A multi-chip simultaneous testing device

Abstract

The present invention relates to the field of chip testing technology, and in particular to a multi-chip simultaneous testing device, wherein a tray conveyor line for feeding a tray carrying chips to the bottom of the testing device is provided on a frame; the testing device comprises a LENS fixing plate, a product testing fixture used in pair with the tray, and a plurality of LENS lenses evenly distributed on the LENS fixing plate; a light source fixed on the frame is provided above the LENS fixing plate. When the present invention is used, the structure can enable batch automatic loading and automatic testing of chips, reduce labor intensity, improve testing efficiency, and reduce the risk of scratches during loading and unloading of chips during testing.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a multi-chip simultaneous testing device. Background Art

[0002] During the entire production process, it is necessary to ensure that the CMOS chip has no electrical or functional defects and no appearance defects such as partial or scratches. There is no process to fully inspect the yield rate of the chip after it is received and before the CCM completes the assembly. Only after the chip + LENS + VCM are assembled can the performance of the CMOS chip be tested to see if it is intact.

[0003] The LENS lens generates product images during testing, and determines whether there are defects on the product. If each PCS CMOS chip is taken out from the tray for full testing, it will take a lot of time and manpower, and the detection efficiency will be low. In addition, manual loading and unloading of materials can easily scratch the chip, greatly increasing the risk of poor appearance of the CMOS chip. Summary of the invention

[0004] The object of the present invention is to provide a multi-chip simultaneous testing device in view of the defects and shortcomings of the prior art.

[0005] To achieve the above object, the technical solution adopted by the present invention is:

[0006] The invention discloses a multi-chip simultaneous testing device, which comprises a frame and a testing device; the frame is provided with a tray conveyor line for conveying a tray carrying chips to the bottom of the testing device; the testing device comprises a LENS fixing plate, a product testing fixture used in pair with the tray, and a plurality of LENS lenses evenly distributed on the LENS fixing plate; a light source fixed on the frame is provided above the LENS fixing plate.

[0007] Furthermore, the testing device also includes a vertical angle adjustment component; the vertical angle adjustment component is connected to a horizontal angle adjustment component; the horizontal angle adjustment component is connected to a LENS fixing plate.

[0008] Furthermore, the vertical angle adjustment assembly includes a vertical adjustment base and a vertical swing block fixed on the horizontal angle adjustment assembly; an arc-shaped guide groove is arranged on one side of the vertical swing block facing the vertical adjustment base; the axis of the arc-shaped guide groove is arranged horizontally;

[0009] An arc-shaped slider matching the arc-shaped guide groove is arranged on the top surface of the vertical adjustment base; the arc-shaped slider is slidably connected to the arc-shaped guide groove; a second threaded hole connected to the arc-shaped guide groove is opened on the side surface of the vertical pendulum block; a second locking bolt which is tightly pressed against the vertical adjustment base is threadedly connected to the second threaded hole; a worm is rotatably connected to the inside of the arc-shaped slider; a plurality of teeth meshing with the worm are arranged on the surface of the arc-shaped guide groove; the teeth are arranged along the arc direction of the arc-shaped guide groove.

[0010] Furthermore, the number of the vertical angle adjustment components is two; the axes of the two arc-shaped guide grooves are arranged parallel to the horizontal plane; and the axes of the two arc-shaped guide grooves are arranged perpendicular to each other.

[0011] Furthermore, a lifting and fine-tuning assembly is provided on the vertical angle adjustment assembly; the lifting and fine-tuning assembly includes an upper lifting seat and a fine-tuning lifting seat; the upper lifting seat is slidably connected to the fine-tuning lifting seat; an upper lifting seat strip hole is opened on the upper lifting seat along the height direction; a third locking bolt is threadedly connected to the fine-tuning lifting seat; the third locking bolt passes through the upper lifting seat strip hole and is threadedly connected to the fine-tuning lifting seat; the head of the third locking bolt is pressed against the upper lifting seat; a rocker rod is rotatably connected to the fine-tuning lifting seat; a second differential head is fixed on the fine-tuning lifting seat; the two ends of the rocker rod are respectively pressed against the measuring rod of the second differential head and the bottom of the upper lifting seat.

[0012] Furthermore, a top jig pressure plate is fixed on the frame; the product testing jig is arranged directly below the top jig pressure plate; the tray conveyor line includes two conveyor lines parallel to each other; a jig lifting assembly is arranged between the two conveyor lines for driving the top jig pressure plate to perform lifting and lowering movements.

