Imaging quality testing method, device and equipment for X-ray linear array detection equipment

Abstract

The present application relates to an imaging quality test method, device and equipment for an X-ray linear array detection device, wherein the method includes: determining the direction of motion of an X-ray linear array detection object and the detection line position of the X-ray linear array detection device; performing clarity detection of the optical path imaging of the X-ray linear array detection device based on the direction of motion and the detection line position; performing signal-to-noise ratio, noise signal mutual interference and pixel response consistency detection of the optical path imaging of the X-ray linear array detection device respectively; and collecting the results of the signal-to-noise ratio detection, clarity detection, noise signal mutual interference detection and pixel response consistency detection to obtain the imaging quality test result of the X-ray linear array detection device. During the whole process, the imaging quality of the X-ray linear array detection device is respectively tested for clarity, signal-to-noise ratio, noise signal mutual interference and pixel response consistency, and the imaging quality test of the X-ray linear array detection device is performed from four dimensions.

Description

Technical Field

[0001] The present application relates to the technical field of equipment testing, and in particular to an imaging quality testing method, device, computer equipment, storage medium and computer program product for an X-ray linear array detection device. Background Art

[0002] With the continuous development of modern science and technology and industrial production, X-ray linear array detection technology, as an important non-destructive testing method, has been widely used in various industrial fields, such as aerospace, machinery manufacturing, petrochemicals, etc. This technology can accurately detect the internal structure and composition of objects by utilizing the penetration and imaging principles of X-rays. However, the imaging quality of X-ray linear array detection directly affects the accuracy and reliability of detection. Therefore, in order to ensure the imaging quality of X-ray linear array detection, it is particularly important to formulate a series of strict test standards.

[0003] When formulating the imaging quality test standards for X-ray linear array detection, multiple factors need to be considered. First, the main evaluation indicators of imaging quality need to be clarified, which can reflect the performance characteristics and detection capabilities of the imaging system. Secondly, the scientificity and feasibility of the test standards need to be considered to ensure that the formulation of the standards is based on scientific theories and practical experience, and to take into account the actual conditions such as technical level and equipment conditions.

[0004] However, there is currently no systematic and accurate imaging quality testing solution for X-ray linear array detection equipment. Summary of the invention

[0005] Based on this, it is necessary to provide a systematic and accurate imaging quality testing method, device, computer equipment, storage medium and computer program product for X-ray linear array detection equipment to address the above technical problems.

[0006] In a first aspect, the present application provides an imaging quality testing method for an X-ray linear array detection device. The method comprises:

[0007] Determine the direction of movement of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device;

[0008] Performing clarity detection of optical path imaging of an X-ray linear array detection device based on the movement direction and the detection line position;

[0009] The signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of the optical path imaging of the X-ray linear array detection equipment are tested respectively;

[0010] The signal-to-noise ratio test results, clarity test results, noise signal mutual interference test results, and pixel response consistency test results are collected to obtain the imaging quality test results of the X-ray linear array detection equipment.

[0011] In one embodiment, performing signal-to-noise ratio detection of optical path imaging of an X-ray linear array detection device includes:

[0012] Get the pure signal intensity sequence of a single pixel;

[0013] Based on the pure signal intensity sequence of the single pixel, calculating the mean and standard deviation of the pure signal intensity of the single pixel;

[0014] Calculating the ratio of the mean value to the standard deviation of the pure signal intensity of the single pixel to obtain the signal-to-noise ratio of the single pixel;

[0015] Repeatedly calculate the signal-to-noise ratio of each pixel to obtain the mean signal-to-noise ratio of all pixels.

[0016] In one embodiment, the clarity detection of the optical path imaging of the X-ray linear array detection device based on the motion direction and the detection line position includes:

[0017] If the clarity of the direction of the test line is tested, the metal straight wire is determined to be arranged in a posture covering the test line and perpendicular to the test line;

[0018] If the clarity of the moving direction is tested, the metal straight wire is determined to be arranged in a position parallel to the detection line and spaced a certain distance from the detection line in the opposite direction of the moving direction;

[0019] Collecting a metal straight wire image, and calculating statically corrected normalized image data of the metal straight wire image;

[0020] Calculate the signal intensity mean of each pixel according to the image data to obtain a signal attenuation rate peak curve corresponding to the position of each metal straight wire;

[0021] Performing Gaussian distribution fitting on the signal attenuation rate peak curve corresponding to each metal straight wire to obtain a fitting result;

[0022] A clarity detection result is obtained according to the standard deviation in the fitting result.

