional example, based on the respective positions of the multiple sub-regions in the region under test, the aperture field distributions of each sub-region are combined to obtain the actual aperture field distribution of the antenna under test, including:

[0025] Obtain the path difference of the feed source;

[0026] Based on the positions of the various sub-regions in the region to be measured and the path difference, the various aperture field distributions are combined to obtain the actual aperture field distribution.

[0027] In an optional example, the test area of ​​the antenna under test is divided into multiple sub-regions through the following steps:

[0028] Determine the size of each individual sub-region to be divided;

[0029] Based on the size of the single sub-region, the region to be tested is divided into multiple sub-regions.

[0030] In one optional example, determining the size of the individual sub-regions to be divided includes:

[0031] Obtain the desired scanning area size corresponding to the area to be tested, and the spacing distance between the test probe and the antenna to be tested;

[0032] Based on the desired scan area size and spacing, the size of the individual sub-region to be divided is determined.

[0033] In one optional example, determining the size of the individual sub-regions to be divided includes:

[0034] Obtain the position parameters corresponding to the feed source, wherein the position parameters are used to characterize the desired azimuth and desired height of the feed source relative to the area to be measured;

[0035] Based on the position parameters, determine the size of the scanning surface corresponding to a single sub-region;

[0036] The size of the individual sub-region to be divided is determined based on the size of the scanning surface corresponding to the individual sub-region.

[0037] This application also provides a near-field testing system for an antenna, the system comprising:

[0038] An antenna support assembly is used to support the antenna under test, wherein the test area of ​​the antenna under test is divided into multiple sub-regions;

[0039] A feed source is used to provide a radiation field to the area to be measured;

[0040] A test probe is used to perform near-field scanning on multiple sub-regions respectively, and obtain measurement data corresponding to each of the multiple sub-regions;

[0041] A computing component is used to acquire far-field characteristic data of the antenna under test based on measurement data corresponding to each of the multiple sub-regions.

[0042] In an optional example, the system also includes:

[0043] An antenna moving device for translating and / or rotating the antenna support assembly to translate and / or rotate the antenna under test so that the first sub-region to be tested is located within the scanning range of the test probe and the radiation field of the feed source; the first sub-region is any one of the plurality of sub-regions.

[0044] In an optional example, the system also includes:

[0045] A scanning movement device is used to move the test probe and / or the feed source so that the test probe is located within the scanning plane corresponding to the second sub-region to be scanned, and the second sub-region is located in the radiation field of the feed source; wherein the second sub-region is any one of the plurality of sub-regions, and the test probe is not located in the radiation field of the feed source.

[0046] In an optional example, the system also includes: a masking element;

[0047] The occlusion element is used to occlude other sub-regions besides the stated sub-region during near-field scanning of each sub-region.

[0048] This disclosure also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executed, implements the near-field testing method described above.

[0049] In addition, a non-transient computer-readable storage medium is provided, which stores a computer program that causes a processor to execute the near-field testing method as described.

[0050] The above description is merely an overview of the technical solution disclosed herein. In order to better understand the technical means of this disclosure and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this disclosure more apparent and understandable, specific embodiments of this disclosure are described below. Attached Figure Description

[0051] To more clearly illustrate the technical solutions in the embodiments or related technologies of this disclosure, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are some embodiments of this disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. It should be noted that the dimensions and shapes of the figures in the drawings do not reflect actual proportions and are only intended to illustrate the content of the present invention. The same or similar reference numerals in the drawings represent the same or similar elements or elements having the same or similar functions.

[0052] Figure 1 A schematic diagram of a near-field test under positive feed illumination mode is shown.

[0053] Figure 2 A schematic diagram of a near-field test under a feed-off illumination mode is shown.

[0054] Figure 3 A flowchart illustrating the steps of a near-field testing method for an antenna provided in this disclosure is shown schematically.

[0055] Figure 4 The diagram illustrates a comparison of dividing the area to be measured with and without dividing it under the condition of feed offset illumination.

[0056] Figure 5 The diagram illustrates the movement of the antenna under test in two cases: when the phased array antenna is divided into two sub-regions and four sub-regions.

[0057] Figure 6 A schematic diagram of the framework of a near-field testing system for an antenna is shown. Detailed Implementation

[0058] To make the objectives, technical solutions, and advantages of the embodiments of this disclosure clearer, the technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0059] To fully understand the near-field testing method of this application, two near-field testing methods in related technologies are described below. (Refer to...) Figure 1 and Figure 2 As shown, Figure 1 A schematic diagram of near-field testing under positive feed illumination mode is shown. Figure 2 A schematic diagram of near-field testing under the feed offset illumination mode is shown. Figure 1 and Figure 2 The dashed lines in the diagram represent the scanning surface of the test probe.

[0060] like Figure 1 As shown, for the positive feed illumination method, if the test probe is placed behind the feed, according to the Nyquist sampling theorem, there will be a problem of an excessively large scanning area, and the feed will block part of the scanning area, resulting in inaccurate test data. If the probe is placed in front of the scanning area, the test probe will interfere with the feed illumination. That is, the test probe is in the radiation field of the feed, which will inevitably interfere with the radiation field, thus also leading to inaccurate test data.

[0061] like Figure 2 As shown, for the feed offset illumination method, in order to ensure that the test probe does not interfere with the feed illumination, that is, to ensure that the test probe is not in the radiation field of the feed, the feed position needs to be placed very low. In this way, the radiation field of the feed will be incident on the antenna under test at a very small angle. However, this does not conform to the actual working condition of the antenna under test, so the test results cannot effectively reflect the actual working performance of the antenna.

