Test equipment prioritization methods, media and equipment

Abstract

The present application relates to the field of equipment testing technology, and in particular to a method, medium and device for determining the priority of a test device. The method comprises: receiving a key test instruction uploaded by any test device, obtaining key skills and corresponding skill requirement information, obtaining a historical test instruction matrix Z; then obtaining a scoring matrix ZD; according to ZD, obtaining a sub-priority list P; if P x If the value is less than or equal to the preset sub-priority threshold, then P is obtained. x Corresponding associated preset skill list PG x According to PG x and ZD, get the associated preset skill sub-priority list PGA x If P x 0 >P x , then P x Replace with P x 0 ; According to P, the test device priority Y is obtained; and the order of issuing the corresponding target test instructions is determined according to Y. The present application can detect problems of the device under test in advance, so that the entire test process can be carried out in an orderly manner.

Description

Background Art

[0002] When conducting attack tests or other tests on vehicles or some smart furniture, it is usually necessary to use test equipment to directly connect to the hardware and software of the device under test for targeted testing. That is, the tester needs to use the test equipment near the device under test for testing, and there are corresponding restrictions on the site and test distance. In some special cases, if it is inconvenient for the tester to conduct near-field testing, he or she will choose to use a virtual machine for remote testing. When using a virtual machine for remote testing, the virtual machine is directly controlled to connect to the components of the device under test for testing. Therefore, when multiple testers remotely access the same component of the same virtual machine at the same time, it may cause resource competition problems and affect the test accuracy and test efficiency. In summary, there is an urgent need for a remote testing method that can reasonably allocate test resources and improve test efficiency. Summary of the invention

[0003] The technical problem to be solved by this application is: how to reasonably allocate test resources and improve test efficiency.

[0004] In view of the above technical problems, according to the first aspect of the present application, a method for determining the priority of a test device is provided, which is applied to a cloud platform of a remote test system: the cloud platform is provided with a temporary storage list of key test instructions; the temporary storage list of key test instructions is used to store a test device priority list corresponding to each key test instruction; the key test instruction is a target test instruction corresponding to a non-virtual object and corresponding to at least two test devices to be tested; each test device corresponds to a tester; the method comprises:

[0005] S110, in response to receiving a key test instruction uploaded by any test device, obtaining each key skill corresponding to the key test instruction;

[0006] S120, obtaining the skill requirement information corresponding to each completed historical test instruction of the tester corresponding to the test device to obtain a historical test instruction matrix Z; Z meets the following requirements:

[0007]

[0008] Wherein, i=1, 2, ..., n; n is the number of preset skills; j=1, 2, ..., m; m is the number of historical test instructions completed by the tester corresponding to the test device; Z ji The requirement information of the i-th preset skill corresponding to the j-th completed historical test instruction of the tester corresponding to the test device; Z ji =0 or Z ji =1;

[0009] S130, obtaining the historical instruction scores D1, D2, ..., D corresponding to each completed historical test instruction of the tester corresponding to the test device. j , ..., D m , to get the scoring matrix ZD; D j Score the historical instruction corresponding to the jth completed historical test instruction of the tester corresponding to the test device; where ZD meets the following requirements:

[0010]

[0011] Among them, ZD ji Z ji The skill score of the corresponding preset skill; ZD ji =Z ji ×D j ;

[0012] S140, according to each skill score corresponding to each preset skill in ZD that is the same as the key skill, obtain a sub-priority list P for each preset skill that is the same as the key skill = (P1, P2, ..., P x , ..., P y ); x = 1, 2, ..., y; y ≤ n; y is the number of preset skills in Z that correspond to the key skills; P x is the sub-priority of the xth preset skill in ZD that corresponds to the same key skill; P x =(Σ j＝1 m ZD jx ) / m;

