Phase diagram optimization method and device, equipment, storage medium and product

Abstract

The invention belongs to the technical field of optical communication, and discloses a phase diagram optimization method and device, equipment, a storage medium and a product. Determining a plurality of initial phase diagrams corresponding to the wavelength selection switch according to the plurality of groups of initial parameters, then obtaining a plurality of optical power sets corresponding to an output port of the wavelength selection switch, determining a plurality of worst port isolation degrees according to the plurality of optical power sets, and when the plurality of worst port isolation degrees are all lower than a preset threshold value, determining the wavelength selection switch according to the plurality of initial phase diagrams. And adjusting the plurality of groups of initial parameters according to the plurality of worst port isolation degrees to obtain a plurality of groups of target parameters, and determining a target phase diagram corresponding to the wavelength selection switch according to the plurality of groups of target parameters. According to the invention, multiple groups of initial parameters are respectively adjusted according to multiple worst port isolation degrees, and only the initial parameters corresponding to the initial phase diagram can be adjusted, so that the port isolation degree of the wavelength selection switch is rapidly improved, and the target phase diagram corresponding to the wavelength selection switch is determined according to multiple groups of target parameters. And an optimal target phase diagram can be generated.

Description

Technical Field

[0001] The present application relates to the field of optical communication technology, and in particular to a phase diagram optimization method, device, equipment, storage medium and product. Background Art

[0002] Wavelength Selective Switch (WSS) is a core component in optical switching systems. Among them, WSS based on Liquid Crystal on Silicon (LCoS) has become the mainstream technical solution for WSS due to its advantages such as high resolution, high reliability, flexible grid and programmability. When realizing beam deflection, it is necessary to load a periodic ramp electric field on the LCoS to produce the effect of a blazed grating. Since the difference in the electric field at the junction of adjacent periods is too large and affects each other, an edge field effect will be generated, resulting in the appearance of high-order diffraction light. These high-order diffraction lights will be focused on non-target output ports to form crosstalk. The port isolation of WSS based on LCoS is generally low and it is difficult to meet communication requirements. Generally speaking, the isolation index of WSS is determined by the worst port isolation. Therefore, how to quickly improve the isolation of WSS ports and generate the optimal phase diagram has become an urgent problem to be solved. Summary of the invention

[0003] The main purpose of this application is to provide a phase diagram optimization method, device, equipment, storage medium and product, aiming to solve the technical problem of quickly improving the isolation of WSS ports and generating an optimal phase diagram.

[0004] To achieve the above object, the present application provides a phase diagram optimization method, which comprises the following steps:

[0005] Determine a plurality of initial phase diagrams corresponding to the wavelength selective switch according to the plurality of groups of initial parameters;

[0006] Acquire multiple optical power sets corresponding to the output port of the wavelength selective switch, and determine multiple worst port isolations according to the multiple optical power sets;

[0007] When the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and the target phase diagram corresponding to the wavelength selective switch is determined according to the multiple groups of target parameters.

[0008] Optionally, the step of determining a plurality of initial phase diagrams corresponding to the wavelength selective switch according to the plurality of groups of initial parameters specifically includes:

[0009] Determine multiple groups of initial parameters, each group of initial parameters includes a blazed grating period parameter, a blazed grating maximum phase value parameter, and a high-order diffraction elimination parameter;

[0010] Determining a plurality of initial phase functions according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the functional function, the high-order diffraction elimination parameter and the high-order diffraction elimination superposition function;

[0011] A plurality of initial phase diagrams corresponding to the wavelength selective switch are generated according to the plurality of initial phase functions.

[0012] Optionally, the step of determining multiple groups of initial parameters specifically includes:

[0013] Determine the period parameter of the blazed grating and the maximum phase value parameter of the blazed grating;

[0014] A plurality of groups of high-order diffraction elimination parameters are randomly generated, each group of high-order diffraction elimination parameters includes a superposition amplitude parameter and a superposition phase parameter.

[0015] Optionally, the step of determining a plurality of initial phase functions according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the functional function, the high-order diffraction elimination parameter and the high-order diffraction elimination superposition function specifically includes:

[0016] Determine a first function according to the blazed grating period parameter, the blazed grating maximum phase value parameter and a function function, wherein the function function is a periodic ramp function;

[0017] The second function is determined according to the superposition amplitude parameter, the superposition phase parameter and a high-order diffraction elimination superposition function, wherein the high-order diffraction elimination superposition function is a sine wave superposition function.

[0018] Optionally, the step of acquiring a plurality of optical power sets corresponding to the output port of the wavelength selective switch and determining a plurality of worst port isolations according to the plurality of optical power sets specifically includes:

[0019] Acquire multiple optical power sets corresponding to the output ports of the wavelength selective switch;

[0020] For each optical power set, selecting a target port power and a plurality of non-target port powers from the optical power set;

[0021] Determining the isolation of the non-output port in the wavelength selective switch according to the target port power and the multiple non-target port powers;

[0022] The worst port isolation is determined according to the isolation, and multiple worst port isolations are determined by obtaining the multiple optical power sets.

