Current sensor error measurement method, system, device, equipment and storage medium

Abstract

The present application discloses a current sensor error measurement method, system, device, equipment and storage medium, the method comprising: obtaining a reference current and a test current within a target period, the reference current is a current flowing through a bus structure continuously collected by a current signal control device, and the test current is a current collected by at least one current sensor arranged on the bus structure; integrating the reference current within the target period to obtain a reference total charge within the target period, and integrating the test current collected by each current sensor within the target period to obtain a test total charge within the target period; respectively determining a difference index between the reference total charge and each test total charge; and determining the error of the corresponding current sensor according to each difference index. In this way, the current sensor error measurement can be realized.

Description

Technical Field

[0001] The present application relates to the field of current sensors, and in particular to a current sensor error measurement method, system, device, equipment and storage medium. Background Art

[0002] A current sensor is a device used to collect current. The accuracy of the current it collects is crucial for subsequent applications. For example, in the battery field, battery management systems often use the ampere-hour integration method to integrate the battery charge and discharge current collected by the current sensor to estimate the battery state of charge (SOC). Therefore, the accuracy of the SOC estimated by the ampere-hour integration method is closely related to the error of the current sensor.

[0003] Therefore, how to measure the error of the current sensor is of great significance for scenarios where current is applied for processing. Summary of the invention

[0004] The present application provides a current sensor error measurement method, system, device, equipment and storage medium, which can realize error detection of the current sensor.

[0005] In a first aspect, the present application provides a current sensor error measurement method, comprising: obtaining a reference current and a test current within a target time period, the reference current being the current flowing through a bus structure continuously collected by a current signal control device, and the test current being the current collected by at least one current sensor arranged on the bus structure; integrating the reference current within the target time period to obtain a total reference charge within the target time period, and integrating the test current collected by each current sensor within the target time period to obtain a total test charge within the target time period; respectively determining a difference index between the total reference charge and each total test charge; and determining the error of the corresponding current sensor according to each difference index.

[0006] In the embodiment of the present application, after obtaining one or more current sensors that can determine the current size in the bus structure within the target period, that is, the test current, and the reference current flowing through the bus structure, the test current and the reference current collected by each current sensor within the target period can be integrated respectively, thereby obtaining multiple test charge totals and the reference charge totals corresponding to the reference current. Further, the difference index of the reference charge total and each test charge total can be determined respectively; according to each difference index, the error of the corresponding current sensor is determined, thereby realizing the error measurement of the current sensor.

[0007] In some optional embodiments of the present application, a target time period is determined based on a dwell time of at least one current dwell point configured for a current sensor, and at least one current dwell point is determined based on a measuring range of the current sensor, and a reference current and a test current within the target time period are obtained, including: obtaining an actual current passing through a bus structure at a current dwell point measured by a current signal control device during each dwell time, and obtaining a reference current within each dwell time; obtaining an actual current passing through a bus structure at a current dwell point measured by each current sensor during each dwell time, and obtaining a test current within each dwell time.

[0008] In an embodiment of the present application, by ensuring the accuracy of the actual current flowing through the bus structure and the test current measured by the current sensor, the accuracy of the difference index between the total reference charge and each test charge is ensured, thereby ensuring the accuracy of the error of the current sensor.

[0009] In some optional embodiments of the present application, the reference current within the target time period is integrated to obtain the total reference charge within the target time period, including: for each dwell time, the reference current within the dwell time is integrated within the dwell time to obtain the reference charge within the dwell time; the reference charge within each dwell time is summed up to obtain the total reference charge within the target time period; accordingly, the test current collected by each current sensor within the target time period is integrated to obtain the total test charge within the target time period, including: for each current sensor, respectively execute: for each dwell time, the test current within the dwell time is integrated within the dwell time to obtain the test charge within the dwell time; the test charge within each dwell time is summed up to obtain the total test charge of the current sensor within the target time period.

[0010] In an embodiment of the present application, when there are multiple residence times in a target time period, the reference charge and the test charge corresponding to each residence time can be calculated separately, and by adding the reference charge and the test charge corresponding to the calculated residence times, the total reference charge and the total test charge in the target time period can be determined.

[0011] In some optional embodiments of the present application, at least one current dwelling point has multiple current dwelling points, and the span of the multiple current dwelling points is determined according to the range of the current sensor.

[0012] In the embodiment of the present application, the current dwell point can be determined by the range of the current sensor. This ensures that when the current sensor determines the error, by integrating each dwell point, the determined error can reflect the error situation of the entire range of the current sensor, making the error detection more accurate.

[0013] In some optional embodiments of the present application, the measuring range of the current sensor includes [-A, +B], where A and B are both real numbers; the multiple current residence points include at least one first current along a first direction and at least one second current along a second direction; the numerical values ​​of the first current and the second current are equal or unequal, and the first direction and the second direction are opposite to each other.

[0014] In the embodiment of the present application, by combining the first current and the second current of different current directions in the current sensor range, it is ensured that the acquired current value is universal, thereby improving the accuracy of error detection of the current sensor.

[0015] In some optional embodiments of the present application, at least one first current includes multiple first currents of different magnitudes; and / or at least one second current includes multiple second currents of different magnitudes.

[0016] In the embodiment of the present application, the accuracy of error detection of the current sensor is improved by acquiring multiple current values ​​with different current directions.

[0017] In some optional embodiments of the present application, the difference index between the reference total charge and each test total charge is determined respectively, including: calculating the total charge difference between the reference total charge and each test total charge; for each total charge difference, calculating the ratio of the total charge difference to the reference total charge to obtain the difference index.

[0018] In the embodiment of the present application, the total charge difference between the test charge and the reference charge is calculated, and a difference index is determined based on the difference, thereby improving the accuracy of the current sensor measurement.

[0019] In some optional embodiments of the present application, at least one current sensor includes a plurality of current sensors, and the method further includes: comparing error sizes of the plurality of current sensors to obtain a comparison result; and determining a target current sensor with the smallest error from the plurality of current sensors based on the comparison result.

[0020] In an embodiment of the present application, the processor can compare the error values ​​corresponding to each current sensor after calculating the errors corresponding to each current sensor, so as to determine the current sensor with the smallest error value as the target sensor. In this way, when the target sensor is applied to a scenario where current is used for processing, it is ensured that the current detected by the target current sensor in the scenario can have a high degree of accuracy, thereby providing a solid and reliable foundation for scenarios that require current detection.

[0021] In some optional embodiments of the present application, before determining the error of the corresponding current sensor according to each difference indicator, the method also includes: obtaining a first environmental condition in an environment where at least one current sensor is located; determining the error of the corresponding current sensor according to each difference indicator, including: determining the error of the current sensor under the first environmental condition according to each difference indicator.

[0022] In the embodiment of the present application, the first environmental condition corresponding to one or more current sensors is obtained, thereby ensuring that the one or more sensors are in the same environment, so that the error calculated for the current sensor is more accurate.

[0023] In some optional embodiments of the present application, after determining the error of the current sensor under the first environmental condition according to each difference indicator, the method also includes: obtaining the error of each current sensor under at least one second environmental condition; for each current sensor, determining the comprehensive error of the current sensor according to the error under the first environmental condition and the second environmental condition.