[0013] S150, if P x If the value is less than or equal to the preset sub-priority threshold, the P is obtained according to the preset associated skill mapping table. x Corresponding associated preset skill list PG x =(PG x1 , P.G. x2 , ..., PG xp , ..., PG xf(x) ); p = 1, 2, ..., f(x); where f(x) is P x The number of corresponding associated preset skills; PG xp P x The corresponding p-th associated preset skill; the preset associated skill mapping table includes each preset skill and each associated preset skill corresponding thereto;

[0014] S160, according to PG x and ZD, get the associated preset skill sub-priority list PGA x =(PGAx1 , PGA x2 , ..., PGA xp , ..., PGA xf(x) );

[0015] S170, if P x 0 >P x , then P x Replace with P x 0 ;P x 0 Meet the following conditions: P x 0 =(Σ p＝1 f(x) PGA xp ) / f(x);

[0016] S180: According to P, obtain the test device priority Y of the test device for the key test instruction; Y meets the following conditions:

[0017] Y=Σ x＝1 y P x ;

[0018] S190, determining the order of issuing the corresponding target test instructions according to Y.

[0019] According to a second aspect of the present application, a non-transitory computer-readable storage medium is provided, in which at least one instruction or at least one program is stored, and the at least one instruction or at least one program is loaded and executed by a processor to implement the above-mentioned test device priority determination method.

[0020] According to a third aspect of the present application, there is provided an electronic device comprising a processor and the above-mentioned non-transitory computer-readable storage medium.

[0021] This application has at least the following beneficial effects:

[0022] The method for determining the priority of a test device provided in the present application first obtains the skill requirement information corresponding to each completed historical test instruction of the tester corresponding to the test device. Then, when the tester corresponding to the test device completes each historical test instruction, each historical test instruction has a corresponding score. Here, the higher the score of a historical test instruction, the higher the proficiency or the more proficient the tester corresponding to the test device may be in the preset skill corresponding to the historical test instruction with a higher score; therefore, a scoring matrix is ​​obtained based on the historical instruction scores corresponding to each historical test instruction. In ZD, each skill score corresponding to the preset skill that is the same as each key skill is selected, and then the sub-priority of each preset skill that is the same as the key skill is obtained. Here, P x The larger the value is, the higher the proficiency or mastery of the preset skill of the tester may be, and the frequency of use of the preset skill in historical test instructions may be higher.

[0023] The sub-priorities corresponding to the preset skills with the same key skills are summed to obtain the test equipment priority for the key test instruction. That is, the higher the test equipment priority of the key test instruction, the higher the proficiency or proficiency of the test personnel corresponding to the test equipment for the majority of skills required for the key test instruction may be. In this embodiment, the larger Y is, the earlier the target test instruction of the test equipment corresponding to Y is issued to the industrial control equipment, and then the corresponding non-virtual object is tested. In this embodiment, due to the non-virtual object, only one test equipment can be supported for testing at a time. Therefore, if there are multiple test equipments for the same target test task, that is, when testing the same non-virtual object, they need to be tested in sequence. Therefore, according to the skill requirements corresponding to each completed historical test task of the test personnel corresponding to each test equipment, and the historical instruction score of each completed historical test task, the proficiency or proficiency of the test personnel for each preset skill is evaluated. Then, according to each key skill corresponding to the key test instruction, the corresponding skill sub-priority is obtained in ZD, and finally the sum is obtained to obtain the test equipment priority for the key test instruction. This application comprehensively calculates the priority of each test equipment test target test task based on the proficiency or mastery of each key skill of the tester corresponding to each test equipment. Testers with higher proficiency or mastery of the skills required for the target test task are given priority for testing, which can detect problems of the equipment under test early and enable the entire test process to proceed in an orderly manner. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0025] Figure 1 A flowchart of a method for determining test device priority according to an embodiment of the present application;

[0026] Figure 2 A structural block diagram of a remote testing system provided in one embodiment of the present application. DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of this application.