[0023] In one embodiment, the diameter of the metal wire is the same as the size of the pixel, and the metal wire is a tungsten wire.

[0024] In one embodiment, performing noise signal mutual interference detection of optical path imaging of an X-ray linear array detection device includes:

[0025] Obtain the signal intensity response value and signal intensity mean of each pixel;

[0026] Subtract the signal intensity mean from the signal intensity response value of each pixel to obtain the noise signal value of each pixel;

[0027] According to the noise signal value of each pixel, the Pearson correlation coefficient between each pixel and its adjacent pixels is calculated;

[0028] Based on the Pearson correlation coefficient calculation results, the mutual interference detection results were obtained.

[0029] In one embodiment, performing pixel response consistency detection of optical path imaging of an X-ray linear array detection device includes:

[0030] Obtaining the pure response value curve of the detection card;

[0031] Calculating the fitting error of the pure response value curve;

[0032] According to the fitting error results, the pixel response consistency detection results are obtained.

[0033] In a second aspect, the present application also provides an imaging quality testing device for an X-ray linear array detection device. The device comprises:

[0034] Setting a parameter determination module for determining the movement direction of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device;

[0035] A clarity detection module, used for performing clarity detection of optical path imaging of an X-ray linear array detection device based on the movement direction and the detection line position;

[0036] Comprehensive detection module, used to detect the signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of optical path imaging of X-ray linear array detection equipment;

[0037] The collection processing module is used to collect the signal-to-noise ratio detection results, the clarity detection results, the noise signal mutual interference detection results, and the pixel response consistency detection results to obtain the imaging quality test results of the X-ray linear array detection equipment.

[0038] In a third aspect, the present application further provides a computer device. The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the following steps when executing the computer program:

[0039] Determine the direction of movement of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device;

[0040] Performing clarity detection of optical path imaging of an X-ray linear array detection device based on the movement direction and the detection line position;

[0041] The signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of the optical path imaging of the X-ray linear array detection equipment are tested respectively;

[0042] The signal-to-noise ratio test results, clarity test results, noise signal mutual interference test results, and pixel response consistency test results are collected to obtain the imaging quality test results of the X-ray linear array detection equipment.

[0043] In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0044] Determine the direction of movement of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device;

[0045] Performing clarity detection of optical path imaging of an X-ray linear array detection device based on the movement direction and the detection line position;

[0046] The signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of the optical path imaging of the X-ray linear array detection equipment are tested respectively;

[0047] The signal-to-noise ratio test results, clarity test results, noise signal mutual interference test results, and pixel response consistency test results are collected to obtain the imaging quality test results of the X-ray linear array detection equipment.

[0048] In a fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0049] Determine the direction of movement of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device;

[0050] Performing clarity detection of optical path imaging of an X-ray linear array detection device based on the movement direction and the detection line position;

[0051] The signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of the optical path imaging of the X-ray linear array detection equipment are tested respectively;

[0052] The signal-to-noise ratio test results, clarity test results, noise signal mutual interference test results, and pixel response consistency test results are collected to obtain the imaging quality test results of the X-ray linear array detection equipment.

