MLCC aging test method, system and medium

Abstract

The invention provides an MLCC aging test method and system, and a medium. The method comprises the steps of performing an aging test on the MLCC, processing according to a test result to obtain a voltage-resistant performance evaluation index, a frequency stability evaluation index and an environmental adaptability evaluation index, further processing to obtain a reliability evaluation index, and performing product quality judgment according to the reliability evaluation index. And process parameters of the MLCC are optimized according to the characteristic parameter change curves of the MLCC in different aging test environments, so that the purpose of finding potential quality problems through aging tests is achieved.

Description

Technical Field

[0001] The present application relates to the technical field of big data and MLCC aging test, and specifically, to an MLCC aging test method, system and medium. Background Art

[0002] MLCC (Multilayer Ceramic Capacitor) is an indispensable key component in electronic circuits and is widely used in various electronic devices, such as smart phones, computers, automotive electronics, and communication equipment. With the continuous improvement of the performance of electronic equipment and the diversification of the use environment, MLCC may age during long-term use. Aging will cause changes in the capacitance value of MLCC, increase in equivalent series resistance, and decrease in insulation performance, which will in turn affect the performance, reliability, and life of electronic equipment. Some existing aging test methods often only focus on some performance parameters of MLCC and cannot fully evaluate its aging status. For example, some methods can only measure changes in capacitance, but ignore changes in other important parameters such as equivalent series resistance and insulation resistance. In addition, there is currently a lack of an aging test technology that comprehensively evaluates voltage dependence, frequency stability, and environmental adaptability.

[0003] In view of the above problems, effective technical solutions are urgently needed. Summary of the invention

[0004] The purpose of the present application is to provide an MLCC aging test method, system and medium, which processes the aging test results of the MLCC to obtain a withstand voltage performance evaluation index, a frequency stability evaluation index and an environmental adaptability evaluation index, and then processes to obtain a reliability evaluation index, and makes a product quality judgment based on the reliability evaluation index. The process parameters of the MLCC are optimized based on the characteristic parameter change curves of the MLCC under different aging test environments, so as to achieve the purpose of discovering potential quality problems through aging testing.

[0005] The present application also provides an MLCC aging test method, comprising the following steps: Perform aging tests on MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data, and environmental adaptability test data; Processing the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing the frequency stability test data to obtain a frequency stability evaluation index; The environmental adaptability test data is processed to obtain an environmental adaptability evaluation index, the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index are processed to obtain a reliability evaluation index, and product quality is determined based on the reliability evaluation index.

[0006] Optionally, in the MLCC aging test method described in the present application, the aging test is performed on the MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data and environmental adaptability test data, including: The withstand voltage performance test data includes breakdown voltage value, insulation resistance change value and dielectric breakdown degree data; The frequency stability test data includes capacity change value, phase angle change value, ESR change amount data and ESL change amount data; The environmental adaptability test data includes capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data.

[0007] Optionally, in the MLCC aging test method described in the present application, the processing according to the withstand voltage performance test data to obtain the withstand voltage performance evaluation index, and the processing according to the frequency stability test data to obtain the frequency stability evaluation index include: Processing the breakdown voltage value, insulation resistance change value and dielectric breakdown degree data to obtain a withstand voltage performance evaluation index; The frequency stability evaluation index is obtained by processing the capacity change value, the phase angle change value, the ESR change amount data and the ESL change amount data.

[0008] Optionally, in the MLCC aging test method described in the present application, the environmental adaptability test data is processed to obtain an environmental adaptability evaluation index, the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index are processed to obtain a reliability evaluation index, and product quality determination is performed according to the reliability evaluation index, including: Calculating according to the capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data to obtain an environmental adaptability assessment index; Calculating according to the environmental adaptability evaluation index, the voltage resistance performance evaluation index and the frequency stability evaluation index to obtain a reliability evaluation index; The reliability evaluation index is compared with a preset reliability evaluation index threshold. If the threshold comparison result does not meet the preset threshold comparison result requirement, the product quality is judged as unqualified.