[0013] Furthermore, the product testing jig includes a tray positioning frame, a jig base plate fixed on the jig lifting assembly, and a jig body fixed on the jig base plate; a plurality of guide pins are fixed on the jig body; the tray positioning frame is slidably connected to the guide pins; and a spring is connected between the tray positioning frame and the jig body.

[0014] Furthermore, the tray conveyor line also includes two adjustment fixing frames; a conveyor line guide shaft is fixed between the two adjustment fixing frames; a conveyor line fixing frame is fixed on each of the conveyor lines; an adjustment guide sleeve slidably connected to the conveyor line guide shaft is fixed on the conveyor line fixing frame; an adjustment screw nut is fixed on each of the conveyor line fixing frames; a bidirectional screw is rotatably connected to the adjustment fixing frame; the two adjustment screw nuts are respectively threadedly connected to the two sections of the thread of the bidirectional screw; an adjustment guide sleeve slidably connected to the conveyor line guide shaft is fixed on the conveyor line fixing frame.

[0015] Furthermore, an adjusting hand wheel is fixed on the bidirectional screw rod.

[0016] Furthermore, a laser measuring instrument assembly is fixed on the frame; the laser measuring instrument assembly includes a second measuring instrument fixing plate, a measuring instrument fixing seat, a first measuring instrument fixing plate fixed on the frame, a transverse linear module connected between the first measuring instrument fixing plate and the second measuring instrument fixing plate, and a longitudinal linear module connected between the second measuring instrument fixing plate and the measuring instrument fixing seat; the laser measuring instrument body is fixed on the measuring instrument fixing seat.

[0017] After adopting the above structure, the beneficial effects of the present invention are as follows: the multi-chip simultaneous testing device described in the present invention, when using the present invention, the material tray is placed in the material tray conveyor line, and after the material tray conveyor line conveys the material tray to the testing device, the material tray is positioned by the product testing fixture, the material tray is separated from the material tray conveyor line, and each LENS lens is coaxially aligned with the corresponding lens on the material tray, and the chip in the material tray is connected to the circuit by using the product testing fixture; the image of the chip surface is obtained by multiple LENS lenses and transmitted to the computer and then compared with the standard image to batch judge whether the chip is a good product, and the light source is added to make the imaging of the LENS lens clearer. This structure can automatically load and detect chips in batches, reduce labor intensity, improve detection efficiency, reduce the risk of scratches on the loading and unloading of chips during chip detection, and synchronously obtain images of multiple chips through multiple LENS lenses for judgment, thereby improving detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 is a first perspective stereogram of the present invention;

[0019] Figure 2 is a second viewing angle stereogram of the present invention;

[0020] Figure 3 is a schematic diagram of the structure of the test device;

[0021] Figure 4 This is the structural diagram of the adjustment part of the LENS fixing plate;

[0022] Figure 5 This is the exploded view of the LENS fixed plate adjustment part after removing the lateral adjustment component;

[0023] Figure 6 is a structural diagram of the horizontal angle adjustment component;

[0024] Figure 7 is an exploded view of the vertical angle adjustment assembly;

[0025] Figure 8 It is the structural diagram of the vertical pendulum block;

[0026] Fig. 9 This is an exploded view of the lifting and fine-tuning assembly;

[0027] Fig.10 This is the structural diagram of the connection between the pendulum and the second differential head.

[0028] Fig.11 It is a first-person perspective stereogram of the tray conveying mechanism;

[0029] Fig.12 It is a second-angle stereogram of the tray conveying mechanism;

[0030] Fig.13 It is the structural diagram of the tray conveyor line;

[0031] Fig.14 It is a structural diagram of the jig lifting assembly;

[0032] Fig.15 It is the structural diagram of the product test fixture;

[0033] Fig.16 It is the structural diagram of the frame and the top fixture plate;

[0034] Fig.17 It is a structural diagram of the laser measuring instrument components;

[0035] Description of reference numerals:

[0036] A, horizontal angle adjustment assembly; A1, upper turntable; A2, turntable handle; A3, lower turntable seat;

[0037] A4, turntable locking screw; A5, first differential head; A6, horizontal differential connector;

[0038] A7, angle adjustment pendulum block; A8, first nut; A9, horizontal tightening bolt;

