A material creepage margin analysis method and device, electronic equipment, and storage medium

Through finite element calculation and creeping path analysis, combined with temperature correction of electric field strength and calculation of insulation margin, the problem that the prior art cannot effectively evaluate the insulation reliability at the interface of insulating materials is solved, and the accurate reflection of insulation performance and reliable basis for material design is achieved.

CN117828913BActive Publication Date: 2025-05-09XIAN XIDIAN TRANSFORMER +1
View PDF 2 Cites 0 Cited by

Patent Information

Application Number
CN202311520732.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-11-15
Publication Date
2025-05-09
Estimated Expiration
2043-11-15

AI Technical Summary

Technical Problem

The prior art cannot effectively reflect the insulation reliability at the interface of insulating materials, and fails to fully consider the impact of temperature on electric field strength.

Method used

The finite element calculation method is used to obtain the electric field intensity distribution data and temperature distribution data at the interface of the insulating material, analyze the interface crawling path, and correct the electric field intensity mode according to the temperature, calculate the average electric field intensity mode to compare the allowable field strength to obtain the insulation margin.

Benefits of technology

The accurate reflection of the insulation reliability at the interface of the insulating material is achieved, and a reliable basis is provided to improve the material design structure.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN117828913B_ABST
    Figure CN117828913B_ABST
Patent Text Reader

Abstract

The present application discloses a material creepage margin analysis method and device, electronic equipment, and storage medium. The method comprises: obtaining characteristic information of a target insulating material under an alternating and direct current electric field; respectively calculating electric field strength distribution data and temperature distribution data at an interface of the target insulating material using a finite element calculation method based on the characteristic information of the target insulating material; analyzing an interface creepage path of the target insulating material based on the electric field strength distribution data; determining the temperatures at a plurality of positions on the interface creepage path of the target insulating material based on the temperature distribution data; correcting the electric field strength modulus at each position point using the temperature at each position point to obtain a corrected electric field strength modulus at each position point; calculating an average electric field strength modulus of the interface creepage path using the corrected electric field strength modulus at each position point; and comparing and calculating the average electric field strength modulus with the allowable field strength to obtain a design insulation margin of the target insulating material.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The present application relates to the technical field of material analysis, and in particular to a material creepage margin analysis method and device, electronic equipment, and storage medium. Background Art

[0002] With the continuous and rapid development of the economy, people's demand for electricity is also growing, and the demand for high-voltage power transmission is also increasing. As the core equipment of the high-voltage power transmission system, the safety and reliability of the high-voltage transformer are related to the safety of the entire power transmission system. The insulation reliability of the high-voltage transformer is one of the most important safety performances.

[0003] In order to evaluate the insulation reliability of high-voltage transformers, the electric field strength parameters at the interface of the insulation materials of high-voltage transformers are currently evaluated. Specifically, a path on the interface is manually selected, and then the electric field strength on the path is directly analyzed, and the analyzed electric field strength parameters are compared with the allowed field strength to determine whether the insulation performance of the material meets the requirements, so that the design structure of the insulation material can be further improved according to the calculated electric field strength parameters.

[0004] However, the artificially selected path is usually inconsistent with the electric field distribution at the interface of the insulating material, and the existing method does not take into account the significant impact of temperature on the electric field strength. Therefore, the existing method cannot well reflect the insulation reliability at the interface of the insulating material, and therefore cannot provide a reliable basis for the improvement of the material design structure. Summary of the invention

[0005] Based on the above-mentioned deficiencies of the prior art, the present application provides a material creepage margin analysis method and device, electronic equipment, and storage medium to solve the problem that the prior art cannot effectively reflect the insulation reliability at the interface of insulating materials.

[0006] In order to achieve the above objectives, this application provides the following technical solutions:

[0007] The first aspect of the present application provides a material creepage margin analysis method, comprising:

[0008] Obtain characteristic information of target insulating materials under AC and DC electric fields;

[0009] Based on the characteristic information of the target insulating material, the electric field intensity distribution data and the temperature distribution data at the interface of the target insulating material are calculated by using a finite element calculation method;

[0010] Analyzing the interface creepage path of the target insulating material based on the electric field intensity distribution data;

[0011] Based on the temperature distribution data, determining the temperature at a plurality of positions on the interface creepage path of the target insulating material;

[0012] Using the determined temperature at each of the position points, correcting the electric field strength modulus at each of the position points to obtain a corrected electric field strength modulus at each of the position points;

[0013] Calculate the average electric field strength modulus of the interface creepage path of the target insulating material by using the corrected electric field strength modulus of each of the position points;

[0014] The average electric field strength modulus is compared and calculated with the allowable field strength to obtain the design insulation margin of the target insulation material.

