Electronic circuit board high voltage resistance test seat

Abstract

The invention, which relates to the technical field of electronic circuit board testing, discloses an electronic circuit board high-voltage-resistant test seat comprising a test base, an air cylinder installed at the inner side of the test base, a test head installed at the output end of the air cylinder, a test board slidably connected to the test base and capable of moving horizontally and transversely, and collection boxes installed at both sides of the test base. A defective product collecting bin and a good product collecting bin are formed in the collecting box, a plurality of second opening grooves are formed in the upper portion of the testing plate, clamping assemblies are arranged on the inner sides of the second opening grooves, and each clamping assembly comprises a concentric-square-shaped plate movably connected to the inner side of the corresponding second opening groove and a plurality of first movable plates; a second movable plate is movably connected to the end of the first movable plate, and a rubber plate is movably connected to the bottom of the second movable plate, the circuit board can be rapidly clamped and fixed by arranging the clamping assembly, clamping can be adjusted according to the irregular shape and thickness of the circuit board, and the applicability of the equipment is improved.

Description

Technical Field

[0001] The invention relates to the technical field of electronic circuit board testing, and in particular to a high voltage resistance test socket for an electronic circuit board. Background Art

[0002] Electronic circuit boards, also known as printed circuit boards, are key components used to support and connect electronic components in electronic devices. The design and production quality of electronic circuit boards directly affect the performance and reliability of electronic products. Circuit board high-voltage testing can effectively detect the insulation performance, voltage resistance and electrical safety of circuit boards, and can detect existing hidden dangers and defects early to ensure that the circuit boards do not fail in actual use. During the test, the test instrument will apply a set high-voltage power supply to the electronic circuit board for a period of time. During the test, observe whether the PCB has leakage, breakdown and other problems.

[0003] After searching, the Chinese invention patent with the patent number CN118191562A discloses a PCB board test jig;

[0004] Compared with the prior art, the invention patent with Chinese patent number CN118191562A sets a trigger mechanism, which drives the push plate to contact the rotating plate through the movement of the needle plate, thereby controlling the opening and closing of the clamping mechanism. The overall operation is simple and the degree of automation is high, which improves the clamping and testing efficiency of the PCB board.

[0005] However, in actual use of the above device, after the circuit board test is completed, the equipment stops working when necessary, and then the old circuit board is disassembled and a new circuit board is installed, which affects the continuity of work, and the applicability to irregularly shaped circuit boards is low. It is not convenient to classify and store the circuit boards in time after the test. Therefore, an electronic circuit board high voltage test socket is proposed. Summary of the invention

[0006] The purpose of the present invention is to solve the shortcomings of the prior art, that is, the continuity of the test work is weak, the applicability to irregularly shaped circuit boards is low, and it is inconvenient to classify and store the circuit boards in time after the test, and to propose an electronic circuit board high voltage test socket.

[0007] In order to achieve the above object, the present invention adopts the following technical solutions:

[0008] A high-voltage test seat for an electronic circuit board comprises a test base, a cylinder is installed on the inner side of the test base, a test head is installed on the output end of the cylinder, a test board that can perform horizontal and lateral movements is slidably connected to the test base, a collection box is installed on both sides of the test base, a defective product collection bin and a good product collection bin are respectively provided inside the collection box, a plurality of second opening grooves are provided on the upper part of the test board, a clamping assembly is provided on the inner side of the second opening groove, the clamping assembly comprises a circular plate movably connected to the inner side of the second opening groove and a plurality of first movable plates, the end of the first movable plate is movably connected to the second movable plate, the bottom of the second movable plate is movably connected to a rubber plate, the plurality of rubber plates are separated from and contacted with the circuit board as the circular plate moves up and down, a plurality of opening and closing assemblies for the second opening grooves are provided on the test board, the opening and closing assemblies comprise a rotating ring movably connected on the test board and a plurality of support plates, and the plurality of support plates perform an opening and closing action on the second opening grooves through the rotation of the rotating ring.

[0009] The above technical solution further includes:

[0010] A first opening groove is provided on the inner side of the test base, a first rack is slidably provided on the inner side of the first opening groove, the first rack is fixedly connected to the test plate, and the cross sections of the first opening groove and the first rack are both convex.

