Portable multi-pin integrated circuit OPEN and SHORT testing device

Abstract

The invention provides a portable multi-pin integrated circuit OPEN and SHORT testing device. The portable multi-pin integrated circuit OPEN and SHORT testing device comprises a bias module, a current limiting module, a judgment module and a circuit board, the bias module, the current limiting module and the judgment module are all integrated on the circuit board; the bias module comprises a first power input end, and the output end of the first power input end is electrically connected with a voltage stabilizing chip. According to the portable multi-pin integrated circuit OPEN and SHORT testing device provided by the invention, through mutual cooperation of the bias module, the current limiting module, the judgment module and the circuit board, when the portable multi-pin integrated circuit OPEN and SHORT testing device is used, a to-be-tested chip is connected to a wild port seat in the middle of the testing device through a special manual testing seat, and GND and PIN of the to-be-tested chip are set through jumpers on the left side and the right side; the integrated chip testing device is simple in operation, low in cost and convenient for a user to carry, the number of pins of the tested integrated chip can be set according to requirements, and testing is performed simultaneously, so that the testing efficiency is improved.

Description

Technical Field

[0001] The invention relates to the technical field of integrated circuits, and in particular to a portable multi-pin integrated circuit OPEN and SHORT testing device. Background Art

[0002] In the integrated circuit electrical parameter test, O / S test (OPEN / SHORT TEST) is the most basic test item. Generally speaking, each PIN of the chip has a diode to GND. O / S test is to determine whether the internal circuit connection of the chip is normal by testing the diode of each PIN to GND. The method is to apply 100uA~1mA current from GND to each PIN, measure the voltage (usually around 0.7V), set the voltage range (0.3V~2V), greater than 2V is OPEN, less than 0.3V is SHORT.

[0003] Conventional O / S testing usually uses an automatic test system or a multimeter. The automatic test system is a large device with high price and is also limited by factors such as application scenarios. The multimeter can only test a single PIN. When encountering a multi-pin chip, the multimeter test is time-consuming and laborious.

[0004] Therefore, it is necessary to provide a portable multi-pin integrated circuit OPEN, SHORT test device to solve the above technical problems. Summary of the invention

[0005] The present invention provides a portable multi-pin integrated circuit OPEN and SHORT test device, which solves the problems of high test cost, large volume and inconvenience in carrying, and low efficiency of only being able to test a single PIN at a time.

[0006] In order to solve the above technical problems, the present invention provides a portable multi-pin integrated circuit OPEN, SHORT test device, comprising:

[0007] A bias module, a current limiting module, a determination module and a circuit board;

[0008] The bias module, the current limiting module and the determination module are all integrated on the circuit board;

[0009] The bias module includes a first power input terminal, an output terminal of the first power input terminal is electrically connected to a voltage stabilizing chip, a ground terminal of the voltage stabilizing chip is electrically connected to a first ground port, an input capacitor is electrically connected between the first power input terminal and the first ground port, an output capacitor is electrically connected between the output terminal of the voltage stabilizing chip and the first ground port, and a plurality of first resistors are electrically connected between the output terminal of the voltage stabilizing chip and the first ground port;

[0010] The current limiting module includes a second power input terminal, an output terminal of the second power input terminal is electrically connected to a diode to be tested, one end of the diode to be tested is electrically connected to an operational amplifier, a voltage measurement point is electrically connected between the diode to be tested and the operational amplifier, a third pin of the operational amplifier is electrically connected to a second resistor, and a first pin of the operational amplifier is electrically connected to a second ground port;

[0011] The determination module includes a comparator, a first pin of the comparator is electrically connected to a third resistor, one end of the third resistor is electrically connected to a first LED, one end of the first LED is electrically connected to a third power input terminal, a fourth pin of the comparator is electrically connected to a third ground port, a seventh pin of the comparator is electrically connected to a fourth resistor, and one end of the fourth resistor is electrically connected to a second LED.

[0012] Preferably, the voltage stabilizing chip sets a stable input voltage of 6V, and sets a bias voltage range of the determination module through a plurality of the first resistors.

[0013] Preferably, the input voltage value of the second power input terminal is 6V, and the input voltage value of the third power input terminal is 6V.

