Multi-channel full-temperature parameter program control measuring system for PINFET optical receiving assembly

Abstract

The invention relates to the technical field of optical fiber measurement, in particular to a PINFET optical receiving component multi-channel full-temperature parameter program control measurement system, which comprises a main control unit, a main power supply module and a test channel, and is characterized in that the test channel comprises a relay connected with the main power supply module in series, the relay is connected with a power supply module in series, and the power supply module is connected with the main power supply module. The power supply module is connected with a modulation laser module, an optical power measurement module and a TEC temperature control module in parallel, the modulation laser module is connected with a test seat through an optical fiber, and the test seat is connected with a direct current test module and an alternating current test module in parallel. In the prior art, production efficiency and measurement efficiency are low, performance parameters of devices at high / low temperature cannot be measured, test cost is high, and test difficulty is large.

Description

Technical Field

[0001] The invention relates to the technical field of optical fiber measurement, in particular to a multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component. Background Art

[0002] In the field of optical fiber communication and optical fiber sensing technology, PIN / FET optical receiving components are important components of optical fiber gyroscopes. The accuracy of gyroscopes depends largely on the performance and indicators of PIN / FET optical receiving components, so it is particularly important to accurately, quickly and easily measure the performance of PIN / FET optical receiving components. The full-temperature performance test of PIN / FET optical receiving components mainly includes noise, bandwidth, responsivity, sensitivity, no-light voltage value, linear minimum optical power, linear saturated optical power, responsivity change ratio, etc. At present, the traditional measurement method is mainly through source meter stacking, and each parameter is measured through source meters with different functions. The system composition is complex, the volume is large, the purchase cost of a single device is high, and the test program portability is poor.

[0003] In response to the above problems, China's patent disclosed "Test Method for Performance Index of PIN / FET Optical Receiver Component" (patent number 2011101193366), and proposed the technical problem of measuring the performance of PIN / FET optical receiver components, but the patent did not provide the method for actual PIN / FET device parameter testing, nor did it realize automatic data recording and measurement calculation. The patent "Manufacturing Method for Automatic Testing System of PIN / FET Optical Receiver Component" proposed a measurement device with integrated multiple functions, including high-frequency signal source, light source, electric multimeter, electric oscilloscope, optical power meter, optical attenuator, high-frequency noise millivolt meter and other equipment, and realized automatic data recording and measurement calculation under normal temperature, but the patented technology cannot realize single multi-channel device measurement, which reduces production efficiency and measurement efficiency, and cannot measure device performance parameters at high / low temperatures, which increases testing costs and increases testing difficulty.

[0004] Therefore, a multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component is needed to solve the problems raised in the above background technology. Summary of the invention

[0005] The object of the present invention is to provide a multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving assembly to solve the problems raised in the above background technology.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component comprises a main control unit, a main power module and a test channel, wherein the test channel comprises a relay connected in series with the main power module, the relay is connected in series with the power module, the power module is connected in parallel with a modulated laser module, an optical power measurement module and a TEC temperature control module, the modulated laser module is connected with a test socket via an optical fiber, and the test socket is connected in parallel with a DC test module and an AC test module.

[0008] As a preferred solution of the present invention, the test channels are provided in multiple groups, and the multiple groups of test channels are connected in parallel with the main power supply module, and the multiple groups of test channels are connected in parallel with the main control power supply.

[0009] As a preferred solution of the present invention, the optical power measurement module, the modulated laser module, the TEC temperature control module, the relay, the DC test module and the AC test module are all connected in parallel with the main control power supply through a signal feedback line.

[0010] As a preferred solution of the present invention, the relay is an active relay, the power supply module and the TEC temperature control module are connected in series with the test socket through wires, the part of the test socket in contact with the device is made of black copper, and is connected to the TEC temperature control module by welding at the bottom of the black copper.