[0039] B, vertical angle adjustment assembly; B1, vertical swing block; B101, arc guide groove; B101a, teeth;

[0040] B102, first threaded hole; B103, second threaded hole; B2, screw; B3, second locking bolt;

[0041] B4, worm; B5, worm handle; B6, vertical adjustment base; B601, arc slider;

[0042] C, lifting and fine-tuning assembly; C1, upper lifting seat; C2, swing rod; C3, second differential head;

[0043] C4, the third locking bolt; C5, the strip hole of the upper lifting seat; C6, the fine adjustment lifting seat;

[0044] D, translation fine adjustment assembly; E, lateral adjustment assembly; E1, lateral adjustment guide rail;

[0045] E2, lateral adjustment slide; E3, lateral adjustment positioning seat; E301, positioning seat strip hole;

[0046] E4, fourth locking bolt; F, lifting adjustment assembly; G, LENS fixing plate; H, LENS lens;

[0047] I. Product testing fixture; I1. Fixture base; I2. Material tray positioning frame; I3. Fixture body;

[0048] I301, pin; I4, guide pin; I5, spring; J, tray conveyor line; J1, adjustment bracket;

[0049] J2, conveyor line fixing frame; J3, conveyor line guide shaft; J4, conveyor line; J5, bidirectional screw rod;

[0050] J6, adjusting hand wheel; J7, adjusting screw nut; J8, adjusting guide sleeve; K, frame; L, light source;

[0051] M, fixture lifting assembly; M1, fixture fixing plate; M2, lifting platform; M3, lifting screw nut;

[0052] M4, fixture lifting guide rail; M5, fixture lifting bracket; M6, fixture lifting motor;

[0053] M7, lifting screw; N, fixture pressure plate; P, laser measuring instrument assembly;

[0054] P1, first measuring instrument fixing plate; P2, second measuring instrument fixing plate; P3, lateral linear module;

[0055] P4, longitudinal linear module; P5, measuring instrument fixing seat; P6, laser measuring instrument body. DETAILED DESCRIPTION

[0056] The present invention will be further described below in conjunction with the accompanying drawings.

[0057] like Figures 1 to 17 As shown, a multi-chip simultaneous testing device of the present invention comprises a rack K and a testing device; the rack K is provided with a tray conveying line J for conveying a tray carrying chips to the bottom of the testing device; the testing device comprises a LENS fixing plate G, a product testing fixture I used in pair with the tray, and a plurality of LENS lenses H evenly distributed on the LENS fixing plate G; a light source L fixed on the rack K is provided above the LENS fixing plate G;

[0058] The tray is placed in the tray conveyor line J. After the tray conveyor line J conveys the tray to the test device, the tray is positioned by the product test fixture I. The tray is separated from the tray conveyor line J, and each LENS lens H is coaxially aligned with the corresponding lens on the tray. The chip in the tray is connected to the circuit by using the product test fixture I. The image of the chip surface is obtained by multiple LENS lenses H and transmitted to the computer, and then compared with the standard image to determine whether the chips are good in batches. In addition, the light source L is added to make the image of the LENS lens H clearer. This structure can automatically load and detect chips in batches, reduce labor intensity, improve detection efficiency, and reduce the risk of scratches when loading and unloading chips during chip detection.

[0059] As a preferred embodiment of the present invention, the test device further comprises a vertical angle adjustment component B; the LENS lens H is essentially the same as the prior art, so it is not described in detail; the LENS fixing plate G is a plate for fixing the LENS lens H; the vertical angle adjustment component B is connected to a horizontal angle adjustment component A; the horizontal angle adjustment component A is connected to the LENS fixing plate G;

[0060] LENS lens H is used to obtain the image of the chip surface, and then transmit the image to the computer for comparison to determine whether the chip surface is dirty;

[0061] The LENS lens H connected to the LENS fixing plate G is used to generate an image that can be obtained by the chip to be tested; the LENS fixing plate G is driven to swing on the horizontal plane through the horizontal angle adjustment component A to adjust the horizontal swing angle of the LENS lens H; the horizontal angle adjustment component A is made to swing in the vertical direction through the vertical angle adjustment component B to achieve the swing angle adjustment of the LENS lens H in the vertical direction; the LENS lens H is made coaxial with the chip to be tested through the coordinated adjustment of the horizontal angle adjustment component A and the vertical angle adjustment component B, so that a more complete chip image can be obtained, reducing the probability of misjudgment of chip testing.

