X-ray source focal spot size determination method, apparatus, electronic device, and storage medium

Abstract

The application discloses an X-ray source focal point size determination method and device, electronic equipment and a storage medium. The method comprises the following steps: acquiring a test profile curve corresponding to a line pair test image; acquiring an ideal profile curve corresponding to a line pair image; performing deconvolution processing based on the test profile curve corresponding to the line pair test image and the ideal profile curve corresponding to the line pair image to obtain a target convolution kernel function curve; and determining the X-ray source focal point size based on the target convolution kernel function curve. Through the deconvolution method, the determination of the target convolution kernel function curve is realized, and then the X-ray source focal point size is determined according to the target convolution kernel function curve, the automatic determination of the focal point size is realized, the determination of the focal point size has a basis, and the accuracy of the focal point size is improved.

Description

Technical Field

[0001] This invention relates to the field of resolution testing technology, and in particular to a method, apparatus, electronic device, and storage medium for determining the focal size of an X-ray source. Background Technology

[0002] Currently, line-pair cards are commonly used for X-ray source focus or resolution testing.

[0003] In existing line-pair card testing methods, the focal point size is mainly determined based on the tester's observation of the pattern, which involves subjectivity and randomness.

[0004] In the process of realizing the present invention, it was found that at least the following technical problems exist in the prior art: the above-mentioned prior art solutions have the problem of low accuracy of focal size. Summary of the Invention

[0005] This invention provides a method, apparatus, electronic device, and storage medium for determining the focal spot size of an X-ray source, thereby improving the accuracy of the focal spot size.

[0006] According to one aspect of the present invention, a method for determining the focal spot size of an X-ray source is provided, comprising:

[0007] Obtain the test profile curve corresponding to the test image of the line pair card;

[0008] Obtain the ideal profile curve corresponding to the line pair card image;

[0009] Based on the test profile curve corresponding to the test image of the line pair card and the ideal profile curve corresponding to the test image of the line pair card, deconvolution processing is performed to obtain the target convolution kernel function curve;

[0010] The X-ray source focal size is determined based on the target convolution kernel function curve.

[0011] According to another aspect of the present invention, an X-ray source focal spot size determination device is provided, comprising:

[0012] The test profile curve acquisition module is used to acquire the test profile curve corresponding to the test image of the line pair card;

[0013] The ideal profile curve acquisition module is used to acquire the ideal profile curve corresponding to the line pair card image;

[0014] The curve deconvolution processing module is used to perform deconvolution processing based on the test profile curve corresponding to the test image of the line pair card and the ideal profile curve corresponding to the test image of the line pair card to obtain the target convolution kernel function curve.

[0015] The X-ray source focal size determination module is used to determine the X-ray source focal size based on the target convolution kernel function curve.

[0016] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0017] At least one processor;

[0018] and a memory communicatively connected to the at least one processor;

[0019] The memory stores a computer program that can be executed by the at least one processor, which is then executed by the at least one processor to enable the at least one processor to perform the X-ray source focal size determination method according to any embodiment of the present invention.

[0020] According to another aspect of the present invention, a computer-readable storage medium is provided, the computer-readable storage medium storing computer instructions for causing a processor to execute and implement the X-ray source focal size determination method according to any embodiment of the present invention.

[0021] The technical solution of this invention uses a deconvolution method to determine the target convolution kernel function curve, and then determines the X-ray source focal size based on the target convolution kernel function curve, thus realizing the automatic determination of the focal size, making the determination of the focal size reliable and improving the accuracy of the focal size.

