A method and device for analyzing high orbit satellite orbit changes

Abstract

This invention discloses a method and apparatus for analyzing orbital changes of high-orbit satellites. The method is based on nighttime imaging data from ground-based photoelectric detection equipment. By analyzing the relative luminosity changes of two satellites in multiple frames of related images, it determines whether the orbit of one of the satellites has undergone a significant change. This method avoids complex modeling and is conducive to timely and rapid detection of satellite orbital anomalies.

Description

Technical Field

[0001] This invention relates to the field of data technology, and in particular to a method and apparatus for analyzing orbital changes of high-orbit satellites. Background Technology

[0002] Currently, geostationary orbit is valued by various countries as an important strategic resource. Due to its orbital characteristics, satellites in geostationary orbit possess unique advantages in agriculture, meteorology, communications, science, and national defense. However, high-orbit satellites, being far from Earth, require a method to quickly monitor their orbital changes. Traditional methods for analyzing satellite orbital changes require precise orbit determination, necessitating substantial computational resources and real-time time-to-earth (TLE) data. These methods are highly susceptible to limitations imposed by observation accuracy, consume large amounts of computational resources, and struggle to obtain accurate TLE data in real time. To promptly and quickly detect orbital anomalies in high-orbit satellites, while also being simple, efficient, and fast, a method using direct data to determine these anomalies is crucial. Therefore, this paper proposes a method and apparatus for analyzing orbital changes in high-orbit satellites, facilitating the timely and rapid detection of orbital anomalies and avoiding the need for complex modeling for orbital change analysis. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a method and apparatus for analyzing changes in the orbit of high-orbit satellites, which is conducive to timely and rapid detection of satellite orbit anomalies and avoids the problem of complex modeling and anomaly judgment.

[0004] To address the aforementioned technical problems, a first aspect of the present invention discloses a method for analyzing orbital changes of high-orbit satellites, the method comprising:

[0005] S1, acquire the image information of the high-orbit satellite to be processed and the first photometric information of the high-orbit satellite with normal orbit;

[0006] S2, based on the image information, determine the second photometric information;

[0007] S3, the second photometric information and the first photometric information are fused to obtain orbital change information; the orbital change information is used to characterize whether the high-orbit satellite to be processed has experienced orbital anomalies.

[0008] As an optional implementation, in a first aspect of the present invention, determining the second photometric information based on the image information includes:

[0009] S21, preprocess the image information to obtain preprocessed image information;

[0010] S22, Perform feature extraction processing on the preprocessed image information to obtain the image information to be processed;

[0011] S23, perform photometric calculation on the image information to be processed to obtain second photometric information.

[0012] As an optional implementation, in a first aspect of the present invention, the step of fusing the second photometric information and the first photometric information to obtain orbital change information includes:

[0013] S31, the first photometric information and the second photometric information are fused to obtain residual information;

[0014] S32, the residual information and the first photometric information are calculated and processed to obtain orbital change information.

[0015] As an optional implementation, in a first aspect of the present invention, the step of fusing the first photometric information and the second photometric information to obtain residual information includes:

[0016] S311, preprocess the first photometric information and the second photometric information to obtain first preprocessed photometric information and second preprocessed photometric information;

[0017] S312, perform matching calculation on the first preprocessed photometric information and the second preprocessed photometric information to obtain the first photometric information to be processed and the second photometric information to be processed.

[0018] S313, perform calculations on the first photometric information to be processed and the second photometric information to be processed to obtain residual information.

[0019] As an optional implementation, in a first aspect of the present invention, the step of calculating and processing the residual information and the first photometric information to obtain orbital change information includes:

[0020] S321, The first photometric information is calculated and processed to obtain the photometric threshold;

[0021] S322, The residual information and the photometric threshold are calculated and processed to obtain relative residual information; the relative residual information includes several relative residual values;

[0022] S323, Based on the relative residual information, determine the orbital change information.

