Electronic computer cable manufacturing method and electronic computer cable

Abstract

The invention is suitable for the technical field of cable manufacturing, and particularly relates to an electronic computer cable manufacturing method and an electronic computer cable, and the method comprises the steps: obtaining the application field information of a to-be-manufactured electronic computer cable; determining manufacturing equipment information and equipment parameter information according with the application scene according to the application field information; wherein the manufacturing equipment information is used for indicating manufacturing equipment required for producing the electronic computer cable to be manufactured, and the equipment parameter information is used for indicating equipment parameters required to be set in the manufacturing equipment; performing analysis based on the manufacturing equipment information to obtain equipment state information; performing defect correction on the equipment state information, and obtaining manufacturing plan information of the to-be-manufactured electronic computer cable according to the equipment state information and the equipment parameter information after defect correction; according to the electronic computer cable manufacturing method provided by the invention, the manufacturing time can be shortened, the operable duration of the manufacturing equipment can be accurately known, and the safety risk is reduced.

Description

Technical Field

[0001] The present application belongs to the technical field of cable manufacturing, and in particular, relates to a method for manufacturing an electronic computer cable and an electronic computer cable. Background Art

[0002] Electronic computer cables are mainly used to connect electronic computers and their peripheral devices and components. Electronic computer cables can transmit data, power and signals. They are mainly used in the fields of electronic computers, automation control, communications, medical equipment and aerospace.

[0003] In the related art, when manufacturing electronic computer cables, if the number of electronic computer cables to be manufactured is large, the manufacturing time consumed is long, and the technicians cannot accurately understand the operating time of the manufacturing equipment in the workshop, resulting in increased safety risks. Summary of the invention

[0004] The embodiments of the present application provide a method for manufacturing an electronic computer cable and an electronic computer cable, which can solve the problem of increased safety risks caused by a large number of electronic computer cables to be manufactured and the inability of technicians to accurately understand the operating time of the manufacturing equipment.

[0005] In a first aspect, an embodiment of the present application provides a method for manufacturing an electronic computer cable, comprising:

[0006] Acquire application field information of the electronic computer cable to be manufactured; wherein the application field information is used to indicate the application scenario of the electronic computer cable to be manufactured;

[0007] Determine manufacturing equipment information and equipment parameter information that meet the application scenario according to the application field information; wherein the manufacturing equipment information is used to indicate the manufacturing equipment required to produce the electronic computer cable to be manufactured, and the equipment parameter information is used to indicate the equipment parameters that need to be set in the manufacturing equipment;

[0008] Analyze the manufacturing equipment information to obtain equipment status information; wherein the equipment status information is used to reflect defects that occur when the manufacturing equipment is running for a long time;

[0009] Defect correction is performed on the device status information, and then manufacturing plan information of the electronic computer cable to be manufactured is obtained based on the defect-corrected device status information and the device parameter information; wherein the control device uses the manufacturing plan information to control the manufacturing equipment to manufacture the electronic computer cable.

[0010] The electronic computer cable manufacturing method provided by the present application obtains the application field information of the electronic computer cable to be manufactured, and can understand the design specifications and performance requirements in detail to select various parameters that meet the needs of the scenario. According to the application field information, the manufacturing equipment information and equipment parameter information that meet the application scenario can be determined, and the electronic computer cable manufacturing equipment that best suits the application scenario can be matched, which not only has efficient production capacity, but also can make the stability and reliability of cable quality, and further optimize the production process. Based on the manufacturing equipment information, the equipment status information is analyzed to obtain the equipment status information, the operating status of the equipment can be mastered, and abnormal conditions can be found and processed, so as to avoid equipment shutdown due to failure, and reduce the losses caused by production interruption; the equipment status information is corrected for defects, and then the manufacturing plan information of the electronic computer cable to be manufactured is obtained according to the equipment status information and the equipment parameter information after the defects are corrected, which not only improves the accuracy and reliability of the data, but also improves the stability and efficiency of the manufacturing process, can identify and correct potential problems, effectively prevent production delays and quality problems caused by equipment failures or data errors, reduce manufacturing time, and technicians can accurately understand the operating time of manufacturing equipment in the workshop and reduce the occurrence of safety risks.

[0011] In a possible implementation manner of the first aspect, determining the manufacturing equipment information and equipment parameter information that conforms to the application scenario according to the application field information includes:

[0012] Determine the performance standard information and multiple equipment satisfaction information of the electronic computer cable to be manufactured according to the application field information; wherein the performance standard information is used to indicate the performance target value of the electronic computer cable to be manufactured in the application scenario, and the equipment satisfaction information is used to indicate the manufacturing equipment that meets the application field information;

[0013] Using the performance standard information to perform parameter matching on the manufacturing equipment to obtain the equipment parameter information;

[0014] Performing performance evaluation on the plurality of equipment compliance information, comparing the plurality of evaluation performance values ​​obtained after the performance evaluation with the performance target value indicated by the performance standard information, and obtaining equipment compliance information; wherein the equipment compliance information is used to indicate the manufacturing equipment that meets the performance target value;

[0015] The manufacturing equipment information is determined based on the equipment compliance information.

[0016] In a possible implementation manner of the first aspect, the performing analysis based on the manufacturing equipment information to obtain the equipment status information includes:

[0017] Performing an estimated test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain first status information; wherein the first status information is used to reflect the defect situation that occurs after the estimated test analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information;

[0018] Performing human-machine detection and analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain second status information; wherein the second status information is used to reflect defects that occur after the human-machine detection and analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information;

[0019] Performing simulation test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain third status information; wherein the third status information is used to reflect the defect situation that occurs after the simulation test analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information;

[0020] The device status information is obtained by performing a combined analysis based on the first status information, the second status information and the third status information.

[0021] In a possible implementation manner of the first aspect, performing estimated test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain first status information includes:

[0022] Determine the cable manufacturing time information of the electronic computer cable to be manufactured; wherein the cable manufacturing time information is used to indicate the total time required to manufacture the electronic computer cable to be manufactured;

[0023] Extracting historical information of the manufacturing equipment indicated by the manufacturing equipment information to obtain basic equipment information; wherein the basic equipment information is used to reflect the maintenance status and equipment age of the manufacturing equipment;

[0024] Determine first duration information according to the maintenance situation and the age of the equipment; wherein the first duration information is used to indicate the total working time that the manufacturing equipment can still operate;

[0025] The first duration information is compared with the cable manufacturing duration information, and if the first duration information is less than the cable manufacturing duration information, first defect information is obtained; wherein the first defect information is used to indicate that the manufacturing equipment may have at least one of equipment aging defect, equipment temperature abnormality defect and component defect while it is still operational;

[0026] The first defect information is determined as the first state information.

[0027] In a possible implementation manner of the first aspect, the method further includes:

[0028] If the first duration information is greater than the cable manufacturing duration information, first feedback information is obtained; wherein, the feedback information is used to prompt the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured under the estimated test analysis.

[0029] In a possible implementation manner of the first aspect, performing human-machine detection analysis on the manufacturing equipment information to obtain the second state information includes:

[0030] Divide the manufacturing equipment indicated by the manufacturing equipment information into detection positions to obtain first detection information and second detection information; wherein the first detection information is used to indicate the local position where a technician needs to detect the manufacturing equipment, and the second detection information is used to indicate the local position where a detection machine needs to detect the manufacturing equipment;

[0031] A technician performs a test on the test position indicated by the first test information to obtain first test status information; wherein the first test status information is used to reflect the fatigue status of the test position indicated by the first test information;

[0032] The detection position indicated by the second detection information is detected by the detection machine to obtain second detection status information; wherein the second detection status information is used to reflect the fatigue status of the detection position indicated by the second detection information;

[0033] Performing an input operation to perform status detection on the first detection status information and the second detection status information through the detection machine to obtain second duration information; wherein the second duration information is used to indicate the total working duration of the manufacturing equipment obtained according to the detection of the detection machine, and the input operation is to input the first detection status information into the detection machine;

[0034] The second duration information is compared with the cable manufacturing duration information, and if the second duration information is less than the cable manufacturing duration information, second defect information is obtained; wherein the second defect information is used to indicate at least one of an equipment aging defect, an equipment temperature abnormality defect, and a component defect that occurs in the manufacturing equipment according to the detection machine;

[0035] determining the second defect information as the second state information;

[0036] And / or, the method further comprises:

[0037] If the second duration information is greater than the cable manufacturing duration information, second feedback information is obtained; wherein, the feedback information is used to prompt the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured during the human-machine detection and analysis.