[0015] Optionally, in the material creepage margin analysis method, analyzing the interface creepage path of the target insulating material based on the electric field strength distribution data includes:

[0016] Finding the maximum value of the tangential electric field intensity modulus in the electric field intensity distribution data, and determining its corresponding position coordinates;

[0017] Determine the position where the position coordinates corresponding to the maximum value of the tangential electric field intensity modulus are located as the current position point;

[0018] Taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current search direction, determining the next position point according to the set search step size;

[0019] Determining whether the boundary of the target insulating material has been found;

[0020] If it is determined that the boundary of the target insulating material has not been found, the most recently determined position point is updated as the current target position point, and the process returns to execute the process of taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current search direction, and determining the next position point according to the set search step size;

[0021] If it is determined that the boundary of the target insulating material has not been found, each of the found position points is connected using a smooth curve to obtain an interface creepage path of the target insulating material.

[0022] Optionally, in the material creepage margin analysis method, determining the temperatures at multiple locations on the interface creepage path of the target insulating material based on the temperature distribution data includes:

[0023] Based on the position coordinates of each of the found position points on the interface creepage path of the target insulating material, the temperature at each of the position points is found from the temperature distribution data.

[0024] Optionally, in the material creepage margin analysis method, the use of the modified electric field strength modulus of each of the position points to calculate the average electric field strength modulus of the interface creepage path of the target insulating material includes:

[0025] For each target path segment of the interface creepage path of the target insulating material, respectively, the average electric field strength modulus corresponding to the target path segment is calculated using the modified electric field strength modulus of each of the position points on the target path segment; wherein the target path segment includes the full path segment of the interface creepage path and the sub-path segments from the starting position point on the interface creepage path to each of the other position points;

[0026] The step of comparing and calculating the average electric field strength modulus with the allowable field strength to obtain the design insulation margin of the target insulation material includes:

[0027] The average electric field strength modulus corresponding to each target path segment is divided by the allowable field strength corresponding to the target path segment to obtain the designed insulation margin of the target insulating material on the target path segment.

[0028] Optionally, in the material creepage margin analysis method, using the determined temperature at each of the position points to correct the electric field strength modulus at each of the position points to obtain a corrected electric field strength modulus at each of the position points includes:

[0029] Finding the correction coefficient corresponding to the temperature at each of the position points from the pre-configured correspondence between each temperature and the correction coefficient;

[0030] The correction coefficient corresponding to the temperature at each of the position points is multiplied by the electric field strength modulus at each of the position points to obtain the corrected electric field strength modulus at each of the position points.

[0031] A second aspect of the present application provides a material creepage margin analysis device, comprising:

[0032] An acquisition unit, used to acquire characteristic information of a target insulating material under an AC or DC electric field;

[0033] A distribution data calculation unit, used to calculate the electric field intensity distribution data and the temperature distribution data at the interface of the target insulating material by using a finite element calculation method based on the characteristic information of the target insulating material;

[0034] A path analysis unit, configured to analyze an interface creepage path of the target insulating material based on the electric field strength distribution data;

[0035] A temperature determination unit, configured to determine the temperature at a plurality of positions on the interface creepage path of the target insulating material based on the temperature distribution data;

[0036] a correction unit, configured to correct the electric field strength modulus of each of the position points by using the determined temperature at each of the position points to obtain a corrected electric field strength modulus of each of the position points;

[0037] A mean value calculation unit, used to calculate the average electric field strength modulus of the interface creepage path of the target insulating material by using the corrected electric field strength modulus of each of the position points;

[0038] The margin calculation unit is used to compare and calculate the average electric field strength modulus with the allowable field strength to obtain the design insulation margin of the target insulation material.