[0028] like Figure 1 As shown, a method for determining the priority of a test device is provided according to an embodiment of the present application, which is applied to a cloud platform of a remote testing system: the cloud platform is provided with a temporary storage list of key test instructions; the temporary storage list of key test instructions is used to store a test device priority list corresponding to each key test instruction; the key test instruction is a target test instruction in which the corresponding target test object is a non-virtual object and the corresponding test devices to be tested are at least two; each test device corresponds to a tester.

[0029] Specifically, the industrial control equipment can be a risk control sandbox, which is set within a preset distance range of the location of the device under test, and the device under test can be an IoT device such as a vehicle or home appliance. The cloud platform, as a medium for information transmission, receives the target test instructions sent by each test device, and sends each target test instruction to the industrial control equipment according to the preset rules.

[0030] Each target test instruction has a corresponding target test object; the target test object includes a virtual object and a non-virtual object; the virtual object is obtained by virtualizing the corresponding virtualizable real object according to the Docker virtualization technology; the virtual object is connected to the virtual machine; the same virtualizable real object can generate multiple corresponding virtual objects at the same time; the non-virtual object is a real object that cannot be virtualized; the non-virtual object is connected to the industrial control equipment.

[0031] In addition, the target test object includes virtual objects and non-virtual objects, wherein the virtual objects are obtained by virtualizing the corresponding virtualizable real objects according to the Docker virtualization technology. It should be noted that some components in the device to be tested interact frequently with other components, or the interfaces are too complex, and it is difficult to realize the virtualization of such components, because, in this embodiment, such components are used as non-virtual objects, that is, the components themselves are connected to the virtual machine to realize the test of non-virtual objects; on the contrary, for components with fewer interfaces and lower interaction frequency, in this embodiment, the corresponding virtualizable real objects are virtualized based on the lightweight Docker virtualization technology. The Docker virtualization technology has a corresponding operating environment, and can directly call the hardware in the industrial control equipment for processing, and run the pod in the Docker container to realize the virtualization of some components. Its operation is simple, the volume is small, and a pod can run in multiple Docker containers at the same time, that is, in this embodiment, for the same virtualizable real object, multiple corresponding virtualized objects can be generated at the same time, and then for the same virtualizable real object, it can support simultaneous testing of multiple test devices, and each test device corresponds to a virtual object running in Docker. For non-virtual objects, only one test device can be tested at a time.

[0032] In another embodiment, the real object may also be virtualized using kvm, qemu host virtualization and lxc user space virtualization technologies.

[0033] The method comprises:

[0034] S110, in response to receiving a key test instruction uploaded by any test device, obtaining each key skill corresponding to the key test instruction.

[0035] Specifically, each target test instruction has its corresponding required skills, that is, the skills needed to complete the target test instruction. As an example, the skills may include: network and protocol skills, operating system skills, security tool usage skills, code auditing skills, etc.

[0036] S120, obtaining the skill requirement information corresponding to each completed historical test instruction of the tester corresponding to the test device to obtain a historical test instruction matrix Z; Z meets the following requirements:

[0037]

[0038] Wherein, i=1, 2, ..., n; n is the number of preset skills; j=1, 2, ..., m; m is the number of historical test instructions completed by the tester corresponding to the test device; Z jiThe requirement information of the i-th preset skill corresponding to the j-th completed historical test instruction of the tester corresponding to the test device; Z ji =0 or Z ji =1.

[0039] Specifically, the skill requirement information corresponding to each completed historical test instruction of the tester corresponding to the test device is obtained. Here, the preset skill can be each preset skill included in the preset skill library. In one embodiment, Z ji =0 means that the jth completed historical test instruction of the tester corresponding to the test device does not need to apply the ith preset skill; Z ji =1 indicates that the jth completed historical test instruction of the tester corresponding to the test device requires the application of the ith preset skill. According to Z, the skill requirement corresponding to each completed historical test instruction of the tester corresponding to the test device can be obtained.

[0040] S130, obtaining the historical instruction scores D1, D2, ..., D corresponding to each completed historical test instruction of the tester corresponding to the test device. j , ..., D m , to get the scoring matrix ZD; D j Score the historical instruction corresponding to the jth completed historical test instruction of the tester corresponding to the test device; where ZD meets the following requirements:

[0041]

[0042] Among them, ZD ji Z ji The skill score of the corresponding preset skill; ZD ji =Z ji ×D j .