[0062] The horizontal angle adjustment component A includes a lower turntable seat A3, an upper turntable A1 rotatably connected to the lower turntable seat A3, and a turntable locking screw A4 threadedly connected to the upper turntable A1; the end of the turntable locking screw A4 is pressed against the lower turntable seat A3; the LENS fixing plate G is fixed on the upper turntable A1; the lower turntable seat A3 is fixed on the vertical angle adjustment component B;

[0063] The upper turntable A1 and the lower turntable seat A3 are connected by bearings to achieve rotational connection. After the turntable locking screw A4 rotates in the threaded hole of the upper turntable A1, the locking screw A4 is tightened on the lower turntable seat A3; when the locking screw A4 is pressed on the lower turntable seat A3, the upper turntable A1 cannot rotate on the lower turntable seat A3. By loosening the locking screw A4 to tighten the lower turntable seat A3, the swing angle of the upper turntable A1 can be adjusted. A horizontal differential connection seat A6 and a first nut A8 are fixed on the lower turntable seat A3; a horizontal jacking bolt A9 is threadedly connected to the first nut A8; a first differential head A5 is fixed on the horizontal differential connection seat A6; an angle adjustment pendulum block A7 is fixed on the side wall of the upper turntable A1; the angle adjustment pendulum block A7 is arranged between the horizontal jacking bolt A9 and the measuring rod of the first differential head A5;

[0064] After loosening the locking screw A4, the first differential head A5 is operated to make the measuring rod extend and retract, and the measuring rod pushes the angle adjustment pendulum block A7 to make the upper turntable A1 swing, so as to fine-tune the horizontal swing angle of the LENS fixing plate G on the upper turntable A1. After the adjustment is completed, the horizontal tightening bolt A9 is rotated on the first nut A8 to tighten the angle adjustment pendulum block A7 on the measuring rod to position it, and finally the locking screw A4 is pressed on the lower turntable seat A3 to complete the adjustment. A turntable handle A2 is fixed on the upper turntable A1.

[0065] As a preferred embodiment of the present invention, the vertical angle adjustment component B includes a vertical adjustment base B6 and a vertical swing block B1 fixed on the horizontal angle adjustment component A; an arc-shaped guide groove B101 is provided on one side of the vertical swing block B1 facing the vertical adjustment base B6; the axis of the arc-shaped guide groove B101 is horizontally arranged;

[0066] An arc-shaped slider B601 matching the arc-shaped guide groove B101 is arranged on the top surface of the vertical adjustment base B6; the arc-shaped slider B601 is slidably connected to the arc-shaped guide groove B101; a second threaded hole B103 connected to the arc-shaped guide groove B101 is opened on the side surface of the vertical swing block B1; the second threaded hole B103 is internally threadedly connected with a second locking bolt B3 pressed against the vertical adjustment base B601; a worm B4 is rotatably connected inside the arc-shaped slider B601; a plurality of teeth B101a meshing with the worm B4 are arranged on the surface of the arc-shaped guide groove B101; the teeth B101a are arranged along the arc direction of the arc-shaped guide groove B101;

[0067] A worm handle B5 is connected to the worm B4; the second locking bolt B3 is used to press and fix the vertical adjustment base B6 and the vertical pendulum block B1; in addition, two first threaded holes B102 are arranged on the vertical pendulum block B1, and the first threaded holes B102 are threadedly connected with screws B2 that are pressed against the arc-shaped slider B601, and the function of the screw B2 is also to lock and fix the vertical adjustment base B6 and the vertical pendulum block B1; before adjusting the angle of the vertical adjustment base B6 of the vertical pendulum block B1, it is necessary to loosen the screw B2 and the second locking bolt B3; rotate the worm B4 so that the worm B4 moves on the teeth B101a, driving the arc-shaped slider B601 to slide along the arc-shaped guide groove B101, so as to realize the swing of the horizontal angle adjustment component A on the vertical plane.

[0068] As a preferred embodiment of the present invention, the number of the vertical angle adjustment components B is two; the axes of the two arc-shaped guide grooves B101 are arranged parallel to the horizontal plane; the axes of the two arc-shaped guide grooves B101 are arranged perpendicular to each other;

[0069] By setting two vertical angle adjustment components B, and the axes of the arc-shaped guide grooves B101 are perpendicular to each other, the two vertical angle adjustment components B are used to realize the two actions of swinging the horizontal angle adjustment component A left and right and swinging forward and backward on the vertical plane.

