System and method for sequentially powering a circuit board and a test device to test the circuit board

Abstract

A system and method for sequentially supplying power to a circuit board and a testing device to test the circuit board, which controls a power supply controller to sequentially supply power to a circuit board under test, a card testing device, and an extended testing device according to a sequence by a testing control device, and transmits a testing signal to the circuit board under test by the card testing device and the extended testing device, so that the testing signal passes through the circuit board under test connected with electronic components to generate a result signal, and the result signal is received by the card testing device to generate a testing result of the circuit board under test, thereby sequentially supplying power to the circuit board and its testing device to avoid failure to generate a correct testing result, and achieving the technical effects of improving the pass rate and increasing the testing efficiency.

Description

Technical Field

[0001] A testing system and method thereof, particularly a system and method for sequentially supplying power to a circuit board and a testing device to test the circuit board. Background Technology

[0002] Industry 4.0, also known as the Fourth Industrial Revolution, is not simply about creating new industrial technologies. Instead, it focuses on integrating existing industrial technologies, sales processes, and product experiences. Through artificial intelligence, it aims to build intelligent factories that are adaptive, resource-efficient, and ergonomic. Furthermore, it integrates customers and business partners into business and value processes to provide comprehensive after-sales service, thereby constructing a new, intelligent industrial world with awareness and consciousness.

[0003] As the wave of Industry 4.0 sweeps the globe, manufacturers are all optimizing their production transformation and enhancing their competitiveness through intelligent manufacturing. Intelligent manufacturing is built on sensing technology, network technology, automation technology, and artificial intelligence. It achieves intelligent product design and manufacturing, as well as enterprise management and services through processes of perception, human-machine interaction, decision-making, execution, and feedback.

[0004] The electronics industry's characteristics of low profit margins and high sales volume, coupled with fierce price competition, drive businesses to seek more effective control and optimization of raw materials and production tools, thereby maximizing the efficiency of factory production resources. This includes product testing after manufacturing is completed.

[0005] Generally, during product testing, power is initially supplied to the test devices. If there are multiple test devices, power is usually supplied to all of them simultaneously. However, for some circuit boards, such as motherboards, if power is supplied to all connected test devices simultaneously, unexpected signals may be generated during power supply due to the interconnection between the test devices and the circuit board. This can cause the connected test devices and / or circuit boards to fail to power on properly, fail to start successfully, or malfunction after starting. This will result in incorrect test results, reducing the first-pass yield (FPY) and requiring manpower and time to identify and troubleshoot the anomalies.

[0006] In summary, it is clear that the existing technology has long suffered from the problem that simultaneously supplying power to the circuit board and its testing device may lead to the inability to perform tests or the generation of erroneous results. Therefore, it is necessary to propose improved technical means to solve this problem. Summary of the Invention

[0007] In view of the problem that simultaneously supplying power to a circuit board and its testing device may result in incorrect test results, the present invention discloses a system and method for sequentially supplying power to a circuit board and a testing device to test the circuit board, wherein:

[0008] The system disclosed in this invention, which sequentially supplies power to a circuit board and a testing device for testing the circuit board, includes at least: a testing machine for placing the circuit board under test (TBD); a power controller; a cardboard testing device connected to the TBD; an expansion testing device connected to the TBD; and a test control device connected to the cardboard testing device and the expansion testing device. The test control device controls the power controller to supply power to the TBD, the cardboard testing device, and the expansion testing device in a first sequence, controls the testing machine to connect the TBD to the electronic components, and transmits test signals to the TBD through the cardboard testing device and the expansion testing device. The test signals generate result signals by passing through the TBD connected to the electronic components, and the cardboard testing device receives the result signals and generates test results for the TBD based on the result signals.

[0009] The method disclosed in this invention for sequentially supplying power to a circuit board and a testing device to test the circuit board includes at least the following steps: connecting the circuit board under test (DUT) to a cardboard testing device, the DUT to an expansion testing device, and placing the DUT on a testing machine; a testing control device controlling the testing machine to connect the DUT to electronic components; the testing control device controlling a power controller to supply power to the DUT, the cardboard testing device, and the expansion testing device in a first sequence; the testing control device transmitting test signals to the DUT through the cardboard testing device and the expansion testing device, causing the test signals to generate result signals through the DUT connected to electronic components, and receiving the result signals through the cardboard testing device; and the testing control device generating test results for the DUT based on the result signals.

