Photoelectric detection device calibration system and method based on fast reflector
By using a fast reflector and a laser beam analyzer in the photodetection device, the rapid calibration of the photodetection device is achieved, and the existing calibration methods are solved, and the existing calibration methods are complex and cost-effective, and are suitable for photodetection devices of various sizes.
Patent Information
- Application Number
- CN202411883559.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-19
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2044-12-19
AI Technical Summary
The calibration method of existing photodetection devices is complex and requires additional space and equipment, and is costly and cannot be applied to small systems. A fast and effective calibration method is urgently needed.
The photodetection device calibration system based on a fast reflector is adopted, including a photodetection device, a fast reflector, a laser beam analyzer, a test computer and a power supply. By measuring the initial coordinate data of the laser and the rotation coordinate data, the error calibration value is calculated.
It realizes fast, flexible and low-cost calibration of photodetection devices, avoids the need to design complex self-collimating optical paths and increase self-collimating instruments and equipment, and is suitable for photodetection devices of all sizes.
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Figure CN119687986A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of photoelectric detection technology, and in particular to a photoelectric detection device calibration system and method based on a fast reflector. Background Art
[0002] In recent years, photoelectric detection devices often consist of optical detectors, turntables, lasers and other components as well as complex optical paths. During use and maintenance, the system error needs to be calibrated to ensure that the system accuracy meets the requirements. Research on how to quickly and effectively calibrate photoelectric detection devices is of great significance for improving the function and performance of photoelectric detection devices.
[0003] The common calibration method for photoelectric detection devices is to design a self-collimating optical path or use self-collimating measuring instruments to measure system errors. This method is complex in design and requires additional space or equipment to be added to the system. It is costly and cannot be used for special occasions or small systems.
[0004] Based on this, there is an urgent need for a calibration system and method for a photoelectric detection device based on a fast reflector to solve the above technical problems. Summary of the invention
[0005] The embodiment of the present invention provides a photoelectric detection device calibration system and method based on a fast reflector, which can conveniently and flexibly perform fast calibration on the photoelectric detection device.
[0006] In a first aspect, an embodiment of the present invention provides a photoelectric detection device calibration system based on a fast reflector, comprising a power supply, a test computer, and a photoelectric detection device, a fast reflector, and a laser beam analyzer arranged in sequence along the propagation direction of an optical path, wherein:
[0007] The photoelectric detection device includes a multi-axis turntable and a laser fixed on the multi-axis turntable, wherein the multi-axis turntable is used to adjust the light emission angle of the laser, and the laser is used to emit a detection laser;
[0008] The multi-axis turntable and the fast reflection mirror are both fixed on a base;
[0009] The fast reflection mirror is arranged in front of the initial orientation of the multi-axis turntable, and the initial direction of the normal line of the mirror surface is 45° with the initial orientation of the multi-axis turntable;
[0010] The laser beam analyzer is arranged in front of the reflected light of the initial laser after being reflected by the fast reflector;
[0011] The test computer is electrically connected to the laser beam analyzer, and the test computer is used to receive target surface laser coordinate data and analyze the results;
[0012] The power supply is used to supply power to various devices in the system.
[0013] In a second aspect, an embodiment of the present invention further provides a method for calibrating a photoelectric detection device based on a fast reflector, comprising:
[0014] Using the laser beam analyzer to measure the initial coordinate data of the laser when the fast reflection mirror and the multi-axis turntable are both in the initial directions;
[0015] The laser beam analyzer is used to measure the first coordinate data of the laser after the multi-axis turntable rotates a preset angle when the fast reflection mirror is in the initial direction, and the second coordinate data of the laser after the multi-axis turntable is in the initial direction and the fast reflection mirror rotates an equivalent angle; wherein the equivalent angle is determined by the preset angle;
[0016] Calculating, by the test computer, a first difference between the initial coordinate data and the first coordinate data, and a second difference between the initial coordinate data and the second coordinate data;
[0017] The test computer is used to perform coordinate transformation on the first difference and the second difference to obtain an error calibration value of the photoelectric detection device.