[0014] Preferably, a protective mechanism is provided on the outer side of the circuit board, and the protective structure includes a protective shell, a surround is fixedly installed on the top of the protective shell, a sealing gasket is fixedly installed on the top of the surround, a card interface is provided at one end of the protective shell, a mounting groove is provided on the top of the protective shell, a cover plate is rotatably connected to the outer side of the surround, and a limiting component is fixedly installed on the top of the cover plate.

[0015] Preferably, a handle is fixedly mounted on one end of the protective shell 4, a charging port is provided on one side of the handle, the charging port is fixedly mounted on one end of the protective shell, and a battery compartment is fixedly mounted on the bottom of the protective shell.

[0016] Preferably, the battery compartment 43 is electrically connected to the charging port 4, and rubber pads are fixedly installed around the bottom of the protective shell.

[0017] Preferably, fixing columns are fixedly installed around the bottom of the inner side surface of the installation groove, a threaded rod is fixedly installed on the top of the fixing column, a first buffer pad is sleeved on the outer side surface of the threaded rod, the circuit board is arranged on the outer side surface of the threaded rod, the circuit board is located on the top of the first buffer pad, a threaded cover is threadedly connected to the outer side surface of the threaded rod, a second buffer pad is fixedly installed on the bottom of the threaded cover, and the bottom of the second buffer pad abuts against the top of the circuit board.

[0018] Preferably, the limiting assembly includes a fixed seat, a snap-in plate, a slide groove, a limiting plate, a sliding rod and a spring, the fixed seat is fixedly installed on the top of the cover plate, the snap-in plate is slidably connected to the inner side surface of the fixed seat, the slide groove is opened inside the snap-in plate, the limiting plate is slidably connected to the inner side surface of the slide groove, the two ends of the limiting plate are respectively fixedly installed on both sides of the inner side surface of the fixed seat, the sliding rod is fixedly installed on the inner side surface of the slide groove, the sliding rod is slidably connected to the inside of the limiting plate, the spring is sleeved on the outer side surface of the slide rod, and the spring is set at the bottom of the limiting plate.

[0019] Preferably, a groove is provided at the bottom of the clamping plate, and a push switch is fixedly mounted on the inner side of the groove.

[0020] Preferably, a lighting lamp is fixedly mounted on the bottom of the push switch.

[0021] Compared with the related art, the portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention has the following beneficial effects:

[0022] The invention provides a portable multi-pin integrated circuit OPEN and SHORT test device. A bias module, a current limiting module, a determination module and a circuit board cooperate with each other. When in use, a chip to be tested is connected to a Noguchi seat in the middle of the test device by a special hand test seat, and the GND and the PIN to be tested of the chip to be tested are set by jumpers on the left and right sides. The operation is simple, the cost is low, and the user is convenient to carry. Moreover, the number of the pins of the test integrated chip can be set according to the demand, and the test can be performed simultaneously, thereby increasing the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A schematic diagram of a first embodiment of a portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention;

[0024] Figure 2 for Figure 1 The core circuit diagram shown;

[0025] Figure 3 for Figure 2 Bias module circuit diagram shown;

[0026] Figure 4 for Figure 2 The current limiting module circuit diagram shown;

[0027] Figure 5 for Figure 2 The circuit diagram of the determination module shown;

[0028] Figure 6 for Figure 1The finished product style picture shown;

[0029] Figure 7 A schematic diagram of a second embodiment of a portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention;

[0030] Figure 8 for Figure 7 Another perspective structural schematic diagram shown;

[0031] Fig. 9 for Figure 8 Another perspective structural schematic diagram shown;

[0032] Fig.10 for Figure 8 The schematic diagram of the cross-sectional structure of the limiting component shown;

[0033] Fig.11 for Figure 8 An enlarged schematic diagram of part A is shown;

[0034] Fig.12 This is a schematic diagram of a third embodiment of a portable multi-pin integrated circuit OPEN and SHORT testing device provided by the present invention.