[0053] The imaging quality test method, device, computer device, storage medium and computer program product of the above-mentioned X-ray linear array detection equipment determine the movement direction of the X-ray linear array detection object and the detection line position of the X-ray linear array detection equipment; perform clarity detection of the optical path imaging of the X-ray linear array detection equipment based on the movement direction and the detection line position; respectively perform signal-to-noise ratio, noise signal mutual interference and pixel response consistency detection of the optical path imaging of the X-ray linear array detection equipment; collect the signal-to-noise ratio detection results, clarity detection results, noise signal mutual interference detection results and pixel response consistency detection results to obtain the imaging quality test results of the X-ray linear array detection equipment. During the whole process, the imaging quality of the X-ray linear array detection equipment is respectively tested for clarity, signal-to-noise ratio, noise signal mutual interference and pixel response consistency, and the imaging quality test of the X-ray linear array detection equipment is performed from four dimensions, so that accurate imaging quality testing can be achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] Figure 1 A diagram showing an application environment of an imaging quality testing method for an X-ray linear array detection device in one embodiment;

[0055] Figure 2 It is a schematic flow chart of an imaging quality testing method of an X-ray linear array detection device in one embodiment;

[0056] Figure 3 Schematic diagram of the metal straight wire posture when testing the clarity of the detection line direction;

[0057] Figure 4 Schematic diagram of the metal wire posture when testing the clarity of the movement direction;

[0058] Figure 5 is a schematic diagram of a sub-process of S400 in one embodiment;

[0059] Figure 6 A schematic diagram of the fitting effect of Gaussian distribution fitting for each curve;

[0060] Figure 7 It is the fitting schematic diagram of the pure response value curve;

[0061] Figure 8 A structural block diagram of an imaging quality testing device for an X-ray linear array detection device in one embodiment;

[0062] Fig. 9 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0063] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0064] The imaging quality testing method of the X-ray linear array detection device provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown. Among them, the terminal 102 sends a test request to the imaging quality test platform 104 of the X-ray linear array detection device, and the imaging quality test platform 104 of the X-ray linear array detection device determines the movement direction of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device; based on the movement direction and the detection line position, the clarity detection of the optical path imaging of the X-ray linear array detection device is performed; the signal-to-noise ratio, the mutual interference of noise signals and the consistency of pixel response of the optical path imaging of the X-ray linear array detection device are respectively performed; the signal-to-noise ratio detection results, the clarity detection results, the mutual interference of noise signals and the consistency of pixel response detection results are aggregated to obtain the imaging quality test results of the X-ray linear array detection device. Among them, the terminal 102 can be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc. Portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc.

[0065] In one embodiment, Figure 2 As shown, a method for testing the imaging quality of an X-ray linear array detection device is provided. Figure 1 The imaging quality test platform 104 of the X-ray linear array detection device in the embodiment is used as an example to illustrate, including the following steps:

[0066] S200: Determine the movement direction of the X-ray line array detection object and the detection line position of the X-ray line array detection device.

[0067] X-ray linear array detection equipment utilizes the penetration and imaging principle of X-rays to receive X-ray signals through linear array detectors and convert them into image signals, thereby achieving non-destructive testing of the internal structure of the object being inspected. The X-ray source emits X-rays, which attenuate to varying degrees after passing through the object being inspected due to the different density and thickness of the material. The attenuated X-rays are received by the linear array detectors and converted into image signals. By processing and analyzing these image signals, the internal structure information of the object being inspected can be obtained.

[0068] First, the physical layout of the X-ray linear array detection equipment needs to be accurately identified, including the arrangement of the detectors, the position of each detection line, etc. At the same time, the motion path of the detection object (such as the object or material to be detected) is accurately calibrated to ensure that the motion direction matches the detection range of the detection equipment. Set the motion parameters to ensure that it can pass through the detection area stably and continuously during the test.

[0069] S400: Perform clarity detection of optical path imaging of the X-ray linear array detection device based on the movement direction and the detection line position.

[0070] Image clarity refers to the clarity of image details, which reflects the resolution and detail reproduction capabilities of each part of the image (such as edges, textures, etc.). We choose to collect straight metal wire images of a certain specification to analyze and evaluate the clarity of the image. Specifically, clarity detection includes two dimensions: clarity test in the detection line direction and clarity test in the motion direction. When testing the clarity in these two dimensions, the corresponding metal wire setting postures are different. Specifically, if the clarity in the detection line direction is tested, the metal wire setting posture is determined to cover the detection line and be arranged perpendicular to the detection line. The specific setting posture of the metal wire is as follows: Figure 3 If the clarity of the moving direction is tested, the metal straight wire is set to be parallel to the detection line and arranged at a certain distance from the detection line in the opposite direction of the moving direction. The specific setting position of the metal straight wire is as follows: Figure 4 shown.

