Shunt test device, control method and control device thereof

Abstract

The present invention proposes a shunt testing device and its control method and control device. The shunt testing device includes a power supply module, a drive component and a plurality of first electrode rods, and the first ends of the plurality of first electrode rods are connected in parallel with the power supply module. The method includes: first obtaining a test instruction, and determining the current to be measured according to the test instruction; then controlling the drive component to drive the second ends of at least two first electrode rods to abut against the two ends of the shunt to be measured; then controlling the power supply module to output the current to be measured through the plurality of first electrode rods abutting against the two ends of the shunt to be measured to flow through the shunt to be measured; finally obtaining the detection current output by the shunt, and determining the performance of the shunt to be measured based on the detection current and the current to be measured. The present invention aims to realize the detection of shunt performance.

Description

Technical Field

[0001] The present invention relates to the technical field of shunt testing, and in particular to a shunt testing device and a control method and a control device thereof. Background Art

[0002] A shunt is a device connected in series with a circuit under test to detect the current flowing through it. This is accomplished by measuring the voltage drop across the current sensing element within the shunt and calculating the current flowing through the circuit based on the known resistance of the current sensing element. Therefore, it is crucial to test the performance of shunts before shipment. Summary of the Invention

[0003] The main purpose of the present invention is to provide a shunt testing device and a control method and a control device thereof, aiming to test the working performance of the shunt.

[0004] To achieve the above objectives, the present invention provides a shunt testing method, wherein the shunt testing device includes a power module, a drive assembly, and a plurality of first electrode rods, wherein the first ends of the plurality of first electrode rods are connected in parallel to the power module, and the method includes:

[0005] Step S100: obtaining a test instruction, and determining a current to be measured according to the test instruction;

[0006] Step S200: Control the driving assembly to drive the second ends of at least two of the first electrode guide rods to abut against two ends of the shunt to be measured;

[0007] Step S300, controlling the power supply module to output the current to be measured through the plurality of first electrode guide rods abutting against both ends of the shunt to be measured to flow through the shunt to be measured;

[0008] Step S400: obtaining a detection current output by the shunt, and determining the performance of the shunt to be tested according to the detection current and the current to be tested.

[0009] Optionally, step S200 specifically includes:

[0010] Step S210: obtaining the current value of the current to be measured;

[0011] Step S220: According to the current value, select a corresponding number of second ends of the first electrode guide rods to abut against two ends of the shunt to be measured.

[0012] Optionally, the shunt to be tested includes a current sensing component and a first conductive portion and a second conductive portion respectively provided on both sides of the current sensing component, and the step S100 further includes:

[0013] Step S110: determining a test position according to the test instruction;

[0014] The step S200 further includes:

[0015] Step S230: According to the test position, control the driving assembly to drive the second ends of at least two of the first electrode guide rods to abut against positions corresponding to the first conductive portion and the second conductive portion of the shunt to be tested.

[0016] Optionally, mounting holes are provided on the first conductive portion and the second conductive portion, and step S230 specifically includes:

[0017] According to the test position, the driving assembly is controlled to drive the second ends of at least two of the first electrode guide rods to abut against the position adjacent to the mounting hole on the first conductive part of the shunt to be tested and / or abut against the position adjacent to the mounting hole on the second conductive part of the shunt to be tested.

[0018] Optionally, the step S230 further includes:

[0019] According to the test position, the driving assembly is controlled to drive the second ends of at least two of the first electrode guide rods to abut against a position on the first conductive part of the shunt to be tested away from the mounting hole and / or abut against a position on the second conductive part of the shunt to be tested away from the mounting hole.

[0020] Optionally, step S200 further includes:

[0021] Step S240: Select at least two symmetrical conductor groups from the plurality of first electrode rods; wherein the symmetrical conductor groups include two first electrode rods, and when the second ends of the two first electrode rods are respectively abutted against the shunt to be measured, the second ends of the two first electrode rods are symmetrical with respect to the central axis of the shunt to be measured;

[0022] Step S250: Control the driving assembly to drive at least two of the symmetrical conductor groups to move so that the second ends of the first electrode rods in the symmetrical conductor groups abut against the two ends of the shunt to be measured.