[0024] In the embodiment of the present application, by obtaining the error of the current sensor under different environmental conditions and calculating the corresponding comprehensive error of the current sensor according to the error values ​​under different environments, the accuracy of the current sensor in current detection under various environments can be observed, so that technicians can select current sensors suitable for various environmental conditions based on the comprehensive error.

[0025] In a second aspect, the present application provides a current sensor error measurement system, comprising: a confluence structure; a current source device for providing current to the confluence structure; a current signal control device, respectively connected to the current source device and the data transmission device, for controlling the current output by the current source device and collecting the reference current output by the current source device within a target time period; a data transmission device, the data transmission device being respectively connected to the current signal control device, a processor and at least one current sensor; each current sensor is arranged on the confluence structure, the current sensor is used to collect a test current flowing through the confluence structure within a target time period, and the data transmission device is used to obtain the reference current and the test current within the target time period; and the reference current and the test current within the target time period are sent to the processor; the processor is used to integrate the reference current within the target time period to obtain a total reference charge within the target time period, and to integrate the test current collected by each current sensor within the target time period to obtain a total test charge within the target time period; respectively determine the difference index between the total reference charge and each total test charge; and determine the error of the corresponding current sensor according to each difference index.

[0026] In an embodiment of the present application, the current sensor error measurement system can provide current to the confluence structure through a current source device, wherein one or more current sensors are provided in the confluence structure, so that the one or more current sensors can determine the current size in the confluence structure within the target period and obtain the test current. In addition, the one or more current sensors can send the detected test current to the processor through a data transmission device connected thereto, and the processor can integrate the test current collected by each current sensor within the target period after receiving the test current, thereby obtaining multiple test charge totals. Further, the current sensor error measurement system can also include a current signal control device to control the current size of the current source output and collect the reference current output by the current source device, and send the reference current to the processor through a data transmission device connected to the current signal control device, so that the processor can integrate the reference current within the target period and obtain the reference charge total of the battery within the target period. Further, the processor can determine the difference index between the reference charge total and each test charge total; according to each difference index, determine the error of the corresponding current sensor, thereby realizing the error measurement of the current sensor.

[0027] In some optional embodiments of the present application, the system further includes: a receiving device for receiving the confluence structure.

[0028] In the embodiment of the present application, by placing the bus structure in a containing device, it can be ensured that one or more current sensors in the bus structure will not be disturbed by factors such as ambient temperature and electromagnetic environment when collecting current, thereby ensuring that when error detection is performed on the current sensor, the variable is only the current size collected by the current sensor, realizing the single variable principle in the error measurement process, and improving the accuracy of the current sensor in error measurement.

[0029] In some optional embodiments of the present application, the containing device includes a controllable temperature and humidity device, and the controllable temperature and humidity device is used to set the ambient temperature and humidity information when the current sensor collects the current.

[0030] In the embodiment of the present application, the accommodating device may include a controllable temperature and humidity device, which is used to set the ambient temperature and humidity information of the current sensor when collecting current. This ensures that the current sensor can collect current in the same temperature and humidity environment, thereby improving the accuracy of the current sensor error measurement.

[0031] In some optional embodiments of the present application, there are multiple current sensors, and the processor is further used to: compare the error sizes of the multiple current sensors to obtain a comparison result; and determine a target current sensor with the smallest error from the multiple current sensors based on the comparison result.

[0032] In the embodiment of the present application, a current sensor with the smallest error among multiple current sensors may be determined as a target current sensor, thereby ensuring that the current sensor has high accuracy during use.

[0033] In a third aspect, the present application provides a current sensor error measurement device, the device comprising:

[0034] An acquisition module, used to acquire a reference current and a test current within a target period, wherein the reference current is a current flowing through the bus structure continuously acquired by a current signal control device, and the test current is a current acquired by at least one current sensor disposed on the bus structure;

[0035] An integration module, used to integrate the reference current in the target period to obtain the total reference charge in the target period, and to integrate the test current collected by each current sensor in the target period to obtain the total test charge in the target period;

[0036] A first determination module is used to determine a difference index between a reference charge total amount and each test charge total amount respectively;

[0037] The second determination module is used to determine the error of the corresponding current sensor according to each difference indicator.

[0038] In a fourth aspect, an embodiment of the present application provides a current sensor error measurement device, the device comprising: a processor and a memory storing computer program instructions; when the processor executes the computer program instructions, it implements the current sensor error measurement method in the first aspect or any one of the embodiments of the first aspect.

[0039] In a fifth aspect, a computer-readable storage medium is provided, on which computer program instructions are stored. When the computer program instructions are executed by a processor, the current sensor error measurement method in the first aspect or any one of the embodiments of the first aspect is implemented.

[0040] In a sixth aspect, an embodiment of the present application provides a computer program product. When the instructions in the computer program product are executed by a processor of an electronic device, the electronic device executes a current sensor error measurement method as described in the first aspect or any one of the embodiments of the first aspect.

[0041] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Moreover, the same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0043] Figure 1 A schematic diagram of the architecture of a current sensor error measurement system provided by an embodiment of the present application;

[0044] Figure 2 A schematic diagram of the architecture of a current sensor error measurement system provided by another embodiment of the present application;

[0045] Figure 3 A flow chart of a current sensor error measurement method provided by an embodiment of the present application;

[0046] Figure 4 A flow chart of a current sensor error measurement method provided by another embodiment of the present application;

[0047] Figure 5 A schematic diagram of the dwell time and current dwell point provided by an embodiment of the present application;

[0048] Figure 6 A flow chart of a current sensor error measurement method provided by another embodiment of the present application;

[0049] Figure 7 A flow chart of a current sensor error measurement method provided by another embodiment of the present application;

[0050] Figure 8 A flow chart of a current sensor error measurement method provided by another embodiment of the present application;

[0051] Fig. 9 A flow chart of a current sensor error measurement method provided by another embodiment of the present application;

[0052] Fig.10 A flow chart of a current sensor error measurement method provided by another embodiment of the present application;

[0053] Fig.11 is a structural schematic diagram of a current sensor error measurement device provided by another embodiment of the present application;

[0054] Fig.12 It is a structural schematic diagram of a current sensor error measurement device provided by yet another embodiment of the present application.

[0055] In the drawings, the drawings are not necessarily drawn to scale.

[0056] 100. Current sensor error measurement system; 101. Convergence structure; 102. Current source device; 103. Current signal control device; 104. Data transmission device; 105. Processor; 106. Current sensor; 107. Accommodation device. DETAILED DESCRIPTION

[0057] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0058] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0059] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

[0060] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0061] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0062] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0063] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0064] The SOC of a battery is one of the important indicators for measuring battery performance. Therefore, the battery management system needs to accurately estimate the SOC of the battery.

[0065] At present, battery management systems mostly use the ampere-hour integration method to estimate SOC. The ampere-hour integration method is based on the principle of current integration and estimates the change in battery power by calculating the charge and discharge current of the battery over a period of time. Among them, the charge and discharge current is collected by a current sensor. Therefore, whether the SOC estimated by the ampere-hour integration method is accurate has a great relationship with the error of the current collected by the current sensor. Therefore, it is of great significance to determine the error of the current sensor used.

[0066] In response to the above technical problems, the present application provides a current sensor error measurement method, system, device, equipment and storage medium, which can determine the current sensor error.

