A NED device testing apparatus and method

Abstract

This application belongs to the field of NED device testing, specifically disclosing an NED device testing apparatus and method. The NED device includes an NED display screen and an NED optical system, with the NED optical system disposed behind the NED display screen. The testing apparatus includes an optical lens and a spectral scanning unit. The aperture of the optical lens is positioned in front and located behind the NED optical system, used to image the displayed image of the NED device onto the image plane of the optical lens. The spectral scanning unit is located behind the optical lens and used to perform spectral scanning on the image plane to acquire the spectral data of the displayed image. Through this application, using a front-aperture NED test lens combined with a line-scanning spectrometer, luminance and chromaticity measurements of the virtual image of the NED device across the entire field of view can be achieved. Compared to existing imaging luminance and chromaticity meters and rotating point luminance and chromaticity meters, this provides higher measurement accuracy and ensures the accuracy of the measurement results.

Description

Technical Field

[0001] This application belongs to the field of testing near eye display (NED) devices, and more specifically, relates to a testing apparatus and method for NED devices. Background Technology

[0002] With the development of technology, NED devices such as Virtual Reality (VR), Augmented Reality (AR), and Mixed Reality (MR) have gradually become an indispensable part of people's daily lives and work. These devices project images onto the human eye through built-in optical systems to form virtual images. However, due to the characteristics of their optical systems, unevenness in brightness and chromaticity often occurs in the field of view. This unevenness not only affects the user experience but also reduces the overall quality of the product. Therefore, accurate measurement of the brightness and chromaticity of NED devices is crucial.

[0003] Existing solutions primarily utilize imaging luminance and colorimeters and rotating point luminance and colorimeters to measure the luminance and colorimetry of NED products. The accuracy of imaging luminance and colorimeters depends on the spectral variations of the measured light source; however, when the spectrum of the measured light source differs significantly from that of the calibration light source, the measurement results may become unreliable. Rotating point luminance and colorimeters, on the other hand, require control via robotic arms or hexapod stages, resulting in long testing times, low spatial resolution, and high requirements for the rotational accuracy of the point spectrometer. While these methods provide basic measurement functionality, they have limitations in terms of accuracy, testing time, and spatial resolution. Summary of the Invention

[0004] In view of the shortcomings of the prior art, the purpose of this application is to provide a testing device and method for NED equipment, which aims to solve the limitations of existing NED product luminance and chromaticity measurement devices in terms of accuracy, testing time and spatial resolution.

[0005] To achieve the above objectives, in a first aspect, this application provides a testing apparatus for an NED device, the NED device comprising: an NED display screen and an NED optical system, the NED optical system being disposed behind the NED display screen, and the testing apparatus comprising: an optical lens and a spectral scanning unit;

[0006] The optical lens is located at the rear of the NED optical system, with its aperture in front. The optical lens is used to image the display image of the NED device onto the image plane of the optical lens.

[0007] The spectral scanning unit is located behind the optical lens and is used to perform spectral scanning on the image plane to acquire the spectral data of the displayed image.

[0008] It should be noted that the NED device testing apparatus provided in this application uses a front-aperture NED test lens paired with a scanning spectrometer, enabling the measurement of luminance, chromaticity, and spectrum across the entire field of view of the NED device's displayed image. This application uses the test lens to image the displayed image, and then directly scans the spectrum of the image on the imaging surface, determining the corresponding luminance and chromaticity information based on the spectral data. Those skilled in the art will understand that determining luminance and chromaticity through spectral analysis is generally the most accurate method for measuring luminance and chromaticity; therefore, the testing apparatus provided in this application can accurately measure the spectrum and luminance and chromaticity of the NED device's displayed image.

[0009] Existing technologies using imaging luminance and colorimeters require calibration based on a calibration light source before measuring luminance and colorimetry. Due to the difference between the spectrum of the calibration light source and the spectrum of the light source being measured, the accuracy of luminance and colorimetry measurement cannot be guaranteed. This application eliminates the need for calibration, directly measures the spectrum of the displayed image, and then determines the luminance and colorimetry based on the spectrum. This eliminates the need for calibration and avoids introducing calibration errors, thus greatly improving the measurement accuracy.

