A well logging instrument intelligent detection system

Abstract

This invention belongs to the field of automated testing technology, and particularly relates to a smart testing system for well logging instruments. It includes a test housing and a host computer. The test housing is used to connect to the instrument under test and is connected to the host computer via a bus interface. The host computer is used to install smart instrument testing software. The smart instrument testing software includes a data input module; a truth table generation module; a logic relationship processing module; a fault matching module, which has a built-in expert diagnostic processing knowledge base; and a fault diagnosis module. Addressing the shortcomings of existing well logging instrument testing methods, such as the inability to standardize fault detection processes, solidify software, and digitize records, and the inability to quickly locate and diagnose instrument faults, this invention proposes a smart testing system for well logging instruments.

Description

Technical Field

[0001] This invention belongs to the field of automated detection technology, and in particular relates to an intelligent detection system for well logging instruments. Background Technology

[0002] Currently, well logging instrument maintenance uses traditional single-board testing and digital testing methods for downhole logging instruments. Both methods work by sending the signals collected by the logging instrument to a host computer, determining whether the signals at the observation points are abnormal, and then having maintenance personnel manually locate the fault point based on the abnormal signals.

[0003] Traditional single-board testing methods require the connection of a signal generator, power supply, and oscilloscope to measure the waveform and other characteristic parameters of the observation point. On-site maintenance personnel then determine the approximate fault area based on the measured signals and manually troubleshoot the fault. This requires on-site maintenance personnel to possess extensive professional knowledge and field repair experience. Digital testing of downhole logging instruments in China primarily utilizes portable test benches, requiring the connection of a remote transmission sub. Another method typically uses a laptop, bus converter, and power supply to construct a simple testing device, determining the fault area based on the signal transmitted by the instrument. All of the aforementioned domestic and international fault detection methods remain at the general testing level, only capable of identifying problems. Repair or debugging activities are conducted by experienced operators under the guidance of maintenance manuals or operating instructions, without providing intelligent repair or debugging solutions.

[0004] The patent, with patent number CN200710099358.4 and titled "Test Unit of Well Logging Instrument Repair and Testing System", discloses a test unit for well logging instrument repair and testing system. This test unit only realizes the signal acquisition and processing of well logging instruments and does not have the function of locating fault points in the instrument circuit.

[0005] The patent, with patent number CN201110218401.0 and titled "A Fault Diagnosis Device and Method for Petroleum Instruments," discloses a portable fault diagnosis instrument method. However, this method requires the design of oscilloscope card interfaces, multimeter card interfaces, and digital signal acquisition card interfaces for different instruments, resulting in a large amount of interactive information. Furthermore, it is impractical to add so many interfaces when testing actual downhole logging instruments due to the excessive human intervention factors.

[0006] The patent number is CN201710545385.3, and the title is "A method, device and electronic equipment for online fault diagnosis". Its fault diagnosis adopts a fault tree model, which simply divides the causes of faults into single-node hierarchical progression relationships. However, instrument faults are multi-node, and a fault contains one or more processing elements. Therefore, this diagnostic method cannot comprehensively and accurately locate the fault.

[0007] To address the shortcomings of the aforementioned instrument testing methods, which fail to standardize fault detection processes, solidify software, and digitize records, and thus cannot achieve rapid location and diagnosis of instrument faults, this invention proposes a smart testing system for well logging instruments. Summary of the Invention

[0008] The purpose of this invention is to provide a smart detection system for well logging instruments, which standardizes the fault detection process, solidifies the software, and digitizes the records, making it more compatible with the needs of on-site instrument repair and debugging processes, enabling rapid location and diagnosis of instrument faults, and improving maintenance efficiency and quality.

[0009] A smart testing system for logging instruments includes a test housing and a host computer. The test housing is used to connect to the instrument under test and is connected to the host computer via a bus interface. The host computer is used to install smart instrument testing software.

[0010] The intelligent instrument testing software includes: an expert diagnostic knowledge base for storing fault model data and corresponding processing methods; a data input module for receiving status words collected by the test chamber; a truth table generation module for binarizing the collected status words, arranging the binarized status words into a truth table, and sending the truth table to the logic relation processing module; a logic relation processing module for receiving the truth table sent by the truth table generation module, performing logical AND and OR operations on the binarized status words in the truth table to obtain a fault mask; a fault matching module for matching the fault mask with the fault model codes in the expert diagnostic knowledge base to obtain a matching result; and a fault diagnosis module for outputting the corresponding processing method from the expert diagnostic knowledge base as a diagnostic result based on the obtained matching result.