[0070] As a preferred embodiment of the present invention, a lifting and fine-tuning component C is provided on the vertical angle adjustment component B; the lifting and fine-tuning component C includes an upper lifting seat C1 and a fine-tuning lifting seat C6; the upper lifting seat C1 is slidably connected to the fine-tuning lifting seat C6; an upper lifting seat strip hole C5 is provided on the upper lifting seat C1 along the height direction; a third locking bolt C4 is threadedly connected to the fine-tuning lifting seat C6; the third locking bolt C4 passes through the upper lifting seat strip hole C5 and is threadedly connected to the fine-tuning lifting seat C6; the head of the third locking bolt C4 is pressed against the upper lifting seat C1; a pendulum rod C2 is rotatably connected to the fine-tuning lifting seat C6; a second differential head C3 is fixed to the fine-tuning lifting seat C6; the two ends of the pendulum rod C2 are respectively pressed against the measuring rod of the second differential head C3 and the bottom of the upper lifting seat C1;

[0071] Due to the gravity of the upper lifting seat C1 and the gravity of the components connected to it, the swing rod C2 is pressed against the upper lifting seat C1;

[0072] After the head of the third locking bolt C4 is pressed against the upper lifting seat C1, the fine-tuning lifting seat C6 and the upper lifting seat C1 are completely fixed; after loosening the third locking bolt C4, the second micrometer head C3 is operated to make the measuring rod push the pendulum rod C2 to swing, so as to realize the swing of the pendulum rod C2 and push the upper lifting seat C1 to move up and down along the fine-tuning lifting seat C6, so as to realize the fine-tuning of the LENS fixing plate G and the distance between the chip and the LENS lens H.

[0073] In addition, a lifting adjustment component F for coarsely adjusting the horizontal height of the LENS fixing plate G is connected between the horizontal angle adjustment component A and the LENS fixing plate G; the lifting adjustment component F includes a lifting frame fixed on the LENS fixing plate G, and a lifting guide rail extending along the height direction; a lifting slider slidably connected to the lifting guide rail is fixed on the lifting frame, and a handle bolt is threaded on the lifting frame; the handle bolt is tightened on the lifting guide rail; by loosening the handle bolt, the lifting frame can slide along the length direction of the lifting guide rail to roughly adjust the height of the LENS fixing plate G.

[0074] The bottom of the lifting fine-tuning component C is connected to a translation fine-tuning component D that can drive the lifting fine-tuning component C to perform translational motion on a horizontal plane; the translation fine-tuning component D includes two linear fine-tuning components; the two linear fine-tuning components are respectively an X-direction fine-tuning component and a Y-direction fine-tuning component whose adjustment directions are perpendicular to each other;

[0075] The linear fine-tuning assembly includes an upper linear slide and a lower linear fixed seat slidably connected to the upper linear slide; a third differential head is connected to the lower linear fixed seat; a measuring head of the third differential head is rotatably connected to the upper linear slide; a fifth locking bolt is threadedly connected to the upper linear slide; a strip hole is provided on the lower linear fixed seat; the fifth locking bolt passes through the strip hole and is locked in the threaded hole on the upper linear slide, and the fifth locking bolt locks and fixes the upper linear slide and the lower linear fixed seat; after loosening the fifth locking screw, the third differential head can be rotated to drive the upper linear slide to translate on the lower linear fixed seat, and after the adjustment is completed, the fifth locking bolt is used to lock and fix the upper linear slide and the lower linear fixed seat; the two horizontal directions of the LENS fixing plate G are adjusted respectively by the X-direction fine-tuning assembly and the Y-direction fine-tuning assembly to make the horizontal position of the LENS lens H.

[0076] A lateral adjustment component E is provided at the bottom of the translation fine-tuning component D; the structure is used for coarsely adjusting the lateral position of the LENS fixing plate G; the lateral adjustment component E includes a lateral adjustment guide rail E1, a lateral adjustment slide E2 fixed on the translation fine-tuning component D, and a lateral adjustment positioning seat E3 fixed on the lateral adjustment guide rail E1; the lateral adjustment slide E2 is slidably connected to the lateral adjustment guide rail E1; the lateral adjustment positioning seat E3 is provided with a positioning seat strip hole E301; the length direction of the positioning seat strip hole E301 is consistent with the length direction of the lateral adjustment guide rail E1; the fourth locking bolt E4 passes through the positioning seat strip hole E301 and is threadedly connected to the frame K, the fourth locking bolt E4 presses the lateral adjustment positioning seat E3 on the frame K, and the lateral position of the lateral adjustment slide E2 can be adjusted by loosening the fourth locking bolt E4.