[0062] Furthermore, regardless of whether the feed is positive or negative, the test probe needs to move within the entire scan area corresponding to the antenna under test to complete the scan. When the scan area is too large, the test time is very long, resulting in low test efficiency.

[0063] In view of this, the applicant proposes a partitioned testing concept to improve testing efficiency. Specifically, the test area of ​​the antenna under test is divided into multiple sub-regions, and near-field scanning is performed on each sub-region. Then, the near-field scans of each sub-region are combined to finally obtain the test data of the antenna under test.

[0064] Under this design, since each near-field scan targets only a portion of the test area, the scanning area of ​​the test probe can be reduced for each scan, thereby increasing the testing speed. Furthermore, in offset feed illumination, zonal testing, because each scan targets only a portion of the test area, results in a smaller scanning area. This allows the test probe to move within a smaller scanning area, making it easier for the test probe to avoid being within the radiation field of the feed. Therefore, it allows the feed to be placed higher, such as... Figure 2 As shown, when the scanning area is smaller than Figure 2 When the scanning surface is shown by the dashed line, the height of the feed can be increased, so that the radiation field of the feed can be incident on the antenna under test at a larger angle.

[0065] In near-field testing, the far-field of the data (antenna amplitude and phase data) collected within the scanning plane, after inversion, generally needs to approximate the far-field of the antenna under test. Therefore, the measurement data collected within the scanning plane, after inversion, needs to reflect the true far-field radiation of the antenna. Specifically, in the case of feed offset illumination, the method for determining the height and size of the scanning plane is as follows:

[0066] 1. The center of the scanning surface should be aligned with the center of the antenna array under test;

[0067] 2. In order for the current scanning surface test results to be correctly deduced into the antenna far-field radiation pattern, the scanning surface height and size settings must meet certain angular domain conditions. Specifically, the angular domain conditions are as follows: assuming that the complementary angle between the line connecting the edge of the scanning surface to the edge of the antenna surface and the antenna array surface is θ, then the tangent of θ must be less than: (scanning surface side length - antenna side length) / (2 * scanning surface height).

[0068] This shows that if the array size and scanning area size remain unchanged, forcibly reducing the scanning area height (i.e., placing the feed very low in related technologies) will fail to meet the angular domain constraints for scanning area testing, making the calculation of the far-field radiation pattern from the test results inaccurate. Therefore, while meeting the minimum angular domain requirements, reducing the size of the antenna array under test can simultaneously reduce both the scanning area height and the scanning area size.

[0069] Therefore, this application employs a partitioned testing method under the condition that the scanning plane is in the critical angular domain. This method reduces the array size of a single test while simultaneously lowering the scanning plane height (e.g., ...). Figure 4 The difference lies in the height of the scanning surface and its size. Since the feed source must be placed behind (or flush with) the scanning surface during reflective array testing, the feed source height can be reduced during testing. Therefore, the sum of the scanning surfaces is slightly smaller, thereby improving scanning efficiency and testing speed.

[0070] Reference Figure 3 The diagram illustrates a flowchart of the near-field testing method for the antenna according to this application. This near-field testing method can be applied to both positive feed illumination and negative feed illumination, and preferably, it is more commonly applied to negative feed illumination. This application can be applied to the near-field testing of phased array antennas, such as... Figure 3 As shown, the specific steps may include:

[0071] Step S301: Provide an antenna under test and a feed source. The test area of ​​the antenna under test is divided into multiple sub-regions. The feed source is used to provide a radiation field to the test area.

[0072] In this embodiment, the antenna under test refers to the antenna that needs a feed source to be tested, which can be a phased array antenna or other types of antennas. Among them, a phased array antenna is a collection of antenna array elements assembled together, which can be an antenna array composed of a module consisting of several antenna elements arranged at a certain interval on the same plane or curved surface and active devices closely connected to them.

[0073] In this array, the radiation pattern of each element is structurally combined with the radiation patterns of adjacent antennas to form an effective radiation pattern called the main lobe. The shape of the radiation pattern is altered by controlling the feed phase of the radiating elements in the array. Controlling the phase can change the direction of the maximum value of the antenna pattern, thus achieving beam scanning.

[0074] The feed source provides a radiation field to the antenna under test (AUT). Specifically, the feed source radiates electromagnetic waves onto the reflector of the AUT, creating a suitable field distribution across the aperture to form the desired sharp or shaped beam. In this embodiment, the radiation field can be understood as the field radiated by the electromagnetic waves, i.e., the electromagnetic field region.

[0075] The test area of ​​the antenna under test can refer to the region on the antenna used to reflect radiated waves. Taking a phased array antenna as an example, the test area can be the region formed by the arrangement of several antenna elements. The test area can be divided into several sub-regions, each a part of the test area. Again using a phased array antenna as an example, multiple adjacent antenna elements can be grouped into a single sub-region, resulting in multiple sub-regions. This involves dividing the antenna elements into blocks. Generally, the division can be equal, unequal, or a combination of equal and unequal divisions. For example, for a phased array antenna, some sub-regions may contain the same number of antenna elements (e.g., four), while others may contain six antenna elements each.

[0076] Of course, the specific division method can be flexibly determined according to the actual situation of the test area of ​​the antenna under test, and this application does not impose any restrictions.

[0077] Step S302: Use a test probe to perform near-field scanning on the multiple sub-regions respectively to obtain the measurement data corresponding to each of the multiple sub-regions.