[0038] In a possible implementation manner of the first aspect, performing simulation test analysis on the manufacturing equipment information to obtain the third state information includes:

[0039] Extracting size parameters, power parameters, maintenance content, technical parameters and process parameters according to the manufacturing equipment information;

[0040] Using the size parameter, the power parameter, the maintenance content, the technical parameter and the process parameter as modeling parameters, modeling is performed in a modeling software to obtain an equipment model of the manufacturing equipment;

[0041] Performing a simulated manufacturing operation on the electronic computer cable to be manufactured based on the equipment model and the equipment parameter information, and determining third duration information; wherein the third duration information is used to indicate the total working duration of the manufacturing equipment obtained according to the simulation analysis;

[0042] The third duration information is compared with the cable manufacturing duration information. If the third duration information is less than the cable manufacturing duration information, third defect information is obtained; wherein the third defect information is used to indicate at least one of possible equipment aging defects, equipment temperature abnormality defects and component defects obtained by simulation analysis of the manufacturing equipment;

[0043] determining the third defect information as the third state information;

[0044] And / or, the method further comprises:

[0045] If the third duration information is greater than the cable manufacturing duration information, third feedback information is obtained; wherein, the feedback information is used to indicate to the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured under the simulation test analysis.

[0046] In a possible implementation manner of the first aspect, the performing combined analysis according to the first state information, the second state information, and the third state information to obtain the device state information includes:

[0047] Determine first state sub-information by performing defect probability analysis according to the first state information; wherein the first state sub-information is used to indicate at least one of a defect probability value corresponding to the device aging defect, a probability value corresponding to the device temperature abnormality defect, and a probability value corresponding to the component defect;

[0048] Determine second state sub-information by performing defect probability analysis according to the second state information; wherein the second state sub-information is used to indicate at least one of a defect probability value corresponding to the device aging defect, a probability value corresponding to the device temperature abnormality defect, and a probability value corresponding to the component defect;

[0049] Determine the third state sub-information by performing defect probability analysis according to the third state information; wherein the third state sub-information is used to indicate at least one of a defect probability value corresponding to the device aging defect, a probability value corresponding to the device temperature abnormality defect, and a probability value corresponding to the component defect;

[0050] A Bayesian method is used to perform multi-information fusion calculation on the first state sub-information, the second state sub-information and the third state sub-information to obtain the device state information.

[0051] In a second aspect, an embodiment of the present application provides an electronic computer cable manufacturing system, comprising:

[0052] An acquisition unit, used for acquiring application field information of the electronic computer cable to be manufactured; wherein the application field information is used for indicating the application scenario of the electronic computer cable to be manufactured;

[0053] A determination unit, used to determine manufacturing equipment information and equipment parameter information that meet the application scenario according to the application field information; wherein the manufacturing equipment information is used to indicate the manufacturing equipment required to produce the electronic computer cable to be manufactured, and the equipment parameter information is used to indicate the equipment parameters that need to be set in the manufacturing equipment;

[0054] An analysis unit, configured to analyze the manufacturing equipment information to obtain equipment status information; wherein the equipment status information is used to reflect defects of the manufacturing equipment that occur during long-term operation;

[0055] The result unit is used to perform defect correction on the device status information, and then obtain the manufacturing plan information of the electronic computer cable to be manufactured based on the defect-corrected device status information and the device parameter information; wherein the control device uses the manufacturing plan information to control the manufacturing equipment to manufacture the electronic computer cable.

[0056] In a third aspect, an embodiment of the present application provides an electronic computer cable manufacturing device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the method described in any one of the first aspects above.

[0057] In a fourth aspect, an embodiment of the present application provides an electronic computer cable, wherein the electronic computer cable is manufactured by the electronic computer cable manufacturing equipment described in the third aspect above.

[0058] It can be understood that the beneficial effects of the second to fourth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0059] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0060] Figure 1 It is a schematic flow chart of a method for manufacturing an electronic computer cable provided in one embodiment of the present application;

[0061] Figure 2 It is a schematic diagram of the implementation process of step S200 in the method for manufacturing an electronic computer cable provided in one embodiment of the present application;

[0062] Figure 3 It is a schematic diagram of the implementation process of step S300 in the method for manufacturing an electronic computer cable provided in one embodiment of the present application;

[0063] Figure 4 It is a schematic diagram of the implementation process of step S310 in the method for manufacturing a computer cable provided in one embodiment of the present application;

[0064] Figure 5 It is a schematic diagram of the implementation process of step S320 in the method for manufacturing a computer cable provided in one embodiment of the present application;

[0065] Figure 6 It is a schematic diagram of the implementation process of step S330 in the method for manufacturing a computer cable provided in one embodiment of the present application;

[0066] Figure 7 It is a schematic diagram of the implementation process of step S340 in the method for manufacturing an electronic computer cable provided in one embodiment of the present application;

[0067] Figure 8 It is a structural schematic diagram of an electronic computer cable manufacturing system provided in an embodiment of the present application;

[0068] Fig. 9 It is a structural schematic diagram of a control device for an electronic computer cable device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0069] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0070] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.

[0071] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0072] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0073] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0074] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0075] Electronic computer cables are mainly used to connect electronic computers and their peripheral devices and components. Electronic computer cables can transmit data, power and signals. They are mainly used in the fields of electronic computers, automation control, communications, medical equipment and aerospace.

[0076] In the related art, when manufacturing electronic computer cables, if the number of electronic computer cables to be manufactured is large, the manufacturing time consumed is long, and the technicians cannot accurately understand the operating time of the manufacturing equipment in the workshop, resulting in increased safety risks.

[0077] To solve the above problems, the embodiments of the present application provide a method for manufacturing an electronic computer cable and an electronic computer cable.

[0078] In the method, the application field information of the electronic computer cable to be manufactured is obtained, and the design specifications and performance requirements can be understood in detail to select various parameters that meet the needs of the scenario. According to the application field information, the manufacturing equipment information and equipment parameter information that meet the application scenario can be determined, and the electronic computer cable manufacturing equipment that best suits the application scenario can be matched, which not only has efficient production capacity, but also can make the cable quality stable and reliable, and further optimize the production process. Based on the manufacturing equipment information, the equipment status information is analyzed to obtain the operation status of the equipment, and the abnormal situation can be found and processed, so as to avoid the equipment from shutting down due to failure, and reduce the loss caused by production interruption; the equipment status information is corrected for defects, and then the manufacturing plan information of the electronic computer cable to be manufactured is obtained according to the equipment status information and the equipment parameter information after the defect correction, which not only improves the accuracy and reliability of the data, but also improves the stability and efficiency of the manufacturing process, can identify and correct potential problems, effectively prevent production delays and quality problems caused by equipment failure or data errors, and reduce manufacturing time. The technicians can accurately understand the operating time of the manufacturing equipment in the workshop and reduce the occurrence of safety risks.

[0079] The electronic computer cable manufacturing method provided in the embodiment of the present application can be applied to electronic computer cables. In this case, the electronic computer cable is the executor of the electronic computer cable manufacturing method provided in the embodiment of the present application. The embodiment of the present application does not impose any restrictions on the specific type of electronic computer cables.

[0080] For example, the manufacturing equipment of electronic computer cables includes a control device and a manufacturing device; the control device and the manufacturing device are connected in communication; the manufacturing device may include conductor drawing components, insulation layer covering components, shielding layer adding components, etc., and these sub-units are connected through precise mechanical and electrical connections to improve the continuity and quality of cable production. The control device can be a tablet computer, a laptop computer, a netbook, a desktop computer, a smart screen, a computer, a laptop computer, etc.

[0081] In order to better understand the electronic computer cable manufacturing method provided in the embodiment of the present application, the specific implementation process of the electronic computer cable manufacturing method provided in the embodiment of the present application is exemplarily introduced below.

[0082] Figure 1 A schematic flow chart of a method for manufacturing an electronic computer cable provided in an embodiment of the present application is shown, and the method for manufacturing an electronic computer cable comprises:

[0083] S100, obtaining application field information of the electronic computer cable to be manufactured; wherein the application field information is used to indicate the application scenario of the electronic computer cable to be manufactured.

[0084] For example, you can use the Internet to search for information on the application fields of the electronic computer cables to be manufactured; Internet search can be done by using search engines such as Google, Baidu, etc., and by entering keywords or phrases, you can quickly find relevant web pages, articles, pictures or videos, etc. You can also use professional databases, such as PubMed in medicine and Lexis Nexis in law; these professional databases usually contain high-quality resources such as academic papers, cases, laws and regulations. You can also obtain it through libraries; it can be public libraries or university libraries, which have a large collection of paper materials such as books, journals, newspapers, etc., and also provide digital resources such as e-books and e-journals.

