An LED lamp aging test device

Abstract

The present invention relates to an aging test device for LED lamps, belonging to the technical field of lamp test devices. It includes a test box body, on which a cover body is slidably clamped. Inside the test box body, a test platform is installed through a support part. Regularly arranged ventilation holes are provided on the test platform, and a sliding groove is provided at the bottom of the test platform. Two power supply components are slidably clamped in the sliding groove. A pressing mechanism for restricting the position of the tested lamp is fixed on the top of the cover body. The power supply component includes a slider slidably clamped in the sliding groove, a clamping seat is fixed at the bottom of the slider, and an extension arm is rotatably clamped on the clamping seat. The applicability of this test device is strong, it can adaptively supply power to LED lamps of different specifications and sizes, and cooperate with the pressing mechanism to better fix the tested LED lamps. Moreover, the pin fixing component in the test platform can fix and test pin-type LED lamps inserted into the socket holes, and can also change the test environment according to requirements during the aging test to speed up the test speed.

Description

Technical Field

[0001] The present invention relates to the technical field of lamp testing devices, and particularly to an LED lamp aging test device. Background Art

[0002] An LED lamp is a lighting device made using the principle of electroluminescence of semiconductor materials. Compared with traditional incandescent lamps and fluorescent lamps, the LED lamp has the characteristics of high efficiency and energy saving, and the LED lamp has a small volume and rich colors. Therefore, it is widely used in modern society. Since the LED lamp has a small volume, it is very convenient to be integrated into various products. During the production process of the LED lamp, it is necessary to conduct aging tests on some finished or semi-finished products of the LED lamp to ensure the use quality of the LED lamp. Since a large amount of time is required for waiting during normal use, people often adopt rapid aging tests to obtain the quality conditions of the LED lamps in the test batches.

[0003] As disclosed in the Chinese invention patent document with the publication number CN104076297B, an LED lamp aging test device is disclosed, which is used to electrically connect an external power supply and a pin-type LED lamp to simulate the aging process of the pin-type LED lamp. The LED lamp aging test device includes a box body, a potentiometer, a positive connector, a plurality of LED lamp jacks and a negative connector, all of which are arranged on the box body; the negative connector is arranged corresponding to the LED lamp jacks; the positive connector is used to connect the positive pole of the power supply to the first end of the potentiometer, the second end of the potentiometer is sequentially connected in series with a plurality of the LED lamp jacks and a negative connector, and the negative connector is used to electrically connect the negative pole of the power supply.

[0004] The above test device has a simple structure and low cost, can simultaneously conduct aging tests on multiple LED lamps with high efficiency. However, in the above test device, wire connection is still required after inserting the LED lamp pins. Repeated operations are needed when testing multiple LED lamps, which is rather troublesome. Moreover, the adaptability of the above test device is poor. There are also some semi-finished lamps welded on the circuit board during the production and manufacturing process of the LED lamp, and the above test device cannot be well adapted for testing. Therefore, it still needs to be further improved, and thus the technical solution of the present invention is proposed. Summary of the Invention

[0005] To overcome the technical defects existing in the prior art, the present invention provides an LED lamp aging test device, which can adaptively supply power to LED lamps of different specifications and sizes, including aging tests on semi-finished LED lamps and LED lamps with pins that are not integrated on the circuit board, and is convenient for fixing the position of the LED lamp to be tested.

[0006] The technical solution adopted by the present invention is as follows: It includes a test box body, on which a cover body is slidably clamped. The cover body and the test box body together form an independent environment. Inside the test box body, a test platform is installed through a support part. A heating device can be arranged at the bottom of the test platform to quickly increase the temperature inside the test box body. Raising the environmental temperature can accelerate the aging of the LED lamp. At the same time, when power is supplied, the magnitude of the supply current can be increased according to requirements, so as to accelerate the aging of the LED lamp by increasing the load condition of the LED lamp. At the same time, necessary control modules need to be set up to realize various variables and control the power on and off of the LED lamp. During the test, a vibrator can be arranged on the support part to periodically jolt the LED lamp slightly, so as to better simulate the natural aging of the conventional LED lamp. Regularly arranged ventilation holes are opened on the test platform. Heat will be generated during the energized operation of the LED lamp, and the ventilation holes can facilitate the dissipation of heat. A sliding groove is opened at the bottom of the test platform, and two power supply components are slidably clamped in the sliding groove. The power supply components are used to supply power to the LED lamp. During use, the contact electrode part directly contacts the electrical connection point of the LED lamp for power supply. A pressing mechanism for restricting the position of the tested lamp is fixed on the top of the cover body. During use, after the LED lamp is simply adjusted in position and placed on the test platform, the pressing mechanism is used to fix the position of the LED lamp. The power supply component includes a slider slidably clamped in the sliding groove. A clamping seat is fixed at the bottom of the slider. An extension arm is rotatably clamped on the clamping seat. A contact electrode part is arranged at one end of the extension arm. A power supply connector is provided on one side of the test box body through a wire.