[0011] A worm gear is rotatably connected to the inner side of the first opening slot, and the worm gear is meshed with the first rack. A first servo motor is installed on the side of the test base, and a worm is installed at the output end of the first servo motor extending to the inner side of the first opening slot. The end of the worm gear away from the first servo motor is rotatably connected to the inner wall of the first opening slot, and the worm gear is meshed with the worm gear to achieve horizontal movement of the test board. When the test head tests the next circuit board and takes out the previous circuit board at the same time, a new circuit board can be installed for testing, which greatly shortens the installation time of the circuit board and ensures the continuity of the test.

[0012] A plurality of fixed plates are installed on the inner side of the second opening groove, and a rotating rod is rotatably connected to the side of the fixed plate. The rotating rod is fixedly connected to the first movable plate, and a torsion spring is installed on the side of the first movable plate close to the fixed plate, and one end of the torsion spring away from the first movable plate is fixedly connected to the fixed plate.

[0013] The second movable plate is threadedly connected to the first threaded rod, and one end of the first threaded rod close to the supporting plate is threadedly connected to the rubber plate.

[0014] The inner side of the second movable plate is rotatably connected with a second threaded rod, and the second threaded rod is threadedly connected to the first movable plate, so that circuit boards of irregular shapes and different thicknesses can be fixed.

[0015] A gear is installed at one end of the rotating rod away from the fixed plate, and a second rack is slidably arranged on the inner side of the second opening groove. The second rack is meshed with the gear, and the ends of multiple second racks away from the support plate are fixedly connected to the circular plate.

[0016] A plurality of sliding grooves are provided on the inner side of the test plate, a sliding block is slidably arranged inside the sliding groove, a spring is installed on the side of the sliding block, an end of the spring away from the sliding block is fixedly connected to the inner wall of the sliding groove, and the sliding block is fixedly connected to the support plate.

[0017] A connecting rope is installed on the side of the support plate close to the spring, and the ends of the multiple connecting ropes away from the support plate are fixedly connected to the rotating ring. A pulley is rotatably connected to the side of the test plate close to the rotating ring. The pulley and the connecting rope are movably connected, which can drive the multiple support plates to open and close the second opening groove, thereby realizing automatic removal and collection of the circuit boards.

[0018] The size of the sliding groove opening is matched with the size of the sliding block, and the cross sections of the sliding groove and the sliding block are both convex.

[0019] The present invention has the following beneficial effects:

[0020] 1. In the present invention, the circuit board can be quickly clamped and fixed by setting a clamping assembly, which is convenient for high voltage resistance testing, and the clamping assembly can be adjusted according to the irregular shape and thickness of the circuit board, thereby improving the applicability of the equipment.

[0021] 2. In the present invention, when the test head tests the next circuit board, the previous circuit board is taken out at the same time, and a new circuit board can be installed to prepare for testing, which greatly shortens the installation time of the circuit board, thereby ensuring the continuity of the test and improving the test efficiency.

[0022] 3. In the present invention, the process of quickly taking out and collecting the circuit boards by opening and closing the components significantly reduces the time of manual operation, making the testing process more efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a schematic diagram of the overall structure of an electronic circuit board high voltage resistance test socket proposed by the present invention;

[0024] Figure 2 It is a schematic diagram of the bottom cross-sectional structure of the present invention;

[0025] Figure 3 It is a schematic diagram of the structure of the test board in the present invention;

[0026] Figure 4 for Figure 1 A schematic diagram of the structure enlargement in the middle;

[0027] Figure 5 for Figure 4 A magnified schematic diagram of the structure at B in the middle;

[0028] Figure 6 for Figure 2 A magnified schematic diagram of the structure at C in the middle;

[0029] Figure 7 for Figure 3 Enlarged schematic diagram of the structure at point D in the middle.

