Load testing method and device, equipment and storage medium

Abstract

The embodiment of the invention provides a load test method and device, equipment and a storage medium. The method comprises the steps of receiving N groups of load test parameters sent by control equipment, n is a positive integer; according to the N groups of load test parameters, respectively adjusting the load of the load adjusting circuit, and obtaining first circuit loss respectively corresponding to the N groups of load test parameters; sending the first circuit loss corresponding to the N groups of load test parameters to a control device; the control device is used for measuring the second circuit loss corresponding to the N groups of load test parameters through the measurement assembly; and according to the first circuit loss and the second circuit loss respectively corresponding to the N groups of load test parameters, determining load test results respectively corresponding to the to-be-tested equipment under the N groups of load test parameters. According to the invention, the test workload can be reduced, and the test efficiency of load test is improved.

Description

Technical Field

[0001] The present invention relates to the field of communication technology, and in particular to a load testing method, device, equipment and storage medium. Background Art

[0002] The wireless wide area network (WWAN) module (i.e., the device to be tested in this application) can be used to realize the conversion between digital signals and wireless signals, as well as to realize the radiation and reception of wireless signals. The module or component connected when the WWAN module is working is usually called a load. When the impedance value of the load does not match the impedance value of the WWAN module, a reflection signal will be generated during the transmission of the digital signal between the load and the WWAN module, which will interfere with the transmission of digital signals and wireless signals by the WWAN module, affect the transmission power of the WWAN module, and bring a bad experience to the user.

[0003] At present, RF impedance tuners are mainly used to simulate loads with different impedance values, and to perform load tests on WWAN modules to test the influence of loads with different impedance values ​​on the transmission power of WWAN modules. However, during the test, it is necessary to manually change the slider position and probe number in the RF impedance tuner to simulate loads with different impedance values. It can be seen that this test method has the problem of a relatively large test workload, resulting in low test efficiency of load testing. Summary of the invention

[0004] The embodiments of the present application provide a load testing method, apparatus, device and storage medium, which can reduce the testing workload and improve the testing efficiency of load testing.

[0005] An embodiment of the present application provides a load testing method, including:

[0006] Receive N groups of load test parameters sent by the control device; N is a positive integer

[0007] According to the N groups of load test parameters, the load of the load adjustment circuit is adjusted respectively to obtain the first circuit losses respectively corresponding to the N groups of load test parameters; the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load adjustment circuit after adjustment based on the i-th group of load test parameters, the load adjustment circuit is connected to the device to be tested and is used to simulate the load circuit connected to the device to be tested when it is working; i is a positive integer less than or equal to N;

[0008] The first circuit losses corresponding to the above-mentioned N groups of load test parameters are sent to the above-mentioned control device; the above-mentioned control device is used to measure the second circuit losses corresponding to the above-mentioned N groups of load test parameters through the measuring component; according to the first circuit losses and the second circuit losses corresponding to the above-mentioned N groups of load test parameters, the load test results corresponding to the above-mentioned device to be tested under the above-mentioned N groups of load test parameters are determined; the second circuit loss corresponding to the above-mentioned i-th group of load test parameters is the circuit loss of the above-mentioned device to be tested and the load regulation circuit adjusted based on the above-mentioned i-th group of load test parameters.

[0009] An embodiment of the present application provides a load testing method, including:

[0010] N groups of load test parameters of the device to be tested are sent to the device to be tested; the device to be tested is used to adjust the load of the load adjustment circuit according to the N groups of load test parameters, and obtain the first circuit losses corresponding to the N groups of load test parameters, the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load adjustment circuit after adjustment based on the i-th group of load test parameters, the load adjustment circuit is connected to the device to be tested, and is used to simulate the load circuit connected to the device to be tested when it is working, N is a positive integer, and i is a positive integer less than or equal to N;

[0011] Receiving the first circuit losses respectively corresponding to the N groups of load test parameters sent by the device to be tested;

[0012] The second circuit losses corresponding to the N groups of load test parameters are measured by the measuring component; the second circuit loss corresponding to the i-th group of load test parameters is the circuit loss between the device to be tested and the load adjustment circuit adjusted based on the i-th group of load test parameters;

[0013] According to the first circuit loss and the second circuit loss respectively corresponding to the N groups of load test parameters, the load test results respectively corresponding to the device to be tested under the N groups of load test parameters are determined.

[0014] An embodiment of the present application provides a load testing device, including:

[0015] The first receiving module is used to receive N groups of load test parameters sent by the control device; N is a positive integer

[0016] An adjustment module, used for adjusting the load of the load adjustment circuit according to the N groups of load test parameters, and obtaining the first circuit losses corresponding to the N groups of load test parameters; the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load adjustment circuit after adjustment based on the i-th group of load test parameters, the load adjustment circuit is connected to the device to be tested, and is used to simulate the load circuit connected to the device to be tested when it is working; i is a positive integer less than or equal to N;

[0017] The first sending module is used to send the first circuit losses corresponding to the above N groups of load test parameters to the above control device; the above control device is used to measure the second circuit losses corresponding to the above N groups of load test parameters through the measuring component; according to the first circuit losses and the second circuit losses corresponding to the above N groups of load test parameters, the load test results corresponding to the above device to be tested under the above N groups of load test parameters are determined; the second circuit loss corresponding to the above i-th group of load test parameters is the circuit loss between the above device to be tested and the load adjustment circuit adjusted based on the above i-th group of load test parameters. On the one hand, an embodiment of the present application provides a load testing device, including:

[0018] The second sending module is used to send N groups of load test parameters of the device to be tested to the above-mentioned device to be tested; the above-mentioned device to be tested is used to adjust the load of the load adjustment circuit according to the above-mentioned N groups of load test parameters, and obtain the first circuit losses corresponding to the above-mentioned N groups of load test parameters, the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the above-mentioned load adjustment circuit after adjustment based on the above-mentioned i-th group of load test parameters, the above-mentioned load adjustment circuit is connected to the above-mentioned device to be tested, and is used to simulate the load circuit connected to the above-mentioned device to be tested when working, N is a positive integer, and i is a positive integer less than or equal to N;

[0019] A second receiving module is used to receive the first circuit losses respectively corresponding to the N groups of load test parameters sent by the device to be tested;

[0020] The measuring module is used to measure the second circuit losses corresponding to the N groups of load test parameters respectively through the measuring component; the second circuit loss corresponding to the i-th group of load test parameters is the circuit loss between the device to be tested and the load adjustment circuit adjusted based on the i-th group of load test parameters;

[0021] The processing module is used to determine the load test results corresponding to the above-mentioned device under the above-mentioned N groups of load test parameters according to the first circuit loss and the second circuit loss respectively corresponding to the above-mentioned N groups of load test parameters.

[0022] On one hand, an embodiment of the present application provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.

[0023] On one hand, an embodiment of the present application provides a computer storage medium, wherein the computer storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the above method are executed.

[0024] In the present application, the degree of influence of the load regulation circuit on the transmission power of the module to be tested is related to the circuit loss of the device to be tested. For example, when the degree of influence of the load regulation circuit on the transmission power of the module to be tested is greater, it indicates that the generated reflected signal is stronger, and the interaction between the reflected signal and the digital signal is stronger, resulting in more energy being consumed in the transmission process, so that the circuit loss of the device to be tested is greater; when the degree of influence of the load regulation circuit on the transmission power of the module to be tested is smaller, it indicates that the generated reflected signal is smaller, and the interaction between the reflected signal and the digital signal is weaker, and less energy is consumed in the transmission process, so that the circuit loss of the device to be tested is smaller. Based on this, the degree of influence of the load regulation circuit on the transmission power of the module to be tested can be reflected based on the circuit loss of the device to be tested.

[0025] Specifically, the device to be tested can automatically adjust the load of the load adjustment circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load adjustment circuit, the test workload of manually adjusting the load is reduced, thereby improving the test efficiency of the load test. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load adjustment circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can be used to obtain the second circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the device to be tested and the load adjustment circuit after adjustment based on each group of load test parameters) based on the measurement component; based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load adjustment circuit on the load test results can be avoided, and the test accuracy of the load test can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the background technology, the drawings required for use in the embodiments of the present application or the background technology will be described below.

[0027] Figure 1It is a structural diagram of a load testing system provided by the present application;

[0028] Figure 2 It is a flow chart of a load testing method provided by this application;

[0029] Figure 3 It is a flowchart of another load testing method provided by the present application;

[0030] Figure 4 It is a structural schematic diagram of a load adjustment table provided by the present application;

[0031] Figure 5a It is a Smith chart provided by the present application;

[0032] Figure 5b It is another Smith chart provided by this application;

[0033] Figure 5c It is another Smith chart provided by this application;

[0034] Figure 5d It is another Smith chart provided by this application;

[0035] Figure 5e It is another Smith chart provided by this application;

[0036] Figure 5f It is another Smith chart provided by this application;

[0037] Figure 5g It is another Smith chart provided by this application;

[0038] Figure 5h It is another Smith chart provided by this application;

[0039] Figure 6 It is a flowchart of another load testing method provided by the present application;

[0040] Figure 7 It is a flowchart of another load testing method provided by the present application;

[0041] Figure 8 It is a structural schematic diagram of a load testing device provided by the present application;

[0042] Fig. 9 is a structural schematic diagram of another load testing device provided by the present application;

[0043] Fig.10 It is a structural schematic diagram of a computer device provided by this application. DETAILED DESCRIPTION

[0044] The embodiments of the present application are described below in conjunction with the drawings in the embodiments of the present application.

[0045] The terms "first" and "second" in the specification, claims and drawings of this application are only used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units that are not listed, or may optionally include other steps or units that are inherent to these processes, methods, products or devices.

[0046] The "embodiment" mentioned in this application means that the specific features, structures or characteristics described in conjunction with the embodiment may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It can be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0047] It should be understood that in the present application, "at least one (item)" means one or more, "more than one" means two or more, "at least two (items)" means two or three and more than three, and "and / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0048] It should be understood that, although the various steps in the flowchart in the embodiment of the present application are displayed in sequence according to the indication of the arrows, these steps are not necessarily performed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and it can be performed in other orders. Moreover, at least a portion of the steps in the figure may include a plurality of sub-steps or a plurality of stages, and these sub-steps or stages are not necessarily performed at the same time, but can be performed at different times, and their execution order is not necessarily performed in sequence, but can be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.

[0049] First, see Figure 1 , Figure 1 is a structural diagram of a load testing system provided by this application, such as Figure 1 As shown, the load testing system may include a load regulating circuit 10, a device to be tested 11, a control component 12 and a measuring component 13. The load testing system may be used to implement the load testing method in the present application.

[0050] It should be noted that the load adjustment circuit 10 may refer to a load circuit connected to the device under test when simulating the device under test, and the load adjustment circuit 10 is connected to the device under test 11; a WWAN module such as a router, a computer, a server, etc. is deployed in the device under test 11. In the present application, the device under test 11 adjusts the load of the load adjustment circuit 10 based on N groups of load test parameters to simulate loads of different impedance values ​​connected to the device under test when it is working normally.

