Testing head and testing method thereof

Abstract

The invention provides a testing head and a testing method thereof, and the testing head comprises a pedestal which is made of a conductive material and is provided with a first through hole; the sleeve is made of a conductive material, and one end of the sleeve penetrates through the first through hole and is connected with the base; the connecting port is formed at the other end of the sleeve; the transmission line is arranged in the sleeve, one end of the transmission line forms a contact in the connecting port, and the other end of the transmission line penetrates out of the first through hole and extends out by a preset length; the at least two supporting legs are made of conductive materials, one end of each supporting leg is rotatably connected with the base, and the other end of each supporting leg is in a spine shape. By using the test head provided by the invention, the debugging efficiency of the radio frequency test is improved.

Description

Technical Field

[0001] The present application relates to the field of radio frequency testing technology, and in particular to a test head and a testing method thereof. Background Art

[0002] Traditional RF tubes are usually designed as a single structure, that is, the copper tube form widely used in the market. When it is necessary to measure a specific RF signal line or pad on a printed circuit board assembly, a common practice is to perform a soldering operation and install the corresponding matching device.

[0003] However, in actual application scenarios, every time matching and debugging is performed, technicians need to re-weld the copper tube to achieve a good grounding connection. This step is not only cumbersome and time-consuming, but also leads to reduced debugging efficiency. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide a test head and a test method thereof, aiming to solve at least one of the above-mentioned defects.

[0005] In a first aspect, the present application provides a test head, which includes: a base, which is made of a conductive material and has a first through hole formed on the base; a sleeve, which is made of a conductive material, one end of which is passed through the first through hole and connected to the base; a connecting port, which is formed at the other end of the sleeve; a transmission line, which is arranged in the sleeve, one end of which forms a contact in the connecting port, and the other end of the transmission line passes through the first through hole and extends a preset length; and at least two supporting legs, which are made of a conductive material, one end of each supporting leg is rotatably connected to the base, and the other end is in a spike shape.

[0006] In a possible embodiment, the test head further includes: at least two first elastic members, the number of the at least two first elastic members is consistent with the number of the at least two supporting legs, one end of each first elastic member is respectively connected to the base, and the other end of each first elastic member is connected to a corresponding supporting leg, wherein each supporting leg has an initial position for placing the corresponding first elastic member in a state of no tensile force and a stretched position for placing the corresponding first elastic member in a stretched state, the initial position includes the supporting leg being parallel to a penetration direction of the first through hole, or the supporting leg being retracted in a direction approaching the transmission line, the stretched position includes the supporting leg being pulled out in a direction away from the transmission line, and when the at least two supporting legs are adjusted from the initial position to the stretched position, the relative height of the other end of the transmission line and the other end of each supporting leg in the penetration direction becomes smaller.

[0007] In a possible implementation, an external thread is formed on the outer wall of the sleeve near one end of the sleeve, and an internal thread is formed on the inner wall of the first through hole, wherein the sleeve is driven to move in the penetration direction of the first through hole through the mutual screwing between the external thread and the internal thread, so that the transmission line moves synchronously with the sleeve.

[0008] In a possible implementation manner, the test head further includes: a protrusion formed on an outer wall of the sleeve, so as to drive the external thread and the internal thread to perform a screwing movement through an external force acting on the protrusion.

[0009] In a possible implementation, the test head further includes: a fixing portion formed at one end of the sleeve, the fixing portion having a second through hole and a third through hole respectively formed on two side surfaces perpendicular to the transmission line, so that the transmission line passes through the second through hole and the third through hole and extends a preset length, and the fixing portion having a fourth through hole formed on a designated side surface parallel to the transmission line; and a locking member passing through the fourth through hole to lock the transmission line.

[0010] In a possible embodiment, the test head also includes: at least two second elastic members, one end of each second elastic member is respectively connected to the fixed portion, and the other end of each second elastic member is connected to a side of a corresponding support leg close to the base, wherein when the at least two support legs are in a stretched position, the at least two second elastic members are in a stretched state so as to apply tension to the corresponding support legs through the at least two second elastic members.

[0011] In a possible implementation manner, the other end of the transmission line is tapered.