[0009] Optionally, the MLCC aging test method described in the present application further includes: Obtain characteristic parameter data of MLCC under different aging test environments, including capacitance value, capacitance loss factor value and insulation resistance value; Draw characteristic parameter variation curves according to the capacitance value, capacitance loss factor value and insulation resistance value, including capacitance value variation curve, capacitance loss factor variation curve and insulation resistance variation curve; Recognize characteristic points of the capacitance change curve, the capacitance loss factor change curve, and the insulation resistance change curve, respectively, and obtain characteristic parameter change rates corresponding to the characteristic points, including the capacitance change rate, the capacitance loss factor change rate, and the insulation resistance change rate; The capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate are respectively compared with a preset capacitance value change rate threshold, a capacitance loss factor change rate threshold, and an insulation resistance change rate threshold to obtain a threshold comparison result; The characteristic parameter change curve corresponding to the characteristic parameter change rate whose threshold comparison result does not meet the preset threshold comparison result requirement is marked.

[0010] Optionally, the MLCC aging test method described in the present application further includes: The characteristic parameter data, characteristic parameter change rate and corresponding test environment data corresponding to the marked characteristic parameter change curve are input into the preset capacitor process traceability detection platform for identification to obtain the traceability process parameter type data; Obtain historical aging test record data of MLCC, extract historical characteristic parameter data according to the historical aging test record data and draw a historical characteristic parameter change curve, wherein the historical characteristic parameter data includes historical capacitance value, historical capacitance loss factor value and historical insulation resistance value; The historical characteristic parameter change rate of each characteristic point in the historical characteristic parameter change curve is obtained, including the historical capacitance value change rate, the historical capacitance loss factor change rate and the historical insulation resistance change rate.

[0011] Optionally, the MLCC aging test method described in the present application further includes: Extracting historical process parameter data corresponding to the traceability process parameter type data according to the historical aging test record data; Performing model training according to the historical process parameter data in combination with the historical capacitance value, the historical capacitance loss factor value, the historical insulation resistance value, and the historical capacitance value change rate, the historical capacitance loss factor change rate, and the historical insulation resistance change rate to obtain a process parameter adaptation model; Inputting the capacitance value, capacitance loss factor value, insulation resistance value, and the capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate into the process parameter adaptation model for processing to obtain adaptation process parameter data; The process parameters of the MLCC are optimized according to the adaptation process parameter data and the traceability process parameter type data.

[0012] In a second aspect, the present application provides an MLCC aging test system, the system comprising: a memory and a processor, the memory storing a program of an MLCC aging test method, and the program of the MLCC aging test method implementing the following steps when executed by the processor: Perform aging tests on MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data, and environmental adaptability test data; Processing the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing the frequency stability test data to obtain a frequency stability evaluation index; The environmental adaptability test data is processed to obtain an environmental adaptability evaluation index, the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index are processed to obtain a reliability evaluation index, and product quality is determined based on the reliability evaluation index.

[0013] Optionally, in the MLCC aging test system described in the present application, the aging test is performed on the MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data and environmental adaptability test data, including: The withstand voltage performance test data includes breakdown voltage value, insulation resistance change value and dielectric breakdown degree data; The frequency stability test data includes capacity change value, phase angle change value, ESR change amount data and ESL change amount data; The environmental adaptability test data includes capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data.

[0014] In a third aspect, the present application also provides a computer-readable storage medium, in which an MLCC aging test method program is stored. When the MLCC aging test method program is executed by a processor, the steps of the MLCC aging test method as described in any one of the above items are implemented.

[0015] From the above, it can be seen that the present application provides an MLCC aging test method, system and medium, which obtain the voltage resistance performance evaluation index, frequency stability evaluation index and environmental adaptability evaluation index by processing the aging test results of the MLCC, and then obtain the reliability evaluation index, and make product quality judgments based on the reliability evaluation index, and optimize the process parameters of the MLCC based on the characteristic parameter change curves of the MLCC under different aging test environments, so as to achieve the purpose of discovering potential quality problems through aging testing.