[0010] The system and method disclosed in this invention are as described above. The difference between this invention and the prior art is that the present invention controls the power controller to supply power to the circuit board under test, the card board testing device, and the expansion testing device in sequence through the test control device. The card board testing device and the expansion testing device transmit test signals to the circuit board under test, so that the test signals generate result signals through the circuit board under test connected to electronic components. The card board testing device receives the result signals to generate the test results of the circuit board under test, thereby solving the problems existing in the prior art and achieving the technical effects of improving the pass rate and increasing the test efficiency. Attached Figure Description

[0011] Figure 1A This is a system architecture diagram of sequentially supplying power to a circuit board and a testing device to test the circuit board, as proposed in this invention.

[0012] Figure 1BThis is another system architecture diagram of sequentially supplying power to a circuit board and a testing device to test the circuit board, as proposed in this invention.

[0013] Figure 2A This is a flowchart illustrating the method of sequentially supplying power to a circuit board and a testing device to test the circuit board, as proposed in this invention.

[0014] Figure 2B This is a flowchart illustrating an additional method for sequentially supplying power to a circuit board and a testing device to test the circuit board, as proposed in this invention.

[0015] Figure 2C This is a flowchart of the second sequence method for generating power according to the present invention.

[0016] Figure 3 This is a flowchart illustrating another method proposed in this invention for sequentially supplying power to a circuit board and a testing device to test the circuit board.

[0017] Figure 4 This is a schematic table of control commands provided in the embodiments of the present invention.

[0018] The annotations in the attached figures are explained as follows:

[0019] 101: Circuit board under test

[0020] 110: Power Controller

[0021] 120: Cardboard Testing Device

[0022] 130: Expanded testing equipment

[0023] 140: Adapter Test Device

[0024] 150: Testing equipment

[0025] 151: Electronic Components

[0026] 160: Test control device

[0027] Step 210: Connect the circuit board under test (DUT) to the cardboard testing device and the expanded testing device, and place the DUT on the testing machine.

[0028] Step 230: The test control device controls the test machine to connect the circuit board under test and the electronic components.

[0029] Step 250: The test control device controls the power controller to supply power to the circuit board under test, the card board test device, and the expansion test device in the first sequence.

[0030] Step 253: The test control device determines whether it has received an abnormal signal from the cardboard test device.

[0031] Step 255: The test control device generates different second sequences based on the abnormal signals.

[0032] Step 257: The test control device controls the power controller to supply power to the circuit board under test, the card board test device, and the expansion test device in the second sequence.

[0033] Step 260: The test control device transmits control signals to the circuit board under test (DUT) through the cardboard test device and the expansion test device, so that the control signals generate result signals through the DUT connected to the electronic components.

[0034] Step 270: The test control device receives the result signal through the cardboard test device and generates the test result of the circuit board under test based on the result signal.

[0035] Step 280: The test control device controls the power controller to stop supplying power to the circuit board under test, the card board test device, and the expansion test device in the reverse order of the first sequence.

[0036] Step 290: The test control device controls the test machine to separate the circuit board under test from the electronic components.

[0037] Step 310: Connect the circuit board under test (PCB) to the adapter test device, the card test device, and the expansion test device, and place the PCB under test on the test bench.

[0038] Step 330: The test control device controls the test bench to connect the circuit board under test and the electronic components.

[0039] Step 350: The test control device controls the power controller to supply power to the adapter test device, the circuit board under test, the card test device, and the expansion test device in the first sequence.

[0040] Step 360: The test control device transmits control signals to the circuit board under test (DUT) via the adapter test device, the cardboard test device, and the expansion test device. These control signals then generate result signals through the DUT, which connects to the electronic components.

[0041] Step 370: The test control device receives the result signal through the adapter test device and the card board test device, and generates the test result of the circuit board under test based on the result signal.

[0042] Step 380: The test control device controls the power controller to stop supplying power to the adapter test device, the circuit board under test, the card board test device, and the expansion test device in the reverse order of the first sequence.

[0043] Step 390: The test control device controls the test machine to separate the circuit board under test from the electronic components. Detailed Implementation

[0044] The features and implementation methods of the present invention will be described in detail below with reference to the accompanying drawings and embodiments. The content is sufficient to enable any person skilled in the art to easily and fully understand the technical means used by the present invention to solve the technical problem and to implement it accordingly, thereby achieving the effects that the present invention can achieve.

[0045] This invention can control the order of power supply to the circuit board and the test devices required for testing the circuit board during testing, so that the circuit board and other test devices can start up smoothly and operate normally.

