High-frequency test pen device

Abstract

The invention relates to a high-frequency test pen device (5) for releasable contact with a contact object (1), in particular a board-to-board connector. The test pen device comprises an outer shell (6), an inner shell (10) which is at least partially elastically mounted in the outer shell and is used for moving relative to the outer shell at least in a longitudinal extension direction (9) of the test pen device and in a direction opposite to the longitudinal extension direction (9) of the test pen device, the inner shell (10) is provided with a first piston (20), and the inner shell (10) is provided with a second piston (30). The invention relates to a test pen device (5) comprising an outer shell (6), a first piston (20), preferably axially centered and resiliently mounted in the outer shell (6), and a centering piston (33), which is positioned and resiliently mounted at the end of the test pen device (5), the inner shell (10) further comprising a contact unit (11), which comprises at least two, preferably a plurality of contact elements (13, 14), the invention relates to a test pen device (5) for a contact object (1), comprising a contact element (13, 14) for contacting the contact object (1), which contact element is mounted in the contact unit and extends in a longitudinal extension direction (9) to a receptacle (16) at an end of the test pen device (5), the contact element (13, 14) being in the form of a pin-shaped contact element, preferably spring-loaded at both ends, the contact unit (11) is guided for an axial movement in the centering piston (33), and the centering piston (33) is guided for a movement in the first piston (20) of the inner housing (10) and overcomes a restoring force of a first spring device (15a), such that when the test pen device (5) is in a non-contact position, the centering piston (33) is moved in the first piston (20) of the inner housing (10). The centering piston is centered relative to the first piston (20) and, in a second position in which the test pen device contacts the contact object (1) and is at least partially compressed, the centering piston can be moved relative to the first piston (20) and preferably together with the contact unit (11) in a plane running perpendicular to the longitudinal extension direction (9).

Description

Technical Field

[0001] The present invention relates to a high-frequency test pen device for removably contacting a contact object in a high-frequency range. Background Art

[0002] Such a high-frequency test pen device is generally known from the prior art and is used to test the function of a contact object (e.g., an electronic component with a suitable bushing portion) in a test field or other test environment. The high-frequency test pen device is placed as a plug on the contact object to be tested so that the contact element of the high-frequency test pen device contacts the mating contact element of the contact object. The test signal is then applied to the contact object or transmitted from the contact object to the high-frequency test pen device via a suitable contact.

[0003] In conventional test operation, the contacting, which is usually carried out at periodic intervals, is then completed by the relative contact of the test pen device and the contact object to be tested. During the test process, especially in the field of high-frequency technology, a high contact quality is required, because insufficient electrical contact not only leads to higher wear and thus to a damaged service life, but also to insufficient resistance matching and thus to wave matching, resulting in undesired reflections and thus potentially incorrect contact or measurement results. At the same time, an optimized design of the contact elements and devices with respect to the transmission characteristics of high-frequency signals is required, in particular to minimize the probability of possible signal losses.

[0004] In particular, the contact object may be a so-called board-to-board connector. In addition to high-frequency mating contact elements (which typically have a frequency of 1 GHz or higher) for inputting or outputting high-frequency signals, such a board-to-board connector may also typically include non-high-frequency mating contact elements for inputting or outputting non-high-frequency signals and transmitting power.

[0005] DE102018131877 A1 discloses a contact head, for example, for a high-frequency test pen device, which has a housing and a plunger or piston, which is installed in the housing so as to be able to move axially and is arranged at an end, a plurality of linear layered contact elements are arranged in the piston for contacting a contact object, and the piston is reversibly guided between a protection position and a release position against the restoring force of at least one spring element in the housing, a portion of the spring element is sleeve-shaped, so that in the protection position, the contact element is arranged in the protection space, and in the release position, the contact element can at least partially protrude from the inner shell for contacting the contact object.

[0006] WO2021 / 151524A1 discloses a high-frequency test pen device for removably contacting a contact object, which includes layered contact elements, each of which has a zigzag shape area. The test pen device includes a fastening flange, which has a central hole and a cylindrical inner shell, in which the cylindrical inner shell is partially movably guided, and has a contact portion formed as an elastic mounting piston at the end, and the inner shell is firmly mounted relative to the fastening flange in a first contactless relative position by a guide device arranged on the hole of the fastening flange, and the inner shell can be at least partially rotated and / or tilted relative to the fastening flange in a second relative position in contact with the contact object. This enables tolerance compensation and improved alignment when contacting the contact object.

[0007] WO2021 / 215334A1 discloses a high-frequency test pen device having a contact portion, which is arranged at an end and has a plurality of coaxial contact pins installed therein for removably contacting a contact object. The contact pins are arranged in a cylindrical housing, which is movably mounted in a fastening flange and preloaded to a fixed position with a spring element. Summary of the invention

[0008] Based on the known state of the art, the object of the present invention is to provide an improved test pen device which enables reliable contact with a contact object to be tested and which thus preferably enables an optimized transmission of high-frequency signals.

[0009] This object is achieved by a high-frequency test probe device having the features of claim 1 .

[0010] A high-frequency test pen device for removably contacting a contact object, in particular a board-to-board connector, comprises: an outer shell; an inner shell, the inner shell is elastically mounted and at least partially in the outer shell and can move relative to the outer shell at least in the longitudinal direction of the test pen device and in the direction opposite to the longitudinal direction of the test pen device, and the inner shell has a first piston, the first piston is preferably axially centered and elastically mounted in the outer shell, and a centering piston, the centering piston is arranged and elastically mounted at the end of the test pen device, the inner shell also has a contact unit, the contact unit has at least two, preferably a plurality of contact elements mounted therein, for The contact element is a pin-shaped contact element, preferably spring-loaded on both sides, and the contact unit is guided to be able to move axially in the centering piston, and the centering piston is movably guided in the first piston of the inner shell to overcome the restoring force of the first spring device, so that the centering piston is installed in a centered manner relative to the first piston when not in contact with the test pen device, and is movably installed relative to the first piston, and is preferably installed together with the contact unit in a plane perpendicular to the longitudinal direction, when in contact with the contact object in at least a partially spring-offset position.

[0011] Since the invention aims to shape the contact element as a pin and preferably spring-loaded on both sides, an optimized signal transmission is allowed, in particular for high-frequency signals during the test process. The pin-shaped contact element allows effective and structurally simple shielding of the individual contact elements and thus a structurally simple design of a test pen device with simultaneously optimized signal transmission. The contact element is preferably designed as a coaxial contact spring pin or a so-called fine pitch pin that is spring-loaded on both sides.

[0012] The arrangement of the contact elements in the contact unit as contemplated by the invention, when in the non-contact position, the contact unit is guided so as to be axially movable in the centering piston, and the centering piston is designed so that it is centered and / or mounted in an axially determined manner relative to the housing together with the contact unit and the contact elements arranged therein, and when in the contact position for making contact with the contact object, the contact unit is mounted so as to be at least partially movable in a plane extending perpendicularly to the longitudinal direction, so that the centering piston and the contact unit and the associated contact elements can be precisely aligned to the contact object with tolerance compensation. At the same time, a compact design of the test pen device is made possible, thereby achieving an optimized alignment of the inner shell with the contact object, and in particular achieving an optimized alignment with the receiving portion arranged at the end, preferably arranged in a fixed position, relative to the housing.

[0013] Movement in a plane perpendicular to the longitudinal direction is understood to mean movement in at least one direction perpendicular to the longitudinal direction and in a direction opposite to at least one direction perpendicular to the longitudinal direction. A centered arrangement refers to an arrangement of the respective components relative to one another which is axially fixed in the longitudinal direction.