[0071] S600: respectively performing detection of the signal-to-noise ratio, mutual interference of noise signals, and consistency of pixel response of the optical path imaging of the X-ray linear array detection device.

[0072] Signal-to-noise ratio detection. By comparing the signal strength in the image with the strength of the background noise, the signal-to-noise ratio (SNR) is calculated. Noise signal mutual interference detection. By applying a signal of known strength on different test lines, the signal interference between adjacent test lines is observed and recorded. This helps to evaluate the performance stability of the device in complex test environments.

[0073] Pixel response consistency test. Test each detection unit (pixel) of the device one by one, record its response value to the same X-ray intensity, and evaluate the response difference between each pixel. This can be achieved by taking images under a uniform radiation field and calculating the coefficient of variation of each pixel output value.

[0074] S800: Collect the signal-to-noise ratio test results, the clarity test results, the noise signal mutual interference test results, and the pixel response consistency test results to obtain the imaging quality test results of the X-ray linear array detection device.

[0075] The data of the above tests are collated, including signal-to-noise ratio, clarity, noise interference and pixel response consistency. Furthermore, based on the collated data, combined with the technical specifications and application requirements of the equipment, the imaging quality of the X-ray linear array detection equipment can be comprehensively analyzed and evaluated.

[0076] The imaging quality test method of the above-mentioned X-ray linear array detection equipment determines the movement direction of the X-ray linear array detection object and the detection line position of the X-ray linear array detection equipment; performs clarity detection of the optical path imaging of the X-ray linear array detection equipment based on the movement direction and the detection line position; respectively performs signal-to-noise ratio, noise signal mutual interference and pixel response consistency detection of the optical path imaging of the X-ray linear array detection equipment; and collects the signal-to-noise ratio detection results, clarity detection results, noise signal mutual interference detection results and pixel response consistency detection results to obtain the imaging quality test results of the X-ray linear array detection equipment. During the whole process, the imaging quality of the X-ray linear array detection equipment is respectively tested for clarity, signal-to-noise ratio, noise signal mutual interference and pixel response consistency, and the imaging quality test of the X-ray linear array detection equipment is performed from four dimensions, so that accurate imaging quality testing of the system can be achieved.

[0077] In one embodiment, performing signal-to-noise ratio detection of optical path imaging of an X-ray linear array detection device includes:

[0078] Obtain a pure signal intensity sequence of a single pixel; based on the pure signal intensity sequence of a single pixel, calculate the mean and standard deviation of the pure signal intensity of a single pixel; calculate the ratio of the mean and standard deviation of the pure signal intensity of a single pixel to obtain the signal-to-noise ratio of the single pixel; repeatedly calculate the signal-to-noise ratio of each pixel to obtain the mean signal-to-noise ratio of all pixels.

[0079] Image signal-to-noise ratio (‌SNR) refers to the intensity ratio of the original signal to the noise signal in the image, generally referring to the ratio of the power spectrum of the signal to the noise. Since the power spectrum is usually difficult to calculate, it is generally approximated by the ratio of the signal to the noise variance. However, in X-ray linear array detection, the variance of the signal is difficult to calculate.

[0080] We can choose another calculation method to replace it under fixed test conditions (fixed ray source voltage, fixed ray source current), namely:

[0081]

[0082] s is the pure signal intensity sequence of a single pixel, mean() is the calculated mean, std() is the calculated standard deviation, then SNR_s is the signal-to-noise ratio of a single pixel, and SNR is the mean signal-to-noise ratio of all pixels.

[0083] In one embodiment, if Figure 5As shown, S400 includes:

[0084] S410: If the clarity of the direction of the test line is tested, the metal straight wire is determined to be arranged in a posture covering the test line and perpendicular to the test line.

[0085] A straight metal wire of a certain length with a diameter equal to the pixel size can be selected, preferably a tungsten wire. Tungsten wire has high density and good X-ray absorption ability, so that a clear contrast can be formed in the X-ray image, which is convenient for observation and measurement. When performing a clarity test in the detection line direction, the metal wire is set to cover the detection line and be arranged perpendicular to the detection line. The specific position is shown as follows Figure 3 shown.