[0023] Optionally, the shunt testing device further includes at least one second electrode guide rod, which is drivingly connected to the driving assembly; a temperature sensor is provided at one end of the second electrode guide rod. Between step S100 and step S400, the method further includes:

[0024] Step S500: Control the driving assembly to drive the second electrode guide rod to move so that the temperature sensor on the second electrode guide rod is close to the shunt to be tested;

[0025] The step S400 specifically includes:

[0026] Step S410: Acquire the detection temperature output by the temperature sensor, and determine the performance of the shunt to be tested according to the detection temperature.

[0027] Optionally, step S500 specifically includes:

[0028] The control driving component drives the second electrode guide rod to move so that the temperature sensor on the second electrode guide rod is close to the shunt to be tested and away from the first electrode guide rod abutting against the shunt to be tested.

[0029] The present invention further provides a control device, which is used for the shunt testing device, and includes:

[0030] Memory;

[0031] processor; and,

[0032] A shunt test device control program stored in the memory and executed by the processor, wherein when the household appliance control program is executed by the processor, the shunt test device control method as described above is implemented.

[0033] The present invention also provides a shunt testing device, which includes a power supply module, a drive assembly, a plurality of first electrode guide rods, at least one second electrode guide rod, and the control device as described above;

[0034] The first ends of the plurality of first electrode guide rods are all connected in parallel to the power module; and the second ends of the second electrode guide rods are provided with temperature sensors.

[0035] In the solution of the present invention, the shunt testing device method includes first obtaining a test instruction and determining a current to be tested based on the test instruction; then controlling a drive assembly to drive the second ends of at least two first electrode rods to abut against the two ends of the shunt to be tested; then controlling a power supply module to output a current to be tested through the multiple first electrode rods abutting against the two ends of the shunt to be tested; finally, obtaining a detection current output by the shunt, and determining the performance of the shunt to be tested based on the detection current and the current to be tested. In this way, during the actual testing process, the user can output the required current to be tested through the shunt through the shunt through the shunt testing device, and determine the performance of the shunt based on the result output by the shunt.

[0036] At the same time, it should be understood that for the shunt to be tested, there are often multiple depressions of varying degrees on the surface of the connection parts at both ends of the shunt for accessing the circuit to be tested. Therefore, in the prior art, if the output end of the power module directly contacts the connection part of the shunt through a conductive pressing piece, its uneven surface will affect the transmission of the current to be tested thereon, resulting in uneven current distribution density on the surface of the shunt, which will in turn affect the detection results of the shunt and cause misjudgment of the performance of the shunt. In the present application, since the shunt test device of the present application transmits the current to be tested output by the power module through multiple electrode guide rods abutting at both ends of the shunt, compared with an entire pressing piece, multiple electrode guide rods with a smaller contact area with the shunt can be fitted with the surface of the connection parts at both ends of the shunt, so that the current to be tested output by the power module through multiple first electrode guide rods can be distributed more evenly on the surface of the shunt, thereby improving the accuracy of the judgment of the shunt performance. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying any creative work.

[0038] Figure 1 This is a flow chart of an embodiment of a method for controlling a shunt test device according to the present invention;

[0039] Figure 2 This is a flow chart of another embodiment of the control method of the shunt testing device of the present invention;

[0040] Figure 3 This is a flow chart of another embodiment of the control method of the shunt testing device of the present invention;

[0041] Figure 4 This is a flow chart of another embodiment of the control method of the shunt testing device of the present invention;

[0042] Figure 5 Schematic diagram of the structure of a shunt testing device according to an embodiment of the present invention.