[0046] The following is a preliminary step. Figure 1A The system operation of this invention is illustrated by a system architecture diagram of sequentially supplying power to a circuit board and a testing device, using the circuit board as an example. Figure 1A As shown, the system of the present invention includes a power controller 110, a card board testing device 120, an expansion testing device 130, a testing machine 150, and a testing control device 160, wherein the testing machine 150 and the testing control device 160 may be computing devices.

[0047] The power controller 110 is connected to the board testing device 120, the expansion testing device 130, the testing machine 150, the test control device 160, and the circuit board under test 101. It can receive power control signals transmitted by the test control device 160 and can select targets (including but not limited to the board testing device 120, the expansion testing device 130, the testing machine 150, and the circuit board under test 101) to power or de-power based on the received power control signals. In some embodiments, the power controller 110 can also supply power to the testing machine 150. The power controller 110 can be a programmable logic controller (PLC), and the power control signals can be PLC control instructions, but this invention is not limited to these limitations.

[0048] The board testing device 120 can be connected to the power controller 110 via a power connection interface (not shown in the figure), to the expansion testing device 130 and the test control device 160 via a signal input / output interface (not shown in the figure), and to the circuit board under test 101 via a test interface (not shown in the figure).

[0049] The board testing device 120 is responsible for starting up after the power controller 110 supplies power, and for receiving the test signals transmitted by the test control device 160 through the signal input / output interface. It can also transmit part of the test signal to the expansion test device 130 through another signal input / output interface, and can transmit another part of the test signal to the circuit board under test 101 through the test interface. The board testing device 120 is also responsible for receiving the result signal transmitted back by the circuit board under test 101 through the test interface, and for transmitting the received result signal back to the test control device 160 through the signal input / output interface.

[0050] The expansion test device 130 can be connected to the power controller 110 via a power connection interface (not shown in the figure), and to the card board test device 120 and the test control device 160 via a signal input / output interface (not shown in the figure).

[0051] The extended test device 130 is responsible for starting up after the power controller 110 supplies power, and is responsible for receiving the test signals transmitted by the test control device 160 through the signal input / output interface. It can also transmit part of the test signal to the card board test device 120 through another signal input / output interface.

[0052] The test equipment 150 can be connected to the power controller 110 via a power connection interface (not shown in the figure), and to the test control device 160 via a physical connection cable, wired network, or wireless network. The test equipment 150 can also provide the circuit board under test 101 to be placed in the test position for testing.

[0053] The test equipment 150 may include one or more electronic components 151. Electronic components 151 may include processor modules and memory (DIMM) modules, but the present invention is not limited thereto. The processor module includes, but is not limited to, a central processing unit (CPU) or other processing chips.

[0054] The testing machine 150 can determine the electronic component 151 connected to the circuit board 101 under test and the connection position of the electronic component 151 connected to the circuit board 101. More specifically, the testing machine 150 can read the component identification data of the electronic component 151 connected to the circuit board 101 under test and the connection position information of the circuit board 101 under test based on the card identification data of the circuit board 101 under test transmitted by the testing control device 160, and can obtain the electronic component 151 based on the read component identification data and move the obtained electronic component 151 to the connection position indicated by the obtained position information; the testing machine 150 can also receive the component identification data and position information transmitted by the testing control device 160, and can obtain the electronic component 151 based on the received component identification data and move the obtained electronic component 151 to the connection position indicated by the received position information. However, the present invention is not limited thereto.

[0055] The test equipment 150 is responsible for receiving the connection / disconnection control signals transmitted by the test control device 160, and for connecting or disconnecting the electronic component 151 from the circuit board under test 101 placed at the test position of the test equipment 150 based on the received connection / disconnection control signals. For example, the test equipment 150 can lower the electronic component 151 when the received connection / disconnection control signal indicates the start of connection, so that the electronic component 151 is connected to the circuit board under test 101 placed at the test position of the test equipment 150, or it can raise the electronic component 151 when the received connection / disconnection control signal indicates the end of connection, so that the electronic component 151 is disconnected from the circuit board under test 101 placed at the test position of the test equipment 150 and is not connected.

[0056] The test control device 160 can be connected to the power controller 110, the card board test device 120, and the expansion test device 130 via a signal input / output interface (not shown in the figure), and can be connected to the test machine 150 via a physical connection cable, wired or wireless network.

