A method and device for measuring point spread function of imaging spectrometer based on NED lens

Abstract

The present application discloses a method and device for measuring the point spread function of an imaging spectrometer based on a NED lens, belonging to the field of optical measurement technology, comprising: controlling a first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens; imaging the second incident light source outputted by the first incident light source after passing through the NED lens at various positions of a slit of the imaging spectrometer to obtain a quasi-monochromatic point light source at various positions on the slit; imaging the quasi-monochromatic point light source at various positions on the slit through an imaging spectrometer system to obtain an image plane intensity distribution, and obtaining the point spread function of the quasi-monochromatic point light source at each position based on the image plane intensity distribution. Through the present application, the point spread function of each point on the slit can be measured, thereby improving the convenience and comprehensiveness of the point spread function measurement.

Description

Technical Field

[0001] The present application relates to the field of optical measurement technology, and more specifically, to a method and device for measuring the point spread function of an imaging spectrometer based on a NED lens. Background Art

[0002] During spectral testing, a monochromatic light source is typically used to correct for bandwidth and stray light. The spectrometer's response to the monochromatic light source yields its spectral broadening curve, which is then deconvolved or fitted to the original spectrum to yield the unbroadened spectrum. During optical imaging testing, a point light source is typically used. An optical imaging system is used to image the point light source, obtaining its point spread function. The original image is then deconvolved or fitted to yield the unbroadened image based on the point spread function. Imaging spectrometers image the slit as a two-dimensional image, encompassing both spatial and spectral dimensions. To correct for bandwidth and stray light on this two-dimensional spectral image, the point spread function at each point on the slit must be measured and obtained.

[0003] Traditional methods for measuring the point spread function of optical systems use imaging with a small aperture or array of apertures to determine how the point spread function varies with the field of view. This method requires the fabrication of a sample aperture, and the aperture size and position cannot be changed. While traditional methods can partially perform testing by replacing the imaging spectrometer slit with an array of apertures, this only allows testing at the aperture position, not at every point along the slit. Furthermore, replacing and debugging the slit is a complex process.

[0004] Therefore, providing a method for measuring the point spread function of each point in the slit becomes an urgent problem to be solved. Summary of the Invention

[0005] In response to at least one defect or improvement need in the prior art, the present invention provides a method and device for measuring the point spread function of an imaging spectrometer based on a NED lens, which enables measurement of the point spread function at each point of the slit, thereby improving the convenience and comprehensiveness of point spread function measurement.

[0006] To achieve the above objectives, according to a first aspect of the present invention, a method for measuring the point spread function of an imaging spectrometer based on a NED lens is provided, the method comprising: controlling a first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens; imaging the second incident light source output after the first incident light source passes through the NED lens at various positions of a slit of the imaging spectrometer to obtain a quasi-monochromatic point light source at each position on the slit; imaging the quasi-monochromatic point light source at each position on the slit through an imaging spectrometer system to obtain an image plane intensity distribution, and obtaining the point spread function of the quasi-monochromatic point light source at each position based on the image plane intensity distribution.

[0007] In an exemplary embodiment, controlling a first incident light source to be incident on an NED lens at a target angle to obtain a second incident light source includes: adjusting the incident angle of the first incident light source relative to the NED lens to obtain a series of target angles; controlling the first incident light source to be incident on the NED lens according to a series of target angles to obtain a series of second incident light sources, wherein each target angle corresponds one-to-one to a position where the second incident light source is imaged on a slit; and obtaining a point spread function of a quasi-monochromatic point light source at each position based on an image plane intensity distribution, including: obtaining a set of first point spread functions of an imaging spectrometer at a series of target angles when the first incident light source is monochromatic parallel light with a wavelength of λ1.

[0008] In an exemplary embodiment, after adjusting the incident angle of the first incident light source relative to the NED lens through the light source adjustment mechanism to obtain a series of target angles, the method further includes: controlling the first incident light source to be incident on the NED lens according to the series of target angles respectively to obtain a series of second incident light sources, wherein each target angle corresponds one-to-one to a position where the second incident light source is imaged on the slit; obtaining the point spread function of the quasi-monochromatic point light source at each position according to the image plane intensity distribution, including: obtaining a set of second point spread functions of the imaging spectrometer at a series of target angles when the first incident light source is monochromatic parallel light with a wavelength of λ1.

[0009] In an exemplary embodiment, a first incident light source is controlled to be incident on a NED lens at a target angle to obtain a second incident light source, including: determining a target parallelism of the first incident light source based on a target image plane size of the second incident light source imaged on a slit; and controlling the first incident light source under the target parallelism to be incident on the NED lens at a target angle to obtain the second incident light source.