[0018] In a third aspect, an embodiment of the present invention further provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the method described in any embodiment of this specification is implemented.
[0019] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon, which, when executed in a computer, enables the computer to execute the method described in any embodiment of this specification.
[0020] In a fifth aspect, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the method described in any embodiment of this specification is implemented.
[0021] The embodiment of the present invention provides a photoelectric detection device calibration system and method based on a fast reflector, the system includes a photoelectric detection device, a fast reflector, a laser beam measuring instrument, a test computer, a base and a power supply, wherein the fast reflector is fixed in front of the initial laser emission direction, the initial direction of the mirror normal is at a 45-degree angle to the initial laser emission direction, the laser beam measuring instrument is placed in front of the reflected light after the laser emission light is reflected by the fast reflector, and the test computer is connected to the laser beam measuring instrument to receive the target surface laser coordinate data and analyze the results. This system utilizes the advantages of high precision and high sensitivity of the fast reflector, does not require the design of a complex autocollimation optical path in the photoelectric detection device or the addition of instruments and equipment such as an autocollimator, has low cost, simple operation, and is flexible and convenient, and realizes the rapid calibration of the photoelectric detection device. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0023] Figure 1 It is a schematic diagram of the layout of a calibration system for a photoelectric detection device based on a fast reflector provided by an embodiment of the present invention;
[0024] Figure 2 It is a flow chart of a calibration method of a photoelectric detection device based on a fast reflector provided by an embodiment of the present invention;
[0025] Figure 3 It is a schematic diagram of the definition of the fast reflection mirror coordinate system provided by an embodiment of the present invention. DETAILED DESCRIPTION
[0026] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.
[0027] Please refer to Figure 1 The embodiment of the present invention provides a photoelectric detection device calibration system based on a fast reflector, the system comprising a power supply, a test computer, and a photoelectric detection device, a fast reflector, and a laser beam analyzer arranged in sequence along the propagation direction of the optical path, wherein:
[0028] The photoelectric detection device includes a multi-axis turntable and a laser fixed on the multi-axis turntable, wherein the multi-axis turntable is used to adjust the light emission angle of the laser, and the laser is used to emit a detection laser;
[0029] The multi-axis turntable and the fast reflection mirror are both fixed on a base;
[0030] The fast reflection mirror is arranged in front of the initial orientation of the multi-axis turntable, and the initial direction of the normal line of the mirror surface is 45° with the initial orientation of the multi-axis turntable;
[0031] The laser beam analyzer is arranged in front of the reflected light of the initial laser after being reflected by the fast reflector;
[0032] The test computer is electrically connected to the laser beam analyzer, and the test computer is used to receive target surface laser coordinate data and analyze the results;
[0033] The power supply is used to supply power to various devices in the system.
[0034] By combining the photoelectric detection device with a high-precision, high-response fast reflector, the device's response accuracy and bandwidth can be improved. At the same time, the fast reflector can assist in the rapid calibration of the photoelectric detection device, with low cost, simple implementation, convenience and flexibility.
[0035] like Figure 2 As shown, an embodiment of the present invention provides a method for calibrating a photoelectric detection device based on a fast reflector, which is applied to the calibration system for a photoelectric detection device based on a fast reflector mentioned in any of the above embodiments, and the method includes:
[0036] Step 200, using the laser beam profiler to measure the initial coordinate data of the laser when the fast reflection mirror and the multi-axis turntable are both in the initial directions;
[0037] Step 202, using the laser beam profiler to measure the first coordinate data of the laser after the multi-axis turntable rotates a preset angle when the fast reflection mirror is in the initial direction, and the second coordinate data of the laser after the multi-axis turntable is in the initial direction and the fast reflection mirror rotates an equivalent angle; wherein the equivalent angle is determined by the preset angle;
[0038] Step 204, using the test computer to calculate a first difference between the initial coordinate data and the first coordinate data, and a second difference between the initial coordinate data and the second coordinate data;
[0039] Step 206: Use the test computer to perform coordinate transformation on the first difference and the second difference to obtain an error calibration value of the photoelectric detection device.