[0043] Specifically, when the tester corresponding to the test device completes each historical test instruction, each historical test instruction has a corresponding score. Here, the higher the score of a historical test instruction, the higher the proficiency or the more proficient the tester corresponding to the test device may be in the preset skill corresponding to the historical test instruction with a higher score; therefore, a scoring matrix is ​​obtained according to the historical instruction score corresponding to each historical test instruction.

[0044] S140, according to each skill score corresponding to each preset skill in ZD that is the same as the key skill, obtain a sub-priority list P for each preset skill that is the same as the key skill = (P1, P2, ..., P x , ..., P y); x = 1, 2, ..., y; y ≤ n; y is the number of preset skills in Z that correspond to the key skills; P x is the sub-priority of the xth preset skill in ZD that corresponds to the same key skill; P x =(Σ j＝1 m ZD jx ) / m.

[0045] Specifically, each skill score corresponding to the preset skill that is the same as each key skill is selected in ZD, and then the sub-priority of each preset skill that is the same as the key skill is obtained. x The larger the value is, the higher the proficiency or mastery of the preset skill of the tester may be, and the frequency of use of the preset skill in historical test instructions may be higher.

[0046] S150, if P x If the value is less than or equal to the preset sub-priority threshold, the P is obtained according to the preset associated skill mapping table. x Corresponding associated preset skill list PG x =(PG x1 , P.G. x2 , ..., PG xp , ..., PG xf(x) ); p = 1, 2, ..., f(x); where f(x) is P x The number of corresponding associated preset skills; PG xp P x The corresponding p-th associated preset skill; the preset associated skill mapping table includes each preset skill and each associated preset skill corresponding to it.

[0047] Specifically, if P x If the sub-priority threshold is less than or equal to the preset sub-priority threshold, it means that the P in the current key test instruction is x For the corresponding key skills, the test personnel corresponding to the test equipment have used them in each historical test instruction or have used them very rarely or have a very low demand ratio. In order to determine the sub-priorities of these key skills, their corresponding related skills are obtained. This is because skills may be related to each other, and knowledge systems and operating procedures may be partially interconnected. Therefore, their corresponding sub-priorities can be determined based on their related skills.

[0048] S160, according to PG x and ZD, get the associated preset skill sub-priority list PGA x =(PGA x1 , PGA x2 , ..., PGA xp, ..., PGA xf(x) ).

[0049] S170, if P x 0 >P x , then P x Replace with P x 0 ;P x 0 Meet the following conditions: P x 0 =(Σ p＝1 f(x) PGA xp ) / f(x).

[0050] Specifically, obtain P x The average of the sub-priorities of each associated skill of the corresponding key skill, if it is greater than P x , then replace it, and the resulting P x The sub-priorities are more precise.

[0051] S180: According to P, obtain the test device priority Y of the test device for the key test instruction; Y meets the following conditions:

[0052] Y=Σ x＝1 y P x .

[0053] S190, determining the order of issuing the corresponding target test instructions according to Y.