[0023] As an optional implementation, in a first aspect of the present invention, the step of calculating and processing the residual information and the photometric threshold to obtain relative residual information includes:

[0024] S3221, The residual information and the photometric threshold are calculated and processed to obtain the first relative residual information;

[0025] S3222, the first relative residual information is normalized to obtain the second relative residual information; the second relative residual information includes a plurality of second relative residual values;

[0026] S3223, the maximum and minimum values ​​of several second relative residual values ​​in the second relative residual information are removed to obtain relative residual information.

[0027] As an optional implementation, in a first aspect of the present invention, determining the orbital change information based on the relative residual information includes:

[0028] S3231, preset track threshold;

[0029] S3232, Perform statistical processing on all the relative residual values ​​in the relative residual information to obtain residual statistical values; the residual statistical values ​​represent the number of relative residual values ​​greater than 0 in the relative residual information;

[0030] S3233, determine whether the residual statistical value is greater than the orbital threshold, and obtain the difference judgment result;

[0031] When the difference judgment result is yes, the orbit change information is determined to be an orbit anomaly;

[0032] When the difference judgment result is negative, the track change information is determined to be normal.

[0033] A second aspect of this invention discloses a device for analyzing orbital changes of high-orbit satellites, characterized in that the device comprises:

[0034] The acquisition module is used to acquire image information of the high-orbit satellite to be processed and the first photometric information of the high-orbit satellite with normal orbit.

[0035] The first calculation module is used to determine the second photometric information based on the image information;

[0036] The second calculation module is used to fuse the second photometric information and the first photometric information to obtain orbital change information; the orbital change information is used to characterize whether the high-orbit satellite to be processed has experienced orbital anomalies.

[0037] A third aspect of this invention discloses another device for analyzing orbital changes of high-orbit satellites, characterized in that the device comprises:

[0038] processor;

[0039] A memory coupled to the processor stores executable program code;

[0040] The processor calls the executable program code stored in the memory to execute some or all of the steps of the method for analyzing orbital changes of high-orbit satellites disclosed in the first aspect of the present invention.

[0041] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0042] 1. The calculation process is greatly simplified, and only simple calculations are performed based on the real-time observation of the relative magnitude changes between the target star and the reference star. There is no need for complex calculations such as orbit determination, and it does not rely on a large amount of orbital data input, which significantly improves the calculation efficiency and the timeliness of anomaly detection.

[0043] 2. By subtracting the photometric data of the target star and the observed star from the same observation equipment, observation errors can be effectively reduced and calculation accuracy can be improved;

[0044] 3. Using relative light intensity variation information between two satellites to determine orbital changes provides a new approach.

[0045] In this embodiment of the invention, image information of the high-orbit satellite to be processed and first photometric information of the high-orbit satellite with normal orbit are acquired; based on the image information, second photometric information is determined; the second photometric information and the first photometric information are fused to obtain orbital change information; the orbital change information is used to characterize whether the high-orbit satellite to be processed has experienced orbital anomalies. Attached Figure Description

[0046] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 This is a flowchart illustrating a method for analyzing orbital changes of high-orbit satellites according to an embodiment of the present invention;

[0048] Figure 2 This is a schematic diagram of a device for analyzing orbital changes of high-orbit satellites, as disclosed in an embodiment of the present invention.

[0049] Figure 3 This is a schematic diagram of another device for analyzing orbital changes of high-orbit satellites disclosed in an embodiment of the present invention. Detailed Implementation

[0050] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0051] The terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this invention are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, apparatus, product, or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices.

[0052] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0053] This invention discloses a method and apparatus for analyzing orbital changes of high-orbit satellites, which facilitates the timely and rapid detection of satellite orbital anomalies and avoids the problems of complex modeling and anomaly judgment. Detailed descriptions follow.

