Stain compensation system and stain compensation method

Abstract

The invention relates to a system and method for compensating for stains. The system for compensating for stains includes a display device including a display panel having pixels and a drive controller, an imaging unit, and an inspection device including a defect characteristic classification unit and a compensation data generation unit. The inspection device generates first measurement data and second measurement data. The inspection device compares the second image data with compensation data based on the first measurement data and the second measurement data, and the defect characteristic classification unit classifies the plurality of pixels as a first defect pixel or a second defect pixel based on the first measurement data, the second measurement data, and the second image data. The compensation data generation unit generates a first compensation value for compensating for a first defective pixel in a first pixel unit, and a second compensation value for compensating for a second defective pixel in a second pixel unit different from the first pixel unit.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims the priority of Korean Patent Application No. 10-2023-0105601 filed on August 11, 2023 in the Korean Intellectual Property Office, the disclosure of which is incorporated herein by reference in its entirety. Technical Field

[0003] Embodiments of the present disclosure described herein relate to a system for compensating for stain (hereinafter, referred to as a “stain compensation system”) and a method for compensating for stain (hereinafter, referred to as a “stain compensation method”) with improved reliability. Background Art

[0004] Generally, a display device includes a display panel for displaying an image and a driving circuit for driving the display panel. The display panel includes a plurality of scan lines, a plurality of data lines, and a plurality of pixels. The driving circuit includes a data driving circuit for outputting a data driving signal to the data line, a scanning driving circuit for outputting a scanning signal to drive the scanning line, and a driving controller for controlling the data driving circuit and the scanning driving circuit.

[0005] The display device may output a scan signal to a scan line connected to pixels for displaying an image, and supply a data voltage corresponding to the image to a data line connected to the pixels, thereby displaying the image. Summary of the invention

[0006] Embodiments of the present disclosure provide a stain compensation system and a stain compensation method with increased reliability.

[0007] According to an embodiment of the present disclosure, a system for compensating stains includes a display device having a display panel and a driving controller for driving the display panel, wherein the display panel includes a plurality of pixels displaying an image. An imaging unit captures an image displayed by the display device. An inspection device outputs a first compensation value and a second compensation value different from the first compensation value to the driving controller. The inspection device includes a defect characteristic classification unit and a compensation data generation unit. The inspection device acquires first measurement data and second measurement data based on first image data generated by the imaging unit. The inspection device compares the second image data generated by the imaging unit with compensation data based on the first measurement data and the second measurement data to determine the first compensation value and the second compensation value. The defect characteristic classification unit classifies a plurality of pixels into first defective pixels having a first defect or second defective pixels having a second defect different from the first defect based on the first measurement data, the second measurement data, and the second image data. The compensation data generation unit generates a first compensation value for compensating a first defective pixel in a first pixel unit and a second compensation value for compensating a second defective pixel in a second pixel unit different from the first pixel unit.

[0008] In an embodiment, the inspection device may further include an inspection storage unit that stores the first measurement data and the second measurement data.

[0009] In an implementation, the second pixel unit may be smaller than the first pixel unit.

[0010] In an embodiment, the size of the first pixel unit may be equal to an area of ​​8×8 pixels, and the size of the second pixel unit may be equal to an area of ​​1×1 pixels.

[0011] In an embodiment, the first compensation value may compensate for brightness of a first defective pixel, and the second compensation value may compensate for color of a second defective pixel.

[0012] In an embodiment, the first measurement data may be data generated by measuring the display panel using a full-contact array tester and an imaging unit in a state where the display panel is not connected to a driving controller.

[0013] In an embodiment, the second image data may include: 2-1 image data generated by photographing a display panel that displays only first light having a first color; and 2-2 image data generated by photographing a display panel that displays only second light having a second color different from the first color.

[0014] In an embodiment, each of the plurality of pixels may include a driving transistor and a light emitting element electrically connected to the driving transistor.

[0015] In an embodiment, the second measurement data may be data generated by linear driving of a driving transistor in the display panel in a state where the display panel is not connected to the driving controller.

[0016] In an embodiment, the inspection device may receive first compensation data, second compensation data, and third compensation data from the display device after performing a first compensation on the defect characteristics predicted based on the first measurement data and the second measurement data, the first compensation data may be data generated by re-detecting the defect characteristics by measuring the threshold voltage of the driving transistor, the second compensation data may be data generated by re-detecting the defect characteristics by measuring the mobility of the driving transistor, and the third compensation data may be data generated by re-detecting the defect characteristics by measuring the characteristics of the light-emitting element.

[0017] In an embodiment, the compensation data generating unit may additionally generate a third compensation value for compensating for the brightness of the first defective pixel in the second pixel unit.

[0018] In an embodiment, the defect characteristic classification unit may further classify a third defective pixel different from each of the first defective pixel and the second defective pixel, and the compensation data generation unit may further generate a fourth compensation value for compensating for the grayscale level of the third defective pixel in the first pixel unit.

[0019] In an embodiment, the compensation data generating unit may additionally generate a fifth compensation value for compensating for a color of a second defective pixel in the first pixel unit.

[0020] In an embodiment, the compensation data generating unit may additionally generate a sixth compensation value for compensating for a gray level of a third defective pixel in the second pixel unit.

[0021] According to an embodiment of the present disclosure, a method for compensating for stains may include: measuring first measurement data for a display panel including multiple pixels using a full-contact array tester and an imaging unit; measuring second measurement data by linear driving of the display panel; classifying the multiple pixels as first defective pixels having a first defect or second defective pixels having a second defect different from the first defect based on the first measurement data and the second measurement data; extracting image data by photographing an image displayed by a display device including a display panel and a drive controller via an imaging unit; reclassifying the first defective pixels and the second defective pixels based on the extracted image data; and generating a first compensation value for compensating for a first defective pixel in a first pixel unit and a second compensation value for compensating for a second defective pixel in a second pixel unit different from the first pixel unit.

[0022] In an embodiment, extracting image data may include: extracting first image data generated by photographing a display panel that displays only first light having a first color; and extracting second image data generated by photographing a display panel that displays only second light having a second color different from the first color.

[0023] In an embodiment, each of the plurality of pixels may include a driving transistor and a light emitting element electrically connected to the driving transistor, and the method may further include receiving compensation data measured from the driving transistor and the light emitting element.

[0024] In an embodiment, the display panel may further include a light control pattern and a color filter disposed on the light emitting element, and classification as a first defective pixel or a second defective pixel may include: based on first measurement data and compensation data, classifying defects generated by the driving transistor and the light emitting element as first defects; and based on second measurement data and image data, classifying defects generated by the light control pattern and the color filter as second defects.

[0025] In an embodiment, reclassifying the first defective pixel and the second defective pixel may include: receiving first compensation data generated by redetecting defect characteristics by measuring a threshold voltage of a driving transistor; receiving second compensation data generated by redetecting defect characteristics by measuring a mobility of the driving transistor; and receiving third compensation data generated by redetecting defect characteristics by measuring characteristics of a light-emitting element.

[0026] In an embodiment, the size of the first pixel unit may be equal to an area of ​​8×8 pixels; and the size of the second pixel unit may be equal to an area of ​​1×1 pixels. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The above and other objects and features of the present disclosure will become apparent by describing in detail non-limiting embodiments of the present disclosure with reference to the accompanying drawings.

[0028] Figure 1 is a perspective view of a display device according to an embodiment of the present disclosure.

[0029] Figure 2 is an exploded perspective view of a display device according to an embodiment of the present disclosure.

[0030] Figure 3 is a block diagram of a display device according to an embodiment of the present disclosure.

[0031] Figure 4 is a block diagram illustrating a driving controller according to an embodiment of the present disclosure.

[0032] Figure 5 is an equivalent circuit diagram of a pixel according to an embodiment of the present disclosure.

[0033] Figure 6 According to the embodiment of the present disclosure, Figure 2 A cross-sectional view taken along line II'.

[0034] Figure 7 is a flowchart illustrating a method of manufacturing a display device according to an embodiment of the present disclosure.

[0035] Figure 8 is a flow chart illustrating a portion of a cell process according to an embodiment of the present disclosure.

[0036] Fig. 9 A stain compensation system for performing a cell drive inspection step and a linear drive inspection step according to an embodiment of the present disclosure is shown.

[0037] Fig.10 First measurement data according to an embodiment of the present disclosure is shown.

[0038] FIG. 11A to FIG. 11C An enlarged portion of first measurement data according to an embodiment of the present disclosure is shown.

[0039] Fig.12 Second measurement data according to an embodiment of the present disclosure is shown.

[0040] Fig.13A and Fig. 13B is an enlarged view of a portion of second measurement data according to an embodiment of the present disclosure.

[0041] Fig.14 is a flow chart illustrating a portion of a module process according to an embodiment of the present disclosure.

[0042] Fig.15 A stain compensation system that performs a module stain sensing step, a module optical sensing step, a defect characteristic extraction step, and a step of compensating for each defect characteristic according to an embodiment of the present disclosure is shown.

[0043] FIG. 16A to FIG. 16C Compensation data according to an embodiment of the present disclosure is shown.

[0044] Fig.17A is a view showing first image data according to an embodiment of the present disclosure

[0045] Fig. 17B is an enlarged view of a portion of first image data according to an embodiment of the present disclosure.

[0046] Fig.18A Second image data according to an embodiment of the present disclosure is shown.

[0047] Fig.18B is an enlarged view showing a portion of the second image data according to an embodiment of the present disclosure.

[0048] Fig.19A Third image data according to an embodiment of the present disclosure is shown.

[0049] Fig.19B is an enlarged view showing a portion of third image data according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0050] In this specification, the expression that a first component (or region, layer, portion, part, etc.) is "on", "connected to" or "coupled to" a second component means that the first component is directly on, directly connected to or directly coupled to the second component, or means that a third component is interposed therebetween. The expression that a first component (or region, layer, portion, part, etc.) is "directly on", "directly connected to" or "directly coupled to" a second component means that no intervening component is interposed therebetween.

[0051] The same reference numerals will be assigned to the same components. In addition, in the drawings, the thickness, proportion and size of the components may be exaggerated to effectively describe the technical features. The term "and / or" includes any and all combinations of one or more of the related components.

[0052] Although the terms "first," "second," etc., may be used to describe various components, these components should not be construed as limited by these terms. These terms are only used to distinguish one component from another. For example, a first component may be referred to as a second component, and similarly, a second component may be referred to as a first component, without departing from the scope and spirit of the embodiments of the present disclosure. The singular form is intended to include the plural form unless the context clearly indicates otherwise.

[0053] In addition, the terms "below", "at the lower portion", "above", and "at the upper portion" are used to describe the relationship between components shown in the drawings. These terms are relative and are described with reference to the directions indicated in the drawings.

[0054] It will also be understood that the terms “comprises,” “comprising,” “including,” or “including,” or “having” indicate the presence of stated features, quantities, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, quantities, steps, operations, components, parts, and / or combinations thereof.

[0055] Unless otherwise defined, all terms (including technical terms and scientific terms) used in the specification have the same meaning as those commonly understood by those skilled in the art to which the present disclosure belongs. In addition, terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning consistent with the meaning in the context of the relevant technology, and should not be interpreted as an ideal or overly formal meaning unless explicitly defined herein.

[0056] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings.

[0057] Figure 1 is a perspective view of a display device according to an embodiment of the present disclosure, and Figure 2is an exploded perspective view of a display device according to an embodiment of the present disclosure.