[0010] In addition, the testing device provided in this application does not require rotation testing like a rotary luminance meter, thus reducing the testing time; and this application directly measures the spectrum of the image displayed on the NED device on the image plane of the optical lens and outputs the spectral cube data of the NED device display image. Its spatial resolution is determined by the size of the scanning window in the scanning direction, and can usually be as small as 10 μm or even less, thus having a high spatial resolution.

[0011] In one possible implementation, the spectral scanning unit is further configured to determine the luminance and chromaticity information of the displayed image based on the spectral data.

[0012] As shown above, determining luminance and chromaticity based on spectral data is the most accurate method among all luminance and chromaticity measurement methods. Therefore, the solution provided in this application has a high accuracy rate in measuring the luminance and chromaticity of images displayed on NED devices. Furthermore, when the optical lens can image the entire image within the field of view of the NED device, the testing device provided in this application can accurately measure the full spectrum of the image displayed on the NED device and accurately and comprehensively acquire the luminance and chromaticity information of the displayed image.

[0013] In one possible implementation, the spectral scanning unit includes: a scanning window and a scanning spectrometer;

[0014] The scanning window is disposed on the image plane and can be scanned and moved on the image plane to define the area where the scanning spectrometer performs spectral imaging in a single operation.

[0015] The scanning spectrometer is used to complete the dispersion-forming spectrum in the width direction of the scanning window and the spectral imaging at each wavelength in the length direction of the scanning window during a single exposure time of spectral imaging in the scanning spectrometer, thereby acquiring the spectral cube data of the display image imaged by the optical lens within the scanning window.

[0016] In one possible implementation, the scanning speed of the scanning window is determined based on the size of the scanning window and the single exposure time for spectral imaging by the scanning spectrometer.

[0017] In one possible implementation, the scanning spectrometer stitches together all the spectral data acquired by scanning through the scanning window to obtain the spectral data of the displayed image.

[0018] In one possible implementation, the scanning spectrometer is a line-scanning spectrometer or a point-scanning spectrometer.

[0019] Wherein, when the scanning spectrometer is a line scanning spectrometer, the scanning window is a slit; when the scanning spectrometer is a point scanning spectrometer, the scanning window is a circular hole.

[0020] Secondly, this application provides a testing method for a near-eye display (NED) device, wherein the NED device includes: an NED display screen and an NED optical system, the NED optical system being disposed behind the NED display screen, and the testing method includes:

[0021] The display image of the NED device is imaged onto the image plane of the optical lens; the optical lens is located at the rear of the NED optical system, and its aperture is positioned in front;

[0022] A spectral scan is performed on the image plane to acquire the spectral data of the displayed image.

[0023] In one possible implementation, the method also includes:

[0024] The luminance and chromaticity information of the displayed image are determined based on the spectral data.

[0025] In one possible implementation, spectral scanning is performed on the image plane by a spectral scanning unit;

[0026] The spectral scanning unit includes a scanning window and a scanning spectrometer; the scanning window is disposed on the image plane and is used to define the area in which the scanning spectrometer performs spectral imaging in a single operation.

[0027] Performing a spectral scan on the image plane to acquire the spectral data of the displayed image includes:

[0028] Control the scanning window to move and scan on the image plane;

[0029] During a single exposure time for spectral imaging using the scanning spectrometer, dispersion-forming spectra are completed in the width direction of the scanning window, and spatial imaging at each wavelength is completed in the length direction of the scanning window, thereby acquiring spectral cube data of the displayed image image imaged by the optical lens within the scanning window.

[0030] In one possible implementation, the scanning speed of the scanning window is determined based on the size of the scanning window and the single exposure time for spectral imaging by the scanning spectrometer.

[0031] Overall, the technical solutions conceived in this application have at least the following beneficial effects compared with the prior art:

[0032] This application provides a testing apparatus and method for NED devices. The NED testing lens with a front-mounted aperture is paired with a line-scan spectrometer, which can directly measure the luminance and chromaticity and spectrum of the NED device display image across the entire field of view. Compared with existing imaging luminance and chromaticity meters and rotating point luminance and chromaticity meters, it is not affected by calibration errors and has higher spatial resolution, thus providing higher measurement accuracy and ensuring the accuracy of the measurement results.