[0011] As a preferred solution of the present invention, the power module sends commands through the main control unit to control the working state of each relay, ensuring that there is voltage input in the channel where the device is measured, and the voltage input is turned off in the idle channel.

[0012] As a preferred solution of the present invention, the host computer communicates with the main control unit through a 232 serial port. The host computer uses the feedback commands of each module uploaded by the main control unit as the trigger signal for the next step, and issues a planned program to control and monitor the working status of each module in the corresponding test channel.

[0013] As a preferred solution of the present invention, the main power module and the main control module are connected in series through a power line, and the optical power measurement module and the modulated laser module are connected in series through a test line.

[0014] As a preferred solution of the present invention, the main control unit, the main power module and the test channel adopt a unified communication interface and communication protocol, and the optical fiber end of the modulated laser module is connected to the device optical fiber through a flange.

[0015] Compared with the prior art, the present invention has the following beneficial effects:

[0016] 1. In the present invention, by installing the test device in the test socket, the main control unit detects the relay feedback signal in the corresponding test channel and uploads the feedback signal to the host computer. The host computer sends a trigger command to the main control unit. The main control unit programs the DC voltage test module and the AC voltage test module according to the trigger command to test the light-free voltage value and noise value of the device. The values ​​are automatically recorded and saved to the host computer by the main control unit and used as the trigger condition for the next operation instruction. After receiving the trigger command of the previous step, the main control unit will control the modulated laser module to output a DC optical signal to the test socket. At this time, the DC voltage test module will detect the device. The light-on voltage value is uploaded and saved, and then the device response is calculated according to the light-on voltage value and the light-off voltage value through the proposed algorithm. The value is automatically recorded and saved to the host computer through the main control unit, and used as the trigger condition for the next operation instruction. After receiving the trigger command of the previous step, the main control unit will control the modulated laser module to output the modulated optical signal to the test socket. At this time, the AC voltage test module will record the peak-to-peak value of the device voltage output in real time. By continuously controlling the frequency of the optical signal output by the modulated laser module, the peak-to-peak value detected by the AC voltage test module will change in real time until the peak-to-peak value of the device output AC voltage is 0.707 times, it is considered that the optical signal frequency corresponding to the peak-to-peak value is the bandwidth frequency of the device. The value is automatically recorded and saved to the host computer through the main control unit, and used as the trigger condition for the next operation instruction. After receiving the trigger command of the previous step, the main control unit will control the TEC temperature control module to adjust the temperature of the test socket. The part of the test socket that contacts the device is made of black copper, and is connected to the TEC temperature control module by welding at the bottom of the black copper, which can greatly ensure the uniformity of temperature. At the same time, the TEC temperature control module is equipped with a temperature feedback system, which can monitor the device temperature in real time through the host computer to ensure the accuracy of the high / low temperature performance measurement of the device. When the host computer monitors the device temperature to -45℃ or 70℃, the DC voltage test module tests the lightless / light-emitting voltage value at the temperature, and then calculates the device response change ratio according to the light-emitting voltage value and the lightless voltage value through the proposed algorithm. The value is automatically recorded and saved to the host computer through the main control unit. , and as the trigger condition for the next operation instruction, during the test, the optical power measurement module will measure the stability of the optical power output by the modulated laser module in real time to ensure the accuracy of the measurement results. When the optical power fluctuation range is found to exceed the output limit value, it will be immediately uploaded to the host computer through the main control unit for alarm. After receiving the alarm command, the host computer will immediately feedback to the main control unit to stop the working state of the module in the corresponding channel. The high-power TEC module is integrated, and the temperature control range reaches -45℃~180℃, which can realize the full-temperature performance test of the device and realize the single multi-channel test of the device, and the devices do not interfere with each other, reducing the complexity of the test system. It has the advantages of easy operation, small size, low cost, modular work, batch testing, etc., which solves the problems of being unable to realize single multi-channel device measurement, low production efficiency and measurement efficiency, and unable to measure device performance parameters at high / low temperatures, high test cost, and greater test difficulty. . BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the system flow of the present invention;