[0051] It should be noted that the control component 12 can be used to configure N groups of load test parameters for load testing the device to be tested 11; the measurement component 13 can be used to measure the circuit loss of the device to be tested 11 and the load regulation circuit 10 adjusted based on each group of load test parameters in the N groups of load test parameters during the test. In the present application, the control component 12 and the measurement component 13 can be deployed in the control device at the same time. In addition, the control component 12 and the measurement component 13 can also be deployed in different devices, and the present application does not limit this.

[0052] It should be noted that in the present application, corresponding load regulation subcircuits can be designed for different load test parameters. That is to say, the load regulation circuit 10 may include one or more load regulation subcircuits; each load regulation subcircuit can be used to simulate the load circuit connected to the device to be tested when working under the corresponding load test parameters; each load regulation subcircuit may include one or more switch elements, one or more capacitor elements, one or more inductor elements, etc. Therefore, the device to be tested 11 can control the connection relationship between the capacitor element and the inductor element in each load regulation subcircuit and the device to be tested 11 based on the switch element in each load regulation subcircuit and the corresponding load test parameters, so as to adjust the load of each load regulation subcircuit.

[0053] like Figure 1As shown, the load regulation circuit 10 includes four load regulation sub-circuits, namely, load regulation sub-circuit 104, load regulation sub-circuit 105, load regulation sub-circuit 106 and load regulation sub-circuit 107. Among them, the load regulation sub-circuit 104 includes a switch element 1110, an inductor element 1111, an inductor element 1112, an inductor element 1113, a capacitor element 1114, a switch element 1115, a capacitor element 1116, an inductor element 1117, an inductor element 1118, an inductor element 1119, a switch element 1120, a switch element 1121, an inductor element 1122, an inductor element 1123, an inductor element 1124 and a capacitor element 1125. The load regulation subcircuit 105 includes a switch element 1210, an inductor element 1211, an inductor element 1212, an inductor element 1213, a capacitor element 1214, a switch element 1215, a capacitor element 1216, an inductor element 1217, an inductor element 1218, an inductor element 1219, a switch element 1220, a switch element 1221, an inductor element 1222, an inductor element 1223, an inductor element 1224 and a capacitor element 1225. The load regulation subcircuit 106 includes a switch element 1310, an inductor element 1311, an inductor element 1312, an inductor element 1313, a capacitor element 1314, a switch element 1315, a capacitor element 1316, an inductor element 1317, an inductor element 1318, an inductor element 1319, a switch element 1320, a switch element 1321, an inductor element 1322, an inductor element 1323, an inductor element 1324 and a capacitor element 1325. The load regulation subcircuit 107 includes a switch element 1410, an inductor element 1411, an inductor element 1412, an inductor element 1413, a capacitor element 1414, a switch element 1415, a capacitor element 1416, an inductor element 1417, an inductor element 1418, an inductor element 1419, a switch element 1420, a switch element 1421, an inductor element 1422, an inductor element 1423, an inductor element 1424 and a capacitor element 1425.

[0054] like Figure 1As shown, the load regulation circuit 10 also includes a switch element 101, a switch element 102 and an adjustment interface 103. The adjustment interface 103 provides the device under test 11 with the function of controlling each element in the load regulation circuit 10, that is, the device under test 11 can control the connection state between the capacitor element and the inductor element in the load regulation circuit 10 and the device under test 11 through the adjustment interface 103 based on the switch element in the load regulation circuit 10, so as to adjust the load of the load regulation circuit 10. Among them, the device under test 11 can also control the connection state between each load regulation sub-circuit in the load regulation circuit 10 and the device under test 11 through the adjustment interface 103 based on the switch element 101 and the switch element 102 in the load regulation circuit 10. For example, when the device under test 11 controls the switch element 101 to establish a connection with the switch element 1115 and controls the switch element 102 to establish a connection with the switch element 1120 through the adjustment interface 103, the connection state between the load regulation sub-circuit 104 and the device under test 11 is a connected state.

[0055] It should be noted that, taking the load adjustment subcircuit 104 as an example, the various components in the load adjustment subcircuit are explained. Among them, the capacitor element 1114, the capacitor element 1116 and the capacitor element 1125 in the load adjustment subcircuit 104 can all be capacitor elements with adjustable capacitance values, but the adjustable capacitance value ranges corresponding to the capacitor element 1114, the capacitor element 1116 and the capacitor element 1125 can be the same or different. The inductor element 1111, the inductor element 1112, the inductor element 1113, the inductor element 1117, the inductor element 1118, the inductor element 1119, the inductor element 1122, the inductor element 1123 and the inductor element 1124 in the load adjustment subcircuit 104 can be electrical components with fixed inductance values, but the inductance values ​​corresponding to the above-mentioned inductors can be the same or different. The switch element 1110 in the load regulation subcircuit 104 can be connected to any one of the inductor element 1111, the inductor element 1112, the inductor element 1113, and the capacitor element 1114. The switch element 1115 in the load regulation subcircuit 104 can be connected to any one of the capacitor element 1116, the inductor element 1117, the inductor element 1118, and the inductor element 1119. The switch element 1120 in the load regulation subcircuit 104 can be connected to any one of the capacitor element 1116, the inductor element 1117, the inductor element 1118, and the inductor element 1119. The switch element 1120 in the load regulation subcircuit 104 can be connected to any one of the inductor element 1122, the inductor element 1123, the inductor element 1124, and the capacitor element 1125. In the present application, for Figure 1For explanations of the various switch elements in the load regulation sub-circuit 105, the load regulation sub-circuit 106, and the load regulation sub-circuit 107, please refer to the above description of the switch elements in the load regulation sub-circuit 105, the load regulation sub-circuit 106, and the load regulation sub-circuit 107. Figure 1 1. An explanation of the various switching elements in the load regulation subcircuit 104 in FIG.

[0056] In one embodiment, the N groups of load test parameters include load test parameters A1 and load test parameters A2, the load test parameters A1 and load test parameters A2 are different, the load test parameter A1 corresponds to the load adjustment subcircuit 104, and the load test parameter A2 corresponds to the load adjustment subcircuit 105. During the load test, the control component 12 can obtain the configured load test parameters A1 and load test parameters A2, and first send the load test parameter A1 to the device to be tested 11. The device to be tested 11 can control the switch element 101 to establish a connection with the switch element 1115, and the switch element 102 to establish a connection with the switch element 1120 through the adjustment interface 103, so that the connection state between the load adjustment subcircuit 104 and the device to be tested 11 is a connected state. The device to be tested 11 can also adjust the capacitance value of each capacitor in the load adjustment subcircuit 104 based on the load test parameter and each switch element in the load adjustment subcircuit 104 through the adjustment interface 103, and control the connection relationship between the device to be tested 11 and each capacitor and each inductor in the load adjustment subcircuit 104 to adjust the load of the load adjustment subcircuit 104. The device to be tested 11 can also obtain the circuit loss of the load adjustment subcircuit 104 adjusted based on the load test parameter A1, that is, the first circuit loss corresponding to the load test parameter A1; and send the first circuit loss corresponding to the load test parameter A1 to the control component 12. After the control component 12 receives the first circuit loss corresponding to the load test parameter A1, the measurement component 13 can measure the circuit loss of the device to be tested 11 and the load adjustment subcircuit 104 adjusted based on the load test parameter A1, that is, the second circuit loss corresponding to the load test parameter A1. The measurement component 13 can send the second circuit loss corresponding to the load test parameter A1 to the control component 12.

[0057] Further, after receiving the second circuit loss corresponding to the load test parameter A1, the control component 12 may send the load test parameter A2 to the device to be tested 11. The device to be tested 11 may control the switch element 101 to establish a connection with the switch element 1215, and the switch element 102 to establish a connection with the switch element 1220, by adjusting the interface 103, so that the connection state between the load adjustment subcircuit 105 and the device to be tested 11 is in a connected state. The device to be tested 11 may also adjust the capacitance value of each capacitor element in the load adjustment subcircuit 105 based on the load test parameter and each switch element in the load adjustment subcircuit 105, and control the connection relationship between the device to be tested 11 and each capacitor element and each inductor element in the load adjustment subcircuit 105, so as to adjust the load of the load adjustment subcircuit 105, by adjusting the interface 103. The device to be tested 11 may also obtain the circuit loss of the load adjustment subcircuit 105 adjusted based on the load test parameter A2, that is, the first circuit loss corresponding to the load test parameter A2; and send the first circuit loss corresponding to the load test parameter A2 to the control component 12. After the control component 12 receives the first circuit loss corresponding to the load test parameter A2, the measurement component 13 can measure the circuit loss of the device to be tested 11 and the load adjustment subcircuit 105 adjusted based on the load test parameter A2, that is, the second circuit loss corresponding to the load test parameter A2. The measurement component 13 can send the second circuit loss corresponding to the load test parameter A2 to the control component 12. Then, the control component 12 can determine the load test result of the device to be tested 11 under the load test parameter A1 based on the first circuit loss and the second circuit loss corresponding to the load test parameter A1; the control component 12 can determine the load test result of the device to be tested 11 under the load test parameter A2 based on the first circuit loss and the second circuit loss corresponding to the load test parameter A2. This time, the load test of the device to be tested 11 under the load test parameters A1 and the load test parameters A2 is completed.

[0058] It should be noted that in Figure 1In the embodiment, the control component 12 establishes a first connection with the measuring component 13 so that the control component 12 and the measuring component 13 can exchange information. The first connection may include a wired connection or a wireless connection. The wired connection may be a network connection based on twisted pair, optical fiber, etc. The wireless connection may include a mobile hotspot (Wireless Fidelity, WiFi) connection, Bluetooth connection, Near Field Communication (Near Field Communication, NFC) connection, Universal Serial Bus (Universal Serial Bus, USB) connection, Local Area Network (Local Area Network, LAN) connection, etc. The control component 12 establishes a second connection with the device to be tested 11 so that the control component 12 and the device to be tested 11 can exchange information. The second connection may include a wired connection or a wireless connection. The load regulation circuit 10 establishes a wired circuit connection with the device to be tested 11, and the load regulation circuit 10 establishes a wired circuit connection with the measuring component 13.

[0059] See also Figure 2 , Figure 2 This is a flow chart of a load testing method provided by this application. Figure 2 As shown, the method can be performed by the device to be tested (such as Figure 1 The method may include but is not limited to the following steps:

[0060] S201. Receive N groups of load test parameters sent by a control device.

[0061] It should be noted that the control device may be capable of carrying a control component and a measurement component (such as Figure 1 The control device may also be composed of two devices equipped with a control component and a measurement component, respectively. The control component may be used to provide a configuration parameter interface.