[0039] Optionally, in the above-mentioned material creepage margin analysis device, the path analysis unit includes:

[0040] An initial point search unit, used to find the maximum value of the tangential electric field intensity modulus in the electric field intensity distribution data and determine its corresponding position coordinates;

[0041] A first determining unit, configured to determine the position of the position coordinate corresponding to the maximum value of the tangential electric field intensity modulus as the current position point;

[0042] A position point searching unit, used to determine the next position point according to a set searching step length, taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current searching direction;

[0043] A judging unit, used for judging whether the boundary of the target insulating material has been found;

[0044] A second determining unit is used to update the most recently determined position point as the current target position point when it is determined that the boundary of the target insulating material has not been found, and return to the position point finding unit to execute the process of taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current search direction and determining the next position point according to the set search step length;

[0045] The connection unit is used to connect the found positions using a smooth curve when it is determined that the boundary of the target insulating material has not been found, so as to obtain the interface creepage path of the target insulating material.

[0046] Optionally, in the above-mentioned material creepage margin analysis device, the temperature determination unit includes:

[0047] The temperature search unit is used to find out the temperature at each of the position points from the temperature distribution data based on the position coordinates of each of the position points found on the interface creepage path of the target insulating material.

[0048] Optionally, in the above-mentioned material creepage margin analysis device, the mean value calculation unit includes:

[0049] A mean value calculation subunit is used to calculate the average electric field strength modulus corresponding to each target path segment of the interface creepage path of the target insulating material by using the modified electric field strength modulus of each position point on the target path segment; wherein the target path segment includes the full path segment of the interface creepage path and the sub-path segments from the starting position point on the interface creepage path to each other position point;

[0050] Wherein, the margin calculation unit includes:

[0051] The margin calculation subunit is used to divide the average electric field strength modulus corresponding to each target path segment by the allowable field strength corresponding to the target path segment to obtain the design insulation margin of the target insulating material on the target path segment.

[0052] Optionally, in the above-mentioned material creepage margin analysis device, the correction unit includes:

[0053] A coefficient search unit, used to search for the correction coefficient corresponding to the temperature at each of the position points from the pre-configured correspondence between each temperature and the correction coefficient;

[0054] The field strength correction unit is used to multiply the correction coefficient corresponding to the temperature at each of the position points by the electric field strength modulus of each of the position points to obtain the corrected electric field strength modulus of each of the position points.

[0055] A third aspect of the present application provides an electronic device, including:

[0056] Memory and processor;

[0057] Wherein, the memory is used to store programs;

[0058] The processor is used to execute the program, and when the program is executed, it is specifically used to implement the material creepage margin analysis method as described in any one of the above items.

[0059] A fourth aspect of the present application provides a computer storage medium for storing a computer program, which, when executed, is used to implement the material creepage margin analysis method as described in any one of the above.

[0060] The embodiment of the present application provides a material creepage margin analysis method, which obtains characteristic information of the target insulating material under AC and DC electric fields, and then uses the finite element calculation method to calculate the electric field strength distribution data and temperature distribution data at the interface of the target insulating material based on the characteristic information of the target insulating material. Then, based on the electric field strength distribution data, the interface creepage path of the target insulating material is analyzed, so that a creepage path reflecting the electric field conditions can be obtained, and then the creepage path can be analyzed to accurately reflect the insulation performance. Subsequently, based on the temperature distribution data, the temperature at multiple positions on the interface creepage path of the target insulating material is determined, and the electric field strength modulus at each position point is corrected using the temperature at each position point determined, and the corrected electric field strength modulus at each position point is obtained, thereby fully considering the influence of temperature on the electric field strength. Finally, the average electric field strength modulus of the interface creepage path of the target insulating material is calculated using the corrected electric field strength modulus at each position point. The average electric field strength modulus is compared with the allowable field strength to obtain the design insulation margin of the target insulating material. The insulation performance of the material can be reflected through the insulation margin, thus realizing a method that can accurately reflect the insulation reliability at the interface of the insulating material, providing a reliable basis for the improvement of the material design structure. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying any creative work.

[0062] Figure 1 A flow chart of a material creepage margin analysis method provided in an embodiment of the present application;

[0063] Figure 2 A flow chart of a method for analyzing an interface creepage path provided in an embodiment of the present application;

[0064] Figure 3 A schematic diagram of an example of an interface creepage path analyzed in an embodiment of the present application;

[0065] Figure 4 A flow chart of a method for correcting an electric field strength modulus provided in an embodiment of the present application;

[0066] Figure 5 A schematic diagram of the architecture of a material creepage margin analysis device provided in an embodiment of the present application;

[0067] Figure 6A schematic diagram of the architecture of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0068] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0069] In this application, relational terms such as first and second, etc. are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprise", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the statement "comprises a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0070] The present application embodiment provides a material creepage margin analysis method, such as Figure 1 As shown, the following steps are included:

[0071] S101. Acquire characteristic information of a target insulating material under an AC or DC electric field.