[0078] In this embodiment, after dividing the area to be tested into sub-regions, near-field scanning can be performed on each sub-region. Specifically, the test probe scans each sampling point within the scanning surface corresponding to each sub-region, obtaining the measurement data measured at each sampling point. Thus, the measurement data obtained from each sampling point within the scanning surface constitutes the measurement data corresponding to that sub-region. The scanning surface can be uniformly divided into multiple grid points, each grid point being a sampling point. When the test probe moves to a sampling point, it scans the amplitude and phase data at the current sampling point; this amplitude and phase data constitutes the measurement data.

[0079] In one alternative example, a near-field scan can be performed on one sub-region at a time to sequentially complete the near-field scan of multiple sub-regions. The movement of the test probe within the scanning plane can be referenced from relevant techniques and will not be elaborated upon here.

[0080] The scanning surface can be a planar scanning surface, a spherical scanning surface, or a cylindrical scanning surface.

[0081] Step S303: Based on the measurement data corresponding to each of the multiple sub-regions, obtain the far-field characteristic data of the antenna under test.

[0082] In this embodiment, after obtaining the measurement data corresponding to each sub-region, the amplitude and phase data of each sub-region in the near field can be obtained. Then, according to the near-field to far-field transformation theory in related technologies, the measurement data of each sub-region is transformed to obtain the waveform diagram of the amplitude and phase of each sub-region in the far field as a function of position. Then, the waveform diagrams of the amplitude and phase of multiple sub-regions in the far field as a function of position are combined to obtain the far-field characteristic data of the antenna under test.

[0083] Of course, in an alternative example, during the near-field scanning of each sub-region, other sub-regions are blocked. This blocking can be achieved using absorbing materials to prevent interference from radiation from other sub-regions while a sub-region is being scanned in the near field.

[0084] The technical solution adopted in this application has two advantages. First, since each near-field scan targets only a portion of the area to be tested, the scanning area of ​​the test probe can be reduced for each scan, thereby improving the testing speed. Second, when applied to positive feed illumination, such as... Figure 1 As shown, with a reduced scanning area, the test probe's moving scan can avoid the feed source, i.e., avoid scanning behind the feed source or avoiding the feed source's radiation field. This avoids the problem of the feed source partially obscuring the scanning area and prevents the test probe from interfering with the radiation field generated by the feed source, thus improving the accuracy of near-field testing. Furthermore, when applied to feed-off illumination, with a reduced measured area, the entire scanning area of ​​the antenna under test is reduced, and the feed source does not need to be forcibly lowered. While ensuring that the feed source's radiation field can be incident on the antenna under test at a larger angle, the feed source can be adjusted within a certain height range. Therefore, while increasing the testing speed with a reduced scanning area, it also ensures that the inverted measurement data reflects the far-field distribution of the antenna under test during actual operation.

[0085] Reference Figure 4 As shown, a comparative schematic diagram is presented regarding the division of the measurement area with and without division under feed offset illumination conditions, as follows: Figure 4 As shown, A is the region to be tested, and A1 and A2 are the sub-regions after division. If near-field scanning is adopted in related technologies, in order to prevent the test probe from interfering with the radiation field of the feed source, the radiation field is as follows: Figure 4 As shown in Figure S, the feed needs to be placed very low, i.e., the feed height needs to be forcibly reduced. This will lead to the inability to meet the angular domain constraints of the scanning surface test, resulting in inaccurate testing. Figure 4 Position 1 in the middle, the resulting scan surface is as follows Figure 4 Middle scan surface 1 ( Figure 4 As shown by the thinner dashed line, the scanning area is quite large. After dividing the test area A into zones and performing partitioned testing, the corresponding scanning area for near-field scanning of A1 is as follows... Figure 4 Scanning surface 2 in Figure 4 (The thicker dashed line in the middle) shows that, compared to scan 1, scan surface 2 is smaller and its position is lower, allowing the feed source to be set at the height of position 2 ( Figure 4 Position 2 is merely an example illustration, or it can be set at a position slightly higher than position 1. In this way, on the one hand, when the feed needs to be placed behind the scanning surface, the test probe will not interfere with the radiation field of the feed when it moves in the scanning surface 2. On the other hand, setting the feed at a position slightly higher than position 1 makes the far-field characteristic data obtained by the test closer to the far-field performance of the antenna under test when it is actually working, thereby improving the accuracy of the near-field test.

[0086] In one embodiment, the near-field testing method for the antenna of this application is described in chronological order of the near-field testing process:

[0087] First, the antenna under test and the feed source need to be provided. Since the test area needs to be divided into multiple sub-regions, the test area must first be divided:

[0088] In one alternative example, the division method and the corresponding scanning surface size of each partition can be set according to the shape of the test area of ​​the antenna under test. If the test area is a regular shape, it can be divided into multiple equal sub-regions, such as a circular region, a parabolic antenna under test (the test area is a regular parabola), and a regular polygonal test area. If the test area is an irregular shape, it can be adaptively divided according to its shape.

[0089] The number of sub-regions can be determined based on the size of each individual sub-region. In practice, because the area to be measured is divided, the area of ​​each sub-region is reduced, thereby reducing the size of the scanning surface. Therefore, regardless of the division method, the efficiency of near-field scanning can be improved.

[0090] In one alternative example, for a regularly shaped region to be tested, it can be divided into multiple sub-regions as follows:

[0091] Determine the size of each individual sub-region to be divided, and divide the test area into multiple sub-regions based on the size of each individual sub-region.