[0012] In a possible implementation, the sleeve includes a first sub-tube and a second sub-tube, wherein the test head further includes: a connector, the connector is made of a conductive material, and is used to connect the first sub-tube and the second sub-tube, the connection port is formed at an end of the first sub-tube away from the connector, and an end of the second sub-tube away from the connector is passed through the first through hole.

[0013] In a possible embodiment, a fifth through hole is formed on the first surface of the connecting member for connecting the first sub-tube, a sixth through hole is formed on the second surface of the connecting member for connecting the second sub-tube, a preset angle is formed between the first surface and the second surface, and / or the at least two supporting legs are evenly arranged along the circumference of the base.

[0014] In a second aspect, the present application provides a testing method, which includes: aligning a transmission line of a test head with a feeding point on a circuit board, the test head including the test head as described in the first aspect; adjusting each supporting leg to a target stretching position so that an end of the transmission line extending from a first through hole is close to the feeding point; applying pressure to the test head, and under the action of the pressure, a spike-shaped end of at least two supporting legs pierces the circuit board to connect to the ground of the circuit board and make the transmission line in close contact with the feeding point; connecting the connection port of the test head to the test port of an analyzer to observe the test parameters of the feeding point through the analyzer.

[0015] The present application provides a test head and a test method thereof, wherein the test head includes: a base, the base is made of a conductive material, and a first through hole is formed on the base; a sleeve, the sleeve is made of a conductive material, one end of the sleeve is passed through the first through hole and connected to the base; a connection port, the connection port is formed at the other end of the sleeve; a transmission line is arranged in the sleeve, one end of the transmission line forms a contact in the connection port, and the other end of the transmission line passes through the first through hole and extends a preset length; at least two support legs, the at least two support legs are made of a conductive material, one end of each support leg is rotatably connected to the base, and the other end is spike-shaped. The test head of the present application improves the debugging efficiency of radio frequency testing.

[0016] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 One of the structural schematic diagrams of the test head provided in the embodiment of the present application;

[0019] Figure 2 The second structural schematic diagram of the test head provided in the embodiment of the present application;

[0020] Figure 3 A flowchart of the testing method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0021] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application usually described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, each other embodiment obtained by those skilled in the art without making creative work belongs to the scope of protection of the present application.

[0022] In the description of the embodiments of the present application, it should be noted that the terms "upper", "lower", "left", "right", "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or are the positions or positional relationships in which the invented product is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0023] In addition, the terms "horizontal", "vertical" and the like do not mean that the components are required to be absolutely horizontal or suspended, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0024] In the description of the embodiments of the present application, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "setting", "installation", "connection", and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal connection of two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0025] First, the application scenarios to which the present application is applicable are introduced. The present application can be applied to radio frequency testing.

[0026] Research has found that traditional RF bushings generally use a single-structure copper bushing design, which dominates the market. When it is necessary to measure specific RF signal lines or pads on printed circuit board assemblies, conventional practices involve welding operations and the installation of matching components. In this process, the copper bushing needs to be re-welded each time the matching is debugged, which is easily affected by human factors and leads to incomplete soldering, resulting in impedance discontinuity and misjudgment of scattering parameters, affecting RF performance; at the same time, the traditional copper bushing has increased attenuation after repeated welding, which is not suitable for high-frequency RF signal debugging, and is prone to loss and high cost.

[0027] Based on this, an embodiment of the present application provides a test head and a test method thereof, so as to achieve grounding of the radio frequency test head without welding.

[0028] See also Figure 1 , Figure 1 This is one of the structural schematic diagrams of the test head provided in the embodiment of the present application. Figure 1 As shown in , the test head 100 includes: a base 101 , a sleeve, a connection port 201 , a transmission line 102 and at least two support legs 301 .

[0029] In the embodiment of the present application, the base 101 is made of a conductive material, and a first through hole is formed on the base 101, the sleeve is also made of a conductive material, one end of the sleeve is passed through the first through hole and connected to the base 101, a connecting port 201 is formed at the other end of the sleeve, the transmission line 102 is arranged in the sleeve, one end of the transmission line 102 forms a contact in the connecting port 201, and the other end of the transmission line 102 passes through the first through hole and extends a preset length, at least two supporting legs 301 are made of a conductive material, one end of each supporting leg 301 is rotatably connected to the base 101, and the other end is in a spike shape.