[0010] In an exemplary embodiment, the quasi-monochromatic point light sources at various positions on the slit are imaged by an imaging spectrometer system to obtain an image plane intensity distribution, which includes: acquiring a planar array image of the quasi-monochromatic point light sources at various positions on the slit imaged by the imaging spectrometer system through a spectrometer image acquisition system; and determining the image plane intensity distribution based on the grayscale value of the planar array image.

[0011] In an exemplary embodiment, the wavelength of the first incident light source is switched; a set of N point spread functions of the imaging spectrometer at the N different wavelengths of the first incident light source at the series of target angles is obtained; and a complete point spread function of the imaging spectrometer is obtained based on the set of the first point spread functions and the set of N point spread functions.

[0012] According to a second aspect of the present invention, a device for measuring the point spread function of an imaging spectrometer based on an NED lens is also provided, which includes: a first incident unit, used to control the first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens; an imaging unit, used to image the second incident light source output after the first incident light source passes through the NED lens at various positions of the imaging spectrometer slit, to obtain a quasi-monochromatic point light source at various positions on the slit; a first acquisition unit, used to image the quasi-monochromatic point light source at various positions on the slit through the imaging spectrometer system, to obtain an image plane intensity distribution, and to obtain the point spread function of the quasi-monochromatic point light source at each position based on the image plane intensity distribution.

[0013] According to a third aspect of the present invention, a computer-readable storage medium is further provided, in which a computer program is stored, wherein the computer program is configured to execute the above-mentioned method for measuring the point spread function of an imaging spectrometer based on an NED lens when running.

[0014] According to a fourth aspect of the present invention, an electronic device is also provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the above-mentioned method for measuring the point spread function of an imaging spectrometer based on an NED lens through the computer program.

[0015] In general, the above technical solutions conceived by the present invention can achieve the following beneficial effects compared with the prior art:

[0016] The present invention provides a method for measuring the point spread function of an imaging spectrometer based on an NED lens. The method comprises the following steps: controlling a first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens; the second incident light source outputted from the first incident light source after passing through the NED lens is imaged at various positions of a slit of the imaging spectrometer to obtain a quasi-monochromatic point light source at various positions on the slit; imaging the quasi-monochromatic point light source at various positions on the slit through an imaging spectrometer system to obtain an image plane intensity distribution, and obtaining a point spread function of the quasi-monochromatic point light source at various positions based on the image plane intensity distribution. The method can complete the full-field point spread function test of the imaging spectrometer without machining a pinhole array template and performing complicated replacement work, thereby improving the convenience and comprehensiveness of point spread function measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0018] Figure 1 A schematic flow chart of an optional method for measuring the point spread function of an imaging spectrometer based on an NED lens according to an embodiment of the present application;

[0019] Figure 2 A schematic structural diagram of an optional device for measuring the point spread function of an imaging spectrometer based on an NED lens provided in an embodiment of the present application;

[0020] Figure 3 A schematic structural diagram of another optional device for measuring the point spread function of an imaging spectrometer based on an NED lens according to an embodiment of the present application;

[0021] Figure 4 A schematic flow chart of another optional method for measuring the point spread function of an imaging spectrometer based on an NED lens provided in an embodiment of the present application;

[0022] Figure 5 A schematic structural diagram of an optional device for measuring the point spread function of an imaging spectrometer based on an NED lens provided in an embodiment of the present application;

[0023] Figure 6 A schematic structural diagram of an optional electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0024] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely for the purpose of explaining the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

[0025] The terms "first," "second," "third," and the like in the specification and claims of this application and the accompanying drawings are used to distinguish between different objects, not to describe a particular order. Furthermore, the terms "including," "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or elements is not limited to the listed steps or elements, but may optionally include steps or elements not listed, or may optionally include other steps or elements inherent to the process, method, product, or apparatus.

[0026] According to one aspect of the embodiment of the present application, a method for measuring the point spread function of an imaging spectrometer based on a NED lens is provided. Figure 1 The present invention describes a method for measuring the point spread function of an imaging spectrometer based on an NED lens provided in an embodiment of the present application.

[0027] Figure 1 FIG. 1 is a flow chart of an optional method for measuring the point spread function of an imaging spectrometer based on an NED lens provided in an embodiment of the present application, such as Figure 1 As shown, the process of the method may include the following steps:

[0028] S102, controlling a first incident light source to be incident on a NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light having a wavelength of λ1, and the target angle is an incident angle of the first incident light source relative to the NED lens;

[0029] S104, imaging a second incident light source outputted from the first incident light source through the NED lens at various positions of the imaging spectrometer slit to obtain a quasi-monochromatic point light source at each position on the slit;

[0030] S106 , the quasi-monochromatic point light source at each position on the slit is imaged by an imaging spectrometer system to obtain an image plane intensity distribution, and a point spread function of the quasi-monochromatic point light source at each position is obtained according to the image plane intensity distribution.