[0011] Optionally, the binarization process is as follows: compare the acquired status word with the nominal value of the status word. If it is within the specified error range, process the status word as logic "1"; otherwise, process it as logic "0".

[0012] Optionally, the intelligent instrument testing software also includes a voice assistant prompt module, which provides voice guidance to users to complete circuit board-level fault location and / or instrument fault diagnosis based on diagnostic results.

[0013] Optionally, the method for arranging the binarized state words into a truth table is as follows:

[0014] S1. Group the binarized status words according to the structure or function of the instrument under test;

[0015] S2. Arrange all groups according to the first set order to form a truth table.

[0016] Optionally, the truth table generation module performs logical AND and OR operations on the binarized state words in the truth table to obtain the fault mask. The steps of this method are as follows:

[0017] S11. The logic relationship processing module lists all possible fault information of the instrument under test (3) in the second set order.

[0018] S12. Based on the possible fault information, select the group in the truth table that is related to the possible fault information;

[0019] S13. Select the binarized status word related to possible fault information from the selected group;

[0020] S14. If there are multiple binarized status words selected in the selected group, then according to the corresponding logical "AND" and logical "OR" relationships stored in the expert diagnosis processing knowledge base, perform logical relationship operations on the binarized status words selected in the selected group to obtain the output result of the selected group. If there is only one binarized status word selected in the selected group, then the binarized status word is used as the output result of the selected group. The output results of the selected group are arranged in the first preset order to obtain the combination code corresponding to the fault information.

[0021] S15. Repeat steps S12-S14 to obtain the combination code corresponding to each fault information. Arrange the combination codes corresponding to each fault information in the second preset order to obtain the fault mask.

[0022] Optionally, the system includes three modes.

[0023] The intelligent single-board detection mode is used to detect faults in circuit boards.

[0024] The single-board positioning one-click detection mode is used for one-click detection of single-board faults in instruments.

[0025] Instrument fault detection mode, used for detecting complex faults in instrument circuits.

[0026] Optionally, the expert diagnostic processing knowledge base includes a binary status word group, a logical relationship group, and a diagnostic conclusion group. The binary status word group stores the fault model code, which is used to match the fault mask. The logical relationship group stores the logical "AND" and logical "OR" relationships of the status word. The diagnostic conclusion group stores the diagnostic results corresponding to the fault code.

[0027] Optionally, the logic relationship processing module constructs logical "AND" and logical "OR" relationships between different status words based on the correlation between different status words and circuit boards or instrument components, and stores the constructed logical relationships in the logical relationship group in the expert knowledge base.

[0028] Optionally, the test chamber includes:

[0029] The power module is used to provide a stable power supply to the instrument under test and the host computer.

[0030] The signal acquisition module is used to acquire signals from the instrument under test and convert them into digital signals.

[0031] The bus interface module is used to transmit the digital signals acquired by the signal acquisition module to the host computer;

[0032] The instrument interface module is used to connect the instrument under test and the test chamber.

[0033] Optionally, the host computer may also include,

[0034] The data display unit is used to display the diagnostic results of the intelligent instrument detection software on the screen in the form of graphics or text;

[0035] The data storage unit is used to store the diagnostic results and related data of the intelligent instrument detection software in memory or external storage devices.

[0036] The beneficial effects of this invention are as follows:

[0037] 1. This invention employs intelligent instrument detection software, which performs binarization, logical relationship processing, fault matching, and fault diagnosis on status words, thereby enabling rapid location and diagnosis of instrument faults and improving maintenance efficiency and quality.

[0038] 2. This invention uses a test chamber, which is connected to the instrument under test and to the host computer via a bus interface, thereby realizing the acquisition and transmission of instrument signals and simplifying the structure and operation of the testing device.

[0039] 3. This invention employs a voice assistant prompt module, which guides users to complete circuit board-level fault location and instrument fault diagnosis based on diagnostic results, thereby improving user convenience and user-friendliness.

[0040] 4. This invention employs a data display unit and a data storage unit. By displaying the diagnostic results of the intelligent instrument detection software on the screen in the form of graphics or text, and storing the diagnostic results and related data in memory or external storage devices, the visualization and informatization of the detection data are realized.

