A fully automated high-efficiency chip testing device

Abstract

This invention relates to the field of chip testing technology, specifically to a fully automated, high-efficiency chip testing device, comprising a machine base; the machine base is equipped with multiple testing modules; each testing module includes a base and a testing platform; the testing platform has a first plane, a second plane, a third plane, and a fourth plane arranged sequentially along its circumferential direction; each of the first, second, and third planes is equipped with a test board; each test board is equipped with multiple test holders; each test holder is equipped with a clamping assembly; and the base is equipped with a driving assembly for opening the clamping assembly. This invention, by setting multiple testing modules on the machine base, each testing module having a test platform, and each test platform having a first plane, a second plane, and a third plane, and each of the first, second, and third planes being equipped with a test board, allows the testing platform to hold multiple chips via clamping assemblies. This multi-faceted arrangement of test boards significantly improves space utilization and greatly enhances testing efficiency.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and more specifically to a fully automated, high-efficiency chip testing device. Background Technology

[0002] Low-level testing after integrated circuit packaging is an indispensable step in the chip manufacturing process, aiming to ensure the performance and reliability of the packaged chip in practical applications. However, current low-level testing methods on the market have some significant problems, affecting testing efficiency, yield, and security.

[0003] To reduce floor space, some manufacturers have adopted low-profile testing cabinets. While this method reduces space usage, it still requires manual loading and unloading operations. Manually transferring materials onto the testing fixtures is not only time-consuming and labor-intensive, but also increases the workload of the operators.

[0004] Frequent manual handling of chips increases the risk of electrostatic discharge (ESD) from the human body causing chip breakdown. ESD events can damage chips, reducing yield and increasing production costs.

[0005] Furthermore, existing testing methods generally have low levels of automation and rely heavily on manual intervention, which not only increases labor costs but also limits the improvement of testing efficiency. In addition, inconsistencies in manual operations can also affect the reliability and repeatability of test results. Summary of the Invention

[0006] The purpose of this invention is to address the aforementioned shortcomings in the prior art by providing a fully automated, high-efficiency chip testing device.

[0007] The objective of this invention is achieved through the following technical solution: a fully automated high-efficiency chip testing device, comprising a machine base; the machine base is provided with multiple testing modules; each testing module includes a base disposed on the machine base and a testing platform rotatably disposed on the base; the testing platform is provided with a first plane, a second plane, a third plane and a fourth plane in sequence along its circumferential direction; each of the first plane, the second plane and the third plane is provided with a testing plate; each testing plate is provided with multiple testing seats; each testing seat is provided with a clamping assembly; the base is provided with a driving assembly for driving the clamping assembly to open.

[0008] The present invention is further configured such that the clamping assembly includes a movable seat and a pressing block; the movable seat is movably and vertically mounted on the top of the test seat; the test seat has a test groove in the middle; the movable seat has a test opening; the test groove is exposed in the test opening; the test seat has pressing blocks flipped on both sides of the test groove; the movable seat is used to drive the pressing blocks to flip.

[0009] The drive assembly includes a pressure plate that is movably mounted on the top of the test platform and a drive cylinder mounted on the base; the pressure plate has multiple through holes; the through holes are corresponding to the test openings; the output end of the drive cylinder is connected to the pressure plate.

[0010] The present invention is further configured such that a return spring is provided between the test seat and the movable seat; a control part is provided at one end of the pressing block; a pressing part is provided at the other end of the pressing block; and a positioning part is provided in the middle of the pressing block.

[0011] The positioning part is hinged to the test seat; the pressing part protrudes into the test groove; the control part is provided with a strip groove; the movable seat is provided with a hinge block; the hinge block is movably hinged to the strip groove.

[0012] The present invention is further configured such that: the test bench has a wiring channel; the test board is connected to the wiring channel; the base has a hollow rotating platform; the output end of the hollow rotating platform is connected to the test bench; and the hollow rotating platform is connected to the wiring channel.

[0013] The base is provided with a support cylinder at its bottom; the output end of the support cylinder is provided with a support block; the first plane, the second plane and the third plane are all provided with clearance grooves for abutting against the support block.

[0014] The present invention is further configured such that the machine tool is provided with a feeding mechanism, a discharging mechanism and a picking mechanism; the picking mechanism is used to move between the feeding mechanism and the testing module and to move between the discharging mechanism and the testing module.