[0016] Other features and advantages of the present application will be described in the following description, and partly become apparent from the description, or understood by practicing the embodiments of the present application. The purpose and other advantages of the present application can be realized and obtained by the structures specifically pointed out in the written description and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 A flow chart of the MLCC aging test method provided in an embodiment of the present application; Figure 2 A flow chart of obtaining a withstand voltage performance evaluation index and a frequency stability evaluation index for an MLCC aging test method provided in an embodiment of the present application; Figure 3 A flow chart of obtaining a reliability evaluation index for an MLCC aging test method provided in an embodiment of the present application; Figure 4 A flow chart of obtaining adaptation process parameter data for the MLCC aging test method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0019] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0020] It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. At the same time, in the description of this application, the terms "first", "second", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0021] Please refer to Figure 1 , Figure 1 Flow chart of the MLCC aging test method in some embodiments of the present application. The MLCC aging test method is used in terminal equipment, such as computers, mobile phone terminals, etc. The MLCC aging test method includes the following steps: S11. Perform an aging test on the MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data, and environmental adaptability test data; S12, processing according to the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing according to the frequency stability test data to obtain a frequency stability evaluation index; S13. Process the environmental adaptability test data to obtain an environmental adaptability evaluation index, process the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index to obtain a reliability evaluation index, and make a product quality judgment based on the reliability evaluation index.

[0022] It should be noted that the voltage resistance performance evaluation index, frequency stability evaluation index and environmental adaptability evaluation index are obtained by processing the aging test results of MLCC, and then the reliability evaluation index is obtained, and the product quality is judged based on the reliability evaluation index.

[0023] According to an embodiment of the present invention, the aging test is performed on the MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data and environmental adaptability test data, including: The withstand voltage performance test data includes breakdown voltage value, insulation resistance change value and dielectric breakdown degree data; The frequency stability test data includes capacity change value, phase angle change value, ESR change amount data and ESL change amount data; The environmental adaptability test data includes capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data.

[0024] It should be noted that the withstand voltage test is based on the insulation characteristics of the capacitor. When voltage is applied across the capacitor, the capacitor's dielectric will withstand the electric field strength. If the electric field strength exceeds the dielectric's tolerance, breakdown will occur, causing damage to the capacitor. The frequency stability test measures the capacitance of the capacitor at different frequencies to evaluate its frequency response and possible parasitic effects. The main evaluation parameters include capacitance change value, phase angle change value, ESR change data, and ESL change data. The capacitance change value represents the trend of the capacitor's capacitance changing with frequency. Ideally, the capacitance of the capacitor should remain constant at low frequencies, and the phase angle of the capacitor changes with frequency. The phase angle of an ideal capacitor should be close to -90 degrees. The equivalent series resistance (ESR) and equivalent series inductance (ESL) can be used to evaluate parasitic effects. ESR represents the resistive loss inside the capacitor, and ESL represents the inductive effect inside the capacitor. In high-frequency circuits, ESL will produce additional impedance, affecting the frequency response and impedance characteristics of the capacitor. The environmental adaptability test of MLCC is to ensure that the capacitor can work normally and maintain stable performance under various environmental conditions. It mainly includes high temperature and high humidity test, hot and cold shock test, etc. The capacitor will have leakage, mechanical damage and thermal stress damage in this environment. The capacitance loss factor is a parameter to measure the energy loss capacity of the capacitor. The lower the capacitance loss factor, the smaller the loss of the capacitor and the higher the efficiency. Therefore, the aging test of MLCC requires voltage resistance test, frequency stability test and environmental adaptability test.

[0025] Please refer to Figure 2 , Figure 2 The flowchart of obtaining the withstand voltage performance evaluation index and the frequency stability evaluation index of the MLCC aging test method in some embodiments of the present application. According to the embodiment of the present invention, the withstand voltage performance evaluation index is obtained by processing the withstand voltage performance test data, and the frequency stability evaluation index is obtained by processing the frequency stability test data, including: S21, processing the breakdown voltage value, insulation resistance change value and dielectric breakdown degree data to obtain a withstand voltage performance evaluation index; S22. Process the capacity change value, the phase angle change value, the ESR change data, and the ESL change data to obtain a frequency stability evaluation index.