[0077] As a preferred embodiment of the present invention, a top jig platen N is fixed on the frame K; the product testing jig I is arranged directly below the top jig platen N; the tray conveyor line J includes two mutually parallel conveyor lines J4; a jig lifting assembly M for driving the top jig platen N to perform lifting motion is arranged between the two conveyor lines J4;

[0078] Conveyor line J4 has no essential difference from the prior art, so it will not be described in detail;

[0079] The two trays are placed between the two conveyor lines J4, and the trays are conveyed to the bottom of the top jig platen N through the two conveyor lines J4; the jig lifting assembly M lifts the product test jig I upward, and the product test jig I of the jig lifting assembly M lifts the tray from the conveyor line J4 upward until the tray is pressed on the top jig platen N, and after the tray is pressed by the product test jig I and the top jig platen N, the electrodes of the chip in the tray are connected to the pins on the product test jig I for testing; after the test is completed, the jig lifting assembly M drives the product test jig I to descend, and the tray is prevented from moving between the conveyor lines J4 again, and the tray is released to the outside through the conveyor line J4, completing the entire chip testing process; during the entire testing process, the chips of the entire tray can be measured synchronously, and the tray is automatically loaded, automatically positioned and automatically unloaded, which greatly improves the efficiency of chip detection and the labor intensity of chip detection.

[0080] As a preferred embodiment of the present invention, the product testing jig I includes a tray positioning frame I2, a jig base plate I1 fixed on the jig lifting assembly M, and a jig body I3 fixed on the jig base plate I1; a plurality of guide pins I4 are fixed on the jig body I3; the tray positioning frame I2 is slidably connected to the guide pins I4; a spring I5 is connected between the tray positioning frame I2 and the jig body I3;

[0081] The inner hole of the tray positioning frame I2 matches the tray, and a flange is provided on the edge of the tray, which is supported on the surface of the tray positioning frame I2.

[0082] After the material tray is placed in the material tray positioning frame I2, it is positioned by the edge of the material tray positioning frame I2; so that the electrode of the chip in the material tray is aligned with the pin I301 on the fixture body I3; the force of the spring I5 lifts the material tray and the material tray positioning frame I2, so that the electrode of the chip in the material tray is separated from the pin I301 on the fixture body I3; after the fixture lifting component M lifts the product testing fixture I, the flange of the material tray is gradually pressed by the top fixture pressure plate N, the spring I5 is compressed, and the material tray and the material tray positioning frame I2 slide down along the guide pin I4 until the electrode of the chip in the material tray contacts the pin I301 on the fixture body I3, and the circuit is connected; when the product testing fixture I and the material tray descend and separate from the top fixture pressure plate N, the force of the spring I5 pushes the material tray and the material tray positioning frame I2 upward, so that the electrode of the chip in the material tray is aligned with the pin I301 on the fixture body I3 The pin I301 is separated: the jig lifting assembly M includes a jig lifting motor M6, a jig lifting bracket M5 fixed on the frame K, a jig lifting guide rail M4 fixed on the jig lifting bracket M5, a lifting platform M2 slidably connected to the jig lifting guide rail M4, and a lifting screw M7 rotatably connected to the jig lifting bracket M5; a lifting screw nut M3 threadedly connected to the lifting screw M7 is fixed on the lifting platform M2; the two ends of the jig lifting motor M6 are respectively fixed on the jig lifting bracket M5 and the lifting screw M7; the product testing jig I is fixed on the jig lifting bracket M5 through the jig fixing plate M1; after the jig lifting motor M6 is started, it drives the lifting screw M7 to rotate, so that the lifting platform M2, the lifting screw nut M3, the jig fixing plate M1 and the product testing jig I perform lifting movements.