[0043] Figure Numbers

[0044] 110 first conductive portion 120 Second conductive portion 200 First electrode guide

[0045] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0046] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0047] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0048] In the present invention, unless otherwise specified or limited, the terms "connection" and "fixation" should be understood in a broad sense. For example, "fixation" can mean fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two elements or interaction between two elements, unless otherwise specified. Those skilled in the art will be able to understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0049] In addition, in the present invention, descriptions such as "first" and "second" are for descriptive purposes only and should not be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but this must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0050] A shunt is a device connected in series with a circuit under test to detect the current flowing through it. This is accomplished by measuring the voltage drop across the current sensing element within the shunt and calculating the current flowing through the circuit based on the known resistance of the current sensing element. Therefore, it is crucial to test the performance of shunts before shipment.

[0051] To this end, the present invention provides a control method for a shunt test device. The shunt test device includes a power module, a drive assembly, and multiple first electrode guide rods 200, wherein the first ends of the multiple first electrode guide rods 200 are connected in parallel to the power module. It will be understood that the shunt test device is provided with a control device for storing and executing the control method described below. The control device can be implemented using a main controller, such as an MCU, a DSP (Digital Signal Process), an FPGA (Field Programmable Gate Array), or a SOC (System on Chip).

[0052] Among them, the power supply module can be implemented by an adjustable constant current source module, and the adjustable constant current source module can be implemented by building an adjustable constant current source circuit with electronic components such as switching devices, capacitors, inductors, resistors, etc. Alternatively, it can be implemented directly by using a programmable adjustable constant current source. The first electrode guide rod 200 can be implemented by a metal electrode, such as a copper metal electrode. The first end of a part of the multiple first electrode guide rods 200 is connected to the positive output terminal of the power supply module, and the first end of the other part is connected to the negative output terminal of the power supply module. Optionally, the drive assembly can be implemented by a manipulator, a robotic arm and a plurality of motors, and the control device can control the above-mentioned multiple motors to realize the movement of the driving manipulator and the robotic arm so that the second end of the first electrode guide rod 200 is abutted against the diverter. Optionally, the shunt control device may also be provided with a test area, and a plurality of first electrode guide rods 200 are arranged in sequence above the test area. The driving assembly is implemented by a plurality of driving motors. When the shunt to be tested is placed in the test area, the control device may control the corresponding driving motors to move the plurality of first electrode guide rods 200 above the test area vertically downward until their second ends abut against the shunt to be tested.

[0053] refer to Figure 1 In one embodiment of the present invention, the method includes:

[0054] Step S100: obtaining a test instruction, and determining a current to be measured according to the test instruction;

[0055] In this embodiment, optionally, the shunt test device may further include a trigger component electrically connected to the control device, such as a keyboard, a touch screen, a button, etc. The user can operate the trigger component as needed to make it output a corresponding test instruction to the control device. Optionally, the shunt test device may also be provided with a communication module electrically connected to the control device, and the communication module is used to establish a communication connection with an external terminal such as a host computer, a cloud, or a personal terminal. The communication module can be implemented by a wireless communication module, such as a Wi-Fi communication module, a Bluetooth communication module, or a 4G / 5G communication module; or, the communication module can also be implemented by a wired communication module, such as a LIN communication module, a CAN communication module, etc. The user can operate the external terminal to output the corresponding test instruction to the control device via the communication module. Optionally, the test instruction may include a start test instruction, a current to be measured, a test area, etc., so that the control device controls the power module and the drive component according to the test instruction to implement the test of the shunt to be tested.

[0056] Step S200: Control the driving assembly to drive the second ends of at least two of the first electrode guide rods 200 to abut against both ends of the shunt to be measured;

[0057] Optionally, in one embodiment, the control device can control the driving assembly to abut all first electrode rods 200 against both ends of the diverter. The number of first electrode rods 200 abutting against both ends of the diverter can be the same or different.

[0058] Optionally, refer to Figure 2 In another embodiment, step S200 specifically includes:

[0059] Step S210: obtaining the current value of the current to be measured;

[0060] Step S220 : According to the current value, select a corresponding number of the second ends of the first electrode guide rods 200 to abut against the two ends of the shunt to be measured.