[0023] Optionally, when the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and the step of determining the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters specifically includes:

[0024] When all of the multiple worst port isolations are lower than a preset threshold, selecting a preset number of target worst port isolations from the multiple worst port isolations;

[0025] Selecting a plurality of groups of first parameters corresponding to the target worst port isolation from the plurality of groups of initial parameters;

[0026] Determine multiple sets of new initial parameters according to the multiple sets of first parameters, and return to the step of determining multiple initial phase diagrams corresponding to the wavelength selective switch according to the multiple sets of initial parameters until at least one new worst port isolation is higher than the preset threshold, and multiple sets of target parameters are obtained;

[0027] A target phase diagram corresponding to the wavelength selective switch is determined according to the multiple groups of target parameters.

[0028] In addition, to achieve the above-mentioned purpose, the present application also provides a phase diagram optimization device, the phase diagram optimization device comprising:

[0029] A phase diagram determination module, used to determine a plurality of initial phase diagrams corresponding to the wavelength selective switch according to a plurality of groups of initial parameters;

[0030] An isolation determination module, used to obtain a plurality of optical power sets corresponding to the output ports of the wavelength selective switch, and determine a plurality of worst port isolations according to the plurality of optical power sets;

[0031] The phase diagram optimization module is used to adjust the multiple groups of initial parameters respectively according to the multiple worst port isolations when the multiple worst port isolations are all lower than a preset threshold, obtain multiple groups of target parameters, and determine the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters.

[0032] In addition, to achieve the above-mentioned purpose, the present application also proposes a phase diagram optimization device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, and the computer program is configured to implement the steps of the phase diagram optimization method described above.

[0033] In addition, to achieve the above-mentioned purpose, the present application also proposes a storage medium, which is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the phase diagram optimization method described above are implemented.

[0034] In addition, to achieve the above-mentioned purpose, the present application also provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the steps of the phase diagram optimization method described above are implemented.

[0035] The present application determines multiple initial phase diagrams corresponding to the wavelength selective switch based on multiple groups of initial parameters, then obtains multiple optical power sets corresponding to the output ports of the wavelength selective switch, and determines multiple worst port isolations based on the multiple optical power sets. When the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and the target phase diagram corresponding to the wavelength selective switch is determined based on the multiple groups of target parameters. The present application first determines multiple initial phase diagrams corresponding to the wavelength selective switch based on multiple groups of initial parameters, and can preliminarily generate multiple initial phase diagrams, and then adjusts the multiple groups of initial parameters respectively according to the multiple worst port isolations, and can only adjust the initial parameters corresponding to the initial phase diagram, thereby quickly improving the port isolation of the wavelength selective switch, and determines the target phase diagram corresponding to the wavelength selective switch based on multiple groups of target parameters, and can generate the optimal target phase diagram. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0037] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0038] Figure 1 This is a schematic diagram of the flow chart of the first embodiment of the phase diagram optimization method of the present application;

[0039] Figure 2 A schematic diagram of a phase image optimization device according to an embodiment of the phase image optimization method of the present application;

[0040] Figure 3 A schematic diagram of another phase image optimization device according to an embodiment of the phase image optimization method of the present application;

[0041] Figure 4 This is a flow chart of a second embodiment of the phase diagram optimization method of the present application;

[0042] Figure 5 A grayscale image of a periodic ramp function according to an embodiment of the phase image optimization method of the present application;

[0043] Figure 6 A grayscale image of a sine wave superposition function according to an embodiment of the phase image optimization method of the present application;

[0044] Figure 7 A schematic diagram of a high-order diffraction elimination superposition function of an embodiment of the phase image optimization method of the present application;

[0045] Figure 8 This is a structural block diagram of the first embodiment of the phase diagram optimization device of the present application;

[0046] Fig. 9 It is a structural diagram of a phase diagram optimization device in a hardware operating environment involved in an embodiment of the present application.

[0047] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0048] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0049] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0050] The main solution of the embodiment of the present application is: determine multiple initial phase diagrams corresponding to the wavelength selective switch according to multiple groups of initial parameters; obtain multiple optical power sets corresponding to the output port of the wavelength selective switch, and determine multiple worst port isolations according to the multiple optical power sets; adjust the multiple groups of initial parameters respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and determine the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters.

[0051] Wavelength Selective Switch (WSS) is a core component in optical switching systems. Among them, WSS based on Liquid Crystal on Silicon (LCoS) has become the mainstream technical solution for WSS due to its advantages such as high resolution, high reliability, flexible grid and programmability. When realizing beam deflection, it is necessary to load a periodic ramp electric field on the LCoS to produce the effect of a blazed grating. Since the difference in the electric field at the junction of adjacent periods is too large and affects each other, an edge field effect will be generated, resulting in the appearance of high-order diffraction light. These high-order diffraction lights will be focused on non-target output ports to form crosstalk. The port isolation of WSS based on LCoS is generally low and it is difficult to meet communication requirements. Generally speaking, the isolation index of WSS is determined by the worst port isolation.