[0086] S420: If the clarity of the moving direction is tested, the metal straight wire is determined to be arranged in a position parallel to the detection line and at a certain distance from the detection line in the opposite direction of the moving direction.

[0087] When testing the clarity of the moving direction, make sure that the metal straight wire is set in a position parallel to the detection line and arranged at a certain distance from the detection line in the opposite direction of the moving direction. The spacing here can be set according to the actual needs. The specific position is shown as follows: Figure 4 shown.

[0088] S430: Collecting a metal straight wire image, and calculating statically corrected normalized image data of the metal straight wire image.

[0089] When testing the clarity of the detection line direction, follow the Figure 3 In the manner shown, several metal straight wires are fixed on the detection platform in a manner that covers and is perpendicular to the detection line. They can be arranged densely as required, and then static corrected normalized image data is collected and calculated according to the actual normal operation condition parameters. When testing the clarity in the direction of motion, follow the following procedure: Figure 4 In the method shown, several metal straight wires of the same length as the detection line are fixed on the detection platform in a direction completely parallel to the detection line. The number of rows can be selected according to needs, and then dynamic correction image data is collected according to the actual normal operation condition parameters.

[0090] S440: Calculate the signal intensity mean of each pixel according to the image data to obtain a signal attenuation rate peak curve corresponding to the position of each metal straight wire.

[0091] When testing the clarity in the detection line direction, the mean value of each pixel of the obtained image data is calculated, and each metal wire position should correspond to a signal attenuation rate peak curve. When testing the clarity in the moving direction, each metal wire should also have a signal attenuation rate peak curve for each pixel. Specifically, the mean value m of the signal intensity of each pixel is calculated based on the image data, and then 1-m is calculated to obtain the signal attenuation rate peak curve corresponding to the position of each metal wire.

[0092] S450: Perform Gaussian distribution fitting on the signal attenuation rate peak curve corresponding to each metal straight wire to obtain a fitting result.

[0093] Then, a Gaussian distribution fit is performed on each curve, and the specific fitting results corresponding to the clarity of the test line direction are as follows: Figure 6 Similarly, when testing the clarity of the moving direction, a Gaussian distribution fit is performed on each curve. The Gaussian curve fitting (Gauss) uses the formula ; Among them, coefficient a1 = 0.5203, b1= 8.7384, c1 = 0.8852; goodness of fit SSE = 0.0004, R square = 0.9986.

[0094] S460: Obtain a clarity detection result according to the standard deviation in the fitting result.

[0095] When testing the clarity of the detection line direction, the standard deviation c in the fitting result represents the clarity of the image. The larger the standard deviation, the worse the clarity, and vice versa. The standard deviation c of the metal straight wire curve at different positions represents the clarity of different detection positions, and the average value of the standard deviation c of all positions represents the overall clarity of the detection line direction. When testing the clarity of the moving direction, a Gaussian distribution fitting is performed on each curve to obtain the standard deviation c value at the pixel, thus forming a c value matrix. The mean of each column of this matrix represents the clarity of the moving direction of the pixel, and the average value of all c represents the overall clarity of the moving direction.

[0096] Furthermore, the clarity of the moving direction will be affected by noise, and the noise can be suppressed by reducing the detection speed or increasing the current of the ray source to improve this effect. In addition, in traditional technology, clarity detection is generally performed by an image quality meter. Image quality meters mainly include two types: linear image quality meters and dual-wire image quality meters. Among them, the linear image quality meter is a series of parallel arrangement of metal straight wires of different diameters. The dual-wire image quality meter is usually composed of multiple wire pairs placed in a rigid translucent plastic box, and the diameters of these wire pairs are equal to the distance between the wire pairs. However, the cost of these two image quality meters is not low, especially the dual-wire image quality meter. The implementation cost of the clarity test method of the present application is lower. In addition, the detection results of the traditional clarity detection method based on the image quality meter are generally qualitatively observed by naked eye. If quantitative test analysis is required, it is generally performed by directly calculating the peak width, MTF (modulation transfer function) and other functions. In this embodiment, the signal attenuation rate peak curve of the signal is first fitted and then the standard deviation is calculated to more accurately quantitatively analyze the clarity.