[0072] The AC / DC electric field may be an AC electric field, a DC electric field, or an electric field in which both AC and DC electric fields exist. The specific selection can be based on actual working conditions and requirements.

[0073] It should be noted that in the embodiment of the present application, it is necessary to analyze the electric field conditions at the interface of the target insulating material, so it is necessary to first calculate the entire electric field strength distribution at the interface of the target insulating material, and therefore it is necessary to first obtain the characteristic information of the target insulating material under the corresponding AC and DC electric fields.

[0074] Specifically, the characteristic information of the target insulating material includes characteristic information of the insulating structure used to calculate the electric field strength distribution data and temperature structure characteristic information used to calculate the temperature distribution data. For example, for the solid-liquid composite insulating medium composed of mineral insulating oil and fiber paperboard, which is currently widely used, the characteristic information of the oil-paper bonding structure and the air-paper insulation structure can be used to calculate the electric field strength distribution data. In addition, the fluid-solid structure characteristic information used to calculate the temperature distribution data is obtained.

[0075] S102, based on the characteristic information of the target insulating material, using a finite element calculation method to calculate the electric field intensity distribution data and the temperature distribution data at the interface of the target insulating material.

[0076] Since the interface of the target insulating material is large, in order to accurately calculate the electric field intensity distribution data and the temperature distribution data at the entire interface, that is, to calculate the tangential electric field vector field at the interface and the temperature scalar field at the interface, the finite element calculation method is used for calculation in the embodiment of the present application.

[0077] Specifically, based on the characteristic information of the insulating structure in the characteristic information of the target insulating material, the electric field intensity distribution data at the interface of the target insulating material, that is, the tangential electric field vector field at the interface, is calculated using the finite element calculation method. In addition, based on the temperature structure characteristic information in the characteristic information of the target insulating material, the temperature distribution data at the interface of the target insulating material, that is, the temperature scalar field at the interface, is calculated using the finite element calculation method.

[0078] It should be noted that in order to accurately reflect the electric field strength distribution, in the embodiment of the present application, the calculated electric field strength distribution data and temperature distribution data at the interface are data in space, that is, data in three-dimensional space, and are not limited to a two-dimensional plane.

[0079] S103: Analyze the interface creepage path of the target insulating material based on the electric field strength distribution data.

[0080] It should be noted that since the creepage path can reflect the leakage situation of the target insulating material, in the embodiment of the present application, the path is no longer selected manually for analysis. Instead, the interface creepage path of the target insulating material is analyzed based on the electric field strength distribution data, and then the interface creepage path is analyzed.

[0081] Optionally, in another embodiment of the present application, a specific implementation of step S103 is as follows: Figure 2 As shown, the following steps are included:

[0082] S201, finding the maximum value of the tangential electric field intensity modulus in the electric field intensity distribution data, and determining its corresponding position coordinates.

[0083] It should be noted that the creepage process starts from the maximum electric field strength and continuously attenuates outward. Therefore, to select the creepage path, it is necessary to first determine the maximum value of the tangential electric field strength modulus in the electric field strength distribution data and determine its corresponding position coordinates, with the maximum value of the tangential electric field strength modulus.

[0084] The electric field strength modulus refers to the modulus of the electric field strength vector.

[0085] S202: Determine the position where the position coordinates corresponding to the maximum value of the tangential electric field intensity modulus are located as the current position point.

[0086] Specifically, after finding the position point corresponding to the maximum value of the tangential electric field intensity modulus, in order to use it as a reference to select the next position point downward, it is determined as the current position point.

[0087] S203. Taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current search direction, determine the next position point according to the set search step size.

[0088] Since the creepage process changes with the direction of the unit vector of the electric field strength vector at the current target position, it is necessary to use the direction of the unit vector of the electric field strength vector at the current target position as the current search direction for searching. The search step length can be a fixed step length or a variable step length. The shorter the search step length, the higher the accuracy of the found creepage path, but the corresponding calculation amount is also greater, so it can be set according to actual needs and situations.