[0058] refer to Figure 1 and Figure 2 , the display device DD is a device activated in response to an electrical signal. According to the present disclosure, the display device DD may include a large-sized display device such as a television or a monitor, or may include a small-sized or medium-sized display device such as a cellular phone, a tablet personal computer (PC), a laptop computer, a vehicle navigation, or a game console. However, the embodiments of the present disclosure are not necessarily limited thereto, and without departing from the embodiments of the present disclosure, the display device DD may be applied to any other electronic device having a display device applied thereto. In an embodiment, the display device DD has a rectangular shape having a long side in a first direction DR1 and a short side in a second direction DR2 intersecting the first direction DR1. However, the shape of the display device DD is not necessarily limited thereto, but various display devices DD having various shapes may be provided. In an embodiment, the display device DD may display an image IM in a third direction DR3 on a display surface IS defined along the first direction DR1 and the second direction DR2. The third direction DR3 may be a direction intersecting the first direction DR1 and the second direction DR2. For example, in an embodiment, the first direction DR1, the second direction DR2, and the third direction DR3 may be perpendicular to each other. However, the embodiments of the present disclosure are not necessarily limited thereto. The display surface IS on which the image IM is displayed may correspond to a front surface of the display device DD.

[0059] According to an embodiment, a front surface (e.g., top surface) and a rear surface (e.g., bottom surface) of the member are defined based on the direction along which the image IM is displayed. The front surface and the rear surface are opposite to each other in the third direction DR3, and a direction perpendicular to the front surface and the rear surface may be parallel to the third direction DR3.

[0060] The distance between the front and rear surfaces in the third direction DR3 may correspond to the thickness of the display device DD in the third direction DR3. However, the first direction DR1, the second direction DR2, and the third direction DR3 may be relative concepts and may be changed to different directions.

[0061] The display device DD can sense input applied from the outside (e.g., external input). The external input may include various types of inputs provided from the outside of the display device DD. According to an embodiment of the present disclosure, the display device DD can sense external input applied from the outside by a user. In an embodiment, the external input performed by the user may include any of a variety of external inputs, such as a part of the user's body, light, heat or pressure, or a combination thereof. In addition, depending on the structure of the display device DD, the display device DD can sense external input applied by the user to the side surface or rear surface of the display device DD, and the embodiments of the present disclosure are not necessarily limited to any one embodiment. According to an embodiment of the present disclosure, the external input may include input performed by an input device (e.g., a stylus pen, an active pen, a touch pen, an electronic pen, or an e-pen).

[0062] The display surface IS of the display device DD may be divided into a display area DA and a non-display area NDA. The display area DA may be an area where an image IM is displayed. A user views the image IM through the display area DA. Figure 1 and Figure 2 In the embodiment shown, the display area DA is shown as a rectangular shape with rounded corners. However, the shape is provided for illustrative purposes, and the embodiments of the present disclosure are not necessarily limited thereto. For example, the display area DA may have a variety of different shapes.

[0063] The non-display area NDA may be adjacent to the display area DA (e.g., adjacent thereto in the first direction DR1 and / or the second direction DR2). In an embodiment, the non-display area NDA may have a specific color. The non-display area NDA may surround the display area DA. Therefore, the shape of the display area DA may be substantially defined by the non-display area NDA. However, the above shape of the display area DA is provided for illustrative purposes, and embodiments of the present disclosure are not necessarily limited thereto. For example, in some embodiments, the non-display area NDA may be provided to be adjacent to only one side of the display area DA, or may be omitted. The display device DD according to an embodiment of the present disclosure may include various embodiments, and the present disclosure is not necessarily limited to any one embodiment.

[0064] In an embodiment, the display device DD may further include a display panel DP, a main circuit board MCB, a flexible circuit film D-FCB, a driving chip DIC, and a window WM.

[0065] According to an embodiment of the present disclosure, the display panel DP may be an emissive display panel. For example, the display panel DP may be an organic light-emitting display panel, an inorganic light-emitting display panel, or a quantum dot light-emitting display panel. The light-emitting layer of the organic light-emitting display panel may include an organic light-emitting material. The light-emitting layer of the inorganic light-emitting display panel may include an inorganic light-emitting material. The light-emitting layer of the quantum dot light-emitting display panel may include quantum dots and quantum rods. Hereinafter, for ease of description, the display panel DP will be referred to as an organic light-emitting display panel.

[0066] The display panel DP may output an image IM, and the output image IM may be displayed on the display surface IS.

[0067] The window WM may include a transparent material to output the image IM. For example, in an embodiment, the window WM may include glass, sapphire, or plastic. Although the window WM is shown as a single layer, embodiments of the present disclosure are not necessarily limited thereto. For example, the window WM may include multiple layers.

[0068] According to an embodiment, the window WM may include a light blocking pattern to define the non-display area NDA. In an embodiment, the light blocking pattern may include an organic layer having a color formed in a coating scheme.

[0069] The window WM may be coupled to the display panel DP via an adhesive film. According to an embodiment of the present disclosure, the adhesive film may include an optically clear adhesive (OCA) film. However, the adhesive film is not necessarily limited thereto, but may include typical adhesives and adhesives. For example, the adhesive film may include an optically clear resin (OCR) or a pressure sensitive adhesive (PSA) film.

[0070] In an embodiment, an input sensing layer may be further disposed between the window WM and the display panel DP. The input sensing layer may sense external input. The input sensing layer may be disposed directly on the display panel DP. However, embodiments of the present disclosure are not necessarily limited thereto. For example, in some embodiments, the input sensing layer may be omitted.

[0071] The display panel DP may display an image IM in response to an electrical signal. The display panel DP may be defined with an active area AA and a non-active area NAA. The active area AA may be defined as an area through which an image IM provided from the display area DA is output.

[0072] The non-active area NAA may be adjacent to the active area AA (e.g., adjacent to it in the first direction DR1 and / or the second direction DR2). For example, the non-active area NAA may surround the active area AA. However, the shapes are provided for illustrative purposes, and the embodiments of the present disclosure are not necessarily limited thereto. For example, the non-active area NAA may have various shapes and is not necessarily limited to any one embodiment. According to an embodiment, the active area AA of the display panel DP may correspond to at least a portion of the display area DA.

[0073] The main circuit board MCB may be connected to the flexible circuit film D-FCB and may be electrically connected to the display panel DP. The flexible circuit film D-FCB is connected to the display panel DP to electrically connect the display panel DP to the main circuit board MCB.

[0074] In an implementation, the main circuit board MCB may include a driving controller 100 and a voltage generator 300. The driving controller 100 may include a circuit for driving the display panel DP. A driving chip DIC may be mounted on the flexible circuit film D-FCB.

[0075] According to an embodiment of the present disclosure, the flexible circuit film D-FCB may include a first flexible circuit film D-FCB1, a second flexible circuit film D-FCB2, and a third flexible circuit film D-FCB3. The driving chip DIC may include a first driving chip DIC1, a second driving chip DIC2, and a third driving chip DIC3. However, the embodiments of the present disclosure are not necessarily limited thereto, and the number of flexible circuit films D-FCB and driving chips DIC may vary. In an embodiment, the first flexible circuit film D-FCB1, the second flexible circuit film D-FCB2, and the third flexible circuit film D-FCB3 are disposed to be spaced apart from each other in the first direction DR1, and are connected to the display panel DP to electrically connect the display panel DP to the main circuit board MCB. The first driving chip DIC1 may be mounted on the first flexible circuit film D-FCB1. The second driving chip DIC2 may be mounted on the second flexible circuit film D-FCB2. The third driving chip DIC3 may be mounted on the third flexible circuit film D-FCB3. However, the embodiments of the present disclosure are not necessarily limited thereto. For example, the display panel DP may be electrically connected to the main circuit board MCB through one flexible circuit film, and only one data driving chip may be mounted on one flexible circuit film. In addition, the display panel DP may be electrically connected to the main circuit board MCB through at least four flexible circuit films, and only one data driving chip may be mounted on one flexible circuit film.

[0076] although Figure 2It is shown that the first to third driver chips DIC1 to DIC3 can be mounted on the first flexible circuit film D-FCB1, the second flexible circuit film D-FCB2, and the third flexible circuit film D-FCB3, respectively, but the embodiments of the present disclosure are not necessarily limited thereto. For example, in some embodiments, the first to third driver chips DIC1 to DIC3 can be directly mounted on the display panel DP. In this embodiment, a portion of the display panel DP in which the first to third driver chips DIC1 to DIC3 are mounted can be bent and disposed on the rear surface of the display panel DP. For example, the first to third driver chips DIC1 to DIC3 can be directly mounted on the main circuit board MCB.

[0077] In an embodiment, the display device DD may further include a housing EDC for receiving the display panel DP. The housing EDC may be coupled to the window WM to define the appearance of the display device DD. The housing EDC may absorb impacts applied from the outside and may prevent foreign matter / moisture from penetrating into the display panel DP to protect components received in the housing EDC. In an embodiment, the housing EDC may be provided in the form of a plurality of receiving members coupled to each other.

[0078] According to an embodiment, the display device DD may also include an electronic module (which includes various functional modules for operating the display panel DP), a power module (e.g., a battery) for providing power required for the overall operation of the display device DD, a bracket connected to the display panel DP and / or the housing EDC to separate the internal space of the display device DD, and the like.

[0079] Figure 3 is a block diagram of a display device according to an embodiment of the present disclosure.

[0080] refer to Figure 3 In an embodiment, the display device DD includes a display panel DP, a driving controller 100, a data driving circuit 200, a voltage generator 300, and a scan driving circuit 400. According to an embodiment, the driving controller 100, the data driving circuit 200, and the scan driving circuit 400 may be defined as a driving circuit DC.

[0081] In an embodiment, the driving controller 100 receives input image data I_RGB and a control signal CTRL. The driving controller 100 may appropriately compensate the input image data I_RGB for the characteristics of the display panel DP and may output the output image data O_RGB. In addition, the driving controller 100 may output a scan control signal SCS and a data control signal DCS.

[0082] The data driving circuit 200 may receive a data control signal DCS and output image data O_RGB from the driving controller 100. The data driving circuit 200 converts the output image data O_RGB into a data signal and then outputs the data signal to a plurality of data lines DL1 to DLm to be described later. The data signal is an analog voltage corresponding to a grayscale value of the output image data O_RGB.

[0083] The display panel DP includes: first scan lines SCL1 to SCLn, where n is an integer greater than or equal to 4; second scan lines SSL1 to SSLn; data lines DL1 to DLm, where m is an integer greater than or equal to 3; and a plurality of pixels PX. The display panel DP may further include a scan driving circuit 400. According to an embodiment, the scan driving circuit 400 may be disposed at a first side of the display panel DP. The first scan lines SCL1 to SCLn and the second scan lines SSL1 to SSLn may extend from the scan driving circuit 400 in a first direction DR1.

[0084] The driving controller 100 , the data driving circuit 200 , and the scan driving circuit 400 are driving circuits that provide data signals to a plurality of pixels PX of the display panel DP.

[0085] The display panel DP may be classified into an active area AA and a non-active area NAA. In an embodiment, the pixels PX may be disposed in the active area AA, and the scan driving circuit 400 may be disposed in the non-active area NAA.

[0086] In an embodiment, the first scan lines SCL1 to SCLn and the second scan lines SSL1 to SSLn may be arranged to be spaced apart from each other in the second direction DR2. The data lines DL1 to DLm may extend from the data driving circuit 200 in the second direction DR2 and may be arranged to be spaced apart from each other in the first direction DR1.

[0087] A plurality of pixels PX may be electrically connected to first scan lines SCL1 to SCLn, second scan lines SSL1 to SSLn, and data lines DL1 to DLm. For example, the pixels PX in the first row may be connected to the first scan line SCL1 and the second scan line SSL1. In addition, the pixels PX in the second row may be connected to the first scan line SCL2 and the second scan line SSL2.

[0088] In an embodiment, each of the plurality of pixels PX includes a light emitting element ED (see Figure 5 ) and pixel circuit PXC (see Figure 5 ) to control the light emitting element ED to emit light. Figure 5) may include a plurality of transistors and capacitors. In an embodiment, the scan driving circuit 400 may include a plurality of transistors and capacitors. Figure 5 )'s transistor is formed using the same process as the transistor of FIG.