[0085] S200, determining manufacturing equipment information and equipment parameter information that meet the application scenario based on the application field information; wherein the manufacturing equipment information is used to indicate the manufacturing equipment required to produce the electronic computer cable to be manufactured, and the equipment parameter information is used to indicate the equipment parameters that need to be set in the manufacturing equipment.

[0086] Exemplarily, the application scenario of the electronic computer cable to be manufactured is determined based on the application field information, and the manufacturing equipment information and equipment parameter information that meet the application scenario are determined for the application scenario; the manufacturing equipment information and equipment parameter information that meet the application scenario can be determined through the manufacturing requirements of the electronic computer cable, which may include the cable specifications, performance requirements, use environment and other information; by determining the equipment that can meet the cable specifications and performance requirements, the performance can be further improved according to the determined equipment, and the equipment parameters can be fine-tuned, and the manufacturing equipment information and equipment parameter information that meet the application scenario can be determined. Among them, the factors that can be fine-tuned in the equipment parameters can be temperature, pressure, speed, etc.; when determining the equipment, the cable specifications can be diameter, length, insulation thickness, etc.

[0087] In one possible implementation, see Figure 2, S200, determining manufacturing equipment information and equipment parameter information that meet the application scenario according to the application field information, including:

[0088] S210, determining the performance standard information and multiple equipment satisfaction information of the electronic computer cable to be manufactured based on the application field information; wherein the performance standard information is used to indicate the performance target value of the electronic computer cable to be manufactured in the application scenario, and the equipment satisfaction information is used to indicate the manufacturing equipment that meets the application field information.

[0089] It can be understood that the performance target value can be the minimum value of the performance that needs to be met, for example, the heat resistance performance needs to be met, and the quality of the heat resistance performance can be expressed according to the heat resistance value of 0 to 100, for example, 0 represents the worst and 100 represents the best, so the specific heat resistance performance value of the electronic computer cable to be manufactured in the application scenario can be determined; the manufacturing equipment that meets the application field information can be understood as the electronic computer cable processed by the manufacturing equipment in the application field meets the application requirements; for example, the performance standard information of the electronic computer cable to be manufactured and the satisfaction information of multiple devices determined according to the application field information can be through professional databases, by establishing one's own professional database, such as PubMed in medicine, LexisNexis in law, etc.; these databases in professional databases usually contain high-quality resources such as academic papers, cases, laws and regulations; it can be consulting materials or Internet inquiries, but not limited to this.

[0090] S220, performing parameter matching on manufacturing equipment using the performance standard information to obtain equipment parameter information.

[0091] It can be understood that the performance standard information may include production efficiency, energy consumption, accuracy, durability, etc. For example, if it is an automated production line, the equipment may be required to achieve an efficiency of producing 1,000 products per hour while maintaining a 99% pass rate.

[0092] For example, the performance standard information is used to perform parameter matching on manufacturing equipment. The parameter matching may be assisted by Excel or specialized parameter comparison software. When comparing, attention may be paid to parameters that may affect equipment performance but are easily overlooked.

[0093] S230, performing performance evaluation on multiple equipment compliance information, comparing multiple evaluation performance values ​​obtained after the performance evaluation with the performance target values ​​indicated by the performance standard information, and obtaining equipment compliance information; wherein the equipment compliance information is used to indicate manufacturing equipment that meets the performance target value.

[0094] It can be understood that meeting the performance target value can be understood as multiple performance target values, such as heat resistance, conductivity, etc.; manufacturing equipment that meets the performance target value proves that the manufacturing equipment should meet the target performance values ​​such as heat resistance and conductivity; when conducting performance evaluation of multiple devices, the specific evaluation indicators can be clarified, and then the evaluation can be implemented through design; the evaluation can include test environment preparation, test tool and software configuration, test execution and generation of equipment compliance information; test environment preparation can be to test all devices under the same test environment to eliminate the impact of environmental factors on the evaluation results, including control of temperature, humidity, power supply stability, etc. Test tool and software configuration can be to use test tools and software to configure according to evaluation requirements, and can accurately capture the data of the device on various performance indicators. Test execution can be to test each device one by one or in parallel;

[0095] S240, determining manufacturing equipment information according to the equipment compliance information.

[0096] For example, it can be understood that equipment compliance information refers to a collection of data such as performance indicators, specification parameters, and safety standards exhibited by the equipment under specific environments or conditions. Based on the equipment compliance information, a series of methods can be used to infer or determine the relevant information of the manufacturing equipment. The following is a detailed and specific process and steps: The equipment compliance information can be compared with relevant industry standards and regulatory requirements to confirm whether the equipment meets all necessary performance and safety requirements. It should be noted that throughout the process, the accuracy and reliability of the information are improved. At the same time, since the specific circumstances of different equipment and industries may be different, it may be necessary to make flexible adjustments according to the specific circumstances in actual operations.

[0097] Such a setting helps to meet usage requirements. By comparing equipment compliance information with industry standards and regulatory requirements, it can quickly and accurately evaluate the quality and compliance of equipment, effectively avoiding legal risks and market access barriers caused by non-compliance of equipment with standards.

[0098] S300, analyzing the manufacturing equipment information to obtain equipment status information; wherein the equipment status information is used to reflect defects that occur when the manufacturing equipment is running for a long time.

[0099] It can be understood that the defects that appear in manufacturing equipment during long-term operation can be the severity of the defects, etc.; the equipment status information can be obtained by analyzing the manufacturing equipment information; for example, to obtain the equipment status information, it is possible to first determine which data reflects the operating status of the equipment, and the data may include equipment sensor data (such as temperature, vibration, pressure, etc.) maintenance records, fault reports, etc.; the analysis method can use the data to be converted into a format suitable for analysis, standardize, normalize or perform other forms of conversion on the time series data, and extract key features from the converted data, which should be able to reflect the operating status of the equipment. For example, frequency domain features can be extracted from vibration data to detect imbalance or bearing failure; the analysis of manufacturing equipment information can also be carried out through software simulation methods, so that the equipment status information can be obtained.

[0100] In one possible implementation, see Figure 3 , S300, analyzing the manufacturing equipment information to obtain equipment status information, including:

[0101] S310, performing estimated test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain first status information; wherein the first status information is used to reflect defects that occur after the estimated test analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information.

[0102] It can be understood that the estimated test analysis of the manufacturing equipment indicated by the manufacturing equipment information can be carried out by establishing multiple test scenarios to test the various operating conditions and abnormal conditions that the manufacturing equipment may encounter during operation; each test scenario contains test steps, expected results, and corresponding evaluation criteria. Among them, the test data and observations are recorded in real time during the test execution phase. The data includes but is not limited to key parameters such as the equipment's response time, processing speed, energy consumption, temperature, vibration, and any abnormal alarms or shutdowns. In addition, after the test is completed, an evaluation can be conducted to identify potential problems or defects in the equipment's performance, reliability, safety, etc., and to determine the extent of the potential problems or defects; the judgment method can be through fatigue level and life curve.

[0103] In one possible implementation, see Figure 4 , S310, performing estimated test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain first state information, including:

[0104] S311, determining the cable manufacturing time information of the electronic computer cable to be manufactured; wherein the cable manufacturing time information is used to indicate the total time required to manufacture the electronic computer cable to be manufactured.

[0105] Exemplarily, the cable manufacturing time information of the electronic computer cable to be manufactured is determined by determining the demand and equipment of the electronic computer cable to be manufactured, determining the demand and equipment, then determining the process method and steps, and then manufacturing it through the manufacturing method to determine the total time required to manufacture the electronic computer cable; wherein the manufacturing method can be virtual manufacturing or estimated manufacturing; when determining the total time required to manufacture the electronic computer cable, the total time required to manufacture the electronic computer cable is different due to different diameters, different materials, different processing methods, and different requirements.

[0106] S312, extracting historical information of the manufacturing equipment indicated by the manufacturing equipment information to obtain basic equipment information; wherein the basic equipment information is used to reflect the maintenance status and age of the manufacturing equipment.