[0089] Specifically, a position point which is in the direction of the unit vector of the electric field intensity vector of the current target position point and is at a distance of the search step from the current target position point is determined as the next position point, and the position coordinates of the position point are recorded.

[0090] S204: Determine whether the boundary of the target insulating material has been found.

[0091] If it is determined that the boundary of the target insulating material has not been found, step S205 is executed. If it is determined that the boundary of the target insulating material has not been found, step S206 is executed.

[0092] S205: Update the most recently determined location point as the current target location point.

[0093] Since it is necessary to continue searching for the next position point on the creepage path, and to search downward based on the most recently determined position point, it is necessary to update the most recently determined position point to the current target position point, and then return to execute step S203.

[0094] S206, connecting the found position points using a smooth curve to obtain an interface creepage path of the target insulating material.

[0095] Specifically, Figure 3 As shown, first find the position of the maximum value of the tangential electric field strength modulus, and then find the next position point according to the step size. Then, based on the next position point, find the next next position point until the boundary is found. Then, use a smooth curve to connect the found positions to obtain the creepage path.

[0096] S104. Determine the temperature at multiple locations on the interface creepage path of the target insulating material based on the temperature distribution data.

[0097] It should be noted that, since limited data is required for calculation in the calculation process, in the embodiment of the present application, the electric field strength modulus at multiple positions on the interface creepage path is used for calculation. In order to take into account the influence of temperature on the electric field strength, it is necessary to determine the temperature of each position point, so as to correct the electric field strength modulus of the position point according to the temperature of the position point.

[0098] Optionally, when step S103 adopts Figure 2 When the method shown is implemented, accordingly, in the embodiment of the present application, a specific implementation of step S104 includes:

[0099] Based on the position coordinates of each position point found on the interface creepage path of the target insulating material, the temperature at each position point is found from the temperature distribution data.

[0100] Since multiple position points on the path have been found and the corresponding position coordinates have been determined in the process of determining the interface creepage path, and these position points are relatively evenly distributed, these positions can be directly used for subsequent analysis. Therefore, the temperature at each position point can be directly found from the temperature distribution data based on the position coordinates of each position point found on the interface creepage path of the target insulating material.

[0101] S105 , using the determined temperature at each position point, correcting the electric field strength modulus at each position point to obtain a corrected electric field strength modulus at each position point.

[0102] Specifically, the influence of different temperatures on the electric field strength can be determined in advance through experiments, and then the battery strength model at each location can be modified accordingly based on the experimental data.

[0103] Optionally, in another embodiment of the present application, a specific implementation of step S105 is as follows: Figure 4 As shown, the following steps are included:

[0104] S401 , finding out the correction coefficient corresponding to the temperature at each position point from the pre-configured correspondence between each temperature and the correction coefficient.

[0105] It should be noted that in the embodiment of the present application, the correction coefficient corresponding to each temperature is determined in advance through experiments, so that the correction coefficient corresponding to the temperature at each position point can be found, and the correction coefficient is used to correct the electric field strength modulus at each position point, that is, only the magnitude of the electric field strength at each position point is corrected, but its direction is not changed.

[0106] S402 , multiplying the correction coefficient corresponding to the temperature at each position point by the electric field strength modulus at each position point to obtain a corrected electric field strength modulus at each position point.

[0107] S106. Calculate the average electric field strength modulus of the interface creepage path of the target insulating material using the corrected electric field strength modulus at each position point.

[0108] It should be noted that the average electric field strength modulus is the average electric field modulus, which is calculated using the electric field strength vector. Therefore, the magnitude and direction of the electric field need to be considered simultaneously during the calculation process. The corrected electric field strength modulus is the magnitude of the electric field strength, and the direction is the direction of the vector unit of the electric field strength at that location.

[0109] Optionally, when calculating the average electric field strength modulus of the interface creepage path of the target insulating material, at least the average electric field strength modulus of the entire interface creepage path needs to be calculated, that is, the average electric field strength modulus of the entire interface creepage path needs to be calculated, so that the insulation performance of the interface can be reflected as a whole. Of course, the average electric field strength modulus of a partial path segment of the interface creepage path can also be calculated, so as to reflect the insulation performance of a partial area. Alternatively, the interface creepage path can be divided into multiple segments, and the average electric field strength modulus of each segment is calculated separately, so as to reflect the insulation performance of each part.