[0007] Preferably, in order to preferably obtain the temperature data inside the test box body, external temperature detectors are arranged at the bottom of the test platform and the top of the cover body. The support part includes a rubber seat fixed at the bottom of the test platform. A support rod is fixedly connected between the bottom of the rubber seat and the bottom of the test box body. The rubber seat can isolate the current and at the same time reduce the influence range of vibration.

[0008] Preferably, in order to facilitate the adjustment of the position of one end of the extension arm, better adjust the position of the contact electrode part according to requirements, and make the contact electrode part better correspond to the lower part of the electrical connection part of the LED lamp. The extension arm includes a rotating part and an elastic part connected to the rotating part. The rotating part is rotatably installed on the clamping seat, and one end extends horizontally outward from the test platform. The elastic part is made of an elastic material, and the part close to the rotating part bends upward and extends. The upper surface of the elastic part contacts the bottom of the test platform. When static, the elastic part can push up the test platform by its own elasticity, so as to fix itself.

[0009] Preferably, in order to facilitate the electrical connection part of the electrode block and the LED lamp to be in contact at all times, the contact electrode part includes an outer cylinder fixed on the elastic part, a buffer spring is fixed on the elastic part, the buffer spring is located inside the outer cylinder, an electrode rod is slidably clamped inside the outer cylinder, a bottom block for fitting with the inner wall of the outer cylinder is fixed at the bottom of the electrode rod, and an electrode block extending above the outer cylinder is fixed at the top of the electrode rod.

[0010] Preferably, in order to improve the stability of the electrical connection and at the same time improve the running stability of the electrode rod, the top of the electrode block is provided with grooves arranged in parallel, both the bottom block and the outer cylinder are made of insulating materials, and a limiting ring block for restricting the position of the electrode rod is also fixed on the inner wall of the outer cylinder. The external charged electrode needs to be electrically connected to the electrode rod through a wire.

[0011] Preferably, in order to facilitate the aging test of the LED lamp with pins and facilitate the fixing and power supply of the LED lamp with pins, it further includes a pin fixing component installed in the test platform. A cylindrical cavity extending inward is opened on the side wall of the test platform. The pin fixing component includes a fitting cylinder rotatably clamped in the cylindrical cavity. A rotating rod is fixed between the fitting cylinders. An inner ring body that can follow the rotation is sleeved outside the rotating rod. A winding spring is connected to the outer wall of the inner ring body. The outer end of the winding spring is connected to an eccentric ring shell. A part of the eccentric ring shell gradually approaches the inner wall of the cylindrical cavity. A plug hole is vertically opened on the test platform. The bottom end of the plug hole extends into the cylindrical cavity and is located on one side of the eccentric ring shell. The extending direction of the outer end of the winding spring is opposite to the rotation direction of the rotating rod. At the same time, when the rotating rod is not stressed, the protruding part of the eccentric ring shell is located on the other side of the plug hole.

[0012] Preferably, in order to facilitate manual operation to fix the LED lamp, one end of the fitting cylinder extends outside the test platform. The length of the cylindrical cavity is greater than the overall length of the pin fixing component. A relay rod is fixed at one end of the fitting cylinder. The relay rod is threadedly connected to the test platform through the thread on the outer wall. An operating handle is fixed at one end of the relay rod. The eccentric ring shell needs to be connected to a suitable external power supply.