[0089] Each of the pixels PX receives a first voltage ELVDD, a second voltage ELVSS, and an initialization voltage VINT.

[0090] The scan driving circuit 400 receives a scan control signal SCS from the driving controller 100. Also, the scan driving circuit 400 may output a first scan signal to the first scan lines SCL1 to SCLn and may output a second scan signal to the second scan lines SSL1 to SSLn in response to the scan control signal SCS.

[0091] According to an embodiment, the scan driving circuit 400 may be disposed at a first side of the active area AA (e.g., a first side in the first direction DR1). However, the embodiments of the present disclosure are not necessarily limited thereto. According to an embodiment, the scan driving circuit 400 may be disposed at a first side and a second side of the active area AA (e.g., a first side and a second side in the first direction DR1). For example, the scan driving circuit 400 disposed at the first side of the active area AA may provide a first scan signal to the first scan lines SCL1 to SCLn, and the scan driving circuit disposed at the second side of the active area AA may provide a second scan signal to the second scan lines SSL1 to SSLn.

[0092] The voltage generator 300 generates voltages required for the operation of the display panel DP. According to an embodiment, the voltage generator 300 may generate a first voltage ELVDD, a second voltage ELVSS, and an initialization voltage VINT required for the operation of the display panel DP. In addition to the first voltage ELVDD, the second voltage ELVSS, and the initialization voltage VINT, the voltage generator 300 may also generate various voltages required for the operation of the display panel DP and the scan driving circuit 400. For example, in an embodiment, the voltage generator 300 may additionally generate a first driving voltage Vinit and a second driving voltage VGMA required for the operation of the driving controller 100 and the data driving circuit 200.

[0093] Figure 4 is a block diagram illustrating a driving controller according to an embodiment of the present disclosure.

[0094] refer to Figure 2 and Figure 4 , the driving controller 100 may include a compensation unit 110 and a storage unit 120 .

[0095] In an embodiment, the storage unit 120 may include a first lookup table LUT1, a second lookup table LUT2, a third lookup table LUT3, a fourth lookup table LUT4, a fifth lookup table LUT5, and a sixth lookup table LUT6. However, the embodiments of the present disclosure are not necessarily limited thereto, and the number of lookup tables in the storage unit 120 may vary.

[0096] In an embodiment, the compensation unit 110 may output the output image data O_RGB by compensating the input image data I_RGB based on the first to sixth lookup tables LUT1 to LUT6 .

[0097] In an embodiment, the first lookup table LUT1 may store a first compensation value for specifying a plurality of first defective pixels classified as having a first defect among the plurality of pixels PX and compensating for the brightness of the plurality of first defective pixels in a first unit of pixels (e.g., a first pixel unit). The first compensation value may include a compensation voltage value provided to the first defective pixel.

[0098] In an embodiment, the first lookup table LUT1 may be a lookup table for compensating for stains (e.g., brightness difference stains) caused by brightness difference of the display panel DP. For example, brightness difference stains and fine brightness difference stains may be caused because a specific area of ​​the display panel DP exhibits brightness different from that of another area.

[0099] The first defect may be caused by the inspection device TD (see Fig. 9 ) classification. The first lookup table LUT1 may store first compensation values ​​for a plurality of first defective pixels among the plurality of pixels PX, the plurality of first defective pixels having stains caused by brightness difference. The plurality of first defective pixels may include at least one of the plurality of pixels PX.

[0100] In an embodiment, the first defect may be with respect to each driving transistor TR1 (see Figure 5 ) and / or caused by the light emitting element ED (see Figure 5 ) caused by defects.

[0101] In an embodiment, the size of the first unit of pixels may have the same area as 8×8 pixels. The compensation unit 110 may compensate the plurality of pixels PX in the first unit. The scheme of compensating the plurality of pixels PX in the first unit may be referred to as a scheme of compensating representative values.

[0102] According to an embodiment of the present disclosure, the compensation unit 110 can use the first compensation value to compensate only the pixels having the brightness difference stain. The compensation unit 110 can perform the brightness difference compensation operation on the local area of ​​the display panel DP by using the first lookup table LUT1. The compensation performance of the display panel DP can be improved by the first lookup table LUT1, and the resources required for compensation (e.g., calculation and storage) can be effectively utilized. Therefore, a display device DD with increased reliability can be provided.

[0103] The second lookup table LUT2 may store second compensation values ​​for specifying a plurality of second defective pixels classified as having the second defect among the plurality of pixels PX and compensating for colors of the plurality of second defective pixels in the second unit (or second pixel unit).

[0104] Each of the plurality of second defective pixels may emit first light having a first color.

[0105] In an embodiment, the second lookup table LUT2 may be a lookup table for compensating for fine monochrome stains of the display panel DP. For example, monochrome stains and fine monochrome stains may be defects caused by moisture absorption into the light control pattern and aeration into the light control pattern. Monochrome stains and fine monochrome stains may be defects related to brightness uniformity, which are observed only in monochromes presenting the same color.

[0106] The second defect may be different from the first defect. The second defect may be caused by the inspection device TD (see Fig. 9 ) classification. The second lookup table LUT2 may store second compensation values ​​for a plurality of second defective pixels among the plurality of pixels PX, the second defective pixels having stains caused by fine monochrome stains. The plurality of second defective pixels may include at least one of the plurality of pixels PX.

[0107] The second defect may be a defect caused by the second substrate S2 including the light-controlling pattern and the color filter.

[0108] In an embodiment, the second unit of the pixel may be smaller than the first unit. For example, in an embodiment, the size of the second unit of the pixel may have the same area as 1×1 pixels. For example, the second unit may have the same size as each of the plurality of pixels PX. The compensation unit 110 may compensate for the plurality of pixels PX in the second unit. For example, the size of the first unit may be 64 times the size of the second unit.

[0109] According to an embodiment of the present disclosure, the compensation unit 110 can use the second compensation value to compensate only the pixels with fine monochrome stains. The compensation unit 110 can perform a fine monochrome stain compensation operation on a fine area of ​​the display panel DP by using the second lookup table LUT2. The compensation performance of the display panel DP can be improved by the second lookup table LUT2, and the resources required for compensation (e.g., calculation and storage) can be effectively utilized. Therefore, a display device DD with increased reliability can be provided.

[0110] Unlike the embodiments of the present disclosure, in the comparative embodiments in which the compensation operation is performed on the entire portion of the plurality of pixels PX in the smaller unit, the calculation time may be increased and a large storage space may be required to store the compensation value. However, according to the embodiments of the present disclosure, a plurality of lookup tables may be used to compensate some of the plurality of pixels PX instead of compensating the entire portion of the plurality of pixels PX. Therefore, the embodiments of the present disclosure present the same compensation performance and require reduced resources compared to when the compensation operation is performed on the entire portion of the plurality of pixels PX in the smaller unit. Therefore, a display device DD with improved reliability and quality (e.g., display quality) can be provided.

[0111] In an embodiment, the third lookup table LUT3 may store a third compensation value for compensating for brightness of a plurality of first defective pixels in the second unit among the plurality of pixels PX.

[0112] The third lookup table LUT3 may be a lookup table for compensating for fine stains caused by a brightness difference of the display panel DP.

[0113] According to an embodiment of the present disclosure, the compensation unit 110 can use the third compensation value to compensate only pixels with fine stains. The compensation unit 110 can perform a luminance stain compensation operation on a fine area of ​​the display panel DP by using the third lookup table LUT3. The compensation performance of the display panel DP can be improved by the third lookup table LUT3, and the resources required for compensation (e.g., calculation and storage) can be effectively utilized. Therefore, a display device DD with increased reliability can be provided.

[0114] In an embodiment, the fourth lookup table LUT4 may store fourth compensation values ​​for specifying a plurality of third defective pixels classified as having a third defect among the plurality of pixels PX and compensating for grayscale values ​​of the plurality of third defective pixels in the first unit.

[0115] In an embodiment, the fourth lookup table LUT4 may be a lookup table for compensating stains (eg, discoloration stains) caused by discoloration of the display panel DP. For example, discoloration stains and fine discoloration stains may be color uniformity defects when observing a gray pattern.

[0116] The third defect may be different from the first defect and the second defect. The third defect may be caused by the inspection device TD (see Fig. 9 ) classification. The fourth lookup table LUT4 may store a fourth compensation value that compensates for a plurality of third defective pixels that are discolored among the plurality of pixels PX. The plurality of third defective pixels may include at least one of the plurality of pixels PX.

[0117] The third defect may be caused by the second substrate S2 including the light-controlling pattern and the color filter.

[0118] According to an embodiment of the present disclosure, the compensation unit 110 can use the fourth compensation value to compensate only the discolored pixels. The compensation unit 110 can perform a brightness difference compensation operation on a local area of ​​the display panel DP by using the fourth lookup table LUT4. The compensation performance of the display panel DP can be improved by the fourth lookup table LUT4, and the resources required for compensation (e.g., calculation and storage) can be effectively utilized. Therefore, a display device DD with increased reliability can be provided.

[0119] In an implementation, the fifth lookup table LUT5 may store fifth compensation values ​​for compensating for colors of the plurality of second defective pixels in the first unit.

[0120] The fifth lookup table LUT5 may be a lookup table for compensating for monochrome stain of the display panel DP.

[0121] According to an embodiment of the present disclosure, the compensation unit 110 can use the fifth compensation value to compensate only the pixels with monochrome stains. The compensation unit 110 can perform a monochrome stain compensation operation on a local area of ​​the display panel DP by using the fifth lookup table LUT5. The compensation performance of the display panel DP can be improved by the fifth lookup table LUT5, and the resources required for compensation (e.g., calculation and storage) can be effectively utilized. Therefore, a display device DD with increased reliability can be provided.

[0122] In an embodiment, the sixth lookup table LUT6 may store sixth compensation values ​​for compensating for gray levels of the plurality of third defective pixels in the second unit among the plurality of pixels PX.

[0123] The sixth lookup table LUT6 may be a lookup table for compensating for fine discoloration stains of the display panel DP.

[0124] According to an embodiment of the present disclosure, the compensation unit 110 can use the sixth compensation value to compensate only the pixels with brightness difference stains. The compensation unit 110 can perform a brightness difference compensation operation on a local area of ​​the display panel DP by using the sixth lookup table LUT6. The compensation performance of the display panel DP can be improved by the sixth lookup table LUT6, and the resources required for compensation (e.g., calculation and storage) can be utilized. Therefore, a display device DD with increased reliability can be provided.

[0125] According to an embodiment, the compensation unit 110 may perform an optimized compensation operation according to the type of stain using the first to sixth lookup tables LUT1 to LUT6. The compensation performance of the display panel DP may be improved through the first to sixth lookup tables LUT1 to LUT6, and resources (e.g., calculation and storage) required for compensation may be utilized. Stain of a plurality of pixels PX may be compensated. Therefore, a display device DD having improved display quality may be provided.

[0126] However, the embodiments of the present disclosure are not necessarily limited thereto. For example, in some embodiments, the third to sixth lookup tables LUT3 to LUT6 may be omitted.

[0127] Figure 5 is an equivalent circuit diagram of a pixel according to an embodiment of the present disclosure.

[0128] Figure 5 Shown with Figure 3 The i-th data line DLi (where i is an integer greater than or equal to 1) among the data lines DL1 to DLm shown in FIG. Figure 3 The j-th first scan line SCLj (wherein j is an integer greater than or equal to 1) among the first scan lines SCL1 to SCLn shown in FIG. Figure 3 1 is an equivalent circuit diagram of a pixel PX connected to the j-th second scan line SSLj among the second scan lines SSL1 to SSLn shown in FIG. 1. Hereinafter, the i-th data line DLi may be referred to as the data line DLi, the j-th first scan line SCLj may be referred to as the first scan line SCLj, and the j-th second scan line SSLj may be referred to as the second scan line SSLj.