[0107] Exemplarily, historical information of manufacturing equipment is extracted; this can be done by obtaining previous equipment lists, equipment maintenance orders, equipment usage, and basic equipment information; the basic equipment information may include the equipment production year, model, precautions, etc., but is not limited to this. After acquisition, the equipment production year, model, and precautions can be directly extracted; historical information can also be extracted from the basic information of production equipment provided by the equipment manufacturer or the Internet. The basic information of the equipment can be obtained based on the results of historical information extraction, and a basic information framework of the equipment can be constructed. This framework should include multiple aspects such as the equipment's maintenance history, service life, fault type distribution, and key component replacement, but is not limited to this.

[0108] S313, determining first duration information according to the maintenance situation and the age of the equipment; wherein the first duration information is used to indicate the total working time that the manufacturing equipment can still operate.

[0109] It can be understood that the total working time that the manufacturing equipment can still operate can be understood as the total time or maximum time that the manufacturing equipment can continue to produce and operate after it is put into operation.

[0110] Exemplarily, when evaluating the remaining operating time of manufacturing equipment, that is, the first duration information, all maintenance records of the manufacturing equipment, including maintenance time, maintenance reasons, replaced parts, and the operating status of the equipment after maintenance, can be classified and sorted to identify frequently occurring fault types and their corresponding maintenance cycles. The manufacturing date, commissioning date, and current date of the equipment can be confirmed to calculate the actual service life of the equipment. Then, by consulting the technical manual or industry standards of the equipment, the design life and common aging phenomena of this type of equipment can be understood. The operating environment that the manufacturing equipment may face currently and in the future, including temperature, humidity, dust concentration, voltage stability, etc., can be analyzed; the first duration information can be determined by comprehensive analysis and duration. The first duration information can be determined by using statistical methods such as weighted average method and exponential smoothing method, combined with expert experience and judgment, to quantify the remaining operating time of the manufacturing equipment and obtain the first duration information.

[0111] S314, compare the first duration information with the cable manufacturing duration information, if the first duration information is less than the cable manufacturing duration information, obtain the first defect information; wherein the first defect information is used to indicate at least one of equipment aging defects, equipment temperature abnormality defects and component defects that may occur when the manufacturing equipment is still operating.

[0112] Exemplarily, the first duration information and the cable manufacturing duration information are obtained as described above, and the first duration information and the cable manufacturing duration information are compared; the comparison method can be to compare the size using numerical values ​​to obtain the difference between them; the units of the two duration information are made consistent (for example, seconds, minutes, hours or days, etc.) for direct comparison. Then, it is determined whether the first duration is less than the cable manufacturing duration. When the judgment result is that the first duration information is less than the cable manufacturing duration information, it means that the manufacturing equipment has an abnormality and cannot operate normally; according to the degree to which the first duration information is less than the cable manufacturing duration information, it can be judged that at least one of the equipment aging defects, equipment temperature abnormality defects and component defects that may occur during the operation of the manufacturing equipment; for example, when the first duration information is 50h and the cable manufacturing duration information is 60, so 50 is less than 60, and the difference between them is 10, it can be preliminarily judged that the manufacturing equipment may be working slowly, and it can be inferred that the equipment production speed may be reduced due to the abnormal equipment temperature defect; when the first duration information is 40h and the cable manufacturing duration information is 80, so 40 is less than 80, and the difference between them is 40, it can be preliminarily judged that the component may be working slowly, and the degree of slowness is large, so the equipment may have been suspended due to component defects, or caused by equipment aging.

[0113] S315: Determine the first defect information as the first status information.

[0114] Exemplarily, it can be determined by the degree of impact on the system or product; the degree of impact includes determining the severity of the defect (e.g., fatal, serious, general, minor, etc.), the scope of impact (e.g., single user, multiple users, the entire system), and the possible consequences (e.g., data loss, service interruption, etc.). After evaluating the impact of the defect, this information needs to be compared with preset status information standards. These standards can be based on historical data, industry standards, or internal regulations to guide how to determine whether a defect should be considered as first status information: If the defect information meets the conditions for first status information in the preset standards, it can be determined as first status information.

[0115] With this setting, you can quickly identify which defects need to be handled first and which can be handled later or ignored, avoiding wasting time and energy on minor issues. You can clearly understand the processing status and priority of each defect, thereby having a more comprehensive understanding of the entire problem handling process, which helps to continuously improve and optimize the problem handling process.

[0116] In a possible implementation, the method further includes:

[0117] S314A, if the first duration information is greater than the cable manufacturing duration information, first feedback information is obtained; wherein the feedback information is used to prompt the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured under the estimated test analysis.

[0118] Exemplarily, the first duration information is directly compared with the cable manufacturing duration information, mainly by judging whether the manufacturing equipment can complete the cable manufacturing task within the expected time. For example, it can be by comparing the total duration and then performing a logical judgment. If the first duration information is greater than the cable manufacturing duration information, it means that the manufacturing equipment, under the estimated test analysis, has completed the total working time indicated by the cable manufacturing duration information, proving that the manufacturing equipment can complete the manufacturing task of the electronic computer cable to be manufactured, and the completion information is used as the first feedback information.

[0119] S320, performing human-machine detection and analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain second status information; wherein the second status information is used to reflect defects that occur after the human-machine detection and analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information.

[0120] It can be understood that human-machine detection and analysis can be understood as the detection and analysis of manufacturing equipment by machines and humans. Exemplarily, when performing human-machine detection and analysis to obtain the second state information, the detection and analysis method can be to use automated detection tools to collect data from manufacturing equipment remotely or on-site. The automated detection tools can include sensors, cameras, infrared detectors, etc., which can capture key indicators such as the operating status, temperature, and vibration of the equipment in real time. In addition, human-machine detection and analysis also emphasizes human participation and judgment. On the basis of automated detection and algorithm analysis, professional engineers and technicians will conduct inspections and verifications, and can detect subtle problems that automated tools may ignore, such as tiny cracks on the appearance of the equipment, loose terminals, etc. The results of automated detection, algorithm analysis, and manual inspection are summarized to form the second state information. Through the comprehensive use of these methods, the operating status of the equipment can be more accurately grasped, potential problems can be discovered and solved, and the stable operation of the production line and the high-quality output of products can be achieved.

[0121] In one possible implementation, see Figure 5 , S320, performing human-machine detection and analysis on the manufacturing equipment information to obtain second state information, including:

[0122] S321, divide the manufacturing equipment indicated by the manufacturing equipment information into detection positions to obtain first detection information and second detection information; wherein the first detection information is used to indicate the local position where a technician is required to detect the manufacturing equipment, and the second detection information is used to indicate the local position where a detection machine is required to detect the manufacturing equipment.

[0123] It can be understood that the manufacturing equipment indicated by the first detection information and the manufacturing equipment information is divided into detection positions. The manufacturing equipment can be a single one, and the local position of the single manufacturing equipment is divided into multiple local positions of the equipment. The local position is analyzed to obtain the position that needs to be detected by the detection machine and the position that needs to be detected by the technician; the manufacturing equipment indicated by the manufacturing equipment information is divided into detection positions. There can also be multiple manufacturing equipment. The multiple manufacturing equipment are classified, and according to the classification, it is determined which classified manufacturing equipment needs to be detected by the technician and which needs to be detected by the detection machine; different detection information is obtained according to different detection positions, that is, the second detection information is obtained; the local position of the manufacturing equipment for detection can be understood as splitting the components of a single device to obtain multiple equipment components, and each equipment component is the local position on the manufacturing equipment that needs to be detected.

[0124] S322, a technician detects the detection position indicated by the first detection information to obtain first detection status information; wherein the first detection status information is used to reflect the fatigue status of the detection position indicated by the first detection information.

[0125] It can be understood that fatigue can be understood as the performance degradation phenomenon of the components at the test location after long-term stress or cyclic loading; for example, changes in the internal microstructure of the material, such as crack initiation and expansion, will reduce the bearing capacity and service life of the component.

[0126] Exemplarily, the technician detects the detection position indicated by the first detection information and can obtain the first detection status information; the technician will prepare corresponding detection equipment and tools according to the detection position clearly indicated in the first detection information; these equipment and tools may include but are not limited to sensors, measuring instruments, cameras, etc., depending on the characteristics of the object to be detected and the detection requirements. The detection position indicated by the first detection information can be detected by physical contact measurement; during the detection process, each detection point is accurately covered. At the same time, the detection method can be flexibly adjusted according to the actual situation of the detection object to cope with special or unexpected situations that may arise. The appearance of the detection position component (for example, the appearance has cracks, deformation, etc.) is recorded and used as a basis to generate a fatigue curve, and the first detection status information can be obtained based on the fatigue curve.

[0127] S323, detecting the detection position indicated by the second detection information by a detection machine to obtain second detection status information; wherein the second detection status information is used to reflect the fatigue status of the detection position indicated by the second detection information.