[0110] S107. Compare and calculate the average electric field strength modulus with the allowable field strength to obtain the design insulation margin of the target insulation material.

[0111] Optionally, the ratio of the average electric field strength modulus to the allowable field strength may be used as the design insulation margin of the target insulation material.

[0112] Optionally, in another embodiment of the present application, a specific implementation of step S106 includes:

[0113] For each target path segment of the interface creepage path of the target insulating material, the average electric field strength modulus corresponding to the target path segment is calculated using the corrected electric field strength modulus of each position point on the target path segment.

[0114] The target path segment includes the full path segment of the interface creepage path and the sub-path segments from the starting point on the interface creepage path to other positions. That is, in the embodiment of the present application, it is necessary to calculate not only the average electric field strength modulus of the full path segment, but also the average electric field strength modulus of the sub-segment path starting from the maximum value to other points.

[0115] It should be noted that, since the full path segment is the path from the position point of the maximum value to the last position point, the sub-path segment does not include the path from the position point of the maximum value to the last position point.

[0116] Accordingly, in the embodiment of the present application, a specific implementation of step S107 includes:

[0117] The average electric field strength modulus corresponding to each target path segment is divided by the allowable field strength corresponding to the target path segment to obtain the design insulation margin of the target insulation material on the target path segment.

[0118] The embodiment of the present application provides a material creepage margin analysis method, which obtains characteristic information of the target insulating material under AC and DC electric fields, and then uses the finite element calculation method to calculate the electric field strength distribution data and temperature distribution data at the interface of the target insulating material based on the characteristic information of the target insulating material. Then, based on the electric field strength distribution data, the interface creepage path of the target insulating material is analyzed, so that a creepage path reflecting the electric field conditions can be obtained, and then the creepage path can be analyzed to accurately reflect the insulation performance. Subsequently, based on the temperature distribution data, the temperature at multiple positions on the interface creepage path of the target insulating material is determined, and the electric field strength modulus at each position point is corrected using the temperature at each position point determined, and the corrected electric field strength modulus at each position point is obtained, thereby fully considering the influence of temperature on the electric field strength. Finally, the average electric field strength modulus of the interface creepage path of the target insulating material is calculated using the corrected electric field strength modulus at each position point. The average electric field strength modulus is compared with the allowable field strength to obtain the design insulation margin of the target insulating material. The insulation performance of the material can be reflected through the insulation margin, thus realizing a method that can accurately reflect the insulation reliability at the interface of the insulating material, providing a reliable basis for the improvement of the material design structure.

[0119] Another embodiment of the present application provides a material creepage margin analysis device, such as Figure 5 As shown, including:

[0120] The acquisition unit 501 is used to acquire characteristic information of the target insulating material under AC and DC electric fields.

[0121] The distribution data calculation unit 502 is used to calculate the electric field intensity distribution data and the temperature distribution data at the interface of the target insulating material using a finite element calculation method based on the characteristic information of the target insulating material.

[0122] The path analysis unit 503 is used to analyze the interface creepage path of the target insulating material based on the electric field intensity distribution data.

[0123] The temperature determination unit 504 is used to determine the temperature at multiple locations on the interface creepage path of the target insulating material based on the temperature distribution data.

[0124] The correction unit 505 is used to correct the electric field strength modulus at each position point by using the determined temperature at each position point to obtain a corrected electric field strength modulus at each position point.

[0125] The mean value calculation unit 506 is used to calculate the average electric field strength modulus of the interface creepage path of the target insulating material by using the modified electric field strength modulus of each position point.

[0126] The margin calculation unit 507 is used to compare and calculate the average electric field strength modulus with the allowable field strength to obtain the design insulation margin of the target insulation material.

[0127] Optionally, in the material creepage margin analysis device provided in another embodiment of the present application, the path analysis unit includes:

[0128] The initial point search unit is used to find the maximum value of the tangential electric field intensity modulus in the electric field intensity distribution data and determine its corresponding position coordinates.

[0129] The first determining unit is used to determine the position where the position coordinates corresponding to the maximum value of the tangential electric field intensity modulus are located as the current position point.

[0130] The position point searching unit is used to determine the next position point according to the set searching step length, taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current searching direction.

[0131] The judging unit is used to judge whether the boundary of the target insulating material has been found.