[0054] Specifically, the sub-priorities corresponding to the preset skills with the same key skills are summed to obtain the test equipment priority for the key test instruction. That is, the higher the test equipment priority of the key test instruction, the higher the proficiency or the more proficient the tester corresponding to the test equipment may be in most of the skills required for the key test instruction. In this embodiment, the larger Y is, the earlier the target test instruction of the test equipment corresponding to Y is issued to the industrial control equipment, and then the corresponding non-virtual object is tested. In this embodiment, due to the non-virtual object, only one test equipment can be supported for testing at a time. Therefore, if there are multiple test equipment for the same target test task, that is, when testing the same non-virtual object, they need to be tested in sequence. Therefore, the proficiency or mastery of the tester for each preset skill is evaluated according to the skill requirements corresponding to each completed historical test task of the tester corresponding to each test equipment, and the historical instruction score of each completed historical test task. Then, according to each key skill corresponding to the key test instruction, the corresponding skill sub-priority is obtained in ZD, and if P xIf the sub-priority threshold is less than or equal to the preset sub-priority threshold, it means that the P in the current key test instruction is x The corresponding key skills, the test personnel corresponding to the test equipment have all been used or used very rarely in each historical test instruction, or the proportion of the demand occupied by them is very low. In order to determine the sub-priorities of these key skills, the corresponding associated skills are obtained. This is because there may be an association between skills, and the knowledge system and operation process may be partially interoperable. Therefore, the corresponding sub-priorities can be determined according to their associated skills. Finally, the sum is obtained to obtain the test equipment priority for the key test instruction. This embodiment is based on the proficiency or mastery of each key skill of the test personnel corresponding to each test equipment, and replaces the preset skills that are less than or equal to the preset sub-priority threshold by the sub-priority corresponding to the associated skills. Then the priority of the test target test task of each test equipment is comprehensively calculated. Test personnel with higher proficiency or mastery of the skills required for the target test task are given priority to test, which can discover problems with the equipment to be tested early, so that the entire test process can be carried out in an orderly manner, and the efficiency of remote testing is improved.

[0055] In an exemplary embodiment of the present application, Figure 2 As shown, the remote testing system further includes an industrial control device and at least one testing device; the industrial control device is arranged within a preset distance range of the location of the device to be tested; each of the testing devices is provided with a first processing module; and the industrial control device is provided with a second processing module.

[0056] In this embodiment, as an example, the industrial control device can be a risk control sandbox, which is set within a preset distance range of the location of the device under test, and the device under test can be an IoT device such as a vehicle or a home appliance. The cloud platform serves as a medium for information transmission, which receives the target test instructions sent by each test device; and sends each target test instruction to the industrial control device according to the preset rules.

[0057] The first processing module is used to perform the following steps:

[0058] S210, sending the target test instruction to the cloud platform.

[0059] Specifically, each target test instruction has a corresponding test object. Here, as an example, the test object is a certain hardware of the device to be tested.

[0060] The second processing module is used to perform the following steps:

[0061] S310, in response to receiving a target test instruction issued by the cloud platform for the first time, a target virtual machine is established; each target test instruction has a corresponding target test object; the target test object includes a virtual object and a non-virtual object; the virtual object is obtained by virtualizing the corresponding virtualizable real object according to the Docker virtualization technology; the same virtualizable real object can generate multiple corresponding virtualized objects at the same time; the virtual object is connected to the virtual machine; the non-virtual object is a real object that cannot be virtualized; the non-virtual object is connected to the industrial control equipment.

[0062] Specifically, when the second processing module of the industrial control device first receives the target test instruction issued by the cloud platform, a target virtual machine is established in the industrial control device, and various tools are integrated in the target virtual machine, as well as links (USB, Bluetooth, WiFi, protocols, etc.) connected to the target test object. At this time, for the test device, the target virtual machine is displayed on the test device in the form of a web page; each test device has a corresponding tester, who controls the virtual machine in the industrial control device by operating the web page on the test device.

[0063] In addition, the target test object includes virtual objects and non-virtual objects, wherein the virtual objects are obtained by virtualizing the corresponding virtualizable real objects according to the Docker virtualization technology. It should be noted that some components in the device to be tested interact frequently with other components, or the interfaces are too complex, and it is difficult to realize the virtualization of such components, because, in this embodiment, such components are used as non-virtual objects, that is, the components themselves are connected to the virtual machine to realize the test of non-virtual objects; on the contrary, for components with fewer interfaces and lower interaction frequency, in this embodiment, the corresponding virtualizable real objects are virtualized based on the lightweight Docker virtualization technology. The Docker virtualization technology has a corresponding operating environment, and can directly call the hardware in the industrial control equipment for processing, and run the pod in the Docker container to realize the virtualization of some components. Its operation is simple, the volume is small, and a pod can run in multiple Docker containers at the same time, that is, in this embodiment, for the same virtualizable real object, multiple corresponding virtualized objects can be generated at the same time, and then for the same virtualizable real object, it can support simultaneous testing of multiple test devices, and each test device corresponds to a virtual object running in Docker. For non-virtual objects, only one test device can be tested at a time.