[0026] It should be noted that the calculation formula of the pressure resistance performance evaluation index is: ; in, Is the pressure resistance performance evaluation index, is the breakdown voltage value, is the insulation resistance change value, is the dielectric breakdown degree data, , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database); The calculation formula of the frequency stability evaluation index is: ; in, is the frequency stability evaluation index, is the capacity change value, is the phase angle change value, is the ESR variation data, is the ESL variation data, , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database).

[0027] Please refer to Figure 3 , Figure 3 It is a flow chart of obtaining a reliability evaluation index of the MLCC aging test method in some embodiments of the present application. According to an embodiment of the present invention, the environmental adaptability test data is processed to obtain an environmental adaptability evaluation index, the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index are processed to obtain a reliability evaluation index, and product quality is determined according to the reliability evaluation index, including: S31, calculating according to the capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data to obtain an environmental adaptability assessment index; S32, calculating according to the environmental adaptability evaluation index, the voltage resistance performance evaluation index and the frequency stability evaluation index to obtain a reliability evaluation index; S33, comparing the reliability evaluation index with a preset reliability evaluation index threshold, and if the threshold comparison result does not meet the preset threshold comparison result requirement, determining that the product quality is unqualified.

[0028] It should be noted that the calculation formula of the environmental adaptability assessment index is: ; in, is the environmental adaptability assessment index, is the capacitance loss factor data, is the leakage current data, is the conductivity change data, is the physical damage degree data, is the degree of thermal stress damage data, , , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database); The calculation formula of the reliability evaluation index is: ; in, is the reliability evaluation index, is the environmental adaptability assessment index, Is the pressure resistance performance evaluation index, is the frequency stability evaluation index, , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database).

[0029] According to an embodiment of the present invention, it also includes: Obtain characteristic parameter data of MLCC under different aging test environments, including capacitance value, capacitance loss factor value and insulation resistance value; Draw characteristic parameter variation curves according to the capacitance value, capacitance loss factor value and insulation resistance value, including capacitance value variation curve, capacitance loss factor variation curve and insulation resistance variation curve; Recognize characteristic points of the capacitance change curve, the capacitance loss factor change curve, and the insulation resistance change curve, respectively, and obtain characteristic parameter change rates corresponding to the characteristic points, including the capacitance change rate, the capacitance loss factor change rate, and the insulation resistance change rate; The capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate are respectively compared with a preset capacitance value change rate threshold, a capacitance loss factor change rate threshold, and an insulation resistance change rate threshold to obtain a threshold comparison result; The characteristic parameter change curve corresponding to the characteristic parameter change rate whose threshold comparison result does not meet the preset threshold comparison result requirement is marked.

[0030] It should be noted that by testing MLCC under different aging environments, the characteristic parameter curve with abnormal changes is determined by identifying the abnormal characteristic points of the characteristic parameter curve, so as to facilitate subsequent problem tracing.

[0031] According to an embodiment of the present invention, it also includes: The characteristic parameter data, characteristic parameter change rate and corresponding test environment data corresponding to the marked characteristic parameter change curve are input into the preset capacitor process traceability detection platform for identification to obtain the traceability process parameter type data; Obtain historical aging test record data of MLCC, extract historical characteristic parameter data according to the historical aging test record data and draw a historical characteristic parameter change curve, wherein the historical characteristic parameter data includes historical capacitance value, historical capacitance loss factor value and historical insulation resistance value; The historical characteristic parameter change rate of each characteristic point in the historical characteristic parameter change curve is obtained, including the historical capacitance value change rate, the historical capacitance loss factor change rate and the historical insulation resistance change rate.

[0032] It should be noted that the type of process parameters that need to be adjusted is determined based on the abnormal characteristic parameters, the abnormal characteristic parameter change rate and the test environment.