[0054] Example 1

[0055] Please see Figure 1 , Figure 1 This is a flowchart illustrating a method for analyzing orbital changes of high-orbit satellites, as disclosed in an embodiment of the present invention. Figure 1 The described method for analyzing orbital changes of high-orbit satellites is applied in devices for analyzing orbital changes of high-orbit satellites, such as local servers or cloud servers used for optimized management of orbital changes analysis of high-orbit satellites, etc., and the embodiments of the present invention are not limited thereto. Figure 1 As shown, this method for analyzing orbital changes of high-orbit satellites may include the following operations:

[0056] S1, acquire the image information of the high-orbit satellite to be processed and the first photometric information of the high-orbit satellite with normal orbit;

[0057] S2, based on the image information, determine the second photometric information;

[0058] S3, the second photometric information and the first photometric information are fused to obtain orbital change information; the orbital change information is used to characterize whether the high-orbit satellite to be processed has experienced orbital anomalies.

[0059] It should be noted that the image information refers to the astronomical image information of the high-orbit satellite to be processed, such as multiple frames of astronomical image data captured throughout the night by photoelectric detection equipment to constitute the image information.

[0060] It should be noted that the first photometric information is obtained from the satellite photometric data of a satellite selected by the user that has normal attitude, normal orbit, and stable three axes.

[0061] It should be noted that the image information includes several image frames, each image frame corresponding to a point in time when the image was captured;

[0062] It should be noted that the second photometric information contains several photometric values, where each photometric value corresponds to a specific time point.

[0063] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0064] In an optional embodiment, determining the second photometric information based on the image information includes:

[0065] S21, preprocess the image information to obtain preprocessed image information;

[0066] S22, Perform feature extraction processing on the preprocessed image information to obtain the image information to be processed;

[0067] S23, perform photometric calculation on the image information to be processed to obtain second photometric information.

[0068] It should be noted that the image information is preprocessed to obtain preprocessed image information, including using a Gaussian filter to remove random noise from the image information, using a geometric transformation algorithm to correct the image information to compensate for distortions during the imaging process, and finally obtaining the preprocessed image information through normalization.

[0069] It should be noted that feature extraction processing is performed on the preprocessed image information to obtain the image information to be processed. This includes using image segmentation algorithms to identify satellites in the preprocessed image information, such as threshold segmentation and Canny edge detection, and then using histogram feature methods to extract satellite brightness features, ultimately obtaining the image information to be processed.

[0070] It should be noted that performing photometric calculations on the image information to be processed to obtain second photometric information includes using some commonly used photometric calculation methods to calculate the image information to be processed to obtain the satellite's second photometric information, such as using commonly used point spread function, spectral response function, standard photometric function, etc.

[0071] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0072] In an optional embodiment, the step of fusing the second photometric information and the first photometric information to obtain orbital change information includes:

[0073] S31, the first photometric information and the second photometric information are fused to obtain residual information;

[0074] S32, the residual information and the first photometric information are calculated and processed to obtain orbital change information.

[0075] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0076] In another optional embodiment, the fusion processing of the first photometric information and the second photometric information to obtain residual information includes:

[0077] S311, preprocess the first photometric information and the second photometric information to obtain first preprocessed photometric information and second preprocessed photometric information;

[0078] It should be noted that the first photometric information includes several first photometric values, each of which corresponds to a first photometric time, and the several first photometric values ​​are arranged sequentially according to the time series of the first photometric times.

[0079] It should be noted that the second photometric information includes several second photometric values, each of which corresponds to a second photometric time, and the several second photometric values ​​are arranged sequentially according to the time series of the second photometric times;

[0080] It should be noted that preprocessing the first and second photometric information to obtain first preprocessed photometric information and second preprocessed photometric information is to correct abnormal first photometric values ​​in the first photometric information and abnormal second photometric values ​​in the second photometric information. For example, if the first photometric information is {3,4,3,5,23,5}, where the first photometric value 23 is impossible, then it is necessary to correct the first photometric value before and after the first photometric value 23. The average value is calculated as (5+5) / 2 = 5, and 23 is replaced. The preprocessed first photometric value is then {3,4,3,5,5,5}. If the second photometric value is {4,0,3,6,5,2}, since a second photometric value of 0 is impossible, the average of the second photometric value before and after the value of 0 is calculated as (4+3) / 2 = 3.5, and 0 is replaced. The preprocessed second photometric value is then {4,3.5,3,6,5,2}.