[0041] 5. This invention employs three modes: intelligent single-board detection mode, single-board positioning one-click detection mode, and instrument fault detection mode, achieving adaptability and flexibility for different types of instrument faults.

[0042] In summary, this invention features standardized fault detection procedures, software integration, and information-based recording, which better meets the needs of on-site instrument repair and debugging processes, and achieves the beneficial effect of rapid fault location and diagnosis. Attached Figure Description

[0043] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings:

[0044] Figure 1 This is a schematic diagram of an embodiment of a smart detection system for well logging instruments according to the present invention.

[0045] Figure 2 This is a schematic diagram of the rear structure of an embodiment of the intelligent detection system for well logging instruments according to the present invention.

[0046] Figure 3 This is a schematic diagram of the intelligent instrument detection software configuration of an embodiment of the intelligent detection system for well logging instruments according to the present invention.

[0047] Figure 4 This is a flowchart illustrating an embodiment of a method for a smart detection system for well logging instruments according to the present invention.

[0048] Figure 5 This is a flowchart illustrating an embodiment of a smart single-board detection method for a well logging instrument smart detection system according to the present invention.

[0049] Figure 6 This is a flowchart illustrating an embodiment of a single-board positioning one-click detection method for a smart detection system for well logging instruments according to the present invention.

[0050] Figure 7 This is a flowchart illustrating an embodiment of an instrument fault detection method for a well logging instrument intelligent detection system according to the present invention.

[0051] Wherein: 1-Host computer, 2-Test enclosure, 3-Instrument under test, 4-Bus interface. Detailed Implementation

[0052] The present invention will now be described in detail with reference to the accompanying drawings and embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other.

[0053] The following detailed description is exemplary and intended to provide further detailed explanation of the invention. Unless otherwise specified, all technical terms used in this invention have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains. The terminology used in this invention is for the purpose of describing particular embodiments only and is not intended to limit the scope of exemplary embodiments according to the invention.

[0054] like Figures 1-3 As shown, a smart detection system for well logging instruments includes,

[0055] A smart detection system for logging instruments includes a test box 2 and a host computer 1. The test box is used to connect to the instrument under test 3 and is connected to the host computer 1 through a bus interface 4.

[0056] Host computer 1 is used to install the intelligent instrument detection software;

[0057] The intelligent instrument testing software includes: an expert diagnostic knowledge base for storing fault model data and corresponding processing methods; a data input module for receiving status words collected by the test chamber 2; a truth table generation module for binarizing the collected status words, arranging the binarized status words into a truth table, and sending the truth table to the logic relation processing module; a logic relation processing module for receiving the truth table sent by the truth table generation module, performing logical AND and OR operations on the binarized status words in the truth table to obtain a fault mask; a fault matching module for matching the fault mask with the fault model codes in the expert diagnostic processing knowledge base to obtain a matching result; and a fault diagnosis module for outputting the corresponding processing method from the expert diagnostic processing knowledge base as a diagnostic result based on the obtained matching result.

[0058] Specifically, the data input module can be connected to the instrument under test 3 through the test box 2, and transmit the status word of the instrument under test 3 to the host computer 1 through the bus interface 4 or other interfaces.

[0059] As a specific example, the test enclosure 2 includes: a power supply module for providing a stable power supply to the instrument under test 3 and the host computer 1; a signal acquisition module for acquiring the signal of the instrument under test 3 and converting it into a digital signal; a bus interface 4 module for transmitting the digital signal acquired by the signal acquisition module to the host computer 1; and an instrument interface module for connecting the instrument under test 3 and the test enclosure 2.

[0060] As a specific example, the binarization process is as follows: The acquired status word is compared with its nominal value. If it is within the specified error range, the status word is processed as logic "1"; otherwise, it is processed as logic "0". The nominal value of the status word refers to the status word value that the instrument under test (DUT) 3 should have during normal operation, such as power supply voltage, current, and frequency. The specified error range refers to the allowable deviation between the status word value and the nominal value of the DUT 3 during normal operation, such as ±5%. The truth table generation module performs binarization processing on the acquired status words, arranges the binarized status words into a truth table, and arranges them according to the various functions and circuit principles of the DUT 3. The truth table is stored in memory or an external storage device, i.e., in the data storage unit, and then sent to the logic relationship processing module.