[0013] Preferably, in order to facilitate the fixing of the LED lamp, one side of the cover body is provided with a transparent observation window. The pressing mechanism includes a pressing telescopic rod fixed on the top of the cover body. The bottom end of the pressing telescopic rod extends below the cover body. A frame plate is fixed at the bottom end of the pressing telescopic rod. A range block extending downward is fixed at the bottom of the frame plate. A buffer part is connected between the range blocks. In the semi-finished product of the LED lamp, the LED lamp beads are simply welded on the circuit board and there is an exposed electrical connection part.

[0014] Preferably, in order to avoid damaging the LED lamp, elastic blocks are fixed to the bottom of the buffer part and the range block. A receiving groove is provided at the bottom of the shelf board. A receiving spring is fixed to the top inside the receiving groove. A floating cover is fixed to the bottom of the receiving spring. An internal temperature detector is fixed to the bottom of the floating cover. A through hole is provided in the bottom of the buffer part corresponding to the internal temperature detector. When fixing the LED lamp, the internal temperature detector is used to directly detect the operating temperature of the LED lamp.

[0015] Preferably, in order to facilitate controlling the environmental temperature inside the test box body, an air flow fan is fixed to the side wall of the test box body. An exhaust slot hole is provided in the inner wall of the test box body on the opposite side of the air flow fan. A baffle is provided outside the exhaust slot hole. The top of the baffle is hinged to the outer wall of the test box body.

[0016] The beneficial effects of the present invention are as follows: The applicability of this test device is strong, and it can adaptively supply power to LED lamps of different specifications and sizes. When it is necessary to adjust the position of the contact electrode part on the extension arm, press down the elastic part to make the elastic part disengage from the contact test platform. At this time, the extension arm can be rotated, and the slider at one end of the extension arm can be operated to slide under the bottom of the test platform. After adjustment, the elastic part can contact the test platform again, and the electrode block can maintain contact with the electrical connection part of the LED lamp under the push of the buffer spring. Cooperating with the pressing mechanism can better fix the LED lamp to be tested. The deformation of the buffer part makes the internal temperature detector on the floating cover approach the LED lamp to be aged and detected, thereby facilitating the detection of the operating temperature of the LED lamp. Moreover, the pin fixing component in the test platform can fix and test the pin-type LED lamp inserted into the plug hole. When in use, directly insert the LED lamp with pins into the plug hole. At this time, rotate the rotating rod with the operating handle. First, the inner ring body is rotated, and under the elastic support of the winding spring, the eccentric ring shell can be indirectly rotated, so that the eccentric ring shell presses the pins of the LED lamp, thereby fixing the position of the LED lamp. During the aging test, the test environment can also be changed according to requirements to accelerate the test speed. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a three-dimensional structural schematic diagram of the present invention.

[0018] Figure 2 It is a structural schematic diagram of the cover body of the present invention being opened.

[0019] Figure 3 It is a structural schematic diagram of the test platform of the present invention.

[0020] Figure 4 It is a structural schematic diagram of the bottom of the test platform of the present invention.

[0021] Figure 5 Schematic diagram of the power supply component structure of the present invention.

[0022] Figure 6 is Figure 5 The enlarged structural diagram at position A in

[0023] Figure 7 Schematic diagram of the pin fixing component structure of the present invention.

[0024] Figure 8 Schematic diagram of the rotating rod structure of the present invention.

[0025] Figure 9 Schematic cross-sectional structure diagram of the test platform of the present invention.

[0026] Figure 10 is Figure 9 The enlarged structural diagram at position B in

[0027] Figure 11 Schematic diagram of the bottom structure of the cover body of the present invention.

[0028] Figure 12 Schematic diagram of the pressing mechanism structure of the present invention.

[0029] Explanation of reference numerals: In the figure: 1. Test box body; 101. Airflow fan; 102. Baffle; 2. Cover body; 3. Test platform; 301. Ventilation holes; 302. Sliding groove; 4. Power supply component; 41. Slide block; 42. Clamping seat; 43. Extension arm; 431. Rotating part; 432. Elastic part; 44. Contact electrode part; 441. External cylinder; 442. Buffer spring; 443. Electrode rod; 444. Electrode block; 5. Pressing mechanism; 501. Pressing telescopic rod; 502. Frame plate; 503. Range block; 504. Buffer part; 505. Elastic block; 506. Accommodating spring; 507. Floating cover; 508. Inner temperature detector; 6. Pin fixing component; 601. Fitting cylinder; 602. Rotating rod; 603. Inner ring body; 604. Winding spring; 605. Eccentric ring shell; 606. Relay rod; 607. Operating handle; 7. Insertion hole. Detailed implementation manners