[0062] It should be noted that the impedance value of the load regulation circuit is related to the AC signal (such as an electrical signal, an electromagnetic wave signal) in the load regulation circuit, such as the impedance value of the load regulation circuit will change with the change of the frequency of the AC signal, and the impedance value of the load regulation circuit will change with the change of the standing wave ratio of the AC signal. The load test parameters in this application can be physical quantities used to describe the AC signal in the load regulation circuit, such as the current, voltage, frequency, standing wave ratio, phase, etc. of the AC signal. Therefore, each set of load test parameters can include the frequency to be tested, the standing wave ratio to be tested, and the phase to be tested.

[0063] It should be noted that the frequency to be tested may refer to the frequency of the AC signal in the load regulation circuit. The standing wave ratio to be tested may refer to the ratio of the maximum voltage (or current) to the minimum voltage (or current) in the load regulation circuit. The phase to be tested may be used to reflect the degree of deviation of the waveform corresponding to the AC signal in the load regulation circuit on the time axis. Wherein, N is a positive integer. When N is greater than 1, any two sets of load test parameters in the N sets of load test parameters are not the same, that is, at least one parameter of the frequency to be tested, the standing wave ratio to be tested and the phase to be tested corresponding to any two sets of load test parameters is different.

[0064] In the present application, the control component in the control device can obtain N sets of configured load test parameters from the configuration parameter interface, and send the N sets of load test parameters to the device to be tested; the device to be tested can receive the N sets of load test parameters sent by the control component.

[0065] S202: According to N groups of load test parameters, respectively adjust the load of the load adjustment circuit to obtain first circuit losses corresponding to the N groups of load test parameters.

[0066] It should be noted that the load regulation circuit is connected to the device to be tested and is used to simulate the load circuit connected to the device to be tested when it is working; the load regulation circuit may include a switch element and a capacitor element. The first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load regulation circuit after adjustment based on the i-th group of load test parameters; wherein i is a positive integer less than or equal to N. The first circuit loss corresponding to the i-th group of load test parameters may refer to at least one of the resistance loss, electromagnetic loss, etc. of the load regulation circuit after adjustment based on the i-th group of load test parameters.

[0067] For example, when the first circuit loss corresponding to the i-th group of load test parameters is resistance loss, the first circuit loss corresponding to the i-th group of load test parameters may refer to the energy loss caused by the conversion of electrical energy consumed by various components (such as switching components, capacitor components, inductor components, etc.) in the load regulation circuit adjusted based on the i-th group of load test parameters into heat energy when current passes through.

[0068] For example, when the first circuit loss corresponding to the i-th group of load test parameters is electromagnetic loss, the first circuit loss corresponding to the i-th group of load test parameters may refer to the electromagnetic field generated in each component in the load regulation circuit when the current in the load regulation circuit adjusted based on the i-th group of load test parameters changes, thereby causing energy loss.

[0069] In the present application, the device to be tested can control the connection state between the capacitive element in the load adjustment circuit and the device to be tested based on the switch element in the load adjustment circuit to adjust the load of the load adjustment circuit so that the AC signal in the adjusted load adjustment circuit satisfies the i-th group of load test parameters. By automatically adjusting the load of the load adjustment circuit, the workload of manual testing is reduced and the test efficiency of the load test is improved.

[0070] For example, the i-th group of load test parameters includes a frequency to be tested, a standing wave ratio to be tested, and a phase to be tested, the frequency to be tested is 80 Hz (Hertz), the standing wave ratio to be tested is 5:1, and the phase to be tested is 45°. The device to be tested controls the connection state between the capacitive element and the inductive element in the load adjustment circuit and the device to be tested based on the switch element in the load adjustment circuit to adjust the load of the load adjustment circuit, so that the frequency of the AC signal in the adjusted load adjustment circuit is 80 Hz (Hertz), the ratio of the maximum voltage (or current) to the minimum voltage (or current) is 5:1, and the offset phase of the waveform corresponding to the AC signal is 45°.

[0071] In the present application, the device to be tested can also perform a circuit loss test on the load regulation circuit adjusted based on the i-th group of load test parameters to obtain the first circuit loss corresponding to the i-th group of load test parameters. By performing the above operations in sequence, the device to be tested can obtain the first circuit losses corresponding to the N groups of load test parameters.

[0072] S203. Send the first circuit losses corresponding to the N groups of load test parameters to the control device; the control device is used to measure the second circuit losses corresponding to the N groups of load test parameters through the measuring component; according to the first circuit losses and the second circuit losses corresponding to the N groups of load test parameters, determine the load test results corresponding to the device to be tested under the N groups of load test parameters.

[0073] It should be noted that the second circuit loss corresponding to the i-th group of load test parameters may refer to at least one of the resistance loss, electromagnetic loss, etc. of the device to be tested and the load adjustment circuit after adjustment based on the i-th group of load test parameters.

[0074] For example, when the second circuit loss corresponding to the i-th group of load test parameters is resistance loss, the second circuit loss corresponding to the i-th group of load test parameters may refer to the energy loss caused by the conversion of electrical energy consumed by the device to be tested and each component (such as switching elements, capacitor elements, inductor elements, etc.) in the load adjustment circuit adjusted based on the i-th group of load test parameters when current passes through into heat energy.

[0075] For example, when the second circuit loss corresponding to the i-th group of load test parameters is electromagnetic loss, the second circuit loss corresponding to the i-th group of load test parameters may refer to the electromagnetic field generated in the device to be tested and each component in the load regulation circuit when the current in the device to be tested and the load regulation circuit adjusted based on the i-th group of load test parameters changes, thereby causing energy loss.

[0076] In the present application, the device to be tested can send the first circuit losses corresponding to N groups of load test parameters to the control device. The control device can measure the circuit loss of the load regulation circuit and the device to be tested adjusted based on the i-th group of load test parameters through the measurement component, that is, the second circuit loss corresponding to the i-th group of load test parameters; by performing the above operations in sequence, the control device can obtain the second circuit losses corresponding to the N groups of load test parameters.

[0077] Furthermore, the control device can determine the circuit loss of the device to be tested under the i-th group of load test parameters based on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters, thereby avoiding the influence of the circuit loss of the load regulation circuit on the load test result and improving the test accuracy of the load test. The control device can also determine the load test results corresponding to the device to be tested under the i-th group of load test parameters based on the circuit loss of the device to be tested under the i-th group of load test parameters. By performing the above operations in sequence, the control device can obtain the load test results corresponding to the device to be tested under N groups of load test parameters.

[0078] It should be noted that the greater the circuit loss of the device to be tested under the i-th group of load test parameters, the smaller the matching degree between the load impedance of the device to be tested under the i-th group of load test parameters and the source impedance of the device to be tested, the greater the obstruction to the propagation of the signal in the antenna system, the worse the communication quality of the antenna system, and the load test result that the device to be tested fails the load test under the i-th group of load test parameters can be obtained. The smaller the circuit loss of the device to be tested under the i-th group of load test parameters, the greater the matching degree between the load impedance of the device to be tested under the i-th group of load test parameters and the source impedance of the device to be tested, the smaller the obstruction to the propagation of the signal in the antenna system, the better the communication quality of the antenna system, and the load test result that the device to be tested passes the load test under the i-th group of load test parameters can be obtained.

[0079] It should be noted that, based on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters, determining the circuit loss of the device to be tested under the i-th group of load test parameters may include any of the following methods: 1. Performing a difference operation on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters to obtain the circuit loss of the device to be tested under the i-th group of load test parameters; 2. Performing a weighted difference operation on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters to obtain the circuit loss of the device to be tested under the i-th group of load test parameters.

[0080] In the present application, the device to be tested can automatically adjust the load of the load regulation circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load regulation circuit, the test workload of manually adjusting the load is reduced, and the test efficiency of the load test is improved. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load regulation circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can be used to obtain the second circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the device to be tested and the load regulation circuit after adjustment based on each group of load test parameters) based on the measurement component; based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load regulation circuit on the load test results can be avoided, and the test accuracy of the load test can be improved.

[0081] Figure 3 This is a flow chart of another load testing method provided by this application. Figure 3 As shown, the method can be performed by the device to be tested (such as Figure 1 The method may include but is not limited to the following steps:

[0082] S301. Receive N groups of load test parameters sent by a control device.

[0083] S302: Determine the jth test frequency segment to which the frequency to be tested in the i-th group of load test parameters belongs.

[0084] It should be noted that M test frequency segments can be set in the present application, where M is a positive integer. One test frequency segment can correspond to a frequency range. For example, four test frequency segments are set in the present application, and the four test frequency segments are the first test frequency segment, the second test frequency segment, the third test frequency segment, and the fourth test frequency segment. Among them, the frequency range corresponding to the first test frequency segment is [0, 300 Hz], the frequency range corresponding to the second test frequency segment is [300 Hz, 600 Hz], the frequency range corresponding to the third test frequency segment is [600 Hz, 900 Hz], and the frequency range corresponding to the fourth test frequency segment is [900 Hz, 1200 Hz].

[0085] It should be noted that the frequencies to be tested in N groups of load test parameters belong to M test frequency segments, and the frequencies to be tested in one group of load test parameters belong to one test frequency segment. For example, two test frequency segments are set in the present application, namely the first test frequency segment and the second test frequency segment; wherein the frequency range corresponding to the first test frequency segment is [0, 300Hz], and the frequency range corresponding to the second test frequency segment is [300Hz, 600Hz]. Therefore, when the value of the frequency to be tested in the i-th group of load test parameters is 130Hz, the frequency to be tested in the i-th group of load test parameters belongs to the first test frequency segment; when the value of the frequency to be tested in the i-th group of load test parameters is 450Hz, the frequency to be tested in the i-th group of load test parameters belongs to the second test frequency segment.

[0086] It can be understood that the device to be tested can determine the jth test frequency segment to which the frequency to be tested in the i-th group of load test parameters belongs based on the value of the frequency to be tested in the i-th group of load test parameters.

[0087] S303, adjusting the load of the load adjustment circuit according to the j-th test frequency band, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, and obtaining a first circuit loss corresponding to the i-th group of load test parameters.

[0088] In the present application, the device to be tested can control the connection state between the capacitor element and the inductor element in the load regulation circuit and the device to be tested based on the switching element in the load regulation circuit to adjust the load of the load regulation circuit so that the AC signal in the adjusted load regulation circuit satisfies the i-th group of load test parameters.

[0089] For example, the frequency range corresponding to the jth test frequency segment is [0, 300 Hz], the standing wave ratio to be tested in the i-th group of load test parameters is 5:1, and the phase to be tested in the i-th group of load test parameters is 45°. The device to be tested controls the connection state between the capacitor element and the inductor element in the load adjustment circuit and the device to be tested based on the switch element in the load adjustment circuit to adjust the load of the load adjustment circuit so that the frequency range of the AC signal in the adjusted load adjustment circuit belongs to [0, 300 Hz], the ratio of the maximum voltage (or current) to the minimum voltage (or current) is 5:1, and the offset phase of the waveform corresponding to the AC signal is 45°.