[0015] The present invention is further configured such that the material handling mechanism includes a transverse linear motor disposed on the machine base in the transverse direction, a longitudinal linear motor disposed at the output end of the transverse linear motor in the longitudinal direction, a material handling seat disposed at the output end of the longitudinal linear motor, and a material handling suction nozzle that is movably and vertically disposed on the material handling seat.

[0016] The present invention is further configured such that the machine tool is provided with a first slide rail and a second slide rail in the transverse direction; the transverse linear motor is disposed between the first slide rail and the second slide rail;

[0017] The two ends of the longitudinal linear motor are slidably mounted on the first slide rail and the second slide rail, respectively; multiple test modules are arranged in the transverse direction between the first slide rail and the transverse linear motor to form a first test group; multiple test modules are arranged in the transverse direction between the second slide rail and the transverse linear motor to form a second test group.

[0018] The present invention is further configured such that both the feeding mechanism and the unloading mechanism include a conveyor seat; one end of the conveyor seat is provided with a first station; the other end of the conveyor seat is provided with a material picking station; a second station is provided at the end of the first station near the material picking station; a linear module is provided between the first station, the second station and the material picking station; and a tray is provided at the output end of the linear module.

[0019] The conveyor seat of the feeding mechanism is located between the first test group and the transverse linear motor; the conveyor seat of the unloading mechanism is located between the second test group and the transverse linear motor.

[0020] The present invention is further configured such that the conveyor seat is equipped with a material picking rod that is movably raised and lowered at the material picking station; the material picking rod is located on both sides of the pallet; and the conveyor seat is equipped with a material picking and lifting assembly for driving the material picking rod to move up and down.

[0021] The present invention is further configured such that the conveying seat is provided with a first positioning column and a first positioning cylinder at the first work station; the output end of the first positioning cylinder is provided with a first positioning plate; the first positioning plate is movably disposed on the top of the pallet; the conveying seat is provided with a first push rod that is movably lifted at the first work station; the first push rod is disposed on both sides of the pallet; the conveying seat is provided with a first lifting assembly for driving the first push rod to lift.

[0022] The conveyor seat is provided with a second positioning column and a second positioning cylinder at the second work station; the output end of the second positioning cylinder is provided with a second positioning plate; the second positioning plate is movably disposed on the top of the pallet; the conveyor seat is provided with a second push rod at the second work station; the second push rod is disposed on both sides of the pallet; the conveyor seat is provided with a second lifting assembly for driving the second push rod to move up and down.

[0023] The beneficial effects of the present invention are as follows: By setting multiple test modules on the machine, each test module is equipped with a test platform, and the test platform is equipped with a first plane, a second plane and a third plane, and test boards are set on the first plane, the second plane and the third plane, so that the test platform can hold multiple chips through clamping components. This method of multi-sided test board mounting greatly improves space utilization and greatly improves testing efficiency. Attached Figure Description

[0024] The invention will be further illustrated with reference to the accompanying drawings, but the embodiments in the drawings do not constitute any limitation on the invention. For those skilled in the art, other drawings can be obtained based on the following drawings without any creative effort.

[0025] Figure 1 This is a schematic diagram of the structure of the present invention;

[0026] Figure 2 yes Figure 1 A magnified view of part A in the middle;

[0027] Figure 3 This is a schematic diagram of the test module of the present invention;

[0028] Figure 4 This is a structural schematic diagram of the test module of the present invention from another perspective;

[0029] Figure 5 This is a schematic diagram of the structure of the test seat and the movable seat of the present invention.

[0030] Figure 6 This is a structural schematic diagram of the test seat and movable seat of the present invention from another perspective;

[0031] Figure 7 This is a schematic diagram of the structure of the pressing block of the present invention;

[0032] Figure 8 This is a schematic diagram of the feeding mechanism of the present invention;

[0033] Figure 9 yes Figure 8 A magnified view of part B in the middle;

[0034] Figure 10 This is a schematic diagram of the feeding mechanism of the present invention from another perspective;