[0030] The present invention will be further described below with reference to the accompanying drawings:

[0031] As Figures 1-12As shown in the figure, this embodiment provides an LED lamp aging test device, including a test box body 1, on which a cover body 2 is slidably clamped. The cover body 2 and the test box body 1 together form an independent environment. Inside the test box body 1, a test platform 3 is installed through a support part. A heating device can be set at the bottom of the test platform 3 to quickly increase the temperature inside the test box body 1. Raising the ambient temperature can accelerate the aging of the LED lamp. At the same time, when supplying power, the magnitude of the supply current can be increased according to requirements, so as to accelerate the aging of the LED lamp by increasing the load condition of the LED lamp. At the same time, necessary control modules need to be set to achieve various variables and control the power on and off of the LED lamp. During the test, a vibrator can be set on the support part to slightly shake the LED lamp regularly, so as to better simulate the natural aging of conventional LED lamps. Regularly arranged ventilation holes 301 are opened on the test platform 3. Heat will be generated during the power-on operation of the LED lamp, and the ventilation holes 301 can facilitate the dissipation of heat. A sliding groove 302 is opened at the bottom of the test platform 3, and two power supply components 4 are slidably clamped in the sliding groove 302. The power supply components 4 are used to supply power to the LED lamp. When in use, the contact electrode part 44 directly contacts the electrical connection point of the LED lamp for power supply. A pressing mechanism 5 for restricting the position of the tested lamp is fixed on the top of the cover body 2. When in use, after simply adjusting the position, the LED lamp is placed on the test platform 3, and the pressing mechanism 5 is used to fix the position of the LED lamp. The power supply component 4 includes a slider 41 slidably clamped in the sliding groove 302. A clamping seat 42 is fixed at the bottom of the slider 41. An extension arm 43 is rotatably clamped on the clamping seat 42. One end of the extension arm 43 is provided with a contact electrode part 44. A power supply connector is provided on one side of the test box body 1 through a wire. External temperature detectors are provided at the bottom of the test platform 3 and the top of the cover body 2. The support part includes a rubber seat fixed at the bottom of the test platform 3. A support rod is fixedly connected between the bottom of the rubber seat and the bottom of the test box body 1. The rubber seat can isolate the current and at the same time reduce the influence range of vibration, so that the temperature data inside the test box body 1 can be obtained better. An air flow fan 101 is fixed on the side wall of the test box body 1. An exhaust slot is opened on the inner wall of the test box body 1 on the opposite side of the air flow fan 101. A baffle 102 is provided outside the exhaust slot. The top of the baffle 102 is hinged on the outer wall of the test box body 1. This can facilitate the control of the ambient temperature inside the test box body 1. When in use, this device can control the ambient temperature inside the test box body 1 according to the requirements of the aging test. The external temperature detector mainly detects the temperature inside the test box body 1. At this time, when cooling is required, the air flow fan 101 can be started to work, introducing the air flow in the external environment into the test shell to cool the LED lamp. The air flow can push the baffle 102 on one side of the exhaust slot. When a high-temperature environment needs to be maintained, the air flow fan 101 and the baffle 102 are only in a static state, and the air flow is relatively difficult to circulate, thus playing a heat preservation role.