[0081] S312, perform matching calculation on the first preprocessed photometric information and the second preprocessed photometric information to obtain the first photometric information to be processed and the second photometric information to be processed.

[0082] It should be noted that the matching calculation of the first preprocessed photometric information and the second preprocessed photometric information to obtain the first photometric information to be processed and the second photometric information to be processed can be obtained by the matching calculation algorithm set by the user, or by the matching calculation of the first photometric model. This embodiment of the invention does not limit the specific method.

[0083] The first photometric model is:

[0084]

[0085]

[0086] In the formula, DC1 and DC2 represent the first and second photometric information to be processed, respectively; SJ1 represents the first time point set corresponding to the first preprocessed information; SJ2 represents the second time point set corresponding to the second preprocessed information; and YC... 1,t YC represents the first photometric value corresponding to the t-th time point in the first time point set of the first preprocessed information. 2,t This represents the second photometric value corresponding to the t-th time point in the second time point set;

[0087] It should be noted that each of the first photometric values ​​corresponds to a time point in the first time point set; and each of the second photometric values ​​corresponds to a time point in the second time point set.

[0088] S313, perform calculations on the first photometric information to be processed and the second photometric information to be processed to obtain residual information;

[0089] It should be noted that the residual information obtained by calculating and processing the first photometric information to be processed and the second photometric information to be processed can be obtained by calculation and processing through a user-defined calculation method or by calculation and processing through a second photometric model. This embodiment of the invention does not limit the calculation and processing.

[0090] The second photometric model is as follows:

[0091] CC i =DY i -DE i 1≤i≤N;

[0092] In the formula, CC i Let DY be the i-th residual value in the residual information. i For the i-th second photometric value in the second photometric information to be processed, DE i Let N be the i-th first photometric value in the first photometric information to be processed, and N be the number of first photometric values ​​in the first photometric information to be processed.

[0093] It should be noted that N is also the number of the second photometric values ​​in the second photometric information to be processed.

[0094] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0095] In another optional embodiment, the preprocessing of the first photometric information and the second photometric information to obtain first preprocessed photometric information and second preprocessed photometric information includes:

[0096] S3111, obtain the first highest threshold, the first lowest threshold, the second highest threshold, and the second lowest threshold;

[0097] S3112, determine whether any of the first photometric values ​​in the first photometric information is greater than the first highest threshold, and obtain a first determination result:

[0098] When the first judgment result is yes, the first average photometric value information is calculated by averaging the first GG first photometric value information and the last GG first photometric value information in the first photometric information to obtain the first average photometric value information, and the first average photometric value information is added to the first preprocessed photometric information.

[0099] When the first judgment result is negative, determine whether the first photometric value is greater than the first minimum threshold to obtain the second judgment result:

[0100] When the second judgment result is yes, the first photometric value information is added to the first preprocessed photometric information;

[0101] When the second judgment result is negative, the average value of the first photometric value information in the first photometric information is calculated by the first GG first photometric value information and the last GG first photometric value information in the first photometric information to obtain the second average photometric value information, and the second average photometric value information is added to the first preprocessed photometric information.

[0102] S3113, determine whether any of the second photometric values ​​in the second photometric information is greater than the second highest threshold, and obtain a third determination result:

[0103] When the third judgment result is yes, the average value of the first HH second photometric values ​​and the last HH second photometric values ​​in the second photometric information is calculated to obtain the third average photometric value, and the third average photometric value is added to the second preprocessed photometric information.