[0030] In the figure: 1. test base; 2. cylinder; 3. test head; 4. first opening slot; 5. first rack; 6. worm gear; 7. first servo motor; 8. worm; 9. test plate; 10. sliding slot; 11. sliding block; 12. support plate; 13. connecting rope; 14. pulley; 15. rotating ring; 16. second opening slot; 17. fixed plate; 18. rotating rod; 19. torsion spring; 20. first movable plate; 21. second movable plate; 22. first threaded rod; 23. rubber plate; 24. second threaded rod; 25. gear; 26. second rack; 27. circular plate; 28. collection box; 29. ​​defective collection bin; 30. good collection bin; 31. spring. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0032] Embodiment 1

[0033] like Figure 1-Figure 7As shown, the present invention proposes an electronic circuit board high voltage resistance test seat, including a test base 1, a cylinder 2 is installed on the inner side of the test base 1, a test head 3 is installed on the output end of the cylinder 2, a test plate 9 that can perform horizontal lateral movement is slidably connected to the test base 1, and a collection box 28 is installed on both sides of the test base 1. A defective product collection bin 29 and a good product collection bin 30 are respectively opened inside the collection box 28. A plurality of second opening grooves 16 are opened on the upper part of the test board 9, and a clamping assembly is arranged on the inner side of the second opening groove 16. The clamping assembly includes a movable connection between the second opening groove and the second opening groove. The circular plate 27 and the plurality of first movable plates 20 are arranged inside the opening groove 16, the end of the first movable plate 20 is movably connected with the second movable plate 21, the bottom of the second movable plate 21 is movably connected with the rubber plate 23, the plurality of rubber plates 23 are separated from and contacted with the circuit board as the circular plate 27 moves up and down, the test board 9 is provided with a plurality of opening and closing components for the second opening groove 16, the opening and closing components include a rotating ring 15 movably connected on the test board 9 and a plurality of support plates 12, and the plurality of support plates 12 open and close the second opening groove 16 through the rotation of the rotating ring 15;

[0034] A first opening slot 4 is provided on the inner side of the test base 1, and a first rack 5 is slidably provided on the inner side of the first opening slot 4, and the first rack 5 is fixedly connected to the test plate 9. The cross sections of the first opening slot 4 and the first rack 5 are both convex, and a worm gear 6 is rotatably connected to the inner side of the first opening slot 4, and the worm gear 6 is meshed with the first rack 5. A first servo motor 7 is installed on the side of the test base 1, and a worm 8 is installed on the output end of the first servo motor 7 extending to the inner side of the first opening slot 4, and the end of the worm 8 away from the first servo motor 7 is rotatably connected to the inner wall of the first opening slot 4, and the worm 8 is meshed with the worm gear 6. A plurality of fixed plates 17 are installed on the inner side of the second opening slot 16, and a rotating rod 18 is rotatably connected to the side of the fixed plate 17, and the rotating rod 18 is fixedly connected to the first movable plate 20, and a torsion spring 19 is installed on the side of the first movable plate 20 close to the fixed plate 17, and the end of the torsion spring 19 away from the first movable plate 20 is fixedly connected to the fixed plate 17;

[0035] The second movable plate 21 is threadedly connected to the first threaded rod 22, and the end of the first threaded rod 22 close to the support plate 12 is threadedly connected to the rubber plate 23. The second threaded rod 24 is rotatably connected to the inner side of the second movable plate 21, and the second threaded rod 24 is threadedly connected to the first movable plate 20. A gear 25 is installed at the end of the rotating rod 18 away from the fixed plate 17, and a second rack 26 is slidably provided on the inner side of the second opening groove 16. The second rack 26 is meshed with the gear 25, and the ends of multiple second racks 26 away from the support plate 12 are fixedly connected to the circular plate 27.

[0036] In this embodiment, when a high voltage resistance test is required, the circuit board can be clamped and fixed. First, the circular plate 27 is pressed. When the circular plate 27 moves downward, the second rack 26 can be driven to move downward. Since the second rack 26 is meshed with the gear 25, the gear 25 is driven to rotate when the second rack 26 moves downward. When the gear 25 rotates, the collection box 28 can be driven to rotate, and the first movable plate 20 can be driven to rotate with it until the first movable plate 20 and the second movable plate 21 are perpendicular to the test plate 9. At this time, the torsion spring 19 is contracted, and then the collection box 28 can be driven to rotate. The circuit board is placed on the inner side of the second opening groove 16 and on the support plate 12 at the same time, and the circular plate 27 can be loosened. At this time, the torsion spring 19 in the contracted state is reset, and the first movable plate 20 is driven to reset by the torsion spring 19 until the first movable plate 20 is parallel to the support plate 12. At the same time, the rubber plate 23 is driven to contact the circuit board on the support plate 12 by the first movable plate 20 and the second movable plate 21, so as to achieve rapid fixation thereof, which is simple and quick. Then, the cylinder 2 is started to drive the test head 3 to contact the circuit board to achieve high voltage resistance test.