[0032] The extension arm 43 includes a rotating part 431 and an elastic part 432 connected to the rotating part 431. The rotating part 431 is rotatably mounted on the clamping seat 42, and one end extends horizontally outward from the test platform 3. The elastic part 432 is made of an elastic material, and the part near the rotating part 431 bends upward and extends. The upper surface of the elastic part 432 is in contact with the bottom of the test platform 3. When at rest, the elastic part 432 can push up the test platform 3 by its own elasticity, so as to fix itself. This can facilitate the adjustment of the position of one end of the extension arm 43 and better adjust the position of the contact electrode part 44 according to needs, so that the contact electrode part 44 can better correspond to the lower part of the electrical connection part of the LED lamp. The contact electrode part 44 includes an outer cylinder 441 fixed on the elastic part 432. A buffer spring 442 is fixed on the elastic part 432. The buffer spring 442 is located inside the outer cylinder 441. An electrode rod 443 is slidably clamped inside the outer cylinder 441. A bottom block for fitting against the inner wall of the outer cylinder 441 is fixed at the bottom of the electrode rod 443. An electrode block 444 extending above the outer cylinder 441 is fixed at the top of the electrode rod 443. This can facilitate keeping the electrode block 444 in contact with the electrical connection part of the LED lamp at all times. Grooves arranged in parallel with each other are provided at the top of the electrode block 444. Both the bottom block and the outer cylinder 441 are made of insulating materials. A limiting ring block for restricting the position of the electrode rod 443 is also fixed on the inner wall of the outer cylinder 441. The external charged electrode needs to be electrically connected to the electrode rod 443 through a wire. This can improve the stability of the electrical connection and at the same time improve the running stability of the electrode rod 443. When in use, when it is necessary to adjust the position of the contact electrode part 44 on the extension arm 43, press down the elastic part 432 to make the elastic part 432 disengage from the contact with the test platform 3. At this time, the extension arm 43 can be rotated, and the slider 41 at one end of the extension arm 43 can be operated to slide on the bottom of the test platform 3. After adjustment, the elastic part 432 can contact the test platform 3 again, and the electrode block 444 can be kept in contact with the electrical connection part of the LED lamp at all times under the push of the buffer spring 442.

[0033] It further includes a pin fixing component 6 installed inside the test platform 3. A cylindrical cavity extending inward is provided on the side wall of the test platform 3. The pin fixing component 6 includes a fitting cylinder 601 rotatably clamped inside the cylindrical cavity. A rotating rod 602 is fixed between the fitting cylinders 601. An inner ring body 603 capable of rotating therewith is sleeved outside the rotating rod 602. A winding spring 604 is connected to the outer wall of the inner ring body 603. An eccentric ring shell 605 is connected to the outer end of the winding spring 604. A part of the eccentric ring shell 605 gradually approaches the inner wall of the cylindrical cavity. A plug hole 7 is vertically provided on the test platform 3. The bottom end of the plug hole 7 extends into the cylindrical cavity and is located on one side of the eccentric ring shell 605. The extending direction of the outer end of the winding spring 604 is opposite to the rotation direction of the rotating rod 602. At the same time, when the rotating rod 602 is not stressed, the protruding part of the eccentric ring shell 605 is located on the other side of the plug hole 7. This can facilitate the aging test of the LED lamp with pins, and facilitate the fixing and power supply of the LED lamp with pins. One end of the fitting cylinder 601 extends outside the test platform 3. The length of the cylindrical cavity is greater than the overall length of the pin fixing component 6. A relay rod 606 is fixed to one end of the fitting cylinder 601. The relay rod 606 is threadedly connected to the test platform 3 through the thread on the outer wall. An operating handle 607 is fixed to one end of the relay rod 606. The eccentric ring shell 605 needs to be connected to a suitable external power source. This can facilitate the manual operation of fixing the LED lamp. During use, directly insert the LED lamp with pins into the plug hole 7. At this time, rotate the rotating rod 602 using the operating handle 607. At this time, first, the inner ring body 603 is rotated. Under the elastic support of the winding spring 604, the eccentric ring shell 605 can be indirectly rotated, thereby pressing the pins of the LED lamp, and then fixing the position of the LED lamp.

[0034] One side of the cover body 2 is provided with a transparent observation window. The downward pressing mechanism 5 includes a downward pressing telescopic rod 501 fixed to the top of the cover body 2. The bottom end of the downward pressing telescopic rod 501 extends below the cover body 2. A frame plate 502 is fixed to the bottom end of the downward pressing telescopic rod 501. A range block 503 extending downward is fixed to the bottom of the frame plate 502. A buffer portion 504 is connected between the range blocks 503. This can facilitate the fixation of the LED lamp. In the semi-finished product of the LED lamp fixture, the LED lamp beads are simply soldered on the circuit board and there are exposed electrical connection portions. Elastic blocks 505 are fixed to the bottoms of both the buffer portion 504 and the range block 503. A receiving groove is provided at the bottom of the frame plate 502. A receiving spring 506 is fixed to the top inside the receiving groove. A floating cover 507 is fixed to the bottom of the receiving spring 506. An internal temperature detector 508 is fixed to the bottom of the floating cover 507. A through hole is provided in the bottom of the buffer portion 504 corresponding to the internal temperature detector 508. When fixing the LED lamp, the internal temperature detector 508 is used to directly detect the working temperature of the LED lamp. This can avoid damaging the LED lamp. After placing the LED lamp, the downward pressing telescopic rod 501 drives the frame plate 502 to descend, so that the buffer portion 504 and the range block 503 approach the LED lamp. Then, the elastic block 505 presses and fixes the LED lamp. During continuous descent, the buffer portion 504 deforms to make the internal temperature detector 508 on the floating cover 507 approach the LED lamp to be aged and detected, thereby facilitating the detection of the working temperature of the LED lamp.