[0090] In the present application, the device to be tested can also obtain the circuit loss of the load regulation circuit after adjustment based on the i-th group of load test parameters, that is, the first circuit loss corresponding to the i-th group of load test parameters. The device to be tested can perform the above operations in sequence to obtain the first circuit losses corresponding to the N groups of load test parameters.

[0091] Optionally, the load regulation circuit may include M load regulation subcircuits, one load regulation subcircuit corresponding to one test frequency segment. Therefore, the device to be tested may select the load regulation subcircuit corresponding to the jth test frequency segment from the M load regulation subcircuits; according to the jth test frequency segment, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, adjust the load of the selected load regulation subcircuit, and obtain the first circuit loss corresponding to the i-th group of load test parameters.

[0092] It should be noted that each load adjustment subcircuit can be used to simulate the load circuit connected to the device under test when it works in the corresponding test frequency band. Therefore, N groups of load test parameters can cover all test frequency bands. Based on N groups of different load test parameters, the device under test is load tested to achieve the test purpose of automated full coverage testing, and the load conditions that may occur during user use are tested in advance, thereby improving the reliability of the product.

[0093] In the present application, the device to be tested can screen out the load regulation subcircuit corresponding to the jth test frequency segment from the M load regulation subcircuits based on the jth test frequency segment. The device to be tested controls the connection state between the capacitor element in the screened load regulation subcircuit and the device to be tested based on the switch element in the screened load regulation subcircuit to adjust the load of the screened load regulation subcircuit, so that the frequency, standing wave ratio and phase corresponding to the AC signal in the adjusted screened load regulation subcircuit match the jth test frequency segment, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, and obtain the first circuit loss corresponding to the i-th group of load test parameters. In the present application, the device to be tested can perform the above operations in sequence to obtain the first circuit losses corresponding to the N groups of load test parameters.

[0094] Optionally, the device to be tested can filter out historical adjustment parameters that match the j-th test frequency band, the standing wave ratio to be tested, and the phase to be tested in the i-th group of load test parameters from the load adjustment table; the historical adjustment parameters are state parameters of components in the filtered load adjustment subcircuit when the load parameters corresponding to the filtered load adjustment subcircuit match the i-th group of load test parameters. The device to be tested can adjust the load of the filtered load adjustment subcircuit according to the filtered historical adjustment parameters; and determine the circuit loss of the adjusted filtered load adjustment subcircuit as the first circuit loss corresponding to the i-th group of load test parameters.

[0095] It should be noted that the load adjustment table may include at least one set of historical load test parameters, at least one set of historical adjustment parameters, etc. Each set of historical load test parameters may include a historical test frequency segment, a historical test standing wave ratio, and a historical test phase; a set of historical load test parameters corresponds to a set of historical adjustment parameters. Each set of historical adjustment parameters may be a state parameter of a component in a load adjustment subcircuit corresponding to a historical test frequency in a corresponding historical load test parameter when the load parameter corresponding to the load adjustment subcircuit corresponding to the historical test frequency in the corresponding historical load test parameter matches the corresponding historical load test parameter.

[0096] It should be noted that when the element in the load regulation sub-circuit is a switching element of multiple path switches, the state parameter of the switching element may refer to the connection state of each path switch in the switching element; when the element in the load regulation sub-circuit is a capacitor element with adjustable capacitance value, the state parameter of the capacitor element may refer to the capacitance value of the capacitor element.

[0097] It should be noted that the load parameter may refer to a Smith chart used to reflect the frequency, standing wave ratio and phase of the AC signal. The load parameter corresponding to the selected load adjustment subcircuit matches the i-th group of load test parameters, which may refer to the frequency, standing wave ratio and phase of the AC signal reflected by the Smith chart corresponding to the selected load adjustment subcircuit, matching the frequency to be tested, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters one by one. It can also be understood that the Smith chart corresponding to the selected load adjustment subcircuit is the same as the Smith chart corresponding to the i-th group of load test parameters.

[0098] It should be noted that screening out historical adjustment parameters that match the standing wave ratio to be tested and the phase to be tested in the j-th test frequency segment and the i-th group of load test parameters may include the following steps: Step 1, from the load adjustment table, screening out historical load test parameters whose historical test frequency segment, historical test standing wave ratio and historical test phase match the standing wave ratio to be tested and the phase to be tested in the j-th test frequency segment and the i-th group of load test parameters; Step 2, determining the historical adjustment parameters corresponding to the screened historical load test parameters as the historical adjustment parameters that match the standing wave ratio to be tested and the phase to be tested in the j-th test frequency segment and the i-th group of load test parameters.

[0099] In the present application, the device to be tested can filter out historical load test parameters from the load adjustment table, whose historical test frequency range, historical test standing wave ratio and historical test phase all match the standing wave ratio to be tested and the phase to be tested in the jth test frequency range, the i-th group of load test parameters. Obtain the historical adjustment parameters corresponding to the filtered historical load test parameters, and adjust the load of the filtered load adjustment subcircuit according to the filtered historical adjustment parameters; determine the circuit loss of the adjusted filtered load adjustment subcircuit as the first circuit loss corresponding to the i-th group of load test parameters.

[0100] In one embodiment, the load adjustment table also includes at least one historical circuit loss, and one historical adjustment parameter corresponds to one historical circuit loss. Each historical circuit loss may refer to the circuit loss of the load adjustment subcircuit after adjustment based on the corresponding historical adjustment parameter. The device to be tested may obtain the historical circuit loss corresponding to the screened historical adjustment parameter from the load adjustment table, and determine the obtained historical circuit loss as the circuit loss of the screened load adjustment subcircuit after adjustment, that is, the first circuit loss corresponding to the i-th group of load test parameters.

[0101] In one embodiment, the device to be tested may measure the circuit loss of the adjusted and screened load regulation sub-circuit, and determine the measured circuit loss as the first circuit loss corresponding to the i-th group of load test parameters.

[0102] Optionally, the elements in the screened load regulation subcircuit may include switching elements, capacitor elements and inductor elements. Therefore, the device to be tested can control the connection relationship between the capacitor elements and inductor elements in the screened load regulation subcircuit and the device to be tested according to the screened historical adjustment parameters and switching elements to adjust the load of the screened load regulation subcircuit.

[0103] In the present application, the device to be tested can adjust the capacitance value of the capacitor element according to the screened historical adjustment parameters and switching elements, determine the connection relationship between the capacitor element and the inductor element in the screened load adjustment subcircuit and the device to be tested, so as to adjust the load of the screened load adjustment subcircuit.

[0104] like Figure 4 As shown, Figure 4 is a structural diagram of a load adjustment table provided in the present application. In the present application, the device to be tested can adjust the load in the load adjustment circuit based on the load adjustment table and the load test parameters; the device to be tested can refer to Figure 1 The device under test 11 in the embodiment of the present invention may be a load regulating circuit. Figure 1 The load regulation circuit 10 in FIG. 10 is shown in FIG. Figure 4 The load adjustment table includes 8 groups of historical load test parameters, 8 groups of historical adjustment parameters and 8 historical circuit losses. The historical test frequency segments in the 8 groups of historical load test parameters are all the first test frequency segments, and the historical test standing wave ratios in the 8 groups of historical load test parameters are all 5:1. In addition, the historical test phase in the first group of historical load test parameters is 0°, the historical test phase in the second group of historical load test parameters is 45°, the historical test phase in the third group of historical load test parameters is 90°, the historical test phase in the fourth group of historical load test parameters is 135°, the historical test phase in the fifth group of historical load test parameters is 180°, the historical test phase in the sixth group of historical load test parameters is 225°, the historical test phase in the seventh group of historical load test parameters is 270° and the historical test phase in the eighth group of historical load test parameters is 315°. Among them, one group of historical load test parameters corresponds to one group of historical adjustment parameters, and corresponds to one historical circuit loss. Figure 4 The first test frequency band in Figure 1 Taking the load regulation subcircuit 104 in the load regulation circuit 10 as an example, Figure 4 The load regulation table in the Figure 1 11 Adjustment of the device under test Figure 1 The load in the load regulation sub-circuit 104 is controlled.

[0105] Among them, Figure 4 As shown, Figure 1The load adjustment subcircuit 104 in the embodiment has a historical circuit loss of 3 dB (decibel) after adjustment based on the historical adjustment parameters corresponding to the first group of historical load test parameters; Figure 1 The load adjustment subcircuit 104 in the embodiment has a historical circuit loss of 2.5 dB after adjustment based on the historical adjustment parameters corresponding to the first group of historical load test parameters; Figure 1 The load adjustment subcircuit 104 in the embodiment has a historical circuit loss of 2.95 dB after adjustment based on the historical adjustment parameters corresponding to the first group of historical load test parameters; Figure 1 The load adjustment subcircuit 104 in the embodiment has a historical circuit loss of 2.78 dB after adjustment based on the historical adjustment parameters corresponding to the first group of historical load test parameters; Figure 1 The load adjustment subcircuit 104 in the embodiment has a historical circuit loss of 3.68 dB after adjustment based on the historical adjustment parameters corresponding to the first group of historical load test parameters; Figure 1 The load adjustment subcircuit 104 in the embodiment has a historical circuit loss of 2.35 dB after adjustment based on the historical adjustment parameters corresponding to the first group of historical load test parameters; Figure 1 The load adjustment subcircuit 104 in the embodiment has a historical circuit loss of 2.61 dB after adjustment based on the historical adjustment parameters corresponding to the first group of historical load test parameters; Figure 1 The historical circuit loss of the load adjustment subcircuit 104 adjusted based on the historical adjustment parameters corresponding to the first group of historical load test parameters is 2.51 dB.

[0106] It should be noted that each set of historical adjustment parameters is Figure 1 When the load parameter of the load adjustment subcircuit 104 in matches the corresponding historical load test parameter, Figure 1 The state parameters of each element (such as a switch element, a capacitor element, an inductor element, etc.) in the load regulation subcircuit 104 in the embodiment of the present invention are as follows: Figure 1 The switch element 101 in the embodiment of the present invention, the switch element B2 may refer to Figure 1 The switch element 102 in the embodiment, the switch element B3 may refer to Figure 1 The switch element 1110 in FIG. 1110. The switch element B4 may refer to Figure 1 The switch element 1115 in the embodiment of the present invention, the switch element B5 may refer to Figure 1 The switch element 11120 in the embodiment of the present invention, the switch element B6 may refer to Figure 1 The switching element 1121 in.

[0107] In the load adjustment table, when the content corresponding to component C1 includes "C11", component C1 may refer to Figure 1 Inductor element 1111 in; when the content corresponding to element C1 includes "C12", element C1 may refer to Figure 1When the content corresponding to the element C1 includes "C13", the element C1 may refer to Figure 1 Inductor element 1113 in; when the content corresponding to element C1 includes "C14", element C1 may refer to Figure 1 In the load regulation table, when the content corresponding to component C2 includes "C21", component C2 may refer to Figure 1 When the content corresponding to the element C2 includes "C22", the element C2 may refer to Figure 1 When the content corresponding to the element C2 includes "C23", the element C2 may refer to the inductor element 1117 in FIG. Figure 1 When the content corresponding to the element C2 includes "C24", the element C2 may refer to Figure 1 In the load regulation table, when the content corresponding to the component C3 includes "C31", the component C3 may refer to Figure 1 When the content corresponding to the element C3 includes "C32", the element C3 may refer to Figure 1 Inductor element 1123 in; when the content corresponding to element C3 includes "C33", element C3 may refer to Figure 1 When the content corresponding to the component C3 includes "C34", the component C3 may refer to Figure 1 Capacitor element 1125 in.