[0031] A spectrometer is a basic optical measuring instrument. Its principle is to collect light signals emitted, reflected, or transmitted by a target object. After optical and electrical signal processing, it obtains the spectral power distribution curve of the incident light. This analysis can provide detailed information about the incident light, such as radiometric, photometric, and colorimetric quantities, enabling the identification of material structure and composition and the measurement of material optical properties. Imaging spectrometers combine optical imaging and spectral analysis techniques to collect spatial and spectral information of the target, generating a three-dimensional spectral imaging data cube for classification, feature extraction, and quantitative analysis of the test object.

[0032] During spectral testing, a monochromatic light source is typically used to correct for bandwidth and stray light. The spectrometer's response to the monochromatic light source yields its spectral broadening curve, which is then deconvolved or fitted to the original spectrum to yield the unbroadened spectrum. During optical imaging testing, a point light source is typically used. An optical imaging system is used to image the point light source, obtaining its point spread function. The original image is then deconvolved or fitted to yield the unbroadened image based on the point spread function. Imaging spectrometers image the slit as a two-dimensional image, encompassing both spatial and spectral dimensions. To correct for bandwidth and stray light on this two-dimensional spectral image, the point spread function at each point on the slit must be measured and obtained.

[0033] In an embodiment of the present application, the point spread function can be measured based on an NED (Near Eye Display) lens. Optionally, the point spread function of the test light source can be measured in combination with an imaging spectrometer. Specifically, the first incident light source can be controlled to be incident on the NED lens at a target angle to obtain a second incident light source. Here, the first incident light source can be a set of monochromatic parallel light with a wavelength of λ1. The range of wavelength λ1 can be selected based on the operating wavelength range of the imaging spectrometer, and its wavelength range can cover visible light to near infrared. For example, a set of red parallel light, green parallel light, etc. can be selected, and this is not limited here.

[0034] The second incident light source, output from the NED lens after the first incident light source passes through it, can be imaged at various positions on the slit, thereby obtaining a quasi-monochromatic point light source at each position on the slit, thereby enabling measurement of the point spread function at each point on the slit. Here, the target angle can be the angle of incidence of the first incident light source relative to the NED lens. The quasi-monochromatic point light source at each position on the slit is imaged by the imaging spectrometer system, and the point spread function of the quasi-monochromatic point light source at each position can be obtained based on the obtained image plane intensity distribution.

[0035] Through the above steps S102 to S106, the second incident light source is obtained by controlling the first incident light source to be incident on the NED lens at a target angle, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens; the second incident light source output after the first incident light source passes through the NED lens is imaged at various positions of the slit of the imaging spectrometer to obtain a quasi-monochromatic point light source at each position on the slit; the quasi-monochromatic point light source at each position on the slit is imaged by the imaging spectrometer system to obtain an image plane intensity distribution, and the point spread function of the quasi-monochromatic point light source at each position is obtained according to the image plane intensity distribution. Through the present application, the point spread function of each point on the slit can be measured, thereby improving the convenience and comprehensiveness of measuring the point spread function.

[0036] In an exemplary embodiment, controlling a first incident light source to be incident on a NED lens at a target angle to obtain a second incident light source includes:

[0037] S11, adjusting the incident angle of the first incident light source relative to the NED lens through the light source adjustment mechanism to obtain a series of target angles;

[0038] S12, controlling the first incident light source to be incident on the NED lens according to a series of target angles, thereby obtaining a series of second incident light sources, wherein each target angle corresponds to a position where the second incident light source is imaged at the slit;

[0039] The step of obtaining the point spread function of the quasi-monochromatic point light source at each position according to the image plane intensity distribution includes:

[0040] S13, obtaining a set of first point spread functions of the imaging spectrometer under the series of target angles when the first incident light source is monochromatic parallel light with a wavelength of λ1.

[0041] In the embodiments of this application, Figure 2 A schematic diagram of the structure of an optional device for measuring the point spread function of an imaging spectrometer based on an NED lens provided in an embodiment of the present application is shown in FIG. Figure 2 As shown, the first incident light source is a monochromatic parallel light source incident on the NED lens. Optionally, the method of generating the monochromatic parallel light source and its parallelism is not limited. For example, a monochromatic parallel light source can be generated by a collimator, and its incident angle can be changed by a light source adjustment mechanism. Its parallelism can also be changed by changing the focal length of the collimator lens. The light source adjustment mechanism can adjust the incident angle of the first incident light source relative to the NED lens, so that the first incident light source can be incident on the NED lens according to a set incident angle (i.e., the target angle). For example, the first incident light source can be adjusted by the light source adjustment mechanism to be incident on the NED lens according to a set series of incident angles, thereby obtaining a series of second incident light sources, where the second incident light source can be imaged at different positions of the slit based on the different incident angles of the first incident light source, and each incident angle corresponds one-to-one to the position where the second incident light source is imaged on the slit.