[0128] Exemplarily, the detection machine detects the detection position indicated by the second detection information and can obtain the second detection status information; when the detection machine performs detection, it will perform corresponding detection functions and detection steps according to the detection position clearly indicated in the first detection information; the detection function can be to detect the service life of the components on the manufacturing equipment, the estimated use time, etc., but is not limited to this. The detection position indicated by the second detection information is detected. During the detection process, the detection method can be flexibly adjusted according to the actual situation of the detection target to deal with special situations or unexpected situations that may arise. The appearance of the components at the detection position (for example, the appearance has cracks, deformation, etc.) and the structural conditions (for example, the strength of the structure, endurance strength, etc.) are recorded and used as the basis to generate a fatigue curve, and the second detection status information can be obtained based on the fatigue curve.

[0129] S324, execute an input operation to perform status detection on the first detection status information and the second detection status information through a detection machine to obtain second duration information; wherein the second duration information is used to indicate the total working time of the manufacturing equipment obtained according to the detection of the detection machine, and the input operation is to input the first detection status information into the detection machine.

[0130] It can be understood that executing the input operation may be to enable the manufacturing equipment to start working.

[0131] Exemplarily, the detection machine performs state detection on the first detection state information and the second detection state information, and obtains the second duration information; when performing state detection, the first detection state information is analyzed to identify key features or abnormal changes therein, so as to better understand the current state of the target object or system and its changing trend. The detection machine will collect the second detection state information according to the same process, and perform the same type of data sorting on the data shared by the first detection state information and the second detection state information, such as physical quantities such as temperature, pressure, speed, current, force intensity, etc. According to the first detection state information and the second detection state information, the two are compared, and through comparative analysis, the state change of the target object or system between the two detections and its corresponding second duration information can be identified.

[0132] S325, compare the second duration information with the cable manufacturing duration information, if the first duration information is less than the cable manufacturing duration information, obtain the second defect information; wherein the second defect information is used to indicate at least one of equipment aging defects, equipment temperature abnormality defects and component defects that occur in the manufacturing equipment according to the detection of the detection machine.

[0133] Exemplarily, the second duration information and the cable manufacturing duration information are obtained as described above, and the second duration information and the cable manufacturing duration information are compared; the comparison method may be to compare the size using numerical values ​​to obtain the difference between them; the units of the two duration information can be made consistent (for example, seconds, minutes, hours or days, etc.) for direct comparison. Then, it is determined whether the second duration is less than the cable manufacturing duration. When the judgment result is that the second duration information is less than the cable manufacturing duration information, it means that the manufacturing equipment has an abnormality and cannot operate normally; according to the degree to which the second duration information is less than the cable manufacturing duration information, it can be judged that at least one of the equipment aging defects, equipment temperature abnormality defects and component defects that may occur during the operation of the manufacturing equipment; for example, when the second duration information is 70h and the cable manufacturing duration information is 75, so 70 is less than 75, and the difference between the two is 5, it can be preliminarily judged that the manufacturing equipment may be working slowly, and it can be inferred that the equipment production speed may be reduced due to the abnormal equipment temperature defect; when the second duration information is 30h and the cable manufacturing duration information is 80, so 30 is less than 80, and the difference between the two is 50, it can be preliminarily judged that the component may be working slowly, and the degree is large, so the equipment may have been suspended due to component defects, or caused by equipment aging.

[0134] S326, determining the second defect information as the second state information.

[0135] Exemplarily, it can be determined by the degree of impact on the product; the degree of impact includes determining the severity of the defect, such as serious, moderate and minor, the scope of impact, such as a single user, multiple users, the entire system, and possible consequences, such as data loss, service interruption, etc.; after evaluating the impact of the defect, it is necessary to compare this information with preset status information standards; the standards may be based on historical data, industry standards or internal regulations to guide how to judge whether a defect should be regarded as second status information: if the defect information meets the conditions for the second status information in the preset standards, it can be determined as second status information.

[0136] Such a setting can more accurately grasp the severity and urgency of the problem, and then make more reasonable decisions, so that the accuracy and effectiveness of the processing results can better ensure the stability and reliability of the system or product.

[0137] In a possible implementation, the method further includes:

[0138] S325A, if the second duration information is greater than the cable manufacturing duration information, the second feedback information is obtained; wherein the feedback information is used to prompt the technicians that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured during the human-machine detection and analysis.

[0139] Exemplarily, the second duration information is directly compared with the cable manufacturing duration information, mainly by judging whether the manufacturing equipment can complete the cable manufacturing task within the expected time. For example, it can be by comparing the total duration and then performing a logical judgment. If the second duration information is greater than the cable manufacturing duration information, it means that the manufacturing equipment has completed the total working time indicated by the cable manufacturing duration information in the human-machine detection analysis, proving that the manufacturing equipment can complete the manufacturing task of the electronic computer cable to be manufactured, and the completion information is used as the first feedback information.

[0140] S330, performing simulation test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain third status information; wherein the third status information is used to reflect defects that occur after the simulation test analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information.

[0141] It can be understood that simulation test analysis can be understood as simulation experiment analysis through simulation software.

[0142] Exemplarily, by acquiring data from the manufacturing equipment indicated by the manufacturing equipment information, selecting simulation test tools and environments, and automatically collecting and analyzing test data during the test execution phase, the third state information can be obtained; for example, acquiring data from the manufacturing equipment indicated by the manufacturing equipment information can obtain the design specifications, functional requirements, and historical fault data of the manufacturing equipment, and establish the key areas of the test. The selection of simulation test tools can select simulation test software, hardware platforms, and test scripts according to the complexity and characteristics of the manufacturing equipment. The selected environment may include but is not limited to external conditions such as temperature, humidity, and power fluctuations, as well as the interactive logic of various components inside the device. In the test execution phase, a variety of simulation test analysis methods can be used. For example, stress testing is used to evaluate the stability and performance of equipment under high load or extreme conditions; fault injection testing observes the response and recovery capabilities of the equipment by artificially introducing faults; and performance testing focuses on the efficiency and accuracy of the equipment when processing routine tasks. The analysis of test data may include equipment operating parameters, error logs, performance indicators, etc., and can identify defects in the equipment during the simulation test process, including but not limited to performance bottlenecks, logical errors, compatibility issues, etc.

[0143] In one possible implementation, see Figure 6 , S330, simulate and test the manufacturing equipment information to obtain third state information, including:

[0144] S331, extracting dimension parameters, power parameters, maintenance contents, technical parameters and process parameters according to the manufacturing equipment information.

[0145] For example, it can be obtained through, but not limited to, equipment manuals, technical manuals, design drawings, operating guides, and maintenance records; it can be obtained through the nameplate or model information of the manufacturing equipment; it can be obtained through direct measurement or software-assisted methods; among which, the software-assisted method is to use CAD computer-aided design software to open the design drawings and directly obtain dimensional data through software functions.

[0146] S332, using size parameters, power parameters, maintenance content, technical parameters and process parameters as modeling parameters, modeling is performed in the modeling software to obtain an equipment model of the manufacturing equipment.

[0147] Exemplarily, the dimensional parameters, power parameters, maintenance contents, technical parameters and process parameters obtained in the above (step S331) are modeled in a modeling software to construct an equipment model of the manufacturing equipment.

[0148] To build a device model of a manufacturing device, first collect and organize the modeling parameters. In addition to the parameters obtained above, they may also include but are not limited to length, width, height, mounting hole positions, travel of moving parts, etc. Before modeling, you can select appropriate 3D modeling software based on the complexity of the device and the required model accuracy to build a complex 3D model. For example, 3D modeling software can be Solid Works, AutoCAD, CATIA, etc. To create a basic model, you can use dimensional parameters to draw the basic geometric shapes of the device in the modeling software, such as the housing, base, moving parts, etc.

[0149] S333, simulating the manufacturing work of the electronic computer cable to be manufactured based on the equipment model and equipment parameter information, and determining third duration information; wherein the third duration information is used to indicate the total working time of the manufacturing equipment obtained according to the simulation analysis.