[0033] Please refer to Figure 4 , Figure 4 It is a flow chart of obtaining the adaptation process parameter data of the MLCC aging test method in some embodiments of the present application. According to an embodiment of the present invention, it also includes: Extracting historical process parameter data corresponding to the traceability process parameter type data according to the historical aging test record data; Performing model training according to the historical process parameter data in combination with the historical capacitance value, the historical capacitance loss factor value, the historical insulation resistance value, and the historical capacitance value change rate, the historical capacitance loss factor change rate, and the historical insulation resistance change rate to obtain a process parameter adaptation model; Inputting the capacitance value, capacitance loss factor value, insulation resistance value, and the capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate into the process parameter adaptation model for processing to obtain adaptation process parameter data; The process parameters of the MLCC are optimized according to the adaptation process parameter data and the traceability process parameter type data.

[0034] It should be noted that the model is trained according to the historical process parameter data in combination with the historical characteristic parameters and the historical characteristic parameter change rate to obtain the process parameter adaptation model. The preset process parameter adaptation model is a model obtained by training with the process parameter data, characteristic parameters, characteristic parameter change rate and adaptation process parameter data of a large number of historical samples. The relevant information can be input for processing to obtain the corresponding output adaptation process parameter data.

[0035] The present invention also discloses an MLCC aging test system, comprising a memory and a processor, wherein the memory stores an MLCC aging test method program, and when the MLCC aging test method program is executed by the processor, the following steps are implemented: Perform aging tests on MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data, and environmental adaptability test data; Processing the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing the frequency stability test data to obtain a frequency stability evaluation index; The environmental adaptability test data is processed to obtain an environmental adaptability evaluation index, the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index are processed to obtain a reliability evaluation index, and product quality is determined based on the reliability evaluation index.

[0036] It should be noted that the voltage resistance performance evaluation index, frequency stability evaluation index and environmental adaptability evaluation index are obtained by processing the aging test results of MLCC, and then the reliability evaluation index is obtained, and the product quality is judged based on the reliability evaluation index.

[0037] According to an embodiment of the present invention, the aging test is performed on the MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data and environmental adaptability test data, including: The withstand voltage performance test data includes breakdown voltage value, insulation resistance change value and dielectric breakdown degree data; The frequency stability test data includes capacity change value, phase angle change value, ESR change amount data and ESL change amount data; The environmental adaptability test data includes capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data.

[0038] It should be noted that the withstand voltage test is based on the insulation characteristics of the capacitor. When voltage is applied across the capacitor, the capacitor's dielectric will withstand the electric field strength. If the electric field strength exceeds the dielectric's tolerance, breakdown will occur, causing damage to the capacitor. The frequency stability test measures the capacitance of the capacitor at different frequencies to evaluate its frequency response and possible parasitic effects. The main evaluation parameters include capacitance change value, phase angle change value, ESR change data, and ESL change data. The capacitance change value represents the trend of the capacitor's capacitance changing with frequency. Ideally, the capacitance of the capacitor should remain constant at low frequencies, and the phase angle of the capacitor changes with frequency. The phase angle of an ideal capacitor should be close to -90 degrees. The equivalent series resistance (ESR) and equivalent series inductance (ESL) can be used to evaluate parasitic effects. ESR represents the resistive loss inside the capacitor, and ESL represents the inductive effect inside the capacitor. In high-frequency circuits, ESL will produce additional impedance, affecting the frequency response and impedance characteristics of the capacitor. The environmental adaptability test of MLCC is to ensure that the capacitor can work normally and maintain stable performance under various environmental conditions. It mainly includes high temperature and high humidity test, hot and cold shock test, etc. The capacitor will have leakage, mechanical damage and thermal stress damage in this environment. The capacitance loss factor is a parameter to measure the energy loss capacity of the capacitor. The lower the capacitance loss factor, the smaller the loss of the capacitor and the higher the efficiency. Therefore, the aging test of MLCC requires voltage resistance test, frequency stability test and environmental adaptability test.

[0039] According to an embodiment of the present invention, the step of processing the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing the frequency stability test data to obtain a frequency stability evaluation index includes: Processing the breakdown voltage value, insulation resistance change value and dielectric breakdown degree data to obtain a withstand voltage performance evaluation index; The frequency stability evaluation index is obtained by processing the capacity change value, the phase angle change value, the ESR change amount data and the ESL change amount data.