[0022] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0023] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0024] Figure 1 This is a flowchart of a method for determining the focal size of an X-ray source according to Embodiment 1 of the present invention;

[0025] Figure 2 This is a schematic diagram of a line-to-card test image provided in an embodiment of the present invention;

[0026] Figure 3 A schematic diagram of a test profile curve provided in an embodiment of the present invention;

[0027] Figure 4This is a schematic diagram of a line-to-card image provided in an embodiment of the present invention;

[0028] Figure 5 A schematic diagram of an ideal cross-sectional curve provided in an embodiment of the present invention;

[0029] Figure 6 This is a schematic diagram of a line-pair pattern convolution provided in an embodiment of the present invention;

[0030] Figure 7 This is a flowchart of a method for determining the focal size of an X-ray source according to Embodiment 2 of the present invention;

[0031] Figure 8 This is a schematic diagram of an X-ray source focal spot size determination device according to Embodiment 3 of the present invention;

[0032] Figure 9 This is a schematic diagram of the structure of an electronic device that implements the X-ray source focal spot size determination method of the present invention. Detailed Implementation

[0033] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0034] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be used interchangeably where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or device that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or devices. The acquisition, storage, use, and processing of data in the technical solutions of this application all comply with the relevant provisions of national laws and regulations.

[0035] Example 1

[0036] Figure 1This is a flowchart of a method for determining the focal size of an X-ray source according to Embodiment 1 of the present invention. This embodiment is applicable to the automatic determination of the focal size of an X-ray source. This method can be executed by an X-ray source focal size determining device, which can be implemented in hardware and / or software and can be configured in a computer terminal. Figure 1 As shown, the method includes:

[0037] S110. Obtain the test profile curve corresponding to the test image of the line pair card.

[0038] In this embodiment, the line-pair test image refers to the image acquired by a focal testing device. This device may include, but is not limited to, an X-ray source, a line-pair card, and a detector. The X-ray source, line-pair card, and detector are installed in parallel, meaning that X-rays emitted by the X-ray source irradiate the line-pair card and form a line-pair test image on the detector. The test profile curve is a curve characterizing the change in grayscale value in the line-pair test image with distance or pixels. It can be simulated based on the grayscale value of each pixel in the line-pair test image. For example, Figure 2 This is a schematic diagram of a line-to-card test image provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of a test profile curve provided in an embodiment of the present invention.

[0039] Optionally, obtaining the test profile curve corresponding to the line pair test image includes: obtaining the grayscale value of each pixel in the line pair test image; and generating the test profile curve corresponding to the line pair test image based on the grayscale value of each pixel in the line pair test image.

[0040] Specifically, the grayscale value of each row of pixels in the line-pair test image is determined; a multi-row average is performed based on the grayscale values ​​of each row of pixels in the line-pair test image; and a test profile curve corresponding to the line-pair test image is generated based on the multi-row average result, where the horizontal axis of the test profile curve represents pixels, and the vertical axis represents grayscale values. For example, Figure 2 This is a schematic diagram of a line-to-card test image provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of a test profile curve provided in an embodiment of the present invention, wherein Distance / pixels represents distance / pixel and Gray Value represents grayscale value.

[0041] S120. Obtain the ideal profile curve corresponding to the line pair card image.

[0042] Among them, the line pair card image refers to the ideal line pair image on the detector. The ideal profile curve is a curve that characterizes the change of gray value in the line pair card image with distance or pixel, which can be simulated based on relevant parameters such as the detector's pixel size, number of line pairs, line width, and line spacing.

[0043] Optionally, obtaining the ideal profile curve corresponding to the line pair card image includes: obtaining the detector's pixel size, number of line pairs, line width, and line spacing; generating the ideal profile curve corresponding to the line pair card image based on the detector's pixel size, number of line pairs, line width, and line spacing, wherein the horizontal axis of the ideal profile curve represents pixels, and the vertical axis represents grayscale values. For example, Figure 4 This is a schematic diagram of a line-to-card image provided in an embodiment of the present invention; Figure 5 This is a schematic diagram of an ideal profile curve provided in an embodiment of the present invention, wherein the pixel size can be used to determine the scaling ratio of the ideal profile curve, the number of line pairs can be used to determine the number of peaks in the ideal profile curve, the line width can be used to determine the width of the peaks, and the line spacing can be used to determine the distance between the peaks.