[0052] The present application determines multiple initial phase diagrams corresponding to the wavelength selective switch based on multiple groups of initial parameters, then obtains multiple optical power sets corresponding to the output ports of the wavelength selective switch, and determines multiple worst port isolations based on the multiple optical power sets. When the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and the target phase diagram corresponding to the wavelength selective switch is determined based on the multiple groups of target parameters. The present application first determines multiple initial phase diagrams corresponding to the wavelength selective switch based on multiple groups of initial parameters, and can preliminarily generate multiple initial phase diagrams, and then adjusts the multiple groups of initial parameters respectively according to the multiple worst port isolations, and can only adjust the initial parameters corresponding to the initial phase diagram, thereby quickly improving the port isolation of the wavelength selective switch, and determines the target phase diagram corresponding to the wavelength selective switch based on multiple groups of target parameters, and can generate the optimal target phase diagram.

[0053] It should be noted that the execution subject of the present application may be a computing service device with data processing, network communication and program running functions, such as a computer, or an electronic device capable of realizing the above functions, a phase map optimization device, etc. The following takes the phase map optimization device as an example to illustrate this embodiment and the following embodiments.

[0054] Based on this, the present application embodiment provides a phase diagram optimization method, referring to Figure 1 , Figure 1 It is a flowchart diagram of the first embodiment of the phase diagram optimization method of the present application.

[0055] In this embodiment, the phase diagram optimization method includes the following steps:

[0056] Step S10: determining a plurality of initial phase diagrams corresponding to the wavelength selective switch according to a plurality of groups of initial parameters.

[0057] Understandably, referring to Figure 2 , Figure 2 Schematic diagram of a phase diagram optimization device according to an embodiment of the phase diagram optimization method of the present application. Figure 2 As shown, 100 is an adjustable light source, 110 is a wavelength selective switch, 111 is an input / output port in the wavelength selective switch, 112 is an optical component in the wavelength selective switch, including a lens, a grating, etc., 113 is an LCoS panel in the wavelength selective switch, 114 is an LCoS driving device in the wavelength selective switch, 120 is a multi-channel optical power meter, and 130 is a host computer.

[0058] It should be understood that reference Figure 3 , Figure 3 Schematic diagram of another phase image optimization device according to an embodiment of the phase image optimization method of the present application, as shown in FIG. Figure 3As shown, 200 is an adjustable light source, 210 is a wavelength selection switch, 211-1 is an input port in the wavelength selection switch, 211-2 is an output port in the wavelength selection switch, 212-1 is an input optical component in the wavelength selection switch, 212-2 is an output optical component in the wavelength selection switch, including a lens, a grating, etc., 213 is an LCoS panel in the wavelength selection switch, 214 is an LCoS driving device in the wavelength selection switch, 120 is a multi-channel optical power meter, and 130 is a host computer. Figure 2 The difference is that the input / output optical paths of the wavelength selective switch in this structure are separated. Figure 2 and Figure 3 In the device, there is no requirement for the specific structure of the wavelength selective switch, nor is there any need to modify the structure of the wavelength selective switch, that is, the device is applicable to any form of wavelength selective switch, and the phase diagram optimization method is the same for these two devices.

[0059] In a specific implementation, the tunable light source emits a continuous laser, which enters the input port of the wavelength selective switch and is focused to the LCoS panel through the optical component. The LCoS panel will display an initial phase diagram, which is related to initial parameters. The initial parameters may be parameters related to the period of the blazed grating, parameters of the maximum phase value of the blazed grating, etc. One set of initial parameters corresponds to one initial phase diagram, so multiple sets of initial parameters may correspond to multiple initial phase diagrams.

[0060] Step S20: Acquire multiple optical power sets corresponding to the output ports of the wavelength selective switch, and determine multiple worst port isolations according to the multiple optical power sets.

[0061] It is understandable that after passing through the LCoS panel, the light beam is deflected and reflected back to the output port. One or more multi-channel optical power meters are used to detect all output ports simultaneously. The data detected by the multi-channel optical power meter is transmitted to the host computer through the data line for analysis, calculation and processing. The multi-power optical power meter can detect the optical power set, which is recorded as Q1, Q2...Qn, where n is the number of WSS output ports. An initial phase diagram can correspond to an optical power set, and multiple initial phase diagrams can correspond to multiple optical power sets. Each optical power set can correspond to a worst port isolation.

[0062] Furthermore, in order to accurately obtain the worst port isolation, in this embodiment, the step S20 includes: obtaining multiple optical power sets corresponding to the output port of the wavelength selective switch; for each optical power set, selecting a target port power and multiple non-target port powers from the optical power set; determining the isolation of the non-output port in the wavelength selective switch according to the target port power and the multiple non-target port powers; determining the worst port isolation according to the isolation, and obtaining multiple worst port isolations determined by the multiple optical power sets.