[0040] It should be noted that the calculation formula of the pressure resistance performance evaluation index is: ; in, Is the pressure resistance performance evaluation index, is the breakdown voltage value, is the insulation resistance change value, is the dielectric breakdown degree data, , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database); The calculation formula of the frequency stability evaluation index is: ; in, is the frequency stability evaluation index, is the capacity change value, is the phase angle change value, is the ESR variation data, is the ESL variation data, , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database).

[0041] According to an embodiment of the present invention, the processing according to the environmental adaptability test data to obtain an environmental adaptability evaluation index, the processing according to the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index to obtain a reliability evaluation index, and the product quality determination according to the reliability evaluation index includes: Calculating according to the capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data to obtain an environmental adaptability assessment index; Calculating according to the environmental adaptability evaluation index, the voltage resistance performance evaluation index and the frequency stability evaluation index to obtain a reliability evaluation index; The reliability evaluation index is compared with a preset reliability evaluation index threshold. If the threshold comparison result does not meet the preset threshold comparison result requirement, the product quality is judged as unqualified.

[0042] It should be noted that the calculation formula of the environmental adaptability assessment index is: ; in, is the environmental adaptability assessment index, is the capacitance loss factor data, is the leakage current data, is the conductivity change data, is the physical damage degree data, is the degree of thermal stress damage data, , , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database); The calculation formula of the reliability evaluation index is: ; in, is the reliability evaluation index, is the environmental adaptability assessment index, Is the pressure resistance performance evaluation index, is the frequency stability evaluation index, , and is the preset characteristic coefficient (which can be obtained by querying the preset MLCC aging test platform database).

[0043] According to an embodiment of the present invention, it also includes: Obtain characteristic parameter data of MLCC under different aging test environments, including capacitance value, capacitance loss factor value and insulation resistance value; Draw characteristic parameter variation curves according to the capacitance value, capacitance loss factor value and insulation resistance value, including capacitance value variation curve, capacitance loss factor variation curve and insulation resistance variation curve; Recognize characteristic points of the capacitance change curve, the capacitance loss factor change curve, and the insulation resistance change curve, respectively, and obtain characteristic parameter change rates corresponding to the characteristic points, including the capacitance change rate, the capacitance loss factor change rate, and the insulation resistance change rate; The capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate are respectively compared with a preset capacitance value change rate threshold, a capacitance loss factor change rate threshold, and an insulation resistance change rate threshold to obtain a threshold comparison result; The characteristic parameter change curve corresponding to the characteristic parameter change rate whose threshold comparison result does not meet the preset threshold comparison result requirement is marked.

[0044] It should be noted that by testing MLCC under different aging environments, the characteristic parameter curve with abnormal changes is determined by identifying the abnormal characteristic points of the characteristic parameter curve, so as to facilitate subsequent problem tracing.

[0045] According to an embodiment of the present invention, it also includes: The characteristic parameter data, characteristic parameter change rate and corresponding test environment data corresponding to the marked characteristic parameter change curve are input into the preset capacitor process traceability detection platform for identification to obtain the traceability process parameter type data; Obtain historical aging test record data of MLCC, extract historical characteristic parameter data according to the historical aging test record data and draw a historical characteristic parameter change curve, wherein the historical characteristic parameter data includes historical capacitance value, historical capacitance loss factor value and historical insulation resistance value; The historical characteristic parameter change rate of each characteristic point in the historical characteristic parameter change curve is obtained, including the historical capacitance value change rate, the historical capacitance loss factor change rate and the historical insulation resistance change rate.

[0046] It should be noted that the type of process parameters that need to be adjusted is determined based on the abnormal characteristic parameters, the abnormal characteristic parameter change rate and the test environment.

[0047] According to an embodiment of the present invention, it also includes: Extracting historical process parameter data corresponding to the traceability process parameter type data according to the historical aging test record data; Performing model training according to the historical process parameter data in combination with the historical capacitance value, the historical capacitance loss factor value, the historical insulation resistance value, and the historical capacitance value change rate, the historical capacitance loss factor change rate, and the historical insulation resistance change rate to obtain a process parameter adaptation model; Inputting the capacitance value, capacitance loss factor value, insulation resistance value, and the capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate into the process parameter adaptation model for processing to obtain adaptation process parameter data; The process parameters of the MLCC are optimized according to the adaptation process parameter data and the traceability process parameter type data.