[0097] In one embodiment, performing noise signal mutual interference detection of optical path imaging of an X-ray linear array detection device includes:

[0098] Step 1: Obtain the signal intensity response value and signal intensity mean of each pixel.

[0099] First, a specific test sample (such as a metal plate of uniform thickness or a standard test pattern) needs to be imaged using an X-ray linear array detection device. Then, the signal intensity response value of each pixel is extracted from the imaging result. These values ​​represent the X-ray intensity received by each pixel. Next, the mean of all pixel signal intensity response values ​​is calculated. This mean represents the average signal intensity of the entire image and can be used as a benchmark for subsequent calculations.

[0100] Step 2: Subtract the signal intensity mean from the signal intensity response value of each pixel to obtain the noise signal value of each pixel.

[0101] In order to obtain the noise signal value of each pixel, it is necessary to subtract the signal intensity mean calculated previously from the signal intensity response value of each pixel. This difference reflects the fluctuation of each pixel relative to the average signal intensity, that is, the noise signal.

[0102] Step 3: According to the noise signal value of each pixel, calculate the Pearson correlation coefficient between each pixel and its adjacent pixels.

[0103] The Pearson correlation coefficient is a statistic used to measure the degree of linear correlation between two variables. In this detection process, it is necessary to calculate the Pearson correlation coefficient between each pixel and its adjacent pixels. Specifically, for each pixel, select the adjacent pixels around it (for example, the two adjacent pixels on the left and right), and then calculate the Pearson correlation coefficient between the pixel and each adjacent pixel. This correlation coefficient can reflect the degree of mutual interference of noise signals between adjacent pixels.

[0104] Step 4: Based on the Pearson correlation coefficient calculation result, the mutual interference detection result is obtained.

[0105] Finally, based on the calculated Pearson correlation coefficient, the mutual interference of noise signals in the optical path imaging of the X-ray linear array detection equipment can be evaluated. If the correlation coefficient is high (close to 1 or -1), it means that there is strong mutual interference between the noise signals of adjacent pixels, which may be caused by the optical path design of the equipment, crosstalk between pixels, or other factors. If the correlation coefficient is low (close to 0), it means that the noise signals between adjacent pixels have weak mutual interference and the imaging quality of the equipment is good.

[0106] Specifically, the noise signal of the pixel is regarded as a random variable, and the statistical correlation between them is used to evaluate the mutual interference of the pixel noise signal. Usually, we only need to consider the mutual interference between adjacent pixels. Therefore, after collecting the response value of each pixel, we subtract the mean value of the pixel respectively, so as to obtain the noise signal value of the pixel. Finally, we can calculate the Pearson correlation coefficient between each pixel and its adjacent pixels to evaluate the magnitude of the mutual interference of the pixel noise signal.

[0107] ;

[0108] In one embodiment, performing pixel response consistency detection of optical path imaging of an X-ray linear array detection device includes:

[0109] Step 1: Obtain the pure response value curve of the probe card.

[0110] First, a standard detection card (also called a calibration board or test board) is needed to obtain the pure response value curve of the X-ray linear array detection device. This detection card should have uniform and known X-ray absorption characteristics so that a consistent response can be produced. The detection card is placed between the X-ray source and the detector and imaged using the device. Then, the response value of each pixel is extracted from the imaging results, and these values ​​will constitute the pure response value curve. This curve reflects the X-ray response of the device to each pixel.

[0111] Step 2: Calculate the fitting error of the pure response value curve.

[0112] Next, the fitting error of the pure response value curve needs to be calculated. The fitting error refers to the difference between the actual response value and the response value obtained by fitting a certain mathematical model (such as a linear model, a polynomial model, etc.). In order to calculate the fitting error, a suitable mathematical model can be selected and the least squares method or other optimization methods can be used to fit the pure response value curve. Then, the difference between the actual response value and the fitted value of each pixel is calculated to obtain the fitting error.

[0113] Step 3: According to the fitting error result, the pixel response consistency detection result is obtained.