[0083] As a preferred embodiment of the present invention, the tray conveyor line J also includes two adjustment fixing frames J1; a conveyor line guide shaft J3 is fixed between the two adjustment fixing frames J1; a conveyor line fixing frame J2 is fixed on each of the conveyor lines J4; an adjustment guide sleeve 8 slidably connected to the conveyor line guide shaft J3 is fixed on the conveyor line fixing frame J2; an adjustment screw nut J7 is fixed on each of the conveyor line fixing frames J2; a bidirectional screw J5 is rotatably connected to the adjustment fixing frame J1; two adjustment screw nuts J7 are respectively threadedly connected to two sections of the thread of the bidirectional screw J5; an adjustment guide sleeve J8 slidably connected to the conveyor line guide shaft J3 is fixed on the conveyor line fixing frame J2; the number of the conveyor line guide shafts J3 is at least two, and the conveyor line guide shafts J3 are arranged parallel to each other;

[0084] After rotating the bidirectional screw rod J5, the two conveyor lines J4 can move toward or away from each other along the conveyor line guide axis J3 to adjust the distance between the two conveyor lines J4 and match the conveyance of trays of different widths.

[0085] As a preferred embodiment of the present invention, an adjusting hand wheel J6 is fixed on the bidirectional screw rod J5.

[0086] As a preferred embodiment of the present invention, a laser measuring instrument assembly P is fixed on the frame K; the laser measuring instrument assembly P includes a second measuring instrument fixing plate P2, a measuring instrument fixing seat P5, a first measuring instrument fixing plate P1 fixed on the frame K, a transverse linear module P3 connected between the first measuring instrument fixing plate P1 and the second measuring instrument fixing plate P2, and a longitudinal linear module P4 connected between the second measuring instrument fixing plate P2 and the measuring instrument fixing seat P5; a laser measuring instrument body P6 is fixed on the measuring instrument fixing seat P5; the laser measuring instrument body P6 is essentially the same as the prior art, so it is not described in detail, and the transverse linear module P3 and the longitudinal linear module P4 are essentially the same as the existing linear modules, so they are not described in detail; the collection point of the laser measuring instrument body P6 is adjusted by the transverse linear module P3 and the longitudinal linear module P4; the transverse linear module P3 can drive the longitudinal linear module P4 to move the laser measuring instrument body P6. The linear module P4 performs lateral movement, and the longitudinal linear module P4 can drive the longitudinal movement of the measuring instrument fixing seat P5 and the laser measuring instrument body P6 to realize the position adjustment of the laser measuring instrument body P6; the laser measuring instrument body P6; the laser measuring instrument body P6 can measure the position height of the LENS lens H, the product test fixture I and the LENS fixed plate G; through the coordinated movement of the lateral linear module P3 and the longitudinal linear module P4, the multi-point height information of multiple positions of the LENS fixed plate G is collected to determine whether the LENS fixed plate G is in a horizontal state; similarly, the product test fixture I is also judged by collecting multi-point data at multiple positions to determine whether it is in a horizontal state; and the position of the chip to the LENS lens H can be determined by collecting height data of the product test fixture I and the LENS fixed plate G, which is convenient for adjusting the position height of the LENS fixed plate G.

[0087] The above description is only a preferred embodiment of the present invention, so all equivalent changes or modifications made according to the structure, characteristics and principles described in the scope of the patent application of the present invention are included in the scope of the patent application of the present invention.

Claims

1. A multi-chip simultaneous testing device, characterized in that: It comprises a frame (K) and a testing device; the frame (K) is provided with a tray conveying line (J) for conveying a tray carrying chips to the bottom of the testing device; the testing device comprises a LENS fixing plate (G), a product testing fixture (I) used in pair with the tray, and a plurality of LENS lenses (H) evenly distributed on the LENS fixing plate (G); a light source (L) fixed on the frame (K) is provided above the LENS fixing plate (G); A top jig pressing plate (N) is fixed on the frame (K); the product testing jig (I) is arranged directly below the top jig pressing plate (N); the tray conveyor line (J) includes two conveyor lines (J4) parallel to each other; a jig lifting component (M) is arranged between the two conveyor lines (J4) for driving the top jig pressing plate (N) to perform lifting motion; The product testing jig (I) comprises a material tray positioning frame (I2), a jig base plate (I1) fixed on a jig lifting assembly (M), and a jig body (I3) fixed on the jig base plate (I1); a plurality of guide pins (I4) are fixed on the jig body (I3); the material tray positioning frame (I2) is slidably connected to the guide pins (I4); a spring (I5) is connected between the material tray positioning frame (I2) and the jig body (I3); The tray conveyor line (J) also includes two adjustment fixing frames (J1); a conveyor line guide shaft (J3) is fixed between the two adjustment fixing frames (J1); a conveyor line fixing frame (J2) is fixed on each of the conveyor lines (J4); an adjustment guide sleeve (8) slidably connected to the conveyor line guide shaft (J3) is fixed on the conveyor line fixing frame (J2); an adjustment screw nut (J7) is fixed on each of the conveyor line fixing frames (J2); a bidirectional screw (J5) is rotatably connected to the adjustment fixing frame (J1); the two adjustment screw nuts (J7) are respectively threadedly connected to two sections of the thread of the bidirectional screw (J5); and an adjustment guide sleeve (J8) slidably connected to the conveyor line guide shaft (J3) is fixed on the conveyor line fixing frame (J2).