[0092] In this embodiment, the size of a single sub-region can be determined based on the overall size of the area to be tested. For example, if the overall size of the area to be tested is large, the size of the sub-region can be designed to be large to avoid too many partition tests. Of course, this is not the only possibility in practice. In one possible implementation, if the overall size of the area to be tested is large due to the size of the scanning environment, the size of the sub-region can be designed to be small, thereby allowing the test probe to move and scan within a smaller scanning area.

[0093] Since the size of the scanning surface is related to the size of the scanning surface, and the size of the scanning surface is related to the height of the feed in the feed offset illumination, it directly affects the overall scanning time and the accuracy of the test. Therefore, if the far field of the data collected within the scanning surface, after calculation and inversion, can approximate the far field test of the antenna under test, the scanning time can be controlled as short as possible within an acceptable range. This allows for the pre-design of the size of the scanning surface corresponding to the area under test.

[0094] In this way, once the size of the scanning surface of the entire test area is designed, the size of the scanning surface of each sub-region can be determined based on the size of the scanning surface corresponding to the test area (the size of the scanning surface corresponding to the test area is the sum of the sizes of the scanning surfaces corresponding to each sub-region), and thus the size of each sub-region can be determined based on the size of the scanning surface of each sub-region.

[0095] Therefore, in one embodiment, the expected scanning surface size corresponding to the area under test and the spacing distance between the test probe and the antenna under test can also be obtained; based on the expected scanning surface size and the spacing distance, the size of the individual sub-region to be divided can be determined.

[0096] The desired scanning area size refers to the pre-specified size of the scanning area, designed to further shorten the scanning time, while ensuring that the far-field data obtained from the scanning area, after calculation and inversion, approximates the far-field test results of the antenna under test. The interval distance can be represented by wavelength and can be approximated as the scanning area height mentioned above.

[0097] In practice, the size of the scanning surface in near-field scanning is affected by factors such as the distance between the test probe and the antenna under test, and the area of ​​the region under test. Generally speaking, the size of the scanning surface can be calculated by setting a reasonable scanning surface height according to the size of the region under test. Therefore, conversely, once the scanning surface height and size are determined, the size of the region under test can be calculated.

[0098] In this embodiment, since the size of each sub-region can be determined by the size of the scanning surface of each sub-region, and the size of the scanning surface of each sub-region can be determined by the desired scanning surface size, and the interval between the test probe and the antenna under test can generally be fixed, the sum of the scanning surfaces of multiple sub-regions corresponding to each other when the interval distance with the test probe is consistent is the desired scanning surface size. Based on this principle, the size of a single sub-region to be divided can be determined based on the interval distance.

[0099] For example, if the desired scanning area size is 200, the size of a single sub-region can be obtained based on the number of sub-regions to be divided. If it is divided into 4 sub-regions, the scanning area is cut into 4. The specific size of each scanning area can be determined based on the interval distance, the desired scanning area size, and the number of sub-regions to be divided, according to the calculation formula for scanning area size in related technologies.

[0100] In another alternative example, in feed offset illumination, the lower the feed position, the larger the scanning area. The height of the feed position also determines the size of the scanning area corresponding to the test area. In order to achieve test results that conform to the actual working conditions of the antenna under test, the feed offset position can be specified in advance, that is, the expected azimuth angle and expected height of the feed relative to the test area. This is to obtain a smaller scanning area while ensuring that the test results conform to the actual working performance of the antenna under test (i.e., to make the feed offset position of the feed approximately consistent with the actual offset position of the antenna under test).

[0101] In practice, the position parameters corresponding to the feed can be obtained. The position parameters are used to characterize the expected azimuth and expected height of the feed relative to the area to be measured. Based on the position parameters, the size of the scanning surface corresponding to a single sub-region can be determined. Based on the size of the scanning surface corresponding to a single sub-region, the size of the single sub-region to be divided can be determined.

[0102] In this embodiment, the desired azimuth angle of the feed relative to the area under test can refer to: the pre-set incident angle of the feed relative to the edge of the area under test, which is related to the illumination direction of the feed relative to the area under test, such as... Figure 2 As shown, in Figure 2 Under the direction of illumination, the desired azimuth angle is as follows: Figure 2 The included angle θ1, while the desired height can refer to the vertical distance between the feed source and the area to be measured.

[0103] In this embodiment, when the desired azimuth angle and desired altitude of the feed are obtained, such as Figure 4 As stated above, it can be predicted that when the test probe does not obstruct the radiation field of the area to be tested at the desired azimuth angle and desired height, the size of its scanning surface can be determined based on the maximum scanning surface size, which can be used to determine the size of the scanning surface corresponding to a single sub-region.

[0104] For example, such as Figure 4 As shown, the feed is located at position 2. Given the known distance between the test probe and the antenna under test, the size of the scanning surface can be determined without the test probe interfering with the feed's radiation field. This scanning surface size can be used as the scanning surface corresponding to a single sub-region. Therefore, given the known scanning surface size, the size of a single sub-region can be calculated using relevant formulas. Based on the size of each single sub-region, the area under test can be divided such that each sub-region is smaller than or equal to the calculated size of the single sub-region.

[0105] In this embodiment, the size (scanning surface and area to be measured) can refer to the area size. If it is a planar scan, it refers to the area size of the scanning plane. If it is a spherical scan, it can refer to the area size of the sphere.

[0106] By employing the division methods based on the expected scanning area size and the expected azimuth and height of the feed source in the embodiments of this application, the far field of the data collected within the scanning area after calculation and inversion can be approximately equivalent to the far field test of the antenna under test. By using the region division method that conforms to the expected scanning area size or the region division method that conforms to the expected azimuth and height, the scanning area size corresponding to the test area can be minimized as much as possible, and the scanning time can be actively controlled within the shortest possible time, thereby shortening the scanning time and improving the test efficiency.