[0057] Test control device 160 is responsible for determining the first sequence. For example, test control device 160 can execute a test script to provide a first sequence corresponding to the circuit board under test 101 or load a pre-set first sequence. However, the way test control device 160 determines the first sequence is not limited to the above.

[0058] The test control device 160 is also responsible for generating corresponding power control signals according to the determined first order, thereby controlling the power controller 110 to sequentially supply power to the cardboard test device 120, the expansion test device 130, and the circuit board under test 101 according to the determined first order. This prevents the cardboard test device 120, the expansion test device 130, and / or the circuit board under test 101 from failing to be powered on, resulting in test failure or malfunction of the cardboard test device 120 and / or the expansion test device 130, leading to incorrect test results. In addition, the test control device 160 can also generate corresponding power control signals according to the reverse order of the determined first order, thereby controlling the power controller 110 to sequentially stop supplying power to the cardboard test device 120, the expansion test device 130, and the circuit board under test 101 according to the reverse order of the first order. This prevents malfunction of the cardboard test device 120 and / or the expansion test device 130 from interfering with the result signals and producing incorrect test results.

[0059] In some embodiments, the test control device 160 may also determine whether the board testing device 120 returns an abnormal signal when generating a power control signal and transmitting it to the power controller 110 to control the power controller 110 to supply power to the board testing device 120, the expansion testing device 130, and the circuit board under test 101 according to a first sequence; the test control device 160 may also generate a second sequence different from the first sequence based on the received abnormal signal when it receives an abnormal signal during the process of generating a power control signal and transmitting it to the power controller 110 to control the power controller 110 to supply power to the board testing device 120, the expansion testing device 130, and the circuit board under test 101 according to the second sequence, and generate a power control signal again based on the second sequence and transmit it to the power controller 110 to control the power controller 110 to supply power to the board testing device 120, the expansion testing device 130, and the circuit board under test 101 according to the second sequence. Furthermore, the test control device 160 can, during the process of generating a power control signal according to the generated second sequence and transmitting it to the power controller 110 to control the power controller 110 to supply power according to the second sequence, determine again whether an abnormal signal is received. If so, the test control device 160 can re-determine a third sequence that is different from both the first and second sequences, and control the power controller 110 to supply power according to the third sequence until no abnormal signal is received or there is no sequence that can be determined.

[0060] The test control device 160 is also responsible for generating connection / disconnection control signals and transmitting these signals to the test equipment 150 to control the test equipment 150 to connect or disconnect the circuit board under test 101 and one or more electronic components 151. Specifically, the test control device 160 can generate a connection / disconnection control signal indicating the start of connection when testing the circuit board under test 101 begins, thereby controlling the test equipment 150 to connect the circuit board under test 101 and the electronic components 151; the test control device 160 can also generate a connection / disconnection control signal indicating the end of connection when testing is completed or interrupted, thereby controlling the test equipment 150 to disconnect the circuit board under test 101 and the electronic components 151.

[0061] The test control device 160 is also responsible for generating test signals and transmitting them to the circuit board under test (DUT) 101 placed on the test position on the test bench 150 via the cardboard test device 120 and the extended test device 130. The generated test signals are then transmitted to the DUT 101, which is connected to the electronic components 151, to produce result signals. The test control device 160 is also responsible for receiving these result signals via the cardboard test device 120 and the extended test device 130. The test signals generated by the test control device 160 correspond to the DUT 101, and the test control device 160 can generate test signals based on the identification data of the DUT 101.

[0062] The test control device 160 is also responsible for generating the test results of the circuit board under test based on the received result signals.

[0063] It should be noted that, Figure 1A In this configuration, the circuit board testing device 120 and the circuit board under test 101 can be directly connected via a test interface. However, if the circuit board testing device 120 and the circuit board under test 101 cannot be directly connected via a test interface, then... Figure 1B As shown in another system architecture diagram, the card board testing device 120 and the circuit board under test 101 are connected via an adapter testing device 140. That is, the card board testing device 120 is connected to the adapter testing device 140, and the circuit board under test 101 is connected to the adapter testing device 140. The adapter testing device 140 may not require an external power supply; for example, it may be an adapter card that simply transmits signals. Alternatively, the adapter testing device 140 may require an external power supply to transmit signals; this invention does not impose any particular limitations.