[0035] Numbers in the figure: 1, bias module; 11, voltage regulator chip; 12, first power input terminal; 13, input capacitor; 14, first ground port; 15, output capacitor; 16, first resistor;

[0036] 2. Current limiting module; 21. Operational amplifier; 22. Second resistor; 23. Second grounding port; 24. Voltage measurement point; 25. Diode to be tested; 26. Second power input terminal;

[0037] 3. Determination module; 31. Comparator; 32. Third resistor; 33. First LED; 34. Third power input terminal; 35. Fourth resistor; 36. Second LED; 37. Third ground port;

[0038] 4. Protective shell; 41. Rubber pad; 42. Handle; 43. Battery compartment; 44. Charging port; 45. Mounting slot; 46. Enclosure; 47. Sealing pad; 48. Card interface;

[0039] 5. Cover plate;

[0040] 6. Limiting assembly; 61. Fixing seat; 62. Clamping plate; 63. Sliding groove; 64. Limiting plate; 65. Sliding rod; 66. Spring;

[0041] 7. Fixed column; 71. First buffer pad; 72. Threaded rod; 73. Second buffer pad; 74. Threaded cover;

[0042] 8. Groove; 81. Push switch; 82. Light. DETAILED DESCRIPTION

[0043] The present invention will be further described below in conjunction with the accompanying drawings and implementation modes.

[0044] First embodiment

[0045] Please refer to Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 and Figure 6 ,in, Figure 1 A schematic diagram of a first embodiment of a portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention; Figure 2 for Figure 1 The core circuit diagram shown; Figure 3 for Figure 2 Bias module circuit diagram shown; Figure 4 for Figure 2 The current limiting module circuit diagram shown; Figure 5 for Figure 2 The circuit diagram of the determination module shown; Figure 6 for Figure 1 The finished product style diagram shown. A portable multi-pin integrated circuit OPEN and SHORT test device comprises: a bias module 1, a current limiting module 2, a determination module 3 and a circuit board;

[0046] The bias module 1, the current limiting module 2 and the determination module 3 are all integrated on the circuit board;

[0047] The bias module 1 includes a first power input terminal 12, an output terminal of the first power input terminal 12 is electrically connected to a voltage regulator chip 11, a ground terminal of the voltage regulator chip 11 is electrically connected to a first ground port 14, an input capacitor 13 is electrically connected between the first power input terminal 12 and the first ground port 14, an output capacitor 15 is electrically connected between the output terminal of the voltage regulator chip 11 and the first ground port 14, and a plurality of first resistors 16 are electrically connected between the output terminal of the voltage regulator chip 11 and the first ground port 14;

[0048] The current limiting module 2 includes a second power input terminal 26, an output terminal of the second power input terminal 26 is electrically connected to a diode to be tested 25, one end of the diode to be tested 25 is electrically connected to an operational amplifier 21, a voltage measurement point 24 is electrically connected between the diode to be tested 25 and the operational amplifier 21, a third pin of the operational amplifier 21 is electrically connected to a second resistor 22, and a first pin of the operational amplifier 21 is electrically connected to a second ground port 23;

[0049] The determination module includes a comparator 31, a first pin of the comparator 31 is electrically connected to a third resistor 32, one end of the third resistor 32 is electrically connected to a first LED 33, one end of the first LED 33 is electrically connected to a third power input terminal 34, a fourth pin of the comparator 31 is electrically connected to a third ground port 37, a seventh pin of the comparator 31 is electrically connected to a fourth resistor 35, one end of the fourth resistor 35 is electrically connected to a second LED 36.

[0050] The voltage regulator chip 11 sets the stable input voltage to 6V, and sets the bias voltage range of the determination module 31 through the plurality of first resistors 16 .

[0051] The input voltage value of the second power input terminal 26 is 6V, and the input voltage value of the third power input terminal 34 is 6V.

[0052] like Figure 3 , the working voltage range of the first power input terminal 12 is (8-30V), the stable input voltage 6V is set by the voltage regulator chip 11, the voltage regulator chip 11 is a 78D06 voltage regulator tube, and the plurality of first resistors 16 are respectively R1, R2, R3 and R4, and R1, R2, R3 and R4 set the bias voltage range of the determination module;

[0053] like Figure 4 , connect the 6V output of the voltage regulator chip 11 to the GND terminal of the chip, connect an operational amplifier (LM317) in series at the PIN to be tested of the chip, limit the input current by adjusting the second resistor 22, where the current is set to 250uA, and determine the voltage output Vn = VIN (6V) - U7 (voltage drop of the PIN to be tested);