[0037] And if encountering circuit boards of irregular shapes and different thicknesses, the positions of multiple rubber plates 23 can be adjusted according to the shape and thickness of the circuit boards to achieve accurate positioning. First, the second threaded rod 24 can be rotated, and the second movable plate 21 can be horizontally moved by the force generated by rotating the second threaded rod 24 and the first movable plate 20, and the horizontal movement of the rubber plate 23 can be achieved at the same time. And the first threaded rod 22 can be rotated, and the force generated by the rotation can be used to achieve the up and down movement of the rubber plate 23. In this way, it can be applicable to fixing circuit boards of various specifications, thereby improving the applicability of the equipment;

[0038] After the test of the current circuit board is completed, the first servo motor 7 can be started, and the worm 8 can be driven to rotate by the first servo motor 7. Since the worm 8 is meshed with the worm gear 6, and the worm gear 6 is meshed with the first rack 5, when the worm 8 rotates, the worm gear 6 can be driven to move by the worm gear 6, and the test board 9 can be driven to move at the same time, until the test head 3 is aligned with the next circuit board for testing, and according to the test results of the previous circuit board, if the previous circuit board is defective, it is taken out to the defective collection bin 29, and if it is good, it is taken out to the good collection bin 30, and when the test head 3 tests the next circuit board, after taking out the previous circuit board, a new circuit board can be installed to prepare for testing, which greatly shortens the installation time of the circuit board, thereby ensuring the continuity of the test and improving the test efficiency.

[0039] Embodiment 2

[0040] like Figure 1-Figure 7As shown, based on the first embodiment, a plurality of sliding grooves 10 are provided on the inner side of the test plate 9, a sliding block 11 is slidingly provided inside the sliding groove 10, a spring 31 is installed on the side of the sliding block 11, an end of the spring 31 away from the sliding block 11 is fixedly connected to the inner wall of the sliding groove 10, the sliding block 11 is fixedly connected to the support plate 12, a connecting rope 13 is installed on the side of the support plate 12 close to the spring 31, a plurality of connecting ropes 13 are fixedly connected to the rotating ring 15 at one end away from the support plate 12, a pulley 14 is rotatably connected to the side of the test plate 9 close to the rotating ring 15, the pulley 14 and the connecting rope 13 are movably connected, the size of the opening of the sliding groove 10 is adapted to the size of the sliding block 11, and the cross-sections of the sliding groove 10 and the sliding block 11 are both convex.

[0041] In this embodiment, when it is necessary to take out the tested circuit board, the rotating ring 15 can be rotated. When the rotating ring 15 rotates, it pulls the multiple connecting ropes 13, so that the connecting ropes 13 are moved through the support of the pulley 14. At the same time, the multiple connecting ropes 13 respectively drive the corresponding support plates 12 to move, so that the support plates 12 are moved along the sliding groove 10 through the sliding block 11. At this time, the spring 31 contracts until the multiple support plates 12 move to the outside of the second opening groove 16 and no longer block the second opening groove 16. At this time, the circuit board on the support plate 12 will automatically fall off, so that the circuit board can be quickly taken out and then automatically fall into the defective product collection bin 29 or the good product collection bin 30. The process of rapid removal and collection significantly reduces the time of manual operation, making the testing process more efficient.