[0064] exist Figure 1B In this configuration, the power controller 110, the board testing device 120, the expansion testing device 130, the testing machine 150, and the test control device 160 are generally the same as described above. However, the power controller 110 may need to provide additional power to the adapter testing device 140. The board testing device 120 needs to go through the adapter testing device 140 to transmit test signals to the circuit board under test 101 and receive the result signals generated by the circuit board under test 101. If the adapter testing device 140 needs power, the first sequence generated by the test control device 160 may also include the adapter testing device 140.

[0065] The operation of the present invention will then be explained using an embodiment, and please refer to [reference needed]. Figure 2A The present invention provides a flowchart of a method for sequentially supplying power to a circuit board and a testing device to test the circuit board. It is assumed that the circuit board under test 101 is a motherboard, but the present invention is not limited to the above.

[0066] If this invention is used on the production line of the circuit board under test 101, when the circuit board under test 101 enters the testing area on the production line, the relevant personnel on the production line can first connect the circuit board under test 101 to the cardboard testing device 120 and connect the circuit board under test 101 to the expansion testing device 130 (step 210). In this embodiment, it is assumed that the cardboard testing device 120 can be connected to a portion of the control pins of the circuit board under test 101, and the expansion testing device 130 can be connected to another portion of the control pins of the circuit board under test 101.

[0067] After the circuit board under test 101 is connected to the cardboard testing device 120 and the expansion testing device 130, the test control device 160 can control the test machine 150 to connect the circuit board under test 101 and the electronic component 151 (step 230). In this embodiment, assuming that the electronic component 151 includes a central processing unit and a memory module, the test control device 160 can generate a connection / disconnection control signal indicating the start of the test and transmit it to the test machine 150 when it determines that the test can start. The test machine 150 can determine that the received connection / disconnection control signal indicates the start of the test and press down the electronic components 151 such as the central processing unit and the memory module, so that the central processing unit is inserted into the processor connector of the circuit board under test 101 and the memory module is inserted into the memory connection slot of the circuit board under test 101.

[0068] After the test machine 150 connects the circuit board under test 101 and the electronic components 151, the test control device 160 can control the power controller 110 to supply power to the board testing device 120, the expansion testing device 130, and the circuit board under test 101 according to a first order (step 250). In this embodiment, it is assumed that the power controller 110 is a programmable logic controller, the power control signal is a PLC control instruction, and the test control device 160 can obtain the board identification data (such as model) of the circuit board under test 101 and execute the test script corresponding to the board identification data of the circuit board under test 101 to determine the first order, for example, board testing device 120, expansion testing device 130, and circuit board under test 101. If the PLC control instructions recorded in the test script are as follows... Figure 4As shown, the test control device 160 can generate a power control signal "01 03 02 04 05 0A 0A" corresponding to the cardboard test device 120 according to the first sequence and transmit it to the power controller 110. Upon receiving the power control signal, the power controller 110 determines whether to supply power to the cardboard test device 120, thereby powering on and starting the cardboard test device 120. After the power controller 110 supplies power to the cardboard test device 120, it can send a power supply report message back to the test control device 160. Then, the test control device 160 can generate a power control signal "01 03 02 04 05 0B 0A" corresponding to the expansion test device 130 according to the first sequence and transmit it to the power controller 110. Upon receiving the power control signal "01 03 02 04 05 0B 0A", the power controller 110 determines whether to supply power to the cardboard test device 120, thereby powering on and starting the cardboard test device 120. After the power controller 110 supplies power to the cardboard test device 120, it can send a power supply report message back to the test control device 160. Afterwards, the test control device 160 can generate a power control signal "01 03 02 04 05 0B 0A" corresponding to the expansion test device 130 again according to the first sequence and transmit it to the power controller 110. After "0A", power is supplied to the expansion test device 130, thereby powering on and starting the expansion test device 130. Then, after receiving the power supply report message from the power controller 110, the test control device 160 can generate the power control signal "01 03 02 04 05 0C 0A" corresponding to the circuit board under test 101 according to the first sequence and send it to the power controller 110, so that the power controller 110 supplies power to the circuit board under test 101, thereby powering on and starting the circuit board under test 101. In this way, the board test device 120, the expansion test device 130, and the circuit board under test 101 will start up sequentially, instead of starting up simultaneously as is known.