[0061] As a concrete example, the method for arranging the binarized state words into a truth table is as follows:

[0062] S1. Group the binarized status words according to the structure or function of the instrument under test 3.

[0063] S2. Arrange all groups according to the first set order to form a truth table.

[0064] Specifically, the initial grouping order can be based on the single-board division, or it can be the order initially set by the system. For example, it can be sorted from least to most according to the number of group status words.

[0065] As a specific example, the logic relation processing module performs logical "AND" and logical "OR" operations on the binarized state words in the truth table to obtain the fault mask. The steps of this method are as follows:

[0066] S11. The logic relationship processing module lists all possible fault information of the instrument under test (3) in the second set order.

[0067] S12. Based on the possible fault information, select the group in the truth table that is related to the possible fault information;

[0068] S13. Select the binarized status word related to possible fault information from the selected group;

[0069] S14. If there are multiple binarized status words selected in the selected group, then according to the corresponding logical "AND" and logical "OR" relationships stored in the expert diagnosis processing knowledge base, perform logical relationship operations on the binarized status words selected in the selected group to obtain the output result of the selected group. If there is only one binarized status word selected in the selected group, then use the binarized status word as the output result of the selected group. The output results of the selected group are arranged in the first set order to obtain the combination code corresponding to the fault information.

[0070] S15. Repeat steps S12-S14 to obtain the combination code corresponding to each fault information. Arrange the combination codes corresponding to each fault information in the second preset order to obtain the fault mask.

[0071] The second setting order can be the order of the initial system settings, such as sorting by the probability of failure from smallest to largest, and the possible fault information can be the single board or function that may fail.

[0072] The output results of the selected group are arranged in a first set order, which can be arranged horizontally. The fault mask can be formed by arranging the various combination codes in a second set order in the vertical direction.

[0073] For unselected groups in S14 that are not related to the fault information, the output result for the selected groups can be empty.

[0074] As a specific example, the logic relation processing module constructs logical "AND" and "OR" relationships between different state words based on their correlation with circuit boards or instrument components. These relationships are stored in a logic relation group in the expert knowledge base. The module then performs corresponding logical "AND" and "OR" operations on the binarized state words to obtain a fault mask. Logical relationships can refer to necessary or sufficient conditional relationships between different state words determined based on fault diagnosis rules and experience in the expert diagnostic processing knowledge base. The logic relation processing module extracts the corresponding logical relationships stored in the logic relation group based on the correlation between different state words and circuit boards or instrument components, such as A AND B, A OR B, etc. A fault mask is an encoding representing fault characteristics, composed of binarized state words and logical relationships, such as 0101, 1100, etc. The logic relation processing module can perform logical relation operations on the binarized state words in the truth table and store the resulting fault mask in memory or external storage devices (i.e., in the data storage unit), and then send the obtained fault mask to the fault matching module.

[0075] As a specific example, the diagnostic results include diagnostic diagrams, diagnostic recommendations, causes of failure, diagnostic reports, fault location information, handling steps, and handling methods.

[0076] Diagnostic diagrams refer to the prompts displayed on the data display unit in graphical or textual form, based on the fault causes and solutions from the expert diagnostic processing knowledge base, such as circuit diagrams, waveform diagrams, and flowcharts. Diagnostic suggestions refer to repair or debugging solutions provided in text or voice form, based on the fault causes and solutions from the expert diagnostic processing knowledge base, such as replacing circuit boards or adjusting parameters. Fault causes refer to the reasons for the abnormality of the tested instrument 3, provided in text or voice form, based on the fault causes and solutions from the expert diagnostic processing knowledge base, such as unstable power supply or communication line interference. Diagnostic reports are documents generated in text or tabular form, recording the testing process and results of the tested instrument 3, based on the fault causes and solutions from the expert diagnostic processing knowledge base, such as testing time, testing personnel, testing items, and testing results. Fault location information refers to information in text or voice form indicating the abnormality of specific parts or components of the tested instrument 3, such as the power module or communication acquisition module, based on the fault causes and solutions from the expert diagnostic processing knowledge base. The processing steps and methods refer to the steps and methods provided in text or voice form to guide maintenance or debugging personnel on how to operate or repair the system, based on the fault causes and solutions in the expert diagnostic knowledge base. Examples include disassembling circuit boards and replacing components. The fault diagnosis module can output the matching results through the data display unit in the host computer 1, and store the output results in memory or external storage devices, i.e., in the data storage unit.