[0107] After dividing the area to be tested into multiple sub-regions, near-field scanning begins:

[0108] In one alternative example, two methods for near-field scanning of multiple sub-regions are illustrated. In method A, the position of the feed and the scanning surface position of the test probe remain unchanged during the scanning process, while the antenna under test (AUT) is moved to test each sub-region. In method B, the position of the AUT remains unchanged, while the position of the feed and the scanning surface position of the test probe are adjusted so that the radiation field of the sub-region to be scanned can radiate onto the adjusted scanning surface of the test probe, and the sub-region to be scanned can be within the radiation field of the feed.

[0109] Method A: When using a test probe to perform near-field scanning on multiple sub-regions to obtain measurement data for each sub-region, the antenna under test can be translated and / or rotated so that the first sub-region to be detected is within the scanning range of the test probe and the radiation field of the feed source; and the test probe is used to perform near-field scanning on the first sub-region to obtain measurement data for the first sub-region.

[0110] The first sub-region is any one of the multiple sub-regions.

[0111] In this embodiment, since the antenna under test can be a phased array antenna, a parabolic antenna, etc., the area under test has different shapes. In order to facilitate scanning each sub-region sequentially, the sub-region of the antenna under test can be actively aligned with the scanning surface of the test probe. This allows for near-field scanning of the sub-region while keeping the feed position as still as possible and ensuring that the scanning surface of the test probe is the same as possible.

[0112] Depending on the position of the sub-region within the test area and the shape of the test area, the antenna under test can be translated and / or rotated. For example, if it is a phased array antenna, since its test area is an area of ​​multiple element arrays, generally planar in shape, the first sub-region under test can be translated alone, rotated alone, or translated and rotated simultaneously, according to the position of the divided sub-region, so that the first sub-region under test enters the scanning range of the test probe and the radiation field of the feed source, thereby completing the near-field scan of it.

[0113] For example, refer to Figure 5 As shown, this diagram illustrates the positional movement of the antenna under test in two scenarios: dividing the phased array antenna into two sub-regions and four sub-regions. Figure 5 As shown in the image on the left, when divided into two sub-regions, the phased array antenna can be rotated 180° directly, so that the two sub-regions are respectively in the scanning plane of the test probe. Since the phased array antenna is actually rotating in its original position during the rotation, it does not affect the change of the radiation field of the phased array antenna by the feed or the change of the scanning plane position of the test probe.

[0114] like Figure 5 As shown in the image on the right, when divided into four sub-regions, the phased array antenna can be directly tested using a combination of translation and rotation. For example, after testing sub-region 1, when testing sub-region 2, sub-region 2 is translated to be within the scanning plane of the test probe. In this case, if sub-region 2 is not completely within the radiation field of the feed, the feed position can be adjusted appropriately. After testing sub-region 2, when testing sub-region 3, the phased array antenna can be rotated, thus avoiding changes to the positions of the feed and test probe. Similarly, sub-region 4 can be tested using a translation method after testing sub-region 2.

[0115] Of course, in yet another alternative example, such as Figure 5 As shown, when divided into 4 sub-regions, the phased array antenna can be rotated individually in combination with rotation, rotating 90° each time.

[0116] In one alternative example, if multiple sub-regions of a parabolic antenna are being tested, since a parabolic antenna is generally a symmetrical parabola, the antenna can be rotated directly during the test to bring the first sub-region under test into the scanning plane of the test probe.

[0117] Method B: When using a test probe to perform near-field scanning on multiple sub-regions to obtain measurement data for each sub-region, the position of the test probe and the position of the feed source can be adjusted until the adjusted test probe is on the scanning surface corresponding to the second sub-region to be scanned, and the second sub-region is in the radiation field of the adjusted feed source. Then, the test probe is used to perform near-field scanning on the second sub-region to obtain the measurement data of the first sub-region.

[0118] In this context, the adjusted test probe is not located in the radiation field of the adjusted feed source, and the second sub-region is any one of the multiple sub-regions.

[0119] In this method B, the position of the antenna under test can be kept unchanged, while the position of the test probe and the position of the feed source can be adjusted. Specifically, the test probe can be adjusted to the scanning plane corresponding to the second sub-region. If it is a planar scan, the test probe can be adjusted to a sampling point at the edge of the scanning plane corresponding to the second sub-region. If it is a spherical or cylindrical scan, the test probe can be adjusted to any sampling point on the scanning plane corresponding to the second sub-region.

[0120] In this method B, if the second sub-region is not entirely within the radiation field of the feed source, the position of the feed source can be adjusted so that the second sub-region is completely within the radiation field of the feed source.

[0121] In practice, the test probe or the feed source can be adjusted separately or both can be adjusted appropriately, depending on the actual situation. This application does not impose any restrictions on these aspects.

[0122] Of course, in some optional embodiments, the position of the test probe can be subject to corresponding constraints. Specifically, the position of the test probe is adjusted under the constraints corresponding to the test probe. The constraint is that the test probe has the same spacing distance with different sub-regions.

[0123] In this case, since the size of the scanning area is related to the distance between the test probe and the region, and also to the location and depth of the radiation field of the antenna under test reflected in the measurement data, the position of the test probe can be adjusted while keeping the distance between the test probe and the region constant, in order to reduce the error caused by the different distances in the measurement data of each sub-region. For example, in planar scanning, the test probe can be kept moving within the same plane.