[0067] The current sensor error measurement system provided in the embodiment of the present application is first introduced in detail below.

[0068] Figure 1 This is a schematic diagram of the architecture of a current sensor error measurement system provided by an embodiment of the present application. Figure 1 As shown, the current sensor error measurement system 100 may include:

[0069] Confluence structure 101;

[0070] A current source device 102 for providing current to the bus structure 101;

[0071] The current signal control device 103 is connected to the current source device 102 and the data transmission device 104 respectively, and is used to control the current output by the current source device 102 and collect the reference current output by the current source device 102 within the target period;

[0072] A data transmission device 104, the data transmission device 104 is respectively connected to the current signal control device 103, the processor 105 and at least one current sensor 106; each current sensor 106 is arranged on the bus structure 101, the current sensor 106 is used to collect the test current flowing through the bus structure 101 within the target period, and the data transmission device 104 is used to obtain the reference current and the test current within the target period; and send the reference current and the test current within the target period to the processor 105;

[0073] The processor 105 is used to integrate the reference current within the target time period to obtain the total reference charge within the target time period, and to integrate the test current collected by each current sensor within the target time period to obtain the total test charge within the target time period; respectively determine the difference index between the total reference charge and each total test charge; and determine the error of the corresponding current sensor 106 according to each difference index.

[0074] Exemplarily, the bus structure 101 may be a conductive material disposed in a circuit.

[0075] In one example, the bus structure may be made of a conductive metal, for example, the bus structure may be a copper bus.

[0076] Exemplarily, at least one current sensor may be provided in the bus structure 101 to detect the current value flowing through the bus structure 101 .

[0077] Exemplarily, the current source device 102 may be a high-precision current source. The current source device 102 is connected to the bus structure 101, and can provide a high-precision, high-stability, and low-noise current signal to the bus structure 101. It is understood that high precision may mean that the error between the current value actually output by the current source and the preset current value is extremely small.

[0078] In one example, the current source device may be a current source device with an accuracy of 0.01%.

[0079] Exemplarily, the current signal control device 103 is respectively connected to the current source device 102 and the data transmission device 104. Furthermore, the current signal control device 103 can control the current output by the current source device 102, and can also be used to collect the reference current of the current source device in the target period.

[0080] In one example, the current signal control device can collect the current of the current source device at a preset frequency during the target period to obtain multiple current values, and calculate the average value of the multiple current values ​​as the reference current of the current source device during the target period.

[0081] In another example, the current signal control device can use the current value collected at any time point in the target period as the current of the current source device in the target period. For example, the target period can be 10 milliseconds (ms), and the current of the current source device can be collected every 10 ms as the reference current.

[0082] In one example, the current signal control device may be a data acquisition system.

[0083] Exemplarily, the data transmission device 104 is respectively connected to the current signal control device 103, the processor 105 and at least one current sensor 106. Among them, one or more current sensors can be arranged on the bus structure 101 to collect the test current flowing through the bus structure 101 in the target period.

[0084] The data transmission device 104 is connected to the current signal control device 103 and at least one current sensor 106, so as to obtain the reference current of the current source device 102 in the target period and the test current of one or more current sensors 106 in the target period. In addition, the data transmission device 104 is also connected to the processor 105, so as to transmit the obtained reference current and the reference current to the processor 105.

[0085] In one example, the data transmission device may be a Controller Area Network (CAN) transceiver device, and the current signal control device and one or more current sensors may be connected to the same CAN bus to achieve connection with the data transmission device. It is understandable that the CAN transceiver device may communicate with the current signal control device and one or more current sensors through the CAN protocol to achieve transmission of the current signal.

[0086] In one example, in order to distinguish the current corresponding to the current source device from each current sensor, data representation can be added during current signal transmission to distinguish the current corresponding to the current source device from each current sensor. For example, when the data transmission device is a CAN transceiver, each current sensor and current signal control device can send a CAN message to the CAN transceiver to transmit the current value of each current sensor and current source device. At this time, the message ID number can be set to distinguish the current corresponding to the current source device from each current sensor.

[0087] Alternatively, the data transmission channel of the data transmission device may be configured accordingly in advance, thereby ensuring that the current corresponding to the current source device and each current sensor can be distinguished.

[0088] Exemplarily, after receiving the test current and the reference current, the processor 105 can integrate the reference current in the target period by the ampere-hour integration method to obtain the total reference charge in the target period, and integrate the test current collected by each current sensor 106 in the target period by the ampere-hour integration method to obtain the total test charge of the battery in the target period. Furthermore, the processor 105 can determine the difference index between the total reference charge and each test charge, and determine the error of the corresponding current sensor 106 according to each difference index.

[0089] The battery is a device for supplying power to the bus structure 101. It is understood that the current flowing into the bus structure can be adjusted by the current source device 102.

[0090] In the embodiment of the present application, the current sensor error measurement system can provide current to the confluence structure through a current source device, wherein one or more current sensors are provided in the confluence structure, so that the one or more current sensors can determine the current size in the confluence structure within the target period and obtain the test current. In addition, the one or more current sensors can send the detected test current to the processor through the data transmission device connected thereto, and after receiving the test current, the processor can integrate the test current collected by each current sensor within the target period by the ampere-hour integration method, thereby obtaining multiple test charge totals. Further, the current sensor error measurement system can also include a current signal control device to control the current size of the current source output and collect the reference current output by the current source device, and send the reference current to the processor through the data transmission device connected to the current signal control device, so that the processor can integrate the reference current within the target period by the ampere-hour integration method to obtain the reference charge total of the battery within the target period. Further, the processor can determine the difference index between the reference charge total and each test charge total; according to each difference index, determine the error of the corresponding current sensor, thereby realizing the error measurement of the current sensor.

[0091] In some optional embodiments, when there are multiple current sensors, the processor 105 is further configured to: compare the error sizes of the multiple current sensors to obtain a comparison result; and determine a target current sensor with the smallest error from the multiple current sensors according to the comparison result.

[0092] In the embodiment of the present application, a current sensor with the smallest error among multiple current sensors may be determined as a target current sensor, thereby ensuring that the current sensor has high accuracy during use.

[0093] In order to accurately measure the error of the current sensor, it is necessary to ensure the single variable characteristics when performing current sensor error detection. As another implementation method of the present application, the present application also provides another implementation method of the current sensor error measurement system. Please refer to the following embodiments for details.

[0094] Figure 2 This is a schematic diagram of the architecture of a current sensor error measurement system provided by another embodiment of the present application. Figure 2 As shown, the current sensor error measurement system 100 may further include: a receiving device 107 for receiving the bus structure 101 .

[0095] Exemplarily, the receiving device 107 may contain a bus structure 101 and one or more current sensors 106 .

[0096] Exemplarily, placing the bus structure 101 in the containing device 107 can ensure that one or more current sensors in the bus structure 101 will not be disturbed by factors such as ambient temperature and electromagnetic environment when collecting current, thereby ensuring that when performing error detection on the current sensor, the variable is only the current size collected by the current sensor, realizing the single variable principle in the error measurement process, and improving the accuracy of the current sensor in error measurement.