[0033] This application provides a testing apparatus and method for NED (Near-Eye Display) devices. By continuously scanning the image plane of the NED test lens, within a single exposure time of spectral imaging using a scanning spectrometer, dispersion-forming spectra are completed in the width direction of the scanning window, and spatial imaging at each wavelength is completed in the length direction of the scanning window. This allows for the output of spectral cube data of the tested NED virtual image, enabling high-precision calculation of its luminance and chromaticity data. Compared to existing methods, this application achieves continuous spatial measurement, rather than discretely measuring a limited number of points, thereby obtaining luminance and chromaticity information across the entire field of view and improving spatial resolution.

[0034] This application provides a testing apparatus and method for NED (Neural Image Display) devices. It allows for two-dimensional scanning within the image plane of the NED test lens by controlling a line-scan spectrometer, or by controlling only the spectrometer slit within the image plane of the NED test lens. This simplifies the scanning control structure and reduces the overall size of the NED luminance, color, and spectral testing system. Compared to existing methods, the method provided in this application is simpler to operate and easier to control. Attached Figure Description

[0035] Figure 1 This is an architectural diagram of the NED device testing apparatus provided in the embodiments of this application;

[0036] Figure 2This is a schematic diagram of the test optical path using a VR device as the test object, provided in an embodiment of this application;

[0037] Figure 3 This is a schematic diagram of the VR device display image provided in the embodiments of this application;

[0038] Figure 4 This is a schematic diagram of spectral data measured using the NED equipment testing device provided in the embodiments of this application;

[0039] Figure 5 This is a flowchart of the NED device testing method provided in the embodiments of this application. Detailed Implementation

[0040] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0041] In this article, the term "and / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. The symbol " / " in this article indicates that the related objects are in an "or" relationship; for example, A / B means A or B.

[0042] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0043] Next, the technical solutions provided in the embodiments of this application will be described.

[0044] Figure 1 This is an architectural diagram of the NED device testing apparatus provided in the embodiments of this application; as shown below. Figure 1 As shown, the NED device includes: an NED display screen and an NED optical system, with the NED optical system disposed behind the NED display screen; the testing device includes: an optical lens and a scanning spectrometer;

[0045] The optical lens is located at the rear of the NED optical system, with its aperture in front, and is used to image the display image of the NED device onto the image plane of the optical lens;

[0046] The spectral scanning unit is located behind the optical lens and is used to perform spectral scanning on the image plane to acquire the spectral data of the displayed image.

[0047] The spectral scanning unit is also used to determine the luminance and chromaticity information of the displayed image based on the spectral data.

[0048] like Figure 1 As shown, the spectral scanning unit includes: a scanning window and a scanning spectrometer;

[0049] The scanning window is disposed on the image plane and can be scanned and moved on the image plane to define the area where the scanning spectrometer performs spectral imaging in a single operation.

[0050] The scanning spectrometer is used to complete the dispersion-forming spectrum in the width direction of the scanning window and complete the spatial imaging at each wavelength in the length direction of the scanning window during a single exposure time of spectral imaging, thereby acquiring the spectral cube data of the display image imaged by the optical lens within the scanning window.

[0051] It should be noted that the scanning window is usually built into the spectrometer, but conventional spectrometers only perform spectral imaging in the width direction of the scanning window, acquiring spectral data in one dimension. This application uses a scanning spectrometer to scan the image plane of the optical lens of the NED device test device. It performs spectral imaging of the NED device's display image not only in the width direction of the scanning window but also in the length direction of the scanning window, achieving high-precision, high-spatial-resolution measurement of the luminance, color, and spectrum of the NED device's display image.

[0052] Optionally, the scanning speed of the scanning window is determined based on the size of the scanning window and the single exposure time for spectral imaging by the scanning spectrometer.

[0053] For example, the scanning spectrometer stitches together all the spectral data acquired by scanning and moving through the scanning window to obtain the spectral data of the displayed image.

[0054] Furthermore, the scanning spectrometer is a line scanning spectrometer or a point scanning spectrometer.