[0124] The embodiment using method B allows for zone testing of antennas under test that are difficult to move, while the embodiment using method A allows for zone testing of antennas under test that are easy to move, and can ensure that the positions of the test probe and feed source remain unchanged as much as possible, thus reducing the difficulty of zone testing.

[0125] Of course, in an alternative example, the antenna under test can be translated and / or rotated, and the position of the feed or test probe can be adjusted to complete a high-precision partitioned near-field scan.

[0126] After obtaining the measurement data of each sub-region through scanning, the far-field distribution is obtained through inversion:

[0127] In one optional embodiment, the near-field scanning data is inverted using an algorithm to calculate the aperture field distribution of each sub-region, and the far-field characteristic data to be measured is obtained based on the aperture field distributions corresponding to each of the multiple sub-regions.

[0128] Among them, the aperture field distribution refers to the distribution of the aperture field in the sub-region, including amplitude and phase. Based on the aperture field distribution, the far-field distribution characteristics of the antenna under test in the radiation field can be obtained.

[0129] In one alternative example, when obtaining far-field characteristic data of the antenna under test based on the aperture field distribution corresponding to each of the multiple sub-regions, the aperture field distributions of each sub-region can be combined based on their respective positions in the region under test to obtain the actual aperture field distribution of the antenna under test; and based on the actual aperture field distribution of the antenna under test, the far-field distribution of the antenna under test in the radiation field can be obtained.

[0130] The actual aperture field distribution can refer to the distribution of the aperture field of the entire area under test. The aperture field distribution of each sub-region can be directly combined according to the location of the sub-region. This can be understood as splicing the sub-regions according to their locations to obtain the actual aperture field distribution of the antenna under test.

[0131] Next, based on the actual aperture field distribution of the antenna under test, the actual aperture field distribution can be transformed according to the near-field to far-field transformation theory to obtain the far-field characteristic data of the antenna under test in the radiation field.

[0132] Of course, in an alternative example, to avoid measurement errors caused by zonal testing, error correction can be performed based on the path difference of the feed when obtaining the far-field characteristic data of the antenna under test. In specific implementation, the actual aperture field distribution can be obtained by combining the field distributions of each aperture based on the position of each of the multiple sub-regions in the region under test and the path difference.

[0133] Here, path difference refers to the difference in the distance traveled by two waves from their source to a certain particle. In this embodiment, during partitioned testing, the boundary between sub-regions may be scanned repeatedly by the test probe, meaning that a particle may have overlapping measurement data. In this case, if the feed position is adjusted during near-field scanning of the two sub-regions, the path difference generated by the feed at the boundary between the two sub-regions can be used to correct the error caused by repeated measurements, thereby obtaining more accurate measurement data.

[0134] Specifically, in the process of obtaining the actual aperture field distribution of the area to be tested, a path difference correction can be added to correct the error caused by repeated measurements of the sub-regions at the boundary, thereby improving the accuracy of near-field testing.

[0135] Below, with Figure 4 Taking the near-field scanning under the feed offset illumination method shown as an example, the near-field testing method of the antenna of this application is introduced, which may include the following steps:

[0136] S1: Provides a phased array antenna (as the antenna under test) and its corresponding feed.

[0137] S2: Divide the test area of ​​the phased array antenna into two sub-regions of the same size.

[0138] S3: Near-field planar scanning test of a phased array antenna in a microwave anechoic chamber environment, including, for example... Figure 5 As shown in the image on the left, the left half is labeled region A1, and the right half is labeled region A2. Planar near-field scanning tests were performed on region A1 using an offset feed method, while region A2 was shielded with absorbing material to preserve the near-field measurement data.

[0139] S4: With the feed position unchanged, rotate the phased array antenna 180° around the center. At this time, the positions of regions A1 and A2 are reversed, with region A2 located on the left. The test probe then moves within the scanning plane corresponding to region A2, which is consistent with the scanning plane corresponding to region A1. The test probe performs a planar near-field scan test on region A2, while simultaneously using absorbing material to shield region A1, thus preserving the near-field measurement data.

[0140] In this scenario, after scanning region A1, the test probe changes position. After rotating region A2, the test probe can begin moving within the scanning plane from its current position. Alternatively, after scanning region A1, the test probe can return to its initial scanning position. After rotating region A2, the test probe can then begin moving within the scanning plane from that initial position. Either method can be used as needed, and no specific limitation is imposed here.

[0141] S5: Perform algorithmic inversion on the near-field measurement data of regions A1 and A2 to calculate the aperture field distribution of regions A1 and A2. Then, recombine the aperture field distributions of regions A1 and A2 according to their actual positions to calculate the actual aperture field distribution of the phased array antenna. Finally, based on the actual aperture field distribution, obtain the far-field distribution of the phased array antenna. This far-field distribution is the far-field characteristic data.

[0142] The scanning surface in the near-field testing method described in this embodiment can be a cylindrical surface, a spherical surface, or a plane, and can be specifically determined based on the actual antenna under test. In general, the near-field testing method of this application is applicable to all of the above-mentioned scanning surfaces.

[0143] Based on the same inventive concept, this application also provides a near-field testing system for antennas, referring to... Figure 6 As shown, a schematic diagram of the near-field testing system is presented, such as... Figure 6 As shown, the system includes:

[0144] An antenna support assembly is used to support the antenna under test, wherein the test area of ​​the antenna under test is divided into multiple sub-regions;

[0145] A feed source is used to provide a radiation field to the area to be measured;

[0146] A test probe is used to perform near-field scanning on multiple sub-regions respectively, and obtain measurement data corresponding to each of the multiple sub-regions;

[0147] A computing component is used to acquire far-field characteristic data of the antenna under test based on measurement data corresponding to each of the multiple sub-regions.

