A method and device for detecting low carrier mobility of insulating materials

Abstract

The present application relates to the technical field of electrical performance testing of insulating polymer materials, and discloses a method and device for detecting low carrier mobility of insulating materials, the method comprising: fixing a sample; applying a triangular wave voltage at both ends of the sample; irradiating the sample with X-rays to generate carriers inside the sample, and the generated carriers move under the action of the triangular wave voltage; wherein the X-ray irradiation process coincides with the rising stage of the triangular wave voltage; obtaining the current signal of the sample under the action of the triangular wave voltage; and calculating the carrier mobility based on the current signal. The present application realizes accurate detection of the carrier behavior inside the material by combining X-ray excitation and voltage signal analysis.

Description

Technical Field

[0001] The present application relates to the technical field of electrical performance testing of insulating polymer materials, and in particular to a method and device for detecting low carrier mobility of insulating materials. Background Art

[0002] Insulating materials are widely used in modern electronic devices and power systems due to their excellent insulation properties and chemical stability. These materials play a key role in cable insulation, transformers and electronic components, ensuring safe current transmission and stable operation of equipment. With the continuous advancement of science and technology, the performance requirements for insulating materials are also gradually increasing, especially in high-voltage and high-frequency applications, where materials need to maintain excellent electrical and mechanical properties under more stringent conditions.

[0003] As an important electrical parameter, carrier mobility refers to the mobility of charge carriers inside a material under the action of an external electric field. This parameter directly affects the conductivity and electrical resistance of insulating materials in a high electric field environment. High mobility may increase the conductivity of the material, thereby reducing the insulation effect, leading to leakage and power loss. Low carrier mobility helps to improve the insulation effect of the material, reduce leakage current, and thus improve the safety and reliability of the device.

[0004] With the development of new functional materials, accurate measurement of carrier mobility has become a key step in material selection and performance optimization. Whether it is used in microelectronic devices or in high-voltage power transmission, understanding the carrier mobility of materials can help engineers design more efficient and reliable systems. This can not only improve energy efficiency, but also extend the service life of equipment and reduce maintenance costs.

[0005] However, current conventional measurement methods have significant problems with sensitivity and precision when dealing with insulating materials with low carrier mobility. Due to the weak current changes, conventional measurement techniques are difficult to provide reliable data. This technical bottleneck limits the comprehensive evaluation of material properties and hinders the development and application of new insulating materials. Therefore, the industry urgently needs a measurement method that can provide higher accuracy and sensitivity to meet the growing industrial needs.

[0006] Application Contents

[0007] The purpose of this application is to provide a method and device for detecting low carrier mobility of insulating materials, which can achieve accurate detection of carrier behavior inside the material by combining X-ray excitation and voltage signal analysis.

[0008] In order to achieve the above purpose, the technical solution adopted in this application is as follows:

[0009] In a first aspect of the present application, a method for detecting low carrier mobility of an insulating material is provided, comprising:

[0010] Fix the sample;

[0011] A triangular wave voltage is applied across the sample;

[0012] The sample is irradiated with X-rays to generate carriers inside the sample, and the generated carriers move under the action of the triangular wave voltage; wherein the irradiation process of the X-rays coincides with the rising stage of the triangular wave voltage;

[0013] Obtaining the current signal of the sample under the action of triangular wave voltage;

[0014] The carrier mobility is calculated based on the current signal.

[0015] Furthermore, the X-rays are generated by an X-ray tube, and an operating voltage of the X-ray tube is greater than or equal to 80 kV.

[0016] Furthermore, the amplitude of the triangular wave voltage is determined according to the rated breakdown voltage of the sample.

[0017] Furthermore, the amplitude of the triangular wave voltage is 70% of the rated breakdown voltage of the sample.

[0018] Furthermore, the thickness of the sample is less than or equal to 500 μm.

[0019] Furthermore, the sample was irradiated with X-rays for 0.5 seconds.

[0020] Further, calculating the carrier mobility based on the current signal includes:

[0021] Based on the current signal, the carrier mobility is calculated through filtering and denoising.