[0097] In some optional embodiments, the containing device may include a controllable temperature and humidity device, which is used to set the ambient temperature and humidity information when the current sensor collects current. This ensures that the current sensor can collect current in the same temperature and humidity environment, thereby improving the accuracy of the error measurement of the current sensor. In one example, the controllable temperature range of the controllable temperature and humidity device may be -40 degrees Celsius (℃) -125℃, and the controllable humidity range may be 0-100%, where humidity is relative humidity (RH).

[0098] Furthermore, the current sensor error measurement method provided in the embodiment of the present application is introduced in detail.

[0099] Figure 3 The following is a flow chart of a current sensor error measurement method provided by an embodiment of the present application. Figure 3 As shown, the current sensor error measurement method may include the following steps:

[0100] S310, obtaining a reference current and a test current within a target period.

[0101] The reference current is the current flowing through the bus structure and continuously collected by the current signal control device, and the test current is the current collected by at least one current sensor arranged on the bus structure.

[0102] Exemplarily, the processor may obtain a reference current of the circuit within the target period and a test current in the bus structure collected by at least one current sensor within the target period.

[0103] The reference current may be the current output by the current source device collected by the current signal control device during the target period, and the test current may be the current passing through the bus structure collected by one or more current sensors provided in the bus structure.

[0104] S320, integrating the reference current in the target time period to obtain the total reference charge in the target time period, and integrating the test current collected by each current sensor in the target time period to obtain the total test charge in the target time period.

[0105] For example, after receiving the reference current and the test current, the processor may calculate the total reference charge and the total test charge respectively according to the integration method. The integration method may be expressed as the following formula (1):

[0106] (1)

[0107] in, represents integration, Q can represent the charge, i.e., the reference charge or the test charge; I(t) can represent the reference current or the test current received by the processor; t can represent time, and the time period t1-t2 can correspond to the target time period. It can be understood that formula (1) represents the integration of the current in the time period t1-t2 to obtain the corresponding charge, i.e., the reference charge or the test charge.

[0108] S330, respectively determining a difference index between the reference total charge and each test total charge.

[0109] Exemplarily, the difference index between the reference total charge and each test total charge can be calculated respectively, wherein the difference index can be used to characterize the difference between each test total charge and the reference total charge.

[0110] S340: Determine the error of the corresponding current sensor according to each difference indicator.

[0111] Exemplarily, the processor may determine the error of the corresponding current sensor according to the difference information between each reference charge amount and the test charge amount.

[0112] In the embodiment of the present application, after receiving the test current and the reference current, the processor can integrate the current collected by each current sensor in the target period by the ampere-hour integration method, thereby obtaining the reference charge total amount and multiple test charge total amounts. Further, the error of each current sensor is calculated by using the difference index between the reference charge total amount and each test charge total amount, thereby realizing the current sensor error calculation, thereby ensuring that the accuracy of the current sensor can be determined when the current sensor is used.

[0113] Exemplarily, to ensure that the current sensor can accurately collect the current value within its range, the current source device can set multiple current dwelling points so that the current sensor collects the current value corresponding to each current dwelling point. Therefore, the target time period is determined according to the dwelling time of at least one current dwelling point configured for the current sensor, and at least one current dwelling point is determined according to the range of the current sensor.

[0114] In the embodiment of the present application, after obtaining one or more current sensors that can determine the current size in the bus structure within the target period, that is, the test current, and the reference current flowing through the bus structure, the test current and the reference current collected by each current sensor within the target period can be integrated respectively, thereby obtaining multiple test charge totals and the reference charge totals corresponding to the reference current. Further, the difference index of the reference charge total and each test charge total can be determined respectively; according to each difference index, the error of the corresponding current sensor is determined, thereby realizing the error measurement of the current sensor.

[0115] In order to obtain the test current and the reference current, as another implementation of the present application, the present application also provides another implementation of the current sensor error measurement method, please refer to the following embodiments for details.

[0116] Figure 4 A flow chart of a current sensor error measurement method provided by another embodiment of the present application. Figure 4 As shown, the current sensor error measurement method may include the following steps:

[0117] S410, obtaining the actual current passing through the current converging structure at the current dwelling point measured by the current signal control device at each dwelling time, and obtaining a reference current within each dwelling time.

[0118] S420, obtaining the actual current passing through the current converging structure at the current dwelling point measured by each current sensor at each dwelling time, and obtaining the test current within each dwelling time.

[0119] S430, integrating the reference current in the target time period to obtain the total reference charge in the target time period, and integrating the test current collected by each current sensor in the target time period to obtain the total test charge in the target time period.

[0120] S440, respectively determining a difference index between the reference total charge and each test total charge.

[0121] S450: Determine the error of the corresponding current sensor according to each difference indicator.

[0122] Exemplarily, steps S430-S450 are consistent with steps S320-S340, and will not be described in detail here.

[0123] In some embodiments, in step S410, the controller may adjust the output current of the current source device so that the current source device can output a preset dwell current and maintain the dwell current within the dwell time.

[0124] Exemplarily, the resident current output by the current source device may be taken as the actual current flowing into the bus structure.

[0125] It is understandable that the dwell time and the size of the current dwell point can be preset by a technician based on experience; or, can be determined based on the working environment in which the current sensor is required to be located.

[0126] Exemplarily, the adjustment of different current dwelling points can be achieved by adjusting the current source device. The current source device can be adjusted by a technician; or the current source device can be adjusted by a processor.

[0127] For example, for different dwell currents, the corresponding dwell times may be the same or different. The reference charge amounts flowing through the current converging device at the corresponding dwell times for different reference currents may be calculated respectively.

[0128] Exemplarily, the target time period may include one or more dwell time periods, and the one or more dwell time periods may be equal time periods or unequal time periods.

[0129] In some optional embodiments, the current dwelling point may include multiple ones, and the span between the current dwelling points may be determined by the range of the current sensor, wherein the range of the current sensor may be a current range consisting of the maximum value and the minimum value of the current that the current sensor can test.

[0130] Exemplarily, the range in which the current dwell point can be set may be the minimum value of the range of one or more current sensors.

[0131] It can be understood that in the embodiment of the present application, the current dwell point can be determined by the range of the current sensor. This can ensure that when the current sensor determines the error, by integrating each dwell point, the determined error can reflect the error situation of the entire range of the current sensor, making the error detection more accurate.

[0132] In some optional embodiments, the range of the current sensor includes [-A, +B], where A and B are both real numbers. The multiple current retention points include at least one first current in the first direction and at least one second current in the second direction. The values ​​of the first current and the second current are equal or unequal, and the first direction and the second direction are opposite to each other. It can be understood that the current sensor can detect positive and negative values ​​of the current, wherein the first direction can be the negative direction of the current value, and the second direction can be the positive direction of the current value; or the first direction can be the positive direction of the current value, and the second direction can be the negative direction of the current value. In addition, one or more current retention points can be set along the first direction of the current and the second direction of the current within the range of the current sensor, that is, at least one first current can be set in the first direction of the current, and at least one second current can be set in the second direction.

[0133] In one example, Figure 5 As shown, Figure 5 A schematic diagram of the dwell time and current dwell point provided by one embodiment of the present application. Among them, the horizontal axis can represent time, and the vertical axis can represent the current magnitude. It can be understood that the current dwell point can be ±I1 ampere (A), ±I2A and ±I3A, and when the current dwell point is +I1A, the dwell time can be T1 hour (H); when the current dwell point is +I2A, the dwell time can be T2H; other current dwell points exist at the corresponding dwell time.