[0064] In this embodiment, according to the actual properties of the components in the device to be tested, some of the virtualizable components are virtualized by lightweight Docker virtualization technology to obtain virtual objects. These virtualizable components can generate multiple virtual objects at the same time, that is, they support multiple test devices to test at the same time. As for some components that frequently interact with other components or have too complex interfaces and are difficult to virtualize, the components themselves are connected to the virtual machine to implement the test of non-virtual objects. In this embodiment, some components are virtualized according to the actual properties of the components in the device to be tested, rather than all of them. On the one hand, the accuracy of the test is guaranteed. On the other hand, since virtual objects can support multi-terminal testing at the same time, the reasonable allocation of test resources is realized, saving test time.

[0065] S320, testing each of the target test objects according to the target virtual machine and each target test instruction, and generating a corresponding target test feedback screen.

[0066] S330, returning the target test feedback screen to the corresponding test device through the cloud platform.

[0067] Specifically, after the test results are generated, the test results are transmitted back to the corresponding test equipment in the form of a target test feedback screen, and the test equipment obtains the test results according to the target test feedback screen. The data corresponding to the target test feedback screen and other test data are stored in the industrial control equipment, thereby avoiding security risks caused by data leakage and maintaining data security.

[0068] In an exemplary embodiment of the present application, the industrial control device further includes a security detection module, and the security detection module is used to perform security detection on each target test instruction.

[0069] Specifically, the present application sets up a security detection module in the industrial control equipment to perform security detection on the data and tools corresponding to each target test instruction.

[0070] In an exemplary embodiment of the present application, the data corresponding to the target test feedback screen is stored in the industrial control device.

[0071] In an exemplary embodiment of the present application, step S130 may be replaced by:

[0072] S1000, obtaining the historical instruction scores D1, D2, ..., D corresponding to each completed historical test instruction. j , ..., D m ; To obtain the scoring matrix ZD; D j Score the historical instruction corresponding to the jth completed historical test instruction of the tester corresponding to the test device; where ZD meets the following requirements:

[0073]

[0074] Among them, ZD ji Z ji The skill score of the corresponding preset skill; ZD ji =Z ji ×D j ×A ji ; A ji Z ji The corresponding preset skill demand ratio value; A ji It is obtained according to a preset demand ratio mapping table; the preset demand ratio mapping table includes a demand degree ratio value of each preset skill relative to each test instruction.

[0075] Specifically, since the importance of each skill to each test instruction may be different, that is, the requirement ratio of each test instruction to each skill may be different, when determining ZD, the requirement ratio value of each test instruction to each skill is taken into consideration, which can better reflect the difference in skill requirements between any two test instructions, thereby making the corresponding score more accurate.

[0076] An embodiment of the present application also provides a computer program product, which includes program code. When the program product is run on an electronic device, the program code is used to enable the electronic device to execute the steps of the method described above in this specification according to various exemplary embodiments of the present application.

[0077] In addition, although the steps of the method in the present disclosure are described in a specific order in the drawings, this does not require or imply that the steps must be performed in this specific order, or that all the steps shown must be performed to achieve the desired results. Additionally or alternatively, some steps may be omitted, multiple steps may be combined into one step, and / or one step may be decomposed into multiple steps, etc.

[0078] Through the description of the above implementation, it is easy for those skilled in the art to understand that the example implementation described here can be implemented by software, or by software combined with necessary hardware. Therefore, the technical solution according to the implementation of the present disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, a USB flash drive, a mobile hard disk, etc.) or on a network, including several instructions to enable a computing device (which can be a personal computer, a server, a mobile terminal, or a network device, etc.) to execute the method according to the implementation of the present disclosure.