[0014] In a preferred embodiment, the centering piston comprises a centering portion on its outer peripheral surface, which is designed for interaction with a position-dependent guide portion of the first piston, which guide portion is designed to be complementary thereto. The centering portion is preferably designed in a conical or truncated cone shape and is mounted in a non-contact position in a guide portion, which is designed to rotate in opposite directions and is arranged in a preferably centrally arranged orifice of the first piston. In this position, the centering piston is preloaded against the first piston by the first spring device. In this position, the centering piston is centered in the orifice and / or axially fixed relative to the first piston.

[0015] The guide is arranged in a guide opening of the first piston, and advantageously the inner diameter of the opening at the end is larger than the outer diameter of the centering piston, so that the centering piston can be movably arranged in a contact position and / or a partial spring offset position in the opening, and in particular in a plane extending perpendicular to the longitudinal direction.

[0016] Further advantageously, the first piston has an inner guide and in particular a radial inner side, which is formed together with the centering piston and is in particular intended to selectively interact with a rear flange of the centering piston. Here, the radial inner side of the step of the first piston in which the centering piston is arranged and / or movably mounted can limit a lateral movement of the centering piston in the piston, in particular in a contact position or a partially spring-deflected position relative to the first piston. In particular, the third step of the first piston can be designed to limit a lateral movement of the centering piston in the piston in a stop-like manner. The first piston can be at least partially sleeve-shaped.

[0017] In a preferred embodiment, the test pen device has a resiliently mounted contact plate, which is axially movable relative to the centering piston and the contact unit, at least partially engaged in the receiving portion, and is designed to contact and center the contact object relative to the contact plate and / or the contact unit. The contact plate according to the invention enables further optimization of the alignment of the test pen device with the contact object. In particular, this enables optimal alignment of the individual contact elements with the contact object from the start of contact with the contact object.

[0018] The contact plate preferably has protruding and / or recessed centering elements for interaction with the contact object. Protruding centering elements can be, for example, one or more noses protruding onto the contact object, which noses are designed to selectively engage in the contact object. Recessed centering elements can be, for example, one or more recesses, into which a protruding part of the contact object or a protruding element can engage. Further advantageously, the contact plate comprises at least one, preferably several through-holes for the contact elements.

[0019] Advantageously, the contact plate can be movably mounted in the inner shell and / or the receiving space in a plane extending perpendicular to the longitudinal direction, i.e., in at least one direction perpendicular to the longitudinal direction and in at least one direction opposite to the longitudinal direction. In particular, the contact plate can be movably mounted in the inner shell or the receiving portion along a transverse direction perpendicular to the longitudinal direction and in a direction opposite to the transverse direction perpendicular to the longitudinal direction of the high-frequency test pen device, and / or along a depth direction perpendicular to the longitudinal direction and the transverse direction and in a direction opposite to the depth direction perpendicular to the longitudinal direction and the transverse direction of the high-frequency test pen device.

[0020] In a preferred embodiment, the contact plate is mounted in a guided manner that overcomes the restoring force of the second spring device, so that when the contact plate is not in contact with the contact object, the contact plate is arranged in a centered manner relative to the contact unit and / or the centering piston, and when in contact with the contact object in the partial spring deflection position, the second part is movably mounted relative to the contact unit and / or the centering piston in a plane perpendicular to the longitudinal direction. In addition, the second spring device and / or the contact plate are designed so that they are arranged in a centered manner relative to the contact unit and / or the centering piston in the full spring deflection position of the second spring device. This initially allows tolerance compensation and an optimized alignment of the contact object and the contact plate in the intermediate position of the partial spring deflection, and then a fixed spring deflection-guided alignment relative to the contact unit and the contact element can be produced in the full spring deflection position.

[0021] In a preferred embodiment, the second spring device comprises at least two, preferably at least four, guide elements extending in the longitudinal direction and each having a guide pin which is guided in a guide bushing with radial play, the guide pin having two opposite conical stops, each of which is arranged at the end and is designed to interact with a contact portion of the guide bushing which is preferably shaped like a conical portion and is formed complementarily in shape when in the non-contact position and the full spring deflection contact position of the contact plate. This results in a centered or axially fixed arrangement in the non-contact position and the full spring deflection contact position. The guide pins in the sleeve and / or the guide bushing have a lateral play at least in the partially spring deflected state of the contact plate, so that a movable arrangement or mounting in a plane perpendicular to the longitudinal direction is possible.

[0022] The contact plate can have a rectangular cross-sectional surface, the guide element being permanently arranged at each corner of the cross-sectional surface. In the contact position, the side of the contact plate facing the contact unit can at least partially abut the contact unit and / or the base of the contact unit, while the side of the contact plate facing away from the contact unit can at least partially abut the contact object.

[0023] In a preferred embodiment, the first piston of the inner housing is elastically mounted in the outer housing by a third spring device and is arranged in a manner that allows axial movement in the longitudinal direction and in a direction opposite to the longitudinal direction, the piston is preloaded relative to the outer housing and abuts against a first stop formed by the outer housing when in the non-contact position, and the third spring device has a greater elastic force than the first spring device and the second spring device. Preferably, the elastic force of the third spring device is greater than the elastic force of the first spring device or the second spring device. Further preferably, the elastic force of the third spring device is greater than the sum of the elastic forces of the first and second spring devices.

[0024] In a preferred embodiment, the test pen device is designed so that when the contact object is in contact against the longitudinal direction and as the spring deflection of the spring device of the test pen device increases, the centering piston is first spring-loaded to overcome the preload force of the first spring device, then the contact plate is spring-deflected to overcome the preload force of the second spring device, then the spring-loaded contact element is elastically mounted after contact with the contact object, and preferably then the first piston is spring-deflected in the housing to overcome the preload force of the third spring device.

[0025] In a preferred embodiment, a centering piston movable in the longitudinal direction and in a direction opposite to the longitudinal direction is elastically mounted relative to the contact unit by a first spring device, and when in the non-contact position, the centering piston is preloaded relative to the first piston and abuts against a second stop formed by the first piston.

[0026] The inner housing can advantageously have a spring plate which is firmly connected to the first piston and on which the third spring device is supported, the contact unit being arranged adjacent to the spring plate in the longitudinal direction so as to be surrounded by the first piston and the centering piston.

[0027] The receiving portion designed for contacting with the contact object is preferably arranged in the end of the centering piston. Advantageously, this includes an inner centering chamfer arranged on the inner circumference of the centering piston and used for interacting with the outer contour of the contact object.

[0028] In a preferred embodiment, the contact element has at least one high-frequency contact element extending in a first channel of a contact element carrier of the contact unit in the longitudinal direction and a non-high-frequency contact element extending in a second channel of the contact element carrier in the longitudinal direction, the first channel being completely spatially separated from the second channel.

[0029] The high-frequency contact element is intended for the input or output of a high-frequency signal, which is understood to be a signal with a frequency of 1 gigahertz or higher, and is used to make contact with a corresponding high-frequency mating contact element of a contact object. The non-high-frequency contact element is intended for the input or output of a non-high-frequency signal, in particular a direct current (DC) signal, and is used to make contact with a corresponding non-high-frequency mating contact element of a contact object. The non-high-frequency signal is especially understood to be a signal with a frequency of less than 1 gigahertz. In particular, the non-high-frequency signal can also be a low-frequency signal or a direct current (DC) signal.