[0048] It should be noted that the model is trained according to the historical process parameter data in combination with the historical characteristic parameters and the historical characteristic parameter change rate to obtain the process parameter adaptation model. The preset process parameter adaptation model is a model obtained by training with the process parameter data, characteristic parameters, characteristic parameter change rate and adaptation process parameter data of a large number of historical samples. The relevant information can be input for processing to obtain the corresponding output adaptation process parameter data.

[0049] A third aspect of the present invention provides a readable storage medium, in which an MLCC aging test method program is stored. When the MLCC aging test method program is executed by a processor, the steps of the MLCC aging test method as described in any one of the above items are implemented.

[0050] The present invention discloses an MLCC aging test method, system and medium, which obtain a withstand voltage performance evaluation index, a frequency stability evaluation index and an environmental adaptability evaluation index by processing the MLCC aging test results, and then obtain a reliability evaluation index, perform product quality judgment based on the reliability evaluation index, and optimize the process parameters of the MLCC based on the characteristic parameter change curves of the MLCC under different aging test environments, so as to achieve the purpose of discovering potential quality problems through aging testing.

[0051] In the several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as: multiple units or components can be combined, or can be integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the components shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0052] The units described above as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units; they may be located in one place or distributed on multiple network units; some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0053] In addition, all functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may be separately used as a unit, or two or more units may be integrated into one unit; the above-mentioned integrated units may be implemented in the form of hardware or in the form of hardware plus software functional units.

[0054] Those skilled in the art can understand that: all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions, the aforementioned program can be stored in a readable storage medium, and when the program is executed, it executes the steps of the above method embodiments; and the aforementioned storage medium includes: mobile storage devices, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), disks or optical disks, and other media that can store program codes.

[0055] Alternatively, if the above-mentioned integrated unit of the present invention is implemented in the form of a software function module and sold or used as an independent product, it can also be stored in a readable storage medium. Based on this understanding, the technical solution of the embodiment of the present invention can be essentially or partly reflected in the form of a software product that contributes to the prior art. The software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as mobile storage devices, ROM, RAM, magnetic disks or optical disks.

Claims

1. A MLCC aging test method, characterized in that: The following steps are involved: Perform aging tests on MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data, and environmental adaptability test data; Processing the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing the frequency stability test data to obtain a frequency stability evaluation index; The environmental adaptability test data is processed to obtain an environmental adaptability evaluation index, the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index are processed to obtain a reliability evaluation index, and product quality is determined based on the reliability evaluation index.

2. The MLCC aging test method according to claim 1, characterized in that: The aging test of the MLCC is performed to obtain test result data, including withstand voltage performance test data, frequency stability test data and environmental adaptability test data, including: The withstand voltage performance test data includes breakdown voltage value, insulation resistance change value and dielectric breakdown degree data; The frequency stability test data includes capacity change value, phase angle change value, ESR change amount data and ESL change amount data; The environmental adaptability test data includes capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data.

3. The MLCC aging test method according to claim 2, characterized in that: The step of processing the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing the frequency stability test data to obtain a frequency stability evaluation index includes: Processing is performed according to the breakdown voltage value, insulation resistance change value and dielectric breakdown degree data to obtain a withstand voltage performance evaluation index; The frequency stability evaluation index is obtained by processing the capacity change value, the phase angle change value, the ESR change amount data and the ESL change amount data.

4. The MLCC aging test method according to claim 3, characterized in that: The step of processing the environmental adaptability test data to obtain an environmental adaptability evaluation index, processing the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index to obtain a reliability evaluation index, and determining product quality based on the reliability evaluation index includes: Calculating according to the capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data to obtain an environmental adaptability assessment index; Calculating according to the environmental adaptability evaluation index, the voltage resistance performance evaluation index and the frequency stability evaluation index to obtain a reliability evaluation index; The reliability evaluation index is compared with a preset reliability evaluation index threshold. If the threshold comparison result does not meet the preset threshold comparison result requirement, the product quality is judged as unqualified.