[0063] It should be understood that for each optical power set, the target port power and multiple non-target port powers can be selected from the optical power set. Assuming that in the optical power set, Q1 is the target port power and the others are non-target port powers, the isolation of the non-output port is the difference between the target port power and the non-target port power. For example, if n=9, it includes the isolation of 8 non-output ports, namely Q1-Q2, Q1-Q3, ... Q1-Q9. The minimum value of the isolation of these 8 non-output ports is the worst port isolation corresponding to the optical power set. For each optical power set, multiple worst port isolations can be obtained in the above manner.

[0064] Step S30: When the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and a target phase diagram corresponding to the wavelength selective switch is determined according to the multiple groups of target parameters.

[0065] Further, in order to effectively adjust the multiple groups of initial parameters respectively, in this embodiment, the step S30 includes: when the multiple worst port isolations are all lower than the preset threshold, selecting a preset number of target worst port isolations from the multiple worst port isolations; selecting multiple groups of first parameters corresponding to the target worst port isolations from the multiple groups of initial parameters; determining multiple groups of new initial parameters according to the multiple groups of first parameters, and returning to the step of determining multiple initial phase diagrams corresponding to the wavelength selective switch according to the multiple groups of initial parameters, until at least one new worst port isolation is higher than the preset threshold, and multiple groups of target parameters are obtained; determining the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters.

[0066] It is understandable that it is possible to determine whether multiple worst port isolations are all lower than a preset threshold. If not, the loop is stopped and the corresponding phase grayscale image is output. If so, a genetic algorithm is used to screen, sort, mutate, and inherit the initial parameters according to multiple worst port isolations to obtain the target parameters. Genetic process: Assuming that the 10 worst port isolations are all lower than the preset threshold, a preset number of target worst port isolations can be selected, and the preset number can be 2, 3, 4, 5, etc. This embodiment is described by taking the preset number of 5 as an example, and the 5 higher worst port isolations can be selected as the target worst isolations and used as parents, and then the first parameters corresponding to the 5 target worst isolations are determined, and 5 groups of new offspring parameters are generated according to the first parameters by weighted superposition, that is, 5 groups of new initial parameters; Mutation process: Randomly assign some parameters in the 5 groups of new offspring parameters and obtain another 5 groups of offspring parameters, which together form 10 groups of new initial parameters, and then return to the above step of determining multiple initial phase diagrams corresponding to the wavelength selective switch according to multiple groups of initial parameters, until at least one of the new worst port isolations obtained is higher than the preset threshold, and the corresponding new initial parameters are used as target parameters.

[0067] In a specific implementation, the above-mentioned mutation and inheritance process is an optimization and update process for all parameters, thereby generating a target phase diagram corresponding to the wavelength selective switch according to multiple sets of target parameters. The target phase diagram is generated after optimizing the initial phase diagram, and the worst port isolation corresponding to the target phase diagram is higher than a preset threshold.

[0068] This embodiment determines multiple initial phase diagrams corresponding to the wavelength selective switch according to multiple groups of initial parameters, then obtains multiple optical power sets corresponding to the output port of the wavelength selective switch, and determines multiple worst port isolations according to the multiple optical power sets. When the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and the target phase diagram corresponding to the wavelength selective switch is determined according to the multiple groups of target parameters. This embodiment first determines multiple initial phase diagrams corresponding to the wavelength selective switch according to multiple groups of initial parameters, and can preliminarily generate multiple initial phase diagrams, and then adjusts the multiple groups of initial parameters respectively according to the multiple worst port isolations, and can only adjust the initial parameters corresponding to the initial phase diagram, thereby quickly improving the port isolation of the wavelength selective switch, and determines the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters, and can generate the optimal target phase diagram.

[0069] refer to Figure 4 , Figure 4 It is a flowchart diagram of the second embodiment of the phase map optimization method of the present application.

[0070] Based on the above first embodiment, in this embodiment, step S10 includes:

[0071] Step S101: determining a plurality of groups of initial parameters, each group of initial parameters comprising a blazed grating period parameter, a blazed grating maximum phase value parameter and a high-order diffraction elimination parameter.

[0072] Furthermore, in order to effectively determine multiple groups of initial parameters, in the present embodiment, the step S101 includes: determining the blazed grating period parameters and the blazed grating maximum phase value parameters; randomly generating multiple groups of high-order diffraction elimination parameters, each group of high-order diffraction elimination parameters including a superposition amplitude parameter and a superposition phase parameter.

[0073] It can be understood that the initial parameters in this embodiment may include g, r, a1, p1, a2, p2, a3, and p3, where g is the blazed grating period parameter, and r is the blazed grating maximum phase value parameter. These two parameters can realize the basic beam deflection function, and a1, p1, a2, p2, a3, and p3 are high-order diffraction elimination parameters. This embodiment takes the three port isolation differences as an example for explanation, and the number of parameters can also be selected according to actual conditions, where ai, i=1, 2, 3 are superimposed amplitude parameters, and pi, i=1, 2, 3 are superimposed phase parameters. Through the joint action of these eight parameters, the corresponding crosstalk can be eliminated and the isolation of the isolation difference port can be improved.