[0018] Figure 2 This is a system structure block diagram of the present invention. DETAILED DESCRIPTION

[0019] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0020] To facilitate understanding of the present invention, the present invention will be described more comprehensively below with reference to the relevant drawings, and several embodiments of the present invention are given. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0021] It should be noted that when an element is referred to as being "fixed on" another element, it may be directly on the other element or there may also be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used in this article are for illustrative purposes only.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which the present invention belongs. The terms used in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0023] For examples, see Figure 1-2 , the present invention provides a technical solution:

[0024] A multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component comprises a main control unit, a main power module and a test channel, wherein the test channel comprises a relay connected in series with the main power module, the relay is connected in series with the power module, the power module is connected in parallel with a modulated laser module, an optical power measurement module and a TEC temperature control module, the modulated laser module is connected with a test socket via an optical fiber, and the test socket is connected in parallel with a DC test module and an AC test module.

[0025] Furthermore, the test channels are provided in multiple groups, and the multiple groups of test channels are connected in parallel with the main power supply module, and the multiple groups of test channels are connected in parallel with the main control power supply.

[0026] Furthermore, the optical power measurement module, the modulated laser module, the TEC temperature control module, the relay, the DC test module and the AC test module are all connected in parallel with the main control power supply through a signal feedback line.

[0027] Furthermore, the relay is an active relay, the power module and the TEC temperature control module are connected in series with the test socket through wires, the part of the test socket that contacts the device is made of black copper, and is connected to the TEC temperature control module by welding at the bottom of the black copper.

[0028] Furthermore, the power supply module sends commands through the main control unit to control the working state of each relay, ensuring that there is voltage input in the channel where the device is measured, and the voltage input is turned off in the idle channel.

[0029] Furthermore, the host computer communicates with the main control unit through the 232 serial port. The host computer uses the feedback commands of each module uploaded by the main control unit as the trigger signal for the next step, and issues a planned program to control and monitor the working status of each module in the corresponding test channel.

[0030] Furthermore, the main power supply module and the main control module are connected in series via a power line, and the optical power measurement module and the modulated laser module are connected in series via a test line.

[0031] Furthermore, the main control unit, the main power supply module and the test channel adopt a unified communication interface and communication protocol, and the optical fiber end of the modulated laser module is connected to the device optical fiber through a flange.