[0108] Specifically, Figure 4 Take the historical load test parameters in the historical test phase as an example, when the historical adjustment parameters are 0°, Figure 4 The historical adjustment parameters in the historical adjustment parameters are explained. When the historical test phase in the historical adjustment parameters is 0°, Figure 4 The state parameters of the switch element B1 in the example are all "1115", which indicates that Figure 1 The switch element 101 and the switch element 1115 are in a connected state; Figure 4 The state parameters of the switch element B2 in the example are all "1120", which indicates that Figure 1 The switch element 102 and the switch element 1120 are in a connected state. At this time, Figure 1 The first load regulation subcircuit 104 in the test device (ie Figure 1 A connection is established with the device under test 11).

[0109] Furthermore, when the historical test phase in the historical adjustment parameter is 0°, Figure 4 The state parameter of the switch element B3 in is "open circuit", which indicates that Figure 1The switch element 1110 in the circuit is not connected to any of the inductor element 1111, the inductor element 1112, the inductor element 1113 and the capacitor element 1114. Figure 4 Component C1 corresponds to "NA", which means Figure 1 The inductor element 1111 , the inductor element 1112 , the inductor element 1113 and the capacitor element 1114 are all in a disconnected state with the switch element 1110 . Figure 4 The state parameter of the switch element B4 in is "1116", which indicates that Figure 1 The switch element 1115 and the capacitor element 1116 are in a connected state. Figure 4 The component C2 in corresponds to "C21 = 2", which means Figure 1 The capacitance value of the capacitor element 1116 in is 2pF (picofarad). Figure 4 The state parameter of the switch element B5 in is "1116", which indicates that Figure 1 The switch element 1120 and the capacitor element 1116 are in a connected state. Figure 4 The state parameter of the switch element B6 in is "1122", which indicates that Figure 1 The switch element 1121 and the inductor element 1122 are in a connected state. Figure 4 The corresponding element C3 in is "C31=24", which shows Figure 1 The inductance value of the inductor element 1122 is 24nH (nanohenry). Figure 4 The historical adjustment parameters in the historical adjustment parameters correspond to the historical test phases of 45°, 90°, 135°, 180°, 225°, 270° and 315°, which can be understood by referring to the above explanation.

[0110] It should be noted that based on Figure 4 Each set of historical adjustment parameters in Figure 1 The load regulation subcircuit 104 in the regulated Figure 1 The Smith chart corresponding to the load regulation subcircuit 104 in FIG. 1 is the same as the Smith chart corresponding to the corresponding historical load test parameter.

[0111] See also Figure 5a to Figure 5h , Figure 5a to Figure 5h are all Smith charts provided by this application. Figure 5a Take the Smith chart as an example to illustrate the Smith chart. The rings in the Smith chart (such as Figure 5a The circles 501 and 502 in FIG. 5 can be used to represent impedance values, and one circle corresponds to one impedance value; the curve segments whose two ends fall on the edge of the Smith chart (such as Figure 5a The curve segments 503 and 504 in FIG. 5 can be used to represent the admittance value (i.e., the derivative of the impedance value), and one curve segment corresponds to one admittance value. Figure 5b to Figure 5h For the description of the ring in the figure and the curve segments whose ends fall on the edge of the Smith chart, please refer to the above Figure 5a The description of the ring in the figure and the curve segment whose ends fall on the edge of the Smith chart will not be repeated here.

[0112] besides, Figure 5a is a Smith chart provided by this application, Figure 5a The line segments 511, 512 and 513 in FIG. 1 are drawn based on the impedance value of the load adjustment subcircuit 104 when the frequency of the AC signal in the load adjustment subcircuit 104 is the first frequency band, the standing wave ratio is 5:1 and the phase is 0°.

[0113] Figure 5b It is another Smith chart provided by this application. Figure 5b The line segment 52 in FIG. 5 is drawn based on the impedance value of the load adjustment sub-circuit 104 when the frequency of the AC signal in the load adjustment sub-circuit 104 is the first frequency band, the standing wave ratio is 5:1, and the phase is 45°.

[0114] Figure 5c It is another Smith chart provided by this application. Figure 5c The line segments 531, 532 and 533 in FIG. 1 are drawn based on the impedance value of the load adjustment subcircuit 104 when the frequency of the AC signal in the load adjustment subcircuit 104 is the first frequency band, the standing wave ratio is 5:1 and the phase is 90°.

[0115] Figure 5d It is another Smith chart provided by this application. Figure 5d The line segment 54 in FIG. 5 is drawn based on the impedance value of the load adjustment sub-circuit 104 when the frequency of the AC signal in the load adjustment sub-circuit 104 is the first frequency band, the standing wave ratio is 5:1, and the phase is 135°.

[0116] Figure 5e It is another Smith chart provided by this application. Figure 5e The line segments 551, 552 and 553 in FIG. 1 are drawn based on the impedance value of the load adjustment sub-circuit 104 when the frequency of the AC signal in the load adjustment sub-circuit 104 is the first frequency band, the standing wave ratio is 5:1 and the phase is 180°.

[0117] Figure 5f It is another Smith chart provided by this application. Figure 5f The line segment 56 in FIG. 5 is drawn based on the impedance value of the load adjustment sub-circuit 104 when the frequency of the AC signal in the load adjustment sub-circuit 104 is the first frequency band, the standing wave ratio is 5:1, and the phase is 225°.

[0118] Figure 5g It is another Smith chart provided by this application. Figure 5g The line segments 571, 572 and 573 in FIG. 1 are drawn based on the impedance value of the load adjustment sub-circuit 104 when the frequency of the AC signal in the load adjustment sub-circuit 104 is the first frequency band, the standing wave ratio is 5:1 and the phase is 270°.

[0119] Figure 5h It is another Smith chart provided by this application. Figure 5h The line segment 58 in FIG. 1 is drawn based on the impedance value of the load adjustment sub-circuit 104 when the frequency of the AC signal in the load adjustment sub-circuit 104 is the first frequency band, the standing wave ratio is 5:1, and the phase is 315°.

[0120] S304. Send the first circuit losses corresponding to the N groups of load test parameters to the control device; the control device is used to measure the second circuit losses corresponding to the N groups of load test parameters through the measuring component; according to the first circuit losses and the second circuit losses corresponding to the N groups of load test parameters, determine the load test results corresponding to the device to be tested under the N groups of load test parameters.

[0121] In the present application, the device to be tested can automatically adjust the load of the load regulation circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load regulation circuit, the test workload of manually adjusting the load is reduced, and the test efficiency of the load test is improved. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load regulation circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can be used to obtain the second circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the device to be tested and the load regulation circuit after adjustment based on each group of load test parameters) based on the measurement component; based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load regulation circuit on the load test results can be avoided, and the test accuracy of the load test can be improved.

[0122] Figure 6 This is a flow chart of another load testing method provided by this application. Figure 6 As shown, the method can be executed by a control device, and the method can include but is not limited to the following steps:

[0123] S601: Send N groups of load test parameters of the device to be tested to the device to be tested.

[0124] It should be noted that the N groups of load test parameters can be manually configured in the control device, and N is a positive integer. The N groups of load test parameters can be used to indicate that a load test is performed on the device to be tested. Each group of load test parameters can include a frequency to be tested, a standing wave ratio to be tested, and a phase to be tested; among them, the explanation of the frequency to be tested, the standing wave ratio to be tested, and the phase to be tested can be referred to above and will not be repeated here.

[0125] In the present application, the control device can obtain N groups of load test parameters obtained by the configuration, and send the N groups of load test parameters to the device to be tested. The device to be tested can control the connection state between the capacitor element in the load regulation circuit and the device to be tested based on the switch element in the load regulation circuit to adjust the load of the load regulation circuit so that the frequency, standing wave ratio and phase corresponding to the AC signal in the adjusted load regulation circuit match the frequency to be tested, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters. Among them, the explanation of the load regulation circuit, the switch element and the capacitor element in the load regulation circuit can be referred to above and will not be repeated here.

[0126] Furthermore, the device to be tested can perform a circuit loss test on the load adjustment circuit adjusted based on the i-th group of load test parameters to obtain the first circuit loss corresponding to the i-th group of load test parameters. By performing the above operations in sequence, the first circuit losses corresponding to the N groups of load test parameters can be obtained.

[0127] Optionally, when N is greater than 1, the device to be tested can obtain N groups of load test parameters and the test order of the N groups of load test parameters; based on the test order of the N groups of load test parameters, the N groups of load test parameters are sent to the device to be tested in sequence.

[0128] It should be noted that each group of load test parameters may include a frequency to be tested, a standing wave ratio to be tested, and a phase to be tested. For the explanation of the frequency to be tested, the standing wave ratio to be tested, and the phase to be tested, please refer to the above and will not be repeated here. The method for determining the order to be tested may include the following situations: 1. Based on the size of the frequency to be tested in the N groups of load test parameters, determine the test order of the N groups of load test parameters, such as the smaller the test frequency, the higher the test order of the load test parameters, the larger the test frequency, the later the test order of the load test parameters, etc.; 2. Manually configure the order of the N groups of load test parameters, that is, the test order of the N groups of load test parameters, such as the earlier the configuration time, the higher the test order of the load test parameters, the later the configuration time, the later the test order of the load test parameters, etc.

[0129] S602: Receive first circuit losses corresponding to N groups of load test parameters sent by the device to be tested.

[0130] In the present application, the device under test may send first circuit losses respectively corresponding to N groups of load test parameters to the control device, and the control device may receive first circuit losses respectively corresponding to the N groups of load test parameters sent by the device under test.

[0131] S603: Measure the second circuit losses corresponding to the N groups of load test parameters respectively through the measuring component.

[0132] In the present application, the control device can measure the total circuit loss of the load regulation circuit adjusted based on the i-th group of load test parameters and the device to be tested through a measuring component when the load regulation circuit adjusted based on the i-th group of load test parameters is connected to the device to be tested, that is, the second circuit loss corresponding to the i-th group of load test parameters; performing the above operations in sequence can obtain the second circuit losses corresponding to N groups of load test parameters respectively.

[0133] S604 , determining the load test results corresponding to the device to be tested under the N groups of load test parameters according to the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters.

[0134] In the present application, the control device can determine the circuit loss of the device under test under the i-th group of load test parameters based on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters. Based on the circuit loss of the device under test under the i-th group of load test parameters, it is determined that the device under test is responsible for the load test result that failed under the i-th group of load test parameters.