[0104] If the third judgment result is negative, determine whether the second photometric value is greater than the second minimum threshold to obtain the fourth judgment result:

[0105] When the fourth judgment result is yes, the second photometric value information is added to the second preprocessed photometric information;

[0106] When the fourth judgment result is negative, the average value of the first HH second photometric values ​​and the last HH second photometric values ​​in the second photometric information is calculated to obtain the fourth average photometric value, and the fourth average photometric value is added to the second preprocessed photometric information.

[0107] It should be noted that GG and HH can be user-defined or obtained from historical data; this embodiment of the invention does not specify any particular settings. For example, GG can be 5 and HH can be 4.

[0108] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0109] In another optional embodiment, the step of calculating and processing the residual information and the first photometric information to obtain orbital change information includes:

[0110] S321, The first photometric information is calculated and processed to obtain the photometric threshold;

[0111] It should be noted that the photometric threshold obtained by calculating and processing the first photometric information can be obtained by using a calculation method set by the user or by using a photometric threshold model. This embodiment of the invention does not limit the calculation.

[0112] The photometric threshold model is as follows:

[0113] S=σ1EG+σ2EE+σ30≤σ1,σ2,σ3≤1;

[0114] In the formula, S is the photometric threshold, EG is the average value of the first photometric information, EE is the standard deviation of the first photometric information, and σ1, σ2 and σ3 are the first weight parameter, the second weight parameter and the third weight parameter, respectively.

[0115] It should be noted that the first weight parameter, the second weight parameter, and the third weight parameter can be set by the user or obtained based on historical experience. This embodiment of the invention does not impose any specific limitations.

[0116] It should be noted that the first, second, and third weighting parameters are used to adjust the photometric threshold to adapt to different environmental factors, such as the influence of atmospheric environment and the accuracy of equipment photometry.

[0117] S322, The residual information and the photometric threshold are calculated and processed to obtain relative residual information; the relative residual information includes several relative residual values;

[0118] S323, Based on the relative residual information, determine the orbital change information.

[0119] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0120] In an optional embodiment, the step of calculating and processing the residual information and the photometric threshold to obtain relative residual information includes:

[0121] S3221, The residual information and the photometric threshold are calculated and processed to obtain the first relative residual information;

[0122] It should be noted that the calculation and processing of the residual information and the photometric threshold to obtain the first relative residual information can be obtained by calculation and processing through a user-defined calculation method or by calculation and processing through a third photometric model. This embodiment of the invention does not limit the calculation and processing.

[0123] The third photometric model is as follows:

[0124] DYCC z =|CC z |-S1≤z≤X;

[0125] In the formula, DYCC z CC represents the z-th relative residual value in the first relative residual information. z Let S be the z-th residual value in the residual information, S be the photometric threshold, X be the number of residual values ​​in the residual information, and || represent the absolute value;

[0126] S3222, the first relative residual information is normalized to obtain the second relative residual information; the second relative residual information includes a plurality of second relative residual values;

[0127] S3223, the maximum and minimum values ​​of several second relative residual values ​​in the second relative residual information are removed to obtain relative residual information.

[0128] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0129] In an optional embodiment, determining the orbital change information based on the relative residual information includes:

[0130] S3231, Obtain the orbital threshold;

[0131] S3232, Perform statistical processing on all the relative residual values ​​in the relative residual information to obtain residual statistical values; the residual statistical values ​​represent the number of relative residual values ​​greater than 0 in the relative residual information;

[0132] S3233, determine whether the residual statistical value is greater than the orbital threshold, and obtain the difference judgment result;

[0133] When the difference judgment result is yes, the orbit change information is determined to be an orbit anomaly;

[0134] When the difference judgment result is negative, the track change information is determined to be normal.