[0061] In this embodiment, the control device determines the number of first electrode rods 200 required to abut the ends of the shunt based on the current value of the current to be measured, based on the preset upper limit of the current transmitted by each electrode rod (preset by R&D personnel). For example, if a single first electrode rod 200 can transmit a maximum current of 5A and the current to be measured is 30A, the control device will control the drive assembly to drive at least 12 first electrode rods 200 so that at least six first electrode rods 200 abut each end of the shunt, thereby ensuring the reliability and stability of the measured transmission.

[0062] Step S300, controlling the power module to output the current to be measured to flow through the shunt to be measured via the plurality of first electrode guide rods 200 abutting against both ends of the shunt to be measured;

[0063] Step S400: obtaining a detection current output by the shunt to be tested, and determining the performance of the shunt to be tested according to the detection current and the current to be tested.

[0064] In this embodiment, the control device establishes a communication connection with the shunt. After the control device controls the power module to output the current to be measured so that it flows through the shunt to be measured, the detection result output by the shunt to be measured, that is, the detection current, is obtained. Then, the current value of the detection current is compared with the current value of the current to be measured. If the difference between the two reaches a preset difference (preset by the R&D personnel), then it means that the detection accuracy of the current shunt is abnormal and the performance is unqualified. If the difference between the two is less than the preset difference, then the detection accuracy of the current shunt is normal and the performance is qualified. In this way, during the actual test process, the user can output the required current to be measured through the shunt through the shunt test device, and judge the performance of the shunt based on the result output by the shunt.

[0065] At the same time, it should be understood that for the shunt to be tested, there are often multiple depressions of varying degrees on the surface of the connection parts at both ends of the shunt for accessing the circuit to be tested. Therefore, in the prior art, if the output end of the power module directly contacts the connection part of the shunt through a conductive pressing piece, its uneven surface will affect the transmission of the current to be tested thereon, resulting in uneven current distribution density on the surface of the shunt, which will in turn affect the detection result of the shunt and cause a misjudgment of the performance of the shunt. In the present application, since the shunt test device of the present application transmits the current to be tested output by the power module through multiple electrode guide rods abutting at both ends of the shunt, compared with an entire pressing piece, multiple electrode guide rods with a smaller contact area with the shunt can be fitted with the surface of the connection part at both ends of the shunt, so that the current to be tested output by the power module through multiple first electrode guide rods 200 can be distributed more evenly on the surface of the shunt, thereby improving the accuracy of the judgment of the shunt performance.

[0066] In addition, it can be understood that in order to further improve the accuracy of judging the performance of the shunt, based on the above embodiment and the following embodiment, reference Figure 4 In one embodiment of the present invention, step S200 further includes:

[0067] Step S240: Select at least two symmetrical conductor groups from the plurality of first electrode rods 200; wherein the symmetrical conductor groups include two first electrode rods 200, and when the second ends of the two first electrode rods 200 are respectively abutted against the shunt to be measured, the second ends of the two first electrode rods 200 are symmetrical with respect to the central axis of the shunt to be measured;

[0068] Step S250: Control the driving assembly to drive at least two of the symmetrical conductor groups to move, so that the second ends of the first electrode rods 200 in the symmetrical conductor groups abut against the two ends of the shunt to be measured.

[0069] In this embodiment, multiple symmetrical conductor groups are directly pre-set in the structure of the shunt testing device. The two first electrode rods 200 in each symmetrical conductor group are symmetrical with respect to the central axis of the test area. In this way, when the shunt to be tested is placed in the test area, the two first electrode rods 200 in the same symmetrical conductor group can be symmetrical with respect to the central axis of the shunt to be tested. In this way, during the actual testing of the shunt to be tested, since the multiple first electrode rods 200 abutting the two ends of the shunt to be tested are symmetrically arranged with respect to each other, the uniformity of the current distribution in the shunt to be tested can be further improved, thereby ensuring the accuracy of the performance test of the shunt to be tested.