[0042] After controlling the first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source, the point spread function of the quasi-monochromatic point light source at each position can be obtained according to the image plane intensity distribution. Optionally, a set of first point spread functions of the imaging spectrometer under a series of target angles when the first incident light source is monochromatic parallel light with a wavelength of λ1 can be obtained, that is, the point spread function of the spatial dimension.

[0043] Through this embodiment, the second incident light source is a point light source output after passing through the NED lens. Since the incident angle of the first incident light source can be adjusted, the second incident light source can be imaged at any position of the slit. Different from the method of using a pinhole array imaging, each point of the slit can be tested, and the measurement of the point spread function of the light source point is simpler and more controllable in operation.

[0044] In an exemplary embodiment, after adjusting the incident angle of the first incident light source relative to the NED lens by the light source adjustment mechanism to obtain a series of target angles, the method further includes:

[0045] S21, controlling the first incident light source to be incident on the NED lens according to a series of target angles, thereby obtaining a series of second incident light sources, wherein each target angle corresponds to a position where the second incident light source is imaged at the slit;

[0046] The point spread function of the quasi-monochromatic point light source at each position is obtained according to the image plane intensity distribution, including:

[0047] S22 , obtaining a set of second point spread functions of the imaging spectrometer under a series of target angles when the first incident light source is monochromatic parallel light with a wavelength of λ1.

[0048] In this embodiment, after adjusting the incident angle of the first incident light source relative to the NED lens using the light source adjustment mechanism to obtain a series of target angles, the first incident light source can be controlled to be incident on the NED lens at these target angles, thereby obtaining a series of second incident light sources, each of which corresponds to a position where the second incident light source is imaged at the slit. Alternatively, the imaging spectrometer system can obtain a set of second point spread functions (i.e., spectral point spread functions) of the imaging spectrometer when the first incident light source is monochromatic parallel light with a wavelength of λ1 at these target angles.

[0049] In an exemplary embodiment, controlling a first incident light source to be incident on a NED lens at a target angle to obtain a second incident light source includes:

[0050] S31, determining the target parallelism of the first incident light source according to the target image plane size of the second incident light source imaged on the slit;

[0051] S32 , controlling the first incident light source under target parallelism to be incident on the NED lens at a target angle to obtain a second incident light source.

[0052] In an embodiment of the present application, after obtaining the second incident light source, the target parallelism of the first incident light source can be determined based on the target image plane size that needs to be presented on the slit, and then the first incident light source under the target parallelism can be incident on the NED lens at a set incident angle to obtain a point light source (second incident light source) of the target image plane size imaged on the slit.

[0053] Optionally, the parallelism of the light source may be controlled by changing the focal length of a collimator lens after the collimator generates the parallel light.

[0054] Furthermore, the image plane size of the NED test lens is related to the parallelism of the incident quasi-parallel light. Under completely ideal parallel light incidence in one direction, the ideal NED spot size is 0. However, the actual NED test lens will have a specific spot size, which is related to the angular resolution of the NED test lens. The higher the angular resolution, the smaller the spot size.

[0055] Through this embodiment, the image plane size after the parallel light passes through the NED detection lens is related to the parallelism of the light source and the angular resolution of the NED detection lens and is controllable, thereby improving the measurement accuracy of the point spread function.

[0056] In an exemplary embodiment, the imaging spectrometer system includes an imaging spectrometer image acquisition system. Quasi-monochromatic point light sources at various positions on the slit are imaged by the imaging spectrometer system to obtain an image plane intensity distribution including:

[0057] S41, collecting, by the spectrometer image acquisition system, an area array image of the quasi-monochromatic point light source at each position on the slit formed by the imaging spectrometer system;

[0058] S42: Determine the image plane intensity distribution based on the grayscale value of the area array image.

[0059] In this embodiment, when measuring the point spread function, an imaging spectrometer point spread function measuring device based on an NED test lens may be used, for example, Figure 3 A schematic diagram of the structure of another optional device for measuring the point spread function of an imaging spectrometer based on an NED lens provided in an embodiment of the present application is shown in FIG. Figure 3 As shown, the measuring device may include the following parts: a monochromatic light source 1, a NED detection lens 2, an imaging spectrometer slit 3, an imaging spectrometer collimation system 4, an imaging spectrometer dispersion system 5, an imaging spectrometer imaging system 6, and an imaging spectrometer image acquisition system 7.

[0060] Optionally, the area array imaging of the imaging spectrometer imaging system 6 can be acquired by the imaging spectrometer image acquisition system 7 in the imaging spectrometer system. Specifically, the area array image of the imaging spectrometer imaging system 6 can be acquired by the imaging spectrometer image acquisition system 7, and then the image plane intensity distribution can be determined based on the grayscale value of the area array image.