[0030] In principle, the high-frequency contact element can be designed to be structurally identical to the non-high-frequency contact element. The high-frequency contact element and the non-high-frequency contact element can also be designed to be structurally different from each other to optimize the high-frequency signal and non-high-frequency signal used in combination with the high-frequency contact element and the non-high-frequency contact element, respectively.

[0031] The high-frequency contact element or the non-high-frequency contact element may have a first part and a second part, the first part being arranged in the first channel and / or the second channel of the contact element carrier of the contact unit, and the second part being arranged to protrude from the contact element carrier. Preferably, the first part can be firmly (i.e., immovably) connected to the contact element carrier. The linear pin shape of the high-frequency contact element and / or the non-high-frequency contact element makes it possible to form a first channel and / or a second channel extending substantially linearly in the longitudinal direction in a simple manner, for example in the form of a drill hole. The arrangement of the high-frequency contact element and / or the non-high-frequency contact element in the first channel and / or the second channel is also relatively simple, so that electromagnetic shielding of the high-frequency contact element and the non-high-frequency contact element can be achieved using simple means. Preferably, the high-frequency contact element or the non-high-frequency contact element is spring-loaded, and the second part can be spring-loaded relative to the first part. It is particularly preferred that the high-frequency contact element and / or the non-high-frequency contact element are spring-loaded on both sides. In this case, the high-frequency contact element and / or the non-high-frequency contact element can have a third part, which is adjacent to the first part, extends in a direction opposite to the longitudinal direction, and can be spring-loaded relative to the first part. Advantageously, the high-frequency contact element and / or the non-high-frequency contact element is pin-shaped and spring-loaded on both sides. The suspension on both sides supports the high-frequency test pen device to make a firm contact with the contact object and ensures tolerance compensation in the longitudinal direction and / or in a direction opposite to the longitudinal direction. The high-frequency contact element and / or the non-high-frequency contact element may include one or two spring elements to realize the suspension.

[0032] The first channel and / or the second channel of the contact element carrier can have a cylindrical shape and be designed in the form of a hole. However, other shapes are also conceivable, for example a cuboid shape.

[0033] The high-frequency contact element and the non-high-frequency contact element are arranged in different channels that are completely separated from each other in space, which means that the high-frequency contact element is electromagnetically shielded from the non-high-frequency contact element. In particular, the wall of the contact element carrier defining the first channel can form a sleeve around the high-frequency contact element, which is closed on all sides of the radial direction of the high-frequency contact element and serves as an insulating bushing. Advantageously, the high-frequency contact element and the first channel are coaxially arranged with each other. Similarly, the wall of the contact element carrier defining the second channel can form a sleeve around the non-high-frequency contact element, which is closed on all sides of the radial direction of the non-high-frequency contact element and can be used as an insulating bushing, and in addition, it is electromagnetically shielded from the high-frequency contact element. Therefore, electromagnetic shielding or isolation can minimize or largely avoid crosstalk between high-frequency signals passing through high-frequency contact elements and non-high-frequency signals passing through non-high-frequency contact elements, so that the high-frequency test pen device according to the present invention can be used to optimize and / or accurately test a contact object, which includes at least one non-high-frequency mating contact element and at least one high-frequency mating contact element, and the high-frequency mating contact element is electromagnetically shielded from the non-high-frequency mating contact element (especially such a board-to-board connector).

[0034] The spring system of the test pen device as described above preferably includes a first spring device, a second spring device and a third spring device, and the spring system supports the high-frequency test pen device to make firm contact with the contact object. The spring system preloads the inner shell relative to the outer shell in the non-contact position, so that the second part of the high-frequency contact element and / or the non-high-frequency contact element is completely protected from external influences in the inner shell when in the non-contact position. The second part protruding from the contact element is usually very slender and therefore has great potential to be easily bent or broken under mechanical load. When the high-frequency test pen device is transferred from the non-contact position to the contact position, the high-frequency contact element and / or the non-high-frequency contact element correspondingly protrudes further out of the inner shell, and preferably extends at least partially into the receiving part formed by the inner shell, so that the contact object can be contacted.

[0035] Advantageously, the outer shell can be formed in several parts, in particular in two parts. If the outer shell has a two-piece design, it can include a base part, which accommodates the inner shell and is at least partially sleeve-shaped, and a cover part, which adjoins the base part and extends in a direction opposite to the longitudinal direction. However, the outer shell can also be formed in one piece. Furthermore, the inner shell can be formed in one piece or in several pieces.

[0036] The geometrical arrangement and / or alignment of the high-frequency contact elements and / or the non-high-frequency contact elements can generally be adapted to the contact object to be contacted.

[0037] In one embodiment, the contact unit may include two high-frequency contact elements, a separate first channel can be formed in the contact element carrier of each high-frequency contact element, and the contact unit may include at least two, preferably six non-high-frequency contact elements, a common second channel can be formed in the contact element carrier of the non-high-frequency contact elements, and the non-high-frequency contact elements can be arranged (preferably in opposite rows) between the high-frequency contact elements. The fact that a separate first channel can be provided for each high-frequency contact element means that the high-frequency contact element can be electromagnetically shielded in particular from other high-frequency contact elements. Since the crosstalk between non-high-frequency signals is reduced or even non-existent, the non-high-frequency contact elements can be arranged in the common second channel, making the contact element carrier easier to manufacture. At the same time, a separate second channel can be formed for each non-high-frequency contact element, which can cause additional electromagnetic shielding between the non-high-frequency contact elements. In principle, more than two high-frequency contact elements can also be arranged. In principle, the non-high-frequency contact elements may also not be arranged between the high-frequency contact elements.

[0038] Advantageously, the high-frequency contact element and / or the non-high-frequency contact element can be fastened and centered in the first channel and / or the second channel to pass through the fastening device in the longitudinal direction by the fastening element of the contact unit, each fastening element is preferably substantially inserted at the end of the first channel and / or the second channel, and is made of a plastic material, preferably polytetrafluoroethylene (PTFE). The fastening element can only be substantially arranged at the end of the first channel and / or the second channel, that is, it can only extend on the end of the first channel or the second channel, thereby further optimizing the signal quality or high-frequency characteristics. In addition, in the case where a plurality of non-high-frequency contact elements are arranged in a common second channel, a common fastening element substantially inserted at the end of the common second channel can be provided. Nevertheless, this may be intended to extend the fastening element over the entire length of the first channel and / or the second channel, connecting the ends to each other, thereby achieving uniform fastening and centering of the high-frequency contact element and / or the non-high-frequency contact element over the entire length of the first channel and / or the second channel.

[0039] In a preferred embodiment of the present invention, the contact element carrier may include: a base body, which has a first channel and a second channel and accommodates a high-frequency contact element and / or a non-high-frequency contact element; a fastening body, which is preferably plate-shaped and is preferably connected to the base body by screws; and a conductor plate, which is arranged between the base body and the fastening body, and the high-frequency contact element and / or the non-high-frequency contact element can be connected to the high-frequency conductor and / or the non-high-frequency conductor of the high-frequency test pen device in an electrically conductive manner via the conductor plate.