[0035] The components include: 1. Machine base; 11. Horizontal linear motor; 12. Vertical linear motor; 13. Material pick-up seat; 14. Material pick-up nozzle; 15. First slide rail; 16. Second slide rail; 17. Material tray; 21. First test group; 22. Second test group; 3. Base; 31. Hollow rotating platform; 32. Support cylinder; 33. Support block; 4. Test table; 41. First plane; 42. Second plane; 43. Third plane; 44. Fourth plane; 45. Clearance groove; 46. Test plate; 47. Test seat; 48. Test groove; 5. Movable seat; 51. Test opening; 52. Hinge block; 53. Reset. 6. Spring; 7. Pressing block; 81. Control unit; 62. Pressing unit; 63. Positioning unit; 64. Strip groove; 7. Pressure plate; 71. Perforation; 72. Drive cylinder; 81. Feeding mechanism; 82. Unloading mechanism; 83. Conveyor seat; 84. First station; 85. Second station; 86. Picking station; 87. Linear module; 88. Pallet; 89. Picking rod; 80. Picking lifting assembly; 91. First positioning post; 92. First positioning cylinder; 93. First positioning plate; 94. First push rod; 96. Second positioning post; 97. Second positioning cylinder; 98. Second positioning plate; 99. Second push rod. Detailed Implementation

[0036] The present invention will be further described in conjunction with the following embodiments.

[0037] Depend on Figures 1 to 10 As can be seen, the fully automated high-efficiency chip testing equipment described in this embodiment includes a machine base 1; the machine base 1 is provided with multiple testing modules; each testing module includes a base 3 disposed on the machine base 1 and a testing platform 4 rotatably disposed on the base 3; the testing platform 4 is provided with a first plane 41, a second plane 42, a third plane 43 and a fourth plane 44 in sequence along the circumferential direction; each of the first plane 41, the second plane 42 and the third plane 43 is provided with a testing plate 46; the testing plate 46 is provided with multiple testing seats 47; each testing seat 47 is provided with a clamping assembly; the base 3 is provided with a driving assembly for driving the clamping assembly to open.

[0038] Specifically, the fully automated high-efficiency chip testing equipment described in this embodiment sets up multiple testing modules on the machine base 1. Each testing module is equipped with a test platform 4, and the test platform 4 is provided with a first plane 41, a second plane 42, and a third plane 43. Test boards 46 are provided on the first plane 41, the second plane 42, and the third plane 43, so that the test platform 4 can place multiple chips through clamping components. By using this method of having test boards 46 on multiple sides, the space utilization rate is greatly improved and the testing efficiency is greatly improved.

[0039] This embodiment describes a fully automated high-efficiency chip testing device. The clamping assembly includes a movable seat 5 and a pressing block 6. The movable seat 5 is movably and vertically mounted on the top of a test seat 47. A test groove 48 is provided in the middle of the test seat 47. The movable seat 5 has a test opening 51. The test groove 48 is exposed in the test opening 51. The test seat 47 has pressing blocks 6 flipped on both sides of the test groove 48. The movable seat 5 is used to drive the pressing blocks 6 to flip.

[0040] The driving assembly includes a pressure plate 7 that is movably mounted on the top of the test platform 4 and a driving cylinder 72 mounted on the base 3; the pressure plate 7 is provided with a plurality of through holes 71; the through holes 71 are correspondingly provided with the test opening 51; the output end of the driving cylinder 72 is connected to the pressure plate 7.

[0041] Specifically, in this embodiment, the fully automated high-efficiency chip testing equipment operates by rotating the test stage 4 so that the first plane 41, the second plane, or the third plane 43 is directly below the pressure plate 7. Then, the driving cylinder 72 drives the pressure plate 7 to descend, and the pressure plate 7 presses against the movable seat 5 of the plane, causing the movable seat 5 to descend. During the descent of the movable seat 5, the pressing block 6 flips upward, thereby connecting the through hole 71, the test opening 51, and the test slot 48. At this point, the chip can be placed sequentially through the through hole 71 and the test opening 51 into each test slot 48. Then, the driving cylinder 72 drives the pressure plate 7 to rise, causing the movable seat 5 to reset, thereby causing the pressing block 6 to flip downward, pressing the chip firmly into the test slot 48. Then, the test stage 4 is rotated again, so that different planes are directly below the pressure plate 7, and the above actions are repeated until all test boards 46 of the first plane 41, the second plane, and the third plane 43 have chips placed on them.

[0042] The fully automated high-efficiency chip testing equipment described in this embodiment includes a return spring 53 between the test base 47 and the movable base 5; a control part 61 is provided at one end of the pressing block 6; a pressing part 62 is provided at the other end of the pressing block 6; and a positioning part 63 is provided in the middle of the pressing block 6.

[0043] The positioning part 63 is hinged to the test seat 47; the pressing part 62 protrudes into the test groove 48; the control part 61 is provided with a strip groove 64; the movable seat 5 is provided with a hinge block 52; the hinge block 52 is movably hinged to the strip groove 64.