[0030] As an example, the shape of the base 101 can be rectangular, triangular, etc., and the conductive material as part of the electrical connection can be copper, silver or a composite material, etc. It is necessary to ensure that the base 101 can effectively transmit current or signals. This application does not limit the material and shape of the base 101.

[0031] The sleeve is used to accommodate and protect the transmission line 102, and also serves as an electrical connection channel between the connection port 201 and the base 101, ensuring that the transmission line 102 can be stably connected to other parts of the test head 100. The sleeve is made of a conductive material and forms a complete electrical path together with the base 101. In addition, the design of the sleeve allows it to move in the first through hole, which helps to adjust the position or tension of the transmission line 102.

[0032] The connection port 201 is an interface between the test head 100 and an external device or a test object, allowing the transmission line 102 (especially its contacts) to establish an electrical connection with the external device. The connection port 201 may be an SMA connector to match an analyzer.

[0033] The transmission line 102 is responsible for transmitting current, signals or data between the test head 100 and external devices. The other end of the transmission line 102 is tapered, and the tip of the tapered transmission line 102 can fit the feeding point more closely, thereby reducing contact resistance and improving the stability and efficiency of the electrical connection.

[0034] As an example, the transmission line 102, as a core component of signal transmission, is essentially a solid semiconductor material with a specific impedance. In order to ensure the integrity and stability of the signal during transmission, an insulating layer is designed on the outer edge of the transmission line 102. This insulating layer not only plays a role of isolation and protection, preventing abnormal leakage of current and short circuit, but also ensures the electrical isolation between the transmission line 102 and the external environment. On the outside of the insulating layer, a material with excellent conductive properties (usually referred to as GND in physics, i.e., ground wire) can be used for wrapping. This material is tightly attached to the outer surface of the insulating layer by bonding, forming a tight protective layer. This GND conductor is closely connected to the base and the supporting legs, and together they constitute a complete grounding system.

[0035] In the embodiment of the present application, the impedance of the GND is 50 ohms. In the design of the RF system and the transmission line 102, 50 ohms is a widely accepted standard impedance value. This is because the impedance of 50 ohms can minimize the reflection and loss of the signal during the transmission process, thereby ensuring the stable transmission of high-speed signals.

[0036] One end of at least two supporting legs 301 is in the shape of a spike, which is used to pierce the circuit board 600, so as to achieve a direct connection with "GND" and achieve a good ground feeding effect. Specifically, the circuit board 600 includes a top signal layer, a top solder mask layer, an intermediate wiring layer, a bottom signal layer, a bottom solder mask layer, an internal power supply layer, a mechanical layer and other auxiliary layers from top to bottom, wherein the top solder mask layer is a green oil layer that protects the copper wire and prevents incorrect soldering, and the layer below the top solder mask layer is a signal layer and a ground layer. Therefore, grounding usually requires that a part of the circuit board 600 be connected to the earth or other reference potential. If the grounding point is covered by the solder mask layer, electrical connection cannot be achieved. Therefore, it is necessary to pierce the solder mask layer to establish the necessary electrical connection. Piercing the solder mask layer can ensure that the test signal can be accurately transmitted to the node to be tested, and reduce signal loss or distortion caused by poor connection or impedance mismatch, can provide a stable reference potential, reduce electromagnetic interference and radiation, and improve measurement accuracy.

[0037] When the test head 100 is placed on the circuit board 600, the spike-shaped support legs 301 can penetrate the surface layer of the circuit board 600 and form electrical contact with the internal ground conductor. This connection method is not only stable and reliable, but also can effectively ground the test head 100, ensuring accurate transmission of current or signals and grounding protection during the test. In addition, multiple spike-shaped support legs 301 also help to better fix the support legs 301 on the circuit board 600, preventing the test head 100 from moving or tilting during the test, thereby improving the accuracy and stability of the test. The number of support legs 301 can be two, three or four, and the support legs 301 need to be evenly arranged on the back of the base 101 to achieve a stable effect. The number of support legs 301 is not limited in this application.