[0114] Finally, based on the results of the fitting error, the pixel response consistency of the optical path imaging of the X-ray linear array detection equipment can be evaluated. If the fitting error is small, it means that the pixel response of the equipment is relatively consistent and the imaging quality is good. If the fitting error is large, it may mean that the response consistency between the pixels of the equipment is poor, and further debugging and optimization are required.

[0115] Specifically, the consistency of the pixel signal response is tested and evaluated by measuring the fitting error of the pure response value curve of the detection card. The smaller the error, the better the consistency. Figure 7 The fitted curve represents the overall X-ray energy spectrum intensity distribution on the detection line. The detector with better consistency should have a higher fit with this curve. Therefore, the smaller the overall fitting error, the better the consistency of the pixel signal response.

[0116] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0117] Based on the same inventive concept, the embodiment of the present application also provides an imaging quality testing device for an X-ray linear array detection device for implementing the imaging quality testing method for the X-ray linear array detection device involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific definition in the embodiment of the imaging quality testing device for one or more X-ray linear array detection devices provided below can refer to the definition of the imaging quality testing method for the X-ray linear array detection device above, and will not be repeated here.

[0118] In one embodiment, Figure 8 As shown, an imaging quality testing device for an X-ray linear array detection device is provided, comprising:

[0119] A parameter determination module 200 is provided to determine the movement direction of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device;

[0120] A clarity detection module 400 is used to detect the clarity of the optical path imaging of the X-ray linear array detection device based on the motion direction and the detection line position;

[0121] The comprehensive detection module 600 is used to detect the signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of the optical path imaging of the X-ray linear array detection equipment;

[0122] The collection processing module 800 is used to collect the signal-to-noise ratio detection results, the clarity detection results, the noise signal mutual interference detection results, and the pixel response consistency detection results to obtain the imaging quality test results of the X-ray linear array detection device.

[0123] In one embodiment, the comprehensive detection module 600 is also used to obtain a pure signal intensity sequence of a single pixel; based on the pure signal intensity sequence of a single pixel, calculate the mean and standard deviation of the pure signal intensity of the single pixel; calculate the ratio of the mean and standard deviation of the pure signal intensity of the single pixel to obtain the signal-to-noise ratio of the single pixel; repeatedly calculate the signal-to-noise ratio of each pixel to obtain the mean signal-to-noise ratio of all pixels.

[0124] In one of the embodiments, the clarity detection module 400 is also used to determine that the metal straight wire is set to cover the detection line and be arranged perpendicular to the detection line if the clarity in the direction of the detection line is tested; if the clarity in the direction of movement is tested, the metal straight wire is set to be parallel to the detection line and arranged at a certain distance from the detection line in the opposite direction of the movement; collect the metal straight wire image and calculate the static corrected normalized image data of the metal straight wire image; calculate the signal intensity mean of each pixel according to the image data to obtain the signal attenuation rate peak curve corresponding to the position of each metal straight wire; perform Gaussian distribution fitting on the signal attenuation rate peak curve corresponding to each metal straight wire to obtain a fitting result; and obtain a clarity detection result according to the standard deviation in the fitting result.

[0125] In one embodiment, the diameter of the metal wire is the same as the size of the pixel, and the metal wire is a tungsten wire.

[0126] In one embodiment, the comprehensive detection module 600 is also used to obtain the signal strength response value and the signal strength mean of each pixel; subtract the signal strength mean from the signal strength response value of each pixel to obtain the noise signal value of each pixel; calculate the Pearson correlation coefficient between each pixel and its adjacent pixels based on the noise signal value of each pixel; and obtain the mutual interference detection result based on the calculation result of the Pearson correlation coefficient.

[0127] In one embodiment, the comprehensive detection module 600 is further used to obtain a pure response value curve of the detection card; calculate the fitting error of the pure response value curve; and obtain a pixel response consistency detection result based on the fitting error result.

[0128] Each module in the imaging quality test device of the above-mentioned X-ray linear array detection device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0129] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Fig. 9As shown. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, an imaging quality test method for an X-ray linear array detection device is implemented. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covered on the display screen, or a key, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0130] Those skilled in the art will understand that Fig. 9 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0131] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the imaging quality test method of the above-mentioned X-ray linear array detection device is implemented.