[0044] Specifically, in this embodiment, the fully automated high-efficiency chip testing equipment, during use, rotates the test stage 4 so that the first plane 41, the second plane, or the third plane 43 rotates to be directly below the pressure plate 7. Then, the drive cylinder 72 drives the pressure plate 7 to descend, and the pressure plate 7 presses against the movable seat 5 of the plane, causing the movable seat 5 to descend. Since the hinge block 52 is movably hinged to the strip groove 64, the pressing part 62 flips upward during the descent of the movable seat 5, causing the pressing part 62 to exit the test groove 48, thereby connecting the through hole 71, the test opening 51, and the test groove 48. At this time, the chip is placed in each test groove 48 sequentially through the through hole 71 and the test opening 51. Then, the drive cylinder 72 drives the pressure plate 7 to rise, and the movable seat 5 returns to its original position under the action of the return spring 53, thereby causing the pressing part 62 to flip downward, so that the pressing part 62 presses the chip tightly in the test groove 48, and then all the chips are tested simultaneously.

[0045] This embodiment describes a fully automated high-efficiency chip testing device. The test bench 4 has a wiring channel inside; the test board 46 is connected to the wiring channel; the base 3 has a hollow rotating platform 31; the output end of the hollow rotating platform 31 is connected to the test bench 4; the hollow rotating platform 31 is connected to the wiring channel; the wiring channel is not shown in the figure; specifically, by setting the hollow rotating platform 31 and the wiring channel, this embodiment facilitates the routing of wires on each test board 46.

[0046] The base 3 is provided with a support cylinder 32 at its bottom; the output end of the support cylinder 32 is provided with a support block 33; the first plane 41, the second plane 42 and the third plane 43 are all provided with clearance grooves 45 for abutting against the support block 33.

[0047] Specifically, in this embodiment, by setting a relief groove 45 and a support block 33, when the driving cylinder 72 drives the pressure plate 7 to descend, the support cylinder 32 drives the support block 33 to rise and abut against the relief groove 45, thereby providing sufficient support force to the test platform 4.

[0048] The fully automated high-efficiency chip testing equipment described in this embodiment includes a machine base 1 equipped with a loading mechanism 81, a unloading mechanism 82, and a picking mechanism; the picking mechanism is used to move between the loading mechanism 81 and the testing module and to move between the unloading mechanism 82 and the testing module.

[0049] This embodiment describes a fully automated high-efficiency chip testing device. The material handling mechanism includes a transverse linear motor 11 mounted on the machine base 1 in the transverse direction, a longitudinal linear motor 12 mounted on the output end of the transverse linear motor 11 in the longitudinal direction, a material handling seat 13 mounted on the output end of the longitudinal linear motor 12, and a material handling nozzle 14 that is movably and vertically mounted on the material handling seat 13. Specifically, the transverse linear motor 11 facilitates the transverse movement of the material handling nozzle 14; the longitudinal linear motor 12 facilitates the longitudinal movement of the material handling nozzle 14; and the material handling nozzle 14 is movably and vertically mounted on the material handling seat 13, and moves up and down with the material handling nozzle 14.

[0050] This embodiment describes a fully automated high-efficiency chip testing device, wherein the machine base 1 is provided with a first slide rail 15 and a second slide rail 16 in the transverse direction; and the transverse linear motor 11 is located between the first slide rail 15 and the second slide rail 16.

[0051] The two ends of the longitudinal linear motor 12 are respectively slidably disposed on the first slide rail 15 and the second slide rail 16; multiple test modules are arranged in the transverse direction between the first slide rail 15 and the transverse linear motor 11 to form a first test group 21; multiple test modules are arranged in the transverse direction between the second slide rail 16 and the transverse linear motor 11 to form a second test group 22.

[0052] Specifically, through the above-described arrangement, this embodiment can effectively and reasonably arrange the test modules on the machine 1, thereby effectively improving the efficiency of loading and unloading.

[0053] This embodiment describes a fully automated high-efficiency chip testing device, in which both the loading mechanism 81 and the unloading mechanism 82 include a conveyor base 83; one end of the conveyor base 83 is provided with a first station 84; the other end of the conveyor base 83 is provided with a picking station 86; a second station 85 is provided at the end of the first station 84 near the picking station 86; a linear module 87 is provided between the first station 84, the second station 85 and the picking station 86; and a tray 88 is provided at the output end of the linear module 87.