[0055] It should be noted that the technical solution provided in this application is mainly aimed at improving the accuracy of luminance and chromaticity measurement of NED equipment; and realizing the measurement of luminance, chromaticity, and spectrum of the entire field of view of the NED virtual image to obtain continuous spatial resolution. Based on this, this application proposes a method using an NED test lens with a front-positioned aperture and a line-scanning spectrometer. This method uses an NED test lens with a front-positioned aperture and positions the slit of the line-scanning spectrometer on the image plane of the NED test lens to perform a two-dimensional scan, thereby obtaining luminance, chromaticity, and spectral data throughout the entire field of view.

[0056] Specifically, taking NED devices as VR devices and line scanning as the scanning method of the scanner, Figure 2 This is a schematic diagram of the test optical path using a VR device as the test object, provided in an embodiment of this application; as shown... Figure 2 As shown, the main technical means adopted in this technical solution are as follows:

[0057] 1. A NED test lens with an aperture in front is used to receive the virtual image projected from the VR device, and the slit of the line-scan spectrometer is located on the image plane of the NED test lens. This design allows the line-scan spectrometer to perform two-dimensional scanning within the image plane of the NED test lens, thereby completing the luminance, chromaticity, and spectral measurements of the entire field of view of the VR device's virtual image.

[0058] 2. By controlling a line-scan spectrometer (including a slit) to perform a two-dimensional scan within the image plane of the NED test lens, or by controlling only the spectrometer slit to scan within the image plane of the NED test lens, high-precision, high-spatial-resolution luminance, color, and spectral measurements of the virtual image of the VR device can be achieved. This method not only improves testing accuracy but also enables continuous scanning of the entire field of view, thereby obtaining continuous spatial resolution.

[0059] It should be noted that controlling the line scan spectrometer to perform two-dimensional scanning within the image plane specifically involves controlling the slit and the line scan spectrometer to scan synchronously within the image plane.

[0060] Furthermore, the slit is controlled to scan only within the image plane, specifically: the slit is controlled to scan only within the image plane, while the position of the line scan spectrometer is fixed.

[0061] 3. By setting parameters such as scanning speed and the frame rate of the spectrometer sensor, the accuracy of the scanning test results can be guaranteed.

[0062] Specifically, it is necessary to first determine the required exposure time expT when imaging a VR virtual image using an NED test lens and a line scan spectrometer at a certain position. Then, the scanning speed is set according to the slit width and the exposure time to ensure that the scanning of a space of slit width x slit length is completed during a single image acquisition by the line scan spectrometer.

[0063] Simultaneously, the imaging frame rate, or scanning frame rate, of the spectrometer sensor should be set to 1 / expT to ensure the continuity and accuracy of the scanning results. A line-scan spectrometer can complete the dispersion-forming spectrum (spectral dimension) along the slit width and image the slit scanning position at each wavelength (spatial dimension) along the slit length. This allows for the output of spectral cube data of the virtual image of the VR device under test by stitching together the results of continuous scanning of the image plane of the NED test lens.

[0064] In one embodiment, when the VR device displays an image as a dot plot, such as Figure 3As shown. The technicians of this application used the aforementioned NED equipment testing device to test the VR device display image at this time, and the obtained spectral data is as follows. Figure 4 As shown. Then based on Figure 4 The spectral cube data shown can output the spectral data at any field of view of the VR virtual image, and its luminance and chromaticity data can be calculated with high precision based on the spectral data.

[0065] In a more specific embodiment, this application provides a testing process for a VR device, the steps of which are as follows:

[0066] Step 1: Prepare a test lens with a front aperture. This lens will be used to receive the virtual image projected by the VR device.

[0067] Step 2: Prepare a line scan spectrometer and place the slit of the line scan spectrometer on the image plane of the test lens.

[0068] Step 3: Set the scanning speed according to the slit width and exposure time to ensure that the online scanning spectrometer completes the scanning of a space of one slit width x slit length during a single image acquisition.

[0069] Step 4: Set the image frame rate of the spectrometer sensor according to the exposure time to ensure the continuity and accuracy of the scanning results.