[0074] It should be understood that in the initial phase diagram, g and r are set according to the actual function, and a1, p1, a2, p2, a3, and p3 are randomly generated. For example, g = 0.077, r = 2pi, a1, a2, and a3 are randomly generated between 0-0.2pi, and p1, p2, and p3 are randomly generated between 0-2pi. Ten groups of initial parameters can be generated, and this embodiment does not specifically limit the number of initial parameter groups.

[0075] Step S102: determining a plurality of initial phase functions according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the functional function, the high-order diffraction elimination parameter and the high-order diffraction elimination superposition function.

[0076] Furthermore, in order to effectively obtain multiple initial phase functions, in the present embodiment, the step S102 includes: determining a first function according to the blazed grating period parameter, the blazed grating maximum phase value parameter and a functional function, wherein the functional function is a periodic ramp function; determining a second function according to the superposition amplitude parameter, the superposition phase parameter and a high-order diffraction elimination superposition function, wherein the high-order diffraction elimination superposition function is a sinusoidal wave superposition function.

[0077] It can be understood that, assuming that there are 10 sets of initial parameters, the initial phase function in this embodiment can be expressed as: Φi=f(g,r)+ci(a1,p1,a2,p2,a3,p3),i=1,2…10, where f(g,r) is the first function, that is, the functional function, which can be specifically a periodic ramp function, and ci(a1,p1,a2,p2,a3,p3) is the second function, that is, the high-order diffraction elimination superposition function, which can be specifically a sinusoidal wave superposition function.

[0078] It should be understood that f(g,r) is a functional function, which may be a periodic ramp function. Figure 5 , Figure 5 This is a grayscale image of a periodic ramp function according to an embodiment of the phase image optimization method of the present application, such as Figure 5 As shown, 301 is a schematic diagram of a periodic ramp function, and 302 is a phase grayscale image of a periodic ramp function. It should be noted that since the grayscale image is periodic, the grayscale images shown here and later are all partial cutouts.

[0079] In the specific implementation, ci(a1, p1, a2, p2, a3, p3) is a high-order diffraction elimination superposition function, which can be a sine wave superposition function of three different frequencies, that is, ci = a1*sin(ω*t+p1)+a2*sin(ω / 2*t+p2)+a3*sin(ω / 3*t+p3), where ω = 2π / T, T is the period of the sine wave superposition function, refer to Figure 6 , Figure 6 This is a grayscale image of a sine wave superposition function according to an embodiment of the phase image optimization method of the present application, such as Figure 6 As shown, 401 is a schematic diagram of a sine wave function with a frequency of ω, 402 is a schematic diagram of a sine wave function with a frequency of ω / 2, 403 is a schematic diagram of a sine wave function with a frequency of ω / 3, 404 is a phase grayscale diagram of a sine wave function with a frequency of ω, 405 is a phase grayscale diagram of a sine wave function with a frequency of ω / 2, and 406 is a phase grayscale diagram of a sine wave function with a frequency of ω / 3.

[0080] In addition to the sine wave superposition function, ci can also be a square wave function of different frequencies, a triangle wave function, or a superposition of several functions, see Figure 7 , Figure 7 Schematic diagram of a high-order diffraction elimination superposition function of an embodiment of the phase image optimization method of the present application, such as Figure 7As shown, 501 is a phase grayscale diagram of a square wave function with a frequency of ω, 502 is a phase grayscale diagram of a square wave function with a frequency of ω / 2, 503 is a phase grayscale diagram of a square wave function with a frequency of ω / 3, 504 is a schematic diagram of a square wave function with a frequency of ω, 505 is a schematic diagram of a square wave function with a frequency of ω / 2, 506 is a schematic diagram of a square wave function with a frequency of ω / 3, 507 is a phase grayscale diagram of a triangle wave function with a frequency of ω, 508 is a phase grayscale diagram of a triangle wave function with a frequency of ω / 2, and 509 is a phase grayscale diagram of a triangle wave function with a frequency of ω / 3. Figure, 510 is a schematic diagram of a triangle wave function with a frequency of ω, 511 is a schematic diagram of a triangle wave function with a frequency of ω / 2, 512 is a schematic diagram of a triangle wave function with a frequency of ω / 3, 513 is a phase grayscale diagram of a triangle wave function with a frequency of ω, 514 is a phase grayscale diagram of a square sine wave function with a frequency of ω / 2, 515 is a phase grayscale diagram of a square wave function with a frequency of ω / 3, 516 is a schematic diagram of a triangle wave function with a frequency of ω, 517 is a schematic diagram of a sine wave function with a frequency of ω / 2, and 518 is a schematic diagram of a square wave function with a frequency of ω / 3.