[0069] After the power controller 110 supplies power to the cardboard testing device 120, the extended testing device 130, and the circuit board under test 101 according to the first order determined by the test control device 160, the test control device 160 can transmit test signals to the circuit board under test 101 through the cardboard testing device 120 and the extended testing device 130, so that the test signals generate result signals through the circuit board under test 101 connected to the electronic component 151 (step 260). In this embodiment, it is assumed that the test script executed by the test control device 160 corresponding to the cardboard identification data of the circuit board under test 101 can generate one or more test signals and transmit them to the connected cardboard testing device 120 and the extended testing device 130, so that the test signals reach the circuit board under test 101 through the cardboard testing device 120 and the extended testing device 130, and after the electronic component 151 connected to the circuit board under test performs calculations or judgments on each test signal, one or more corresponding result signals are generated.

[0070] After the circuit board under test 101 generates a result signal, the test control device 160 can receive the result signal generated by the circuit board under test 101 through the card board test device 120, and can generate the test result of the circuit board under test 101 based on the received result signal (step 270).

[0071] Thus, through this invention, the power controller 110 can be controlled by the test control device 160 to supply power to the circuit board under test 101 and the cardboard test device 120 and the expansion test device 130 of the circuit board under test 101 in a certain order, so as to avoid the situation where the circuit board under test 101, the cardboard test device 120 and the expansion test device 130 cannot be powered on or have abnormal startup due to simultaneous power supply to the circuit board under test 101, the cardboard test device 120 and the expansion test device 130.

[0072] In the above embodiments, after the test control device 160 receives the result signal generated by the circuit board under test 101 through the cardboard test device 120 (step 270), it can also perform the following steps: Figure 2B As shown in the process, the test control device 160 can control the power controller 110 to sequentially stop supplying power to the circuit board under test 101, the expansion test device 130, and the cardboard test device 120 according to the reverse order of the determined first sequence (step 280). For example, the test control device 160 can sequentially generate power control signals such as "01 03 02 04 05 0C 0B", "01 03 02 04 05 0B 0B", and "01 03 02 04 05 0A 0B" according to the order of the circuit board under test 101, the expansion test device 130, and the cardboard test device 120, and transmit them to the power controller 110, so that the power controller 110 stops supplying power to the circuit board under test 101, the expansion test device 130, and the cardboard test device 120 in order according to the received power control signals.

[0073] Subsequently, the test control device 160 can control the test machine 150 to separate the connected circuit board 101 under test 101 and electronic components 151 (step 290). For example, the test control device 160 can generate a disconnection control command indicating the end of the test and transmit the generated disconnection control command to the test machine 150. After the test machine determines that the received disconnection control command indicates the end of the test, it raises the electronic components 151 such as the central processing unit and memory module, and then separates the circuit board 101 under test 101 and electronic components 151 to prepare for testing the next circuit board.

[0074] In addition, in the above embodiments, if the circuit board testing device 120 and the circuit board under test 101 cannot be directly connected, then as follows: Figure 3As shown in the process flow, personnel on the production line can connect the PCB testing device 120 to the expansion testing device 130, connect the PCB testing device 120 to the adapter testing device 140, and connect the adapter testing device 140 to the circuit board under test 101. The circuit board under test 101, which is directly or indirectly connected to the adapter testing device 140, the PCB testing device, and the expansion testing device 130, is placed on the testing machine 150 (step 310).

[0075] Then, the test control device 160 can control the test machine 150 to connect the electronic component 151 and the circuit board under test 101 (step 330), and can control the power controller 110 to sequentially supply power to the card board test device 120, the expansion test device 130, the adapter test device 140 and the circuit board under test 101 according to the determined first order (step 350). If the first sequence is PCB testing device 120, expansion testing device 130, adapter testing device 140, and circuit board under test 101, then the test control device 160 can sequentially generate power control signals such as “01 03 02 04 05 0A 0A”, “01 03 02 04 05 0B 0A”, “01 03 02 04 05 0C 0A”, and “01 03 02 04 05 0D 0A” and transmit them to the power controller 110, so that the power controller 110 supplies power to the PCB testing device 120, expansion testing device 130, adapter testing device 140, and circuit board under test 101 after receiving the power control signals.

[0076] Next, the test control device 160 can transmit the generated test signal to the circuit board under test 101 through the cardboard test device 120, the extended test device 130, and the adapter test device 140, so that the test signal generates a result signal through the circuit board under test 101 (step 360). The test control device 160 can also receive the result signal generated by the circuit board under test 101 through the adapter test device 140 and the cardboard test device 120, and generate the test result of the circuit board under test based on the received result signal (step 370). In other words, the test control device 160 can output test signals to the connected cardboard test device 120 and extended test device 130, so that the test signals first pass through the cardboard test device 120 and extended test device 130 and then through the adapter test device 140 to reach the circuit board under test 101. Then, the electronic components 151 connected to the circuit board under test 101 process the test signals arriving at the circuit board under test to generate corresponding result signals, and the result signals can pass through the circuit board under test 101 and the adapter test device 140 to reach the cardboard test device 120 and be transmitted back to the test control device 160 from the cardboard test device 120.