[0135] In one embodiment, the control device may perform a difference processing on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters, and the difference value obtained is the circuit loss of the device under test under the i-th group of load test parameters. The control device may determine the load test result of the device under test under the i-th group of load test parameters based on the circuit loss of the device under test under the i-th group of load test parameters; the above operations are performed in sequence until the control device obtains the load test results corresponding to the device under test under N groups of load test parameters.

[0136] In the present application, a loss threshold may be set in the control device. When the i-th group circuit loss of the device to be tested is less than the loss threshold, it indicates that the load impedance of the device to be tested under the i-th group load test parameters matches the source impedance of the device to be tested to a large extent, the obstruction to the propagation of the signal in the antenna system is small, and the communication quality of the antenna system is good. Therefore, the control device may determine that the device to be tested has passed the load test under the i-th group load test parameters, and generate a load test result indicating that the device to be tested has passed the load test under the i-th group load test parameters.

[0137] In the present application, when the i-th group circuit loss of the device to be tested is greater than or equal to the loss threshold, it indicates that the load impedance of the device to be tested under the i-th group load test parameters is less matched with the source impedance of the device to be tested, the propagation of the signal in the antenna system is greatly hindered, and the communication quality of the antenna system is poor. Therefore, it is determined that the load test of the device to be tested under the i-th group load test parameters has not passed, and a load test result indicating that the load test of the device to be tested under the i-th group load test parameters has not passed is generated.

[0138] It should be noted that the loss threshold may be manually set, or the loss threshold may be a default value in the control device.

[0139] In one embodiment, the control device may also measure the transmission power of the device under test under the i-th group of load test parameters through the measuring component; based on the transmission power and circuit loss of the device under test under the i-th group of load test parameters, determine the load test result of the device under test under the i-th group of load test parameters. The transmission power may refer to the power of the signal transmitted by the device under test (i.e., the WAAN module) to the surrounding space.

[0140] In the present application, when the circuit loss of the device to be tested under the i-th group of load test parameters is less than the loss threshold, and the transmission power of the device to be tested under the i-th group of load test parameters is greater than or equal to the transmission power threshold, it indicates that the load impedance of the device to be tested under the i-th group of load test parameters is highly matched with the source impedance of the device to be tested, the obstruction to the propagation of the signal in the antenna system is small, and the communication quality of the antenna system is good. Therefore, the control device can determine that the device to be tested passes the load test under the i-th group of load test parameters, and generate a load test result indicating that the device to be tested passes the load test under the i-th group of load test parameters.

[0141] In the present application, when the circuit loss of the device to be tested under the i-th group of load test parameters is greater than or equal to the loss threshold, or the transmission power of the device to be tested under the i-th group of load test parameters is less than the transmission power threshold, it indicates that the load impedance of the device to be tested under the i-th group of load test parameters is less matched with the source impedance of the device to be tested, the propagation of the signal in the antenna system is greatly hindered, and the communication quality of the antenna system is poor. Therefore, the control device can determine that the device to be tested has failed the load test under the i-th group of load test parameters, and generate a load test result indicating that the device to be tested has failed the load test under the i-th group of load test parameters.

[0142] In the present application, the device to be tested can be used to automatically adjust the load of the load regulation circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load regulation circuit, the test workload of manually adjusting the load is reduced, and the test efficiency of the load test is improved. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load regulation circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can obtain the second circuit loss corresponding to the N groups of load test parameters based on the measurement component (i.e., the circuit loss of the device to be tested and the load regulation circuit after adjustment based on each group of load test parameters); based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load regulation circuit on the load test results can be avoided, and the test accuracy of the load test can be improved.

[0143] Figure 7 This is a flow chart of another load testing method provided by this application. Figure 7 As shown, the method can be performed by the control device and the device to be tested together, and the method can include but is not limited to the following steps:

[0144] S71. The control device obtains N sets of configured load test parameters.

[0145] In the present application, N groups of load test parameters may be configured in the control device, where N is a positive integer.

[0146] S72: The device to be tested stores the load adjustment table locally.

[0147] In the present application, after configuring N groups of load test parameters, the device to be tested can store the load adjustment table corresponding to the N groups of load test parameters locally.

[0148] In one embodiment, the load adjustment table may also be stored in the device to be tested before N groups of load test parameters are configured in the control device; the present application does not limit the execution order of step 71 and step 72.

[0149] S73. The control device sends the i-th group of load test parameters to the device to be tested.

[0150] In the present application, after the connection state between the control device, the device to be tested and the load regulation circuit is in the connected state, the control device can obtain the test order of N groups of load test parameters; the description of the test order of N groups of load test parameters can refer to the above description, which will not be repeated here. The control device can send the i-th group of load test parameters to the device to be tested based on the test order of N groups of load test parameters.

[0151] S74. The device to be tested adjusts the load of the load adjustment circuit based on the i-th group of load test parameters, and obtains a first circuit loss corresponding to the i-th group of load test parameters.

[0152] In the present application, the device to be tested can adjust the load of the load adjustment circuit based on the i-th group of load test parameters, and determine the circuit loss of the load adjustment circuit adjusted based on the i-th group of load test parameters as the first circuit loss corresponding to the i-th group of load test parameters. The device to be tested can also send the first circuit loss corresponding to the i-th group of load test parameters to the control device.

[0153] S75. The control device measures the second circuit loss corresponding to the i-th group of load test parameters.

[0154] In the present application, after the control device receives the first circuit loss corresponding to the i-th group of load test parameters, it can measure the circuit loss of the load adjustment circuit and the device to be tested adjusted based on the i-th group of load test parameters based on the measurement component, and determine the measured circuit loss as the second circuit loss corresponding to the i-th group of load test parameters.

[0155] S76: Check whether the N groups of load test parameters have been tested.

[0156] In the present application, the control device can determine whether the N groups of load test parameters have been tested. When i is less than N, the control device determines that the N groups of load test parameters have not been tested, and executes step 77; when i is equal to N, the control device determines that the N groups of load test parameters have been tested, and executes step 78.

[0157] S77, i is increased by one; the control device may increase the value of i by one, and then the control device continues to execute step 73.

[0158] S78. The control device generates a load test result based on the first circuit loss and the second circuit loss respectively corresponding to the N groups of load test parameters.

[0159] In the present application, if N groups of load test parameters have been tested, the control device can generate load test results corresponding to the device to be tested under N groups of load test parameters based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, and output a test report about the device to be tested; this load test is completed.

[0160] In the present application, the device to be tested can automatically adjust the load of the load regulation circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load regulation circuit, the test workload of manually adjusting the load is reduced, and the test efficiency of the load test is improved. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load regulation circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can be used to obtain the second circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the device to be tested and the load regulation circuit after adjustment based on each group of load test parameters) based on the measurement component; based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load regulation circuit on the load test results can be avoided, and the test accuracy of the load test can be improved.

[0161] See also Figure 8 , Figure 8 Schematic diagram of a load test device provided by this application. Figure 8 As shown, the load testing device may include:

[0162] The first receiving module 811 is used to receive N groups of load test parameters sent by the control device; N is a positive integer;

[0163] The adjustment module 812 is used to adjust the load of the load adjustment circuit according to the N groups of load test parameters, and obtain the first circuit losses corresponding to the N groups of load test parameters; the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load adjustment circuit after adjustment based on the i-th group of load test parameters, the load adjustment circuit is connected to the device to be tested, and is used to simulate the load circuit connected to the device to be tested when it is working; i is a positive integer less than or equal to N;

[0164] The first sending module 813 is used to send the first circuit losses corresponding to the above-mentioned N groups of load test parameters to the above-mentioned control device; the above-mentioned control device is used to measure the second circuit losses corresponding to the above-mentioned N groups of load test parameters through the measuring component; according to the first circuit losses and the second circuit losses corresponding to the above-mentioned N groups of load test parameters, the load test results corresponding to the above-mentioned device to be tested under the above-mentioned N groups of load test parameters are determined; the second circuit loss corresponding to the above-mentioned i-th group of load test parameters is the circuit loss of the above-mentioned device to be tested and the load regulation circuit adjusted based on the above-mentioned i-th group of load test parameters.

[0165] Optionally, each group of load test parameters includes a frequency to be tested, a standing wave ratio to be tested, and a phase to be tested. The frequencies to be tested in the N groups of load test parameters belong to M test frequency segments, and the frequencies to be tested in one group of load test parameters belong to one test frequency segment; M is an integer greater than 1; the adjustment module 812 can also be used to execute:

[0166] Determine the jth test frequency segment to which the frequency to be tested in the i-th group of load test parameters belongs; j is a positive integer less than or equal to M;

[0167] According to the j-th test frequency band, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, the load of the load adjustment circuit is adjusted to obtain the first circuit loss corresponding to the i-th group of load test parameters.

[0168] Optionally, the load adjustment circuit includes M load adjustment sub-circuits, and one load adjustment sub-circuit corresponds to one test frequency segment; the adjustment module 812 may also be used to execute:

[0169] Selecting the load adjustment sub-circuit corresponding to the j-th test frequency band from the M load adjustment sub-circuits;

[0170] According to the j-th test frequency band, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, the load of the screened load adjustment subcircuit is adjusted to obtain the first circuit loss corresponding to the i-th group of load test parameters.

[0171] Optionally, the adjustment module 812 may also be used to execute:

[0172] From the load adjustment table, historical adjustment parameters that match the j-th test frequency band, the standing wave ratio to be tested, and the phase to be tested in the i-th group of load test parameters are screened out; the historical adjustment parameters are state parameters of the components in the screened load adjustment subcircuit when the load parameters corresponding to the screened load adjustment subcircuit match the i-th group of load test parameters;

[0173] According to the screened historical adjustment parameters, adjusting the load of the screened load adjustment subcircuit;

[0174] The adjusted circuit loss of the screened load regulation sub-circuit is determined as the first circuit loss corresponding to the i-th group of load test parameters.

[0175] Optionally, the elements in the above-screened load adjustment subcircuit include switch elements, capacitor elements and inductor elements; the above-mentioned adjustment module 812 can also be used to execute:

[0176] According to the above-screened historical adjustment parameters and the above-screened switch element, the connection relationship between the capacitor element and the inductor element in the above-screened load adjustment subcircuit and the above-screened device to be tested is controlled to adjust the load of the above-screened load adjustment subcircuit.

[0177] In the embodiments of the present application, the term "module" or "unit" refers to a computer program or a part of a computer program with a predetermined function, and works together with other related parts to achieve a predetermined goal, and can be implemented in whole or in part by using software, hardware (such as processing circuits or memories) or a combination thereof. Similarly, a processor (or multiple processors or memories) can be used to implement one or more modules or units. In addition, each module or unit can be part of an overall module or unit that includes the function of the module or unit.