[0054] The conveyor seat 83 of the feeding mechanism 81 is located between the first test group 21 and the transverse linear motor 11; the conveyor seat 83 of the unloading mechanism 82 is located between the second test group 22 and the transverse linear motor 11.

[0055] Specifically, in the fully automated high-efficiency chip testing equipment described in this embodiment, the loading mechanism 81 and the unloading mechanism 82 have the same structure; the first station 84 is used to place a tray 17 fully loaded with chips, and the second station 85 is used to place an empty tray 17; in the loading mechanism 81, the tray 17 fully loaded with chips in the first station 84 is moved to the picking station 86 by the pallet 88, and the picking mechanism then transfers the chips in the picking station 86 to each testing module; when all the chips in the tray 17 have been transferred, the pallet 88 transfers the empty tray 17 to the second station 85.

[0056] In the unloading mechanism 82, the empty tray 17 of the second station 85 is moved to the picking station 86 by the pallet 88, and the picking mechanism places the chips in each test module into the tray 17 in the picking station 86; when the tray 17 is full of chips, the pallet 88 transfers the full tray 17 to the first station 84; thus realizing automated loading and unloading.

[0057] The fully automatic high-efficiency chip testing equipment described in this embodiment includes a material picking rod 89 that is movably lifted and lowered at the material picking station 86 on the conveyor seat 83; the material picking rod 89 is located on both sides of the pallet 88; the conveyor seat 83 is provided with a material picking lifting assembly 80 for driving the material picking rod 89 to move up and down; wherein the material picking lifting assembly 80 can be a cylinder, hydraulic cylinder or motor screw, etc.

[0058] Specifically, when the pallet 88 and the tray 17 move to the picking station 86, the picking lifting assembly 80 drives the picking rod 89 to rise, thereby causing the tray 17 to move upward, making it easier for the picking mechanism to load or unload materials.

[0059] This embodiment describes a fully automated high-efficiency chip testing device. The conveyor 83 is equipped with a first positioning column 91 and a first positioning cylinder 92 at the first station 84. The output end of the first positioning cylinder 92 is equipped with a first positioning plate 93. The first positioning plate 93 is movably mounted on the top of the support plate 88. The conveyor 83 is equipped with a first lifting rod 94 that can be raised and lowered at the first station 84. The first lifting rod 94 is located on both sides of the support plate 88. The conveyor 83 is equipped with a first lifting assembly for driving the first lifting rod 94 to move up and down.

[0060] Specifically, in this embodiment, the first positioning plate 93 is extended by the first positioning cylinder 92, thereby placing the material tray 17 in the first positioning post 91. When it is necessary to place the material tray 17 from the first positioning post 91 onto the pallet 88, or to place the material tray 17 from the pallet 88 onto the first positioning post 91, it is only necessary to activate the first lifting assembly so that the first push rod 94 and the first positioning plate 93 are at the same height, and then drive the first positioning cylinder 92 to move.

[0061] The conveyor seat 83 is provided with a second positioning column 96 and a second positioning cylinder 97 at the second station 85; the output end of the second positioning cylinder 97 is provided with a second positioning plate 98; the second positioning plate 98 is movably disposed on the top of the pallet 88; the conveyor seat 83 is provided with a second push rod 99 at the second station 85; the second push rod 99 is disposed on both sides of the pallet 88; the conveyor seat 83 is provided with a second lifting assembly for driving the second push rod 99 to lift; wherein the first lifting assembly and the second lifting assembly can be structures such as cylinders, hydraulic cylinders or motor screws.

[0062] Specifically, in this embodiment, the second positioning plate 98 is extended by the second positioning cylinder 97, thereby placing the material tray 17 in the second positioning post 96. When it is necessary to place the material tray 17 from the second positioning post 96 onto the pallet 88, or to place the material tray 17 from the pallet 88 onto the second positioning post 96, it is only necessary to activate the second lifting assembly so that the first push rod 94 and the second positioning plate 98 are at the same height, and then drive the second positioning cylinder 97 to move.

[0063] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit the scope of protection of the present invention. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the essence and scope of the technical solutions of the present invention.