[0132] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the imaging quality testing method of the above-mentioned X-ray linear array detection device is implemented.

[0133] In one embodiment, a computer program product is provided, including a computer program, which implements the imaging quality testing method of the above-mentioned X-ray linear array detection device when executed by a processor.

[0134] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0135] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0136] The above embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. An imaging quality testing method for an X-ray linear array detection device, characterized in that: The method comprises: Determine the direction of movement of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device; Performing clarity detection of optical path imaging of an X-ray linear array detection device based on the movement direction and the detection line position; The signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of the optical path imaging of the X-ray linear array detection equipment are tested respectively; The signal-to-noise ratio test results, the clarity test results, the noise signal mutual interference test results, and the pixel response consistency test results are collected to obtain the imaging quality test results of the X-ray linear array detection equipment; The clarity detection of the optical path imaging of the X-ray linear array detection device based on the movement direction and the detection line position includes: If the clarity of the direction of the test line is tested, the metal straight wire is determined to be arranged in a posture covering the test line and perpendicular to the test line; If the clarity of the moving direction is tested, the metal straight wire is determined to be arranged in a position parallel to the detection line and spaced a certain distance from the detection line in the opposite direction of the moving direction; Collecting a metal straight wire image, and calculating statically corrected normalized image data of the metal straight wire image; Calculate the signal intensity mean of each pixel according to the image data to obtain a signal attenuation rate peak curve corresponding to the position of each metal straight wire; Performing Gaussian distribution fitting on the signal attenuation rate peak curve corresponding to each metal straight wire to obtain a fitting result; A clarity detection result is obtained according to the standard deviation in the fitting result.

2. The method according to claim 1, characterized in that The signal-to-noise ratio test for optical path imaging of X-ray linear array detection equipment includes: Get the pure signal intensity sequence of a single pixel; Based on the pure signal intensity sequence of the single pixel, calculating the mean and standard deviation of the pure signal intensity of the single pixel; Calculating the ratio of the mean value to the standard deviation of the pure signal intensity of the single pixel to obtain the signal-to-noise ratio of the single pixel; Repeatedly calculate the signal-to-noise ratio of each pixel to obtain the mean signal-to-noise ratio of all pixels.

3. The method according to claim 1, characterized in that: The diameter of the metal straight wire is the same as the size of the pixel, and the metal straight wire is a tungsten wire.

4. The method according to claim 1, characterized in that: The noise signal mutual interference detection of the optical path imaging of the X-ray linear array detection equipment includes: Obtain the signal intensity response value and signal intensity mean of each pixel; Subtract the signal intensity mean from the signal intensity response value of each pixel to obtain the noise signal value of each pixel; According to the noise signal value of each pixel, the Pearson correlation coefficient between each pixel and its adjacent pixels is calculated; Based on the Pearson correlation coefficient calculation results, the mutual interference detection results were obtained.

5. The method according to claim 1, characterized in that The pixel response consistency test for optical path imaging of X-ray linear array detection equipment includes: Obtaining the pure response value curve of the detection card; Calculating the fitting error of the pure response value curve; According to the fitting error results, the pixel response consistency detection results are obtained.

6. An imaging quality testing device for an X-ray linear array detection device, characterized in that: Used to perform the imaging quality testing method according to any one of claims 1 to 5, the device comprises: Setting a parameter determination module for determining the movement direction of the X-ray linear array detection object and the detection line position of the X-ray linear array detection device; A clarity detection module, used for performing clarity detection of optical path imaging of an X-ray linear array detection device based on the movement direction and the detection line position; Comprehensive detection module, used to detect the signal-to-noise ratio, mutual interference of noise signals and consistency of pixel response of optical path imaging of X-ray linear array detection equipment; The collection processing module is used to collect the signal-to-noise ratio detection results, the clarity detection results, the noise signal mutual interference detection results, and the pixel response consistency detection results to obtain the imaging quality test results of the X-ray linear array detection equipment.

7. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 5 are implemented.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

9. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

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