[0132] The second determination unit is used to update the most recently determined position point as the current target position point when it is determined that the boundary of the target insulating material has not yet been found, and return to the position point search unit to execute the direction of the unit vector of the electric field strength vector of the current target position point as the current search direction, and determine the next position point according to the set search step size.

[0133] The connection unit is used to connect the found positions using a smooth curve when it is determined that the boundary of the target insulating material has not been found, so as to obtain the interface creepage path of the target insulating material.

[0134] Optionally, in the material creepage margin analysis device provided in another embodiment of the present application, the temperature determination unit includes:

[0135] The temperature search unit is used to find out the temperature at each position point from the temperature distribution data based on the position coordinates of each position point found on the interface creepage path of the target insulating material.

[0136] Optionally, in the material creepage margin analysis device provided in another embodiment of the present application, the mean value calculation unit includes:

[0137] The mean value calculation subunit is used to calculate the average electric field strength modulus corresponding to each target path segment of the interface creepage path of the target insulating material using the modified electric field strength modulus of each position point on the target path segment. The target path segment includes the full path segment of the interface creepage path and the sub-path segments from the starting position point on the interface creepage path to each other position point.

[0138] The margin calculation unit in the embodiment of the present application includes:

[0139] The margin calculation subunit is used to divide the average electric field strength modulus corresponding to each target path segment by the allowable field strength corresponding to the target path segment to obtain the design insulation margin of the target insulation material on the target path segment.

[0140] Optionally, in the material creepage margin analysis device provided in another embodiment of the present application, the correction unit includes:

[0141] The coefficient search unit is used to search for the correction coefficient corresponding to the temperature at each position point from the pre-configured correspondence between each temperature and the correction coefficient.

[0142] The field strength correction unit is used to multiply the correction coefficient corresponding to the temperature at each position point by the electric field strength modulus at each position point to obtain the corrected electric field strength modulus at each position point.

[0143] It should be noted that the specific working process of each unit provided in the above embodiments of the present application can refer to the implementation process of the corresponding steps in the above method embodiments, and will not be repeated here.

[0144] Another embodiment of the present application provides an electronic device, such as Figure 6 As shown, including:

[0145] Memory 601 and processor 602 .

[0146] The memory 601 is used to store programs.

[0147] The processor 602 is used to execute the program stored in the memory 601. When the program is executed, it is specifically used to implement the material creepage margin analysis method provided in any one of the above embodiments.

[0148] Another embodiment of the present application provides a computer storage medium for storing a computer program. When the computer program is executed, it is used to implement the material creepage margin analysis method provided in any one of the above embodiments.

[0149] Computer storage media includes permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. Information can be computer-readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer-readable media does not include temporary computer-readable media (transitory media), such as modulated data signals and carrier waves.

[0150] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0151] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A material creepage margin analysis method, characterized in that: include: Obtain characteristic information of target insulating materials under AC and DC electric fields; Based on the characteristic information of the target insulating material, the electric field intensity distribution data and the temperature distribution data at the interface of the target insulating material are calculated by using a finite element calculation method; Analyzing the interface creepage path of the target insulating material based on the electric field intensity distribution data; Based on the temperature distribution data, determining the temperature at a plurality of positions on the interface creepage path of the target insulating material; Using the determined temperature at each of the position points, correcting the electric field strength modulus at each of the position points to obtain a corrected electric field strength modulus at each of the position points; Calculate the average electric field strength modulus of the interface creepage path of the target insulating material by using the corrected electric field strength modulus of each of the position points; The average electric field strength modulus is compared and calculated with the allowable field strength to obtain the design insulation margin of the target insulation material.

2. The method according to claim 1, characterized in that The step of analyzing the interface creepage path of the target insulating material based on the electric field intensity distribution data includes: Finding the maximum value of the tangential electric field intensity modulus in the electric field intensity distribution data, and determining its corresponding position coordinates; Determine the position where the position coordinates corresponding to the maximum value of the tangential electric field intensity modulus are located as the current position point; Taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current search direction, determining the next position point according to the set search step size; Determining whether the boundary of the target insulating material has been found; If it is determined that the boundary of the target insulating material has not been found, the most recently determined position point is updated as the current target position point, and the process returns to execute the process of taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current search direction, and determining the next position point according to the set search step size; If it is determined that the boundary of the target insulating material has not been found, each of the found position points is connected using a smooth curve to obtain an interface creepage path of the target insulating material.