[0081] Step S103: generating a plurality of initial phase diagrams corresponding to the wavelength selective switch according to the plurality of initial phase functions.

[0082] It should be understood that each initial phase function may correspond to an initial phase diagram of the wavelength selective switch.

[0083] This embodiment determines multiple groups of initial parameters, each group of initial parameters includes a blazed grating period parameter, a blazed grating maximum phase value parameter, and a high-order diffraction elimination parameter, and then determines multiple initial phase functions according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the function function, the high-order diffraction elimination parameter, and the high-order diffraction elimination superposition function, and then generates multiple initial phase diagrams corresponding to the wavelength selective switch according to the multiple initial phase functions. This embodiment determines multiple initial phase functions according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the function function, the high-order diffraction elimination parameter, and the high-order diffraction elimination superposition function, and can accurately and effectively obtain the initial phase function corresponding to each group of initial parameters, thereby accurately generating the corresponding initial phase diagram.

[0084] Reference Figure 8 , Figure 8 This is a structural block diagram of the first embodiment of the phase diagram optimization device of the present application.

[0085] like Figure 8 As shown, the phase diagram optimization device proposed in the embodiment of the present application includes:

[0086] A phase diagram determination module 10, configured to determine a plurality of initial phase diagrams corresponding to the wavelength selective switch according to a plurality of groups of initial parameters;

[0087] An isolation determination module 20, configured to obtain a plurality of optical power sets corresponding to the output ports of the wavelength selective switch, and determine a plurality of worst port isolations according to the plurality of optical power sets;

[0088] The phase diagram optimization module 30 is used to adjust the multiple groups of initial parameters respectively according to the multiple worst port isolations when the multiple worst port isolations are all lower than a preset threshold, obtain multiple groups of target parameters, and determine the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters.

[0089] This embodiment determines multiple initial phase diagrams corresponding to the wavelength selective switch according to multiple groups of initial parameters, then obtains multiple optical power sets corresponding to the output port of the wavelength selective switch, and determines multiple worst port isolations according to the multiple optical power sets. When the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and the target phase diagram corresponding to the wavelength selective switch is determined according to the multiple groups of target parameters. This embodiment first determines multiple initial phase diagrams corresponding to the wavelength selective switch according to multiple groups of initial parameters, and can preliminarily generate multiple initial phase diagrams, and then adjusts the multiple groups of initial parameters respectively according to the multiple worst port isolations, and can only adjust the initial parameters corresponding to the initial phase diagram, thereby quickly improving the port isolation of the wavelength selective switch, and determines the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters, and can generate the optimal target phase diagram.

[0090] It should be noted that the workflow described above is merely illustrative and does not limit the scope of protection of the present application. In practical applications, technicians in this field can select part or all of it according to actual needs to achieve the purpose of the present embodiment, and no limitation is made here.

[0091] In addition, for technical details not fully described in this embodiment, reference can be made to the phase diagram optimization method provided in any embodiment of the present application, and will not be repeated here.

[0092] Based on the above-mentioned first embodiment of the phase diagram optimization device of the present application, a second embodiment of the phase diagram optimization device of the present application is proposed.

[0093] In this embodiment, the phase diagram determination module 10 is also used to determine multiple groups of initial parameters, each group of initial parameters includes a blazed grating period parameter, a blazed grating maximum phase value parameter and a high-order diffraction elimination parameter; multiple initial phase functions are determined according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the functional function, the high-order diffraction elimination parameter and the high-order diffraction elimination superposition function; and multiple initial phase diagrams corresponding to the wavelength selective switch are generated according to the multiple initial phase functions.

[0094] Furthermore, the phase diagram determination module 10 is also used to determine the blazed grating period parameter and the blazed grating maximum phase value parameter; randomly generate multiple groups of high-order diffraction elimination parameters, each group of high-order diffraction elimination parameters includes a superposition amplitude parameter and a superposition phase parameter.

[0095] Furthermore, the phase diagram determination module 10 is also used to determine a first function based on the blazed grating period parameter, the blazed grating maximum phase value parameter and a functional function, wherein the functional function is a periodic ramp function; and to determine a second function based on the superposition amplitude parameter, the superposition phase parameter and a high-order diffraction elimination superposition function, wherein the high-order diffraction elimination superposition function is a sinusoidal wave superposition function.

[0096] Furthermore, the isolation determination module 20 is also used to obtain multiple optical power sets corresponding to the output ports of the wavelength selective switch; for each optical power set, select a target port power and multiple non-target port powers from the optical power set; determine the isolation of the non-output port in the wavelength selective switch according to the target port power and the multiple non-target port powers; determine the worst port isolation according to the isolation, and obtain multiple worst port isolations determined by the multiple optical power sets.