[0038] As an example, in RF and microwave circuits, ensuring accurate signal measurement is closely related to good grounding, in order to eliminate the slot antenna effect, provide a smooth return path, reduce signal crosstalk coupling, and reduce ground impedance, thereby effectively addressing the challenges brought by the sensitivity of high-frequency signals and the skin effect. To achieve this goal, the present application adopts a multi-support foot multi-point grounding strategy, that is, the ground wires of all circuits are grounded nearby to ensure that the ground wire length is short and suitable for high-frequency grounding. This grounding method can not only significantly reduce the ground impedance, but also reduce the total inductance of the grounding conductor by connecting multiple wires in parallel to meet the needs of high-frequency conditions. In addition, nearby grounding can also reduce ground loop problems, further optimize circuit performance, and help reduce electromagnetic radiation, improve the circuit's anti-interference ability, and ensure that the performance of the RF circuit is stable and the signal transmission is accurate.

[0039] In a preferred embodiment of the present application, an external thread is formed on the outer wall of the sleeve near one end of the sleeve, and an internal thread is formed on the inner wall of the first through hole, wherein the sleeve is driven to move in the penetration direction of the first through hole through the mutual screwing between the external thread and the internal thread, so that the transmission line 102 moves synchronously with the sleeve.

[0040] In a preferred embodiment of the present application, the test head 100 further includes: a connecting member 203 .

[0041] Wherein, the sleeve includes a first sub-tube 202 and a second sub-tube 204, and the connecting piece 203 is made of a conductive material for connecting the first sub-tube 202 and the second sub-tube 204. The connecting port 201 is formed at one end of the first sub-tube 202 away from the connecting piece 203, and one end of the second sub-tube 204 away from the connecting piece 203 is penetrated through the first through hole. The connecting piece 203 ensures the electrical connection between the two, and allows the first sub-tube 202 and the second sub-tube 204 to adjust their positions and angles relatively independently while maintaining electrical continuity, so that the test head 100 can adjust its angle relative to the circuit board 600 or other test objects according to actual test requirements, thereby making it easier to achieve accurate electrical connection and testing.

[0042] Figure 2 This is a second schematic diagram of the structure of the test head provided in the embodiment of the present application. Figure 2 As shown in , in a preferred embodiment of the present application, the test head further includes: at least two first elastic members 401 .

[0043] The number of at least two first elastic members 401 is consistent with the number of at least two supporting legs 301. One end of each first elastic member 401 is connected to the base 101, and the other end of each first elastic member 401 is connected to a corresponding supporting leg 301. This connection method provides additional support for the supporting leg 301, so that the supporting leg 301 can move flexibly within a certain range.

[0044] Each supporting leg 301 has an initial position for placing the corresponding first elastic member 401 in a state of no tensile force and a stretched position for placing the corresponding first elastic member 401 in a stretched state.

[0045] The initial position includes the support leg 301 being parallel to the penetration direction of the first through hole, or the support leg 301 being retracted toward the direction close to the transmission line 102. In the initial state, the support leg 301 can be in a position parallel to the penetration direction of the first through hole, or being retracted toward the direction close to the transmission line 102.

[0046] The stretched position includes the support leg 301 being pulled away from the transmission line 102. When the position of the support leg 301 needs to be adjusted, it can be pulled from the initial position to the direction away from the transmission line 102, that is, the stretched position. During this process, the first elastic member 401 will be stretched to provide the necessary elasticity and restoring force for the support leg 301.

[0047] When at least two supporting legs 301 are adjusted from the initial position to the stretched position, the relative height between the other end of the transmission line 102 and the other end of each supporting leg 301 in the penetration direction becomes smaller. When the supporting legs 301 are adjusted from the initial position to the stretched position, the relative height between the other end of the transmission line 102 and the other end of each supporting leg 301 in the penetration direction becomes smaller. As the supporting legs 301 are stretched, the transmission line 102 will be relatively closer to the supporting legs 301, thereby changing the contact pressure and electrical connection state between the test head 100 and the circuit board 600.

[0048] The introduction of the first elastic member 401 enables the support leg 301 to move flexibly within a certain range, thereby improving the adaptability and versatility of the test head 100, which helps to ensure that the test head 100 can make good contact and electrical connection with circuit boards 600 of different shapes and sizes. Through the support and restoring force of the first elastic member 401, it can be ensured that the support leg 301 maintains a stable position during the stretching process, thereby improving the accuracy and reliability of the test. In addition, the change in relative height also helps to adjust the contact pressure between the test head 100 and the circuit board 600 to ensure the optimal electrical connection state.