[0022] In a second aspect of the present application, there is provided an insulating material low carrier mobility detection device, comprising:

[0023] A sample fixing fixture, used to fix the sample;

[0024] A voltage generating component, connected to the sample, and used to apply a triangular wave voltage to both ends of the sample;

[0025] An X-ray excitation component is used to generate X-rays to irradiate the sample so as to generate carriers inside the sample, and the generated carriers move under the action of the triangular wave voltage; wherein the irradiation process of the X-rays coincides with the rising stage of the triangular wave voltage;

[0026] A signal acquisition component, connected to the sample, for acquiring a current signal generated by the movement of carriers in the sample;

[0027] A data processing component is connected to the signal acquisition component and is used to calculate the carrier mobility according to the current signal.

[0028] Further, the amplitude of the triangular wave voltage applied by the voltage generating component to both ends of the sample is determined according to the rated breakdown voltage of the sample.

[0029] Furthermore, the X-ray excitation component is an X-ray tube, and the operating voltage of the X-ray tube is greater than or equal to 80 kV.

[0030] The beneficial effects of this application are:

[0031] (1) High-sensitivity measurement: Using an X-ray source with adjustable energy to effectively excite carriers inside the material improves the sensitivity of the measurement. Compared with traditional methods, it can more accurately detect the movement of low-mobility carriers.

[0032] (2) Accuracy and stability: By applying a programmable triangular wave voltage to the material, the movement of carriers is precisely controlled. The synchronization of the voltage signal and the X-ray irradiation process ensures the stability and consistency of the data.

[0033] (3) Wide applicability: It is suitable for different types of insulating materials, especially when the sample thickness does not exceed 500μm, and can accurately measure the carrier mobility of various materials.

[0034] Through the above technical advantages, the present invention provides a powerful tool for the research and development of insulating materials, promotes the development of the field of materials science, and meets the industry's urgent needs for high-performance insulating material testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 A flow chart of a method for detecting low carrier mobility of an insulating material according to an embodiment of the present application is shown.

[0036] Figure 2 A working principle diagram of a method for detecting low carrier mobility of insulating materials according to an embodiment of the present application is shown.

[0037] Figure 3 A schematic diagram of a sample fixture according to an embodiment of the present application is shown; in the figure, the reference numerals are: 301, fixture plate; 302, fixture slot; 303, clamping member; 304, wiring port; 305, sample.

[0038] Figure 4 The figure shows a timing diagram of applying a triangular wave voltage to X-rays according to an embodiment of the present application.

[0039] Figure 5A structural diagram of a low carrier mobility detection device for insulating materials according to an embodiment of the present application is shown; in the figure, the reference numerals are: 501, sample fixing fixture; 502, voltage generating component; 503, X-ray excitation component; 504, signal acquisition component; 505, data processing component. DETAILED DESCRIPTION

[0040] The following describes the embodiments of the present application through specific examples, and those skilled in the art can easily understand other advantages and effects of the present application from the contents disclosed in this specification. The present application can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict.

[0041] The specific implementation of the present application is further described in detail below in conjunction with the drawings and examples.

[0042] Figure 1 A flow chart of a method for detecting low carrier mobility of an insulating material according to an embodiment of the present application is shown. Figure 2 The working principle diagram of a method for detecting low carrier mobility of insulating materials according to an embodiment of the present application is shown. The embodiment of the present application provides a method for detecting low carrier mobility of insulating materials, which realizes accurate detection of the carrier behavior inside the material by combining X-ray excitation and voltage signal analysis. Figure 1 and Figure 2 As shown, the method comprises the following steps:

[0043] S100, fix the sample.

[0044] In this embodiment, a sample fixture is used to fix the sample to ensure good contact between the electrode and the sample surface and to ensure the accuracy of the measurement. The sample is made of insulating material, and the specific structure of the sample fixture is determined according to the structural shape of the sample.