[0129] Figure 3 Each of the plurality of pixels PX shown may have Figure 5 According to an embodiment, the pixel PX includes a light emitting element ED and a pixel circuit PXC.

[0130] refer to Figure 5, the pixel circuit PXC may be electrically connected to the light emitting element ED, and may provide a current corresponding to the data signal Di received from the data line DLi to the light emitting element ED. According to an embodiment, the pixel circuit PXC of the pixel PX includes a first transistor TR1, a second transistor TR2, a third transistor TR3, and a capacitor Cst. According to an embodiment, each of the first transistor TR1 to the third transistor TR3 may be an N-type transistor having a semiconductor layer including an oxide semiconductor. However, the embodiments of the present disclosure are not necessarily limited thereto. According to an embodiment, each of the first transistor TR1 to the third transistor TR3 may be a P-type transistor having a low temperature polycrystalline silicon (LTPS) semiconductor layer. According to an embodiment, at least one of the first transistor TR1 to the third transistor TR3 may be an N-type transistor, and the remaining transistors of the first transistor TR1 to the third transistor TR3 may be P-type transistors. In addition, according to an embodiment of the present disclosure, the circuit configuration of the pixel circuit PXC is not necessarily limited to Figure 5 For example, the configuration of the pixel circuit PXC may be further modified.

[0131] The first scan line SCLj may transmit a first scan signal SCj, and the second scan line SSLj may transmit a second scan signal SSj. The data line DLi transmits a data signal Di. In an embodiment, the data signal Di may have a signal that is different from the input image data I_RGB (see FIG. 1 ) input to the display device DD. Figure 3 ) corresponds to the voltage level.

[0132] In an implementation, the first voltage line VL1 may transmit the first voltage ELVDD to the pixel circuit PXC, and the second voltage line VL2 may transmit the second voltage ELVSS to the cathode (eg, the second terminal) of the light emitting element ED.

[0133] The first transistor TR1 includes a first electrode (e.g., source electrode) connected to the first voltage line VL1, a second electrode (e.g., drain electrode) electrically connected to the anode (e.g., first terminal) of the light emitting element ED, and a gate electrode connected to one terminal of the capacitor Cst. According to the switching operation of the second transistor TR2, the first transistor TR1 can provide a driving current to the light emitting element ED in response to the data signal Di transmitted through the data line DLi. The first transistor TR1 can be referred to as a driving transistor TR1.

[0134] The second transistor TR2 includes a first electrode connected to the data line DLi, a second electrode connected to the gate electrode of the first transistor TR1, and a gate electrode connected to the first scan line SCLj. In an embodiment, the second transistor TR2 may be turned on in response to a first scan signal SCj received through the first scan line SCLj, and may transmit a data signal Di transmitted through the data line DLi to the gate electrode of the first transistor TR1.

[0135] The data line DLi may be electrically connected to a digital-to-analog converter DAC of the data driving circuit 200 .

[0136] The third transistor TR3 includes a first electrode connected to the sensing line SL, a second electrode connected to the anode of the light emitting element ED, and a gate electrode connected to the second scan line SSLj. In an implementation, the third transistor TR3 may be turned on in response to a second scan signal SSj received through the second scan line SSLj and transmit the initialization voltage VINT to the anode of the light emitting element ED.

[0137] One terminal of the capacitor Cst is connected to the gate electrode of the first transistor TR1, and the opposite terminal of the capacitor Cst is connected to the second electrode of the first transistor TR1 as described above. However, the embodiments of the present disclosure are not necessarily limited thereto, and the structure of the pixel PX may vary. For example, the number of transistors included in one pixel PX, the number of capacitors included in the pixel PX, and the connection relationship between the transistor and the capacitor may be modified differently.

[0138] In an implementation, the switch SW may electrically connect an input terminal for the initialization voltage VINT or the analog-to-digital converter ADC of the data driving circuit 200 with the sensing line SL in response to a control signal.

[0139] Inspection device TD (see Fig. 9 ) can sense the current flowing through the light emitting element ED through the sensing line SL.

[0140] Figure 6 According to the embodiment of the present disclosure, Figure 2 A cross-sectional view taken along line II'.

[0141] refer to Figure 6 , the display panel DP may include a first substrate S1 and a second substrate S2 facing the first substrate S1 and spaced apart from the first substrate S1 (e.g., facing and spaced apart from the first substrate S1 in a third direction DR3). A specific cell gap GAP may be formed between the first substrate S1 and the second substrate S2. In an embodiment, the cell gap GAP may be maintained by a sealant coupling the first substrate S1 and the second substrate S2 to each other. The sealant may be disposed in the non-display area NDA (see Figure 1 ). According to an embodiment of the present disclosure, the synthetic resin material may be disposed in the cell gap GAP. However, the embodiment of the present disclosure is not necessarily limited thereto, and the structure of the display panel DP may vary.

[0142] In an embodiment, a first pixel region PXA1, a second pixel region PXA2, a third pixel region PXA3, and a peripheral region NPXA may be defined in the display panel DP.

[0143] The first substrate S1 may include a first base substrate BS1 (e.g., a base substrate), a circuit layer CCL, a display element layer EL, and a thin film encapsulation layer TFE. The circuit layer CCL may be disposed on the first base substrate BS1 (e.g., directly disposed on the first base substrate BS1 in the third direction DR3). In an embodiment, the circuit layer CCL may include a plurality of insulating layers, a plurality of conductive layers, and a semiconductor layer. The display element layer EL may be disposed on the circuit layer CCL (e.g., directly disposed on the circuit layer CCL in the third direction DR3). The thin film encapsulation layer TFE may be disposed on the display element layer EL (e.g., directly disposed on the display element layer EL in the third direction DR3), and may seal the display element layer EL.

[0144] In an implementation, the first base substrate BS1 may be a stack structure including a silicon substrate, a plastic substrate, a glass substrate, an insulating layer, or a plurality of insulating layers.

[0145] The circuit layer CCL may include a plurality of transistors and a plurality of insulating layers IL1, IL2, IL3, and IL4. Figure 6 In the embodiment, only for illustrative purposes, one driving transistor TD is provided. However, the embodiments of the present disclosure are not necessarily limited thereto. In an embodiment, the plurality of insulating layers IL1, IL2, IL3, and IL4 may include a first insulating layer IL1, a second insulating layer IL2, a third insulating layer IL3, and a fourth insulating layer IL4. However, the embodiments of the present disclosure are not necessarily limited thereto, and the number of insulating layers may vary. The driving transistor TD may be referred to as a first transistor TR1 (see Figure 5 ).

[0146] The first insulating layer IL1 may be disposed on the first base substrate BS1 (eg, directly disposed on the first base substrate BS1 in the third direction DR3), and the driving transistor TD may be disposed on the first insulating layer IL1 (eg, directly disposed on the first insulating layer IL1 in the third direction DR3). The driving transistor TD may include an active portion AD, a source SD, a drain DD, and a gate GD.

[0147] The active portion AD, the source electrode SD, and the drain electrode DD may be regions classified based on the doping concentration or conductivity of the semiconductor pattern. The active portion AD, the source electrode SD, and the drain electrode DD may be disposed on the first insulating layer IL1. In an embodiment, the active portion AD, the source electrode SD, and the drain electrode DD may have a higher bonding force than the first base substrate BS1 with respect to the first insulating layer IL1.

[0148] The first insulating layer IL1 may be a barrier layer that protects the bottom surface of the active portion AD, the source electrode SD, and the drain electrode DD. In this embodiment, the first insulating layer IL1 may protect the active portion AD, the source electrode SD, and the drain electrode DD from the first base substrate BS1 itself, or prevent contaminants or moisture introduced through the first base substrate BS1 from penetrating into the active portion AD, the source electrode SD, and the drain electrode DD. Alternatively, the first insulating layer IL1 may be a light blocking layer that blocks external light incident through the first base substrate BS1 from entering the active portion AD. In this embodiment, the first insulating layer IL1 may further include a light blocking material.

[0149] The second insulating layer IL2 is disposed on the first insulating layer IL1 (e.g., directly on the first insulating layer IL1 in the third direction DR3), and may cover the active portion AD, the source electrode SD, and the drain electrode DD. The second insulating layer IL2 may include an inorganic material. In an embodiment, the inorganic material may include at least one of silicon nitride, silicon oxynitride, silicon oxide, titanium oxide, and aluminum oxide.

[0150] The gate GD may be disposed on the second insulating layer IL2 (e.g., directly disposed on the second insulating layer IL2 in the third direction DR3). The third insulating layer IL3 may be disposed on the second insulating layer IL2 (e.g., directly disposed on the second insulating layer IL2 in the third direction DR3) and may cover the gate GD. The third insulating layer IL3 may be formed of a single layer or a plurality of layers. For example, a single layer may include an inorganic layer. In an embodiment, the plurality of layers may include an organic layer and an inorganic layer.

[0151] The fourth insulating layer IL4 may be disposed on the third insulating layer IL3 (e.g., directly disposed on the third insulating layer IL3 in the third direction DR3). The fourth insulating layer IL4 may be formed of a single layer or a plurality of layers. For example, a single layer may include an organic layer. In an embodiment, the plurality of layers may include an organic layer and an inorganic layer. In an embodiment, the fourth insulating layer IL4 may be a planarization layer providing a flat surface thereon.

[0152] The display element layer EL may be disposed on the fourth insulating layer IL4 (e.g., directly disposed on the fourth insulating layer IL4 in the third direction DR3). The display element layer EL may include a light emitting element OLED and a pixel defining layer PDL. According to an embodiment, the light emitting element OLED may be an organic light emitting element. However, the embodiments of the present disclosure are not necessarily limited thereto. For example, the light emitting element OLED may be a micron LED element or a nano LED element. The pixel defining layer PDL may be an organic layer.

[0153] In an embodiment, the light emitting element OLED may include a first electrode AE3 (hereinafter referred to as a third pixel electrode), a hole control layer HCL, a light emitting layer EML, an electron control layer ECL, and a second electrode CE (e.g., a common electrode). In an embodiment, the third pixel electrode AE3 may be provided separately for each pixel. In an embodiment, the light emitting element OLED may include a first light emitting element overlapping the first pixel area PXA1, a second light emitting element overlapping the second pixel area PXA2, a third light emitting element overlapping the third pixel area PXA3, and a fourth light emitting element overlapping the fourth pixel area. Figure 6 A first pixel electrode AE1 included in the first light emitting element, a second pixel electrode AE2 included in the second light emitting element, and a third pixel electrode AE3 included in the third light emitting element are shown.

[0154] In an embodiment, the first pixel electrode AE1 may be arranged to correspond to the first pixel area PXA1, the second pixel electrode AE2 may be arranged to correspond to the second pixel area PXA2, and the third pixel electrode AE3 may be arranged to correspond to the third pixel area PXA3. In this case, the wording "corresponding" means that when viewed in the thickness direction (e.g., the third direction DR3) of the display panel DP, the two components overlap each other and are not necessarily limited to having the same area as each other. For example, in some embodiments, parts of the two components may not overlap each other in the third direction DR3.

[0155] The first pixel electrode AE1, the second pixel electrode AE2, and the third pixel electrode AE3 may be disposed on the fourth insulating layer IL4 (e.g., directly disposed on the fourth insulating layer IL4 in the third direction DR3). Each of the first pixel electrode AE1, the second pixel electrode AE2, and the third pixel electrode AE3 may be directly or indirectly electrically connected to an associated driving transistor. For example, the second pixel electrode AE2 may be directly or indirectly connected to Figure 6 The driving transistor TD is shown.