[0040] The high-frequency conductor and / or the non-high-frequency conductor can be a cable and / or a line, which can be used to input or output a high-frequency signal or a non-high-frequency signal, and can extend from the conductor plate in the opposite direction opposite to the longitudinal direction. The high-frequency conductor and / or the non-high-frequency conductor and the high-frequency contact element and / or the non-high-frequency contact element can be welded to the conductor plate, in particular via a third portion protruding from the substrate in the direction opposite to the longitudinal direction. Considering that the high-frequency conductor and / or the non-high-frequency conductor cannot be directly connected to the high-frequency contact element and / or the non-high-frequency contact element in a conductive manner, but only indirectly connected to the high-frequency contact element and / or the non-high-frequency contact element through the conductor plate, it is advantageous to expand the wiring range, because the high-frequency conductor can be fastened to the conductor plate at the fastening point of the high-frequency conductor relatively far from the fastening point of the non-high-frequency conductor on the conductor plate. This can also advantageously increase the electromagnetic shielding in the transition area between the high-frequency conductor and / or the non-high-frequency conductor and the high-frequency contact element and the non-high-frequency contact element. The conductor plate can extend in the radial direction of the high-frequency test pen device and / or in a plane perpendicular to the longitudinal direction. The fastening body can have a recess, through which the high-frequency conductor and / or the non-high-frequency conductor can be guided to the conductor plate. Preferably, the base body and / or the fastening body are made of metal, for example aluminium. The metal may have a coating.

[0041] The contact plate for making contact with a contact object in a receiving part according to the present invention preferably has a first through hole and a second through hole, wherein the first through hole is aligned with a first channel of a contact element carrier of a contact unit, and the high-frequency contact element at least partially passes through or can pass through the first through hole in a non-contact position or completely in a contact position; the second through hole is aligned with the second channel, and the non-high-frequency contact element at least partially passes through and / or can pass through the second through hole in a non-contact position, and the non-high-frequency contact element completely passes through and / or can pass through the second through hole in a contact position, and the first through hole can be formed completely separated from the second through hole in space. The wall of the contact plate surrounding all sides of the second part of the high-frequency contact element and / or the non-high-frequency contact element protrudes from the contact element carrier and at least partially passes through the first through hole or the second through hole, and can also protect the usually very slender second part from mechanical influences and provide additional electromagnetic shielding in the area of ​​the receiving part. If several high-frequency contact elements and / or non-high-frequency contact elements are provided, a separate first through hole can be formed for each high-frequency contact element, or a common second through hole can be formed for the non-high-frequency contact element. The contact plate and / or the contact portion may be formed integrally with the contact unit; in particular, the base body may form the contact portion or the contact plate. Advantageously, the contact portion and / or the contact plate may be formed as a separate component from the contact unit.

[0042] Preferably, the contact plate and / or the contact portion can be made of metal, such as stainless steel or a non-conductive material with a conductive coating, such as metallized plastic. The contact plate and / or the contact portion can also be formed using a 3D printing process, milling or sintering.

[0043] In addition, the contact plate in the contact position can abut the contact object to contact with the side of the contact plate facing away from the contact unit. The contact portion and / or the contact plate, in particular the side of the contact plate facing away from the contact unit, can be adapted to the contact object to be contacted so as to enable reliable contact.

[0044] Advantageously, on the side of the contact plate facing away from the contact unit, the contact plate can have at least one centering element, for example in the form of a nose, which at least partially surrounds the first through hole, protrudes in the longitudinal direction, is preferably formed integrally with the contact plate, and is brought into the recess of the contact object when engaged. In the contact position in which the high-frequency contact element and / or the non-high-frequency contact element completely passes through the first through hole and / or the second through hole, the nose can also electromagnetically shield the high-frequency contact element from the non-high-frequency contact element. The nose can be designed as a latching device, which can engage with the matching latching device of the contact object in the contact position. The second through hole can also be at least partially surrounded by at least one nose of the contact plate on the side facing away from the contact unit. Unlike a protruding centering element (for example in the form of a nose), the corresponding centering element can also be designed as a recessed centering element, for example a recess or a notch, which is designed to engage with the protruding contour of the contact object. For example, the first, second and third spring devices can each respectively include four spring elements. Particularly preferably, the first spring device comprises two spring elements and the second and third spring devices each comprise four spring elements.

[0045] The first piston of the inner shell can be designed as a step and include three steps, and the radial outer side of the first step of the three steps observed in the longitudinal direction can form a reverse stopper, which can be adjacent to the first stopper of the outer shell in a non-contact position. The radial inner side of the first step and the radial inner side of the second step of the three steps observed in the longitudinal direction can form a stopper for the contact unit, which can be arranged to be at least partially movable in the piston relative to the piston in the longitudinal direction and in the direction opposite to the longitudinal direction, and / or in a plane extending perpendicular to the longitudinal direction (that is, along or opposite to at least one direction perpendicular to the longitudinal direction). In other words, the radial inner side of the first step and the second step can limit the movement of the contact unit in the piston in a manner similar to a stopper. The piston can be at least partially sleeve-shaped.

[0046] The radially inner side of the third of the three steps viewed in the longitudinal direction can form a second stop, against which the centering piston abuts in the non-contact position. The first piston preferably has an aperture, through which the centering piston can at least partially engage with the center portion of the centering piston. The center portion can be sleeve-shaped, so that the center portion can at least partially receive the contact element carrier, in particular the base body, in a guided manner, and can have an aperture, which is arranged at the end in the longitudinal direction and in which the receiving portion is arranged and / or formed.

[0047] Advantageously, the first piston, the centering piston and the contact unit can be arranged coaxially with each other and / or coaxially with the longitudinal axis. In addition, the centering piston and / or the central part can have an abutment, to which the contact object can abut. In the contact position, the contact object can at least partially engage in the orifice of the central part.

[0048] The base body and the contacts can be held at ground potential (grounded).

[0049] The high frequency test pen device can be transferred from the non-contact position to the contact position in the following manner.

[0050] When the high-frequency test pen device is placed on a contact object, the contact object can first contact the centering piston and / or the central portion and / or the adjacent portion, whereby the spring element of the first spring device can be loaded and / or further loaded beyond the preload already applied, and the centering piston can disengage from the second stop of the first piston and move away from the second stop.

[0051] If the contact object then comes into contact with the contact portion and / or the contact plate, the spring element of the second spring device of the contact portion can also be loaded or further loaded beyond the preload already applied.

[0052] If the HF contact element and / or the non-HF contact element subsequently comes into contact with the HF mating contact element and / or the non-HF mating contact element of the contact object, the spring elements of the HF contact element and / or the non-HF contact element may also be loaded.

[0053] If the contact portion and / or the contact plate subsequently come into contact with the contact unit and / or the base body, the spring element of the third spring device can also be loaded or further loaded beyond the already applied preload, and the counter stop of the first piston can disengage from the first stop of the inner housing and / or the base and move away from the first stop. The contact portion and / or the contact plate can be pressed against the contact unit and / or the base body, and the contact unit and / or the fastening body can be pressed against the spring plate.

[0054] Then, the spring elements of the first, second and third spring devices, and the spring elements of the high-frequency contact element and / or the non-high-frequency contact element can be further loaded together until the high-frequency test pen device has been transferred to the contact position. In the contact position, the high-frequency contact element and / or the non-high-frequency contact element can pass through the contact object. BRIEF DESCRIPTION OF THE DRAWINGS

[0055] Hereinafter, preferred embodiments of the present invention are described in more detail with reference to the accompanying drawings.

[0056] Figure 1 A perspective view of a contact object is shown.

[0057] Figure 2 A perspective view of a high frequency test pen device is shown in a contact position.

[0058] Figure 3 A partial front view of a high frequency test pen device in a contact position is shown.

[0059] Figure 4 A cross-sectional front view of a high frequency test pen device in a non-contact position is shown.

[0060] Figure 5 A partial cross-sectional front view of a high frequency test pen device in a non-contact position is shown.

[0061] Figure 6 A partial cross-sectional front view of a high frequency test pen device in a contact position is shown.