[0079] In an exemplary embodiment of the present disclosure, an electronic device capable of implementing the above method is also provided.

[0080] Those skilled in the art will appreciate that various aspects of the present application may be implemented as a system, method or program product. Therefore, various aspects of the present application may be specifically implemented in the following forms, namely: a complete hardware implementation, a complete software implementation (including firmware, microcode, etc.), or a combination of hardware and software, which may be collectively referred to as "circuit", "module" or "system" herein.

[0081] The electronic device according to this embodiment of the present application is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0082] The electronic device is presented in the form of a general-purpose computing device. The components of the electronic device may include, but are not limited to: the at least one processor mentioned above, the at least one storage device mentioned above, and a bus connecting different system components (including storage devices and processors).

[0083] The storage stores program codes, which can be executed by the processor, so that the processor executes the steps described in the above “Exemplary Method” section of this specification according to various exemplary embodiments of the present application.

[0084] The memory may include readable media in the form of volatile memory, such as random access memory (RAM) and / or cache memory, and may further include read only memory (ROM).

[0085] The storage may also include a program / utility having a set (at least one) of program modules, such program modules including but not limited to: an operating system, one or more application programs, other program modules and program data, each of which or some combination may include the implementation of a network environment.

[0086] The bus may represent one or more of several types of bus structures including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus architectures.

[0087] The electronic device can also communicate with one or more external devices (such as keyboards, pointing devices, Bluetooth devices, etc.), and can also communicate with one or more devices that enable users to interact with the electronic device, and / or communicate with any device (such as routers, modems, etc.) that enables the electronic device to communicate with one or more other computing devices. This communication can be carried out through an input / output (I / O) interface. In addition, the electronic device can also communicate with one or more networks (such as local area networks (LANs), wide area networks (WANs) and / or public networks, such as the Internet) through a network adapter. As shown in the figure, the network adapter communicates with other modules of the electronic device through a bus. It should be understood that, although not shown in the figure, other hardware and / or software modules can be used in conjunction with the electronic device, including but not limited to: microcode, device drivers, redundant processors, external disk drive arrays, RAID systems, tape drives, and data backup storage systems, etc.

[0088] Through the description of the above implementation, it is easy for those skilled in the art to understand that the example implementation described here can be implemented by software, or by software combined with necessary hardware. Therefore, the technical solution according to the implementation of the present disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, a USB flash drive, a mobile hard disk, etc.) or on a network, including several instructions to enable a computing device (which can be a personal computer, a server, a terminal device, or a network device, etc.) to execute the method according to the implementation of the present disclosure.

[0089] In an exemplary embodiment of the present disclosure, a computer-readable storage medium is also provided, on which a program product capable of implementing the above method of the present specification is stored. In some possible implementations, various aspects of the present application can also be implemented in the form of a program product, which includes a program code. When the program product is run on a terminal device, the program code is used to enable the terminal device to execute the steps according to various exemplary implementations of the present application described in the above "Exemplary Method" section of the present specification.

[0090] The program product may use any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples of readable storage media (a non-exhaustive list) include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0091] Computer readable signal media may include data signals propagated in baseband or as part of a carrier wave, in which readable program code is carried. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. Readable signal media may also be any readable medium other than a readable storage medium, which may send, propagate, or transmit a program for use by or in conjunction with an instruction execution system, apparatus, or device.

[0092] The program code embodied on the readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wired, optical cable, RF, etc., or any suitable combination of the foregoing.

[0093] Program code for performing the operations of the present application may be written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Java, C++, etc., and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as a separate software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server. In the case of a remote computing device, the remote computing device may be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computing device (e.g., via the Internet using an Internet service provider).