[0044] S130. Based on the test profile curve corresponding to the test image of the line pair card and the ideal profile curve corresponding to the test image of the line pair card, perform deconvolution processing to obtain the target convolution kernel function curve.

[0045] The target convolution kernel function curve refers to the optimal convolution kernel function curve that characterizes the focal image.

[0046] For example, Figure 6 This is a schematic diagram of line-pair pattern convolution provided by an embodiment of the present invention. Specifically, in X-ray detection imaging, there exists a relationship that the convolution of the line-pair card image and the focal image equals the line-pair card test image. Based on the above relationship, it can be known that the convolution of the ideal profile curve and the convolution kernel function curve equals the test profile curve. Therefore, in this embodiment of the present invention, the target convolution kernel function curve can be obtained by performing deconvolution processing on the test profile curve corresponding to the line-pair card test image and the ideal profile curve corresponding to the line-pair card image.

[0047] S140. Determine the X-ray source focal size based on the target convolution kernel function curve.

[0048] The focal size of an X-ray source can be used to evaluate the resolution level of an X-ray source.

[0049] Specifically, Gaussian fitting can be performed on the target convolution kernel function curve to obtain the corresponding Gaussian fitting curve, and then the X-ray source focal size can be determined based on the corresponding Gaussian fitting curve.

[0050] The technical solution of this invention uses a deconvolution method to determine the target convolution kernel function curve, and then determines the X-ray source focal size based on the target convolution kernel function curve, thus realizing the automatic determination of the focal size, making the determination of the focal size reliable and improving the accuracy of the focal size.

[0051] Example 2

[0052] Figure 7 This is a flowchart of a method for determining the focal size of an X-ray source according to Embodiment 2 of the present invention. The method of this embodiment can be combined with various optional schemes in the X-ray source focal size determination method provided in the above embodiments. The X-ray source focal size determination method provided in this embodiment has been further optimized. Optionally, determining the X-ray source focal size based on the target convolution kernel function curve includes: performing Gaussian fitting on the target convolution kernel function curve to obtain a Gaussian fitting curve corresponding to the target convolution kernel function curve; and determining the X-ray source focal size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0053] like Figure 7 As shown, the method includes:

[0054] S210. Obtain the test profile curve corresponding to the test image of the line pair card.

[0055] S220. Obtain the ideal profile curve corresponding to the line pair card image.

[0056] S230. Based on the test profile curve corresponding to the test image of the line pair card and the ideal profile curve corresponding to the test image of the line pair card, perform deconvolution processing to obtain the target convolution kernel function curve.

[0057] S240. Perform Gaussian fitting on the target convolution kernel function curve to obtain the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0058] S250. Determine the X-ray source focal size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0059] Specifically, determining the X-ray source focal size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve includes: using the half-width at half-maximum (WHM) of the Gaussian fitting curve corresponding to the target convolution kernel function curve as the X-ray source focal size.

[0060] Here, half-width at half maximum (FWHM) refers to the full width at half maximum (FWHM) of the Gaussian fitted curve.

[0061] Optionally, before obtaining the test profile curve corresponding to the line pair test image, the method further includes: importing the initial line pair test image; and obtaining the line pair test image in response to the user's selection operation on the initial line pair test image.

[0062] The initial line-pair test image refers to the line-pair image projected onto the detector plane, and the line-pair test image is the area selected by the user from the initial line-pair test image.

[0063] The technical solution of this invention obtains the Gaussian fitting curve corresponding to the target convolution kernel function curve by performing Gaussian fitting on the target convolution kernel function curve, and then determines the X-ray source focal size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve, thereby realizing the automatic determination of the focal size, making the determination of the focal size reliable, and improving the accuracy of the focal size.

[0064] Example 3

[0065] Figure 8 This is a schematic diagram of an X-ray source focal spot size determination device provided in Embodiment 3 of the present invention. Figure 8 As shown, the device includes:

[0066] The test profile curve acquisition module 310 is used to acquire the test profile curve corresponding to the test image of the line pair card.