[0070] Step 5: Begin scanning. Control the line-scan spectrometer to perform a two-dimensional scan within the image plane of the test lens, or simply control the spectrometer slit to scan within the image plane of the test lens. During the scan, the line-scan spectrometer will complete the dispersion-forming spectrum (spectral dimension) along the slit width direction and image the slit scanning position at each wavelength (spatial dimension) along the slit length direction.

[0071] Step Six: After scanning is complete, the results of continuous scanning of the image plane of the test lens are stitched together to output the spectral cube data of the virtual image of the VR device under test. This data will be the basis for subsequent calculations of the spectral data of the VR device's virtual image at any field of view.

[0072] Step 7: Calculate the luminance and chromaticity data of the VR device's virtual image at any field of view based on the spectral data. This data will be used to evaluate the display quality of the VR device. The above are the specific operation steps of this embodiment. This method enables high-precision, high-spatial-resolution luminance, chromaticity, and spectral measurements of the VR virtual image, thereby evaluating the display quality of the VR device.

[0073] Due to the advanced nature of the technical solution provided in this application, it can be widely applied in the production and quality control of near-eye display devices such as AR, VR, and MR. By providing more accurate luminance, color, and spectral data, it can help manufacturers optimize product design, improve user experience, and simultaneously reduce production costs and increase product yield. Furthermore, this technology can also be used in scientific research and development, supporting the development of novel optical systems. Implementing this application can significantly improve the testing efficiency and accuracy of near-eye display devices, and is expected to drive technological progress and market competitiveness across the entire industry. In summary, this application has broad market demand and promising application prospects.

[0074] Figure 5 This is a flowchart of the NED device testing method provided in the embodiments of this application; as follows: Figure 5 As shown, it includes the following steps:

[0075] Step S101: The display image of the NED device is imaged onto the image plane of the optical lens through the optical lens; the optical lens aperture is in front and is located at the rear of the NED optical system;

[0076] Step S102: Perform a spectral scan on the image plane to acquire the spectral data of the displayed image.

[0077] Furthermore, the luminance and chromaticity information of the displayed image are determined based on spectral data.

[0078] Optionally, spectral scanning is performed on the image plane using a spectral scanning unit;

[0079] The spectral scanning unit includes a scanning window and a scanning spectrometer; the scanning window is disposed on the image plane and is used to define the area for a single spectral imaging by the scanning spectrometer.

[0080] Performing a spectral scan on the image plane to acquire the spectral data of the displayed image includes:

[0081] Control the scanning window to move and scan on the image plane;

[0082] During a single exposure time for spectral imaging using the scanning spectrometer, dispersion-forming spectra are completed in the width direction of the scanning window, and spatial imaging at each wavelength is completed in the length direction of the scanning window, thereby acquiring the spectral data of the display image image captured by the optical lens within the scanning window.

[0083] Optionally, the scanning speed of the scanning window is determined based on the size of the scanning window and the single exposure time for spectral imaging by the scanning spectrometer.

[0084] It should be understood that the specific execution flow of the above method can be referred to the relevant description in the above device embodiment, and will not be repeated here.

[0085] It is understood that the various numerical designations used in the embodiments of this application are merely for the convenience of description and are not intended to limit the scope of the embodiments of this application.

[0086] It should be understood that expressions such as “comprising” and “may include” used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as “comprising” and / or “having” are to be interpreted as indicating a particular characteristic, number, operation, constituent element, component, or combination thereof, but not to exclude the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0087] In the description of the embodiments of this application, it should be noted that, unless otherwise explicitly specified and limited, the term "connection" should be interpreted broadly. For example, "connection" can be a detachable connection or a non-detachable connection; it can be a direct connection or an indirect connection through an intermediate medium. "Fixed connection" refers to a connection where the relative positional relationship remains unchanged after connection. "Rotary connection" refers to a connection where the components can rotate relative to each other after connection. "Sliding connection" refers to a connection where the components can slide relative to each other after connection. The directional terms mentioned in the embodiments of this application, such as "top," "bottom," "inner," "outer," "left," and "right," are only for reference to the directions in the accompanying drawings. Therefore, the directional terms used are for better and clearer explanation and understanding of the embodiments of this application, and are not intended to indicate or imply that the device or component referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.