[0061] In an exemplary embodiment, the method further includes:

[0062] S51, switching the wavelength of the first incident light source;

[0063] S52, obtaining a set of N point spread functions of the imaging spectrometer at the series of target angles for the N different wavelengths of the first incident light source;

[0064] S53 : Obtain a complete point spread function of the imaging spectrometer according to the first set of point spread functions and the set of N point spread functions.

[0065] In an embodiment of the present application, the first incident light source can be monochromatic parallel light of different wavelengths. Optionally, the wavelength of the first incident light source can be switched to λ2, and the value range of the wavelength λ2 is different from that of the wavelength λ1. A set of second point spread functions of the imaging spectrometer is obtained when the first incident light source is monochromatic parallel light with a wavelength of λ2 under the series of target angles. Each time the wavelength is switched, a set of point spread functions of the imaging spectrometer under the series of target angles for the monochromatic parallel light at this wavelength is obtained. The wavelength of the first incident light source is switched N times, and a total of N sets of point spread functions of the imaging spectrometer are obtained. Based on the set of the first point spread function and the set of the N point spread functions, a complete point spread function of the imaging spectrometer is obtained. In this embodiment, the point spread functions of point light sources at different spatial positions and different wavelengths can be combined and analyzed. In the imaging spectrometer system, the imaging spectrometer imaging system 6 can image incident light of different wavelengths at the same spatial position at different positions on the image sensor image plane. Therefore, incident light of different wavelengths entering the imaging spectrometer system can be equivalent to scanning one dimension (spectral dimension), and scanning along the length direction of the slit is equivalent to scanning the other dimension (spatial dimension). Combining the two is equivalent to the result of a two-dimensional scan.

[0066] Specifically, in order to obtain slit imaging in the spatial and spectral dimensions, a first incident light source of different wavelengths can be used to be incident on the NED lens according to a set series of target angles, thereby obtaining a series of second incident light sources. The second incident light sources are imaged at various positions of the imaging spectrometer slit, thereby obtaining a quasi-monochromatic point light source at each position on the slit. Figure 3 As shown, several quasi-monochromatic point light sources pass through the imaging spectrometer system, and a series of area array images can be collected by the imaging spectrometer image acquisition system 7. Based on the grayscale values ​​of the area array images, the imaging spectrometer point spread function can be determined. Several quasi-monochromatic point light sources can pass through the imaging spectrometer collimation system 4, the imaging spectrometer dispersion system 5, and the imaging spectrometer imaging system 6. The resulting series of area array images can be collected by the imaging spectrometer image acquisition system 7. Based on the grayscale values ​​of the area array images, the complete point spread function of the imaging spectrometer can be determined.

[0067] Through this embodiment, the measurement of the spatial dimension and spectral dimension point function spread function of a point light source in a slit can be realized, and the measurement of the point spread function of a point light source in different spaces of the slit can be realized. The test range is larger and is no longer limited to the measurement of the point spread function of a finite point light source in the optional pinhole array imaging.

[0068] The following describes an alternative example to illustrate the measurement of the point spread function of an imaging spectrometer based on an NED lens in an embodiment of the present application. In this alternative example, the imaging spectrometer system includes: a monochromatic light source 1, an NED detection lens 2, an imaging spectrometer slit 3, an imaging spectrometer collimation system 4, an imaging spectrometer dispersion system 5, an imaging spectrometer imaging system 6, and an imaging spectrometer image acquisition system 7.

[0069] Combine Figure 3 and Figure 4 The method for measuring the point spread function of an imaging spectrometer based on an NED lens in this optional example may include the following steps:

[0070] S402, a monochromatic light source outputs quasi-parallel light that can be imaged at different positions of the slit.

[0071] The monochromatic light source 1 outputs quasi-parallel light, which can be imaged on different slits. By controlling the parallelism of the quasi-parallel light and making the imaging size reach the target size, a quasi-monochromatic point light source on the slit can be achieved.

[0072] S404: The incident light is imaged onto the image plane through the NED lens.

[0073] The NED detection lens 2 images the incident light emitted at different angles on the object surface to different spatial positions on the image surface. The image plane size after the quasi-parallel light passes through the NED detection lens 2 is related to the parallelism of the light source and the angular resolution of the NED detection lens and is controllable.

[0074] S406, the monochromatic point light source passes through the imaging spectrometer system.

[0075] The quasi-monochromatic point light source passes through the imaging spectrometer collimation system 4, the imaging spectrometer dispersion system 5, and the imaging spectrometer imaging system 6 in the imaging spectrometer optical system, and the obtained series of area array images corresponding to the target imaging can be collected by the imaging spectrometer image acquisition system 7.

[0076] S408, changing the incident angle of the monochromatic light source and performing point spread function measurement.

[0077] By changing the incident angle of the parallel light output by the monochromatic light source 1 relative to the NED detection lens 2 and imaging at different spatial positions of the slit, point spread function testing at different slit positions can be achieved.