[0045] For example, Figure 3 A schematic diagram of a sample fixture according to an embodiment of the present application is shown, Figure 3As shown, the sample fixture includes a fixture plate 301, a fixture slot 302 is provided on the fixture plate 301, and a clamping member 303 can be movably provided on the fixture plate 301 corresponding to the fixture slot 302, wherein the clamping member 303 can be selected as a screw, and is movably assembled on the fixture plate 301 through a screw hole provided on the fixture plate 301, and a wiring port 304 is also provided on the fixture plate 301 corresponding to the fixture slot 302. The sample 305 is fixed in the fixture slot 302 through the clamping member 303, and the wiring port 304 is used to connect the wires connected to the sample 305. For example, if the sample 305 needs to be connected to the voltage generating component and the signal acquisition component respectively through wires, the corresponding wires can be connected through the multiple wiring ports 304 provided to be connected to the voltage generating component and the signal acquisition component respectively. Since the two ends of the fixture slot 302 are not closed, and the triangular wave voltage is applied to the two ends of the sample 305, the wires connected to the voltage generating component can be directly passed through the two ends of the fixture slot 302.

[0046] S200. Apply a triangular wave voltage across the sample.

[0047] In this embodiment, a voltage generating component can be used to connect the sample through a wire to apply a triangular wave voltage to both ends of the sample. Selecting a triangular wave signal with a suitable frequency and amplitude can optimize the measurement conditions. For example, the voltage generating component includes a voltage source and a signal generating system, and the signal generating system is used to control the voltage source to generate a triangular wave signal with a set frequency and amplitude. For example, the frequency of the triangular wave voltage can be selected to be 0.5Hz. The amplitude of the triangular wave voltage is determined according to the rated breakdown voltage of the sample, specifically 70% of the rated breakdown voltage. For example, if the breakdown voltage of a sample with a thickness of 500μm is 10kV, then the amplitude of the applied triangular wave voltage should be 7kV.

[0048] S300, irradiating the sample with X-rays to generate carriers inside the sample, and the generated carriers move under the action of a triangular wave voltage.

[0049] In this embodiment, Figure 4 The triangle wave voltage is applied to the X-ray application timing diagram, such as Figure 4 As shown, the X-ray irradiation process coincides with the rising stage of the triangular wave voltage, and the time for irradiating the sample with X-rays is 0.5 seconds. X-rays can be generated by an X-ray tube, and the working voltage of the X-ray tube is greater than or equal to 80 kV to ensure the excitation efficiency.

[0050] S400, obtaining a current signal of the sample under the action of a triangular wave voltage.

[0051] In this embodiment, a signal acquisition component can be used to collect the current signal of the sample under the action of a triangular wave voltage, wherein the signal acquisition component can be selected as a current sensor. In the case where a triangular wave voltage is provided to the sample by a voltage generation component, the current sensor can be arranged in a loop connecting the voltage generation component and the sample. Of course, the current sensor can also use a separate measurement loop to realize the collection of the current signal, which is merely an example and does not constitute a limitation to the present application.

[0052] S500: Calculate carrier mobility based on the current signal.

[0053] In this embodiment, the carrier mobility is calculated based on the current signal through filtering and denoising.

[0054] The calculation formula of carrier mobility μ is:

[0055]

[0056] Among them, I is the measured current, n is the carrier concentration (a property of the material itself, which can be obtained by looking up a table or theoretical calculation), e is the electron charge, and E is the electric field strength.

[0057] In summary, the present application achieves high-precision measurement of carrier mobility of insulating materials and has broad application value and prospects.

[0058] The feasibility and advancement of this application will be further illustrated below in conjunction with specific experiments.

[0059] Based on the method described above, cross-linked polyethylene material samples and polypropylene material samples with known carrier mobility were selected for multiple test experiments, wherein the size parameters of the cross-linked polyethylene material samples and the polypropylene material samples were consistent, and their thickness was 200 μm, and the size was 10 cm long × 10 cm wide. In each test experiment, different core parameters were set, including X-ray excitation voltage, excitation time, triangular wave voltage amplitude, and triangular wave voltage frequency. The current signal collected in each test was recorded, and the carrier mobility was calculated based on the current signal. The test results for the cross-linked polyethylene material sample and the polypropylene material sample are described in Tables 1 and 2.

[0060] Table 1 Test results for cross-linked polyethylene material samples

[0061]

[0062] Table 2 Test results for polypropylene material samples

[0063]

[0064] As shown in Tables 1 and 2, after multiple tests, the carrier mobility values ​​of the cross-linked polyethylene material samples and the polypropylene material samples are not much different from the known carrier mobility values, which proves the effectiveness and accuracy of this method.