[0088] Furthermore, the mathematical concepts mentioned in the embodiments of this application, such as symmetry, equality, parallelism, and perpendicularity, are limitations specific to the current technological level, rather than absolute and strict mathematical definitions. Slight deviations are permissible; approximations of symmetry, equality, parallelism, and perpendicularity are all acceptable. For example, "A and B are parallel" means that A and B are parallel or approximately parallel, and the angle between A and B can be between 0 and 10 degrees. "A and B are perpendicular" means that A and B are perpendicular or approximately perpendicular, and the angle between A and B can be between 80 and 100 degrees.

[0089] Those skilled in the art will readily understand that the above description is merely a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the scope of protection of this application.

Claims

1. A near-eye display (NED) device test apparatus, the NED device comprising: NED display screen and NED optical system, wherein the NED optical system is disposed on the rear side of the NED display screen, characterized in that the testing device includes: an optical lens and a spectral scanning unit; The optical lens is located at the rear of the NED optical system, with its aperture in front. The optical lens is used to image the virtual display image generated by the NED device onto the image plane of the optical lens. The spectral scanning unit is disposed on the rear side of the optical lens and is used to perform spectral scanning on the image plane to acquire the spectral data of the virtual display image; The spectral scanning unit includes: a scanning window and a scanning spectrometer; The scanning window is directly disposed on the image plane and can scan and move on the image plane to define the area for spectral imaging by the scanning spectrometer in a single operation; when the scanning spectrometer is a line scanning spectrometer, the scanning window is a single slit. The scanning spectrometer is used to complete the dispersion-forming spectrum in the width direction of the scanning window and complete the spatial imaging at each wavelength in the length direction of the scanning window during a single exposure time of spectral imaging by the scanning spectrometer, thereby acquiring the spectral cube data of the virtual display image imaged by the optical lens within the scanning window; and to stitch together all the spectral data acquired by scanning and moving through the scanning window to obtain the spectral data of the virtual display image.

2. The apparatus of claim 1, wherein, The spectral scanning unit is also used to determine the luminance and chromaticity information of the displayed image based on the spectral data.

3. The apparatus according to claim 1, characterized in that, The scanning speed of the scanning window is determined based on the size of the scanning window and the single exposure time for spectral imaging by the scanning spectrometer.

4. The apparatus according to claim 1, characterized in that, The scanning spectrometer is either a line scanning spectrometer or a point scanning spectrometer.

5. A testing method for a near-eye display (NED) device, wherein the NED device comprises: The NED display screen and NED optical system, wherein the NED optical system is disposed on the rear side of the NED display screen, are characterized by a testing method comprising: The virtual display image generated by the NED device is imaged onto the image plane of the optical lens; the optical lens is located at the rear of the NED optical system, and its aperture is positioned in front; A spectral scan is performed on the image plane to obtain the spectral data of the virtual display image; Among them, spectral scanning is performed on the image plane by a spectral scanning unit; The spectral scanning unit includes a scanning window and a scanning spectrometer; the scanning window is directly disposed on the image plane and is used to define the area for a single spectral imaging operation by the scanning spectrometer; when the scanning spectrometer is a line scanning spectrometer, the scanning window is a single slit. Performing a spectral scan on the image plane to acquire the spectral data of the virtual display image includes: The scanning window is controlled to move directly across the image plane. During a single exposure time for spectral imaging using the scanning spectrometer, dispersion-forming spectra are completed in the width direction of the scanning window, and spatial imaging at each wavelength is completed in the length direction of the scanning window, thereby acquiring spectral cube data of the virtual display image imaged by the optical lens within the scanning window; all spectral data acquired through scanning and moving the scanning window are stitched together to obtain the spectral data of the virtual display image.

6. The method according to claim 5, characterized in that, Also includes: The luminance and chromaticity information of the displayed image are determined based on the spectral data.

7. The method according to claim 5, characterized in that, The scanning speed of the scanning window is determined based on the size of the scanning window and the single exposure time for spectral imaging by the scanning spectrometer.

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