[0040] For step 202, the calculation process of the equivalent angle includes:
[0041] like Figure 3 As shown, according to the first azimuth angle and the first pitch angle of the multi-axis turntable in the first turntable coordinate system in the initial direction, the second azimuth angle ε2 and the second pitch angle β2 in the second turntable coordinate system after the multi-axis turntable rotates by a preset angle are calculated;
[0042] Calculate the incident coordinates of the incident light in the third coordinate system of the fast reflector according to the direction cosine [0, 1, 0] of the incident light in the second turntable coordinate system;
[0043] The incident coordinates are converted into the outgoing coordinates according to the light reflection relationship of the fast reflector, and the equivalent angle is calculated by combining the outgoing coordinates, the second azimuth angle and the second pitch angle.
[0044] Specifically, the second azimuth angle ε2 and the second pitch angle β2 are calculated by the following formula:
[0045]
[0046] Wherein, R is the transformation matrix from the first turntable coordinate system to the second turntable coordinate system; the first azimuth angle and the first pitch angle are both 0°.
[0047] The incident coordinates are calculated using the following formula:
[0048]
[0049] Where, T is the transformation matrix from the second turntable coordinate system to the third coordinate system; δ x is the equivalent rotation angle of the fast reflection mirror on the X axis; δ y is the equivalent rotation angle of the fast reflection mirror on the Y axis.
[0050] The equivalent angle is calculated using the following formula:
[0051]
[0052] In the formula, δ x is the equivalent rotation angle of the fast reflection mirror on the X axis; δ y is the equivalent rotation angle of the fast reflection mirror on the Y axis.
[0053] In an embodiment of the present invention, after executing step 202 to measure and obtain the first coordinate data and the second coordinate data, it also includes: changing the rotation angle of the multi-axis turntable multiple times according to different preset angle values; performing no less than 10 measurements at each rotation angle to obtain multiple sets of first coordinate data and second coordinate data.
[0054] It can be understood that the method embodiment provided in the embodiment of the present invention and the above-mentioned device embodiment belong to the same inventive concept, so the two have the same beneficial effects and will not be described in detail here.
[0055] An embodiment of the present invention further provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, a calibration method for a photoelectric detection device based on a fast reflection mirror in any embodiment of the present invention is implemented.
[0056] An embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the processor executes a calibration method for a photoelectric detection device based on a fast reflector in any embodiment of the present invention.
[0057] Specifically, a system or device equipped with a storage medium can be provided, on which software program code that implements the functions of any of the above-mentioned embodiments is stored, and a computer (or CPU or MPU) of the system or device can be enabled to read and execute the program code stored in the storage medium.
[0058] In this case, the program code itself read from the storage medium can realize the function of any one of the above-mentioned embodiments, and thus the program code and the storage medium storing the program code constitute a part of the present invention.
[0059] The storage medium embodiments for providing the program code include a floppy disk, a hard disk, a magneto-optical disk, an optical disk (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD+RW), a magnetic tape, a non-volatile memory card, and a ROM. Alternatively, the program code can be downloaded from a server computer by a communication network.
[0060] In addition, it should be clear that the functions of any of the above embodiments can be implemented not only by executing the program code read by the computer, but also by enabling an operating system operating on the computer to complete part or all of the actual operations based on instructions from the program code.
[0061] In addition, it can be understood that the program code read from the storage medium is written to a memory provided in an expansion board inserted into the computer or to a memory provided in an expansion module connected to the computer, and then based on the instructions of the program code, a CPU installed on the expansion board or expansion module is enabled to perform part or all of the actual operations, thereby realizing the functions of any of the above-mentioned embodiments.
[0062] It should be noted that, in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "comprise a ..." do not exclude the presence of other identical factors in the process, method, article or device including the elements.
[0063] A person of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions, and the aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it executes the steps of the above method embodiments; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk, etc., various media that can store program codes.