[0067] The ideal profile curve acquisition module 320 is used to acquire the ideal profile curve corresponding to the line pair card image;

[0068] The curve deconvolution processing module 330 is used to perform deconvolution processing based on the test profile curve corresponding to the test image of the line pair card and the ideal profile curve corresponding to the test image of the line pair card to obtain the target convolution kernel function curve.

[0069] The X-ray source focal size determination module 340 is used to determine the X-ray source focal size based on the target convolution kernel function curve.

[0070] The technical solution of this invention uses a deconvolution method to determine the target convolution kernel function curve, and then determines the X-ray source focal size based on the target convolution kernel function curve, thus realizing the automatic determination of the focal size, making the determination of the focal size reliable and improving the accuracy of the focal size.

[0071] In some alternative implementations, the test profile curve acquisition module 310 includes:

[0072] The pixel grayscale value acquisition unit is used to acquire the grayscale value of each pixel in the test image of the line pair card;

[0073] The test profile curve generation unit is used to generate a test profile curve corresponding to the test image of the line pair card based on the grayscale value of each pixel in the test image of the line pair card.

[0074] In some alternative implementations, the test profile curve generation unit can also be used for:

[0075] Determine the grayscale value of each row of pixels in the test image of the line pair card;

[0076] The grayscale values ​​of each row of pixels in the test image of the line pair card are averaged across multiple rows, and a test profile curve corresponding to the test image of the line pair card is generated based on the multi-row averaging results. The horizontal axis of the test profile curve is pixels, and the vertical axis of the test profile curve is grayscale values.

[0077] In some alternative implementations, the ideal profile curve acquisition module 320 may also be used for:

[0078] Obtain the detector's pixel size, number of line pairs, line width, and line spacing;

[0079] An ideal profile curve is generated based on the pixel size, number of line pairs, line width, and line spacing of the detector, corresponding to the line pair card image. The horizontal axis of the ideal profile curve is pixels, and the vertical axis is grayscale value.

[0080] In some alternative implementations, the X-ray source focal spot size determination module 340 includes:

[0081] A Gaussian fitting unit is used to perform Gaussian fitting on the target convolution kernel function curve to obtain the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0082] The focal size extraction unit is used to determine the focal size of the X-ray source based on the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0083] In some alternative implementations, the focus size extraction unit may also be used for:

[0084] The half-width at half-maximum (WHM) of the Gaussian fitting curve corresponding to the target convolution kernel function curve is used as the focal point size of the X-ray source.

[0085] In some alternative embodiments, the X-ray source focal spot size determination device includes:

[0086] The initial line pair card test image import module is used to import the initial line pair card test image;

[0087] The line-pair test image selection module is used to obtain the line-pair test image in response to the user's selection operation on the initial line-pair test image.

[0088] The X-ray source focal size determination device provided in the embodiments of the present invention can execute the X-ray source focal size determination method provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of executing the method.

[0089] Example 4

[0090] Figure 9 A schematic diagram of an electronic device 10 that can be used to implement embodiments of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0091] like Figure 9 As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded into the RAM 13 from storage unit 18. The RAM 13 can also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An I / O interface 15 is also connected to the bus 14.

[0092] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0093] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as the X-ray source focal size determination method, which includes:

[0094] Obtain the test profile curve corresponding to the test image of the line pair card;

[0095] Obtain the ideal profile curve corresponding to the line pair card image;

[0096] Based on the test profile curve corresponding to the test image of the line pair card and the ideal profile curve corresponding to the test image of the line pair card, deconvolution processing is performed to obtain the target convolution kernel function curve;

[0097] The X-ray source focal size is determined based on the target convolution kernel function curve.

[0098] In some embodiments, the X-ray source focal size determination method may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or mounted on electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the X-ray source focal size determination method described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the X-ray source focal size determination method by any other suitable means (e.g., by means of firmware).