[0070] It's important to understand that in actual shunt applications, the connections at both ends of the shunt are typically connected to the external circuit under test through screwing, welding, riveting, clamping, etc. Different connection methods, due to their different connection locations on the shunt, can result in different current distributions across the shunt, thus affecting the final test results.

[0071] To this end, in one embodiment of the present invention, reference is made to Figure 3 The shunt to be tested includes a current sensing component and a first conductive portion 110 and a second conductive portion 120 respectively provided on both sides of the current sensing component. The step S100 further includes:

[0072] Step S110: determining a test position according to the test instruction;

[0073] The step S200 further includes:

[0074] Step S230 , according to the test position, controlling the driving assembly to drive the second ends of at least two first electrode rods 200 to abut against the positions corresponding to the first conductive portion 110 and the second conductive portion 120 of the shunt to be tested.

[0075] In this embodiment, the control device will determine the connection mode that needs to be simulated at present according to the test instruction given by the user, and then determine the test position corresponding to the connection mode according to the preset connection mode-test position mapping table, that is, the position where the second ends of multiple first electrode guide rods 200 need to abut on the shunt. Then, according to the preset test position-first electrode guide rod 200 mapping table, the first electrode guide rod 200 that needs to be driven is determined (pre-set by the R&D personnel in the process of structural design of the shunt test device), that is, when determining the test position, which first electrode guide rods 200 need to be driven by the driving component. It can be understood that for the same test position, there can be multiple first electrode guide rods 200. For example, refer to Figure 5 For the first conductive part 110 of the shunt, for the mounting hole (test position) on the first conductive part 110, the multiple first electrode rods 200 in a circle around the position can be preset as the first electrode rods 200 corresponding to the test position, so that the control device can select the required number of first electrode rods 200 for abutment during the test.

[0076] Optionally, in one embodiment, referring to Figure 5 , the first conductive portion 110 and the second conductive portion 120 are provided with mounting holes, and the step S230 specifically includes:

[0077] According to the test position, the driving assembly is controlled to drive the second ends of at least two of the first electrode guide rods 200 to abut against the position adjacent to the mounting hole on the first conductive part 110 of the shunt to be tested and / or abut against the position adjacent to the mounting hole on the second conductive part 120 of the shunt to be tested.

[0078] Specifically, the first electrode rod 200 on the side of the first conductive portion 110 is used as an example for description, and the same applies to the second conductive portion 120. During the test process, the control device controls the drive assembly to drive the second ends of the first electrode rods 200 on both sides of the mounting hole of the first conductive portion 110 to abut against the periphery of the mounting hole based on the test position, thereby simulating a connection method through the mounting hole and performing the above-mentioned test process.

[0079] Alternatively, in another embodiment, referring to Figure 5 , the step S230 further includes:

[0080] According to the test position, the driving assembly is controlled to drive the second ends of at least two of the first electrode rods 200 to abut against a position on the first conductive part 110 of the shunt to be tested away from the mounting hole and / or abut against a position on the second conductive part 120 of the shunt to be tested away from the mounting hole.

[0081] Specifically, the first electrode rod 200 on the side of the first conductive portion 110 is used as an example for description, and the same applies to the second conductive portion 120. During the test process, the control device controls the drive assembly to drive the second end of the first electrode rod 200 at a position on the first conductive portion 110 near the shunt circuit board to abut against the first conductive portion 110 based on the test position, thereby simulating a connection method such as welding or crimping, and performing the above-mentioned test process.

[0082] Through the above configuration, during the shunt testing process, a simulation test can be performed on the shunt's actual performance when connected to the circuit under test. This allows not only the determination of the shunt's ability to maintain its detection accuracy under different connection methods based on the performance determination process described in the above embodiment, but also the simulation of the detection accuracy of shunts with normal detection accuracy under different connection methods to determine the most suitable connection method for the shunt under test.