[0032] The working process of the present invention is as follows: when the multi-channel full-temperature parameter program-controlled measurement system of the PINFET optical receiving component designed by the present invention is in operation, the device is placed on the apparatus, the apparatus is powered on, the main control unit starts to work, the main control unit test relay is closed, the power module starts to run, and it is observed whether the indicator light of the power module is on. If not, the relay connection status is checked. If the indicator light of the power module is on, the main control unit detects the relay feedback signal in the corresponding test channel and uploads the feedback signal to the host computer. The host computer sends a trigger command to the main control unit. The main control unit programs the DC voltage test module and the AC voltage test module according to the trigger command to test the light-free voltage value and noise value of the device. The values ​​are automatically recorded by the main control unit. The main control unit will record and save it to the host computer, and use it as the trigger condition for the next operation instruction. After receiving the trigger command of the previous step, the main control unit will control the modulated laser module to output a DC optical signal to the test socket. At this time, the DC voltage test module will detect the light-on voltage value of the device and upload it for storage. Then, the device responsiveness is calculated based on the light-on voltage value and the light-off voltage value through the proposed algorithm. The value is automatically recorded and saved to the host computer by the main control unit, and used as the trigger condition for the next operation instruction. After receiving the trigger command of the previous step, the main control unit will control the modulated laser module to output a modulated optical signal to the test socket. At this time, the AC voltage test module will record the peak-to-peak value of the device voltage output in real time. By continuously controlling the frequency of the optical signal output by the modulated laser module, the AC The peak-to-peak value detected by the current voltage test module will change in real time until the peak-to-peak value of the device output AC voltage is 0.707 times the peak-to-peak value of the highest point. The optical signal frequency corresponding to the peak-to-peak value is considered to be the bandwidth frequency of the device. The value is automatically recorded and saved to the host computer through the main control unit, and used as the trigger condition for the next operation instruction. After receiving the previous trigger command, the main control unit will control the TEC temperature control module to adjust the temperature of the test socket. The part of the test socket that contacts the device is made of black copper, and is connected to the TEC temperature control module by welding at the bottom of the black copper, which can greatly ensure the uniformity of temperature. At the same time, the TEC temperature control module has a temperature feedback system, which can monitor the device temperature in real time through the host computer to ensure the high / low temperature of the device. The accuracy of low-temperature performance measurement: when the temperature of the device monitored by the host computer reaches -45℃ or 70℃, the DC voltage test module tests the no-light / light-on voltage value at the temperature, and then calculates the device response change ratio according to the light-on voltage value and the no-light voltage value through the proposed algorithm. The value is automatically recorded and saved to the host computer through the main control unit, and serves as the trigger condition for the next operation instruction. During the test, the optical power measurement module will measure the stability of the output optical power of the modulated laser module in real time to ensure the accuracy of the measurement results. When it is found that the optical power fluctuation range exceeds the limit value, it will be immediately uploaded to the host computer through the main control unit for alarm. After receiving the alarm command, the host computer will immediately feedback to the main control unit to stop the working status of the module in the corresponding channel.

[0033] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component, comprising a main control unit, a main power module and a test channel, characterized in that: The test channel includes a relay connected in series with a main power supply module, the relay is connected in series with a power supply module, the power supply module is connected in parallel with a modulated laser module, an optical power measurement module and a TEC temperature control module, the modulated laser module is connected to a test socket via an optical fiber, and the test socket is connected in parallel with a DC test module and an AC test module.

2. A PINFET optical receiving component multi-channel full-temperature parameter program-controlled measurement system according to claim 1, characterized in that: The test channels are arranged in multiple groups, and the multiple groups of test channels are connected in parallel with the main power supply module, and the multiple groups of test channels are connected in parallel with the main control power supply.

3. A PINFET optical receiving component multi-channel full-temperature parameter program-controlled measurement system according to claim 1, characterized in that: The optical power measurement module, the modulated laser module, the TEC temperature control module, the relay, the DC test module and the AC test module are all connected in parallel with the main control power supply through a signal feedback line.

4. A multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component according to claim 1, characterized in that: The relay is an active relay. The power module and the TEC temperature control module are connected in series with the test socket through wires. The part of the test socket that contacts the device is made of black copper and is connected to the TEC temperature control module by welding at the bottom of the black copper.

5. A multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component according to claim 1, characterized in that: The power supply module sends commands through the main control unit to control the working state of each relay, ensuring that the channel where the device is measured has voltage input, and the voltage input of the idle channel is turned off.

6. A multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component according to claim 1, characterized in that: The host computer communicates with the main control unit through the 232 serial port. The host computer uses the feedback commands of each module uploaded by the main control unit as the trigger signal for the next step, and sends out a planned program to control and monitor the working status of each module in the corresponding test channel.

7. A PINFET optical receiving component multi-channel full-temperature parameter program-controlled measurement system according to claim 1, characterized in that: The total power supply module and the main control module are connected in series through a power line, and the optical power measurement module and the modulated laser module are connected in series through a test line.

8. A multi-channel full-temperature parameter program-controlled measurement system for a PINFET optical receiving component according to claim 1, characterized in that: The main control unit, the main power supply module and the test channel adopt a unified communication interface and communication protocol, and the optical fiber end of the modulated laser module is connected to the device optical fiber through a flange.

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