[0078] S410, changing the output wavelength of the monochromatic light source and performing point spread function measurement.

[0079] By changing the output wavelength of the monochromatic light source 1, the point spread function test of the slit point light source at different wavelengths can be realized.

[0080] S412, combining the point spread functions of the slit point light sources at different spaces and wavelengths to obtain a complete point spread function of the imaging spectrometer.

[0081] Through this embodiment, the full-field point spread function test of the imaging spectrometer can be completed without processing the small hole array template and performing complicated replacement work, thereby improving the convenience and comprehensiveness of point spread function measurement.

[0082] According to another aspect of an embodiment of the present application, a measuring device for implementing the above-mentioned method for measuring the point spread function of an imaging spectrometer based on an NED lens is also provided. Figure 5 FIG. 1 is a schematic structural diagram of an optional device for measuring the point spread function of an imaging spectrometer based on an NED lens according to an embodiment of the present application, such as Figure 5 As shown, the device may include:

[0083] A first incident light unit 502 is configured to control a first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens;

[0084] An imaging unit 504 is configured to image a second incident light source outputted from the first incident light source through the NED lens onto various positions of the slit of the imaging spectrometer, thereby obtaining a quasi-monochromatic point light source at each position on the slit;

[0085] The first acquisition unit 506 is used to image the quasi-monochromatic point light source at each position on the slit through the imaging spectrometer system to obtain an image plane intensity distribution, and obtain the point spread function of the quasi-monochromatic point light source at each position according to the image plane intensity distribution.

[0086] It should be noted that the first incident unit 502 in this embodiment can be used to perform the above step S102, the imaging unit 504 in this embodiment can be used to perform the above step S104, and the first acquisition unit 506 in this embodiment can be used to perform the above step S106.

[0087] Through the above module, a second incident light source is obtained by controlling the first incident light source to be incident on the NED lens at a target angle, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens; the second incident light source output after the first incident light source passes through the NED lens is imaged at various positions of the slit of the imaging spectrometer, and a quasi-monochromatic point light source at each position on the slit is obtained; the quasi-monochromatic point light source at each position on the slit is imaged by the imaging spectrometer system to obtain an image plane intensity distribution, and the point spread function of the quasi-monochromatic point light source at each position is obtained according to the image plane intensity distribution. Through this application, the point spread function of each point on the slit can be measured, thereby improving the convenience and comprehensiveness of measuring the point spread function.

[0088] In an exemplary embodiment, the first incident unit includes:

[0089] An adjustment module, configured to adjust an incident angle of the first incident light source relative to the NED lens to obtain a series of target angles;

[0090] A first control module is configured to control the first incident light source to be incident on the NED lens according to a series of target angles, thereby obtaining a series of second incident light sources, wherein each target angle corresponds to a position where the second incident light source is imaged at the slit;

[0091] The first acquisition unit includes:

[0092] The first acquisition module is used to obtain a set of first point spread functions of the imaging spectrometer under a series of target angles when the first incident light source is monochromatic parallel light with a wavelength of λ1.

[0093] In an exemplary embodiment, the apparatus further comprises:

[0094] A second incident unit is used to control the first incident light source to be incident on the NED lens according to a series of target angles, thereby obtaining a series of second incident light sources, wherein each target angle corresponds to a position where the second incident light source is imaged at the slit;

[0095] The first acquisition unit includes:

[0096] The second acquisition module is used to obtain a set of second point spread functions of the imaging spectrometer under a series of target angles when the first incident light source is monochromatic parallel light with a wavelength of λ1.

[0097] In an exemplary embodiment, the first incident unit includes:

[0098] A determination module, configured to determine the target parallelism of the first incident light source according to the target image plane size of the second incident light source imaged on the slit;

[0099] The second control module is used to control the first incident light source under the target parallelism to be incident on the NED lens at a target angle to obtain a second incident light source.

[0100] In an exemplary embodiment, the imaging spectrometer system includes an imaging spectrometer image acquisition system, and the acquisition unit includes:

[0101] An acquisition module is used to acquire, through a spectrometer image acquisition system, a planar array image of a quasi-monochromatic point light source at each position on the slit formed by an imaging spectrometer system;

[0102] The third determining module is used to determine the image plane intensity distribution based on the grayscale value of the area array image.

[0103] In one exemplary embodiment, the invention includes:

[0104] a switching unit, configured to switch the wavelength of the first incident light source;

[0105] a second acquisition unit, configured to obtain a set of N point spread functions of the imaging spectrometer at the series of target angles for the N different wavelengths of the first incident light source;

[0106] The third acquisition unit obtains a complete point spread function of the imaging spectrometer according to the set of the first point spread functions and the set of N point spread functions.