[0134] In the embodiment of the present application, by combining the first current and the second current of different current directions in the current sensor range, it is ensured that the acquired current value is universal, thereby improving the accuracy of error detection of the current sensor.

[0135] In some optional embodiments, at least one first current includes multiple first currents of different magnitudes; and / or at least one second current includes multiple second currents of different magnitudes. It is understandable that by obtaining multiple current values ​​of different current directions, the accuracy of current sensor error detection is improved.

[0136] In some embodiments, in step S420 , one or more current sensors may obtain the current flowing through the bus structure at each current retention point, and send the respective detected currents to the sensors as test currents.

[0137] In an embodiment of the present application, by ensuring the accuracy of the actual current flowing through the bus structure and the test current measured by the current sensor, the accuracy of the difference index between the total reference charge and each test charge is ensured, thereby ensuring the accuracy of the error of the current sensor.

[0138] In order to calculate the reference total charge and the test total charge, as another implementation of the present application, the present application also provides another implementation of the current sensor error measurement method, which is specifically referred to in the following embodiments.

[0139] Figure 6 A flow chart of a current sensor error measurement method provided by another embodiment of the present application. Figure 6 As shown, the current sensor error measurement method may include the following steps:

[0140] S610: Obtain a reference current and a test current within a target period.

[0141] S620, obtaining the actual current passing through the current converging structure at the current dwelling point measured by each current sensor at each dwelling time, and obtaining the test current within each dwelling time.

[0142] S630 . For each dwell time, integrate the reference current within the dwell time within the dwell time to obtain a reference charge amount within the dwell time.

[0143] S640: sum the reference charge amounts within each dwell time to obtain a total reference charge amount within the target time period.

[0144] S650 , for each dwell time, integrating the test current within the dwell time within the dwell time to obtain the test charge within the dwell time.

[0145] S660: sum the test charge amounts within each dwell time to obtain the total test charge amount of the current sensor within the target time period.

[0146] S670, respectively determine a difference index between the reference total charge and each test total charge.

[0147] S680: Determine the error of the corresponding current sensor according to each difference indicator.

[0148] Exemplarily, steps S610-S620 are consistent with steps S410-S420, and steps S670-S680 are consistent with steps S440-S450, which will not be described in detail here.

[0149] In some embodiments, in S630, for each dwell time, the reference current may be integrated within the dwell time to obtain a reference charge amount within the dwell time.

[0150] For example, formula (1) can be used to calculate the corresponding reference charge amount within the dwell time by setting I(t) to the reference current value collected during the dwell time and setting t1-t2 to the time value corresponding to the dwell time.

[0151] In some embodiments, in S640, after the reference charge amount corresponding to each dwell time is calculated, the reference charge amount within each dwell time may be added to obtain the total reference charge amount corresponding to the dwell time.

[0152] In some embodiments, in S650, for each dwell time, the test current corresponding to each dwell time may be integrated to obtain the test charge amount within the dwell time.

[0153] For example, formula (1) can be used to calculate the corresponding test charge amount within the dwell time by setting I(t) to the test current value collected during the dwell time and setting t1-t2 to the time value corresponding to the dwell time. It is understandable that different current sensors have different accuracies, and the current values ​​they detect may have some differences.

[0154] In some embodiments, in S660, after the test charge corresponding to each dwell time is calculated, the reference charge of the same current sensor in each dwell time may be summed to obtain the total test charge in the target time period.

[0155] In an embodiment of the present application, when there are multiple mainstream durations in the target time period, the reference charge and the test charge corresponding to each residence time can be calculated separately, and the reference charge and the test charge corresponding to the calculated residence time can be summed separately, so that the reference total charge and the test total charge in the target time period can be determined.

[0156] In order to determine the difference index, as another implementation of the present application, the present application also provides another implementation of the current sensor error measurement method, and see the following embodiments for details.

[0157] Figure 7 A flow chart of a current sensor error measurement method provided by another embodiment of the present application. Figure 7 As shown, the current sensor error measurement method may include the following steps:

[0158] S710 , obtaining a reference current and a test current within a target period.

[0159] S720, integrating the reference current in the target time period to obtain the total reference charge in the target time period, and integrating the test current collected by each current sensor in the target time period to obtain the total test charge in the target time period.

[0160] S730, respectively calculating the total charge difference between the reference total charge and each test total charge. Exemplarily, the processor may calculate the difference between the reference total charge and each test total charge, and use the difference as the total charge difference corresponding to each current sensor.

[0161] S740 . For each total charge difference, calculate the ratio of the total charge difference to the reference total charge to obtain a difference index.

[0162] Exemplarily, the processor may determine the error index of the corresponding current sensor according to the calculated difference. In one example, the error index may be determined by the error value corresponding to the total charge difference, wherein the error value may be calculated using the following formula (2):

[0163] (2)

[0164] Among them, d can represent the error value; It can be the total amount of test charge; Can be a reference to the total amount of charge.

[0165] Exemplarily, the error indicator may be used to characterize the error condition of current sensing.

[0166] S750: Determine the error of the corresponding current sensor according to each difference indicator.

[0167] Among them, illustratively, steps S610-S620 are consistent with steps S310-S320, and step S750 is consistent with step S340, which will not be described in detail here.

[0168] In the embodiment of the present application, the total charge difference between the test charge and the reference charge is calculated, and a difference index is determined based on the difference, thereby improving the accuracy of the current sensor measurement.

[0169] In order to determine the target current sensor, as another implementation of the present application, the present application also provides another implementation of the current sensor error measurement method, and details are shown in the following embodiments.

[0170] Figure 8 A flow chart of a current sensor error measurement method provided by another embodiment of the present application. Figure 8 As shown, the current sensor error measurement method may include the following steps:

[0171] S810, obtaining a reference current and a test current within a target period.

[0172] S820, integrating the reference current in the target time period to obtain the total reference charge in the target time period, and integrating the test current collected by each current sensor in the target time period to obtain the total test charge in the target time period.

[0173] S830, respectively determine a difference index between the reference total charge and each test total charge.

[0174] S840: Compare the error sizes of multiple current sensors to obtain a comparison result.

[0175] Among them, steps S810-S840 are consistent with steps S310-S340, and will not be described in detail here.

[0176] Exemplarily, in the case of multiple current sensors, the processor can compare the errors corresponding to the current sensors to obtain a comparison result. In one example, the errors corresponding to the sensors can be sorted by comparing the errors corresponding to the sensors. For example, the error values ​​corresponding to the three current sensors can be sorted in ascending order.

[0177] S850 . Determine a target current sensor with the smallest error from the multiple current sensors according to the comparison result. Determine the error of the corresponding current sensor according to each difference indicator.

[0178] Exemplarily, after obtaining the comparison result, the processor can determine the current sensor with the smallest error value through the comparison result, and use the current sensor with the smallest error value as the target current sensor. In one example, the processor can determine the current sensor with the smallest error value based on the error ranking corresponding to each sensor.