[0135] Implementing the method for analyzing changes in the orbit of high-orbit satellites described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0136] Example 2

[0137] Please see Figure 2 , Figure 2 This is a schematic diagram of a device for analyzing orbital changes of high-orbit satellites, as disclosed in an embodiment of the present invention. Figure 2 The described device for analyzing orbital changes of high-orbit satellites is applied in optimization systems for analyzing orbital changes of high-orbit satellites, such as local servers or cloud servers used for analyzing orbital changes of high-orbit satellites, etc., and the embodiments of the present invention are not limited thereto. Figure 2 As shown, the device for analyzing orbital changes of high-orbit satellites includes:

[0138] The acquisition module 201 is used to acquire image information of the high-orbit satellite to be processed and the first photometric information of the high-orbit satellite with normal orbit.

[0139] The first calculation module 202 is used to determine the second photometric information based on the image information;

[0140] The second calculation module 203 is used to fuse the second photometric information and the first photometric information to obtain orbit change information; the orbit change information is used to characterize whether the high-orbit satellite to be processed has experienced orbital anomalies.

[0141] Implementing the device for analyzing changes in the orbit of high-orbit satellites as described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0142] Example 3

[0143] Please see Figure 3 , Figure 3 This is a schematic diagram of another device for analyzing orbital changes of high-orbit satellites disclosed in an embodiment of the present invention. Figure 3 The described device for analyzing orbital changes in high-orbit satellites is applied in an optimization system for analyzing orbital changes in high-orbit satellites, such as a local server or cloud server for analyzing orbital changes in high-orbit satellites. This invention does not limit the application of this device. Figure 3 As shown, the device for analyzing orbital changes of high-orbit satellites includes:

[0144] Processor 301;

[0145] A memory 302 containing executable program code is coupled to the processor 301;

[0146] The processor 301 calls the executable program code stored in the memory 302 to execute some or all of the steps in the method for analyzing the orbital changes of high-orbit satellites described in Embodiment 1.

[0147] Implementing the device for analyzing changes in the orbit of high-orbit satellites as described in the embodiments of the present invention is beneficial for timely and rapid detection of satellite orbit anomalies, avoiding the problems of complex modeling and anomaly judgment.

[0148] Example 4

[0149] This invention discloses a computer-readable storage medium, characterized in that the computer-readable storage medium stores computer instructions, which, when invoked, are used to execute some or all of the steps in the method for analyzing orbital changes of high-orbit satellites described in Embodiment 1.

[0150] Example 5

[0151] This invention discloses a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to cause a computer to perform some or all of the steps in the method for analyzing orbital changes of high-orbit satellites described in Embodiment 1.

[0152] The system embodiments described above are merely illustrative. The modules described as separate components may or may not be physically separate, and the components shown as modules may or may not be physical modules; that is, they may be located in one place or distributed across multiple network modules. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0153] Through the detailed description of the above embodiments, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, including read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically-Erasable Programmable Read-Only Memory (EEPROM), compact disc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium that can be used to carry or store data.