[0049] In a preferred embodiment of the present application, the test head 100 further includes a protrusion 503 .

[0050] The protrusion 503 is formed on the outer wall of the sleeve so that the external thread and the internal thread can be driven to engage with each other by the external force acting on the protrusion 503. The protrusion 503 provides a point for the user to apply force. The external force acting on the protrusion 503 can drive the external thread of the sleeve and the internal thread of the base 101 to engage with each other. This design allows the user to easily adjust the position of the sleeve relative to the base 101, thereby achieving fine adjustment of the height of the test head 100.

[0051] In a preferred embodiment of the present application, the test head 100 further includes: a fixing portion 501 and a locking member 502 .

[0052] The fixing portion 501 is formed at one end of the sleeve. The fixing portion 501 is respectively formed with a second through hole and a third through hole on two side surfaces perpendicular to the transmission line 102, so that the transmission line 102 passes through the second through hole and the third through hole and extends a preset length. The fixing portion 501 is formed with a fourth through hole on a designated side surface parallel to the transmission line 102. The locking member 502 is passed through the fourth through hole to lock the transmission line 102 to prevent it from moving or loosening during the test process. This design ensures a stable connection between the transmission line 102 and the test head 100.

[0053] In a preferred embodiment of the present application, the test head 100 further includes: at least two second elastic members 402 .

[0054] One end of each second elastic member 402 is respectively connected to the fixing portion 501, and the other end of each second elastic member 402 is connected to a side of a corresponding supporting leg 301 close to the base 101, wherein when at least two supporting legs 301 are in a stretched position, at least two second elastic members 402 are in a stretched state, so that a pulling force is applied to the corresponding supporting leg 301 through at least two second elastic members 402, and the second elastic member 402 not only increases the stability of the supporting leg 301, but also enables the supporting leg 301 to have a certain buffering and recovery ability when subjected to external force.

[0055] Figure 3 The following is a flow chart of a testing method provided in an embodiment of the present application. Figure 3 As shown in, the test method provided in the embodiment of the present application includes:

[0056] S101 , align the transmission line 102 of the test head 100 with a feeding point on the circuit board 600 .

[0057] In this step, the user needs to align the tapered end of the transmission line 102 of the test head 100 with the target feeding point on the circuit board 600 .

[0058] S102, adjusting each supporting leg 301 to a target stretching position so that one end of the transmission line 102 extending from the first through hole is close to the feeding point.

[0059] In this step, the user needs to adjust at least two support legs 301 on the test head 100 so that they reach a predetermined stretched position. The stretching of the support legs 301 can be achieved by manually changing the angle between the support legs 301 and the base 101. The stretching position needs to be determined based on the thickness of the circuit board 600, the position of the feed point and the structure of the test head 100. By adjusting the position of the support legs 301, it can be ensured that the contact pressure between the transmission line 102 and the feed point is moderate, and poor contact will not occur due to too little pressure.

[0060] S103 , applying pressure to the test head 100 , under the pressure, at least two support legs 301 have one end in a spike shape that pierces the circuit board 600 to connect to the ground of the circuit board 600 , and make the transmission line 102 in close contact with the feeding point.

[0061] In this step, by piercing the circuit board 600 and connecting it to the ground wire, it can be ensured that the test head 100 has a stable grounding path during the test process. At the same time, the close contact can ensure that the electrical connection between the transmission line 102 and the feed point is stable and reliable, thereby obtaining accurate test data.

[0062] Before puncturing the circuit board 600, the user needs to carefully check the structure of the circuit board 600 to ensure that the selected puncture location does not have any electronic components, connecting lines or other parts that may hinder the puncture.

[0063] S104 , connecting the connection port 201 of the test head 100 to the test port of the analyzer to observe the test parameters of the feed point through the analyzer.

[0064] In this step, the user needs to connect the connection port 201 of the test head 100 to the test port of the analyzer, and transmit the signal or data collected by the test head 100 to the analyzer for analysis and processing. After the connection is completed, the analyzer will start to receive the signal or data from the test head 100, and perform a series of analysis and processing. By measuring and analyzing the scattering parameters, the user can gain an in-depth understanding of key information such as the reflection coefficient and transmission coefficient of the feed point, and then accurately evaluate the performance of the circuit board 600. By replacing different groups of inductors / capacitors / resistors, etc., and testing them in turn, a set of optimal values ​​can be obtained, thereby realizing the RF matching tuning process.