[0062] Figure 7 A partially cut-away perspective view of a high frequency test pen device in a non-contact position is shown.

[0063] Figure 8 A perspective view of a contact unit is shown.

[0064] Fig. 9 A cross-sectional perspective view of a contact unit is shown.

[0065] Fig.10 A perspective view of the contact portion is shown.

[0066] Fig.10a A perspective view of an alternative embodiment of a contact portion is shown.

[0067] Fig.11 Another perspective view of the contact portion is shown.

[0068] Fig.12 A partial cross-sectional front view of a high frequency test pen device in a non-contact position is shown.

[0069] Fig.13A partial cross-sectional front view of a high frequency test pen device in a contact position is shown.

[0070] Fig.14 A force-displacement diagram is shown.

[0071] Fig.15 A partial cutaway front view of a high frequency test pen device is shown in a non-contact position.

[0072] Fig.16 A partial cross-sectional front view showing a high frequency test pen device in a first intermediate position

[0073] Fig.17 A partial cross-sectional front view of the high-frequency test pen device in a second intermediate position is shown.

[0074] Fig.18 A partial cross-sectional front view of a high frequency test pen device in a contact position is shown.

[0075] Fig.19 A possible embodiment of a contact object for providing a swing gap during contact by a test pen device is shown.

[0076] In the following, functionally identical and / or structurally identical parts and / or elements may have the same reference numerals. DETAILED DESCRIPTION

[0077] Figure 1 A perspective view of a contact object 1 is shown, which is designed as a board-to-board connector and includes two high-frequency mating contact elements 2 and six non-high-frequency mating contact elements 3, which are arranged in two opposite rows between the high-frequency mating contact elements 2. The high-frequency mating contact elements 2 can be partially surrounded by two curved or substantially L-shaped shielding elements 4 to electromagnetically shield the non-high-frequency mating contact elements 3. The non-high-frequency mating contact elements 3 are intended for input or output of direct current (DC) signals. In a top view, the plug connector 1 has a substantially rectangular outer contour 1a.

[0078] Figure 2 , Figure 3 and Figure 6 or Figure 4 , Figure 5 and Figure 7 The combined figure shows a high-frequency test pen device 5 in a contact position and / or a non-contact position. The high-frequency test pen device 5 is in contact with the contact object 1. Figure 2 and Figure 3 It is schematically shown in FIG.

[0079] The high frequency test pen device 5 comprises a two-piece housing 6 including a partially sleeve-shaped base portion 7 and a cover portion 8 adjoining the base portion 7 .

[0080] Furthermore, the high-frequency test pen device 5 comprises an inner shell 10 which is partially movable and elastically mounted relative to the outer shell 6 along or opposite to the longitudinal direction 9 of the high-frequency test pen device 5 and which can preferably be designed as a multi-part housing module.

[0081] In addition, the high-frequency test pen device 5 includes a contact unit 11, which is installed in the inner shell 10 and has a contact element carrier 12 and two or six pin-shaped high-frequency contact elements 13 and / or non-high-frequency contact elements 14, which pass through the contact element carrier 12 in the longitudinal direction 9 and partially protrude from the contact element carrier 12 in the longitudinal direction 9, and are spring-loaded on both sides. The high-frequency contact element 13 and / or the non-high-frequency contact element 14 are spring-loaded on both sides by spring elements (not shown) of the high-frequency contact element 13 and / or the non-high-frequency contact element.

[0082] Each high-frequency contact element 13 is arranged in its individual first channel 17 of the contact element carrier 12 extending in the longitudinal direction 9, and the non-high-frequency contact elements 14 are arranged in a common second channel 18 of the contact element carrier 12 extending in the longitudinal direction 9, the first channel 17 being spatially completely separated from the second channel 18. Therefore, the contact element carrier 12 has two first channels 17.

[0083] The inner housing 10 comprises a first piston 20 which is partially mounted in the outer housing 6, is movable in the longitudinal direction 9 and in the direction opposite to the longitudinal direction 9, and is spring-loaded relative to the outer housing 6 by means of a third spring device 15c, the piston 20 in the non-contact position being preloaded on the outer housing 6 while abutting a first stop 21 formed by the outer housing 6. The third spring device 15c comprises four spring elements 22, only two of which are shown here. The piston 20 has a stepped design and comprises three steps 23. From the perspective of the longitudinal direction 9, the radially outer side 24 of the first step 25 of the three steps 23 forms a counter-stop 26, which abuts the first stop 21 of the outer housing 6 or the base 7 when in the non-contact position. From the perspective of the longitudinal direction 9, the radial inner side 27 of the first step 25 and the radial inner side 28 of the second step 29 of the three steps 23 form stops 30, 31 for the contact unit 11, which are arranged to be partially movable in the piston 20 relative to the piston 20 in the longitudinal direction 9 and in a direction opposite to the longitudinal direction 9 and in a plane extending perpendicular to the longitudinal direction 9, that is, in the directions marked by the double arrows P1, P2, perpendicular to each other and perpendicular to the longitudinal direction 9. In other words, the radial inner sides 27, 28 of the first step 25 and the second step 29 limit the movement of the contact unit 11 in the piston 20 in a stop-like manner. The piston 20 is partially sleeve-shaped.

[0084] Furthermore, the inner housing 10 comprises a centering piston 33 which is partially mounted in the piston 20, the centering piston 33 being movable in the longitudinal direction 9 and in the direction opposite to the longitudinal direction 9 and being spring-loaded relative to the contact unit 11 by means of the first spring device 15a, the centering piston 33 in the non-contact position being preloaded against a second stop 34 formed by the piston 20 while abutting against the piston 20 and / or the contact unit 11. The first spring device 15a comprises two spring elements 35, only one of which is shown here. The radial inner side 36 of the third step 37 of the three steps 23, viewed in the longitudinal direction 9, forms the second stop 34. The piston 20 has an orifice 38, through which the centering piston 33 partially engages with a central portion 39 of the centering piston 33. The central part 39 is partially sleeve-shaped so that the central part 39 partially receives the contact element carrier 12 and has an aperture 40 at the end in the longitudinal direction 9, from which the high-frequency contact element 13 and / or the non-high-frequency contact element 14 can protrude when in the contact position. The piston 20, the centering piston 33 and the contact unit 11 are arranged coaxially with each other.

[0085] The centering piston 33 is mounted partially movable in the piston 20 in a plane extending perpendicularly to the longitudinal direction 9. The radially inner side 36 of the third step 37 limits the lateral movement of the centering piston 33 in the piston 20 in a stop-like manner.

[0086] In order to center the centering piston 33 in the non-contact position, the centering piston 33 includes a centering portion 33a on its outer peripheral surface, which is designed for position-dependent interaction with a guide portion 38a of the first piston 20 formed in a complementary shape. The shape of the centering portion 33a is preferably designed as a cone or a truncated cone, and the centering portion 33a is installed in the non-contact position in the guide portion 38a, which is opposite in shape and arranged in the centrally arranged end aperture 38 of the first piston 20. In this position, the centering piston is preloaded against the first piston by the first spring device. The centering portion 33a is arranged between the sleeve-shaped end and / or the center portion 39 of the centering piston 33 and the rear flange portion 33b. In the non-contact position, the flange portion 33b rests on the second stop 34 of the first piston. The piston 33 also includes a central hole 33c, in which the contact unit is advantageously axially fixed relative to the centering piston 33 and can be axially moved.

[0087] Furthermore, the inner housing 10 comprises a spring plate 41 which is firmly connected to the piston 20 , on which the third spring device 15 c is supported, and to which the contact unit 11 is arranged adjacent in the longitudinal direction 9 and is surrounded by the piston 20 and the centering piston 33 .