[0150] Exemplarily, by collecting and organizing all relevant equipment models and equipment parameter information, using computer-aided design (CAD) or simulation software, a virtual environment for cable manufacturing is established according to the equipment model, process planning, parameter setting and debugging, and simulated manufacturing are carried out to determine the third duration information; wherein, process planning can be based on the specifications, materials, and performance requirements of the cable, planning the manufacturing process, including material preparation, cutting, twisting, insulation, shielding, sheathing and other links. In addition, the manufacturing process is simulated in a virtual environment so that each step can be executed and meets production standards and safety specifications. The virtual environment should reflect the actual production scenario as realistically as possible, including the layout of the equipment, the workflow, and the interaction between the equipment. Parameter setting and debugging can be to set the operating parameters of each device in the simulation software based on the equipment parameter information. Mainly including key parameters such as speed, temperature, pressure, tension, etc. Simulated manufacturing can be to start the simulation software, and in the process of starting the simulated manufacturing of electronic computer cables,

[0151] Record and analyze key data in the simulated manufacturing process; key data such as the time consumption of each process, energy consumption of equipment, performance indicators of cables, etc. These data will be used for subsequent optimization and adjustment.

[0152] S334, compare the third duration information with the cable manufacturing duration information, if the third duration information is less than the cable manufacturing duration information, obtain the third defect information; wherein the third defect information is used to indicate at least one of the possible equipment aging defects, equipment temperature abnormality defects and component defects obtained by simulating and analyzing the manufacturing equipment.

[0153] Exemplarily, the third duration information is compared with the cable manufacturing duration information by using a preset algorithm or logic to directly compare the third duration information with the cable manufacturing duration information. If the third duration information is less than the cable manufacturing duration information, the third defect information is obtained. For example, direct comparison may be to set a reasonable threshold (for example, a certain percentage or a fixed time difference) to determine whether the third duration information is shorter than the cable manufacturing duration information. If the third duration information is less than this threshold, it is considered abnormal, which may indicate the existence of some defect or problem. The third defect information may be obtained by automatically triggering the extraction process of defect information when the abnormality of the duration information is detected, and determining the defect that matches it according to the time difference between the third duration information and the cable manufacturing duration information. For example, a large difference may be that the temperature of the equipment is too high and the equipment stops running to cool down. It may also be that the components of the manufacturing equipment are stuck or partially damaged, etc., but it is not limited to this.

[0154] Optionally, the method further comprises:

[0155] If the third duration information is greater than the cable manufacturing duration information, third feedback information is obtained; wherein the feedback information is used to indicate to the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured under simulation test analysis.

[0156] Exemplarily, the third duration information is directly compared with the cable manufacturing duration information, mainly by judging whether the manufacturing equipment can complete the cable manufacturing task within the expected time. For example, it can be by comparing the total duration and then making a logical judgment. If the third duration information is greater than the cable manufacturing duration information, it means that the manufacturing equipment, under the simulation test analysis, has completed the total working time indicated by the cable manufacturing duration information, proving that the manufacturing equipment can complete the manufacturing task of the electronic computer cable to be manufactured, and the completion information is used as the third feedback information.

[0157] S335, determining the third defect information as the third state information.

[0158] Exemplarily, all defect information collected is reviewed. The defect information may be at least one of possible equipment aging defects, equipment temperature abnormality defects and component defects obtained by simulation analysis of manufacturing equipment, and defect information belonging to the third category of defects is determined. If the third category of defect data is determined to be an equipment aging defect, the degree of influence of the aged component can be understood by performing a weight analysis on the aged component, and the third state information is determined based on the degree of influence.

[0159] This setting improves the efficiency of problem solving and can quickly identify critical defects, such as equipment aging. The application of weight analysis further refines the severity of the problem. By evaluating the weight of aging components, it not only reveals their importance in the entire system, but also provides a scientific basis for subsequent maintenance decisions. This data-based decision-making method avoids the limitations of empirical judgment alone and ensures the rationality and effectiveness of resource allocation.

[0160] S340, performing combined analysis based on the first state information, the second state information, and the third state information to obtain device state information.

[0161] It can be understood that the combined analysis can be to summarize and analyze the states of the first state information, the second state information, and the third state information to obtain the device state information. For example, the device state information can be obtained by obtaining the first state information, the second state information, and the third state information, and analyzing the first state information, the second state information, and the third state information by weighted average method, and determining that the first state information has the largest influencing factor, the second state information has the second largest influencing factor, and finally the third state information has the smallest influencing factor. The largest influencing factor, the second largest influencing factor, and the smallest influencing factor can be scored respectively. After the scoring is completed, the first scoring result with the largest influencing factor, the second scoring result with the second largest influencing factor, and the third scoring result with the smallest influencing factor can be obtained. The three scores are assigned a certain proportion of values ​​according to the weights, and numerical analysis is performed to obtain the equipment status information; for example, the first score result can take the score proportion to 45% (because it has the greatest influencing factor), the second score result can take the score proportion to 35%, and the second score result can take the score proportion to 20%. For example, the first score result is 85, the second score result is 78, and the first score result is 70, so the first score result of 85 multiplied by the proportion of 45% is 38.25, the second score result of 78 multiplied by the proportion of 35% is 27.3, and the third score result of 70 multiplied by the proportion of 20% is 14, so the three are summed up to 38.25+27.3+14, which is equal to 79.55. The defects in equipment aging defects, equipment temperature abnormality defects and component defects have an impact degree of 79.55 on the manufacturing equipment.

[0162] In one possible implementation, see Figure 7 S340, performing combined analysis based on the first state information, the second state information and the third state information to obtain device state information, including:

[0163] S341, performing defect probability analysis based on the first state information to determine first state sub-information; wherein the first state sub-information is used to indicate at least one of a defect probability value corresponding to an equipment aging defect, a probability value corresponding to an equipment temperature abnormality defect, and a probability value corresponding to a component defect.

[0164] It can be understood that the defect probability value corresponding to the equipment aging defect, the probability value corresponding to the equipment temperature abnormality defect or the probability value corresponding to the component defect can be understood as the probability that the manufacturing equipment may have an equipment aging defect.

[0165] Exemplarily, the first state information is subjected to defect probability analysis to obtain the first state sub-information; before defect probability analysis, the fault characteristics of the manufacturing equipment may be extracted, such as the fault occurrence interval, the equipment wear rate, and the occurrence of a fault after a period of use, and a defect probability analysis method may be selected according to the fault characteristics. For example, the analysis method may select a Bayesian network, and the fault characteristics (such as the fault occurrence interval, the equipment wear rate, and the occurrence of a fault after a period of use) may be input into the Bayesian network to calculate the probability value of the defect caused by equipment aging; the above is an example of the defect of equipment aging;

[0166] S342, performing defect probability analysis based on the second state information to determine second state sub-information; wherein the second state sub-information is used to indicate at least one of a defect probability value corresponding to an equipment aging defect, a probability value corresponding to an equipment temperature abnormality defect, and a probability value corresponding to a component defect.

[0167] Exemplarily, the second state sub-information can be obtained by performing defect probability analysis on the second state information;

[0168] Before defect probability analysis, the fault characteristics of the manufacturing equipment can be extracted, such as average temperature, temperature fluctuation range, and temperature anomaly peak. The defect probability analysis method is selected according to the fault characteristics. The defect probability analysis can use the Bayesian analysis method to calculate the defect probability value; the fault characteristics (such as average temperature, temperature fluctuation range, and temperature anomaly peak) are input into the Bayesian network to calculate the probability value that the cause of the fault characteristics is the abnormal temperature defect of the equipment. The above is an example of the abnormal temperature defect of the equipment;

[0169] S343, performing defect probability analysis based on the third state information to determine third state sub-information; wherein the third state sub-information is used to indicate at least one of a defect probability value corresponding to an equipment aging defect, a probability value corresponding to an equipment temperature abnormality defect, and a probability value corresponding to a component defect.

[0170] Exemplarily, the third state sub-information can be obtained by performing a defect probability analysis on the third state information; before the defect probability analysis, the fault characteristics of the manufacturing equipment can be extracted, such as the usage cycle, component loss rate, vibration data, etc., and a defect probability analysis method can be selected according to the fault characteristics. For example, a Bayesian network is selected as the method, and the fault characteristics (such as the usage cycle, component loss rate, vibration data, etc.) are input into the Bayesian network to calculate the probability value that the defect cause of the manufacturing equipment is a component defect; the above is an example of a component defect situation.

[0171] Three types of defects are exemplified in step S341, step S342 and step S343; step S341 is an example of equipment aging defects; step S342 is an example of equipment temperature abnormality defects; step S343 is an example of component defects; different defects exemplified in step S342 and step S343 can also be exemplified in step S341 at the same time; therefore, in step S342, in addition to the equipment temperature abnormality defect, the defects in step S341 and step S343 can also be exemplified, and step S343 is the same as the previous two.