[0148] The near-field testing system of this embodiment is located in a microwave anechoic chamber environment. Using the near-field testing system of this application embodiment, the antenna under test can be scanned in a regional manner, which can reduce the scanning area and improve the testing efficiency.

[0149] In one alternative example, since both method A and method B described above can be used when testing each sub-region, the system also includes, to support method A:

[0150] An antenna moving device for translating and / or rotating the antenna support assembly to translate and / or rotate the antenna under test so that the first sub-region currently to be tested is located within the scanning range of the test probe and in the radiation field of the feed source; the first sub-region is any one of the plurality of sub-regions.

[0151] To support method B, the system also includes:

[0152] A scanning movement device is used to move the position of the test probe and / or the offset position of the feed source until the test probe is located within the scanning plane corresponding to the second sub-region to be scanned and the second sub-region is in the radiation field of the feed source; wherein the second sub-region is any one of the multiple sub-regions, and the test probe is not located in the adjusted radiation field of the feed source.

[0153] The testing system can include both an antenna moving device and a scanning moving device. In practice, since the scanning is a fine-grained process, a control device can be added to precisely control the displacement of the antenna moving device and the scanning moving device.

[0154] In an optional example, a shielding element is also included for shielding other sub-regions besides the stated sub-region during near-field scanning of each sub-region. The shielding element is made of a microwave-absorbing material.

[0155] In an alternative example, the computing component can also be used to determine the size of a single sub-region to be divided; and based on the size of the single sub-region, to divide the region to be tested into multiple sub-regions.

[0156] More specifically, in an alternative example, the computing component can obtain the desired scan area size corresponding to the region under test, and the spacing distance between the test probe and the antenna under test; based on the desired scan area size and the spacing distance, the size of the individual sub-region to be divided is determined.

[0157] In another alternative example, the computing component may obtain position parameters corresponding to the feed source, the position parameters being used to characterize the desired azimuth and desired height of the feed source relative to the area to be measured; based on the position parameters, determine the size of the scanning surface corresponding to a single sub-region; and based on the size of the scanning surface corresponding to a single sub-region, determine the size of the single sub-region to be divided.

[0158] In one optional example, the computing component can specifically invert the measurement data of multiple sub-regions to obtain the aperture field distribution corresponding to each of the multiple sub-regions; and obtain the far-field characteristic data of the antenna under test based on the aperture field distribution corresponding to each of the multiple sub-regions.

[0159] More specifically, in an optional example, the computing component may combine the aperture field distributions of the various sub-regions based on their respective positions in the region under test to obtain the actual aperture field distribution of the antenna under test; and based on the actual aperture field distribution of the antenna under test, obtain the far-field characteristic data of the antenna under test in the radiation field.

[0160] In yet another alternative example, the computing component may specifically acquire the path difference of the feed source;

[0161] Based on the positions of the various sub-regions in the region to be measured and the path difference, the various aperture field distributions are combined to obtain the actual aperture field distribution.

[0162] As the near-field testing system embodiment for antennas is basically similar to the near-field testing method embodiment for antennas, the description is relatively simple. For relevant details, please refer to the description of the near-field testing method embodiment for antennas.

[0163] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0164] This disclosure also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executed, implements the near-field testing method described above. Specifically, the electronic device can be used as a computer execution unit in near-field testing to control the movement of the antenna under test, receive measurement data, invert the far-field distribution, and control the movement of the feed source and the test probe.

[0165] In addition, a non-transient computer-readable storage medium is provided, which stores a computer program that causes a processor to execute the near-field testing method as described.

[0166] Finally, it should be noted that, unless otherwise defined, the terms "first," "second," and similar terms used herein do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element. Terms such as "connected" or "linked" are not limited to physical or mechanical connections but can include electrical connections, whether direct or indirect.

[0167] The foregoing has provided a detailed description of a near-field testing method, programming device, programming system, and display device for an antenna provided by this disclosure. Specific examples have been used to illustrate the principles and implementation methods of this disclosure. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of this disclosure. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this disclosure. Therefore, the content of this specification should not be construed as a limitation of this disclosure.

[0168] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0169] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

[0170] The terms "an embodiment," "embodiment," or "one or more embodiments" as used herein mean that a particular feature, structure, or characteristic described in connection with an embodiment is included in at least one embodiment of this disclosure. Furthermore, please note that the examples of the phrase "in one embodiment" do not necessarily all refer to the same embodiment.

[0171] Numerous specific details are set forth in the specification provided herein. However, it will be understood that embodiments of this disclosure may be practiced without these specific details. In some instances, well-known methods, structures, and techniques have not been shown in detail so as not to obscure the understanding of this specification.

[0172] In the claims, any reference signs placed between parentheses should not be construed as limiting the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. This disclosure can be implemented by means of hardware comprising a plurality of different elements and by means of a suitably programmed computer. In a unit claim enumerating a plurality of means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third, etc., does not indicate any order. These words may be interpreted as names.

[0173] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this disclosure, and are not intended to limit them. Although this disclosure has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this disclosure.

Claims

1. A near-field testing method for an antenna, characterized in that, The method includes: An antenna under test and a feed source are provided. The test area of ​​the antenna under test is divided into multiple sub-regions. The feed source is used to provide a radiation field to the test area. The test area is the region on the antenna under test used to reflect radiated waves. The test area includes a region formed by the arrangement of several antenna elements. A test probe was used to perform near-field scanning on each of the sub-regions to obtain measurement data corresponding to each of the sub-regions. Based on the measurement data corresponding to each of the multiple sub-regions, the far-field characteristic data of the antenna under test are obtained; Specifically, when acquiring the far-field characteristic data of the antenna under test, the error caused by repeated measurements is corrected based on the path difference generated by the feed at the boundary of the two sub-regions.