[0077] Specifically, the fault matching module matches fault masks with fault model codes in the expert diagnostic processing knowledge base. The expert diagnostic processing knowledge base is a database established based on the summaries and generalizations of experts or experienced personnel regarding the causes and solutions to logging instrument faults. It includes fault models, fault causes, fault diagnosis diagrams, diagnostic suggestions, fault location information, processing steps, and processing methods. A fault model is defined as a fault type that maps different fault masks to corresponding fault model codes based on fault diagnosis rules and experience in the expert diagnostic processing knowledge base; for example, 0101 represents a power failure, and 1100 represents a communication acquisition failure. The fault matching module can compare the fault mask and fault model codes through the data matching module in the host computer 1, and store the comparison results in memory or external storage devices, i.e., in the data storage unit.

[0078] As a specific example, a status word refers to a signal generated by the instrument under test (DUT) 3 during operation to indicate its working status. Status words include: a power status word, used to indicate the power status of the DUT 3; a communication acquisition status word, used to indicate the communication acquisition status of the DUT 3; a transmit excitation status word, used to indicate the transmit excitation status of the DUT 3; a receive conditioning status word, used to indicate the receive conditioning status of the DUT 3; and a probe status word, used to indicate the probe status of the DUT 3.

[0079] As a specific example, the expert diagnostic processing knowledge base includes a binary state word group, a logical relationship group, and a diagnostic conclusion group.

[0080] The expert diagnostic and handling knowledge base can be set up within the fault matching module or simultaneously within the fault diagnosis module.

[0081] The expert diagnostic processing knowledge base vertically divides the fault diagnosis modules into power supply fault diagnosis and processing modules, communication acquisition fault diagnosis and processing modules, transmission excitation fault diagnosis and processing modules, reception conditioning fault diagnosis and processing modules, and probe fault diagnosis and processing modules. Horizontally, each fault module is divided into module-related status words, auxiliary logic conditions, signal flow node combinations, node fault cause combinations, processing combinations, cause characteristic value combinations, and assistant prompt information combinations. The expert diagnostic processing knowledge base can be a multi-dimensional data structure, allowing for querying and matching based on different dimensions. Vertically, the knowledge base categorizes fault diagnosis modules according to different functions or signal processing parts of the instrument under test (DUT), such as power supply, communication acquisition, transmission excitation, reception conditioning, and probe sections. This facilitates the identification of potentially faulty parts or modules based on different status words or fault masks of the DUT. Horizontally, the expert diagnostic processing knowledge base categorizes each fault diagnosis and processing module according to different information or conditions, such as module-related status words, auxiliary logic conditions, signal flow node combinations, node fault cause combinations, processing combinations, cause characteristic value combinations, and assistant prompt information combinations. This allows for convenient determination of specific fault causes and solutions based on different information or conditions of the instrument under test 3.

[0082] The expert diagnostic processing knowledge base can be a data structure consisting of three main parts: binary status word groups, logical relationship groups, and diagnostic conclusion groups. The binary status word groups store fault model codes for matching with fault masks. The logical relationship groups store the logical "AND" and "OR" relationships between the status words. The diagnostic conclusion groups store the diagnostic results corresponding to the fault codes. Queries and matches can be performed based on different inputs and outputs. Binary status word groups refer to the binary data stored in the expert diagnostic processing knowledge base representing the status word values ​​that the tested instrument 3 should have during normal or abnormal operation, such as 0101, 1100, etc. Logical relationship groups refer to the logical data stored in the expert diagnostic processing knowledge base representing the necessary or sufficient conditional relationships between different status words, such as A AND B, A OR B, etc.

[0083] In the logic relation processing module, logical AND and OR operations are performed on the binarized status words in the truth table. These logical relations are derived from the logical relation groups. The diagnostic conclusion group refers to text or voice data stored in the expert diagnostic processing knowledge base, representing the fault type and solution determined based on different status words and logical relations, such as power failure, communication acquisition failure, etc. This allows for convenient matching of the fault mask with the binarized status word groups in the expert diagnostic processing knowledge base, and outputs the corresponding diagnostic conclusion group.