[0083] In one embodiment of the present invention, the shunt testing device further includes at least one second electrode guide rod, which is drivingly connected to the drive assembly; a temperature sensor is provided at one end of the second electrode guide rod. Between step S100 and step S400, the method further includes:

[0084] Step S500: Control the driving assembly to drive the second electrode guide rod to move so that the temperature sensor on the second electrode guide rod is close to the shunt to be tested;

[0085] The step S400 further includes:

[0086] Step S410: Acquire the detection temperature output by the temperature sensor, and determine the performance of the shunt to be tested according to the detection temperature.

[0087] In this embodiment, the temperature sensor may optionally be implemented by an infrared temperature sensor, a thermocouple temperature sensor, an NTC temperature sensor, etc. The second electrode guide rod may be implemented by using the same material or structure as the first electrode guide rod 200 .

[0088] refer to Figure 5 As can be seen, a current splitter typically contains a circuit board for sampling, calculating, and outputting current results. The temperature of the circuit board significantly impacts the performance of the circuit modules located therein. Therefore, before the control device controls the power module to output the measured current, it also controls the second electrode guide rod to approach the circuit board of the current splitter to detect the temperature of the circuit board.

[0089] If the detection temperature reaches the preset temperature (set by the R&D personnel), the tester can determine that the temperature of the circuit board in the shunt is likely to be too high under the current to be tested, which may affect its performance. If the detection temperature fails to reach the preset temperature, the tester can determine that the temperature of the circuit board in the shunt can be maintained in a normal range under the current to be tested. In this way, through the above settings, the tester can determine the current value of the shunt to be tested at which the temperature of the circuit board will be too high, and thus provide a reference for setting the limit test current of the shunt to be tested.

[0090] In addition, it should be understood that, based on the above embodiment, the second end of the first electrode guide rod 200 is in contact with both ends of the shunt, that is, Figure 5 The first conductive portion 110 and the second conductive portion 120 of the shunt are located in the middle of the shunt, and the contact area between the first electrode guide rod 200 and the shunt is relatively small, so heat is easily accumulated during the current conduction process. Therefore, in this embodiment, step S500 specifically includes: controlling the drive assembly to drive the second electrode guide rod to operate so that the temperature sensor thereon is close to the shunt to be tested and away from the first electrode guide rod 200 abutting the shunt to be tested. Such an arrangement can effectively reduce the impact of the temperature at the abutment point of the first electrode guide rod 200 on the above-mentioned testing process, effectively improving the accuracy of temperature detection on the circuit board within the shunt.

[0091] The present invention further provides a control device, which is used for the shunt testing device, and includes:

[0092] Memory;

[0093] processor; and,

[0094] A shunt test device control program stored in the memory and executed by the processor, wherein when the household appliance control program is executed by the processor, the shunt test device control method as described above is implemented.

[0095] It is worth noting that since the control device of the present invention is based on the above-mentioned shunt test device control method, the embodiments of the control device of the present invention include all technical solutions of all embodiments of the above-mentioned shunt test device control method, and the technical effects achieved are also exactly the same, which will not be repeated here.

[0096] The present invention also provides a shunt testing device, characterized in that the shunt testing device includes a power supply module, a drive assembly, a plurality of first electrode guide rods, at least one second electrode guide rod, and the control device as described above;

[0097] The first ends of the plurality of first electrode guide rods are all connected in parallel to the power module; and the second ends of the second electrode guide rods are provided with temperature sensors.

[0098] It is worth noting that since the shunt testing device of the present invention is based on the above-mentioned control device, the embodiments of the shunt testing device of the present invention include all technical solutions of all embodiments of the above-mentioned control device, and the technical effects achieved are also exactly the same, which will not be repeated here.