[0064] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims
1. A photoelectric detection device calibration system based on a fast reflector, characterized in that: It includes a power supply, a test computer, and a photoelectric detection device, a fast reflector and a laser beam analyzer arranged in sequence along the propagation direction of the optical path, wherein: The photoelectric detection device includes a multi-axis turntable and a laser fixed on the multi-axis turntable, wherein the multi-axis turntable is used to adjust the light emission angle of the laser, and the laser is used to emit a detection laser; The multi-axis turntable and the fast reflection mirror are both fixed on a base; The fast reflection mirror is arranged in front of the initial orientation of the multi-axis turntable, and the initial direction of the normal line of the mirror surface is 45° with the initial orientation of the multi-axis turntable; The laser beam analyzer is arranged in front of the reflected light of the initial laser after being reflected by the fast reflector; The test computer is electrically connected to the laser beam analyzer, and the test computer is used to receive target surface laser coordinate data and analyze the results; The power supply is used to supply power to various devices in the system.
2. A calibration method for a photoelectric detection device based on a fast reflector, characterized in that: The photoelectric detection device calibration system based on a fast reflector as claimed in claim 1 comprises: Using the laser beam analyzer to measure the initial coordinate data of the laser when the fast reflection mirror and the multi-axis turntable are both in the initial directions; The laser beam analyzer is used to measure the first coordinate data of the laser after the multi-axis turntable rotates a preset angle when the fast reflection mirror is in the initial direction, and the second coordinate data of the laser after the multi-axis turntable is in the initial direction and the fast reflection mirror rotates an equivalent angle; wherein the equivalent angle is determined by the preset angle; Calculating, by the test computer, a first difference between the initial coordinate data and the first coordinate data, and a second difference between the initial coordinate data and the second coordinate data; The test computer is used to perform coordinate transformation on the first difference and the second difference to obtain an error calibration value of the photoelectric detection device.
3. The method according to claim 2, characterized in that The equivalent angle is determined as follows: According to the first azimuth angle and the first pitch angle of the multi-axis turntable in the first turntable coordinate system in the initial direction, a second azimuth angle ε2 and a second pitch angle β2 in the second turntable coordinate system after the multi-axis turntable rotates by a preset angle are calculated; Calculate the incident coordinates of the incident light in the third coordinate system of the fast reflector according to the direction cosine [0, 1, 0] of the incident light in the second turntable coordinate system; The incident coordinates are converted into the outgoing coordinates according to the light reflection relationship of the fast reflector, and the equivalent angle is calculated by combining the outgoing coordinates, the second azimuth angle and the second pitch angle.
4. The method according to claim 3, characterized in that The second azimuth angle ε2 and the second pitch angle β2 are calculated by the following formula: Wherein, R is the transformation matrix from the first turntable coordinate system to the second turntable coordinate system; the first azimuth angle and the first pitch angle are both 0°.
5. The method according to claim 4, characterized in that The incident coordinates are calculated by the following formula: Where, T is the transformation matrix from the second turntable coordinate system to the third coordinate system; δ x is the equivalent rotation angle of the fast reflection mirror on the X axis; δ y is the equivalent rotation angle of the fast reflection mirror on the Y axis.
6. The method according to claim 5, characterized in that The equivalent angle is calculated by the following formula: In the formula, δ x is the equivalent rotation angle of the fast reflection mirror on the X axis; δ y is the equivalent rotation angle of the fast reflection mirror on the Y axis.
7. The method according to claim 2, characterized in that After obtaining the first coordinate data and the second coordinate data by measurement, the method further includes: Changing the rotation angle of the multi-axis turntable multiple times according to different preset angle values; At each rotation angle, no less than 10 measurements are performed to obtain multiple sets of first coordinate data and second coordinate data.
8. A computer device, characterized in that: The computer device includes a memory and a processor, the memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory to implement the steps of any of the methods described in claims 2-7.
9. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method described in any one of claims 2 to 7 are implemented.
10. A computer program product, characterized in that The method comprises a computer program, which, when executed by a processor, implements the steps of the method according to any one of claims 2 to 7.
Citation Information
Patent Citations
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CN113489547A
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