[0107] It should be noted here that the examples and scenarios implemented by the above modules and corresponding steps are the same, but are not limited to the contents disclosed in the above embodiments. It should be noted that the above modules as part of the device can run in a hardware environment, can be implemented by software, and can also be implemented by hardware, where the hardware environment includes a network environment.

[0108] According to another aspect of the embodiments of the present application, a storage medium is further provided. Optionally, in this embodiment, the storage medium can be used to execute the program code of any of the above-mentioned methods for measuring the point spread function of an imaging spectrometer based on an NED lens in the embodiments of the present application.

[0109] Optionally, in this embodiment, the storage medium is configured to store program codes for executing the following steps:

[0110] S1, controlling a first incident light source to be incident on a NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens;

[0111] S2, the second incident light source output by the first incident light source after passing through the NED lens is imaged at various positions of the imaging spectrometer slit to obtain a quasi-monochromatic point light source at each position on the slit;

[0112] S3, the quasi-monochromatic point light source at each position on the slit is imaged by the imaging spectrometer system to obtain the image plane intensity distribution, and the point spread function of the quasi-monochromatic point light source at each position is obtained according to the image plane intensity distribution.

[0113] Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, which will not be described in detail in this embodiment.

[0114] Among them, computer-readable storage media may include, but are not limited to, any type of disk, including floppy disks, optical disks, DVDs, CD-ROMs, microdrives and magneto-optical disks, ROMs, RAMs, EPROMs, EEPROMs, DRAMs, VRAMs, flash memory devices, magnetic or optical cards, nanosystems (including molecular memory ICs), or any type of medium or device suitable for storing instructions and / or data.

[0115] According to another aspect of an embodiment of the present application, an electronic device for implementing the above-mentioned method for measuring the point spread function of an imaging spectrometer based on an NED lens is also provided. The electronic device may be a server, a terminal, or a combination thereof.

[0116] Figure 6 is a schematic structural diagram of an optional electronic device according to an embodiment of the present application, such as Figure 6 As shown, it includes a processor 602, a communication interface 604, a memory 606 and a communication bus 608, wherein the processor 602, the communication interface 604, and the memory 606 communicate with each other via the communication bus 608, wherein,

[0117] Memory 606, for storing computer programs;

[0118] The processor 602 is configured to execute the computer program stored in the memory 606 to implement the following steps:

[0119] S1, controlling a first incident light source to be incident on a NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is the incident angle of the first incident light source relative to the NED lens;

[0120] S2, the second incident light source output by the first incident light source after passing through the NED lens is imaged at various positions of the imaging spectrometer slit to obtain a quasi-monochromatic point light source at each position on the slit;

[0121] S3, the quasi-monochromatic point light source at each position on the slit is imaged by the imaging spectrometer system to obtain the image plane intensity distribution, and the point spread function of the quasi-monochromatic point light source at each position is obtained according to the image plane intensity distribution.

[0122] Optionally, the communication bus may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus. The communication bus may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 6The communication interface is used for communication between the electronic device and other devices.

[0123] The memory may include RAM, or may include non-volatile memory, such as at least one disk memory. Alternatively, the memory may also be at least one storage device located away from the aforementioned processor.

[0124] As an example, the memory 606 may include, but is not limited to, the first incident unit 502, the imaging unit 504, and the first acquisition unit 506 in the device for measuring the point spread function of an imaging spectrometer based on an NED lens. Furthermore, the memory 606 may also include, but is not limited to, other modules and units in the device for measuring the point spread function of an imaging spectrometer based on an NED lens, which will not be further described in this example.

[0125] The above-mentioned processor can be a general-purpose processor, including but not limited to: CPU (Central Processing Unit), NP (Network Processor), etc.; it can also be DSP (Digital Signal Processing), ASIC (Application Specific Integrated Circuit), FPGA (Field-Programmable Gate Array) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0126] Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment will not be described in detail here.

[0127] It should be noted that for the aforementioned method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by this application.

[0128] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0129] In the several embodiments provided in this application, it should be understood that the disclosed devices can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some service interface, and the indirect coupling or communication connection of the device or unit can be electrical or other forms.

[0130] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0131] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0132] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a memory, including a number of instructions for enabling a computer device (which can be a personal computer, server or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned memory includes: various media that can store program codes, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk.

[0133] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable memory, which may include: a flash drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0134] The above is only an exemplary embodiment of the present disclosure and cannot be used to limit the scope of the present disclosure. That is, any equivalent changes and modifications made according to the teachings of the present disclosure are still within the scope of the present disclosure. After considering the specification and practicing the disclosure herein, those skilled in the art will easily think of the implementation scheme of the present disclosure. This application is intended to cover any variation, use or adaptation of the present disclosure, which follows the general principles of the present disclosure and includes common knowledge or customary technical means in the art that are not recorded in the present disclosure. The description and examples are to be regarded as exemplary only, and the scope and spirit of the present disclosure are defined by the claims.