[0054] like Figure 5 , connect the lower limit of the judgment voltage 4V set by the voltage regulator chip 11 to the positive input of the comparator 31, and the upper limit 5.7V to the negative input of the comparator 31, and the current limiting module outputs the judgment voltage Vn to the negative input and the positive input of the comparator 31 respectively. When the saturation voltage drop of the diode 25 to be tested is (0.3V~2V), the judgment voltage Vn is (4V~5.7V), at this time, the first LED 33 and the second LED 36 are both on, and it is judged as PASS (the internal connection of the chip is normal); when the saturation voltage drop of the diode 25 to be tested is less than 0.3V, the judgment voltage Vn>5.7V, at this time, the first LED 33 is on, and it is judged as SHORT FAIL (there is a short circuit inside the chip); when the saturation voltage drop of the diode 25 to be tested is greater than 2V, the judgment voltage Vn<4V, at this time, the second LED 36 is on, and it is judged as OPEN FAIL (there is an open circuit inside the chip);

[0055] The test device can produce the number of test pins according to personal needs, and each PIN is connected to a current limiting module and a judgment module, such as Figure 6 This device is set to test integrated circuit chips with up to 50 PINs. Connect the chip to be tested to the Noguchi socket in the middle of the test device with a special hand test socket, and set the GND (connected to the inside) and the PIN to be tested (connected to the outside) of the chip to be tested through the jumpers on the left and right sides.

[0056] Compared with the related art, the portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention has the following beneficial effects:

[0057] The bias module 1, the current limiting module 2, the determination module 3 and the circuit board cooperate with each other. When in use, the chip to be tested is connected to the Noguchi seat in the middle of the test device with a special hand test seat, and the GND and the PIN to be tested of the chip to be tested are set by the jumpers on the left and right sides. The operation is simple, the cost is low, and the user is convenient to carry. In addition, the number of pins of the test integrated chip can be set according to the needs, and the test can be performed at the same time, thereby increasing the test efficiency.

[0058] Second embodiment

[0059] Please refer to Figure 7 , Figure 8 , Fig. 9 , Fig.10 and Fig.11 Based on the portable multi-pin integrated circuit OPEN, SHORT test device provided in the first embodiment of the present application, the second embodiment of the present application proposes another portable multi-pin integrated circuit OPEN, SHORT test device. The second embodiment is only a preferred method of the first embodiment, and the implementation of the second embodiment will not affect the independent implementation of the first embodiment.

[0060] Specifically, the second embodiment of the present application provides a portable multi-pin integrated circuit OPEN, SHORT test device. The difference is that, in a portable multi-pin integrated circuit OPEN, SHORT test device, a protective mechanism is provided on the outer side of the circuit board, and the protective structure includes a protective shell 4, a surrounding plate 46 is fixedly installed on the top of the protective shell 4, a sealing gasket 47 is fixedly installed on the top of the surrounding plate 46, a card interface 48 is provided at one end of the protective shell 4, and a mounting groove 45 is provided on the top of the protective shell 4, and the outer side surface of the surrounding plate 46 is rotatably connected to a cover plate 5, and a limiting component 6 is fixedly installed on the top of the cover plate 5.

[0061] A handle 42 is fixedly mounted on one end of the protective shell 4 , a charging port 44 is provided on one side of the handle 42 , and the charging port 44 is fixedly mounted on one end of the protective shell 4 . A battery compartment 43 is fixedly mounted on the bottom of the protective shell 4 .

[0062] The handle 42 is provided to facilitate the user to carry the device by holding the handle 42 during use. The battery compartment 43 is provided with a storage battery, so that the device is not restricted by external power supply during carrying.

[0063] The battery compartment 43 is electrically connected to the charging port 44 , and rubber pads 41 are fixedly installed around the bottom of the protective shell 4 .

[0064] By connecting a charger through the charging port 44 , the battery in the battery compartment 43 can be charged during use. By installing a rubber pad at the bottom of the protective shell 4 , the protective shell 4 can be protected from friction.

[0065] Fixed columns 7 are fixedly installed around the bottom of the inner side surface of the installation groove 45, a threaded rod 72 is fixedly installed on the top of the fixed column 7, the outer side surface of the threaded rod 72 is sleeved with a first buffer pad 71, the circuit board is arranged on the outer side surface of the threaded rod 72, the circuit board is located on the top of the first buffer pad 71, the outer side surface of the threaded rod 72 is threadedly connected with a threaded cover 74, the bottom of the threaded cover 74 is fixedly installed with a second buffer pad 73, and the bottom of the second buffer pad 73 abuts against the top of the circuit board.

[0066] By sleeve-mounting the circuit board on the outer side of the threaded rod 72 and placing the first buffer pad 71 and the second buffer pad 73 at the bottom and the bottom of the circuit board respectively, vibration is generated when the device is carried, thereby protecting the circuit board.