3. The method according to claim 2, characterized in that The step of determining the temperature at a plurality of positions on the interface creepage path of the target insulating material based on the temperature distribution data comprises: Based on the position coordinates of each of the found position points on the interface creepage path of the target insulating material, the temperature at each of the position points is found from the temperature distribution data.

4. The method according to claim 2, characterized in that: The method of calculating the average electric field strength modulus of the interface creepage path of the target insulating material by using the modified electric field strength modulus of each of the position points comprises: For each target path segment of the interface creepage path of the target insulating material, respectively, the average electric field strength modulus corresponding to the target path segment is calculated using the modified electric field strength modulus of each of the position points on the target path segment; wherein the target path segment includes the full path segment of the interface creepage path and the sub-path segments from the starting position point on the interface creepage path to each of the other position points; The step of comparing and calculating the average electric field strength modulus with the allowable field strength to obtain the design insulation margin of the target insulation material includes: The average electric field strength modulus corresponding to each target path segment is divided by the allowable field strength corresponding to the target path segment to obtain the designed insulation margin of the target insulating material on the target path segment.

5. The method according to claim 1, characterized in that The method of using the determined temperature at each of the position points to correct the electric field strength modulus at each of the position points to obtain a corrected electric field strength modulus at each of the position points includes: Finding the correction coefficient corresponding to the temperature at each of the position points from the pre-configured correspondence between each temperature and the correction coefficient; The correction coefficient corresponding to the temperature at each of the position points is multiplied by the electric field strength modulus at each of the position points to obtain the corrected electric field strength modulus at each of the position points.

6. A material creepage margin analysis device, characterized in that: include: An acquisition unit, used to acquire characteristic information of a target insulating material under an AC or DC electric field; A distribution data calculation unit, used to calculate the electric field intensity distribution data and the temperature distribution data at the interface of the target insulating material by using a finite element calculation method based on the characteristic information of the target insulating material; A path analysis unit, configured to analyze an interface creepage path of the target insulating material based on the electric field strength distribution data; A temperature determination unit, configured to determine the temperature at a plurality of positions on the interface creepage path of the target insulating material based on the temperature distribution data; a correction unit, configured to correct the electric field strength modulus of each of the position points by using the determined temperature at each of the position points to obtain a corrected electric field strength modulus of each of the position points; A mean value calculation unit, used to calculate the average electric field strength modulus of the interface creepage path of the target insulating material by using the corrected electric field strength modulus of each of the position points; The margin calculation unit is used to compare and calculate the average electric field strength modulus with the allowable field strength to obtain the design insulation margin of the target insulation material.

7. The device according to claim 6, characterized in that The path analysis unit comprises: An initial point search unit, used to find the maximum value of the tangential electric field intensity modulus in the electric field intensity distribution data and determine its corresponding position coordinates; A first determining unit, configured to determine the position of the position coordinate corresponding to the maximum value of the tangential electric field intensity modulus as the current position point; A position point searching unit, used to determine the next position point according to a set searching step length, taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current searching direction; A judging unit, used for judging whether the boundary of the target insulating material has been found; A second determining unit is used to update the most recently determined position point as the current target position point when it is determined that the boundary of the target insulating material has not been found, and return to the position point finding unit to execute the process of taking the direction of the unit vector of the electric field intensity vector of the current target position point as the current search direction and determining the next position point according to the set search step length; The connection unit is used to connect the found positions using a smooth curve when it is determined that the boundary of the target insulating material has not been found, so as to obtain the interface creepage path of the target insulating material.

8. The device according to claim 7, characterized in that The temperature determination unit comprises: The temperature search unit is used to find out the temperature at each of the position points from the temperature distribution data based on the position coordinates of each of the position points found on the interface creepage path of the target insulating material.

9. An electronic device, characterized in that: include: Memory and processor; Wherein, the memory is used to store programs; The processor is used to execute the program, and when the program is executed, it is specifically used to implement the material creepage margin analysis method as described in any one of claims 1 to 5.

10. A computer storage medium, characterized in that: Used to store a computer program, which, when executed, is used to implement the material creepage margin analysis method as described in any one of claims 1 to 5.

Citation Information

Patent Citations

  • Transformer test temperature correction method and device

    CN109596926A

  • Lighting full-wave impulse test-based transformer insulation test correction method, equipment and readable storage medium

    CN110618361A