[0154] Finally, it should be noted that the method and apparatus for analyzing orbital changes of high-orbit satellites disclosed in the embodiments of the present invention are merely preferred embodiments of the present invention and are only used to illustrate the technical solutions of the present invention, not to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for analyzing orbital changes of high-orbit satellites, characterized in that, The method includes: S1, acquire the image information of the high-orbit satellite to be processed and the first photometric information of the high-orbit satellite with normal orbit; S2, based on the image information, determine the second photometric information; S3, the second photometric information and the first photometric information are fused to obtain orbital change information; the orbital change information is used to characterize whether the high-orbit satellite to be processed has experienced orbital anomalies; The process of fusing the second photometric information and the first photometric information to obtain orbital change information includes: S31, the first photometric information and the second photometric information are fused to obtain residual information; S32, calculate and process the residual information and the first photometric information to obtain orbital change information; The process of fusing the first photometric information and the second photometric information to obtain residual information includes: S311, preprocess the first photometric information and the second photometric information to obtain first preprocessed photometric information and second preprocessed photometric information; S312, perform matching calculation on the first preprocessed photometric information and the second preprocessed photometric information to obtain the first photometric information to be processed and the second photometric information to be processed. S313, perform calculations on the first photometric information to be processed and the second photometric information to be processed to obtain residual information; The preprocessing of the first photometric information and the second photometric information to obtain first preprocessed photometric information and second preprocessed photometric information includes: S3111, obtain the first highest threshold, the first lowest threshold, the second highest threshold, and the second lowest threshold; S3112, determine whether any first photometric value in the first photometric information is greater than the first highest threshold, and obtain the first determination result: When the first judgment result is yes, the first average photometric value information is calculated by averaging the first GG first photometric value information and the last GG first photometric value information in the first photometric information to obtain the first average photometric value information, and the first average photometric value information is added to the first preprocessed photometric information. When the first judgment result is negative, determine whether the first photometric value is greater than the first minimum threshold to obtain the second judgment result: When the second judgment result is yes, the first photometric value information is added to the first preprocessed photometric information; When the second judgment result is negative, the average value of the first photometric value information in the first photometric information is calculated by the first GG first photometric value information and the last GG first photometric value information in the first photometric information to obtain the second average photometric value information, and the second average photometric value information is added to the first preprocessed photometric information. S3113, determine whether any second photometric value in the second photometric information is greater than the second highest threshold, and obtain a third determination result: When the third judgment result is yes, the average value of the first HH second photometric values ​​and the last HH second photometric values ​​in the second photometric information is calculated to obtain the third average photometric value, and the third average photometric value is added to the second preprocessed photometric information. If the third judgment result is negative, determine whether the second photometric value is greater than the second minimum threshold to obtain the fourth judgment result: When the fourth judgment result is yes, the second photometric value information is added to the second preprocessed photometric information; When the fourth judgment result is negative, the average value of the first HH second photometric values ​​and the last HH second photometric values ​​in the second photometric information is calculated to obtain the fourth average photometric value, and the fourth average photometric value is added to the second preprocessed photometric information.

2. The method for analyzing orbital changes of high-orbit satellites according to claim 1, characterized in that, The determination of the second photometric information based on the image information includes: S21, preprocess the image information to obtain preprocessed image information; S22, Perform feature extraction processing on the preprocessed image information to obtain the image information to be processed; S23, perform photometric calculation on the image information to be processed to obtain second photometric information.

3. The method for analyzing orbital changes of high-orbit satellites according to claim 1, characterized in that, The calculation and processing of the residual information and the first photometric information to obtain orbital change information includes: S321, The first photometric information is calculated and processed to obtain the photometric threshold; S322, The residual information and the photometric threshold are calculated and processed to obtain relative residual information; the relative residual information includes several relative residual values; S323, Based on the relative residual information, determine the orbital change information.

4. The method for analyzing orbital changes of high-orbit satellites according to claim 3, characterized in that, The step of calculating and processing the residual information and the photometric threshold to obtain relative residual information includes: S3221, The residual information and the photometric threshold are calculated and processed to obtain the first relative residual information; S3222, the first relative residual information is normalized to obtain the second relative residual information; the second relative residual information includes a plurality of second relative residual values; S3223, the maximum and minimum values ​​of several second relative residual values ​​in the second relative residual information are removed to obtain relative residual information.

5. The method for analyzing orbital changes of high-orbit satellites according to claim 3, characterized in that, The determination of orbital change information based on the relative residual information includes: S3231, preset track threshold; S3232, Perform statistical processing on all the relative residual values ​​in the relative residual information to obtain residual statistical values; the residual statistical values ​​represent the number of relative residual values ​​greater than 0 in the relative residual information; S3233, determine whether the residual statistical value is greater than the orbital threshold, and obtain the difference judgment result; When the difference judgment result is yes, the orbit change information is determined to be an orbit anomaly; When the difference judgment result is negative, the track change information is determined to be normal.

6. A device for analyzing orbital changes of high-orbit satellites, characterized in that, The device includes: processor; A memory coupled to the processor stores executable program code; The processor calls the executable program code stored in the memory to execute the method for analyzing orbital changes of high-orbit satellites as described in any one of claims 1-5.

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