[0067] The limiting assembly 6 includes a fixed seat 61, a clamping plate 62, a slide groove 63, a limiting plate 64, a slide rod 65 and a spring 66. The fixed seat 61 is fixedly installed on the top of the cover plate 5, the clamping plate 62 is slidably connected to the inner side surface of the fixed seat 61, the slide groove 63 is opened inside the clamping plate 62, the limiting plate 64 is slidably connected to the inner side surface of the slide groove 63, the two ends of the limiting plate 64 are respectively fixedly installed on both sides of the inner side surface of the fixed seat 61, the slide rod 65 is fixedly installed on the inner side surface of the slide groove 63, the slide rod 65 is slidably connected to the inside of the limiting plate 64, the spring 66 is sleeved on the outer side surface of the slide rod 65, and the spring 66 is arranged at the bottom of the limiting plate 64.

[0068] When the cover plate 5 needs to be moved away from the top of the enclosure 46, the user can pull the clamping plate 62 to slide the clamping plate 62 inside the fixing seat 61, so that one end of the clamping plate 62 moves out from the inner side of the clamp interface 48, thereby canceling the function of limiting the cover plate 5;

[0069] When the clamping plate 62 moves, the limiting plate 64 will slide on the inner side of the slide groove 63, and at the same time, the slide rod 65 will slide inside the limiting plate 64 to squeeze the spring 66, so that when the user releases the clamping plate 62, the clamping plate 62 can be automatically reset.

[0070] The working principle of a portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention is as follows:

[0071] When in use, the circuit board is sleeved on the outer side of the threaded rod 72, and then the threaded cover 74 is threadedly connected to the outer side of the threaded rod 72, and the bottom of the second buffer pad 73 is abutted against the top of the circuit board to limit the circuit board. After use, the user rotates the cover plate 5 to rotate the cover plate 5 on the top of the protective shell 4 until the snap-on plate 62 is snapped into the inner side of the card interface 48 to limit the cover plate 5, and at the same time, the bottom of the cover plate 5 abuts against the top of the sealing pad 47, thereby playing a sealing role, preventing dust from entering, and protecting the circuit board.

[0072] Compared with the related art, the portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention has the following beneficial effects:

[0073] By cooperating with each other through structures such as the protective shell 4, the cover plate 5, the limit assembly 6, the fixing column 7, the first buffer pad 71, the threaded rod 72, the second buffer pad 73 and the threaded cover 74, the circuit board integrated with the bias module 1, the current limiting module 2 and the determination module 3 can be installed on the inner side of the installation groove 45 when in use, so that the device can be protected when being carried.

[0074] Third embodiment

[0075] Please refer to Fig.12 Based on the portable multi-pin integrated circuit OPEN, SHORT test device provided in the first embodiment of the present application, the third embodiment of the present application proposes another portable multi-pin integrated circuit OPEN, SHORT test device. The third embodiment is only a preferred method of the first embodiment, and the implementation of the third embodiment will not affect the independent implementation of the first embodiment.

[0076] Specifically, the difference of the portable multi-pin integrated circuit OPEN, SHORT testing device provided in the third embodiment of the present application is that, in a portable multi-pin integrated circuit OPEN, SHORT testing device, a groove 8 is provided at the bottom of the clamping plate 62, and a push switch 81 is fixedly installed on the inner side of the groove 8.

[0077] A lighting lamp 82 is fixedly mounted on the bottom of the push switch 81 .

[0078] The push switch 81 is electrically connected to the battery compartment 43, the lighting lamp 82 is electrically connected to the push switch 81, and the push switch 81 can turn off the lighting lamp 82 when it is squeezed, and can turn on the lighting lamp 82 when the squeezing is released.

[0079] The working principle of a portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention is as follows:

[0080] When in use, the user pulls the snap-in plate 62 to move one end of the snap-in plate 62 out from the inner side of the card interface 48. At this time, the press switch 81 returns to its original state due to the lack of squeezing. At this time, the lighting lamp 82 is turned on. After that, when the user flips the cover plate 5 to the top of the protective shell 4, the circuit board installed on the inner side of the mounting groove 45 can be illuminated.