2. A multi-chip simultaneous testing device according to claim 1, characterized in that: The testing device also includes a vertical angle adjustment component (B); the vertical angle adjustment component (B) is connected to a horizontal angle adjustment component (A); the horizontal angle adjustment component (A) is connected to a LENS fixing plate (G).

3. A multi-chip simultaneous testing device according to claim 2, characterized in that: The vertical angle adjustment component (B) comprises a vertical adjustment base (B6) and a vertical swing block (B1) fixed on the horizontal angle adjustment component (A); an arc-shaped guide groove (B101) is arranged on a side of the vertical swing block (B1) facing the vertical adjustment base (B6); the axis of the arc-shaped guide groove (B101) is arranged horizontally; An arc-shaped slider (B601) matching the arc-shaped guide groove (B101) is arranged on the top surface of the vertical adjustment base (B6); the arc-shaped slider (B601) is slidably connected to the arc-shaped guide groove (B101); a second threaded hole (B103) connected to the arc-shaped guide groove (B101) is opened on the side surface of the vertical swing block (B1); a second locking bolt (B3) pressed against the vertical adjustment base (B601) is internally threadedly connected to the second threaded hole (B103); a worm (B4) is rotatably connected inside the arc-shaped slider (B601); a plurality of teeth (B101a) meshing with the worm (B4) are arranged on the surface of the arc-shaped guide groove (B101); the teeth (B101a) are arranged along the arc direction of the arc-shaped guide groove (B101).

4. The multi-chip simultaneous testing device according to claim 3, characterized in that: The number of the vertical angle adjustment components (B) is two; the axes of the two arc-shaped guide grooves (B101) are arranged parallel to the horizontal plane; and the axes of the two arc-shaped guide grooves (B101) are arranged perpendicular to each other.

5. The multi-chip simultaneous testing device according to claim 2, characterized in that: The vertical angle adjustment component (B) is provided with a lifting and fine-tuning component (C); the lifting and fine-tuning component (C) includes an upper lifting seat (C1) and a fine-tuning lifting seat (C6); the upper lifting seat (C1) is slidably connected to the fine-tuning lifting seat (C6); an upper lifting seat strip hole (C5) is opened on the upper lifting seat (C1) along the height direction; a third locking bolt (C4) is threadedly connected to the fine-tuning lifting seat (C6); the third locking bolt (C4) passes through the upper lifting seat strip hole (C5) and is threadedly connected to the fine-tuning lifting seat (C6); the head of the third locking bolt (C4) is pressed against the upper lifting seat (C1); a swing rod (C2) is rotatably connected to the fine-tuning lifting seat (C6); a second differential head (C3) is fixed to the fine-tuning lifting seat (C6); two ends of the swing rod (C2) are respectively pressed against the measuring rod of the second differential head (C3) and the bottom of the upper lifting seat (C1).

6. The multi-chip simultaneous testing device according to claim 1, characterized in that: An adjusting hand wheel (J6) is fixed on the bidirectional screw rod (J5).

7. The multi-chip simultaneous testing device according to claim 1, characterized in that: A laser measuring instrument assembly (P) is fixed on the frame (K); the laser measuring instrument assembly (P) comprises a second measuring instrument fixing plate (P2), a measuring instrument fixing seat (P5), a first measuring instrument fixing plate (P1) fixed on the frame (K), a transverse linear module (P3) connected between the first measuring instrument fixing plate (P1) and the second measuring instrument fixing plate (P2), and a longitudinal linear module (P4) connected between the second measuring instrument fixing plate (P2) and the measuring instrument fixing seat (P5); a laser measuring instrument body (P6) is fixed on the measuring instrument fixing seat (P5).

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