[0099] The above are only optional embodiments of the present invention and do not limit the patent scope of the present invention. All equivalent structural transformations made by using the contents of the present invention description and drawings under the inventive concept of the present invention, or direct / indirect application in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A method for controlling a shunt test device, characterized in that: The shunt testing device includes a power module, a drive assembly, and a plurality of first electrode guide rods, wherein the first ends of the plurality of first electrode guide rods are connected in parallel to the power module. The method includes: Step S100: obtaining a test instruction, and determining a current to be measured according to the test instruction; Step S200: Control the driving assembly to drive the second ends of at least two of the first electrode guide rods to abut against two ends of the shunt to be measured; Step S300, controlling the power supply module to output the current to be measured through the plurality of first electrode guide rods abutting against both ends of the shunt to be measured to flow through the shunt to be measured; Step S400: obtaining a detection current output by the shunt, and determining the performance of the shunt to be tested based on the detection current and the current to be tested; Wherein, the step S200 further includes: Step S240: Select at least two symmetrical conductor groups from the plurality of first electrode rods; wherein the symmetrical conductor groups include two first electrode rods, and when the second ends of the two first electrode rods are respectively abutted against the shunt to be measured, the second ends of the two first electrode rods are symmetrical with respect to the central axis of the shunt to be measured; Step S250: Control the driving assembly to drive at least two of the symmetrical conductor groups to move so that the second ends of the first electrode rods in the symmetrical conductor groups abut against the two ends of the shunt to be measured.

2. The control method of the shunt test device according to claim 1, wherein: The step S200 specifically includes: Step S210: obtaining the current value of the current to be measured; Step S220: According to the current value, select a corresponding number of second ends of the first electrode guide rods to abut against two ends of the shunt to be measured.

3. The control method of the shunt test device according to claim 1, wherein: The shunt to be tested includes a current sensing component and a first conductive portion and a second conductive portion respectively provided on both sides of the current sensing component. Step S100 further includes: Step S110: determining a test position according to the test instruction; The step S200 further includes: Step S230: According to the test position, control the driving assembly to drive the second ends of at least two of the first electrode guide rods to abut against positions corresponding to the first conductive portion and the second conductive portion of the shunt to be tested.

4. The control method of the shunt test device according to claim 3, wherein: The first conductive portion and the second conductive portion are provided with mounting holes, and the step S230 specifically includes: According to the test position, the driving assembly is controlled to drive the second ends of at least two of the first electrode guide rods to abut against the position adjacent to the mounting hole on the first conductive part of the shunt to be tested and / or abut against the position adjacent to the mounting hole on the second conductive part of the shunt to be tested.

5. The control method of the shunt test device according to claim 4, wherein: The step S230 further includes: According to the test position, the driving assembly is controlled to drive the second ends of at least two of the first electrode guide rods to abut against a position on the first conductive part of the shunt to be tested away from the mounting hole and / or abut against a position on the second conductive part of the shunt to be tested away from the mounting hole.

6. The control method for a shunt test device according to any one of claims 1 to 5, characterized in that: The shunt testing device further includes at least one second electrode guide rod, which is drivingly connected to the driving assembly; a temperature sensor is provided at one end of the second electrode guide rod. Between step S100 and step S400, the method further includes: Step S500: Control the driving assembly to drive the second electrode guide rod to move so that the temperature sensor on the second electrode guide rod is close to the shunt to be tested; The step S400 specifically includes: Step S410: Acquire the detection temperature output by the temperature sensor, and determine the performance of the shunt to be tested according to the detection temperature.

7. The control method of the shunt test device according to claim 6, characterized in that: The step S500 specifically includes: The control driving component drives the second electrode guide rod to move so that the temperature sensor on the second electrode guide rod is close to the shunt to be tested and away from the first electrode guide rod abutting against the shunt to be tested.

8. A control device, characterized in that: The control device is used for the shunt testing device, and the control device includes: Memory; processor; and, A shunt test device control program stored on the memory and executed by the processor, wherein when the control program is executed by the processor, the shunt test device control method according to any one of claims 1 to 7 is implemented.

9. A shunt testing device, characterized in that: The shunt testing device comprises a power supply module, a driving assembly, a plurality of first electrode guide rods, at least one second electrode guide rod and the control device according to claim 8; The first ends of the plurality of first electrode guide rods are all connected in parallel to the power module; and the second ends of the second electrode guide rods are provided with temperature sensors.

Images