[0156] The pixel defining layer PDL may expose a portion of each of the first pixel electrode AE1, the second pixel electrode AE2, and the third pixel electrode AE3, such as a central portion thereof (e.g., a central portion in the first direction DR1). For example, a light emitting opening OP may be defined in the pixel defining layer PDL. A portion of each of the first pixel electrode AE1, the second pixel electrode AE2, and the third pixel electrode AE3 may be exposed through the light emitting opening OP.

[0157] The first light emitting area EA1, the second light emitting area EA2, and the third light emitting area EA3 may be defined by the light emitting opening OP, respectively. In addition, the first light emitting area EA1 may be defined to correspond to the first pixel area PXA1, the second light emitting area EA2 may be defined to correspond to the second pixel area PXA2, and the third light emitting area EA3 may be defined to correspond to the third pixel area PXA3. In this case, the wording "corresponding" means that when viewed in the thickness direction (e.g., the third direction DR3) of the display panel DP, the two components overlap each other, and are not necessarily limited to having the same area as each other.

[0158] In an embodiment, the hole control layer HCL, the light emitting layer EML, the electron control layer ECL and the second electrode CE may be commonly disposed in the first pixel region PXA1, the second pixel region PXA2, the third pixel region PXA3 and the peripheral region NPXA. The hole control layer HCL may include a hole transport layer and may further include a hole injection layer.

[0159] The light emitting layer EML may have a single layer structure or a cascade structure. In an embodiment, the light emitting layer EML may emit blue light as the source light. The blue light may include a wavelength in the range from 410nm to 480nm. For example, the emission spectrum of the blue light may have a peak wavelength in the range from 440nm to 460nm. The light emitting layer EML may be commonly disposed in the first pixel region PXA1, the second pixel region PXA2, and the third pixel region PXA3, or may be independently disposed. The wording "independently disposed" means that the light emitting layer EML is separately disposed for each of the first pixel region PXA1, the second pixel region PXA2, and the third pixel region PXA3.

[0160] The electron control layer ECL may include an electron transport layer and may further include an electron injection layer. The second electrode CE may be disposed on the electron control layer ECL (eg, directly disposed on the electron control layer ECL in the third direction DR3). In an embodiment, the second electrode CE may be disposed on a plurality of pixels PX (see Figure 3 ) is set in public.

[0161] The thin film encapsulation layer TFE may be disposed on the second electrode CE. For example, in an embodiment, the thin film encapsulation layer TFE may be directly disposed on the display element layer EL (e.g., in the third direction DR3). In an embodiment, the thin film encapsulation layer TFE may include a first inorganic encapsulation layer ITL1, an organic encapsulation layer OTL, and a second inorganic encapsulation layer ITL2 sequentially stacked (e.g., sequentially stacked in the third direction DR3). The organic encapsulation layer OTL may be disposed between the first inorganic encapsulation layer ITL1 and the second inorganic encapsulation layer ITL2 (e.g., disposed between them in the third direction DR3). The first inorganic encapsulation layer ITL1 and the second inorganic encapsulation layer ITL2 may be formed by depositing an inorganic material, and the organic encapsulation layer OTL may be formed by depositing, printing, or coating an organic material.

[0162] The first inorganic encapsulation layer ITL1 and the second inorganic encapsulation layer ITL2 protect the display element layer EL from moisture and oxygen, and the organic encapsulation layer OTL protects the display element layer EL from foreign matter such as dust particles. In an embodiment, the first inorganic encapsulation layer ITL1 and the second inorganic encapsulation layer ITL2 may include at least one of silicon nitride, silicon oxynitride, silicon oxide, titanium oxide, and aluminum oxide. The organic encapsulation layer OTL may include a polymer, such as an acrylic organic layer. However, embodiments of the present disclosure are not necessarily limited thereto.

[0163] Figure 6 It is shown that the thin film encapsulation layer TFE includes two inorganic layers and one organic layer. However, the embodiments of the present disclosure are not necessarily limited thereto. For example, in an embodiment, the thin film encapsulation layer TFE may include three inorganic layers and two organic layers, and in this embodiment, the inorganic layers and the organic layers may be alternately stacked. In some embodiments, the display panel DP may further include a refractive index control layer formed on the thin film encapsulation layer TFE to improve the emission efficiency.

[0164] The second substrate S2 may be disposed on the first substrate S1 (e.g., disposed thereon in the third direction DR3). In an embodiment, the second substrate S2 may include a second base substrate BS2 (e.g., a cover base substrate), a first color filter CF1, a second color filter CF2, a third color filter CF3, a first light control pattern WC1, a second light control pattern WC2, a third light control pattern WC3, a partition BW, and a plurality of insulating layers 200-1, 200-2, and 200-3.

[0165] In an implementation, the second base substrate BS2 may be a stack structure including a silicon substrate, a plastic substrate, a glass substrate, an insulating layer, or a plurality of insulating layers. A bottom surface BS2 -B of the second base substrate BS2 may be flat.

[0166] A plurality of color filters CF1, CF2, and CF3 may be disposed on one surface of the second base substrate BS2. For example, a plurality of color filters CF1, CF2, and CF3 may be disposed on the bottom surface BS2-B of the second base substrate BS2. The first color filter CF1 may be disposed to overlap with the first light emitting region EA1 (e.g., disposed to overlap with it in the third direction DR3), the second color filter CF2 may be disposed to overlap with the second light emitting region EA2 (e.g., disposed to overlap with it in the third direction DR3), and the third color filter CF3 may be disposed to overlap with the third light emitting region EA3 (e.g., disposed to overlap with it in the third direction DR3).

[0167] The second color filter CF2 may be disposed in the second pixel region PXA2 and the peripheral region NPXA. A plurality of openings may be defined in the second color filter CF2. The plurality of openings may define the first pixel region PXA1 and the third pixel region PXA3. The first color filter CF1 may be disposed to overlap with the first pixel region PXA1 (e.g., disposed to overlap with it in the third direction DR3), and the third color filter CF3 may be disposed to overlap with the third pixel region PXA3 (e.g., disposed to overlap with it in the third direction DR3).

[0168] The third color filter CF3 may be disposed on the partition BW in the peripheral area NPXA.

[0169] The first color filter CF1 may be disposed on the third color filter CF3 in the peripheral area NPXA.

[0170] The second color filter CF2 may be disposed on the first color filter CF1 in the peripheral area NPXA.

[0171] Each of the first color filter CF1, the second color filter CF2, and the third color filter CF3 transmits light within a specific wavelength range and blocks light having a wavelength outside the corresponding wavelength range. Each of the first color filter CF1, the second color filter CF2, and the third color filter CF3 includes a base resin and a dye and / or pigment dispersed in the base resin. The base resin is a medium in which the dye and / or pigment are dispersed, and may be made of various resin components that may be generally referred to as a binder.

[0172] The first color filter CF1 may transmit the first color light, the second color filter CF2 may transmit the source light provided from the light emitting layer EML, and the third color filter CF3 may transmit the third color light. For example, in an embodiment, the first color filter CF1 may be a red color filter, the second color filter CF2 may be a blue color filter, and the third color filter CF3 may be a green color filter. In an embodiment, the first color filter CF1 and the third color filter CF3 may be yellow color filters. In this embodiment, the first color filter CF1 and the third color filter CF3 may be arranged to be connected to each other.

[0173] The first color filter CF1 may be arranged adjacent to the second color filter CF2. The third color filter CF3 may overlap the first color filter CF1 and the second color filter CF2 (e.g., overlap with them in the third direction DR3). The area overlapping with all of the multiple color filters CF1, CF2, and CF3 may block light. In this embodiment, a black component containing a light-shielding material may not be included. The area in which all of the multiple color filters CF1, CF2, and CF3 overlap may correspond to the peripheral area NPXA, and may correspond to the partition BW. In this case, the wording "corresponding" means that when viewed in the thickness direction of the display panel DP (e.g., the third direction DR3), the two components overlap each other, and are not necessarily limited to having the same area as each other.

[0174] The first insulating layer 200-1 may be disposed below the first color filter CF1, the second color filter CF2, and the third color filter CF3 (e.g., directly below them in the third direction DR3), and may cover the first color filter CF1, the second color filter CF2, and the third color filter CF3. The second insulating layer 200-2 may cover the first insulating layer 200-1 and may have a flat bottom surface. In an embodiment, the first insulating layer 200-1 may be an inorganic layer, and the second insulating layer 200-2 may be an organic layer. However, embodiments of the present disclosure are not necessarily limited thereto. For example, in an embodiment, the second insulating layer 200-2 may be omitted.

[0175] The partition BW may be disposed below the second insulating layer 200-2. The partition BW may be disposed in the peripheral area NPXA. A plurality of first openings BW-OP1 may be defined in the partition BW. The partition BW may include a material having a transmittance less than or equal to a specific value. For example, in an embodiment, the partition BW may include a light shielding material, and may include, for example, a typical black component. The partition BW may include a black dye and a black pigment mixed with a base resin. For example, in an embodiment, the partition BW may include at least one compound selected from propylene glycol methyl ether acetate, 3-methoxy-n-butyl acetate, an acrylate monomer, an acrylate 320 monomer, an organic pigment, and an acrylate.

[0176] A bottom surface BW-B of the partition BW may be defined on a surface facing the thin film encapsulation layer TFE.

[0177] The plurality of first openings BW-OP1 may correspond to the first pixel area PXA1, the second pixel area PXA2, and the third pixel area PXA3, respectively. The plurality of first openings BW-OP1 may correspond to the first light emitting area EA1, the second light emitting area EA2, and the third light emitting area EA3, respectively. In this case, the wording "corresponding" means that when viewed in the thickness direction (e.g., the third direction DR3) of the display panel DP, the two components overlap each other, and are not necessarily limited to having the same area as each other.

[0178] In an embodiment, the first light-controlling pattern WC1 is disposed in one of the plurality of first openings BW-OP1 and may convert the source light into the first color light. The second light-controlling pattern WC2 is disposed in one of the plurality of first openings BW-OP1 and may transmit the source light. The third light-controlling pattern WC3 is disposed in one of the plurality of first openings BW-OP1 and may convert the source light into the second color light.

[0179] In an embodiment, each of the first light-controlling pattern WC1, the second light-controlling pattern WC2, and the third light-controlling pattern WC3 may be formed by an inkjet process. A composition may be provided in a space defined by the partition BW (e.g., a plurality of first openings BW-OP1) to form the first light-controlling pattern WC1, the second light-controlling pattern WC2, and the third light-controlling pattern WC3.

[0180] In an embodiment, each of the first light control pattern WC1 and the third light control pattern WC3 may include a base resin, quantum dots and scattering particles, and the second light control pattern WC2 may include a base resin and scattering particles. However, embodiments of the present disclosure are not necessarily limited to this. For example, in an embodiment, each of the first light control pattern WC1, the second light control pattern WC2 and the third light control pattern WC3 includes a base resin and scattering particles, and at least two of the first light control pattern WC1, the second light control pattern WC2 and the third light control pattern WC3 may include quantum dots. According to an embodiment of the present disclosure, scattering particles may be omitted from any one of the first light control pattern WC1, the second light control pattern WC2 and the third light control pattern WC3.

[0181] The base resin is a medium in which quantum dots or scattering particles are dispersed, and can be formed by various resin components that can be generally referred to as binders. However, the embodiments of the present disclosure are not necessarily limited to this, and any medium used to disperse and set quantum dots in this specification may be referred to as a base resin, regardless of its name, other additional functions, constituent materials, etc. The base resin may be a polymer resin. For example, in an embodiment, the base resin may be an acrylic resin, a urethane resin, a silicone resin, or an epoxy resin. The base resin may be a transparent resin.