[0088] The central portion 39 of the centering piston 33 forms the receiving portion 16 at the end.

[0089] Figure 8 and 9 The combined view of FIG. 1 shows the contact unit 11 .

[0090] The contact element carrier 12 includes: a base 42, which has a first channel 17 and a second channel 18 and accommodates the high-frequency contact element 13 and / or the non-high-frequency contact element 14; a plate-shaped fastening body 44, which is connected to the base 42 by screws 43 (only two are shown); and a conductor plate 45, which is arranged between the base 42 and the fastening body 44, and the high-frequency contact element 13 and / or the non-high-frequency contact element 14 are electrically connected to the high-frequency conductor 46 (such as the high-frequency conductor 46) of the test pen device 5 via the conductor plate 45. Figure 2 , Figure 4 , Figure 5 , Figure 6 and Figure 7 shown) and / or non-high frequency conductors (not shown).

[0091] Furthermore, the contact unit 11 comprises a sleeve-shaped portion 11 a which is provided at the end and by which the contact unit 11 and / or the contact element carrier 12 is axially guided in the central bore 33 c of the centering piston 33 .

[0092] The high-frequency conductor 46 and / or the non-high-frequency conductor are used to input and / or output high-frequency signals and / or non-high-frequency signals, and extend from the conductor plate 45 in a direction opposite to the longitudinal direction 9 .

[0093] The high-frequency conductor 46 and / or the non-high-frequency conductor, and the high-frequency contact element 13 and / or the non-high-frequency contact element 14 are welded to the conductor plate 45 via the third portion 47 of the high-frequency contact element 13 and / or the non-high-frequency contact element 14, and the third portion 47 protrudes from the base body 42 in the direction opposite to the longitudinal direction 9. The fastening body 44 has a recess 48, and the high-frequency conductor 46 and / or the non-high-frequency conductor is transferred to the conductor plate 45 through the recess 48. In addition, the high-frequency conductor 46 and / or the non-high-frequency conductor are designed to be movable in the longitudinal direction and in the direction opposite to the longitudinal direction and on a plane extending perpendicular to the longitudinal direction 9, so that they can participate in the movement of the contact unit 11.

[0094] The conductor 46 is arranged in a cable guide element 77 which is arranged in the housing 8 and is preferably made of plastic. For this purpose, it has a duct 77a extending in the longitudinal direction 9. Preferably, lateral forces on the conductor 46 and the contact unit 11 connected to the conductor 46 are avoided as much as possible by correspondingly larger ducts 77a and / or by fasteners arranged on the housing 78.

[0095] The high-frequency contact element 13 and / or the non-high-frequency contact element 14 has a first portion 49 and a second portion 50, wherein the first portion 49 is arranged in the first channel 17 and / or the second channel 18, and the second portion 50 is arranged to protrude from the contact element carrier 12 and / or the base body 42. The first portion 49 is firmly (i.e., immovably) connected to the contact element carrier 12 and / or the base body 42.

[0096] The high-frequency contact element 13 is preferably identical in structure to the non-high-frequency contact element 14 .

[0097] In addition, the high-frequency contact element 13 and / or the non-high-frequency contact element 14 are fastened and centered in the first channel 17 and / or the second channel 18 so as to pass through the fastening device along the longitudinal direction 9 through the fastening elements 51 of the contact unit 11, each fastening element 51 is basically inserted at the end of the first channel 17 and / or the second channel 18 and is made of polytetrafluoroethylene (PTFE).

[0098] In addition, in particular, Fig.10 , Fig.10a , Fig.11 , Fig.12 and Fig.13 It can be seen from the combined views that the test pen device 5 includes a contact portion 52 adjacent to the contact unit 11 at the end along the longitudinal direction 9. The contact portion 52 is installed in the receiving portion 16 formed by the inner shell 10 and has a contact plate 53. The contact plate 53 has: two first through holes 54, which are aligned flush with the first channel 17 and allow the high-frequency contact element 13 to partially pass through and / or be able to partially pass through in the non-contact position, and completely pass through and / or be able to completely pass through in the contact position; and a second through hole 55, which is aligned flush with the second channel 18 and allows the non-high-frequency contact element 14 to partially pass through and / or be able to partially pass through in the non-contact position, and completely pass through and / or be able to completely pass through in the contact position. The first through hole 54 and the second through hole 55 are formed completely separated in space.

[0099] exist Fig.10a In another possible embodiment shown, instead of using a common second through hole 55, the contact plate 53 includes a plurality of individual through holes 55a which are aligned flush with the plurality of contact elements 14 passing through the second passage 18. These may be formed in a separate component of the contact plate 53 or integrally formed with the contact plate.

[0100] On a side 56 of the contact plate 53 facing away from the contact unit 11, the contact plate 53 has a nose 57 which partially surrounds the first through hole 54 and projects integrally with the contact plate 53 in the longitudinal direction 9, the nose 57 being able to engage in particular with a recess 58 of the contact object 1. In the contact position, the side face 56 abuts the contact object.

[0101] The contact plate 53 is movable in the centering piston 33 and / or in the receiving portion 16 in the longitudinal direction 9 and in a direction opposite to the longitudinal direction 9 and is resiliently mounted relative to the contact unit 11 by means of a second spring device 15b. The second spring device 15b preferably comprises four guide elements extending in the longitudinal direction 9 and each guide element comprises a guide pin 60 guided with radial clearance in a guide bushing 64, the guide pin 60 having two opposing conical stops 65a, 65b, which are arranged at the ends and are designed to interact with complementary contact portions, which are preferably shaped similarly to the conical portions and / or contact surfaces 64a, 64b of the guide bushing 64, when in the non-contact position and in the fully compressed contact position. The spring device 15b comprises a spring element 79 (see Fig.12 ), the spring element 79 is assigned to the guide pin 60 and preloads the contact plate 53 to Fig.12 Position shown.

[0102] The contact plate 53 is mounted in the centering piston 33 so as to be movable in a plane extending perpendicularly to the longitudinal direction 9. This is made possible by the fact that the guide pin 60 in the sleeve 61 is mounted so as to be movable in the plane with a certain amount of lateral play, at least when the contact plate 53 is partially spring-biased.

[0103] The contact plate 53 is designed so that the contact plate 53 is preloaded relative to the contact unit 11 when in the non-contact position, such as Figure 4 , Figure 5 , Figure 7 and Fig.12 As shown, it is spaced apart from the contact unit 11 in the longitudinal direction 9 and as shown Figure 6 and Fig.13 It is shown partially contacting the contact unit 11 when in the contact position. The cross-sectional surface 62 of the contact plate 53 is substantially rectangular, and the guide pin 60 is provided at each of the four corners 63 of the cross-sectional surface 62. The corners 63 may also be rounded.

[0104] The spring element 35 of the first spring device 15a, the spring element 79 of the second spring device 15b of the contact portion 52, and the spring elements of the high-frequency contact element 13 and / or the non-high-frequency contact element 14 are preferably connected in parallel with each other, while the aforementioned spring elements are connected in series with the spring element 22 of the third spring device 15c as a whole.

[0105] Fig.14A path-time diagram is shown, which shows a curve 65 of the force and / or restoring force of the spring element 35 of the first spring device 15a, the spring element of the second spring device 15b of the contact portion 52, the spring element of the high-frequency contact element 13 and / or the non-high-frequency contact element 14, and the spring element 22 of the third spring device 15c when the high-frequency test pen device 5 is transferred from the non-contact position to the contact position. The force is plotted on the ordinate 66, and the path of the tension of the aforementioned spring elements during the transfer from the non-contact position to the contact position is plotted on the abscissa 67. The numerical values ​​of the force and the path should be understood as purely exemplary.