[0042] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A high voltage test socket for an electronic circuit board, comprising a test socket (1), characterized in that: A cylinder (2) is installed on the inner side of the test base (1), and a test head (3) is installed on the output end of the cylinder (2). A test plate (9) capable of horizontal lateral movement is slidably connected to the test base (1). Collection boxes (28) are installed on both sides of the test base (1). A defective product collection bin (29) and a good product collection bin (30) are respectively provided inside the collection box (28). A plurality of second opening grooves (16) are provided on the upper part of the test plate (9). A clamping assembly is provided on the inner side of the second opening groove (16). The clamping assembly includes a circular plate (27) movably connected to the inner side of the second opening groove (16). and a plurality of first movable plates (20), the end of the first movable plate (20) being movably connected to a second movable plate (21), the bottom of the second movable plate (21) being movably connected to a rubber plate (23), the plurality of rubber plates (23) being separated from and in contact with the circuit board as the circular plate (27) moves up and down, the test board (9) being provided with a plurality of opening and closing components for the second opening groove (16), the opening and closing components comprising a rotating ring (15) movably connected to the test board (9) and a plurality of support plates (12), the plurality of support plates (12) performing an opening and closing action on the second opening groove (16) through the rotation of the rotating ring (15).

2. The electronic circuit board high voltage test socket according to claim 1, characterized in that: A first opening groove (4) is provided on the inner side of the test base (1), a first rack (5) is slidably provided on the inner side of the first opening groove (4), the first rack (5) is fixedly connected to the test plate (9), and the cross sections of the first opening groove (4) and the first rack (5) are both convex.

3. The electronic circuit board high voltage test socket according to claim 2, characterized in that: A worm wheel (6) is rotatably connected to the inner side of the first opening slot (4), and the worm wheel (6) is meshed with the first rack (5). A first servo motor (7) is installed on the side of the test base (1), and a worm (8) is installed at the output end of the first servo motor (7) extending to the inner side of the first opening slot (4). An end of the worm (8) away from the first servo motor (7) is rotatably connected to the inner wall of the first opening slot (4), and the worm (8) is meshed with the worm wheel (6).

4. The electronic circuit board high voltage test socket according to claim 1, characterized in that: A plurality of fixed plates (17) are installed on the inner side of the second opening groove (16); a rotating rod (18) is rotatably connected to the side of the fixed plate (17); the rotating rod (18) is fixedly connected to the first movable plate (20); a torsion spring (19) is installed on the side of the first movable plate (20) close to the fixed plate (17); an end of the torsion spring (19) away from the first movable plate (20) is fixedly connected to the fixed plate (17).

5. The electronic circuit board high voltage test socket according to claim 1, characterized in that: The second movable plate (21) is threadedly connected to the first threaded rod (22), and one end of the first threaded rod (22) close to the support plate (12) is threadedly connected to the rubber plate (23).

6. The electronic circuit board high voltage test socket according to claim 5, characterized in that: A second threaded rod (24) is rotatably connected to the inner side of the second movable plate (21), and the second threaded rod (24) is threadably connected to the first movable plate (20).

7. The electronic circuit board high voltage test socket according to claim 4, characterized in that: A gear (25) is installed at one end of the rotating rod (18) away from the fixed plate (17); a second rack (26) is slidably arranged on the inner side of the second opening groove (16); the second rack (26) is meshed with the gear (25); and the ends of a plurality of the second racks (26) away from the supporting plate (12) are fixedly connected to the circular plate (27).

8. The electronic circuit board high voltage test socket according to claim 1, characterized in that: A plurality of sliding grooves (10) are provided on the inner side of the test plate (9), a sliding block (11) is slidably arranged inside the sliding groove (10), a spring (31) is installed on the side of the sliding block (11), an end of the spring (31) away from the sliding block (11) is fixedly connected to the inner wall of the sliding groove (10), and the sliding block (11) is fixedly connected to the support plate (12).

9. The electronic circuit board high voltage test socket according to claim 1, characterized in that: A connecting rope (13) is installed on the side of the support plate (12) close to the spring (31), and one end of a plurality of the connecting ropes (13) away from the support plate (12) is fixedly connected to a rotating ring (15). A pulley (14) is rotatably connected to the side of the test plate (9) close to the rotating ring (15), and the pulley (14) and the connecting rope (13) are movably connected.

10. The electronic circuit board high voltage test socket according to claim 8, characterized in that: The size of the opening of the sliding groove (10) is matched to the size of the sliding block (11), and the cross-sections of the sliding groove (10) and the sliding block (11) are both convex.

Images