[0182] In an embodiment, the scattering particles may be titanium oxide (TiO 2 ) or silica-based nanoparticles. The scattering particles may scatter incident light to increase the amount of light provided to the outside. According to an embodiment of the present disclosure, at least one of the first light-controlling pattern WC1 and the third light-controlling pattern WC3 may not include the scattering particles.

[0183] Quantum dots can be particles that convert the wavelength of incident light. Quantum dots are materials that have a crystal structure with a size of several nanometers and include hundreds to thousands of atoms, and exhibit a quantum confinement effect in which the energy band gap increases due to its smaller size. When light with a wavelength higher than the band gap enters the quantum dot, the quantum dot absorbs the light, becomes excited, and falls into a ground state while emitting light with a specific wavelength. The emitted wavelength light has a value corresponding to the band gap. By adjusting the size and composition of the quantum dots, the luminescence characteristics due to the quantum confinement effect can be adjusted.

[0184] In an embodiment, the core of each of the quantum dots may be selected from a group consisting of a II-VI compound, a III-V compound, a III-VI compound, a I-III-VI compound, a IV-VI compound, a Group IV element, a Group IV compound, and combinations thereof.

[0185] In an embodiment, the II-VI compound may be selected from the group consisting of: a binary compound selected from the group consisting of CdSe, CdTe, CdS, ZnS, ZnSe, ZnTe, ZnO, HgS, HgSe, HgTe, MgSe, MgS, and mixtures thereof; a ternary compound selected from the group consisting of CdSeS, CdSeTe, CdSTe, ZnSeS, ZnSeTe, ZnSTe, HgSeS, HgSeTe, HgSTe, CdZnS, Cd ZnSe, CdZnTe, CdHgS, CdHgSe, CdHgTe, HgZnS, HgZnSe, HgZnTe, MgZnSe, MgZnS and mixtures thereof; and a quaternary compound selected from the group consisting of HgZnTeS, CdZnSeS, CdZnSeTe, CdZnSTe, CdHgSeS, CdHgSeTe, CdHgSTe, HgZnSeS, HgZnSeTe, HgZnSTe and mixtures thereof.

[0186] In an embodiment, the III-VI group compound may include: a binary compound such as In 2 S 3 andIn 2 Se 3 ; Ternary compounds such as InGaS 3 、and InGaSe 3 or a combination thereof.

[0187] In an embodiment, the I-III-VI group compound may be selected from the group consisting of: a ternary compound selected from AgInS, AgInS 2 、CuInS、CuInS 2 、AgGaS 2 、CuGaS 2 、CuGaO 2 、AgGaO 2 、AgAlO 2 and mixtures thereof; or a quaternary compound selected from AgInGaS 2 and CuInGaS 2 The group composed of.

[0188] In an embodiment, the III-V compound may be selected from the group consisting of: a binary compound selected from the group consisting of GaN, GaP, GaAs, GaSb, AlN, AlP, AlAs, AlSb, InN, InP, InAs, InSb, and mixtures thereof; a ternary compound selected from the group consisting of GaNP, GaNAs, GaNSb, GaPAs, GaPSb, AlNP, AlNAs, AlNSb, AlPAs, AlPSb, InGaP, InAlP, InNP, InNAs, InNSb, InPAs, InPSb, and mixtures thereof; and a quaternary compound selected from the group consisting of GaN, GaP, GaAs, GaSb, AlN, AlP, AlAs, AlSb, InN, InP, InAs, InSb, and mixtures thereof. At the same time, the III-V compound may also include a II group metal. For example, InZnP may be selected as the III-II-V compound.

[0189] In an embodiment, the IV-VI compound may be selected from the group consisting of: a binary compound including SnS, SnSe, SnTe, PbS, PbSe, PbTe, and mixtures thereof; a ternary compound selected from the group consisting of SnSeS, SnSeTe, SnSTe, PbSeS, PbSeTe, PbSTe, SnPbS, SnPbSe, SnPbTe, and mixtures thereof; and a quaternary compound selected from the group consisting of SnPbSSe, SnPbSeTe, SnPbSTe, and mixtures thereof. The IV group element may be selected from the group consisting of Si, Ge, and mixtures thereof. The IV group element may be selected from the group consisting of S320, SiGe, and mixtures thereof.

[0190] In this embodiment, the binary compound, ternary compound or quaternary compound can be present in the particle at a uniform concentration, or can be present in the same particle at different concentration distributions. In addition, a quantum dot can have a core-shell structure around another quantum dot. The interface surface between the core and the shell can have a concentration gradient in which the concentration of the element decreases toward the center.

[0191] According to some embodiments, the quantum dot may have a core-shell structure including a core (which includes nanocrystals) and a shell surrounding the core. The shell of the above quantum dot can be used as a protective layer to maintain semiconductor properties by preventing chemical modification of the above core, and / or can be used as a charging layer to apply electrophoretic properties to the quantum dot. The shell can be a single layer or multiple layers. The interface surface between the core and the shell can have a concentration gradient in which the concentration of the element present in the shell decreases toward the center. Examples of the shell of the quantum dot may include metal or non-metal oxides, semiconductor compounds, or combinations thereof.

[0192] For example, in an embodiment, the oxide of a metal or non-metal may be a binary compound such as SiO 2、 Al2O 3 、TiO 2 、ZnO、MnO、Mn 2 O 3 , Mn 3 O 4 , CuO, Fe 2 O 3 , Fe 3 O 4 , CoO, Co 3 O 4 and NiO; or ternary compounds such as MgAl 2 O 4 、CoFe 2 O 4 、NiFe 2 O 4 and CoMn 2 O 4 However, the embodiments of the present disclosure are not necessarily limited thereto.

[0193] In addition, in an embodiment, the semiconductor compound may be CdS, CdSe, CdTe, ZnS, ZnSe, ZnTe, ZnSeS, ZnTeS, GaAs, GaP, GaSb, HgS, HgSe, HgTe, InAs, InP, InGaP, InSb, AlAs, AlP, AlSb, or AlSb. However, embodiments of the present disclosure are not necessarily limited thereto.

[0194] The quantum dots may have a full width at half maximum (FWHM) of a light emission wavelength spectrum of about 45 nm or less, such as about 40 nm or less, such as about 30 nm or less, and may increase color purity or color reproducibility within this range. In addition, since the light emitted by the quantum dots is emitted in all directions, the light viewing angle may be increased.

[0195] In addition, the form of quantum dots is not necessarily limited to those commonly used in the art. For example, spherical, pyramidal, multi-armed or cubic (cub320) nanoparticles, nanotubes, nanowires, nanofibers and / or nanoplate particles can be used.

[0196] Quantum dots can adjust the color of emitted light according to particle size, and thus, quantum dots can have various light emission colors, such as blue, red, and green.

[0197] The third insulating layer 200-3 may cover the partition BW, the first light-controlling pattern WC1, the second light-controlling pattern WC2, and the third light-controlling pattern WC3. For example, the third insulating layer 200-3 may be an inorganic layer sealing the partition BW, the first light-controlling pattern WC1, the second light-controlling pattern WC2, and the third light-controlling pattern WC3.

[0198] Figure 7 is a flowchart illustrating a method of manufacturing a display device according to an embodiment of the present disclosure.

[0199] refer to Figure 7 , the display device DD may be manufactured by a specific process. In an embodiment, the display device DD may be manufactured by a thin film transistor (TFT) manufacturing process in block S100, a deposition process in block S200, a packaging process in block S300, a cell process in block S400, and a module process in block S500.

[0200] The TFT manufacturing process in frame S100 may represent a process for forming a thin film transistor (TFT). A thin film transistor may output a signal by controlling the on / off state of a pixel, which is the smallest unit of a display panel. A thin film transistor may be viewed as a smaller semiconductor that is used as a switch to turn light on or off by controlling an electrical signal. In this regard, the TFT manufacturing process may be understood as a process for manufacturing an electrode switch of a pixel on a glass substrate, which is a basic element of a display. The thin film transistor may include a first transistor TR1, a second transistor TR2, and a third transistor TR3.

[0201] According to an embodiment, a thin film transistor (TFT) may be formed by a plurality of mask processes. In an embodiment, the mask process may include a series of processes including a thin film deposition process, a cleaning process, a photolithography process, an etching process, a stripping process, and an inspection process. In each mask process, defects may be caused by foreign matter.

[0202] The deposition process in block S200 may refer to a process of chemically or physically forming an insulating layer, a semiconductor film, a metal film, etc. on a glass substrate.

[0203] The packaging process in block S300 may represent a process of blocking oxygen and moisture, thereby preventing the light emitting element ED from being allowed to be encapsulated (see Figure 5 ) The luminescent organic material and the electrode lose the luminescent property through the reaction between oxygen and moisture. In an embodiment, the packaging process in block S300 may further include a step of placing the first substrate S1 (see Figure 6 ) and a second substrate S2 (see Figure 6 ) combined process.

[0204] The unit cell process in block S400 may refer to a process for cutting the manufactured TFT substrate to make a portion (eg, a component) according to a purpose.

[0205] The module process in block S500 may represent a manufacturing process of attaching accessories to a panel that has undergone a cell process and modularizing the resulting structure to be used as a part (eg, component). For example, the part may include a drive circuit DC (see Figure 3 ) and voltage generator 300 (see Figure 3 ).

[0206] Figure 8 is a flow chart illustrating a portion of a cell process according to an embodiment of the present disclosure.

[0207] refer to Figure 7 and Figure 8 , the cell process in block S400 may include a cell drive inspection step in block S410 and a linear drive inspection step in block S420 .

[0208] Fig. 9 A stain compensation system for performing a cell drive inspection step and a linear drive inspection step according to an embodiment of the present disclosure is shown.

[0209] refer to Figure 8 and Fig. 9 , the stain compensation system SCA may include the display panel DP provided in the cell process in block S400, the imaging unit CAM, and the inspection device TD provided in the cell process in block S400.

[0210] The imaging unit CAM can capture the image displayed by the display panel DP (see Figure 1 IM) is used to generate image data IMD.

[0211] The inspection device TD may receive the image data IMD and generate first measurement data DATA1 and second measurement data DATA2 , respectively.

[0212] In an embodiment, the inspection device TD may include an inspection storage unit 510 and a defect characteristic classification unit 520 .

[0213] The first measurement data DATA1 and the second measurement data DATA2 may be stored in the inspection storage unit 510 .

[0214] In an embodiment, the defect characteristic classification unit 520 may classify the plurality of pixels PX (see Figure 3) is classified as a first defective pixel having a first defect, a second defective pixel having a second defect, or a third defective pixel having a third defect. Details thereof will be described later.

[0215] Fig.10 shows first measurement data according to an embodiment of the present disclosure, and FIG. 11A to FIG. 11C An enlarged portion of first measurement data according to an embodiment of the present disclosure is shown.

[0216] refer to Figures 7 to 11C The first measurement data DATA1 may be the cell drive inspection step in block S410, in the driving circuit DC (see Figure 3 ) and voltage generator 300 (see Figure 3 ) is not connected (such as, the display panel DP is not connected to the driving controller 100 (for example, not driven by the driving controller 100)), and the data is obtained by measuring the display panel DP through the array inspection device and the imaging unit CAM adopting the electrical scheme.

[0217] The inspection device TD may convert the received image data IMD into grayscale to generate the first measurement data DATA1. For example, the first measurement data DATA1 may include the image data IMD measured using the imaging unit CAM and the sensing line SL of each of the plurality of pixels PX obtained by the full contact array tester (see Figure 5 ) output value. In an embodiment, the array tester adopting the electrical scheme may be a capacitor Cst (see Figure 5 ) is a device that charges and checks the current value from each pixel to check for pixel defects.