[0179] In an embodiment of the present application, the processor can compare the error values ​​corresponding to each current sensor after calculating the errors corresponding to each current sensor, so as to determine the current sensor with the smallest error value as the target sensor. In this way, when the target sensor is applied to a scenario where current is used for processing, it is ensured that the current detected by the target current sensor in the scenario can have a high degree of accuracy, thereby providing a solid and reliable foundation for scenarios that require current detection.

[0180] In order to ensure the accuracy of the current sensor error, when collecting current, it is necessary to ensure that one or more current sensors are in the same environment, so as to ensure the single variable feature of the current sensor when measuring the error. Therefore, the present application also provides another implementation of the current sensor error measurement method, see the following embodiments for details.

[0181] Fig. 9 A flow chart of a current sensor error measurement method provided by another embodiment of the present application. Fig. 9 As shown, the current sensor error measurement method may include the following steps:

[0182] S910: Obtain a first environmental condition in an environment where at least one current sensor is located.

[0183] Exemplarily, the processor can obtain the actual environmental conditions in which one or more current sensors are located. In one example, one or more current sensors can be located in a containing device, and the containing device can ensure that the one or more current sensors can be in the same actual environmental conditions. For example, the containing device can be a controllable temperature and humidity device. Among them, the processor can be connected to the controllable temperature and humidity device to achieve adjustment and acquisition of environmental conditions. Further, it can be understood that the processor can simulate the working environment of the current sensor by adjusting the temperature and / or humidity in the controllable temperature and humidity device, and then determine the errors of each current sensor under the corresponding working environment.

[0184] S920: Obtain a reference current and a test current within a target period.

[0185] S930, integrating the reference current in the target time period to obtain the total reference charge in the target time period, and integrating the test current collected by each current sensor in the target time period to obtain the total test charge in the target time period.

[0186] S940, respectively determine a difference index between the reference total charge and each test total charge.

[0187] S950: Determine an error of the current sensor under the first environmental condition according to each difference indicator.

[0188] Exemplarily, steps S920-S940 are consistent with steps S310-S340, and will not be described in detail here.

[0189] Exemplarily, after obtaining the test current of each current sensor in the first environmental condition, the processor can use the integration method to determine the total test charge under the environmental condition. Moreover, after receiving the reference current, the processor can also calculate the total reference charge. Then, the difference index value is determined, and the error value of each current sensor under the actual environmental condition is determined.

[0190] In the embodiment of the present application, the first environmental condition corresponding to one or more current sensors is obtained, thereby ensuring that the one or more sensors are in the same environment, so that the error calculated for the current sensor is more accurate.

[0191] Furthermore, in order to ensure the universal applicability of the current sensor, as an embodiment of the present application, the present application also provides another implementation of the current sensor error measurement method, and please refer to the following embodiments for details.

[0192] Fig.10 A flow chart of a current sensor error measurement method provided by another embodiment of the present application. Fig.10 As shown, the current sensor error measurement method may include the following steps:

[0193] S1010. Obtain a first environmental condition in an environment where at least one current sensor is located.

[0194] S1020, obtaining a reference current and a test current within a target period.

[0195] S1030, integrating the reference current in the target time period to obtain the total reference charge in the target time period, and integrating the test current collected by each current sensor in the target time period to obtain the total test charge in the target time period.

[0196] S1040, respectively determine a difference index between the reference total charge and each test total charge.

[0197] S1050: Determine an error of the current sensor under the first environmental condition according to each difference indicator.

[0198] Exemplarily, steps S1010-S1050 are consistent with steps S910-S950, and are not described in detail here.

[0199] S1060: Obtain an error of each current sensor under at least one second environmental condition.

[0200] Illustratively, the first environmental condition may be another environmental condition different from the first environmental condition.

[0201] Exemplarily, the processor may obtain error values ​​of each current sensor under different environmental conditions, and calculate the errors corresponding to each current sensor when the current sensor is in different environmental conditions.

[0202] In one example, the processor can adjust the environmental conditions of the current sensor by adjusting the temperature and humidity in a containing device, such as a controllable temperature and humidity device, so as to determine the environmental conditions of the current sensor and calculate the error value corresponding to the current sensor under different environmental conditions.

[0203] In another example, the environmental conditions of one or more current sensors can be adjusted by relevant technicians, and the processor can detect the environment in which the one or more current sensors are located to obtain the environmental conditions corresponding to the one or more current sensors. Further, the processor can calculate the error values ​​corresponding to the current sensors under different environmental conditions.

[0204] S1070 . For each current sensor, determine a comprehensive error of the current sensor according to the errors under the first environmental condition and the second environmental condition.

[0205] Exemplarily, after calculating and obtaining the error values ​​of each current sensor under different environmental conditions, namely, the first environmental condition and the second environmental condition, the processor may determine the comprehensive error of each current sensor according to the errors under multiple different environmental conditions.

[0206] In one example, the comprehensive error corresponding to the current sensor can be obtained by performing weighted summation on the error values ​​under different environmental conditions.

[0207] In another example, the comprehensive error corresponding to the current sensor may be obtained by averaging the error values ​​under different environmental conditions.

[0208] In an embodiment of the present application, by obtaining the error of the current sensor under different environmental conditions and calculating the comprehensive error corresponding to the current sensor according to the error values ​​under different environments, the accuracy of the current sensor in current detection under various environments is observed, so that technicians can select current sensors suitable for various environmental conditions based on the comprehensive error.

[0209] Based on the current sensor error measurement method provided in the above embodiment, the present application also provides a specific implementation of a current sensor error measurement device. Please refer to the following embodiment.

[0210] See first Fig.11 The current sensor error measurement device 1100 provided in the embodiment of the present application includes the following units:

[0211] An acquisition module 1101 is used to acquire a reference current and a test current within a target period, wherein the reference current is a current flowing through the bus structure continuously acquired by a current signal control device, and the test current is a current acquired by at least one current sensor disposed on the bus structure;

[0212] The integration module 1102 is used to integrate the reference current in the target period to obtain the total reference charge in the target period, and to integrate the test current collected by each current sensor in the target period to obtain the total test charge in the target period;

[0213] A first determination module 1103 is used to determine a difference index between a reference total charge and each test total charge;

[0214] The second determination module 1104 is configured to determine an error of a corresponding current sensor according to each difference indicator.

[0215] In some embodiments, the target time period is determined according to a dwell time length of at least one current dwell point configured for the current sensor, and the at least one current dwell point is determined according to a range of the current sensor;

[0216] The acquisition module 1101 acquires the reference current and the test current within the target time period in the following manner: the actual current passing through the bus structure at the current residence point measured by the current signal control device during each residence time is acquired to obtain the reference current within each residence time; the actual current passing through the bus structure at the current residence point measured by each current sensor during each residence time is acquired to obtain the test current within each residence time.

[0217] The acquisition module 1101 integrates the reference current within the target time period in the following manner to obtain the total reference charge within the target time period: for each dwell time, the reference current within the dwell time is integrated within the dwell time to obtain the reference charge within the dwell time; the reference charge within each dwell time is summed up to obtain the total reference charge within the target time period; accordingly, the acquisition module 1101 integrates the test current collected by each current sensor within the target time period in the following manner to obtain the total test charge within the target time period: for each current sensor, execute respectively: for each dwell time, the test current within the dwell time is integrated within the dwell time to obtain the test charge within the dwell time; the test charge within each dwell time is summed up to obtain the total test charge of the current sensor within the target time period.