[0106] Apart from Fig.14 In addition, Fig.15 , Fig.16 , Fig.17 and Fig.18 , it is shown that the high-frequency test pen device 5 is transferred from the non-contact position to the contact position via the first intermediate position of the high-frequency test pen device 5 and the second intermediate position of the high-frequency test pen device 5 .

[0107] When the high-frequency test pen device 5 is placed on the contact object 1, the contact object 1 first contacts the adjacent portion 76 of the central portion 39, such as Fig.15 As shown. This preferably has inner chamfers or centering surfaces 6a, 6b to interact with the outer contour 1a of the contact object. Here, the spring element 35 of the first spring device 15a is loaded or further loaded beyond the pretensioning force already applied, and the centering piston 33 disengages from the second stop 34 of the piston 20 and moves away from the second stop 34. According to this, the force in the first region 68 of the curve 65 increases rapidly, i.e. substantially parallel to the ordinate 66. In the second region 69 of the curve 65, the spring element 35 of the first spring device 15a is further loaded.

[0108] When the contact object 1 contacts the contact plate 53 at the first intermediate position, as shown in FIG. Fig.16 As shown, the contact portion 52 inserted into the sleeve 61 and / or the spring element 79 of the second spring device 15b of the contact plate 53 are additionally loaded or further loaded beyond the preload force already applied. Accordingly, the force in the third region 70 of the curve 65 increases rapidly. In the fourth region 71 of the curve 65, the spring element 35 of the first spring device 15a of the contact plate 52 and the spring element of the second spring device 15b are further loaded.

[0109] During further spring deflection of the spring system, as Fig.17As shown, if the high-frequency contact element 13 and / or the non-high-frequency contact element 14 contacts the high-frequency mating contact element 2 and / or the non-high-frequency mating contact element 3 in the second intermediate position, the spring elements of the high-frequency contact element 13 and / or the non-high-frequency contact element 14 are also loaded or further loaded via any preload that may already exist. Accordingly, the force in the fifth region 72 of the curve 65 increases rapidly. In the sixth region 73 of the curve 65, the spring element 35 of the first spring device 15a, the spring element of the second spring device 15b of the contact plate 53, and the spring element of the high-frequency contact element 13 and / or the non-high-frequency contact element 14 are further loaded.

[0110] During further spring deflection of the spring system, as Fig.17 As shown, if the contact plate 53 contacts the contact unit 11 and / or the base 42, the spring element 22 of the third spring device 15c is additionally loaded or further loaded to exceed the preload already applied, and the counter stop 26 of the piston 20 is disengaged from the first stop 21 of the base 7 and moves away from the first stop 21. Accordingly, the force in the seventh region 74 of the curve 65 increases rapidly. In the eighth region 75 of the curve 65, the spring element 35 of the first spring device 15a, the spring element 79 of the second spring device 15b of the contact plate 53, the spring element of the high-frequency contact element 13 and / or the non-high-frequency contact element 14, and the spring element 22 of the third spring device 15c are further loaded until the high-frequency test pen device has been transferred to the contact position. In the contact position, the high-frequency contact element 13 and / or the non-high-frequency contact element 14 preferably at least partially penetrate the contact object 1. Alternatively, the high-frequency contact element 13 and / or the non-high-frequency contact element 14 may also rest on corresponding mating contacts on the upper surface of the contact object 1 and / or the surface facing the test pen device 5 (see Figure 1 3').

[0111] The contact object 1 can also be designed as follows: Fig.19 As shown, such that it allows a certain amount of play (particularly so-called swing play) of the contact elements 13 , 14 (particularly the non-high frequency contact element 14 ) in the contact object 1 when interacting with the test pen device 5 .

[0112] In this case, the non-high-frequency mating contact element 3 is preferably geometrically designed, for example by providing a tubular inner contact surface 80, so that when engaging with the mating contact element 3 and while maintaining electrical contact, the contact element 14 is allowed to move within predetermined limits, in particular a limited tilting or swinging about a predetermined angle A.

[0113] Reference numerals

[0114] 1 Contact object

[0115] 2High frequency mating contact elements

[0116] 3 Non-high frequency mating contact elements

[0117] 3'Alternative mating contact elements

[0118] 4 Shielding elements

[0119] 5 High frequency test pen device

[0120] 6 Shell

[0121] 6a, 6b Centering slope

[0122] 7 Base

[0123] 8 cover

[0124] 9. Vertical direction

[0125] 10 Inner shell

[0126] 11 contact units

[0127] 11a Sleeve-shaped end

[0128] 12 contact element carrier

[0129] 13 High frequency contact components

[0130] 14 Non-high frequency contact components

[0131] 15. First spring device

[0132] 15b Second spring device

[0133] 15C third spring device

[0134] 16 Receiving Department

[0135] 17 First Channel

[0136] 18 Second Channel

[0137] 19First spring device

[0138] 20 Piston

[0139] 21 first stopper

[0140] 22 Spring element (third spring device)

[0141] 23 steps

[0142] 24 radial external

[0143] 25First Step

[0144] 26 Reverse stopper

[0145] 27 radial inside

[0146] 28 radial inside

[0147] 29 The Second Step

[0148] 30 stopper

[0149] 31 stopper

[0150] 33 Centering piston

[0151] 33a Centering part

[0152] 33b flange part

[0153] 33c center hole

[0154] 34 second stopper

[0155] 35 Spring element (first spring device)

[0156] 36 radial inside

[0157] 37 The Third Step

[0158] 38 holes

[0159] 38a Guide

[0160] 39 Center

[0161] 40 holes

[0162] 41 Spring Plate

[0163] 42 Matrix

[0164] 43 screws

[0165] 44 Fastener

[0166] 45 conductor plate

[0167] 46 High frequency conductor

[0168] 47 Part 3

[0169] 48 concavity

[0170] 49 Part 1

[0171] 50 Part 2

[0172] 51 Fastening elements

[0173] 52 Contact Department

[0174] 53 contact plate

[0175] 54 first through hole

[0176] 55 Second through hole

[0177] 55a single through hole

[0178] 56 side

[0179] 57 Nose

[0180] 58 notch

[0181] 59 side

[0182] 60 guide pin

[0183] 61 sleeve

[0184] 62 cross-sectional surfaces

[0185] 63 Corner

[0186] 64 guide bushing

[0187] 64a, 64b are formed as contact surfaces of the tapered portion

[0188] 65a, 65b Conical stopper

[0189] 65 Shapes

[0190] 66 vertical coordinate

[0191] 67 horizontal axis

[0192] 68 First Area

[0193] 69 Second Area

[0194] 70 Third Area

[0195] 71 Fourth Area

[0196] 72 Fifth Area

[0197] 73. The sixth area

[0198] 74 Seventh Area

[0199] 75 Eighth Area

[0200] 76 Adjacent part

[0201] 77 Cable guide

[0202] 77a Cable guide conduit

[0203] 78 Housing fasteners

[0204] 79 Spring element of contact plate

[0205] 80 tubular inner contact surface

[0206] P1 double arrow

[0207] P2 double arrow

[0208] A tilted.