[0077] Subsequently, the test control device 160 can control the power controller 110 to stop supplying power to the card board test device 120, the expansion test device 130, the adapter test device 140, and the circuit board under test 101 in the reverse order of the first sequence (step 380). After the power controller 110 stops supplying power to the card board test device 120, the expansion test device 130, the adapter test device 140, and the circuit board under test 101, it can control the test machine 150 to separate the circuit board under test 150 from the electronic component 151 (step 390). Since the first sequence is circuit board testing device 120, expansion testing device 130, adapter testing device 140, and circuit board under test 101, the test control device 160 can generate a power control signal indicating power failure according to the sequence of circuit board under test 101, adapter testing device 140, expansion testing device 130, and circuit board testing device 120, and transmit the generated power control signal to the power controller 110, so that the power controller 110 stops supplying power to the circuit board under test 101, adapter testing device 140, expansion testing device 130, and circuit board testing device 120 in sequence according to the received power control signal.

[0078] Furthermore, the present invention can also be as follows Figure 2C As shown in the flowchart, after the test control device 160 controls the power controller 110 to supply power to the card board test device 120, the expansion test device 130, and the circuit board under test 101 (and the adapter test device 140) according to the first sequence (steps 250 and 350), the test control device 160 can determine whether it receives an abnormal signal from the card board test device 120 (step 253). If not, it means that the card board test device 120, the expansion test device 130, and the circuit board under test 101 (and the adapter test device 140) are all successfully powered on and started normally. If yes, it means that at least one of the card board test device 120, the expansion test device 130, and the circuit board under test 101 (and the adapter test device 140) cannot be successfully powered on or start normally. The test control device 160 can generate a second sequence different from the first sequence. The sequence (step 255) is as follows: for example, a second sequence is generated for the expansion test device 130, the card board test device 120, and the circuit board under test 101 (and the adapter test device 140). The power controller 110 can be controlled to supply power to the expansion test device 130, the card board test device 120, and the circuit board under test 101 (and the adapter test device 140) in sequence according to the generated second sequence (step 257). That is, power control signals for supplying power to the expansion test device 130, the card board test device 120, and the circuit board under test 101 (and the adapter test device 140) are generated in sequence and transmitted to the power controller 110. After receiving the power control signals, the power controller 110 supplies power to the corresponding expansion test device 130, card board test device 120, and circuit board under test 101 (or adapter test device 140).

[0079] In summary, the difference between this invention and the prior art lies in the technical means of having a test control device that controls the power controller to supply power to the circuit board under test, the cardboard test device, and the expansion test device in sequence, and transmitting test signals to the circuit board under test through the cardboard test device and the expansion test device, so that the test signals generate result signals through the circuit board under test connected to electronic components, and receiving the result signals through the cardboard test device to generate the test results of the circuit board under test. This technical means can solve the problem in the prior art that simultaneously supplying power to the circuit board and its test device may lead to incorrect test results, thereby achieving the technical effects of improving the pass rate and increasing test efficiency.

[0080] Furthermore, the method of sequentially supplying power to the circuit board and the testing device to test the circuit board according to the present invention can be implemented in hardware, firmware, software or a combination of hardware, firmware and software, or it can be implemented in a centralized manner in a computer system or in a decentralized manner in which different components are distributed among several interconnected computer systems.

[0081] While the embodiments disclosed in this invention are as described above, the content is not intended to directly limit the scope of patent protection for this invention. Any modifications or variations in form and detail made by those skilled in the art to the implementation of this invention without departing from the spirit and scope disclosed herein shall fall within the scope of patent protection for this invention. The scope of patent protection for this invention shall still be determined by the scope defined in the appended claims.