2. The method according to claim 1, characterized in that, The method involves using a test probe to perform near-field scanning on multiple sub-regions to obtain measurement data corresponding to each of the multiple sub-regions, including: The antenna under test is translated and / or rotated so that the first sub-region to be tested is located within the scanning range of the test probe and the radiation field of the feed source; the first sub-region is any one of the plurality of sub-regions; The test probe is used to perform a near-field scan of the first sub-region to obtain measurement data of the first sub-region.

3. The method according to claim 1 or 2, characterized in that, A test probe is used to perform near-field scanning on multiple sub-regions to obtain measurement data corresponding to each sub-region, including: Adjust the position of the test probe and / or the position of the feed source so that the test probe is located within the scanning plane corresponding to the second sub-region to be scanned, and the second sub-region is located in the radiation field of the feed source; the second sub-region is any one of the multiple sub-regions; The test probe is used to perform a near-field scan of the second sub-region to obtain measurement data of the second sub-region; wherein the test probe is not located in the radiation field of the feed source.

4. The method according to claim 3, characterized in that, Adjust the position of the test probe under the constraints corresponding to the test probe; The constraint condition is that the test probe has the same spacing distance with different sub-regions.

5. The method according to claim 1, characterized in that, The method further includes: During the near-field scanning of each sub-region, other sub-regions are occluded except for that sub-region.

6. The method according to claim 1, characterized in that, The process of obtaining far-field characteristic data of the antenna under test based on measurement data from multiple sub-regions includes: Inverting the measurement data of multiple sub-regions yields the aperture field distribution corresponding to each of the multiple sub-regions; Based on the aperture field distribution corresponding to each of the multiple sub-regions, the far-field characteristic data of the antenna under test are obtained.

7. The method according to claim 6, characterized in that, The process of obtaining far-field characteristic data of the antenna under test based on the aperture field distribution corresponding to each of the multiple sub-regions includes: Based on the positions of each of the multiple sub-regions in the region under test, the aperture field distributions of each sub-region are combined to obtain the actual aperture field distribution of the antenna under test. Based on the actual aperture field distribution of the antenna under test, the far-field characteristic data of the antenna under test in the radiation field are obtained.

8. The method according to claim 7, characterized in that, Combining the respective aperture field distributions based on the positions of the multiple sub-regions in the region to be measured to obtain the actual aperture field distribution of the antenna to be measured includes: Obtaining the path difference of the feed source; Combining the respective aperture field distributions based on the positions of the multiple sub-regions in the region to be measured and the path difference to obtain the actual aperture field distribution.

9. The method according to claim 1, characterized in that, The region to be measured of the antenna to be measured is divided into multiple sub-regions through the following steps: Determining the size of a single sub-region to be divided; Based on the size of the single sub-region, dividing the region to be measured into multiple sub-regions.

10. The method according to claim 9, characterized in that, Determining the size of a single sub-region to be divided includes: Obtaining the size of the expected scanning plane corresponding to the region to be measured and the spacing distance between the test probe and the antenna to be measured; Based on the size of the expected scanning plane and the spacing distance, determining the size of the single sub-region to be divided.

11. The method according to claim 9, characterized in that, Determining the size of a single sub-region to be divided includes: Obtaining the position parameters corresponding to the feed source, where the position parameters are used to characterize the expected azimuth angle and expected height of the feed source relative to the region to be measured; Based on the position parameters, determining the size of the scanning plane corresponding to a single sub-region; Based on the size of the scanning plane corresponding to a single sub-region, determining the size of the single sub-region to be divided.

12. A near-field testing system for an antenna, characterized in that, The system includes: An antenna support assembly for supporting the antenna to be measured, and the region to be measured of the antenna to be measured is divided into multiple sub-regions; A feed source for providing a radiation field to the region to be measured; A test probe for respectively performing near-field scanning on multiple sub-regions to obtain measurement data corresponding to each of the multiple sub-regions; A calculation component for obtaining the far-field characteristic data of the antenna to be measured based on the measurement data corresponding to each of the multiple sub-regions; The region to be measured is the region on the antenna to be measured for reflecting radiation waves, and the region to be measured includes a region formed by the arrangement of a plurality of antenna elements; Wherein, when obtaining the far-field characteristic data of the antenna to be measured, the error caused by repeated measurement is corrected based on the path difference generated by the feed source at the junction of two sub-regions.

13. The system according to claim 12, characterized in that, Includes: An antenna moving device for translating and / or rotating the antenna support assembly to translate and / or rotate the antenna to be measured so that the first sub-region to be currently detected is within the scanning range of the test probe and within the radiation field of the feed source; the first sub-region is any one of the multiple sub-regions.

14. The system according to claim 12, characterized in that, Further includes: A scanning moving device for moving the test probe and / or the feed source so that the test probe is within the scanning plane corresponding to the second sub-region to be currently scanned and the second sub-region is within the radiation field of the feed source; wherein, the second sub-region is any one of the multiple sub-regions and the test probe is not within the radiation field of the feed source.

15. The system according to claim 12, characterized in that, Further includes: An occlusion member; The occlusion member is used to occlude other sub-regions except the sub-region during the near-field scanning of each sub-region.

16. An electronic device, characterized in that, It includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executed, implements the near-field testing method as described in any one of claims 1-11.

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