[0084] As a preferred example, the intelligent instrument testing software also includes a voice assistant prompt module, which provides voice guidance to users to complete circuit board-level fault location and / or instrument fault diagnosis based on diagnostic results.

[0085] Specifically, the host computer 1 can be equipped with a voice unit to receive audio signals from the voice assistant prompt module and produce sound. The voice assistant prompt module can also be equipped with a separate sound function.

[0086] As a preferred example, host computer 1 also includes,

[0087] The data display unit is used to display the diagnostic results of the intelligent instrument detection software on the screen in the form of graphics or text;

[0088] The data storage unit is used to store the diagnostic results and related data of the intelligent instrument detection software in memory or external storage devices.

[0089] As a preferred example, the system includes three modes.

[0090] The intelligent single-board detection mode is used to detect faults in circuit boards.

[0091] The single-board positioning one-click detection mode is used for one-click detection of single-board faults in instruments.

[0092] Instrument fault detection mode, used for detecting complex faults in instrument circuits.

[0093] Depending on the object being tested, the system's testing methods can be divided into intelligent single-board testing methods for circuit boards, and single-board positioning one-click testing methods and instrument fault detection methods for instruments.

[0094] The intelligent single-board testing method is based on the following principle: A host computer 1 with the intelligent single-board testing software installed is connected to the test enclosure 2 via bus interface 4 to complete signal measurement and uploading of the circuit board under test. The host computer 1 collects the status word combinations through the communication link and performs binarization processing. If the logical AND relationship of these status word combinations is "0", the single board is considered abnormal; otherwise, it is "1", indicating normal operation.

[0095] The principle behind the one-click single-board location detection method is as follows: The host computer 1 is connected to the instrument under test 3 via the test enclosure 2. The host computer 1, equipped with intelligent single-board detection software, completes the measurement and uploading of the instrument's logging signals through the bus conversion board in the test enclosure 2. The status word is binarized and judged. Unlike the intelligent single-board detection method, this method requires establishing logical AND and OR relationships between the signals associated with the single board based on the board-level location logic. The uploaded status word, after binarization, is combined with the logical relationship group to form a corresponding diagnostic conclusion. The diagnostic conclusion includes troubleshooting suggestions for the abnormal circuits under the condition of the status combination and the logical relationship combination. Operators verify the suggestions step-by-step using backup boards, then repeat the testing process to ultimately determine the type and number of faulty single boards in the instrument.

[0096] The instrument fault detection method considers not only circuit board issues but also complex situations such as abnormalities in wiring, framework, and other components. The status words are sourced from three sources: information uploaded by the instrument under test (DUT), power supply interaction information, and node interaction information. Nodes are set between boards or between functional blocks and boards, and their types and numbers are related to the overall status after binarization of the DUT's status words and power supply status words. After the binarized values ​​of the three status words are determined, they are matched with the fault model in the expert diagnostic and processing knowledge base to form an expert troubleshooting plan. The user verifies the plan step by step according to the troubleshooting suggestions until all faults are located and repaired.

[0097] Example 1, as Figure 4 The usage method of this system is as follows:

[0098] S1. Place the instrument under test 3 into the test chamber 2. The test chamber 2 collects the signal of the instrument under test 3 and uploads the signal to the host computer 1 through the bus interface 4.

[0099] S2. The data input module of the intelligent instrument testing software receives the signal uploaded by the test chamber 2, extracts and organizes the information in the signal to obtain the required status word, and transmits the status word to the truth table generation module.

[0100] S3. The truth table generation module compares the status word with the nominal value of the status word. If it is within the specified error range, it is processed as logic "1"; otherwise, it is processed as logic "0". The binarized status word is then transmitted to the logic relation processing module.

[0101] S4. The logic relationship processing module performs logical AND and logical OR operations on the binarized status word to obtain the fault mask, and sends the fault mask to the fault matching module.

[0102] S5. The fault matching module matches the fault mask with the fault model in the expert diagnosis and processing knowledge base to obtain the matching result. The fault diagnosis module outputs the diagnosis result in the expert diagnosis and processing knowledge base based on the obtained matching result.

[0103] S6. The voice assistant prompt module provides voice guidance to users based on diagnostic results to complete circuit board-level fault location and / or instrument fault diagnosis.