[0218] In an embodiment, the display panel DP may have a stain defect as shown in the first measurement data DATA1. The stain defect may be caused by a brightness difference between a specific area and another area. For example, in some cases, the stain defect may have a point shape, a line shape, a band shape, a circular shape, or a polygonal shape, and may have an irregular shape. Due to an error or manufacturing defect caused in a manufacturing process, the stain defect may be caused by a defective pixel having a large brightness deviation compared to the brightness of another pixel.

[0219] The first area AA1 may be an area having fine monochrome stains DF1. The fine monochrome stains DF1 may be formed by a second substrate S2 including a light control pattern and a color filter (see Figure 6) is caused by defects in the image processing apparatus. The fine monochrome stain DF1 may be a stain having a size smaller than an area of ​​10×10 pixels. For example, when the size of the fine monochrome stain DF1 is greater than or equal to an area of ​​10×10 pixels, the fine monochrome stain DF1 may be classified as a monochrome stain. In the present specification, a fine stain may refer to a stain having a size smaller than an area of ​​10×10 pixels.

[0220] In the packaging process in block S300, the first substrate S1 (see Figure 6 ) and a second substrate S2 (see Figure 6 ) can cause fine monochrome stains DF1 due to absorbed or mixed moisture between the processes. The absorption of moisture may be caused by the delay between the processes, and aeration may be caused by the pixel (see Figure 3 This is caused by process limitations due to the reduction in the area of ​​PX).

[0221] The fine monochrome stain DF1 may be a stain observed due to a brightness difference in a monochrome pattern due to abnormal efficiency of light conversion caused by absorption and / or aeration of moisture. For example, the fine monochrome stain DF1 may be formed in the first pixel area PXA1 and the third pixel area PXA3 for the first light-controlling pattern WC1 and the third light-controlling pattern WC3 including quantum dots, and may not be formed in the second pixel area PXA2 for the second light-controlling pattern WC2 not including quantum dots.

[0222] The second region BB1 may be a region having a discoloration spot DF2. The discoloration spot DF2 may be due to the second substrate S2 including the light control pattern and the color filter (see Figure 6 ) is caused by defects in .

[0223] The discoloration stain DF2 may be a color uniformity defect caused by the recognition of the gray pattern. Figure 6 ) and the second substrate S2 (see Figure 6 ) Discoloration stains DF2 may be caused by moisture absorption and / or aeration between the combined processes.

[0224] Even when the second substrate S2 includes a microlens array, fine monochrome stains DF1 and discoloration stains DF2 may be formed. For example, according to an embodiment of the present disclosure, the stain compensation system SCA may sense fine monochrome stains and discoloration stains in a display device including a microlens array.

[0225] The third region CC1 may be a region in which the brightness difference stain DF3 is caused. In an embodiment, the brightness difference stain DF3 may be caused by the first substrate S1 including the driving transistor and the light emitting element (see Figure 6) is caused by defects in .

[0226] The brightness difference stain DF3 can be driven by the driving transistor (see Figure 5 The threshold voltage, mobility and light-emitting element of TR1) (see Figure 5 The defects in each of the ED) are caused.

[0227] Fig.12 shows second measurement data according to an embodiment of the present disclosure, and Fig.13A and Fig. 13B is an enlarged view of a portion of second measurement data according to an embodiment of the present disclosure.

[0228] refer to Figures 7 to 9 , Figures 12 to 13B The second measurement data DATA2 may be obtained by the linear drive inspection step in block S420 (where the drive circuit DC (see Figure 3 ) and voltage generator 300 (see Figure 3 ) is not connected) and the display panel DP is linearly driven and data is measured by using the imaging unit CAM.

[0229] In an embodiment, the inspection device TD may convert the received image data IMD into data having a grayscale level to generate the second measurement data DATA2.

[0230] The first area AA2 may be an area where the fine monochrome stain DF1-1 is generated. The first area AA2 may be an area corresponding to the first measurement data DATA1 (see Fig.10 ) of the first area AA1 (see Fig.10 ) corresponding to the area. The fine monochrome stain DF1-1 may be a region corresponding to the first measurement data (see Fig.10 DATA1) measured fine monochrome stain DF1 (see Fig.11A )Stains caused by the same defects.

[0231] The second area BB2 may be an area where the discoloration stain DF2-1 is caused. The second area BB2 may be an area corresponding to the first measurement data DATA1 (see Fig.10 ) of the second region BB1 (see Fig.10 ) area. The discolored stain DF2-1 may be caused by the difference with respect to the first measurement data DATA1 (see Fig.10 ) measured discoloration stain DF2 (see Fig. 11B )Stains caused by the same defects.

[0232] Brightness difference stain DF3 (see Fig. 11C) may not be included in the second measurement data DATA2. The imaging unit CAM may not measure the linear drive of the display panel DP by the driving transistor (see Figure 5 TR1) defects and / or multiple pixels (see Figure 3 PX) light emitting element (see Figure 5 For example, the second measurement data DATA2 may include data in which the first defect is compensated.

[0233] In an embodiment, the inspection device TD can be configured to receive the first measurement data DATA1 (see Fig.10 ) is compared with the second measurement data DATA2 to predict a plurality of pixels PX (see Figure 3 ). For example, in an embodiment, the inspection device TD may detect a first defect or a second defect in the first measurement data DATA1 (see Fig.10 ) and the second measurement data DATA2 will have a brightness difference stain DF3 caused by the first defect (see Fig. 11C ) is classified as a first defective pixel, and a fine monochrome stain DF1 caused by a second defect (see Fig. 11C ) is classified as a second defective pixel.

[0234] In addition, in the embodiment, the inspection device TD can also be based on the first measurement data DATA1 (see Fig.10 ) and the second measurement data DATA2 will have a discolored stain DF2 (see Fig. 11B ) is classified as a third defective pixel.

[0235] For example, in an embodiment, the inspection device TD may classify the second defective pixel based on the second measurement data DATA2, and may classify the second defective pixel based on the first measurement data DATA1 (see Fig.10 ) to classify the first defective pixel by excluding the second defective pixel.

[0236] According to an embodiment of the present disclosure, the stain compensation system SCA may be based on the first measurement data DATA1 (see Fig.10 ) and the second measurement data DATA2 to predict the defect characteristic. Thereafter, the inspection device TD may specify the defective pixels classified as having defects corresponding to each of the defect characteristics among the plurality of pixels PX, and may create lookup tables LUT1 to LUT6 (see Figure 4 ), and the lookup tables LUT1 to LUT6 may be provided to the drive controller 100 (see Figure 4 ). Drive controller 100 (see Figure 4) can prevent the image displayed on the display panel DP from being distorted by compensating for the defective pixel (see Figure 1 Therefore, a display device DD with improved display quality can be provided (see Figure 1 ), and a stain compensation system and a stain compensation method with improved reliability.

[0237] Fig.14 is a flow chart illustrating a portion of a module process according to an embodiment of the present disclosure.

[0238] refer to Figure 7 and Fig.14 The module process in block S500 may include a module contamination sensing step in block S510, a module optical sensing step in block S520, a defect characteristic extraction step in block S530, and a step of compensating for each defect characteristic in block S540.

[0239] Fig.15 A stain compensation system that performs a module stain sensing step, a module optical sensing step, a defect characteristic extraction step, and a step of compensating for each defect characteristic according to an embodiment of the present disclosure is shown.

[0240] refer to Fig. 9 and Fig.15 , the stain compensation system SCA may include the display device DD, the imaging unit CAM, and the inspection device TD provided in the module process in block S500.

[0241] The display device DD may include a display panel DP and a driving controller 100 .

[0242] In an embodiment, the imaging unit CAM can capture an image displayed by the display panel DP (see Figure 1 IM) to generate image data IMa, IMb and IMc.

[0243] The inspection device TD may receive the image data IMa, IMb, and IMc. The inspection device TD may receive the compensation data DATAa, DATAb, and DATAc from the display device DD. The inspection device TD may output the lookup tables LUT1 to LUT6 to the driving controller 100 .

[0244] The inspection device TD may further include a compensation data generating unit 530 .

[0245] In an embodiment, the defect characteristic classification unit 520 may classify a plurality of pixels PX (see FIG. 1 ) based on the image data IMa, IMb, and IMc and the compensation data DATAa, DATAb, and DATAc. Figure 3) is reclassified as a first defective pixel, a second defective pixel, or a third defective pixel. This will be described later.

[0246] The compensation data generating unit 530 may generate a compensation data based on the classified pixels PX (see Figure 3 ) generates a plurality of compensation values, and generates a lookup table LUT1 to LUT6 including the plurality of compensation values.

[0247] FIG. 16A to FIG. 16C Compensation data according to an embodiment of the present disclosure is shown.

[0248] refer to Figures 15 to 16C In an embodiment, the compensation data DATAa, DATAb, and DATAc may include first compensation data DATAa, second compensation data DATAb, and third compensation data DATAc.

[0249] In an embodiment, the first compensation data DATAa may be obtained by comparing the first measurement data DATA1 (see Fig. 9 ) and the second measurement data DATA2 (see Fig. 9 ) performs first compensation based on the defect characteristics predicted, and then measures a plurality of pixels PX (see Figure 3 ) of each of the drive transistors TR1 (see Figure 5 )’s threshold voltage (Vth) is used to re-detect defect characteristics.

[0250] In an embodiment, to measure the threshold voltage, the driving transistor TR1 (see Figure 5 ) can be operated in a source follower mode, the first sensing voltage can be input to the driving transistor TR1 (see Figure 5 ) source voltage, and can be based on the first sensing voltage through the sensing line SL (see Figure 5 ) detects the driving transistor TR1 (see Figure 5 ) of the threshold voltage. In this embodiment, the driving transistor TR1 (see Figure 5 ) can be determined according to the strength of the first sensing voltage. However, the embodiments of the present disclosure are not necessarily limited thereto, and the way of measuring the first compensation data DATAa can be provided differently.

[0251] In an embodiment, the second compensation data DATAb may be obtained by comparing the first measurement data DATA1 (see Fig. 9 ) and the second measurement data DATA2 (see Fig. 9 ) performs first compensation based on the defect characteristics predicted, and then measures a plurality of pixels PX (see Figure 3 ) of each of the drive transistors TR1 (see Figure 5) is the data obtained by re-detecting defect characteristics.

[0252] In an embodiment, in order to measure the mobility of the driving transistor TR1, a voltage higher than a threshold voltage may be applied to the driving transistor TR1 (see Figure 5 ), so that the driving transistor TR1 is turned on. In this state, the driving transistor TR1 (see Figure 5 ) is input as the second sensing voltage and can be sensed through the sensing line SL (see Figure 5 ) detects the driving transistor TR1 (see Figure 5 In this embodiment, the driving transistor TR1 (see Figure 5 ) can be determined according to the strength of the second sensing voltage. However, the embodiments of the present disclosure are not necessarily limited thereto, and a method of measuring the second compensation data DATAb may be provided differently.

[0253] The first region CCa may be a region having stains caused by brightness difference (e.g., brightness difference stains). The defect characteristic classification unit 520 may re-detect pixels having brightness difference stains caused by the first defect based on the second compensation data DATAb. The defect characteristic classification unit 520 may reclassify the pixels as first defective pixels, thereby increasing the reliability of the stain compensation method.

[0254] In an embodiment, the third compensation data DATAc may be obtained by comparing the first measurement data DATA1 (see Fig. 9 ) and the second measurement data DATA2 (see Fig. 9 ) performs the first compensation based on the defect characteristics predicted by the light emitting element, and then measures the light emitting element ED (see Figure 5 ) characteristics to re-test the defect characteristics to obtain data.

[0255] In the embodiment, in order to measure the light emitting element ED (see Figure 5 ) characteristics, when the driving transistor TR1 (see Figure 5 ) produces a uniform output current, the current from the light emitting element ED (see Figure 5 ) The intensity of the light emitted by the third compensation data DATAc. However, the embodiments of the present disclosure are not necessarily limited thereto, and the manner of measuring the third compensation data DATAc may be provided differently.