[0097] Furthermore, the phase diagram optimization module 30 is also used to select a preset number of target worst port isolations from the multiple worst port isolations when all of the multiple worst port isolations are lower than a preset threshold; select multiple groups of first parameters corresponding to the target worst port isolations from the multiple groups of initial parameters; determine multiple groups of new initial parameters according to the multiple groups of first parameters, and return to the step of determining multiple initial phase diagrams corresponding to the wavelength selective switch according to the multiple groups of initial parameters, until at least one new worst port isolation is higher than the preset threshold, and multiple groups of target parameters are obtained; determine the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters.

[0098] Other embodiments or specific implementations of the phase diagram optimization device of the present application can refer to the above-mentioned method embodiments and will not be described in detail here.

[0099] The present application provides a phase diagram optimization device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the phase diagram optimization method in the above-mentioned embodiment one.

[0100] Reference below Fig. 9, which shows a schematic diagram of the structure of a phase diagram optimization device suitable for implementing the embodiment of the present application. The phase diagram optimization device in the embodiment of the present application may include but is not limited to mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions), PMPs (Portable Media Players), vehicle-mounted terminals (such as vehicle-mounted navigation terminals), etc., and fixed terminals such as digital TVs, desktop computers, etc. Fig. 9 The phase diagram optimization device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0101] like Fig. 9 As shown, the phase diagram optimization device may include a processing device 1001 (e.g., a central processing unit, a graphics processor, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM: Read Only Memory) 1002 or a program loaded from a storage device 1003 to a random access memory (RAM: Random Access Memory) 1004. In RAM1004, various programs and data required for the operation of the phase diagram optimization device are also stored. The processing device 1001, ROM1002, and RAM1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Generally, the following systems can be connected to the I / O interface 1006: an input device 1007 including, for example, a touch screen, a touch pad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; an output device 1008 including, for example, a liquid crystal display (LCD: Liquid Crystal Display), a speaker, a vibrator, etc.; a storage device 1003 including, for example, a magnetic tape, a hard disk, etc.; and a communication device 1009. The communication device 1009 can allow the phase diagram optimization device to communicate with other devices wirelessly or by wire to exchange data. Although the phase diagram optimization device with various systems is shown in the figure, it should be understood that it is not required to implement or have all the systems shown. More or fewer systems can be implemented or have alternatively.

[0102] In particular, according to the embodiments disclosed in the present application, the process described above with reference to the flowchart can be implemented as a computer software program. For example, the embodiments disclosed in the present application include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication device, or installed from a storage device 1003, or installed from a ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present application are executed.

[0103] The phase diagram optimization device provided by the present application adopts the phase diagram optimization method in the above embodiment, which can solve the technical problem of how to quickly improve the isolation of the WSS port and generate the optimal phase diagram. Compared with the prior art, the beneficial effects of the phase diagram optimization device provided by the present application are the same as the beneficial effects of the phase diagram optimization method provided by the above embodiment, and the other technical features in the phase diagram optimization device are the same as the features disclosed in the method of the previous embodiment, which will not be repeated here.

[0104] It should be understood that the various parts disclosed in this application can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0105] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

[0106] The present application provides a computer-readable storage medium having computer-readable program instructions (ie, computer programs) stored thereon, and the computer-readable program instructions are used to execute the phase map optimization method in the above-mentioned embodiment.

[0107] The computer-readable storage medium provided in the present application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency), etc., or any suitable combination of the above.

[0108] The computer-readable storage medium may be included in the phase diagram optimization device; or may exist independently without being assembled into the phase diagram optimization device.

[0109] The computer-readable storage medium carries one or more programs. When the one or more programs are executed by the phase diagram optimization device, the phase diagram optimization device: determines multiple initial phase diagrams corresponding to the wavelength selective switch according to multiple groups of initial parameters; obtains multiple optical power sets corresponding to the output ports of the wavelength selective switch, and determines multiple worst port isolations according to the multiple optical power sets; adjusts the multiple groups of initial parameters respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and determines the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters.

[0110] Computer program code for performing the operations of the present application may be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0111] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present application. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0112] The modules involved in the embodiments described in this application may be implemented by software or hardware, wherein the name of the module does not constitute a limitation on the unit itself in some cases.

[0113] The readable storage medium provided in the present application is a computer-readable storage medium, which stores computer-readable program instructions (i.e., computer programs) for executing the above-mentioned phase diagram optimization method, and can solve the technical problem of how to quickly improve the isolation of WSS ports and generate an optimal phase diagram. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided in the present application are the same as the beneficial effects of the phase diagram optimization method provided in the above-mentioned embodiment, and will not be repeated here.

[0114] The present application also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the steps of the phase diagram optimization method as described above are implemented.

[0115] The computer program product provided by the present application can solve the technical problem of how to quickly improve the isolation of WSS ports and generate an optimal phase diagram. Compared with the prior art, the beneficial effects of the computer program product provided by the present application are the same as the beneficial effects of the phase diagram optimization method provided by the above embodiment, which will not be repeated here.