[0104] S7. The host computer 1 generates the corresponding detection report and stores the recorded fault information.

[0105] Example 2, as Figure 5 As shown, a smart board testing method based on a smart board testing mode includes the following steps:

[0106] S11. Place the circuit board under test into the test chamber 2. The test chamber 2 collects the signals from the circuit board under test and uploads the signals to the host computer 1 through the bus interface 4.

[0107] S12. The data input module of the intelligent instrument testing software receives the signal uploaded by the test chamber 2, extracts and organizes the information in the signal to obtain the required status word, and transmits the status word to the truth table generation module.

[0108] S13. The truth table generation module compares the status word with the nominal value of the status word. If it is within the specified error range, it is processed as logic "1"; otherwise, it is processed as logic "0". The binarized status word is then transmitted to the logic relation processing module.

[0109] S14. The logic relationship processing module performs corresponding logical "AND" and logical "OR" operations on the binarized status words. If the logical "AND" relationship of the binarized status word combination is "0", the board can be judged to be abnormal; otherwise, it is "1", which is normal.

[0110] Example 3, such as Figure 6 As shown, the one-click detection method for single-board positioning based on the single-board positioning one-click detection mode has the following steps:

[0111] S21. Place the instrument under test 3 into the test chamber 2. The test chamber 2 collects the signal of the instrument under test 3 and uploads the signal to the host computer 1 through the bus interface 4.

[0112] S22. The data input module of the intelligent instrument testing software receives the signal uploaded by the test chamber 2, extracts and organizes the information in the signal to obtain the required status word, and transmits the status word to the truth table generation module.

[0113] S23. The truth table generation module compares the status word with the nominal value of the status word. If it is within the specified error range, it is processed as logic "1"; otherwise, it is processed as logic "0". The binarized status word is then transmitted to the logic relation processing module.

[0114] S24, the logical relationship processing module, based on the logical relationship of board-level positioning, combines the binary status words associated with the single board to establish logical AND and OR relationships, obtains the fault mask, and sends the fault mask to the fault matching module.

[0115] S25. The fault matching module matches the fault mask with the fault model in the expert diagnosis and processing knowledge base to obtain the matching result. The fault diagnosis module outputs the diagnosis result in the expert diagnosis and processing knowledge base based on the obtained matching result.

[0116] S26. The voice assistant prompt module provides voice guidance to the user based on the diagnostic results, using backup boards to verify step by step according to the troubleshooting suggestions, and then repeatedly testing to finally determine the type and number of faulty boards in the instrument.

[0117] S27. The host computer 1 generates the corresponding detection report and stores the recorded fault information.

[0118] Specifically, the diagnostic results include corresponding troubleshooting suggestions for abnormal circuits.

[0119] Example 4, such as Figure 7 As shown, the instrument fault detection method based on the instrument fault detection mode has the following steps:

[0120] S31. Place the instrument under test 3 into the test chamber 2. The test chamber 2 collects the signals of the instrument under test 3, as well as the power interaction input information and node interaction input information, and uploads the collected signals and information to the host computer 1 through the bus interface 4.

[0121] S32. The data input module of the intelligent instrument testing software receives the signals and information uploaded by the test chamber 2, extracts and organizes all the information to obtain the three required status words, and transmits the obtained status words to the truth table generation module.

[0122] S33. The truth table generation module compares the status word with the nominal value of the status word. If it is within the specified error range, it is processed as logic "1"; otherwise, it is processed as logic "0". The binarized status word is then transmitted to the logic relation processing module.

[0123] S34. The logic relationship processing module performs corresponding logical "AND" and logical "OR" operations on the binarized status word to obtain the fault mask, and sends the fault mask to the fault matching module.

[0124] S35. The fault matching module matches the fault mask with the fault model in the expert diagnosis and processing knowledge base to obtain the matching result. The fault diagnosis module outputs the diagnosis result in the expert diagnosis and processing knowledge base based on the obtained matching result.

[0125] S36. The voice assistant prompt module provides voice guidance to the user based on the diagnostic results to complete circuit board level fault location and / or instrument fault troubleshooting.

[0126] S37. The host computer 1 generates the corresponding detection report and stores the recorded fault information.

[0127] As is known from common technical knowledge, this invention can be implemented through other embodiments that do not depart from its spirit or essential characteristics. Therefore, the disclosed embodiments described above are merely illustrative in all respects and are not the only ones. All modifications within the scope of this invention or its equivalents are included in this invention.