[0035] During the aging test, it is also possible to change the test environment according to requirements to speed up the test speed. This device can control the environmental temperature inside the test box body 1 according to the requirements of the aging test. The external temperature detector mainly detects the temperature inside the test box body 1. At this time, when cooling is required, the air flow fan 101 can start to work, introducing the air flow in the external environment into the test shell to cool the LED lamp. The air flow can push the baffle 102 on one side of the exhaust strip hole. When it is necessary to maintain a high-temperature environment, the air flow fan 101 and the baffle 102 are only in a static state, and the air flow is relatively difficult to circulate, thus playing a heat preservation role. This test device has strong applicability and can adaptively supply power to LED lamps of different specifications and sizes. When it is necessary to adjust the position of the contact electrode part 44 on the extension arm 43, press down the elastic part 432 so that the elastic part 432 disengages from the contact test platform 3. At this time, the extension arm 43 can be rotated, and the slider 41 at one end of the extension arm 43 can be operated to slide at the bottom of the test platform 3. After adjustment, the elastic part 432 can contact the test platform 3 again, and the electrode block 444 can be kept in contact with the electrical connection part of the LED lamp at all times under the push of the buffer spring 442. Cooperating with the pressing mechanism 5 can better fix the LED lamp to be tested. The pressing telescopic rod drives the frame plate 502 to descend, so that the buffer part 504 and the range block 503 approach the LED lamp, and then the elastic block 505 presses and fixes the LED lamp. During continuous descent, the buffer part 504 deforms, making the internal temperature detector 508 on the floating cover 507 approach the LED lamp to be aged and detected, thus facilitating the detection of the working temperature of the LED lamp. Moreover, the pin fixing component 6 in the test platform 3 can fix and test the pin-type LED lamp inserted into the insertion hole 7. When in use, directly insert the LED lamp with pins into the insertion hole 7. At this time, rotate the rotating rod 602 with the operation handle 607. First, the inner ring body 603 is rotated, and under the elastic support of the winding spring 604, the eccentric ring shell 605 can be indirectly rotated, so that the eccentric ring shell 605 squeezes the pins of the LED lamp, thereby fixing the position of the LED lamp.

[0036] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. What is described in the above embodiments and the specification only illustrates the principle of the present invention. Without departing from the spirit and scope of the present invention, the present invention will have various changes and improvements, and these changes and improvements all fall within the scope of the present invention claimed. The scope of the present invention claimed is defined by the appended claims and their equivalents.

Claims

1. An LED lamp aging test device, comprising a test box body (1), and a cover body (2) is slidably clamped on the test box body (1), characterized in that: Inside the test box body (1), a test platform (3) is installed through a support part. Regularly arranged ventilation holes (301) are provided on the test platform (3). A sliding groove (302) is provided at the bottom of the test platform (3). Two power supply components (4) are slidably clamped in the sliding groove (302). A pressing mechanism (5) for restricting the position of the lamp to be tested is fixed on the top of the cover body (2). The power supply component (4) includes a slider (41) slidably clamped in the sliding groove (302). A clamping seat (42) is fixed to the bottom of the slider (41). An extension arm (43) is rotatably clamped on the clamping seat (42). A contact electrode part (44) is provided at one end of the extension arm (43). A power supply connector is provided on one side of the test box body (1) through a wire. A pin fixing component (6) is also included and installed inside the test platform (3). A cylindrical cavity extending inward is provided on the side wall of the test platform (3). The pin fixing component (6) includes a fitting cylinder (601) rotatably clamped in the cylindrical cavity. A rotating rod (602) is fixed between the fitting cylinders (601). An inner ring body (603) capable of rotating along with the rotation is sleeved outside the rotating rod (602). A winding spring (604) is connected to the outer wall of the inner ring body (603). An eccentric ring shell (605) is connected to the outer end of the winding spring (604). A part of the eccentric ring shell (605) gradually approaches the inner wall of the cylindrical cavity. A plugging hole (7) is vertically provided on the test platform (3). The bottom end of the plugging hole (7) extends into the cylindrical cavity and is located on one side of the eccentric ring shell (605). The eccentric ring shell (605) is connected to a suitable external power supply. During use, the LED lamp with pins is directly inserted into the plugging hole (7). By rotating the rotating rod (602), the eccentric ring shell (605) can be indirectly rotated, so that the eccentric ring shell (605) presses the lamp pins of the LED lamp, thereby fixing the LED lamp.