[0218] In some embodiments, at least one current dwelling point has a plurality of points, and the span of the plurality of current dwelling points is determined according to the range of the current sensor.

[0219] In some embodiments, the measuring range of the current sensor includes [-A, +B], where A and B are both real numbers; the multiple current residence points include at least one first current along a first direction and at least one second current along a second direction; the values ​​of the first current and the second current are equal or unequal, and the first direction and the second direction are opposite to each other.

[0220] In some embodiments, the at least one first current includes a plurality of first currents of different magnitudes; and / or the at least one second current includes a plurality of second currents of different magnitudes.

[0221] In some embodiments, the first determination module 1103 determines the difference index between the reference total charge and each test total charge in the following manner: respectively calculate the total charge difference between the reference total charge and each test total charge; for each total charge difference, calculate the ratio of the total charge difference to the reference total charge to obtain the difference index.

[0222] In some embodiments, the at least one current sensor includes a plurality of current sensors, and the second determination module 1104 is further configured to: compare the error sizes of the plurality of current sensors to obtain a comparison result; and determine a target current sensor with the smallest error from the plurality of current sensors according to the comparison result.

[0223] In some embodiments, before determining the error of the corresponding current sensor according to each difference indicator, the device also includes a third determination module: used to obtain a first environmental condition in the environment where at least one current sensor is located; the second determination module determines the error of the corresponding current sensor according to each difference indicator in the following manner: according to each difference indicator, determine the error of the current sensor under the first environmental condition.

[0224] In some embodiments, after determining the error of the current sensor under the first environmental condition according to each difference indicator, the second determination module 1104 is further used to: obtain the error of each current sensor under at least one second environmental condition; for each current sensor, determine the comprehensive error of the current sensor according to the errors under the first environmental condition and the second environmental condition.

[0225] Fig.12 A schematic diagram of the hardware structure of the current sensor error measurement provided in an embodiment of the present application is shown.

[0226] The current sensor error measurement device may include a processor 105 and a memory 1202 storing computer program instructions.

[0227] Specifically, the processor 105 may include a central processing unit (CPU), or an application specific integrated circuit (ASIC), or may be configured to implement one or more integrated circuits of the embodiments of the present application.

[0228] The memory 1202 may include a large capacity memory for data or instructions. By way of example and not limitation, the memory 1202 may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a magnetic tape, or a universal serial bus (USB) drive or a combination of two or more of these. Where appropriate, the memory 1202 may include a removable or non-removable (or fixed) medium. Where appropriate, the memory 1202 may be inside or outside the integrated gateway disaster recovery device. In a specific embodiment, the memory 1202 is a non-volatile solid-state memory.

[0229] The memory may include read-only memory (ROM), random access memory (RAM), magnetic disk storage media devices, optical storage media devices, flash memory devices, electrical, optical or other physical / tangible memory storage devices. Thus, typically, the memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the method according to an aspect of the present disclosure.

[0230] The processor 105 implements any one of the current sensor error measurement methods in the above embodiments by reading and executing computer program instructions stored in the memory 1202 .

[0231] In one example, the current sensor error measurement device may further include a communication interface 1203 and a bus 1210. Fig.12 As shown, the processor 105, the memory 1202, and the communication interface 1203 are connected via a bus 1210 and communicate with each other.

[0232] The communication interface 1203 is mainly used to implement communication between various modules, devices, units and / or equipment in the embodiments of the present application.

[0233] Bus 1210 includes hardware, software or both, and couples the components of online data traffic billing equipment to each other. For example, but not limitation, the bus may include accelerated graphics port (AGP) or other graphics bus, enhanced industrial standard architecture (EISA) bus, front-side bus (FSB), hypertransport (HT) interconnection, industrial standard architecture (ISA) bus, infinite bandwidth interconnection, low pin count (LPC) bus, memory bus, micro channel architecture (MCA) bus, peripheral component interconnect (PCI) bus, PCI-Express (PCI-X) bus, serial advanced technology attachment (SATA) bus, video electronics standard association local (VLB) bus or other suitable bus or two or more of these combinations. Where appropriate, bus 1210 may include one or more buses. Although the present application embodiment describes and shows a specific bus, the present application considers any suitable bus or interconnection.

[0234] The current sensor error measurement device can test the current and reference the current to perform the current sensor error measurement method in the embodiment of the present application, thereby realizing the combination of Figure 3 and Fig.12 A current sensor error measurement method and device are described.

[0235] In addition, in combination with the current sensor error measurement method in the above embodiment, the embodiment of the present application can provide a computer storage medium for implementation. The computer storage medium stores computer program instructions; when the computer program instructions are executed by a processor, any current sensor error measurement method in the above embodiment is implemented.

[0236] An embodiment of the present application further provides a computer program product, including a computer program, which implements any current sensor error measurement method in the above embodiments when the computer program is executed by a processor.

[0237] It should be clear that the present application is not limited to the specific configuration and processing described above and shown in the figures. For the sake of simplicity, a detailed description of the known method is omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the present application is not limited to the specific steps described and shown, and those skilled in the art can make various changes, modifications and additions, or change the order between the steps after understanding the spirit of the present application.

[0238] The functional blocks shown in the structural block diagram described above can be implemented as hardware, software, firmware or a combination thereof. When implemented in hardware, it can be, for example, an electronic circuit, an application-specific integrated circuit (ASIC), appropriate firmware, a plug-in, a function card, etc. When implemented in software, the elements of the present application are programs or code segments used to perform the required tasks. The program or code segment can be stored in a machine-readable medium, or transmitted on a transmission medium or a communication link by a data signal carried in a carrier. "Machine-readable medium" may include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, ROMs, flash memories, erasable ROMs (EROMs), floppy disks, CD-ROMs, optical disks, hard disks, optical fiber media, radio frequency (RF) links, etc. The code segment can be downloaded via a computer network such as the Internet, an intranet, etc.

[0239] It should also be noted that the exemplary embodiments mentioned in this application describe some methods or systems based on a series of steps or devices. However, this application is not limited to the order of the above steps, that is, the steps can be performed in the order mentioned in the embodiment, or in a different order from the embodiment, or several steps can be performed simultaneously.

[0240] Aspects of the present disclosure are described above with reference to the flowcharts and / or block diagrams of the methods, devices (systems) and computer program products according to the embodiments of the present disclosure. It should be understood that each box in the flowchart and / or block diagram and the combination of each box in the flowchart and / or block diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device to produce a machine so that these instructions executed by the processor of the computer or other programmable data processing device enable the implementation of the functions / actions specified in one or more boxes of the flowchart and / or block diagram. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field programmable logic circuit. It can also be understood that each box in the block diagram and / or flowchart and the combination of boxes in the block diagram and / or flowchart can also be implemented by dedicated hardware that performs the specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions.

[0241] The above is only a specific implementation of the present application. Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the systems, modules and units described above can refer to the corresponding processes in the aforementioned method embodiments, and will not be repeated here. It should be understood that the protection scope of the present application is not limited to this. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in this application, and these modifications or replacements should be included in the protection scope of this application.