[0172] The establishment of a Bayesian network can be done by first collecting equipment failure data and then calculating the defect probability based on conditional probability; the collected equipment failure data can be equipment aging data, temperature data, fatigue data and failure data; equipment aging data can include equipment service life, annual operating time, maintenance records, etc.; temperature data can include equipment temperature sensor data, including temperature fluctuation range and abnormal conditions; fatigue data can include information such as fatigue degree and noise through regular inspection of equipment; failure data can include historical equipment failure data, environmental information when the failure occurred, and equipment status. Conditional probability can be divided into conditional probability of equipment aging on equipment failure status, conditional probability of temperature abnormality on component consumption, and construction conditional probability, and finally a Bayesian network can be constructed.

[0173] Table 1 shows the conditional probability diagram of equipment aging and equipment failure status:

[0174]

[0175]

[0176] Table 1

[0177] Table 2 shows the conditional probability diagram of temperature anomaly on component consumption:

[0178] state noise Component wear Normal temperature 0.2 0.3 abnormal 0.8 0.7

[0179] Table 2

[0180] Table 3 shows the conditional probability graph of component defects:

[0181] Maintenance level Component wear Failure rate Low Low 0.05 Low high 0.15 middle middle 0.3 middle high 0.6 high Low 0.5 high high 0.9

[0182] Table 3

[0183] S344, using the Bayesian method to perform multi-information fusion calculation on the first state sub-information, the second state sub-information and the third state sub-information to obtain device state information.

[0184] Exemplarily, in the Bayesian multi-information fusion calculation framework, the fusion processing of the first state sub-information, the second state sub-information and the third state sub-information is carried out to obtain the device state information; the fusion processing can be carried out by defining the state space and prior probability, constructing the likelihood function, and applying the Bayesian formula to perform information fusion and decision-making and output processes; wherein, the definition of the state space and the prior probability can be performed by clarifying the possible state space of the device, that is, the set of all states that the device may be in, and assigning a prior probability to each sub-state information based on historical data, professional knowledge or domain experience, and these prior probabilities reflect the possibility of the device state corresponding to each sub-state information occurring when there is no new information; constructing the likelihood function can For each sub-state information, a likelihood function is constructed between it and each possible state of the device. The likelihood function describes the probability that the device is in a certain state under the given sub-state information. The relationship between the sub-state information and the device state can be modeled, for example, using probability distribution forms such as Gaussian distribution and multinomial distribution; applying the Bayesian formula for information fusion can be achieved by combining the likelihood function of each sub-state information with the corresponding prior probability, calculating the updated posterior probability, and then combining all sub-state information to evaluate the overall state of the device to obtain the posterior probability, and using the maximum posterior probability criterion to determine the final state of the manufacturing device; for example, the manufacturing equipment has three possible states: normal, minor fault and major fault. The prior probability is assigned to each sub-state information through the first state sub-information, the second state sub-information and the third state sub-information, and then the likelihood function between each sub-state information and the device state is constructed based on historical data, and the Bayesian formula is applied to fuse the information to obtain the posterior probability of each state.

[0185] Such a setting can enhance the accuracy of state assessment. By combining the likelihood function and prior probability of multiple sub-state information, it can more comprehensively and meticulously characterize the equipment state, reduce the error and uncertainty caused by a single information source, effectively integrate various information, improve the accuracy of state assessment, promote fault prediction and preventive maintenance, help reduce the probability and impact of failures, and improve the reliability and availability of manufacturing equipment.

[0186] S400, performing defect correction on the device status information, and then obtaining manufacturing plan information of the electronic computer cable to be manufactured based on the defect-corrected device status information and device parameter information; wherein the manufacturing plan information is used to control the manufacturing equipment to manufacture the electronic computer cable.

[0187] Exemplarily, defects in the equipment status information can be corrected, and then the manufacturing plan information of the electronic computer cable to be manufactured can be obtained based on the equipment status information and equipment parameter information after the defects are corrected; the correction of defects in the equipment status information can be divided into defect assessment and classification, defect correction plan design and implementation of the correction plan for correction; among them, defect assessment and classification can be for the identified defects, further assessment of the severity and scope of impact, according to the nature and degree of the defects, they are classified into minor, medium or severe levels, and determine whether immediate shutdown and maintenance are required; defect correction plan design can be for different types of defects, design specific correction plans, which can include replacement of faulty parts, adjustment of equipment operating parameters, optimization of maintenance plans, etc. In addition, when designing the plan, factors such as time and technical feasibility need to be considered comprehensively.

[0188] Such a setting helps to quickly identify the severity of the problem, so as to reasonably allocate resources and avoid unnecessary downtime; and for serious defects, emergency maintenance procedures can be quickly initiated to prevent the problem from expanding and affecting the overall production schedule. It can better control production costs, improve product quality, shorten production cycles, and significantly improve the manufacturing efficiency and product quality of electronic computer cables in many aspects. It can identify and correct potential problems, effectively prevent production delays and quality problems caused by equipment failure or data errors, reduce manufacturing time, and technicians can accurately understand the operating time of manufacturing equipment in the workshop, reducing the occurrence of safety risks.

[0189] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0190] Corresponding to the electronic computer cable manufacturing method described in the above embodiment, the embodiment of the present application also provides an electronic computer cable manufacturing system, and each unit of the system can implement each step of the electronic computer cable manufacturing method. Figure 8 A structural block diagram of an electronic computer cable manufacturing system provided in an embodiment of the present application is shown. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0191] Reference Figure 8 , the electronic computer cable manufacturing system comprises:

[0192] An acquisition unit, used to acquire application field information of the electronic computer cable to be manufactured; wherein the application field information is used to indicate the application scenario of the electronic computer cable to be manufactured;

[0193] A determination unit, used to determine manufacturing equipment information and equipment parameter information that meet the application scenario according to the application field information; wherein the manufacturing equipment information is used to indicate the manufacturing equipment required to produce the electronic computer cable to be manufactured, and the equipment parameter information is used to indicate the equipment parameters that need to be set in the manufacturing equipment;

[0194] An analysis unit, used to analyze the manufacturing equipment information to obtain equipment status information; wherein the equipment status information is used to reflect defects that occur when the manufacturing equipment is running for a long time;

[0195] The result unit is used to correct defects in the device status information, and then obtain the manufacturing plan information of the electronic computer cable to be manufactured based on the defect-corrected device status information and device parameter information; wherein the control device uses the manufacturing plan information to control the manufacturing equipment to manufacture the electronic computer cable.

[0196] It should be noted that the information interaction, execution process, etc. between the above-mentioned systems / units are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0197] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the system can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0198] The present application also provides a computer cable manufacturing device. Fig. 9 This is a schematic diagram of the structure of a control device for electronic computer cable manufacturing equipment provided in one embodiment of the present application. Fig. 9 As shown, the control device 6 of this embodiment includes: at least one processor 60 ( Fig. 9 Only one is shown), at least one memory 61 ( Fig. 9 Only one is shown) and a computer program 62 stored in the at least one memory 61 and executable on the at least one processor 60, when the processor 60 executes the computer program 62, the control device 6 implements the steps in any of the above-mentioned electronic computer cable manufacturing method embodiments, or the control device 6 implements the functions of each module / unit in the above-mentioned system embodiments.

[0199] Exemplarily, the computer program 62 may be divided into one or more modules / units, which are stored in the memory 61 and executed by the processor 60 to complete the present application. The one or more modules / units may be a series of computer program instruction segments capable of completing specific functions, which are used to describe the execution process of the computer program 62 in the control device 6.

[0200] The control device 6 may be a computing device such as a desktop computer, a notebook, a palm computer, etc. The control device may include, but is not limited to, a processor 60 and a memory 61. Those skilled in the art will understand that Fig. 9 It is only an example of the control device 6 and does not constitute a limitation on the control device 6. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, it may also include input and output devices, network access devices, buses, etc.

[0201] The processor 60 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0202] In some embodiments, the memory 61 may be an internal storage unit of the control device 6, such as a hard disk or memory of the control device 6. In other embodiments, the memory 61 may also be an external storage device of the control device 6, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the control device 6. Further, the memory 61 may also include both an internal storage unit and an external storage device of the control device 6. The memory 61 is used to store an operating system, an application program, a boot loader (BootLoader), data, and other programs, such as the program code of the computer program. The memory 61 may also be used to temporarily store data that has been output or is to be output.

[0203] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in any of the above method embodiments are implemented.

[0204] An embodiment of the present application provides a computer program product. When the computer program product is run on an electronic computer cable manufacturing device, the electronic computer cable manufacturing device implements the steps in any of the above-mentioned method embodiments.