2. The LED lamp aging test device according to claim 1, characterized in that: External temperature detectors are provided at the bottom of the test platform (3) and the top of the cover body (2). The support part includes a rubber seat fixed to the bottom of the test platform (3). A support rod is fixedly connected between the bottom of the rubber seat and the bottom of the test box body (1).

3. The LED lamp aging test device according to claim 1, characterized in that: The extension arm (43) includes a rotating part (431) and an elastic part (432) connected to the rotating part (431). The rotating part (431) is rotatably installed on the clamping seat (42) and extends horizontally outward from the test platform (3) at one end. The elastic part (432) is made of an elastic material, and the part close to the rotating part (431) bends upward and extends. The upper surface of the elastic part (432) is in contact with the bottom of the test platform (3).

4. The LED lamp aging test device according to claim 3, characterized in that: The contact electrode part (44) includes an outer cylinder (441) fixed on the elastic part (432). A buffer spring (442) is fixed on the elastic part (432). The buffer spring (442) is located inside the outer cylinder (441). An electrode rod (443) is slidably clamped inside the outer cylinder (441). A bottom block for fitting against the inner wall of the outer cylinder (441) is fixed at the bottom of the electrode rod (443). An electrode block (444) extending above the outer cylinder (441) is fixed at the top of the electrode rod (443).

5. The LED lamp aging test device according to claim 4, characterized in that: Grooves arranged in parallel are provided at the top of the electrode block (444). Both the bottom block and the outer cylinder (441) are made of insulating materials. A limiting ring block for restricting the position of the electrode rod (443) is also fixed on the inner wall of the outer cylinder (441).

6. The LED lamp aging test device according to claim 1, characterized in that: One end of the fitting cylinder (601) extends outside the test platform (3). The length of the cylinder cavity is greater than the overall length of the pin fixing assembly (6). A relay rod (606) is fixed at one end of the fitting cylinder (601). The relay rod (606) is threadedly connected to the test platform (3) through the thread on its outer wall. An operation handle (607) is fixed at one end of the relay rod (606).

7. The LED lamp aging test device according to claim 1, characterized in that: One side of the cover body (2) is provided with a transparent observation window. The pressing mechanism (5) includes a pressing telescopic rod (501) fixed on the top of the cover body (2). The bottom end of the pressing telescopic rod (501) extends below the cover body (2). A frame plate (502) is fixed at the bottom end of the pressing telescopic rod (501). A range block (503) extending downward is fixed at the bottom of the frame plate (502). A buffer part (504) is connected between the range blocks (503).

8. The LED lamp aging test device according to claim 7, characterized in that: Elastic blocks (505) are fixed at the bottoms of both the buffer part (504) and the range block (503). A receiving groove is provided at the bottom of the frame plate (502). A receiving spring (506) is fixed at the top inside the receiving groove. A floating cover (507) is fixed at the bottom of the receiving spring (506). An internal temperature detector (508) is fixed at the bottom of the floating cover (507). A through hole is provided at the bottom of the buffer part (504) corresponding to the internal temperature detector (508).

9. The LED lamp aging test device according to claim 8, characterized in that: An air flow fan (101) is fixed on the side wall of the test box body (1). An exhaust air slot is opened on the inner wall of the test box body (1) on the opposite side of the air flow fan (101). A baffle (102) is provided outside the exhaust air slot. The top of the baffle (102) is hinged on the outer wall of the test box body (1).

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