5. The MLCC aging test method according to claim 4, characterized in that: Also includes: Obtain characteristic parameter data of MLCC under different aging test environments, including capacitance value, capacitance loss factor value and insulation resistance value; Draw characteristic parameter variation curves according to the capacitance value, capacitance loss factor value and insulation resistance value, including capacitance value variation curve, capacitance loss factor variation curve and insulation resistance variation curve; Recognize characteristic points of the capacitance change curve, the capacitance loss factor change curve, and the insulation resistance change curve, respectively, and obtain characteristic parameter change rates corresponding to the characteristic points, including the capacitance change rate, the capacitance loss factor change rate, and the insulation resistance change rate; The capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate are respectively compared with a preset capacitance value change rate threshold, a capacitance loss factor change rate threshold, and an insulation resistance change rate threshold to obtain a threshold comparison result; The characteristic parameter change curve corresponding to the characteristic parameter change rate for which the threshold comparison result does not meet the preset threshold comparison result requirement is marked.

6. The MLCC aging test method according to claim 5, characterized in that: Also includes: The characteristic parameter data, characteristic parameter change rate and corresponding test environment data corresponding to the marked characteristic parameter change curve are input into the preset capacitor process traceability detection platform for identification to obtain the traceability process parameter type data; Obtain historical aging test record data of MLCC, extract historical characteristic parameter data according to the historical aging test record data and draw a historical characteristic parameter change curve, wherein the historical characteristic parameter data includes historical capacitance value, historical capacitance loss factor value and historical insulation resistance value; The historical characteristic parameter change rate of each characteristic point in the historical characteristic parameter change curve is obtained, including the historical capacitance value change rate, the historical capacitance loss factor change rate and the historical insulation resistance change rate.

7. The MLCC aging test method according to claim 6, characterized in that: Also includes: Extracting historical process parameter data corresponding to the traceability process parameter type data according to the historical aging test record data; Performing model training according to the historical process parameter data in combination with the historical capacitance value, the historical capacitance loss factor value, the historical insulation resistance value, and the historical capacitance value change rate, the historical capacitance loss factor change rate, and the historical insulation resistance change rate to obtain a process parameter adaptation model; Inputting the capacitance value, capacitance loss factor value, insulation resistance value, and the capacitance value change rate, capacitance loss factor change rate, and insulation resistance change rate into the process parameter adaptation model for processing to obtain adaptation process parameter data; The process parameters of the MLCC are optimized according to the adaptation process parameter data and the traceability process parameter type data.

8. An MLCC aging test system, characterized in that: The invention comprises a memory and a processor, wherein the memory stores a program of an MLCC aging test method, and when the program of the MLCC aging test method is executed by the processor, the following steps are implemented: Perform aging tests on MLCC to obtain test result data, including withstand voltage performance test data, frequency stability test data, and environmental adaptability test data; Processing the withstand voltage performance test data to obtain a withstand voltage performance evaluation index, and processing the frequency stability test data to obtain a frequency stability evaluation index; The environmental adaptability test data is processed to obtain an environmental adaptability evaluation index, the environmental adaptability evaluation index and the withstand voltage performance evaluation index and the frequency stability evaluation index are processed to obtain a reliability evaluation index, and product quality is determined based on the reliability evaluation index.

9. The MLCC aging test system according to claim 8, characterized in that: The aging test of the MLCC is performed to obtain test result data, including withstand voltage performance test data, frequency stability test data and environmental adaptability test data, including: The withstand voltage performance test data includes breakdown voltage value, insulation resistance change value and dielectric breakdown degree data; The frequency stability test data includes capacity change value, phase angle change value, ESR change amount data and ESL change amount data; The environmental adaptability test data includes capacitance loss factor data, leakage current data, conductivity change data, physical damage degree data and thermal stress damage degree data.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores an MLCC aging test program, and when the MLCC aging test program is executed by a processor, the steps of the MLCC aging test method according to any one of claims 1 to 7 are implemented.

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