Claims

1. A fully automated, high-efficiency chip testing device, characterized in that: The system includes a machine base; the machine base is equipped with multiple testing modules; each testing module includes a base mounted on the machine base and a testing platform rotatably mounted on the base; the testing platform has a first plane, a second plane, a third plane, and a fourth plane arranged sequentially along its circumferential direction; each of the first plane, the second plane, and the third plane has a testing plate; each testing plate has multiple testing seats; each testing seat has a clamping assembly; and the base has a driving assembly for opening the clamping assembly. The clamping assembly includes a movable seat and a pressing block; the movable seat is movably mounted on the top of the test seat; the test seat has a test groove in the middle; the movable seat has a test opening; the test groove is exposed in the test opening; the test seat has pressing blocks flipped on both sides of the test groove; the movable seat is used to drive the pressing blocks to flip. The drive assembly includes a pressure plate that is movably mounted on the top of the test bench and a drive cylinder mounted on the base; the pressure plate has multiple through holes; the through holes are corresponding to the test openings; the output end of the drive cylinder is connected to the pressure plate; A return spring is provided between the test seat and the movable seat; a control part is provided at one end of the pressing block; a pressing part is provided at the other end of the pressing block; and a positioning part is provided in the middle of the pressing block. The positioning part is hinged to the test seat; the pressing part protrudes into the test groove; the control part is provided with a strip groove; the movable seat is provided with a hinge block; the hinge block is movably hinged to the strip groove; The test bench is equipped with a wiring channel; the test board is connected to the wiring channel; the base is equipped with a hollow rotating platform; The output end of the hollow rotary platform is connected to the test bench; The hollow rotating platform is connected to the wiring channel; The base is provided with a support cylinder at its bottom; the output end of the support cylinder is provided with a support block; the first plane, the second plane and the third plane are all provided with clearance grooves for abutting against the support block.

2. The fully automated high-efficiency chip testing equipment according to claim 1, characterized in that: The machine is equipped with a feeding mechanism, a discharging mechanism, and a picking mechanism; the picking mechanism is used to move between the feeding mechanism and the testing module and to move between the discharging mechanism and the testing module.

3. The fully automated high-efficiency chip testing equipment according to claim 2, characterized in that: The material handling mechanism includes a transverse linear motor mounted on the machine base in the transverse direction, a longitudinal linear motor mounted on the output end of the transverse linear motor in the longitudinal direction, a material handling seat mounted on the output end of the longitudinal linear motor, and a material handling suction nozzle that is movably mounted on the material handling seat.

4. The fully automated high-efficiency chip testing equipment according to claim 3, characterized in that: The machine base is provided with a first slide rail and a second slide rail in the transverse direction; the transverse linear motor is located between the first slide rail and the second slide rail; The two ends of the longitudinal linear motor are slidably mounted on the first slide rail and the second slide rail, respectively; multiple test modules are arranged in the transverse direction between the first slide rail and the transverse linear motor to form a first test group; multiple test modules are arranged in the transverse direction between the second slide rail and the transverse linear motor to form a second test group.

5. The fully automated high-efficiency chip testing equipment according to claim 4, characterized in that: Both the feeding mechanism and the unloading mechanism include a conveyor seat; one end of the conveyor seat is provided with a first station; the other end of the conveyor seat is provided with a material picking station; a second station is provided at the end of the first station near the material picking station; a linear module is provided between the first station, the second station and the material picking station; the output end of the linear module is provided with a tray; The conveyor seat of the feeding mechanism is located between the first test group and the transverse linear motor; the conveyor seat of the unloading mechanism is located between the second test group and the transverse linear motor.

6. The fully automated high-efficiency chip testing equipment according to claim 5, characterized in that: The conveyor seat is equipped with a material picking rod that moves up and down at the material picking station; the material picking rod is located on both sides of the pallet; the conveyor seat is equipped with a material picking and lifting assembly for driving the material picking rod to move up and down.

7. The fully automated high-efficiency chip testing equipment according to claim 5, characterized in that: The conveyor seat is provided with a first positioning column and a first positioning cylinder at the first work station; the output end of the first positioning cylinder is provided with a first positioning plate; the first positioning plate is movably disposed on the top of the pallet; the conveyor seat is provided with a first push rod that is movably lifted at the first work station; the first push rod is disposed on both sides of the pallet; the conveyor seat is provided with a first lifting assembly for driving the first push rod to lift. The conveyor seat is provided with a second positioning column and a second positioning cylinder at the second work station; the output end of the second positioning cylinder is provided with a second positioning plate; the second positioning plate is movably disposed on the top of the pallet; the conveyor seat is provided with a second push rod at the second work station; the second push rod is disposed on both sides of the pallet; the conveyor seat is provided with a second lifting assembly for driving the second push rod to move up and down.

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