[0116] The above descriptions are only some embodiments of the present application, and are not intended to limit the patent scope of the present application. All equivalent structural changes made using the contents of the present application specification and drawings under the technical concept of the present application, or direct / indirect applications in other related technical fields are included in the patent protection scope of the present application.

Claims

1. A phase diagram optimization method, characterized in that: The phase diagram optimization method comprises the following steps: Determine a plurality of initial phase diagrams corresponding to the wavelength selective switch according to the plurality of groups of initial parameters; Acquire multiple optical power sets corresponding to the output port of the wavelength selective switch, and determine multiple worst port isolations according to the multiple optical power sets; When the multiple worst port isolations are all lower than a preset threshold, the multiple groups of initial parameters are adjusted respectively according to the multiple worst port isolations to obtain multiple groups of target parameters, and the target phase diagram corresponding to the wavelength selective switch is determined according to the multiple groups of target parameters.

2. The phase diagram optimization method according to claim 1, characterized in that: The step of determining a plurality of initial phase diagrams corresponding to the wavelength selective switch according to a plurality of groups of initial parameters specifically comprises: Determine multiple groups of initial parameters, each group of initial parameters includes a blazed grating period parameter, a blazed grating maximum phase value parameter, and a high-order diffraction elimination parameter; Determining a plurality of initial phase functions according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the functional function, the high-order diffraction elimination parameter and the high-order diffraction elimination superposition function; A plurality of initial phase diagrams corresponding to the wavelength selective switch are generated according to the plurality of initial phase functions.

3. The phase diagram optimization method according to claim 2, characterized in that: The step of determining multiple groups of initial parameters specifically includes: Determine the period parameter of the blazed grating and the maximum phase value parameter of the blazed grating; A plurality of groups of high-order diffraction elimination parameters are randomly generated, each group of high-order diffraction elimination parameters includes a superposition amplitude parameter and a superposition phase parameter.

4. The phase diagram optimization method according to claim 3, characterized in that: The step of determining a plurality of initial phase functions according to the blazed grating period parameter, the blazed grating maximum phase value parameter, the functional function, the high-order diffraction elimination parameter and the high-order diffraction elimination superposition function specifically comprises: Determine a first function according to the blazed grating period parameter, the blazed grating maximum phase value parameter and a function function, wherein the function function is a periodic ramp function; The second function is determined according to the superposition amplitude parameter, the superposition phase parameter and a high-order diffraction elimination superposition function, wherein the high-order diffraction elimination superposition function is a sine wave superposition function.

5. The phase diagram optimization method according to claim 1, characterized in that: The step of obtaining a plurality of optical power sets corresponding to the output port of the wavelength selective switch and determining a plurality of worst port isolations according to the plurality of optical power sets specifically includes: Acquire multiple optical power sets corresponding to the output ports of the wavelength selective switch; For each optical power set, selecting a target port power and a plurality of non-target port powers from the optical power set; Determining the isolation of the non-output port in the wavelength selective switch according to the target port power and the multiple non-target port powers; The worst port isolation is determined according to the isolation, and multiple worst port isolations are determined by obtaining the multiple optical power sets.

6. The phase diagram optimization method according to any one of claims 1 to 5, characterized in that: The step of adjusting the multiple groups of initial parameters respectively according to the multiple worst port isolations to obtain multiple groups of target parameters when the multiple worst port isolations are all lower than a preset threshold, and determining the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters specifically includes: When all of the multiple worst port isolations are lower than a preset threshold, selecting a preset number of target worst port isolations from the multiple worst port isolations; Selecting a plurality of groups of first parameters corresponding to the target worst port isolation from the plurality of groups of initial parameters; Determine multiple sets of new initial parameters according to the multiple sets of first parameters, and return to the step of determining multiple initial phase diagrams corresponding to the wavelength selective switch according to the multiple sets of initial parameters until at least one new worst port isolation is higher than the preset threshold, and multiple sets of target parameters are obtained; A target phase diagram corresponding to the wavelength selective switch is determined according to the multiple groups of target parameters.

7. A phase diagram optimization device, characterized in that: The phase diagram optimization device comprises: A phase diagram determination module, used to determine a plurality of initial phase diagrams corresponding to the wavelength selective switch according to a plurality of groups of initial parameters; An isolation determination module, used to obtain a plurality of optical power sets corresponding to the output port of the wavelength selective switch, and determine a plurality of worst port isolations according to the plurality of optical power sets; The phase diagram optimization module is used to adjust the multiple groups of initial parameters respectively according to the multiple worst port isolations when the multiple worst port isolations are all lower than a preset threshold value, obtain multiple groups of target parameters, and determine the target phase diagram corresponding to the wavelength selective switch according to the multiple groups of target parameters.

8. A phase diagram optimization device, characterized in that: The device comprises: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the phase map optimization method according to any one of claims 1 to 6.

9. A storage medium, characterized in that: The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the phase diagram optimization method according to any one of claims 1 to 6 are implemented.

10. A computer program product, characterized in that The computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the phase map optimization method according to any one of claims 1 to 6 are implemented.

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