[0205] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium can at least include: any entity or system, recording medium, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, RandomAccess Memory), electric carrier signal, telecommunication signal and software distribution medium that can carry the computer program code to the electronic computer cable manufacturing equipment. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0206] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0207] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0208] In the embodiments provided in the present application, it should be understood that the disclosed electronic computer cable manufacturing system, electronic computer cable manufacturing equipment and method can be implemented in other ways. For example, the electronic computer cable manufacturing system and electronic computer cable manufacturing equipment embodiments described above are only schematic, for example, the division of the modules or units is only a logical function division, and there can be other division methods in actual implementation, for example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point, the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0209] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0210] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A method for manufacturing a computer cable, characterized in that: include: Acquire application field information of the electronic computer cable to be manufactured; wherein the application field information is used to indicate the application scenario of the electronic computer cable to be manufactured; Determine manufacturing equipment information and equipment parameter information that meet the application scenario according to the application field information; wherein the manufacturing equipment information is used to indicate the manufacturing equipment required to produce the electronic computer cable to be manufactured, and the equipment parameter information is used to indicate the equipment parameters that need to be set in the manufacturing equipment; Analyze the manufacturing equipment information to obtain equipment status information; wherein the equipment status information is used to reflect defects that occur when the manufacturing equipment is running for a long time; Defect correction is performed on the device status information, and then manufacturing plan information of the electronic computer cable to be manufactured is obtained based on the defect-corrected device status information and the device parameter information; wherein the control device uses the manufacturing plan information to control the manufacturing equipment to manufacture the electronic computer cable.

2. The method for manufacturing a computer cable according to claim 1, wherein: The determining of manufacturing equipment information and equipment parameter information that conforms to the application scenario according to the application field information includes: Determine the performance standard information and multiple equipment satisfaction information of the electronic computer cable to be manufactured according to the application field information; wherein the performance standard information is used to indicate the performance target value of the electronic computer cable to be manufactured in the application scenario, and the equipment satisfaction information is used to indicate the manufacturing equipment that meets the application field information; Using the performance standard information to perform parameter matching on the manufacturing equipment to obtain the equipment parameter information; Performing performance evaluation on the plurality of equipment compliance information, comparing the plurality of evaluation performance values ​​obtained after the performance evaluation with the performance target value indicated by the performance standard information, and obtaining equipment compliance information; wherein the equipment compliance information is used to indicate the manufacturing equipment that meets the performance target value; The manufacturing equipment information is determined based on the equipment compliance information.

3. The method for manufacturing a computer cable according to claim 1, wherein: The analyzing based on the manufacturing equipment information to obtain equipment status information includes: Performing an estimated test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain first status information; wherein the first status information is used to reflect the defect situation that occurs after the estimated test analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information; Performing human-machine detection and analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain second status information; wherein the second status information is used to reflect defects that occur after the human-machine detection and analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information; Performing simulation test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain third status information; wherein the third status information is used to reflect the defect situation that occurs after the simulation test analysis is performed on the manufacturing equipment indicated by the manufacturing equipment information; The device status information is obtained by performing a combined analysis based on the first status information, the second status information and the third status information.

4. The method for manufacturing a computer cable according to claim 3, characterized in that: The performing estimated test analysis on the manufacturing equipment indicated by the manufacturing equipment information to obtain first status information includes: Determine the cable manufacturing time information of the electronic computer cable to be manufactured; wherein the cable manufacturing time information is used to indicate the total time required to manufacture the electronic computer cable to be manufactured; Extracting historical information of the manufacturing equipment indicated by the manufacturing equipment information to obtain basic equipment information; wherein the basic equipment information is used to reflect the maintenance status and equipment age of the manufacturing equipment; Determine first duration information according to the maintenance situation and the age of the equipment; wherein the first duration information is used to indicate the total working time that the manufacturing equipment can still operate; The first duration information is compared with the cable manufacturing duration information, and if the first duration information is less than the cable manufacturing duration information, first defect information is obtained; wherein the first defect information is used to indicate that the manufacturing equipment may have at least one of equipment aging defect, equipment temperature abnormality defect and component defect while it is still operational; The first defect information is determined as the first state information.

5. The method for manufacturing a computer cable according to claim 4, characterized in that: The method further comprises: If the first duration information is greater than the cable manufacturing duration information, first feedback information is obtained; wherein, the feedback information is used to prompt the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured under the estimated test analysis.

6. The method for manufacturing a computer cable according to claim 4, characterized in that: The performing of human-machine detection and analysis on the manufacturing equipment information to obtain the second status information includes: Divide the manufacturing equipment indicated by the manufacturing equipment information into detection positions to obtain first detection information and second detection information; wherein the first detection information is used to indicate the local position where a technician needs to detect the manufacturing equipment, and the second detection information is used to indicate the local position where a detection machine needs to detect the manufacturing equipment; A technician performs a test on the test position indicated by the first test information to obtain first test status information; wherein the first test status information is used to reflect the fatigue status of the test position indicated by the first test information; The detection position indicated by the second detection information is detected by the detection machine to obtain second detection status information; wherein the second detection status information is used to reflect the fatigue status of the detection position indicated by the second detection information; Performing an input operation to perform status detection on the first detection status information and the second detection status information through the detection machine to obtain second duration information; wherein the second duration information is used to indicate the total working duration of the manufacturing equipment obtained according to the detection of the detection machine, and the input operation is to input the first detection status information into the detection machine; The second duration information is compared with the cable manufacturing duration information, and if the second duration information is less than the cable manufacturing duration information, second defect information is obtained; wherein the second defect information is used to indicate at least one of an equipment aging defect, an equipment temperature abnormality defect, and a component defect that occurs in the manufacturing equipment according to the detection machine; determining the second defect information as the second state information; And / or, the method further comprises: If the second duration information is greater than the cable manufacturing duration information, second feedback information is obtained; wherein, the feedback information is used to prompt the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured during the human-machine detection and analysis.

7. The method for manufacturing a computer cable according to claim 4, wherein: The simulation test analysis of the manufacturing equipment information to obtain the third state information includes: Extracting size parameters, power parameters, maintenance content, technical parameters and process parameters according to the manufacturing equipment information; Using the size parameter, the power parameter, the maintenance content, the technical parameter and the process parameter as modeling parameters, modeling is performed in a modeling software to obtain an equipment model of the manufacturing equipment; Performing a simulated manufacturing operation on the electronic computer cable to be manufactured based on the equipment model and the equipment parameter information, and determining third duration information; wherein the third duration information is used to indicate the total working duration of the manufacturing equipment obtained according to the simulation analysis; The third duration information is compared with the cable manufacturing duration information. If the third duration information is less than the cable manufacturing duration information, third defect information is obtained; wherein the third defect information is used to indicate at least one of possible equipment aging defects, equipment temperature abnormality defects and component defects obtained by simulation analysis of the manufacturing equipment; determining the third defect information as the third state information; And / or, the method further comprises: If the third duration information is greater than the cable manufacturing duration information, third feedback information is obtained; wherein, the feedback information is used to indicate to the technician that the manufacturing equipment meets the manufacturing task of the electronic computer cable to be manufactured under the simulation test analysis.

8. The method for manufacturing a computer cable according to claim 4, wherein: The obtaining the device status information by combining and analyzing the first status information, the second status information, and the third status information includes: Determine first state sub-information by performing defect probability analysis according to the first state information; wherein the first state sub-information is used to indicate at least one of a defect probability value corresponding to the device aging defect, a probability value corresponding to the device temperature abnormality defect, and a probability value corresponding to the component defect; Determine second state sub-information by performing defect probability analysis according to the second state information; wherein the second state sub-information is used to indicate at least one of a defect probability value corresponding to the device aging defect, a probability value corresponding to the device temperature abnormality defect, and a probability value corresponding to the component defect; Determine the third state sub-information by performing defect probability analysis according to the third state information; wherein the third state sub-information is used to indicate at least one of a defect probability value corresponding to the device aging defect, a probability value corresponding to the device temperature abnormality defect, and a probability value corresponding to the component defect; A Bayesian method is used to perform multi-information fusion calculation on the first state sub-information, the second state sub-information and the third state sub-information to obtain the device state information.

9. An electronic computer cable manufacturing device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method according to any one of claims 1 to 8 is implemented.

10. An electronic computer cable, characterized in that: The electronic computer cable is manufactured by the electronic computer cable manufacturing equipment according to claim 9.

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