[0242] Although the present application has been described with reference to preferred embodiments, various modifications may be made thereto and parts thereof may be replaced with equivalents without departing from the scope of the present application. In particular, the various technical features mentioned in the various embodiments may be combined in any manner as long as there is no structural conflict. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A current sensor error measurement method, characterized in that: include: Obtaining a reference current and a test current within a target period, wherein the reference current is a current flowing through a bus structure continuously collected by a current signal control device, and the test current is a current collected by a plurality of current sensors arranged on the bus structure, wherein the current signal control device is used to control the current output by a current source device, and collects the current output by the current source device at a preset frequency, and uses an average value of the plurality of collected current values ​​as a reference current output by the current source device in the target period; Integrating the reference current in the target time period to obtain a total reference charge in the target time period, and integrating the test current collected by each current sensor in the target time period to obtain a total test charge in the target time period; respectively determining a difference index between the reference total charge and each of the test total charges; Determining an error of the corresponding current sensor according to each of the difference indicators; Comparing the error sizes of the multiple current sensors to obtain a comparison result; According to the comparison result, determining a target current sensor with the smallest error from the plurality of current sensors; The target time period is determined according to the dwell time of at least one current dwell point configured for the current sensor, and the at least one current dwell point is determined according to the range of the current sensor; There are multiple at least one current dwelling point, and the span of the multiple current dwelling points is determined according to the range of the current sensor; The measuring range of the current sensor includes [-A, +B], where A and B are both real numbers; The multiple current retention points include at least one first current along a first direction and at least one second current along a second direction; the values ​​of the first current and the second current are equal or different, and the first direction and the second direction are opposite to each other.

2. The method according to claim 1, characterized in that The step of integrating the reference current in the target time period to obtain a total reference charge in the target time period includes: For each dwell time, integrating the reference current within the dwell time within the dwell time to obtain a reference charge amount within the dwell time; Adding the reference charge amounts within each of the dwell time periods to obtain a total reference charge amount within a target time period; Correspondingly, the step of integrating the test current collected by each current sensor in the target time period to obtain the total test charge in the target time period includes: For each current sensor, execute: For each dwell time, integrating the test current within the dwell time within the dwell time to obtain the test charge within the dwell time; The test charge amounts within each of the dwell time periods are summed up to obtain the total test charge amount of the current sensor within the target time period.

3. The method according to claim 1 or 2, characterized in that: The at least one first current includes a plurality of first currents of different magnitudes; And / or, the at least one second current includes a plurality of second currents of different magnitudes.

4. The method according to any one of claims 1 to 2, characterized in that: The step of respectively determining a difference index between the reference charge amount and each of the test charge amounts comprises: respectively calculating the total charge difference between the reference total charge and each of the test total charges; For each total charge difference, a ratio of the total charge difference to the reference total charge is calculated to obtain a difference index.

5. The method according to any one of claims 1-2, characterized in that: Before determining the error of the corresponding current sensor according to each of the difference indicators, the method further includes: Acquire a first environmental condition in an environment where the multiple current sensors are located; Determining the error of the corresponding current sensor according to each of the difference indicators includes: According to each of the difference indicators, an error of the current sensor under the first environmental condition is determined.

6. The method according to claim 5, characterized in that After determining the error of the current sensor under the first environmental condition according to each of the difference indicators, the method further includes: Obtaining an error of each of the current sensors under at least one second environmental condition; For each of the current sensors, a comprehensive error of the current sensor is determined according to the errors under the first environmental condition and the second environmental condition.

7. A current sensor error measurement system, characterized in that: include: Confluence structure; A current source device for providing current to the bus structure; A current signal control device, connected to the current source device and the data transmission device respectively, for controlling the current output by the current source device and collecting the reference current output by the current source device within a target period; The data transmission device is connected to the current signal control device, the processor and the plurality of current sensors respectively; Each of the current sensors is disposed on the bus structure, the current sensor is used to collect a test current flowing through the bus structure within the target period, and the data transmission device is used to obtain a reference current and the test current within the target period; and sending the reference current and the test current within the target period to a processor; The processor is used to integrate the reference current in the target period to obtain the total reference charge in the target period, and to integrate the test current collected by each current sensor in the target period to obtain the total test charge in the target period; Determine the difference index between the reference charge total amount and each test charge total amount respectively; determine the error of the corresponding current sensor according to each difference index; compare the error sizes of multiple current sensors to obtain a comparison result; determine the target current sensor with the smallest error from the multiple current sensors according to the comparison result; The target time period is determined according to a dwell time length of at least one current dwell point configured for the current sensor, and the at least one current dwell point is determined according to a range of the current sensor; There are multiple at least one current dwelling point, and the span of the multiple current dwelling points is determined according to the range of the current sensor; The measuring range of the current sensor includes [-A, +B], where A and B are both real numbers; The multiple current retention points include at least one first current along a first direction and at least one second current along a second direction; the values ​​of the first current and the second current are equal or different, and the first direction and the second direction are opposite to each other.

8. The current sensor error measurement system according to claim 7, characterized in that: The system further comprises: a receiving device for receiving the bus structure.

9. The current sensor error measurement system according to claim 8, characterized in that: The accommodating device includes a controllable temperature and humidity device, and the controllable temperature and humidity device is used to set the ambient temperature and humidity information when the current sensor collects current.

10. A current sensor error measurement device, characterized in that: The device comprises: An acquisition module, used to acquire a reference current and a test current within a target period, wherein the reference current is a current flowing through a bus structure continuously acquired by a current signal control device, and the test current is a current acquired by at least one current sensor disposed on the bus structure, wherein the current signal control device is used to control the current output by a current source device, and acquire the current output by the current source device at a preset frequency, and an average value of a plurality of acquired current values ​​is used as a reference current output by the current source device in the target period; An integration module, used to integrate the reference current in the target period to obtain a total reference charge in the target period, and to integrate the test current collected by each current sensor in the target period to obtain a total test charge in the target period; A first determination module, used to respectively determine a difference index between the reference total charge and each of the test total charges; A second determination module is configured to determine an error of the corresponding current sensor according to each difference index; compare the error sizes of the plurality of current sensors to obtain a comparison result; and determine a target current sensor with the smallest error from the plurality of current sensors according to the comparison result; The target time period is determined according to a dwell time length of at least one current dwell point configured for the current sensor, and the at least one current dwell point is determined according to a range of the current sensor; There are multiple at least one current dwelling point, and the span of the multiple current dwelling points is determined according to the range of the current sensor; The measuring range of the current sensor includes [-A, +B], where A and B are both real numbers; the multiple current retention points include at least one first current along a first direction and at least one second current along a second direction; the values ​​of the first current and the second current are equal or unequal, and the first direction and the second direction are opposite to each other.

11. A current sensor error measurement device, characterized in that: The device comprises: a processor and a memory storing computer program instructions; When the processor executes the computer program instructions, the current sensor error measurement method according to any one of claims 1 to 6 is implemented.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer program instructions, and when the computer program instructions are executed by a processor, the current sensor error measurement method according to any one of claims 1 to 6 is implemented.

13. A computer program product, characterized in that When the instructions in the computer program product are executed by a processor of an electronic device, the electronic device executes the current sensor error measurement method according to any one of claims 1 to 6.

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