[0081] Compared with the related art, the portable multi-pin integrated circuit OPEN and SHORT test device provided by the present invention has the following beneficial effects:

[0082] By cooperating with each other, the groove 8, the push switch 81, the lighting lamp 82 and other structures, the lighting lamp can illuminate the circuit board during use, making it convenient for users to operate.

[0083] The above descriptions are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A portable multi-pin integrated circuit OPEN and SHORT test device, characterized in that: include: A bias module, a current limiting module, a determination module and a circuit board; The bias module, the current limiting module and the determination module are all integrated on the circuit board; The bias module includes a first power input terminal, an output terminal of the first power input terminal is electrically connected to a voltage stabilizing chip, a ground terminal of the voltage stabilizing chip is electrically connected to a first ground port, an input capacitor is electrically connected between the first power input terminal and the first ground port, an output capacitor is electrically connected between the output terminal of the voltage stabilizing chip and the first ground port, and a plurality of first resistors are electrically connected between the output terminal of the voltage stabilizing chip and the first ground port; The current limiting module includes a second power input terminal, an output terminal of the second power input terminal is electrically connected to a diode to be tested, one end of the diode to be tested is electrically connected to an operational amplifier, a voltage measurement point is electrically connected between the diode to be tested and the operational amplifier, a third pin of the operational amplifier is electrically connected to a second resistor, and a first pin of the operational amplifier is electrically connected to a second ground port; The determination module includes a comparator, a first pin of the comparator is electrically connected to a third resistor, one end of the third resistor is electrically connected to a first LED, one end of the first LED is electrically connected to a third power input terminal, a fourth pin of the comparator is electrically connected to a third ground port, a seventh pin of the comparator is electrically connected to a fourth resistor, and one end of the fourth resistor is electrically connected to a second LED.

2. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 1, characterized in that: The voltage stabilizing chip sets a stable input voltage of 6V, and sets a bias voltage range of the determination module through a plurality of the first resistors.

3. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 1, characterized in that: The input voltage value of the second power input terminal is 6V, and the input voltage value of the third power input terminal is 6V.

4. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 1, characterized in that: A protective mechanism is provided on the outer side of the circuit board, and the protective structure includes a protective shell, a panel is fixedly installed on the top of the protective shell, a sealing gasket is fixedly installed on the top of the panel, a card interface is provided at one end of the protective shell, a mounting groove is provided on the top of the protective shell, a cover plate is rotatably connected to the outer side of the panel, and a limiting component is fixedly installed on the top of the cover plate.

5. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 4, characterized in that: A handle is fixedly mounted on one end of the protective shell, a charging port is provided on one side of the handle, the charging port is fixedly mounted on one end of the protective shell, and a battery compartment is fixedly mounted on the bottom of the protective shell.

6. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 5, characterized in that: The battery compartment is electrically connected to the charging port, and rubber pads are fixedly installed around the bottom of the protective shell.

7. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 4, characterized in that: Fixed columns are fixedly installed around the bottom of the inner side surface of the installation groove, a threaded rod is fixedly installed on the top of the fixed column, a first buffer pad is sleeved on the outer side surface of the threaded rod, the circuit board is arranged on the outer side surface of the threaded rod, the circuit board is located on the top of the first buffer pad, a threaded cover is threadedly connected to the outer side surface of the threaded rod, a second buffer pad is fixedly installed on the bottom of the threaded cover, and the bottom of the second buffer pad abuts against the top of the circuit board.

8. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 4, characterized in that: The limiting assembly includes a fixed seat, a clamping plate, a sliding groove, a limiting plate, a sliding rod and a spring, the fixed seat is fixedly installed on the top of the cover plate, the clamping plate is slidably connected to the inner side surface of the fixed seat, the sliding groove is opened in the interior of the clamping plate, the limiting plate is slidably connected to the inner side surface of the sliding groove, the two ends of the limiting plate are respectively fixedly installed on both sides of the inner side surface of the fixed seat, the sliding rod is fixedly installed on the inner side surface of the sliding groove, the sliding rod is slidably connected to the interior of the limiting plate, the spring is sleeved on the outer side surface of the sliding rod, and the spring is set at the bottom of the limiting plate.

9. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 8, characterized in that: A groove is provided at the bottom of the clamping plate, and a push switch is fixedly installed on the inner side surface of the groove.

10. A portable multi-pin integrated circuit OPEN, SHORT test device according to claim 9, characterized in that: A lighting lamp is fixedly installed on the bottom of the push switch.

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