[0065] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-mentioned embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-mentioned embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A test head, characterized in that: The test head comprises: A base, the base is made of a conductive material and has a first through hole formed therein; A sleeve, the sleeve is made of a conductive material, one end of the sleeve is passed through the first through hole and connected to the base; A connection port, the connection port being formed at the other end of the sleeve; A transmission line is arranged in the sleeve, one end of the transmission line forms a contact in the connection port, and the other end of the transmission line passes through the first through hole and extends to a preset length; At least two supporting legs are made of conductive material, one end of each supporting leg is rotatably connected to the base, and the other end is spike-shaped.

2. The test head according to claim 1, characterized in that: The test head also includes: at least two first elastic members, the number of the at least two first elastic members is consistent with the number of the at least two supporting legs, one end of each first elastic member is connected to the base, and the other end of each first elastic member is connected to a corresponding supporting leg, Each supporting leg has an initial position for placing the corresponding first elastic member in a state of no tensile force and a stretched position for placing the corresponding first elastic member in a stretched state, wherein the initial position includes the supporting leg being parallel to the penetration direction of the first through hole, or the supporting leg being retracted in a direction close to the transmission line, and the stretched position includes the supporting leg being pulled out in a direction away from the transmission line. When the at least two supporting legs are adjusted from the initial position to the extended position, the relative height between the other end of the transmission line and the other end of each supporting leg in the penetration direction becomes smaller.

3. The test head according to claim 1 or 2, characterized in that: An external thread is formed on the outer wall of the sleeve near one end of the sleeve, and an internal thread is formed on the inner wall of the first through hole. The outer thread and the inner thread are screwed together to drive the sleeve to move in the penetration direction of the first through hole, so that the transmission line moves synchronously with the sleeve.

4. The test head according to claim 3, characterized in that: The test head also includes: A protrusion is formed on the outer wall of the sleeve so as to drive the external thread and the internal thread to engage with each other through an external force acting on the protrusion.

5. The test head according to claim 3, characterized in that: The test head also includes: A fixing portion formed at one end of the sleeve, wherein the fixing portion is respectively formed with a second through hole and a third through hole on two sides perpendicular to the transmission line, so that the transmission line passes through the second through hole and the third through hole and extends a preset length, and a fourth through hole is formed on a designated side of the fixing portion parallel to the transmission line; A locking member is passed through the fourth through hole to lock the transmission line.

6. The test head according to claim 5, characterized in that: The test head also includes: at least two second elastic members, one end of each second elastic member is connected to the fixing portion, and the other end of each second elastic member is connected to a side of a corresponding supporting leg close to the base. Wherein, when the at least two supporting legs are in the stretched position, the at least two second elastic members are in a stretched state, so as to apply a pulling force to the corresponding supporting legs through the at least two second elastic members.

7. The test head according to claim 1, characterized in that: The other end of the transmission line is tapered.

8. The test head according to claim 1, characterized in that: The casing comprises a first sub-tube and a second sub-tube, Wherein, the test head further includes: A connecting piece, which is made of a conductive material and is used to connect the first sub-tube and the second sub-tube. The connecting port is formed at one end of the first sub-tube away from the connecting piece, and one end of the second sub-tube away from the connecting piece is passed through the first through hole.

9. The test head according to claim 8, characterized in that: A fifth through hole is formed on the first surface of the connector for connecting the first sub-tube, and a sixth through hole is formed on the second surface of the connector for connecting the second sub-tube. A preset angle is formed between the first surface and the second surface. And / or, the at least two supporting legs are evenly arranged along the circumference of the base.

10. A testing method, characterized in that: The test method includes: Aligning a transmission line of a test head with a feed point on a circuit board, the test head comprising a test head as claimed in any one of claims 1 to 9; Adjusting each supporting leg to a target stretching position so that an end of the transmission line extending from the first through hole is close to the feeding point; Applying pressure to the test head, under the action of the pressure, one end of the at least two support legs in a spike shape pierces the circuit board to connect with the ground of the circuit board, and makes the transmission line closely contact with the feeding point; The connection port of the test head is connected to the test port of the analyzer to observe the test parameters of the feed point through the analyzer.

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