[0256] The second region CCb may be a region having stains (e.g., brightness difference stains) caused by brightness difference. The second region CCb may be a region corresponding to the first region CCa. The defect characteristic classification unit 520 may re-detect pixels having brightness difference stains caused by the first defect based on the third compensation data DATAc. The defect characteristic classification unit 520 may reclassify the pixels as first defective pixels, thereby increasing the reliability of the stain compensation method.

[0257] Fig.17A is a view showing first image data according to an embodiment of the present disclosure, and Fig. 17B is an enlarged view of a portion of first image data according to an embodiment of the present disclosure.

[0258] refer to Fig.17A and Fig. 17B In an embodiment, the first image data IMa, such as the 2-1st image data, may be obtained by an imaging unit CAM (see Fig.15 ) photographs the display panel DP displaying only the first light having the first color (see Fig.15 ) In an embodiment, the first color may be red.

[0259] The first region DD1 may be a region having fine monochrome stains. The fine monochrome stains may be formed by a second substrate S2 including a light control pattern and a color filter (see Figure 6 ). Fine monochrome stains may be stains having an area smaller than 10×10 pixels in size. Fine monochrome stains may be caused in a number corresponding to “A” pixels in a first pixel direction, and may be caused in a number corresponding to “B” pixels in a second pixel direction intersecting the first pixel direction. For example, in an example, “A” may be 10 and “B” may be 6.

[0260] Fig.18A shows second image data according to an embodiment of the present disclosure, and Fig.18B is an enlarged view showing a portion of the second image data according to an embodiment of the present disclosure.

[0261] refer to Fig.18A and Fig.18B In an embodiment, the second image data IMb, such as the 2-2 image data, may be obtained by the imaging unit CAM (see Fig.15 ) photographs the display panel DP displaying only the second light having the second color (see Fig.15 ) In an embodiment, the second color may be green.

[0262] The second region DD2 may be a region having fine monochrome stains. The fine monochrome stains may be due to the second substrate S2 including the light control pattern and the color filter (see Figure 6 ). The fine monochrome stain may be a stain having an area smaller than 10×10 pixels in size. The fine monochrome stain may be caused in a number corresponding to “C” pixels in the third pixel direction, and the fine monochrome stain may be caused in a number corresponding to “D” pixels in the fourth pixel direction intersecting the third pixel direction. For example, in the example, “C” may be 12, and D may be 8.

[0263] Fig.19A shows third image data according to an embodiment of the present disclosure, and Fig.19B is an enlarged view showing a portion of third image data according to an embodiment of the present disclosure.

[0264] refer to Fig.19A and Fig.19B In an embodiment, the third image data IMc, such as the 2nd-3rd image data, may be obtained by the imaging unit CAM (see Fig.15 ) photographs the display panel DP displaying only the third light having the third color (see Fig.15 ) In an embodiment, the third color may be blue.

[0265] Fine monochrome stains may be stains that are identified by brightness differences in a monochrome pattern due to abnormal efficiency of light conversion caused by absorption and / or aeration of moisture. For example, fine monochrome stains may not exist in the third image data IMc obtained by photographing the second light control pattern WC2 that does not include quantum dots using blue light.

[0266] refer to Figures 14 to 19B The stain compensation system SCA may sense the compensation data DATAa, DATAb, and DATAc during the module stain sensing step in block S510. The stain compensation system SCA may sense the image data IMa, IMb, and IMc during the module optical sensing step in block S520.

[0267] The defect characteristic classification unit 520 may classify the defect characteristics based on the first measurement data DATA1 measured in the cell process in block S400 during the defect characteristic extraction step in block S530 (see Fig. 9 ) and the second measurement data DATA2 (see Fig. 9 ) predicted defect characteristics, compensation data DATAa, DATAb and DATAc, and image data IMa, IMb and IMc to reclassify the defect characteristics.

[0268] In an embodiment, the defect characteristic classification unit 520 may compare the compensation data DATAa, DATAb, and DATAc with the image data IMa, IMb, and IMc to re-inspect the plurality of pixels PX (see Figure 3 ). For example, the defect characteristic classification unit 520 may reclassify a pixel having a brightness difference stain caused by the first defect as a first defective pixel, and reclassify a pixel having a fine monochrome stain caused by the second defect as a second defective pixel based on the compensation data DATAa, DATAb, and DATAc and the image data IMa, IMb, and IMc. The defect characteristic classification unit 520 may also reclassify a pixel having a discoloration stain as a third defective pixel.

[0269] For example, the defect characteristic classification unit 520 may reclassify the first defective pixel based on the compensation data DATAa, DATAb, and DATAc, and reclassify the second defective pixel by excluding the first defective pixel from the image data IMa, IMb, and IMc. The defect characteristic classification unit 520 may reclassify the first defective pixel and the second defective pixel to increase the reliability of the stain compensation method.

[0270] refer to Figures 7 to 9 , Fig.14 and Fig.15 The defect characteristic classification unit 520 may linearly drive the display panel DP in the linear driving inspection step in block S420 and first photograph the display panel DP using the imaging unit CAM. The defect characteristic classification unit 520 may classify the first defective pixel and the second defective pixel based on the first measurement data DATA1 and the second measurement data DATA2.

[0271] The defect characteristic classification unit 520 may photograph the display panel DP using the imaging unit CAM in the module optical sensing in block S520. The defect characteristic classification unit 520 may reclassify the second defective pixel based on the image data IMa, IMb, and IMc.

[0272] For example, the defect characteristic classification unit 520 may classify the plurality of pixels PX (see FIG. 1 ) based on the first measurement data DATA1, the second measurement data DATA2, and the image data IMa, IMb, and IMc. Figure 3 ) is classified into a first defective pixel and a second defective pixel.

[0273] According to an embodiment of the present disclosure, the defect characteristic classification unit 520 can extract defect characteristics in the cell process in box S400 using the data measured in the cell drive inspection in box S410 and the linear drive inspection in box S420, and re-extract the defect characteristics in the module process in box S500 using the data measured by the module stain sensing step in box S510 and the module optical sensing step in box S520, and combine the extracted defect characteristics with the re-extracted defect characteristics, thereby improving the reliability of classifying the defect characteristics.

[0274] The compensation data generation unit 530 may generate a first lookup table LUT1 including a first compensation value for compensating for the brightness of a first defective pixel in a first cell.

[0275] The compensation data generation unit 530 may generate a second lookup table LUT2 including second compensation values ​​for compensating the color of the second defective pixel in the second cell. The second compensation values ​​for compensating the colors of the plurality of second defective pixels in the second cell may be stored in the second lookup table LUT2.

[0276] The second lookup table LUT2 may store a second compensation value for compensating for a fine monochrome defect having a size smaller than an area of ​​10×10 pixels in the second unit.

[0277] The compensation data generating unit 530 may generate a third lookup table LUT3 including a third compensation value for compensating for the brightness of the first defective pixel in the second unit.

[0278] The compensation data generating unit 530 may generate a fourth lookup table LUT4 including a fourth compensation value for compensating for the gray level of the third defective pixel in the first unit.

[0279] The compensation data generation unit 530 may generate a fifth lookup table LUT5 including a fifth compensation value for compensating for the color of the second defective pixel in the first cell.

[0280] The compensation data generating unit 530 may generate a sixth lookup table LUT6 including a sixth compensation value for compensating for the gray level of the third defective pixel in the second cell.

[0281] The compensation data generating unit 530 may store the compensation data in the storage unit 120 (see Figure 4 ) provides a first lookup table LUT1 to a sixth lookup table LUT6.

[0282] According to an embodiment of the present disclosure, the stain compensation system SCA may include a defect characteristic classification unit 520 and a compensation data generation unit 530. The defect characteristic classification unit 520 may specify a plurality of pixels PX (see Figure 3 ), and the compensation data generating unit 530 may generate the first to sixth lookup tables LUT1 to LUT6 which optimize the compensation for the defective pixels and provide the first to sixth lookup tables LUT1 to LUT6 to the driving controller 100. The driving controller 100 may prevent the image IM displayed on the display panel DP from being defective by compensating for the defective pixels (see Figure 1 ) A stain defect occurs in the display device DD. Therefore, a display device DD with improved display quality, a stain compensation system with improved reliability, and a stain compensation method can be provided.

[0283] As described above, the stain compensation system can specify a defective pixel classified as having a defect corresponding to each of the defect characteristics among a plurality of pixels with respect to each defect characteristic, can create a lookup table for optimizing compensation for the defective pixel, and can provide the lookup table to a drive controller. The drive controller can compensate for the defective pixel to prevent a stain defect from occurring in an image displayed on a display panel. Therefore, a display device with improved display quality can be provided, and a stain compensation system and a stain compensation method with improved reliability can be provided.

[0284] Although the present disclosure has been described with reference to non-limiting embodiments thereof, it will be apparent to one skilled in the art that various changes and modifications can be made thereto without departing from the spirit and scope of the present disclosure.

Claims

1. A system for compensating for stains, comprising: A display device, comprising a display panel and a driving controller for driving the display panel, wherein the display panel comprises a plurality of pixels for displaying an image; an imaging unit, for capturing the image displayed by the display device; as well as an inspection device, outputting a first compensation value and a second compensation value different from the first compensation value to the drive controller, the inspection device comprising a defect characteristic classification unit and a compensation data generation unit, wherein the inspection device acquires first measurement data and second measurement data based on first image data generated by the imaging unit, wherein the inspection device compares the second image data generated by the imaging unit with compensation data based on the first measurement data and the second measurement data to determine the first compensation value and the second compensation value, wherein the defect characteristic classification unit classifies the plurality of pixels into first defective pixels having a first defect or second defective pixels having a second defect different from the first defect based on the first measurement data, the second measurement data, and the second image data, and The compensation data generating unit generates the first compensation value for compensating the first defective pixel in a first pixel unit and the second compensation value for compensating the second defective pixel in a second pixel unit different from the first pixel unit.

2. The system according to claim 1, wherein: The inspection device also includes: A storage unit is checked to store the first measurement data and the second measurement data.

3. The system according to claim 1, wherein: The second pixel unit is smaller than the first pixel unit.

4. The system of claim 3, wherein: The size of the first pixel unit is equal to the area of ​​8×8 pixels; and The size of the second pixel unit is equal to the area of ​​1×1 pixels.

5. The system of claim 1, wherein: The first compensation value compensates for the brightness of the first defective pixel; and The second compensation value compensates for a color of the second defective pixel.

6. The system according to claim 1, wherein: The first measurement data is data generated by measuring the display panel using a full-contact array tester and the imaging unit in a state where the display panel is not connected to the driving controller.

7. The system according to claim 1, wherein: The second image data includes: 2-1 image data generated by photographing the display panel displaying only the first light having the first color; and The 2-2 image data is generated by capturing an image of the display panel displaying only the second light having a second color different from the first color.

8. The system according to claim 1, wherein: Each of the plurality of pixels includes a driving transistor and a light emitting element electrically connected to the driving transistor.

9. The system according to claim 8, wherein: The second measurement data is data generated by linear driving of the driving transistor in the display panel in a state where the display panel is not connected to the driving controller.

10. The system of claim 9, wherein: The inspection device receives first compensation data, second compensation data, and third compensation data from the display device after first compensating for the defect characteristic predicted based on the first measurement data and the second measurement data, wherein the first compensation data is data generated by re-detecting the defect characteristic by measuring the threshold voltage of the driving transistor, wherein the second compensation data is data generated by re-detecting the defect characteristic by measuring the mobility of the driving transistor, and The third compensation data is data generated by re-detecting the defect characteristics by measuring the characteristics of the light emitting element.

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