Claims

1. A smart detection system for well logging instruments, characterized in that, include, The test box (2) is used to connect to the instrument under test (3) and to the host computer (1) through the bus interface (4). The host computer (1) is used to install the intelligent instrument detection software; Intelligent instrument testing software, including, An expert diagnostic knowledge base is used to store fault model data and corresponding processing methods; The data input module is used to receive the status words collected by the test box (2); The truth table generation module is used to binarize the collected status words, arrange the binarized status words into a truth table, and send the truth table to the logic relation processing module. The method for arranging the binarized state words into a truth table is as follows: S1. Group the binarized status words according to the structure or function of the instrument under test (3); S2. Arrange all groups according to the first set order to form a truth table; The logic relationship processing module is used to receive the truth table sent by the truth table generation module, perform logical "AND" and logical "OR" operations on the binary status words in the truth table, and obtain the fault mask. The logic relation processing module performs logical AND and OR operations on the binary status words in the truth table to obtain the fault mask. The steps are as follows: S11. The logic relationship processing module lists all possible fault information of the instrument under test (3) in the second set order. S12. Based on the possible fault information, select the group in the truth table that is related to the possible fault information; S13. Select the binarized status word related to possible fault information from the selected groups; S14. If there are multiple binarized status words selected in the selected group, then according to the corresponding logical "AND" and logical "OR" logical relationships stored in the expert diagnosis processing knowledge base, the logical relationship operation is performed on the binarized status words selected in the selected group to obtain the output result of the selected group. If there is only one binarized status word selected in the selected group, then the binarized status word is used as the output result of the selected group. The output results of the selected group are arranged in the first set order to obtain the combination code corresponding to the fault information. S15. Repeat steps S12-S14 to obtain the combination code corresponding to each fault information. Arrange the combination codes corresponding to each fault information in the second preset order to obtain the fault mask. The fault matching module is used to match the fault mask with the fault model code in the expert diagnosis and processing knowledge base to obtain the matching result. The expert diagnostic processing knowledge base includes a binary status word group, a logical relationship group, and a diagnostic conclusion group. The binary status word group stores the fault model code, which is used to match the fault mask. The logical relationship group stores the logical "AND" and logical "OR" relationships of the status word. The diagnostic conclusion group stores the diagnostic results corresponding to the fault code. The logic relationship processing module constructs logical "AND" and logical "OR" relationships between different status words based on the correlation between different status words and circuit boards or instrument components, and stores the constructed logical relationships in the logical relationship group in the expert knowledge base; The fault diagnosis module is used to output the corresponding processing method from the expert diagnosis and processing knowledge base as the diagnosis result based on the obtained matching results.

2. The intelligent detection system for well logging instruments according to claim 1, characterized in that, The binarization process is as follows: compare the acquired status word with the nominal value of the status word. If it is within the specified error range, process the status word as logic "1"; otherwise, process it as logic "0".

3. The intelligent detection system for well logging instruments according to claim 1, characterized in that, The intelligent instrument testing software also includes a voice assistant prompt module, which guides users to complete circuit board-level fault location and / or instrument fault diagnosis based on diagnostic results.

4. The intelligent detection system for well logging instruments according to claim 1, characterized in that, The system includes three modes. The intelligent single-board detection mode is used to detect faults in circuit boards. The single-board positioning one-click detection mode is used for one-click detection of single-board faults in instruments. Instrument fault detection mode, used for detecting complex faults in instrument circuits.

5. The intelligent detection system for well logging instruments according to claim 1, characterized in that, The test chamber (2) includes: The power module is used to provide a stable power supply for the instrument under test (3) and the host computer (1); The signal acquisition module is used to acquire the signals of the instrument under test (3) and convert them into digital signals; The bus interface (4) module is used to transmit the digital signals acquired by the signal acquisition module to the host computer (1). The instrument interface module is used to connect the instrument under test (3) and the test box (2).

6. The intelligent detection system for well logging instruments according to claim 1, characterized in that, The host computer (1) also includes, The data display unit is used to display the diagnostic results of the intelligent instrument detection software on the screen in the form of graphics or text; The data storage unit is used to store the diagnostic results and related data of the intelligent instrument detection software in memory or external storage devices.

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