[0178] In the present application, the device to be tested can automatically adjust the load of the load regulation circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load regulation circuit, the test workload of manually adjusting the load is reduced, and the test efficiency of the load test is improved. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load regulation circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can be used to obtain the second circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the device to be tested and the load regulation circuit after adjustment based on each group of load test parameters) based on the measurement component; based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load regulation circuit on the load test results can be avoided, and the test accuracy of the load test can be improved.

[0179] See also Fig. 9 , Fig. 9 is a structural diagram of another load testing device provided by the present application. Fig. 9 As shown, the load testing device may include:

[0180] The second sending module 911 is used to send N groups of load test parameters of the device to be tested to the above-mentioned device to be tested; the above-mentioned device to be tested is used to adjust the load of the load adjustment circuit according to the above-mentioned N groups of load test parameters, and obtain the first circuit losses corresponding to the above-mentioned N groups of load test parameters, the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the above-mentioned load adjustment circuit after adjustment based on the above-mentioned i-th group of load test parameters, the above-mentioned load adjustment circuit is connected to the above-mentioned device to be tested, and is used to simulate the load circuit connected to the above-mentioned device to be tested when working, N is a positive integer, and i is a positive integer less than or equal to N;

[0181] The second receiving module 912 is used to receive the first circuit losses respectively corresponding to the N groups of load test parameters sent by the device to be tested;

[0182] The measuring module 913 is used to measure the second circuit losses corresponding to the N groups of load test parameters respectively through the measuring component; the second circuit loss corresponding to the i-th group of load test parameters is the circuit loss between the device to be tested and the load adjustment circuit adjusted based on the i-th group of load test parameters;

[0183] The processing module 914 is used to determine the load test results corresponding to the above-mentioned device under the above-mentioned N groups of load test parameters according to the first circuit loss and the second circuit loss respectively corresponding to the above-mentioned N groups of load test parameters.

[0184] Optionally, the processing module 914 may also be used to execute:

[0185] Performing a difference processing on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters to obtain the circuit loss of the device to be tested under the i-th group of load test parameters;

[0186] Determine a load test result of the device under test under the i-th group of load test parameters based on the circuit loss of the device under test under the i-th group of load test parameters;

[0187] Until the load test results corresponding to the above-mentioned equipment to be tested under the above-mentioned N groups of load test parameters are obtained.

[0188] Optionally, the processing module 914 may also be used to execute:

[0189] When the i-th group of circuit losses of the above-mentioned device to be tested is less than the loss threshold, it is determined that the above-mentioned device to be tested has passed the load test under the above-mentioned i-th group of load test parameters, and a load test result is generated to indicate that the above-mentioned device to be tested has passed the load test under the above-mentioned i-th group of load test parameters;

[0190] When the i-th group circuit loss of the above-mentioned device to be tested is greater than or equal to the loss threshold, it is determined that the above-mentioned device to be tested has failed the load test under the above-mentioned i-th group of load test parameters, and a load test result is generated to indicate that the above-mentioned device to be tested has failed the load test under the above-mentioned i-th group of load test parameters.

[0191] Optionally, the processing module 914 may also be used to execute:

[0192] Measuring the transmission power of the device to be tested under the i-th group of load test parameters by the measurement component;

[0193] Based on the transmission power and circuit loss of the device to be tested under the i-th group of load test parameters, a load test result of the device to be tested under the i-th group of load test parameters is determined.

[0194] Optionally, the processing module 914 may also be used to execute:

[0195] When the circuit loss of the device to be tested under the i-th group of load test parameters is less than the loss threshold, and the transmission power of the device to be tested under the i-th group of load test parameters is greater than or equal to the transmission power threshold, it is determined that the load test of the device to be tested under the i-th group of load test parameters has passed, and a load test result indicating that the load test of the device to be tested under the i-th group of load test parameters has passed is generated;

[0196] When the circuit loss of the above-mentioned device to be tested under the above-mentioned i-th group of load test parameters is greater than or equal to the loss threshold, or the transmission power of the above-mentioned device to be tested under the above-mentioned i-th group of load test parameters is less than the transmission power threshold, it is determined that the above-mentioned device to be tested has failed the load test under the above-mentioned i-th group of load test parameters, and a load test result is generated to indicate that the above-mentioned device to be tested has failed the load test under the above-mentioned i-th group of load test parameters.

[0197] Optionally, when N is greater than 1, the second sending module 911 may also be used to execute:

[0198] Obtaining N groups of load test parameters configured in the control device and a test order of the N groups of load test parameters;

[0199] Based on the test sequence of the N groups of load test parameters, the N groups of load test parameters are sent to the devices to be tested in sequence.

[0200] In the embodiments of the present application, the term "module" or "unit" refers to a computer program or a part of a computer program with a predetermined function, and works together with other related parts to achieve a predetermined goal, and can be implemented in whole or in part by using software, hardware (such as processing circuits or memories) or a combination thereof. Similarly, a processor (or multiple processors or memories) can be used to implement one or more modules or units. In addition, each module or unit can be part of an overall module or unit that includes the function of the module or unit.

[0201] In the present application, the device to be tested can automatically adjust the load of the load regulation circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load regulation circuit, the test workload of manually adjusting the load is reduced, and the test efficiency of the load test is improved. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load regulation circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can be used to obtain the second circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the device to be tested and the load regulation circuit after adjustment based on each group of load test parameters) based on the measurement component; based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load regulation circuit on the load test results can be avoided, and the test accuracy of the load test can be improved.

[0202] See also Fig.10 , is a schematic diagram of the structure of a computer device provided by this application. Fig.10 As shown, the computer device may include:

[0203] The above-mentioned computer device includes: a processor 1001, a network interface 1004 and a memory 1005. In addition, the above-mentioned computer device 1000 may also include: a user interface 1003, and at least one communication bus 1002. The communication bus 1002 is used to realize the connection and communication between these components. In some embodiments, the user interface 1003 may include a display screen (Display) and a keyboard (Keyboard). The user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a WI-FI interface). The memory 1005 may be a high-speed RAM memory, or it may be a non-volatile memory (non-volatile Memory), such as at least one disk storage. The memory 1005 may also be optionally at least one storage device away from the aforementioned processor 1001. Fig.10 As shown, the memory 1005 as a computer device may include an operating system, a network communication module, a user interface module and a computer program.

[0204] exist Fig.10 In the computer device 1000 shown, the network interface 1004 can provide a network communication function; the user interface 1003 is mainly used to provide an input interface; and the processor 1001 can be used to call a computer program stored in the memory 1005 to execute:

[0205] Receive N groups of load test parameters sent by the control device; N is a positive integer;

[0206] According to the N groups of load test parameters, the load of the load adjustment circuit is adjusted respectively to obtain the first circuit losses respectively corresponding to the N groups of load test parameters; the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load adjustment circuit after adjustment based on the i-th group of load test parameters, the load adjustment circuit is connected to the device to be tested and is used to simulate the load circuit connected to the device to be tested when it is working; i is a positive integer less than or equal to N;

[0207] The first circuit losses corresponding to the above-mentioned N groups of load test parameters are sent to the above-mentioned control device; the above-mentioned control device is used to measure the second circuit losses corresponding to the above-mentioned N groups of load test parameters through the measuring component; according to the first circuit losses and the second circuit losses corresponding to the above-mentioned N groups of load test parameters, the load test results corresponding to the above-mentioned device to be tested under the above-mentioned N groups of load test parameters are determined; the second circuit loss corresponding to the above-mentioned i-th group of load test parameters is the circuit loss of the above-mentioned device to be tested and the load regulation circuit adjusted based on the above-mentioned i-th group of load test parameters.

[0208] In the present application, the device to be tested can automatically adjust the load of the load regulation circuit based on N groups of load test parameters, thereby simulating the situation where different loads are connected to the device to be tested, and by automatically adjusting the load of the load regulation circuit, the test workload of manually adjusting the load is reduced, and the test efficiency of the load test is improved. Further, the device to be tested can obtain the first circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the load regulation circuit after adjustment based on each group of load test parameters), and send the first circuit loss corresponding to the N groups of load test parameters to the control device. The control device can be used to obtain the second circuit loss corresponding to the N groups of load test parameters (i.e., the circuit loss of the device to be tested and the load regulation circuit after adjustment based on each group of load test parameters) based on the measurement component; based on the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters, the circuit loss corresponding to the device to be tested under the N groups of load test parameters is obtained, thereby determining the load test results corresponding to the device to be tested under the N groups of load test parameters. In this way, the influence of the circuit loss of the load regulation circuit on the load test results can be avoided, and the test accuracy of the load test can be improved.

[0209] In addition, it should be pointed out here that: the embodiment of the present application also provides a computer-readable storage medium, and the computer-readable storage medium stores a computer program executed by the data processing device mentioned above, and the computer program includes program instructions. When the processor executes the program instructions, it can execute the description of the data processing method in the corresponding embodiment above, so it will not be repeated here. In addition, the description of the beneficial effects of the same method will not be repeated. For technical details not disclosed in the computer-readable storage medium embodiment involved in this application, please refer to the description of the method embodiment of this application.

[0210] As an example, the above program instructions may be deployed on a computer device for execution, or deployed on at least two computer devices at one location for execution, or executed on at least two computer devices distributed at at least two locations and interconnected through a communication network. At least two computer devices distributed at at least two locations and interconnected through a communication network may constitute a blockchain network.

[0211] The computer-readable storage medium may be the data processing device provided in any of the aforementioned embodiments or the central storage unit of the computer device, such as a hard disk or a memory of the computer device. The computer-readable storage medium may also be an external storage device of the computer device, such as a plug-in hard disk, a smart memory card (SMART Media card, SMC), a secure digital (Secure digital, SD) card, a flash card (flash card), etc. equipped on the computer device. Further, the computer-readable storage medium may also include both the central storage unit of the computer device and an external storage device. The computer-readable storage medium is used to store the computer program and other programs and data required by the computer device. The computer-readable storage medium may also be used to temporarily store data that has been output or is to be output.

[0212] The terms "first", "second", etc. in the description, claims, and drawings of the embodiments of the present application are used to distinguish between contents in different media, rather than to describe a specific order. In addition, the terms "including" and any of their variations are intended to cover non-exclusive inclusions. For example, a process, method, device, product, or equipment that includes a series of steps or units is not limited to the listed steps or modules, but may optionally include steps or modules that are not listed, or may optionally include other step units inherent to these processes, methods, devices, products, or equipment.

[0213] The data collection and processing in this application should be strictly in accordance with the requirements of relevant laws and regulations when applied in practice, and the informed consent or separate consent of the personal information subject should be obtained. Subsequent data use and processing should be carried out within the scope of authorization of laws and regulations and the personal information subject.

[0214] The embodiment of the present application also provides a computer program product, including a computer program, which, when executed by a processor, implements the description of the above-mentioned data processing method and decoding method in the corresponding embodiment above, so it will not be repeated here. In addition, the description of the beneficial effects of the same method will not be repeated. For technical details not disclosed in the embodiment of the computer program product involved in the present application, please refer to the description of the method embodiment of the present application.