[0065] Figure 5 The structure diagram of a low carrier mobility detection device for insulating materials according to an embodiment of the present application is shown. The embodiment of the present application also provides a low carrier mobility detection device for insulating materials, such as Figure 5 As shown, the device comprises:

[0066] A sample fixing fixture 501, used to fix the sample;

[0067] A voltage generating component 502, connected to the sample, for applying a triangular wave voltage across the two ends of the sample;

[0068] The X-ray excitation component 503 is used to generate X-rays to irradiate the sample, so as to generate carriers inside the sample, and the generated carriers move under the action of the triangular wave voltage; wherein the X-ray irradiation process coincides with the rising stage of the triangular wave voltage;

[0069] A signal acquisition component 504, connected to the sample, for acquiring a current signal generated by the movement of carriers in the sample;

[0070] The data processing component 505 is connected to the signal acquisition component 504 and is used to calculate the carrier mobility according to the current signal.

[0071] In some embodiments, the amplitude of the triangular wave voltage applied by the voltage generating component 502 across the sample is determined according to the rated breakdown voltage of the sample.

[0072] In some embodiments, the X-ray excitation component 503 is an X-ray tube, and the operating voltage of the X-ray tube is greater than or equal to 80 kV.

[0073] The above implementation modes are only used to illustrate the present application, and are not intended to limit the present application. Ordinary technicians in the relevant technical field may make various changes and modifications without departing from the spirit and scope of the present application. Therefore, all equivalent technical solutions also belong to the scope of the present application, and the scope of patent protection of the present application shall be limited by the claims.

Claims

1. A method for detecting low carrier mobility of insulating materials, characterized in that: include: Fix the sample; A triangular wave voltage is applied across the sample; The sample is irradiated with X-rays to generate carriers inside the sample, and the generated carriers move under the action of the triangular wave voltage; wherein the irradiation process of the X-rays coincides with the rising stage of the triangular wave voltage; Obtaining the current signal of the sample under the action of triangular wave voltage; Calculating carrier mobility based on the current signal; The calculation formula of carrier mobility μ is: Where I is the measured current, n is the carrier concentration, e is the electron charge, and E is the electric field strength; The amplitude of the triangular wave voltage is determined according to the rated breakdown voltage of the sample; The amplitude of the triangular wave voltage is 70% of the rated breakdown voltage of the sample.

2. The method for detecting low carrier mobility of insulating materials according to claim 1, characterized in that: The X-rays are generated by an X-ray tube, and the operating voltage of the X-ray tube is greater than or equal to 80 kV.

3. The method for detecting low carrier mobility of insulating materials according to claim 1, characterized in that: The thickness of the sample is less than or equal to 500 μm.

4. The method for detecting low carrier mobility of insulating materials according to claim 1, characterized in that: The sample was irradiated with X-rays for 0.5 seconds.

5. The method for detecting low carrier mobility of insulating materials according to claim 1, characterized in that: Calculating the carrier mobility based on the current signal includes: Based on the current signal, the carrier mobility is calculated through filtering and denoising.

6. An insulating material low carrier mobility detection device, characterized in that: include: A sample fixing fixture, used to fix the sample; A voltage generating component, connected to the sample, and used to apply a triangular wave voltage to both ends of the sample; An X-ray excitation component is used to generate X-rays to irradiate the sample so as to generate carriers inside the sample, and the generated carriers move under the action of the triangular wave voltage; wherein the irradiation process of the X-rays coincides with the rising stage of the triangular wave voltage; A signal acquisition component, connected to the sample, for acquiring a current signal generated by the movement of carriers in the sample; A data processing component, connected to the signal acquisition component, and used to calculate the carrier mobility according to the current signal; The calculation formula of carrier mobility μ is: Where I is the measured current, n is the carrier concentration, e is the electron charge, and E is the electric field strength; The amplitude of the triangular wave voltage applied by the voltage generating component to both ends of the sample is determined according to the rated breakdown voltage of the sample; the amplitude of the triangular wave voltage is 70% of the rated breakdown voltage of the sample.

7. The low carrier mobility detection device for insulating materials according to claim 6, characterized in that: The X-ray excitation component is an X-ray tube, and the operating voltage of the X-ray tube is greater than or equal to 80 kV.

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