[0099] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), system-on-a-chip (SoCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0100] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0101] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0102] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0103] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0104] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0105] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0106] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A method for determining the focal spot size of an X-ray source, characterized in that, include: Obtain the test profile curve corresponding to the test image of the line pair card; Obtain the ideal profile curve corresponding to the line pair card image; Based on the test profile curve corresponding to the test image of the line pair card and the ideal profile curve corresponding to the test image of the line pair card, deconvolution processing is performed to obtain the target convolution kernel function curve; The X-ray source focal size is determined based on the target convolution kernel function curve; The step of determining the X-ray source focal size based on the target convolution kernel function curve includes: Gaussian fitting is performed on the target convolution kernel function curve to obtain the corresponding Gaussian fitting curve. The half-width at half maximum (WHM) of the Gaussian fitting curve corresponding to the target convolution kernel function curve is used as the focal point size of the X-ray source; wherein, the WHM is the full width at half maximum (FWHM) of the Gaussian fitting curve.

2. The method according to claim 1, characterized in that, The acquisition of the test profile curve corresponding to the test image of the line pair card includes: Obtain the grayscale value of each pixel in the test image of the line pair card; A test profile curve corresponding to the test image of the line pair card is generated based on the grayscale values ​​of each pixel in the test image of the line pair card.

3. The method according to claim 2, characterized in that, The step of generating a test profile curve corresponding to the line-pair test image based on the grayscale values ​​of each pixel in the line-pair test image includes: Determine the grayscale value of each row of pixels in the test image of the line pair card; The grayscale values ​​of each row of pixels in the test image of the line pair card are averaged across multiple rows, and a test profile curve corresponding to the test image of the line pair card is generated based on the multi-row averaging results. The horizontal axis of the test profile curve is pixels, and the vertical axis of the test profile curve is grayscale values.

4. The method according to claim 1, characterized in that, The process of obtaining the ideal profile curve corresponding to the line pair card image includes: Obtain the detector's pixel size, number of line pairs, line width, and line spacing; An ideal profile curve is generated based on the pixel size, number of line pairs, line width, and line spacing of the detector, corresponding to the line pair card image. The horizontal axis of the ideal profile curve is pixels, and the vertical axis is grayscale value.

5. The method according to any one of claims 1-4, characterized in that, Before acquiring the test profile curve corresponding to the test image of the line pair card, the method further includes: Import the initial line pair card test image; In response to the user's selection operation on the initial line-pair test image, a line-pair test image is obtained.

6. A device for determining the focal spot size of an X-ray source, characterized in that, include: The test profile curve acquisition module is used to acquire the test profile curve corresponding to the test image of the line pair card; The ideal profile curve acquisition module is used to acquire the ideal profile curve corresponding to the line pair card image; The curve deconvolution processing module is used to perform deconvolution processing based on the test profile curve corresponding to the line pair card test image and the ideal profile curve corresponding to the line pair card image to obtain the target convolution kernel function curve. The X-ray source focal size determination module is used to determine the X-ray source focal size based on the target convolution kernel function curve; The X-ray source focal spot size determination module includes: A Gaussian fitting unit is used to perform Gaussian fitting on the target convolution kernel function curve to obtain the Gaussian fitting curve corresponding to the target convolution kernel function curve. The focal size extraction unit is used to take the half-width at half-maximum (WHM) of the Gaussian fitting curve corresponding to the target convolution kernel function curve as the focal size of the X-ray source; wherein the WHM is the full width at half-peak of the Gaussian fitting curve.

7. An electronic device, characterized in that, The electronic device includes: At least one processor; and a memory communicatively connected to the at least one processor; The memory stores a computer program that can be executed by the at least one processor, which is then executed by the at least one processor to enable the at least one processor to perform the X-ray source focal size determination method according to any one of claims 1-5.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that cause a processor to execute the method for determining the focal size of an X-ray source as described in any one of claims 1-5.

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