Claims

1. A method for sequentially supplying power to a circuit board and a testing device to test the circuit board, the method comprising at least the following steps: Connect the circuit board under test (TBD) to the cardboard testing device, the TBD to the expansion testing device, and place the TBD on the testing machine platform; The test control device controls the test machine to connect the circuit board under test to at least one electronic component; The test control device controls the power controller to supply power to the circuit board under test, the card board test device, and the expansion test device in a first sequence; The test control device transmits test signals to the circuit board under test through the cardboard test device and the extended test device, so that the test signals generate result signals through the circuit board under test connected to the at least one electronic component, and receive the result signals through the cardboard test device; and The test control device generates the test results of the circuit board under test based on the result signal; The method further includes, after the step of the test control device controlling the power controller to supply power to the circuit board under test, the card board testing device, and the expansion testing device in a first sequence, the step of the test control device determining whether the card board testing device returns an abnormal signal, and upon receiving the abnormal signal, generating a different second sequence based on the abnormal signal, and controlling the power controller to supply power to the circuit board under test, the card board testing device, and the expansion testing device in the second sequence.

2. The method of sequentially supplying power to a circuit board and a testing device as described in claim 1 for testing the circuit board, wherein the step of connecting the circuit board under test (DUT) to the cardboard testing device and the DUT to the expansion testing device further includes the steps of connecting the DUT to a transfer testing device and connecting the transfer testing device to the cardboard testing device; the step of the test control device controlling the power controller to supply power to the DUT, the cardboard testing device, and the expansion testing device in the first order further includes the step of the test control device controlling the power controller to supply power to the DUT, the cardboard testing device, the expansion testing device, and the transfer testing device in the first order; the step of the test control device transmitting test signals to the DUT through the cardboard testing device and the expansion testing device further includes the step of the test control device transmitting test signals to the DUT through the cardboard testing device, the expansion testing device, and the transfer testing device; and the step of the test control device receiving the result signal through the cardboard testing device further includes the step of the test control device receiving the result signal through the cardboard testing device and the transfer testing device.

3. The method of sequentially supplying power to a circuit board and a test device as described in claim 1 for testing the circuit board, wherein the method further includes, before the step of the test control device controlling the power controller to supply power in the first order, a step of the test control device setting the first order corresponding to the circuit board under test.

4. The method of sequentially supplying power to a circuit board and a testing device as described in claim 1 to test the circuit board, wherein after the step of the test control device receiving the result signal through the cardboard testing device, the method further includes the steps of the test control device controlling the power controller to stop supplying power to the circuit board under test, the cardboard testing device, and the expansion testing device in the reverse order of the first sequence, and controlling the test machine to separate the circuit board under test from the at least one electronic component.

5. A system for sequentially supplying power to a circuit board and a testing apparatus to test the circuit board, the system comprising at least: A testing machine that provides a place to mount the circuit board to be tested; Power controller; A circuit board testing device is connected to the circuit board under test. An extended testing device is connected to the circuit board under test. and A test control device, connected to the board testing device and the expansion testing device, is used to control the power controller to supply power to the circuit board under test, the board testing device, and the expansion testing device in a first sequence, and to control the test machine to connect the circuit board under test and at least one electronic component. It is also used to transmit test signals to the circuit board under test through the board testing device and the expansion testing device, so that the test signals generate result signals through the circuit board under test connected to the at least one electronic component, and to receive the result signals through the board testing device, and to generate test results for the circuit board under test based on the result signals. The test control device is further configured to determine whether the board testing device returns an abnormal signal when the power controller supplies power to the circuit board under test, the board testing device, and the expansion testing device in a first sequence, and upon receiving the abnormal signal, generate a different second sequence based on the abnormal signal, and control the power controller to supply power to the circuit board under test, the board testing device, and the expansion testing device in the second sequence.

6. The system for sequentially supplying power to a circuit board and a testing device as described in claim 5 to test the circuit board, wherein the system further includes a switching testing device for connecting the circuit board under test and the cardboard testing device, and the testing control device is further configured to control the power controller to supply power to the circuit board under test, the cardboard testing device, the expansion testing device, and the switching testing device in the first order, and to transmit test signals to the circuit board under test through the cardboard testing device, the expansion testing device, and the switching testing device, and to receive the result signals through the cardboard testing device and the switching testing device.

7. The system for sequentially supplying power to a circuit board and a testing device as described in claim 5 to test the circuit board, wherein the testing control device is further configured to set the first sequential steps corresponding to the circuit board under test.

8. The system for sequentially supplying power to a circuit board and a testing apparatus as described in claim 5 to test the circuit board, wherein the test control device is further configured to control the power controller to stop supplying power to the circuit board under test, the cardboard testing apparatus, and the expansion testing apparatus in the reverse order of the first sequence, and to control the test machine to separate the circuit board under test from the at least one electronic component.

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