[0135] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0136] It will be easily understood by those skilled in the art that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A method for measuring the point spread function of an imaging spectrometer based on a NED lens, characterized in that: include: Controlling a first incident light source to be incident on a NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is an incident angle of the first incident light source relative to the NED lens; The second incident light source output by the first incident light source after passing through the NED lens is imaged at various positions of the imaging spectrometer slit to obtain a quasi-monochromatic point light source at each position on the slit; The quasi-monochromatic point light sources at various positions on the slit are imaged by an imaging spectrometer system to obtain an image plane intensity distribution, and the point spread function of the quasi-monochromatic point light sources at various positions is obtained according to the image plane intensity distribution.

2. The method for measuring the point spread function of an imaging spectrometer based on an NED lens according to claim 1, wherein: The controlling the first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source includes: adjusting the incident angle of the first incident light source relative to the NED lens to obtain a series of target angles; Controlling the first incident light source to be incident on the NED lens according to the series of target angles to obtain a series of second incident light sources, wherein each target angle corresponds one-to-one to a position where the second incident light source is imaged on the slit; The step of obtaining the point spread function of the quasi-monochromatic point light source at each position according to the image plane intensity distribution includes: A set of first point spread functions of the imaging spectrometer is obtained when the first incident light source is monochromatic parallel light with a wavelength of λ1 at the series of target angles.

3. The method for measuring the point spread function of an imaging spectrometer based on an NED lens according to claim 2, wherein: After adjusting the incident angle of the first incident light source relative to the NED lens by the light source adjustment mechanism to obtain a series of target angles, the method further includes: Controlling the first incident light source to be incident on the NED lens according to the series of target angles to obtain the series of second incident light sources, wherein each of the target angles corresponds one-to-one to a position where the second incident light source is imaged on the slit; The step of obtaining the point spread function of the quasi-monochromatic point light source at each position according to the image plane intensity distribution includes: A set of second point spread functions of the imaging spectrometer is obtained when the first incident light source is monochromatic parallel light with a wavelength of λ1 at the series of target angles.

4. The method for measuring the point spread function of an imaging spectrometer based on an NED lens according to claim 1, wherein: The controlling the first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source includes: determining the target parallelism of the first incident light source according to the target image plane size of the second incident light source imaged on the slit; The second incident light source is obtained by controlling the first incident light source under the target parallelism to be incident on the NED lens at the target angle.

5. The method for measuring the point spread function of an imaging spectrometer based on an NED lens according to claim 1, wherein the imaging spectrometer system comprises an imaging spectrometer image acquisition system, wherein: The quasi-monochromatic point light source at each position on the slit is imaged by the imaging spectrometer system, and the image plane intensity distribution obtained includes: The imaging spectrometer image acquisition system is used to acquire a planar array image of the quasi-monochromatic point light source at each position on the slit formed by the imaging spectrometer system; The image plane intensity distribution is determined based on the grayscale value of the area array image.

6. The method for measuring the point spread function of an imaging spectrometer based on an NED lens according to any one of claims 1 to 5, wherein: Switching the wavelength of the first incident light source; Obtaining a set of N point spread functions of the imaging spectrometer at a series of target angles for N different wavelengths of the first incident light source; A complete point spread function of the imaging spectrometer is obtained according to the set of the first point spread functions and the set of N point spread functions.

7. A device for measuring the point spread function of an imaging spectrometer based on a NED lens, characterized in that: include: a first incident light source, configured to control a first incident light source to be incident on the NED lens at a target angle to obtain a second incident light source, wherein the first incident light source is monochromatic parallel light with a wavelength of λ1, and the target angle is an incident angle of the first incident light source relative to the NED lens; An imaging unit, configured to image the second incident light source output by the first incident light source through the NED lens at various positions of the imaging spectrometer slit to obtain a quasi-monochromatic point light source at each position on the slit; The first acquisition unit is used to image the quasi-monochromatic point light source at each position on the slit through an imaging spectrometer system to obtain an image plane intensity distribution, and obtain the point spread function of the quasi-monochromatic point light source at each position according to the image plane intensity distribution.

8. The device for measuring the point spread function of an imaging spectrometer based on an NED lens according to claim 7, wherein: include: a switching unit, configured to switch the wavelength of the first incident light source; a second acquisition unit, configured to obtain a set of N point spread functions of the imaging spectrometer at a series of target angles for the N different wavelengths of the first incident light source; The third acquisition unit obtains a complete point spread function of the imaging spectrometer according to the set of the first point spread functions and the set of the N point spread functions.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored program, wherein the program executes the method according to any one of claims 1 to 6 when executed.

10. An electronic device comprising a memory and a processor, characterized in that: A computer program is stored in the memory, and the processor is configured to execute the method according to any one of claims 1 to 6 through the computer program.

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