Claims

1. A high-frequency test pen device (5) for removably contacting a contact object (1), in particular a board-to-board connector, the high-frequency test pen device (5) comprising: An outer shell (6), an inner shell (10), the inner shell (10) being elastically mounted and at least partially located in the outer shell and being movable relative to the outer shell at least in the longitudinal direction (9) of the test pen device and in a direction opposite to the longitudinal direction (9) of the test pen device, and the inner shell (10) comprising a first piston (20), the first piston (20) being preferably axially centered and elastically mounted in the outer shell (6), and a centering piston (33), the centering piston (33) being arranged and elastically mounted at the end of the test pen device (5), the inner shell (10) further comprising a contact unit (11), the contact unit (11) having at least two, preferably a plurality of contact elements (13, 14) mounted therein, for contacting the contact object (1) and extending in the longitudinal direction (9) toward the receiving portion (16) of the test pen device (5) arranged at the end, characterized in that The contact elements (13, 14) are pin-shaped contact elements which are preferably spring-loaded on both sides, and the contact unit (11) is guided so as to be axially displaceable in the centering piston (33), and The centering piston (33) is movably mounted in the first piston (20) of the inner housing (10) and is guided against the restoring force of the first spring device (15a), so that the centering piston (33) is centrally mounted relative to the first piston (20) when not in contact with the test pen device (5), and is movably mounted relative to the first piston (20), and is preferably movably mounted together with the contact unit (11) in a plane perpendicular to the longitudinal direction (9) when in contact with the contact object (1) in at least a partially spring-deflected position.

2. The test pen device according to claim 1, characterized in that: The test pen device (5) has a resiliently mounted contact plate (53), which is axially movable relative to the centering piston (33) and the contact unit (11), at least partially engaged in the receiving portion (16), and is designed to contact the contact object (1) and center the contact object (1) relative to the contact plate (53) and / or the contact unit (11).

3. The test pen device according to claim 2, characterized in that: The contact plate (53) comprises: protruding and / or recessed centering elements (57) for interacting with the contact object (1); and at least one, preferably a plurality of through holes (54, 55) for the contact elements (13, 14).

4. The test pen device according to claim 2 or 3, characterized in that: The contact plate (53) is guided and installed by overcoming the restoring force of the second spring device (15b), so that when the contact plate (53) is not in contact with the contact object (1), the contact plate (53) is arranged in a centered manner relative to the contact unit (11) and / or the centering piston (33), and when the second part contacts the contact object in a partial spring offset position, the second part is movably installed in a plane perpendicular to the longitudinal direction (9) relative to the contact unit (11) and / or the centering piston (33).

5. The test pen device according to claim 4, characterized in that: The second spring device (15b) and / or the contact plate (53) are designed such that they are arranged centrally relative to the contact unit (11) and / or the centering piston (33) in a fully spring-deflected position of the second spring device (15b).

6. The test pen device according to claim 4 or 5, characterized in that: The second spring device (15b) has at least two, preferably at least four, guide elements extending in the longitudinal direction (9), and each guide element has a guide pin (60), which is guided in a guide bushing (64) with a radial gap, and the guide pin (60) has two opposite conical stops (65a, 65b), each of which is arranged on the end and is designed to interact with a contact portion (64a, 64b) of the guide bushing (64), the contact portion (64) preferably being formed as a cone and formed to be complementary in shape.

7. A test pen device according to any one of the preceding claims, characterized in that The contact unit (11) is mounted in the inner housing (10) so as to be movably mounted in the longitudinal direction (9) and in a direction opposite to the longitudinal direction (9) and / or so as to be movably mounted in the inner housing (10) in a plane extending perpendicular to the longitudinal direction.

8. A test pen device according to any one of the preceding claims, characterized in that The first piston (20) of the inner shell (10) is elastically mounted in the outer shell (6) via a third spring device (15c) and is arranged in a manner capable of axial movement in the longitudinal direction (9) and in a direction opposite to the longitudinal direction (9); the piston is preloaded relative to the outer shell (6) when in the non-contact position and simultaneously abuts against a first stopper (21) formed by the outer shell (6); and the third spring device (15c) has a greater elastic force than the first spring device (15a) and the second spring device (15b).

9. A test pen device according to any one of the preceding claims, characterized in that The inner housing (10) comprises a spring plate (41) which is permanently connected to the first piston (20) and on which a third spring device (15c) is supported, the contact unit (11) being surrounded by the first piston (20) and the centering piston (33) adjacent to the spring plate in the longitudinal direction (9).

10. A test pen device according to any one of the preceding claims, characterized in that The centering piston (33) capable of moving in the longitudinal direction (9) and in a direction opposite to the longitudinal direction (9) is elastically mounted relative to the contact unit (11) by means of the first spring device (15a), and the centering piston (33) is preloaded relative to the first piston (20) when in the non-contact position and simultaneously abuts against a second stop (34) formed by the first piston (20).

11. A test pen device according to any one of the preceding claims, characterized in that The test pen device (5) is designed so that when the contact object (1) is contacted in a direction opposite to the longitudinal direction (9) and as the spring deflection of the spring device (15a, 15b, 15c) of the test pen device (5) increases, the centering piston (33) is first spring-loaded to overcome the preload force of the first spring device (15a), then the contact plate (53) is spring-deflected to overcome the preload force of the second spring device (15b), then the spring-loaded contact element (13, 14) is elastically mounted after contact with the contact object (1), and preferably then the first piston (20) is spring-deflected in the housing (6) to overcome the preload force of the third spring device (15c).

12. A test pen device according to any one of the preceding claims, characterized in that The receiving portion (16) is arranged in the end of the centering piston (33) and includes a centering bevel (6a, 6b) which is used to interact with the outer contour (1a) of the contact object (1) and is arranged on the inner circumference of the centering piston (33).

13. A test pen device according to any one of the preceding claims, characterized in that The contact element (13, 14) comprises at least one high-frequency contact element extending in a first channel (17) of the contact element carrier (12) of the contact unit along the longitudinal direction and a non-high-frequency contact element extending in a second channel (18) of the contact element carrier (12) along the longitudinal direction, the first channel being completely separated from the second channel in space.

14. A test pen device according to any one of the preceding claims, characterized in that The contact unit (11) comprises two high-frequency contact elements (13), a separate first channel (17) being formed in a contact element carrier (12) for each high-frequency contact element; and the contact unit comprises at least two, preferably six, non-high-frequency contact elements (14), a common second channel (18) being formed in the contact element carrier for the non-high-frequency contact elements, the non-high-frequency contact elements being preferably arranged in opposite rows and located between the high-frequency contact elements.

15. The test pen device according to claim 13 or 14, characterized in that: The high-frequency contact element (13) and / or the non-high-frequency contact element (14) are fastened and centered in the first channel and / or the second channel so as to pass through the fastening device along the longitudinal direction (9) through the fastening element (51) of the contact unit (11), each of the high-frequency contact element (13) and the non-high-frequency contact element (14) preferably being inserted substantially at the end of the first channel (17) and / or the second channel (18) and being made of plastic material, preferably made of polytetrafluoroethylene (PTFE).

16. The test pen device according to any one of claims 13 to 15, characterized in that: The contact element carrier (12) comprises: a base body (42), the base body (42) having the first channel (17) and the second channel (18), and the base body (42) accommodating the high-frequency contact element (13) and / or the non-high-frequency contact element (14); a fastening body (44), which is preferably plate-shaped and is preferably connected to the base body by means of screws (43); and A conductor plate (45), the conductor plate (45) being arranged between the base body and the fastening body, and the high-frequency contact element and / or the non-high-frequency contact element being connected to the high-frequency conductor (46) and / or the non-high-frequency conductor of the test pen device (5) in an electrically conductive manner via the conductor plate (45).

Images