[0215] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in terms of function in the above description. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0216] The method and related apparatus provided by the embodiment of the present application are described with reference to the method flow chart and / or structural diagram provided by the embodiment of the present application. Specifically, each process and / or box in the method flow chart and / or structural diagram, as well as the combination of the processes and / or boxes in the flow chart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable network connection device to generate a machine, so that the instructions executed by the processor of the computer or other programmable network connection device generate instructions for implementing the process in the process. Figure 1 Schematic diagram of one or more processes and / or structures Figure 1 These computer program instructions can also be stored in a computer-readable memory that can guide a computer or other programmable network-connected device to work in a specific manner, so that the instructions stored in the computer-readable memory produce a product including an instruction device, which implements the functions specified in the process. Figure 1 Schematic diagram of one or more processes and / or structures Figure 1 These computer program instructions can also be loaded onto a computer or other programmable network connected device, so that a series of operation steps are executed on the computer or other programmable device to produce a computer-implemented process, so that the instructions executed on the computer or other programmable device provide for implementing the process. Figure 1 A flow or multiple flows and / or structures illustrate the steps of the functions specified in one block or multiple blocks.

[0217] The above disclosure is only the preferred embodiment of the present application, which certainly cannot be used to limit the scope of rights of the present application. Therefore, equivalent changes made according to the claims of the present application are still within the scope covered by the present application.

Claims

1. A load testing method, characterized in that: include: Receive N groups of load test parameters sent by the control device; N is a positive integer; According to the N groups of load test parameters, the load of the load adjustment circuit is adjusted respectively to obtain the first circuit losses respectively corresponding to the N groups of load test parameters; the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load adjustment circuit after adjustment based on the i-th group of load test parameters, the load adjustment circuit is connected to the device to be tested and is used to simulate the load circuit connected when the device to be tested is working; i is a positive integer less than or equal to N; The first circuit losses corresponding to the N groups of load test parameters are sent to the control device; the control device is used to measure the second circuit losses corresponding to the N groups of load test parameters through a measuring component; according to the first circuit losses and the second circuit losses corresponding to the N groups of load test parameters, the load test results corresponding to the device to be tested under the N groups of load test parameters are determined; the second circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the device to be tested and the load regulation circuit adjusted based on the i-th group of load test parameters.

2. The method according to claim 1, characterized in that Each group of load test parameters includes a frequency to be tested, a standing wave ratio to be tested and a phase to be tested, the frequencies to be tested in the N groups of load test parameters belong to M test frequency segments, and the frequencies to be tested in one group of load test parameters belong to one test frequency segment; M is a positive integer; The step of adjusting the load of the load regulating circuit respectively according to the N groups of load test parameters to obtain first circuit losses respectively corresponding to the N groups of load test parameters includes: Determine the jth test frequency segment to which the frequency to be tested in the i-th group of load test parameters belongs; j is a positive integer less than or equal to M; According to the j-th test frequency segment, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, the load of the load adjustment circuit is adjusted to obtain the first circuit loss corresponding to the i-th group of load test parameters.

3. The method according to claim 2, characterized in that The load regulation circuit includes M load regulation sub-circuits, one load regulation sub-circuit corresponding to one test frequency segment; The step of adjusting the load of the load adjustment circuit according to the j-th test frequency segment, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, and obtaining the first circuit loss corresponding to the i-th group of load test parameters includes: Selecting the load adjustment sub-circuit corresponding to the j-th test frequency segment from the M load adjustment sub-circuits; According to the j-th test frequency segment, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, the load of the screened load adjustment subcircuit is adjusted to obtain the first circuit loss corresponding to the i-th group of load test parameters.

4. The method according to claim 3, characterized in that The step of adjusting the load of the selected load adjustment subcircuit according to the j-th test frequency segment, the standing wave ratio to be tested and the phase to be tested in the i-th group of load test parameters, and obtaining the first circuit loss corresponding to the i-th group of load test parameters includes: From the load adjustment table, historical adjustment parameters that match the j-th test frequency band, the standing wave ratio to be tested, and the phase to be tested in the i-th group of load test parameters are screened out; the historical adjustment parameters are state parameters of components in the screened load adjustment subcircuit when the load parameters corresponding to the screened load adjustment subcircuit match the i-th group of load test parameters; According to the screened historical adjustment parameters, adjusting the load of the screened load adjustment subcircuit; The adjusted circuit loss of the screened load regulation sub-circuit is determined as the first circuit loss corresponding to the i-th group of load test parameters.

5. The method according to claim 4, characterized in that The elements in the selected load regulation subcircuit include switch elements, capacitor elements and inductor elements; and adjusting the load of the selected load regulation subcircuit according to the selected historical adjustment parameters includes: According to the selected historical adjustment parameters and the switch element, the connection relationship between the capacitor element and the inductor element in the selected load adjustment subcircuit and the device to be tested is controlled to adjust the load of the selected load adjustment subcircuit.

6. A load testing method, characterized in that: include: N groups of load test parameters of the device to be tested are sent to the device to be tested; the device to be tested is used to adjust the load of the load regulation circuit according to the N groups of load test parameters, and obtain the first circuit losses corresponding to the N groups of load test parameters, the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load regulation circuit after adjustment based on the i-th group of load test parameters, the load regulation circuit is connected to the device to be tested, and is used to simulate the load circuit connected to the device to be tested when it is working, N is a positive integer, and i is a positive integer less than or equal to N; Receiving first circuit losses respectively corresponding to the N groups of load test parameters sent by the device to be tested; The second circuit losses corresponding to the N groups of load test parameters are measured by a measuring component; the second circuit loss corresponding to the i-th group of load test parameters is the circuit loss between the device to be tested and the load adjustment circuit adjusted based on the i-th group of load test parameters; According to the first circuit loss and the second circuit loss respectively corresponding to the N groups of load test parameters, the load test results respectively corresponding to the device to be tested under the N groups of load test parameters are determined.

7. The method according to claim 6, characterized in that Determining the load test results corresponding to the device to be tested under the N groups of load test parameters respectively according to the first circuit loss and the second circuit loss respectively corresponding to the N groups of load test parameters includes: Performing a difference processing on the first circuit loss and the second circuit loss corresponding to the i-th group of load test parameters to obtain the circuit loss of the device to be tested under the i-th group of load test parameters; Determining a load test result of the device under test under the i-th group of load test parameters based on a circuit loss of the device under test under the i-th group of load test parameters; Until the load test results corresponding to the device to be tested under the N groups of load test parameters are obtained.

8. The method according to claim 7, characterized in that The determining, based on the circuit loss of the device under test under the i-th group of load test parameters, a load test result of the device under test under the i-th group of load test parameters comprises: When the i-th group circuit loss of the device to be tested is less than the loss threshold, determining that the device to be tested has passed the load test under the i-th group load test parameters, and generating a load test result indicating that the device to be tested has passed the load test under the i-th group load test parameters; When the i-th group circuit loss of the device to be tested is greater than or equal to the loss threshold, it is determined that the device to be tested has failed the load test under the i-th group of load test parameters, and a load test result is generated to indicate that the device to be tested has failed the load test under the i-th group of load test parameters.

9. The method according to claim 7, characterized in that: The determining, based on the circuit loss of the device under test under the i-th group of load test parameters, a load test result of the device under test under the i-th group of load test parameters comprises: Measuring, by means of the measuring component, the transmission power of the device to be tested under the i-th group of load test parameters; Based on the transmission power and circuit loss of the device to be tested under the i-th group of load test parameters, a load test result of the device to be tested under the i-th group of load test parameters is determined.

10. The method according to claim 9, characterized in that The determining, based on the transmission power and circuit loss of the device to be tested under the i-th group of load test parameters, a load test result of the device to be tested under the i-th group of load test parameters comprises: When the circuit loss of the device to be tested under the i-th group of load test parameters is less than the loss threshold, and the transmission power of the device to be tested under the i-th group of load test parameters is greater than or equal to the transmission power threshold, it is determined that the load test of the device to be tested under the i-th group of load test parameters has passed, and a load test result indicating that the load test of the device to be tested under the i-th group of load test parameters has passed is generated; When the circuit loss of the device to be tested under the i-th group of load test parameters is greater than or equal to the loss threshold, or the transmission power of the device to be tested under the i-th group of load test parameters is less than the transmission power threshold, it is determined that the load test of the device to be tested under the i-th group of load test parameters has failed, and a load test result is generated to indicate that the device to be tested has failed the load test under the i-th group of load test parameters.

11. The method according to claim 6, characterized in that When N is greater than 1, sending N groups of load test parameters of the device to be tested to the device to be tested includes: Obtaining N groups of load test parameters configured in the control device and a test order of the N groups of load test parameters; Based on the test order of the N groups of load test parameters, the N groups of load test parameters are sent to the devices to be tested in sequence.

12. A load testing device, characterized in that: include: A first receiving module, used for receiving N groups of load test parameters sent by the control device; N is a positive integer An adjustment module, used for adjusting the load of the load adjustment circuit according to the N groups of load test parameters, and obtaining first circuit losses corresponding to the N groups of load test parameters; the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load adjustment circuit after adjustment based on the i-th group of load test parameters, the load adjustment circuit is connected to the device to be tested, and is used to simulate the load circuit connected to the device to be tested when it is working; i is a positive integer less than or equal to N; The first sending module is used to send the first circuit losses corresponding to the N groups of load test parameters to the control device; the control device is used to measure the second circuit losses corresponding to the N groups of load test parameters through the measuring component; according to the first circuit losses and the second circuit losses corresponding to the N groups of load test parameters, the load test results corresponding to the device to be tested under the N groups of load test parameters are determined; the second circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the device to be tested and the load regulation circuit adjusted based on the i-th group of load test parameters.

13. A load testing device, characterized in that: include: A second sending module is used to send N groups of load test parameters of the device to be tested to the device to be tested; the device to be tested is used to adjust the load of the load regulation circuit according to the N groups of load test parameters, and obtain the first circuit losses corresponding to the N groups of load test parameters, the first circuit loss corresponding to the i-th group of load test parameters is the circuit loss of the load regulation circuit after adjustment based on the i-th group of load test parameters, the load regulation circuit is connected to the device to be tested, and is used to simulate the load circuit connected to the device to be tested when it is working, N is a positive integer, and i is a positive integer less than or equal to N; A second receiving module, used for receiving first circuit losses respectively corresponding to the N groups of load test parameters sent by the device to be tested; A measuring module, configured to measure, by means of a measuring component, second circuit losses respectively corresponding to the N groups of load test parameters; the second circuit loss corresponding to the i-th group of load test parameters is a circuit loss between the device to be tested and a load regulating circuit adjusted based on the i-th group of load test parameters; The processing module is used to determine the load test results corresponding to the device to be tested under the N groups of load test parameters according to the first circuit loss and the second circuit loss corresponding to the N groups of load test parameters.

14. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 11 are implemented.

15. A computer storage medium, characterized in that The computer storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 11 are performed.

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