[0094] In addition, the above-mentioned figures are only schematic illustrations of the processes included in the method according to the exemplary embodiments of the present application, and are not intended to be limiting. It is easy to understand that the processes shown in the above-mentioned figures do not indicate or limit the time sequence of these processes. In addition, it is also easy to understand that these processes can be performed synchronously or asynchronously, for example, in multiple modules.

[0095] It should be noted that, although several modules or units of the device for action execution are mentioned in the above detailed description, this division is not mandatory. In fact, according to the embodiments of the present disclosure, the features and functions of two or more modules or units described above can be embodied in one module or unit. On the contrary, the features and functions of one module or unit described above can be further divided into multiple modules or units to be embodied.

[0096] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed in the present application should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A method for determining test equipment priority, characterized in that: A cloud platform applied to a remote test system: the cloud platform is provided with a temporary storage list of key test instructions; the temporary storage list of key test instructions is used to store a priority list of test devices corresponding to each key test instruction; the target test object of the key test instruction is a non-virtual object, and the key test instruction has at least two test devices; Each test device corresponds to a tester; the method comprises: S110, in response to receiving a key test instruction uploaded by any test device, obtaining each key skill corresponding to the key test instruction; S120, obtaining the skill requirement information corresponding to each completed historical test instruction of the tester corresponding to the test device to obtain a historical test instruction matrix Z; Z meets the following requirements: Where i=1, 2, ..., n; n is the number of preset skills; j=1, 2, ..., m; m is the number of historical test instructions completed by the tester corresponding to the test device; Z ji The requirement information of the i-th preset skill corresponding to the j-th completed historical test instruction of the tester corresponding to the test device; Z ji =0 or Z ji =1; S130, obtaining the historical instruction scores D1, D2, ..., D corresponding to each completed historical test instruction of the tester corresponding to the test device. j , ..., D m , to get the scoring matrix ZD; D j Score the historical instruction corresponding to the jth completed historical test instruction of the tester corresponding to the test device; where ZD meets the following requirements: Among them, ZD ji Z ji The skill score of the corresponding preset skill; ZD ji =Z ji ×D j ; S140, according to each skill score corresponding to each preset skill that is the same as the key skill in ZD, obtain a sub-priority list P = (P1, P2, ..., P x , ..., P y ); x = 1, 2, ..., y; y ≤ n; y is the number of preset skills in Z that correspond to the key skills; P x is the sub-priority of the xth preset skill in ZD that is the same as the key skill; P x =(Σ j=1 m ZD jx ) / m; S150, if P x If the value is less than or equal to the preset sub-priority threshold, the P is obtained according to the preset associated skill mapping table. x Corresponding associated preset skill list PG x =(PG x1 , P.G. x2 , ..., PG xp , ..., PG xf(x) ), p = 1, 2, ..., f(x), where f(x) is P x The number of corresponding associated preset skills; PG xp P x The corresponding p-th associated preset skill; the preset associated skill mapping table includes each preset skill and each associated preset skill corresponding thereto; S160, according to PG x and ZD, get the associated preset skill sub-priority list PGA x =(PGA x1 , PGA x2 , ..., PGA xp , ..., PGA xf(x) ); S170, if P x 0 >P x , then P x Replace with P x 0 ;P x 0 Meet the following conditions: P x 0 =(Σ p=1 f(x) PGA xp ) / f(x); S180: According to P, obtain the test device priority Y of the test device for the key test instruction; Y meets the following conditions: Y=S x=1 y P x ; S190, determining the order of issuing the corresponding key test instructions according to Y; Z ji =0 means that the jth completed historical test instruction of the tester corresponding to the test device does not need to apply the ith preset skill; Z ji =1 indicates that the j-th completed historical test instruction of the tester corresponding to the test device requires the application of the i-th preset skill.

2. A non-transitory computer-readable storage medium, wherein at least one instruction or at least one program is stored in the storage medium, characterized in that: The at least one instruction or the at least one program is loaded and executed by a processor to implement the method as claimed in claim 1.

3. An electronic device, characterized in that: The invention comprises a processor and the non-transitory computer-readable storage medium as claimed in claim 2.

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